TW202028977A - Test method for transmit port of storage devices of system host - Google Patents

Abstract

A test method for a transmit port of storage devices of a system host, the system host includes a computing module, and the test method includes the steps of: coupling a test storage device to the transmit port of the computing module, wherein the test storage device includes a controller and a cache unit; providing, by the computing module, data to the test storage device through the transmit port to perform a storage testing mode; writing, by the controller, the data to the cache unit to complete the write operation, and then stops the write operation to complete the storage test; reading, by the computing module, the data provided from the test storage device for the computing module requested, performing a reading testing mode, and the controller only transmit the data from the cache unit to the computing module to complete a reading test.

Description

System host storage device connection port testing method

The present invention relates to a test method, in particular to a test method applied to a storage device port of a system host.

The solid-state storage device has the characteristic that it can be placed in the computer system at will without affecting its normal operation. However, the life of the current solid-state storage device has a certain specification limit for the number of reads and writes, such as TBW (Terabytes Written) and DWPD (Drive Writes) Per Day). For system testing and server-related companies, they often need to perform functional testing, burn-in verification, and assembly system hardware and software components, which often require a large number of read/write tests on storage devices. However, the use of general solid-state storage devices will make it more difficult for the industry to control costs due to the aforementioned life issues.

Therefore, how to design a system host storage device port test method to solve the aforementioned technical problems is an important subject studied by the inventors of this case.

The purpose of the present invention is to provide a method for testing the system host storage device port, which can solve the aforementioned general solid-state storage device life problem with a certain limit of read and write times, and achieve the purpose of improving the cost control difficulties of related businesses.

In order to achieve the foregoing objective, the present invention provides a method for testing a storage device port of a system host. The system host includes a computing module. The testing method includes the following steps: coupling a test storage device to a connection of the computing module Port, the test storage device includes a controller and a cache unit coupled to the controller; performs a storage test mode, and the computing module provides a data to be transmitted to the test storage device via the port; the test When the storage device receives the data, the controller writes the data in the cache unit and stops the writing operation to complete the storage test; a read test mode is performed, and the computing module requests the test storage device to provide the The data is read, and the controller only transmits the data from the buffer unit to the arithmetic module to complete the read test.

Regarding the efficacy and advantages of the system host storage device port test method of the present invention, since the computing module and the controller of the test storage device communicate, the controller only writes and writes the data to the cache unit Reading, all used in the process are cache units belonging to random-access memory (Random-access Memory). Those skilled in the art can understand that the write times and read life of random access memory are higher than those of flash memory in traditional solid-state drives, especially non-volatile flash memory (such as NAND). FLASH). For this reason, through the appropriate configuration of the test method, the aforementioned general solid-state storage device has a certain limit on the life of the read and write times, and achieves the goal of improving the cost control difficulties of the relevant industry.

The technical content and detailed description of the present invention are described below with the drawings.

Please refer to FIG. 1, where the system host includes a computing module 10 and a backplane 20. The computing module 10 includes a port 11, and the backplane 20 has a plurality of connectors 21, one of which is electrically connected to the port. 11 enables the computing module 10 to be coupled to the backplane 20.

The backplane 20 may be a single-sided backplane (Backplane) or a double-sided backplane (Midplane). The backplane 20 is compatible with general high-speed backplane architecture standards, such as CPCI, ATCA, MicroTCA, VPX, etc., except In addition, each connector 21 can be a hybrid U.2 transmission interface compatible with the three transmission protocols of SATA, SAS, and NVMe or an independent SATA, SAS, mSATA, M.2, SATA DOM, NF1, NGSFF, EGSFF storage device interface and can provide hot-swappable function; in other embodiments, the backplane 20 can be replaced with another motherboard or electronic circuit substrate with the same transmission function connector 21, and the computing module 10 can Optionally set on the motherboard or electronic circuit substrate.

The system host can be a server (Server), a computer (PC) or a notebook computer, a tablet computer, a smart phone, a personal digital assistant, and other electronic devices with a computing module 10.

