TW202104840A - Inspection system - Google Patents
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- TW202104840A TW202104840A TW109118685A TW109118685A TW202104840A TW 202104840 A TW202104840 A TW 202104840A TW 109118685 A TW109118685 A TW 109118685A TW 109118685 A TW109118685 A TW 109118685A TW 202104840 A TW202104840 A TW 202104840A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G1/00—Storing articles, individually or in orderly arrangement, in warehouses or magazines
- B65G1/02—Storage devices
- B65G1/04—Storage devices mechanical
- B65G1/0457—Storage devices mechanical with suspended load carriers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66C—CRANES; LOAD-ENGAGING ELEMENTS OR DEVICES FOR CRANES, CAPSTANS, WINCHES, OR TACKLES
- B66C13/00—Other constructional features or details
- B66C13/04—Auxiliary devices for controlling movements of suspended loads, or preventing cable slack
- B66C13/08—Auxiliary devices for controlling movements of suspended loads, or preventing cable slack for depositing loads in desired attitudes or positions
- B66C13/085—Auxiliary devices for controlling movements of suspended loads, or preventing cable slack for depositing loads in desired attitudes or positions electrical
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C1/00—Measuring angles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67724—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations by means of a cart or a vehicule
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/6773—Conveying cassettes, containers or carriers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67733—Overhead conveying
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
- B65G2201/02—Articles
- B65G2201/0297—Wafer cassette
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- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Warehouses Or Storage Devices (AREA)
Abstract
Description
本發明是有關於一種具備了對物品搬送車所具備之可升降自如之升降部的傾斜狀態進行檢測之檢測部的檢查系統。The present invention relates to an inspection system provided with a detection unit that detects the inclination state of an elevating and lowering section of an article transport vehicle.
作為這種檢查系統,例如,已知有日本專利特開2017-095261號公報所記載之物。以下,在先前技術的說明中,括號中的符號是先前技術文獻中的符號。日本專利特開2017-095261號公報所記載之檢查系統是構成為:在檢查用治具(Wb)具備角度感測器(8),並使該檢查用治具(Wb)支撐於升降部(升降體22),從而藉由角度感測器(8)來檢測升降部(22)的傾斜方向及傾斜角度。As such an inspection system, for example, what is described in JP 2017-095261 A is known. Hereinafter, in the description of the prior art, the symbols in parentheses are the symbols in the prior art documents. The inspection system described in Japanese Patent Laid-Open No. 2017-095261 is composed of: an inspection jig (Wb) is provided with an angle sensor (8), and the inspection jig (Wb) is supported by a lifting part ( The lifting body 22) is used to detect the inclination direction and the inclination angle of the lifting part (22) by the angle sensor (8).
然而,日本專利特開2017-095261號公報之檢查系統中,由於是使檢查用治具(Wb)支撐於升降部(22)的構成,因此在檢查複數個物品搬送車(1)之升降部(22)的傾斜時,必須使檢查用治具(Wb)在複數個物品搬送車(1)之間移動。亦即,在檢測各物品搬送車(1)中之升降部(22)的傾斜狀態時,必須在使檢查用治具(Wb)支撐於升降部(22)後再檢測升降部(22)的傾斜方向及傾斜角度,然後將檢查用治具(Wb)從升降部(22)卸下。因此,有著難以有效率地進行升降部(22)的傾斜狀態之檢查的情況。However, in the inspection system of Japanese Patent Laid-Open No. 2017-095261, since the inspection jig (Wb) is supported on the lifting part (22), it is necessary to inspect the lifting part of a plurality of article transport vehicles (1). When the (22) is tilted, the inspection jig (Wb) must be moved between a plurality of article transport vehicles (1). That is, when detecting the inclination state of the lifting part (22) in each article transport vehicle (1), the inspection jig (Wb) must be supported on the lifting part (22) before detecting the lifting part (22). Tilt the direction and angle, and then remove the inspection jig (Wb) from the lifting part (22). Therefore, it may be difficult to efficiently check the tilted state of the lifter (22).
於是,期待實現一種可以有效率地進行升降部的傾斜狀態之檢查的檢查系統。Therefore, it is desired to realize an inspection system capable of efficiently inspecting the tilted state of the lifter.
