TW202219512A - Autosampler system with automated sample container cover removal and sample probe positioning - Google Patents

Abstract

Systems and methods are described for integrated sample container cover removal and sample probe positioning. In an example implementation, an autosampler system includes, but is not limited to, a z-axis support rotatable about a z-axis of an autosampler deck; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe to withdraw a fluid-containing sample held within a sample container supported by the autosampler deck; and a sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support with respect to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure.

Description

Autosampler system with automatic sample container cap removal and sample probe positioning

In many laboratory settings, it is often necessary to analyze a large number of chemical or biochemical samples located in individual sample containers. To streamline these procedures, the manipulation of the samples has been mechanized. This mechanized injection is often referred to as automatic injection and is performed using an autosampler or autosampler.

Cross-references to related applications This application is a continuation-in-part of U.S. Application No. 17/208,136 filed on March 22, 2021 under 35 U.S.C. § 120 and entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION", followed by the U.S. application No. 17/208,136 asserts rights under 35 U.S.C. § 119(e) in U.S. Provisional Application No. 62/992,334, filed on March 20, 2020, and entitled "AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPLING FOR LINEAR MOTION," and This application also claims rights under 35 U.S.C. § 119(e) in U.S. Provisional Application No. 63/057,441, filed July 28, 2020, and entitled "AUTOSAMPLER SYSTEM WITH AUTOMATED SAMPLE CONTAINER COVER REMOVAL AND SAMPLE PROBE POSITIONING" . US Provisional Application Nos. 62/992,334 and 63/057,441 and US Application No. 17/208,136 are each incorporated herein by reference in their entirety. Overview

An autosampler or autosampler may support a sample probe relative to a vertically oriented rod that moves the sample probe in or across one or more directions of movement. For example, the sample probe may be coupled by a probe support arm or other means to a vertically movable portion of the rod to move the probe in a vertical direction, such as to position the probe to a sample vessel on a panel of an autosampler ( Sample vessels (eg, tubes or other vessels), e.g., tubes or other containers), rinse vessels, standard chemical vessels, diluent vessels, and the like, and sample vessels (eg, tubes or other vessels) that position the probe on one of the panels of the autosampler, Except for rinsing utensils, standard chemical utensils, diluent utensils and the like. In other scenarios, the rod can be rotated to facilitate movement of the probe about a horizontal plane, such as positioning the probe over other sample vessels and other vessels positioned on the panel.

Autosamplers are used to automate the handling of multiple samples stored in sample containers, such as sample vials, sample tubes, microtiter plates, or the like. The sample containers can be supported by a sample rack on one of the panels of the autosampler so that various sample containers can be used for sample probes when the system is programmed to introduce sample probes into the containers. Autosamplers may include metallic mechanical or structural portions that move relative to each other to facilitate movement of one or more of the probes. As the part begins to wear (eg, through repeated friction-based interactions), metal particles can be released onto the faceplate of the autosampler and into the vessel positioned around the probe arm. For example, metal particles can be deposited directly into sample vessels, onto probes, or into other vessels used in sample preparation procedures (eg, rinse vessels, standard chemical vessels, diluent vessels, etc.), thereby removing contaminants Introduced to samples or other fluids. These contaminants can be detected by analytical instruments and can skew analytical measurements of samples and other fluids by providing unreliable or otherwise inaccurate data. In addition, metal mechanical or structural parts can be exposed to harmful chemicals such as corrosive acids present on the autosampler faceplate, which can accelerate the release of metal particles through the normal operation of the autosampler.

Hanging of a sample waiting to be disposed of by the autosampler can lead to potentially negative consequences such as loss of sample, contamination hazards, or other risks to accuracy. The period of time that a given sample is held within a sample container generally depends on the duration required for a sample handling system to analyze all samples that are scheduled to be analyzed before a given sample. If the sample container is open to the surrounding environment (eg, with an open top), a given sample can be negatively affected during the period awaiting analysis. For example, parts of the sample can evaporate or otherwise be lost to the surrounding environment, contaminants can be introduced into the sample container through open areas of the sample container, and parts of different samples can chemically react to cause deposits to form on parts of the system or in other sample containers , or another result that would adversely affect the accuracy of the compositional analysis of the sample. The effects of evaporation can particularly affect small volume samples, where even small losses of solvent or other liquid fractions can result in wide variations in analytical accuracy.

Accordingly, systems and methods are disclosed for handling samples held in closed sample containers by automatically removing sample container caps and positioning a sample probe. In one aspect, an autosampler system includes an automatic sample cap remover and a probe support arm, the autosampler system configured to position the sample cap remover on a sample cap And the sample cap is temporarily or permanently removed from the sample container and a sample probe held by the probe support arm is positioned into the sample container to withdraw a fluid-containing sample. The sample cap remover may be supported by a z-axis support that translates along a channel in the faceplate of the autosampler, providing movement along the z-axis and rotational movement along the x-y plane. In an implementation, the z-axis support is coupled to each of the sample cap remover and the probe support arm. For example, the sample cap remover may be rotationally offset from the probe support arm in the x-y plane such that the sample cap is not perpendicular to the sample probe when the sample cap remover is supporting a sample cap removed from a sample container The axes intersect (eg, do not interfere with insertion of the sample probe into the sample container). Other configurations are contemplated, such as substantially vertical alignment of the sample cap remover and sample probe.

