TW202313636A - New organosilicon compound, new crosslinking agent, curable composition, prepreg, laminate body, metal-clad laminate, and circuit board - Google Patents

New organosilicon compound, new crosslinking agent, curable composition, prepreg, laminate body, metal-clad laminate, and circuit board Download PDF

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TW202313636A
TW202313636A TW111115961A TW111115961A TW202313636A TW 202313636 A TW202313636 A TW 202313636A TW 111115961 A TW111115961 A TW 111115961A TW 111115961 A TW111115961 A TW 111115961A TW 202313636 A TW202313636 A TW 202313636A
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curable composition
organosilicon compound
metal
crosslinking agent
laminate
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臼田司
森澤義富
橋本和美
神谷亮介
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日商Agc股份有限公司
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    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08FMACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
    • C08F290/00Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups
    • C08F290/02Macromolecular compounds obtained by polymerising monomers on to polymers modified by introduction of aliphatic unsaturated end or side groups on to polymers modified by introduction of unsaturated end groups
    • C08F290/06Polymers provided for in subclass C08G
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/24Impregnating materials with prepolymers which can be polymerised in situ, e.g. manufacture of prepregs
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate

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Abstract

The present invention provides: a novel organosilicon compound suitable for use as a crosslinking agent or the like; a novel crosslinking agent; a curable composition; a prepreg; a laminate; a metal-clad laminated board; and a wiring board. The organosilicon compound is represented by formula (1m). (In the formula, M is a single bond or an optionally substituted alkylene group having 1-20 carbon atoms. The benzene ring may have a substituent group. The position of substitution of the vinyl group on the benzene ring is a meta position. n is an integer between 2 and 4. R is a hydrogen atom, a hydroxyl group or an organic group, and if R is an organic group, an atom that bonds to Si is C.).

Description

新穎之有機矽化合物、新穎之交聯劑、硬化性組合物、預浸體、積層體、覆金屬之積層板及配線基板Novel organosilicon compounds, novel crosslinking agents, curable compositions, prepregs, laminates, metal-clad laminates and wiring boards

本發明係關於一種新穎之有機矽化合物、新穎之交聯劑、硬化性組合物、預浸體、積層體、覆金屬之積層板及配線基板。The present invention relates to a novel organosilicon compound, a novel crosslinking agent, a curable composition, a prepreg, a laminate, a metal-clad laminate and a wiring substrate.

配線基板(亦稱為印刷配線板)用於電氣設備及電子機器等用途。配線基板例如可以如下方式製造。使硬化性組合物含浸於纖維基材中,使硬化性組合物(半)硬化,而製作預浸體。利用一對金屬箔夾住1個以上之預浸體,獲得第1暫時積層體,對該第1暫時積層體進行加熱加壓,而製作覆金屬之積層板。使用位於該覆金屬之積層板之最表面之金屬箔形成配線等導體圖案(亦稱為電路圖案)。最表面之金屬箔可僅配置於第1暫時積層體之單面側。Wiring boards (also called printed wiring boards) are used for electrical equipment and electronic equipment. The wiring board can be manufactured, for example, as follows. A prepreg is produced by impregnating a curable composition into a fiber base material and (semi)curing the curable composition. One or more prepregs are sandwiched between a pair of metal foils to obtain a first temporary laminate, and the first temporary laminate is heated and pressed to produce a metal-clad laminate. Conductive patterns such as wiring (also referred to as circuit patterns) are formed using the metal foil positioned on the outermost surface of the metal-clad laminate. The metal foil on the outermost surface may be arranged only on one side of the first temporary laminate.

可藉由如下方式製造多層配線基板(亦稱為多層印刷配線板):對所獲得之配線基板進一步重疊1個以上之預浸體,利用一對金屬箔將其夾住,獲得第2暫時積層體,對該第2暫時積層體進行加熱加壓,並使用位於最表面之金屬箔形成配線等導體圖案。最表面之金屬箔可僅配置於第2暫時積層體之單面側。A multilayer wiring board (also called a multilayer printed wiring board) can be manufactured by laminating one or more prepregs on the obtained wiring board and sandwiching them with a pair of metal foils to obtain a second temporary buildup body, the second temporary laminate is heated and pressed, and conductive patterns such as wiring are formed using the metal foil located on the outermost surface. The metal foil on the outermost surface may be arranged only on one side of the second temporary laminate.

預浸體之加熱加壓物包含纖維基材、樹脂及無機填充材(亦稱為填料)等,亦稱為複合基材。於配線基板中,複合基材作為絕緣層發揮功能。 預浸體中所包含之樹脂為硬化性組合物之(半)硬化物,複合基材中所包含之樹脂為硬化性組合物之硬化物。 The heated and pressed material of prepreg includes fiber base material, resin and inorganic filler (also called filler), etc., also known as composite base material. In a wiring board, the composite base material functions as an insulating layer. The resin contained in the prepreg is the (semi) cured product of the curable composition, and the resin contained in the composite substrate is the cured product of the curable composition.

近年來,於攜帶用電子機器等用途中,通訊不斷高速化及大容量化,且信號之高頻化不斷發展。對用於該用途之配線基板,要求降低高頻區域中之傳輸損耗。傳輸損耗主要包括:由金屬箔之表面電阻引起之導體損耗、及由複合基材之介電損耗因數(D f)引起之介電損耗。因此,對用於上述用途之配線基板之複合基材中所包含之樹脂,要求降低高頻區域中之介電損耗。介電損耗因數(D f)通常依存於頻率,相同材料有頻率越高則介電損耗因數(D f)越大之傾向。複合基材中所包含之樹脂較佳為高頻條件下之介電損耗因數(D f)較低。 In recent years, in applications such as portable electronic devices, communication has been increasing in speed and capacity, and the frequency of signals has been increasing. For a wiring board used for this purpose, it is required to reduce transmission loss in a high-frequency region. Transmission loss mainly includes: conductor loss caused by the surface resistance of the metal foil, and dielectric loss caused by the dielectric loss factor (D f ) of the composite substrate. Therefore, reduction of the dielectric loss in the high-frequency region is required for the resin contained in the composite base material of the wiring board used for the above-mentioned application. The dielectric loss factor (D f ) usually depends on the frequency, and the higher the frequency of the same material, the larger the dielectric loss factor (D f ) tends to be. The resin contained in the composite substrate preferably has a low dielectric loss factor (D f ) under high frequency conditions.

若預浸體或複合基材與金屬箔之熱膨脹係數(CTE)之差較大,則對包含預浸體與金屬箔之第1暫時積層體、或包含複合基材、預浸體、及金屬箔之第2暫時積層體進行加熱加壓時,有金屬箔發生偏移或剝離之虞。預浸體或複合基材與金屬箔之熱膨脹係數(CTE)之差較佳為較小。由於樹脂之熱膨脹係數(CTE)通常大於金屬箔之熱膨脹係數(CTE),因此較佳為預浸體及複合基材之熱膨脹係數(CTE)較小。If the difference between the coefficient of thermal expansion (CTE) of the prepreg or the composite substrate and the metal foil is large, the first temporary laminate containing the prepreg and the metal foil, or the composite substrate, prepreg, and metal When the second temporary laminate of foil is heated and pressed, there is a possibility that the metal foil may shift or be peeled off. The difference in coefficient of thermal expansion (CTE) between the prepreg or the composite substrate and the metal foil is preferably small. Since the coefficient of thermal expansion (CTE) of the resin is generally greater than that of the metal foil, it is preferred that the coefficient of thermal expansion (CTE) of the prepreg and the composite substrate be smaller.

配線基板有時於溫度相對較高之環境下使用。為了於此情形時亦確保配線基板之可靠性,較佳為預浸體及複合基材中所包含之樹脂具有足夠高之玻璃轉移溫度(Tg)。Wiring substrates are sometimes used in environments with relatively high temperatures. In order to secure the reliability of the wiring board also in this case, it is preferable that the resin contained in the prepreg and the composite base material have a sufficiently high glass transition temperature (Tg).

於配線基板中,複合基材與金屬箔之密接性較為重要。先前,有對金屬箔之複合基材側之表面進行表面粗糙化以提昇複合基材與金屬箔之密接性之技術。然而,該技術易造成高頻電流之損耗,從而欠佳。 作為提高複合基材與金屬箔之密接性而不對金屬箔之複合基材側之表面進行表面粗糙化之技術,專利文獻1中揭示有一種配線基板用樹脂組合物及使用該配線基板用樹脂組合物所得之配線基板(請求項1~4),該配線基板用樹脂組合物含有:包含聚苯醚及異氰尿酸三烯酯之聚苯醚系樹脂、以及三甲氧基乙烯基矽烷(TMVS)及三乙氧基乙烯基矽烷(TEVS)等乙烯基矽烷。 [先前技術文獻] [專利文獻] In wiring boards, the adhesion between the composite base material and the metal foil is important. Conventionally, there is a technique of roughening the surface of the metal foil on the side of the composite substrate to improve the adhesion between the composite substrate and the metal foil. However, this technique is prone to loss of high-frequency current, which is not good. Patent Document 1 discloses a resin composition for wiring boards and a resin composition for wiring boards using the same as a technique for improving the adhesiveness between the composite base material and the metal foil without roughening the surface of the metal foil on the side of the composite base material. The obtained wiring board (request items 1-4), the resin composition for wiring board contains: polyphenylene ether resin containing polyphenylene ether and trienyl isocyanurate, and trimethoxyvinylsilane (TMVS) And vinyl silanes such as triethoxy vinyl silane (TEVS). [Prior Art Literature] [Patent Document]

[專利文獻1]日本專利特開2004-259899號公報 [專利文獻2]韓國專利第10-1481417號說明書 [非專利文獻] [Patent Document 1] Japanese Patent Laid-Open No. 2004-259899 [Patent Document 2] Specification of Korean Patent No. 10-1481417 [Non-patent literature]

[非專利文獻1]JOURNAL OF POLYMER SCIENCE, PART A: POLYMER CHEMISTRY 2015, 53, 1707 - 1718. [非專利文獻2]J. Org. Chem. 2013, 78, 3329 - 3335. [Non-Patent Document 1] JOURNAL OF POLYMER SCIENCE, PART A: POLYMER CHEMISTRY 2015, 53, 1707 - 1718. [Non-Patent Document 2] J. Org. Chem. 2013, 78, 3329 - 3335.

[發明所欲解決之問題][Problem to be solved by the invention]

專利文獻1中使用之三甲氧基乙烯基矽烷(TMVS)及三乙氧基乙烯基矽烷(TEVS)等乙烯基矽烷係包含Si與作為極性原子之氧原子(O)之鍵之矽烷偶合劑。 本發明人等進行了研究,結果發現,於向硬化性組合物中添加包含Si與作為極性原子之氧原子(O)之鍵之矽烷偶合劑之情形時,所獲得之複合基材有介電損耗因數(D f)增加之傾向。 Vinylsilanes such as trimethoxyvinylsilane (TMVS) and triethoxyvinylsilane (TEVS) used in Patent Document 1 are silane coupling agents containing a bond between Si and an oxygen atom (O) as a polar atom. The inventors of the present invention conducted research and found that when a silane coupling agent containing a bond between Si and an oxygen atom (O) as a polar atom is added to the curable composition, the obtained composite substrate has dielectric properties. Tendency to increase loss factor (D f ).

本發明人等發現包含2個以上反應性乙烯基且不包含Si與極性原子之鍵的具有特定化學結構之有機矽化合物可用作硬化性組合物之交聯劑,使用包含該有機矽化合物之硬化性組合物所得之複合基材係高頻條件下之介電損耗因數(D f)有效降低,熱膨脹係數(CTE)足夠低,玻璃轉移溫度(Tg)足夠高,而具有對於高頻區域中所使用之配線基板用途而言良好之特性。 再者,於專利文獻1中,藉由使用矽烷偶合劑而提高複合基材與金屬箔之密接性,但關於將有機矽化合物用作交聯劑,並無記載及提示。 The inventors of the present invention have found that an organosilicon compound with a specific chemical structure that contains more than two reactive vinyl groups and does not contain a bond between Si and a polar atom can be used as a crosslinking agent for a curable composition. The composite base material obtained from the curable composition effectively reduces the dielectric loss factor (D f ) under high-frequency conditions, the coefficient of thermal expansion (CTE) is sufficiently low, and the glass transition temperature (Tg) is sufficiently high, and it is suitable for the high-frequency region Good characteristics for the wiring board used. Furthermore, in Patent Document 1, the adhesiveness between the composite substrate and the metal foil is improved by using a silane coupling agent, but there is no description or suggestion about using an organosilicon compound as a crosslinking agent.

作為其他本發明之本發明之相關技術,可例舉非專利文獻1、2及專利文獻2。 於非專利文獻1中,合成出一種於Si鍵結有2個4-乙烯基苯基及2個烷基(具體而言為-C 8H 17)之有機矽化合物。反應路徑圖如下。於非專利文獻1中,使合成之有機矽化合物進行聚合,對所獲得之直鏈聚合物之螢光特性進行評估。於非專利文獻1中,有機矽化合物係作為單體而使用,關於將其用作交聯劑,並無記載及提示,關於介電特性亦無記載。 Non-Patent Documents 1 and 2 and Patent Document 2 can be cited as related technologies of the present invention of other present inventions. In Non-Patent Document 1, an organosilicon compound having two 4-vinylphenyl groups and two alkyl groups (specifically -C 8 H 17 ) bonded to Si was synthesized. The reaction path diagram is as follows. In Non-Patent Document 1, a synthesized organosilicon compound was polymerized, and the fluorescent properties of the obtained linear polymer were evaluated. In Non-Patent Document 1, the organosilicon compound is used as a monomer, but there is no description or hint about its use as a crosslinking agent, and there is no description about the dielectric properties.

[化1]

Figure 02_image003
[chemical 1]
Figure 02_image003

於非專利文獻2中,合成出一種於Si鍵結有2個2-乙烯基苯基及2個烷基(具體而言為-Me、-Et或-Ph)之有機矽化合物。於非專利文獻2中,對合成之有機矽化合物進行閉環複分解(Ring-closing metathesis),而合成出二苯并共軛七員雜環系化合物類。反應路徑圖如下。於非專利文獻2中,關於有機矽化合物之用途並無記載,關於將其用作交聯劑,並無記載及提示,關於介電特性亦無記載。In Non-Patent Document 2, an organosilicon compound having two 2-vinylphenyl groups and two alkyl groups (specifically -Me, -Et or -Ph) bonded to Si was synthesized. In Non-Patent Document 2, ring-closing metathesis is performed on the synthesized organosilicon compound to synthesize dibenzo-conjugated seven-membered heterocyclic compounds. The reaction path diagram is as follows. In Non-Patent Document 2, there is no record about the use of organosilicon compounds, there is no record or hint about its use as a crosslinking agent, and there is no record about dielectric properties.

[化2]

Figure 02_image005
[Chem 2]
Figure 02_image005

於專利文獻2中,合成出一種於Si上取代有2個2-、3-或4-乙烯基苯基及2個烷基之複數個有機矽化合物。以下之[化3]中示出專利文獻2中合成之有機矽化合物之例。於專利文獻2中,有機矽化合物用於阻氣,關於將其用作交聯劑,並無記載及提示,關於介電特性亦無記載。In Patent Document 2, a plurality of organosilicon compounds in which two 2-, 3- or 4-vinylphenyl groups and two alkyl groups are substituted on Si were synthesized. An example of the organosilicon compound synthesized in Patent Document 2 is shown in [Chemical 3] below. In Patent Document 2, the organosilicon compound is used as a gas barrier, but there is no description or hint about its use as a crosslinking agent, and there is no description about the dielectric properties.