有鑑於上述內容,檢查系統的特徴構成在於下述的點:具備:檢測部,檢測物品搬送車所具備之可升降自如之升降部的傾斜狀態, 前述升降部具有基準面,前述檢測部具備第1攝像裝置及第2攝像裝置,以前述升降部位於規定之設定升降位置的狀態下的前述基準面的位置作為設定基準面位置,前述第1攝像裝置及前述第2攝像裝置是設置成:前述第1攝像裝置的光軸即第1光軸與前述第2攝像裝置的光軸即第2光軸交叉的交點成為對應前述設定基準面位置的位置,並且,前述第1光軸及前述第2光軸成為沿著前述基準面的方向,前述檢測部是依據藉由前述第1攝像裝置及前述第2攝像裝置所拍攝之前述基準面的圖像,來檢測前述升降部的傾斜方向及傾斜角度。In view of the above, the characteristic structure of the inspection system lies in the following points: It is equipped with: a detection unit that detects the inclination state of the lifting unit that can be lifted and lowered by the article transport vehicle, The lift unit has a reference surface, the detection unit includes a first imaging device and a second imaging device, and the position of the reference surface in a state where the lift unit is at a predetermined set lift position is used as a set reference surface position, and the first imaging device The device and the second imaging device are arranged such that the intersection of the optical axis of the first imaging device, that is, the first optical axis, and the optical axis of the second imaging device, that is, the second optical axis, becomes a position corresponding to the position of the set reference plane And, the first optical axis and the second optical axis are in a direction along the reference plane, and the detection unit is based on an image of the reference plane captured by the first imaging device and the second imaging device , To detect the inclination direction and the inclination angle of the aforementioned lifting part.
根據該特徴構成,由於是依據藉由第1攝像裝置及第2攝像裝置從交叉的2個方向拍攝之升降部的基準面的圖像,來檢測升降部的傾斜狀態,因此可以適當地檢測升降部的傾斜方向及傾斜角度。又,根據該特徴構成,由於是使物品搬送車之升降部移動至規定之設定升降位置,且在該狀態下,藉由第1攝像裝置及第2攝像裝置拍攝升降部,從而可以檢測升降部的傾斜狀態,因此不須使檢測用治具等支撐於升降部。因此,即便在檢查複數個物品搬送車之升降部的傾斜狀態的情況下,也不須使檢查用治具等在複數個物品搬送車之間移動,可以有效率地進行升降部的傾斜狀態之檢查。According to this characteristic structure, since the image of the reference plane of the lifting part taken from two crossing directions by the first imaging device and the second imaging device is used to detect the inclination state of the lifting part, it is possible to appropriately detect the lifting The tilt direction and tilt angle of the part. In addition, according to this characteristic configuration, since the lifting part of the article transport vehicle is moved to a predetermined set lifting position, and in this state, the lifting part can be detected by the first and second imaging devices photographing the lifting part The tilted state, so there is no need to support the detection jigs on the lifting part. Therefore, even in the case of inspecting the tilting state of the lifting part of a plurality of article transport vehicles, it is not necessary to move inspection jigs and the like between the plurality of article transporting vehicles, and the tilting state of the lifting part can be efficiently performed. inspection.