Also disclosed are systems and methods for preventing release from an autosampler of metal particles that would otherwise be detected within a sample during sample analysis. In one aspect, a system includes an inner shuttle magnetically coupled to an outer shuttle configured to support a sample probe. The inner shuttle is encapsulated within a tube formed or covered by a chemically inert material (eg, fluoropolymer) and the outer shuttle is formed or covered by a chemically inert material (eg, fluoropolymer) so that no metal features are automatically fed. Exposure to the external environment during operation of the sampler. The inner shuttle moves within the tube and the movement is translated via magnetic coupling to the outer shuttle, which in turn translates to the probe support structure. In embodiments, the tube defines surface features (eg, splines) on an outer surface of the tube, and the outer shuttle has corresponding features on an inner surface. The surface features of the tube and the outer shuttle interact to translate the rotational motion of the tube to the outer shuttle, which in turn translates to the probe support structure. The autosampler facilitates multiple planes of motion of the sample probe without the risk of exposing metal particles to sample vessels or other containers positioned on the faceplate of the autosampler.

In one aspect, an autosampler system includes (but is not limited to): a z-axis support rotatable about a z-axis of an autosampler faceplate; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for withdrawing a fluid-containing sample held within a sample container supported by the autosampler panel; and a sample cap A remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support relative to the sample probe support structure, the sample cap remover configured to lift a cap from the sample container to provide access to an interior of one of the sample containers by the sample probe supported by the sample probe support structure.

In one aspect, an autosampler system includes (but is not limited to): a z-axis support rotatable about a z-axis of an autosampler faceplate; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for extraction of a fluid-containing sample held within a sample container supported by the autosampler panel; and a sample cap removed a device coupled to the z-axis support, the sample cap remover including a clamp portion configured to interface with an outer surface of the z-axis support, configured to cover at least a portion of the clamp portion a cover portion of the The device is configured to lift a cap from the sample container to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure. Exemplary Embodiment

1A-8, there is shown an autosampler probe for preventing metal particles that would otherwise be detected within a sample from being released from an autosampler during sample analysis, according to an exemplary embodiment of the present invention. Needle Track System ("System 100"). The system 100 generally includes a probe support arm 102 , an outer shuttle 104 , an inner shuttle 106 , and a z-axis support 108 . The probe support arm 102, the outer shuttle 104, and the z-axis support each include structures formed or covered with a chemically inert material to prevent exposure of the metal components to the external environment of the system 100, such as to prevent the introduction of ingress contaminants adjacent to the automatic feeder. sample vessel or other fluid container. For example, chemically inert materials may include, but are not limited to, fluoropolymers such as polytetrafluoroethylene (PTFE).

The probe support arm 102 includes a probe support 110 that holds a sample probe and is used to aspirate fluid from a sample vessel positioned adjacent to the system 100, such as on a panel of an autosampler system, or The fluid is introduced into the associated conduit in the sample vessel. The probe support arm 102 is coupled to the outer shuttle 104 (eg, via a friction fit interlock, via a snap coupling, or the like), with each of the probe support arm 102 and the outer shuttle 104 defining one of the z-axis supports 108 The upper portion 112 fits therein to couple the probe support arm 102 and the outer shuttle 104 to the aperture of the z-axis support 108 . For example, upper portion 112 of z-axis support 108 includes a generally circular shape that corresponds to a generally circular opening in each of probe support arm 102 and outer shuttle 104 . Although a generally circular shape is shown, other shapes including, but not limited to, rectangular shapes, triangular shapes, irregular shapes, and the like, may be used with the system 100 . The probe support arm 102 can be held in place relative to the z-axis support 108 by friction fit between the respective structures and by magnetic coupling between the outer shuttle 104 and the inner shuttle 106 positioned within the z-axis support. In an embodiment, the probe support arm 102 and the outer shuttle 104, or portions thereof, may be formed as a unitary structure.

System 100 controls the positioning of a sample probe held by probe support arm 102 through controlled positioning of outer shuttle 104 and rotation of z-axis support 108 . For example, FIG. 1B shows outer shuttle 104 moving along z-axis support 108 (eg, along z-axis 114 ), which in turn moves probe support arm 102 via interaction between outer shuttle 104 and inner shuttle 106 . FIG. 1C shows the probe support arm 102 rotationally moved through rotation of the z-axis support 108, as further described herein.

