TW202238659A - Insulation window, control method thereof and plasma processing device - Google Patents

Insulation window, control method thereof and plasma processing device Download PDF

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TW202238659A
TW202238659A TW110140333A TW110140333A TW202238659A TW 202238659 A TW202238659 A TW 202238659A TW 110140333 A TW110140333 A TW 110140333A TW 110140333 A TW110140333 A TW 110140333A TW 202238659 A TW202238659 A TW 202238659A
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window
heating
ring
semiconductor refrigerator
temperature control
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TW110140333A
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Chinese (zh)
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TWI811828B (en
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毛杰
左濤濤
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大陸商中微半導體設備(上海)股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32009Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
    • H01J37/32082Radio frequency generated discharge
    • H01J37/321Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
    • H01J37/32119Windows
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32458Vessel
    • H01J37/32522Temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67069Apparatus for fluid treatment for etching for drying etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/32Processing objects by plasma generation
    • H01J2237/33Processing objects by plasma generation characterised by the type of processing
    • H01J2237/334Etching

Abstract

According to the insulation window, the control method thereof and the plasma processing device, the heating device and the semiconductor cooler are arranged on the insulation window, uniform control over the temperature of the insulation window is achieved, the semiconductor cooler can effectively reduce the temperature of the center of the window, and in addition, the semiconductor cooler can achieve the dual functions of heating and cooling.

Description

絕緣窗及其溫度控制方法、及等離子體處理裝置Insulating window, temperature control method thereof, and plasma processing device

本發明涉及等離子體蝕刻的技術領域,尤其涉及一種用於等離子體蝕刻的絕緣窗的技術領域。The invention relates to the technical field of plasma etching, in particular to the technical field of an insulating window used for plasma etching.

對於等離子體蝕刻技術,該技術是向反應腔內輸入製程氣體,射頻源被電感或電容耦合至反應腔內部來激勵製程氣體,以形成和保持等離子體,在反應腔內部,晶圓被基板支撐而暴露在製程氣體中,實現蝕刻。其中,電感耦合等離子體(Inductive Coupled Plasma,ICP)是常見的技術,該技術是在反應腔上部覆蓋絕緣窗,例如陶瓷窗,絕緣窗上部排布線圈。For plasma etching technology, the technology is to input process gas into the reaction chamber, and the RF source is inductively or capacitively coupled to the reaction chamber to excite the process gas to form and maintain plasma. Inside the reaction chamber, the wafer is supported by the substrate While exposed to process gases, etching is achieved. Among them, Inductive Coupled Plasma (Inductive Coupled Plasma, ICP) is a common technology. In this technology, an insulating window, such as a ceramic window, is covered on the upper part of the reaction chamber, and coils are arranged on the upper part of the insulating window.

隨著晶圓的加工精度越來越高,對於陶瓷窗溫度的均一性要求也越來越高。As the processing precision of the wafer becomes higher and higher, the requirements for the uniformity of the temperature of the ceramic window are also higher and higher.

習知技術中,為了保證陶瓷窗溫度的均一性,需要對陶瓷窗進行溫度控制,以防陶瓷窗溫度差異對晶圓表面的均勻性產生影響。習知的溫度控制方法是在陶瓷窗上粘貼加熱裝置,並在陶瓷窗上方安裝風扇進行冷卻,實現對陶瓷窗的加熱和冷卻。然而,在蝕刻過程中,等離子體的熱量會集中加熱陶瓷窗的中心部位,僅利用風扇難以對陶瓷窗實現精確降溫。因此,亟需一種解決方案以適應陶瓷窗溫度均一性的要求。In the conventional technology, in order to ensure the uniformity of the temperature of the ceramic window, it is necessary to control the temperature of the ceramic window to prevent the temperature difference of the ceramic window from affecting the uniformity of the wafer surface. The known temperature control method is to paste a heating device on the ceramic window, and install a fan above the ceramic window for cooling, so as to realize heating and cooling of the ceramic window. However, during the etching process, the heat of the plasma will heat the central part of the ceramic window intensively, and it is difficult to achieve accurate cooling of the ceramic window only by using a fan. Therefore, there is an urgent need for a solution to meet the temperature uniformity requirements of the ceramic window.

為了解決上述技術問題,本發明提供一種絕緣窗,其用於等離子體處理裝置,包括:窗主體,所述窗主體具有內部區域和圍繞內部區域的至少一部分的外部區域;溫度控制裝置,其包括加熱裝置和區域溫控裝置;所述加熱裝置至少位於所述窗主體的外部區域;所述區域溫控裝置位於所述窗主體的內部區域,其中,區域溫控裝置為半導體製冷器,所述半導體製冷器用於在等離子體產生之前對所述窗主體加熱。In order to solve the above technical problems, the present invention provides an insulating window for a plasma processing device, comprising: a window body having an inner region and an outer region surrounding at least a part of the inner region; a temperature control device comprising A heating device and a zone temperature control device; the heating device is at least located in the outer area of the window body; the zone temperature control device is located in the inner area of the window body, wherein the zone temperature control device is a semiconductor refrigerator, the A peltier is used to heat the window body prior to plasma generation.

較佳的,所述半導體製冷器還用於在等離子體產生時對窗主體冷卻。Preferably, the semiconductor refrigerator is also used to cool the window body when the plasma is generated.

較佳的,所述加熱裝置大致呈環形分佈且形成至少一個環,所述半導體製冷器大致呈環形分佈且形成至少一個環;其中,所述加熱裝置的功率密度沿著所述窗主體的徑向方向由外部區域向內部區域減小,所述區域溫控裝置的功率密度沿著所述窗主體的徑向方向由外部區域向內部區域增加。Preferably, the heating device is approximately annularly distributed and forms at least one ring, and the semiconductor refrigerator is approximately annularly distributed and forms at least one ring; wherein, the power density of the heating device is along the diameter of the window main body The direction decreases from the outer area to the inner area, and the power density of the area temperature control device increases from the outer area to the inner area along the radial direction of the window body.

較佳的,半導體製冷器與加熱裝置在內部區域中沿著周向方向交替設置。Preferably, semiconductor refrigerators and heating devices are arranged alternately along the circumferential direction in the inner region.

較佳的,所述加熱裝置為加熱貼片,所述加熱貼片中間夾設有加熱絲;所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第一加熱環;其中,長彎折部沿著窗主體的徑向向內部區域延伸。Preferably, the heating device is a heating patch, and a heating wire is sandwiched between the heating patch; the heating wire has a short bending part and a long bending part, and the short bending part and the long bending part The parts are arranged alternately in the circumferential direction of the window main body and connected to each other to form a roughly first heating ring; wherein, the long bent parts extend along the radial direction of the window main body to the inner area.

較佳的,所述長彎折部沿著窗主體的徑向向中心延伸的部分延伸至內部區域的窗主體的中心附近。Preferably, the part of the long bent portion extending toward the center along the radial direction of the window body extends to near the center of the window body in the inner region.

較佳的,短彎折部由至少一個短彎折單元構成,且長彎折部由至少一個長彎折單元構成。Preferably, the short bending part is formed by at least one short bending unit, and the long bending part is formed by at least one long bending unit.

