TW202247114A - Analysis method and device of learning situation based on evaluation results - Google Patents
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本發明係關於教育領域之學生學習情況的分析,特別關於一種基於測評成績的學情分析方法及基於測評成績的學情分析裝置,可用於分析、確認學生的學習概況以對其產生原因進行歸因。 The present invention relates to the analysis of the learning situation of students in the field of education, in particular to a learning situation analysis method based on evaluation results and a learning situation analysis device based on evaluation results, which can be used to analyze and confirm the learning situation of students to attribute their causes because.
計算機技術和網絡技術的快速發展給人們的生活帶來了翻天覆地的變化、及各種便利性。同時,伴著生活水平的不斷提高,家長及老師對學生的學習情況越來越重視。學校、課外培訓機構等教育機構需及時瞭解每個學生的學習情況以對每個學生進行針對性的知識模塊輔導、訓練。 The rapid development of computer technology and network technology has brought earth-shaking changes and various conveniences to people's lives. At the same time, with the continuous improvement of living standards, parents and teachers pay more and more attention to the learning situation of students. Schools, extracurricular training institutions and other educational institutions need to keep abreast of each student's learning situation in order to provide targeted knowledge module guidance and training for each student.
通常情況下,教育機構的老師一般會不定期地對學生以試題測試的方式瞭解、掌握學生們再一段時間內對知識的的掌握情況,即各位學生的學習情況。據由不同學生的學習情況,老師可有針對性地對學習情況不同的學生採取方式各異的輔導、激勵方法。 Usually, the teachers of educational institutions generally use test questions and tests to understand and grasp the students' mastery of knowledge over a period of time, that is, the learning situation of each student. According to the learning situation of different students, teachers can adopt different methods of counseling and motivation for students with different learning situations.
一般地,各學科的不同知識點之間存在著遞進的層次關係,不同的知識點間存在著千絲萬縷的聯繫。每套測試題(或每套考卷)中不同題號所考察的知識點間存在某種程度的關聯。老師通過對該些不同題號 間知識點的關聯性和各位學生的答題情況進行分析,進而瞭解、確認欸為學生對於該套試題所涉知識點的掌握情況、答題時的狀態及老師的出題質量等。 Generally, there is a progressive hierarchical relationship between different knowledge points of various disciplines, and there are innumerable connections between different knowledge points. There is a certain degree of correlation between the knowledge points examined by different question numbers in each set of test questions (or each set of examination papers). The teacher passed these different question numbers Analyze the relevance of the knowledge points among them and the students' answers to the questions, and then understand and confirm the students' mastery of the knowledge points involved in the set of test questions, the status of answering questions, and the quality of the teacher's questions, etc.
因此,本發明的主要目的在於提供一種如何通過對不同考試題的測評成績或答題對錯情況進行分析,以瞭解、掌握各位學生在一定時間內對該階段所學知識點的掌握情況。 Therefore, the main purpose of the present invention is to provide a method of how to understand and grasp the mastery of the knowledge points learned by each student within a certain period of time by analyzing the evaluation results of different examination questions or the correctness of the answers.
本發明之目的在於提供一種基於測評成績的學情分析方法及基於測評成績的學情分析裝置,通過該裝置及方法對試題測評成績或答題結果進行分析,以瞭解各個學生的學習情況(如知識點掌握與否及程度等),益於老師後續安排更加適宜的教學計劃、針對各個學生進行有針對性的輔導等。 The purpose of the present invention is to provide a method for analyzing academic situation based on evaluation results and a device for analyzing academic situation based on evaluation results, through which the device and method analyze the evaluation results or answer results of test questions to understand the learning situation of each student (such as knowledge mastery and level, etc.), it is beneficial for teachers to arrange more suitable teaching plans and provide targeted counseling for each student.
為達所述優點至少其中之一或其他優點,本發明的一實施例提出一種基於測評成績的學情分析方法,至少包括如下步驟: In order to achieve at least one of the advantages or other advantages, an embodiment of the present invention proposes a method for analyzing academic performance based on evaluation results, which at least includes the following steps:
S01:創建考卷測評結果信息庫,包括採集並識別每道試題答對人數、每位測試者的答題結果狀態; S01: Create an examination paper evaluation result information database, including collecting and identifying the number of people who answered each test question correctly and the status of each test taker's answer result;
S02:據由每道試題答對人數對該考卷試題的題號進行分組排列,將答對人數相同的試題題號排在同一組; S02: Arrange the question numbers of the examination paper in groups according to the number of people who answered correctly for each question, and arrange the question numbers of the questions with the same number of correct answers in the same group;
S03:設定一關聯性閾值; S03: Setting a relevance threshold;
S04:依據該關聯性閾值構建試題關聯模型。根據該關聯性閾值計算下一組所列試題與其相鄰的上一組所列試題建立關聯所需符合要求的答對人數,並根據所述答對人數以形成下一組所列試題與其相鄰的上一 組之間的試題關聯模型。 S04: Construct an item association model according to the association threshold. According to the relevance threshold, the number of correct answers required to establish the association between the next group of listed test questions and its adjacent previous group of listed test questions is calculated, and according to the number of correct answers, the next group of listed test questions and its adjacent group of test questions are formed. Previous Item association models between groups.
