TW202132755A - Optical testing device - Google Patents

Optical testing device Download PDF

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TW202132755A
TW202132755A TW109113151A TW109113151A TW202132755A TW 202132755 A TW202132755 A TW 202132755A TW 109113151 A TW109113151 A TW 109113151A TW 109113151 A TW109113151 A TW 109113151A TW 202132755 A TW202132755 A TW 202132755A
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target
optical
light
under test
optical device
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TW109113151A
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楊世豪
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九驊科技股份有限公司
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Abstract

An optical testing device is used to detect a first optical device to be tested whose optical path is non-linear. The optical testing device includes a target, a light source and an image sensing module. The light source is used to form a light beam, which is suitable for illuminating the first optical device to be tested after penetrating the target. The image sensing module is configured to receive the light beam from the first optical device, and is used to capture an image including a pattern of the target. The target is disposed at a position where the light from the light source cannot directly enter the image sensing module after passing through the target, but can enter the image sensing module after passing through the first optical device.

Description

光學檢測裝置 Optical detection device

一種光學檢測裝置,尤其關於一種光學檢測裝置,其能夠符合不同鏡頭或影像模組所需要的測試條件。 An optical detection device, in particular, an optical detection device, which can meet the test conditions required by different lenses or image modules.

不同光學產品因應用的不同,所以其在檢測上也需要提供一類似且相應的測試條件,例如包括視角(FOV, Field of View)及物距,如何在一有限空間上提供可滿足不同物距及視角等架構實為重要,如一般市面相機鏡頭、監視器或望遠鏡等物距是幾米或上千米,而視角則可能從2度到165度甚至更大等。 Different optical products have different applications, so they also need to provide a similar and corresponding test condition for detection, such as FOV (Field of View) and object distance. How to provide it in a limited space to meet different object distances The structure and the angle of view are really important. For example, the object distance of general market camera lenses, monitors or telescopes is a few meters or thousands of meters, and the angle of view may be from 2 degrees to 165 degrees or even greater.

圖1顯示習知技術之可縮短物距的光學模擬裝置的示意圖。圖1為臺灣公開第201409007號所揭示的一可縮短物距的技術。請參閱圖1,可縮短物距的光學模擬裝置3,用以將一測試屏幕2的影像投射於置於光學模擬裝置3出瞳位置的待測鏡頭1,而能夠使用一較短的物距u,讓該待測鏡頭1擷取到一較大的虛擬屏幕2’。依據圖1的習知技術,可針對遠物距,利用中繼鏡頭(Relay Lens)縮短實際距離,但類似架構對廣角或魚眼鏡頭或影像模組而言,中繼鏡頭的設計及製作上有相當的困難度。 FIG. 1 shows a schematic diagram of a conventional optical simulation device capable of shortening the object distance. Figure 1 shows a technology that can shorten the object distance disclosed in Taiwan Publication No. 201409007. Please refer to Fig. 1, an optical simulation device 3 capable of shortening the object distance for projecting an image of a test screen 2 on the test lens 1 placed at the exit pupil of the optical simulation device 3, and can use a shorter object distance u, let the lens to be tested 1 capture a larger virtual screen 2'. According to the conventional technology in Figure 1, relay lenses can be used to shorten the actual distance for long-object distances. However, similar architectures are used for wide-angle or fisheye lenses or image modules. The design and production of relay lenses are There is considerable difficulty.

臺灣專利第I282900號揭示另一種縮短光程之光學系統的技術,其加入一等效透鏡及透過調整鏡間距等模擬產生所需物距,相同的在廣角或魚眼鏡頭的測試時該等效透鏡的設計及製作一樣有相當難度。 Taiwan Patent No. I282900 discloses another optical system technology that shortens the optical path. It adds an equivalent lens and simulates the required object distance by adjusting the distance between the lenses. The same is equivalent in the test of a wide-angle or fisheye lens. The design and production of the lens are equally difficult.

圖2顯示習知用以檢測鏡頭之鏡頭檢測裝置的示意圖。圖2的技術為無限-有限距共軛系統。如圖2所示,鏡頭檢測裝置100包含一標靶110、一光源120、一待測鏡頭130、多個望遠影像模組140及一弧面軌道150。光源120的光線穿透標靶110,標靶110上刻有所需分析的圖案,隨後光線再經由待測鏡頭130投影至一望遠影像模組140。望遠影像模組140包含一望遠鏡頭141及一影像感測器142。望遠鏡頭141提供一無窮遠物距,影像感測器142則取得包含標靶110的圖案的影像,並利用電腦及軟體演算(未圖示)得知該影像品質。於圖2所示的鏡頭檢測裝置100,可安裝有多組的望遠影像模組140,以便同時測得不同視角(field of view,FOV)之影像品質,且望遠影像模組140視需求也可以沿弧面軌道150的弧面移動即可測得另一不同視角的影像品質,此架構優點為對廣角鏡頭而言限制較少。 Fig. 2 shows a schematic diagram of a conventional lens detection device for detecting a lens. The technology of Figure 2 is an infinite-finite distance conjugate system. As shown in FIG. 2, the lens inspection device 100 includes a target 110, a light source 120, a lens 130 to be tested, a plurality of telephoto image modules 140 and a curved track 150. The light from the light source 120 penetrates the target 110, the target 110 is engraved with a pattern to be analyzed, and then the light is projected to a telephoto image module 140 through the lens 130 to be measured. The telephoto image module 140 includes a telephoto lens 141 and an image sensor 142. The telephoto lens 141 provides an infinite object distance, and the image sensor 142 obtains an image containing the pattern of the target 110, and uses a computer and software calculations (not shown) to obtain the image quality. In the lens inspection device 100 shown in FIG. 2, multiple sets of telephoto image modules 140 can be installed to measure the image quality of different field of view (FOV) at the same time, and the telephoto image module 140 can also be used as required. Moving along the curved surface of the curved track 150 can measure the image quality of another different viewing angle. The advantage of this architecture is that there are fewer restrictions on the wide-angle lens.

圖3顯示圖2習知技術之鏡頭及影像模組檢測裝置的一使用狀態的示意圖。如圖3所示,依據圖2習知技術,將多個望遠影像模組140置於弧面軌道250的中間部分,用以量測待測光學裝置230的中心部分的光學性質時,因望遠影像模組140間的機構干涉,只能夠量測大於特定規格的視角。習知技術的缺點在於當視角小於特定規格時則而無法量測。 FIG. 3 shows a schematic diagram of a use state of the lens and image module detection device of the prior art of FIG. 2. As shown in FIG. 3, according to the conventional technology of FIG. 2, when a plurality of telephoto image modules 140 are placed in the middle part of the curved track 250 to measure the optical properties of the central part of the optical device 230 to be tested, the telephoto The mechanism interference between the image modules 140 can only measure the viewing angle greater than a specific specification. The disadvantage of the conventional technology is that it cannot be measured when the viewing angle is smaller than a specific specification.

為了克服視角量測限制的問題,臺灣專利第M567860號,揭示一種光學檢測裝置,用以檢測一待測光學裝置且具有視角量測限制小之特點。然而,依據前述該些習知技術,依然還有改進的空間。 In order to overcome the problem of viewing angle measurement limitation, Taiwan Patent No. M567860 discloses an optical detection device for detecting an optical device to be tested and has the feature of small viewing angle measurement limitation. However, based on the aforementioned conventional technologies, there is still room for improvement.

依據本發明一實施例之目的在於,提供一種光學檢測裝置,用以檢測其光路為非直線的一第一待測光學裝置。依據本發明另一實施例之目的在於,提供一種光學檢測裝置,用以檢測其光路為非直線的一第一待測光學裝置及一第二待測光學裝置,且該第一待測光學裝置相異於該第二待測光學裝置。 An objective of an embodiment according to the present invention is to provide an optical detection device for detecting a first optical device under test whose optical path is non-linear. According to another embodiment of the present invention, an object is to provide an optical detection device for detecting a first optical device under test and a second optical device under test whose optical paths are non-linear, and the first optical device under test It is different from the second optical device under test.

