TW202240246A - Detection method and detection device - Google Patents
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- TW202240246A TW202240246A TW110112414A TW110112414A TW202240246A TW 202240246 A TW202240246 A TW 202240246A TW 110112414 A TW110112414 A TW 110112414A TW 110112414 A TW110112414 A TW 110112414A TW 202240246 A TW202240246 A TW 202240246A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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Abstract
Description
本案係關於一種檢測方法及檢測裝置,特別係關於一種適用於電容式觸控顯示面板的檢測方法及檢測裝置。This case relates to a detection method and detection device, in particular to a detection method and detection device suitable for capacitive touch display panels.
在現今的電容式觸控顯示面板技術中,包含外掛式觸控顯示面板以及內嵌式觸控顯示面板,其中電容式觸控顯示面板在製程上的電容及電阻的變異更容易造成觸控顯示面板的不良,如何判別電容式觸控顯示面板之電容及電阻的變異係必要的議題。Today's capacitive touch display panel technologies include plug-in touch display panels and built-in touch display panels. Among them, the variation of capacitance and resistance in the manufacturing process of capacitive touch display panels is more likely to cause touch display Defective panel, how to distinguish the variation of capacitance and resistance of capacitive touch display panel is a necessary issue.
本揭示文件提供一種檢測方法,檢測方法包含下列步驟。在第一時間長度,施加電壓至電容式觸控面板的觸控感測電極。在第一時間長度結束時,停止施加電壓至電容式觸控面板的觸控感測電極,並且將觸控感測電極電性耦接可變電容以及運算放大器,其中運算放大器的非反向輸入端用以接收參考電壓。調整可變電容的電容值使運算放大器的輸出電壓大致上為零。判斷可變電容的電容值是否在預期電容值。This disclosed document provides a detection method, which includes the following steps. A voltage is applied to the touch sensing electrodes of the capacitive touch panel for a first time period. When the first time length ends, stop applying voltage to the touch sensing electrodes of the capacitive touch panel, and electrically couple the touch sensing electrodes to the variable capacitor and the operational amplifier, wherein the non-inverting input of the operational amplifier The terminal is used to receive the reference voltage. Adjust the capacitance value of the variable capacitor so that the output voltage of the operational amplifier is approximately zero. Determine whether the capacitance value of the variable capacitor is within the expected capacitance value.
本揭示文件提供一種檢測裝置,檢測裝置包含:可變電容以及運算放大器。檢測裝置用以在第一時間長度內施加電壓至電容式觸控面板的觸控感測電極,並且檢測裝置在第一時間長度結束後將觸控感測電極連接至可變電容以及運算放大器,其中檢測裝置將可變電容調整至運算放大器的輸出大致上為零,並且檢測裝置判斷可變電容經調整後的數值是否在預期電容值。The disclosed document provides a detection device, which includes: a variable capacitor and an operational amplifier. The detection device is used to apply a voltage to the touch sensing electrodes of the capacitive touch panel within the first time length, and the detection device connects the touch sensing electrodes to the variable capacitor and the operational amplifier after the first time length is over, Wherein the detection device adjusts the variable capacitor until the output of the operational amplifier is substantially zero, and the detection device judges whether the adjusted value of the variable capacitor is within the expected capacitance value.
綜上所述,本揭式文件利用檢測裝置中的可變電容判斷電容式觸控面板的電容是否變異。To sum up, the disclosed document utilizes the variable capacitance in the detection device to determine whether the capacitance of the capacitive touch panel varies.
下列係舉實施例配合所附圖示做詳細說明,但所提供之實施例並非用以限制本揭露所涵蓋的範圍,而結構運作之描述非用以限制其執行順序,任何由元件重新組合之結構,所產生具有均等功效的裝置,皆為本揭露所涵蓋的範圍。另外,圖示僅以說明為目的,並未依照原尺寸作圖。為使便於理解,下述說明中相同元件或相似元件將以相同之符號標示來說明。The following is a detailed description of the embodiments in conjunction with the attached drawings, but the provided embodiments are not intended to limit the scope of this disclosure, and the description of the structure and operation is not intended to limit the execution sequence. Any recombination of components Structures and devices with equivalent functions are all within the scope of this disclosure. In addition, the illustrations are for illustration purposes only and are not drawn in original size. To facilitate understanding, the same elements or similar elements will be described with the same symbols in the following description.
