TW201935005A - Cassettes with offset vias - Google Patents

Cassettes with offset vias Download PDF

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TW201935005A
TW201935005A TW107104349A TW107104349A TW201935005A TW 201935005 A TW201935005 A TW 201935005A TW 107104349 A TW107104349 A TW 107104349A TW 107104349 A TW107104349 A TW 107104349A TW 201935005 A TW201935005 A TW 201935005A
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pads
pad
row
interconnect
interconnection
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TW107104349A
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Chinese (zh)
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蓋瑞 G. 路汀史蓋
馬修 D. 史密斯
丹尼斯 R. 伊斯特保
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美商惠普發展公司有限責任合夥企業
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Publication of TW201935005A publication Critical patent/TW201935005A/en

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Abstract

A cassette may include a substrate, a die coupled to the substrate, and an electrical interconnection pad layout formed on a first side of the substrate. The electrical interconnection pad layout may include a first row of interconnect pads including at least one interconnect pad. Each interconnect pad of the first row of interconnect pads may be electrically coupled to one of a first set of vias. The electrical interconnection pad layout may also include a second row of interconnection pads including at least one interconnect pad. Each interconnect pad of the second row of interconnect pads being electrically coupled to one of a second set of vias. The second set of vias electrically coupled to the second row of interconnect pads are offset relative to an alignment of the interconnect pads of the first and second rows.

Description

帶偏移通孔之卡匣Cassette with offset through hole

本發明大體而言係有關於帶偏移通孔之卡匣。The present invention generally relates to a cassette with offset through holes.

「檢定回合(assay run)」係為用於例如實驗室醫學、藥理學、分析化學、環境生物學、或分子生物學用以定性評估或定量測量一樣品之存在、數量或機能活性的一調查性或分析活動。此樣品可為一藥物、生物樣品、蛋白體學(proteomic)樣品、生物化學物質、有機體中之細胞、有機樣品、或其他無機與有機化學樣品。一檢定回合可測量樣品的密集性質,並將其以相關測量單位表示,諸如,例如莫耳濃度、密度、酵素國際單位機能活性、相較於一標準的某些效應程度等等可量測特性。一檢定可能涉及使一樣品與數種試劑反應,且可分類為符合一檢定規程之一檢定過程的一實例。一檢定規程可能涉及以特定數量施配到諸如一井孔板內之井孔之數個檢定反應區的一組試劑及/或樣品流體。再者,一檢定規程可能包括額外處理,諸如混合、分離、加熱或冷卻、培養、及最終至少一讀出。一檢定的可複製性及回合間可比較性視其規程的複製而定。An `` assay run '' is an investigation used, for example, in laboratory medicine, pharmacology, analytical chemistry, environmental biology, or molecular biology to qualitatively evaluate or quantitatively measure the presence, quantity, or functional activity of a sample Sexual or analytical activities. The sample can be a drug, a biological sample, a proteomic sample, a biochemical substance, a cell in an organism, an organic sample, or other inorganic and organic chemical samples. A test round can measure the dense nature of the sample and express it in relevant measurement units, such as, for example, Mohr concentration, density, functional unit enzyme activity, some degree of effect compared to a standard, etc. . A test may involve reacting a sample with several reagents and may be classified as an example of a test procedure that complies with a test procedure. A test procedure may involve a set of reagents and / or sample fluids that are dispensed in a specific amount into several test reaction zones, such as wells in a well plate. Furthermore, an assay procedure may include additional processing such as mixing, separating, heating or cooling, culturing, and finally at least one readout. The reproducibility of a test and the comparability between rounds depend on the reproduction of its procedures.

依據本發明之一實施例,係特地提出一種卡匣,其包含:一基體;耦合至該基體的一晶粒;以及形成在該基體之一第一側上的一電氣互連墊佈局配置,其包含:一第一列互連墊,其包含至少一互連墊,該第一列互連墊中的各互連墊係電氣耦合至一第一組通孔中的一者;及一第二列互連墊,其包含至少一互連墊,該第二列互連墊中的各互連墊係電氣耦合至一第二組通孔中的一者,其中電氣耦合至該第二列互連墊的該第二組通孔係相對於該第一列及該第二列中之互連墊的一對準線而偏置。According to an embodiment of the present invention, a cassette is specifically provided, which includes: a base body; a die coupled to the base body; and an electrical interconnection pad layout configuration formed on a first side of the base body, It includes: a first row of interconnect pads including at least one interconnect pad, each interconnect pad in the first row of interconnect pads being electrically coupled to one of a first set of through-holes; and a first A two-row interconnect pad comprising at least one interconnect pad, each interconnect pad in the second row of interconnect pads is electrically coupled to one of a second set of through-holes, wherein the second row of interconnect pads are electrically coupled to the second row The second set of through-holes of the interconnect pads are offset relative to an alignment line of the interconnect pads in the first and second columns.

一些檢定流體施配系統可在一短時間內採一精確受控形式自動施配諸如例如樣品及試劑的檢定流體到在一井孔板內稱為井孔的多個反應區中。數種試劑的一謹慎配製(formulated)混合物,包括一關注目標物種,可在多個反應區被謹慎配製,用以測試多種濃度之一組測試樣品試劑。如此允許諸多反應同時進行。此種自動化減少使用者勞力及使用者所造成的變動,而同時更縮短完成一複雜檢定的時間。Some test fluid dispensing systems can automatically dispense test fluids, such as, for example, samples and reagents, into a plurality of reaction zones called wells in a well plate within a short period of time. A carefully formulated mixture of several reagents, including a target species of interest, can be carefully formulated in multiple reaction zones to test a set of test sample reagents at multiple concentrations. This allows many reactions to proceed simultaneously. This automation reduces user labor and user-induced changes, while at the same time shortening the time to complete a complex test.

一檢定流體施配系統將諸如分析物或試劑之至少一檢定流體同時或連續施配到井孔中,且可利用使用可互換卡匣的一流體施配器驅動器。這些卡匣可含有檢定流體在數個儲槽內,且可經控制成將檢定流體放置到井孔板之井孔內。包括一反應媒介的井孔板可相對於卡匣移動,致使一檢定流體可由在井孔板之不同井孔處的數個流體噴射晶粒射出。此井孔板可為例如一微滴定板,其中界定有一反應井孔陣列。再者,於一範例中,檢定流體施配系統可將至少一檢定流體施配到一組織樣品、一具有整合式微流體結構之晶片、或一載玻片上。A test fluid dispensing system simultaneously or continuously dispenses at least one test fluid, such as an analyte or a reagent, into a wellbore, and can utilize a fluid dispenser driver using interchangeable cassettes. These cassettes may contain the verification fluid in several storage tanks and may be controlled to place the verification fluid into the wellbore of the wellbore plate. A wellbore comprising a reaction medium is movable relative to the cassette, so that a test fluid can be ejected from several fluid jet grains at different wellbores of the wellbore. The well plate may be, for example, a microtiter plate in which a reaction well array is defined. Furthermore, in one example, the test fluid dispensing system can dispense at least one test fluid to a tissue sample, a wafer with an integrated microfluidic structure, or a glass slide.

多通道卡匣可用來使多個流體可同時被施配。例如,多個樣品可被同時或接續放置在井孔板之個別井孔內,以縮短滴定井孔內之多個樣品的時間。在本案說明書及後附申請專利範圍中使用時,「卡匣」一詞係要廣泛理解為一檢定流體施配器系統之任何使用者可替換構件,其中至少一流體在從檢定流體施配器系統施配之前經由該構件流經至少一流體通道。Multi-channel cassettes can be used to allow multiple fluids to be dispensed simultaneously. For example, multiple samples may be placed simultaneously or successively in individual wells of a well plate to reduce the time required to titrate multiple samples in the well. As used in the description of this case and the scope of the attached patent application, the term "cassette" is to be broadly understood as any user-replaceable component of a certified fluid dispenser system, and at least one fluid is Flow through the component through at least one fluid channel before dispensing.

