TW202117664A - Optical inspection secondary image classification method which can effectively improve the accuracy of image recognition and classification - Google Patents

Optical inspection secondary image classification method which can effectively improve the accuracy of image recognition and classification Download PDF

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TW202117664A
TW202117664A TW108137798A TW108137798A TW202117664A TW 202117664 A TW202117664 A TW 202117664A TW 108137798 A TW108137798 A TW 108137798A TW 108137798 A TW108137798 A TW 108137798A TW 202117664 A TW202117664 A TW 202117664A
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TWI707299B (en
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廖國軒
廖彥欽
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汎思數據股份有限公司
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An optical inspection secondary image classification method of the present invention is used in the image classification determination of good products or defective products provided by a processing line equipped with an automatic optical inspection system, mainly, after an image classification model is generated and verified, the predicted and classified results of input images are recorded. then the number of images that cannot be accurately predicted and classified are increased, labeled, and then re-entered into a neural network architecture of the image classification model for a reinforced training and then another image classification model is generated, through at least one reinforced training, the prediction and classification accuracy of the image classification model is improved, the recognition accuracy and efficiency of a detection device are improved by relatively more active and reliable means, and the cost of secondary screening is therefore reduced.

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光學檢測二次圖像分類方法Optical inspection secondary image classification method

本發明係與深度學習圖像分類技術有關,特別是指一種尤適合應用於產品通過自動光學檢測之後,再次判別產品為良品或瑕疵品的光學檢測二次圖像分類方法。The present invention is related to the deep learning image classification technology, and particularly refers to an optical detection secondary image classification method that is particularly suitable for being applied to the product after the automatic optical detection is passed, and then the product is judged as a good product or a defective product.

自動光學檢測(Automatic Optical Inspection;AOI)係以非接觸的方式,運用機器視覺技術擷取圖像進行分析,進而判斷產品(成品或半成品)是否存在瑕疵,可部署於自動化加工產線的節點中間進行檢測,同時不影響產能,為目前業界廣泛應用的檢測手法,更是電路板和顯示面板產業製程中比重甚高的必要投資。Automatic Optical Inspection (AOI) is a non-contact method that uses machine vision technology to capture images for analysis, and then determine whether the product (finished or semi-finished) is defective, and can be deployed in the middle of the node of the automated processing line Testing, without affecting production capacity, is a testing method widely used in the industry, and it is a necessary investment with a high proportion in the manufacturing process of the circuit board and display panel industry.

以應用最廣泛的電路板加工產線為例,AOI檢測系統流程主要係先利用光學儀器對待檢測的電路板進行掃描獲取圖像,然後系統對數據庫中的合格參數進行比對,經過電腦圖像處理技術檢查出電路板上是否存在缺陷。Taking the most widely used circuit board processing production line as an example, the AOI inspection system process mainly uses optical instruments to scan the circuit board to be inspected to obtain images, and then the system compares the qualified parameters in the database and passes the computer image The processing technology detects whether there are defects on the circuit board.

通常電路板加工產線會有極高的良率要求,因此在AOI的參數上設定非常嚴格,加上光學原理容易使AOI因光影干擾而敏感,因此只要有些微外在光影的影響,設備便會自動判斷為瑕疵品,導致AOI檢測經常面臨過度篩檢(將良品誤判為瑕疵品)的現象。Usually the circuit board processing production line has extremely high yield requirements, so the AOI parameters are set very strictly, and the optical principle is easy to make the AOI sensitive to light and shadow interference. Therefore, as long as there is some slight external light and shadow influence, the equipment is It will be automatically judged as defective, which causes AOI inspection to often face the phenomenon of over-screening (misjudgment of good products as defective).

已知,可透過人工智慧和深度學習類神經網路處理圖像資料,並利用規律對未知資料進行預測的演算法針對未知瑕疵進行識別,輔助AOI檢測的後續優化,藉以提高檢測設備的辨別正確率,降低人工進行第二次篩選的成本。It is known that image data can be processed through artificial intelligence and deep learning neural networks, and an algorithm that uses rules to predict unknown data can identify unknown defects and assist the subsequent optimization of AOI detection, thereby improving the accuracy of detection equipment Rate, reduce the cost of manual second screening.

以類神經網路架構為基礎的影像分類模型之所以能夠充分且正確地學習到判別圖像的關鍵,除了必須在深度學習的訓練過程(Training)中提供大量有標記(Label)的圖像資料之外,改良類神經網路架構或許是一個可行的做法。The reason why the image classification model based on the neural network architecture can fully and correctly learn the key to distinguishing images, in addition to the need to provide a large amount of labeled (Label) image data in the training process of deep learning (Training) In addition, improved neural network architecture may be a feasible approach.

惟,類神經網路架構中可以調整的參數選項非常繁瑣,不易在繁瑣的參數選項中系統化地找出最好的排列組合;因此,如何在樣品數量有限的條件之下,提升影像分類模型之判別準確率,長久以來一直是產業界及學術界所亟欲解決之課題。However, the parameter options that can be adjusted in the neural network architecture are very cumbersome, and it is not easy to systematically find the best permutation and combination in the cumbersome parameter options; therefore, how to improve the image classification model under the condition of a limited number of samples The accuracy of the discrimination has long been a problem that the industry and academia desperately want to solve.

