TW202115479A - Optical measuring device - Google Patents

Optical measuring device Download PDF

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TW202115479A
TW202115479A TW108136176A TW108136176A TW202115479A TW 202115479 A TW202115479 A TW 202115479A TW 108136176 A TW108136176 A TW 108136176A TW 108136176 A TW108136176 A TW 108136176A TW 202115479 A TW202115479 A TW 202115479A
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light
light sensing
sensing
measurement device
optical measurement
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TW108136176A
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Chinese (zh)
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彭致勛
吳志文
吳建均
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中強光電股份有限公司
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Abstract

An optical measuring device provided in the invention is adapted to measure a projection image projected on a projection target by a projection device The optical measuring device includes a measuring unit and a processing unit. The measuring unit is disposed on the projection target. The measuring unit includes a first sensing strip and a second light sensing strip. The processing unit is electrically connected to the measuring unit. The first light sensing strip includes a plurality of first light sensing groups arranged obliquely along a first direction, and the second light sensing strip includes a plurality of second light sensing groups arranged obliquely along a second direction. Each of the first light sensing groups includes at least one first light sensing element, each of the second light sensing groups includes at least one second light sensing element, and the first direction is perpendicular to the second direction.

Description

光學量測裝置Optical measuring device

本發明關於一種電子裝置,且特別關於一種用以量測投影畫面的光學量測裝置。The present invention relates to an electronic device, and more particularly to an optical measurement device for measuring projection images.

在雷射投影機的投影架構中,光源由雷射二極體產生,並且透過多個光學元件投射並成像至外部。然而,由於光傳遞路徑上設置許多不同的光學元件、機構零件以及系統組裝等,因此畫面由於溫度變化而偏移。在投影機的開發、安裝、及/或校對過程中,畫面的偏移量需加以量測,以確認投影機或投影畫面是否符合預期。In the projection structure of a laser projector, the light source is generated by a laser diode, and is projected and imaged to the outside through a plurality of optical elements. However, because many different optical components, mechanical parts, and system assembly are installed on the light transmission path, the picture shifts due to temperature changes. During the development, installation, and/or proofreading process of the projector, the offset of the screen needs to be measured to confirm whether the projector or the projection screen meets expectations.

舉例而言,在投影畫面的量測過程中,可利用例如膠帶的標記物標識投影畫面的初始位置,人工調整投影機,使得所投射的畫面對準標記物所標識的初始位置。在投影機工作過程中,若投影畫面發生偏移,再藉由另一標記物記錄投影畫面偏移後的位置,再以人工量測或計算前後兩者的差異,進而得出畫面的偏移量。工作時間及工作溫度對投影機所投射之畫面的影像不容忽視。因此,需在量測時紀錄投影機的工作時間及工作溫度。然而此量測方法誤差較大,且量測精度有限,也需耗費大量時間及人力資源。For example, in the process of measuring the projection image, a marker such as tape can be used to mark the initial position of the projection image, and the projector can be manually adjusted so that the projected image is aligned with the initial position identified by the marker. During the working process of the projector, if the projected image is shifted, another marker is used to record the shifted position of the projected image, and then manually measure or calculate the difference between the two before and after to obtain the shift of the image the amount. The influence of working time and working temperature on the image of the screen projected by the projector cannot be ignored. Therefore, it is necessary to record the working time and working temperature of the projector during the measurement. However, this measurement method has large errors and limited measurement accuracy, which also consumes a lot of time and human resources.

“先前技術”段落只是用來幫助了解本發明內容,因此在“先前技術”段落所揭露的內容可能包含一些沒有構成所屬技術領域中具有通常知識者所知道的習知技術。在“先前技術”段落所揭露的內容,不代表該內容或者本發明一個或多個實施例所要解決的問題,在本發明申請前已被所屬技術領域中具有通常知識者所知曉或認知。The "prior art" paragraph is only used to help understand the content of the present invention, so the contents disclosed in the "prior art" paragraph may include some conventional technologies that do not constitute the common knowledge in the technical field. The content disclosed in the "prior art" paragraph does not represent the content or the problem to be solved by one or more embodiments of the present invention, and has been known or recognized by those with ordinary knowledge in the technical field before the application of the present invention.

本發明提供一種光學量測裝置,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。The invention provides an optical measuring device, which can effectively measure the degree of deviation of the projection image, effectively save manpower and time, and can greatly improve the accuracy of the measurement.

本發明的其他目的和優點可以從本發明所揭露的技術特徵中得到進一步的了解。The other objectives and advantages of the present invention can be further understood from the technical features disclosed in the present invention.

為達上述之一或部份或全部目的或是其他目的,本發明的一實施例提出一種光學量測裝置,用以量測由投影裝置投射至投影目標的投影畫面。光學量測裝置包括量測單元以及處理單元。量測單元配置於投影目標上。量測單元包括第一光感測條及第二光感測條。處理單元電性連接於量測單元。第一光感測條包括沿第一方向斜向排列的多個第一光感測組,且第二光感測條包括沿第二方向斜向排列的多個第二光感測組。各第一光感測組包括至少一第一光感測元件,各第二光感測組包括至少一第二光感測元件,且第一方向垂直於第二方向。In order to achieve one or part or all of the above objectives or other objectives, an embodiment of the present invention provides an optical measurement device for measuring the projection image projected from the projection device to the projection target. The optical measurement device includes a measurement unit and a processing unit. The measuring unit is arranged on the projection target. The measuring unit includes a first light sensing strip and a second light sensing strip. The processing unit is electrically connected to the measuring unit. The first light sensing strip includes a plurality of first light sensing groups arranged obliquely along a first direction, and the second light sensing strip includes a plurality of second light sensing groups arranged obliquely along a second direction. Each first light sensing group includes at least one first light sensing element, and each second light sensing group includes at least one second light sensing element, and the first direction is perpendicular to the second direction.

基於上述,本發明的實施例至少具有以下其中一個優點或功效。利用本發明的光學量測裝置,當投影畫面產生位移後,根據量測單元上不同位置的光感測元件所接收到的光束的強度以及強度的改變,處理單元接收相關訊號,且由該些訊號演算得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。Based on the above, the embodiments of the present invention have at least one of the following advantages or effects. With the optical measurement device of the present invention, when the projection image is displaced, the processing unit receives the relevant signal according to the intensity and the change of the intensity of the light beam received by the light sensing element at different positions on the measurement unit, and the processing unit receives the relevant signal. The signal calculation obtains the displacement direction and displacement amount of the projection screen. In this way, the degree of deviation of the projection image can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.