多通道流體施配器卡匣的一範例可為例如一配合HP® D300數位式施配器使用的T-8型卡匣。在此範例中,通道在合適時於標稱上為相同,此合適情況例如在滴定一組具有類似流體特性的樣品時。然而,許多檢定規程可要求使用具有極為不同之流體特性或處理規程的不同檢定流體。例如,一些檢定流體較其他檢定流體更為黏稠。再者,一些檢定流體可以大量施配以便發生效用。另外其他檢定流體,諸如,例如有力樣品,可以小而受精確控制的數量被施配以便發生效用。在又一範例中,一些檢定流體可在特定情況下施配,諸如在存在有管道塗層及溫度控制的情況,來發生效用。此外,許多檢定規程可能規定流體處理與其他諸如混合或讀取之非施配步驟的確切順序及時序。An example of a multi-channel fluid dispenser cassette may be, for example, a T-8 type cassette for use with an HP® D300 digital dispenser. In this example, the channels are nominally the same when appropriate, such as when titrating a set of samples with similar fluid characteristics. However, many verification procedures may require the use of different verification fluids with very different fluid characteristics or processing procedures. For example, some verification fluids are more viscous than others. Furthermore, some test fluids can be dispensed in large quantities in order to be effective. In addition, other test fluids, such as, for example, a powerful sample, can be dispensed in small, precisely controlled quantities for utility to occur. In yet another example, some test fluids can be dispensed in specific situations, such as in the presence of pipe coatings and temperature control, to take effect. In addition, many verification procedures may specify the exact sequence and timing of fluid processing and other non-dispensing steps such as mixing or reading.

因此,數個卡匣可在檢定流體施配器系統內使用以達成多種不同反應。在允許一使用者替換的情況下,卡匣可能在將可互換卡匣上之數個電氣接點與流體施配器驅動器之數個電氣接點適當對準時造成使用者失誤。並且,在允許一使用者替換的情況下,此等卡匣可能對可互換卡匣上的電氣接點造成損壞,使得卡匣的整體性可能受危害。As a result, several cartridges can be used within a calibration fluid dispenser system to achieve a variety of different responses. In the case where a user is allowed to replace, the cassette may cause a user error when properly aligning the electrical contacts on the interchangeable cassette with the electrical contacts of the fluid dispenser driver. Moreover, when a user is allowed to replace these cassettes, the electrical contacts on the interchangeable cassettes may be damaged, so that the integrity of the cassette may be compromised.

本文所述之範例提供一卡匣。此卡匣包括一基體、耦合至該基體之一晶粒、及形成在該基體之一第一側上的一電氣互連墊佈局配置。此電氣互連墊佈局配置可包括第一列互連墊,其包括至少一互連墊。此第一列互連墊中之各互連墊可電氣耦合至第一組通孔中之一者。該電氣互連墊佈局配置亦可包括第二列互連墊,其包括至少一互連墊。此第二列互連墊中之各互連墊可電氣耦合至第二組通孔中之一者。電氣耦合至第二列互連墊的第二組通孔係相對於第一列及第二列中之互連墊之一對準線而偏置。The example described in this article provides a cassette. The cassette includes a substrate, a die coupled to the substrate, and an electrical interconnection pad layout formed on a first side of the substrate. The electrical interconnection pad layout configuration may include a first column of interconnection pads including at least one interconnection pad. Each interconnect pad in the first row of interconnect pads may be electrically coupled to one of the first set of vias. The electrical interconnection pad layout configuration may also include a second row of interconnection pads, which includes at least one interconnection pad. Each interconnect pad in this second row of interconnect pads may be electrically coupled to one of the second set of vias. The second set of vias electrically coupled to the second row of interconnect pads are offset relative to the alignment of one of the interconnect pads in the first and second rows.

於本文之範例中,卡匣更可包括形成在基體之第二側上的數條電氣跡線。第一及第二組通孔將電氣互連墊佈局配置電氣耦合至該等電氣跡線。電氣耦合至第二列互連墊之第二組通孔的偏置,造成基體之一第二側上所形成之電氣跡線的一偏置。並且,於本文之範例中,第一列互連墊中之該等互連墊中的至少一者可包括界定於其中的一接觸座。此接觸座允許一彈簧壓抵連接體的座設。再者,在本文之範例中,第二列互連墊中之該等互連墊中的至少一者可包括一發射互連墊。In the example herein, the cassette may further include several electrical traces formed on the second side of the substrate. The first and second sets of vias electrically couple the electrical interconnect pad layout configuration to the electrical traces. The bias of the second set of vias electrically coupled to the second row of interconnect pads results in a bias of the electrical traces formed on the second side of one of the substrates. And, in the example herein, at least one of the interconnection pads in the first row of interconnection pads may include a contact seat defined therein. This contact seat allows a spring to be pressed against the seat of the connection body. Furthermore, in the example herein, at least one of the interconnect pads in the second row of interconnect pads may include a launch interconnect pad.

本文所述之範例更提供用以射出流體到一檢定試料中的系統。此系統可包括一印刷電路總成(PCA)。此PCA可包括至少一彈簧壓抵連接件、及至少一施配頭。該至少一施配頭可包括一基體、耦合至該基體之一晶粒、及形成在該基體之一第一側上的一電氣互連墊佈局配置。此電氣互連墊佈局配置可包括第一列互連墊,其包括至少一互連墊。此第一列互連墊中之各互連墊可電氣耦合至第一組通孔中之一者。該電氣互連墊佈局配置亦可包括第二列互連墊,其包含至少一互連墊。此第二列互連墊中之各互連墊可電氣耦合至第二組通孔中之一者。電氣耦合至第二列互連墊之第二組通孔係相對於第一列及第二列中之互連墊之一對準線而偏置。The example described herein further provides a system for injecting fluid into a test sample. The system may include a printed circuit assembly (PCA). The PCA may include at least one spring pressing connection member and at least one dispensing head. The at least one dispensing head may include a substrate, a die coupled to the substrate, and an electrical interconnection pad layout formed on a first side of the substrate. The electrical interconnection pad layout configuration may include a first column of interconnection pads including at least one interconnection pad. Each interconnect pad in the first row of interconnect pads may be electrically coupled to one of the first set of vias. The electrical interconnection pad layout configuration may also include a second row of interconnection pads including at least one interconnection pad. Each interconnect pad in this second row of interconnect pads may be electrically coupled to one of the second set of vias. The second set of vias electrically coupled to the second row of interconnect pads are offset relative to an alignment of one of the interconnect pads in the first and second rows.

於本文之範例中,第二列互連墊中之該等互連墊中的至少一者可包括一發射互連墊。並且,於一範例中,第一列互連墊中之該等互連墊中的至少一者可包括界定於其中的一接觸座。此接觸座允許彈簧壓抵連接件中之至少一者,在至少一施配頭與PCA介接時,座設於其中。In the examples herein, at least one of the interconnect pads in the second row of interconnect pads may include a launch interconnect pad. And, in an example, at least one of the interconnection pads in the first row of interconnection pads may include a contact seat defined therein. The contact seat allows the spring to be pressed against at least one of the connecting members, and the seat is disposed in the at least one dispensing head when it is interfaced with the PCA.

