TW202140371A - Silicon nitride powder, and method for producing silicon nitride sintered body - Google Patents
Silicon nitride powder, and method for producing silicon nitride sintered body Download PDFInfo
- Publication number
- TW202140371A TW202140371A TW110111377A TW110111377A TW202140371A TW 202140371 A TW202140371 A TW 202140371A TW 110111377 A TW110111377 A TW 110111377A TW 110111377 A TW110111377 A TW 110111377A TW 202140371 A TW202140371 A TW 202140371A
- Authority
- TW
- Taiwan
- Prior art keywords
- silicon nitride
- nitride powder
- powder
- less
- sintered body
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B21/00—Nitrogen; Compounds thereof
- C01B21/06—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron
- C01B21/068—Binary compounds of nitrogen with metals, with silicon, or with boron, or with carbon, i.e. nitrides; Compounds of nitrogen with more than one metal, silicon or boron with silicon
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/515—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics
- C04B35/58—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides
- C04B35/584—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on non-oxide ceramics based on borides, nitrides, i.e. nitrides, oxynitrides, carbonitrides or oxycarbonitrides or silicides based on silicon nitride
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Structural Engineering (AREA)
- Ceramic Products (AREA)
Abstract
Description
本揭示係關於氮化矽粉末、以及氮化矽燒結體之製造方法。This disclosure relates to a manufacturing method of silicon nitride powder and a silicon nitride sintered body.
氮化矽因為係強度、硬度、韌性、耐熱性、耐腐蝕性、耐熱衝擊性等優異的材料,所以被利用於壓鑄設備及熔解爐等各種產業用之零件、及汽車零件等中。又,因為氮化矽在高溫時的機械特性亦優異,所以已有研究將其採用於要求高溫強度、高溫蠕變特性之燃氣輪機零件中。Silicon nitride is a material with excellent strength, hardness, toughness, heat resistance, corrosion resistance, and thermal shock resistance, so it is used in various industrial parts such as die-casting equipment and melting furnaces, and automotive parts. In addition, because silicon nitride has excellent mechanical properties at high temperatures, it has been studied to use it in gas turbine parts that require high-temperature strength and high-temperature creep characteristics.
對於氮化矽燒結體而言要求熱傳導率及機械特性更進一步的改善。例如專利文獻1揭示一種氮化矽質燒結體,其特徵為:在常溫時之熱傳導率為100~300W/(m・K),且在常溫時之3點彎折強度為600~1500MPa。 [先前技術文獻] [專利文獻]For silicon nitride sintered bodies, further improvements in thermal conductivity and mechanical properties are required. For example, Patent Document 1 discloses a silicon nitride sintered body characterized by a thermal conductivity of 100 to 300 W/(m・K) at room temperature and a three-point bending strength of 600 to 1500 MPa at room temperature. [Prior Technical Literature] [Patent Literature]
[專利文獻1]日本特開2004-262756號公報[Patent Document 1] JP 2004-262756 A
[發明所欲解決之課題][The problem to be solved by the invention]
本揭示之一目的為提供可製造彎折強度優異之燒結體的氮化矽粉末。本揭示之又一目的為提供彎折強度優異的氮化矽燒結體的製造方法。 [解決課題之手段]An object of the present disclosure is to provide silicon nitride powder capable of producing a sintered body with excellent bending strength. Another object of the present disclosure is to provide a method for manufacturing a silicon nitride sintered body with excellent bending strength. [Means to solve the problem]
本揭示其中一態樣為提供一種氮化矽粉末,其包含氮化矽之一次粒子,且將藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%及90%時的粒徑分別設為D10及D90時,D90與D10的差值為5.5μm以下。One aspect of the present disclosure is to provide a silicon nitride powder, which contains primary particles of silicon nitride, and the distribution curve of the volume-based particle size measured by the laser diffraction scattering method starts with a small particle size. When the particle diameters when the cumulative value reaches 10% and 90% of the total are set to D10 and D90, respectively, the difference between D90 and D10 is 5.5 μm or less.
上述氮化矽粉末,因為使D90與D10的差值(D90-D10)為預定值以下,所以可製備粒度分布窄,且具有更緻密的組織的成形體(未煅燒物)。將上述成形體予以煅燒而獲得之氮化矽燒結體,孔隙的產生等受抑制,彎折強度優異。Since the above-mentioned silicon nitride powder has the difference between D90 and D10 (D90-D10) being a predetermined value or less, it is possible to prepare a compact (uncalcined) having a narrower particle size distribution and a denser structure. The silicon nitride sintered body obtained by calcining the above-mentioned molded body has suppressed generation of voids and the like, and has excellent bending strength.
上述氮化矽之D50可為1.5μm以下。若D50之上限值落在上述範圍內,氮化矽粉末會具有適度的粒度分布,所以可更改善一次粒子的填充密度。The D50 of the above-mentioned silicon nitride may be 1.5 μm or less. If the upper limit of D50 falls within the above range, the silicon nitride powder will have a moderate particle size distribution, so the packing density of the primary particles can be improved.
上述氮化矽粉末之D90可為6.0μm以下。若D90之上限值落在上述範圍內,則可充分降低粗大粒子的比例,可更充分地抑制燒結體的密度降低。又,操作性會更優異。The D90 of the above-mentioned silicon nitride powder may be 6.0 μm or less. If the upper limit of D90 falls within the above range, the ratio of coarse particles can be sufficiently reduced, and the decrease in the density of the sintered body can be more sufficiently suppressed. In addition, the operability will be more excellent.
上述氮化矽粉末之BET比表面積可未達9.0m2 /g。The BET specific surface area of the above-mentioned silicon nitride powder may not reach 9.0 m 2 /g.
本揭示其中一態樣為提供一種氮化矽燒結體之製造方法,具有將包含上述氮化矽粉末之燒結原料予以成形並煅燒的步驟。One aspect of the present disclosure is to provide a method for manufacturing a silicon nitride sintered body, which has the steps of forming and calcining the sintering raw material containing the above-mentioned silicon nitride powder.