[化3]

Figure 02_image007
[Chem 3]
Figure 02_image007

除上述以外,亦報告有與Si鍵結之4個原子均為非極性原子且具有2個以上反應性乙烯基之若干個有機矽化合物。然而,關於將與Si鍵結之4個原子均為非極性原子且具有2個以上反應性乙烯基之有機矽化合物用作交聯劑,以往並無報告。與Si鍵結之4個原子均為非極性原子且具有2個以上反應性乙烯基之有機矽化合物作為交聯劑均較為新穎。 進而,與Si鍵結之4個原子均為非極性原子且具有2個以上反應性乙烯基之有機矽化合物之中,若干個具有特定結構之有機矽化合物作為化合物較為新穎。 具體而言,與Si鍵結之4個原子均為非極性原子、含有包含乙烯基苯基之2個以上反應性官能基且苯環上之乙烯基之取代位置為間位之有機矽系化合物(有機矽系化合物中所包含之苯環可具有取代基)作為化合物較為新穎。 In addition to the above, some organosilicon compounds in which all four atoms bonded to Si are non-polar atoms and have two or more reactive vinyl groups have also been reported. However, there has been no report on the use of an organosilicon compound whose four atoms bonded to Si are all non-polar atoms and has two or more reactive vinyl groups as a crosslinking agent. The 4 atoms bonded to Si are all non-polar atoms and the organosilicon compounds with more than 2 reactive vinyl groups are relatively novel as cross-linking agents. Furthermore, among organosilicon compounds whose four atoms bonded to Si are all non-polar atoms and have two or more reactive vinyl groups, several organosilicon compounds with specific structures are relatively new compounds. Specifically, the 4 atoms bonded to Si are all non-polar atoms, contain more than 2 reactive functional groups including vinylphenyl, and the substitution position of the vinyl group on the benzene ring is meta-position (The benzene ring contained in the organosilicon compound may have a substituent) is relatively novel as a compound.

本發明係鑒於上述情況而完成者,其目的在於提供一種適宜用作交聯劑等之新穎之有機矽化合物。 又,本發明之目的在於提供一種適宜用於硬化性組合物且能夠獲得高頻條件下之介電損耗因數(D f)有效降低、熱膨脹係數(CTE)足夠低且玻璃轉移溫度(Tg)足夠高之(半)硬化物的新穎之交聯劑及使用該交聯劑之硬化性組合物。 本發明之新穎之有機矽化合物及新穎之交聯劑係適宜用於預浸體、覆金屬之積層板及配線基板等用途中所使用之硬化性組合物者,但可用於任意用途。 [解決問題之技術手段] The present invention was made in view of the above circumstances, and an object of the present invention is to provide a novel organosilicon compound suitable for use as a crosslinking agent or the like. Moreover, the object of the present invention is to provide a kind of suitable for curable composition and can obtain the dielectric dissipation factor (D f ) under the condition of high frequency to effectively reduce, the coefficient of thermal expansion (CTE) is low enough and the glass transition temperature (Tg) is enough A novel crosslinking agent for highly (semi)cured products and a curable composition using the crosslinking agent. The novel organosilicon compound and novel crosslinking agent of the present invention are suitable for use in curable compositions used in applications such as prepregs, metal-clad laminates, and wiring boards, but can be used in any application. [Technical means to solve the problem]

本發明提供以下新穎之有機矽化合物、新穎之交聯劑、硬化性組合物、預浸體、積層體、覆金屬之積層板及配線基板。The present invention provides the following novel organosilicon compounds, novel crosslinking agents, curable compositions, prepregs, laminates, metal-clad laminates and wiring boards.

[1]一種有機矽化合物,其係由下式(1m)表示。 [2]一種交聯劑,其係由下式(1m)表示。 [化4]

Figure 02_image009
(上式中,M為單鍵或可具有取代基之碳數1~20之伸烷基;苯環可具有取代基;苯環上之乙烯基之取代位置為間位;n為2~4之整數;R為氫原子、羥基或有機基,於R為有機基時,與Si鍵結之原子為C) [1] An organosilicon compound represented by the following formula (1m). [2] A crosslinking agent represented by the following formula (1m). [chemical 4]
Figure 02_image009
(In the above formula, M is a single bond or an alkylene group with a carbon number of 1 to 20 that may have a substituent; the benzene ring may have a substituent; the substitution position of the vinyl group on the benzene ring is the meta position; n is 2 to 4 Integer; R is a hydrogen atom, a hydroxyl group or an organic group, when R is an organic group, the atom bonded to Si is C)

[3]一種硬化性組合物,其包含:[2]之交聯劑、及具有能夠與該交聯劑交聯之2個以上交聯性官能基之硬化性化合物。 [4]一種預浸體,其包含:纖維基材、及[3]之硬化性組合物之半硬化物或硬化物。 [5]一種積層體,其包含:基材、及含有[3]之硬化性組合物之硬化性組合物層。 [6]一種積層體,其包含:基材、及含有[3]之硬化性組合物之半硬化物或硬化物之含(半)硬化物之層。 [7]如[5]或[6]之積層體,其中上述基材為樹脂膜或金屬箔。 [8]一種覆金屬之積層板,其包含:含有[3]之硬化性組合物之硬化物之絕緣層、及金屬箔。 [9]一種配線基板,其包含:含有[3]之硬化性組合物之硬化物之絕緣層、及配線。 [發明之效果] [3] A curable composition comprising: the crosslinking agent of [2], and a curable compound having two or more crosslinkable functional groups capable of crosslinking with the crosslinking agent. [4] A prepreg comprising: a fiber base material, and a semi-cured or cured product of the curable composition of [3]. [5] A laminate comprising: a substrate, and a curable composition layer containing the curable composition of [3]. [6] A laminate comprising: a substrate, and a semi-cured product containing the curable composition of [3] or a layer containing a (semi)cured product of the cured product. [7] The laminate according to [5] or [6], wherein the base material is a resin film or a metal foil. [8] A metal-clad laminate comprising: an insulating layer containing a cured product of the curable composition of [3]; and a metal foil. [9] A wiring board comprising: an insulating layer comprising a cured product of the curable composition of [3]; and wiring. [Effect of Invention]

根據本發明,可提供一種適宜用作交聯劑等之新穎之有機矽化合物。根據本發明,可提供一種適宜用於硬化性組合物且能夠獲得高頻條件下之介電損耗因數(D f)有效降低、熱膨脹係數(CTE)足夠低且玻璃轉移溫度(Tg)足夠高之(半)硬化物的新穎之交聯劑及使用該交聯劑之硬化性組合物。 According to the present invention, a novel organosilicon compound suitable for use as a crosslinking agent and the like can be provided. According to the present invention, it is possible to provide a compound suitable for curable compositions that can effectively reduce the dielectric loss factor (D f ) under high frequency conditions, have a sufficiently low coefficient of thermal expansion (CTE), and have a sufficiently high glass transition temperature (Tg). Novel cross-linking agent for (semi)cured products and curable composition using the cross-linking agent.

於本說明書中,(半)硬化係半硬化及硬化之總稱。 於本說明書中,除非特別分開記載,否則「配線基板」包含多層配線基板。 於本說明書中,「高頻區域」定義為頻率1 GHz以上之區域。 於本說明書中,除非另有說明,否則「數量平均分子量(Mn)」係藉由凝膠滲透層析(GPC)法求出之聚苯乙烯換算之數量平均分子量。 於本說明書中,除非另有說明,否則表示數值範圍之「~」係以包含記載於其前後之數值作為下限值及上限值之含義來使用。 以下,對本發明之實施方式進行說明。 In this specification, (semi) hardening is a generic term for semi-hardening and hardening. In this specification, "wiring board" includes a multilayer wiring board unless otherwise specified. In this specification, "high frequency region" is defined as a region with a frequency above 1 GHz. In this specification, unless otherwise stated, "number average molecular weight (Mn)" is the number average molecular weight in terms of polystyrene calculated|required by the gel permeation chromatography (GPC) method. In this specification, unless otherwise stated, "~" which shows a numerical range is used in the meaning which includes the numerical value described before and after it as a lower limit and an upper limit. Embodiments of the present invention will be described below.

[新穎之有機矽化合物、新穎之交聯劑] 本發明之有機矽化合物係由下式(1m)表示。 本發明之有機矽化合物適宜作為交聯劑等。 本發明之交聯劑係由下式(1m)表示。 [化5]

Figure 02_image011
(上式中,M為單鍵或可具有取代基之碳數1~20之伸烷基;苯環可具有取代基;苯環上之乙烯基之取代位置為間位;n為2~4之整數;R為氫原子、羥基或有機基,於R為有機基時,與Si鍵結之原子為C) [Novel organosilicon compound, novel crosslinking agent] The organosilicon compound of the present invention is represented by the following formula (1m). The organosilicon compound of the present invention is suitable as a crosslinking agent and the like. The crosslinking agent of the present invention is represented by the following formula (1m). [chemical 5]
Figure 02_image011
(In the above formula, M is a single bond or an alkylene group with a carbon number of 1 to 20 that may have a substituent; the benzene ring may have a substituent; the substitution position of the vinyl group on the benzene ring is the meta position; n is 2 to 4 Integer; R is a hydrogen atom, a hydroxyl group or an organic group, when R is an organic group, the atom bonded to Si is C)

本發明之有機矽化合物及交聯劑可用於任意用途,對於硬化性組合物、預浸體、積層體、覆金屬之積層板及配線基板等較為適宜。The organosilicon compound and crosslinking agent of the present invention can be used for any purpose, and are suitable for curable compositions, prepregs, laminates, metal-clad laminates, wiring boards, and the like.

[硬化性組合物] 本發明之硬化性組合物包含:本發明之交聯劑、及具有能夠與該交聯劑交聯之2個以上交聯性官能基之硬化性化合物。 硬化性組合物可為熱硬化性亦可為活性能量線硬化性。活性能量線硬化性組合物係藉由紫外線及電子束等活性能量線之照射而硬化之組合物。於覆金屬之積層板及配線基板等用途中,較佳為熱硬化性。 [hardening composition] The curable composition of the present invention includes the crosslinking agent of the present invention and a curable compound having two or more crosslinkable functional groups capable of crosslinking with the crosslinking agent. The curable composition may be thermosetting or active energy ray curable. The active energy ray curable composition is a composition cured by irradiation with active energy rays such as ultraviolet rays and electron beams. For applications such as metal-clad laminates and wiring boards, thermosetting properties are preferred.

作為硬化性化合物,可例舉:單體、低聚物及預聚物等。該等可使用1種以上。 作為硬化性化合物之硬化物,可例舉:聚苯醚樹脂(PPE)、雙馬來醯亞胺樹脂、環氧樹脂、氟樹脂、聚醯亞胺樹脂、烯烴系樹脂、聚酯樹脂、聚苯乙烯樹脂、烴彈性體、苯并㗁𠯤樹脂、活性酯樹脂、氰酸酯樹脂、丁二烯樹脂、氫化或非氫化苯乙烯丁二烯樹脂、乙烯系樹脂、環烯烴聚合物、芳香族聚合物、二乙烯基芳香族聚合物及該等之組合等。 As a curable compound, a monomer, an oligomer, a prepolymer, etc. are mentioned. These can use 1 or more types. Examples of cured products of curable compounds include: polyphenylene ether resin (PPE), bismaleimide resin, epoxy resin, fluororesin, polyimide resin, olefin resin, polyester resin, polyester resin, Styrene resin, hydrocarbon elastomer, benzo㗁𠯤 resin, active ester resin, cyanate resin, butadiene resin, hydrogenated or non-hydrogenated styrene butadiene resin, vinyl resin, cycloolefin polymer, aromatic Polymers, divinyl aromatic polymers, combinations thereof, etc.

於覆金屬之積層板及配線基板等用途中,硬化性化合物之硬化物較佳為包含聚苯醚樹脂(PPE)。 於本說明書中,除非另有說明,否則「聚苯醚樹脂(PPE)」包含非改性聚苯醚樹脂及改性聚苯醚樹脂。 In applications such as metal-clad laminates and wiring boards, the cured product of the curable compound preferably contains polyphenylene ether resin (PPE). In this specification, unless otherwise specified, "polyphenylene ether resin (PPE)" includes non-modified polyphenylene ether resin and modified polyphenylene ether resin.

於上述用途中,作為硬化性化合物,例如較佳為下式(P)所表示之聚苯醚低聚物。 [化6]

Figure 02_image013
In the above use, as a curable compound, for example, a polyphenylene ether oligomer represented by the following formula (P) is preferable. [chemical 6]
Figure 02_image013

式(P)之兩端之X分別獨立地為下式(x1)或下式(x2)所表示之基。該等式中,「*」表示與氧原子之鍵結鍵。 [化7]

Figure 02_image015
X at both ends of the formula (P) is independently a group represented by the following formula (x1) or the following formula (x2). In this equation, "*" represents a bond with an oxygen atom. [chemical 7]
Figure 02_image015

m較佳為1~20,更佳為3~15。 n較佳為1~20,更佳為3~15。 m is preferably 1-20, more preferably 3-15. n is preferably 1-20, more preferably 3-15.

硬化性組合物之(半)硬化物包含硬化性化合物與本發明之交聯劑之反應產物。The (semi)cured product of the curable composition comprises the reaction product of the curable compound and the crosslinker according to the invention.

低聚物之數量平均分子量(Mn)並無特別限制,較佳為1000~5000,更佳為1000~4000。The number average molecular weight (Mn) of the oligomer is not particularly limited, but is preferably 1000-5000, more preferably 1000-4000.

硬化性組合物較佳為包含1種以上聚合起始劑。作為聚合起始劑,可使用有機過氧化物、偶氮系化合物、其他公知之聚合起始劑、及該等之組合。作為具體例,可例舉:二異丙苯基過氧化物、過氧化苯甲醯、異丙苯過氧化氫、2,5-二甲基己烷-2,5-二過氧化氫、2,5-二甲基-2,5-二(第三丁基過氧基)己炔-3、二-第三丁基過氧化物、第三丁基異丙苯基過氧化物、α,α'-二(第三丁基過氧基)二異丙基苯、2,5-二甲基-2,5-二(第三丁基過氧基)己烷、過氧化間苯二甲酸二-第三丁酯、過氧化苯甲酸第三丁酯、2,2-雙(第三丁基過氧基)丁烷、2,2-雙(第三丁基過氧基)辛烷、2,5-二甲基-2,5-二(苯甲醯基過氧基)己烷、二(三甲基矽烷基)過氧化物、三甲基矽烷基三苯基矽烷基過氧化物及偶氮二異丁腈等。The curable composition preferably contains one or more polymerization initiators. As the polymerization initiator, organic peroxides, azo compounds, other known polymerization initiators, and combinations thereof can be used. As specific examples, dicumyl peroxide, benzoyl peroxide, cumene hydroperoxide, 2,5-dimethylhexane-2,5-dihydroperoxide, 2 ,5-Dimethyl-2,5-di(tert-butylperoxy)hexyne-3, di-tert-butyl peroxide, tert-butylcumyl peroxide, α, α'-bis(tert-butylperoxy)diisopropylbenzene, 2,5-dimethyl-2,5-bis(tert-butylperoxy)hexane, isophthalic acid peroxide Di-tert-butyl ester, tert-butyl peroxybenzoate, 2,2-bis(tert-butylperoxy)butane, 2,2-bis(tert-butylperoxy)octane, 2,5-Dimethyl-2,5-bis(benzoylperoxy)hexane, bis(trimethylsilyl)peroxide, trimethylsilyltriphenylsilylperoxide And azobisisobutyronitrile, etc.

