TW202238659A - Insulation window, control method thereof and plasma processing device - Google Patents
Insulation window, control method thereof and plasma processing device Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/32119—Windows
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
Abstract
Description
本發明涉及等離子體蝕刻的技術領域,尤其涉及一種用於等離子體蝕刻的絕緣窗的技術領域。The invention relates to the technical field of plasma etching, in particular to the technical field of an insulating window used for plasma etching.
對於等離子體蝕刻技術,該技術是向反應腔內輸入製程氣體,射頻源被電感或電容耦合至反應腔內部來激勵製程氣體,以形成和保持等離子體,在反應腔內部,晶圓被基板支撐而暴露在製程氣體中,實現蝕刻。其中,電感耦合等離子體(Inductive Coupled Plasma,ICP)是常見的技術,該技術是在反應腔上部覆蓋絕緣窗,例如陶瓷窗,絕緣窗上部排布線圈。For plasma etching technology, the technology is to input process gas into the reaction chamber, and the RF source is inductively or capacitively coupled to the reaction chamber to excite the process gas to form and maintain plasma. Inside the reaction chamber, the wafer is supported by the substrate While exposed to process gases, etching is achieved. Among them, Inductive Coupled Plasma (Inductive Coupled Plasma, ICP) is a common technology. In this technology, an insulating window, such as a ceramic window, is covered on the upper part of the reaction chamber, and coils are arranged on the upper part of the insulating window.
隨著晶圓的加工精度越來越高,對於陶瓷窗溫度的均一性要求也越來越高。As the processing precision of the wafer becomes higher and higher, the requirements for the uniformity of the temperature of the ceramic window are also higher and higher.
習知技術中,為了保證陶瓷窗溫度的均一性,需要對陶瓷窗進行溫度控制,以防陶瓷窗溫度差異對晶圓表面的均勻性產生影響。習知的溫度控制方法是在陶瓷窗上粘貼加熱裝置,並在陶瓷窗上方安裝風扇進行冷卻,實現對陶瓷窗的加熱和冷卻。然而,在蝕刻過程中,等離子體的熱量會集中加熱陶瓷窗的中心部位,僅利用風扇難以對陶瓷窗實現精確降溫。因此,亟需一種解決方案以適應陶瓷窗溫度均一性的要求。In the conventional technology, in order to ensure the uniformity of the temperature of the ceramic window, it is necessary to control the temperature of the ceramic window to prevent the temperature difference of the ceramic window from affecting the uniformity of the wafer surface. The known temperature control method is to paste a heating device on the ceramic window, and install a fan above the ceramic window for cooling, so as to realize heating and cooling of the ceramic window. However, during the etching process, the heat of the plasma will heat the central part of the ceramic window intensively, and it is difficult to achieve accurate cooling of the ceramic window only by using a fan. Therefore, there is an urgent need for a solution to meet the temperature uniformity requirements of the ceramic window.
為了解決上述技術問題,本發明提供一種絕緣窗,其用於等離子體處理裝置,包括:窗主體,所述窗主體具有內部區域和圍繞內部區域的至少一部分的外部區域;溫度控制裝置,其包括加熱裝置和區域溫控裝置;所述加熱裝置至少位於所述窗主體的外部區域;所述區域溫控裝置位於所述窗主體的內部區域,其中,區域溫控裝置為半導體製冷器,所述半導體製冷器用於在等離子體產生之前對所述窗主體加熱。In order to solve the above technical problems, the present invention provides an insulating window for a plasma processing device, comprising: a window body having an inner region and an outer region surrounding at least a part of the inner region; a temperature control device comprising A heating device and a zone temperature control device; the heating device is at least located in the outer area of the window body; the zone temperature control device is located in the inner area of the window body, wherein the zone temperature control device is a semiconductor refrigerator, the A peltier is used to heat the window body prior to plasma generation.
較佳的,所述半導體製冷器還用於在等離子體產生時對窗主體冷卻。Preferably, the semiconductor refrigerator is also used to cool the window body when the plasma is generated.