用以實施發明之形態The form used to implement the invention
1.實施形態
針對具備了檢查系統的物品搬送設備的實施形態,依據圖式來進行說明。如圖1所示地,在物品搬送設備設置有:物品搬送車1,在天花板附近沿著行走路徑L行走,來搬送作為物品之容器W(參照圖2);處理裝置2,對容置於容器W之基板進行處理;支撐台3,作為搬送對象位置處,且以鄰接於該處理裝置2的狀態設置於地面上;及檢查系統4。另外,本實施形態中,將容置半導體基板的FOUP(前開式晶圓傳送盒,Front Opening Unified Pod)作為容器W(物品)。1. Implementation form
The embodiment of the article conveying equipment equipped with the inspection system will be explained based on the drawings. As shown in Figure 1, the article transport equipment is provided with:
以下,如圖2及圖3所示地,將沿著行走路徑L設置的軌道5延伸的延伸方向X之其中一側稱作延伸方向第1側X1,並將其相反側稱作延伸方向第2側X2。又,如圖3所示地,將沿著上下方向Z之上下方向視角下相對於延伸方向X正交的方向稱作寬度方向Y,且將寬度方向Y之其中一側稱作寬度方向第1側Y1,並將其相反側稱作寬度方向第2側Y2。另外,本例中,物品搬送車1是從延伸方向第2側X2朝向延伸方向第1側X1行走在單一方向上。Hereinafter, as shown in FIGS. 2 and 3, one side of the extending direction X in which the
如圖2及圖3所示地,物品搬送車1具備:行走部6,在軌道5上沿著該軌道5行走;升降部7,以懸吊的狀態支撐容器W;及升降裝置8,使升降部7在上下方向Z上移動。像這樣,物品搬送車1具備可升降自如之升降部7。As shown in Figures 2 and 3, the
行走部6具備:第1行走單元6A;及第2行走單元6B,相對於該第1行走單元6A位於延伸方向第2側X2。如圖3所示地,第1行走單元6A具備:一對車輪11,在軌道5上轉動;及行走用馬達12,使一對車輪11旋轉。又,第2行走單元6B與第1行走單元6A同樣地具備一對車輪11及行走用馬達12。The
如圖2所示地,升降裝置8具備:捲繞體14;捲取帶15,捲繞於捲繞體14並在前端部連結有升降部7;及升降用馬達16,使捲繞體14旋轉驅動。升降裝置8是構成為:藉由升降用馬達16的驅動,使捲繞體14朝正向旋轉來送出捲取帶15,從而使升降部7下降,並使捲繞體14朝反向旋轉來捲取捲取帶15,從而使升降部7上升。As shown in FIG. 2, the
升降部7具備:一對把持爪18,沿著水平方向在互相接近或遠離的方向上移動自如;把持用馬達19,使一對把持爪18各自在互相接近或遠離的方向上移動;及殼體20,容置把持用馬達19。升降部7是構成為:藉由把持用馬達19的驅動,使一對把持爪18在互相接近或遠離的方向上移動,從而將狀態轉移到:藉由一對把持爪18把持容器W的狀態、與將一對把持爪18所進行之對容器W的把持解除的狀態。並且,如圖3所示地,升降部7具有基準面F。本實施形態中,殼體20是形成為長方體形狀,並以該殼體20之朝向上方側的面(上表面)作為基準面F。The
其次,針對檢查系統4來進行說明。當藉由檢查系統4來檢測物品搬送車1之升降部7的傾斜狀態時,如圖3所示地,檢查系統4是在物品搬送車1之行走部6停止於規定之設定行走位置,且升降部7之升降方向的位置位於規定之設定升降位置的狀態下,檢測升降部7的傾斜狀態。像這樣,以物品搬送車1位於規定之設定行走位置,並且,升降部7位於規定之設定升降位置的狀態下的基準面F的位置作為設定基準面位置V。在升降部7並未朝延伸方向X及寬度方向Y之任一方向傾斜的正常狀態下,位於設定基準面位置V的基準面F是成為水平姿勢。Next, the
如圖3及圖4所示地,檢查系統4具備:檢測部22,檢測物品搬送車1所具備之升降部7的傾斜狀態。本實施形態中,檢測部22具備:第1攝像裝置23、第2攝像裝置24、第1投光裝置25、第2投光裝置26、及控制部27(參照圖4)。As shown in FIGS. 3 and 4, the
第1攝像裝置23及第2攝像裝置24是設置成:第1攝像裝置23的光軸即第1光軸L1與第2攝像裝置24的光軸即第2光軸L2交叉的交點P成為對應設定基準面位置V的位置,並且,第1光軸L1及第2光軸L2成為沿著基準面F的方向。此處,對應設定基準面位置V的位置是設定成:即便在偏離理想之設定基準面位置V(本實施形態中,是基準面F位於事先設定之高度且成為水平姿勢的狀態下的基準面F的位置)的情況下,仍落在攝像裝置之攝像範圍內。詳細來說,是考慮到假定之升降部7的傾斜狀態,而相對於位於理想之設定基準面位置V的基準面F,設定在規定之距離範圍內(例如,±15cm以下的範圍內)的位置。本實施形態中,是設定成交點P與理想之設定基準面位置V的基準面F一致。另外,此處的基準面F的位置是基準面F中之成為基準的位置(點),例如可以設為基準面F的重心位置。亦即,本實施形態中,是設定成第1光軸L1與第2光軸L2的交點P與基準面F的基準位置(例如重心位置)一致。又,沿著基準面F的方向是相對於沿著理想之設定基準面位置V的基準面F的方向,設定在規定之角度範圍內(例如,±10°以下)的角度。本實施形態中,是設定在水平方向,以和理想之設定基準面位置V的基準面F成為相同的角度。The
本實施形態中,第1攝像裝置23是設置成:相對於設定基準面位置V配置於寬度方向第2側Y2,並面向寬度方向第1側Y1拍攝。又,第2攝像裝置24是設置成:相對於設定基準面位置V配置於延伸方向第2側X2,並面向延伸方向第1側X1拍攝。並且,第1攝像裝置23的第1光軸L1是配置成沿著寬度方向Y。又,第2攝像裝置24的第2光軸L2是配置成沿著延伸方向X。此外,本實施形態中,第1攝像裝置23及第2攝像裝置24是設置成第1光軸L1與第2光軸L2正交。In the present embodiment, the