上述氮化矽燒結體之製造方法因為使用包含上述氮化矽粉末的燒結原料,所以獲得之氮化矽燒結體能展現優異的彎折強度。 [發明之效果]Since the method for manufacturing the silicon nitride sintered body uses the sintering raw material containing the silicon nitride powder, the obtained silicon nitride sintered body can exhibit excellent bending strength. [Effects of the invention]
根據本揭示,可提供能製造彎折強度優異之燒結體的氮化矽粉末。又根據本揭示,可提供彎折強度優異的氮化矽燒結體的製造方法。According to the present disclosure, it is possible to provide silicon nitride powder capable of producing a sintered body with excellent bending strength. According to the present disclosure, it is possible to provide a method for producing a silicon nitride sintered body with excellent bending strength.
以下,針對本揭示之實施形態進行說明。但以下之實施形態係用於說明本揭示之例示,並不代表本揭示受以下內容所限定。Hereinafter, the embodiment of the present disclosure will be described. However, the following embodiments are examples for explaining the present disclosure, and do not mean that the present disclosure is limited by the following content.
本說明書中例示之材料除非另有指明,係可單獨使用1種或將2種以上組合使用。組成物中各成分的含量,在相當於組成物中之各成分的物質有多數存在時,除非另有指明,係指在組成物中存在之該多數物質的合計量。本說明書中之「步驟」,可指互相獨立的步驟,亦可指同時進行的步驟。Unless otherwise specified, the materials exemplified in this specification can be used alone or in combination of two or more. The content of each component in the composition, when there is a majority of substances equivalent to each component in the composition, unless otherwise specified, refers to the total amount of the plurality of substances present in the composition. The "steps" in this manual can refer to mutually independent steps or steps that are performed simultaneously.
氮化矽粉末之一實施形態,係包含氮化矽之一次粒子,且將藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%及90%時的粒徑分別設為D10及D90時,D90與D10的差值為5.5μm以下。One embodiment of silicon nitride powder contains primary particles of silicon nitride, and in the distribution curve of the volume-based particle size measured by the laser diffraction scattering method, the cumulative value starting from the small particle size reaches all When the particle diameters at 10% and 90% are D10 and D90, respectively, the difference between D90 and D10 is 5.5 μm or less.
上述D90與D10的差值(D90-D10)的上限值為5.5μm以下,例如可為5.4μm以下、5.2μm以下、5.0μm以下、4.8μm以下、或4.6μm以下。上述差值的上限值若落在上述範圍內,因為將氮化矽粉末進行壓縮成形等而製備出之成形體能具有更緻密的組織,所以更能抑制在燒結時的孔隙的產生等。亦即,能使獲得之氮化矽燒結體的彎折強度更為改善。上述D90與D10的差值的下限值例如可為3.0μm以上、3.2μm以上、或3.4μm以上。若上述差值的下限值落在上述範圍內,因為氮化矽粉末會具有適度的粒度分布,所以能使一次粒子的填充密度更為改善。上述差值能在上述範圍內進行調整,例如可為3.0~5.5μm、3.2~5.4μm、或3.4~4.6μm。上述差值可藉由調整氮化矽粉末在製造時的粉碎條件等來進行控制。The upper limit of the difference between D90 and D10 (D90-D10) is 5.5 μm or less, for example, 5.4 μm or less, 5.2 μm or less, 5.0 μm or less, 4.8 μm or less, or 4.6 μm or less. If the upper limit of the above difference falls within the above range, the molded body prepared by compression molding of the silicon nitride powder can have a denser structure, so that the generation of voids during sintering can be more suppressed. That is, the bending strength of the obtained silicon nitride sintered body can be more improved. The lower limit of the difference between D90 and D10 can be, for example, 3.0 μm or more, 3.2 μm or more, or 3.4 μm or more. If the lower limit of the above difference falls within the above range, since the silicon nitride powder will have an appropriate particle size distribution, the packing density of the primary particles can be more improved. The above difference can be adjusted within the above range, for example, it can be 3.0 to 5.5 μm, 3.2 to 5.4 μm, or 3.4 to 4.6 μm. The above-mentioned difference can be controlled by adjusting the pulverization conditions of the silicon nitride powder at the time of manufacturing, and the like.
氮化矽粉末之D90的上限值例如可為6.0μm以下、5.8μm以下、5.6μm以下、5.4μm以下、或5.2μm以下。若D90之上限值落在上述範圍內,則可充分降低粗大粒子的比例,可更充分地抑制燒結體的密度降低。D90的下限值例如可為3.5μm以上、3.7μm以上、3.9μm以上、或4.0μm以上。D90可在上述範圍內進行調整,例如可為3.5~6.0μm、或4.0~5.2μm。氮化矽粉末之D90,例如可藉由調整在製造氮化矽粉末時的粉碎條件等來進行控制。The upper limit of D90 of the silicon nitride powder may be 6.0 μm or less, 5.8 μm or less, 5.6 μm or less, 5.4 μm or less, or 5.2 μm or less, for example. If the upper limit of D90 falls within the above range, the ratio of coarse particles can be sufficiently reduced, and the decrease in the density of the sintered body can be more sufficiently suppressed. The lower limit of D90 may be 3.5 μm or more, 3.7 μm or more, 3.9 μm or more, or 4.0 μm or more, for example. D90 can be adjusted within the above range, for example, it can be 3.5 to 6.0 μm, or 4.0 to 5.2 μm. The D90 of the silicon nitride powder can be controlled, for example, by adjusting the crushing conditions during the production of the silicon nitride powder.
