TW202115479A - Optical measuring device - Google Patents
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本發明關於一種電子裝置,且特別關於一種用以量測投影畫面的光學量測裝置。The present invention relates to an electronic device, and more particularly to an optical measurement device for measuring projection images.
在雷射投影機的投影架構中,光源由雷射二極體產生,並且透過多個光學元件投射並成像至外部。然而,由於光傳遞路徑上設置許多不同的光學元件、機構零件以及系統組裝等,因此畫面由於溫度變化而偏移。在投影機的開發、安裝、及/或校對過程中,畫面的偏移量需加以量測,以確認投影機或投影畫面是否符合預期。In the projection structure of a laser projector, the light source is generated by a laser diode, and is projected and imaged to the outside through a plurality of optical elements. However, because many different optical components, mechanical parts, and system assembly are installed on the light transmission path, the picture shifts due to temperature changes. During the development, installation, and/or proofreading process of the projector, the offset of the screen needs to be measured to confirm whether the projector or the projection screen meets expectations.
舉例而言,在投影畫面的量測過程中,可利用例如膠帶的標記物標識投影畫面的初始位置,人工調整投影機,使得所投射的畫面對準標記物所標識的初始位置。在投影機工作過程中,若投影畫面發生偏移,再藉由另一標記物記錄投影畫面偏移後的位置,再以人工量測或計算前後兩者的差異,進而得出畫面的偏移量。工作時間及工作溫度對投影機所投射之畫面的影像不容忽視。因此,需在量測時紀錄投影機的工作時間及工作溫度。然而此量測方法誤差較大,且量測精度有限,也需耗費大量時間及人力資源。For example, in the process of measuring the projection image, a marker such as tape can be used to mark the initial position of the projection image, and the projector can be manually adjusted so that the projected image is aligned with the initial position identified by the marker. During the working process of the projector, if the projected image is shifted, another marker is used to record the shifted position of the projected image, and then manually measure or calculate the difference between the two before and after to obtain the shift of the image the amount. The influence of working time and working temperature on the image of the screen projected by the projector cannot be ignored. Therefore, it is necessary to record the working time and working temperature of the projector during the measurement. However, this measurement method has large errors and limited measurement accuracy, which also consumes a lot of time and human resources.
“先前技術”段落只是用來幫助了解本發明內容,因此在“先前技術”段落所揭露的內容可能包含一些沒有構成所屬技術領域中具有通常知識者所知道的習知技術。在“先前技術”段落所揭露的內容,不代表該內容或者本發明一個或多個實施例所要解決的問題,在本發明申請前已被所屬技術領域中具有通常知識者所知曉或認知。The "prior art" paragraph is only used to help understand the content of the present invention, so the contents disclosed in the "prior art" paragraph may include some conventional technologies that do not constitute the common knowledge in the technical field. The content disclosed in the "prior art" paragraph does not represent the content or the problem to be solved by one or more embodiments of the present invention, and has been known or recognized by those with ordinary knowledge in the technical field before the application of the present invention.
本發明提供一種光學量測裝置,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。The invention provides an optical measuring device, which can effectively measure the degree of deviation of the projection image, effectively save manpower and time, and can greatly improve the accuracy of the measurement.
本發明的其他目的和優點可以從本發明所揭露的技術特徵中得到進一步的了解。The other objectives and advantages of the present invention can be further understood from the technical features disclosed in the present invention.
