TW202307399A - Angle measuring system - Google Patents

Abstract

The present disclosure provides an angle measuring system, comprising a light projection device and an angle measuring device. The light projection device emits a laser beam that penetrates the assembly element in the electronic device to be tested, and the laser beam is subjected to the assembly element to generate a reflected laser. The angle measuring device has a Fourier transform lens group and an image sensor. The Fourier transform lens group is located on the light path of the reflected laser, and the reflected laser is projected on the image sensor through the Fourier transform lens group. Wherein, the incident angle of the reflected laser passing through the lens surface of the Fourier transform lens group will change the projected position of the reflected laser on the image sensor. In the present application, the assembly element are measured by laser, and the reflected laser is received by the image sensor through the Fourier transform lens group, so as to determine the inclination angle of the assembly element.

Description

Angle measurement system

The present application relates to the technical field of measurement systems of electronic devices, and in particular to an angle measurement system.

At present, the detection of the installation inclination of the electronic parts inside the electronic device is mainly determined by the difference in the performance of the electronic device when the performance of the electronic device is detected. To confirm the electronic device, it is necessary to disassemble the electronic device for inspection, and put the electronic parts in question under a digital microscope for observation and measurement. Alternatively, the monitoring camera is used to take photos of the visible electronic parts of the electronic device, and compare the photos of the electronic parts of the normal electronic device to determine the problem of installation inclination. Many problems arise in detecting the inclination of the electronic parts of the electronic device in the above manner. For example, the test requires the disassembly of the electronic device, which is cumbersome, and it is difficult to compare the slight inclination of the electronic parts of the electronic device through photographic comparison or accurate measurement under a microscope. Furthermore, after the performance of the electronic device deviates, the dismantling process of the electronic device cannot ensure that the electronic components in the electronic device will not be affected by the dismantling process, which further reduces the reliability of the test results.

An embodiment of the present application provides an angle measurement system, which can solve the problems of cumbersome detection steps and low reliability of detection results in the existing angle measurement method.

In order to solve the above-mentioned technical problems, the application is implemented as follows:

An angle measurement system is provided, including: a light projection device and an angle measurement device. The light projection device emits a laser that penetrates the assembly components in the electronic device to be tested, and the laser is reflected by the assembly components; and the angle measurement device has a Fourier transform lens group and an image sensor, and the Fourier transform lens group is located at the reflection On the light path of the laser, the reflected laser is projected on the image sensor through the Fourier transform lens group; wherein, the incident angle of the reflected laser through the lens surface of the Fourier transform lens group will change the reflected laser projected on the image sensor location on the device.

In one of the embodiments, the Fourier transform lens group includes a first lens, a second lens and a third lens, the first lens, the second lens and the third lens are arranged in sequence corresponding to the lens surface, and the reflection After the laser passes through the lens surface, the reflected laser sequentially passes through the first lens, the second lens and the third lens to project on the image sensor.

In one of the embodiments, the first lens includes a first surface facing the lens surface and a second surface opposite to the first surface, the first surface has an arc of 24.7, and the second surface has an arc of 147.8, The second lens includes a third surface facing the first lens and a fourth surface opposite to the third surface, the third surface has an arc of 42.1, the fourth surface has an arc of -93.2, and the third lens includes The fifth surface facing the second lens and the sixth surface relative to the fifth surface have an arc of 12.7, and the sixth surface has an arc of 31.9.

In one of the embodiments, the distance between the center point of the lens surface and the center point of the first surface of the first lens is 5 mm, and the distance between the center point of the second surface of the first lens and the first surface of the second lens is 5 mm. The distance between the center points of the three surfaces is 7.1 mm, the distance between the center point of the fourth surface of the second lens and the center point of the fifth surface of the third lens is 7 mm, and the center of the sixth surface of the third lens The distance between the point and the center point of the image sensor is 7mm.

In one of the embodiments, the distance from the center point of the first surface of the first lens to the center point of the second surface is 3mm, and the distance from the center point of the third surface of the second lens to the fourth surface The distance between the center point is 3 mm, and the distance between the center point of the fifth surface of the third lens and the center point of the sixth surface is 3 mm.