一實施例中,提供一種光學檢測裝置,用以檢測其光路為非直線的一第一待測光學裝置。光學檢測裝置包含一標靶、一光源及一影像感測模組。光源用以形成一光線,該光線適於穿透標靶後照射第一待測光學裝置。影像感測模組設置成能夠接收來自第一待測光學裝置的該光線,用以擷取一包含標靶之圖案的影像。標靶設置在光源的該光線通過標靶後,無法直接進入影像感測模組,但能夠在通過第一待測光學裝置後進入影像感測模組的位置。 In one embodiment, an optical detection device is provided for detecting a first optical device under test whose optical path is non-linear. The optical detection device includes a target, a light source and an image sensing module. The light source is used for forming a light, which is suitable for irradiating the first optical device under test after penetrating the target. The image sensing module is configured to receive the light from the first optical device to be tested for capturing an image containing a pattern of the target. The target is set in the light source after the light passes through the target, and cannot directly enter the image sensing module, but can enter the position of the image sensing module after passing through the first optical device to be tested.

一實施例中,提供一種光學檢測裝置,用以檢測其光路為非直線的一 第一待測光學裝置及一第二待測光學裝置,且該第一待測光學裝置相異於該第二待測光學裝置。光學檢測裝置包含:一標靶、一光源、一影像感測模組及一標靶移動機構。光源用以形成一光線,該光線適於穿透該標靶後照射該第一待測光學裝置或該第二待測光學裝置。影像感測模組,接收來自該第一待測光學裝置或該第二待測光學裝置的該光線,用以擷取一包含該標靶之圖案的影像。標靶移動機構,連接於該標靶。該標靶移動機構構成為具有:用以檢測該第一待測光學裝置的一第一狀態;以及用以檢測該第二待測光學裝置的一第二狀態。在該第一狀態時,構成為能夠使通過該標靶的該光線,在通過該第一待測光學裝置後,能夠進入該影像感測模組,而且,該標靶設置在該光源的該光線通過該標靶後,無法直接進入該影像感測模組,但能夠在通過該第一待測光學裝置後進入該影像感測模組的位置。在該第二狀態時,構成為能夠使通過該標靶的該光線,在通過該第二待測光學裝置後,能夠進入該影像感測模組。 In one embodiment, an optical detection device is provided for detecting a non-linear optical path. A first optical device under test and a second optical device under test, and the first optical device under test is different from the second optical device under test. The optical detection device includes: a target, a light source, an image sensing module, and a target moving mechanism. The light source is used for forming a light beam suitable for irradiating the first optical device under test or the second optical device under test after penetrating the target. The image sensing module receives the light from the first optical device under test or the second optical device under test, and is used to capture an image containing the pattern of the target. The target moving mechanism is connected to the target. The target moving mechanism is configured to have: a first state for detecting the first optical device under test; and a second state for detecting the second optical device under test. In the first state, it is configured to enable the light passing through the target to enter the image sensing module after passing through the first optical device to be measured, and the target is set on the light source. After passing through the target, light cannot directly enter the image sensing module, but can enter the position of the image sensing module after passing through the first optical device to be measured. In the second state, it is configured to enable the light passing through the target to enter the image sensing module after passing through the second optical device to be measured.

一實施例中,該第二待測光學裝置的光路為直線。 In an embodiment, the optical path of the second optical device under test is a straight line.

一實施例中,標靶移動機構包含:一標靶固定座、一光路改變元件及一標靶位移裝置。該標靶設於該標靶固定座並面向一第一方向。該光路改變元件設於標靶固定座並面向一第二方向,該第一方向相異於該第二方向,而且該光路改變元件設置成在該第一狀態時將來自該第一待測光學裝置的該光線,傳送至該影像感測模組。該標靶固定座連接於該標靶位移裝置,並且該標靶固定座能夠在該標靶位移裝置的一第一位置及一第二位置 間移動,其中在該標靶移動機構的該第一狀態時,該標靶固定座在該第一位置,而在該標靶移動機構的該第二狀態時,該標靶固定座在該第二位置。 In one embodiment, the target moving mechanism includes: a target fixing seat, an optical path changing element, and a target displacement device. The target is arranged on the target fixing seat and faces a first direction. The optical path changing element is arranged on the target holder and faces a second direction, the first direction is different from the second direction, and the optical path changing element is arranged to be from the first optical under test in the first state The light of the device is transmitted to the image sensing module. The target holder is connected to the target displacement device, and the target holder can be in a first position and a second position of the target displacement device In the first state of the target moving mechanism, the target fixing seat is in the first position, and in the second state of the target moving mechanism, the target fixing seat is in the first position. Two positions.

一實施例中,該標靶位於面向該第一待測光學裝置的一入光側處,而該光路改變元件位於面向該第一待測光學裝置的一出光側且能夠讓該光線進入該影像感測模組的位置處。或者,在該第一方向上,該光路改變元件與該標靶分別位於不相同的位置。或者,該光路改變元件與該標靶為在該第一方向上錯開的位置。 In one embodiment, the target is located on a light-incident side facing the first optical device under test, and the light path changing element is located on a light-emitting side facing the first optical device under test and can allow the light to enter the image The location of the sensing module. Or, in the first direction, the light path changing element and the target are respectively located at different positions. Alternatively, the light path changing element and the target are at positions staggered in the first direction.

一實施例中,光學檢測裝置更包含一第一調整軸模組,第一調整軸模組設置於該標靶固定座,且連接於該標靶,用以調整該標靶的方位。 In one embodiment, the optical detection device further includes a first adjustment axis module. The first adjustment axis module is disposed on the target fixing base and connected to the target for adjusting the position of the target.

一實施例中,光學檢測裝置更包含一第二調整軸模組,第二調整軸模組設置於該標靶固定座,且連接於該光路改變元件,用以調整該光路改變元件的方位。 In one embodiment, the optical detection device further includes a second adjustment axis module. The second adjustment axis module is disposed on the target holder and connected to the optical path changing element for adjusting the position of the optical path changing element.

一實施例中,該第一調整軸模組或該第二調整軸模組包含至少一維度調整裝置。或者,該第一調整軸模組或該第二調整軸模組包含一五軸調整裝置。 In one embodiment, the first adjustment axis module or the second adjustment axis module includes at least one dimension adjustment device. Alternatively, the first adjustment axis module or the second adjustment axis module includes a five-axis adjustment device.

一實施例中,影像感測模組包含:一軌道、至少一望遠影像模組、至少一影像感測器及一換位機構。至少一望遠影像模組置於該軌道上,而且 該至少一望遠影像模組適於形成一無窮遠物距,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。至少一影像感測器,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。標靶移動機構可移動地設置於該換位機構且選擇性地位於一第一光路狀態位置或一第二光路狀態位置,藉以分別使該至少一影像感測器及該標靶位於一第一光路狀態或一第二光路狀態。在該第一光路狀態時,該至少一影像感測器能夠接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。在該第二光路狀態時,該至少一影像感測器不接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。 In one embodiment, the image sensor module includes: a track, at least one telephoto image module, at least one image sensor, and a transposition mechanism. At least one telephoto image module is placed on the track, and The at least one telephoto image module is adapted to form an infinite object distance, and is adapted to receive the light from the first optical device under test or the second optical device under test. At least one image sensor is adapted to receive the light from the first optical device under test or the second optical device under test. The target moving mechanism is movably disposed on the transposition mechanism and is selectively located at a first light path state position or a second light path state position, so that the at least one image sensor and the target are respectively located at a first Optical path state or a second optical path state. In the first light path state, the at least one image sensor can receive the light from the first optical device under test or the second optical device under test. In the second optical path state, the at least one image sensor does not receive the light from the first optical device under test or the second optical device under test.

一實施例中,影像感測模組包含:一軌道、至少一望遠影像模組、至少一影像感測器、另一光路改變元件及一換位機構。至少一望遠影像模組置於該軌道上,而且該至少一望遠影像模組適於形成一無窮遠物距,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。至少一影像感測器適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。換位機構支持該另一光路改變元件,而且選擇性地使該另一光路改變元件位於一第一光路狀態位置或一第二光路狀態位置,藉以分別使該至少一影像感測器及該標靶位於一第一光路狀態或一第二光路狀態。在該第一光路狀態時,該至少一影像感測器能夠接收來自該第一待測光學裝置或該第二待測光學裝置的該光線;而在該第二光路狀態時,該至少一影像感測器不接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。 In one embodiment, the image sensor module includes: a track, at least one telephoto image module, at least one image sensor, another optical path changing element, and a transposition mechanism. At least one telephoto image module is placed on the track, and the at least one telephoto image module is adapted to form an infinite object distance, and is adapted to receive the first optical device under test or the second optical device under test Light. At least one image sensor is adapted to receive the light from the first optical device under test or the second optical device under test. The transposition mechanism supports the other optical path changing element, and selectively positions the another optical path changing element at a first optical path state position or a second optical path state position, so that the at least one image sensor and the mark are respectively The target is in a first light path state or a second light path state. In the first optical path state, the at least one image sensor can receive the light from the first optical device under test or the second optical device under test; and in the second optical path state, the at least one image The sensor does not receive the light from the first optical device under test or the second optical device under test.