所述基於測評成績的學情分析方法,在步驟S04中該下一組所列試題與其相鄰的上一組所列試題之間的試題關聯模型建立方法為:以其相鄰的上一組的答對人數*關聯性閾值,若下一組所列試題與其相鄰的上一組所列試題組共同答對的人員數大於該值,則該下一組所列試題與其相鄰的上一組所列試題有關聯。 In the method for analyzing academic situation based on evaluation results, in step S04, the method for establishing the test question association model between the next set of listed test questions and its adjacent previous set of listed test questions is as follows: with its adjacent previous set The number of correct answers *relevance threshold, if the number of people who have answered correctly in the next group of questions listed in the next group and the adjacent group of questions listed in the previous group is greater than this value, then the test questions listed in the next group and the group adjacent to the previous group The listed questions are related.
在一些實施例中,根據該試題關聯模型對各組之間各個試題題號建立關聯模型時可用關聯線表示。 In some embodiments, according to the test item correlation model, when establishing a correlation model for each test item number between each group, it can be represented by a correlation line.
在一些實施例中,該關聯性閾值之設定值大小的影響因素至少包括試題的難易度、試題數量的多少。 In some embodiments, the influencing factors of the set value of the relevance threshold include at least the difficulty of the test questions and the number of test questions.
在一些實施例中,據由每道試題答對人數對該考卷試題的題號進行分組排列時,從下往上分層排列中每組答對人數依序遞減。 In some embodiments, when the number of questions in the examination paper is arranged in groups according to the number of people who answered correctly for each question, the number of people who answered correctly in each group in the hierarchical arrangement from bottom to top decreases in descending order.
在一些實施例中,該基於測評成績的知識點學情分析方法還可包括根據該每位測試者的該些關聯線判定該套考卷的出題質量。老師們可據此分析、判定結果改善出題質量,如在同一套測試考卷中增加不同試題之間知識點的關聯度。 In some embodiments, the method for analyzing knowledge points based on evaluation scores may also include determining the quality of the test papers according to the correlation lines of each test taker. Teachers can analyze and judge the results based on this to improve the quality of the questions, such as increasing the relevance of knowledge points between different test questions in the same set of test papers.
在一些實施例中,該基於測評成績的學情分析方法可對每位測試者的試題題號進行狀態標識,以區分答對試題和答錯試題。老師可據此標識一目了然地初步分析及瞭解每位測試者或學生的知識點掌握情況。 In some embodiments, the method for analyzing the academic situation based on the evaluation results can identify the status of each tester's test question number, so as to distinguish correct answers from wrong answers. Based on this logo, the teacher can initially analyze and understand the mastery of each tester or student's knowledge points at a glance.
一種基於測評成績的學情分析裝置,包括:分析統計模塊,統計、分析每道試題的答對人數、每位測試者的答題結果狀態;陣列建立 模塊,用以對每道試題題號進行分組排列;關聯模型建立模塊,根據該關聯性閾值構建相鄰組各個試題之間的關聯模型。該些試題之間的關聯模型可以有多種不同的表現形式,如關聯線。 A learning situation analysis device based on evaluation results, including: analysis and statistics module, statistics and analysis of the number of correct answers to each test question, the status of each tester's answer results; array establishment A module for grouping and arranging the question numbers of each test question; an association model building module for constructing an association model between each test question in an adjacent group according to the association threshold. The association models among these test items can have many different forms, such as association lines.
該種基於測評成績的學情分析裝置還可包括一標識模塊,用以對每位測試者的答題對錯試題題號狀態進行標識。 The learning situation analysis device based on evaluation results may also include an identification module, which is used to identify the status of each tester's right or wrong number of questions.