在本文之範例中,第一列互連墊可包括至少一接地互連墊、一電源電壓互連墊、及一熱感測電阻器(TSR)互連墊。並且,於一範例中,第二列互連墊可包括至少一發射互連墊、一時鐘互連墊、及一資料互連墊。藉由使至少一彈簧壓抵連接件滑動經過第二列互連墊及將該至少一彈簧壓抵連接件電氣耦合至第一列互連墊中之至少一互連墊,來將PCA與至少一施配頭之電氣互連墊佈局配置介接。藉由使該至少一彈簧壓抵連接器在與由電氣互連墊佈局配置形成之一平面垂直的方向上,垂降到第一或第二列互連墊中之至少一互連墊上,來將PCA與該至少一施配頭之電氣互連墊佈局配置介接。In the example herein, the first row of interconnect pads may include at least one ground interconnect pad, a power supply voltage interconnect pad, and a thermal sensing resistor (TSR) interconnect pad. Moreover, in an example, the second row of interconnect pads may include at least one transmit interconnect pad, a clock interconnect pad, and a data interconnect pad. The PCA is connected to at least one of the at least one spring pad by sliding the at least one spring press connector through the second row of interconnect pads and electrically coupling the at least one spring press connector to the at least one interconnect pad in the first row of interconnect pads. The electrical interconnection pad layout configuration interface of a distribution head. By pressing the at least one spring against the connector in a direction perpendicular to a plane formed by the electrical interconnection pad layout configuration, the connector is dropped onto at least one interconnection pad in the first or second row of interconnection pads. The PCA and the electrical interconnection pad layout configuration of the at least one dispensing head are interfaced.

本文所述之範例更提供形成一卡匣之方法。此方法可包括形成一單石式基體。一電氣互連墊佈局配置可被形成在該單石式基體之一第一側上。此電氣互連墊佈局配置可藉由形成第一列互連墊來形成(方塊1302),此第一列互連墊包括至少一互連墊,其中第一列互連墊中的各互連墊係電氣耦合至第一組通孔中之一者。並且,電氣互連墊佈局配置係藉由形成第二列互連墊來形成,此第二列互連墊包括至少一互連墊,其中第二列互連墊中的各互連墊係電氣耦合至第二組通孔中之一者。再者,電氣互連墊佈局配置係藉由使第二列互連墊相對於第一及第二列中之該等互連墊的一對準線偏置來形成。The example described herein further provides a method for forming a cassette. The method may include forming a monolithic matrix. An electrical interconnect pad layout configuration may be formed on a first side of the monolithic substrate. The electrical interconnect pad layout configuration may be formed by forming a first row of interconnect pads (block 1302). The first row of interconnect pads includes at least one interconnect pad, wherein each interconnect in the first row of interconnect pads The pad is electrically coupled to one of the first set of through holes. Moreover, the electrical interconnection pad layout configuration is formed by forming a second column of interconnection pads, the second column of interconnection pads including at least one interconnection pad, wherein each of the interconnection pads in the second column of interconnection pads is electrically Coupling to one of the second set of vias. Furthermore, the electrical interconnection pad layout configuration is formed by offsetting an alignment line of the interconnection pads in the second column with respect to the interconnection pads in the first and second columns.

在本文之範例中,此方法更可包括將至少一接觸座形成到第一列互連墊中之至少一互連墊上。並且,此方法更可包括在單石式基體之一第二側上界定數條電氣跡線,其將一晶粒電氣耦合至第一及第二組通孔。於一範例中,數條電氣跡線可利用一雷射直接建構(LDS)程序來界定。In the example herein, the method may further include forming at least one contact pad on at least one interconnection pad in the first row of interconnection pads. Furthermore, the method may further include defining a plurality of electrical traces on a second side of the monolithic substrate, which electrically couples a die to the first and second sets of through holes. In one example, several electrical traces can be defined using a laser direct construction (LDS) procedure.

在本案說明書及後附申請專利範圍中使用時,「數個」或類似用語係廣義理解為任何包括1至無限大的正數;零不是一個數量,而是沒有數量。When used in the specification of the present case and the scope of the attached patent application, "several" or similar terms are broadly understood as any positive number including 1 to infinity; zero is not a quantity, but no quantity.

於以下敘述中,為了解釋目的,數個特定細節係發佈來提供本案系統及方法的一徹底了解。然而,對於熟於此技者而言將會明顯的是,本案裝置、系統及方法可在沒有這些特定細部的情況下而實施。說明書中有關「一範例」或類似用語表示配合該範例敘述的一特定特徵、結構或特性係如所述地被包括,但不一定包括在其他範例中。In the following description, for the purpose of explanation, several specific details are released to provide a thorough understanding of the system and method of this case. However, it will be apparent to those skilled in the art that the devices, systems, and methods of the present case can be implemented without these specific details. The term "an example" or similar in the specification indicates that a particular feature, structure, or characteristic described in conjunction with the example is included as described, but is not necessarily included in other examples.

現參照圖式,圖1係為根據本案所述原理之一範例之第一容積卡匣(100)的前立體圖。再者,圖2係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)的後立體圖。此第一容積卡匣(100)可包括一基體(101)。在一範例中,基體(101)可由一熱塑性材料製成。一儲槽(102)具有一流體孔(103)界定於該儲槽(102)中。流體孔(103)允許一檢定流體自該基體(101)之一側移動至另一側。此基體(101)可包括一握把(150),以允許使用者在不會汙染儲槽(102)或置於其中之檢定流體的情況下觸碰、拾取及移動卡匣(100)。Referring now to the drawings, FIG. 1 is a front perspective view of a first volume cassette (100) according to an example of the principles described herein. Furthermore, FIG. 2 is a rear perspective view of the first volume cassette (100) of FIG. 1 according to an example of the principles described in this case. The first volume cassette (100) may include a base body (101). In one example, the substrate (101) may be made of a thermoplastic material. A storage tank (102) has a fluid hole (103) defined in the storage tank (102). The fluid hole (103) allows a test fluid to move from one side of the substrate (101) to the other. The base (101) may include a grip (150) to allow a user to touch, pick up, and move the cassette (100) without contaminating the reservoir (102) or the calibration fluid placed therein.

一晶粒(104)可在儲槽(102)之一相對立側被耦合至基體(101)且與流體孔(103)在同一直線上。於一範例中,晶粒(104)可為例如一微機電系統(MEMs)。在另一範例中,該晶粒可為一流體噴射裝置。A die (104) may be coupled to the substrate (101) on the opposite side of one of the storage tanks (102) and on the same line as the fluid hole (103). In one example, the die (104) may be, for example, a micro-electromechanical system (MEMs). In another example, the die may be a fluid ejection device.

儲槽(102)係透過流體孔(103)流體耦合至晶粒(104),致使檢定流體可被引入晶粒(104),以允許晶粒(104)在由一檢定流體施配系統指示時,將檢定流體噴射到井孔板之數個井孔中。The reservoir (102) is fluidly coupled to the die (104) through the fluid hole (103), so that a verification fluid can be introduced into the die (104), allowing the die (104) to be directed by a verification fluid dispensing system , Spray the verification fluid into several wells of the well plate.

數個電氣構件係包括在基體(101)之前及背表面。此等電氣構件可由任何導電材料製成,以允許電氣信號在檢定流體施配系統與晶粒(104)之間傳送。例如,數個接觸墊(105-1、105-2、105-3、105-4、105-5、105-6、105-7、105-8、105-9、105-10,在此合稱為105)可被包括在基體(101)之前表面上。該等接觸墊(105)在檢定流體施配系統與卡匣(100)之間提供一電氣傳導介面。Several electrical components are included before and after the base body (101). These electrical components may be made of any conductive material to allow electrical signals to be transmitted between the calibration fluid dispensing system and the die (104). For example, several contact pads (105-1, 105-2, 105-3, 105-4, 105-5, 105-6, 105-7, 105-8, 105-9, 105-10, are combined here Designated 105) may be included on the front surface of the substrate (101). The contact pads (105) provide an electrically conductive interface between the verification fluid dispensing system and the cassette (100).

