TW202321676A - X射線螢光成像裝置及其方法 - Google Patents

X射線螢光成像裝置及其方法 Download PDF

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Publication number
TW202321676A
TW202321676A TW111137757A TW111137757A TW202321676A TW 202321676 A TW202321676 A TW 202321676A TW 111137757 A TW111137757 A TW 111137757A TW 111137757 A TW111137757 A TW 111137757A TW 202321676 A TW202321676 A TW 202321676A
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TW
Taiwan
Prior art keywords
ray
slice
pixels
collimator
ray fluorescence
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TW111137757A
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English (en)
Chinese (zh)
Inventor
曹培炎
劉雨潤
Original Assignee
大陸商深圳幀觀德芯科技有限公司
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Application filed by 大陸商深圳幀觀德芯科技有限公司 filed Critical 大陸商深圳幀觀德芯科技有限公司
Publication of TW202321676A publication Critical patent/TW202321676A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • G01T1/366—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry with semi-conductor detectors

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
TW111137757A 2021-11-15 2022-10-05 X射線螢光成像裝置及其方法 TW202321676A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/CN2021/130539 WO2023082232A1 (fr) 2021-11-15 2021-11-15 Appareil et procédé d'imagerie par fluorescence de rayons x
WOPCT/CN2021/130539 2021-11-15

Publications (1)

Publication Number Publication Date
TW202321676A true TW202321676A (zh) 2023-06-01

Family

ID=86334920

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111137757A TW202321676A (zh) 2021-11-15 2022-10-05 X射線螢光成像裝置及其方法

Country Status (3)

Country Link
CN (1) CN118339481A (fr)
TW (1) TW202321676A (fr)
WO (1) WO2023082232A1 (fr)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998040013A1 (fr) * 1997-03-12 1998-09-17 Hitachi Medical Corporation Tomographe assiste par ordinateur, dote d'un collimateur qui restreint la portee d'irradiation d'un faisceau de rayons x en eventail
US6363134B1 (en) * 1999-01-13 2002-03-26 Kabushiki Kaisha Toshiba X-ray computed tomography apparatus
JP2005245559A (ja) * 2004-03-02 2005-09-15 Ge Medical Systems Global Technology Co Llc Ｘ線ｃｔ装置およびｘ線装置
US10156645B2 (en) * 2016-12-23 2018-12-18 General Electric Company Systems and methods for sub-pixel location determination at sidewalls and corners of detectors
US10324200B2 (en) * 2017-05-15 2019-06-18 General Electric Company Systems and methods for improved collimation sensitivity
US10145964B1 (en) * 2017-05-15 2018-12-04 General Electric Company Systems and methods for improved collimation sensitivity
US9958552B1 (en) * 2017-06-30 2018-05-01 General Electric Company Systems and methods for rotation based reconstruction for multi-column detector geometries
EP3839576A1 (fr) * 2019-12-18 2021-06-23 Siemens Healthcare GmbH Détecteur de rayons x à comptage photonique et procédé de fonctionnement d'un détecteur de rayons x à comptage photonique

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Publication number Publication date
WO2023082232A1 (fr) 2023-05-19
CN118339481A (zh) 2024-07-12

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