為達上述之一或部份或全部目的或是其他目的,本發明的一實施例提出一種光學量測裝置,用以量測由投影裝置投射至投影目標的投影畫面。光學量測裝置包括量測單元以及處理單元。量測單元配置於投影目標上。量測單元包括第一光感測條及第二光感測條。處理單元電性連接於量測單元。第一光感測條包括沿第一方向斜向排列的多個第一光感測組,且第二光感測條包括沿第二方向斜向排列的多個第二光感測組。各第一光感測組包括至少一第一光感測元件,各第二光感測組包括至少一第二光感測元件,且第一方向垂直於第二方向。In order to achieve one or part or all of the above objectives or other objectives, an embodiment of the present invention provides an optical measurement device for measuring the projection image projected from the projection device to the projection target. The optical measurement device includes a measurement unit and a processing unit. The measuring unit is arranged on the projection target. The measuring unit includes a first light sensing strip and a second light sensing strip. The processing unit is electrically connected to the measuring unit. The first light sensing strip includes a plurality of first light sensing groups arranged obliquely along a first direction, and the second light sensing strip includes a plurality of second light sensing groups arranged obliquely along a second direction. Each first light sensing group includes at least one first light sensing element, and each second light sensing group includes at least one second light sensing element, and the first direction is perpendicular to the second direction.
基於上述,本發明的實施例至少具有以下其中一個優點或功效。利用本發明的光學量測裝置,當投影畫面產生位移後,根據量測單元上不同位置的光感測元件所接收到的光束的強度以及強度的改變,處理單元接收相關訊號,且由該些訊號演算得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。Based on the above, the embodiments of the present invention have at least one of the following advantages or effects. With the optical measurement device of the present invention, when the projection image is displaced, the processing unit receives the relevant signal according to the intensity and the change of the intensity of the light beam received by the light sensing element at different positions on the measurement unit, and the processing unit receives the relevant signal. The signal calculation obtains the displacement direction and displacement amount of the projection screen. In this way, the degree of deviation of the projection image can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.
有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之一較佳實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:上、下、左、右、前或後等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明並非用來限制本發明。The foregoing and other technical contents, features, and effects of the present invention will be clearly presented in the following detailed description of a preferred embodiment with reference to the drawings. The directional terms mentioned in the following embodiments, for example: up, down, left, right, front or back, etc., are only directions for referring to the attached drawings. Therefore, the directional terms used are used to illustrate but not to limit the present invention.
圖1為本發明一實施例的光學量測裝置的使用狀態示意圖。請參考圖1,本實施例提供一種光學量測裝置100,用以量測由投影裝置50投射至投影目標10的投影畫面P1。投影目標10例如是螢幕或牆面,投影裝置50例如可為包含照明模組、光閥、及投影鏡頭的投影機,本發明並不限於此。光學量測裝置100包括量測單元110以及處理單元120。量測單元110配置於投影目標10上,且處理單元120電性連接於量測單元110。在本實施例中,光學量測裝置100的量測單元110的數量為四個,且分別配置於投影畫面P1的四個角落位置處,以下說明將以四個量測單元110為例。然而,在不同的實施例中,量測單元110的數量可以為其他數量,本發明並不限於此。在一實施例中,量測單元110的數量為兩個,且可分別配置於投影畫面P1的兩個對角位置處。FIG. 1 is a schematic diagram of an optical measurement device in use according to an embodiment of the present invention. Please refer to FIG. 1, this embodiment provides an