較佳的,加熱裝置還包括第二加熱環,所述第二加熱環與第一加熱環相鄰,且位於第一加熱環靠近內部區域一側。Preferably, the heating device further includes a second heating ring, the second heating ring is adjacent to the first heating ring and is located on a side of the first heating ring close to the inner region.

較佳的,所述第二加熱環為中間夾設有加熱絲的加熱貼片,所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第二加熱環;其中,長彎折部沿著窗主體的徑向向內部區域延伸。Preferably, the second heating ring is a heating patch with a heating wire interposed therebetween, and the heating wire has a short bend and a long bend, and the short bend and the long bend are on the window The main bodies are alternately arranged in the circumferential direction and connected to each other to form a roughly second heating ring; wherein, the long bent portion extends along the radial direction of the window main body to the inner area.

較佳的,所述半導體製冷器包括第一半導體製冷器,所述第一半導體製冷器包括多個製冷單元,所述製冷單元為方形、扇形或環形,所述製冷單元形成大致的第一環形。Preferably, the semiconductor refrigerator includes a first semiconductor refrigerator, and the first semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square, fan-shaped or ring-shaped, and the refrigeration units form a roughly first ring shape.

較佳的,所述半導體製冷器包括第一半導體製冷器,所述第一半導體製冷器包括多個製冷單元,所述製冷單元為方形或扇形,所述製冷單元形成大致的第一環形,所述製冷單元和長彎折部的向內部區域延伸的部分交替設置。Preferably, the semiconductor refrigerator includes a first semiconductor refrigerator, the first semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square or fan-shaped, and the refrigeration units form a roughly first ring shape, The refrigerating unit and the part extending toward the inner area of the long bent part are arranged alternately.

較佳的,所述半導體製冷器還包括第二半導體製冷器,所述第二半導體製冷器包括多個製冷單元,所述製冷單元為方形或扇形,所述多個製冷單元形成大致的第二環形,所述第二環形與第一環形相鄰,且位於第一環形遠離內部區域一側;且第二半導體製冷器的功率密度小於第一半導體製冷器的功率密度。Preferably, the semiconductor refrigerator further includes a second semiconductor refrigerator, the second semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square or fan-shaped, and the plurality of refrigeration units form a roughly second The second ring is adjacent to the first ring and is located on the side of the first ring away from the inner area; and the power density of the second semiconductor refrigerator is smaller than that of the first semiconductor refrigerator.

較佳的,所述溫度控制裝置還包括冷卻裝置,所述冷卻裝置為多個風扇元件;其中,所述冷卻裝置設置在所述絕緣窗的外表面相對側。Preferably, the temperature control device further includes a cooling device, and the cooling device is a plurality of fan elements; wherein, the cooling device is arranged on the opposite side of the outer surface of the insulating window.

較佳的,所述加熱絲為單根或可以分開獨立控制的多根。Preferably, the heating wire is single or multiple that can be separately and independently controlled.

進一步的,本發明還公開了一種等離子體處理裝置,包括反應腔和如上文所述的具有溫度控制裝置的絕緣窗,所述絕緣窗設置在反應腔上部。Further, the present invention also discloses a plasma processing device, comprising a reaction chamber and the above-mentioned insulating window with a temperature control device, and the insulating window is arranged on the upper part of the reaction chamber.

進一步的,本發明還公開了一種上文所述的具有溫度控制裝置的絕緣窗的溫度控制的方法,包括:預加熱步驟,在等離子體產生之前,分別控制加熱裝置和區域溫控裝置加熱;以及控溫步驟,在等離子體產生時,分別控制加熱裝置加熱,區域溫控裝置降溫。Further, the present invention also discloses a method for temperature control of the above-mentioned insulating window with a temperature control device, including: a preheating step, before the plasma is generated, separately controlling the heating device and the zone temperature control device to heat; As well as the temperature control step, when the plasma is generated, the heating device is respectively controlled to heat, and the regional temperature control device is cooled.

本發明的優點在於:本發明提供了一種具有溫度控制裝置的絕緣窗及其溫度控制方法、等離子體處理裝置,通過在絕緣窗上設置環狀的加熱裝置和區域溫控裝置可以實現絕緣窗的溫度均一性,區域溫控裝置採用半導體製冷器,其具有溫度回應快的特點,可以實現對絕緣窗中心快速降溫的目的,不僅如此,半導體製冷器僅需反轉電極即可以實現加熱功能,可以在等離子體產生之前對等離子體進行預熱。The advantage of the present invention is that: the present invention provides an insulating window with a temperature control device, its temperature control method, and a plasma processing device, and the insulating window can be realized by arranging a ring-shaped heating device and a regional temperature control device on the insulating window. Temperature uniformity, the regional temperature control device uses a semiconductor refrigerator, which has the characteristics of fast temperature response, and can achieve the purpose of quickly cooling the center of the insulating window. Not only that, the semiconductor refrigerator can realize the heating function only by reversing the electrodes, which can The plasma is preheated prior to plasma generation.

為使本發明實施例的目的、技術方案和優點更加清楚,下面將結合本發明實施例中的附圖,對本發明實施例中的技術方案進行清楚、完整地描述,顯然,所描述的實施例是本發明一部分實施例,而不是全部的實施例。基於本發明中的實施例,本發明所屬技術領域中具有通常知識者在沒有做出具進步性改變前提下所獲得的所有其他實施例,都屬於本發明保護的範圍。In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art of the present invention without making progressive changes shall fall within the protection scope of the present invention.

圖1示出一種電感耦合等離子體處理裝置示意圖,處理裝置100包括一由外壁101圍成的可抽真空的反應腔106,反應腔106用於對基片112進行處理,其中,基片112放置在基座110上,基座110由基底111支撐;外壁101上設置進氣口105,製程氣體氣源107通過管路108A連接進氣口105,進而輸入反應腔106內,整個腔體通過泵104實現負壓;在反應腔100的頂部設置絕緣窗200,絕緣窗200的外表面設置有溫度控制裝置210,其中外表面是指絕緣窗200與面向反應腔106的內表面相反的面;不做具體限定,溫度控制裝置210也可以設置在絕緣窗200的夾層或內表面;在溫度控制裝置210的外表面上方還設置有電感線圈108,電感線圈108連接RF源109用於產生等離子體;在絕緣窗200的外表面的上方還設置有冷卻裝置220,用於給絕緣窗200降溫,冷卻裝置220由多個風扇元件221構成。Fig. 1 shows a schematic diagram of an inductively coupled plasma processing device. The processing device 100 includes a vacuumable reaction chamber 106 surrounded by an outer wall 101. The reaction chamber 106 is used to process a substrate 112, wherein the substrate 112 is placed On the base 110, the base 110 is supported by the base 111; the outer wall 101 is provided with an air inlet 105, and the process gas source 107 is connected to the air inlet 105 through a pipeline 108A, and then input into the reaction chamber 106, and the whole chamber is passed through the pump 104 to realize negative pressure; an insulating window 200 is set on the top of the reaction chamber 100, and the outer surface of the insulating window 200 is provided with a temperature control device 210, wherein the outer surface refers to the opposite side of the insulating window 200 to the inner surface facing the reaction chamber 106; To be specific, the temperature control device 210 can also be arranged on the interlayer or the inner surface of the insulating window 200; an inductance coil 108 is also arranged above the outer surface of the temperature control device 210, and the inductance coil 108 is connected to the RF source 109 for generating plasma; A cooling device 220 is also provided above the outer surface of the insulating window 200 for cooling the insulating window 200 , and the cooling device 220 is composed of a plurality of fan elements 221 .