在全篇說明書與申請專利範圍所使用之用詞(terms),除有特別註明除外,通常具有每個用詞使用在此領域中、在此揭露之內容中與特殊內容中的平常意義。The terms (terms) used throughout the specification and claims, unless otherwise specified, generally have the ordinary meaning of each term used in the field, in the disclosed content and in the special content.
此外,在本文中所使用的用詞『包含』、『包括』、『具有』、『含有』等等,均為開放性的用語,即意指『包含但不限於』。此外,本文中所使用之『及/或』,包含相關列舉項目中一或多個項目的任意一個以及其所有組合。In addition, the words "comprising", "including", "having", "containing", etc. used in this article are all open terms, meaning "including but not limited to". In addition, "and/or" used herein includes any one and all combinations of one or more items in the relevant listed items.
於本文中,當一元件被稱為『耦接』或『耦接』時,可指『電性耦接』或『電性耦接』。『耦接』或『耦接』亦可用以表示二或多個元件間相互搭配操作或互動。此外,雖然本文中使用『第一』、『第二』、…等用語描述不同元件,該用語僅是用以區別以相同技術用語描述的元件或操作。Herein, when an element is referred to as "coupled" or "coupled", it may mean "electrically coupled" or "electrically coupled". "Coupling" or "coupling" can also be used to indicate that two or more elements cooperate or interact with each other. In addition, although terms such as "first", "second", ..., etc. are used herein to describe different elements, these terms are only used to distinguish elements or operations described with the same technical terms.
請參閱第1圖,第1圖為本揭露一實施例之電容式觸控面板100的示意圖。如第1圖所示,電容式觸控面板100包含封裝玻璃110、觸控感測電極120、共通電極140、發光元件150、陣列160以及顯示器玻璃基板170。發光元件150可由有機光二極體實施,陣列160用以驅動發光元件150。觸控感測電極120、共通電極140、發光元件150、陣列160封裝在封裝玻璃110以及顯示器玻璃基板170之間。並且,觸控感測電極120以及共通電極140之間具有間隙130。如此一來,可將觸控感測電極120、間隙130以及共通電極140視為電容式觸控面板100的電容。在後續實施例中,為了較佳的理解,本揭示文件提供的方法如何分別檢測電容式觸控面板100的電容以及電阻的變異,第1圖中之電容式觸控面板100是以內嵌式觸控面板為例。然而,本揭示提供的檢測方法亦可適用於其他具有電容結構之觸控面板,例如,外掛式觸控面板等。因此,本揭示文件不以此為限。Please refer to FIG. 1 , which is a schematic diagram of a
在電容式觸控面板的技術中,電容式觸控面板100的電容是由觸控感測電極120、共通電極140以及在觸控感測電極120與共通電極140之間的間隙130組成。因此,在電容式觸控面板100的製程上,觸控感測電極120與共通電極140之間的間隙130可能會有所偏差。另一方面,由於內嵌式觸控面板的電容與外掛式觸控面板的電容相比較大,因而觸控感測電極120的電阻在製程上的變異容忍度更低。In the capacitive touch panel technology, the capacitance of the
亦即,電容式觸控面板100的間隙130變異會造成電容式觸控面板100的電容偏差,並且電容式觸控面板100的觸控感測電極120變異會造成電容式觸控面板100中觸控感測電極120的電阻偏差。前述的電容偏差及電阻偏差可能會造成電容式觸控面板100無法或者是延遲判斷正確的觸控感測位置。因此,在本揭示文件中提供檢測裝置以及檢測方法用於檢測電容式觸控面板100。That is, the variation of the gap 130 of the