因此,利用本發明所提供一種基於測評成績的學情分析方法及基於測評成績的學情分析裝置,通過對每位測試者或學生的同一套考試試題答題結果及各道試題之間關聯度的分析,可快速掌握各個學生的學習情況,如知識點掌握與否及程度等。通過該分析還可瞭解該老師本次出卷的質量如何,例如該套試題的知識點是否過於分散、所涉知識點是否過於超前等。基於對試題之間的關聯線分析,有益於老師後續安排更加適宜的教學計劃、針對各個學生進行有針對性的輔導等。 Therefore, utilize a kind of academic situation analysis method based on evaluation result provided by the present invention and the academic situation analysis device based on evaluation result, through the same set of test questions answer results of each tester or student and the correlation degree between each test question Analysis can quickly grasp the learning situation of each student, such as whether the knowledge points are mastered or not and the degree. Through this analysis, it is also possible to understand the quality of the teacher's test papers, such as whether the knowledge points of this set of test questions are too scattered, whether the knowledge points involved are too advanced, etc. Based on the analysis of the connection line between the test questions, it is beneficial for teachers to arrange more appropriate teaching plans and provide targeted counseling for each student.
上述說明僅是本發明技術方案的概述,為了能夠更清楚瞭解本創作的技術手段,而可依照說明書的內容予以實施,並且為了讓本創作的上述和其他目的、特徵和優點能夠更明顯易懂,以下特舉較佳實施例,並配合所附圖式,詳細說明如下。 The above description is only an overview of the technical solution of the present invention. In order to better understand the technical means of this creation, it can be implemented according to the contents of the description, and in order to make the above and other purposes, features and advantages of this creation more obvious and understandable , the following preferred embodiments are specifically cited below, and in conjunction with the attached drawings, the detailed description is as follows.
S01~S04:步驟 S01~S04: Steps
1~40:試題題號 1~40: test question number
100:學情分析裝置 100:Academic situation analysis device
101:統計分析模塊 101: Statistical Analysis Module
102:陣列建立模塊 102: Array building module
103:關聯模型建立模塊 103:Association model building module
所包括的圖式用來提供對本申請實施例的進一步的理解,其構成了說明書的一部分,用於例示本申請的實施方式,並與文字描述一起來闡釋本申請的原理。顯而易見地,下面描述中的圖式僅僅是本申請的一些實施例,並非用於限定本申請的實施方式僅限於此,對於本領域具有通常知識者來講,當然可以根據這些圖式衍生而獲得其他的圖式。所述圖 式包括: The included drawings are used to provide a further understanding of the embodiments of the present application, which constitute a part of the specification, are used to illustrate the implementation of the present application, and explain the principle of the present application together with the text description. Obviously, the drawings in the following description are only some embodiments of the application, and are not intended to limit the implementation of the application to this. For those skilled in the art, of course, they can be derived from these drawings. other schemata. Said figure formulas include:
〔圖1〕係本發明基於測評成績的學情分析方法之流程圖。 〔Fig. 1〕 is the flow chart of the present invention's academic situation analysis method based on evaluation results.
〔圖2〕係本發明基於測評成績的學情分析方法之學生A的答題情況示意圖。 [Fig. 2] is a schematic diagram of student A's answering questions of the present invention based on the evaluation result analysis method for student A.
〔圖3〕係本發明基於測評成績的學情分析方法之學生B的答題情況示意圖。 [Fig. 3] is a schematic diagram of student B's answering questions of the present invention based on the evaluation result analysis method for student B.
〔圖4〕係本發明基於測評成績的學情分析裝置之簡示圖。 [Fig. 4] is a schematic diagram of the academic performance analysis device based on the evaluation results of the present invention.
這裡所公開的具體結構和功能細節僅僅是代表性的,並且是用於描述本發明的示例性實施例的目的。但是本發明可以通過許多替換形式來具體實現,並且不應當被解釋成僅僅受限於這裡所闡述的實施例。在本發明的描述中,需要理解的是,術語“中心”、“橫向”、“上”、“下”、“左”、“右”、“垂直”、“水平”、“頂”、“底”、“內”、“外”等指示的方位或位置關係為基於圖式所示的方位或位置關係,僅是為了便於描述本發明和簡化描述,而不是指示或暗示所指的裝置或組件必須具有特定的方位、或以特定的方位構造和操作,因此不能理解為對本發明的限制。此外,術語“第一”、“第二”僅用於描述目的,而不能理解為指示或暗示相對重要性或者隱含指明所指示的技術特徵的數量。由此,限定有“第一”、“第二”的特徵可以明示或者隱含地包括一個或者更多個該特徵。在本發明的描述中,除非另有說明,“多個”的含義是兩個或兩個以上。另外,術語“包括”及其任何變形皆為“至少包含”的意思。 Specific structural and functional details disclosed herein are representative only and for purposes of describing example embodiments of the present invention. This invention may, however, be embodied in many alternative forms and should not be construed as limited to only the embodiments set forth herein. In describing the present invention, it should be understood that the terms "central", "lateral", "upper", "lower", "left", "right", "vertical", "horizontal", "top", " The orientation or positional relationship indicated by "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying the referred device or positional relationship. Components must have a particular orientation, or be constructed and operated in a particular orientation, and therefore should not be construed as limiting the invention. In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the present invention, unless otherwise specified, "plurality" means two or more. In addition, the term "comprising" and any variations thereof mean "comprising at least".