Referring to FIG. 2, a cross-section of a system 100 according to an example embodiment of the present invention is shown. The z-axis support 108 is shown with an outer tube 200 defining an inner volume 202 through which the inner shuttle 106 is configured to affect vertical movement of the outer shuttle 104 . The system 100 can operate the inner shuttle 106 through various mechanisms including, but not limited to, a linear actuator having a push rod (eg, a pneumatic actuator), a splined helical track, or a combination thereof. move inside the tube 200. The system 100 is shown in the exemplary embodiment as having a splined helical track 204 (eg, as seen in FIGS. 2-5 ). The splined helical track 204 includes a threaded screw 206 positioned along the z-axis 114 , with a structural track 208 positioned around a portion of the screw 206 . Structural rails 208 are fixedly mounted to a base, and screws 206 are rotatably coupled within tube 200 . For example, the system 100 may include a first driver (eg, a pulley driver 500 shown in FIG. 5 ) for inducing rotational movement of the screw 206 within the tube 200 . The inner shuttle 106 includes corresponding threads on an inner surface of the inner shuttle 106 to mate with the threads of the screw 206 . As the drive screw 206 is rotated, the inner shuttle 106 moves vertically within the tube 200 (eg, through the interior volume 202 ) along the z-axis 114 via the interaction between the respective threads. Alternatively or additionally, the system 100 includes a pneumatic actuator for urging the inner shuttle 106 vertically within the interior volume 202 . In an embodiment, the inner shuttle 106 defines one or more apertures corresponding to the shape of the structural rail 208 such that the structural rail 208 passes through the aperture(s) of the inner shuttle 106 as the inner shuttle 106 moves within the tube 200 . For example, the inner shuttle 106 is shown in one exemplary embodiment of FIG. 3 as having a "C" shaped aperture that is the same shape as the "C" shaped structural track 208 .

The outer shuttle 104 and the inner shuttle 106 each include one or more magnets for magnetically coupling the respective shuttles such that when the inner shuttle 106 is driven along the z-axis 114 (eg, via the operation of the splined spiral track 204 and the first driver, via The operation of a pneumatic actuator, etc.), the outer shuttle 104 follows a corresponding vertical movement along one of the outer surfaces of the z-axis support member 108 . For example, the inner shuttle 106 is shown with two magnets 210 positioned within an outer structure 212 of the inner shuttle 106 . The outer structure 212 may include, but is not limited to, a polyvinylidene fluoride (PVDF) material surrounding a body structure 214 of the inner shuttle 106 . In an embodiment, the body structure 214 defines corresponding threads that mate with the threads of the screw 206 . The magnet 210 is shown as having a circular or annular shape with an aperture through which the structure of the splined spiral track 204 can pass in the middle. For example, the magnet 210 surrounds the z-axis 114 and the splined helical track 204 passes through the aperture of the magnet 210 . The inner shuttle 106 is shown with a spacer structure 216 positioned between the magnets 210 . The outer structure 212 and the body structure 214 can push each magnet 210 against the spacer structure 216 to control the separation between the magnets 210 to maintain a substantially uniform distance between the magnets 210, such as during operation of the system 100. The magnets 210 are aligned such that the same poles face each other (eg, the same poles interface with the spacer structure 216). For example, FIG. 2 shows the north poles of each magnet 210 facing each other, with the spacer structures 216 positioned in between the north poles of each magnet 210 and the south poles oriented away from each other. Alternatively, the south poles of the magnets 210 may face each other and the north poles oriented away from each other.

The outer shuttle 104 includes a corresponding magnet that interacts with the magnet 210 of the inner shuttle 106 . For example, the outer shuttle 104 is shown with two corresponding magnets 218 retained within a body structure 220 . Similar to the inner shuttle 106 , the outer shuttle 104 may include a spacer structure 222 positioned between the magnets 218 within the body structure 220 . In implementations, the body structure 220 includes a top portion 224 coupled to a bottom portion 226 , and a cavity is defined between the top portion 224 and the bottom portion 226 to receive the magnets 218 and the spacer structure 222 . Top portion 224 and bottom portion 226 may be secured together (eg, snap fit) to position magnet 218 against spacer structure 222 . The magnets 218 are aligned such that the same poles face each other, and the poles of the magnets 218 have opposite poles facing the poles of the adjacent magnets 210 of the inner shuttle 106 . 2, the north pole of magnet 218 faces the south pole of magnet 210 (eg, with tube 200 positioned between the north pole of magnet 218 and the south pole of magnet 210), and the south pole of magnet 218 faces the north pole of magnet 210 (eg , with tube 200 positioned between the south pole of magnet 218 and the north pole of magnet 210). By facing opposite poles of magnet 210 and magnet 218, the magnetic field couples inner shuttle 106 to outer shuttle 104 such that linear motion of inner shuttle 106 causes a corresponding linear motion of one of outer shuttles 104. Although the system 100 is shown as having two magnets for each of the outer shuttle 104 and the inner shuttle 106, the system 100 is not limited to two magnets and may include fewer or more magnets for each shuttle (eg, depending on the respective a major attraction between shuttles).