請參閱第2圖,第2圖為依據本揭露一實施例之用於檢測第1圖中之電容式觸控面板100的檢測裝置200的示意圖。在第2圖的實施例中,可將電容式觸控面板100的觸控感測電極120視為電容Cpanel的第一端、電容式觸控面板100的共通電極140視為電容Cpanel的第二端、電容式觸控面板100的間隙130視為電容Cpanel的間隙。Please refer to FIG. 2 . FIG. 2 is a schematic diagram of an
並且,可將電容式觸控面板100的觸控感測電極120視為電阻Rpanel、觸控感測電極120的檢測接墊視為節點Vpad。也就是說,電阻Rpanal的第一端電性耦接節點Vpad,電阻Rpanal的第二端電性耦接電容Cpanel的第一端,電容Cpanel的第二端電性耦接系統電壓端Vcom。其中,系統電壓端Vcom的電壓位準可以相等或近似於接地端GND的電壓位準。Moreover, the touch sensing electrodes 120 of the
檢測裝置200包含可變電容CC、運算放大器AMP、電容Cbase以及開關S1及S2。詳細而言,開關S1的第一端用以接收電壓Vtx,開關S1的第二端電性耦接電阻Rpanel的第一端以及節點Vpad。開關S2的第一端電性耦接節點Vpad,開關S2的第二端電性耦接可變電容CC的第一端以及運算放大器AMP的反向輸入端。可變電容CC的第二端電性耦接接地端GND。運算放大器AMP的非反向輸入端用以接收參考電壓Vref。運算放大器AMP用以在差動模式下運行,從而將其兩輸入端的電壓差值輸出。The
請參閱第3圖,第3圖為本揭露一實施例之檢測電容式觸控面板100的電容Cpanel的檢測方法的流程圖S300。流程圖S300包含步驟S310、S320、S330、S340、S342以及S344。步驟S310為在一個時間長度內,對電容式觸控面板100的電容Cpanel充電。步驟S320為將電容式觸控面板100的檢測接墊Pad連接至檢測裝置200。步驟S330為調整檢測裝置200中的可變電容CC。步驟S340為判斷可變電容CC的電容值是否在預期電容值。步驟S342為電容式觸控面板100的電容Cpanel在標準電容值。步驟S344為電容式觸控面板100的電容Cpanel相異於標準電容值。其中,步驟S310~S340可由檢測裝置200執行。Please refer to FIG. 3 . FIG. 3 is a flow chart S300 of a detection method for detecting the capacitance Cpanel of the
在步驟S310中,在一個時間長度內,對電容式觸控面板100的觸控感測電極120施加電壓Vtx。換言之,在一個時間長度內,將開關S1導通並將開關S2,使開關S1將其第一端的電壓Vtx經由電容式觸控面板100的電阻Rpanel傳送至電容式觸控面板100的電容Cpanel,以對電容式觸控面板100的電容Cpanel充電。並且,在所述時間長度結束時,關斷開關S1以停止對電容式觸控面板100的觸控感測電極120施加電壓Vtx。亦即,停止對電容式觸控面板100的電容Cpanel充電。值得注意的是,由於RC電路的充電電量與時間常數(亦即,RC電路上的電阻值乘以電容值)相關聯,並且當充電時間達到五倍的時間常數,RC電路的充電電量約等於99.3%。In step S310 , the voltage Vtx is applied to the touch sensing electrodes 120 of the
因此在步驟S310中,為了將電容式觸控面板100的電容Cpanel充滿電,前述的時間長度可以是五倍以上的時間常數(亦即,電阻Rpanel乘以電容Cpanel的數值),藉此將電容式觸控面板100的電容Cpanel充電至近似最大電量值。在一些實施例中,為了確保電容式觸控面板100的電容Cpanel確實充滿電,可以將前述的時間長度設定在八倍的時間常數(電阻Rpanel乘以電容Cpanel的數值)。Therefore, in step S310, in order to fully charge the capacitor Cpanel of the