在本發明的描述中,需要說明的是,除非另有明確的規定 和限定,術語“安裝”、“相連”、“連接”應做廣義理解,例如,可以是固定連接,也可以是可拆卸的連接,或一體成型的連接;可以是機械連接,也可以是電連接;可以是直接相連,也可以通過中間媒介間接相連,可以是兩個組件內部的連通。對於本領域具有通常知識者而言,可以具體情況理解上述術語在本發明中的具體含義。 In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integrally formed connection; it can be a mechanical connection or an electrical connection. Connection; it can be a direct connection, or an indirect connection through an intermediary, or an internal connection between two components. For those skilled in the art, the specific meanings of the above terms in the present invention can be understood in specific situations.
這裡所使用的術語僅僅是為了描述具體實施例而不意圖限制示例性實施例。除非上下文明確地另有所指,否則這裡所使用的單數形式“一個”、“一項”還意圖包括複數。還應當理解的是,這裡所使用的術語“包括”和/或“包含”規定所陳述的特徵、整數、步驟、操作、單元和/或組件的存在,而不排除存在或添加一個或更多其他特徵、整數、步驟、操作、單元、組件和/或其組合。 The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments. As used herein, the singular forms "a", "an" and "an" are intended to include the plural unless the context clearly dictates otherwise. It should also be understood that the terms "comprising" and/or "comprising" as used herein specify the presence of stated features, integers, steps, operations, units and/or components, but do not exclude the presence or addition of one or more Other features, integers, steps, operations, units, components and/or combinations thereof.
請參見圖1,圖1是本發明基於測評成績的學情分析方法之流程圖。為達所述優點至少其中之一或其他優點,本發明的一實施例提出一種基於測評成績的學情分析方法,至少包括如下步驟:(S01)創建考卷測評結果信息庫,包括採集並識別每道試題答對人數、每位測試者的答題狀態。(S02)據由每道試題答對人數對該考卷試題的題號進行分組排列,將答對人數相同的試題題號排在同一組。(S03)設定一關聯性閾值。(S04)依據該關聯性閾值構建試題關聯模型。根據該關聯性閾值計算下一組(待建立關聯關係的組)所列試題與其相鄰的上一組所列試題建立關聯所需符合要求的答對人數,並根據所述答對人數以形成下一組所列試題與其相鄰的上一組之間的試題關聯模型。下一組位於與其相鄰的上一組的上一層。 Please refer to Fig. 1, Fig. 1 is a flow chart of the method for analyzing academic situation based on evaluation results in the present invention. In order to achieve at least one of the above advantages or other advantages, an embodiment of the present invention proposes a method for analyzing academic performance based on evaluation results, which at least includes the following steps: (S01) creating an information database of examination paper evaluation results, including collecting and identifying each The number of people who answered the test questions correctly and the answering status of each tester. (S02) Arranging the question numbers of the examination paper in groups according to the number of correct answers to each test question, and arranging the test question numbers with the same number of correct answers in the same group. (S03) Setting a correlation threshold. (S04) Construct a test item association model according to the association threshold. According to the relevance threshold, the number of correct answers required to establish the association between the test questions listed in the next group (the group to be established) and the test questions listed in the previous group adjacent to it is calculated, and according to the number of correct answers to form the next The item association model between the items listed in the group and its adjacent previous group. The next group is located one layer above the previous group adjacent to it.
所述基於測評成績的學情分析方法,在步驟S04中該下一組 所列試題與其相鄰的上一組所列試題之間的試題關聯模型建立方法為:以其相鄰的上一組的答對人數*關聯性閾值,若下一組所列試題與其相鄰的上一組所列試題組共同答對的人員數大於該值,則該下一組所列試題與其相鄰的上一組所列試題有關聯。前述所構建的試題關聯模型可有多種不同的表現形式。圖示示例中,所構建的試題關聯模型中以關聯線表示該關聯關係。 In the method for analyzing academic situation based on evaluation results, in step S04, the next group The method for establishing the test item association model between the listed test questions and the previous group of adjacent test questions is as follows: the number of correct answers in the previous adjacent group * correlation threshold, if the test questions listed in the next group and the adjacent test questions If the number of people who have answered correctly in the group of questions listed in the previous group is greater than this value, then the questions listed in the next group are related to the questions listed in the previous group adjacent to it. The test item association model constructed above can have many different forms of expression. In the illustrated example, the association line is used to represent the association relationship in the constructed test item association model.