數個通孔(106-1、106-2、106-3、106-4、106-5、106-6、106-7、106-8、106-9、106-10,在此合稱為106)可被形成在基體(101)中且電氣耦合至接觸墊(105)。此等通孔(106)可為穿經基體(101)且將連接墊(105)耦合至基體(101)之相對立側上之數個電氣構件的任何電氣連接體。Several through holes (106-1, 106-2, 106-3, 106-4, 106-5, 106-6, 106-7, 106-8, 106-9, 106-10, collectively referred to herein as 106) may be formed in the base body (101) and electrically coupled to the contact pad (105). These through holes (106) can be any electrical connector that passes through the substrate (101) and couples the connection pad (105) to several electrical components on opposite sides of the substrate (101).

如圖2中所繪示,通孔(106)係在基體(101)之相對立側上耦接至數條跡線(107-1、107-2、107-3、107-4、107-5、107-6、107-7、107-8、107-9、107-10,在此合稱為107)。此等跡線(107)可利用耦接於晶粒(104)之數個晶粒墊(109)之間的數個線接合體(108)而耦合至晶粒(104)。雖然圖式中繪示一個線接合體(108)耦接於一跡線(107)與一晶粒墊(109)之間,但任何數目的線接合體(108)可被用來將晶粒(104)電氣耦合至一檢定流體施配系統,允許用以控制晶粒(104)的控制信號自檢定流體施配系統、通過接觸墊(105)、通孔(106)、跡線(107)及線接合體(108),而行經至晶粒(104)之晶粒墊(109)。As shown in FIG. 2, the through hole (106) is coupled to several traces (107-1, 107-2, 107-3, 107-4, 107-) on the opposite vertical side of the base body (101). 5, 107-6, 107-7, 107-8, 107-9, 107-10, collectively referred to herein as 107). These traces (107) may be coupled to the die (104) using a number of wire bonds (108) coupled between the die pads (109) of the die (104). Although the figure shows a wire bond (108) coupled between a trace (107) and a die pad (109), any number of wire bonds (108) can be used to place the die (104) Electrically coupled to a test fluid dispensing system, allowing control signals to control the die (104) from the test fluid dispensing system, through contact pads (105), through holes (106), traces (107) And the wire bonding body (108), and the grain pad (109) is passed to the grain (104).

圖3係為根據本案所述原理之一範例之第二容積卡匣(200)的前立體圖。再者,圖4係為根據本案所述原理之一範例之圖3之第二容積卡匣(200)的後立體圖。除可被引入儲槽(102)中之流體容積以外,第二容積卡匣(200)包括與第一容積卡匣(100)相同的元件。圖1及圖2之範例中的儲槽(102)較圖3及圖4之範例中的儲槽(102)相對小。於一範例中,圖1及圖2之儲槽(102)可被定製成含有大略20微升的流體,而圖3及圖4之儲槽(102)可被定製成含有大於20微升的一流體容積。FIG. 3 is a front perspective view of a second volume cassette (200) according to an example of the principles described in this case. Furthermore, FIG. 4 is a rear perspective view of the second volume cassette (200) of FIG. 3 according to an example of the principles described in this case. The second volume cassette (200) includes the same elements as the first volume cassette (100), except for the fluid volume that can be introduced into the reservoir (102). The storage tank (102) in the example of FIG. 1 and FIG. 2 is relatively smaller than the storage tank (102) in the example of FIG. 3 and FIG. In one example, the storage tank (102) of FIGS. 1 and 2 can be customized to contain approximately 20 microliters of fluid, and the storage tank (102) of FIGS. 3 and 4 can be customized to contain more than 20 microliters. Litre of a fluid volume.

在一範例中,第一容積卡匣(100)及第二容積卡匣(200)之範例的電氣構件,包括接觸墊(105)、通孔(106)、跡線(107)與線接合體(108),可利用一雷射直接建構(LDS)程序形成。一LDS程序使用一熱塑性材料,其摻雜有透過雷射活化的一非傳導、金屬、無機化合物。於此範例中,基體(101)可經由注射成型來形成。一雷射可接著劃出待形成在熱塑性材料上之數個電氣構件的路線。在基體(101)暴露於雷射提供之電磁輻射的情況下,金屬添加物形成一微堅硬軌道。此軌道的金屬粒子形成一後續金屬化程序用之核心。此經雷射暴露的基體(101)可被置於一電鍍銅浴中,且電氣構件之各種傳導體路徑層出現在基體(101)暴露於雷射之電磁輻射的那些部分處。任何數目的金屬連續層,諸如銅、鎳及金,可被積設在基體(101)暴露於雷射之電磁輻射的部分上。LDS程序允許電氣構件在基體(101)之表面上的精確、電腦輔助形成。In one example, the electrical components of the example of the first volume cassette (100) and the second volume cassette (200) include a contact pad (105), a through hole (106), a trace (107), and a wire joint. (108), which can be formed using a laser direct construction (LDS) program. An LDS procedure uses a thermoplastic material that is doped with a non-conductive, metallic, inorganic compound activated by laser. In this example, the substrate (101) can be formed by injection molding. A laser can then delineate several electrical components to be formed on the thermoplastic. In the case where the substrate (101) is exposed to the electromagnetic radiation provided by the laser, the metal additive forms a micro-hard track. The metal particles in this orbit form the core for a subsequent metallization process. The laser-exposed substrate (101) can be placed in an electroplated copper bath, and various conductor path layers of electrical components appear at those portions of the substrate (101) that are exposed to the electromagnetic radiation of the laser. Any number of continuous layers of metal, such as copper, nickel, and gold, can be deposited on the portion of the substrate (101) exposed to the electromagnetic radiation of the laser. The LDS program allows precise, computer-aided formation of electrical components on the surface of the substrate (101).

在另一範例中,第一容積卡匣(100)及第二容積卡匣(200)之範例的電氣構件,包括接觸墊(105)、通孔(106)、跡線(107)與線接合體(108),可利用一積設程序來形成,其中一傳導材料係積設在基體(101)上。於此範例中,傳導材料可利用例如一個三維(3D)列印裝置來積設。In another example, the electrical components of the example of the first volume cassette (100) and the second volume cassette (200) include contact pads (105), through holes (106), traces (107), and wires. The body (108) can be formed by an assembly process, wherein a conductive material is deposited on the base body (101). In this example, the conductive material can be built using, for example, a three-dimensional (3D) printing device.

現參照圖1至圖4中第一容積卡匣(100)與第二容積卡匣(200)的範例,接觸墊(105)可採兩列(115、116)被置放在基體(101)之前表面上,其中第一組接觸墊(105-1、105-2、105-3、105-4、105-5)包括在第一列(115)中,而第二組接觸墊(105-6、105-7、105-8、105-9、105-10)包括在第二列(116)中。接觸墊(105)的此種配置讓卡匣在尺寸上能更小,同時仍可提供大量的介面。Referring to the examples of the first volume cassette (100) and the second volume cassette (200) in FIGS. 1 to 4, the contact pad (105) can be placed in the base (101) in two rows (115, 116). On the previous surface, the first set of contact pads (105-1, 105-2, 105-3, 105-4, 105-5) were included in the first column (115), and the second set of contact pads (105- 6, 105-7, 105-8, 105-9, 105-10) are included in the second column (116). This configuration of the contact pad (105) allows the cassette to be smaller in size while still providing a large number of interfaces.