氮化矽粉末之D50的上限值例如可為1.5μm以下、或1.4μm以下。若D50之上限值落在上述範圍內,能使氮化矽燒結體的強度更為改善。氮化矽粉末之D50的下限值例如可為1.1μm以上、或1.2μm以上。氮化矽粉末之D50可在上述範圍內進行調整,例如可為1.1~1.5μm、或1.2~1.4μm。The upper limit of D50 of the silicon nitride powder may be 1.5 μm or less, or 1.4 μm or less, for example. If the upper limit of D50 falls within the above range, the strength of the silicon nitride sintered body can be more improved. The lower limit of D50 of the silicon nitride powder may be 1.1 μm or more, or 1.2 μm or more, for example. The D50 of the silicon nitride powder can be adjusted within the above range, for example, it can be 1.1~1.5μm, or 1.2~1.4μm.
本說明書中之D10、D50、及D90係各別代表藉由雷射繞射散射法測定之體積基準之粒徑的分布曲線中,從小粒徑開始之累積值到達全部的10%、50%及90%時的粒徑。雷射解析散射法可依循JIS Z 8825:2013「粒徑解析-雷射繞射散射法」中記載之方法來進行測定。測定時可使用雷射繞射散射法粒度分布測定裝置(貝克曼庫爾特公司製、商品名:LS-13 320)等。另外,D50亦稱作中值粒徑,係指氮化矽粉末之平均粒徑。In this manual, D10, D50, and D90 respectively represent the volume-based particle size distribution curve measured by the laser diffraction scattering method. The cumulative value starting from the small particle size reaches 10%, 50%, and The particle size at 90%. The laser analysis scattering method can be measured according to the method described in JIS Z 8825:2013 "particle size analysis-laser diffraction scattering method". For the measurement, a laser diffraction scattering method particle size distribution measuring device (manufactured by Beckman Coulter, trade name: LS-13 320) or the like can be used. In addition, D50 is also called the median particle size, which refers to the average particle size of silicon nitride powder.
氮化矽粉末之BET比表面積的上限值例如可為未達9.0m2 /g、8.8m2 /g以下、8.6m2 /g以下、或8.5m2 /g以下。氮化矽粉末之BET比表面積的下限值例如可為5.0m2 /g以上、5.1m2 /g以上、5.2m2 /g以上、5.3m2 /g以上、5.4m2 /g以上、5.5m2 /g以上、6.0m2 /g以上、或7.0m2 /g以上。氮化矽粉末之BET比表面積可在上述範圍內進行調整,例如可為5.0~9.0m2 /g、或5.5~8.5m2 /g、或7.0~8.5m2 /g。氮化矽粉末之BET比表面積,例如可藉由調整在製造氮化矽粉末時的粉碎條件等來進行控制。The silicon nitride powder BET specific surface area, for example, the upper limit may be less than 9.0m 2 /g,8.8m 2 / g or less, 8.6m 2 / g or less, or 8.5m 2 / g or less. The silicon nitride powder BET specific surface area, for example, the lower limit may be 5.0m 2 / g or more, 5.1m 2 / g or more, 5.2m 2 / g or more, 5.3m 2 / g or more, 5.4m 2 / g or more, 5.5m 2 /g or more, 6.0m 2 /g or more, or 7.0m 2 /g or more. The BET specific surface area of the silicon nitride powder can be adjusted within the above range, for example, it can be 5.0~9.0m 2 /g, or 5.5~8.5m 2 /g, or 7.0~8.5m 2 /g. The BET specific surface area of the silicon nitride powder can be controlled, for example, by adjusting the pulverization conditions during the production of the silicon nitride powder.
本說明書中之BET比表面積係依循JIS Z 8830:2013「利用氣體吸附之粉體(固體)的比表面積測定方法」中記載之方法,使用氮氣並藉由BET一點法所測定之數值。The BET specific surface area in this manual follows the method described in JIS Z 8830:2013 "Powder (solid) specific surface area measurement method using gas adsorption", using nitrogen and the value measured by the BET one-point method.
氮化矽之表面氧量的上限值例如可為2.0質量%以下、1.5質量%以下、或1.3質量%以下。氮化矽之表面氧量的上限值若落在上述範圍內,可更充分地減少在製造氮化矽燒結體時的晶界相。氮化矽之表面氧量的下限值例如可為0.20質量%以上、0.30質量%以上、0.35質量%以上、0.40質量%以上、0.45質量%以上、0.60質量%以上、0.80質量%以上、或1.0質量%以上。若氮化矽之表面氧量的下限值落在上述範圍內,可促進在煅燒氮化矽時的晶粒成長,可使氮化矽燒結體之彎折強度更為改善。氮化矽之表面氧量可在上述範圍內進行調整,例如可為0.20~2.0質量%、0.20~1.5質量%、或1.0~1.5質量%。氮化矽之表面氧量,例如可藉由調整在氮化矽粉末之製造中之煅燒步驟中的氣體環境的成分、還有煅燒溫度及煅燒時間等來進行控制。The upper limit of the amount of surface oxygen of silicon nitride may be 2.0% by mass or less, 1.5% by mass or less, or 1.3% by mass or less, for example. If the upper limit of the amount of surface oxygen of silicon nitride falls within the above range, the grain boundary phases in the production of silicon nitride sintered bodies can be more sufficiently reduced. The lower limit of the surface oxygen content of silicon nitride can be, for example, 0.20 mass% or more, 0.30 mass% or more, 0.35 mass% or more, 0.40 mass% or more, 0.45 mass% or more, 0.60 mass% or more, 0.80 mass% or more, or 1.0% by mass or more. If the lower limit of the amount of surface oxygen of silicon nitride falls within the above range, the growth of crystal grains during calcination of silicon nitride can be promoted, and the bending strength of the silicon nitride sintered body can be improved. The surface oxygen content of silicon nitride can be adjusted within the above range, for example, it can be 0.20~2.0% by mass, 0.20~1.5% by mass, or 1.0~1.5% by mass. The amount of surface oxygen of silicon nitride can be controlled, for example, by adjusting the composition of the gas environment in the calcination step in the production of silicon nitride powder, as well as the calcination temperature and calcination time.