依據本發明一實施例的光學檢測裝置,能夠檢測光路為非直線的一第一待測光學裝置。依據本發明另一實施例的光學檢測裝置,能夠兼顧地檢測其光路為非直線的一第一待測光學裝置及一第二待測光學裝置,且該第一待測光學裝置相異於該第二待測光學裝置。 According to the optical detection device of an embodiment of the present invention, a first optical device to be tested whose optical path is non-linear can be detected. According to another embodiment of the optical detection device of the present invention, a first optical device under test and a second optical device under test whose optical paths are non-linear can be detected simultaneously, and the first optical device under test is different from the first optical device under test. The second optical device to be tested.

100:鏡頭檢測裝置 100: Lens detection device

110:標靶 110: Target

120:光源 120: light source

130:待測鏡頭 130: lens to be tested

140:望遠影像模組 140: Telephoto image module

141:望遠鏡頭 141: Telescope lens

142:影像感測器 142: Image Sensor

150:弧面軌道 150: curved track

200-205:光學檢測裝置 200-205: Optical detection device

210:標靶 210: Target

220:光源 220: light source

231:第一待測光學裝置 231: The first optical device to be tested

232:第二待測光學裝置 232: The second optical device to be tested

240:望遠影像模組 240: Telephoto image module

240a:望遠影像模組 240a: Telephoto image module

241:望遠鏡頭 241: Telescope lens

242:影像感測器 242: Image Sensor

245:影像感測器 245: Image Sensor

250:弧面軌道 250: curved track

251:第一軌道 251: The First Track

252:第二軌道 252: The second track

260:中繼鏡頭 260: Relay lens

270:標靶移動機構 270: Target Moving Mechanism

271:標靶位移裝置 271: Target Displacement Device

272:標靶固定座 272: Target holder

273:延伸臂 273: Extension Arm

274:光路改變元件 274: Optical Path Change Element

280:調整軸模組 280: Adjust axis module

280a:調整軸模組 280a: Adjust the axis module

280b:調整軸模組 280b: Adjust the axis module

281:第一維度調整裝置 281: The first dimension adjustment device

282:第二維度調整裝置 282: Second Dimension Adjustment Device

289:計算機 289: Computer

291:感測器固定座 291: sensor mount

292:距離調整裝置 292: Distance Adjustment Device

340:影像感測模組 340: Image sensor module

370:換位機構 370: Transposition Mechanism

374:光路改變元件 374: Optical Path Change Element

圖1顯示習知技術之鏡頭及影像模組檢測裝置的示意圖。 Figure 1 shows a schematic diagram of a conventional lens and image module detection device.

圖2顯示另一習知技術之鏡頭及影像模組檢測裝置的示意圖。 FIG. 2 shows a schematic diagram of another conventional lens and image module detection device.

圖3顯示圖2習知技術之鏡頭及影像模組檢測裝置的一使用狀態的示意圖。 FIG. 3 shows a schematic diagram of a use state of the lens and image module detection device of the prior art of FIG. 2.

圖4顯示本發明一實施例之光學檢測裝置的示意圖。 FIG. 4 shows a schematic diagram of an optical detection device according to an embodiment of the invention.

圖5a顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。 FIG. 5a shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention.

圖5b顯示圖5a實施例之光學檢測裝置的一第二狀態的示意圖。 Fig. 5b shows a schematic diagram of a second state of the optical detection device of the embodiment of Fig. 5a.

圖6a顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。 FIG. 6a shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention.

圖6b顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。 FIG. 6b shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention.

圖7顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。 FIG. 7 shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention.

圖8顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。 FIG. 8 shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention.

潛望式鏡頭(Periscope Lens),是一種利用光線反射原理所製作的光 學儀器。潛望式鏡頭,可以包含有“潛望鏡式變焦”功能,俗稱“內變焦”功能,由於其光學變焦是在機身內部完成,所以可以很容易安裝濾鏡,無需額外安裝鏡頭筒。由於鏡筒長度固定不變,可以非常方便地進行密封處理,所以密封性會更好。隨著科技的不斷進步,潛望式鏡頭已經不僅僅只應用在數位相機上,在一些手機產品上也得到了廣泛應用。 Periscope Lens (Periscope Lens) is a kind of light made by the principle of light reflection Learn instrument. The periscope lens can include the "periscope zoom" function, commonly known as the "internal zoom" function. Since the optical zoom is done inside the body, the filter can be easily installed without the need for an additional lens barrel. Since the length of the lens barrel is fixed, the sealing process can be carried out very conveniently, so the sealing performance will be better. With the continuous advancement of technology, the periscope lens has not only been used in digital cameras, but has also been widely used in some mobile phone products.

依據本發明一實施例,提供一種光學檢測裝置其能夠用以檢測潛望式鏡頭。依據本發明另一實施例,提供一種光學檢測裝置,其具有一可切換的轉向光路結構。較佳地,該光學檢測裝置能夠兼顧一般的鏡頭以及一潛望式鏡頭的檢測功能。更具體的說明,如下。 According to an embodiment of the present invention, an optical detection device is provided which can be used to detect a periscope lens. According to another embodiment of the present invention, an optical detection device is provided, which has a switchable turning light path structure. Preferably, the optical detection device can take into account the detection functions of a general lens and a periscope lens. A more specific description is as follows.

圖4顯示本發明一實施例之光學檢測裝置的示意圖。如圖4所示,光學檢測裝置200用以檢測一第一待測光學裝置231,其包含一光源220、一標靶210及一影像感測模組340。於一實施例中,可以更包含有一調整軸模組280。於另一實施例中,可以更包含有一計算機289。於一實施例中,光源220的光線穿透標靶210,標靶210上刻有所需分析的圖案,隨後光線再經由第一待測光學裝置231投影至一影像感測模組340。影像感測模組340用以擷取一包含標靶210之圖案的影像。於一實施例中,影像感測模組340包含多個望遠影像模組240及多個影像感測器245。詳言之,影像感測模組340的影像感測器245擷取一包含標靶210之圖案的影像,而其望遠影像模組240能夠形成一無窮遠物距並擷取一影像,更具體而言望遠影像模組240包含一望遠鏡頭241及一影像感測器242。望遠鏡頭241提供一無窮遠物距,影像感測器 242則擷取一包含標靶210之圖案的影像。 FIG. 4 shows a schematic diagram of an optical detection device according to an embodiment of the invention. As shown in FIG. 4, the optical detection device 200 is used to detect a first optical device to be tested 231, which includes a light source 220, a target 210 and an image sensing module 340. In one embodiment, an adjustment axis module 280 may be further included. In another embodiment, a computer 289 may be further included. In one embodiment, the light from the light source 220 penetrates the target 210, the target 210 is engraved with the pattern to be analyzed, and then the light is projected to an image sensing module 340 through the first optical device 231 to be tested. The image sensing module 340 is used to capture an image including the pattern of the target 210. In one embodiment, the image sensor module 340 includes a plurality of telephoto image modules 240 and a plurality of image sensors 245. In detail, the image sensor 245 of the image sensor module 340 captures an image containing the pattern of the target 210, and the telephoto image module 240 can form an infinite object distance and capture an image, more specifically In other words, the telephoto image module 240 includes a telephoto lens 241 and an image sensor 242. Telescope lens 241 provides an infinite object distance, image sensor 242 captures an image containing the pattern of the target 210.

光學檢測裝置200利用儲存有軟體演算的計算機289,計算影像感測模組340所擷取的該影像,藉以得知該影像品質,以檢測得第一待測光學裝置231的特性。 The optical inspection device 200 uses a computer 289 that stores software calculations to calculate the image captured by the image sensing module 340, so as to know the image quality to detect the characteristics of the first optical device 231 under test.