較佳的,所述加熱裝置大致呈環形分佈且形成至少一個環,所述半導體製冷器大致呈環形分佈且形成至少一個環;其中,所述加熱裝置的功率密度沿著所述窗主體的徑向方向由外部區域向內部區域減小,所述區域溫控裝置的功率密度沿著所述窗主體的徑向方向由外部區域向內部區域增加。Preferably, the heating device is approximately annularly distributed and forms at least one ring, and the semiconductor refrigerator is approximately annularly distributed and forms at least one ring; wherein, the power density of the heating device is along the diameter of the window main body The direction decreases from the outer area to the inner area, and the power density of the area temperature control device increases from the outer area to the inner area along the radial direction of the window body.
較佳的,半導體製冷器與加熱裝置在內部區域中沿著周向方向交替設置。Preferably, semiconductor refrigerators and heating devices are arranged alternately along the circumferential direction in the inner region.
較佳的,所述加熱裝置為加熱貼片,所述加熱貼片中間夾設有加熱絲;所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第一加熱環;其中,長彎折部沿著窗主體的徑向向內部區域延伸。Preferably, the heating device is a heating patch, and a heating wire is sandwiched between the heating patch; the heating wire has a short bending part and a long bending part, and the short bending part and the long bending part The parts are arranged alternately in the circumferential direction of the window main body and connected to each other to form a roughly first heating ring; wherein, the long bent parts extend along the radial direction of the window main body to the inner area.
較佳的,所述長彎折部沿著窗主體的徑向向中心延伸的部分延伸至內部區域的窗主體的中心附近。Preferably, the part of the long bent portion extending toward the center along the radial direction of the window body extends to near the center of the window body in the inner region.
較佳的,短彎折部由至少一個短彎折單元構成,且長彎折部由至少一個長彎折單元構成。Preferably, the short bending part is formed by at least one short bending unit, and the long bending part is formed by at least one long bending unit.
較佳的,加熱裝置還包括第二加熱環,所述第二加熱環與第一加熱環相鄰,且位於第一加熱環靠近內部區域一側。Preferably, the heating device further includes a second heating ring, the second heating ring is adjacent to the first heating ring and is located on a side of the first heating ring close to the inner region.
較佳的,所述第二加熱環為中間夾設有加熱絲的加熱貼片,所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第二加熱環;其中,長彎折部沿著窗主體的徑向向內部區域延伸。Preferably, the second heating ring is a heating patch with a heating wire interposed therebetween, and the heating wire has a short bend and a long bend, and the short bend and the long bend are on the window The main bodies are alternately arranged in the circumferential direction and connected to each other to form a roughly second heating ring; wherein, the long bent portion extends along the radial direction of the window main body to the inner area.
較佳的,所述半導體製冷器包括第一半導體製冷器,所述第一半導體製冷器包括多個製冷單元,所述製冷單元為方形、扇形或環形,所述製冷單元形成大致的第一環形。Preferably, the semiconductor refrigerator includes a first semiconductor refrigerator, and the first semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square, fan-shaped or ring-shaped, and the refrigeration units form a roughly first ring shape.
較佳的,所述半導體製冷器包括第一半導體製冷器,所述第一半導體製冷器包括多個製冷單元,所述製冷單元為方形或扇形,所述製冷單元形成大致的第一環形,所述製冷單元和長彎折部的向內部區域延伸的部分交替設置。Preferably, the semiconductor refrigerator includes a first semiconductor refrigerator, the first semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square or fan-shaped, and the refrigeration units form a roughly first ring shape, The refrigerating unit and the part extending toward the inner area of the long bent part are arranged alternately.
較佳的,所述半導體製冷器還包括第二半導體製冷器,所述第二半導體製冷器包括多個製冷單元,所述製冷單元為方形或扇形,所述多個製冷單元形成大致的第二環形,所述第二環形與第一環形相鄰,且位於第一環形遠離內部區域一側;且第二半導體製冷器的功率密度小於第一半導體製冷器的功率密度。Preferably, the semiconductor refrigerator further includes a second semiconductor refrigerator, the second semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square or fan-shaped, and the plurality of refrigeration units form a roughly second The second ring is adjacent to the first ring and is located on the side of the first ring away from the inner area; and the power density of the second semiconductor refrigerator is smaller than that of the first semiconductor refrigerator.
較佳的,所述溫度控制裝置還包括冷卻裝置,所述冷卻裝置為多個風扇元件;其中,所述冷卻裝置設置在所述絕緣窗的外表面相對側。Preferably, the temperature control device further includes a cooling device, and the cooling device is a plurality of fan elements; wherein, the cooling device is arranged on the opposite side of the outer surface of the insulating window.