又,本實施形態中,第1投光裝置25是設置成從與第1攝像裝置23相對向之側朝向交點P投光。本實施形態中,第1投光裝置25是設置成:相對於設定基準面位置V配置於寬度方向第1側Y1,並朝向寬度方向第2側Y2投光。並且,如圖6及圖8所示地,第1投光裝置25是以如下方式來投光:在基準面F位於設定基準面位置V的狀態下,基準面F位於第1投光裝置25的投光範圍即第1投光範圍A1之上下方向Z的寬度內。若再加以說明,如圖6所示地,在基準面F位於設定基準面位置V,並且,基準面F隨著朝向寬度方向第1側Y1(圖6中之紙面後側)而朝向下方傾斜的狀態下,基準面F中之寬度方向第2側Y2(圖6中之紙面前側)之邊緣E會作為光與影子的交界而被第1攝像裝置23拍攝,前述光是從第1投光裝置25投光之光,前述影子是藉由升降部7遮蔽該光而形成之影子。又,如圖8所示地,在基準面F位於設定基準面位置V,並且,基準面F隨著朝向寬度方向第2側Y2(圖8中之紙面前側)而朝向下方傾斜的狀態下,基準面F中之寬度方向第1側Y1(圖8中之紙面後側)之邊緣E會作為光與影子的交界而被第1攝像裝置23拍攝,前述光是從第1投光裝置25投光之光,前述影子是藉由升降部7遮蔽該光而形成之影子。In addition, in the present embodiment, the first
第2投光裝置26是設置成從與第2攝像裝置24相對向之側朝向交點P投光。本實施形態中,第2投光裝置26是設置成:相對於設定基準面位置V配置於延伸方向第1側X1,並朝向延伸方向第2側X2投光。並且,第2投光裝置26是以如下方式來投光:在基準面F位於設定基準面位置V的狀態下,基準面F位於第2投光裝置26的投光範圍即第2投光範圍A2之上下方向Z的寬度內。若再加以說明,如圖7所示地,在基準面F位於設定基準面位置V,並且,基準面F隨著朝向延伸方向第1側X1(圖7中之紙面後側)而朝向下方傾斜的狀態下,基準面F中之延伸方向第2側X2(圖7中之紙面前側)之邊緣E會作為光與影子的交界而被第2攝像裝置24拍攝,前述光是從第2投光裝置26投光之光,前述影子是藉由升降部7遮蔽該光而形成之影子。又,如圖9所示地,在基準面F位於設定基準面位置V,並且,基準面F隨著朝向延伸方向第2側X2(圖9中之紙面前側)而朝向下方傾斜的狀態下,基準面F中之延伸方向第1側X1(圖9中之紙面後側)之邊緣E會作為光與影子的交界而被第2攝像裝置24拍攝,前述光是從第2投光裝置26投光之光,前述影子是藉由升降部7遮蔽該光而形成之影子。The second
控制部27是執行第1攝像控制、第2攝像控制、及檢測控制。第1攝像控制中,控制部27控制第1攝像裝置23,以藉由第1攝像裝置23拍攝基準面F。又,本實施形態中,控制部27在第1攝像控制中,還控制第1投光裝置25,以藉由第1投光裝置25朝向基準面F照射光。第2攝像控制中,控制部27控制第2攝像裝置24,以藉由第2攝像裝置24拍攝基準面F。又,本實施形態中,控制部27在第2攝像控制中,還控制第2投光裝置26,以藉由第2投光裝置26朝向基準面F照射光。另外,本實施形態中,控制部27是同時進行第1攝像控制與第2攝像控制。藉此,可以謀求縮短檢查系統4所進行之檢查的所需時間。檢測控制中,控制部27是依據藉由第1攝像裝置23及第2攝像裝置24所拍攝之基準面F的圖像,來檢測升降部7的傾斜方向及傾斜角度。The
本實施形態中,在檢測控制中,控制部27是依據藉由第1攝像裝置23所拍攝之第1圖像所包含的基準面F之邊緣E的傾斜,來檢測延伸方向X(相當於與第1光軸L1正交的第1方向)上之升降部7的傾斜角度θ1及傾斜方向。若再加以說明,檢測控制中,控制部27是依據第1圖像所包含的邊緣E的傾斜,來檢測延伸方向X上之相對於水平的傾斜角度θ1及傾斜方向。此處,所謂傾斜方向是指傾向延伸方向X之哪一側而傾斜,具體而言,是指延伸方向第1側X1在上下方向Z上是比延伸方向第2側X2更上方或更下方。另外,亦可構成為將傾斜角度θ1設為具有正負方向的角度資訊,從而在傾斜角度θ1的資訊中包含傾斜方向的資訊。In the present embodiment, in the detection control, the
又,在檢測控制中,控制部27是依據藉由第2攝像裝置24所拍攝之第2圖像所包含的基準面F之邊緣E的傾斜,來檢測寬度方向Y(相當於與第2光軸L2正交的第2方向)上之升降部7的傾斜角度θ2及傾斜方向。若再加以說明,檢測控制中,控制部27是依據第2圖像所包含的邊緣E的傾斜,來檢測寬度方向Y上之相對於水平的傾斜角度θ2及傾斜方向。此處,所謂傾斜方向是指傾向寬度方向Y之哪一側而傾斜,具體而言,是指寬度方向第1側Y1在上下方向Z上是比寬度方向第2側Y2更上方或更下方。另外,亦可構成為將傾斜角度θ2設為具有正負方向的角度資訊,從而在傾斜角度θ2的資訊中包含傾斜方向的資訊。In addition, in the detection control, the
並且,在檢測控制中,控制部27是依據延伸方向X上之相對於水平的傾斜角度θ1及傾斜方向、及寬度方向Y上之相對於水平的傾斜角度θ2及傾斜方向,來檢測升降部7的三維傾斜方向及傾斜角度。此處,控制部27是依據延伸方向X上之傾斜角度θ1及傾斜方向、寬度方向Y上之傾斜角度θ2及傾斜方向、及延伸方向X(第1方向)與寬度方向Y(第2方向)的關係(相對角度,此處為90°),藉由運算來求出升降部7的三維傾斜方向及傾斜角度。In addition, in the detection control, the
接著,依據圖5所示之檢查控制的流程圖,針對控制部27的控制來進行說明。另外,物品搬送車1或控制物品搬送車1的控制裝置是構成為:在物品搬送車1之行走部6停止於規定之設定行走位置,且物品搬送車1之升降部7停止於規定之設定升降位置的狀態下,朝向檢查系統4發送準備完成訊號。Next, the control of the
控制部27在接收到準備完成訊號時(S1:Yes),執行第1攝像控制來取得第1圖像,並且執行第2攝像控制來取得第2圖像(S2)。另外,控制部27在接收到準備完成訊號之前(S1:No),是維持待機。並且,在第1攝像控制及第2攝像控制的執行後,執行檢測控制(S3)。如上述地,檢測控制中,是依據第1圖像來檢測延伸方向X上之基準面F的傾斜角度θ1及傾斜方向,並依據第2圖像來檢測寬度方向Y上之基準面F的傾斜角度θ2及傾斜方向,然後依據該等來檢測升降部7的傾斜方向及傾斜角度(S3)。另外,控制部27在第1攝像控制及第2攝像控制結束後,會朝向物品搬送車1或控制物品搬送車1的控制裝置發送顯示檢查完成的檢查完成訊號。藉此,即可再度開始升降部7的升降及物品搬送車1的行走。When the