為了更佳的理解時間常數與充電電量的關聯,請一併參閱第4圖。第4圖為依據第3圖中的步驟S310,對電容式觸控面板100的觸控感測電極120充電的波形圖。在第4圖所示的實施例中,縱軸代表充電電量比率,單位是百分比(%)。橫軸代表時間,單位是微秒(μs)。如第4圖所示,無論電容式觸控面板100的電容Cpanel是否有變異,在提供八倍的第一標準時間常數(例如,4.8μs)的充電時間後,均可將電容式觸控面板100的電容Cpanel充電至99.9%以上的電量比率。換言之,各個電容式觸控面板100的電容Cpanel的第一端的電位在足夠的充電時間下應可達到電壓Vtx的位準。其中,步驟S310中所述的第一標準時間常數可以是理想的電容式觸控面板100的標準電容值乘以其標準電阻值。For a better understanding of the relationship between the time constant and the charging capacity, please also refer to Figure 4. FIG. 4 is a waveform diagram of charging the touch sensing electrodes 120 of the
由於前述的電量比率是以各個電容式觸控面板100各自的電容Cpanel能被充電的總電量進行換算而得到的電量比率。因此,若一個電容式觸控面板100的電容Cpanel較大,會有較大的電容量,在足夠的充電時間下所儲存的電量相對較大;若另一個電容式觸控面板100的電容Cpanel較小,會有較小的電容量,在足夠的充電時間下所儲存的電量相對較小。並且在後續實施例中,會透過各個電容式觸控面板100各自的電容Cpanel在步驟S310中所儲存的電量,判斷電容式觸控面板100的電容Cpanel是否有變異。The aforementioned power ratio is the power ratio obtained by converting the total power that can be charged by the respective capacitors Cpanel of each
在步驟S320中,為了電容式觸控面板100的電容Cpanel是否有變異,導通開關S2以將電容式觸控面板100的檢測接墊連接至檢測裝置200,,使電容式觸控面板100的觸控感測電極120連接至檢測裝置200中的運算放大器AMP的反向輸入端以及可變電容CC的第一端。在步驟S320中會提供足夠的充電時間使電容式觸控面板100的電容Cpanel的電位經由電阻Rpanel及開關S2傳送至可變電容CC,使電容Cpanel與可變電容CC的電位達成平衡。In step S320, in order to check whether the capacitance Cpanel of the
類似地,在步驟S320中所述的時間也可以是八倍以上的第二標準時間常數(例如,約為4.8μs)的充電時間。進一步來說,步驟S320中所述的第二標準時間常數可以是電容式觸控面板100的第一標準時間常數(電阻Rpanel乘以電容Cpanel的數值)加上檢測裝置200本身電路的時間常數。Similarly, the time stated in step S320 may also be more than eight times the charging time of the second standard time constant (eg, about 4.8 μs). Further, the second standard time constant in step S320 may be the first standard time constant of the capacitive touch panel 100 (the value of the resistor Rpanel multiplied by the capacitor Cpanel) plus the time constant of the
實際情形中,在步驟S310以及S320僅需確保電容式觸控面板100的電容Cpanel有足夠的時間充/放電以在當下的電路架構達到電位平衡,即可利用接續的步驟S330~S340中可變電容CC的電容值判斷電容式觸控面板100的電容Cpanel的相對大小,從而判斷電容Cpanel是否變異。In actual situations, in steps S310 and S320, it is only necessary to ensure that the capacitor Cpanel of the
由於在步驟S320中,已提供足夠的放電時間使電容Cpanel以及可變電容CC的電位達到平衡,因此步驟S330中調整檢測裝置200中的可變電容CC使運算放大器AMP的輸出端Vout的電壓大致上為零,亦即將可變電容CC調整至節點Vpad、可變電容CC的第一端以及電容Cpanel的電壓實質上等同於參考電壓Vref。其中,參考電壓Vref的位準高於接地端GND的電壓位準。並且,電壓Vtx大於參考電壓Vref以及接地端GND的電壓。Since in step S320, sufficient discharge time has been provided to balance the potentials of the capacitor Cpanel and the variable capacitor CC, the variable capacitor CC in the