硬化性組合物可視需要包含1種以上添加劑。作為添加劑,可例舉:無機填充材(亦稱為填料)、相容劑及阻燃劑等。 作為無機填充材,例如可例舉:球狀二氧化矽等二氧化矽、氧化鋁、氧化鈦及雲母等金屬氧化物;氫氧化鋁及氫氧化鎂等金屬氫氧化物;滑石;硼酸鋁;硫酸鋇;碳酸鈣等。該等可使用1種以上。其中,就低熱膨脹性之觀點而言,較佳為二氧化矽、雲母及滑石等,更佳為球狀二氧化矽。 無機填充材可為利用環氧矽烷型、乙烯基矽烷型、甲基丙烯基矽烷型、或胺基矽烷型之矽烷偶合劑進行了表面處理者。利用矽烷偶合劑進行之表面處理之時機並無特別限制。可預先準備利用矽烷偶合劑進行了表面處理之無機填充材,亦可於製備硬化性組合物時,藉由整體摻合法添加矽烷偶合劑。 The curable composition may contain 1 or more types of additives as needed. As an additive, an inorganic filler (it is also called a filler), a compatibilizer, a flame retardant, etc. are mentioned. Examples of the inorganic filler include: metal oxides such as silicon dioxide such as spherical silica, aluminum oxide, titanium oxide, and mica; metal hydroxides such as aluminum hydroxide and magnesium hydroxide; talc; aluminum borate; Barium Sulfate; Calcium Carbonate, etc. These can use 1 or more types. Among them, from the viewpoint of low thermal expansion, silica, mica, talc, etc. are preferable, and spherical silica is more preferable. The inorganic filler can be surface treated with epoxy silane type, vinyl silane type, methacryl silane type, or amino silane type silane coupling agent. The timing of the surface treatment with the silane coupling agent is not particularly limited. Inorganic fillers that have been surface-treated with silane coupling agents can be prepared in advance, and silane coupling agents can also be added by integral blending when preparing curable compositions.

作為阻燃劑,例如可例舉鹵素系阻燃劑及磷系阻燃劑等。該等可使用1種以上。作為鹵素系阻燃劑,例如可例舉:五溴二苯醚、八溴二苯醚、十溴二苯醚、四溴雙酚A、六溴環十二烷等溴系阻燃劑;氯化石蠟等氯系阻燃劑等。作為磷系阻燃劑,例如可例舉:縮合磷酸酯及環狀磷酸酯等磷酸酯;環狀磷腈化合物等磷腈化合物;二烷基次膦酸鋁鹽等次膦酸鹽系阻燃劑;磷酸三聚氰胺及聚磷酸三聚氰胺等三聚氰胺系阻燃劑;具有二苯基氧化膦基之氧化膦化合物等。As a flame retardant, a halogen type flame retardant, a phosphorus type flame retardant, etc. are mentioned, for example. These can use 1 or more types. Examples of halogen-based flame retardants include brominated flame retardants such as pentabromodiphenyl ether, octabromodiphenyl ether, decabromodiphenyl ether, tetrabromobisphenol A, and hexabromocyclododecane; Chlorine-based flame retardants such as paraffin wax, etc. Examples of phosphorus-based flame retardants include: phosphoric acid esters such as condensed phosphoric acid esters and cyclic phosphoric acid esters; phosphazene compounds such as cyclic phosphazene compounds; melamine-based flame retardants such as melamine phosphate and melamine polyphosphate; phosphine oxide compounds with diphenylphosphine oxide groups, etc.

硬化性組合物可視需要包含1種以上有機溶劑。有機溶劑並無特別限制,可例舉:甲基乙基酮等酮類;二丁醚等醚類;乙酸乙酯等酯類;二甲基甲醯胺等胺類;苯、甲苯及二甲苯等芳香族烴類;三氯乙烯等氯化烴等。The curable composition may contain one or more types of organic solvents as needed. Organic solvents are not particularly limited, and examples include: ketones such as methyl ethyl ketone; ethers such as dibutyl ether; esters such as ethyl acetate; amines such as dimethylformamide; benzene, toluene, and xylene Aromatic hydrocarbons such as trichlorethylene; chlorinated hydrocarbons such as trichlorethylene, etc.

於硬化性組合物中,固形物成分濃度及成分組成可根據用途等進行設計。 於預浸體等用途中,固形物成分濃度較佳為50~90質量%。 In the curable composition, the solid content concentration and component composition can be designed according to the application and the like. In applications such as prepregs, the solid content concentration is preferably from 50 to 90% by mass.

[預浸體] 本發明之預浸體包含纖維基材、及本發明之硬化性組合物之(半)硬化物。(半)硬化物可視需要包含無機填充材(填料)等添加劑。 預浸體可藉由如下方式製造:使硬化性組合物含浸於纖維基材中,並藉由熱硬化等使其(半)硬化。 [Prepreg] The prepreg of the present invention includes a fibrous base material and a (semi)cured product of the curable composition of the present invention. The (semi)cured product may optionally contain additives such as inorganic fillers (fillers). The prepreg can be produced by impregnating a curable composition into a fibrous base material and (semi)hardening it by thermosetting or the like.

纖維基材之材料並無特別限制,可例舉:玻璃纖維、二氧化矽纖維及碳纖維等無機纖維;芳香族聚醯胺纖維及聚酯纖維等有機纖維;該等之組合等。於覆金屬之積層板及配線基板等用途中,較佳為玻璃纖維等。作為玻璃纖維基材之形態,可例舉:玻璃布、玻璃紙及玻璃氈等。The material of the fiber substrate is not particularly limited, and examples thereof include inorganic fibers such as glass fibers, silica fibers, and carbon fibers; organic fibers such as aramid fibers and polyester fibers; combinations thereof, and the like. For applications such as metal-clad laminates and wiring boards, glass fibers and the like are preferred. As a form of a glass fiber base material, glass cloth, cellophane, glass mat, etc. are mentioned.

硬化性組合物之硬化條件可根據硬化性組合物之組成進行設定,較佳為半硬化條件(不完全硬化之條件)。 於使用包含上式(P)所表示之聚苯醚低聚物之硬化性組合物之情形時,較佳為例如於80~180℃下加熱1~10分鐘之熱硬化。 於覆金屬之積層板及配線基板等用途中,較佳為對硬化性組合物之組成及硬化條件進行調整以使所獲得之預浸體中之樹脂含量處於40~80質量%之範圍內。 The curing conditions of the curable composition can be set according to the composition of the curable composition, and semi-hardening conditions (conditions of incomplete curing) are preferred. In the case of using a curable composition containing a polyphenylene ether oligomer represented by the above formula (P), thermal curing by heating, for example, at 80 to 180° C. for 1 to 10 minutes is preferred. In applications such as metal-clad laminates and wiring boards, it is preferable to adjust the composition and curing conditions of the curable composition so that the resin content in the obtained prepreg is within the range of 40 to 80% by mass.

[積層體] 本發明之第1積層體包含:基材、及含有上述本發明之硬化性組合物之硬化性組合物層。 本發明之第2積層體包含:基材、及含有上述本發明之硬化性組合物之(半)硬化物之含(半)硬化物之層。 於本發明之第1、第2積層體中,基材並無特別限制,可例舉:樹脂膜、金屬箔及該等之組合等。 樹脂膜並無特別限制,可使用公知者。作為樹脂膜之構成樹脂,可例舉:聚醯亞胺、聚對苯二甲酸乙二酯(PET)、聚萘二甲酸乙二酯、環烯烴聚合物及聚醚硫醚等。 就電阻較低之情況而言,金屬箔較佳為銅箔、銀箔、金箔、鋁箔及該等之組合等,更佳為銅箔等。 [laminated body] The first laminate of the present invention includes: a base material; and a curable composition layer containing the above-mentioned curable composition of the present invention. The second laminate of the present invention includes a substrate and a (semi)cured layer containing a (semi)cured product of the curable composition of the present invention. In the first and second laminates of the present invention, the substrate is not particularly limited, and examples thereof include resin films, metal foils, and combinations thereof. The resin film is not particularly limited, and known ones can be used. The constituent resin of the resin film may, for example, be polyimide, polyethylene terephthalate (PET), polyethylene naphthalate, cycloolefin polymer or polyether sulfide. In the case of low resistance, the metal foil is preferably copper foil, silver foil, gold foil, aluminum foil and combinations thereof, more preferably copper foil or the like.

[覆金屬之積層板] 本發明之覆金屬之積層板包含:含有本發明之硬化性組合物之硬化物之絕緣層、及金屬箔。 絕緣層可為包含纖維基材及本發明之硬化性組合物之硬化物之層。 就電阻較低之情況而言,金屬箔較佳為銅箔、銀箔、金箔、鋁箔及該等之組合等,更佳為銅箔等。金屬箔可為表面具有金屬鍍覆層者。金屬箔亦可為包含極薄金屬箔及支持該極薄金屬箔之載體金屬箔之附有載體之金屬箔。金屬箔亦可為至少一表面實施了防銹處理、矽烷處理、表面粗糙化處理及障壁形成處理等表面處理者。 金屬箔之厚度並無特別限制,就適宜形成配線等導體圖案(亦稱為電路圖案)之情況而言,較佳為0.1~100 μm,更佳為0.2~50 μm,特佳為1.0~40 μm。 [Metal-clad laminate] The metal-clad laminate of the present invention includes an insulating layer containing a cured product of the curable composition of the present invention, and a metal foil. The insulating layer may be a layer comprising a fibrous base material and a cured product of the curable composition of the present invention. In the case of low resistance, the metal foil is preferably copper foil, silver foil, gold foil, aluminum foil and combinations thereof, more preferably copper foil or the like. The metal foil may have a metal plating layer on the surface. The metal foil may also be a metal foil with a carrier including an ultra-thin metal foil and a carrier metal foil supporting the ultra-thin metal foil. The metal foil may have at least one surface subjected to surface treatments such as antirust treatment, silane treatment, surface roughening treatment, and barrier forming treatment. The thickness of the metal foil is not particularly limited, but it is preferably 0.1 to 100 μm, more preferably 0.2 to 50 μm, and most preferably 1.0 to 40 μm.

覆金屬之積層板可為單面具有金屬箔之單面覆金屬之積層板,亦可為雙面具有金屬箔之雙面覆金屬之積層板,較佳為雙面覆金屬之積層板。 單面覆金屬之積層板可藉由如下方式製造:將1個以上之上述預浸體與金屬箔重疊,獲得第1暫時積層體,對該第1暫時積層體進行加熱加壓。 雙面覆金屬之積層板可藉由如下方式製造:利用一對金屬箔夾住1個以上之上述預浸體,獲得第1暫時積層體,對該第1暫時積層體進行加熱加壓。 使用銅箔作為金屬箔之覆金屬之積層板稱為銅箔積層板(Copper Clad Laminate:CCL)。 The metal-clad laminate can be a single-sided metal-clad laminate with metal foil on one side, or a double-sided metal-clad laminate with metal foil on both sides, preferably a double-sided metal-clad laminate. A single-sided metal-clad laminate can be produced by laminating one or more of the aforementioned prepregs and metal foil to obtain a first temporary laminate, and heating and pressing the first temporary laminate. A double-sided metal-clad laminate can be produced by sandwiching one or more of the above-mentioned prepregs with a pair of metal foils to obtain a first temporary laminate, and heating and pressing the first temporary laminate. A metal-clad laminate using copper foil as the metal foil is called a copper clad laminate (CCL).

絕緣層較佳為包含預浸體之加熱加壓物。預浸體之加熱加壓物包含纖維基材及樹脂,可視需要包含無機填充材及阻燃劑等1種以上添加劑。預浸體之加熱加壓物亦稱為複合基材。 第1暫時積層體之加熱加壓條件並無特別限制,例如較佳為溫度170~250℃、壓力0.3~30 MPa、時間3~240分鐘。 The insulating layer is preferably a heat-pressed product including a prepreg. The heated and pressed material of the prepreg contains a fiber base material and a resin, and optionally contains one or more additives such as an inorganic filler and a flame retardant. The heated and pressed prepreg is also called composite substrate. The heating and pressing conditions of the first temporary laminate are not particularly limited, for example, a temperature of 170 to 250° C., a pressure of 0.3 to 30 MPa, and a time of 3 to 240 minutes are preferable.

圖1及圖2中示出本發明之第1、第2實施方式之覆金屬之積層板之模式剖視圖。 圖1所示之覆金屬之積層板1包含預浸體之加熱加壓物,且係於含有本發明之硬化性組合物之硬化物之複合基材(含硬化物之層)11之單面積層金屬箔(金屬層)12所得之單面覆金屬之積層板(積層體)。 圖2所示之覆金屬之積層板2包含預浸體之加熱加壓物,且係於含有本發明之硬化性組合物之硬化物之複合基材(含硬化物之層)11之雙面積層金屬箔(金屬層)12所得之雙面覆金屬之積層板。 1 and 2 show schematic cross-sectional views of metal-clad laminates according to the first and second embodiments of the present invention. The metal-clad laminate 1 shown in FIG. 1 includes a heated and pressed prepreg on one side of a composite base material (layer containing a cured product) 11 containing a cured product of the curable composition of the present invention. One-side metal-clad laminate (laminate) obtained by laminating metal foil (metal layer) 12. The metal-clad laminate 2 shown in FIG. 2 includes a heated and pressed prepreg on both sides of a composite base material (layer containing the cured product) 11 containing a cured product of the curable composition of the present invention. A double-sided metal-clad laminate obtained by laminating metal foil (metal layer) 12.

覆金屬之積層板1、2亦可具有除上述以外之層。 覆金屬之積層板1、2可於複合基材(含硬化物之層)11與金屬箔(金屬層)12之間具有接著層以提高該等之接著性。作為接著層之材料,可使用公知者,可例舉:環氧樹脂、氰酸酯樹脂、丙烯酸樹脂、聚醯亞胺樹脂、馬來醯亞胺樹脂、接著性氟樹脂及該等之組合等。作為市售之接著性氟樹脂,可例舉:AGC公司製造之「Fluon LM-ETFE LH-8000」、「AH-5000」、「AH-2000」及「EA-2000」等。 The metal-clad laminates 1 and 2 may also have layers other than those described above. The metal-clad laminates 1 and 2 may have an adhesive layer between the composite substrate (layer containing hardened material) 11 and the metal foil (metal layer) 12 to improve the adhesiveness. As the material of the adhesive layer, well-known ones can be used, such as: epoxy resin, cyanate resin, acrylic resin, polyimide resin, maleimide resin, adhesive fluororesin and combinations thereof, etc. . Examples of commercially available adhesive fluororesins include "Fluon LM-ETFE LH-8000", "AH-5000", "AH-2000", and "EA-2000" manufactured by AGC Corporation.

複合基材之厚度可根據用途適當進行設計。就預防配線基板斷線之觀點而言,較佳為50 μm以上,更佳為70 μm以上,特佳為100 μm以上。就配線基板之柔軟性、小型化及輕量化之觀點而言,較佳為300 μm以下,更佳為250 μm以下,特佳為200 μm以下。The thickness of the composite substrate can be properly designed according to the application. From the viewpoint of preventing disconnection of the wiring board, it is preferably at least 50 μm, more preferably at least 70 μm, and particularly preferably at least 100 μm. From the viewpoint of flexibility, miniaturization, and weight reduction of the wiring board, it is preferably at most 300 μm, more preferably at most 250 μm, and most preferably at most 200 μm.

[配線基板] 本發明之配線基板包含:含有本發明之硬化性組合物之硬化物之絕緣層、及配線。 配線基板可藉由使用位於上述本發明之覆金屬之積層板之最表面之金屬箔形成配線等導體圖案(電路圖案)來製造。作為形成配線等導體圖案之方法,可例舉:對金屬箔進行蝕刻而形成配線等之減成法、及於金屬箔上藉由鍍覆而形成配線之MSAP(Modified Semi Additive Process,改良型半加成)法等。 [Wiring board] The wiring board of the present invention includes an insulating layer containing a cured product of the curable composition of the present invention, and wiring. A wiring board can be manufactured by forming a conductor pattern (circuit pattern) such as wiring using the metal foil positioned on the outermost surface of the above-mentioned metal-clad laminate of the present invention. As a method of forming conductor patterns such as wiring, there may be mentioned a subtractive method in which wiring is formed by etching metal foil, and MSAP (Modified Semi Additive Process) in which wiring is formed on metal foil by plating. addition) method, etc.