在一些實施例中,處理單元120例如可包含中央處理單元(central processing unit, CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor, DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits, ASIC)、可程式化邏輯裝置(Programmable Logic Device, PLD)或其他類似裝置或這些裝置的組合,本發明並不以此為限。In some embodiments, the
在一些實施例中,處理單元120可自動化的接收相關訊號,即時的計算並儲存投影畫面的位置資訊。In some embodiments, the
圖2為本發明一實施例的量測單元的示意圖。請參考圖1及圖2,圖2所繪示的量測單元110至少可應用於圖1所繪示的光學量測裝置100中,以下說明以圖1之光學量測裝置100包含圖2之量測單元110的情形為例。在本實施例中,量測單元110包括第一光感測條L1以及第二光感測條L2。舉例而言,在本實施例中,第一光感測條L1及第二光感測條L2的數量分別為四條。然而,在不同的實施例中,第一光感測條L1及第二光感測條L2的數量可依需求設計為一個或多個,本發明並不限於此。FIG. 2 is a schematic diagram of a measurement unit according to an embodiment of the invention. Please refer to FIGS. 1 and 2. The
詳細而言,第一光感測條L1包括沿第一方向D1斜向排列的多個第一光感測組G1,且第二光感測條L2包括沿第二方向D2斜向排列的多個第二光感測組G2。各第一光感測組G1包括至少一第一光感測元件112_1,且各第二光感測組G2包括至少一第二光感測元件112_2。在本實施例中,第一光感測條L1的數量為多個,且多個第一光感測條L1沿第二方向D2排列(例如,直線排列)。第二光感測條L2的數量為多個,且多個第二光感測條L2沿第一方向D1排列(例如,直線排列)。舉例而言,各第一光感測條L1包括四個第一光感測組G1,且這四個第一光感測組G1在第一方向D1上呈階梯狀的排列。各第二光感測條L2包括四個第二光感測組G2,且這四個第二光感測組G2在第二方向D2上呈階梯狀的排列。在圖2所示實施例中,第一光感測組G1包括單一的第一光感測元件112_1,且第二光感測組G2包括單一的第二光感測元件112_2。第一光感測元件112_1及第二光感測元件112_2例如是光電二極體(photodiode)或光敏電阻,其可用以感測光束的強度。在一些實施例中,光感測元件例如可具有5毫米(mm)的寬度。本發明並不限於此。舉例而言,第一方向D1為水平方向,第二方向D2為鉛直方向,第一方向D1垂直於第二方向D2,如圖2所顯示。In detail, the first light sensing strip L1 includes a plurality of first light sensing groups G1 arranged obliquely along the first direction D1, and the second light sensing strip L2 includes a plurality of first light sensing groups G1 arranged obliquely along the second direction D2. A second light sensing group G2. Each first light sensing group G1 includes at least one first light sensing element 112_1, and each second light sensing group G2 includes at least one second light sensing element 112_2. In this embodiment, the number of the first light sensing strips L1 is multiple, and the multiple first light sensing strips L1 are arranged along the second direction D2 (for example, arranged in a straight line). The number of the second light sensing bars L2 is multiple, and the multiple second light sensing bars L2 are arranged along the first direction D1 (for example, arranged in a straight line). For example, each first light sensing bar L1 includes four first light sensing groups G1, and the four first light sensing groups G1 are arranged in a stepwise manner in the first direction D1. Each second light sensing strip L2 includes four second light sensing groups G2, and the four second light sensing groups G2 are arranged in a stepped manner in the second direction D2. In the embodiment shown in FIG. 2, the first light-sensing group G1 includes a single first light-sensing element 112_1, and the second light-sensing group G2 includes a single second light-sensing element 112_2. The first light sensing element 112_1 and the second light sensing element 112_2 are, for example, photodiodes or photoresistors, which can be used to sense the intensity of the light beam. In some embodiments, the light sensing element may have a width of 5 millimeters (mm), for example. The present invention is not limited to this. For example, the first direction D1 is a horizontal direction, the second direction D2 is a vertical direction, and the first direction D1 is perpendicular to the second direction D2, as shown in FIG. 2.