在步驟S02中,據由每道試題答對人數對該考卷之試題的題號進行分組時,從上倒下分組排列時該組所列試題題號的答對人數依此遞增或遞減。例如,在圖示之示例中,對試題題號進行分組排列時,將答對人數最多的試題題號排列在最下面,從下往上每組所列試題題號的答對人數依此遞減。 In step S02, when the question numbers of the test questions in the examination paper are grouped according to the number of correct answers to each test question, the number of correct answers to the test question numbers listed in the group increases or decreases accordingly when grouped from top to bottom. For example, in the example shown in the illustration, when the question numbers of the test questions are arranged in groups, the test question numbers with the largest number of correct answers are arranged at the bottom, and the number of correct answers for each group of test question numbers listed from bottom to top decreases accordingly.
該方法更可包括如下步驟:對每位測試者的試題題號進行狀態標識,以區分答對試題和答錯試題。同時,根據如前所述之步驟所建立的該套試題個題號之間的關聯線及每位測試者打錯試題的分佈情況,分析、確認每位測試者的學習情況。例如,在圖示之示例中以著色填充方式對每位測試者答錯的試題題號進行標識,益於老師等教育者可一目了然地查看每位測試者對該套試題的答題整體情況及答錯試題的分佈情形。不過不限於此,對每位測試者答錯和答對的試題題號進行狀態標識時還可採用不同的圖形形狀、可採用其它的顏色、亦可是形狀與顏色的組合等方式,能體現出差異即可。 The method may further include a step of: marking the status of each tester's test question number to distinguish correct answers from wrong answers. At the same time, analyze and confirm the learning situation of each tester according to the connection line between the question numbers of the set of test questions established in the steps mentioned above and the distribution of each tester's wrong test questions. For example, in the example shown in the illustration, the question numbers of each tester's wrong answers are marked with color filling, so that teachers and other educators can check the overall situation and answers of each tester's answers to this set of test questions at a glance. The distribution of wrong questions. However, it is not limited to this. Different graphic shapes, other colors, or combinations of shapes and colors can be used to indicate the status of each tester's wrong and correct test questions, which can reflect differences. That's it.
該關聯性闡值大小的影響因素至少包括試題的難易度、試題數量的多少。例如,當該些試題的難度較大時,該關聯性閾值之設定可 相對降低,數值偏小一些。當該些試題的數量(亦可稱試題題量)較多時,該關聯性閾值之設定可相對降低,數值偏小一些。 The influencing factors of the value of the correlation include at least the degree of difficulty of the test questions and the number of test questions. For example, when the difficulty of these test questions is relatively high, the setting of the relevance threshold can be Relatively lower, the value is smaller. When the number of these test questions (also referred to as the amount of test questions) is large, the setting of the relevance threshold can be relatively reduced, and the numerical value is relatively small.
該基於測評成績的知識點學情分析方法還可包括根據該套試題不同題號之間的該些關聯線判定該套考卷的出題質量。老師們可據此分析、判定結果改善出題質量,如在同一套測試考卷中增加不同試題之間知識點的關聯度。例如,若各層試題各個題號之間的關聯線較為密集,且每層的不同題號之間都存在關聯線,表明該套考卷各試題之間所涉知識點的較為密集,出題質量較高。該套考卷的測評結果對於老師瞭解、分析各個學生的知識掌握情況具有較高的參考價值。在現有的基礎教育階段,不同階段的學習或知識點之間具有較高的關聯度和連續性。根據參與該套考卷測試的該些測試者或學生的試題關聯線圖譜,若大多試題關聯線圖譜中離散分佈的試題題號較多,表明該套考卷出題質量不佳或未達預期,沒能較好地展現該套考卷所涉知識點的關聯度。 The method for analyzing knowledge points and learning conditions based on evaluation results may also include judging the quality of the set of test papers according to the connection lines between different question numbers of the set of test questions. Teachers can analyze and judge the results based on this to improve the quality of the questions, such as increasing the relevance of knowledge points between different test questions in the same set of test papers. For example, if the connection lines between each question number of each layer of test questions are relatively dense, and there are connection lines between different question numbers of each layer, it indicates that the knowledge points involved between the test questions of this set of examination papers are relatively dense, and the quality of the questions is high. . The evaluation results of this set of examination papers have a high reference value for teachers to understand and analyze the knowledge mastery of each student. In the existing basic education stage, there is a high degree of correlation and continuity between learning or knowledge points in different stages. According to the test-item correlation line graphs of the testers or students who participated in this set of examination papers, if there are more discretely distributed test question numbers in the correlation line graphs of most of the test papers, it indicates that the quality of the test papers is not good or does not meet expectations. Better show the relevance of the knowledge points involved in this set of test papers.