本說明書中之「表面氧量」係指藉由以下程序所求得之數值。使用氧氮分析裝置分析氮化矽粉末之氧量及氮量。在氦氣環境中,將測定用之試樣以8℃/秒之昇溫速度從20℃昇溫至2000℃。利用紅外吸收法來檢測伴隨著昇溫而脫離的氧。昇溫一開始,鍵結於氮化矽粉末的表面的氧會脫離。若進一步加熱而溫度到達1400℃附近的話,氮化矽會開始分解。可藉由開始檢測到氮來確認氮化矽的分解開始。若氮化矽開始分解,在氮化矽粉末內部的氧會脫離。因此,在此階段脫離的氧係相當於內部氧量,所以將在檢測到氮之前所檢測、定量的氧量作為表面氧量。The "surface oxygen content" in this manual refers to the value obtained by the following procedure. The oxygen and nitrogen analyzer is used to analyze the oxygen and nitrogen content of silicon nitride powder. In a helium atmosphere, the sample for measurement is heated from 20°C to 2000°C at a temperature increase rate of 8°C/sec. The infrared absorption method is used to detect the oxygen that desorbs as the temperature rises. As soon as the temperature rises, the oxygen bonded to the surface of the silicon nitride powder will escape. If it is heated further and the temperature reaches around 1400°C, silicon nitride will begin to decompose. The start of the decomposition of silicon nitride can be confirmed by starting to detect nitrogen. If silicon nitride starts to decompose, oxygen in the silicon nitride powder will escape. Therefore, the oxygen system desorbed at this stage corresponds to the amount of internal oxygen, so the amount of oxygen detected and quantified before the detection of nitrogen is taken as the amount of surface oxygen.
上述氮化矽粉末例如可藉由以下方法來製造。氮化矽粉末之製造方法的一實施形態,係具有以下步驟:將矽粉末在包含氮、以及選自於由氫及氨構成之群組中之至少一種的氣體環境下予以煅燒而獲得煅燒物的步驟(以下,亦稱作煅燒步驟);將上述煅燒物予以乾式粉碎而獲得粉碎物的步驟(以下,亦稱作粉碎步驟);將上述粉碎物進行乾式分級的步驟(以下,亦稱作分級步驟)。The above-mentioned silicon nitride powder can be produced, for example, by the following method. An embodiment of the method for manufacturing silicon nitride powder has the following steps: calcining the silicon powder in a gas atmosphere containing nitrogen and at least one selected from the group consisting of hydrogen and ammonia to obtain a calcined product The step (hereinafter, also referred to as the calcination step); the step of dry pulverizing the above-mentioned calcined product to obtain a pulverized product (hereinafter, also referred to as the pulverization step); the step of subjecting the above-mentioned pulverized product to dry classification (hereinafter, also referred to as the pulverization step) Grading steps).
就矽粉末而言,可使用氧濃度低的矽粉末。矽粉末之氧濃度的上限值例如可為0.40質量%以下、0.30質量%以下、或0.20質量%以下。若矽粉末的氧濃度落在上述範圍內,可更減少在獲得之氮化矽粉末內部的氧量。矽粉末之氧濃度的下限值例如可為0.10質量%以上、或0.15質量%以上。矽粉末之氧濃度可在上述範圍內進行調整,例如可為0.10~0.40質量%。As for silicon powder, silicon powder with a low oxygen concentration can be used. The upper limit of the oxygen concentration of the silicon powder may be 0.40% by mass or less, 0.30% by mass or less, or 0.20% by mass or less, for example. If the oxygen concentration of the silicon powder falls within the above range, the amount of oxygen in the obtained silicon nitride powder can be further reduced. The lower limit of the oxygen concentration of the silicon powder can be, for example, 0.10% by mass or more, or 0.15% by mass or more. The oxygen concentration of the silicon powder can be adjusted within the above range, for example, it can be 0.10~0.40% by mass.
本說明書中之矽粉末的氧濃度,係指利用紅外線吸收法所測得之數值。The oxygen concentration of silicon powder in this manual refers to the value measured by infrared absorption method.
矽粉末可使用市售物,亦可使用另外製備者。矽粉末之氧濃度高的時候,例如可使用包含氫氟酸的前處理液來減少與矽粉末鍵結的氧量。例如上述氮化矽粉末的製造方法亦可更具有使用包含氫氟酸的前處理液來對矽粉末進行前處理,並獲得氧濃度為0.40質量%以下之矽粉末的前處理步驟。Commercially available silicon powder can be used, or another preparation can be used. When the oxygen concentration of the silicon powder is high, for example, a pretreatment solution containing hydrofluoric acid can be used to reduce the amount of oxygen bonded to the silicon powder. For example, the above-mentioned manufacturing method of silicon nitride powder may further have a pretreatment step of using a pretreatment liquid containing hydrofluoric acid to pretreat the silicon powder and obtain a silicon powder with an oxygen concentration of 0.40% by mass or less.
前處理液包含氫氟酸,但亦可為例如與鹽酸等酸的混酸,亦可僅由氫氟酸構成。前處理步驟中之前處理液的溫度例如可為40~80℃。又,使前處理液與矽粉末接觸的時間例如可為1~10小時。The pretreatment liquid contains hydrofluoric acid, but may be a mixed acid with acids such as hydrochloric acid, or may be composed of hydrofluoric acid alone. The temperature of the pretreatment liquid in the pretreatment step can be, for example, 40 to 80°C. In addition, the time for bringing the pretreatment liquid into contact with the silicon powder can be, for example, 1 to 10 hours.
在煅燒步驟中將矽粉末在包含氮、以及選自於由氫及氨構成之群組中之至少一種的混合氣體環境下予以煅燒而獲得包含氮化矽的煅燒物。以混合氣體環境全體為基準,混合氣體環境中之氫及氨之合計含量例如可為10~40體積%。煅燒溫度例如可為1100~1450℃、或1200~1400℃。煅燒時間例如可為30~100小時。In the calcining step, the silicon powder is calcined in a mixed gas environment containing nitrogen and at least one selected from the group consisting of hydrogen and ammonia to obtain a calcined product containing silicon nitride. Based on the entire mixed gas environment, the total content of hydrogen and ammonia in the mixed gas environment may be, for example, 10-40% by volume. The calcination temperature can be, for example, 1100 to 1450°C, or 1200 to 1400°C. The calcination time can be 30 to 100 hours, for example.