在一實施例中,根據量測單元110測得的數據,可藉由處理單元120加以運算,得出投影畫面P1在投影目標10上的位移方向及/或位移量(亦即,在不同時間,投影畫面P1在投影目標10上的不同位置之間的差異)。在圖2所示的實施例中,投影畫面P1及投影畫面P2分別表示位於不同位置的投影畫面。在量測投影畫面P1時,由於多個第一光感測組G1在第一方向D1斜向排列,當投影畫面P1覆蓋至量測單元110的第一光感測條L1時,第一光感測條L1上不同位置的第一光感測元件112_1可接收到不同光強度的光束,因此各第一光感測元件112_1可產生不同的訊號(例如,電訊號)。詳細而言,就投影畫面P1而言,如圖2所示,第一光感測元件112_1_a位於投影畫面P1的範圍以內,因此感測的光束強度較大,第一光感測元件112_1_c位於投影畫面P1的範圍以外,因此感測的光束強度較小(舉例而言,第一光感測元件112_1_c感測到的光束的強度為零),且第一光感測元件112_1_b與投影畫面P1的範圍部分重疊,因此感測的光束強度介於第一光感測元件112_1_a與112_1_c之間。據此,可根據各第一光感測元件112_1所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的一邊緣(例如,如圖2所示之投影畫面P1的下邊緣)位於第一光感測元件112_1_b的範圍內。同樣的,由於多個第二光感測組G2在第二方向D2斜向排列,當投影畫面P1覆蓋至量測單元110的第二光感測條L2時,第二光感測條L2上不同位置的第二光感測元件112_2可接收到不同光強度的光束,因此各第一光感測元件112_2可產生不同的訊號(例如,電訊號)。詳細而言,就投影畫面P1而言,如圖2所示,第二光感測元件112_2_a位於投影畫面P1的範圍以內,因此感測的光束強度較大,第二光感測元件112_2_c位於投影畫面P1的範圍以外,因此感測的光束強度較小,且第二光感測元件112_2_b與投影畫面P1的範圍部分重疊,因此感測的光束強度介於第二光感測元件112_2_a與112_2_c之間。據此,可根據各第二光感測元件112_2所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的另一邊緣(例如,如圖2所示之投影畫面P1的右邊緣)位於第二光感測元件112_2_b的範圍內。因此,藉由多個第一光感測元件112_1及多個第二光感測元件112_2可獲得整體投影畫面P1的位置資訊。In one embodiment, according to the data measured by the
類似的,可獲得整體投影畫面P2的位置資訊,藉由比較整體投影畫面P1的位置資訊及整體投影畫面P2的位置資訊,可得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面P1的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。Similarly, the position information of the overall projection screen P2 can be obtained. By comparing the position information of the overall projection screen P1 and the position information of the overall projection screen P2, the displacement direction and displacement amount of the projection screen can be obtained. In this way, the degree of deviation of the projection screen P1 can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.
在一些實施例中,判斷投影畫面的位移方向及位移量的方法不限於此。舉例而言,第一光感測組G1可包含較多數目的第一光感測元件112_1,且/或第二光感測組G2可包含較多數目的第二光感測元件112_2(請參考圖5)。在其他實施例中,多個第一光感測元件112_1及/或多個第二光感測元件112_2的排列方式可不同於圖2所示的實施例,本發明並不限於此。In some embodiments, the method of determining the displacement direction and displacement amount of the projection screen is not limited to this. For example, the first light sensing group G1 may include a greater number of first light sensing elements 112_1, and/or the second light sensing group G2 may include a greater number of second light sensing elements 112_2 (please refer to FIG. 5). In other embodiments, the arrangement of the plurality of first light sensing elements 112_1 and/or the plurality of second light sensing elements 112_2 may be different from the embodiment shown in FIG. 2, and the present invention is not limited thereto.