In one of the embodiments, the first lens, the second lens and the third lens are all spherical mirrors, the first lens, the second lens and the third lens are made of glass, the glass type is TIF6, and the refractive index is is 1.62, and the Abbe number is 30.97.

In one embodiment, the light projection device includes a laser and a filter, and the laser emits the laser to irradiate the assembly element in the electronic device under test through the filter.

In one embodiment, the laser is infrared light, and the wavelength range of the laser is between 990nm and 890nm.

In one embodiment, the image sensor further includes a filter and a photosensitive element, the reflected laser passes through the filter, and the photosensitive element receives the reflected laser passing through the filter.

In one embodiment, a computer is further included, and the computer is connected to the image sensor.

The present application provides an angle measurement system, which uses a light projection device to project laser light through assembly components in the electronic device to be tested, and the laser light is reflected by the assembly components to generate reflected laser light. The incident angle of the reflected laser passing through the lens surface of the Fourier transform lens group will change the projected position of the reflected laser on the image sensor. In the present application, the Fourier transformation lens group can reduce the influence of the detection caused by the change of the detection distance of the light projection device or the angle measurement device relative to the electronic device under test.

The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

Please refer to FIG. 1 and FIG. 2 . FIG. 1 is a schematic view in the XZ direction and a schematic view in the XY direction of the first embodiment of the angle measurement system of the present application. As shown in the figure, an angle measurement system 1 of the present application includes a light projection device 11 and an angle measurement device 13 . The light projecting device 11 emits a laser L1 that penetrates the assembly component 21 in the electronic device 2 to be tested, and the laser L1 receives the assembly component 21 to generate a reflected laser L2. The angle measuring device 13 has a Fourier transform lens group 131 and an image sensor 133. The Fourier transform lens group 131 is located on the light path of the reflected laser L2, and the reflected laser L2 is projected onto the image sensor through the Fourier transform lens group 131. 133. Wherein, the incident angle b (refer to FIG. 4 ) of the reflected laser L2 passing through the lens surface 1310 of the Fourier transform lens group 131 will change the projected position of the reflected laser L2 on the image sensor 133 .

In this embodiment, the light projection device 11 includes a laser 111 and a filter 113 , and the laser 111 emits a laser L1 to irradiate the assembly component 21 in the electronic device 2 to be tested through the filter 113 . Wherein, the laser L1 emitted by the laser 111 is infrared light, and the wavelength range of the laser L1 is between 990nm and 890nm. The above-mentioned laser L1 can be selected according to user's requirements. The purpose of the laser L1 is to penetrate the screen of the electronic device under test 2 and irradiate the assembly component 21 inside the electronic device under test 2 , so as to measure the angle of the assembly component 21 inside the electronic device under test 2 . The laser L1 in this embodiment is 940nm infrared light, and most of the assembly components 21 are installed by metal components, which is beneficial to the reflection measurement of the laser L1 in this embodiment.

Furthermore, the laser light L1 emitted by the laser 111 will pass through the filter 113, and the filter 113 is a combination of two lenses and a small aperture stop. The filter 113 can filter out the high-frequency components in the laser L1 and reduce the adverse effect of the uneven distribution of light intensity of the laser L1 on the system. After the light emitted by the laser 111 is filtered, the laser L1 can be concentratedly irradiated on the assembly components 21 inside the electronic device 2 to be tested for reflection.

Please refer to FIG. 3 and FIG. 4 together. FIG. 3 is a schematic diagram of the structure of the Fourier transform lens group and a schematic diagram of the light path of the present application. In this embodiment, the Fourier transform lens group 131 includes a first lens 131A, a second lens 131B, and a third lens 131C, and the first lens 131A, the second lens 131B, and the third lens 131C are arranged in sequence corresponding to the lens surface 1310, Among them, the first lens 131A, the second lens 131B and the third lens 131C are all spherical mirrors, the first lens 131A, the second lens 131B and the third lens 131C are made of glass material, the glass type is TIF6, and the refractive index is 1.62, Abbe The number is 30.97. After the reflected laser L2 passes through the lens surface 1310 , the reflected laser L2 sequentially passes through the first lens 131A, the second lens 131B and the third lens 131C to project onto the image sensor 133 . The Fourier transform lens group 131 of this embodiment can convert the angle deflection information of the reflected laser L2 into direction information, that is, the incident angle b of the reflected laser L2 entering the Fourier transform lens group 131 will affect the projected image of the reflected laser L2 The landing position of the sensor 133, in other words, the incident angle b deflection information of the reflected laser L2 will be linearly mapped to the distance difference of the image plane. After the reflected laser L2 passes through the Fourier transform lens group 131, the image sensor 133 The landing position of the reflected laser L2 is received, so as to determine the deflection angle of the assembly component 21 in the electronic device 2 to be tested.