When the user wants to test the storage device port 11 of the system host, a test storage device 41 can be selectively used for the test. The test storage device 41 includes a controller 410 and a cache unit 413 coupled to the controller 410 And the flash memory 412 and a transmission terminal 411 are used to couple the test storage device 41 to other electronic devices; similarly, the user can also selectively use the two test storage devices 41 and 42 for testing at the same time. The two test storage devices 42 are roughly the same as the first test storage device 41. The two differences are only that the controller 410 and the controller 420 are compatible with different transmission protocols. The transmission protocols can be SATA, SAS, Any of NVMe.

In particular, the cache unit 413 is a random-access memory. Therefore, when the cache unit 413 loses operating power, the stored data will be cleared; and the cache unit 413 can be a dynamic random-access memory ( Dynamic Random-access Memory), or Static Random-Access Memory (Static Random-Access Memory), is not particularly limited in this embodiment.

The flash memory 412 may be a non-volatile flash memory (NAND FLASH).

Furthermore, according to the needs of the user, the test storage devices 41 and 42 can also be used without the flash memory 412.

The following is a detailed description of the test methods divided into storage test methods and read test methods; please refer to Figure 2 and Figure 3. When the user needs to perform the storage test mode on the port 11 of the system host computing module 10, the user Use a test storage device 41 to plug into the connector 21 on the backplane 20 so that the test storage device 41 can be electrically connected to the computing module 10 through the connection port 11, and then perform a storage test mode. The computing module 10 provides A data 200 is transferred to the test storage device 41 via the port 11 and the connector 21 of the backplane 20; when the test storage device 41 receives the data 200, the controller 410 writes the data 200 in the cache The unit 413 stops the writing operation after completion to complete the storage test.

When the user performs a reading test mode, the test storage device 41 remains coupled to the connector 21 of the backplane 20 at this time, and the computing module 10 requests the test storage device 41 to provide the data according to user requirements 200 for reading, the controller 410 only transmits the data 200 from the buffer unit 413 to the computing module 10 to complete the reading test.

Please refer to FIGS. 4 and 5, which are another embodiment of the present invention. If the user needs to test two test storage devices 41, 42 at the same time, it is similar to the aforementioned method of using a single test storage device 41. The user first plugs the two test storage devices 41, 42 into the connector 21 on the backplane 20, so that they can be electrically connected to the computing module 10 through the connection port 11, and then perform a storage test mode. The module 10 provides a data 200 that is synchronously transmitted to the storage devices 41, 42 through the port 11 and the connector 21 of the backplane 20; when the test storage device 41, 42 receives the data 200, the controller 410, 420 The data 200 is written into the cache units 413 and 423, and the writing operation is stopped after completion to complete the storage test.

Similarly, when the user performs a reading test mode, the test storage devices 41 and 42 are kept coupled to the connector 21 of the backplane 20 at this time, and the computing module 10 requests the test according to the user's requirements. The storage devices 41 and 42 provide the data 200 for reading. The controllers 410 and 420 only transfer the data 200 from the cache units 413 and 423 to the computing module 10 via the connector 21 and the port 11 to complete the reading. test.

Whether it is a storage test or a read test, the test storage devices 41, 42 can be synchronized to perform the storage test and the read test, or according to the needs of the user, the storage devices 41, 42 can be tested in a tandem manner. Perform storage test or read test individually.

To further explain, in the foregoing test method, the flash memory 412, 422 of the test storage device 41, 42 is not subjected to the storage and reading work, so the life of the read and write times will not be reduced; in other words, in the storage test , The controllers 410, 420 write the data 200 in the cache units 413, 423 without writing the flash memory 412, 422; in the read test, the controllers 410, 420 only read the data stored in the The data 200 in the cache unit 413, 423 does not read the flash memory 412, 422; therefore, it can be ensured that when the test storage device 41, 42 is a solid state drive (SSD), this test method can extend the service life .