較佳的,所述加熱絲為單根或可以分開獨立控制的多根。Preferably, the heating wire is single or multiple that can be separately and independently controlled.
進一步的,本發明還公開了一種等離子體處理裝置,包括反應腔和如上文所述的具有溫度控制裝置的絕緣窗,所述絕緣窗設置在反應腔上部。Further, the present invention also discloses a plasma processing device, comprising a reaction chamber and the above-mentioned insulating window with a temperature control device, and the insulating window is arranged on the upper part of the reaction chamber.
進一步的,本發明還公開了一種上文所述的具有溫度控制裝置的絕緣窗的溫度控制的方法,包括:預加熱步驟,在等離子體產生之前,分別控制加熱裝置和區域溫控裝置加熱;以及控溫步驟,在等離子體產生時,分別控制加熱裝置加熱,區域溫控裝置降溫。Further, the present invention also discloses a method for temperature control of the above-mentioned insulating window with a temperature control device, including: a preheating step, before the plasma is generated, separately controlling the heating device and the zone temperature control device to heat; As well as the temperature control step, when the plasma is generated, the heating device is respectively controlled to heat, and the regional temperature control device is cooled.
本發明的優點在於:本發明提供了一種具有溫度控制裝置的絕緣窗及其溫度控制方法、等離子體處理裝置,通過在絕緣窗上設置環狀的加熱裝置和區域溫控裝置可以實現絕緣窗的溫度均一性,區域溫控裝置採用半導體製冷器,其具有溫度回應快的特點,可以實現對絕緣窗中心快速降溫的目的,不僅如此,半導體製冷器僅需反轉電極即可以實現加熱功能,可以在等離子體產生之前對等離子體進行預熱。The advantage of the present invention is that: the present invention provides an insulating window with a temperature control device, its temperature control method, and a plasma processing device, and the insulating window can be realized by arranging a ring-shaped heating device and a regional temperature control device on the insulating window. Temperature uniformity, the regional temperature control device uses a semiconductor refrigerator, which has the characteristics of fast temperature response, and can achieve the purpose of quickly cooling the center of the insulating window. Not only that, the semiconductor refrigerator can realize the heating function only by reversing the electrodes, which can The plasma is preheated prior to plasma generation.
為使本發明實施例的目的、技術方案和優點更加清楚,下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例是本發明一部分實施例,而不是全部的實施例。基於本發明中的實施例,本發明所屬技術領域中具有通常知識者在沒有做出具進步性改變前提下所獲得的所有其他實施例,都屬於本發明保護的範圍。In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art of the present invention without making progressive changes shall fall within the protection scope of the present invention.