有鑑於此,本發明即在提供自動光學檢測一種可以有效提升圖像分類準確率的光學檢測二次圖像分類方法,為其主要目的者。In view of this, the present invention is to provide a secondary image classification method for optical detection that can effectively improve the accuracy of image classification for automatic optical detection, as its main purpose.

本發明之光學檢測二次圖像分類方法,係使用於一設有自動光學檢測系統之加工產線所提供之產品為良品或瑕疵品之圖像分類判別;該光學檢測二次圖像分類方法,係包括下列步驟:(a)提供一圖像特徵自動辨識系統步驟,一圖像特徵自動辨識系統係整合有一儲存單元、一處理單元以及一圖像擷取單元;(b)建立訓練資料集步驟,至少於該圖像特徵自動辨識系統之儲存單元中建立一訓練資料集,該訓練資料集係至少包括複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像;(c)建立驗證資料集步驟,於該圖像特徵自動辨識系統之儲存單元中建立一驗證資料集,該驗證資料集係至少包括複數良品圖像、複數瑕疵品圖像;(d)建立類神經網路架構步驟,於該圖像特徵自動辨識系統之儲存單元中建立一由該處理單元執行運作,供用以對所輸入之圖像進行良品或瑕疵品預測分類的一類神經網路架構;(e)圖像分類模型訓練步驟,透過該圖像擷取單元將該訓練資料集當中複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像逐一輸入該類神經網路架構,經比對該類神經網路架構預測分類輸出結果之後調整該類神經網路架構之特徵和權重,並且儲存成功降低誤差的調整,始產生一更擅於對所輸入之圖像進行良品或瑕疵品預測分類的圖像分類模型;(f)圖像分類模型驗證步驟,在每次產生圖像分類模型時,透過該圖像擷取單元將該驗證資料集當中之複數良品圖像、複數瑕疵品圖像逐一輸入該次產生的圖像分類模型,由該次產生的圖像分類模型對輸入的各該良品圖像及各該瑕疵品圖像進行預測分類,藉以評估該次產生的圖像分類模型預測分類準確性;(g)統計分類預測錯誤分佈及加強訓練步驟,在每次產生圖像分類模型,且在該次產生的圖像分類模型完成驗證時,記錄所輸入之各該良品圖像及各該瑕疵品圖像之預測分類結果,並且統計預測分類錯誤分佈,將各該實際為良品圖像卻無法被準確預測分類的圖像進行數量擴增之後標記為0,將各該實際為瑕疵品圖像卻無法被準確預測分類的圖像進行數量擴增之後圖像標記為1,透過該圖像擷取單元逐一將該些完成擴增且標記為0的圖像及該些完成擴增且標記為1的圖像再次輸入該次產生的圖像分類模型所屬之類神經網路架構加強訓練,始再產生另一圖像分類模型;以及(h)確認模型步驟,經至少執行一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認至少一圖像分類模型,即可利用該至少一被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。The optical inspection secondary image classification method of the present invention is used in the image classification judgment of a good product or defective product provided by a processing production line equipped with an automatic optical inspection system; the optical inspection secondary image classification method , It includes the following steps: (a) Provide an image feature automatic identification system step, an image feature automatic identification system integrates a storage unit, a processing unit and an image capture unit; (b) Create a training data set Step, at least a training data set is established in the storage unit of the image feature automatic identification system, the training data set includes at least a plurality of good images labeled as label 0, a plurality of overscreened images labeled as label 0, A plurality of defective product images marked as label 1; (c) a step of establishing a verification data set, a verification data set is created in the storage unit of the image feature automatic identification system, and the verification data set includes at least a plurality of good product images, Multiple defective images; (d) a step of establishing a neural network-like architecture, in the storage unit of the image feature automatic identification system, creating an operation executed by the processing unit for performing good or defective images on the input image A type of neural network architecture for product prediction classification; (e) Image classification model training step, through the image capture unit in the training data set, the plural number is labeled as the good product image with label 0, and the plural number is labeled as the excess of label 0 Screened images and multiple defective images marked with label 1 are input to this type of neural network architecture one by one, and after comparing the prediction and classification output results of this type of neural network architecture, adjust the features and weights of this type of neural network architecture. And save the adjustment to reduce the error successfully, and then produce an image classification model that is better at predicting and classifying the input image with good or defective products; (f) the image classification model verification step, each time the image classification is generated When modeling, through the image capture unit, the multiple good images and multiple defective images in the verification data set are input into the image classification model generated this time one by one, and the image classification model generated this time compares the input Perform predictive classification for each good image and each defective image to evaluate the accuracy of the prediction and classification of the image classification model generated this time; (g) Statistical classification prediction error distribution and enhanced training steps, each time an image is generated Classification model, and when the verification of the image classification model generated this time is completed, record the input predicted classification results of each of the good images and each of the defective images, and calculate the predicted classification error distribution, and make each actual Images of good quality images that cannot be accurately predicted and classified are marked as 0 after number amplification, and the images that are actually defective images that cannot be accurately predicted and classified are marked as 1 after number amplification. Through the image capture unit, the amplified images marked as 0 and the amplified images marked as 1 are input again into the neural network that the generated image classification model belongs to. Enhance the training of the framework to generate another image classification model; and (h) the step of confirming the model, after performing step (f) to step (g) at least once, confirm at least one of the image classification models Image classification model, namely The at least one confirmed image classification model can be used to classify images of good or defective products provided by the processing line.