在粉碎步驟中將在煅燒步驟獲得之上述煅燒物以乾式方法予以粉碎而獲得粉碎物。在本實施形態之氮化矽粉末之製造方法中,粉碎步驟係包含球磨粉碎及振動研磨粉碎步驟這2個步驟。將煅燒物粉碎、並調整粒度,藉此使在之後的分級步驟的控制變容易。包含在煅燒步驟中獲得之氮化矽的煅燒物為塊狀、鑄錠狀等的時候,進行粉碎步驟的效果係更顯著。In the pulverization step, the above-mentioned calcined product obtained in the calcination step is pulverized by a dry method to obtain a pulverized product. In the method for producing silicon nitride powder of this embodiment, the pulverization step includes two steps of ball mill pulverization and vibration mill pulverization. The calcined product is pulverized and the particle size is adjusted, thereby facilitating the control of the subsequent classification step. When the calcined product including the silicon nitride obtained in the calcining step is in the shape of a block or an ingot, the effect of the pulverization step is more significant.
各粉碎亦可分成像是粗粉碎及微粉碎這樣的多階段來進行。粉碎步驟係以乾式粉碎步驟來進行。Each pulverization can be divided into multiple stages such as coarse pulverization and fine pulverization. The pulverization step is performed as a dry pulverization step.
球磨粉碎步驟中之滾珠對容器之填充率能配合作為目標之氮化矽粉末的粒度分布來進行調整。針對滾珠對容器之填充率的下限值,以容器之容積為基準,例如可為40體積%以上、45體積%以上、50體積%以上、或60體積%以上。針對滾珠對容器之填充率的上限值,以容器之容積為基準,例如可為70體積%以下、或65體積%以下。The filling rate of the ball to the container in the ball milling step can be adjusted according to the target particle size distribution of the silicon nitride powder. The lower limit of the filling rate of the balls to the container is based on the volume of the container, and may be, for example, 40% by volume or more, 45% by volume or more, 50% by volume or more, or 60% by volume or more. Regarding the upper limit of the filling rate of the balls to the container, based on the volume of the container, for example, it may be 70% by volume or less, or 65% by volume or less.
球磨粉碎步驟中之粉碎處理之時間(粉碎時間)的下限值,例如可為5小時以上、6小時以上、7小時以上、或8小時以上。若粉碎時間的下限值落在上述範圍內,可使粉碎物充分細小,可使在以乾式方法進一步粉碎時的粉碎效率更為改善。球磨粉碎步驟中之粉碎處理之時間的上限值例如可為15小時以下、14小時以下、13小時以下、或12小時以下。若粉碎時間之上限值落在上述範圍內,可使煅燒物充分粉碎,可防止過度的粉碎。粉碎時間可在上述範圍內進行調整,例如可為5~15小時、或8~12小時。The lower limit of the time (pulverization time) of the pulverization process in the ball mill pulverization step may be, for example, 5 hours or more, 6 hours or more, 7 hours or more, or 8 hours or more. If the lower limit of the pulverization time falls within the above range, the pulverized product can be made sufficiently fine, and the pulverization efficiency when further pulverized by a dry method can be improved. The upper limit of the time of the pulverization treatment in the ball mill pulverization step may be, for example, 15 hours or less, 14 hours or less, 13 hours or less, or 12 hours or less. If the upper limit of the pulverization time falls within the above range, the calcined product can be sufficiently pulverized and excessive pulverization can be prevented. The pulverization time can be adjusted within the above range, for example, it can be 5 to 15 hours, or 8 to 12 hours.
粉碎步驟係在球磨粉碎步驟之後藉由振動研磨粉碎步驟將上述煅燒物再進行粉碎。振動研磨粉碎步驟中之滾珠對容器之填充率能配合作為目標之氮化矽粉末的粒度分布來進行調整。針對滾珠對容器之填充率的下限值,以容器之容積為基準,例如可為50體積%以上、55體積%以上、或60體積%以上。針對滾珠對容器之填充率的上限值,以容器之容積為基準,例如可為80體積%以下、或75體積%以下。The pulverization step is followed by the ball mill pulverization step to further pulverize the above-mentioned calcined product through a vibration milling pulverization step. The filling rate of the ball to the container in the vibration grinding and crushing step can be adjusted according to the target particle size distribution of the silicon nitride powder. The lower limit of the filling rate of the balls to the container is based on the volume of the container, and may be, for example, 50% by volume or more, 55% by volume or more, or 60% by volume or more. The upper limit of the filling rate of the balls to the container is based on the volume of the container, for example, it may be 80% by volume or less, or 75% by volume or less.
振動研磨粉碎步驟中之粉碎處理之時間(粉碎時間)的下限值例如可為8小時以上、9小時以上、10小時以上、或12小時以上。若粉碎時間的下限值落在上述範圍內,可使粉碎物充分細小,可使分級步驟的處理效率更為改善。振動研磨粉碎步驟中之粉碎處理之時間的上限值例如可為20小時以下、19小時以下、18小時以下、或17小時以下。若粉碎時間的上限值落在上述範圍內,可使煅燒物充分粉碎,亦可防止過剩的粉碎。粉碎時間可在上述範圍內進行調整,例如可為8~20小時、或12~17小時。The lower limit of the time (grinding time) of the grinding treatment in the vibration grinding and grinding step can be, for example, 8 hours or more, 9 hours or more, 10 hours or more, or 12 hours or more. If the lower limit of the pulverization time falls within the above range, the pulverized product can be made sufficiently fine, and the processing efficiency of the classification step can be improved. The upper limit of the time of the grinding treatment in the vibration grinding and grinding step can be, for example, 20 hours or less, 19 hours or less, 18 hours or less, or 17 hours or less. If the upper limit of the pulverization time falls within the above range, the calcined product can be sufficiently pulverized, and excessive pulverization can also be prevented. The pulverization time can be adjusted within the above range, for example, it can be 8-20 hours, or 12-17 hours.