在圖2所示實施例中,在各第一光感測條L1中,兩相鄰第一光感測組G1沿第二方向D2的間距B1小於各第一光感測組G1沿第二方向D2的尺寸C1。在各第二光感測條L2中,兩相鄰第二光感測組G2沿第一方向D1的間距B2小於各第二光感測組G2沿第一方向D1的尺寸C2。如圖2所繪示,在本實施例中,量測單元110在第二方向D2上可達成的量測精度為B1,在第一方向D1上的量測精度為B2。由於間距B1小於尺寸C1,且間距B2小於尺寸C2,因此本實施例的量測單元110可達成較佳的量測精度。In the embodiment shown in FIG. 2, in each first light sensing strip L1, the distance B1 between two adjacent first light sensing groups G1 along the second direction D2 is smaller than that of each first light sensing group G1 along the second direction D2. Dimension C1 in direction D2. In each second light sensing strip L2, the distance B2 between two adjacent second light sensing groups G2 along the first direction D1 is smaller than the size C2 of each second light sensing group G2 along the first direction D1. As shown in FIG. 2, in this embodiment, the achievable measurement accuracy of the
在一些實施例中,處理單元120可電性連接於顯示裝置60。顯示裝置60可用以顯示處理單元120所獲得的畫面位移的資訊。顯示裝置60例如是顯示器或桌上型電腦,但本發明並不限於此。另外,在本實施例中,處理單元120也可選擇性地電性連接於投影裝置50,藉此可將投影裝置50所投射之投影畫面P1的位置或光強度資訊提供至處理單元120,以提高處理單元120進行運算的精準度。In some embodiments, the
在另一些實施例中,可在投影裝置50的適當位置處設置溫度感測器,由於投影裝置50與處理單元120電性連接,處理單元120可即時接收並儲存投影裝置50的溫度資訊。在此情形中,由於處理單元120儲存投影畫面的位置資訊以及投影裝置50的溫度資訊,藉此可實現更全面的資訊分析。In other embodiments, a temperature sensor may be provided at an appropriate position of the
在本實施例中,量測單元110更可包括基板114,例如是電路板。基板114包含第一部份114_1以及第二部份114_2。第一光感測條L1及第二光感測條L2分別配置於基板114的第一部份114_1及第二部份114_2上。在本實施例中,基板114的第一部份114_1的延伸方向平行於第一方向D1,基板114的第二部份114_2的延伸方向平行於第二方向D2,且第一部份114_1及第二部份114_2在投影目標10上可呈現L狀。如圖1及圖2所繪示,在本實施例中,第一部份114_1及第二部份114_2可為兩部分,以組合形成基板114。然而,本發明不限於此,在其他實施例中,第一部份114_1及第二部份114_2亦可形成為一體。In this embodiment, the
圖3為本發明一實施例的量測單元的局部剖視圖。舉例而言,圖3可為圖2之量測單元110沿線A-A’的局部剖視圖。請參考圖2及圖3,圖3所繪示的量測單元110至少可為圖2所示之量測單元110的一部分。在圖2中為方便說明而省略顯示遮光元件116。在圖3中,以量測單元110之基板114的第一部份114_1的一部份為例加以說明。在圖3所示的實施例中,量測單元110更包括遮光元件116,遮光元件116包含第一遮光部116_1以及第二遮光部(圖3未繪示)。第一遮光部116_1具有對應多個第一光感測元件112_1的多個第一開口O1,第二遮光部具有對應於多個第二光感測元件112_2的多個第二開口(圖3未繪示)。在本實施例中,第一開口O1的數量相同於第一光感測元件112_1的數量,且第二開口的數量相同於第二光感測元件112_2的數量,但本發明並不限於此。在其他實施例中,例如在遮光元件116的第一遮光部116_1中,第一開口O1的數量可小於第一光感測元件112_1的數量,第二開口的數量可小於第二光感測元件112_2的數量。舉例而言,一個第一開口O1可對應於多個第一光感測元件112_1,同樣的,一個第二開口可對應於多個第二光感測元件112_2。在本實施例中,第一遮光部以及第二遮光部可為兩部分,以組合形成遮光元件116。然而,本發明不限於此,在其他實施例中,第一遮光部以及第二遮光部亦可形成為一體。FIG. 3 is a partial cross-sectional view of a measurement unit according to an embodiment of the invention. For example, FIG. 3 may be a partial cross-sectional view of the measuring
在本實施例中,第一開口O1沿第二方向D2的尺寸C3小於第一光感測元件112_1沿第二方向D2上的尺寸C4。同樣的,第二開口沿第一方向D1的尺寸小於第二光感測元件112_2沿第一方向D1的尺寸。如圖3所繪示,C3<C4。在本實施例中,在量測投影畫面時,遮光元件116可有利於避免鄰近之光感測元件間的互相干擾,從而精確判斷不同位置處之光感測元件所接受光束的光強度。舉例而言,第一光感測組G1沿第二方向D2的尺寸C4例如可為1毫米(mm),且第一光感測條L1包含四個第一光感測組G1,對應的,第一遮光部116_1具有對應於第一光感測條L1的四個第一開口O1,且第一開口O1沿第二方向D2的尺寸C3不大於1毫米(mm)。在此情形,第一光感測條L1的四個第一光感測組G1可不呈階梯狀的排列,惟對應於該四個第一光感測組G1的四個第一開口O1可呈階梯狀排列。舉例而言,第一光感測條L1的四個第一光感測組G1可沿第一方向D1方向呈直線排列,四個第一開口O1沿第一方向D1呈階梯狀排列,且相鄰兩第一開口O1沿第二方向D2的最小間距為0.25毫米(mm)。