有關本發明之前述及其他技術內容、特點與功效,在以下配合參考圖式之一較佳實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:上、下、左、右、前或後等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說明並非用來限制本發明。The foregoing and other technical contents, features, and effects of the present invention will be clearly presented in the following detailed description of a preferred embodiment with reference to the drawings. The directional terms mentioned in the following embodiments, for example: up, down, left, right, front or back, etc., are only directions for referring to the attached drawings. Therefore, the directional terms used are used to illustrate but not to limit the present invention.

圖1為本發明一實施例的光學量測裝置的使用狀態示意圖。請參考圖1,本實施例提供一種光學量測裝置100,用以量測由投影裝置50投射至投影目標10的投影畫面P1。投影目標10例如是螢幕或牆面,投影裝置50例如可為包含照明模組、光閥、及投影鏡頭的投影機,本發明並不限於此。光學量測裝置100包括量測單元110以及處理單元120。量測單元110配置於投影目標10上,且處理單元120電性連接於量測單元110。在本實施例中,光學量測裝置100的量測單元110的數量為四個,且分別配置於投影畫面P1的四個角落位置處,以下說明將以四個量測單元110為例。然而,在不同的實施例中,量測單元110的數量可以為其他數量,本發明並不限於此。在一實施例中,量測單元110的數量為兩個,且可分別配置於投影畫面P1的兩個對角位置處。FIG. 1 is a schematic diagram of an optical measurement device in use according to an embodiment of the present invention. Please refer to FIG. 1, this embodiment provides an optical measurement device 100 for measuring the projection image P1 projected by the projection device 50 to the projection target 10. The projection target 10 is, for example, a screen or a wall, and the projection device 50 may be, for example, a projector including an illumination module, a light valve, and a projection lens, and the present invention is not limited thereto. The optical measurement device 100 includes a measurement unit 110 and a processing unit 120. The measurement unit 110 is configured on the projection target 10, and the processing unit 120 is electrically connected to the measurement unit 110. In this embodiment, the number of the measuring units 110 of the optical measuring device 100 is four, and they are respectively arranged at the four corner positions of the projection screen P1. The following description will take the four measuring units 110 as an example. However, in different embodiments, the number of measurement units 110 may be other numbers, and the present invention is not limited to this. In an embodiment, the number of measurement units 110 is two, and they can be respectively arranged at two diagonal positions of the projection screen P1.

在一些實施例中,處理單元120例如可包含中央處理單元(central processing unit, CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor, DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits, ASIC)、可程式化邏輯裝置(Programmable Logic Device, PLD)或其他類似裝置或這些裝置的組合,本發明並不以此為限。In some embodiments, the processing unit 120 may include, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessors, or digital signal processors (Digital Signal Processors). Processor, DSP), programmable controller, application specific integrated circuit (Application Specific Integrated Circuits, ASIC), programmable logic device (Programmable Logic Device, PLD) or other similar devices or a combination of these devices, the present invention does not Not limited to this.

在一些實施例中,處理單元120可自動化的接收相關訊號,即時的計算並儲存投影畫面的位置資訊。In some embodiments, the processing unit 120 can automatically receive relevant signals, calculate and store the position information of the projection screen in real time.

圖2為本發明一實施例的量測單元的示意圖。請參考圖1及圖2,圖2所繪示的量測單元110至少可應用於圖1所繪示的光學量測裝置100中,以下說明以圖1之光學量測裝置100包含圖2之量測單元110的情形為例。在本實施例中,量測單元110包括第一光感測條L1以及第二光感測條L2。舉例而言,在本實施例中,第一光感測條L1及第二光感測條L2的數量分別為四條。然而,在不同的實施例中,第一光感測條L1及第二光感測條L2的數量可依需求設計為一個或多個,本發明並不限於此。FIG. 2 is a schematic diagram of a measurement unit according to an embodiment of the invention. Please refer to FIGS. 1 and 2. The measurement unit 110 shown in FIG. 2 can be used at least in the optical measurement device 100 shown in FIG. 1. The following description uses the optical measurement device 100 in FIG. 1 to include the optical measurement device 100 in FIG. Take the case of the measurement unit 110 as an example. In this embodiment, the measurement unit 110 includes a first light sensing strip L1 and a second light sensing strip L2. For example, in this embodiment, the number of the first light sensing strip L1 and the number of the second light sensing strip L2 is four respectively. However, in different embodiments, the number of the first light sensing strip L1 and the second light sensing strip L2 can be designed to be one or more according to requirements, and the present invention is not limited thereto.

詳細而言,第一光感測條L1包括沿第一方向D1斜向排列的多個第一光感測組G1,且第二光感測條L2包括沿第二方向D2斜向排列的多個第二光感測組G2。各第一光感測組G1包括至少一第一光感測元件112_1,且各第二光感測組G2包括至少一第二光感測元件112_2。在本實施例中,第一光感測條L1的數量為多個,且多個第一光感測條L1沿第二方向D2排列(例如,直線排列)。第二光感測條L2的數量為多個,且多個第二光感測條L2沿第一方向D1排列(例如,直線排列)。舉例而言,各第一光感測條L1包括四個第一光感測組G1,且這四個第一光感測組G1在第一方向D1上呈階梯狀的排列。各第二光感測條L2包括四個第二光感測組G2,且這四個第二光感測組G2在第二方向D2上呈階梯狀的排列。在圖2所示實施例中,第一光感測組G1包括單一的第一光感測元件112_1,且第二光感測組G2包括單一的第二光感測元件112_2。第一光感測元件112_1及第二光感測元件112_2例如是光電二極體(photodiode)或光敏電阻,其可用以感測光束的強度。在一些實施例中,光感測元件例如可具有5毫米(mm)的寬度。本發明並不限於此。舉例而言,第一方向D1為水平方向,第二方向D2為鉛直方向,第一方向D1垂直於第二方向D2,如圖2所顯示。In detail, the first light sensing strip L1 includes a plurality of first light sensing groups G1 arranged obliquely along the first direction D1, and the second light sensing strip L2 includes a plurality of first light sensing groups G1 arranged obliquely along the second direction D2. A second light sensing group G2. Each first light sensing group G1 includes at least one first light sensing element 112_1, and each second light sensing group G2 includes at least one second light sensing element 112_2. In this embodiment, the number of the first light sensing strips L1 is multiple, and the multiple first light sensing strips L1 are arranged along the second direction D2 (for example, arranged in a straight line). The number of the second light sensing bars L2 is multiple, and the multiple second light sensing bars L2 are arranged along the first direction D1 (for example, arranged in a straight line). For example, each first light sensing bar L1 includes four first light sensing groups G1, and the four first light sensing groups G1 are arranged in a stepwise manner in the first direction D1. Each second light sensing strip L2 includes four second light sensing groups G2, and the four second light sensing groups G2 are arranged in a stepped manner in the second direction D2. In the embodiment shown in FIG. 2, the first light-sensing group G1 includes a single first light-sensing element 112_1, and the second light-sensing group G2 includes a single second light-sensing element 112_2. The first light sensing element 112_1 and the second light sensing element 112_2 are, for example, photodiodes or photoresistors, which can be used to sense the intensity of the light beam. In some embodiments, the light sensing element may have a width of 5 millimeters (mm), for example. The present invention is not limited to this. For example, the first direction D1 is a horizontal direction, the second direction D2 is a vertical direction, and the first direction D1 is perpendicular to the second direction D2, as shown in FIG. 2.