由於各個電容式觸控面板100的電容Cpanel各自在步驟S310便以被充電至大約為最大電量。因此,在步驟S320中,對於具有較大電容量的電容Cpanel的電容式觸控面板100,檢測裝置200會將可變電容CC調整至較大的電容值,才能使運算放大器AMP的輸出端Vout的電壓大致上為零;對於具有較小電容量的電容Cpanel的電容式觸控面板100,檢測裝置200會將可變電容CC調整至較小的電容值,才能使運算放大器AMP的輸出端Vout的電壓大致上為零。Since the capacitors Cpanel of each
在步驟S340中,由於電容式觸控面板100的電容Cpanel的電容值與可變電容CC被調整後的電容值呈正相關,因此,藉由判斷可變電容CC的電容值是否在預期電容值,可以得知電容式觸控面板100的電容Cpanel是否在標準電容值。In step S340, since the capacitance value of the capacitor Cpanel of the
如此一來,便能透過可變電容CC的電容值判斷各個電容式觸控面板100的電容Cpanel的相對大小,並可以與同一批次生產的電容式觸控面板100的電容Cpanel的大小進行比較,從而判斷電容式觸控面板100的電容Cpanel是否變異。In this way, the relative size of the capacitance Cpanel of each
在一些實施例中,可以藉由對已知為標準的電容式觸控面板100進行步驟S340~S360後,紀錄檢測裝置200中的可變電容CC的電容值,並將此電容值定為預期電容值。In some embodiments, after steps S340-S360 are performed on the known standard
在一些實施例中,可以將同一批生產的電容式觸控面板100經由步驟S310~S330所得到的可變電容CC的電容值進行比對,從而判斷電容式觸控面板100的電容Cpanel是否變異。In some embodiments, the capacitance values of the variable capacitors CC obtained through steps S310-S330 of the same batch of
在步驟S342中,若可變電容CC的電容值在預期電容值,則判斷電容式觸控面板100的電容Cpanel在標準電容值。其中,標準電容值可以是已知為標準的電容式觸控面板100的電容Cpanel的電容值。In step S342, if the capacitance value of the variable capacitor CC is at the expected capacitance value, it is determined that the capacitance Cpanel of the
在步驟S344中,若可變電容CC的電容值相異於預期電容值,則判斷電容式觸控面板100的電容Cpanel相異於標準電容值。In step S344, if the capacitance value of the variable capacitor CC is different from the expected capacitance value, it is determined that the capacitance Cpanel of the
請參閱第5圖,第5圖為本揭露一實施例之檢測電容式觸控面板100的電阻Rpanel的檢測方法的流程圖S300。流程圖S300更包含步驟S340、S350、S360、S370、S372以及S374。步驟S340為維持檢測裝置中的可變電容CC。步驟S350為在一個時間長度內,對電容式觸控面板200的觸控感測電極120充電。步驟S360為在一個時間長度內,將電容式觸控面板100的檢測接墊連接至檢測裝置。步驟S370為判斷運算放大器AMP的輸出電壓是否在預期電壓值。步驟S372為電容式觸控面板100的電阻Rpanel在標準電阻值。步驟S374為電容式觸控面板的電阻Rpanel相異於標準電阻值。其中,步驟S340~S370可由檢測裝置200執行。Please refer to FIG. 5 . FIG. 5 is a flow chart S300 of a detection method for detecting the resistance Rpanel of the
步驟S340是接續第3圖中的步驟S330。在步驟S340中,維持在步驟S330中被調整後的可變電容CC的電容值。Step S340 is a continuation of step S330 in FIG. 3 . In step S340, the capacitance value of the variable capacitor CC adjusted in step S330 is maintained.