圖2示出一種絕緣窗200結構示意圖,絕緣窗200具有窗主體,在該圖所示的結構中,雖然附圖示出絕緣窗200的窗主體為圓形,但是為通常知識的,絕緣窗200的具體形狀是根據反應腔腔體頂部形狀不同而變化的;絕緣窗200的窗主體具有中心201、內部區域303以及圍繞內部區域303的外部區域301,其中內部區域303位於絕緣窗200的中心201附近,等離子體產生時會聚集在中心201附近(即內部區域303),從而集中加熱絕緣窗200的內部區域303位置,導致內部區域303的溫度較外部區域301高。Fig. 2 shows a schematic structural view of an insulating window 200. The insulating window 200 has a window body. The specific shape of 200 varies according to the shape of the top of the reaction chamber; the window body of the insulating window 200 has a center 201, an inner region 303 and an outer region 301 surrounding the inner region 303, wherein the inner region 303 is located at the center of the insulating window 200 Near 201 , when plasma is generated, it will gather near the center 201 (that is, the inner region 303 ), thereby intensively heating the inner region 303 of the insulating window 200 , resulting in a higher temperature of the inner region 303 than the outer region 301 .

為了解決溫度均一性問題,絕緣窗200的外表面設置有溫度控制裝置210,所述溫度控制裝置210包括加熱裝置和區域溫控裝置,所述加熱裝置位於所述窗主體的外部區域301,或外部區域301及內部區域303,以實現在預熱時對絕緣窗200的加熱,以及等離子體產生時對絕緣窗200的溫度控制;所述區域溫控裝置位於所述窗主體的內部區域303(即等離子體產生時,等離子體集中加熱,導致溫度較高的區域),以實現在預熱時對絕緣窗200的加熱,以及在等離子體產生時對絕緣窗200的內部區域303的降溫。其中,區域溫控裝置為半導體製冷器,半導體製冷器具有兩極反轉實現加熱和冷卻切換的功能,方便實現對於預熱和溫控步驟不同需求的轉換。In order to solve the temperature uniformity problem, the outer surface of the insulating window 200 is provided with a temperature control device 210, the temperature control device 210 includes a heating device and a zone temperature control device, and the heating device is located in the outer area 301 of the window main body, or The outer area 301 and the inner area 303 are used to heat the insulating window 200 during preheating and to control the temperature of the insulating window 200 when plasma is generated; the area temperature control device is located in the inner area 303 of the window body ( That is, when the plasma is generated, the plasma is heated intensively, resulting in a region with a higher temperature), so as to heat the insulating window 200 during preheating and cool down the inner region 303 of the insulating window 200 when the plasma is generated. Among them, the regional temperature control device is a semiconductor refrigerator, and the semiconductor refrigerator has the function of reversing the two poles to realize the switching between heating and cooling, which facilitates the conversion of different requirements for preheating and temperature control steps.

加熱裝置和區域溫控裝置均採用大致環行的排布,由於環形大致是沿著絕緣窗200的窗主體周向排布的,因此這樣排布的優點在於沿著絕緣窗200周向的溫度是均一的;其中大致環形並非一定是嚴格的環形,可以是環形,也可以是C形、點劃線式的多段形成的環形或整體排布趨勢呈環形。Both the heating device and the regional temperature control device are arranged in a roughly circular pattern. Since the circular pattern is roughly arranged along the circumference of the window body of the insulating window 200, the advantage of this arrangement is that the temperature along the circumferential direction of the insulating window 200 It is uniform; the approximate ring is not necessarily a strict ring, it can be a ring, it can also be a C-shaped, dot-and-dash line-shaped ring formed by multiple segments, or the overall arrangement tends to be ring-shaped.

具體的,加熱裝置大致呈環形分佈且形成至少一個環,各個環大致呈同心嵌套,加熱裝置位於外部區域301,或外部區域301及內部區域303,各個環的功率密度設置為沿著所述窗主體的徑向方向由外部區域301向內部區域303減小,這樣可以保證窗主體徑向加熱溫度的均一性。Specifically, the heating devices are distributed approximately in a ring shape and form at least one ring, each ring is substantially concentrically nested, the heating device is located in the outer area 301, or the outer area 301 and the inner area 303, and the power density of each ring is set to be along the The radial direction of the window body decreases from the outer region 301 to the inner region 303, which can ensure the uniformity of the radial heating temperature of the window body.

具體的,區域溫控裝置大致呈環形分佈且形成至少一個環,各個環大致呈同心嵌套,區域溫控裝置位於內部區域303,由於等離子產生時,內部區域303的溫度是沿著徑向越向中心201溫度越高,因此各個環的功率密度設置為沿著所述窗主體的徑向方向由外部區域301向內部區域303逐漸增加,這樣可以保證窗主體徑向溫度的均一性。其中,功率密度的變化通過排布密度的變化實現,同樣也可以通過電流大小來控制。Specifically, the regional temperature control devices are distributed approximately in a ring shape and form at least one ring, and each ring is roughly nested concentrically. The regional temperature control device is located in the inner region 303. When the plasma is generated, the temperature of the inner region 303 increases along the radial direction. The temperature is higher toward the center 201, so the power density of each ring is set to gradually increase from the outer region 301 to the inner region 303 along the radial direction of the window body, which can ensure the uniformity of the radial temperature of the window body. Among them, the change of the power density is realized by the change of the arrangement density, and it can also be controlled by the magnitude of the current.

較佳的一個實施例,溫度控制裝置210的具體設置方式參見附圖3,絕緣窗200具有設置在中心201位置的氣體入口202。所述加熱裝置為加熱貼片,所述加熱貼片中間夾設有加熱絲400;所述加熱絲400具有短彎折部401和長彎折部402,所述短彎折部401和長彎折部402在窗主體的周向方向上交替設置並彼此相連形成大致的第一加熱環405;其中,長彎折部402沿著窗主體的徑向向內部區域303延伸,長彎折部402向內部區域303延伸的部位可以延伸至中心201附近,如附圖3顯示的那樣,也可以不延伸至中心201附近,僅在外部區域301內延伸(如附圖8所示),也可以延伸至外部區域301和內部區域303的交界處(如附圖7所示)。For a preferred embodiment, the specific arrangement of the temperature control device 210 is shown in FIG. 3 . The insulating window 200 has a gas inlet 202 arranged at the center 201 . The heating device is a heating patch, and a heating wire 400 is interposed in the middle of the heating patch; the heating wire 400 has a short bending part 401 and a long bending part 402, and the short bending part 401 and the long bending part The folded parts 402 are arranged alternately in the circumferential direction of the window body and are connected to each other to form a roughly first heating ring 405; wherein, the long bent parts 402 extend toward the inner region 303 along the radial direction of the window main body, and the long bent parts 402 The part extending to the inner area 303 may extend to the vicinity of the center 201, as shown in FIG. to the junction of the outer area 301 and the inner area 303 (as shown in FIG. 7 ).