在一實施例中,根據量測單元110測得的數據,可藉由處理單元120加以運算,得出投影畫面P1在投影目標10上的位移方向及/或位移量(亦即,在不同時間,投影畫面P1在投影目標10上的不同位置之間的差異)。在圖2所示的實施例中,投影畫面P1及投影畫面P2分別表示位於不同位置的投影畫面。在量測投影畫面P1時,由於多個第一光感測組G1在第一方向D1斜向排列,當投影畫面P1覆蓋至量測單元110的第一光感測條L1時,第一光感測條L1上不同位置的第一光感測元件112_1可接收到不同光強度的光束,因此各第一光感測元件112_1可產生不同的訊號(例如,電訊號)。詳細而言,就投影畫面P1而言,如圖2所示,第一光感測元件112_1_a位於投影畫面P1的範圍以內,因此感測的光束強度較大,第一光感測元件112_1_c位於投影畫面P1的範圍以外,因此感測的光束強度較小(舉例而言,第一光感測元件112_1_c感測到的光束的強度為零),且第一光感測元件112_1_b與投影畫面P1的範圍部分重疊,因此感測的光束強度介於第一光感測元件112_1_a與112_1_c之間。據此,可根據各第一光感測元件112_1所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的一邊緣(例如,如圖2所示之投影畫面P1的下邊緣)位於第一光感測元件112_1_b的範圍內。同樣的,由於多個第二光感測組G2在第二方向D2斜向排列,當投影畫面P1覆蓋至量測單元110的第二光感測條L2時,第二光感測條L2上不同位置的第二光感測元件112_2可接收到不同光強度的光束,因此各第一光感測元件112_2可產生不同的訊號(例如,電訊號)。詳細而言,就投影畫面P1而言,如圖2所示,第二光感測元件112_2_a位於投影畫面P1的範圍以內,因此感測的光束強度較大,第二光感測元件112_2_c位於投影畫面P1的範圍以外,因此感測的光束強度較小,且第二光感測元件112_2_b與投影畫面P1的範圍部分重疊,因此感測的光束強度介於第二光感測元件112_2_a與112_2_c之間。據此,可根據各第二光感測元件112_2所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的另一邊緣(例如,如圖2所示之投影畫面P1的右邊緣)位於第二光感測元件112_2_b的範圍內。因此,藉由多個第一光感測元件112_1及多個第二光感測元件112_2可獲得整體投影畫面P1的位置資訊。In one embodiment, according to the data measured by the measuring unit 110, the processing unit 120 can calculate the displacement direction and/or displacement of the projection screen P1 on the projection target 10 (that is, at different times , The difference between the different positions of the projection picture P1 on the projection target 10). In the embodiment shown in FIG. 2, the projection picture P1 and the projection picture P2 respectively represent projection pictures located at different positions. When measuring the projection picture P1, since the plurality of first light sensing groups G1 are arranged obliquely in the first direction D1, when the projection picture P1 covers the first light sensing strip L1 of the measuring unit 110, the first light sensing group G1 The first light sensing elements 112_1 at different positions on the sensing bar L1 can receive light beams with different light intensities, so each first light sensing element 112_1 can generate different signals (for example, electrical signals). In detail, with regard to the projection screen P1, as shown in FIG. 2, the first light sensing element 112_1_a is located within the range of the projection screen P1, so the intensity of the light beam sensed is relatively large, and the first light sensing element 112_1_c is located in the projection screen. The image P1 is outside the range, so the intensity of the light beam sensed is small (for example, the intensity of the light beam sensed by the first light sensing element 112_1_c is zero), and the first light sensing element 112_1_b and the projection image P1 The ranges partially overlap, so the intensity of the sensed beam is between the first light sensing elements 112_1_a and 112_1_c. Accordingly, according to the comparison of the light intensity sensed by each first light sensing element 112_1, an edge of the projection picture P1 (for example, the lower part of the projection picture P1 as shown in FIG. 2) can be calculated by the processing unit 120 The edge) is located within the range of the first light sensing element 112_1_b. Similarly, since the plurality of second light sensing groups G2 are arranged obliquely in the second direction D2, when the projection image P1 covers the second light sensing strip L2 of the measuring unit 110, the second light sensing strip L2 The second light sensing elements 112_2 at different positions can receive light beams with different light intensities, so each of the first light sensing elements 112_2 can generate different signals (for example, electrical signals). In detail, as for the projection screen P1, as shown in FIG. 2, the second light sensing element 112_2_a is located within the range of the projection screen P1, so the intensity of the light beam sensed is relatively large, and the second light sensing element 112_2_c is located in the projection The image P1 is outside the range, so the intensity of the light beam sensed is small, and the second light sensing element 112_2_b partially overlaps the range of the projection image P1, so the intensity of the light beam sensed is between the second light sensing elements 112_2_a and 112_2_c. between. According to this, according to the comparison of the light intensity sensed by each second light sensing element 112_2, the processing unit 120 calculates the other edge of the projection picture P1 (for example, the projection picture P1 shown in FIG. 2 The right edge) is located within the range of the second light sensing element 112_2_b. Therefore, the position information of the overall projection screen P1 can be obtained by the plurality of first light sensing elements 112_1 and the plurality of second light sensing elements 112_2.