在步驟S350中,在一個時間長度內,對電容式觸控面板100的觸控感測電極120施加電壓Vtx。換言之,在一個時間長度內,將開關S1導通並且將開關S2關斷,使開關S1將其第一端的電壓Vtx經由電容式觸控面板100的電阻Rpanel傳送至電容式觸控面板100的電容Cpanel,以對電容式觸控面板100的電容Cpanel充電。並且,在所述時間長度結束時,關斷開關S1以停止對電容式觸控面板100的觸控感測電極120施加電壓Vtx。也就是說,在所述時間長度結束時,停止對電容式觸控面板100的電容Cpanel充電。值得注意的是,在步驟S350所述的時間長度可以是一倍的第一標準時間長度,例如,電阻Rpanel乘以電容Cpanel的數值。In step S350 , the voltage Vtx is applied to the touch sensing electrodes 120 of the
為了更佳的理解時間常數與電容Cpanel的電位關聯,請一併參閱第6圖。第6圖為依據第5圖中的步驟S350,對電容式觸控面板100的觸控感測電極120充電的電壓波形圖。在第6圖所示的實施例中,縱軸代表充電電壓,單位是伏特(V)。橫軸代表時間,單位是微秒(μs)。如第6圖所示,若部分的電容式觸控面板100的電阻Rpanel較大,在提供一倍的第一標準時間常數(例如0.6μs)的充電時間後,電阻Rpanel較小的電容式觸控面板100的電容Cpanel可以被充至較高電位;若部分的電容式觸控面板100的電阻Rpanel較大,在提供一倍的第一標準時間常數(例如0.6μs)的充電時間後,電阻Rpanel較大的電容式觸控面板100的電容Cpanel被充至較低電位。For a better understanding of the relationship between the time constant and the potential of the capacitor Cpanel, please also refer to Figure 6. FIG. 6 is a voltage waveform diagram of charging the touch sensing electrodes 120 of the
換言之,在提供一倍的第一標準時間常數(例如0.6μs)的充電時間後,電阻Rpanel較小的電容式觸控面板100的電容Cpanel會儲存相對較多的電量;電阻Rpanel較大的電容式觸控面板100的電容Cpanel會儲存相對較少的電量。In other words, the capacitor Cpanel of the
在步驟S360中,為了檢測電容式觸控面板100的電阻Rpanel是否有變異,將電容式觸控面板100的檢測接墊(亦即,節點Vpad)連接至檢測裝置200,並導通開關S2,使電容式觸控面板100的觸控感測電極120連接至檢測裝置200中的運算放大器AMP的反向輸入端以及可變電容CC的第一端。在步驟S360中會提供足夠的時間使電容式觸控面板100的電容Cpanel的電位經由電阻Rpanel及開關S2傳送至可變電容CC,使電容Cpanel與可變電容CC的電位達成平衡。類似地,在步驟S360中所述的時間也可以是八倍以上的第二標準時間常數(例如,約為4.8μs)的充電時間。進一步來說,在此電路連接關係下,第二標準時間常數實質上等於電容式觸控面板100的第一時間常數(電阻Rpanel乘以電容Cpanel)加上檢測裝置200本身電路的時間常數。In step S360, in order to detect whether the resistance Rpanel of the
實際情形中,在步驟S350以及S3360僅需確保電容式觸控面板100的電阻Rpanel在設定的時間長度進行充電與放電,並且充電時間需與放電時間相異,即可利用接續的步驟S330~S340判斷電容式觸控面板100的電阻Rpanel的相對大小,從而判斷電阻Rpanel是否變異。In actual situations, in steps S350 and S3360, it is only necessary to ensure that the resistance Rpanel of the
由於檢測裝置200中的可變電容CC的電容值在步驟S330中經調整後就維持至步驟S370。因此在步驟S360中將電容式觸控面板100的檢測接墊(以及,節點Vpad)連接至檢測裝置200之後,可將檢測裝置200中的可變電容CC的電容值視為電容式觸控面板100的補償電容。換言之,此時無論電容式觸控面板100的電容Cpanel較大或是較小,各個電容式觸控面板100的電容Cpanel加上各自與檢測裝置200在步驟S330中被調整後的可變電容CC的電容值應為定值。Since the capacitance value of the variable capacitor CC in the
因此,在步驟S370中,藉由判斷運算放大器AMP的輸出電壓是否在預期電壓值,可以得知電容式觸控面板100的電阻Rpanel是否在標準電阻值。Therefore, in step S370, by judging whether the output voltage of the operational amplifier AMP is at the expected voltage value, it can be known whether the resistance Rpanel of the
舉例而言,電阻Rpanel較小的電容式觸控面板100的電容Cpanel會在步驟S350中儲存較多的電量,因而在步驟S360中將檢測接墊(亦即,節點Vpad)連接至檢測裝置200之後,節點Vpad、電容Cpanel的第一端、可變電容CC的第一端會在較高的電位,使運算放大器OPA之兩輸入端的電壓差值較小,運算放大器AMP的輸出電壓會具有較小電壓幅值。另一方面,電阻Rpanel較大的電容式觸控面板100的電容Cpanel會在步驟S350中儲存較少的電量,因而在步驟S360中將檢測接墊(亦即,節點Vpad)連接至檢測裝置200之後,節點Vpad、電容Cpanel的第一端、可變電容CC的第一端會在較低的電位,使運算放大器OPA之兩輸入端的電壓差值較大,使得運算放大器AMP的輸出電壓會具有較大電壓幅值。For example, the capacitance Cpanel of the