該基於測評成績的學情分析方法可對每位測試者答錯的試題題號以著色填充方式進行標識。老師可據此標識一目了然地初步分析及瞭解每位測試者或學生的知識點掌握情況。例如,若答錯的題號主要分佈在關聯線較為密集的區域,該測試者或該學生答錯的原因可能為:對該些知識點的掌握不牢;答題時較為粗心,稍加努力便可較好地掌握。若答錯的題號主要分佈在關聯線較為稀疏的區域或試題題號排列較為分散的區域,該測試者或該學生答錯的原因可能為:試題太難;該題所涉知識點尚未教學;該題所涉知識點已學過但久未複習等。 The academic performance analysis method based on the evaluation results can mark the question numbers of the wrong answers of each tester in a coloring and filling manner. Based on this logo, the teacher can initially analyze and understand the mastery of each tester or student's knowledge points at a glance. For example, if the question numbers that were answered incorrectly are mainly distributed in areas with relatively dense connection lines, the reasons for the tester or the student's incorrect answers may be: the lack of a firm grasp of these knowledge points; Can be better grasped. If the question numbers that are answered incorrectly are mainly distributed in areas where the connection lines are relatively sparse or where the question numbers of the test questions are arranged more scattered, the reason for the tester or the student's wrong answers may be: the test question is too difficult; the knowledge points involved in the question have not yet been taught ; The knowledge points involved in this question have been learned but have not been reviewed for a long time.
參見圖2和圖3,圖2是本發明基於測評成績的學情分析方法
之學生A的答題情況示意圖,圖3是本發明基於測評成績的學情分析方法之學生B的答題情況示意圖。根據該些圖示或試題關聯線圖譜對本發明之基於測評成績的學情分析方法進行詳細闡明或解釋。圖2、圖3中以一套具有40道試題的考卷為例進行說明該方法。經統計分析發現本次測評中題號29的題答對人數最多,將其排列在第一組,圖示示例中為最下層。假如本次測評的參與者共55人,題號29的答對人數最多,為55人。答對人數次多的題號列在第二組/層,如圖示示例中排在第二層的題號為31、25……依此類推,將該套考卷的各道試題及題號進行分組或分層排列。
Referring to Fig. 2 and Fig. 3, Fig. 2 is the academic situation analysis method based on the evaluation results of the present invention
Figure 3 is a schematic diagram of the answering situation of student A of the present invention, which is a schematic diagram of student B's answering situation based on the evaluation result analysis method of the present invention. According to these graphs or test item relational line graphs, the method for analyzing the academic situation based on the evaluation results of the present invention is explained or explained in detail. In Fig. 2 and Fig. 3, a set of examination papers with 40 test questions is taken as an example to illustrate the method. After statistical analysis, it was found that
假設該關聯性關聯性閾值設定為80%。根據每道試題答對人數之間的關聯模型對相鄰組之間各道試題的題號建立關聯線。以圖示中相鄰的第一層和第二層(從下往上)為例進行說明。如,排在第一組題號29有55人正確,排在第二組中的題號31與題號25有52人正確,進一步地,題號31正確且題號29正確人數為48人,題號25正確且題號29正確人數為50人。第一組與第二組的題號之間產生關聯的條件為:55*80%=44人。換句話說,既答對第一組又答對第二組且同時第二組的答對人數大於等於44人時,第一組與第二組的題號之間產生關聯。48>44,所以題號31與題號29有關聯,圖示示例中用關聯線來表示它們之間的關聯關係。50>44,所以題號25與題號29有關聯,圖示示例中用關聯線來表示它們之間的關聯關係。
Assume that the correlation threshold is set at 80%. According to the correlation model between the number of correct answers to each test question, a correlation line is established for the question numbers of each test question between adjacent groups. Take the adjacent first floor and second floor (from bottom to top) in the figure as an example for illustration. For example, 55 people in the first group with
與第二組相鄰的下一組/層對應的試題題號為32、34、40,題號32、34、40的答對人數都是51人。第二組與第三組的題號之間產生關聯的條件為:52*80%=42人。即,若既答對31題且答對32題的人數高於42人時,31題與32題之間建立關聯關係,以關聯線表示。若既答對31題且答
對34題的人數高於42人時,31題與34題之間建立關聯關係,以關聯線表示。若既答對31題且答對40題的人數高於42人時,31題與40題之間建立關聯關係,以關聯線表示。
The test question numbers corresponding to the next group/layer adjacent to the second group are 32, 34, and 40, and the number of correct answers to question