類似的,可獲得整體投影畫面P2的位置資訊,藉由比較整體投影畫面P1的位置資訊及整體投影畫面P2的位置資訊,可得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面P1的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。Similarly, the position information of the overall projection screen P2 can be obtained. By comparing the position information of the overall projection screen P1 and the position information of the overall projection screen P2, the displacement direction and displacement amount of the projection screen can be obtained. In this way, the degree of deviation of the projection screen P1 can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.

在一些實施例中,判斷投影畫面的位移方向及位移量的方法不限於此。舉例而言,第一光感測組G1可包含較多數目的第一光感測元件112_1,且/或第二光感測組G2可包含較多數目的第二光感測元件112_2(請參考圖5)。在其他實施例中,多個第一光感測元件112_1及/或多個第二光感測元件112_2的排列方式可不同於圖2所示的實施例,本發明並不限於此。In some embodiments, the method of determining the displacement direction and displacement amount of the projection screen is not limited to this. For example, the first light sensing group G1 may include a greater number of first light sensing elements 112_1, and/or the second light sensing group G2 may include a greater number of second light sensing elements 112_2 (please refer to FIG. 5). In other embodiments, the arrangement of the plurality of first light sensing elements 112_1 and/or the plurality of second light sensing elements 112_2 may be different from the embodiment shown in FIG. 2, and the present invention is not limited thereto.

在圖2所示實施例中,在各第一光感測條L1中,兩相鄰第一光感測組G1沿第二方向D2的間距B1小於各第一光感測組G1沿第二方向D2的尺寸C1。在各第二光感測條L2中,兩相鄰第二光感測組G2沿第一方向D1的間距B2小於各第二光感測組G2沿第一方向D1的尺寸C2。如圖2所繪示,在本實施例中,量測單元110在第二方向D2上可達成的量測精度為B1,在第一方向D1上的量測精度為B2。由於間距B1小於尺寸C1,且間距B2小於尺寸C2,因此本實施例的量測單元110可達成較佳的量測精度。In the embodiment shown in FIG. 2, in each first light sensing strip L1, the distance B1 between two adjacent first light sensing groups G1 along the second direction D2 is smaller than that of each first light sensing group G1 along the second direction D2. Dimension C1 in direction D2. In each second light sensing strip L2, the distance B2 between two adjacent second light sensing groups G2 along the first direction D1 is smaller than the size C2 of each second light sensing group G2 along the first direction D1. As shown in FIG. 2, in this embodiment, the achievable measurement accuracy of the measurement unit 110 in the second direction D2 is B1, and the measurement accuracy in the first direction D1 is B2. Since the spacing B1 is smaller than the size C1, and the spacing B2 is smaller than the size C2, the measurement unit 110 of this embodiment can achieve better measurement accuracy.

在一些實施例中,處理單元120可電性連接於顯示裝置60。顯示裝置60可用以顯示處理單元120所獲得的畫面位移的資訊。顯示裝置60例如是顯示器或桌上型電腦,但本發明並不限於此。另外,在本實施例中,處理單元120也可選擇性地電性連接於投影裝置50,藉此可將投影裝置50所投射之投影畫面P1的位置或光強度資訊提供至處理單元120,以提高處理單元120進行運算的精準度。In some embodiments, the processing unit 120 may be electrically connected to the display device 60. The display device 60 can be used to display the screen displacement information obtained by the processing unit 120. The display device 60 is, for example, a monitor or a desktop computer, but the invention is not limited to this. In addition, in this embodiment, the processing unit 120 can also be selectively electrically connected to the projection device 50, so that the position or light intensity information of the projection screen P1 projected by the projection device 50 can be provided to the processing unit 120 to Improve the accuracy of operations performed by the processing unit 120.

在另一些實施例中,可在投影裝置50的適當位置處設置溫度感測器,由於投影裝置50與處理單元120電性連接,處理單元120可即時接收並儲存投影裝置50的溫度資訊。在此情形中,由於處理單元120儲存投影畫面的位置資訊以及投影裝置50的溫度資訊,藉此可實現更全面的資訊分析。In other embodiments, a temperature sensor may be provided at an appropriate position of the projection device 50. Since the projection device 50 is electrically connected to the processing unit 120, the processing unit 120 can receive and store the temperature information of the projection device 50 in real time. In this case, since the processing unit 120 stores the position information of the projection screen and the temperature information of the projection device 50, a more comprehensive information analysis can be realized.

在本實施例中,量測單元110更可包括基板114,例如是電路板。基板114包含第一部份114_1以及第二部份114_2。第一光感測條L1及第二光感測條L2分別配置於基板114的第一部份114_1及第二部份114_2上。在本實施例中,基板114的第一部份114_1的延伸方向平行於第一方向D1,基板114的第二部份114_2的延伸方向平行於第二方向D2,且第一部份114_1及第二部份114_2在投影目標10上可呈現L狀。如圖1及圖2所繪示,在本實施例中,第一部份114_1及第二部份114_2可為兩部分,以組合形成基板114。然而,本發明不限於此,在其他實施例中,第一部份114_1及第二部份114_2亦可形成為一體。In this embodiment, the measurement unit 110 may further include a substrate 114, such as a circuit board. The substrate 114 includes a first part 114_1 and a second part 114_2. The first light sensing strip L1 and the second light sensing strip L2 are respectively disposed on the first portion 114_1 and the second portion 114_2 of the substrate 114. In this embodiment, the extending direction of the first portion 114_1 of the substrate 114 is parallel to the first direction D1, the extending direction of the second portion 114_2 of the substrate 114 is parallel to the second direction D2, and the first portion 114_1 and the first portion 114_1 The second part 114_2 may be L-shaped on the projection target 10. As shown in FIG. 1 and FIG. 2, in this embodiment, the first part 114_1 and the second part 114_2 can be two parts to be combined to form the substrate 114. However, the present invention is not limited to this. In other embodiments, the first part 114_1 and the second part 114_2 can also be formed as one body.