圖1示出一種電感耦合等離子體處理裝置示意圖,處理裝置100包括一由外壁101圍成的可抽真空的反應腔106,反應腔106用於對基片112進行處理,其中,基片112放置在基座110上,基座110由基底111支撐;外壁101上設置進氣口105,製程氣體氣源107通過管路108A連接進氣口105,進而輸入反應腔106內,整個腔體通過泵104實現負壓;在反應腔100的頂部設置絕緣窗200,絕緣窗200的外表面設置有溫度控制裝置210,其中外表面是指絕緣窗200與面向反應腔106的內表面相反的面;不做具體限定,溫度控制裝置210也可以設置在絕緣窗200的夾層或內表面;在溫度控制裝置210的外表面上方還設置有電感線圈108,電感線圈108連接RF源109用於產生等離子體;在絕緣窗200的外表面的上方還設置有冷卻裝置220,用於給絕緣窗200降溫,冷卻裝置220由多個風扇元件221構成。Fig. 1 shows a schematic diagram of an inductively coupled plasma processing device. The
圖2示出一種絕緣窗200結構示意圖,絕緣窗200具有窗主體,在該圖所示的結構中,雖然附圖示出絕緣窗200的窗主體為圓形,但是為通常知識的,絕緣窗200的具體形狀是根據反應腔腔體頂部形狀不同而變化的;絕緣窗200的窗主體具有中心201、內部區域303以及圍繞內部區域303的外部區域301,其中內部區域303位於絕緣窗200的中心201附近,等離子體產生時會聚集在中心201附近(即內部區域303),從而集中加熱絕緣窗200的內部區域303位置,導致內部區域303的溫度較外部區域301高。Fig. 2 shows a schematic structural view of an
為了解決溫度均一性問題,絕緣窗200的外表面設置有溫度控制裝置210,所述溫度控制裝置210包括加熱裝置和區域溫控裝置,所述加熱裝置位於所述窗主體的外部區域301,或外部區域301及內部區域303,以實現在預熱時對絕緣窗200的加熱,以及等離子體產生時對絕緣窗200的溫度控制;所述區域溫控裝置位於所述窗主體的內部區域303(即等離子體產生時,等離子體集中加熱,導致溫度較高的區域),以實現在預熱時對絕緣窗200的加熱,以及在等離子體產生時對絕緣窗200的內部區域303的降溫。其中,區域溫控裝置為半導體製冷器,半導體製冷器具有兩極反轉實現加熱和冷卻切換的功能,方便實現對於預熱和溫控步驟不同需求的轉換。In order to solve the temperature uniformity problem, the outer surface of the
加熱裝置和區域溫控裝置均採用大致環行的排布,由於環形大致是沿著絕緣窗200的窗主體周向排布的,因此這樣排布的優點在於沿著絕緣窗200周向的溫度是均一的;其中大致環形並非一定是嚴格的環形,可以是環形,也可以是C形、點劃線式的多段形成的環形或整體排布趨勢呈環形。Both the heating device and the regional temperature control device are arranged in a roughly circular pattern. Since the circular pattern is roughly arranged along the circumference of the window body of the
具體的,加熱裝置大致呈環形分佈且形成至少一個環,各個環大致呈同心嵌套,加熱裝置位於外部區域301,或外部區域301及內部區域303,各個環的功率密度設置為沿著所述窗主體的徑向方向由外部區域301向內部區域303減小,這樣可以保證窗主體徑向加熱溫度的均一性。Specifically, the heating devices are distributed approximately in a ring shape and form at least one ring, each ring is substantially concentrically nested, the heating device is located in the
具體的,區域溫控裝置大致呈環形分佈且形成至少一個環,各個環大致呈同心嵌套,區域溫控裝置位於內部區域303,由於等離子產生時,內部區域303的溫度是沿著徑向越向中心201溫度越高,因此各個環的功率密度設置為沿著所述窗主體的徑向方向由外部區域301向內部區域303逐漸增加,這樣可以保證窗主體徑向溫度的均一性。其中,功率密度的變化通過排布密度的變化實現,同樣也可以通過電流大小來控制。Specifically, the regional temperature control devices are distributed approximately in a ring shape and form at least one ring, and each ring is roughly nested concentrically. The regional temperature control device is located in the
較佳的一個實施例,溫度控制裝置210的具體設置方式參見附圖3,絕緣窗200具有設置在中心201位置的氣體入口202。所述加熱裝置為加熱貼片,所述加熱貼片中間夾設有加熱絲400;所述加熱絲400具有短彎折部401和長彎折部402,所述短彎折部401和長彎折部402在窗主體的周向方向上交替設置並彼此相連形成大致的第一加熱環405;其中,長彎折部402沿著窗主體的徑向向內部區域303延伸,長彎折部402向內部區域303延伸的部位可以延伸至中心201附近,如附圖3顯示的那樣,也可以不延伸至中心201附近,僅在外部區域301內延伸(如附圖8所示),也可以延伸至外部區域301和內部區域303的交界處(如附圖7所示)。For a preferred embodiment, the specific arrangement of the
參見附圖4,短彎折部401包括多個短彎折單元410,每個短彎折單元410包括依次連接的徑向邊411、內周向邊413、徑向邊411和外周向邊412,兩個徑向邊411長度相同且沿著徑向延伸;外周向邊412和內周向邊413沿著周向延伸且外周向邊412的長度大於內周向邊413。Referring to FIG. 4 , the