2.其他實施形態
接著,針對此檢查系統4的其他實施形態來進行說明。2. Other implementation forms
Next, another embodiment of this
(1)上述之實施形態中,是以基準面F為殼體20之上表面的構成為例子來進行了說明。但是,並非限定於這樣的構成。基準面F可以設為升降部7中的殼體20之上表面以外的面,例如,以殼體20之下表面或側面作為基準面F亦可,又,以把持爪18之下表面作為基準面F亦可。惟,不論哪種情況,作為基準面F的面宜為平面或是平面狀的面較佳。(1) In the above-mentioned embodiment, the configuration in which the reference plane F is the upper surface of the
(2)上述之實施形態中,是以檢測部22依據基準面F之邊緣E的傾斜來檢測傾斜角度的構成為例子來進行了說明。但是,並非限定於這樣的構成。例如,亦可作成為以下的構成:在基準面F設置角度檢測用的記號或圖形,且檢測部22依據藉由第1攝像裝置23及第2攝像裝置24所拍攝之基準面F上的記號或圖形的位置及角度來檢測傾斜角度及傾斜方向。(2) In the above-mentioned embodiment, the configuration in which the
(3)上述之實施形態中,是以檢查系統4具備第1投光裝置25與第2投光裝置26的構成為例子來進行了說明。但是,並非限定於這樣的構成。檢查系統4所具備之投光裝置的數量亦可適當變更。例如,亦可設置第3投光裝置28,以從與基準面F相對向之側投光。例如,如圖10所示地,以殼體20之下表面作為基準面F,並設置第3投光裝置28,以從與該基準面F相對向的下方側投光亦可。或者是,以殼體20的1個側面作為基準面F,並設置第3投光裝置28,以從與該基準面F相對向之側邊側投光亦可。又,亦可作成為檢查系統4不具備該等投光裝置的構成。(3) In the above-mentioned embodiment, the configuration in which the
(4)上述之實施形態中,是以將第1攝像裝置23及第2攝像裝置24設置成第1光軸L1與第2光軸L2正交的構成為例子來進行了說明。但是,並非限定於這樣的構成。例如,亦可將第1攝像裝置23及第2攝像裝置24設置成第1光軸L1與第2光軸L2以45°或120°等90°以外的角度來交叉。(4) In the above-mentioned embodiment, the
(5)上述之實施形態中,是以第1光軸L1與第2光軸L2交叉的交點P與位於理想之設定基準面位置V的基準面F的基準位置一致的構成為例子來進行了說明。但是,並非限定於這樣的構成。交點P只要是位於對應設定基準面位置V的位置即可,例如,亦可作成為以下的構成:在相對於第1光軸L1及第2光軸L2正交的方向(上述之實施形態中為上下方向Z)上,交點P相對於位於理想之設定基準面位置V的基準面F,位於僅隔開了設定距離的位置上,前述設定距離是設定在上述之規定之距離範圍內。又,上述之實施形態中,是將基準面F的基準位置設為基準面F的重心位置,但並非限定於此,例如,將基準面F的基準位置設定在基準面F之角落部等基準面F中之其他位置亦可。(5) In the above-mentioned embodiment, the configuration in which the intersection point P where the first optical axis L1 crosses the second optical axis L2 coincides with the reference position of the reference plane F located at the ideal setting reference plane position V is taken as an example. Description. However, it is not limited to such a configuration. The point of intersection P only needs to be located at a position corresponding to the set reference plane position V. For example, it may be configured as follows: in a direction orthogonal to the first optical axis L1 and the second optical axis L2 (in the above-mentioned embodiment In the vertical direction Z), the intersection point P is located at a position separated only by a set distance with respect to the reference plane F located at the ideal set reference plane position V. The set distance is set within the above-mentioned prescribed distance range. In addition, in the above-mentioned embodiment, the reference position of the reference plane F is set as the center of gravity position of the reference plane F, but it is not limited to this. For example, the reference position of the reference plane F is set at the corner of the reference plane F. Other positions in face F are also possible.