圖3中示出本發明之一實施方式之配線基板之模式剖視圖。圖3所示之配線基板3係使用圖2所示之位於第2實施方式之覆金屬之積層板2之至少一個最表面的金屬箔12形成配線22W等導體圖案(電路圖案)22所得者。 配線基板3包含預浸體之加熱加壓物,且於含有本發明之硬化性組合物之硬化物之複合基材(含硬化物之層、絕緣層)11之至少單面形成有配線22W等導體圖案(電路圖案)22。 FIG. 3 shows a schematic cross-sectional view of a wiring board according to an embodiment of the present invention. The wiring board 3 shown in FIG. 3 is obtained by forming conductor patterns (circuit patterns) 22 such as wiring 22W using the metal foil 12 on at least one outermost surface of the metal-clad laminate 2 of the second embodiment shown in FIG. 2 . The wiring board 3 includes a heated and pressed prepreg, and wiring 22W and the like are formed on at least one side of a composite base material (cured material-containing layer, insulating layer) 11 containing a cured product of the curable composition of the present invention. Conductor pattern (circuit pattern) 22 .

亦可藉由如下方式製造多層配線基板(亦稱為多層印刷配線板):對所獲得之配線基板進一步重疊1個以上之預浸體,利用一對金屬箔將其夾住,獲得第2暫時積層體,對該第2暫時積層體進行加熱加壓,並使用最表面之金屬箔形成配線等導體圖案。最表面之金屬箔可僅配置於第2暫時積層體之單面側。 本發明之配線基板適宜於高頻區域(頻率10 GHz以上之區域)中使用。 It is also possible to manufacture a multilayer wiring board (also called a multilayer printed wiring board) by further stacking one or more prepregs on the obtained wiring board, sandwiching them with a pair of metal foils, and obtaining a second temporary For the laminate, the second temporary laminate is heated and pressed, and conductive patterns such as wiring are formed using the metal foil on the outermost surface. The metal foil on the outermost surface may be arranged only on one side of the second temporary laminate. The wiring board of the present invention is suitable for use in a high-frequency region (a region with a frequency of 10 GHz or higher).

近年來,於攜帶用電子機器等用途中,通訊不斷高速化及大容量化,且信號之高頻化不斷發展。對用於該用途之配線基板,要求降低高頻區域中之傳輸損耗。因此,對用於上述用途之配線基板之複合基材中所包含之樹脂,要求降低高頻區域中之介電損耗。介電損耗因數(D f)通常依存於頻率,相同材料有頻率越高則介電損耗因數(D f)越大之傾向。複合基材中所包含之樹脂較佳為高頻條件下之介電損耗因數(D f)較低。 In recent years, in applications such as portable electronic devices, communication has been increasing in speed and capacity, and the frequency of signals has been increasing. For a wiring board used for this purpose, it is required to reduce transmission loss in a high-frequency region. Therefore, reduction of the dielectric loss in the high-frequency region is required for the resin contained in the composite base material of the wiring board used for the above-mentioned application. The dielectric loss factor (D f ) usually depends on the frequency, and the higher the frequency of the same material, the larger the dielectric loss factor (D f ) tends to be. The resin contained in the composite substrate preferably has a low dielectric loss factor (D f ) under high frequency conditions.

若預浸體或複合基材與金屬箔之熱膨脹係數(CTE)之差較大,則對包含預浸體與金屬箔之第1暫時積層體、或包含複合基材、預浸體、及金屬箔之第2暫時積層體進行加熱加壓時,有金屬箔發生偏移或剝離之虞。預浸體或複合基材與金屬箔之熱膨脹係數(CTE)之差較佳為較小。由於樹脂之熱膨脹係數(CTE)通常大於金屬箔之熱膨脹係數(CTE),因此較佳為預浸體及複合基材之熱膨脹係數(CTE)較小。If the difference between the coefficient of thermal expansion (CTE) of the prepreg or the composite substrate and the metal foil is large, the first temporary laminate containing the prepreg and the metal foil, or the composite substrate, prepreg, and metal When the second temporary laminate of foil is heated and pressed, there is a possibility that the metal foil may shift or be peeled off. The difference in coefficient of thermal expansion (CTE) between the prepreg or the composite substrate and the metal foil is preferably small. Since the coefficient of thermal expansion (CTE) of the resin is generally greater than that of the metal foil, it is preferred that the coefficient of thermal expansion (CTE) of the prepreg and the composite substrate be smaller.

配線基板有時於溫度相對較高之環境下使用。為了於此情形時亦確保配線基板之可靠性,較佳為預浸體及複合基材中所包含之樹脂具有足夠高之玻璃轉移溫度(Tg)。Wiring substrates are sometimes used in environments with relatively high temperatures. In order to secure the reliability of the wiring board also in this case, it is preferable that the resin contained in the prepreg and the composite base material have a sufficiently high glass transition temperature (Tg).

本發明之有機矽化合物及交聯劑與[先前技術]項中例舉之專利文獻1中使用之矽烷偶合劑不同,與Si鍵結之4個原子均為非極性原子(具體而言為氫原子或碳原子)。 本發明人等進行了研究,結果發現,於向硬化性組合物中添加本發明之有機矽化合物之情形時,該有機矽化合物可作為使具有2個以上交聯性官能基之硬化性化合物進行交聯之交聯劑發揮功能,且可有效降低硬化性組合物之(半)硬化物之介電損耗因數(D f)。 又發現,含有本發明之有機矽化合物之硬化性組合物之(半)硬化物的熱膨脹係數(CTE)足夠低,玻璃轉移溫度(Tg)足夠高。 又發現,含有本發明之有機矽化合物之硬化性組合物之(半)硬化物與銅箔等金屬之密接性於實際使用中亦良好。 The organosilicon compound and crosslinking agent of the present invention are different from the silane coupling agent used in Patent Document 1 cited in [Prior Art], in that the four atoms bonded to Si are all non-polar atoms (specifically, hydrogen atoms or carbon atoms). The inventors of the present invention conducted research and found that, when the organosilicon compound of the present invention is added to a curable composition, the organosilicon compound can be used as a curable compound having two or more crosslinkable functional groups. The crosslinking agent functions to effectively reduce the dielectric dissipation factor (D f ) of the (semi)cured product of the curable composition. It was also found that the (semi)cured product of the curable composition containing the organosilicon compound of the present invention has a sufficiently low coefficient of thermal expansion (CTE) and a sufficiently high glass transition temperature (Tg). It was also found that the adhesiveness between the (semi)cured product of the curable composition containing the organosilicon compound of the present invention and metals such as copper foil is also good in actual use.

藉由向硬化性組合物中添加本發明之有機矽化合物作為交聯劑,可獲得高頻條件下之介電損耗因數(D f)有效降低、熱膨脹係數(CTE)足夠低且玻璃轉移溫度(Tg)足夠高之(半)硬化物。該(半)硬化物對於適宜用於高頻區域中所使用之配線基板用途之複合基材及絕緣層等較為適宜。 By adding the organosilicon compound of the present invention as a crosslinking agent to the curable composition, the dielectric dissipation factor (D f ) under high frequency conditions can be effectively reduced, the coefficient of thermal expansion (CTE) is sufficiently low and the glass transition temperature ( Tg) sufficiently high (semi) hardened product. This (semi)cured product is suitable for composite substrates and insulating layers suitable for wiring boards used in high-frequency regions.

本發明之硬化性組合物之(半)硬化物及包含該(半)硬化物之複合基材的高頻條件下之介電損耗因數(D f)較佳為例如處於如下範圍內。 頻率10 GHz下之介電損耗因數(D f)較佳為較小,較佳為0.01以下,更佳為0.005以下,特佳為0.003以下。下限值並無特別限制,例如為0.0001。 The dielectric loss factor (D f ) under high frequency conditions of the (semi)cured product of the curable composition of the present invention and the composite substrate comprising the (semi)cured product is preferably, for example, within the following range. The dielectric loss factor (D f ) at a frequency of 10 GHz is preferably smaller, preferably less than 0.01, more preferably less than 0.005, and most preferably less than 0.003. The lower limit is not particularly limited, and is, for example, 0.0001.

本發明之硬化性組合物之(半)硬化物及包含該(半)硬化物之複合基材之熱膨脹係數(CTE)較佳為例如處於如下範圍內。 熱膨脹係數(CTE)較佳為較小,較佳為70 ppm/℃以下,更佳為50 ppm/℃以下,特佳為40 ppm/℃以下。下限值並無特別限制,例如為1 ppm/℃。 The coefficient of thermal expansion (CTE) of the (semi)cured product of the curable composition of the present invention and the composite substrate including the (semi)cured product is preferably, for example, within the following range. The coefficient of thermal expansion (CTE) is preferably smaller, preferably less than 70 ppm/°C, more preferably less than 50 ppm/°C, particularly preferably less than 40 ppm/°C. The lower limit is not particularly limited, and is, for example, 1 ppm/°C.

本發明之硬化性組合物之(半)硬化物之玻璃轉移溫度(Tg)較佳為150℃以上,更佳為180℃以上,特佳為200℃以上。上限值並無特別限制,例如為300℃。The glass transition temperature (Tg) of the (semi)cured product of the curable composition of the present invention is preferably at least 150°C, more preferably at least 180°C, particularly preferably at least 200°C. The upper limit is not particularly limited, and is, for example, 300°C.

介電損耗因數(D f)、熱膨脹係數(CTE)及玻璃轉移溫度(Tg)可藉由下述[實施例]項中記載之方法進行測定。 Dielectric dissipation factor (D f ), coefficient of thermal expansion (CTE) and glass transition temperature (Tg) can be measured by the method described in the following [Example] section.

於式(1m)所表示之本發明之有機矽化合物中,苯環可具有取代基。作為苯環可具有之取代基,例如可例舉碳數1~18之烷基及芳基,就原料獲取性之觀點而言,較佳為甲基、乙基、丙基、丁基、己基、辛基、苯基及甲苯基。苯環較佳為不具有取代基。In the organosilicon compound of the present invention represented by formula (1m), the benzene ring may have a substituent. Examples of substituents that the benzene ring may have include alkyl groups and aryl groups having 1 to 18 carbon atoms, and from the viewpoint of availability of raw materials, methyl, ethyl, propyl, butyl, and hexyl groups are preferred. , octyl, phenyl and tolyl. The benzene ring preferably has no substituent.

於式(1m)所表示之本發明之有機矽化合物中,作為苯環上之乙烯基之取代位置,可有鄰位、間位及對位。於本發明中,苯環上之乙烯基之取代位置為間位。 於上述取代位置為鄰位之情形時,可能會因有機矽化合物中取代之乙烯基與硬化性化合物之交聯反應點之位阻,導致與間位相比,交聯反應更相對難以進行。因此,硬化性組合物之(半)硬化物之熱膨脹係數(CTE)及玻璃轉移溫度(Tg)等物性可能會相對下降。又,與間位相比,位阻變大,因此可能難以合成有機矽化合物。 於上述取代位置為對位之情形時,與間位不同,尤其於高頻條件下,容易引起苯環相對於連結矽原子與交聯點之軸旋轉,從而可能會減弱降低介電損耗因數(D f)之效果。 於上述取代位置為間位之情形時,即便在高頻條件下,亦不易引起苯環旋轉,從而能夠更有效地降低硬化性組合物之(半)硬化物於高頻條件下之介電損耗因數(D f)。上述取代位置為間位之有機矽化合物容易獲取原料,亦容易合成。由於有機矽化合物之中心矽原子與乙烯基之位置並不過於接近,因此乙烯基與硬化性化合物之交聯反應點之位阻之影響較小,硬化性組合物之交聯反應亦容易進行。硬化性組合物之(半)硬化物之熱膨脹係數(CTE)及玻璃轉移溫度(Tg)亦良好。 再者,於上述取代位置為間位之情形時,能夠更有效地降低硬化性組合物之(半)硬化物於高頻條件下之介電損耗因數(D f)之原因未必明確,上述說明包括本發明人等之推測。 In the organosilicon compound of the present invention represented by the formula (1m), the substitution position of the vinyl group on the benzene ring may include ortho, meta and para positions. In the present invention, the substitution position of the vinyl group on the benzene ring is the meta position. In the case where the above-mentioned substitution position is at the ortho position, the cross-linking reaction may be relatively difficult to proceed compared with the meta-position due to the steric hindrance between the substituted vinyl group in the organosilicon compound and the cross-linking reaction point of the hardening compound. Therefore, physical properties such as the coefficient of thermal expansion (CTE) and glass transition temperature (Tg) of the (semi) cured product of the curable composition may be relatively reduced. Also, since the steric hindrance becomes larger compared with the meta position, it may be difficult to synthesize an organosilicon compound. In the case where the above-mentioned substitution position is the para position, it is different from the meta position, especially under high frequency conditions, it is easy to cause the benzene ring to rotate relative to the axis connecting the silicon atom and the cross-linking point, which may weaken the dielectric loss factor ( D f ) effect. In the case where the above-mentioned substitution position is meta, even under high-frequency conditions, it is not easy to cause the benzene ring to rotate, so that the dielectric loss of the (semi) cured product of the curable composition can be more effectively reduced under high-frequency conditions. Factor (D f ). The organosilicon compound whose substitution position is the meta position is easy to obtain raw materials and easy to synthesize. Since the central silicon atom of the organosilicon compound is not too close to the vinyl group, the influence of steric hindrance on the crosslinking reaction point between the vinyl group and the curable compound is small, and the crosslinking reaction of the curable composition is also easy to proceed. The coefficient of thermal expansion (CTE) and glass transition temperature (Tg) of the (semi) cured product of the curable composition are also good. Furthermore, when the above-mentioned substitution position is the meta position, the reason why the dielectric loss factor (D f ) of the (semi) cured product of the curable composition can be more effectively reduced under high-frequency conditions is not necessarily clear. Conjectures of the present inventors are included.

於式(1m)所表示之本發明之有機矽化合物中,反應性官能基之數量(亦簡稱為官能基數)n為2~4。 官能基數n可為2。 官能基數n可為3或4。 In the organosilicon compound of the present invention represented by formula (1m), the number n of reactive functional groups (also referred to simply as the number of functional groups) is 2-4. The functional base n may be 2. The functional group n can be 3 or 4.

於式(1m)所表示之本發明之有機矽化合物中,R為氫原子、羥基或有機基,較佳為可具有取代基之碳數1~18之烷基。就能夠更有效地降低硬化性組合物之(半)硬化物於高頻條件下之介電損耗因數(D f)之情況而言,R較佳為不包含氧原子(O)等極性原子。R較佳為不具有取代基之碳數1~18之烷基。更佳為碳數1~18之直鏈之烷基。 R於碳數較多時,交聯結構之極性降低,能夠更有效地降低硬化性組合物之(半)硬化物於高頻條件下之介電損耗因數(D f),從而較佳。就合成容易性之觀點而言,碳數之上限為18。就硬化性組合物之(半)硬化物於高頻條件下之介電損耗因數(D f)之降低效果及合成容易性之觀點而言,R之碳數更佳為3~18,特佳為8~18。 In the organosilicon compound of the present invention represented by formula (1m), R is a hydrogen atom, a hydroxyl group or an organic group, preferably an alkyl group having 1 to 18 carbon atoms which may have a substituent. In order to more effectively reduce the dielectric loss factor (D f ) of the (semi) cured product of the curable composition under high frequency conditions, R preferably does not contain polar atoms such as oxygen atoms (O). R is preferably an alkyl group having 1 to 18 carbon atoms having no substituent. More preferably, it is a linear alkyl group having 1 to 18 carbon atoms. When R has a large number of carbon atoms, the polarity of the crosslinked structure decreases, which can more effectively reduce the dielectric loss factor (D f ) of the (semi) cured product of the curable composition under high frequency conditions, which is preferable. The upper limit of the carbon number is 18 from the viewpoint of easiness of synthesis. In view of the effect of reducing the dielectric loss factor (D f ) of the (semi) cured product of the curable composition under high frequency conditions and the ease of synthesis, the carbon number of R is more preferably 3 to 18, particularly preferably 8 to 18.