圖3為本發明一實施例的量測單元的局部剖視圖。舉例而言,圖3可為圖2之量測單元110沿線A-A’的局部剖視圖。請參考圖2及圖3,圖3所繪示的量測單元110至少可為圖2所示之量測單元110的一部分。在圖2中為方便說明而省略顯示遮光元件116。在圖3中,以量測單元110之基板114的第一部份114_1的一部份為例加以說明。在圖3所示的實施例中,量測單元110更包括遮光元件116,遮光元件116包含第一遮光部116_1以及第二遮光部(圖3未繪示)。第一遮光部116_1具有對應多個第一光感測元件112_1的多個第一開口O1,第二遮光部具有對應於多個第二光感測元件112_2的多個第二開口(圖3未繪示)。在本實施例中,第一開口O1的數量相同於第一光感測元件112_1的數量,且第二開口的數量相同於第二光感測元件112_2的數量,但本發明並不限於此。在其他實施例中,例如在遮光元件116的第一遮光部116_1中,第一開口O1的數量可小於第一光感測元件112_1的數量,第二開口的數量可小於第二光感測元件112_2的數量。舉例而言,一個第一開口O1可對應於多個第一光感測元件112_1,同樣的,一個第二開口可對應於多個第二光感測元件112_2。在本實施例中,第一遮光部以及第二遮光部可為兩部分,以組合形成遮光元件116。然而,本發明不限於此,在其他實施例中,第一遮光部以及第二遮光部亦可形成為一體。FIG. 3 is a partial cross-sectional view of a measurement unit according to an embodiment of the invention. For example, FIG. 3 may be a partial cross-sectional view of the measuring unit 110 of FIG. 2 along the line A-A'. Please refer to FIGS. 2 and 3. The measurement unit 110 shown in FIG. 3 can be at least a part of the measurement unit 110 shown in FIG. 2. In FIG. 2, the shading element 116 is omitted for convenience of description. In FIG. 3, a part of the first part 114_1 of the substrate 114 of the measurement unit 110 is taken as an example for illustration. In the embodiment shown in FIG. 3, the measurement unit 110 further includes a shading element 116, and the shading element 116 includes a first shading portion 116_1 and a second shading portion (not shown in FIG. 3 ). The first shading portion 116_1 has a plurality of first openings O1 corresponding to the plurality of first light sensing elements 112_1, and the second shading portion has a plurality of second openings corresponding to the plurality of second light sensing elements 112_2 (not shown in FIG. 3). Illustrated). In this embodiment, the number of first openings O1 is the same as the number of first light sensing elements 112_1, and the number of second openings is the same as the number of second light sensing elements 112_2, but the invention is not limited to this. In other embodiments, for example, in the first light-shielding portion 116_1 of the light-shielding element 116, the number of the first openings O1 may be less than the number of the first light sensing elements 112_1, and the number of the second openings may be less than the number of the second light sensing elements. The number of 112_2. For example, one first opening O1 may correspond to a plurality of first light sensing elements 112_1, and similarly, a second opening may correspond to a plurality of second light sensing elements 112_2. In this embodiment, the first shading part and the second shading part may be two parts to be combined to form the shading element 116. However, the present invention is not limited to this. In other embodiments, the first light shielding portion and the second light shielding portion may also be integrally formed.

在本實施例中,第一開口O1沿第二方向D2的尺寸C3小於第一光感測元件112_1沿第二方向D2上的尺寸C4。同樣的,第二開口沿第一方向D1的尺寸小於第二光感測元件112_2沿第一方向D1的尺寸。如圖3所繪示,C3<C4。在本實施例中,在量測投影畫面時,遮光元件116可有利於避免鄰近之光感測元件間的互相干擾,從而精確判斷不同位置處之光感測元件所接受光束的光強度。舉例而言,第一光感測組G1沿第二方向D2的尺寸C4例如可為1毫米(mm),且第一光感測條L1包含四個第一光感測組G1,對應的,第一遮光部116_1具有對應於第一光感測條L1的四個第一開口O1,且第一開口O1沿第二方向D2的尺寸C3不大於1毫米(mm)。在此情形,第一光感測條L1的四個第一光感測組G1可不呈階梯狀的排列,惟對應於該四個第一光感測組G1的四個第一開口O1可呈階梯狀排列。舉例而言,第一光感測條L1的四個第一光感測組G1可沿第一方向D1方向呈直線排列,四個第一開口O1沿第一方向D1呈階梯狀排列,且相鄰兩第一開口O1沿第二方向D2的最小間距為0.25毫米(mm)。在如此之配置中,量測單元110在第二方向D2上可達成的量測精度0.25毫米(mm)。In this embodiment, the size C3 of the first opening O1 along the second direction D2 is smaller than the size C4 of the first light sensing element 112_1 along the second direction D2. Similarly, the size of the second opening along the first direction D1 is smaller than the size of the second light sensing element 112_2 along the first direction D1. As shown in Figure 3, C3<C4. In this embodiment, when measuring the projection image, the shading element 116 can help avoid mutual interference between adjacent light sensing elements, so as to accurately determine the light intensity of the light beam received by the light sensing elements at different positions. For example, the size C4 of the first light sensing group G1 along the second direction D2 may be, for example, 1 millimeter (mm), and the first light sensing strip L1 includes four first light sensing groups G1, correspondingly, The first light shielding portion 116_1 has four first openings O1 corresponding to the first light sensing strip L1, and the size C3 of the first opening O1 along the second direction D2 is not greater than 1 millimeter (mm). In this case, the four first light sensing groups G1 of the first light sensing strip L1 may not be arranged in a stepped manner, but the four first openings O1 corresponding to the four first light sensing groups G1 may be arranged Arranged in steps. For example, the four first light sensing groups G1 of the first light sensing strip L1 may be arranged in a straight line along the first direction D1, and the four first openings O1 may be arranged in a stepwise manner along the first direction D1, and are mutually aligned. The minimum distance between two adjacent first openings O1 along the second direction D2 is 0.25 millimeters (mm). In such a configuration, the achievable measurement accuracy of the measurement unit 110 in the second direction D2 is 0.25 millimeters (mm).