圖1至圖4之通孔(106)可被配置成耦合至第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5) 的通孔(106-1、106-2、106-3、106-4、106-5)係設在它們個別接觸墊(105-1、105-2、105-3、105-4、105-5)之一側上,此等接觸墊距包括在第二列(116)中之接觸墊(105-6、105-7、105-8、105-9、105-10)最遠,而耦合至第二列(116)之接觸墊(105-6、105-7、105-8、105-9、105-10)的通孔(106-6、106-7、106-8、106-9、106-10)係設在它們個別接觸墊(105-6、105-7、105-8、105-9、105-10)之一側上,此等接觸墊距包括在第一列(115)中之接觸墊(105-1、105-2、105-3、105-4、105-5)最遠。The through holes (106) of FIGS. 1 to 4 may be configured to be coupled to the through holes of the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first row (115). (106-1, 106-2, 106-3, 106-4, 106-5) are provided in their individual contact pads (105-1, 105-2, 105-3, 105-4, 105-5) On one side, these contact pads are furthest from the contact pads (105-6, 105-7, 105-8, 105-9, 105-10) included in the second row (116), and are coupled to the second Through holes (106-6, 106-7, 106-8, 106-9, 106-) of the contact pads (105-6, 105-7, 105-8, 105-9, 105-10) in row (116) 10) It is arranged on one side of their individual contact pads (105-6, 105-7, 105-8, 105-9, 105-10). The contact pad distance is included in the first row (115). The contact pads (105-1, 105-2, 105-3, 105-4, 105-5) are the farthest.

再者,通孔(106-1、106-2、106-3、106-4、106-5)係利用一個別偏置跡線(110-1、110-2、110-3、110-4、110-5,合稱為110)耦合至第一列(115)的接觸墊(105-1、105-2、105-3、105-4、105-5)。圖1至圖4的偏置跡線(110)使第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5)的通孔(106-1、106-2、106-3、106-4、106-5)相對於第二列(116)之接觸墊(105-6、105-7、105-8、105-9、105-10)的通孔(106-6、106-7、106-8、106-9、106-10)側向偏置。此偏置佈局配置係繪製於圖5至圖8中。圖5係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)的前平面圖。並且,圖6係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)從圖5之圓圈A觀視的前平面圖。再者,圖7係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)的後平面圖。又,圖8係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)從圖7之圓圈B觀視的後平面圖。即便第一容積卡匣(100)係用來描述通孔(106)之偏置佈局配置,第二容積卡匣(200)及其電氣構件佈局配置亦可以相同方式描述。為易於了解橫列(115、116)中之通孔(106)的偏置佈局配置,部分參考編號已被省略。然而,讀者可透過參照其他圖式,包括圖1至圖4,輕易識別卡匣(100、200)內的各種元件。Furthermore, the through-holes (106-1, 106-2, 106-3, 106-4, 106-5) use a different offset trace (110-1, 110-2, 110-3, 110-4 , 110-5, collectively referred to as 110) are coupled to the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first column (115). The offset traces (110) of FIGS. 1 to 4 make the through-holes (106-) of the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first column (115) 1.106-2, 106-3, 106-4, 106-5) contact pads (105-6, 105-7, 105-8, 105-9, 105-10) in the second row (116) The through holes (106-6, 106-7, 106-8, 106-9, 106-10) are laterally offset. This offset layout configuration is drawn in Figures 5-8. FIG. 5 is a front plan view of the first volume cassette (100) of FIG. 1 according to an example of the principles described in this case. 6 is a front plan view of the first volume cassette (100) of FIG. 1 viewed from circle A in FIG. 5 according to an example of the principles described in this case. Furthermore, FIG. 7 is a rear plan view of the first volume cassette (100) of FIG. 1 according to an example of the principles described in this case. 8 is a rear plan view of the first volume cassette (100) of FIG. 1 viewed from circle B in FIG. 7 according to an example of the principles described in this case. Even if the first volume cassette (100) is used to describe the offset layout configuration of the through hole (106), the second volume cassette (200) and its electrical component layout configuration can also be described in the same way. In order to easily understand the offset layout configuration of the through holes (106) in the rows (115, 116), some reference numbers have been omitted. However, the reader can easily identify various components in the cassette (100, 200) by referring to other drawings, including FIGS. 1 to 4.

如圖5及圖6中所繪示,通孔(106-1、106-2、106-3、106-4、106-5)係利用個別偏置跡線(110-1、110-2、110-3、110-4、110-5,合稱為110)來耦合至第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5)。圖1至圖4之偏置跡線(110)使第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5)的通孔(106-1、106-2、106-3、106-4、106-5)相對於第二列(116)之接觸墊(105-6、105-7、105-8、105-9、105-10)的通孔(106-6、106-7、106-8、106-9、106-10)側向偏置。如圖6及圖5之圓圈A中所繪示,偏置跡線(110)係相對於接觸墊(105)與第二列(116)之通孔(106-6、106-7、106-8、106-9、106-10)的對準線呈一角度,此對準線如同線117所指。因此,此偏置可由與線117相距的距離D界定。更多關於距離D及其作用係於此描述。As shown in Figures 5 and 6, the through-holes (106-1, 106-2, 106-3, 106-4, 106-5) use individual offset traces (110-1, 110-2, 110-3, 110-4, 110-5 (collectively referred to as 110) to be coupled to the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first row (115) . The offset traces (110) of Figs. 1 to 4 make the through-holes (106-) of the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first column (115) 1.106-2, 106-3, 106-4, 106-5) contact pads (105-6, 105-7, 105-8, 105-9, 105-10) in the second row (116) The through holes (106-6, 106-7, 106-8, 106-9, 106-10) are laterally offset. As shown in circle A in Figs. 6 and 5, the offset trace (110) is relative to the contact pads (105) and the through holes (106-6, 106-7, 106-) of the second column (116). 8, 106-9, 106-10) are at an angle, and this alignment line is indicated by line 117. Therefore, this offset can be defined by the distance D from the line 117. More about distance D and its effects are described here.

再者,參照圖1至圖8,且特別是圖7及圖8,由於通孔(106-1、106-2、106-3、106-4、106-5)利用它們的個別偏置跡線(110)耦合至第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5),因此一類似偏置佈局配置係在基體(100)之一相對立側上反映於跡線(107)之佈局配置中。第一列(125)之通孔(106-1、106-2、106-3、106-4、106-5)中的各通孔(106)係相對於第二列(126)之通孔(106-6、106-7、106-8、106-9、106-10)中的各通孔(106)呈偏置。此外,由於通孔(106)的偏置,它們個別的跡線(107)亦呈偏置。依此方式,接觸墊(105)、通孔(106)與跡線(107)之佈局配置允許在基體(101)上有供全部這些裝置用的空間。Furthermore, referring to FIGS. 1 to 8, and particularly FIGS. 7 and 8, since the through holes (106-1, 106-2, 106-3, 106-4, 106-5) use their individual offset traces Line (110) is coupled to the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first column (115), so a similar offset layout configuration is on the base (100) One of them is reflected in the layout of the trace (107) on the opposite side. Each through hole (106) in the through hole (106-1, 106-2, 106-3, 106-4, 106-5) of the first row (125) is relative to the through hole of the second row (126) (106-6, 106-7, 106-8, 106-9, 106-10) each through hole (106) is offset. In addition, due to the offset of the vias (106), their individual traces (107) are also offset. In this way, the layout of the contact pads (105), through holes (106), and traces (107) allows space on the substrate (101) for all of these devices.