於式(1m)所表示之本發明之有機矽化合物中,M為單鍵或可具有取代基之碳數1~20之伸烷基。就合成容易性之觀點而言,碳數之上限為20。就有機矽化合物之合成容易性之觀點而言,M較佳為單鍵或碳數1~4之伸烷基,更佳為單鍵或亞甲基。In the organosilicon compound of the present invention represented by formula (1m), M is a single bond or an alkylene group having 1 to 20 carbon atoms which may have a substituent. The upper limit of the carbon number is 20 from the viewpoint of easiness of synthesis. From the viewpoint of the ease of synthesis of the organosilicon compound, M is preferably a single bond or an alkylene group having 1 to 4 carbons, more preferably a single bond or a methylene group.

式(1m)所表示之本發明之有機矽化合物可藉由公知之合成法合成。關於具體之合成例,請參照[實施例]項。The organosilicon compound of the present invention represented by the formula (1m) can be synthesized by a known synthesis method. For specific synthesis examples, please refer to the section of [Examples].

如上所述,根據本發明,可提供一種適宜用作交聯劑等之新穎之有機矽化合物。根據本發明,可提供一種適宜用於硬化性組合物且能夠獲得高頻條件下之介電損耗因數(D f)有效降低、熱膨脹係數(CTE)足夠低且玻璃轉移溫度(Tg)足夠高之(半)硬化物的新穎之交聯劑及使用該交聯劑之硬化性組合物。 本發明之新穎之有機矽化合物及新穎之交聯劑係適宜用於預浸體、覆金屬之積層板及配線基板等用途中所使用之硬化性組合物者,但可用於任意用途。 As described above, according to the present invention, a novel organosilicon compound suitable for use as a crosslinking agent and the like can be provided. According to the present invention, it is possible to provide a compound suitable for curable compositions that can effectively reduce the dielectric loss factor (D f ) under high frequency conditions, have a sufficiently low coefficient of thermal expansion (CTE), and have a sufficiently high glass transition temperature (Tg). Novel cross-linking agent for (semi)cured products and curable composition using the cross-linking agent. The novel organosilicon compound and novel crosslinking agent of the present invention are suitable for use in curable compositions used in applications such as prepregs, metal-clad laminates, and wiring boards, but can be used in any application.

[用途] 本發明之新穎之有機矽化合物適宜作為交聯劑等。 本發明之交聯劑適於包含單體、低聚物及預聚物等硬化性化合物之硬化性組合物。 本發明之新穎之有機矽化合物及新穎之交聯劑適於預浸體、覆金屬之積層板及配線基板等用途中所使用之硬化性組合物。 包含本發明之交聯劑之硬化性組合物適於預浸體、覆金屬之積層板及配線基板等用途中所使用之硬化性組合物。 本發明之覆金屬之積層板適於各種電氣設備及各種電子機器等中所使用之配線基板等。 本發明之配線基板適於:行動電話、智慧型手機、攜帶型資訊終端及筆記型電腦等攜帶用電子機器;行動電話基地台及汽車等之天線;伺服器、路由器及底板等電子機器;無線基礎設施;用於防碰撞等之雷達;各種感測器(例如引擎管理感測器等汽車用感測器)等。 本發明之配線基板尤其適於使用高頻信號進行通訊之用途,並適於要求於高頻區域中降低傳輸損耗之各種用途。 [實施例] [use] The novel organosilicon compound of the present invention is suitable as a crosslinking agent and the like. The crosslinking agent of the present invention is suitable for curable compositions containing curable compounds such as monomers, oligomers and prepolymers. The novel organosilicon compound and novel crosslinking agent of the present invention are suitable for curable compositions used in applications such as prepregs, metal-clad laminates, and wiring boards. The curable composition containing the crosslinking agent of the present invention is suitable as a curable composition used in applications such as prepregs, metal-clad laminates, and wiring boards. The metal-clad laminate of the present invention is suitable for wiring boards and the like used in various electrical equipment and various electronic devices. The wiring substrate of the present invention is suitable for: portable electronic equipment such as mobile phones, smart phones, portable information terminals, and notebook computers; antennas for mobile phone base stations and automobiles; electronic equipment such as servers, routers, and backplanes; wireless Infrastructure; radar for anti-collision, etc.; various sensors (such as automotive sensors such as engine management sensors), etc. The wiring substrate of the present invention is particularly suitable for communication using high-frequency signals, and is suitable for various applications requiring reduction of transmission loss in a high-frequency region. [Example]

以下例舉實施例對本發明進行具體說明,但本發明並不限定於該等實施例。例1~3、101為實施例,例21、22、31、32為比較例。除非另有說明,否則室溫為25℃左右。The following examples are given to describe the present invention in detail, but the present invention is not limited to these examples. Examples 1 to 3, and 101 are examples, and examples 21, 22, 31, and 32 are comparative examples. Room temperature is around 25°C unless otherwise stated.

[市售試劑]  於[實施例]項中,關於觸媒及試劑,除非另有說明,否則直接將市售品用於反應。溶劑使用經脫水及脫氧之市售品。[Commercially available reagents] In [Example], regarding catalysts and reagents, unless otherwise specified, commercially available products were directly used for the reaction. As a solvent, a commercially available product that has undergone dehydration and deoxidation was used.

[有機矽化合物之評估項目及評估方法]  (結構)  所合成之有機矽化合物之結構係藉由使用核磁共振裝置(日本電子股份有限公司製造之「JNM-AL300」),進行 1H-NMR( 1Hydrogen-Nuclear Magnetic-Resonance,一氫-核磁共振)測定來鑑定。 [Evaluation Items and Evaluation Methods of Organosilicon Compounds] (Structure) The structure of the synthesized organosilicon compound was carried out by 1 H-NMR ( 1 Hydrogen-Nuclear Magnetic-Resonance, a hydrogen-nuclear magnetic resonance) determination to identify.

(分子量)  所合成之有機矽化合物之分子量係藉由使用氣相層析質譜分析計(GC-HRMS)(Agilent公司製造之「7890A/JEOL公司JMS-T200 AccuTOF GCx-plus」),利用電子衝擊法(EI)而求出。(Molecular weight) The molecular weight of the synthesized organosilicon compound was determined by using a gas chromatography mass spectrometer (GC-HRMS) ("7890A/JEOL JMS-T200 AccuTOF GCx-plus" manufactured by Agilent) by electron impact It can be obtained by the method (EI).

[評估用樣品(膜狀硬化物)之製作方法] 準備以下兩種聚苯醚低聚物作為硬化性化合物。 (SA9000 )2官能甲基丙烯酸改性PPE(SABIC公司製造之「SA9000」)、 (OPE-2st)2官能氯甲基苯乙烯改性PPE(三菱瓦斯化學公司製造之「OPE-2st」)。 [Preparation method of evaluation sample (membrane hardened product)] The following two polyphenylene ether oligomers were prepared as hardening compounds. (SA9000 )2-functional methacrylic acid modified PPE ("SA9000" manufactured by SABIC Corporation), (OPE-2st) Bifunctional chloromethylstyrene-modified PPE ("OPE-2st" manufactured by Mitsubishi Gas Chemical Co., Ltd.).

SA9000及OPE-2st係由下式表示。 [化8]

Figure 02_image017
SA9000 and OPE-2st are represented by the following formulae. [chemical 8]
Figure 02_image017

將上述2官能甲基丙烯酸改性PPE(SA9000)或2官能氯甲基苯乙烯改性PPE(OPE-2st)、各例中合成或準備之有機矽化合物、作為自由基聚合起始劑之二異丙苯基過氧化物、及甲苯以質量比7:3:0.1:7加以混合,並於室溫下進行攪拌,製備甲苯溶液(硬化性組合物)。 繼而,使用敷料器(YOSHIMITSU SEIKI公司製造),將上述甲苯溶液塗佈至厚度125 μm之聚醯亞胺膜上,形成厚度250 μm之塗佈膜。 於烘箱中,在空氣氛圍下,以80℃進行30分鐘加熱乾燥後,在氮氣氛圍下,以200℃進行2小時加熱,藉此使塗佈膜進行熱硬化(熱交聯反應),從而獲得厚度約100 μm之評估用樣品(膜狀硬化物)。對所獲得之評估用樣品進行以下評估。 Use the above-mentioned bifunctional methacrylic acid modified PPE (SA9000) or bifunctional chloromethylstyrene modified PPE (OPE-2st), the organosilicon compound synthesized or prepared in each example, as the second radical polymerization initiator Cumyl peroxide and toluene were mixed at a mass ratio of 7:3:0.1:7, and stirred at room temperature to prepare a toluene solution (curable composition). Next, using an applicator (manufactured by YOSHIMITSU SEIKI), the toluene solution was applied onto a polyimide film having a thickness of 125 μm to form a coating film having a thickness of 250 μm. In an oven, after heating and drying at 80°C for 30 minutes in an air atmosphere, heat at 200°C for 2 hours in a nitrogen atmosphere, thereby thermosetting the coating film (thermal crosslinking reaction), thereby obtaining A sample for evaluation with a thickness of about 100 μm (hardened film). The obtained samples for evaluation were evaluated as follows.

[膜狀硬化物之評估項目及評估方法]  (相對介電常數(D k)及介電損耗因數(D f)) 於室溫下,使用向量網路分析儀(安捷倫科技公司製造之「E8361C」),藉由SPDR(Split Post Dielectric Resonator,分離柱電介質諧振器)法測定評估用樣品(膜狀硬化物)於10 GHz下之相對介電常數(D k)及介電損耗因數(D f)。 [Evaluation items and evaluation methods of hardened film] (relative permittivity (D k ) and dielectric loss factor (D f )) At room temperature, use a vector network analyzer ("E8361C" manufactured by Agilent Technologies) ”), the relative permittivity (D k ) and dielectric loss factor (D f ).

(玻璃轉移溫度Tg) 使用動態黏彈性測定裝置(日本IT計測控制股份有限公司製造之「DVA-200」)進行評估用樣品(膜狀硬化物)之動態黏彈性測定(DMA),測定玻璃轉移溫度(Tg)(℃)。測定係於頻率10 Hz、升溫速度2℃/min、溫度範圍25~300℃之條件下進行。 (Glass transition temperature Tg) The dynamic viscoelasticity measurement (DMA) of the evaluation sample (film-like cured product) was performed using a dynamic viscoelasticity measurement device ("DVA-200" manufactured by Japan IT Measurement Control Co., Ltd.), and the glass transition temperature (Tg) (°C) was measured ). The measurement is carried out under the conditions of a frequency of 10 Hz, a heating rate of 2°C/min, and a temperature range of 25-300°C.

(熱膨脹係數(CTE)) 使用熱機械分析裝置(精工電子奈米科技股份有限公司製造之「TMA/SS7100」)測定未達玻璃轉移溫度(Tg)之溫度下之評估用樣品(膜狀硬化物)之熱膨脹係數(CTE)。測定係於升溫速度5℃/min、溫度範圍-50~340℃之條件下進行。 (coefficient of thermal expansion (CTE)) Measure the coefficient of thermal expansion (CTE) of the evaluation sample (hardened film) at a temperature below the glass transition temperature (Tg) using a thermomechanical analyzer ("TMA/SS7100" manufactured by Seiko Denshi Nanotechnology Co., Ltd.) . The measurement is carried out under the conditions of a heating rate of 5°C/min and a temperature range of -50 to 340°C.

[例1]二甲基雙(3-乙烯基苯基)矽烷(C1-D-m-St-Si)之合成  <雙(3-甲醯基苯基)二甲基矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入3-溴苯甲醛二乙縮醛(24.0 g,90.8 mmol)及四氫呋喃(300 mL)。將該溶液冷卻至-65℃以下,歷時1小時向其中滴加n-BuLi(n-Butyllithium,正丁基鋰)/正己烷溶液(2.6 mol/L,35 mL,91 mmol),並於-70℃以下之溫度下攪拌2小時。歷時30分鐘向所獲得之反應溶液中滴加二氯二甲基矽烷(4.40 mL,36.3 mmol),並於與上述相同之溫度下攪拌2小時。將燒瓶加溫至室溫,攪拌12小時以上。利用鹽酸(2 mol/L,120 mL)將反應混合物淬滅,並於室溫下攪拌1小時,而分離有機相。進而,向水相中添加乙酸乙酯(100 mL),進行2次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。利用飽和食鹽水(100 mL)將合併之有機相洗淨,並使用硫酸鎂進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗產物。使用矽膠管柱層析法(流動相:氯仿/正己烷=1:2(體積比))對粗產物進行純化,從而獲得8.61 g作為淡黃色液體之雙(3-甲醯基苯基)二甲基矽烷(產率:88%)。[Example 1] Synthesis of dimethylbis(3-vinylphenyl)silane (C1-D-m-St-Si) <Synthesis of bis(3-formylphenyl)dimethylsilane> under nitrogen atmosphere , Add 3-bromobenzaldehyde diethyl acetal (24.0 g, 90.8 mmol) and tetrahydrofuran (300 mL) into a 500 mL four-neck flask. The solution was cooled to below -65°C, and n-BuLi (n-Butyllithium, n-butyllithium)/n-hexane solution (2.6 mol/L, 35 mL, 91 mmol) was added dropwise thereto over 1 hour, and the Stir at a temperature below 70°C for 2 hours. Dichlorodimethylsilane (4.40 mL, 36.3 mmol) was added dropwise to the obtained reaction solution over 30 minutes, and stirred at the same temperature as above for 2 hours. The flask was warmed to room temperature and stirred over 12 hours. The reaction mixture was quenched with hydrochloric acid (2 mol/L, 120 mL) and stirred at room temperature for 1 hour, and the organic phase was separated. Furthermore, ethyl acetate (100 mL) was added to the aqueous phase, and extraction was performed twice to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were washed with saturated brine (100 mL), dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude product. The crude product was purified using silica gel column chromatography (mobile phase: chloroform/n-hexane = 1:2 (volume ratio)), thereby obtaining 8.61 g of bis(3-formylphenyl) dimethicone as a light yellow liquid. Methylsilane (Yield: 88%).

反應路徑圖及NMR分析結果如下。 [化9]

Figure 02_image019
The reaction path diagram and NMR analysis results are as follows. [chemical 9]
Figure 02_image019

1H-NMR (CDCl 3): δ (ppm) 10.02 (s, 2H, CHO), 8.02 (s, 2H, Ar - H), 7.90 (td, 2H, J = 7.68, 1.71 Hz, Ar - H), 7.76 (d, 2H, J = 7.68 Hz, Ar - H), 7.54 (t, 2H, J = 7.68 Hz, Ar - H), 0.66 (s, 6H, Si - CH 3)。 1 H-NMR (CDCl 3 ): δ (ppm) 10.02 (s, 2H, CHO), 8.02 (s, 2H, Ar - H), 7.90 (td, 2H, J = 7.68, 1.71 Hz, Ar - H) , 7.76 (d, 2H, J = 7.68 Hz, Ar - H), 7.54 (t, 2H, J = 7.68 Hz, Ar - H), 0.66 (s, 6H, Si - CH 3 ).