圖4為本發明另一實施例的量測單元的局部剖視圖。舉例而言,圖4可為圖2之量測單元110沿線E-E’的局部剖視圖。請參考圖2及圖4,圖4所繪示的量測單元110A至少可為圖2所示之量測單元110的一部分。在圖4中,以量測單元110A之基板114的第一部份114_1的一部份為例加以說明。在圖4所示的實施例中,第一遮光部116_1A具有圍繞第一開口O1的多個第一側壁S1,且第二遮光部具有圍繞第二開口的多個第二側壁(圖4未繪示)。在本實施例中,在第一遮光部116_1A中,第一側壁S1可由遮光元件116A朝基板114延伸形成。同樣的,在第二遮光部中,第二側壁可遮光元件116A朝基板114延伸形成。在本實施例中,在量測投影畫面時,設置於第一開口O1周圍的第一側邊S1及/或設置於第二開口周圍的第二側邊可進一步避免鄰近之光感測元件間的互相干擾,從而精確判斷不同位置處之光感測元件所接受光束的光強度。4 is a partial cross-sectional view of a measurement unit according to another embodiment of the invention. For example, FIG. 4 may be a partial cross-sectional view of the measuring unit 110 of FIG. 2 along the line E-E'. Please refer to FIGS. 2 and 4. The measurement unit 110A shown in FIG. 4 can be at least a part of the measurement unit 110 shown in FIG. 2. In FIG. 4, a part of the first part 114_1 of the substrate 114 of the measuring unit 110A is taken as an example for illustration. In the embodiment shown in FIG. 4, the first shading portion 116_1A has a plurality of first sidewalls S1 surrounding the first opening O1, and the second shading portion has a plurality of second sidewalls surrounding the second opening (not shown in FIG. 4). Show). In this embodiment, in the first shading portion 116_1A, the first side wall S1 may be formed by the shading element 116A extending toward the substrate 114. Similarly, in the second shading part, the second side wall can be formed by extending the shading element 116A toward the substrate 114. In this embodiment, when measuring the projection image, the first side edge S1 arranged around the first opening O1 and/or the second side edge arranged around the second opening can further prevent the adjacent light sensing elements from being spaced. Interference with each other, so as to accurately determine the light intensity of the light beam received by the light sensing element at different positions.

圖5為本發明一實施例的量測單元在傾斜時的示意圖。請參考圖5,圖5所繪示的量測單元110B類似於圖2所繪示的110。兩者不同之處在於,在本實施例中,第一光感測組G1包含兩個第一光感測元件112_1(112_1_d、112_1_e),且沿第二方向D2觀察,兩個第一光感測元件112_1_d、112_1_e並列設置。第二光感測組G2包含兩個第二光感測元件112_2,且沿第一方向D1觀察,兩個第二光感測元件112_2並列設置。舉例而言,在圖5所示實施例中,第一光感測組G1的兩個第一光感測元件112_1_d、112_1_e在第二方向D2上具有相同的座標,且第二光感測組G2的兩個第二光感測元件112_2在第一方向D1上具有相同的座標。當投影畫面在投影目標10歪斜時,例如在圖5中當投影畫面P1歪斜角度θ時,一個第一光感測組G1中的兩個第一光感測元件112_1將會接收到不同光強度的光束。因此兩個第一光感測元件112_1可分別產生不同的訊號(例如,電訊號)。同樣的,一個第二光感測組G2中的兩個第二光感測元件112_2亦可接收到不同光強度的光束,進而分別產生不同的訊號。詳細而言,如圖5所示,第一光感測元件112_1_f及第一光感測元件112_1_g皆與投影畫面P1的範圍重疊,但因第一光感測元件112_1_f與投影畫面P1重疊的範圍小於第一光感測元件112_1_g與投影畫面P1重疊的範圍,因此二者感測的光束強度不同,且進一步講,第一光感測元件112_1_f感測的光束強度小於第一光感測元件112_1_g感測的光束強度。據此,可根據第一光感測元件112_1_f、112_1_g所感測之光強度的比較,進而藉由處理單元120運算得出投影畫面P1的歪斜角度θ。如此一來,可藉由本實施例的量測單元110B進行量測,並分析同一光感測組中不同光感測元件所感測之光強度的不同,以判斷出投影畫面P1的歪斜程度,進而使得使用者可依據上述歪斜程度,將投影裝置100在投影目標10上的投影畫面的歪斜角度調整為零。FIG. 5 is a schematic diagram of a measurement unit when tilted according to an embodiment of the present invention. Please refer to FIG. 5. The measurement unit 110B shown in FIG. 5 is similar to the measurement unit 110 shown in FIG. 2. The difference between the two is that in this embodiment, the first light sensing group G1 includes two first light sensing elements 112_1 (112_1_d, 112_1_e), and when viewed along the second direction D2, the two first light sensing elements The measuring elements 112_1_d and 112_1_e are arranged in parallel. The second light sensing group G2 includes two second light sensing elements 112_2, and when viewed along the first direction D1, the two second light sensing elements 112_2 are arranged side by side. For example, in the embodiment shown in FIG. 5, the two first light sensing elements 112_1_d, 112_1_e of the first light sensing group G1 have the same coordinates in the second direction D2, and the second light sensing group G1 The two second light sensing elements 112_2 of G2 have the same coordinates in the first direction D1. When the projection image is skewed on the projection target 10, for example, when the projection image P1 is skewed by an angle θ in FIG. 5, the two first light sensing elements 112_1 in a first light sensing group G1 will receive different light intensities. Beam. Therefore, the two first light sensing elements 112_1 can respectively generate different signals (for example, electrical signals). Similarly, the two second light sensing elements 112_2 in a second light sensing group G2 can also receive light beams with different light intensities, and then generate different signals respectively. In detail, as shown in FIG. 5, both the first light sensing element 112_1_f and the first light sensing element 112_1_g overlap with the range of the projection screen P1, but because the first light sensing element 112_1_f overlaps with the projection screen P1 in the range It is smaller than the overlapping range of the first light sensing element 112_1_g and the projection screen P1, so the light beam intensity sensed by the two is different, and further, the light beam intensity sensed by the first light sensing element 112_1_f is smaller than that of the first light sensing element 112_1_g The intensity of the sensed beam. Accordingly, the skew angle θ of the projection screen P1 can be calculated by the processing unit 120 based on the comparison of the light intensity sensed by the first light sensing elements 112_1_f and 112_1_g. In this way, the measurement unit 110B of this embodiment can be used to measure and analyze the difference in light intensity sensed by different light sensing elements in the same light sensing group to determine the degree of skew of the projection screen P1, and then Therefore, the user can adjust the skew angle of the projection image of the projection device 100 on the projection target 10 to zero according to the aforementioned skew degree.