在分級步驟中將經過粉碎步驟而製備出之上述粉碎物再以乾式方法進行分級,製備具有所期望之粒度分布的氮化矽粉末。例如可將粗粉除去以調整氮化矽粉末的D90等。乾式分級例如可藉由氣流分級等來進行。氣流分級機例如可使用旋回氣流等來進行分級。一次氣體壓力(入口壓力)例如可為0.2~0.8MPa、或0.3~0.7MPa。In the classification step, the above-mentioned pulverized product prepared through the pulverization step is then classified by a dry method to prepare silicon nitride powder having a desired particle size distribution. For example, coarse powder can be removed to adjust the D90 of silicon nitride powder. Dry classification can be performed by, for example, airflow classification. The air flow classifier can perform classification using, for example, a swirling air flow or the like. The primary gas pressure (inlet pressure) may be 0.2 to 0.8 MPa, or 0.3 to 0.7 MPa, for example.
藉由上述製造方法所獲得之氮化矽粉末係燒結性優異。亦即,上述氮化矽粉末可理想地使用於燒結體原料。The silicon nitride powder obtained by the above-mentioned manufacturing method has excellent sinterability. That is, the above-mentioned silicon nitride powder can be ideally used as a sintered body raw material.
氮化矽燒結體之製造方法的一實施形態中,具有將包含上述氮化矽粉末的燒結原料予以成形並煅燒的步驟。One embodiment of the method of manufacturing a silicon nitride sintered body includes a step of forming and firing the sintering raw material containing the above-mentioned silicon nitride powder.
燒結原料除了氮化矽粉末以外亦可含有氧化物系燒結助劑。就氧化物系燒結助劑而言,可列舉如Y2 O3 、MgO及Al2 O3 等。燒結原料中之氧化物系燒結助劑的含量例如可為3~10質量%。The sintering raw material may contain an oxide-based sintering aid in addition to the silicon nitride powder. Examples of oxide-based sintering aids include Y 2 O 3 , MgO, Al 2 O 3 and the like. The content of the oxide-based sintering aid in the sintering raw material can be, for example, 3-10% by mass.
在上述步驟中將上述燒結原料以例如3.0~30.0MPa的成形壓力進行加壓而獲得成形體。成形體可進行單軸加壓來製作,亦可藉由CIP來製作。又,亦可藉由熱壓來一邊成形一邊煅燒。成形體的煅燒可在氮氣或氬氣等鈍性氣體環境中進行。煅燒時的壓力可為0.7~1.0MPa。煅燒溫度可為1860~2100℃,亦可為1880~2000℃。該煅燒溫度之煅燒時間可為6~20小時,亦可為8~16小時。到煅燒溫度為止的昇溫速度例如可為1.0~10.0℃/小時。In the above step, the sintering raw material is pressurized at a molding pressure of, for example, 3.0 to 30.0 MPa to obtain a molded body. The molded body can be produced by uniaxial pressing, or can be produced by CIP. In addition, it may be calcined while forming by hot pressing. The calcination of the formed body can be carried out in a passive gas environment such as nitrogen or argon. The pressure during calcination can be 0.7~1.0MPa. The calcination temperature can be 1860~2100℃, or 1880~2000℃. The calcination time of the calcination temperature can be 6-20 hours, or 8-16 hours. The rate of temperature increase up to the calcination temperature can be, for example, 1.0 to 10.0°C/hour.
獲得之氮化矽燒結體因為晶界相減少並具有緻密的組織,所以能展現優異的彎折強度。The obtained silicon nitride sintered body exhibits excellent flexural strength because the grain boundary phase is reduced and the structure is dense.
氮化矽燒結體之彎折強度在室溫中例如可設定為550MPa以上、600MPa以上、或650MPa以上。本說明書中之氮化矽燒結體的彎折強度,係指依循JIS R 1601:2008來製作強度測定用試驗片,並在室溫中所測得之3點彎折強度。The bending strength of the silicon nitride sintered body can be set to, for example, 550 MPa or more, 600 MPa or more, or 650 MPa or more at room temperature. The flexural strength of the silicon nitride sintered body in this specification refers to the 3-point flexural strength measured at room temperature after making a test piece for strength measurement in accordance with JIS R 1601:2008.
以上,針對幾個實施形態進行了說明,但本揭示並不受上述實施形態任何限定。又,關於上述實施形態之說明內容係可互相採用。 [實施例]Above, several embodiments have been described, but the present disclosure is not limited to the above-mentioned embodiments at all. In addition, the descriptions of the above-mentioned embodiments can be mutually adopted. [Example]
以下,參照實施例及比較例對本揭示內容進行更詳細的說明。但本揭示並不受下列實施例所限定。Hereinafter, the present disclosure will be described in more detail with reference to Examples and Comparative Examples. However, the present disclosure is not limited by the following embodiments.
(實施例1) <氮化矽粉末之製備> 將市售之矽粉末(比表面積:3.0m2 /g)浸漬於溫度調整為60℃且包含氯化氫及氟化氫的混酸中,維持在60℃,施以2小時之前處理。上述混酸係使用市售之鹽酸(濃度:35質量%)與氫氟酸(濃度:55質量%)以10:1的質量比進行混合所成者。之後,將矽粉末從混酸取出並以水洗淨,在氮氣環境下進行乾燥。乾燥後之矽粉末的氧濃度為0.4質量%。此氧濃度係藉由紅外線吸收法進行測定。(Example 1) <Preparation of silicon nitride powder> A commercially available silicon powder (specific surface area: 3.0m 2 /g) was immersed in a mixed acid containing hydrogen chloride and hydrogen fluoride adjusted to a temperature of 60°C and maintained at 60°C, Treat it 2 hours before applying. The above-mentioned mixed acid is obtained by mixing commercially available hydrochloric acid (concentration: 35% by mass) and hydrofluoric acid (concentration: 55% by mass) in a mass ratio of 10:1. After that, the silicon powder is taken out from the mixed acid, washed with water, and dried in a nitrogen atmosphere. The oxygen concentration of the silicon powder after drying was 0.4% by mass. The oxygen concentration is measured by infrared absorption method.