依據上述技術特徵,該光學檢測二次圖像分類方法,於該確認模型步驟中,係在至少重複一次該步驟f至該步驟g之後,於該些圖像分類模型當中確認一準確性較佳的圖像分類模型,利用該被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。According to the above technical features, in the optical detection secondary image classification method, in the confirming model step, after repeating the step f to the step g at least once, confirming a better accuracy among the image classification models Use the confirmed image classification model to classify the products provided by the processing line as good or defective images.

依據上述技術特徵,該光學檢測二次圖像分類方法,於該確認模型步驟中,係在至少重複一次該步驟f至該步驟g之後,於該些圖像分類模型當中確認複數準確性較佳的圖像分類模型,並且將該些被確認的圖像分類模型進行合併,利用該些合併後的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。According to the above technical features, in the optical detection secondary image classification method, in the confirming model step, after repeating the step f to the step g at least once, it is confirmed that the plural accuracy is better among the image classification models And merge the confirmed image classification models, and use the merged image classification models to classify the products provided by the processing line as good or defective images.

依據上述技術特徵,該訓練資料集與該驗證資料集之良品圖像數量係由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集之過度篩檢圖像數量係由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集與該驗證資料集之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成。According to the above technical features, the number of good product images in the training data set and the verification data set is determined by the automatic optical detection system as good products and the original images of good products that are manually confirmed to be good are amplified by amplifying the original images of the training data set; the training data set The number of over-screened images is achieved by amplifying multiple original images of good products that are judged as defective by the automatic optical inspection system but confirmed as good products by manual; the number of defective images in the training data set and the verification data set It is achieved by amplifying a plurality of original images of defective products that are identified as defective by the automatic optical inspection system and manually confirmed as defective.

依據上述技術特徵,該驗證資料集當中之各該良品圖像係與該訓練資料集當中之各該良品圖像不完全相同,該驗證資料集當中之各該瑕疵品圖像係與該訓練資料集當中之各該瑕疵品圖像不完全相同。According to the above technical features, each of the good product images in the verification data set is not exactly the same as each of the good product images in the training data set, and each of the defective product images in the verification data set is the same as the training data The images of the defective products in the set are not exactly the same.

依據上述技術特徵,該訓練資料集與該驗證資料集之良品圖像數量係由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集之過度篩檢圖像數量係由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集與該驗證資料集之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成;以及,該驗證資料集當中之各該良品圖像係與該訓練資料集當中之各該良品圖像不完全相同,該驗證資料集當中之各該瑕疵品圖像係與該訓練資料集當中之各該瑕疵品圖像不完全同。According to the above technical features, the number of good product images in the training data set and the verification data set is determined by the automatic optical detection system as good products and the original images of good products that are manually confirmed to be good are amplified by amplifying the original images of the training data set; the training data set The number of over-screened images is achieved by amplifying multiple original images of good products that are judged as defective by the automatic optical inspection system but confirmed as good products by manual; the number of defective images in the training data set and the verification data set It is achieved by amplifying the original images of defective products identified as defective by the automatic optical inspection system and manually confirmed as defective; and, each of the good product images in the verification data set and the training data set The images of the good products are not exactly the same, and the images of the defective products in the verification data set are not exactly the same as the images of the defective products in the training data set.

依據上述技術特徵,各該圖像分類模型之各該類神經網路架構對各輸入圖像之預測輸出值,係以0或1的輸出型態呈現。According to the above-mentioned technical characteristics, the predicted output value of each of the neural network architectures of each of the image classification models for each input image is presented in the output type of 0 or 1.

依據上述技術特徵,各該圖像分類模型之各該類神經網路架構對各輸入圖像之預測輸出值,係以預測為0之機率及預測為1之機率的輸出型態呈現。According to the above technical characteristics, the predicted output value of each of the neural network architectures of each of the image classification models for each input image is presented in the output type with the probability of prediction being 0 and the probability of prediction being 1.

依據上述技術特徵,該光學檢測二次圖像分類方法,於該步驟(d),係於該圖像特徵自動辨識系統之儲存單元中建立一供用以對所輸入之圖像進行良品或瑕疵品預測分類的卷積神經網路架構(Convolutional neural network , CNN)。According to the above technical features, the optical detection secondary image classification method, in the step (d), is to create a storage unit in the image feature automatic identification system for performing good or defective images on the input image Convolutional neural network architecture (Convolutional neural network, CNN) for predictive classification.