參見附圖4,短彎折部401包括多個短彎折單元410,每個短彎折單元410包括依次連接的徑向邊411、內周向邊413、徑向邊411和外周向邊412,兩個徑向邊411長度相同且沿著徑向延伸;外周向邊412和內周向邊413沿著周向延伸且外周向邊412的長度大於內周向邊413。Referring to FIG. 4 , the short bending part 401 includes a plurality of short bending units 410, and each short bending unit 410 includes a radial side 411, an inner peripheral side 413, a radial side 411 and an outer peripheral side 412 connected in sequence. , the two radial sides 411 have the same length and extend along the radial direction;

長彎折部402包括多個長彎折單元420,每個長彎折單元420包括依次連接的徑向邊421、內周向邊423、徑向邊421和外周向邊422,兩個徑向邊421長度大致相同且沿著徑向延伸;外周向邊422和內周向邊423沿著周向延伸且外周向邊422的長度大於內周向邊423;其中,長彎折單元420的徑向邊421的長度大於短彎折單元410的徑向邊411的長度,這樣徑向長度的不同有助於控制加熱裝置的功率密度沿著徑向向內部區域303方向減小。The long bending part 402 includes a plurality of long bending units 420, and each long bending unit 420 includes a radial side 421, an inner peripheral side 423, a radial side 421 and an outer peripheral side 422 connected in sequence. The sides 421 have approximately the same length and extend along the radial direction; the outer circumferential side 422 and the inner circumferential side 423 extend along the circumferential direction and the length of the outer circumferential side 422 is greater than the inner circumferential side 423; wherein, the diameter of the long bending unit 420 The length of the side 421 is greater than the length of the radial side 411 of the short bending unit 410 , so that the difference in radial length helps to control the power density of the heating device to decrease along the radial direction toward the inner region 303 .

由附圖3可見,第一加熱環405並非是嚴格的環形,而是整體排布趨勢為環形,並通過介面403與外部控制裝置電連接,實現對第一加熱環405的溫度控制。短彎折部401的短彎折單元410個數大於長彎折部402的長彎折單元420個數,這樣數量的配比同樣有助於控制加熱裝置的功率密度沿著徑向向內部區域303方向減小。It can be seen from FIG. 3 that the first heating ring 405 is not strictly ring-shaped, but the overall arrangement tends to be ring-shaped, and is electrically connected to an external control device through the interface 403 to realize temperature control of the first heating ring 405 . The number of short bending units 410 in the short bending part 401 is greater than the number of long bending units 420 in the long bending part 402. Such a ratio of numbers also helps to control the power density of the heating device to the inner area along the radial direction. 303 direction decreases.

參見附圖3,半導體製冷器包括第一半導體製冷器501,第一半導體製冷器501設置在內部區域303內,所述第一半導體製冷器501包括多個製冷單元505,所述製冷單元505的排布形成大致的第一環形。當長彎折部402的延伸部分延伸至內部區域303時,其延伸部分與製冷單元505在周向上交替設置,這樣可以更加有效的控制局部區域的溫度。Referring to accompanying drawing 3, the semiconductive refrigerator comprises a first semiconductive refrigerator 501, and the first semiconductive refrigerator 501 is arranged in the internal area 303, and the first semiconductive refrigerator 501 comprises a plurality of refrigeration units 505, and the refrigeration units 505 The arrangement forms a roughly first ring shape. When the extended portion of the long bent portion 402 extends to the inner area 303 , the extended portion and the refrigeration unit 505 are arranged alternately in the circumferential direction, so that the temperature of the local area can be controlled more effectively.

當然,半導體製冷器可以由多個環形組成,附圖5示出了另一種實施方式,雖然附圖5僅示出了兩個環形,不做限定地,也可以是多個環形。所述半導體製冷器還包括第二半導體製冷器502,第一半導體製冷器501和第二半導體製冷器502均設置在內部區域303內,所述第二半導體製冷器502包括多個製冷單元,所述多個製冷單元形成大致的第二環形,所述第二環形與第一環形相鄰,且位於第一環形遠離中心201的一側;且第二半導體製冷器502的功率密度小於第一半導體製冷器501的功率密度,由附圖5可以看出,可以通過製冷單元505的個數來控制功率密度的變化。Certainly, the peltier cooler may be composed of multiple rings, and FIG. 5 shows another embodiment, although FIG. 5 only shows two rings, without limitation, it may also be multiple rings. The semiconductor refrigerator also includes a second semiconductor refrigerator 502, the first semiconductor refrigerator 501 and the second semiconductor refrigerator 502 are both arranged in the inner area 303, and the second semiconductor refrigerator 502 includes a plurality of refrigeration units, so The plurality of refrigerating units form a substantially second ring, the second ring is adjacent to the first ring, and is located on the side of the first ring away from the center 201; and the power density of the second semiconductor refrigerator 502 is smaller than that of the first ring. The power density of a semiconductor refrigerator 501 can be seen from FIG. 5 , and the variation of the power density can be controlled by the number of refrigeration units 505 .

對於製冷單元505的形式,附圖3和5示出的製冷單元505均為片狀,具體為方形,也可以選用扇形、圓形或其他片狀,甚至幾種形狀的組合,例如附圖6所示,第一半導體製冷器501為扇形,第二半導體製冷器502為方形的情況。Regarding the form of the refrigeration unit 505, the refrigeration units 505 shown in Figures 3 and 5 are all sheet-shaped, specifically square, fan-shaped, circular or other sheet-shaped, or even a combination of several shapes, such as Figure 6 As shown, the first semiconductor refrigerator 501 is fan-shaped, and the second semiconductor refrigerator 502 is square.

上文所述,長彎折部402的延伸部分延伸至內部區域303且靠近中心201附近,延伸部分與半導體製冷器交替排布;附圖7示出了延伸部分並未延伸至中心201附近的情況,當延伸部分沒有延伸至中心201附近時,延伸部分可以僅與半導體製冷器遠離中心201的幾個環形在周向上交替設置,而半導體製冷器靠近中心201的幾個環形則不與延伸部分在周向上交替設置;甚至,延伸部分延伸很短時,延伸部分不與半導體製冷器任何一個環形在周向上交替,例如附圖7示出了這樣的情況,其中當延伸部分不與半導體製冷器交替時,製冷單元505可以選擇環形,環形的製冷單元可以避免片狀製冷單元排布不均勻帶來的溫度不均勻。As mentioned above, the extended part of the long bent part 402 extends to the inner area 303 and is close to the center 201, and the extended part is alternately arranged with the semiconductor refrigerator; FIG. 7 shows that the extended part does not extend to the center 201 When the extension part does not extend to the vicinity of the center 201, the extension part can only be arranged alternately with several rings of the semiconductor refrigerator away from the center 201 in the circumferential direction, while several rings of the semiconductor refrigerator close to the center 201 are not connected with the extension part. Alternately arranged in the circumferential direction; even, when the extension part extends very short, the extension part does not alternate with any ring of the semiconductor refrigerator in the circumferential direction. Alternately, the cooling unit 505 can be ring-shaped, and the ring-shaped cooling unit can avoid temperature unevenness caused by uneven arrangement of sheet cooling units.