假設該關聯性關聯性閾值設定為80%。又如,單獨排在一組的試題題號16及與其相鄰組的試題題號7、10、11、13、17、8、27。若題號16的正確人數或答對人數為44人,同一組/層中題號7、10、11、13、17、8、27的答對人數都是42人。該相鄰組的題號之間產生關聯的條件為:44*80%=35人。與題號16共同答對的人數(即與相鄰的下一組不同題號同時答對的人數)分別為題號7有32人、題號10有34人、題號13有30人、題號27有31人,都小於35人,因而該些題號之間沒有關聯線。與題號16共同答對的人數分別為題號11有36人、題號8有38人,大於35人,因而題號16與下一相鄰組的題號11、8之間建立關聯關係,以關聯線表示。
Assume that the correlation threshold is set at 80%. As another example, the
若試題難度較大、試題數量較多,該關聯性閾值設定數值可取小一些,如可將其設為75%。根據每道試題答對人數之間的關聯模型對相鄰組之間各道試題的題號建立關聯線。假設該關聯性關聯性閾值設定為75%時,以圖2、圖3之示例加以說明。排在第一層(最下層)的題號29有55人答對,排在第二層的題號31、25都是答對人數為52人。進一步地,題號31正確且題號29正確人數為48人,題號25正確且題號29正確人數為50人。第一層與第二層之間的關聯線為:55*0.75=41人。48>41,所以題號31與題號29有關聯,圖示示例中用關聯線來表示它們之間的關聯關係。50>41,所以題號25與題號29有關聯,圖示示例中用關聯線來表示它們之間的關聯關係。依此方法,完成該考卷所有試題分層排列圖譜之間的關聯線構建。
If the test questions are more difficult and the number of test questions is larger, the value of the correlation threshold can be set to be smaller, for example, it can be set to 75%. According to the correlation model between the number of correct answers to each test question, a correlation line is established for the question numbers of each test question between adjacent groups. Assuming that the correlation threshold is set to 75%, it will be described with the examples shown in FIG. 2 and FIG. 3 . 55 people answered correctly the
據前述方法,在該套考卷各試題分層排列完成後,對每位測試者的試題題號進行狀態標識,以區分答對試題和答錯試題。圖示示例中,對各位測試者或學生試題排列分佈圖譜中答錯的試題題號以著色填充方式進行標識,還可對該些圖譜分別標注該測試者或學生的姓名或學號以進行區分。若某位測試者或學生著色填充方式標識題號(答錯的)主要分佈在關聯線較為密集的區域,表明該測試者或該學生對於近段時間所學的知識點掌握情況不甚理想。其在該區域答錯較多的原因可能為:對該些知識點的掌握不牢;答題時較為粗心,稍加努力便可較好地掌握。若位測試者或學生著色填充方式標識題號(答錯的)主要分佈在關聯線較為稀疏的區域或試題題號排列較為分散的區域,表明該測試者或該學生對於近段時間所學的知識點掌握情況達到教學預期。其在該區域答錯較多的原因可能為:試題太難;該題所涉知識點尚未教學;該題所涉知識點已學過但久未複習等。 According to the aforementioned method, after the hierarchical arrangement of the test questions in the set of test papers is completed, the status of each tester's test question number is marked to distinguish the correct answer from the wrong answer. In the illustrated example, the question numbers of the wrong answers in the distribution map of each tester or student's test questions are marked by coloring and filling, and the names or student numbers of the testers or students can also be marked on these maps to distinguish them. If a tester or student's coloring and filling method indicates that the question numbers (wrong answers) are mainly distributed in the area with relatively dense connection lines, it indicates that the tester or student has not mastered the knowledge points learned recently. The reasons for the high number of wrong answers in this area may be: poor grasp of these knowledge points; carelessness in answering questions, and a little effort can be better grasped. If a tester or student's coloring and filling method identifies question numbers (wrong answers) are mainly distributed in the area where the connection lines are relatively sparse or the arrangement of test question numbers is relatively scattered, it indicates that the tester or the student is very satisfied with what they have learned in the recent period The mastery of knowledge points meets the teaching expectations. The reasons for many wrong answers in this area may be: the test questions are too difficult; the knowledge points involved in this question have not been taught; the knowledge points involved in this question have been learned but have not been reviewed for a long time, etc.