本發明所揭露的光學檢測二次圖像分類方法,主要在圖像分類模型產生且完成驗證後,記錄所輸入之圖像預測分類結果,將無法被準確預測分類的圖像進行數量擴增、標記之後再次輸入圖像分類模型所屬之類神經網路架構加強訓練,始再產生另一圖像分類模型,透過至少一次加強訓練,提升圖像分類模型之預測分類準確性,尤適合應用在產品通過自動光學檢測之後,再次判別產品為良品或瑕疵品,以相對更為積極、可靠之手段,提高檢測設備的辨別正確率及效率,並且降低進行二次篩選的成本。The optical detection secondary image classification method disclosed in the present invention mainly records the input image prediction classification results after the image classification model is generated and verified, and the number of images that cannot be accurately predicted and classified is increased, After labeling, input the neural network architecture to which the image classification model belongs to strengthen the training, and then generate another image classification model. Through at least one strengthened training, the predictive classification accuracy of the image classification model is improved, which is especially suitable for application in products. After the automatic optical inspection, the product is judged as good or defective again, using relatively more active and reliable means to improve the accuracy and efficiency of the detection equipment, and reduce the cost of secondary screening.

本發明主要提供自動光學檢測一種可以有效提升圖像分類準確率的光學檢測二次圖像分類方法,本發明之光學檢測二次圖像分類方法,係使用於一設有自動光學檢測系統之加工產線所提供之產品為良品或瑕疵品之圖像分類判別;如第1圖至第3圖所示,該光學檢測二次圖像分類方法,係包括下列步驟:The present invention mainly provides automatic optical inspection, an optical inspection secondary image classification method that can effectively improve the accuracy of image classification. The optical inspection secondary image classification method of the present invention is used in a processing with an automatic optical inspection system The image classification of the products provided by the production line is good or defective; as shown in Figures 1 to 3, the optical inspection secondary image classification method includes the following steps:

(a)提供一圖像特徵自動辨識系統步驟,一圖像特徵自動辨識系統10係整合有一儲存單元11、一處理單元12以及一圖像擷取單元13;於實施時,該處理單元12係可以為一圖形處理器(Graphics Processing Unit , GPU)。(a) Provide an image feature automatic identification system step. An image feature automatic identification system 10 integrates a storage unit 11, a processing unit 12, and an image capture unit 13; in implementation, the processing unit 12 is It may be a graphics processor (Graphics Processing Unit, GPU).

(b)建立訓練資料集步驟,至少於該圖像特徵自動辨識系統10之儲存單元11中建立一訓練資料集20,該訓練資料集20係至少包括複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像。(b) The step of creating a training data set is to create at least a training data set 20 in the storage unit 11 of the image feature automatic identification system 10, and the training data set 20 includes at least a plurality of good images with a label of 0 and a plurality of The over-screened image marked as label 0, and the defective product image marked as label 1 in multiple numbers.

(c)建立驗證資料集步驟,於該圖像特徵自動辨識系統10之儲存單元11中建立一驗證資料集30,該驗證資料集30係至少包括複數良品圖像、複數瑕疵品圖像。(c) The step of establishing a verification data set is to create a verification data set 30 in the storage unit 11 of the image feature automatic identification system 10, and the verification data set 30 includes at least a plurality of good product images and a plurality of defective product images.

(d)建立類神經網路架構步驟,於該圖像特徵自動辨識系統10之儲存單元11中建立一由該處理單元12執行運作,供用以對所輸入之圖像進行良品或瑕疵品預測分類的一類神經網路架構40;於實施時,係可於該圖像特徵自動辨識系統10之儲存單元11中建立一供用以對所輸入之圖像進行良品或瑕疵品預測分類的卷積神經網路架構(Convolutional neural network , CNN)。(d) The step of establishing a neural network-like architecture, in the storage unit 11 of the image feature automatic identification system 10, establishes an operation executed by the processing unit 12 for predicting and classifying the input image with good or defective products A type of neural network architecture 40; in implementation, a convolutional neural network can be established in the storage unit 11 of the image feature automatic recognition system 10 for predicting and classifying the input image for good or defective products Road architecture (Convolutional neural network, CNN).

(e)圖像分類模型訓練步驟,透過該圖像擷取單元13將該訓練資料集20當中複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像逐一輸入該類神經網路架構40,經比對該類神經網路架構40預測分類輸出結果之後調整該類神經網路架構之特徵和權重,並且儲存成功降低誤差的調整,始產生一更擅於對所輸入之圖像進行良品或瑕疵品預測分類的圖像分類模型。(e) Image classification model training step, through the image capturing unit 13 in the training data set 20 in the training data set 20 that the plural number is labeled as the good image of the label 0, the plural number is labeled as the over-screened image of the label 0, and the plural number is labeled as The defective product images of label 1 are input into this type of neural network architecture 40 one by one, and after comparing the prediction of the classification output result of this type of neural network architecture 40, the features and weights of this type of neural network architecture are adjusted, and the results of successfully reducing errors are stored The adjustment starts to produce an image classification model that is better at predicting and categorizing the input image as good or defective.

(f)圖像分類模型驗證步驟,在每次產生圖像分類模型時,透過該圖像擷取單元13將該驗證資料集30當中之複數良品圖像、複數瑕疵品圖像逐一輸入該次產生的圖像分類模型,由該次產生的圖像分類模型對輸入的各該良品圖像及各該瑕疵品圖像進行預測分類,藉以評估該次產生的圖像分類模型預測分類準確性。(f) The image classification model verification step. Each time an image classification model is generated, the multiple good product images and the multiple defective product images in the verification data set 30 are inputted one by one through the image capture unit 13 The generated image classification model is used to predict and classify each input good product image and each defective product image by the generated image classification model, so as to evaluate the prediction classification accuracy of the image classification model generated this time.