在如此之配置中,量測單元110在第二方向D2上可達成的量測精度0.25毫米(mm)。In this embodiment, the size C3 of the first opening O1 along the second direction D2 is smaller than the size C4 of the first light sensing element 112_1 along the second direction D2. Similarly, the size of the second opening along the first direction D1 is smaller than the size of the second light sensing element 112_2 along the first direction D1. As shown in Figure 3, C3<C4. In this embodiment, when measuring the projection image, the
圖4為本發明另一實施例的量測單元的局部剖視圖。舉例而言,圖4可為圖2之量測單元110沿線E-E’的局部剖視圖。請參考圖2及圖4,圖4所繪示的量測單元110A至少可為圖2所示之量測單元110的一部分。在圖4中,以量測單元110A之基板114的第一部份114_1的一部份為例加以說明。在圖4所示的實施例中,第一遮光部116_1A具有圍繞第一開口O1的多個第一側壁S1,且第二遮光部具有圍繞第二開口的多個第二側壁(圖4未繪示)。在本實施例中,在第一遮光部116_1A中,第一側壁S1可由遮光元件116A朝基板114延伸形成。同樣的,在第二遮光部中,第二側壁可遮光元件116A朝基板114延伸形成。在本實施例中,在量測投影畫面時,設置於第一開口O1周圍的第一側邊S1及/或設置於第二開口周圍的第二側邊可進一步避免鄰近之光感測元件間的互相干擾,從而精確判斷不同位置處之光感測元件所接受光束的光強度。4 is a partial cross-sectional view of a measurement unit according to another embodiment of the invention. For example, FIG. 4 may be a partial cross-sectional view of the measuring
圖5為本發明一實施例的量測單元在傾斜時的示意圖。請參考圖5,圖5所繪示的量測單元110B類似於圖2所繪示的110。兩者不同之處在於,在本實施例中,第一光感測組G1包含兩個第一光感測元件112_1(112_1_d、112_1_e),且沿第二方向D2觀察,兩個第一光感測元件112_1_d、112_1_e並列設置。第二光感測組G2包含兩個第二光感測元件112_2,且沿第一方向D1觀察,兩個第二光感測元件112_2並列設置。舉例而言,在圖5所示實施例中,第一光感測組G1的兩個第一光感測元件112_1_d、112_1_e在第二方向D2上具有相同的座標,且第二光感測組G2的兩個第二光感測元件112_2在第一方向D1上具有相同的座標。當投影畫面在投影目標10歪斜時,例如在圖5中當投影畫面P1歪斜角度θ時,一個第一光感測組G1中的兩個第一光感測元件112_1將會接收到不同光強度的光束。因此兩個第一光感測元件112_1可分別產生不同的訊號(例如,電訊號)。同樣的,一個第二光感測組G2中的兩個第二光感測元件112_2亦可接收到不同光強度的光束,進而分別產生不同的訊號。詳細而言,如圖5所示,第一光感測元件112_1_f及第一光感測元件112_1_g皆與投影畫面P1的範圍重疊,但因第一光感測元件112_1_f與投影畫面P1重疊的範圍小於第一光感測元件112_1_g與投影畫面P1重疊的範圍,因此二者感測的光束強度不同,且進一步講,第一光感測元件112_1_f感測的光束強度小於第一光感測元件112_1_g感測的光束強度。據此,可根據第一光感測元件112_1_f、112_1_g所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的歪斜角度θ。如此一來,可藉由本實施例的量測單元110B進行量測,並分析同一光感測組中不同光感測元件所感測之光強度的不同,以判斷出投影畫面P1的歪斜程度,進而使得使用者可依據上述歪斜程度,將投影裝置100在投影目標10上的投影畫面的歪斜角度調整為零。FIG. 5 is a schematic diagram of a measurement unit when tilted according to an embodiment of the present invention. Please refer to FIG. 5. The
綜上所述,本發明的實施例至少具有以下其中一個優點或功效。利用本發明的光學量測裝置,當投影畫面產生位移後,根據量測單元上不同位置的光感測元件所接收到的光束的強度,處理單元接收相關訊號,且由該些訊號演算得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。In summary, the embodiments of the present invention have at least one of the following advantages or effects. With the optical measurement device of the present invention, when the projection image is displaced, the processing unit receives the relevant signals according to the intensity of the light beams received by the light sensing elements at different positions on the measurement unit, and calculates the results from these signals The displacement direction and amount of the projection screen. In this way, the degree of deviation of the projection image can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.
惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。另外本發明的任一實施例或申請專利範圍不須達成本發明所揭露之全部目的或優點或特點。此外,摘要部分和標題僅是用來輔助專利文件搜尋之用,並非用來限制本發明之權利範圍。此外,本說明書或申請專利範圍中提及的“第一”、“第二”等用語僅用以命名元件(element)的名稱或區別不同實施例或範圍,而並非用來限制元件數量上的上限或下限。However, the above are only preferred embodiments of the present invention, and should not be used to limit the scope of implementation of the present invention, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the description of the invention, All are still within the scope of the invention patent. In addition, any embodiment of the present invention or the scope of the patent application does not have to achieve all the objectives or advantages or features disclosed in the present invention. In addition, the abstract part and title are only used to assist in searching for patent documents, and are not used to limit the scope of rights of the present invention. In addition, the terms "first" and "second" mentioned in this specification or the scope of the patent application are only used to name the element (element) or to distinguish different embodiments or ranges, and are not used to limit the number of elements. Upper or lower limit.
10:投影目標
50:投影裝置
60:顯示裝置
100:光學量測裝置
110、110A、110B:量測單元
112_1、112_1_a~112_1_g:第一光感測元件
112_2、112_2_a~112_2_g:第二光感測元件
114:基板
114_1:第一部份
114_2:第二部份
116、116A:遮光元件
116_1、116_1A:第一遮光部
120:處理單元
A-A’、E-E’:線
B1、B2:間距
C1、C2、C3、C4:尺寸
D1:第一方向
D2:第二方向
G1:第一光感測組
G2:第二光感測組
L1:第一光感測條
L2:第二光感測條
O1:開口
P1、P2:投影畫面
S1:側壁
θ:角度10: Projection target
50: Projection device
60: display device
100:
圖1為本發明一實施例的光學量測裝置的使用狀態示意圖。 圖2為本發明一實施例的量測單元的示意圖。 圖3為本發明一實施例的量測單元的局部剖視圖。 圖4為本發明另一實施例的量測單元的局部剖視圖。 圖5為本發明一實施例的量測單元在傾斜時的示意圖。FIG. 1 is a schematic diagram of an optical measurement device in use according to an embodiment of the present invention. FIG. 2 is a schematic diagram of a measurement unit according to an embodiment of the invention. FIG. 3 is a partial cross-sectional view of a measurement unit according to an embodiment of the invention. 4 is a partial cross-sectional view of a measurement unit according to another embodiment of the invention. FIG. 5 is a schematic diagram of a measurement unit when tilted according to an embodiment of the present invention.
10:投影目標10: Projection target
50:投影裝置50: Projection device
60:顯示裝置60: display device
100:光學量測裝置100: Optical measuring device
110:量測單元110: Measuring unit
120:處理單元120: processing unit
P1:投影畫面P1: Projection screen
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