長彎折部402包括多個長彎折單元420,每個長彎折單元420包括依次連接的徑向邊421、內周向邊423、徑向邊421和外周向邊422,兩個徑向邊421長度大致相同且沿著徑向延伸;外周向邊422和內周向邊423沿著周向延伸且外周向邊422的長度大於內周向邊423;其中,長彎折單元420的徑向邊421的長度大於短彎折單元410的徑向邊411的長度,這樣徑向長度的不同有助於控制加熱裝置的功率密度沿著徑向向內部區域303方向減小。The
由附圖3可見,第一加熱環405並非是嚴格的環形,而是整體排布趨勢為環形,並通過介面403與外部控制裝置電連接,實現對第一加熱環405的溫度控制。短彎折部401的短彎折單元410個數大於長彎折部402的長彎折單元420個數,這樣數量的配比同樣有助於控制加熱裝置的功率密度沿著徑向向內部區域303方向減小。It can be seen from FIG. 3 that the
參見附圖3,半導體製冷器包括第一半導體製冷器501,第一半導體製冷器501設置在內部區域303內,所述第一半導體製冷器501包括多個製冷單元505,所述製冷單元505的排布形成大致的第一環形。當長彎折部402的延伸部分延伸至內部區域303時,其延伸部分與製冷單元505在周向上交替設置,這樣可以更加有效的控制局部區域的溫度。Referring to accompanying drawing 3, the semiconductive refrigerator comprises a first
當然,半導體製冷器可以由多個環形組成,附圖5示出了另一種實施方式,雖然附圖5僅示出了兩個環形,不做限定地,也可以是多個環形。所述半導體製冷器還包括第二半導體製冷器502,第一半導體製冷器501和第二半導體製冷器502均設置在內部區域303內,所述第二半導體製冷器502包括多個製冷單元,所述多個製冷單元形成大致的第二環形,所述第二環形與第一環形相鄰,且位於第一環形遠離中心201的一側;且第二半導體製冷器502的功率密度小於第一半導體製冷器501的功率密度,由附圖5可以看出,可以通過製冷單元505的個數來控制功率密度的變化。Certainly, the peltier cooler may be composed of multiple rings, and FIG. 5 shows another embodiment, although FIG. 5 only shows two rings, without limitation, it may also be multiple rings. The semiconductor refrigerator also includes a
對於製冷單元505的形式,附圖3和5示出的製冷單元505均為片狀,具體為方形,也可以選用扇形、圓形或其他片狀,甚至幾種形狀的組合,例如附圖6所示,第一半導體製冷器501為扇形,第二半導體製冷器502為方形的情況。Regarding the form of the
上文所述,長彎折部402的延伸部分延伸至內部區域303且靠近中心201附近,延伸部分與半導體製冷器交替排布;附圖7示出了延伸部分並未延伸至中心201附近的情況,當延伸部分沒有延伸至中心201附近時,延伸部分可以僅與半導體製冷器遠離中心201的幾個環形在周向上交替設置,而半導體製冷器靠近中心201的幾個環形則不與延伸部分在周向上交替設置;甚至,延伸部分延伸很短時,延伸部分不與半導體製冷器任何一個環形在周向上交替,例如附圖7示出了這樣的情況,其中當延伸部分不與半導體製冷器交替時,製冷單元505可以選擇環形,環形的製冷單元可以避免片狀製冷單元排布不均勻帶來的溫度不均勻。As mentioned above, the extended part of the long
附圖8示出了半導體製冷器另一種排布選擇,第一半導體製冷器501為方形,還可以優選方形、圓形等片狀,這樣的好處在於可以精確控制每個製冷單元所在區域的溫度。其中,第一半導體製冷器501具有15個製冷單元且沿著周向形成環形排布,相鄰兩個製冷單元的距離相同,等距的排布保證了周向溫度控制的均一性,第二半導體製冷器502具有10個製冷單元,並且同樣是沿著周向等距環形排布,第一半導體製冷器501的個數大於半導體製冷器502的個數,從而保證了冷卻時,功率密度變化沿著徑向向中心201方向增大;第一半導體製冷器501具有沿著長彎折部402的延伸部分繼續向中心方向延伸的徑向製冷單元5051,第二半導體製冷器502同樣具有沿著長彎折部402的延伸部分繼續向中心方向延伸的徑向製冷單元5052,徑向製冷單元5051、5052有助於在預熱步驟階段,即製冷單元切換成加熱模式時,加熱溫度的均勻性,不僅如此,在預熱步驟階段,製冷單元切換為加熱模式時,為了保證加熱的功率密度沿著徑向向中心減小,並非所有的製冷單元均需工作,以附圖8為例,預熱時,第二半導體製冷器502的製冷單元全部工作或部分工作,但是第一半導體製冷器501的製冷單元僅有部分工作或全部不工作,例如第二半導體製冷器502全部工作,第一半導體製冷器501僅5個製冷單元工作,這5個製冷單元是選擇均勻間隔的以保證溫度的均一性。較佳的,在預熱步驟階段,製冷單元切換為加熱模式時,製冷單元也可以全部工作,即第一半導體製冷器501和第二半導體製冷器502全部工作,以加快預熱的速度。當然製冷單元個數不受附圖限制,附圖僅是為了方便說明。Accompanying drawing 8 shows another arrangement option of semiconductor refrigerators. The