如此一來,便能透過運算放大器AMP的輸出電壓判斷各個電容式觸控面板100的電阻Rpanel的相對大小,並可以與同一批次生產的電容式觸控面板100的電阻Rpanel的大小進行比較,從而判斷電容式觸控面板100的電阻Rpanel是否變異。In this way, the relative size of the resistance Rpanel of each
在一些實施例中,可以藉由對已知為標準的電容式觸控面板100進行步驟S340~S360後,紀錄檢測裝置200中的運算放大器AMP的輸出電壓,並將此輸出電壓定為預期電壓值。In some embodiments, it is possible to record the output voltage of the operational amplifier AMP in the
在步驟S372中,若運算放大器AMP的輸出電壓在預期電壓值,則判斷電容式觸控面板100的電阻Rpanel在標準電阻值。其中,標準電阻值可以是已知為理想的電容式觸控面板100的電阻Rpanel的電阻值。In step S372, if the output voltage of the operational amplifier AMP is at the expected voltage value, it is determined that the resistance Rpanel of the
步驟S374中,若運算放大器AMP的輸出電壓相異於預期電壓值,則判斷電容式觸控面板100的電阻Rpanel相異於標準電阻值。In step S374, if the output voltage of the operational amplifier AMP is different from the expected voltage value, it is determined that the resistance Rpanel of the
值得注意的是,將步驟S360所述的時間長度設定為大於步驟S350所述的時間長度,即可達到電容式觸控面板100的電容Cpanel在不同時間長度充/放電的效果,從而透過步驟S310~S370也可以判斷電容式觸控面板100的電容Cpanel及電阻Rpanel是否有變異。並且,在此情形中,步驟S310所述的時間長度亦會大於步驟S350所述的時間長度。因此,可以將步驟S360所述的時間長度設定為步驟S350所述的時間長度的五倍以上。並且,可以將步驟S310所述的時間長度設定為步驟S350所述的時間長度的五倍以上。It should be noted that by setting the time length described in step S360 to be greater than the time length described in step S350, the effect of charging/discharging the capacitance Cpanel of the
在本揭示文件的另一些實施例中,亦可將第5圖的步驟S350所述的時間長度定為五倍以上的時間常數,並將步驟S360所述的時間長度定為一倍以的時間常數,亦可達到電容式觸控面板100的電容Cpanel在不同時間長度充/放電的效果,從而透過步驟S310~S370也可以判斷電容式觸控面板100的電容Cpanel及電阻Rpanel是否有變異。亦即,將步驟S350所述的時間長度設定為大於步驟S360所述的時間長度,即可達到電容式觸控面板100的電容Cpanel在不同時間長度充/放電的效果。並且,在此情形中,步驟S310所述的時間長度亦會大於步驟S360所述的時間長度。因此,可以將步驟S350所述的時間長度設定為步驟S360所述的時間長度的五倍以上。並且,可以將步驟S310所述的時間長度設定為步驟S360所述的時間長度的五倍以上。In some other embodiments of this disclosure document, the time length described in step S350 in Fig. 5 can also be set to be five times or more the time constant, and the time length described in step S360 can be set to be more than double the time The constant can also achieve the effect of charging/discharging the capacitance Cpanel of the
綜上所述,本揭示文件利用檢測裝置200中的可變電容CC判斷電容式觸控面板100的電容Cpanel是否變異,並在檢測電容式觸控面板100的電阻Rpanel的檢測階段維持檢測裝置200中的可變電容CC的電容值,藉此判斷電容式觸控面板100的電阻Rpanel是否變異。To sum up, the disclosed document utilizes the variable capacitor CC in the
雖然本揭露已以實施方式揭露如上,然其並非用以限定本揭露,任何本領域通具通常知識者,在不脫離本揭露之精神和範圍內,當可作各種之更動與潤飾,因此本揭露之保護範圍當視後附之申請專利範圍所界定者為準。Although the present disclosure has been disclosed above in terms of implementation, it is not intended to limit this disclosure. Any person with ordinary knowledge in the field may make various changes and modifications without departing from the spirit and scope of this disclosure. Therefore, this disclosure The scope of protection disclosed shall be subject to what is defined in the scope of the appended patent application.