一實施例中,第一待測光學裝置231可以為一種光路為非直線的光學裝置,較佳地可以為潛望式鏡頭。在圖4中,第一待測光學裝置231的光路為非直線,且是光線從左側進且從上側出,亦即光路進行了90度的轉折。因此,標靶210設置在「光源220的光線通過標靶210後,無法直接進入影像感測模組340(於一實施例中,光線無法進入望遠影像模組240或影像感測器245),但能夠在通過第一待測光學裝置231後進入影像感測模組340」的位置。於圖4實施例中,標靶210面向一第一側,而第一待測光學裝置231的出光面面向於一第二側,而且該第一側不相同於該第二側。較佳的情況是,該第一側大致垂直於該第二側。所謂「大致垂直於」是指兩者間的角度介於約80度至100度之間。 In an embodiment, the first optical device to be tested 231 may be an optical device with a non-linear optical path, preferably a periscope lens. In FIG. 4, the optical path of the first optical device to be tested 231 is non-linear, and the light enters from the left side and exits from the upper side, that is, the optical path turns 90 degrees. Therefore, the target 210 is set at "after the light from the light source 220 passes through the target 210, it cannot directly enter the image sensor module 340 (in one embodiment, the light cannot enter the telephoto image module 240 or the image sensor 245). However, it can enter the position of the image sensing module 340″ after passing through the first optical device 231 to be tested. In the embodiment of FIG. 4, the target 210 faces a first side, and the light-emitting surface of the first optical device 231 under test faces a second side, and the first side is different from the second side. Preferably, the first side is substantially perpendicular to the second side. The so-called "substantially perpendicular to" means that the angle between the two is between about 80 degrees and 100 degrees.

調整軸模組280連接於標靶210,用以調整標靶210的方位。於一實施例中,調整軸模組280可以包含至少一維度調整裝置,較佳的情況是例如包含一第一維度調整裝置281及一第二維度調整裝置282,分別用以調整第一維度及第二維度的值,其中第一維度相異於第二維度。於一實施例中,第一維度或第二維度可以為x線性軸、y線性軸、z線性軸、第一旋轉軸及第二 旋轉軸其中之一。於一實施例中,調整軸模組280為一種五軸調整裝置,其具有可調整的3個線性軸及2個旋轉軸。計算機289可以為電腦、個人電腦、平板電腦、筆記型電腦和智慧型手機等能夠進行計算的裝置。較佳地,可以為根據一系列指令指示並且自動執行任意算術或邏輯操作序列的裝置。於一實施例中,調整軸模組280亦可以耦接於計算機289,計算機289可以控制調整軸模組280,使標靶210位於適當的檢測位置。 The adjustment axis module 280 is connected to the target 210 for adjusting the position of the target 210. In one embodiment, the adjustment axis module 280 may include at least one dimension adjustment device, preferably, for example, a first dimension adjustment device 281 and a second dimension adjustment device 282 for adjusting the first dimension and The value of the second dimension, where the first dimension is different from the second dimension. In an embodiment, the first dimension or the second dimension may be the x linear axis, the y linear axis, the z linear axis, the first rotation axis, and the second dimension. One of the rotation axis. In one embodiment, the adjustment axis module 280 is a five-axis adjustment device, which has 3 adjustable linear axes and 2 rotary axes. The computer 289 may be a device capable of performing calculations such as a computer, a personal computer, a tablet computer, a notebook computer, and a smart phone. Preferably, it may be a device that automatically executes any sequence of arithmetic or logic operations according to a series of instructions. In one embodiment, the adjustment axis module 280 can also be coupled to the computer 289, and the computer 289 can control the adjustment axis module 280 so that the target 210 is located at an appropriate detection position.

一實施例中,光學檢測裝置200可以更包含一弧面軌道250。如圖4所示,弧面軌道250的中間部分呈現中空狀態,藉以該些影像感測器245及標靶210位於一第一光路狀態時,讓光源220的光線通過該中間部分,最後再進入至該些影像感測器245。更具體而言,弧面軌道250包含一第一軌道251及一第二軌道252,第一軌道251及第二軌道252間隔著一預定距離,使得弧面軌道250的中間部分呈現中空狀態,而讓光源220的光線通過,最後再進入至該些影像感測器245。依據習知技術,當視角小於特定規格時無法量測,然而依據前述設計,即使視角小於特定規格,亦能夠進行量測。 In an embodiment, the optical inspection device 200 may further include a curved track 250. As shown in FIG. 4, the middle part of the curved track 250 is in a hollow state, so that when the image sensors 245 and the target 210 are in a first light path state, the light from the light source 220 passes through the middle part, and finally enters To the image sensors 245. More specifically, the arcuate track 250 includes a first track 251 and a second track 252. The first track 251 and the second track 252 are separated by a predetermined distance, so that the middle portion of the arcuate track 250 is hollow, and The light from the light source 220 passes through, and finally enters the image sensors 245. According to the conventional technology, it cannot be measured when the viewing angle is smaller than a specific specification. However, according to the aforementioned design, even if the viewing angle is smaller than the specified specification, measurement can be performed.

一實施例中,光學檢測裝置200可以更包含一延伸臂273,其連接並固定望遠影像模組240a,能夠選擇性地移動望遠影像模組240a使其延伸至弧面軌道250之中間。依據本實施例,弧面軌道250的中間部分呈現中空狀態,會有中間部分無法用望遠影像模組240進行量測的問題。有鑑於此,於一實施例中,使延伸臂273連接至該些望遠影像模組240中的位於弧面軌道250之中間的一望遠影像模組240a,延伸臂273用以移動望遠影像模組240a,使望 遠影像模組240a選擇性地位於弧面軌道250的中間部分及不位於中間部分。更具體而言,在第二光路狀態時,望遠影像模組240a更位於弧面軌道250的中間部分,使標靶210不面向該些影像感測器245;而在第一光路狀態時,望遠影像模組240a不位於弧面軌道250的中間部分,使標靶210面向該些影像感測器245。不同於習知技術,本實施例利用手動或電動馬達或類似的換位機構,使中心的望遠影像模組240a可位移,較佳地位移至不遮到較小視角的有效光路,而較小視角之檢測改由以實際物距搭配影像感測作相關光學品質檢測。 In one embodiment, the optical detection device 200 may further include an extension arm 273 connected to and fixed to the telephoto image module 240a, and capable of selectively moving the telephoto image module 240a to extend to the middle of the curved track 250. According to this embodiment, the middle part of the curved track 250 is hollow, and there is a problem that the middle part cannot be measured by the telephoto image module 240. In view of this, in one embodiment, the extension arm 273 is connected to a telephoto image module 240a in the middle of the curved track 250 among the telephoto image modules 240, and the extension arm 273 is used to move the telephoto image module 240a, make hope The tele image module 240a is selectively located in the middle part of the curved track 250 and not in the middle part. More specifically, in the second optical path state, the telephoto image module 240a is further located in the middle part of the curved track 250, so that the target 210 does not face the image sensors 245; and in the first optical path state, the telephoto module 240a The image module 240a is not located in the middle part of the curved track 250, so that the target 210 faces the image sensors 245. Different from the prior art, this embodiment uses a manual or electric motor or similar transposition mechanism to make the central telephoto image module 240a displaceable, and preferably displaces to the effective light path that does not cover the smaller viewing angle, and is smaller. The inspection of the viewing angle is changed to use the actual object distance with image sensing for related optical quality inspection.

一實施例中,光學檢測裝置200可以更包含一中繼鏡頭260,中繼鏡頭260位於弧面軌道250的中間部分,適於使光源220的光線通過中繼鏡頭260的內部後,再進入至該些影像感測器245。中繼鏡頭260能夠調整物距的大小,因此依據本實施例中,當小視角物距甚遠時,能夠利用中繼鏡頭260調整物距的大小,而達到縮小檢測設備的體積的功效。依據本實施例,在光學檢測裝置200中心加入中繼鏡頭260,用以測試較小視角及縮短物距。由於影像感測器245至中繼鏡頭260距離為可調變,而能夠模擬不同物距條件等。 In an embodiment, the optical detection device 200 may further include a relay lens 260, which is located in the middle part of the curved track 250, and is adapted to allow the light from the light source 220 to pass through the interior of the relay lens 260 and then enter the relay lens 260. The image sensors 245. The relay lens 260 can adjust the size of the object distance. Therefore, according to this embodiment, when the small angle of view and the object distance are far away, the relay lens 260 can be used to adjust the size of the object distance, so as to achieve the effect of reducing the size of the detection device. According to this embodiment, a relay lens 260 is added to the center of the optical inspection device 200 to test a smaller viewing angle and shorten the object distance. Since the distance from the image sensor 245 to the relay lens 260 is adjustable, it can simulate different object distance conditions.