附圖9示出了加熱裝置和區域溫控裝置另一種排布選擇。由附圖8可以看出:在加熱裝置和區域溫控裝置之間具有空白區域302,空白區域302僅有長彎折部402的延伸部分,因此在加熱時,在徑向上由外部區域301向內部區域303會產生溫度的躍變,為了防止溫度的躍變,在第一加熱環405和半導體製冷器之間還設置有第二加熱環406;第二加熱環406可以選用和第一加熱環405相同的排布方式,附圖9並未具體示出第二加熱環的排布,較佳的,但是根據上文的描述,第二加熱環406包括加熱絲,所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第二加熱環;其中,長彎折部沿著窗主體的徑向向內部區域303延伸,長彎折部向內部區域303延伸的部位可以延伸至中心201附近,也可以不延伸至中心201附近;第二加熱環406的延伸部分和第一加熱環405的延伸部分沿著徑向平行設置。Accompanying drawing 9 shows another arrangement option of the heating device and the zone temperature control device. It can be seen from accompanying drawing 8: there is a
另外,第二加熱環406也可以僅包括短彎折部,短彎折部沿著周向排布,並設置在相鄰的兩個第一加熱環405的延伸部分之間;對於第二加熱環406的具體排布不受限制,但是需要保證第一加熱環405、第二加熱環406的功率密度沿著徑向向中心減小。In addition, the
雖然可以通過設置第二加熱環406的方式來改善溫度的跳變,較佳的,也可以通過其他方式,例如增加第一加熱環405的長彎折單元的個數來改善這個問題,附圖9顯示了有5個長彎折單元情況,可以從5個增加到8個來改善這一問題。Although the temperature jump can be improved by setting the
附圖10示出了加熱裝置和區域溫控裝置另一種排布選擇。第一加熱環405’僅由短彎折部沿著周向排布成環形;第二加熱環406’可以選擇和第一加熱環405’相同的排布,即:僅由短彎折部沿著周向排布成環形;作為另一種替換方式,第二加熱環406’還可以和附圖9中的第一加熱環405的排布相同。Figure 10 shows another arrangement option of heating means and zone temperature control means. The first heating ring 405' is arranged in a ring shape along the circumferential direction only by the short bending part; Arranged in a ring in the circumferential direction; as another alternative, the arrangement of the
附圖9-10中,附圖僅示出了一個第一半導體製冷器形成的環形,根據上文所述的實施例,在第二加熱環406、406’內部的半導體製冷器可以包括第一半導體製冷器和第二半導體製冷器形成的兩個環形,甚至根據需要也可以包括多個大致的環形。In accompanying drawings 9-10, the figure only shows a ring formed by a first semiconductor refrigerator. According to the embodiment described above, the semiconductor refrigerator inside the
圖11示出加熱絲的排布示意圖,和附圖6的區別在於:加熱絲400具有多個介面403,多個介面403可以將加熱絲400分成多根,有助於分別控制加熱絲400,從而實現分區加熱。Figure 11 shows a schematic diagram of the arrangement of the heating wires, and the difference from the accompanying drawing 6 is that the
為了更好的降溫,參見附圖1,在絕緣窗200的外表面的上方還設置有冷卻裝置220,用於給絕緣窗200降溫的同時,也可以給半導體製冷器進行散熱。For better cooling, referring to FIG. 1 , a
在絕緣窗上還設置有多個溫度感測器,以及控制單元(圖中並未示出),溫度感測器用於測量加熱裝置和區域溫控裝置附近的溫度,並將溫度數值返回給控制單元,控制單元根據預設的程式控制加熱裝置和區域溫控裝置,保證了絕緣窗溫度的均勻性;對於設置在區域溫控裝置附近的溫度感測器,也可以將這部分溫度感測器集成在半導體製冷器內,簡化裝置。There are also multiple temperature sensors on the insulating window, as well as a control unit (not shown in the figure), the temperature sensors are used to measure the temperature near the heating device and the zone temperature control device, and return the temperature value to the control unit Unit, the control unit controls the heating device and the area temperature control device according to the preset program, which ensures the uniformity of the temperature of the insulating window; for the temperature sensor installed near the area temperature control device, this part of the temperature sensor can also be Integrated in the semiconductor refrigerator, simplifying the installation.