In this embodiment, the first lens 131A includes a first surface 1311 facing the lens surface 1310 and a second surface 1312 opposite to the first surface 1311. The first surface 1311 has an arc of 24.7, the optimal arc is 24.772, and the second Surface 1312 has an arc of 147.8, with an optimum arc of 147.845. The second lens 131B includes a third surface 1313 facing the first lens 131A and a fourth surface 1314 relative to the third surface 1313. The third surface 1313 has a radian of 42.1, and the optimum radian is 42.179. The fourth surface 1314 has a radian of -93.2, the optimum arc is -93.285, the third lens 131C includes a fifth surface 1315 facing the second lens 131B and a sixth surface 1316 opposite to the fifth surface 1315, the arc of the fifth surface 1315 is 12.7, the optimum arc is 12.743, the curvature of the sixth surface 1316 is 31.9, and the optimal curvature is 31.916.

As mentioned above, the distance D1 between the center point of the lens surface 1310 and the center point of the first surface 1311 of the first lens 131A is 5mm, and the optimal distance D1 is also 5mm, and the center point of the second surface 1312 of the first lens 131A is in the same distance as The center point distance D2 of the third surface 1313 of the second lens 131B is 7.1mm, and the optimal distance D2 is 7.173mm, the center point of the fourth surface 1314 of the second lens 131B and the center of the fifth surface 1315 of the third lens 131C The point distance D3 is 7 mm, and the optimal distance D3 is also 7 mm. The distance D4 between the center point of the sixth surface 1316 of the third lens 131C and the center point of the image sensor 133 is 7 mm, and the optimal distance D4 is also 7 mm.

Also, the thickness T1 from the center point of the first surface 1311 of the first lens 131A to the center point of the second surface 1312 is 3mm, and the optimal thickness T1 is 3.054mm, and the center point of the third surface 1313 of the second lens 131B to the second surface 1312 is 3mm. The thickness T2 of the central point of the four surfaces 1314 is 3 mm, and the optimal thickness T2 is 3.056 mm. The thickness T3 from the central point of the fifth surface 1315 of the third lens 131C to the central point of the sixth surface 1316 is 3 mm, and the optimal thickness T3 Also 3mm.

Please refer to FIG. 1 and FIG. 2 again. If the assembly component 21 is in the correct position and angle in the electronic device 2 to be tested, and there is no angular deflection or deviation, the laser L1 is irradiated on the electronic device 2 to be tested. The assembly components 21 inside form a reflected laser L2 with a correct reflection angle. Under the plane viewing angles of the XZ plane and the XY plane, the path of the reflected laser L2 has no deviation, and the reflected laser L2 is correctly incident on the Fourier transform lens group 131 within the lens surface 1310 . The angle at which the reflected laser L2 enters the lens surface 1310 of the Fourier transform lens group 131 is the correct and unbiased incident angle b, that is, the reflected laser L2 irradiates perpendicularly to the lens surface 1310 of the Fourier transform lens group 131 . The reflected laser L2 does not form refraction or reflection when passing through the Fourier transform lens group 131 . In this way, the reflected laser light L2 irradiates the image sensor 133 through the Fourier transform lens group 131 in a straight line.

Moreover, the image sensor 133 further includes a filter and a photosensitive element, the reflected laser L2 passes through the filter, and the photosensitive element receives the reflected laser L2 passing through the filter. The image sensor 133 of this embodiment receives the reflected laser light L2 passing through the Fourier transform lens group 131 , and then converts the reflected laser light L2 into an infographic with the final projected position of the reflected laser light L2 . Moreover, the angle measurement system 1 further includes a computer 15 connected to the image sensor 133 , and the computer 15 can directly display information pictures of the image sensor 133 on the display screen of the computer 15 .