(g)統計分類預測錯誤分佈及加強訓練步驟,在每次產生圖像分類模型,且在該次產生的圖像分類模型完成驗證時,記錄所輸入之各該良品圖像及各該瑕疵品圖像之預測分類結果,並且統計預測分類錯誤分佈,將各該實際為良品圖像卻無法被準確預測分類的圖像進行數量擴增之後標記為0,將各該實際為瑕疵品圖像卻無法被準確預測分類的圖像進行數量擴增之後圖像標記為1,透過該圖像擷取單元13逐一將該些完成擴增且標記為0的圖像及該些完成擴增且標記為1的圖像再次輸入該次產生的圖像分類模型所屬之類神經網路架構加強訓練,始再產生另一圖像分類模型。(g) Statistical classification prediction error distribution and enhanced training steps, each time an image classification model is generated, and when the image classification model generated this time is verified, each input good image and each defective product are recorded The predicted classification result of the image, and the statistical prediction of the classification error distribution, the number of each image that is actually a good image but cannot be accurately predicted and classified is increased and then marked as 0, and each image that is actually a defective image is marked as 0. After the number of images that cannot be accurately predicted and classified is amplified, the images are marked as 1, and the images that are amplified and marked as 0 are completed one by one through the image capturing unit 13 and the amplified and marked as The image of 1 is input again into the neural network architecture of the image classification model generated this time to strengthen the training, and then another image classification model is generated.

(h)確認模型步驟,經至少執行一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認至少一圖像分類模型,即可利用該至少一被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別(h) The step of confirming the model, after performing steps (f) to (g) at least once, confirming at least one image classification model among the image classification models, and then using the at least one confirmed image Image classification model to classify images of good or defective products provided by the processing line

本發明之光學檢測二次圖像分類方法,於該確認模型步驟中,係可在至少重複一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認一準確性較佳的圖像分類模型,利用該被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。In the optical detection secondary image classification method of the present invention, in the confirming model step, after repeating the steps (f) to (g) at least once, an accuracy can be confirmed among the image classification models A better image classification model uses the confirmed image classification model to classify images of good or defective products provided by the processing line.

本發明之光學檢測二次圖像分類方法,於該確認模型步驟中,亦可在至少重複一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認複數準確性較佳的圖像分類模型,並且將該些被確認的圖像分類模型進行合併,利用該些合併後的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。In the optical detection secondary image classification method of the present invention, in the confirming model step, after repeating the step (f) to the step (g) at least once, the plural accuracy of the image classification models can be confirmed A better image classification model, and combine the confirmed image classification models, and use the combined image classification models to classify the products provided by the processing line for good or defective images Discriminate.

由於本發明之光學檢測二次圖像分類方法,係在圖像分類模型產生且完成驗證後,記錄所輸入之圖像預測分類結果,將無法被準確預測分類的圖像進行數量擴增、標記之後再次輸入圖像分類模型所屬之類神經網路架構加強訓練,始再產生另一圖像分類模型,因此可透過至少一次加強訓練,提升圖像分類模型之預測分類準確性,尤適合應用在產品通過自動光學檢測之後,再次判別產品為良品或瑕疵品,以相對更為積極、可靠之手段,提高檢測設備的辨別正確率及效率,並且降低進行二次篩選的成本。Since the optical detection secondary image classification method of the present invention records the input image prediction classification results after the image classification model is generated and verified, the number of images that cannot be accurately predicted and classified is increased and labeled After that, input the neural network architecture to which the image classification model belongs again for enhanced training, and then generate another image classification model. Therefore, through at least one enhanced training, the predictive classification accuracy of the image classification model can be improved, which is especially suitable for application in After the product passes the automatic optical inspection, the product is again judged as good or defective, and the detection accuracy and efficiency of the inspection equipment are improved by relatively more active and reliable means, and the cost of secondary screening is reduced.

如第1圖及第4圖所示,本發明之光學檢測二次圖像分類方法,在上揭各種可能實施之樣態下,該訓練資料集20與該驗證資料集30之良品圖像數量係可以由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集20之過度篩檢圖像數量係可以由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集20與該驗證資料集30之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成。As shown in Figures 1 and 4, the optical detection secondary image classification method of the present invention reveals the number of good images in the training data set 20 and the verification data set 30 in various possible implementation modes. It can be achieved by amplifying the original images of good products that are judged as good by the automatic optical inspection system and manually confirmed as good; the number of over-screened images in the training data set 20 can be obtained by the automatic optical inspection system It is judged as a defective product but achieved by augmenting the original image of a good product that is manually confirmed as a good product; the number of defective product images in the training data set 20 and the verification data set 30 is determined by the automatic optical inspection system as a defective product and Achieved by augmenting the original image of the defective product that was manually confirmed as a defective product.