本發明還公開了上文所述的具有溫度控制裝置的絕緣窗的溫度控制的方法,包括下列步驟:The present invention also discloses the method for controlling the temperature of the insulating window with the temperature control device described above, including the following steps:
(一)預熱步驟,在等離子體產生之前,分別控制加熱裝置和區域溫控裝置加熱。由於在等離子體產生之前,需要對絕緣窗進行預加熱,防止等離子體產生時溫度突然升高損壞絕緣窗,因此預熱步驟時需要將區域溫控裝置的半導體製冷器切換成加熱模式,然而區域溫控裝置的半導體製冷器的功率密度排布是沿著徑向向中心增加的,這和加熱裝置的功率密度排布需求相反,因此半導體製冷器在預熱步驟中僅部分製冷單元工作,工作的製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢。較佳的,在預熱步驟時,為了增加預熱的速度,半導體製冷器也可以全部工作。(1) In the preheating step, before the plasma is generated, the heating device and the regional temperature control device are respectively controlled to heat. Before the plasma is generated, the insulating window needs to be preheated to prevent the sudden rise in temperature from damaging the insulating window when the plasma is generated. Therefore, it is necessary to switch the semiconductor refrigerator of the regional temperature control device to the heating mode during the preheating step. The power density arrangement of the semiconductor refrigerator of the temperature control device increases radially toward the center, which is opposite to the power density arrangement requirement of the heating device, so only part of the cooling units of the semiconductor refrigerator work during the preheating step, and the working The refrigeration unit and the heating device together conform to the trend that the power density decreases radially toward the center. Preferably, in the preheating step, in order to increase the speed of preheating, all semiconductor refrigerators can also work.
如附圖3、9、10中示出,在預熱步驟時,製冷單元505僅部分工作,並切換為加熱模式,例如僅5個製冷單元505工作,從而保證工作的製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢,且工作的製冷單元505之間的周向間距是相同的,從而保證周向加熱的均勻性;如附圖5中示出,在預熱步驟時,第二半導體製冷器502全部工作或僅部分工作,第一半導體製冷器501僅部分工作或全部不工作,製冷單元工作與否與製冷單元的具體數量有關,製冷單元工作與否最終滿足製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢。附圖中的製冷單元的數量僅僅是一個示意,並未具體限定製冷單元的個數。同理,附圖6-7中的第二半導體製冷器502全部工作或部分工作,第一半導體製冷器501部分工作或全部不工作,或者通過調節第一半導體製冷器501的電流來調節功率,從而滿足功率密度的分佈趨勢。圖8中的工作方式在上文已經具體描述,這裡不再熬述。當然,較佳的,在預熱步驟時,為了增加預熱的速度,半導體製冷器也可以全部工作。As shown in accompanying
(二)控溫步驟,在等離子體產生時,分別控制加熱裝置加熱,區域溫控裝置降溫。在等離子體產生時,等離子體集中分佈在絕緣窗中心附近,造成內部區域溫度過高,通過區域溫控裝置可以快速冷卻絕緣窗的內部區域,實現溫度的均勻化。(2) In the temperature control step, when the plasma is generated, the heating device is respectively controlled to heat, and the regional temperature control device is cooled. When the plasma is generated, the plasma is concentrated and distributed near the center of the insulating window, causing the temperature of the inner area to be too high. The inner area of the insulating window can be quickly cooled through the area temperature control device to achieve uniform temperature.