Please also refer to FIG. 5 , which is a spot diagram of the image sensor of the present application. In this embodiment, the spot diagram of the image sensor 133 is formed by projecting the reflected laser L2. After the laser L1 is irradiated on the assembly component 21, many reflected rays of the laser L2 pass through the optical system, and the intersection points with the image plane are no longer concentrated at the same point due to aberration, forming a diffused area scattered in a certain range. Graphics, and display and image the above-mentioned diffuse graphics on the IMA surface of the optical system, which is the spot diagram. Furthermore, for the judgment of the spot diagram, different aberrations have different image performances. At the same time, the size of the spots varies with the size of the aberrations. Obviously, the smaller the aberration, the smaller the optical system, its The spots are also smaller. There is a definition to measure the spot size, which is the definition of RMS radius, and RMS is the root mean square radius, which can quantitatively reflect the actual spot size of the system. The present embodiment is a normal non-shifted spot diagram, and its incident angle b on the lens surface 1310 of the Fourier transform lens group 131 is 0 degree (refer to FIG. 4 ), so, on the IMA surface of the optical system The image is shown as the top left diagram in Figure 5. The light spot is concentrated at the center point and does not shift outward, and the RMS radius of the spot spot on the spectrum plane is 19.897μm. The Fourier transform lens group 131 of this embodiment has good resolving power at small angles.

Please also refer to FIG. 6 , which is a light fan diagram of the image sensor of the present application. In this embodiment, the light fan diagram can be divided into the beam profile passing through the Y axis of the pupil, which is called the light fan diagram in the meridian plane. The normalized pupil coordinate PY is used to represent any ray on the meridian light fan. And the beam profile passing through the X-axis of the pupil is called the light fan diagram in the sagittal plane. The normalized pupil coordinate PX is used to represent any ray on the sagittal light fan. Wherein, when the difference between the pupil Y axis and the pupil X axis is large, it means that the deflection angle of the light is large. This embodiment is a normal non-shifted light fan diagram, and its incident angle b on the lens surface 1310 of the Fourier transform lens group 131 is 90 degrees (please refer to FIG. 4 again), so the displayed image is the upper left in FIG. 6 corner icon.

Please refer to FIG. 7 and FIG. 8 . FIG. 7 is a schematic view in the XZ direction and a schematic view in the XY direction of the second embodiment of the angle measurement system of the present application. As shown in the figure, the difference between this embodiment and the first embodiment is that the assembly element 21 in the electronic device under test 2 has a deflection angle compared to the screen surface of the electronic device under test 2 . In this embodiment and the first embodiment, the irradiation angle of the laser beam L1 emitted by the light projection device 11 to irradiate the assembly component 21 in the electronic device 2 to be tested remains unchanged, but the angle of the assembly component 21 changes, and the reflected laser L2 The reflection angle will also change accordingly. At the same time, the incident angle b of the reflected laser L2 incident on the lens surface 1310 of the Fourier transform lens group 131 will also change. In this embodiment, when the assembled component 21 is deflected by an angle a, the corresponding incident angle A1 of the laser L1 and the reflection angle A2 of the reflected laser L2 increase the difference of the deflection angle a at the same time, which means that the reflected laser L2 is The Fourier transform lens group 131 produces an angular deflection of the deflection angle 2a, in other words, the incident angle b of the reflected laser L2 is the increased angular deflection, and the incident angle b of the reflected laser L2 relative to the lens surface 1310 of the Fourier transform lens group 131 is 2a.

Please refer to FIG. 4 again. In FIG. 4 , light paths of different line types are provided, and light paths of the same line type represent the same incident angle b. When the incident angle b of the reflected laser L2 incident on the lens surface 1310 of the Fourier transform lens group 131 is the same, although the light paths of the reflected laser L2 passing through the Fourier transform lens group 131 are different, they finally fall on the image sensor 133 The landing position will be the same.