綜上所述,本發明的實施例至少具有以下其中一個優點或功效。利用本發明的光學量測裝置,當投影畫面產生位移後,根據量測單元上不同位置的光感測元件所接收到的光束的強度,處理單元接收相關訊號,且由該些訊號演算得出投影畫面的位移方向及位移量。如此一來,可有效量測投影畫面的偏移程度,有效節省人力及時間,且可大幅提升量測的精準度。In summary, the embodiments of the present invention have at least one of the following advantages or effects. With the optical measurement device of the present invention, when the projection image is displaced, the processing unit receives the relevant signals according to the intensity of the light beams received by the light sensing elements at different positions on the measurement unit, and calculates the results from these signals The displacement direction and amount of the projection screen. In this way, the degree of deviation of the projection image can be effectively measured, manpower and time can be effectively saved, and the accuracy of the measurement can be greatly improved.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,即大凡依本發明申請專利範圍及發明說明內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。另外本發明的任一實施例或申請專利範圍不須達成本發明所揭露之全部目的或優點或特點。此外,摘要部分和標題僅是用來輔助專利文件搜尋之用,並非用來限制本發明之權利範圍。此外,本說明書或申請專利範圍中提及的“第一”、“第二”等用語僅用以命名元件(element)的名稱或區別不同實施例或範圍,而並非用來限制元件數量上的上限或下限。However, the above are only preferred embodiments of the present invention, and should not be used to limit the scope of implementation of the present invention, that is, simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the description of the invention, All are still within the scope of the invention patent. In addition, any embodiment of the present invention or the scope of the patent application does not have to achieve all the objectives or advantages or features disclosed in the present invention. In addition, the abstract part and title are only used to assist in searching for patent documents, and are not used to limit the scope of rights of the present invention. In addition, the terms "first" and "second" mentioned in this specification or the scope of the patent application are only used to name the element (element) or to distinguish different embodiments or ranges, and are not used to limit the number of elements. Upper or lower limit.

10:投影目標 50:投影裝置 60:顯示裝置 100:光學量測裝置 110、110A、110B:量測單元 112_1、112_1_a~112_1_g:第一光感測元件 112_2、112_2_a~112_2_g:第二光感測元件 114:基板 114_1:第一部份 114_2:第二部份 116、116A:遮光元件 116_1、116_1A:第一遮光部 120:處理單元 A-A’、E-E’:線 B1、B2:間距 C1、C2、C3、C4:尺寸 D1:第一方向 D2:第二方向 G1:第一光感測組 G2:第二光感測組 L1:第一光感測條 L2:第二光感測條 O1:開口 P1、P2:投影畫面 S1:側壁 θ:角度10: Projection target 50: Projection device 60: display device 100: Optical measuring device 110, 110A, 110B: measuring unit 112_1, 112_1_a~112_1_g: the first light sensing element 112_2, 112_2_a~112_2_g: second light sensing element 114: substrate 114_1: The first part 114_2: The second part 116, 116A: shading element 116_1, 116_1A: first shading part 120: processing unit A-A’, E-E’: Line B1, B2: spacing C1, C2, C3, C4: size D1: First direction D2: second direction G1: The first light sensing group G2: The second light sensing group L1: The first light sensing strip L2: Second light sensing strip O1: opening P1, P2: Projection screen S1: sidewall θ: Angle

圖1為本發明一實施例的光學量測裝置的使用狀態示意圖。 圖2為本發明一實施例的量測單元的示意圖。 圖3為本發明一實施例的量測單元的局部剖視圖。 圖4為本發明另一實施例的量測單元的局部剖視圖。 圖5為本發明一實施例的量測單元在傾斜時的示意圖。FIG. 1 is a schematic diagram of an optical measurement device in use according to an embodiment of the present invention. FIG. 2 is a schematic diagram of a measurement unit according to an embodiment of the invention. FIG. 3 is a partial cross-sectional view of a measurement unit according to an embodiment of the invention. 4 is a partial cross-sectional view of a measurement unit according to another embodiment of the invention. FIG. 5 is a schematic diagram of a measurement unit when tilted according to an embodiment of the present invention.

10:投影目標10: Projection target

50:投影裝置50: Projection device

60:顯示裝置60: display device

100:光學量測裝置100: Optical measuring device

110:量測單元110: Measuring unit

120:處理單元120: processing unit

P1:投影畫面P1: Projection screen

Claims (17)