圖9係為根據本案所述原理之一範例之圖1之第一容積卡匣(100)與一檢定流體施配器驅動器(900)之一卡匣介面(901)之一印刷電路總成(PCA)(903)介接的立體圖。雖然第一容積卡匣(100)係繪示在圖9中,但圖3及圖4之卡匣(200)亦可以類似方式作動及運用。於一範例中,可藉由將卡匣(100、200)於箭頭方向(904)上沿著檢定流體施配器驅動器(900)的數個對準表面或對齊件插入,使卡匣(100、200)與PCA (903)、卡匣介面(902)及檢定流體施配器驅動器(900)介接。在另一範例中,PCA (903)及/或卡匣(100、200)可在箭頭(914)所指之方向上移動,以使卡匣(100、200)與PCA (903)介接。於此範例中,卡匣(100、200)可被置於檢定流體施配器驅動器(900)之一站台位置,而檢定流體施配器驅動器(900)於箭頭(914)之方向將PCA (903)移動到卡匣(100、200)上,直到PCA (903)與卡匣(100、200)之接觸墊(105)之間達成接觸為止。於又一範例中,於箭頭方向(904)沿檢定流體施配器驅動器(900)之數個對準表面插入卡匣(100、200)與於箭頭(914)所指方向上PCA (903)及/或卡匣(100、200)之移動的組合,可被用來將卡匣(100、200)與PCA (903)介接。FIG. 9 is a printed circuit assembly (PCA) of a first volume cassette (100) of FIG. 1 and a cassette interface (901) of a verification fluid dispenser driver (900) according to an example of the principles described in this case. ) (903) Interfacing perspective view. Although the first volume cassette (100) is shown in FIG. 9, the cassette (200) of FIGS. 3 and 4 can also be operated and used in a similar manner. In one example, the cassette (100, 200) can be inserted by inserting the cassette (100, 200) in the direction of the arrow (904) along several alignment surfaces or alignment members of the calibration fluid dispenser driver (900). 200) Interfaces with PCA (903), cassette interface (902), and calibration fluid dispenser driver (900). In another example, the PCA (903) and / or the cassette (100, 200) can be moved in the direction indicated by the arrow (914) to interface the cassette (100, 200) with the PCA (903). In this example, the cassette (100, 200) can be placed on one of the platforms of the calibration fluid dispenser driver (900), and the calibration fluid dispenser driver (900) places the PCA (903) in the direction of the arrow (914). Move to the cassette (100, 200) until the PCA (903) and the contact pads (105) of the cassette (100, 200) reach contact. In yet another example, insert the cassette (100, 200) along the several alignment surfaces of the verification fluid dispenser driver (900) in the direction of the arrow (904) and the PCA (903) and the direction of the arrow (914). A combination of the cassettes (100, 200) can be used to interface the cassettes (100, 200) with the PCA (903).

PCA (903)可包括數個彈簧壓抵連接件(905),其將形成在卡匣(100、200)上之接觸墊(105)電器耦合至PCA (903)。此等彈簧壓抵連接件(905)可為用於電子組件的任何裝置,以在形成於卡匣(100、200)上之接觸墊(105)與PCA (903)之間建立一連接,且可包括兩個巢套式彈簧負載銷。於一範例中,PCA (903)可包括與形成於卡匣(100、200)上之接觸墊(105)相等數量的彈簧壓抵連接件(905)。在另一範例中,PCA (903)可包括比形成於卡匣(100、200)上之接觸墊(105)更多或更少的彈簧壓抵連接件(905)。在這些範例中,彈簧壓抵連接件(905)可被配置在PCA (903)上,使得它們在卡匣(100、200)與PCA (903)介接時與接觸墊(105)對準。The PCA (903) may include several spring-loaded connectors (905), which electrically couple the contact pads (105) formed on the cassettes (100, 200) to the PCA (903). These spring pressing connection members (905) can be any device for electronic components to establish a connection between the contact pads (105) formed on the cassettes (100, 200) and the PCA (903), and Can include two nested spring loaded pins. In one example, the PCA (903) may include an equal number of spring-pressed connectors (905) as the contact pads (105) formed on the cassette (100, 200). In another example, the PCA (903) may include more or less spring-pressed connectors (905) than contact pads (105) formed on the cassette (100, 200). In these examples, the spring-loaded connectors (905) may be configured on the PCA (903) such that they are aligned with the contact pads (105) when the cassettes (100, 200) interface with the PCA (903).

在一範例中,數個掣子或接觸座(圖1、圖3、圖5、圖6及圖9,111)可被界定在接觸墊(105)之一表面中。這些掣子(111)在卡匣(100、200)與PCA (903)介接時與彈簧壓抵連接件(905)介接。一旦彈簧壓抵連接件(905)進入掣子(111),卡匣(100、200)即可移除地耦合至PCA (903)。卡匣(100、200)的移除可藉由克服由彈簧負載式彈簧壓抵連接件(905)施加在卡匣(100、200)上之壓力來執行,使彈簧壓抵連接件(905)收縮並將彈簧壓抵連接件(905)移出掣子(111)。In an example, a plurality of detents or contact seats (FIGS. 1, 3, 5, 6, and 9, 111) may be defined in one surface of the contact pad (105). These detents (111) are interfaced with the spring pressing connection (905) when the cassette (100, 200) is interfaced with the PCA (903). Once the spring is pressed against the connector (905) into the detent (111), the cassette (100, 200) is removably coupled to the PCA (903). Removal of the cassette (100, 200) can be performed by overcoming the pressure exerted on the cassette (100, 200) by the spring-loaded spring-loaded connection (905), so that the spring is pressed against the connection (905) Retract and press the spring against the connector (905) out of the detent (111).

再次轉向圖5及圖6,配合圖9,於藉由將卡匣(100、200)在箭頭方向(904)上沿檢定流體施配器驅動器(900)之數個對準表面插入而將卡匣(100、200)與PCA (903)介接的一範例中,彈簧壓抵連接件(905)被拉曳經過基體(101)之頂部且經過接觸墊(105)。此至少部分係由於彈簧壓抵連接件(905)之彈簧偏壓而造成。在卡匣(100、200)與PCA (903)係插入一耦合配置之際,由被拉曳經過基體(101)之頂部的彈簧壓抵連接件(905)所施加的摩擦力可能破壞形成在卡匣(100、200)上的電氣連接。彈簧壓抵連接件(905)的拉曳路徑係由圖6之線(117)所識別。拉曳彈簧壓抵連接件(905)經過諸如通孔(106)及跡線(107)的電氣元件,可能因彈簧壓抵連接件(905)之摩擦所造成的任何損壞而危害這些元件的電氣連接整體性。因此,形成在卡匣(100、200)上且電氣耦合至第一列(115)上之接觸墊(105-1、105-2、105-3、105-4、105-5)的偏置跡線(110),消除了彈簧壓抵連接件(905)破壞(例如)改為設置成與線(117)對齊成一列之通孔(106-1、106-2、106-3、106-4、106-5)的可能性。假設例如通孔(106)與線(117)對齊成一列形成,則彈簧壓抵連接件(905)會在卡匣(100、200)插入期間被拉曳經過那些通孔(106-1、106-2、106-3、106-4、106-5),且此種造成摩擦力的移動可能破壞通孔(106-1、106-2、106-3、106-4、106-5)。依此方式,偏置跡線(110)消除了彈簧壓抵連接件(905)可能破壞通孔(106-1、106-2、106-3、106-4、106-5)的可能性。Turning again to FIGS. 5 and 6, and in conjunction with FIG. 9, the cassette is inserted by inserting the cassette (100, 200) in the direction of the arrow (904) along several alignment surfaces of the verification fluid dispenser driver (900) In an example of the interface between (100, 200) and PCA (903), the spring pressing connector (905) is pulled through the top of the base body (101) and through the contact pad (105). This is caused, at least in part, by the spring bias of the spring against the connector (905). When the cassettes (100, 200) and the PCA (903) are inserted into a coupled configuration, the frictional force exerted by the spring pressed against the connecting member (905) pulled through the top of the base body (101) may damage the Electrical connection on the cassette (100, 200). The drawing path of the spring pressing connector (905) is identified by the line (117) of FIG. The pull spring presses the connector (905) through the electrical components such as the through hole (106) and the trace (107). Any damage caused by the friction of the spring press the connector (905) may endanger the electrical of these components. Connectivity. Therefore, the bias formed on the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) on the cassette (100, 200) and electrically coupled to the first row (115) The trace (110) eliminates the destruction of the spring pressing connector (905) (for example) through holes (106-1, 106-2, 106-3, 106-) arranged to align with the line (117) in a row 4, 106-5). Assuming, for example, that the through-holes (106) are aligned with the line (117) in a row, the spring-pressed connection (905) will be pulled through those through-holes (106-1, 106) during the insertion of the cassette (100, 200). -2, 106-3, 106-4, 106-5), and such frictional movement may damage the through holes (106-1, 106-2, 106-3, 106-4, 106-5). In this way, the offset trace (110) eliminates the possibility that the spring pressing against the connection (905) may damage the through-holes (106-1, 106-2, 106-3, 106-4, 106-5).