Please refer to FIG. 5 again. FIG. 5 provides spot diagrams of different angles. In this embodiment, it is illustrated separately that when the incident angle b of the reflected laser L2 incident on the lens surface 1310 of the Fourier transform lens group 131 is 2.5 degrees, the spectral plane The RMS radius of the landing spot is 21.615μm, and the representative diagram is shown in the upper right corner. When the incident angle b is 5 degrees, the RMS radius of the landing spot on the spectrum plane is 26.992 μm, and the representative diagram is the one in the upper left corner. When the incident angle b is 10 degrees, the RMS radius of the landing spot on the spectrum plane is 48.540 μm, and the representative diagram is shown in the lower right corner. Among them, the incident angle b range for the best judgment of the spot diagram is within 5 degrees, and most incident angles b exceeding 5 degrees can be judged by the dispersion degree of the graph, but it is not easy to judge the actual incident angle b.

Please refer to FIG. 6 again. FIG. 6 provides light fan diagrams at different angles. In this embodiment, it is illustrated separately that when the incident angle b of the reflected laser light L2 incident on the lens surface 1310 of the Fourier transform lens group 131 is 2.5 degrees, the representative diagram shown as an icon in the upper right corner. When the incident angle b is 5 degrees, the representative diagram is the one in the upper left corner. When the incident angle b is 10 degrees, the representative diagram is the one in the lower right corner. Among them, the range of the incident angle b for the best judgment of the light fan diagram is within 5 degrees, and most incident angles b exceeding 5 degrees can be judged by the degree of the graph on the pupil Y axis and the pupil X axis, but it is not easy to judge the actual Angle of incidence b.

Please refer to FIG. 9 and FIG. 10 . FIG. 9 is a schematic view in the XZ direction and a schematic view in the XY direction of the third embodiment of the angle measurement system of the present application. As shown in the figure, the difference between this embodiment and the first embodiment is that the assembly element 21 in the electronic device under test 2 has a deflection angle compared to the screen surface of the electronic device under test 2 . The irradiation angle of the laser light L1 emitted by the light projection device 11 to irradiate the assembly component 21 in the electronic device 2 under test in this embodiment and the first embodiment remains the same. In this embodiment, when the assembled component 21 is deflected by the angle -a, the corresponding incident angle A1 of the laser L1 and the reflection angle A2 of the reflected laser L2 increase at the same time by the difference of the deflection -a, which represents the reflected laser L2 For the Fourier transform lens group 131, an angular deflection of -2a is generated. In other words, the incident angle of the reflected laser L2 is the reduced angular deflection. The incident angle of the reflected laser L2 relative to the lens surface 1310 of the Fourier transform lens group 131 is -2a.

To sum up, the present application provides an angle measurement system, which uses a light projection device to project a laser to penetrate the assembly components in the electronic device to be tested, and the laser is reflected by the assembly components to generate reflected laser light. The incident angle of the reflected laser passing through the lens surface of the Fourier transform lens group will change the projected position of the reflected laser on the image sensor. In the present application, the Fourier transformation lens group can reduce the influence of the detection caused by the change of the detection distance of the light projection device or the angle measurement device relative to the electronic device under test.

It should be noted that, in this document, the term "comprising", "comprising" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article or apparatus comprising a set of elements includes not only those elements, It also includes other elements not expressly listed, or elements inherent in the process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a ..." does not preclude the presence of additional identical elements in the process, method, article, or apparatus comprising that element.

The embodiments of the present application have been described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific embodiments. The above-mentioned specific embodiments are only illustrative, rather than restrictive. Under the enlightenment of this application, without departing from the purpose of this application and the protection scope of claims, many forms can also be made, all of which belong to the protection scope of this application.

1: Angle measurement system 11: Ray projection device 111:Laser 113: filter 13: Angle measuring device 131: Fourier transformation lens group 131A: first lens 131B: second lens 131C: Third lens 1310: lens surface 1311: first surface 1312: second surface 1313: The third surface 1314: The fourth surface 1315: fifth surface 1316: The Sixth Surface 133: Image sensor 15: computer 2: Electronic device 21: Assembly components L1: Laser L2: reflective laser A1: Angle of incidence A2: Reflection angle D1, D2, D3, D4: Distance T1, T2, T3: Thickness a, -a: deflection angle b: angle of incidence