In an embodiment, the tube 200 defines surface features on an outer surface of the tube 200 to facilitate rotational movement of the outer shuttle 104 as the tube 200 rotates. For example, the tube 200 is shown as having a plurality of splines 300 oriented longitudinally along the outer surface of the tube 200 . The outer shuttle 104 includes corresponding features on an inner surface for interfacing with surface features of the tube 200 . For example, the outer shuttle 104 is shown having corresponding splines 302 with a clearance fit between the splines 300 of the tube 200 . Surface features of the tube 200 and the outer shuttle 104 interact to translate the rotational motion of the tube 200 to the outer shuttle 104 and then to the probe support structure 102 to rotate the probe support structure 102 about the z-axis 114 . In an embodiment, the tube 200 is rotated to induce rotational motion of the tube 200 by the operation of a second driver (eg, a pulley driver 502 shown in FIG. 5 ). For example, system 100 may include a bushing 504 coupled between a stationary driver base 506 and a rotary driver structure 508 . The rotational drive structure 508 is coupled to the pulley drive 502 for rotation about the z-axis 114 following operation of the pulley drive 502 . Tube 200 is coupled to rotary drive structure 508 to rotate correspondingly following operation of pulley drive 502, which in turn rotates outer shuttle 104 to rotate probe support structure through the interaction of corresponding surface features (eg, splines 300 and 302) 102.

The outer shuttle 104 can be mounted on the z-axis support 108 by positioning the body structure 220 adjacent to the upper portion 112 of the z-axis support 108, and one end 228 of the body structure 220 housing the magnets 218 is positioned to correspond to At one end 230 of the body structure 214 housing the magnet 210, the interaction between the respective magnetic fields of the inner shuttle 106 and the outer shuttle 104 is allowed to magnetically couple the respective shuttles. Surface features of outer shuttle 104 and tube 200 (eg, splines 302 and 300 , respectively) can slide next to each other as outer shuttle 104 is positioned down z-axis support 108 until magnet 218 is coupled with magnet 210 . In an embodiment, the system 100 includes a key structure for orienting the probe support structure 102 in a predetermined direction after being mounted on the z-axis support 108 to, for example, provide a probe held by the probe support structure 102 A specific position of the needle is used for indexing purposes through the rotation of the tube 200 . For example, FIG. 6 shows that the tube 200 defines a key structure 600 (eg, a spline having a larger cross-section than the other splines 300 ), and the outer shuttle 104 defines a corresponding key structure 602 (eg, for receiving the key structure 600 ) one of the pores). The probe support structure 102 and the outer shuttle 104 also include corresponding key structures to provide a desired orientation of the probe support structure 102 relative to one of the tubes 200 . For example, the outer shuttle 104 is shown including a key structure 604, and the probe support structure 102 includes a corresponding key structure 606 (eg, an aperture for receiving the key structure 604). In an embodiment, the probe support structure 102 is removably coupled to the outer shuttle 104 such that a different probe support structure 102 can be coupled to the outer shuttle 104 . Alternatively or additionally, a different outer shuttle may be positioned on the z-axis support 108 to introduce a different style of probe support structure onto the z-axis support (eg, to facilitate a septum piercing probe or the like) .

Referring now to FIGS. 9-12D, there is shown a system 100 having an example configuration for positioning a sample probe by automatically removing sample container caps and following cap removal, cap repositioning, or cap reconfiguration The sample held in the closed sample container is disposed of by removing the sample from the sample container. System 100 generally includes a z-axis support 900 , a probe support arm 902 , and a sample cap remover 904 . The system 100 coordinates the movement of each of the z-axis support 900, the sample cap remover 904, and a sample probe 906 held by the probe support arm 902 to position the sample cap remover 904 in a position with a cap or A sample is enclosed in one of the other structures within the sample container on a designated sample container (eg, positioned on a panel 908 of the system 100), the cap is removed or otherwise modified to allow access by the sample probe, the sample probe is removed Introduce inside one of the sample containers to remove a sample, optionally put the cap back on the sample container and reposition the sample cap remover 904 to the other sample container to repeat the cap removal/sample removal procedure. For example, the sample cap remover 904 may include, but is not limited to, a vacuum clamp for removing the cap using vacuum pressure, a rotating gripping structure (eg, for rotating a cap around the container thread(s)), A rotational positioning structure (eg, for repositioning a cap away from a z-axis), an interdigital or tweezers structure (eg, for a friction fit around an exterior of the cap) or the like or a combination thereof. An example procedure for removing and repositioning a sample cap to access the interior of the sample vessel by the sample probe 906 is further described herein with respect to FIGS. 12A-12D. In an embodiment, z-axis support 900 and probe support arm 902 correspond to z-axis support 108 and probe support arm 102 (eg, to facilitate prevention of metal particle contamination), however, the invention is not so limited etc., in which the system 100 may include other configurations and compositions of the z-axis support 900 and the probe support arm 902.