若該些測試者或學生之試題排列分佈圖譜中答錯的題號主要分佈在關聯線較為稀疏的區域或試題題號排列較為分散的區域,表明老師或出題者在該套考卷的出題時題目難度係數偏高;或者是該些試題所涉知識點過於超前;或者是該些試題所涉知識點為之前所學,與當前之時間間隔較為久遠等。若該些測試者或學生之試題排列分佈圖譜中答錯的題號主要分佈在關聯線較為密集的區域,表明老師或出題者在該套考卷的出題時對應考察的知識點設計的題目難度較高;或者是本次測評中對應考察的知識點整體難度較大,學習者整體掌握情況未達教學預期。老師或教育者可據此分析結果調整下一步的教學計劃或對學生們整體掌握不佳的知識點 進行著重複習或加強相關訓練。 If the question numbers of the testers or students who answered wrongly in the distribution map of the test questions are mainly distributed in the area with relatively sparse connection lines or the area where the test question numbers are scattered, it means that the teacher or the question maker did not answer the questions in the set of test papers. The difficulty coefficient is too high; or the knowledge points involved in these test questions are too advanced; or the knowledge points involved in these test questions are learned before, and the time interval between the current and current time is relatively long, etc. If the number of questions answered incorrectly in the distribution map of the test questions by testers or students is mainly distributed in the area where the connection lines are relatively dense, it means that the questions designed by the teacher or the tester for the knowledge points that are investigated when writing the questions for this set of test papers are relatively difficult. High; or the overall difficulty of the knowledge points investigated in this assessment is relatively high, and the overall mastery of the learners has not met the teaching expectations. Based on the analysis results, teachers or educators can adjust the next teaching plan or learn about the poor knowledge points of the students as a whole Carry out repeated practice or strengthen relevant training.
圖4為本發明基於測評成績的學情分析裝置之簡示圖。一種基於測評成績的學情分析裝置100,至少包括統計分析模塊101、陣列建立模塊102和關聯模型建立模塊103。統計分析模塊101據由考卷測評結果信息庫中的信息,統計、分析每道試題答對人數、每位測試者的答題結果。陣列建立模塊102據由統計分析模塊中每道試題答對人數對,用以對每道試題題號進行分組排列,將答對人數相同的試題題號排在同一組/層。關聯模型建立模塊103根據設定的關聯性閾值構建相鄰組中各個題號的試題之間的關聯性模型。根據該關聯性關聯性閾值計算下一組所列試題與其相鄰的上一組所列試題建立關聯所需符合要求的答對人數,並根據所述答對人數以形成下一組所列試題與其相鄰的上一組所列試題之間的試題關聯模型。
FIG. 4 is a schematic diagram of a learning situation analysis device based on evaluation results of the present invention. A learning
下一組所列試題與其相鄰的上一組所列試題(相鄰兩組所列試題)之間的試題關聯模型建立方法為:以該下一組(待建立關聯關係的組)相鄰的上一組的答對人數*關聯性閾值,若該下一組所列試題與其相鄰的上一組所列試題組共同答對的人員數大於該值,則該下一組所列試題與其相鄰的上一組所列試題有關聯。該種基於測評成績的學情分析裝置還可包括一標識模塊,用以對每位測試者的答題對錯試題題號狀態進行標識。 The method for establishing the test question association model between the test questions listed in the next group and its adjacent test questions listed in the previous group (the test questions listed in the two adjacent groups) is as follows: the next group (the group to be associated) is adjacent The number of people who answered correctly in the previous group*relevance threshold, if the number of people who have answered correctly together with the test questions listed in the next group and the test questions listed in the adjacent group is greater than this value, then the test questions listed in the next group and their corresponding The adjacent previous set of listed questions is related. The learning situation analysis device based on evaluation results may also include an identification module, which is used to identify the status of each tester's right or wrong number of questions.
因此,利用本發明所提供一種基於測評成績的學情分析方法及基於測評成績的學情分析裝置,通過對每位測試者或學生的同一套考試試題答題結果及各道試題之間關聯度的分析,可快速掌握各個學生的學習情況,如知識點掌握與否及程度等。通過該分析還可瞭解該老師本次出卷的質量如何,例如該套試題的知識點是否過於分散、所涉知識點是否過 於超前等。基於對試題之間的關聯線分析,有益於老師後續安排更加適宜的教學計劃、針對各個學生進行有針對性的輔導等,教育機構可即時調整教學規劃等事宜。 Therefore, utilize a kind of academic situation analysis method based on evaluation result provided by the present invention and the academic situation analysis device based on evaluation result, through the same set of test questions answer results of each tester or student and the correlation degree between each test question Analysis can quickly grasp the learning situation of each student, such as whether the knowledge points are mastered or not and the degree. Through this analysis, we can also understand the quality of the teacher's test papers this time, such as whether the knowledge points of this set of test questions are too scattered, whether the knowledge points involved are too Wait ahead. Based on the analysis of the connection line between the test questions, it is beneficial for teachers to arrange more suitable teaching plans, provide targeted counseling for each student, etc., and educational institutions can adjust teaching planning and other matters in real time.
藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之範疇加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的範疇內。 Through the above detailed description of the preferred embodiments, it is hoped that the characteristics and spirit of the present invention can be described more clearly, and the scope of the present invention is not limited by the preferred embodiments disclosed above. On the contrary, the intention is to cover various changes and equivalent arrangements within the scope of the patent application for the present invention.
S01~S04:步驟 S01~S04: Steps
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