為使本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附符號之說明如下: 100:電容式觸控面板 120:觸控感測電極 130:間隙 140:共通電極 150:發光元件 160:陣列 170:顯示器玻璃基板 200:檢測裝置 Cpanel:電容 Rpanel:電阻 Vcom:系統電壓端 S1,S2:開關 CC:可變電容 Vpad:節點 AMP:運算放大器 Cbase:電容 Vout:輸出端 Vref:參考電壓 GND:接地端 Vtx:電壓 In order to make the above and other purposes, features, advantages and embodiments of the present disclosure more obvious and easy to understand, the descriptions of the attached symbols are as follows: 100: capacitive touch panel 120: Touch sensing electrode 130: Gap 140: common electrode 150: light emitting element 160: array 170: display glass substrate 200: detection device Cpanel: capacitance Rpanel: resistance Vcom: system voltage terminal S1, S2: switch CC: variable capacitance Vpad: node AMP: operational amplifier Cbase: Capacitance Vout: output terminal Vref: reference voltage GND: ground terminal Vtx: Voltage
為使本揭露之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: 第1圖為本揭露一實施例之電容式觸控面板的示意圖。 第2圖為依據本揭露一實施例之用於檢測第1圖中之電容式觸控面板的檢測裝置的示意圖。 第3圖為本揭露一實施例之檢測電容式觸控面板的電容的檢測方法的流程圖。 第4圖為依據第3圖中的步驟S310,對電容式觸控面板的觸控感測電極充電的波形圖。 第5圖為本揭露一實施例之檢測電容式觸控面板的電阻的檢測方法的流程圖。 第6圖為依據第5圖中的步驟S350,對電容式觸控面板的觸控感測電極充電的電壓波形圖。 In order to make the above and other purposes, features, advantages and embodiments of the present disclosure more comprehensible, the accompanying drawings are described as follows: FIG. 1 is a schematic diagram of a capacitive touch panel according to an embodiment of the present disclosure. FIG. 2 is a schematic diagram of a testing device for testing the capacitive touch panel in FIG. 1 according to an embodiment of the present disclosure. FIG. 3 is a flowchart of a detection method for detecting capacitance of a capacitive touch panel according to an embodiment of the present disclosure. FIG. 4 is a waveform diagram of charging the touch sensing electrodes of the capacitive touch panel according to step S310 in FIG. 3 . FIG. 5 is a flowchart of a detection method for detecting resistance of a capacitive touch panel according to an embodiment of the present disclosure. FIG. 6 is a voltage waveform diagram of charging the touch sensing electrodes of the capacitive touch panel according to step S350 in FIG. 5 .
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic deposit information (please note in order of depositor, date, and number) none Overseas storage information (please note in order of storage country, institution, date, and number) none
200:檢測裝置 200: detection device
Cpanel:電容 Cpanel: capacitance
Rpanel:電阻 Rpanel: resistance
Vcom:系統電壓端 Vcom: system voltage terminal
S1,S2:開關 S1, S2: switch
CC:可變電容 CC: variable capacitance
Vpad:節點 Vpad: node
AMP:運算放大器 AMP: operational amplifier
Cbase:電容 Cbase: Capacitance
Vout:輸出端 Vout: output terminal
Vref:參考電壓 Vref: reference voltage
GND:接地端 GND: ground terminal
Vtx:電壓 Vtx: Voltage
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