(6)上述之實施形態中,是以第1光軸L1及第2光軸L2兩者沿著水平面的方向的構成為例子來進行了說明。這是因為基準面F是在正常狀態下沿著水平面的面的緣故。但是,並非限定於這樣的構成。例如,第1光軸L1及第2光軸L2之其中任一者沿著上下方向Z的構成亦可。當基準面F是在正常狀態下沿著上下方向Z的面時,宜作成為這樣的構成較佳。或者是,第1光軸L1及第2光軸L2之其中一者或兩者相對於水平面傾斜的構成亦可。第1光軸L1及第2光軸L2的方向宜因應基準面F的方向來設定較佳。(6) In the above-mentioned embodiment, the configuration in which both the first optical axis L1 and the second optical axis L2 are along the direction of the horizontal plane has been described as an example. This is because the reference plane F is a plane along the horizontal plane in a normal state. However, it is not limited to such a configuration. For example, a configuration in which any one of the first optical axis L1 and the second optical axis L2 is along the vertical direction Z may also be adopted. When the reference plane F is a plane along the up-down direction Z in a normal state, it is preferable to have such a configuration. Alternatively, one or both of the first optical axis L1 and the second optical axis L2 may be inclined with respect to the horizontal plane. The directions of the first optical axis L1 and the second optical axis L2 are preferably set in accordance with the direction of the reference plane F.
(7)另外,上述之各實施形態所揭示的構成,只要沒有發生矛盾,也可與其他實施形態所揭示的構成組合而適用。關於其他構成,在本說明書中所揭示的實施形態在各方面均只不過是例示。從而,在不脫離本揭示的主旨之範圍內,可適當地進行各種改變。(7) In addition, the configuration disclosed in each of the above-mentioned embodiments can be applied in combination with the configuration disclosed in other embodiments as long as there is no contradiction. Regarding other configurations, the embodiments disclosed in this specification are merely examples in every respect. Therefore, various changes can be appropriately made without departing from the gist of the present disclosure.
3.上述實施形態之概要 以下,針對在上述已說明之檢查系統的概要來進行說明。3. Outline of the above-mentioned embodiment Hereinafter, the outline of the inspection system explained above will be explained.
檢查系統具備:檢測部,檢測物品搬送車所具備之可升降自如之升降部的傾斜狀態, 前述升降部具有基準面,前述檢測部具備第1攝像裝置及第2攝像裝置,以前述升降部位於規定之設定升降位置的狀態下的前述基準面的位置作為設定基準面位置,前述第1攝像裝置及前述第2攝像裝置是設置成:前述第1攝像裝置的光軸即第1光軸與前述第2攝像裝置的光軸即第2光軸交叉的交點成為對應前述設定基準面位置的位置,並且,前述第1光軸及前述第2光軸成為沿著前述基準面的方向,前述檢測部是依據藉由前述第1攝像裝置及前述第2攝像裝置所拍攝之前述基準面的圖像,來檢測前述升降部的傾斜方向及傾斜角度。The inspection system is equipped with: a detection part, which detects the inclination of the lifting part of the article transport vehicle, which can be raised and lowered freely. The lift unit has a reference surface, the detection unit includes a first imaging device and a second imaging device, and the position of the reference surface in a state where the lift unit is at a predetermined set lift position is used as a set reference surface position, and the first imaging device The device and the second imaging device are arranged such that the intersection of the optical axis of the first imaging device, that is, the first optical axis, and the optical axis of the second imaging device, that is, the second optical axis, becomes a position corresponding to the position of the set reference plane And, the first optical axis and the second optical axis are in a direction along the reference plane, and the detection unit is based on an image of the reference plane captured by the first imaging device and the second imaging device , To detect the inclination direction and the inclination angle of the aforementioned lifting part.