附圖8示出了半導體製冷器另一種排布選擇,第一半導體製冷器501為方形,還可以優選方形、圓形等片狀,這樣的好處在於可以精確控制每個製冷單元所在區域的溫度。其中,第一半導體製冷器501具有15個製冷單元且沿著周向形成環形排布,相鄰兩個製冷單元的距離相同,等距的排布保證了周向溫度控制的均一性,第二半導體製冷器502具有10個製冷單元,並且同樣是沿著周向等距環形排布,第一半導體製冷器501的個數大於半導體製冷器502的個數,從而保證了冷卻時,功率密度變化沿著徑向向中心201方向增大;第一半導體製冷器501具有沿著長彎折部402的延伸部分繼續向中心方向延伸的徑向製冷單元5051,第二半導體製冷器502同樣具有沿著長彎折部402的延伸部分繼續向中心方向延伸的徑向製冷單元5052,徑向製冷單元5051、5052有助於在預熱步驟階段,即製冷單元切換成加熱模式時,加熱溫度的均勻性,不僅如此,在預熱步驟階段,製冷單元切換為加熱模式時,為了保證加熱的功率密度沿著徑向向中心減小,並非所有的製冷單元均需工作,以附圖8為例,預熱時,第二半導體製冷器502的製冷單元全部工作或部分工作,但是第一半導體製冷器501的製冷單元僅有部分工作或全部不工作,例如第二半導體製冷器502全部工作,第一半導體製冷器501僅5個製冷單元工作,這5個製冷單元是選擇均勻間隔的以保證溫度的均一性。較佳的,在預熱步驟階段,製冷單元切換為加熱模式時,製冷單元也可以全部工作,即第一半導體製冷器501和第二半導體製冷器502全部工作,以加快預熱的速度。當然製冷單元個數不受附圖限制,附圖僅是為了方便說明。Accompanying drawing 8 shows another arrangement option of semiconductor refrigerators. The first semiconductor refrigerator 501 is square, and it can also be preferably square, circular and other sheet shapes. The advantage of this is that the temperature in the area where each refrigeration unit is located can be precisely controlled. . Among them, the first semiconductor refrigerator 501 has 15 refrigeration units and is arranged in a ring along the circumferential direction. The distance between two adjacent refrigeration units is the same, and the equidistant arrangement ensures the uniformity of circumferential temperature control. The second The semiconductor refrigerator 502 has 10 refrigeration units, which are also arranged in a circular equidistant manner along the circumferential direction. The number of the first semiconductor refrigerator 501 is greater than the number of the semiconductor refrigerator 502, thereby ensuring that the power density changes during cooling. Increase along the radial direction toward the center 201; the first semiconductor refrigerator 501 has a radial refrigeration unit 5051 that continues to extend toward the center along the extension of the long bent portion 402, and the second semiconductor refrigerator 502 also has a The extended part of the long bent part 402 continues to extend toward the radial refrigeration unit 5052 in the direction of the center. The radial refrigeration units 5051 and 5052 contribute to the uniformity of the heating temperature during the preheating step, that is, when the refrigeration unit switches to the heating mode , not only that, in the preheating step, when the refrigeration unit is switched to the heating mode, in order to ensure that the heating power density decreases radially toward the center, not all the refrigeration units need to work. Taking Figure 8 as an example, the preheating When it is hot, the refrigerating unit of the second semiconductor refrigerator 502 works or partially works, but the refrigeration unit of the first semiconductor refrigerator 501 only partially works or does not work at all, for example, the second semiconductor refrigerator 502 works completely, and the first semiconductor refrigerator Only 5 refrigeration units in the refrigerator 501 work, and these 5 refrigeration units are selected to be evenly spaced to ensure uniformity of temperature. Preferably, during the preheating step, when the refrigeration unit is switched to the heating mode, the refrigeration unit can also all work, that is, the first semiconductor refrigerator 501 and the second semiconductor refrigerator 502 all work, so as to speed up the preheating speed. Of course, the number of refrigeration units is not limited by the drawings, which are only for convenience of description.

附圖9示出了加熱裝置和區域溫控裝置另一種排布選擇。由附圖8可以看出:在加熱裝置和區域溫控裝置之間具有空白區域302,空白區域302僅有長彎折部402的延伸部分,因此在加熱時,在徑向上由外部區域301向內部區域303會產生溫度的躍變,為了防止溫度的躍變,在第一加熱環405和半導體製冷器之間還設置有第二加熱環406;第二加熱環406可以選用和第一加熱環405相同的排布方式,附圖9並未具體示出第二加熱環的排布,較佳的,但是根據上文的描述,第二加熱環406包括加熱絲,所述加熱絲具有短彎折部和長彎折部,所述短彎折部和長彎折部在窗主體的周向方向上交替設置並彼此相連形成大致的第二加熱環;其中,長彎折部沿著窗主體的徑向向內部區域303延伸,長彎折部向內部區域303延伸的部位可以延伸至中心201附近,也可以不延伸至中心201附近;第二加熱環406的延伸部分和第一加熱環405的延伸部分沿著徑向平行設置。Accompanying drawing 9 shows another arrangement option of the heating device and the zone temperature control device. It can be seen from accompanying drawing 8: there is a blank area 302 between the heating device and the area temperature control device, and the blank area 302 has only the extension of the long bent part 402, so when heating, in the radial direction from the outer area 301 to The inner region 303 will produce a temperature jump. In order to prevent the temperature jump, a second heating ring 406 is also provided between the first heating ring 405 and the semiconductor refrigerator; the second heating ring 406 can be selected from the first heating ring 405 in the same arrangement, the accompanying drawing 9 does not specifically show the arrangement of the second heating ring, which is preferred, but according to the above description, the second heating ring 406 includes a heating wire, and the heating wire has a short bend A bent portion and a long bent portion, the short bent portion and the long bent portion are arranged alternately in the circumferential direction of the window main body and connected to each other to form a roughly second heating ring; wherein the long bent portion is along the window main body The radial direction extends toward the inner region 303, and the part where the long bent part extends toward the inner region 303 may or may not extend to the vicinity of the center 201; the extended part of the second heating ring 406 and the first heating ring 405 The extended parts are arranged in parallel along the radial direction.

另外,第二加熱環406也可以僅包括短彎折部,短彎折部沿著周向排布,並設置在相鄰的兩個第一加熱環405的延伸部分之間;對於第二加熱環406的具體排布不受限制,但是需要保證第一加熱環405、第二加熱環406的功率密度沿著徑向向中心減小。In addition, the second heating ring 406 may also only include short bent parts, and the short bent parts are arranged along the circumferential direction and arranged between the extension parts of two adjacent first heating rings 405; for the second heating The specific arrangement of the rings 406 is not limited, but it needs to ensure that the power density of the first heating ring 405 and the second heating ring 406 decreases radially toward the center.