一實施例中,光學檢測裝置200可以更包含一感測器固定座291及一距離調整裝置292。該些影像感測器245設於感測器固定座291上,且感測器固定座291連接於距離調整裝置292,距離調整裝置292用以改變該些影像感測器245與第一待測光學裝置231間的距離。一實施例中,感測器固定座291能 夠在距離調整裝置292上移動,較佳地在距離調整裝置292的長軸上移動,如此,能夠改變該些影像感測器245與第一待測光學裝置231間的距離。當將中繼鏡頭260移除或更新不同的中繼鏡頭260時,可以調整該些影像感測器245與第一待測光學裝置231間的距離,以將該些影像感測器245設置在適當的位置上。 In an embodiment, the optical inspection device 200 may further include a sensor fixing base 291 and a distance adjusting device 292. The image sensors 245 are arranged on the sensor fixing base 291, and the sensor fixing base 291 is connected to the distance adjusting device 292, which is used to change the image sensors 245 and the first to-be-tested The distance between the optical devices 231. In one embodiment, the sensor holder 291 can It can move on the distance adjusting device 292, preferably on the long axis of the distance adjusting device 292, so that the distance between the image sensors 245 and the first optical device 231 under test can be changed. When the relay lens 260 is removed or a different relay lens 260 is updated, the distance between the image sensors 245 and the first optical device 231 to be tested can be adjusted to set the image sensors 245 at In the right place.

於一實施例中,適於使該些影像感測器245及標靶210位於一第一光路狀態或一第二光路狀態。在第一光路狀態時,該些影像感測器245能夠接收來自第一待測光學裝置231的光線;而在第二光路狀態時,該些影像感測器245不接收來自第一待測光學裝置231的光線。於本實施例中,在第一光路狀態時,標靶210面向該些影像感測器245,以接收光線並擷取一影像;而在第二光路狀態時,標靶210不面向該些影像感測器245。 In one embodiment, it is suitable for the image sensors 245 and the target 210 to be in a first light path state or a second light path state. In the first optical path state, the image sensors 245 can receive light from the first optical device to be tested 231; while in the second optical path state, the image sensors 245 do not receive light from the first optical device to be tested The light of the device 231. In this embodiment, in the first light path state, the target 210 faces the image sensors 245 to receive light and capture an image; and in the second light path state, the target 210 does not face the images感器245.

圖5a顯示本發明一實施例之光學檢測裝置的一狀態的示意圖。圖5b顯示圖5a實施例之光學檢測裝置的另一狀態的示意圖。圖5a及5b的實施例類似於圖4的實施例,因此相同的元件使用相同符號,且省略其相關說明。如圖5a及5b所示,依據本發明一實施例,提供一種光學檢測裝置201其能夠兼顧地檢測兩種不同的第一待測光學裝置231及第二待測光學裝置232。一實施例中,第一待測光學裝置231為一光路為非直線的光學裝置,而第二待測光學裝置232為一光路為直線的光學裝置。 FIG. 5a shows a schematic diagram of a state of the optical detection device according to an embodiment of the present invention. Fig. 5b shows a schematic diagram of another state of the optical detection device of the embodiment of Fig. 5a. The embodiments of FIGS. 5a and 5b are similar to the embodiment of FIG. 4, so the same elements use the same symbols, and related descriptions are omitted. As shown in FIGS. 5a and 5b, according to an embodiment of the present invention, an optical detection device 201 is provided, which can simultaneously detect two different first optical devices to be tested 231 and second optical devices 232 to be tested. In one embodiment, the first optical device under test 231 is an optical device with a non-linear optical path, and the second optical device under test 232 is an optical device with a linear optical path.

於一實施例中,可以更包含一標靶移動機構270其構成為具有一第一 狀態及一第二狀態。第一狀態用以檢測第一待測光學裝置231,而第二狀態用以檢測第二待測光學裝置232。標靶移動機構270在該第一狀態時,能夠使通過標靶210的來自光源220的光線,在通過第一待測光學裝置231後,能夠進入影像感測模組340;而且在該第二狀態時,能夠使通過標靶210的來自光源220的光線,在通過第二待測光學裝置232後,能夠進入影像感測模組340。如此,能夠讓影像感測模組340能擷取通過第一待測光學裝置231及第二待測光學裝置232的一包含標靶210之圖案的影像。接著,光學檢測裝置201利用儲存有軟體演算的計算機289計算該影像,藉以得知該影像品質,而能夠達到兼顧地檢測兩種不同的待測光學裝置的功能。 In an embodiment, a target moving mechanism 270 may be further included, which is configured to have a first State and a second state. The first state is used to detect the first optical device to be tested 231, and the second state is used to detect the second optical device to be tested 232. When the target moving mechanism 270 is in the first state, the light from the light source 220 passing through the target 210 can enter the image sensing module 340 after passing through the first optical device to be measured 231; In the state, the light from the light source 220 passing through the target 210 can enter the image sensing module 340 after passing through the second optical device 232 to be measured. In this way, the image sensing module 340 can capture an image including the pattern of the target 210 passing through the first optical device to be tested 231 and the second optical device 232 to be tested. Then, the optical inspection device 201 uses a computer 289 storing software calculations to calculate the image, so as to know the image quality, so as to achieve the function of detecting two different optical devices under test in a balanced manner.

如圖5a所示,標靶移動機構270包含光路改變元件274、一標靶位移裝置271及一標靶固定座272。標靶210設於標靶固定座272上並面向一第一方向,光路改變元件274設於標靶固定座272上並面向一第二方向,而且該第一方向相異於該第二方向。光路改變元件274設置成在該第一狀態時將來自第一待測光學裝置231之出光側的光線,傳送至影像感測模組340的方位。於本實施例中,標靶210面向影像感測器245,於圖5a中為面向上側(第一方向)。此外,在第一方向上,光路改變元件274與標靶210分別位於不相同的位置。較佳地,標靶210位於面向第一待測光學裝置231的入光側處,而光路改變元件274位於面向第一待測光學裝置231的出光側且能夠讓光線進入影像感測模組340的位置處。一實施例中,該不相同的位置例如可以為在第一方向上錯開的位置。 As shown in FIG. 5a, the target moving mechanism 270 includes an optical path changing element 274, a target displacement device 271, and a target fixing seat 272. The target 210 is disposed on the target holder 272 and faces a first direction, and the light path changing element 274 is disposed on the target holder 272 and faces a second direction, and the first direction is different from the second direction. The light path changing element 274 is configured to transmit the light from the light emitting side of the first optical device 231 to be measured to the orientation of the image sensing module 340 in the first state. In this embodiment, the target 210 faces the image sensor 245, and faces the upper side (the first direction) in FIG. 5a. In addition, in the first direction, the light path changing element 274 and the target 210 are respectively located at different positions. Preferably, the target 210 is located on the light-incident side facing the first optical device to be tested 231, and the light path changing element 274 is located on the light-emitting side facing the first optical device 231 to be tested and can allow light to enter the image sensing module 340 Location. In an embodiment, the different position may be a position staggered in the first direction, for example.

標靶固定座272連接於標靶位移裝置271,並且標靶固定座272能夠在標靶位移裝置271的一第一位置及一第二位置間移動。在標靶移動機構270的第一狀態時,標靶固定座272在第一位置(如圖5a),而在標靶移動機構270的第二狀態時,標靶固定座272在第二位置(如圖5b)。圖5b為標靶移動機構270的第二狀態,標靶固定座272在第二位置,此時標靶210面位第二待測光學裝置232,更具體而言,在第一方向上,標靶210、第二待測光學裝置232的入光面及第二待測光學裝置232的出光面,皆位於相同位置上。 The target fixing seat 272 is connected to the target displacement device 271, and the target fixing seat 272 can move between a first position and a second position of the target displacement device 271. In the first state of the target moving mechanism 270, the target fixing seat 272 is in the first position (as shown in FIG. 5a), and in the second state of the target moving mechanism 270, the target fixing seat 272 is in the second position ( Figure 5b). Fig. 5b is the second state of the target moving mechanism 270, the target fixing seat 272 is in the second position, and the target 210 is in the second optical device 232 under test. More specifically, in the first direction, the target The target 210, the light incident surface of the second optical device under test 232, and the light output surface of the second optical device under test 232 are all located at the same position.