再者,偏置跡線(110)從第一列(115)之接觸墊(105-1、105-2、105-3、105-4、105-5)對角延伸至通孔(106-1、106-2、106-3、106-4、106-5),使得該等偏置跡線皆未與彈簧壓抵連接件(905)順沿行經之線(117)對齊成一列。依此方式,偏置跡線(110)的對角佈局配置消除對細的偏置跡線(110)之破壞。Furthermore, the offset trace (110) extends diagonally from the contact pads (105-1, 105-2, 105-3, 105-4, 105-5) of the first column (115) to the through holes (106- (1, 106-2, 106-3, 106-4, 106-5), so that none of the offset traces are aligned with the spring pressing connection (905) along the line (117) passing by. In this manner, the diagonal layout configuration of the offset trace (110) eliminates damage to the fine offset trace (110).

如圖式之中所繪製,耦合至接觸墊(105-6、105-7、105-8、105-9、105-10)之第二列(116)的通孔(106-6、106-7、106-8、106-9、106-10)係位在超過接觸墊(105-6、105-7、105-8、105-9、105-10)的一位置、及位在卡匣(100、200)於檢定流體施配器驅動器(900)內行經之一距離處。在此位置,由於通孔(106-6、106-7、106-8、106-9、106-10)係超過彈簧壓抵連接件(905)沿卡匣(100、200)之表面的行經距離所及之處,因此該等通孔將永不受到彈簧壓抵連接件(905)的摩擦接觸。As shown in the figure, the through holes (106-6, 106-) coupled to the second row (116) of the contact pads (105-6, 105-7, 105-8, 105-9, 105-10) 7, 106-8, 106-9, 106-10) are in a position beyond the contact pads (105-6, 105-7, 105-8, 105-9, 105-10), and in the cassette (100, 200) travel a distance within the verification fluid dispenser driver (900). In this position, since the through-holes (106-6, 106-7, 106-8, 106-9, 106-10) pass through the surface of the cassette (100, 200) beyond the spring pressing connection member (905), As far as the distance is concerned, the through-holes will never be subjected to frictional contact of the spring against the connecting piece (905).

再者,各接觸墊(105)可由例如檢定流體施配器驅動器(900)或一些其他控制器予以邏輯上指定,使得各接觸墊(105)係透過接觸墊(105)、通孔(106)、跡線(107)及線接合體(108)耦合至晶粒(104)之數個晶粒墊(109)中的個別者。例如,接觸墊指定內容可包括以下所列者: 表1:接觸墊指定內容 以上接觸墊指定內容係為一範例,且可作成其他接觸墊指定。為避免或消除對檢定流體施配器驅動器(900)之電氣構件的破壞,PCA (903)、卡匣(100、200)、晶粒(104)、任何其他電氣或電子構件、或其組合,接觸墊指定方式係安排來確保一高電壓彈簧壓抵連接件(905)不會被拉曳經過第一列(115)中之接觸墊(105-1、105-2、105-3、105-4、105-5)之任一者。例如,發射接觸墊(105-4)係設在第一列(115)上。在此位置,發射接觸墊(105-4)之高電壓係在卡匣(100、200)與PCA (903)之彈簧壓抵連接件(905)間作最後一次接觸或數個最後接觸之一時,才耦合至卡匣(100、200)。因此,接觸墊(105)之接觸順序及指定內容係被管理成在PCA(903)之操作或供電之前、期間或之後,不會對卡匣(100、200)、檢定流體施配器驅動器(900)、PCA (903)、晶粒(104)之任何電氣構件、任何其他電氣或電子構件或其組合產生破壞。接觸墊(105)依此方式的指定方式確保檢定程序在不危害檢定回合及其下反應的情況下執行,且提供一更為節約可靠的系統。Furthermore, each contact pad (105) may be logically designated by, for example, a verification fluid dispenser driver (900) or some other controller, so that each contact pad (105) is through the contact pad (105), through hole (106), The trace (107) and the wire bond (108) are coupled to individual ones of several die pads (109) of the die (104). For example, contact pad assignments can include the following: Table 1: Contact pad assignments The above contact pad designation is an example, and other contact pad designations can be made. To avoid or eliminate damage to the electrical components of the calibration fluid dispenser driver (900), the PCA (903), cassette (100, 200), die (104), any other electrical or electronic component, or a combination thereof, is in contact with The pad assignment method is arranged to ensure that a high-voltage spring against the connection member (905) is not pulled through the contact pads (105-1, 105-2, 105-3, 105-4) in the first row (115). , 105-5). For example, the launch contact pads (105-4) are provided on the first column (115). In this position, the high voltage of the emission contact pad (105-4) is when the last contact or one of the last contacts is made between the cassette (100, 200) and the spring-pressed connection (905) of the PCA (903). Before coupling to the cassette (100, 200). Therefore, the contact order and specified contents of the contact pad (105) are managed so that the cassette (100, 200), the verification fluid dispenser driver (900) are not performed before, during or after the operation or power supply of the PCA (903). ), PCA (903), any electrical component of die (104), any other electrical or electronic component, or a combination thereof. The contact pad (105) is specified in this manner to ensure that the verification procedure is performed without endangering the verification round and its subsequent reactions, and provides a more economical and reliable system.

圖10係為根據本案所述原理之一範例之包括多個施配頭總成(1001)之一卡匣(1000)的前平面圖。施配頭總成(1001)各可包括如上述的基體(101)、儲槽(102)、流體孔(103)、晶粒(104)、接觸墊(105)、通孔(106)、跡線(107)、線接合體(108)、晶粒墊(109)、偏置跡線(110)、掣子(111)及其他元件。在圖10中所示之範例中,施配頭總成(1001)係安裝到框架(1005)上。於一範例中,施配頭總成(1001)可透過例如焊接程序、化學接合程序、或藉由數個固定件而機械式耦合至框架(1005)。在一範例中,框架(1005)形成各施配頭總成(1001)之基體(101),使得施配頭總成(1001)之各者係形成到單一單石式框架(1005)中。FIG. 10 is a front plan view of a cassette (1000) including a plurality of dispensing head assemblies (1001) according to an example of the principles described in this case. The dispensing head assembly (1001) may each include a substrate (101), a storage tank (102), a fluid hole (103), a crystal grain (104), a contact pad (105), a through hole (106), and a trace as described above. Wires (107), wire bonds (108), die pads (109), offset traces (110), detents (111), and other components. In the example shown in FIG. 10, the dispensing head assembly (1001) is mounted to a frame (1005). In one example, the dispensing head assembly (1001) may be mechanically coupled to the frame (1005) through, for example, a welding process, a chemical bonding process, or by several fixtures. In one example, the frame (1005) forms the base body (101) of each of the dispensing head assemblies (1001), so that each of the dispensing head assemblies (1001) is formed into a single monolithic frame (1005).