In particular, when the arithmetic module 10 that is compatible with the hybrid transmission protocol is used, that is, the arithmetic module 10 has built-in SATA, SAS, NVMe and other transmission protocols at the same time and communicates with each storage device 41 correspondingly. , 42 synchronizes the storage test mode and the read test mode; the connector 21 on the backplane 20 is the U.2 transmission interface, so the test storage devices 41 and 42 can be selected for different transmission protocols such as SAS or NVMe. Therefore, it can test whether the computing module 10 and the connection port 11 can be normally stored and read according to the different transmission protocols of the storage devices 41 and 42.

Please refer to FIG. 6, which is a schematic flowchart of a method for testing a storage device port of a system host of the present invention. Initially, the test storage devices 41, 42 are coupled to the connection port 11 of the computing module 10. Each test storage device 41, 42 includes a controller 410, 420 and a cache unit 413, 423 coupled to the controller 410, 420 (Step S01); Then a storage test mode is performed, the computing module 10 provides data 200 to be transmitted to each test storage device 41, 42 through the connection port 11; when each test storage device 41, 42 receives the data 200, control After the devices 410 and 420 write the data 200 in the buffer units 413 and 423, the writing operation is stopped to complete the storage test (step S02); after that, a read test mode is performed, and the computing module 10 requests each test storage device 41 42 provides the data 200 for reading, and the controllers 410 and 420 only transfer the data 200 from the buffer units 413 and 423 to the computing module 10 to complete the reading test (step S03).

For this reason, through the appropriate configuration of the test method, the aforementioned general solid-state storage device has a certain limit on the lifespan of the read and write times, and achieves the goal of improving the cost control difficulties of related businesses.

The above are only detailed descriptions and drawings of preferred embodiments of the present invention, but the features of the present invention are not limited thereto, and are not intended to limit the present invention.

10: Computing module 11: Port 20: Backplane 21: Connector 200: Information 41, 42: Test storage device 410, 420: Controller 411, 421: Transmission end 412, 422: flash memory 413, 423: cache unit S01~S03: steps

1 is a schematic diagram of the system architecture of the method for testing the storage device port of the system host of the present invention;

2 and 3 are schematic diagrams of the storage test mode of the method for testing the storage device port of the system host of the present invention;

4 and 5 are schematic diagrams of the read test mode of the method for testing the host storage device port of the system of the present invention; and

FIG. 6 is a schematic flowchart of a method for testing a storage device port of a system host of the present invention.

10: Computing module

11: Port

20: Backplane

21: Connector

41, 42: Test storage device

410, 420: Controller

411, 421: Transmission end

412, 422: flash memory

413, 423: cache unit

Claims (6)

A test method for a storage device connection port of a system host. The system host includes an arithmetic module. The test method includes the following steps: Coupling a test storage device to a port of the computing module, the test storage device including a controller and a cache unit coupled to the controller; Perform a storage test mode, the computing module provides a data to be transmitted to the test storage device through the port; When the test storage device receives the data, the controller stops the writing operation after writing the data in the cache unit to complete the storage test; and A reading test mode is performed, the computing module requests the test storage device to provide the data for reading, and the controller only transmits the data from the cache unit to the computing module to complete the reading test. According to the method for testing the connection end of the system host storage device described in claim 1, wherein the test storage device further includes a flash memory coupled to the controller, wherein the controller is in the storage test mode Write the data in the cache unit without writing the flash memory. As described in the second item of the scope of patent application, the system host storage device connection terminal test method, wherein, when the read test mode is performed, the controller only reads the data stored in the cache unit and does not read the flash Memory, and transmit the data to the computing module. According to the method for testing the storage device connection end of the system host as described in item 3 of the scope of patent application, the controller is driven by a built-in firmware to execute the storage test mode and the read test mode. For example, the method for testing the connection end of the system host storage device described in the scope of patent application, wherein the cache unit is a random access memory, and when the cache unit loses operating power, the cache unit will clear the stored data . For example, the method for testing the connection section of the system host storage device described in the scope of the patent application, wherein the number of the storage device for testing is two, and each storage device for testing is compatible with different transmission protocols and is respectively coupled to the calculation A module, the arithmetic module synchronously performs the storage test mode and the read test mode for each test storage device according to multiple sets of built-in transmission protocols.

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