Probe support arm 902 and sample cap remover 904 are shown in FIGS. 9 and 10A as being supported by the same z-axis support 900, which is translatable across autosampler panel 908 through a channel 910 and Rotation about the z-axis is via motor operation. In an implementation, the probe support arm 902 and the sample cap remover 904 are positioned in one or more non-parallel orientations, and the probe support arm 902 and the sample cap remover 904 are rotationally offset from each other. For example, the probe support arm 902 and the sample cap remover 904 may be displaced from each other by an angle (shown as a in Figure 10A) along the x-y plane. The angle can be selected based on the size of the cap removed by the sample cap remover 904 such that, for example, when the cap is removed from the sample container, the z-axis support 900 rotates about the z-axis to displace the cap along the x-y plane and move the cap along the x-y plane. The sample probe 906 is positioned on the open end of the sample container, and the cap is positioned so as not to intersect the vertical axis of the sample probe (eg, not to interfere with insertion of the sample probe into the sample container). In an embodiment, the angle from the z-axis across the x-y plane may be from about 5 degrees to about 90 degrees. For example, the angle from the z-axis across the x-y plane may be from about 10 degrees to about 35 degrees. A smaller angle may reduce the amount of time the system 100 takes to process a given sample, such as by requiring smaller movements for positioning the probe support arm 902 and the sample cap remover 904.

As an alternative or in addition to a single z-axis support, probe support arm 902 and sample cap remover 904 may be supported on separate z-axis supports 900 . For example, referring to FIG. 10B , probe support arm 902 is shown supported by a first z-axis support 900A and sample cap remover 904 is shown supported by a second z-axis support 900B to facilitate support on panel 908 A cap of the sample on the first portion 1000 is removed. The first z-axis support 900A translates across a first channel 910A and rotates about the z-axis of the first z-axis support 900A to position a sample probe on a sample container held on the first portion 1000 of the panel 908, While the second z-axis support 900B translates across a second channel 910B and rotates about the z-axis of the second z-axis support 900B to position the sample cap remover 904B on the sample held on the first portion 1000 of the panel 908 on the container. Also shown is a third z-axis support 900C, which provides another sample cap remover 904C to facilitate cap removal of samples supported on a second portion 1002 of panel 908, translated across a third channel 910C Movement and rotation about the z-axis of the third z-axis support 900C positions the sample cap remover 904C on the sample container held on the second position 1002 of the panel 908 . In an embodiment, the second z-axis support 900B can fully rotate the probe support arm 902 about the z-axis to provide access by the sample probe 906 whose caps have been removed by the sample cap removers 904B and 904C or the system 100 Part of the sample vessel removed.

Referring to FIG. 11 , the sample cap remover 904 is shown in an exemplary embodiment as including a vacuum clamp structure 1100 supported by a cap remover support arm 1102 that fixes the vacuum clamp structure 1100 relative to the z-axis support 900 . The sample cap remover 904 can include a clamp portion 1104 that provides a friction fit around an outer surface of the z-axis support 900 (eg, via a clamp fastener 1106 ) to resist the clamp portion 1104 at the z-axis support Vertical or rotational movement of the support 900 on or around the z-axis. The z-axis support 900 is translated about the z-axis and rotational movement and translational movement along the channel 910 to the clamp portion 1104 via the connection between the clamp portion 1104 and the z-axis support 900 . The sample cap remover 904 may also include a cover portion 1106 configured to cover at least a portion of the clamp portion 1104 (eg, to prevent exposure of the clamp portion 1104 to an environment outside of the system 100). A cap remover support arm 1102 extends from the cover portion 1108 to position the vacuum jaw structure 1100 substantially away from the clamp portion 1104 when the cover portion 1108 is positioned on the clamp portion 1104 . In an embodiment, the cover portion 1108 rests on the clamp portion 1104 (eg, a top of the cover portion 1108 can interface with a top of the clamp portion 1104 ) while allowing the cover portion 1108 to move vertically relative to the clamp portion 1104 to ( For example, vertical displacement of the caps from their respective sample vessels is facilitated during operation of the vacuum clamp structure 1100 described herein.

The sample cap remover 904 may define a fluid conduit through which to introduce vacuum pressure, fluid pressure, or a combination thereof (eg, which may originate from the system 100 or external to the system) to one of the portions of the sample cap remover 904 or multiple spaces. In an embodiment, the sample cap remover 904 defines a channel 1110 through which the cap remover support arm 1102 holds a vacuum line for coupling with a vacuum clamp port 1112 of the vacuum clamp structure 1100 for removal through the sample cap Eliminator 904 supplies a vacuum to vacuum clamp structure 1100 . Next, the vacuum clamp structure 1100 can be attached to the sample vessel with a cap, such as by removing a cap by introducing a vacuum into the vacuum clamp port 1112 and replacing a cap by stopping the application of vacuum to the vacuum clamp port 1112. cap interaction. In an embodiment, the sample cap remover 904 defines a channel 1114 between the clamp portion 1104 and the cap portion 1108 in communication with the channel 1110 to supply the vacuum line through the sample cap remover 904 through the channels 1114 and 1110 to the Vacuum clamp structure 1100. Alternatively or additionally, the sample cap remover 904 may hold a vacuum line, a fluid line, or a combination thereof within a different portion of the body of the sample cap remover 904, on a surface of the sample cap remover, or combination thereof.