以及,本發明之光學檢測二次圖像分類方法,在上揭各種可能實施之樣態下,該驗證資料集30當中之各該良品圖像係與該訓練資料集20當中之各該良品圖像不完全相同,該驗證資料集30當中之各該瑕疵品圖像係與該訓練資料集20當中之各該瑕疵品圖像不完全相同。And, in the optical detection secondary image classification method of the present invention, each of the good image in the verification data set 30 and each of the good image in the training data set 20 in the various possible implementation modes disclosed above The images are not exactly the same, each of the defective product images in the verification data set 30 and each of the defective product images in the training data set 20 are not completely the same.

當然,本發明之光學檢測二次圖像分類方法,在上揭各種可能實施之樣態下,又以該訓練資料集20與該驗證資料集30之良品圖像數量係可以由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集20之過度篩檢圖像數量係可以由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集20與該驗證資料集30之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成;以及,該驗證資料集30當中之各該良品圖像係與該訓練資料集20當中之各該良品圖像不完全相同,該驗證資料集30當中之各該瑕疵品圖像係與該訓練資料集20當中之各該瑕疵品圖像不完全相同為佳。Of course, the optical detection secondary image classification method of the present invention, in the various possible implementation modes, and the number of good images in the training data set 20 and the verification data set 30 can be determined by the automatic The optical inspection system judges the product as good and is achieved by augmenting the original image of the good product that is manually confirmed as good; the number of over-screened images in the training data set 20 can be determined by the automatic optical inspection system as a defective product by multiple numbers, but through manual The original image of the good product confirmed as good is amplified; the number of defective product images in the training data set 20 and the verification data set 30 is determined by the automatic optical inspection system as defective and manually confirmed as defective The original image of the defective product is amplified; and, each of the good product images in the verification data set 30 is not exactly the same as each of the good product images in the training data set 20, and each of the good product images in the verification data set 30 It is preferable that the defective product image is not exactly the same as each of the defective product images in the training data set 20.

具體而言,本發明之光學檢測二次圖像分類方法,在上揭各種可能實施之樣態下,各該圖像分類模型之各該類神經網路架構40對各輸入圖像之預測輸出值,係能夠選擇以0或1的輸出型態呈現;當然,各該圖像分類模型之各該類神經網路架構40對各輸入圖像之預測輸出值,亦能夠選擇以預測為0之機率及預測為1之機率的輸出型態呈現。Specifically, in the optical detection secondary image classification method of the present invention, in various possible implementation modes, the prediction output of each type of neural network architecture 40 of each image classification model for each input image The value can be selected to be presented as an output type of 0 or 1. Of course, the predicted output value of each of the neural network architectures 40 of each image classification model for each input image can also be selected to be 0. The probability and the prediction of the probability of 1 are presented in the output form.

以上所述之實施例僅係為說明本發明之技術思想及特點,其目的在使熟習此項技藝之人士能夠瞭解本發明之內容並據以實施,當不能以之限定本發明之專利範圍,即大凡依本發明所揭示之精神所作之均等變化或修飾,仍應涵蓋在本發明之專利範圍內。The above-mentioned embodiments are only to illustrate the technical ideas and features of the present invention, and their purpose is to enable those who are familiar with the art to understand the content of the present invention and implement them accordingly. When they cannot be used to limit the patent scope of the present invention, That is, all equal changes or modifications made in accordance with the spirit of the present invention should still be covered by the patent scope of the present invention.

100:光學檢測二次圖像分類方法 10:圖像特徵自動辨識系統 11:儲存單元 12:處理單元 13:圖像擷取單元 20:訓練資料集 30:驗證資料集 40:類神經網路架構100: Optical inspection secondary image classification method 10: Image feature automatic identification system 11: storage unit 12: Processing unit 13: Image capture unit 20: Training data set 30: Validation data set 40: Neural Network Architecture

第1圖係為本發明當中之圖像特徵自動辨識系統基本組成架構方塊示意圖。 第2圖係為本發明之光學檢測二次圖像分類方法基本流程圖。 第3圖係為本發明當中之一種可能實施之圖像分類模型訓練過程示意圖。 第4圖係為本發明當中之一種可能實施之原始圖像確認流程圖。Figure 1 is a block diagram of the basic structure of the image feature automatic recognition system in the present invention. Figure 2 is the basic flow chart of the optical detection secondary image classification method of the present invention. Figure 3 is a schematic diagram of a possible implementation of the image classification model training process in the present invention. Figure 4 is a flow chart of the original image confirmation for one possible implementation of the present invention.

100:光學檢測二次圖像分類方法100: Optical inspection secondary image classification method

Claims (9)