儘管本發明的內容已經通過上述較佳實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本發明所屬技術領域中具有通常知識者閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the content of the present invention has been described in detail through the above preferred embodiments, it should be understood that the above description should not be considered as limiting the present invention. Various modifications and alterations to the present invention will become apparent to those having ordinary skill in the art to which the present invention pertains after reading the above disclosure. Therefore, the protection scope of the present invention should be limited by the scope of the appended patent application.
101:外壁
104:泵
105:進氣口
106:反應腔
107:製程氣體氣源
108:電感線圈
108A:管路
109:RF源
110:基座
111:基底
112:基片
200:絕緣窗
201:中心
202:氣體入口
210:溫度控制裝置
220:冷卻裝置
221:風扇元件
301:外部區域
302:空白區域
303:內部區域
400:加熱絲
401:短彎折部
402:長彎折部
403:介面
405,406’:第一加熱環
406,406’:第二加熱環
410:短彎折單元
411:短彎折單元的徑向邊
412:短彎折單元的外周向邊
413:短彎折單元的內周向邊
420:長彎折單元
421:長彎折單元的徑向邊
422:長彎折單元的外周向邊
423:長彎折單元的內周向邊
501:第一半導體製冷器
502:第二半導體製冷器
505:製冷單元
5051,5052:徑向製冷單元
101: outer wall
104: pump
105: air inlet
106: reaction chamber
107: Process gas source
108:
為了更清楚地說明本發明實施例或習知技術中的技術方案,下面將對實施例或習知技術描述中所需要使用的附圖作簡單地介紹,顯而易見地,下面描述中的附圖僅僅是本發明的一些實施例,對於本發明所屬技術領域中具有通常知識者來講,在不付出具進步性改變的前提下,還可以根據這些附圖獲得其他的附圖。 圖1示出一種電容耦合等離子體處理裝置的結構示意圖; 圖2示出一種絕緣窗結構俯視圖; 圖3示出一種具有溫度控制裝置絕緣窗的實施例; 圖4示出短彎折單元和長彎折單元的示意圖; 圖5示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖6示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖7示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖8示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖9示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖10示出一種具有溫度控制裝置絕緣窗的另一實施例;以及 圖11示出加熱絲的排布示意圖。 In order to more clearly illustrate the technical solutions in the embodiments of the present invention or in the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those skilled in the art to which the present invention pertains, other drawings can also be obtained based on these drawings without making progressive changes. FIG. 1 shows a schematic structural view of a capacitively coupled plasma processing device; Figure 2 shows a top view of an insulating window structure; Fig. 3 shows a kind of embodiment with insulating window of temperature control device; Figure 4 shows a schematic diagram of a short bending unit and a long bending unit; Fig. 5 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 6 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 7 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 8 shows a kind of another embodiment with insulating window of temperature control device; Fig. 9 shows a kind of another embodiment with insulating window of temperature control device; Figure 10 shows a further embodiment with an insulating window for temperature control means; and Figure 11 shows a schematic diagram of the arrangement of heating wires.
200:絕緣窗 200: Insulated windows
201:中心 201: center
202:氣體入口 202: Gas inlet
303:內部區域 303: Inner area
400:加熱絲 400: heating wire
401:短彎折部 401: short bending part
402:長彎折部 402: long bending part
403:介面 403: interface
405:第一加熱環 405: the first heating ring
501:第一半導體製冷器 501: The first semiconductor refrigerator
505:製冷單元 505: Refrigeration unit
Claims (16)
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CN202011305453.7A CN114551200A (en) | 2020-11-19 | 2020-11-19 | Insulating window, control method thereof and plasma processing device |
CN202011305453.7 | 2020-11-19 |
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US6308654B1 (en) * | 1996-10-18 | 2001-10-30 | Applied Materials, Inc. | Inductively coupled parallel-plate plasma reactor with a conical dome |
US5935340A (en) * | 1996-11-13 | 1999-08-10 | Applied Materials, Inc. | Method and apparatus for gettering fluorine from chamber material surfaces |
WO2007067296A2 (en) * | 2005-12-02 | 2007-06-14 | Alis Corporation | Ion sources, systems and methods |
GB2463117A (en) * | 2008-09-08 | 2010-03-10 | Landa Lab Ltd | Generating electricity from the thermal motion of gas molecules |
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