In an embodiment, the sample cap remover 904 defines a space for introducing one or more fluid lines that introduce pressurized fluid into the sample cap remover 904 to hold the cap portion 1108 relative to the clamp Portion 1104 is displaced vertically to facilitate removal and replacement of the cap on the sample vessel. For example, the sample cap remover 904 can define a channel 1116 (eg, by or by the clamp portion 1104) that introduces a fluid line through the sample cap remover 904 to a fluid line coupled to the sample cap remover A piston port 1118 within a piston (eg, received via one or more of cover portion 1108 or clamp portion 1104 ) within 904 . In embodiments, the sample cap remover 904 maintains a raised position to position the vacuum clamp structure 1100 lifted above a cap on a sample vessel (eg, to prevent initial contact between the cap and the clamp structure 1100 ) until the sample cap remover 904 is lowered). The piston may push the cover portion 1108 vertically downward relative to the clamp portion 1104 to a lowered position after air is applied to the piston port 1118 to lower the vacuum clamp structure 1100 into contact with the cap. When no or insufficient fluid pressure is applied to the piston port 1118 (such as when a single-acting piston is included in the sample cap remover 904), a spring may bias the piston to the raised position. Alternatively, the piston may include a spring for biasing the piston in the lowered position and fluid pressure pushes the piston after air is applied to the piston port 1118 to cause the cover portion 1108 to lift to the raised position. In an embodiment, a double-acting piston can be used to bias the rest position of the sample cap remover via fluid pressure.

Vertical displacement of lid portion 1108 relative to clamp portion 1104 can provide a distance to lift the cap from the sample vessel, and due to rotation of sample cap remover 904 about the z-axis (eg, via rotational movement of z-axis support 900 ), ( Such as) during movement of the cap away from the sample vessel, there is no interference between the cap and the sample vessel to provide for the sample probe 906 to access the sample vessel. In an embodiment, the vertical distance that provides the cap lift off the sample vessel is from about 5 mm to about 40 mm, however, the system 100 is not limited to such distances and may include vertical distances less than about 5 mm or greater than about 40 mm . Additionally, although system 100 is described as including a pneumatic piston that provides vertical displacement, system 100 is not limited to this configuration and may include additional or alternative configurations for introducing vertical movement of sample cap remover 904 including (but not limited to) ) magnetically coupled to a shuttle, a mechanical pusher, a linear drive, a magnetic coupling, a controlled electromagnetic coupling, or the like within the z-axis support 900 of the sample cap remover 904.

Referring to Figures 12A-12D, an example operation of a system 100 is shown having a probe support arm 902 and a sample cap remover 904 secured to a single z-axis support 900 and having a system including a pneumatic vacuum clamp structure Sample cap remover 904. System 100 is shown with a plurality of sample containers, which have their interior volumes closed by caps positioned over openings at the tops of the sample containers. The cap can be multifunctional while the sample is waiting to be disposed of by the system. For example, the cap may prevent sample contamination by preventing the introduction of chemicals or objects from the environment through an opening in the sample container, such as when manipulating the probe from container to container, for example. Additionally, the cap can prevent evaporation of one or more sample components, such as a solvent, sample matrix, or other components. In addition, the cap prevents one portion of one sample from interacting (eg, chemically) with another portion of another sample. For example, the cover can prevent vapors from one container (eg, holding ammonium hydroxide) from interacting and chemically reacting with vapors from another container (eg, holding hydrofluoric acid) to form solid deposits that can cover portions of system 100 (eg, ammonium fluoride crystals). In the example shown, the cap is held on the sample container by weight only, however, in embodiments, the cap may be held in place via one or more of threads, clips, spacers, or other structure(s).

In Figure 12A, the system 100 positions the sample cap remover 904 on a first sample container 1200 having a first cap 1202 positioned on top of a first sample container 1200 for isolation retention from the first sample A fluid sample within the present container 1200 and the external environment 1204. The sample cap remover 904 then removes the first cap 1202 from the top of the first sample container 1200 by vertically lifting the first cap 1202 along the z-axis (eg, by pneumatic actuation of the sample cap remover 904), As shown in Figure 12B. For example, the system 100 can introduce a vacuum into the vacuum clamp port 1112, introduce the end of the vacuum clamp structure 1100 into the cap and introduce fluid into the piston port 1118 to grasp and lift the cap from the top of the sample container.

When the first cap 1202 is held by the sample cap remover 904, the sample cap remover 904 is then rotated in the x-y plane to reposition the first cap 1202, as shown in Figure 12C. For example, when holding the first cap 1202, the z-axis support 900 is rotated about the z-axis to reposition the end of the sample cap remover 904 to move the first cap 1202 away from the first sample container 1200 to allow access by the sample probe 906 Access. In implementations in which the probe support arm 902 and the sample cap remover 904 are secured to a single z-axis support 900, rotational movement of the z-axis support 900 can simultaneously move the probe support arm 902 and the sample cap along the x-y plane Each of the removers 904. For example, when the first cap 1202 is removed from the first sample container 1200, the z-axis support 900 may position the end of the probe support arm 902 on the open container in preparation for introduction of the sample probe 906 into the fluid sample to in the first sample container 1200.