雖然可以通過設置第二加熱環406的方式來改善溫度的跳變,較佳的,也可以通過其他方式,例如增加第一加熱環405的長彎折單元的個數來改善這個問題,附圖9顯示了有5個長彎折單元情況,可以從5個增加到8個來改善這一問題。Although the temperature jump can be improved by setting the second heating ring 406, it is preferable to improve this problem by other means, such as increasing the number of long bending units of the first heating ring 405, as shown in the accompanying drawings 9 shows that there are 5 long bending units, which can be improved from 5 to 8.

附圖10示出了加熱裝置和區域溫控裝置另一種排布選擇。第一加熱環405’僅由短彎折部沿著周向排布成環形;第二加熱環406’可以選擇和第一加熱環405’相同的排布,即:僅由短彎折部沿著周向排布成環形;作為另一種替換方式,第二加熱環406’還可以和附圖9中的第一加熱環405的排布相同。Figure 10 shows another arrangement option of heating means and zone temperature control means. The first heating ring 405' is arranged in a ring shape along the circumferential direction only by the short bending part; Arranged in a ring in the circumferential direction; as another alternative, the arrangement of the second heating ring 406 ′ can be the same as that of the first heating ring 405 in FIG. 9 .

附圖9-10中,附圖僅示出了一個第一半導體製冷器形成的環形,根據上文所述的實施例,在第二加熱環406、406’內部的半導體製冷器可以包括第一半導體製冷器和第二半導體製冷器形成的兩個環形,甚至根據需要也可以包括多個大致的環形。In accompanying drawings 9-10, the figure only shows a ring formed by a first semiconductor refrigerator. According to the embodiment described above, the semiconductor refrigerator inside the second heating ring 406, 406' may include a first The two rings formed by the peltier cooler and the second peltier cooler may even include a plurality of approximate ring shapes as required.

圖11示出加熱絲的排布示意圖,和附圖6的區別在於:加熱絲400具有多個介面403,多個介面403可以將加熱絲400分成多根,有助於分別控制加熱絲400,從而實現分區加熱。Figure 11 shows a schematic diagram of the arrangement of the heating wires, and the difference from the accompanying drawing 6 is that the heating wire 400 has multiple interfaces 403, and the multiple interfaces 403 can divide the heating wire 400 into multiple pieces, which helps to control the heating wires 400 respectively, This enables zoned heating.

為了更好的降溫,參見附圖1,在絕緣窗200的外表面的上方還設置有冷卻裝置220,用於給絕緣窗200降溫的同時,也可以給半導體製冷器進行散熱。For better cooling, referring to FIG. 1 , a cooling device 220 is provided above the outer surface of the insulating window 200 to cool down the insulating window 200 while also dissipating heat from the semiconductor refrigerator.

在絕緣窗上還設置有多個溫度感測器,以及控制單元(圖中並未示出),溫度感測器用於測量加熱裝置和區域溫控裝置附近的溫度,並將溫度數值返回給控制單元,控制單元根據預設的程式控制加熱裝置和區域溫控裝置,保證了絕緣窗溫度的均勻性;對於設置在區域溫控裝置附近的溫度感測器,也可以將這部分溫度感測器集成在半導體製冷器內,簡化裝置。There are also multiple temperature sensors on the insulating window, as well as a control unit (not shown in the figure), the temperature sensors are used to measure the temperature near the heating device and the zone temperature control device, and return the temperature value to the control unit Unit, the control unit controls the heating device and the area temperature control device according to the preset program, which ensures the uniformity of the temperature of the insulating window; for the temperature sensor installed near the area temperature control device, this part of the temperature sensor can also be Integrated in the semiconductor refrigerator, simplifying the installation.

本發明還公開了上文所述的具有溫度控制裝置的絕緣窗的溫度控制的方法,包括下列步驟:The present invention also discloses the method for controlling the temperature of the insulating window with the temperature control device described above, including the following steps:

(一)預熱步驟,在等離子體產生之前,分別控制加熱裝置和區域溫控裝置加熱。由於在等離子體產生之前,需要對絕緣窗進行預加熱,防止等離子體產生時溫度突然升高損壞絕緣窗,因此預熱步驟時需要將區域溫控裝置的半導體製冷器切換成加熱模式,然而區域溫控裝置的半導體製冷器的功率密度排布是沿著徑向向中心增加的,這和加熱裝置的功率密度排布需求相反,因此半導體製冷器在預熱步驟中僅部分製冷單元工作,工作的製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢。較佳的,在預熱步驟時,為了增加預熱的速度,半導體製冷器也可以全部工作。(1) In the preheating step, before the plasma is generated, the heating device and the regional temperature control device are respectively controlled to heat. Before the plasma is generated, the insulating window needs to be preheated to prevent the sudden rise in temperature from damaging the insulating window when the plasma is generated. Therefore, it is necessary to switch the semiconductor refrigerator of the regional temperature control device to the heating mode during the preheating step. The power density arrangement of the semiconductor refrigerator of the temperature control device increases radially toward the center, which is opposite to the power density arrangement requirement of the heating device, so only part of the cooling units of the semiconductor refrigerator work during the preheating step, and the working The refrigeration unit and the heating device together conform to the trend that the power density decreases radially toward the center. Preferably, in the preheating step, in order to increase the speed of preheating, all semiconductor refrigerators can also work.

如附圖3、9、10中示出,在預熱步驟時,製冷單元505僅部分工作,並切換為加熱模式,例如僅5個製冷單元505工作,從而保證工作的製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢,且工作的製冷單元505之間的周向間距是相同的,從而保證周向加熱的均勻性;如附圖5中示出,在預熱步驟時,第二半導體製冷器502全部工作或僅部分工作,第一半導體製冷器501僅部分工作或全部不工作,製冷單元工作與否與製冷單元的具體數量有關,製冷單元工作與否最終滿足製冷單元和加熱裝置共同符合功率密度沿著徑向向中心減小的趨勢。附圖中的製冷單元的數量僅僅是一個示意,並未具體限定製冷單元的個數。同理,附圖6-7中的第二半導體製冷器502全部工作或部分工作,第一半導體製冷器501部分工作或全部不工作,或者通過調節第一半導體製冷器501的電流來調節功率,從而滿足功率密度的分佈趨勢。圖8中的工作方式在上文已經具體描述,這裡不再熬述。當然,較佳的,在預熱步驟時,為了增加預熱的速度,半導體製冷器也可以全部工作。As shown in accompanying drawings 3, 9, and 10, during the preheating step, the refrigerating unit 505 only partially works and switches to heating mode, for example, only 5 refrigerating units 505 work, thereby ensuring that the working refrigerating unit and the heating device work together. Conform to the trend that the power density decreases radially toward the center, and the circumferential spacing between the working refrigeration units 505 is the same, thereby ensuring the uniformity of circumferential heating; as shown in Figure 5, during preheating In the first step, the second semiconductor refrigerator 502 is fully working or only partially working, and the first semiconductor refrigerator 501 is only partially working or not working at all. Whether the refrigeration unit works is related to the specific number of refrigeration units. The refrigeration unit and the heating device jointly conform to the trend that the power density decreases radially toward the center. The number of refrigerating units in the drawings is just a schematic, and the number of refrigerating units is not specifically limited. Similarly, the second semiconductor refrigerator 502 in the accompanying drawings 6-7 is fully or partially working, and the first semiconductor refrigerator 501 is partially or not working, or the power is adjusted by adjusting the current of the first semiconductor refrigerator 501, So as to meet the distribution trend of power density. The working mode in FIG. 8 has been described in detail above, and will not be repeated here. Of course, preferably, in the preheating step, in order to increase the speed of preheating, all semiconductor refrigerators can also work.