一實施例中,光學檢測裝置201可以更包含一第一調整軸模組280a。一實施例中,可以更包含一第二調整軸模組280b。第一調整軸模組280a設置於標靶固定座272,而且連接於標靶210用以調整標靶210的方位。第二調整軸模組280b設置於標靶固定座272,而且連接於光路改變元件274用以調整光路改變元件274的方位。於本實施例中,由於第一調整軸模組280a設於標靶固定座272上(一實施例中,較佳地也可以同時使第二調整軸模組280b設於標靶固定座272上),因此當標靶固定座272移動時,能夠調整標靶210及光路改變元件274的位置,使光線的光路能夠在較適當的位置。 In an embodiment, the optical detection device 201 may further include a first adjustment axis module 280a. In an embodiment, a second adjustment axis module 280b may be further included. The first adjustment axis module 280a is disposed on the target fixing seat 272 and connected to the target 210 for adjusting the position of the target 210. The second adjustment axis module 280 b is disposed on the target fixing base 272 and connected to the light path changing element 274 for adjusting the position of the light path changing element 274. In this embodiment, since the first adjustment axis module 280a is disposed on the target fixing seat 272 (in one embodiment, it is preferable that the second adjustment axis module 280b is also disposed on the target fixing seat 272 at the same time. ), so when the target fixing seat 272 moves, the positions of the target 210 and the light path changing element 274 can be adjusted so that the light path of the light can be in a more appropriate position.

一實施例中,第一調整軸模組280a及第二調整軸模組280b可以包含至少一維度調整裝置。一實施例中,第一調整軸模組280a及第二調整軸模組280b可以為或至少包含一種五軸調整裝置。一實施例中,第一調整軸模組280a及第二調整軸模組280b可以為相同於調整軸模組280的結構。 In an embodiment, the first adjustment axis module 280a and the second adjustment axis module 280b may include at least one dimension adjustment device. In an embodiment, the first adjustment axis module 280a and the second adjustment axis module 280b may be or at least include a five-axis adjustment device. In an embodiment, the first adjustment axis module 280a and the second adjustment axis module 280b may have the same structure as the adjustment axis module 280.

圖6a顯示本發明一實施例之光學檢測裝置的一狀態的示意圖。圖6a的實施例類似於圖5a的實施例,因此相同的元件使用相同符號,且省略其相關說明。於圖6a實施例的光學檢測裝置202中,影像感測模組340包含多個望遠影像模組240。而且,一實施例中,較佳地不包含影像感測器245、感測器固定座291、距離調整裝置292或中繼鏡頭260。此外,於圖6a實施例中,光源220不設於標靶固定座272上。另外,於本領域具有通常知識者,可以適宜地將光源220設置在適當的位置上。 Fig. 6a shows a schematic diagram of a state of the optical detection device according to an embodiment of the present invention. The embodiment of FIG. 6a is similar to the embodiment of FIG. 5a, so the same elements use the same symbols, and related descriptions are omitted. In the optical detection device 202 of the embodiment of FIG. 6a, the image sensing module 340 includes a plurality of telephoto image modules 240. Moreover, in one embodiment, the image sensor 245, the sensor mount 291, the distance adjustment device 292, or the relay lens 260 are preferably not included. In addition, in the embodiment of FIG. 6a, the light source 220 is not disposed on the target fixing seat 272. In addition, those who have general knowledge in the field can appropriately set the light source 220 at an appropriate position.

圖6b顯示本發明一實施例之光學檢測裝置的一狀態的示意圖。圖6b的實施例類似於圖5a的實施例,因此相同的元件使用相同符號,且省略其相關說明。於圖6b實施例的光學檢測裝置203中,影像感測模組340包含影像感測器245、感測器固定座291、距離調整裝置292或中繼鏡頭260。而且,一實施例中,較佳地不包含多個望遠影像模組240。此外,於圖6b實施例中,光源220不設於標靶固定座272上。另外,於本領域具有通常知識者,可以適宜地將光源220設置在適當的位置上。 FIG. 6b shows a schematic diagram of a state of the optical detection device according to an embodiment of the present invention. The embodiment of FIG. 6b is similar to the embodiment of FIG. 5a, so the same elements use the same symbols, and related descriptions are omitted. In the optical detection device 203 of the embodiment in FIG. 6b, the image sensor module 340 includes an image sensor 245, a sensor mount 291, a distance adjustment device 292, or a relay lens 260. Moreover, in one embodiment, a plurality of telephoto image modules 240 are preferably not included. In addition, in the embodiment of FIG. 6b, the light source 220 is not arranged on the target fixing seat 272. In addition, those who have general knowledge in the field can appropriately set the light source 220 at an appropriate position.

圖7顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。如圖7所示,光學檢測裝置204也可設計成將圖6a和圖6b結構相連結的架構,利用移動裝置370可選擇控制該第一待測光學裝置231或第二待測光學裝置232在哪一架構下測試。 FIG. 7 shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention. As shown in FIG. 7, the optical detection device 204 can also be designed to connect the structure of FIG. 6a and FIG. Which framework to test under.

圖7的實施例類似於圖5a的實施例,因此相同的元件使用相同符號, 且省略其相關說明。如圖7所示,依據光學檢測裝置204的影像感測模組340,弧面軌道250為連續弧面,其上設置有多個望遠影像模組240且其中心位置可以設有一望遠影像模組240a。多個影像感測器245設於弧面軌道250的旁邊,此外,也可以將中繼鏡頭260面向該些影像感測器245。 The embodiment of FIG. 7 is similar to the embodiment of FIG. 5a, so the same elements use the same symbols, And its related description is omitted. As shown in FIG. 7, according to the image sensing module 340 of the optical detection device 204, the arc track 250 is a continuous arc, on which a plurality of telephoto image modules 240 are arranged, and a telephoto image module can be arranged at the center of the track 250 240a. A plurality of image sensors 245 are arranged beside the curved track 250. In addition, the relay lens 260 may also face the image sensors 245.

光學檢測裝置204更包含一換位機構370。標靶移動機構270可移動地設置於換位機構370,藉以讓標靶移動機構270可以選擇性地位於第一光路狀態位置或第二光路狀態位置。在第一位置時標靶移動機構270在弧面軌道250的外側(或者面向影像感測器245或中繼鏡頭260);在二位置時,標靶移動機構270在弧面軌道250的內側(或者面向該些望遠影像模組240或弧面軌道250)。標靶移動機構270在弧面軌道250的內側時,標靶210的光線能夠通過第一待測光學裝置231或第二待測光學裝置232後,進入影像感測模組340的望遠影像模組240(240a)中,而且可以利用位於弧面軌道250之中心的望遠影像模組240a進行光學的量測。標靶移動機構270在弧面軌道250的外側時,該些影像感測器245及標靶210位於第一光路狀態,而且標靶210面向該些影像感測器245,使得光源220的光線通過標靶210(或中繼鏡頭260)後,能夠再進入該些影像感測器245。 The optical detection device 204 further includes a transposition mechanism 370. The target moving mechanism 270 is movably disposed on the transposition mechanism 370, so that the target moving mechanism 270 can be selectively located at the first light path state position or the second light path state position. In the first position, the target moving mechanism 270 is outside the arcuate track 250 (or facing the image sensor 245 or the relay lens 260); at the second position, the target moving mechanism 270 is inside the arcuate track 250 ( Or facing the telephoto image modules 240 or curved track 250). When the target moving mechanism 270 is inside the arc track 250, the light from the target 210 can pass through the first optical device to be tested 231 or the second optical device to be tested 232, and then enter the telephoto image module of the image sensing module 340 240 (240a), and the telephoto image module 240a located at the center of the curved track 250 can be used for optical measurement. When the target moving mechanism 270 is outside the arc track 250, the image sensors 245 and the target 210 are in the first light path state, and the target 210 faces the image sensors 245, so that the light from the light source 220 can pass through After the target 210 (or the relay lens 260), it can enter the image sensors 245 again.