根據本構成,由於是依據藉由第1攝像裝置及第2攝像裝置從交叉的2個方向拍攝之升降部的基準面的圖像,來檢測升降部的傾斜狀態,因此可以適當地檢測升降部的傾斜方向及傾斜角度。又,根據該特徴構成,由於是使物品搬送車之升降部移動至規定之設定升降位置,且在該狀態下,藉由第1攝像裝置及第2攝像裝置拍攝升降部,從而可以檢測升降部的傾斜狀態,因此不須使檢測用治具等支撐於升降部。因此,即便在檢查複數個物品搬送車之升降部的傾斜狀態的情況下,也不須使檢查用治具等在複數個物品搬送車之間移動,可以有效率地進行升降部的傾斜狀態之檢查。According to this configuration, since the image of the reference plane of the lifting part taken from the two crossing directions by the first imaging device and the second imaging device is used to detect the inclination state of the lifting part, the lifting part can be detected appropriately The inclination direction and angle of inclination. In addition, according to this characteristic configuration, since the lifting part of the article transport vehicle is moved to a predetermined set lifting position, and in this state, the lifting part can be detected by the first and second imaging devices photographing the lifting part The tilted state, so there is no need to support the detection jigs on the lifting part. Therefore, even in the case of inspecting the tilting state of the lifting part of a plurality of article transport vehicles, it is not necessary to move inspection jigs and the like between the plurality of article transporting vehicles, and the tilting state of the lifting part can be efficiently performed. inspection.
此處,前述檢測部宜依據藉由前述第1攝像裝置所拍攝之第1圖像所包含的前述基準面之邊緣的傾斜,來檢測與前述第1光軸正交的方向即第1方向上之前述升降部的傾斜角度,並依據藉由前述第2攝像裝置所拍攝之第2圖像所包含的前述基準面之邊緣的傾斜,來檢測與前述第2光軸正交的方向即第2方向上之前述升降部的傾斜角度。Here, the detection unit preferably detects the direction orthogonal to the first optical axis, that is, the first direction based on the inclination of the edge of the reference plane included in the first image captured by the first imaging device. The inclination angle of the elevating portion is detected based on the inclination of the edge of the reference plane included in the second image captured by the second imaging device to detect the direction orthogonal to the second optical axis, that is, the second The inclination angle of the aforementioned lifting part in the direction.
根據本構成,可以依據藉由第1攝像裝置及第2攝像裝置所分別拍攝之基準面之邊緣的傾斜,來檢測第1方向上之升降部的傾斜角度及第2方向上之升降部的傾斜角度兩者。因此,可以更加適當地檢測升降體的傾斜方向及傾斜角度。According to this configuration, it is possible to detect the inclination angle of the elevating part in the first direction and the inclination of the elevating part in the second direction based on the inclination of the edge of the reference plane photographed by the first imaging device and the second imaging device. Angle both. Therefore, the inclination direction and the inclination angle of the elevator body can be detected more appropriately.
又,宜更具備:第1投光裝置,從與前述第1攝像裝置相對向之側朝向前述交點投光;及第2投光裝置,從與前述第2攝像裝置相對向之側朝向前述交點投光。Furthermore, it is preferable to further include: a first light projection device that projects light from the side facing the first imaging device toward the intersection point; and a second light projection device that projects light from the side facing the second imaging device toward the intersection point Cast light.
根據本構成,從第1攝像裝置觀看,由於基準面的周圍是藉由第1投光裝置而被照亮,因此可以藉由第1攝像裝置拍攝出容易判別基準面與除此以外之交界的圖像。又,從第2攝像裝置觀看,由於基準面的周圍是藉由第2投光裝置而被照亮,因此可以藉由第2攝像裝置拍攝出容易判別基準面與除此以外之交界的圖像。因此,可以更加適當地檢測升降體的傾斜方向及傾斜角度。According to this structure, when viewed from the first imaging device, the surroundings of the reference surface are illuminated by the first light-emitting device, so the first imaging device can easily identify the boundary between the reference surface and the rest. image. Also, as viewed from the second imaging device, since the periphery of the reference surface is illuminated by the second light-emitting device, the second imaging device can capture an image that is easy to distinguish the boundary between the reference surface and the rest. . Therefore, the inclination direction and the inclination angle of the elevator body can be detected more appropriately.
又,宜更備:第3投光裝置,從與前述基準面相對向之側投光。In addition, it is better to prepare a third light projection device to project light from the side opposite to the aforementioned reference plane.
根據本構成,由於基準面是藉由第3投光裝置而從與該基準面相對向之側被照亮,因此可以藉由第1攝像裝置及第2攝像裝置拍攝出容易判別基準面與除此以外之交界的圖像。因此,可以更加適當地檢測升降體的傾斜方向及傾斜角度。According to this configuration, since the reference surface is illuminated from the side opposite to the reference surface by the third light-emitting device, it is easy to distinguish between the reference surface and the removal by the first imaging device and the second imaging device. The image of the border beyond this. Therefore, the inclination direction and the inclination angle of the elevator body can be detected more appropriately.
又,前述第1攝像裝置及前述第2攝像裝置宜設置成前述第1光軸與前述第2光軸正交。Furthermore, it is preferable that the first imaging device and the second imaging device are arranged so that the first optical axis and the second optical axis are orthogonal to each other.