(二)控溫步驟,在等離子體產生時,分別控制加熱裝置加熱,區域溫控裝置降溫。在等離子體產生時,等離子體集中分佈在絕緣窗中心附近,造成內部區域溫度過高,通過區域溫控裝置可以快速冷卻絕緣窗的內部區域,實現溫度的均勻化。(2) In the temperature control step, when the plasma is generated, the heating device is respectively controlled to heat, and the regional temperature control device is cooled. When the plasma is generated, the plasma is concentrated and distributed near the center of the insulating window, causing the temperature of the inner area to be too high. The inner area of the insulating window can be quickly cooled through the area temperature control device to achieve uniform temperature.

儘管本發明的內容已經通過上述較佳實施例作了詳細介紹,但應當認識到上述的描述不應被認為是對本發明的限制。在本發明所屬技術領域中具有通常知識者閱讀了上述內容後,對於本發明的多種修改和替代都將是顯而易見的。因此,本發明的保護範圍應由所附的申請專利範圍來限定。Although the content of the present invention has been described in detail through the above preferred embodiments, it should be understood that the above description should not be considered as limiting the present invention. Various modifications and alterations to the present invention will become apparent to those having ordinary skill in the art to which the present invention pertains after reading the above disclosure. Therefore, the protection scope of the present invention should be limited by the scope of the appended patent application.

101:外壁 104:泵 105:進氣口 106:反應腔 107:製程氣體氣源 108:電感線圈 108A:管路 109:RF源 110:基座 111:基底 112:基片 200:絕緣窗 201:中心 202:氣體入口 210:溫度控制裝置 220:冷卻裝置 221:風扇元件 301:外部區域 302:空白區域 303:內部區域 400:加熱絲 401:短彎折部 402:長彎折部 403:介面 405,406’:第一加熱環 406,406’:第二加熱環 410:短彎折單元 411:短彎折單元的徑向邊 412:短彎折單元的外周向邊 413:短彎折單元的內周向邊 420:長彎折單元 421:長彎折單元的徑向邊 422:長彎折單元的外周向邊 423:長彎折單元的內周向邊 501:第一半導體製冷器 502:第二半導體製冷器 505:製冷單元 5051,5052:徑向製冷單元 101: outer wall 104: pump 105: air inlet 106: reaction chamber 107: Process gas source 108: Inductance coil 108A: pipeline 109: RF source 110: Base 111: base 112: Substrate 200: Insulated windows 201: center 202: Gas inlet 210: temperature control device 220: cooling device 221: Fan element 301: Outer area 302: blank area 303: Inner area 400: heating wire 401: short bending part 402: long bending part 403: interface 405, 406': first heating ring 406, 406': second heating ring 410: short bending unit 411: Radial edge of short bending element 412: The outer peripheral edge of the short bending unit 413: The inner peripheral edge of the short bending unit 420: long bending unit 421: Radial edge of long bending element 422: The outer peripheral edge of the long bending unit 423: The inner peripheral edge of the long bending unit 501: The first semiconductor refrigerator 502: The second semiconductor refrigerator 505: Refrigeration unit 5051, 5052: radial cooling unit

為了更清楚地說明本發明實施例或習知技術中的技術方案,下面將對實施例或習知技術描述中所需要使用的附圖作簡單地介紹,顯而易見地,下面描述中的附圖僅僅是本發明的一些實施例,對於本發明所屬技術領域中具有通常知識者來講,在不付出具進步性改變的前提下,還可以根據這些附圖獲得其他的附圖。 圖1示出一種電容耦合等離子體處理裝置的結構示意圖; 圖2示出一種絕緣窗結構俯視圖; 圖3示出一種具有溫度控制裝置絕緣窗的實施例; 圖4示出短彎折單元和長彎折單元的示意圖; 圖5示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖6示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖7示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖8示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖9示出一種具有溫度控制裝置絕緣窗的另一實施例; 圖10示出一種具有溫度控制裝置絕緣窗的另一實施例;以及 圖11示出加熱絲的排布示意圖。 In order to more clearly illustrate the technical solutions in the embodiments of the present invention or in the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those skilled in the art to which the present invention pertains, other drawings can also be obtained based on these drawings without making progressive changes. FIG. 1 shows a schematic structural view of a capacitively coupled plasma processing device; Figure 2 shows a top view of an insulating window structure; Fig. 3 shows a kind of embodiment with insulating window of temperature control device; Figure 4 shows a schematic diagram of a short bending unit and a long bending unit; Fig. 5 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 6 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 7 shows a kind of another embodiment that has insulating window of temperature control device; Fig. 8 shows a kind of another embodiment with insulating window of temperature control device; Fig. 9 shows a kind of another embodiment with insulating window of temperature control device; Figure 10 shows a further embodiment with an insulating window for temperature control means; and Figure 11 shows a schematic diagram of the arrangement of heating wires.

200:絕緣窗 200: Insulated windows

201:中心 201: center

202:氣體入口 202: Gas inlet

303:內部區域 303: Inner area

400:加熱絲 400: heating wire

401:短彎折部 401: short bending part

402:長彎折部 402: long bending part

403:介面 403: interface

405:第一加熱環 405: the first heating ring

501:第一半導體製冷器 501: The first semiconductor refrigerator

505:製冷單元 505: Refrigeration unit

Claims (16)