<二甲基雙(3-乙烯基苯基)矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入甲基三苯基溴化鏻(25.6 g,71.1 mmol)及四氫呋喃(128 mL)。將燒瓶冷卻至0℃,向懸浮液中添加第三丁醇鉀(9.03 g,80.5 mmol)。於與上述相同之溫度下將反應混合物攪拌5分鐘以上。歷時20分鐘向反應混合物中滴加雙(3-甲醯基苯基)二甲基矽烷(8.00 g,29.8 mmol)之四氫呋喃(128 mL)溶液。將燒瓶加溫至室溫,攪拌7小時。向反應混合物中添加4-第三丁基鄰苯二酚(0.60 mg)後,於30℃下並於減壓下進行濃縮。向所獲得之混合物中添加水(200 mL)及二乙醚(200 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(200 mL),進行2次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。使用硫酸鎂對合併之有機相進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗混合物。向粗混合物中添加正己烷(160 mL)及二乙醚(40 mL),並攪拌30分鐘。使用濾紙對混合物進行過濾,於減壓下對濾液進行濃縮,獲得粗產物(油)。使用矽膠管柱層析法(流動相:正己烷)對粗產物進行純化,從而獲得7.39 g作為無色液體之二甲基雙(3-乙烯基苯基)矽烷(C1-D-m-St-Si)(產率:94%)。<Synthesis of dimethylbis(3-vinylphenyl)silane> Under nitrogen atmosphere, add methyltriphenylphosphonium bromide (25.6 g, 71.1 mmol) and tetrahydrofuran (128 mL). The flask was cooled to 0 °C and potassium tert-butoxide (9.03 g, 80.5 mmol) was added to the suspension. The reaction mixture was stirred at the same temperature as above for 5 more minutes. A solution of bis(3-formylphenyl)dimethylsilane (8.00 g, 29.8 mmol) in tetrahydrofuran (128 mL) was added dropwise to the reaction mixture over 20 minutes. The flask was warmed to room temperature and stirred for 7 hours. After adding 4-tert-butylcatechol (0.60 mg) to the reaction mixture, it was concentrated at 30° C. under reduced pressure. Water (200 mL) and diethyl ether (200 mL) were added to the obtained mixture, and the organic phase was separated for extraction. Furthermore, diethyl ether (200 mL) was added to the aqueous phase, and extraction was performed twice to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude mixture. To the crude mixture were added n-hexane (160 mL) and diethyl ether (40 mL), and stirred for 30 minutes. The mixture was filtered using filter paper, and the filtrate was concentrated under reduced pressure to obtain a crude product (oil). The crude product was purified by silica gel column chromatography (mobile phase: n-hexane) to obtain 7.39 g of dimethylbis(3-vinylphenyl)silane (C1-D-m-St-Si) as a colorless liquid (Yield: 94%).

反應路徑圖、NMR分析結果及HRMS分析結果如下。 [化10]

Figure 02_image021
The reaction path diagram, NMR analysis results and HRMS analysis results are as follows. [chemical 10]
Figure 02_image021

1H-NMR (CDCl 3): δ (ppm) 8.53 (brs, 2H, Ar - H), 7.46-7.37 (m, 4H, Ar - H), 7.32 (t, 2H, J = 7.68 Hz, Ar - H), 6.71 (dd, 2H, J = 11.10, 17.07 Hz, -CH = CH 2), 5.73 (d, 2H, J = 17.07 Hz, -CH = CH 2), 5.23 (d, 2H, J = 11.10 Hz, -CH = CH 2), 0.56 (s, 6H, Si - CH 3)。  HRMS (EI): m/z Calcd for(理論計算值) C 18H 20Si: (M +) 264.133, found(實測值) 264.130。 1 H-NMR (CDCl 3 ): δ (ppm) 8.53 (brs, 2H, Ar - H), 7.46-7.37 (m, 4H, Ar - H), 7.32 (t, 2H, J = 7.68 Hz, Ar - H), 6.71 (dd, 2H, J = 11.10, 17.07 Hz, -CH = CH 2 ), 5.73 (d, 2H, J = 17.07 Hz, -CH = CH 2 ), 5.23 (d, 2H, J = 11.10 Hz, -CH = CH 2 ), 0.56 (s, 6H, Si - CH 3 ). HRMS (EI): m/z Calcd for (calculated for) C 18 H 20 Si: (M + ) 264.133, found (found) 264.130.

[例2]十二烷基三(3-乙烯基苯基)矽烷(C12-T-m-St-Si)之合成  <十二烷基三(3-甲醯基苯基)矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入3-溴苯甲醛二乙縮醛(24.0 g,90.8 mmol)及四氫呋喃(300 mL)。將該溶液冷卻至-65℃以下,歷時1小時向其中滴加n-BuLi/正己烷溶液(2.6 mol/L,35 mL,91 mmol),並將反應溶液於-70℃以下之溫度下攪拌2小時。歷時40分鐘向所獲得之反應溶液中滴加十二烷基三氯矽烷(7.20 mL,24.2 mmol),並於與上述相同之溫度下攪拌2小時。將燒瓶加溫至室溫,攪拌12小時以上。利用鹽酸(2 mol/L,120 mL)將反應混合物淬滅,並於室溫下攪拌1小時,而分離有機相。進而,向水相中添加乙酸乙酯(100 mL),進行2次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。利用飽和食鹽水(100 mL)將合併之有機相洗淨,並使用硫酸鎂進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗產物。使用矽膠管柱層析法(流動相:氯仿/正己烷=1:1(體積比))對粗產物進行純化,從而獲得10.5 g作為無色液體之十二烷基三(3-甲醯基苯基)矽烷(產率:85%)。[Example 2] Synthesis of dodecyltris(3-vinylphenyl)silane (C12-T-m-St-Si) <Synthesis of dodecyltris(3-formylphenyl)silane> in nitrogen Under atmosphere, 3-bromobenzaldehyde diethyl acetal (24.0 g, 90.8 mmol) and tetrahydrofuran (300 mL) were added into a 500 mL four-neck flask. The solution was cooled to below -65°C, n-BuLi/n-hexane solution (2.6 mol/L, 35 mL, 91 mmol) was added dropwise thereto over 1 hour, and the reaction solution was stirred at a temperature below -70°C 2 hours. To the obtained reaction solution, dodecyltrichlorosilane (7.20 mL, 24.2 mmol) was added dropwise over 40 minutes, and stirred at the same temperature as above for 2 hours. The flask was warmed to room temperature and stirred over 12 hours. The reaction mixture was quenched with hydrochloric acid (2 mol/L, 120 mL) and stirred at room temperature for 1 hour, and the organic phase was separated. Furthermore, ethyl acetate (100 mL) was added to the aqueous phase, and extraction was performed twice to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were washed with saturated brine (100 mL), dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude product. The crude product was purified by silica gel column chromatography (mobile phase: chloroform/n-hexane=1:1 (volume ratio)) to obtain 10.5 g of dodecyltris(3-formylbenzene) as a colorless liquid base) silane (yield: 85%).

反應路徑圖及NMR分析結果如下。 [化11]

Figure 02_image023
The reaction path diagram and NMR analysis results are as follows. [chemical 11]
Figure 02_image023

1H-NMR (CDCl 3): δ (ppm) 10.01 (s, 3H, CHO), 8.00 (brs, 3H, s, Ar - H), 7.97 (td, 3H, J = 7.68, 1.71 Hz, Ar - H), 7.76 (d, 3H, J = 7.68 Hz, Ar - H), 7.58 (t, 3H, J = 7.68 Hz, Ar - H), 1.56 ~ 1.33 (m, 6H, -CH 2-), 1.22 (brs, 16H, -CH 2-), 0.87 (t, 3H, J = 6.83 Hz, CH 3)。 1 H-NMR (CDCl 3 ): δ (ppm) 10.01 (s, 3H, CHO), 8.00 (brs, 3H, s, Ar - H), 7.97 (td, 3H, J = 7.68, 1.71 Hz, Ar - H), 7.76 (d, 3H, J = 7.68 Hz, Ar - H), 7.58 (t, 3H, J = 7.68 Hz, Ar - H), 1.56 ~ 1.33 (m, 6H, -CH 2 -), 1.22 (brs, 16H, -CH 2 -), 0.87 (t, 3H, J = 6.83 Hz, CH 3 ).

<十二烷基三(3-乙烯基苯基)矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入甲基三苯基溴化鏻(22.6 g,63.3 mmol)及四氫呋喃(144 mL)。將燒瓶冷卻至0℃,向懸浮液中添加第三丁醇鉀(7.98 g,71.1 mmol)。於與上述相同之溫度下將反應混合物攪拌5分鐘以上。歷時20分鐘向反應混合物中滴加十二烷基三(3-甲醯基苯基)矽烷(9.00 g,17.6 mmol)之四氫呋喃(144 mL)溶液。將燒瓶加溫至室溫,攪拌1小時。向反應混合物中添加4-第三丁基鄰苯二酚(2.55 mg)後,於30℃下並於減壓下進行濃縮。向所獲得之混合物中添加水(200 mL)及二乙醚(200 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(200 mL),進行分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。使用硫酸鎂對合併之有機相進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗混合物。向粗混合物中添加正己烷(160 mL)及二乙醚(40 mL),並攪拌30分鐘。使用濾紙對混合物進行過濾,於減壓下對濾液進行濃縮,獲得粗產物(紅色之油)。使用矽膠管柱層析法(流動相:正己烷)對粗產物進行純化,從而獲得6.32 g作為淡黃色液體之十二烷基三(3-乙烯基苯基)矽烷(C12-T-m-St-Si)(產率:71%)。<Synthesis of dodecyltris(3-vinylphenyl)silane> Under nitrogen atmosphere, add methyltriphenylphosphonium bromide (22.6 g, 63.3 mmol) and tetrahydrofuran ( 144 mL). The flask was cooled to 0 °C and potassium tert-butoxide (7.98 g, 71.1 mmol) was added to the suspension. The reaction mixture was stirred at the same temperature as above for 5 more minutes. A solution of dodecyltris(3-formylphenyl)silane (9.00 g, 17.6 mmol) in tetrahydrofuran (144 mL) was added dropwise to the reaction mixture over 20 minutes. The flask was warmed to room temperature and stirred for 1 hour. After adding 4-tert-butylcatechol (2.55 mg) to the reaction mixture, it was concentrated at 30° C. under reduced pressure. Water (200 mL) and diethyl ether (200 mL) were added to the obtained mixture, and the organic phase was separated for extraction. Furthermore, diethyl ether (200 mL) was added to the aqueous phase, and extraction was performed to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude mixture. To the crude mixture were added n-hexane (160 mL) and diethyl ether (40 mL), and stirred for 30 minutes. The mixture was filtered using filter paper, and the filtrate was concentrated under reduced pressure to obtain a crude product (red oil). The crude product was purified by silica gel column chromatography (mobile phase: n-hexane) to obtain 6.32 g of dodecyl tris(3-vinylphenyl)silane (C12-T-m-St- Si) (Yield: 71%).

反應路徑圖、NMR分析結果及HRMS分析結果如下。 [化12]

Figure 02_image025
The reaction path diagram, NMR analysis results and HRMS analysis results are as follows. [chemical 12]
Figure 02_image025

1H-NMR (CDCl 3): δ (ppm) 7.54 (brs, 3H, Ar - H), 7.48 (d, 3H, J = 6.83 Hz, Ar - H), 7.40 (d, 3H, J = 6.83 Hz, Ar - H), 7.32 (t, 3H, J = 6.83 Hz, Ar - H), 6.69 (dd, 3H, J = 11.10, 17.93 Hz, -CH = CH 2), 5.69 (d, 3H, J = 17.93 Hz, -CH = CH 2), 5.21 (d, 3H, J = 11.10 Hz, -CH = CH 2), 1.52 - 1.42 (m, 2H, -CH 2-), 1.42 - 1.32 (m, 4H, -CH 2-), 1.32 - 1.11 (m, 16H, -CH 2-), 0.87 (t, 3H, J = 6.83 Hz, CH 3)。  HRMS (EI): m/z Calcd for(理論計算值) C 36H 46Si: (M +) 506.337, found(實測值) 506.329。 1 H-NMR (CDCl 3 ): δ (ppm) 7.54 (brs, 3H, Ar - H), 7.48 (d, 3H, J = 6.83 Hz, Ar - H), 7.40 (d, 3H, J = 6.83 Hz , Ar - H), 7.32 (t, 3H, J = 6.83 Hz, Ar - H), 6.69 (dd, 3H, J = 11.10, 17.93 Hz, -CH = CH 2 ), 5.69 (d, 3H, J = 17.93 Hz, -CH = CH 2 ), 5.21 (d, 3H, J = 11.10 Hz, -CH = CH 2 ), 1.52 - 1.42 (m, 2H, -CH 2 -), 1.42 - 1.32 (m, 4H, -CH 2 -), 1.32 - 1.11 (m, 16H, -CH 2 -), 0.87 (t, 3H, J = 6.83 Hz, CH 3 ). HRMS (EI): m/z Calcd for (calculated for) C 36 H 46 Si: (M + ) 506.337, found (found) 506.329.

[例3]十二烷基三(乙烯基苄基)矽烷異構物混合物(C12-T-mp-Bn-Si)之合成  於氮氣氛圍下,向50 mL之四口燒瓶中加入鎂(切削片狀,0.898 g,36.9 mmol)及二乙醚(21.1 mL),利用冰浴進行冷卻。歷時1小時向懸浮液中滴加4-(氯甲基)苯乙烯/3-(氯甲基)苯乙烯混合物(1:1(莫耳比),5.12 g,33.5 mmol)之二乙醚(10.5 mL)溶液。於與上述相同之溫度下攪拌1小時後,歷時20分鐘滴加十二烷基三氯矽烷(3.33 mL,11.2 mmol)。將燒瓶加溫至室溫,攪拌12小時以上。向反應液中添加水(15 mL)並攪拌10分鐘以上,而分離有機相。進而,向水相中添加二乙醚(30 mL),進行2次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。使用硫酸鎂對合併之有機相進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗產物。使用矽膠管柱層析法(流動相:正己烷)對粗產物進行純化,從而獲得0.319 g作為無色液體之十二烷基三(乙烯基苄基)矽烷異構物混合物(C12-T-mp-Bn-Si)(產率:5.2%)。根據NMR之分析結果,推算出異構物混合物中之3-乙烯基苄基與4-乙烯基苄基之莫耳比為1.4:1.6。[Example 3] Synthesis of dodecyl tri(vinylbenzyl) silane isomer mixture (C12-T-mp-Bn-Si) Under nitrogen atmosphere, magnesium (cutting flakes, 0.898 g, 36.9 mmol) and diethyl ether (21.1 mL), cooled in an ice bath. Add 4-(chloromethyl)styrene/3-(chloromethyl)styrene mixture (1:1 (molar ratio), 5.12 g, 33.5 mmol) in diethyl ether (10.5 mL) solution. After stirring at the same temperature as above for 1 hour, dodecyltrichlorosilane (3.33 mL, 11.2 mmol) was added dropwise over 20 minutes. The flask was warmed to room temperature and stirred over 12 hours. Water (15 mL) was added to the reaction liquid and stirred for more than 10 minutes, and the organic phase was separated. Furthermore, diethyl ether (30 mL) was added to the aqueous phase, and extraction was performed twice to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain the crude product. The crude product was purified by silica gel column chromatography (mobile phase: n-hexane) to obtain 0.319 g of dodecyltris(vinylbenzyl)silane isomer mixture (C12-T-mp -Bn-Si) (yield: 5.2%). According to the analysis results of NMR, the molar ratio of 3-vinylbenzyl and 4-vinylbenzyl in the isomer mixture was estimated to be 1.4:1.6.

反應路徑圖、NMR分析結果及HRMS分析結果如下。 [化13]

Figure 02_image027
The reaction path diagram, NMR analysis results and HRMS analysis results are as follows. [chemical 13]
Figure 02_image027

1H-NMR (CDCl 3): δ (ppm) 7.35 ~ 6.81 (m, 12H, Ar - H), 6.74 ~ 6.55 (m, 3H, H - 5, -CH = CH 2), 5.68 (d, 3H, J = 17.1 Hz, -CH = CH 2), 5.20 (d, 1.36H, J = 10.2 Hz, -CH = CH 2, 間位體), 5.17 (d, 1.64H, J = 11.1 Hz, -CH = CH 2, 鄰位體), 2.10 (s, 6H, Si - CH 2- Ar), 1.38 - 1.06 (m, 20H, -CH 2-), 0.88 (t, 3H, J = 6.83 Hz, CH 3), 0.56 - 0.39 (m, 2H, -CH 2-)。 HRMS (EI): m/z Calcd for(理論計算值) C 39H 52Si: (M +) 548.384, found(實測值) 548.376。 1 H-NMR (CDCl 3 ): δ (ppm) 7.35 ~ 6.81 (m, 12H, Ar - H), 6.74 ~ 6.55 (m, 3H, H - 5, -CH = CH 2 ), 5.68 (d, 3H , J = 17.1 Hz, -CH = CH 2 ), 5.20 (d, 1.36H, J = 10.2 Hz, -CH = CH 2 , metabody), 5.17 (d, 1.64H, J = 11.1 Hz, -CH = CH 2 , ortho), 2.10 (s, 6H, Si - CH 2 - Ar), 1.38 - 1.06 (m, 20H, -CH 2 -), 0.88 (t, 3H, J = 6.83 Hz, CH 3 ), 0.56 - 0.39 (m, 2H, -CH 2 -). HRMS (EI): m/z Calcd for (calculated for) C 39 H 52 Si: (M + ) 548.384, found (found) 548.376.