During rotation of the z-axis support 900 to position the sample probe 906, displacement of the sample cap remover 904 relative to the probe support arms 902 causes the sample cap remover 904 to move away from the first sample container 1200 to allow for The sample probe 906 is accessed unobstructed for sample removal. For example, as shown in FIG. 12C , the sample cap remover 904 is positioned away from the first sample container 1200 and the probe support arm moves vertically along the z-axis support 900 to introduce the sample probe 906 into the first sample container 1200 middle. The sample probe 906 then draws a sample from the first sample container 1200 (eg, via a vacuum on the sample probe 906 such as through a pump or other vacuum source) and is removed from the first sample container 1200 (eg, via vertical movement of the probe support arm 902). The system 100 may optionally place the first cap 1202 back into the first sample container 1200 (or a sample cap storage position), as appropriate, such as by rotation of the z-axis support 900 and disengagement of the vacuum on the sample cap remover 904 ). The system 100 then positions the sample cap remover 904 on a second sample container 1210 to repeat the process for another sample, as shown in Figure 12D. In an embodiment, the system 100 can include a sample rack 1212 that lifts a base of a sample container to a certain height above the panel 908 (such as for short or small volume sample containers) to provide (eg, via a scanning device) Access to a bottom side of the sample container or the like, or otherwise hold the sample container in place on the panel 908 .

In embodiments, the sample cap remover 904 may be replaced by another structure for accessing the interior of the sample container, combined with another structure for accessing the interior of the sample container, or within the interior of the sample container provided outside of another structure. For example, system 100 may include a sample tip that includes a conduit or other fluid handling structure to induce a chemical at a particular time, such as configured to induce a known time prior to analyzing the sample, with one of the samples A chemical reaction (a chemical species) is introduced into a sample. in conclusion

Although the subject matter has been described in language specific to structural features and/or program operations, it is to be understood that the subject matter defined in the scope of the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claimed scope.

100: Autosampler Probe Track System 102: Probe support arm/probe support structure 104: Outer shuttle 106: Internal shuttle 108: z-axis support 110: Probe support 112: Upper part 114: z-axis 200: External Tube 202: Internal volume 204: Spline spiral track 206: Screws 208: Structural Track 210: Magnet 212: External Structure 214: Ontology structure 216: Spacer structure 218: Magnet 220: Ontology Structure 222: Spacer structure 224: Top Section 226: Bottom part 228: End 230: End 300: Spline 302: Spline 500: Pulley Drive 502: Pulley Drive 504: Bushing 506: Stationary Driver Base 508: Rotary drive structure 600: Key Structure 602:Key structure 604:Key structure 606:Key structure 900: z-axis support 900A: First z-axis support 900B:D Second z-axis support 900C: Third z-axis support 902: Probe Support Arm 904: Specimen Cap Remover 904C: Specimen Cap Remover 906: Sample Probe 908: Panel 910: Channel 910A: first channel 910B: Second channel 910C: Third channel 1100: Vacuum clamp structure 1102: Cap Remover Support Arm 1104: Fixture part 1106: Clamp Fasteners 1108: Cover part 1110: Channel 1112: Vacuum clamp port 1114: Channel 1116: Channel 1200: First sample container 1202: First Cap 1204: External Environment 1210: Second sample container 1212: Specimen Rack

[Embodiment] is described with reference to the drawings. The use of the same reference numerals in different instances in the description and the figures may indicate similar or identical items.

1A is one of an autosampler probe track system for preventing metal particles that would otherwise be detectable within a sample from being released from an autosampler during sample analysis, according to an exemplary embodiment of the present invention Isometric view.

1B is an isometric view of the autosampler probe track system of FIG. 1A with a support arm of the autosampler translated to a lower position along a z-axis.

1C is an isometric view of the autosampler probe track system of FIG. 1A with the support arm rotating about a z-axis.

Figure 2 is a partial cross-sectional side view of the autosampler probe track system of Figure 1A.

Figure 3 is a partial isometric view of an inner shuttle of the autosampler probe track system of Figure 1A.

4 is a partial cross-sectional isometric view of the autosampler probe track system of FIG. 1A showing magnets supported by an inner shuttle relative to magnets supported by an outer shuttle.

5 is a partial cross-sectional side view of the autosampler probe track system of FIG. 1A with an associated drive system.

Figure 6 is a top view of the autosampler probe track system of Figure 1A.

Figure 7 is an isometric view of a support arm of the autosampler probe track system of Figure 1A.

8 is a partial isometric view of an outer shuttle of the autosampler probe track system of FIG. 1A, according to an exemplary embodiment of the present invention.

9 is an isometric view of an autosampler system with automatic sample container lid removal and sample probe positioning in accordance with an exemplary embodiment of the present invention.

FIG. 10A is a top view of the autosampler system of FIG. 9 .

Figure 10B is an autosampler with automatic sample container lid removal and sample probe positioning with multiple tracks for positioning sample probes and/or container lid positioning elements according to an exemplary embodiment of the present invention Schematic diagram of one of the systems.