根據本構成,由於依據第1攝像裝置所拍攝之圖像來檢測升降部的傾斜角度的方向、與依據第2攝像裝置所拍攝之圖像來檢測升降部的傾斜角度的方向正交,因此可以容易地將依據該等圖像求出升降部的傾斜方向及傾斜角度時的運算處理簡略化。 產業上之可利用性According to this configuration, the direction of detecting the inclination angle of the elevator based on the image taken by the first imaging device is orthogonal to the direction of detecting the inclination angle of the elevator based on the image taken by the second imaging device, so it is possible to It is easy to simplify the arithmetic processing when obtaining the inclination direction and the inclination angle of the lifting part based on these images. Industrial availability
本揭示之技術可以利用於一種具備了對物品搬送車所具備之可升降自如之升降部的傾斜狀態進行檢測之檢測部的檢查系統。The technology of the present disclosure can be used in an inspection system equipped with a detection unit that detects the inclination state of a liftable lifting unit provided in an article transport vehicle.
1:物品搬送車
2:處理裝置
3:支撐台
4:檢查系統
5:軌道
6:行走部
6A:第1行走單元
6B:第2行走單元
7:升降部
8:升降裝置
11:車輪
12:行走用馬達
14:捲繞體
15:捲取帶
16:升降用馬達
18:把持爪
19:把持用馬達
20:殼體
22:檢測部
23:第1攝像裝置
24:第2攝像裝置
25:第1投光裝置
26:第2投光裝置
27:控制部
28:第3投光裝置
A1:第1投光範圍
A2:第2投光範圍
E:邊緣
F:基準面
L:行走路徑
L1:第1光軸
L2:第2光軸
P:交點
V:設定基準面位置
W:容器
X:延伸方向(第1方向)
X1:延伸方向第1側
X2:延伸方向第2側
Y:寬度方向(第2方向)
Y1:寬度方向第1側
Y2:寬度方向第2側
Z:上下方向
θ1,θ2:傾斜角度1: Item transport vehicle
2: Processing device
3: support table
4: Check the system
5: Orbit
6: Walking
圖1是物品搬送設備的平面圖。 圖2是物品搬送車及處理裝置的側面圖。 圖3是物品搬送車及檢查系統的立體圖。 圖4是檢查系統的控制方塊圖。 圖5是檢查控制的流程圖。 圖6是顯示了從寬度方向第2側觀看之設定基準面位置的基準面的圖。 圖7是顯示了從延伸方向第2側觀看之設定基準面位置的基準面的圖。 圖8是顯示了從寬度方向第2側觀看之設定基準面位置的基準面的圖。 圖9是顯示了從延伸方向第2側觀看之設定基準面位置的基準面的圖。 圖10是其他實施形態之檢查系統的側面圖。Fig. 1 is a plan view of the article conveying equipment. Fig. 2 is a side view of the article transport vehicle and the processing device. Fig. 3 is a perspective view of the article transport vehicle and the inspection system. Figure 4 is a control block diagram of the inspection system. Fig. 5 is a flowchart of inspection control. Fig. 6 is a diagram showing a reference surface for setting a reference surface position viewed from the second side in the width direction. Fig. 7 is a diagram showing a reference plane for setting a reference plane position viewed from the second side in the extending direction. Fig. 8 is a diagram showing a reference plane for setting a reference plane position viewed from the second side in the width direction. Fig. 9 is a diagram showing a reference plane for setting a reference plane position viewed from the second side in the extending direction. Fig. 10 is a side view of an inspection system of another embodiment.
1:物品搬送車 1: Item transport vehicle
4:檢查系統 4: Check the system
5:軌道 5: Orbit
6:行走部 6: Walking part
6A:第1行走單元 6A: The first traveling unit
6B:第2行走單元 6B: 2nd traveling unit
7:升降部 7: Lifting part
11:車輪 11: Wheel
12:行走用馬達 12: Motor for walking
15:捲取帶 15: take-up tape
20:殼體 20: shell
22:檢測部 22: Inspection Department
23:第1攝像裝置 23: The first camera
24:第2攝像裝置 24: The second camera
25:第1投光裝置 25: The first projection device
26:第2投光裝置 26: 2nd projecting device
F:基準面 F: Datum plane
L:行走路徑 L: walking path
L1:第1光軸 L1: 1st optical axis
L2:第2光軸 L2: 2nd optical axis
P:交點 P: intersection
V:設定基準面位置 V: Set the position of the reference plane
X:延伸方向(第1方向) X: Extension direction (1st direction)
X1:延伸方向第1側 X1: The first side in the extension direction
X2:延伸方向第2側 X2: The second side in the extension direction
Y:寬度方向(第2方向) Y: Width direction (2nd direction)
Y1:寬度方向第1側 Y1: The first side in the width direction
Y2:寬度方向第2側 Y2: The second side in the width direction
Z:上下方向 Z: Up and down direction
Claims (7)
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KR (1) | KR20210004850A (en) |
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JPH10337344A (en) * | 1997-06-09 | 1998-12-22 | Fuitsuto:Kk | Measurement of lye and loft angles of golf club and computer-readable recording medium to store program to execute the measurement |
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