[例21]二甲基雙(4-乙烯基苯基)矽烷(C1-D-p-St-Si)之合成  <雙(4-甲醯基苯基)二甲基矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入4-溴苯甲醛二甲縮醛(24.0 g,102 mmol)及四氫呋喃(300 mL)。將該溶液冷卻至-65℃以下,歷時1小時向其中滴加n-BuLi/正己烷溶液(2.6 mol/L,39 mL,100 mmol),並將反應溶液於-70℃以下之溫度下攪拌2小時。歷時40分鐘向所獲得之反應溶液中滴加二氯二甲基矽烷(4.93 mL,40.7 mmol),並於與上述相同之溫度下攪拌2小時。將燒瓶加溫至室溫,攪拌12小時以上。利用鹽酸(2 mol/L,120 mL)將反應混合物淬滅,並添加二乙醚(100 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(100 mL),進行2次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。利用飽和食鹽水(100 mL)將合併之有機相洗淨,並使用硫酸鎂進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得縮醛/醛之粗混合物。向粗混合物中添加四氫呋喃(100 mL)及鹽酸(2 mol/L,100 mL),進行2小時之加熱回流。冷卻至室溫後,向反應液中滴加飽和碳酸氫鈉水溶液(240 mL)。向反應液中添加二乙醚(100 mL),進行3次分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。利用飽和食鹽水(100 mL)將合併之有機相洗淨,並使用硫酸鎂進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗產物(淡黃色之油)。向粗產物中添加乙酸乙酯/正己烷混合溶液(1:7(體積比),120 mL),加熱回流後,緩慢地冷卻至0℃。對懸浮液進行過濾,於減壓下對所獲得之固體進行乾燥,從而獲得8.40 g雙(4-甲醯基苯基)二甲基矽烷(產率:77%)。[Example 21] Synthesis of dimethylbis(4-vinylphenyl)silane (C1-D-p-St-Si) <Synthesis of bis(4-formylphenyl)dimethylsilane> under nitrogen atmosphere , Add 4-bromobenzaldehyde dimethyl acetal (24.0 g, 102 mmol) and tetrahydrofuran (300 mL) into a 500 mL four-neck flask. The solution was cooled to below -65°C, n-BuLi/n-hexane solution (2.6 mol/L, 39 mL, 100 mmol) was added dropwise thereto over 1 hour, and the reaction solution was stirred at a temperature below -70°C 2 hours. Dichlorodimethylsilane (4.93 mL, 40.7 mmol) was added dropwise to the obtained reaction solution over 40 minutes, and stirred at the same temperature as above for 2 hours. The flask was warmed to room temperature and stirred over 12 hours. The reaction mixture was quenched with hydrochloric acid (2 mol/L, 120 mL), and diethyl ether (100 mL) was added to separate the organic phase for extraction. Furthermore, diethyl ether (100 mL) was added to the aqueous phase, and extraction was performed twice to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were washed with saturated brine (100 mL), dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude acetal/aldehyde mixture. Add tetrahydrofuran (100 mL) and hydrochloric acid (2 mol/L, 100 mL) to the crude mixture, and heat to reflux for 2 hours. After cooling to room temperature, saturated aqueous sodium bicarbonate solution (240 mL) was added dropwise to the reaction solution. Diethyl ether (100 mL) was added to the reaction liquid, and the organic phase was separated and extracted three times. The organic phases obtained by extraction are combined. The combined organic phases were washed with saturated brine (100 mL), dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude product (pale yellow oil). Ethyl acetate/n-hexane mixed solution (1:7 (volume ratio), 120 mL) was added to the crude product, heated to reflux, and then slowly cooled to 0°C. The suspension was filtered, and the obtained solid was dried under reduced pressure to obtain 8.40 g of bis(4-formylphenyl)dimethylsilane (yield: 77%).

反應路徑圖及NMR分析結果如下。 [化14]

Figure 02_image029
The reaction path diagram and NMR analysis results are as follows. [chemical 14]
Figure 02_image029

1H-NMR (CDCl 3): δ (ppm) 10.03 (s, 2H, CHO), 7.86 (d, 4H, J = 7.68 Hz, Ar - H), 7.68 (d, 4H, J = 8.54 Hz, Ar - H), 0.64 (s, 6H, Si - CH 3)。 1 H-NMR (CDCl 3 ): δ (ppm) 10.03 (s, 2H, CHO), 7.86 (d, 4H, J = 7.68 Hz, Ar - H), 7.68 (d, 4H, J = 8.54 Hz, Ar - H), 0.64 (s, 6H, Si - CH 3 ).

<二甲基雙(4-乙烯基苯基)矽烷之合成> 於氮氣氛圍下,向500 mL之四口燒瓶中加入甲基三苯基溴化鏻(25.6 g,71.7 mmol)及四氫呋喃(128 mL)。將燒瓶冷卻至0℃,向懸浮液中添加第三丁醇鉀(9.03 g,80.5 mmol)。於與上述相同之溫度下將反應混合物攪拌5分鐘以上。歷時20分鐘向反應混合物中滴加雙(4-甲醯基苯基)二甲基矽烷(8.00 g,29.8 mmol)之四氫呋喃(128 mL)溶液。將燒瓶加溫至室溫,攪拌2小時。向反應混合物中添加4-第三丁基鄰苯二酚(0.60 mg)後,於30℃下並於減壓下進行濃縮。向所獲得之混合物中添加水(200 mL)及二乙醚(200 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(200 mL),進行分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。使用硫酸鎂對合併之有機相進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗混合物。向粗混合物中添加正己烷(160 mL)及二乙醚(40 mL),並攪拌30分鐘。使用濾紙對混合物進行過濾,於減壓下對濾液進行濃縮,獲得粗產物。使用矽膠管柱層析法(流動相:正己烷)對粗產物進行純化,從而獲得7.27 g作為無色液體之二甲基雙(4-乙烯基苯基)矽烷(C1-D-p-St-Si)(產率:92%)。 <Synthesis of Dimethylbis(4-vinylphenyl)silane> Under nitrogen atmosphere, methyltriphenylphosphonium bromide (25.6 g, 71.7 mmol) and tetrahydrofuran (128 mL) were added into a 500 mL four-necked flask. The flask was cooled to 0 °C and potassium tert-butoxide (9.03 g, 80.5 mmol) was added to the suspension. The reaction mixture was stirred at the same temperature as above for 5 more minutes. A solution of bis(4-formylphenyl)dimethylsilane (8.00 g, 29.8 mmol) in tetrahydrofuran (128 mL) was added dropwise to the reaction mixture over 20 minutes. The flask was warmed to room temperature and stirred for 2 hours. After adding 4-tert-butylcatechol (0.60 mg) to the reaction mixture, it was concentrated at 30° C. under reduced pressure. Water (200 mL) and diethyl ether (200 mL) were added to the obtained mixture, and the organic phase was separated for extraction. Furthermore, diethyl ether (200 mL) was added to the aqueous phase, and extraction was performed to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude mixture. To the crude mixture were added n-hexane (160 mL) and diethyl ether (40 mL), and stirred for 30 minutes. The mixture was filtered using filter paper, and the filtrate was concentrated under reduced pressure to obtain a crude product. The crude product was purified by silica gel column chromatography (mobile phase: n-hexane) to obtain 7.27 g of dimethylbis(4-vinylphenyl)silane (C1-D-p-St-Si) as a colorless liquid (Yield: 92%).

反應路徑圖、NMR分析結果及HRMS分析結果如下。 [化15]

Figure 02_image031
The reaction path diagram, NMR analysis results and HRMS analysis results are as follows. [chemical 15]
Figure 02_image031

1H-NMR (CDCl 3): δ (ppm) 7.48 (d, 4H, J = 8.54 Hz, Ar - H), 7.38 (d, 4H, J = 7.68 Hz, Ar - H), 6.71 (dd, 2H, J = 11.1, 17.9 Hz, -CH = CH 2), 5.77 (d, 2H, J = 17.1 Hz, -CH = CH 2), 5.25 (d, 2H, J = 10.2 Hz, -CH = CH 2), 0.54 (s, 6H, Si - CH 3)。  HRMS (EI): m/z Calcd for(理論計算值) C 18H 20Si: (M +) 264.133, found(實測值) 264.131。. 1 H-NMR (CDCl 3 ): δ (ppm) 7.48 (d, 4H, J = 8.54 Hz, Ar - H), 7.38 (d, 4H, J = 7.68 Hz, Ar - H), 6.71 (dd, 2H , J = 11.1, 17.9 Hz, -CH = CH 2 ), 5.77 (d, 2H, J = 17.1 Hz, -CH = CH 2 ), 5.25 (d, 2H, J = 10.2 Hz, -CH = CH 2 ) , 0.54 (s, 6H, Si - CH 3 ). HRMS (EI): m/z Calcd for (calculated for) C 18 H 20 Si: (M + ) 264.133, found (found) 264.131. .

[例22]十二烷基三(4-乙烯基苯基)矽烷(C12-T-p-St-Si)之合成  <十二烷基三(4-甲醯基苯基)矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入4-溴苯甲醛二甲縮醛(24.0 g,102 mmol)及四氫呋喃(300 mL)。將該溶液冷卻至-66℃以下,歷時1小時向其中滴加n-BuLi/正己烷溶液(2.6 mol/L,39 mL,100 mmol),並將反應溶液於-70℃以下之溫度下攪拌2小時。歷時40分鐘向所獲得之反應溶液中滴加十二烷基三氯矽烷(8.08 mL,27.2 mmol),並於與上述相同之溫度下攪拌2小時。將燒瓶加溫至室溫,攪拌12小時以上。利用鹽酸(2 mol/L,120 mL)將反應混合物淬滅,並添加二乙醚(100 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(100 mL),進行分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。利用飽和食鹽水(100 mL)將合併之有機相洗淨,並使用硫酸鎂進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗產物。使用矽膠管柱層析法(流動相:氯仿/正己烷=1:1(體積比))對粗產物進行純化,從而獲得9.53 g作為無色液體之十二烷基三(4-甲醯基苯基)矽烷(產率:68%)。[Example 22] Synthesis of dodecyltris(4-vinylphenyl)silane (C12-T-p-St-Si) <Synthesis of dodecyltris(4-formylphenyl)silane> in nitrogen Under atmosphere, add 4-bromobenzaldehyde dimethyl acetal (24.0 g, 102 mmol) and tetrahydrofuran (300 mL) into a 500 mL four-neck flask. The solution was cooled to below -66°C, n-BuLi/n-hexane solution (2.6 mol/L, 39 mL, 100 mmol) was added dropwise thereto over 1 hour, and the reaction solution was stirred at a temperature below -70°C 2 hours. To the obtained reaction solution, dodecyltrichlorosilane (8.08 mL, 27.2 mmol) was added dropwise over 40 minutes, and stirred at the same temperature as above for 2 hours. The flask was warmed to room temperature and stirred over 12 hours. The reaction mixture was quenched with hydrochloric acid (2 mol/L, 120 mL), and diethyl ether (100 mL) was added to separate the organic phase for extraction. Furthermore, diethyl ether (100 mL) was added to the aqueous phase, and extraction was performed to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were washed with saturated brine (100 mL), dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude product. The crude product was purified by silica gel column chromatography (mobile phase: chloroform/n-hexane=1:1 (volume ratio)) to obtain 9.53 g of dodecyltris(4-formylbenzene) as a colorless liquid base) silane (yield: 68%).

反應路徑圖及NMR分析結果如下。 [化16]

Figure 02_image033
The reaction path diagram and NMR analysis results are as follows. [chemical 16]
Figure 02_image033

1H-NMR (CDCl 3): δ (ppm) 10.06 (s, 3H, CHO), 7.89 (d, 6H, J = 8.54 Hz, Ar - H), 7.67 (d, 6H, J = 8.54 Hz, Ar - H), 1.47 ~ 1.39 (m, 6H, -CH 2-), 1.23 (brs, 16H, -CH 2-), 0.87 (t, 3H, J = 6.83 Hz, Si - CH 3)。 1 H-NMR (CDCl 3 ): δ (ppm) 10.06 (s, 3H, CHO), 7.89 (d, 6H, J = 8.54 Hz, Ar - H), 7.67 (d, 6H, J = 8.54 Hz, Ar - H), 1.47 ~ 1.39 (m, 6H, -CH 2 -), 1.23 (brs, 16H, -CH 2 -), 0.87 (t, 3H, J = 6.83 Hz, Si - CH 3 ).

<十二烷基三(4-乙烯基苯基)矽烷之合成>  於氮氣氛圍下,向500 mL之四口燒瓶中加入甲基三苯基溴化鏻(21.3 g,59.6 mmol)及四氫呋喃(136 mL)。將燒瓶冷卻至0℃,向懸浮液中添加第三丁醇鉀(7.53 g,67.1 mmol)。於與上述相同之溫度下將反應混合物攪拌5分鐘以上。歷時20分鐘向反應混合物中滴加十二烷基三(4-甲醯基苯基)矽烷(8.50 g,16.6 mmol)之四氫呋喃(136 mL)溶液。將燒瓶加溫至室溫,攪拌1小時。向反應混合物中添加4-第三丁基鄰苯二酚(2.55 mg)後,於30℃下並於減壓下進行濃縮。向所獲得之混合物中添加水(200 mL)及二乙醚(200 mL),進行分離有機相之萃取。進而,向水相中添加二乙醚(200 mL),進行分離有機相之萃取。將該等藉由萃取所得之有機相進行合併。使用硫酸鎂對合併之有機相進行乾燥,再進行過濾,於減壓下對濾液進行濃縮,獲得粗混合物。向粗混合物中添加正己烷(160 mL)及二乙醚(40 mL),並攪拌30分鐘。使用濾紙對混合物進行過濾,於減壓下對濾液進行濃縮,獲得粗產物(黃色之油)。使用矽膠管柱層析法(流動相:正己烷)對粗產物進行純化,從而獲得4.73 g作為淡黃色液體之十二烷基三(4-乙烯基苯基)矽烷(C12-T-p-St-Si)(產率:56%)。<Synthesis of dodecyltri(4-vinylphenyl)silane> Under nitrogen atmosphere, add methyltriphenylphosphonium bromide (21.3 g, 59.6 mmol) and tetrahydrofuran ( 136 mL). The flask was cooled to 0 °C and potassium tert-butoxide (7.53 g, 67.1 mmol) was added to the suspension. The reaction mixture was stirred at the same temperature as above for 5 more minutes. A solution of dodecyltris(4-formylphenyl)silane (8.50 g, 16.6 mmol) in tetrahydrofuran (136 mL) was added dropwise to the reaction mixture over 20 minutes. The flask was warmed to room temperature and stirred for 1 hour. After adding 4-tert-butylcatechol (2.55 mg) to the reaction mixture, it was concentrated at 30° C. under reduced pressure. Water (200 mL) and diethyl ether (200 mL) were added to the obtained mixture, and the organic phase was separated for extraction. Furthermore, diethyl ether (200 mL) was added to the aqueous phase, and extraction was performed to separate the organic phase. The organic phases obtained by extraction are combined. The combined organic phases were dried over magnesium sulfate, filtered, and the filtrate was concentrated under reduced pressure to obtain a crude mixture. To the crude mixture were added n-hexane (160 mL) and diethyl ether (40 mL), and stirred for 30 minutes. The mixture was filtered using filter paper, and the filtrate was concentrated under reduced pressure to obtain a crude product (yellow oil). The crude product was purified by silica gel column chromatography (mobile phase: n-hexane) to obtain 4.73 g of dodecyltris(4-vinylphenyl)silane (C12-T-p-St- Si) (Yield: 56%).