一種光學檢測二次圖像分類方法,係使用於一設有自動光學檢測系統之加工產線所提供之產品為良品或瑕疵品之圖像分類判別;該光學檢測二次圖像分類方法,係包括下列步驟: (a)提供一圖像特徵自動辨識系統步驟,一圖像特徵自動辨識系統(10)係整合有一儲存單元(11)、一處理單元(12)以及一圖像擷取單元(13); (b)建立訓練資料集步驟,至少於該圖像特徵自動辨識系統(10)之該儲存單元(11)中建立一訓練資料集(20),該訓練資料集(20)係至少包括複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像; (c)建立驗證資料集步驟,於該圖像特徵自動辨識系統(10)之該儲存單元(11)中建立一驗證資料集(30),該驗證資料集(30)係至少包括複數良品圖像、複數瑕疵品圖像; (d)建立類神經網路架構步驟,於該圖像特徵自動辨識系統(10)之該儲存單元(11)中建立一由該處理單元(12)執行運作,供用以對所輸入之圖像進行良品或瑕疵品預測分類的一類神經網路架構(40); (e)圖像分類模型訓練步驟,透過該圖像擷取單元(13)將該訓練資料集(20)當中複數標記為標籤0的良品圖像、複數標記為標籤0的過度篩檢圖像、複數標記為標籤1的瑕疵品圖像逐一輸入該類神經網路架構(40),經比對該類神經網路架構(40)預測分類輸出結果之後調整該類神經網路架構(40)之特徵和權重,並且儲存成功降低誤差的調整,始產生一更擅於對所輸入之圖像進行良品或瑕疵品預測分類的圖像分類模型; (f)圖像分類模型驗證步驟,在每次產生圖像分類模型時,透過該圖像擷取單元(13)將該驗證資料集(30)當中之複數良品圖像、複數瑕疵品圖像逐一輸入該次產生的圖像分類模型,由該次產生的圖像分類模型對輸入的各該良品圖像及各該瑕疵品圖像進行預測分類,藉以評估該次產生的圖像分類模型預測分類準確性; (g)統計分類預測錯誤分佈及加強訓練步驟,在每次產生圖像分類模型,且在該次產生的圖像分類模型完成驗證時,記錄所輸入之各該良品圖像及各該瑕疵品圖像之預測分類結果,並且統計預測分類錯誤分佈,將各該實際為良品圖像卻無法被準確預測分類的圖像進行數量擴增之後標記為0,將各該實際為瑕疵品圖像卻無法被準確預測分類的圖像進行數量擴增之後圖像標記為1,透過該圖像擷取單元(13)逐一將該些完成擴增且標記為0的圖像及該些完成擴增且標記為1的圖像再次輸入該次產生的圖像分類模型所屬之該類神經網路架構(40)加強訓練,始再產生另一圖像分類模型;以及 (h)確認模型步驟,經至少執行一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認至少一圖像分類模型,即可利用該至少一被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。An optical inspection secondary image classification method, which is used in the image classification judgment of a good product or defective product provided by a processing production line equipped with an automatic optical inspection system; the optical inspection secondary image classification method is It includes the following steps: (a) Provide an image feature automatic identification system step. An image feature automatic identification system (10) integrates a storage unit (11), a processing unit (12), and an image capture unit (13); (b) The step of creating a training data set, at least creating a training data set (20) in the storage unit (11) of the image feature automatic recognition system (10), the training data set (20) at least including plural marks Is the good product image with label 0, the over-screening image with the plural label as label 0, and the defective product image with the plural label as label 1; (c) The step of establishing a verification data set is to create a verification data set (30) in the storage unit (11) of the image feature automatic identification system (10), and the verification data set (30) includes at least a plurality of good product images Image, plural defective images; (d) The step of establishing a neural network-like architecture, in the storage unit (11) of the image feature automatic recognition system (10), establishes an operation executed by the processing unit (12) for the input image A neural network architecture for predicting and categorizing good or defective products (40); (e) Image classification model training step, through the image capture unit (13) in the training data set (20), the multiple-labeled good image with label 0, and the multiple-labeled over-screened image with label 0 , The defect images marked as label 1 are input into the neural network architecture (40) one by one, and the neural network architecture (40) is adjusted after comparing the prediction and classification output results of the neural network architecture (40) The features and weights of the images, and the adjustments that successfully reduce the error are stored, and then an image classification model that is better at predicting and classifying the input images for good or defective products will be produced; (f) The image classification model verification step, each time an image classification model is generated, the multiple good product images and multiple defective product images in the verification data set (30) are passed through the image capture unit (13) Input the image classification model produced this time one by one, and the image classification model produced this time will predict and classify each input good image and each defective image, so as to evaluate the prediction of the image classification model produced this time Classification accuracy (g) Statistical classification prediction error distribution and enhanced training steps, each time an image classification model is generated, and when the image classification model generated this time is verified, each input good image and each defective product are recorded The predicted classification result of the image, and the statistical prediction of the classification error distribution, the number of each image that is actually a good image but cannot be accurately predicted and classified is increased and then marked as 0, and each image that is actually a defective image is marked as 0. After the number of images that cannot be accurately predicted and classified is amplified, the images are marked as 1, and the images that have been amplified and marked as 0 are amplified one by one through the image capturing unit (13) and the images that have been amplified and The image marked 1 is re-input to the neural network architecture (40) to which the image classification model generated this time belongs to for enhanced training, and then another image classification model is generated; and (h) The step of confirming the model, after performing steps (f) to (g) at least once, confirming at least one image classification model among the image classification models, and then using the at least one confirmed image The image classification model classifies the products provided by the processing line as good or defective images. 如請求項1所述之光學檢測二次圖像分類方法,其中,該光學檢測二次圖像分類方法,於該步驟(h)中,係在至少重複一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認一準確性較佳的圖像分類模型,利用該被確認的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。The optical detection secondary image classification method according to claim 1, wherein, in the optical detection secondary image classification method, in the step (h), the step (f) to the step ( g) Afterwards, confirm an image classification model with better accuracy among the image classification models, and use the confirmed image classification model to perform good or defective images of the products provided by the processing line Classification discrimination. 