一種光學量測裝置,用以量測由一投影裝置投射至一投影目標的一投影畫面,該光學量測裝置包括: 量測單元,配置於該投影目標上,該量測單元包括第一光感測條及第二光感測條;以及 處理單元,電性連接於該量測單元,其中該第一光感測條包括沿一第一方向斜向排列的多個第一光感測組,該第二光感測條包括沿一第二方向斜向排列的多個第二光感測組,各該第一光感測組包括至少一第一光感測元件,各該第二光感測組包括至少一第二光感測元件,且該第一方向垂直於該第二方向。An optical measurement device for measuring a projection image projected by a projection device to a projection target, the optical measurement device comprising: A measurement unit configured on the projection target, the measurement unit including a first light sensing bar and a second light sensing bar; and The processing unit is electrically connected to the measuring unit, wherein the first light sensing strip includes a plurality of first light sensing groups arranged obliquely along a first direction, and the second light sensing strip includes A plurality of second light-sensing groups arranged obliquely in two directions, each of the first light-sensing groups includes at least one first light-sensing element, and each of the second light-sensing groups includes at least one second light-sensing element , And the first direction is perpendicular to the second direction. 如申請專利範圍第1項所述的光學量測裝置,其中各該第一光感測組包含多個該第一光感測元件,且該多個第一光感測元件在該第二方向上並列設置,各該第二光感測組包含多個該第二光感測元件,且該多個第二光感測元件在該第一方向上並列設置。The optical measurement device according to claim 1, wherein each of the first light-sensing groups includes a plurality of the first light-sensing elements, and the plurality of first light-sensing elements are in the second direction Each of the second light-sensing groups includes a plurality of the second light-sensing elements, and the plurality of second light-sensing elements are arranged in parallel in the first direction. 如申請專利範圍第1項所述的光學量測裝置,其中該量測單元包括多個該第一光感測條,且該些第一光感測條沿該第二方向直線排列,且其中該量測單元包括多個該第二光感測條,且該些第二光感測條沿該第一方向直線排列。The optical measurement device according to claim 1, wherein the measurement unit includes a plurality of the first light sensing strips, and the first light sensing strips are arranged linearly along the second direction, and wherein The measuring unit includes a plurality of the second light sensing strips, and the second light sensing strips are linearly arranged along the first direction. 如申請專利範圍第1項所述的光學量測裝置,其中在該第一光感測條中,兩相鄰該些第一光感測組沿該第二方向的間距小於該些第一光感測組其中任一者沿該第二方向的尺寸,且其中在該第二光感測條中,兩相鄰該些第二光感測組沿該第一方向的間距小於該些第二光感測組其中任一者沿該第一方向的尺寸。According to the optical measurement device described in claim 1, wherein in the first light-sensing strip, the distance between two adjacent first light-sensing groups along the second direction is smaller than that of the first light-sensing groups. The size of any one of the sensing groups along the second direction, and in the second light sensing strip, the distance between two adjacent second light sensing groups along the first direction is smaller than the second The size of any one of the light sensing groups along the first direction. 如申請專利範圍第1項所述的光學量測裝置,其中該光學量測裝置包含兩個該量測單元,且兩個該量測單元分別配置於該投影目標中對應該投影畫面的兩個對角位置處。The optical measurement device described in item 1 of the scope of patent application, wherein the optical measurement device includes two measurement units, and the two measurement units are respectively arranged in the projection target corresponding to the two projection images Diagonally. 如申請專利範圍第1項所述的光學量測裝置,其中該光學量測裝置包含四個該量測單元,且四個該量測單元分別配置於該投影目標中對應該投影畫面的四個角落位置處。The optical measurement device described in item 1 of the scope of patent application, wherein the optical measurement device includes four measurement units, and the four measurement units are respectively arranged in the projection target corresponding to the four projection images At the corner. 如申請專利範圍第1項所述的光學量測裝置,其中該量測單元更包括一基板,該基板包含一第一部份以及一第二部份,且其中該第一光感測條及該第二光感測條分別配置於該第一部份及該第二部份上。According to the optical measurement device described in claim 1, wherein the measurement unit further includes a substrate, the substrate includes a first part and a second part, and wherein the first light sensing strip and The second light sensing strips are respectively arranged on the first part and the second part. 如申請專利範圍第7項所述的光學量測裝置,其中該基板的該第一部份及該第二部份形成為一體。According to the optical measurement device described in item 7 of the scope of patent application, the first part and the second part of the substrate are formed as one body. 如申請專利範圍第7項所述的光學量測裝置,其中該基板的該第一部份的延伸方向平行於該第一方向,該基板的該第二部份的延伸方向平行於該第二方向,且該第一部份及該第二部份在該投影目標上呈現L狀。For the optical measurement device described in claim 7, wherein the extending direction of the first part of the substrate is parallel to the first direction, and the extending direction of the second part of the substrate is parallel to the second Direction, and the first part and the second part present an L-shape on the projection target. 如申請專利範圍第1項所述的光學量測裝置,其中該量測單元更包括一遮光元件,且該遮光元件包含一第一遮光部以及一第二遮光部,且其中該第一遮光部具有對應該些第一光感測元件的多個第一開口,且該第二遮光部具有對應於該些第二光感測元件的多個第二開口。The optical measurement device according to claim 1, wherein the measurement unit further includes a shading element, and the shading element includes a first shading part and a second shading part, and wherein the first shading part There are a plurality of first openings corresponding to the first light sensing elements, and the second light shielding portion has a plurality of second openings corresponding to the second light sensing elements. 如申請專利範圍第10項所述的光學量測裝置,其中該些第一開口的數量相同於該些第一光感測元件的數量,且該些第二開口的數量相同於該些第二光感測元件的數量。The optical measurement device according to claim 10, wherein the number of the first openings is the same as the number of the first light sensing elements, and the number of the second openings is the same as the number of the second The number of light sensing elements. 如申請專利範圍第10項所述的光學量測裝置,其中該些第一開口沿該第二方向的尺寸小於該些第一光感測元件沿該第二方向的尺寸,且該些第二開口沿該第一方向的尺寸小於該些第二光感測元件沿該第一方向的尺寸。The optical measurement device according to claim 10, wherein the size of the first openings along the second direction is smaller than the size of the first light sensing elements along the second direction, and the second The size of the opening along the first direction is smaller than the size of the second light sensing elements along the first direction. 如申請專利範圍第10項所述的光學量測裝置,其中該第一遮光部具有圍繞該些第一開口的多個第一側壁,且該第二遮光部具有圍繞該些第二開口的多個第二側壁,其中該些第一側壁及該些第二側壁由該遮光元件朝該基板延伸。The optical measurement device according to claim 10, wherein the first shading part has a plurality of first side walls surrounding the first openings, and the second shading part has a plurality of first side walls surrounding the second openings. A second side wall, wherein the first side walls and the second side walls extend from the shading element toward the substrate. 如申請專利範圍第10項所述的光學量測裝置,其中該第一遮光部以及該第二遮光部形成為一體。According to the optical measurement device described in claim 10, the first shading part and the second shading part are formed as one body. 如申請專利範圍第1項所述的光學量測裝置,其中該至少一第一光感測元件及/或該至少一第二光感測元件接收不同光強度的光束,且該至少一第一光感測元件及/或該至少一第二光感測元件產生不同的訊號,且其中該處理單元用以接收該等訊號,且根據該等訊號運算得出該投影畫面在該投影目標上的位移方向及位移量。The optical measurement device according to claim 1, wherein the at least one first light-sensing element and/or the at least one second light-sensing element receives light beams of different light intensities, and the at least one first light-sensing element The light sensing element and/or the at least one second light sensing element generate different signals, and the processing unit is used for receiving the signals, and calculating the projection image on the projection target based on the signals Displacement direction and displacement amount. 如申請專利範圍第1項所述的光學量測裝置,其中該處理單元電性連接於一顯示裝置。According to the optical measurement device described in claim 1, wherein the processing unit is electrically connected to a display device. 如申請專利範圍第1項所述的光學量測裝置,其中該處理單元電性連接於該投影裝置。According to the optical measurement device described in item 1 of the scope of patent application, the processing unit is electrically connected to the projection device.
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