反應路徑圖、NMR分析結果及HRMS分析結果如下。 [化17]

Figure 02_image035
The reaction path diagram, NMR analysis results and HRMS analysis results are as follows. [chemical 17]
Figure 02_image035

1H-NMR (CDCl 3): δ (ppm) 7.47 (d, 6H, J = 7.68 Hz, Ar - H), 7.39 (d, 6H, J = 8.54 Hz, Ar - H), 6.72 (dd, 3H, J = 10.7, 17.5 Hz, -CH = CH 2), 5.79 (d, 3H, J = 17.9 Hz, -CH = CH 2), 5.27 (d, 3H, J = 11.1 Hz, -CH = CH 2), 1.49 ~ 1.22 (m, 22H, -CH 2-), 0.86 (t, 3H, J = 6.40 Hz, CH 3)。  HRMS (EI): m/z Calcd for(理論計算值) C 36H 46Si: (M +) 506.337, found(實測值) 506.331。 1 H-NMR (CDCl 3 ): δ (ppm) 7.47 (d, 6H, J = 7.68 Hz, Ar - H), 7.39 (d, 6H, J = 8.54 Hz, Ar - H), 6.72 (dd, 3H , J = 10.7, 17.5 Hz, -CH = CH 2 ), 5.79 (d, 3H, J = 17.9 Hz, -CH = CH 2 ), 5.27 (d, 3H, J = 11.1 Hz, -CH = CH 2 ) , 1.49 ~ 1.22 (m, 22H, -CH 2 -), 0.86 (t, 3H, J = 6.40 Hz, CH 3 ). HRMS (EI): m/z Calcd for (calculated for) C 36 H 46 Si: (M + ) 506.337, found (found) 506.331.

[例31] 準備作為市售之矽烷偶合劑之三甲氧基乙烯基矽烷(TMVS,TCI公司之商品)作為用於比較之有機矽化合物。 [Example 31] Trimethoxyvinylsilane (TMVS, a product of TCI Corporation), which is a commercially available silane coupling agent, was prepared as an organosilicon compound for comparison.

[例32] 準備作為市售之矽烷偶合劑之三乙氧基乙烯基矽烷(TEVS,TCI公司之商品)作為用於比較之有機矽化合物。 [Example 32] Triethoxyvinylsilane (TEVS, a product of TCI Corporation), which is a commercially available silane coupling agent, was prepared as an organosilicon compound for comparison.

[評估及結果] 於例1、2、21、22、31、32中,使用所獲得之或準備之有機矽化合物,依照上述[評估用樣品(膜狀硬化物)之製作方法]製作評估用樣品並進行評估。將評估結果示於表1~表3中。 [Evaluation and Results] In Examples 1, 2, 21, 22, 31, and 32, the obtained or prepared organosilicon compounds were used to prepare evaluation samples according to the above [Method for making evaluation samples (film-like cured products)] and evaluate them. The evaluation results are shown in Tables 1 to 3.

[表1]    例1 例21 有機矽化合物 C1-D-m-St-Si C1-D-p-St-Si

Figure 02_image037
Figure 02_image039
改性PPE OPE-2st SA-9000 OPE-2st 膜狀硬化物之評估             Dk @10 GHz 2.66 2.63 2.58 Df @10 GHz 0.0023 0.0029 0.0026 CTE[ppm/℃] 39 43 38 Tg[℃] 231 233 232 [Table 1] example 1 Example 21 organosilicon compound C1-Dm-St-Si C1-Dp-St-Si
Figure 02_image037
Figure 02_image039
Modified PPE OPE-2st SA-9000 OPE-2st Evaluation of membranous sclerosis Dk @10 GHz 2.66 2.63 2.58 Df @10 GHz 0.0023 0.0029 0.0026 CTE[ppm/℃] 39 43 38 Tg[°C] 231 233 232

[表2]    例2 例22 有機矽化合物 C12-T-m-St-Si C12-T-p-St-Si

Figure 02_image041
Figure 02_image043
改性PPE SA-9000 OPE-2st SA-9000 膜狀硬化物之評估             Dk @10 GHz 2.49 2.59 2.63 Df @10 GHz 0.0021 0.0019 0.0024 CTE[ppm/℃] 55 57 55 Tg[℃] 217 212 219 [Table 2] Example 2 Example 22 organosilicon compound C12-Tm-St-Si C12-Tp-St-Si
Figure 02_image041
Figure 02_image043
Modified PPE SA-9000 OPE-2st SA-9000 Evaluation of membranous sclerosis Dk @10 GHz 2.49 2.59 2.63 Df @10 GHz 0.0021 0.0019 0.0024 CTE[ppm/℃] 55 57 55 Tg[°C] 217 212 219

[表3]    例31 例32 有機矽化合物 TMVS TEVS 改性PPE SA-9000 OPE-2st SA-9000 OPE-2st 膜狀硬化物之評估                Dk @10 GHz 2.64 2.76 2.66 2.71 Df @10 GHz 0.0056 0.0076 0.0100 0.0125 CTE[ppm/℃] 48.7 57.9 59.4 69.5 Tg[℃] 232 238 214 194 [table 3] Example 31 Example 32 organosilicon compound TMVS TEVS Modified PPE SA-9000 OPE-2st SA-9000 OPE-2st Evaluation of membranous sclerosis Dk @10 GHz 2.64 2.76 2.66 2.71 Df @10 GHz 0.0056 0.0076 0.0100 0.0125 CTE[ppm/℃] 48.7 57.9 59.4 69.5 Tg[°C] 232 238 214 194

[結果之彙總] 於例1、2中,使用苯環上之乙烯基之取代位置為間位之有機矽化合物(式(1m)所表示之有機矽化合物)作為交聯劑,獲得膜狀硬化物。 於例21、22中,使用苯環上之乙烯基之取代位置為對位之用於比較之有機矽化合物作為交聯劑,獲得膜狀硬化物。 於例31、32中,使用作為用於比較之有機矽化合物之矽烷偶合劑,獲得膜狀硬化物。 相對於使用矽烷偶合劑之例31、32,於例1、2、21、22中,可有效降低高頻條件下之介電損耗因數(D f)。 根據例1與例21之比較、及例2與例22之比較,可知藉由使用苯環上之乙烯基之取代位置為間位之有機矽化合物作為交聯劑,可更有效地降低高頻條件下之介電損耗因數(D f)。 於例1、2中,可獲得高頻條件下之介電損耗因數(D f)有效降低、熱膨脹係數(CTE)足夠低且玻璃轉移溫度(Tg)足夠高之膜狀硬化物。 [Summary of Results] In Examples 1 and 2, an organosilicon compound (organosilicon compound represented by the formula (1m)) in which the substitution position of the vinyl group on the benzene ring is meta-position was used as a crosslinking agent to obtain film-like hardening thing. In Examples 21 and 22, a comparative organosilicon compound whose substitution position of the vinyl group on the benzene ring was at the para position was used as a crosslinking agent to obtain a hardened film. In Examples 31 and 32, a film-like cured product was obtained using a silane coupling agent which is an organosilicon compound for comparison. Compared with Examples 31 and 32 using silane coupling agents, in Examples 1, 2, 21, and 22, the dielectric loss factor (D f ) under high-frequency conditions can be effectively reduced. According to the comparison between Example 1 and Example 21, and the comparison between Example 2 and Example 22, it can be seen that by using an organosilicon compound whose substitution position of the vinyl group on the benzene ring is meta-position as a crosslinking agent, the high frequency can be reduced more effectively. Dielectric dissipation factor (D f ) under the condition. In Examples 1 and 2, the dielectric loss factor (D f ) is effectively reduced under high frequency conditions, and the film-shaped cured product with a sufficiently low coefficient of thermal expansion (CTE) and a sufficiently high glass transition temperature (Tg) can be obtained.

[例101] 將2官能氯甲基苯乙烯改性PPE(OPE-2st)、例1中合成之有機矽化合物、作為自由基聚合起始劑之二異丙苯基過氧化物、作為無機填充材之球狀二氧化矽、及甲苯以質量比7:3:0.1:10:10加以混合,並於室溫下進行攪拌,製備硬化性組合物(清漆)。 使所獲得之硬化性組合物(清漆)含浸於作為纖維基材之玻璃布(E玻璃(electrical glass,電絕緣玻璃),#2116)中之後,於130℃下加熱5分鐘,使硬化性組合物半硬化,獲得預浸體。 將2片所獲得之預浸體重疊,利用一對銅箔將該等預浸體夾住,獲得暫時積層體,於200℃、1.5小時、3 MPa之條件下對該暫時積層體進行加熱加壓,而製作覆金屬之積層板。 [Example 101] Bifunctional chloromethylstyrene modified PPE (OPE-2st), the organosilicon compound synthesized in Example 1, dicumyl peroxide as a radical polymerization initiator, and spherical Silicon dioxide and toluene were mixed at a mass ratio of 7:3:0.1:10:10 and stirred at room temperature to prepare a curable composition (varnish). The obtained curable composition (varnish) was impregnated in glass cloth (E glass (electrical glass, electrical insulating glass), #2116) as a fiber substrate, and heated at 130°C for 5 minutes to make the curable composition The material is semi-hardened to obtain a prepreg. Two prepregs obtained were stacked, and these prepregs were clamped by a pair of copper foils to obtain a temporary laminate. The temporary laminate was heated at 200°C, 1.5 hours, and 3 MPa. Press to make metal-clad laminates.

本發明並不限定於上述實施方式及實施例,可適當地進行設計變更,只要不脫離本發明之宗旨即可。The present invention is not limited to the above-mentioned embodiments and examples, and design changes can be appropriately made without departing from the gist of the present invention.

本申請案主張基於2021年6月4日提出申請之日本申請特願2021-094309號之優先權,並將其揭示之全部內容併入本文中。This application claims priority based on Japanese Application Japanese Patent Application No. 2021-094309 filed on June 4, 2021, and the entire disclosure thereof is incorporated herein.

1:覆金屬之積層板 2:覆金屬之積層板 3:配線基板 11:複合基材 12:金屬箔 22:導體圖案(電路圖案) 22W:配線 1: Metal-clad laminates 2: Metal-clad laminates 3: Wiring substrate 11: Composite base material 12: metal foil 22: Conductor pattern (circuit pattern) 22W: Wiring

圖1係本發明之第1實施方式之覆金屬之積層板之模式剖視圖。 圖2係本發明之第2實施方式之覆金屬之積層板之模式剖視圖。 圖3係本發明之一實施方式之配線基板之模式剖視圖。 Fig. 1 is a schematic sectional view of a metal-clad laminate according to a first embodiment of the present invention. Fig. 2 is a schematic sectional view of a metal-clad laminate according to a second embodiment of the present invention. Fig. 3 is a schematic cross-sectional view of a wiring board according to an embodiment of the present invention.

1:覆金屬之積層板 1: Metal-clad laminates

11:複合基材 11: Composite base material

12:金屬箔 12: metal foil

Claims (14)

一種有機矽化合物,其係由下式(1m)表示, [化1]
Figure 03_image045
(上式中,M為單鍵或可具有取代基之碳數1~20之伸烷基;苯環可具有取代基;苯環上之乙烯基之取代位置為間位;n為2~4之整數;R為氫原子、羥基或有機基,於R為有機基時,與Si鍵結之原子為C)。
An organosilicon compound represented by the following formula (1m), [Chem. 1]
Figure 03_image045
(In the above formula, M is a single bond or an alkylene group with a carbon number of 1 to 20 that may have a substituent; the benzene ring may have a substituent; the substitution position of the vinyl group on the benzene ring is the meta position; n is 2 to 4 An integer; R is a hydrogen atom, a hydroxyl group or an organic group, and when R is an organic group, the atom bonded to Si is C).
如請求項1之有機矽化合物,其中R為可具有取代基之碳數1~18之烷基。The organosilicon compound according to claim 1, wherein R is an alkyl group having 1 to 18 carbons which may have substituents. 如請求項1或2之有機矽化合物,其中M為單鍵或碳數1~4之伸烷基。The organosilicon compound according to claim 1 or 2, wherein M is a single bond or an alkylene group with 1 to 4 carbons. 一種交聯劑,其係由下式(1m)表示, [化2]
Figure 03_image047
(上式中,M為單鍵或可具有取代基之碳數1~20之伸烷基;苯環可具有取代基;苯環上之乙烯基之取代位置為間位;n為2~4之整數;R為氫原子、羥基或有機基,於R為有機基時,與Si鍵結之原子為C)。
A crosslinking agent represented by the following formula (1m), [Chem. 2]
Figure 03_image047
(In the above formula, M is a single bond or an alkylene group with a carbon number of 1 to 20 that may have a substituent; the benzene ring may have a substituent; the substitution position of the vinyl group on the benzene ring is the meta position; n is 2 to 4 An integer; R is a hydrogen atom, a hydroxyl group or an organic group, and when R is an organic group, the atom bonded to Si is C).
如請求項4之交聯劑,其中R為可具有取代基之碳數1~18之烷基。The crosslinking agent according to claim 4, wherein R is an alkyl group having 1 to 18 carbon atoms which may have substituents. 如請求項4或5之交聯劑,其中M為單鍵或碳數1~4之伸烷基。The crosslinking agent according to claim 4 or 5, wherein M is a single bond or an alkylene group with 1 to 4 carbons. 如請求項4或5之交聯劑,其係用於預浸體、覆金屬之積層板或配線基板之製造中所使用之硬化性組合物。The crosslinking agent according to claim 4 or 5 is a curable composition used in the manufacture of prepregs, metal-clad laminates, or wiring boards. 一種硬化性組合物,其包含:如請求項4或5之交聯劑、及具有能夠與該交聯劑交聯之2個以上交聯性官能基之硬化性化合物。A curable composition comprising: the cross-linking agent according to claim 4 or 5, and a curable compound having two or more cross-linkable functional groups capable of cross-linking with the cross-linking agent. 一種預浸體,其包含:纖維基材、及如請求項8之硬化性組合物之半硬化物或硬化物。A prepreg comprising: a fiber base material, and a semi-hardened or hardened material of the curable composition according to claim 8. 一種積層體,其包含:基材、及含有如請求項8之硬化性組合物之硬化性組合物層。A laminate comprising: a substrate, and a curable composition layer containing the curable composition according to claim 8. 一種積層體,其包含:基材、及含有如請求項8之硬化性組合物之半硬化物或硬化物之含(半)硬化物之層。A laminate comprising: a base material, and a layer containing a semi-cured product or a cured product containing a (semi) cured product of the curable composition according to claim 8. 如請求項10或11之積層體,其中上述基材為樹脂膜或金屬箔。The laminate according to claim 10 or 11, wherein the base material is a resin film or metal foil. 一種覆金屬之積層板,其包含:含有如請求項8之硬化性組合物之硬化物之絕緣層、及金屬箔。A metal-clad laminate, comprising: an insulating layer containing a cured product of the curable composition according to claim 8, and a metal foil. 一種配線基板,其包含:含有如請求項8之硬化性組合物之硬化物之絕緣層、及配線。A wiring board comprising: an insulating layer containing a cured product of the curable composition according to claim 8, and wiring.
TW111115961A 2021-06-04 2022-04-27 New organosilicon compound, new crosslinking agent, curable composition, prepreg, laminate body, metal-clad laminate, and circuit board TW202313636A (en)

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