使用乾燥後之矽粉末製作成形體(容積密度:1.4g/cm3 )。將獲得之成形體靜置於電爐內,以1400℃經過60小時的煅燒來製作包含氮化矽的煅燒體。就煅燒時的氣體環境而言,係供給氮與氫的混合氣體(以使N2 與H2 在標準狀態下的體積比為80:20的方式進行混合所成之混合氣體)。將獲得之煅燒體予以粗粉碎後,以球磨機進行乾式粉碎。就球磨粉碎而言,係將滾珠對容器之填充率設為60體積%,並將粉碎時間設為8小時。再以振動研磨進行乾式粉碎,將滾珠對容器之填充率設為70體積%,並將粉碎時間設為15小時。Use the dried silicon powder to make a molded body (bulk density: 1.4g/cm 3 ). The obtained molded body was statically placed in an electric furnace and calcined at 1400° C. for 60 hours to produce a calcined body containing silicon nitride. Regarding the gas environment during calcination, a mixed gas of nitrogen and hydrogen is supplied (a mixed gas produced by mixing N 2 and H 2 in a standard state in a volume ratio of 80:20). After coarsely pulverizing the obtained calcined body, it is dry pulverized with a ball mill. For ball milling, the filling rate of the ball to the container is set to 60% by volume, and the crushing time is set to 8 hours. Dry pulverization by vibration milling, the filling rate of the balls to the container is set to 70% by volume, and the pulverization time is set to 15 hours.
將進行乾式粉碎而獲得之氮化矽粉末以一次氣體壓力為0.4MPa的條件進行分級,獲得氮化矽粉末。The silicon nitride powder obtained by dry pulverization was classified under the condition of a primary gas pressure of 0.4 MPa to obtain silicon nitride powder.
<氮化矽粉末之評價:D10、D50、及D90的測定> 依循JIS Z 8825:2013「粒徑解析-雷射繞射散射法」中記載之方法以雷射解析散射法來測定氮化矽粉末之D10、D50、及D90。測定係使用雷射繞射散射法粒度分布測定裝置(貝克曼庫爾特公司製、商品名:LS-13 320)。<Evaluation of silicon nitride powder: measurement of D10, D50, and D90> Measure D10, D50, and D90 of silicon nitride powder by laser analysis and scattering method according to the method described in JIS Z 8825:2013 "Particle size analysis-Laser diffraction scattering method". The measurement system used a laser diffraction scattering method particle size distribution measuring device (manufactured by Beckman Coulter, trade name: LS-13 320).
<氮化矽粉末之評價:BET比表面積的測定> BET比表面積係依循JIS Z 8803:2013並使用氮氣藉由BET一點法所測定。將結果顯示於表1。<Evaluation of silicon nitride powder: measurement of BET specific surface area> The BET specific surface area is measured by the BET one-point method in accordance with JIS Z 8803:2013 and using nitrogen. The results are shown in Table 1.
<氮化矽粉末之評價:表面氧量的測定> 表面氧量係使用氧/氮同時分析裝置(堀場製作所公司製、裝置名:EMGA-920)進行測定。具體而言,藉由在氦氣環境中,將氮化矽粉末以昇溫速度8℃/秒從20℃加熱至2000℃,將檢測到氮之前的氧量予以定量以測定。<Evaluation of silicon nitride powder: measurement of surface oxygen content> The surface oxygen content was measured using an oxygen/nitrogen simultaneous analysis device (manufactured by Horiba, Ltd., device name: EMGA-920). Specifically, by heating the silicon nitride powder from 20°C to 2000°C at a temperature increase rate of 8°C/sec in a helium atmosphere, the amount of oxygen before nitrogen is detected is quantified for measurement.
[氮化矽燒結體之製造] 秤取製備出之氮化矽粉末90質量份、平均粒徑為1.5μm之Y2 O3 粉末5質量份、及平均粒徑為1.2μm之Yb2 O3 粉末5質量份於容器中,加入甲醇,濕式混合4小時。之後,將乾燥而獲得之混合粉末(煅燒原料)以10MPa的壓力進行模具成形,之後,再以25MPa的壓力進行冷均壓(CIP)成形。將獲得之成形體與由氮化矽粉末及BN粉末之混合粉末構成的填充粉一併設置於碳製坩堝中,在1MPa的氮加壓氣體環境下,以溫度1900℃煅燒12小時以製造氮化矽燒結體。[Production of silicon nitride sintered body] Weigh 90 parts by mass of the prepared silicon nitride powder, 5 parts by mass of Y 2 O 3 powder with an average particle size of 1.5 μm, and Yb 2 O 3 with an average particle size of 1.2 μm 5 parts by mass of the powder was put in a container, methanol was added, and the mixture was wet-mixed for 4 hours. After that, the mixed powder (calcined raw material) obtained by drying was molded into a mold at a pressure of 10 MPa, and then cold-isolated (CIP) molded at a pressure of 25 MPa. The obtained molded body and the filler powder composed of a mixed powder of silicon nitride powder and BN powder were set in a carbon crucible and calcined at a temperature of 1900°C for 12 hours in a nitrogen pressurized atmosphere of 1 MPa to produce nitrogen. Silica sintered body.