一種絕緣窗,其用於一等離子體處理裝置,其中包括: 一窗主體,該窗主體具有一內部區域和圍繞該內部區域的至少一部分的一外部區域;以及 一溫度控制裝置,其包括一加熱裝置和一區域溫控裝置; 該加熱裝置至少位於該窗主體的該外部區域; 該區域溫控裝置位於該窗主體的該內部區域,其中,該區域溫控裝置為一半導體製冷器,該半導體製冷器用於在等離子體產生之前對該窗主體加熱。 An insulating window for a plasma processing device, comprising: a window body having an inner region and an outer region surrounding at least a portion of the inner region; and A temperature control device, which includes a heating device and a zone temperature control device; the heating device is located at least in the outer region of the window body; The area temperature control device is located in the inner area of the window body, wherein the area temperature control device is a semiconductor refrigerator, and the semiconductor refrigerator is used to heat the window body before plasma is generated. 如請求項1所述的絕緣窗,其中:該半導體製冷器還用於在等離子體產生時對該窗主體冷卻。The insulating window as claimed in claim 1, wherein: the semiconductor refrigerator is also used for cooling the window body when plasma is generated. 如請求項2所述的絕緣窗,其中:該加熱裝置呈環形分佈且形成至少一個環,該半導體製冷器呈環形分佈且形成至少一個環;其中,該加熱裝置的功率密度沿著該窗主體的徑向方向由該外部區域向該內部區域減小,該區域溫控裝置的功率密度沿著該窗主體的徑向方向由該外部區域向該內部區域增加。The insulating window according to claim 2, wherein: the heating device is distributed in a ring and forms at least one ring, and the semiconductor refrigerator is distributed in a ring and forms at least one ring; wherein, the power density of the heating device is along the main body of the window The radial direction of the window body decreases from the outer region to the inner region, and the power density of the temperature control device in the region increases from the outer region to the inner region along the radial direction of the window body. 如請求項3所述的絕緣窗,其中:該半導體製冷器與該加熱裝置在該內部區域中沿著周向方向交替設置。The insulating window as claimed in claim 3, wherein: the peltier coolers and the heating device are arranged alternately along the circumferential direction in the inner region. 如請求項2所述的絕緣窗,其中:該加熱裝置為一加熱貼片,該加熱貼片中間夾設有一加熱絲;該加熱絲具有一短彎折部和一長彎折部,該短彎折部和該長彎折部在該窗主體的周向方向上交替設置並彼此相連形成的一第一加熱環;其中,該長彎折部沿著該窗主體的徑向向該內部區域延伸。The insulating window as described in claim 2, wherein: the heating device is a heating patch, and a heating wire is interposed in the middle of the heating patch; the heating wire has a short bending part and a long bending part, and the short The bent portion and the long bent portion are alternately arranged in the circumferential direction of the window main body and connected to each other to form a first heating ring; wherein, the long bent portion extends toward the inner region along the radial direction of the window main body extend. 如請求項5所述的絕緣窗,其中:該長彎折部沿著該窗主體的徑向向中心延伸的部分延伸至該內部區域的該窗主體的中心附近。The insulating window as claimed in claim 5, wherein: the long bent portion extends along the radially central portion of the window body to near the center of the window body in the inner region. 如請求項5所述的絕緣窗,其中:該短彎折部由至少一個短彎折單元構成,且該長彎折部由至少一個長彎折單元構成。The insulating window as claimed in claim 5, wherein: the short bending portion is formed by at least one short bending unit, and the long bending portion is formed by at least one long bending unit. 如請求項5所述的絕緣窗,其中:該加熱裝置還包括一第二加熱環,該第二加熱環與該第一加熱環相鄰,且位於第一加熱環靠近中心一側。The insulating window according to claim 5, wherein: the heating device further includes a second heating ring, the second heating ring is adjacent to the first heating ring, and is located on the side of the first heating ring close to the center. 如請求項8所述的絕緣窗,其中:該第二加熱環為中間夾設有一加熱絲的一加熱貼片,該加熱絲具有一短彎折部和一長彎折部,該短彎折部和該長彎折部在該窗主體的周向方向上交替設置並彼此相連形成的該第二加熱環;其中,該長彎折部沿著該窗主體的徑向向該內部區域延伸。The insulating window as claimed in claim 8, wherein: the second heating ring is a heating patch with a heating wire interposed therebetween, and the heating wire has a short bend and a long bend, and the short bend The second heating ring is formed by alternating portions and the long bent portions in the circumferential direction of the window main body and connected to each other; wherein, the long bent portions extend toward the inner region along the radial direction of the window main body. 如請求項5所述的絕緣窗,其中:該半導體製冷器包括一第一半導體製冷器,該第一半導體製冷器包括多個製冷單元,該製冷單元為方形、扇形或環形,該製冷單元形成的該第一環形。The insulating window as described in claim 5, wherein: the semiconductor refrigerator includes a first semiconductor refrigerator, and the first semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square, fan-shaped or ring-shaped, and the refrigeration units form of the first ring. 如請求項5、6、8或9任一所述的絕緣窗,其中:所述半導體製冷器包括一第一半導體製冷器,該第一半導體製冷器包括多個製冷單元,該製冷單元為方形或扇形,該製冷單元形成的該第一環形,該製冷單元和該長彎折部的向該內部區域延伸的部分交替設置。The insulating window as described in any one of claims 5, 6, 8 or 9, wherein: the semiconductor refrigerator includes a first semiconductor refrigerator, and the first semiconductor refrigerator includes a plurality of refrigeration units, and the refrigeration units are square Or fan-shaped, the refrigeration unit forms the first ring shape, and the refrigeration unit and the part of the long bent part extending toward the inner area are arranged alternately. 如請求項11所述的絕緣窗,其中:該半導體製冷器還包括一第二半導體製冷器,該第二半導體製冷器包括多個製冷單元,該製冷單元為方形或扇形,該多個製冷單元形成的一第二環形,該第二環形與該第一環形相鄰,且位於該第一環形遠離中心一側;且該第二半導體製冷器的功率密度小於該第一半導體製冷器的功率密度。The insulating window as described in claim 11, wherein: the semiconductor refrigerator further includes a second semiconductor refrigerator, and the second semiconductor refrigerator includes a plurality of refrigeration units, the refrigeration units are square or fan-shaped, and the plurality of refrigeration units A second ring is formed, the second ring is adjacent to the first ring and is located on the side away from the center of the first ring; and the power density of the second semiconductor refrigerator is smaller than that of the first semiconductor refrigerator power density. 如請求項2所述的絕緣窗,其中:該溫度控制裝置還包括一冷卻裝置,該冷卻裝置為多個風扇元件;其中,該冷卻裝置設置在該絕緣窗的外表面相對側。The insulating window according to claim 2, wherein: the temperature control device further includes a cooling device, and the cooling device is a plurality of fan elements; wherein, the cooling device is arranged on the opposite side of the outer surface of the insulating window. 如請求項5或9所述的絕緣窗,其中:所該加熱絲為單根或可以分開獨立控制的多根。The insulating window as claimed in claim 5 or 9, wherein: the heating wire is single or multiple that can be separately and independently controlled. 一種等離子體處理裝置,包括一反應腔和如請求項1-14所述的一絕緣窗,該絕緣窗設置在該反應腔的上部。A plasma processing device, comprising a reaction chamber and an insulating window according to claims 1-14, the insulating window is arranged on the upper part of the reaction chamber. 如請求項1-14所述的絕緣窗的溫度控制的方法,其中包括下列步驟: 一預熱步驟,在等離子體產生之前,分別控制該加熱裝置和該區域溫控裝置加熱;以及 一控溫步驟,在等離子體產生時,分別控制該加熱裝置加熱,該區域溫控裝置降溫。 The method for temperature control of an insulating window as described in claim item 1-14, which includes the following steps: A preheating step, before the plasma is generated, respectively controlling the heating device and the zone temperature control device to heat; and In a temperature control step, when the plasma is generated, the heating device is respectively controlled to heat, and the temperature control device in this area is cooled.
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