於一實施例中,光學檢測裝置204可以更包含一中繼鏡頭260,中繼鏡頭260設於該些影像感測器245的前方,更具體而言,標靶移動機構270在弧面軌道250的外側時,中繼鏡頭260位於光路改變元件274(或者待測光學裝置232(未圖示))及該些影像感測器245之間。中繼鏡頭260能夠調整物距 的大小,因此能夠利用中繼鏡頭260能夠調整物距的大小,而達到縮小檢測設備的體積的功效。於一實施例,該些影像感測器245彼此靠近或相鄰,藉以能夠針對較小視角的情況,進行光學檢測。於一實施例中,較佳的情況是,前述測試架構即可以獨立使用,而自成一獨立檢測裝置。 In one embodiment, the optical detection device 204 may further include a relay lens 260, which is arranged in front of the image sensors 245. More specifically, the target moving mechanism 270 is on a curved track 250. When the relay lens 260 is located outside the optical path changing element 274 (or the optical device under test 232 (not shown)) and the image sensors 245. Relay lens 260 can adjust the object distance Therefore, the relay lens 260 can be used to adjust the size of the object distance, so as to achieve the effect of reducing the size of the detection device. In one embodiment, the image sensors 245 are close to or adjacent to each other, so as to be able to perform optical detection in the case of a small viewing angle. In an embodiment, it is preferable that the aforementioned test framework can be used independently and form an independent detection device by itself.

圖8顯示本發明一實施例之光學檢測裝置的一第一狀態的示意圖。圖8的實施例類似於圖7的實施例,因此相同的元件使用相同符號,且省略其相關說明。如圖8所示,光學檢測裝置205包含一標靶210、一光源220、一第一待測光學裝置231、多個望遠影像模組240、多個影像感測器245、一弧面軌道250、一換位機構370及一光路改變元件374。弧面軌道250為連續弧面,且其中心位置可以設有一望遠影像模組240a。 FIG. 8 shows a schematic diagram of a first state of the optical detection device according to an embodiment of the present invention. The embodiment of FIG. 8 is similar to the embodiment of FIG. 7, so the same elements use the same symbols, and related descriptions are omitted. As shown in FIG. 8, the optical detection device 205 includes a target 210, a light source 220, a first optical device to be tested 231, a plurality of telephoto image modules 240, a plurality of image sensors 245, and a curved track 250 , A transposition mechanism 370 and a light path changing element 374. The curved track 250 is a continuous curved surface, and a telephoto image module 240a can be provided at the center of the curved track 250.

換位機構370支持光路改變元件374,而且選擇性地使光路改變元件374位於第一光路狀態位置或第二光路狀態位置。在第一光路狀態位置時,光路改變元件374面向光路改變元件274(如圖8所示)或第二待測光學裝置232的(未圖示),藉以改變光線的路徑,使該些影像感測器245及標靶210處於第一光路狀態。在第二光路狀態位置時,光路改變元件374不面向光路改變元件274或第二待測光學裝置232,使該些影像感測器245及標靶210位於第二光路狀態。 The transposition mechanism 370 supports the light path changing element 374 and selectively positions the light path changing element 374 at the first light path state position or the second light path state position. At the position of the first light path state, the light path changing element 374 faces the light path changing element 274 (as shown in FIG. 8) or the second optical device 232 (not shown), so as to change the light path to make the images feel The detector 245 and the target 210 are in the first light path state. When in the second light path state position, the light path changing element 374 does not face the light path changing element 274 or the second optical device 232 under test, so that the image sensors 245 and the target 210 are in the second light path state.

該些影像感測器245及標靶210位於第二光路狀態時,光路改變元件374不改變光線路徑,而可以利用位於弧面軌道250之中心的望遠影像模組 240a進行光學的量測。該些影像感測器245及標靶210位於第一光路狀態時,利用光路改變元件374(反射元件)改變光線路徑,使得光源220的光線通過標靶210及第一待測光學裝置231(或第二待測光學裝置232)後,被光路改變元件374改變光線路徑,而能夠再進入該些影像感測器245。 When the image sensors 245 and the target 210 are in the second light path state, the light path changing element 374 does not change the light path, and a telephoto image module located at the center of the curved track 250 can be used 240a performs optical measurement. When the image sensors 245 and the target 210 are in the first light path state, the light path changing element 374 (reflecting element) is used to change the light path, so that the light from the light source 220 passes through the target 210 and the first optical device 231 (or After the second optical device to be tested 232), the light path is changed by the light path changing element 374, and can enter the image sensors 245 again.

應了解的是,光學光路為可逆,因此除了前述各實施例的架構(習稱逆投)也可使用正投架構,亦即光源210、標靶220、影像感測模組340等狀態互換下,由於光路狀態是類似的因此亦成立,在此正投架構下除鏡頭外也可以測試含影像感測器之模組例如相機等。 It should be understood that the optical light path is reversible. Therefore, in addition to the architecture of the foregoing embodiments (known as reverse projection), a front projection structure can also be used, that is, the light source 210, the target 220, and the image sensing module 340 are interchanged. Since the light path states are similar, it is also true. In this front projection architecture, in addition to the lens, modules with image sensors, such as cameras, can also be tested.

於本發明一實施例中,第一待測光學裝置231及第二待測光學裝置232亦可以為一待測鏡頭或一待測影像模組。鏡頭及影像模組可以例如為相機鏡頭、監視器或望遠鏡等。此外,換位機構可以為手動的換位機構或包含電動馬達的換位機構。 In an embodiment of the present invention, the first optical device to be tested 231 and the second optical device to be tested 232 may also be a lens to be tested or an image module to be tested. The lens and image module can be, for example, a camera lens, a monitor, or a telescope. In addition, the indexing mechanism may be a manual indexing mechanism or an indexing mechanism including an electric motor.

200:光學檢測裝置 200: Optical detection device

210:標靶 210: Target

220:光源 220: light source

231:第一待測光學裝置 231: The first optical device to be tested

240:望遠影像模組 240: Telephoto image module

241:望遠鏡頭 241: Telescope lens

242:影像感測器 242: Image Sensor

245:影像感測器 245: Image Sensor

250:弧面軌道 250: curved track

251:第一軌道 251: The First Track

252:第二軌道 252: The second track

260:中繼鏡頭 260: Relay lens

280:調整軸模組 280: Adjust axis module

281:第一維度調整裝置 281: The first dimension adjustment device

282:第二維度調整裝置 282: Second Dimension Adjustment Device

289:計算機 289: Computer

291:感測器固定座 291: sensor mount

292:距離調整裝置 292: Distance Adjustment Device

340:影像感測模組 340: Image sensor module

Claims (11)