<氮化矽燒結體之彎折強度測定、及評價> 依循JIS R1601:2008由氮化矽燒結體製作強度測定用之試驗片,測定在室溫中之3點彎折強度。依據基準從測定結果進行評價。將結果顯示於表1。另外,表1中彎折強度之測定結果,係以將在後述之比較例1製備出之氮化矽燒結體作為基準而獲得之相對值來表示。 A:彎折強度(相對值)為1.10以上。 B:彎折強度(相對值)為1.05以上且未達1.10。 C:彎折強度(相對值)未達1.05。<Measurement and evaluation of bending strength of silicon nitride sintered body> According to JIS R1601:2008, a test piece for strength measurement was made from a silicon nitride sintered body, and the three-point bending strength at room temperature was measured. Evaluate from the measurement results based on the benchmarks. The results are shown in Table 1. In addition, the measurement results of the bending strength in Table 1 are expressed as relative values obtained using the silicon nitride sintered body prepared in Comparative Example 1 described later as a reference. A: The bending strength (relative value) is 1.10 or more. B: The bending strength (relative value) is 1.05 or more and less than 1.10. C: The bending strength (relative value) is less than 1.05.
(實施例2) 將乾式粉碎之振動研磨條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Example 2) Except for changing the vibration milling conditions of dry milling to the conditions described in Table 1, the same procedure as in Example 1 was carried out to prepare silicon nitride powder. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
(實施例3) 將乾式粉碎之球磨粉碎條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Example 3) Except that the ball mill grinding conditions of dry grinding were changed to the conditions described in Table 1, the same procedure as in Example 1 was carried out to prepare silicon nitride powder. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
(比較例1) 將乾式分級之條件變更為表1記載之條件,除此以外,與實施例1同樣地進行,製備氮化矽粉末。針對獲得之氮化矽粉末與實施例1同樣地進行評價。將結果顯示於表1。(Comparative example 1) Except for changing the conditions of the dry classification to the conditions described in Table 1, the same procedure as in Example 1 was carried out to prepare silicon nitride powder. The obtained silicon nitride powder was evaluated in the same manner as in Example 1. The results are shown in Table 1.
[表1]
根據本揭示,可提供能製造彎折強度優異之燒結體的氮化矽粉末。又根據本揭示,可提供彎折強度優異的氮化矽燒結體的製造方法。According to the present disclosure, it is possible to provide silicon nitride powder capable of producing a sintered body with excellent bending strength. According to the present disclosure, it is possible to provide a method for producing a silicon nitride sintered body with excellent bending strength.
Claims (5)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020059919 | 2020-03-30 | ||
JP2020-059919 | 2020-03-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW202140371A true TW202140371A (en) | 2021-11-01 |
Family
ID=77927904
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110111377A TW202140371A (en) | 2020-03-30 | 2021-03-29 | Silicon nitride powder, and method for producing silicon nitride sintered body |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2021200865A1 (en) |
TW (1) | TW202140371A (en) |
WO (1) | WO2021200865A1 (en) |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10399854B2 (en) * | 2014-06-16 | 2019-09-03 | Ube Industries, Ltd. | Silicon nitride powder, silicon nitride sintered body and circuit substrate, and production method for said silicon nitride powder |
TWI657043B (en) * | 2016-12-12 | 2019-04-21 | 日商宇部興產股份有限公司 | Method for manufacturing silicon nitride powder and silicon nitride sintered body |
-
2021
- 2021-03-29 TW TW110111377A patent/TW202140371A/en unknown
- 2021-03-29 JP JP2022512239A patent/JPWO2021200865A1/ja active Pending
- 2021-03-29 WO PCT/JP2021/013391 patent/WO2021200865A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2021200865A1 (en) | 2021-10-07 |
JPWO2021200865A1 (en) | 2021-10-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Kume et al. | High‐thermal‐conductivity AlN filler for polymer/ceramics composites | |
JP6292306B2 (en) | Silicon nitride powder, silicon nitride sintered body and circuit board, and method for producing silicon nitride powder | |
TWI732944B (en) | Spinel powder containing magnesium oxide and its manufacturing method | |
Wang et al. | Two-step preparation of AlON transparent ceramics with powder synthesized by aluminothermic reduction and nitridation method | |
JP7185865B2 (en) | Method for producing spherical AlN particles | |
KR20140096282A (en) | METHOD FOR MAKING A DENSE SiC BASED CERAMIC PRODUCT | |
Duan et al. | Low temperature pressureless sintering of silicon nitride ceramics for circuit substrates in powder electronic devices | |
CN108059447A (en) | A kind of big crystallization sintering plate corundum and preparation method thereof | |
JP2011528312A (en) | Process for preparing silicon carbide parts that do not require sintering additives | |
TW202140407A (en) | Silicon nitride powder, and method for producing silicon nitride sintered body | |
US20190276369A1 (en) | Oriented aln sintered body and method for producing the same | |
WO2023176893A1 (en) | Silicon nitride powder and method for producing silicon nitride sintered body | |
TW202028154A (en) | Mullite-base sintered compact and method for producing same | |
TW202140371A (en) | Silicon nitride powder, and method for producing silicon nitride sintered body | |
Hongzhi et al. | Synthesis of porous Al2TiO5 ceramic by reaction sintering method | |
JP3389642B2 (en) | Method for producing low soda alumina | |
KR101143312B1 (en) | Heat shielding materials with excellent heat resistance and manufacturing method of the same | |
Chen et al. | Preparation of γ-AlON transparent ceramics by pressureless sintering | |
Awaad et al. | Densification, mechanical and microstructure properties of β-spodumene—alumina composites | |
TW202144283A (en) | Silicon nitride powder, and method for producing silicon nitride sintered body | |
JP2020200219A (en) | Method for producing aluminum nitride powder and method for controlling specific surface area of aluminum nitride powder | |
CN108358628B (en) | Mullite-zirconia composite ceramic and preparation method thereof | |
RU2641358C2 (en) | Method of obtaining technological trainings of ceramic articles from silicon nitride | |
TW202140372A (en) | Silicon nitride powder, and method for producing silicon nitride sintered body | |
TW202142485A (en) | Silicon nitride powder, and method for producing silicon nitride sintered body |