11 is an isometric cross-sectional view of a sample cap remover of the autosampler system of FIG. 9, according to an exemplary embodiment of the present invention.

12A is a side view of the autosampler system of FIG. 9 showing a lid positioning tool positioned over a covered sample container, according to an exemplary embodiment of the present invention.

12B is a side view of an autosampler system in which the cap positioning tool removes a cap from a sample container.

12C is a side view of an autosampler system in which the cap positioning tool moves the cap out of the sample probe to a vertical axis and in which the sample probe is introduced into the interior of the sample container.

12D is a side view of the autosampler system with the lid positioning tool positioned on a second covered sample container.

100: Autosampler Probe Track System

102: Probe support arm/probe support structure

104: Outer shuttle

108: z-axis support

110: Probe support

112: Upper part

300: Spline

Claims (20)

An autosampler system comprising: a z-axis support rotatable about a z-axis of an autosampler panel; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for extraction held within a sample container supported by the autosampler panel a sample containing fluid; and A sample cap remover coupled to the z-axis support, the sample cap remover including a clamp portion configured to interface with an outer surface of the z-axis support, configured to cover the z-axis support a cover portion of at least a portion of the clamp portion and a cap remover support arm extending from the cover portion, the cap remover support arm being rotationally offset from the sample probe support structure at an angle across an x-y plane, wherein the sample cap remover is configured to lift a cap from the sample container to provide the sample probe supported by the sample probe support structure access to an interior of the sample container. The autosampler system of claim 1, wherein the sample cap remover includes a vacuum clamp structure configured to remove the cap from the sample container by applying a vacuum to the vacuum clamp structure. The autosampler system of claim 2, wherein the sample cap remover defines a channel for receiving a vacuum line through the sample cap remover for coupling with a vacuum port of the vacuum clamp structure . The autosampler system of claim 1, wherein the cover portion rests on the clamp portion, and wherein the cover portion is vertically displaceable relative to the clamp portion. The autosampler system of claim 4, wherein the sample cap remover includes a piston configured to provide vertical displacement of the cap portion relative to the gripper portion. The autosampler system of claim 1, wherein the angle is from about 5 degrees to about 90 degrees. The autosampler system of claim 1, further comprising: an outer shuttle coupled to an outer surface of the z-axis support; and an inner shuttle that is linearly movable within an interior volume of the z-axis support, the inner shuttle is magnetically coupled to the outer shuttle to translate the linear motion of the inner shuttle to the outer shuttle, Wherein the sample probe support structure is coupled to the outer shuttle to translate linear motion of the outer shuttle to the sample probe support structure. An autosampler system comprising: a z-axis support rotatable about a z-axis of an autosampler panel; a sample probe support structure coupled to the z-axis support, the sample probe support structure configured to hold a sample probe for extraction held within a sample container supported by the autosampler panel a sample containing fluid; and A sample cap remover coupled to the z-axis support in an orientation that is rotationally offset from the z-axis support relative to the sample probe support structure, the sample cap remover configured to remove the sample from the sample The container lifts a cap to provide access to an interior of the sample container by the sample probe supported by the sample probe support structure. The autosampler system of claim 8, wherein the sample cap remover includes a vacuum clamp structure configured to remove the cap from the sample container by applying a vacuum to the vacuum clamp structure. The autosampler system of claim 9, wherein the sample cap remover defines a channel for receiving a vacuum line through the sample cap remover for coupling with a vacuum port of the vacuum clamp structure . The autosampler system of claim 8, wherein the sample cap remover includes a clamp portion and a cover portion, wherein the clamp portion is configured to couple to the z-axis support, and wherein the cover portion covers the at least a portion of the clamp portion. The autosampler system of claim 11, wherein the cover portion rests on the clamp portion, and wherein the cover portion is vertically displaceable relative to the clamp portion. The autosampler system of claim 12, wherein the sample cap remover includes a piston configured to provide vertical displacement of the cap portion relative to the gripper portion. The autosampler system of claim 13, wherein the piston is a pneumatic piston having a piston port configured to couple with a fluid line for receiving a fluid to provide the vertical displacement. The autosampler system of claim 11, wherein the sample cap remover includes a cap remover support arm extending from the cap portion, and wherein the cap remover support arm spans an x-y plane at an angle from The sample probe support structure is rotationally offset. The autosampler system of claim 15, wherein the angle is from about 5 degrees to about 90 degrees. The autosampler system of claim 15, wherein the angle is from about 10 degrees to about 35 degrees. The autosampler system of claim 8, wherein each of the sample probe support structure and the sample cap remover is directly coupled to the z-axis support. The autosampler system of claim 8, further comprising: an outer shuttle coupled to an outer surface of the z-axis support; and An inner shuttle, which is linearly movable within an interior volume of the z-axis support, magnetically couples with the outer shuttle to translate the linear motion of the inner shuttle to the outer shuttle. The autosampler system of claim 19, wherein the sample probe support structure is coupled to the outer shuttle to translate linear motion of the outer shuttle to the sample probe support structure.

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