The drawings described here are used to provide a further understanding of the application and constitute a part of the application. The schematic embodiments and descriptions of the application are used to explain the application and do not constitute an improper limitation to the application. In the attached picture: FIG. 1 is a schematic view in the XZ direction of the first embodiment of the angle measurement system of the present application. FIG. 2 is a schematic diagram of the XY direction of the first embodiment of the angle measurement system of the present application. FIG. 3 is a schematic structural diagram of the Fourier transform lens group of the present application. FIG. 4 is a schematic diagram of the light path of the Fourier transform lens group of the present application. FIG. 5 is a spot diagram of the image sensor of the present application. FIG. 6 is a light fan diagram of the image sensor of the present application. FIG. 7 is a schematic view in the XZ direction of the second embodiment of the angle measurement system of the present application. FIG. 8 is a schematic view in the XY direction of the second embodiment of the angle measurement system of the present application. FIG. 9 is a schematic view in the XZ direction of the third embodiment of the angle measurement system of the present application. FIG. 10 is a schematic view in the XY direction of the third embodiment of the angle measurement system of the present application.

1: Angle measurement system

11: Ray projection device

111:Laser

113: filter

13: Angle measuring device

131: Fourier transformation lens group

133: Image sensor

15: computer

2: Electronic device

21: Assembly components

L1: Laser

L2: reflective laser

A1: Angle of incidence

A2: Reflection angle

Claims (10)

An angle measurement system comprising: A light projection device emits a laser that penetrates an assembled component in an electronic device to be tested, and the laser is reflected by the assembled component to generate a reflected laser; and An angle measuring device has a Fourier transform lens group and an image sensor, the Fourier transform lens group is located on the light path of the reflected laser, and the reflected laser is projected on the image sensor through the Fourier transform lens group detector; Wherein, an incident angle of the reflected laser passing through a lens surface of the Fourier transformation lens group will change the projected position of the reflected laser on the image sensor. The angle measuring system as described in claim 1, wherein the Fourier transform lens group includes a first lens, a second lens and a third lens, and the first lens, the second lens and the third lens are arranged in sequence Corresponding to the lens surface, after the reflected laser passes through the lens surface, the reflected laser sequentially passes through the first lens, the second lens and the third lens to project on the image sensor. The angle measuring system as described in claim 2, wherein the first lens includes a first surface facing the lens surface and a second surface relative to the first surface, the arc of the first surface is 24.7, the first surface The curvature of the two surfaces is 147.8, the second lens includes a third surface facing the first lens and a fourth surface opposite to the third surface, the curvature of the third surface is 42.1, and the curvature of the fourth surface is -93.2, the third lens includes a fifth surface facing the second lens and a sixth surface opposite to the fifth surface, the fifth surface has an arc of 12.7, and the sixth surface has an arc of 31.9. The angle measuring system as described in claim 3, wherein the distance between the center point of the lens surface and the center point of the first surface of the first lens is 5 mm, and the center point of the second surface of the first lens is in the same distance as the first lens. The distance between the center points of the third surface of the second lens is 7.1mm, the distance between the center point of the fourth surface of the second lens and the center point of the fifth surface of the third lens is 7mm, and the distance between the center point of the third surface of the third lens The distance between the center point of the sixth surface and the center point of the image sensor is 7mm. The angle measuring system as described in claim 3, wherein the thickness from the center point of the first surface of the first lens to the center point of the second surface is 3 mm, and the thickness from the center point of the third surface of the second lens to The thickness from the central point of the fourth surface is 3 mm, and the thickness from the central point of the fifth surface of the third lens to the central point of the sixth surface is 3 mm. The angle measuring system as described in claim 2, wherein the first lens, the second lens and the third lens are all spherical mirrors, the first lens, the second lens and the third lens are made of glass material, glass type It is TIF6, the refractive index is 1.62, and the Abbe number is 30.97. The angle measuring system as claimed in claim 1, wherein the light projection device includes a laser and a filter, and the laser emits the laser and irradiates the assembled component in the electronic device under test through the filter . The angle measuring system as claimed in item 7, wherein the laser is infrared light, and the wavelength range of the laser is between 890nm and 990nm. The angle measuring system as described in Claim 1, wherein the image sensor further includes a filter and a photosensitive element, the reflected laser passes through the filter, and the photosensitive element receives light passing through the filter The reflected laser. The angle measurement system as claimed in claim 1, further comprising a computer connected to the image sensor.

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