如請求項1所述之光學檢測二次圖像分類方法,其中,該光學檢測二次圖像分類方法,於該步驟(h)中,係在至少重複一次該步驟(f)至該步驟(g)之後,於該些圖像分類模型當中確認複數準確性較佳的圖像分類模型,並且將該些被確認的圖像分類模型進行合併,利用該些合併後的圖像分類模型對該加工產線所提供之產品進行良品或瑕疵品之圖像分類判別。The optical detection secondary image classification method according to claim 1, wherein, in the optical detection secondary image classification method, in the step (h), the step (f) to the step ( g) After that, among the image classification models, the image classification model with better plural accuracy is confirmed, and the confirmed image classification models are merged, and the merged image classification models are used for the The products provided by the processing line are classified into good or defective products by image classification. 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,該訓練資料集(20)與該驗證資料集(30)之良品圖像數量係由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集(20)之過度篩檢圖像數量係由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集(20)與該驗證資料集(30)之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成。The optical detection secondary image classification method according to any one of Claims 1 to 3, wherein the number of good quality images in the training data set (20) and the verification data set (30) is determined by the automatic The optical inspection system judges it to be good and is achieved through the amplification of the original image of the good product that is manually confirmed as good; the number of over-screened images in the training data set (20) is determined by the automatic optical inspection system to be defective but through Amplification of the original image of the good product that was manually confirmed as a good product is achieved; the number of defective product images in the training data set (20) and the verification data set (30) is determined by the automatic optical detection system as defective products by a plurality of The original image of the defective product confirmed as a defective product is amplified. 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,該驗證資料集(30)當中之各該良品圖像係與該訓練資料集(20)當中之各該良品圖像不完全相同,該驗證資料集(30)當中之各該瑕疵品圖像係與該訓練資料集(20)當中之各該瑕疵品圖像不完全相同。The optical detection secondary image classification method according to any one of claims 1 to 3, wherein each of the good image in the verification data set (30) and each of the training data set (20) The good product images are not completely the same, and each of the defective product images in the verification data set (30) is not completely the same as each of the defective product images in the training data set (20). 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,該訓練資料集(20)與該驗證資料集(30)之良品圖像數量係由複數經該自動光學檢測系統判別為良品且透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集(20)之過度篩檢圖像數量係由複數經該自動光學檢測系統判別為瑕疵品但透過人工確認為良品的良品原始圖像擴增達成;該訓練資料集(20)與該驗證資料集(30)之瑕疵品圖像數量係由複數經該自動光學檢測系統判別為瑕疵品且透過人工確認為瑕疵品的瑕疵品原始圖像擴增達成;以及,該驗證資料集(30)當中之各該良品圖像係與該訓練資料集(20)當中之各該良品圖像不完全相同,該驗證資料集(30)當中之各該瑕疵品圖像係與該訓練資料集(20)當中之各該瑕疵品圖像不完全同。The optical detection secondary image classification method according to any one of Claims 1 to 3, wherein the number of good quality images in the training data set (20) and the verification data set (30) is determined by the automatic The optical inspection system judges it to be good and is achieved through the amplification of the original image of the good product that is manually confirmed as good; the number of over-screened images in the training data set (20) is determined by the automatic optical inspection system to be defective but through Amplification of the original image of the good product that was manually confirmed as a good product is achieved; the number of defective product images in the training data set (20) and the verification data set (30) is determined by the automatic optical detection system as defective products by a plurality of The original image of the defective product confirmed as a defective product is amplified; and, each of the good product images in the verification data set (30) is not exactly the same as each of the good product images in the training data set (20), Each of the defective product images in the verification data set (30) is not exactly the same as each of the defective product images in the training data set (20). 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,各該圖像分類模型之各該類神經網路架構(40)對各輸入圖像之預測輸出值,係以0或1的輸出型態呈現。The optical detection secondary image classification method according to any one of claims 1 to 3, wherein the predicted output value of each of the neural network architectures (40) of each of the image classification models for each input image , Is presented in the output form of 0 or 1. 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,各該圖像分類模型之各該類神經網路架構(40)對各輸入圖像之預測輸出值,係以預測為0之機率及預測為1之機率的輸出型態呈現。The optical detection secondary image classification method according to any one of claims 1 to 3, wherein the predicted output value of each of the neural network architectures (40) of each of the image classification models for each input image , Is presented in the output form of the probability that the prediction is 0 and the probability that the prediction is 1. 如請求項1至3其中任一項所述之光學檢測二次圖像分類方法,其中,該光學檢測二次圖像分類方法,於該步驟(d)中,係於該圖像特徵自動辨識系統(10)之該儲存單元(11)中建立一供用以對所輸入之圖像進行良品或瑕疵品預測分類的卷積神經網路架構(Convolutional neural network , CNN)。The optical detection secondary image classification method according to any one of claims 1 to 3, wherein the optical detection secondary image classification method in the step (d) is based on the automatic identification of the image feature The storage unit (11) of the system (10) establishes a convolutional neural network (CNN) architecture for predicting and classifying the input image with good or defective products.
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