一種光學檢測裝置,用以檢測其光路為非直線的一第一待測光學裝置,包含: An optical detection device for detecting a first optical device to be tested whose optical path is non-linear, comprising: 一標靶; A target 一光源,用以形成一光線,該光線適於穿透該標靶後照射該第一待測光學裝置;以及 A light source for forming a light beam suitable for irradiating the first optical device under test after penetrating the target; and 一影像感測模組,設置成能夠接收來自該第一待測光學裝置的該光線,用以擷取一包含該標靶之圖案的影像, An image sensing module configured to receive the light from the first optical device under test for capturing an image containing a pattern of the target, 其中, in, 該標靶設置在該光源的該光線通過該標靶後,無法直接進入該影像感測模組,但能夠在通過該第一待測光學裝置後進入該影像感測模組的位置。 The target is arranged after the light from the light source passes through the target, and cannot directly enter the image sensing module, but can enter the position of the image sensing module after passing through the first optical device to be tested. 一種光學檢測裝置,用以檢測其光路為非直線的一第一待測光學裝置及一第二待測光學裝置,且該第一待測光學裝置相異於該第二待測光學裝置,該光學檢測裝置包含: An optical detection device for detecting a first optical device under test and a second optical device under test whose optical paths are non-linear, and the first optical device under test is different from the second optical device under test, the The optical detection device includes: 一標靶; A target 一光源,用以形成一光線,該光線適於穿透該標靶後照射該第一待測光學裝置或該第二待測光學裝置; A light source for forming a light beam suitable for irradiating the first optical device under test or the second optical device under test after penetrating the target; 一影像感測模組,接收來自該第一待測光學裝置或該第二待測光學裝置的該光線,用以擷取一包含該標靶之圖案的影像;以及 An image sensing module that receives the light from the first optical device to be tested or the second optical device to be tested to capture an image containing the pattern of the target; and 一標靶移動機構,連接於該標靶,其中, A target moving mechanism connected to the target, wherein 該標靶移動機構構成為具有:用以檢測該第一待測光學裝置的一第一狀態;以及用以檢測該第二待測光學裝置的一第二狀態, The target moving mechanism is configured to have: a first state for detecting the first optical device under test; and a second state for detecting the second optical device under test, 在該第一狀態時,構成為能夠使通過該標靶的該光線,在通過該第 一待測光學裝置後,能夠進入該影像感測模組,而且,該標靶設置在該光源的該光線通過該標靶後,無法直接進入該影像感測模組,但能夠在通過該第一待測光學裝置後進入該影像感測模組的位置,且 In the first state, it is configured to enable the light passing through the target to pass through the first After an optical device to be tested, it can enter the image sensing module, and the target is set after the light from the light source passes through the target, and cannot directly enter the image sensing module, but can pass through the An optical device to be tested enters the position of the image sensing module, and 在該第二狀態時,構成為能夠使通過該標靶的該光線,在通過該第二待測光學裝置後,能夠進入該影像感測模組。 In the second state, it is configured to enable the light passing through the target to enter the image sensing module after passing through the second optical device to be measured. 如請求項2所述的光學檢測裝置,其中,該第二待測光學裝置的光路為直線。 The optical detection device according to claim 2, wherein the optical path of the second optical device under test is a straight line. 如請求項2所述的光學檢測裝置,其中, The optical detection device according to claim 2, wherein: 該標靶移動機構包含:一標靶固定座、一光路改變元件及一標靶位移裝置, The target moving mechanism includes: a target fixing seat, a light path changing element and a target displacement device, 該標靶設於該標靶固定座並面向一第一方向, The target is set on the target holder and faces a first direction, 該光路改變元件設於標靶固定座並面向一第二方向,該第一方向相異於該第二方向,而且該光路改變元件設置成在該第一狀態時將來自該第一待測光學裝置的該光線,傳送至該影像感測模組,而且 The optical path changing element is arranged on the target holder and faces a second direction, the first direction is different from the second direction, and the optical path changing element is arranged to be from the first optical under test in the first state The light of the device is transmitted to the image sensing module, and 該標靶固定座連接於該標靶位移裝置,並且該標靶固定座能夠在該標靶位移裝置的一第一位置及一第二位置間移動,其中在該標靶移動機構的該第一狀態時,該標靶固定座在該第一位置,而在該標靶移動機構的該第二狀態時,該標靶固定座在該第二位置。 The target fixing seat is connected to the target displacement device, and the target fixing seat can move between a first position and a second position of the target displacement device, wherein the first position of the target moving mechanism In the state, the target fixing seat is in the first position, and in the second state of the target moving mechanism, the target fixing seat is in the second position. 如請求項4所述的光學檢測裝置,其中, The optical detection device according to claim 4, wherein: 該標靶移動機構的該第二狀態時,該標靶固定座在該第二位置,且該標靶面位該第二待測光學裝置。 When the target moving mechanism is in the second state, the target fixing seat is in the second position, and the target surface is in the second optical device under test. 如請求項5所述的光學檢測裝置,其中, The optical detection device according to claim 5, wherein: 該標靶位於面向該第一待測光學裝置的一入光側處,而該光路改變元 件位於面向該第一待測光學裝置的一出光側且能夠讓該光線進入該影像感測模組的位置處;或者 The target is located at a light incident side facing the first optical device under test, and the optical path changing element The component is located at a position facing a light-emitting side of the first optical device under test and capable of allowing the light to enter the image sensing module; or 在該第一方向上,該光路改變元件與該標靶分別位於不相同的位置;或者 In the first direction, the light path changing element and the target are respectively located at different positions; or 該光路改變元件與該標靶為在該第一方向上錯開的位置。 The light path changing element and the target are at positions staggered in the first direction. 如請求項4-6任一項所述的光學檢測裝置,更包含: The optical detection device according to any one of claims 4-6, further comprising: 一第一調整軸模組,設置於該標靶固定座,且連接於該標靶,用以調整該標靶的方位。 A first adjustment axis module is arranged on the target fixing seat and connected to the target for adjusting the position of the target. 如請求項7所述的光學檢測裝置,更包含: The optical detection device according to claim 7, further comprising: 一第二調整軸模組,設置於該標靶固定座,且連接於該光路改變元件,用以調整該光路改變元件的方位。 A second adjusting axis module is arranged on the target fixing base and connected to the light path changing element for adjusting the position of the light path changing element. 如請求項8所述的光學檢測裝置,其中, The optical detection device according to claim 8, wherein: 該第一調整軸模組或該第二調整軸模組包含至少一維度調整裝置,或者 The first adjustment axis module or the second adjustment axis module includes at least one dimension adjustment device, or 該第一調整軸模組或該第二調整軸模組包含一五軸調整裝置。 The first adjustment axis module or the second adjustment axis module includes a five-axis adjustment device. 如請求項2-6任一項所述的光學檢測裝置,其中該影像感測模組包含: The optical detection device according to any one of claim 2-6, wherein the image sensing module includes: 一軌道; One track 至少一望遠影像模組,置於該軌道上,而且該至少一望遠影像模組適於形成一無窮遠物距,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線; At least one telephoto image module is placed on the track, and the at least one telephoto image module is adapted to form an infinite object distance and is adapted to receive data from the first optical device under test or the second optical device under test The light 至少一影像感測器,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線;以及 At least one image sensor adapted to receive the light from the first optical device under test or the second optical device under test; and 一換位機構,其中該標靶移動機構可移動地設置於該換位機構且選擇性地位於一第一光路狀態位置或一第二光路狀態位置,藉以分別使該至少一影像感測器及該標靶位於一第一光路狀態或一第二光路狀態, A transposition mechanism, wherein the target moving mechanism is movably disposed on the transposition mechanism and is selectively located at a first light path state position or a second light path state position, so that the at least one image sensor and The target is in a first light path state or a second light path state, 在該第一光路狀態時,該至少一影像感測器能夠接收來自該第一待測光學裝置或該第二待測光學裝置的該光線;而 In the first light path state, the at least one image sensor can receive the light from the first optical device under test or the second optical device under test; and 在該第二光路狀態時,該至少一影像感測器不接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。 In the second optical path state, the at least one image sensor does not receive the light from the first optical device under test or the second optical device under test. 如請求項2-6任一項所述的光學檢測裝置,其中該影像感測模組包含: The optical detection device according to any one of claim 2-6, wherein the image sensing module includes: 一軌道; One track 至少一望遠影像模組,置於該軌道上,而且該至少一望遠影像模組適於形成一無窮遠物距,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線; At least one telephoto image module is placed on the track, and the at least one telephoto image module is adapted to form an infinite object distance and is adapted to receive data from the first optical device under test or the second optical device under test The light 至少一影像感測器,適於接收來自該第一待測光學裝置或該第二待測光學裝置的該光線; At least one image sensor adapted to receive the light from the first optical device under test or the second optical device under test; 另一光路改變元件;以及 Another optical path changing element; and 一換位機構,支持該另一光路改變元件,而且選擇性地使該另一光路改變元件位於一第一光路狀態位置或一第二光路狀態位置,藉以分別使該至少一影像感測器及該標靶位於一第一光路狀態或一第二光路狀態, A transposition mechanism supports the other optical path changing element, and selectively positioning the other optical path changing element at a first optical path state position or a second optical path state position, so that the at least one image sensor and The target is in a first light path state or a second light path state, 在該第一光路狀態時,該至少一影像感測器能夠接收來自該第一待測 光學裝置或該第二待測光學裝置的該光線;而 In the first light path state, the at least one image sensor can receive data from the first under-test The light of the optical device or the second optical device to be tested; and 在該第二光路狀態時,該至少一影像感測器不接收來自該第一待測光學裝置或該第二待測光學裝置的該光線。 In the second optical path state, the at least one image sensor does not receive the light from the first optical device under test or the second optical device under test.
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