圖11係為根據本案所述原理之一範例之用以射出流體到一檢定試料(1110)中之系統(1100)的方塊圖。此系統可包括一印刷電路總成(PCA)(903)。PCA (903)可包括至少一彈簧壓抵連接件(905)、及至少一施配頭(1001)。此至少一施配頭(1001)可包括一基體(101)、耦合至該基體(101)之一晶粒(104)、及形成在該基體(101)之第一側上之一電氣互連墊佈局配置(1101)。此電氣互連墊佈局配置(1101)可包括一第一列(116)之互連墊(105),其包括至少一互連墊(105)。第一列(116)之互連墊(105)中的各互連墊(105)可被電氣耦合至第一組(126)之通孔(106)中之一者。電氣互連墊佈局配置(1101)可包括一第二列(115)之互連墊(105),其包括至少一互連墊(105)。第二列(115)之互連墊(105)中的各互連墊(105)可被電氣耦合至第二組(125)之通孔(106)中之一者。電氣耦合至第二列(115)之互連墊的第二組(125)之通孔(106)係相對於第一及第二列(115、116)中之互連墊(105)的對準線而偏置。FIG. 11 is a block diagram of a system (1100) for ejecting fluid into a test sample (1110) according to an example of the principles described in this case. The system may include a printed circuit assembly (PCA) (903). The PCA (903) may include at least one spring pressing connection member (905), and at least one dispensing head (1001). The at least one dispensing head (1001) may include a base body (101), a die (104) coupled to the base body (101), and an electrical interconnection formed on a first side of the base body (101). Pad layout configuration (1101). The electrical interconnection pad layout configuration (1101) may include a first row (116) of interconnection pads (105) including at least one interconnection pad (105). Each of the interconnection pads (105) in the interconnection pads (105) of the first column (116) may be electrically coupled to one of the through holes (106) of the first group (126). The electrical interconnection pad layout configuration (1101) may include a second row (115) of interconnection pads (105) including at least one interconnection pad (105). Each interconnect pad (105) in the interconnect pad (105) of the second column (115) may be electrically coupled to one of the through holes (106) of the second group (125). The through holes (106) of the second group (125) electrically coupled to the interconnect pads of the second column (115) are opposite to the interconnect pads (105) of the first and second columns (115, 116) The alignment is offset.

在一範例中,第二列(115)之互連墊(105)中之該等互連墊(105)中的至少一者可包括一發射互連墊。並且,於一範例中,第一列(116)之互連墊(105)中之該等互連墊(105)中的至少一者可包括界定於其中的一接觸座(111)。此接觸座(111)允許在至少一施配頭(1001)與PCA (903)介接時供彈簧壓抵連接件(905)中之至少一者的座設。In an example, at least one of the interconnection pads (105) in the interconnection pads (105) of the second column (115) may include a launch interconnection pad. And, in an example, at least one of the interconnection pads (105) in the interconnection pads (105) of the first column (116) may include a contact seat (111) defined therein. The contact seat (111) allows a seat for the spring to press against at least one of the connecting members (905) when the at least one dispensing head (1001) is interfaced with the PCA (903).

於一範例中,第一列(116)之互連墊(105)可包括至少一接地互連墊、一電源電壓互連墊、及一熱感測電阻器(TSR)互連墊。此外,於一範例中,第二列(115)之互連墊(105)可包括至少一發射互連墊、一時鐘互連墊、及一資料互連墊。In one example, the interconnection pads (105) of the first column (116) may include at least one ground interconnection pad, a power supply voltage interconnection pad, and a thermal sensing resistor (TSR) interconnection pad. In addition, in one example, the interconnect pads (105) of the second column (115) may include at least one transmit interconnect pad, a clock interconnect pad, and a data interconnect pad.

藉由將至少一彈簧壓抵連接件(905)滑動經過第二列(115)之互連墊(105)及將該至少一彈簧壓抵連接件(905)電氣耦合至第一列(116)之互連墊(105)中之至少一互連墊(105),使PCA (903)與至少一施配頭(1001)之電氣互連墊佈局配置(1101)介接。藉由將至少一彈簧壓抵連接件(905)在與由電氣互連墊佈局配置(1101)形成之一平面垂直的方向上,垂降到第一或第二列(115、116)之互連墊(105)中之至少一互連墊(105)上,來使PCA (903)與至少一施配頭(1001)之電氣互連墊佈局配置(1101)介接。By sliding at least one spring pressing connection piece (905) through the interconnection pad (105) of the second row (115) and electrically coupling the at least one spring pressing connection piece (905) to the first row (116) At least one of the interconnection pads (105) of the interconnection pads (105) allows the PCA (903) to interface with the electrical interconnection pad layout configuration (1101) of the at least one dispensing head (1001). By pressing at least one spring against the connecting member (905) in a direction perpendicular to a plane formed by the electrical interconnection pad layout configuration (1101), it is dropped to the first or second column (115, 116). At least one of the interconnection pads (105) is connected to the PCA (903) and the electrical interconnection pad layout configuration (1101) of the at least one dispensing head (1001).

圖12係為根據本案所述原理之另一範例之用以射出流體到一檢定試料(1210)中之系統(1200)的方塊圖。此系統(1200)包括一檢定控制裝置(1205)、如上述之一卡匣(100、200)、及一檢定板(1210)。雖然圖11中所繪示者為第一容積卡匣(100),但具有框架(1005)之第二容積卡匣(200)或第一容積卡匣(100)與第二容積卡匣(200)之組合可被包括在系統(1200)中。FIG. 12 is a block diagram of a system (1200) for injecting fluid into a test sample (1210) according to another example of the principles described in this case. The system (1200) includes a verification control device (1205), a cassette (100, 200) as described above, and a verification board (1210). Although shown in FIG. 11 is the first volume cassette (100), the second volume cassette (200) or the first volume cassette (100) and the second volume cassette (200) have a frame (1005). A combination of) may be included in the system (1200).

卡匣(100、200)可包括至少上述之基體(101)、儲槽(102)、流體孔(103)、晶粒(104)、接觸墊(105)、通孔(106)、跡線(107)、線接合體(108)、晶粒墊(109)、偏置跡線(120)及其他元件。雖然圖12中所示之卡匣(100、200)包括或不包括本文所述之某些元件,但與卡匣(100、200)相關聯之元件各可或不會被包括於其中。為完成這些不同範例,卡匣(100、200)之實體特性可被改變。例如,在卡匣(100、200)不包含如前述之通孔(106)之情況下,跡線(107)及接觸墊(105)係可包括在卡匣(100、200)之單一側上,使得PCA (903)經由卡匣(100、200)之背側並非前側而接觸卡匣(100、200)。The cassette (100, 200) may include at least the above-mentioned substrate (101), storage tank (102), fluid hole (103), die (104), contact pad (105), through hole (106), and trace ( 107), wire bonds (108), die pads (109), offset traces (120), and other components. Although the cassette (100, 200) shown in FIG. 12 includes or excludes certain elements described herein, the elements associated with the cassette (100, 200) may or may not be included therein. To complete these different examples, the physical characteristics of the cassette (100, 200) can be changed. For example, in the case where the cassette (100, 200) does not include the through hole (106) as described above, the trace (107) and the contact pad (105) may be included on a single side of the cassette (100, 200) So that the PCA (903) contacts the cassette (100, 200) through the back side of the cassette (100, 200) instead of the front side.

檢定板(1210)可為接收自晶粒(104)射出之流體的任何板體。此檢定板(1210)可包括可供流體射入的數個井孔。檢定板(1210)更可包括使檢定控制裝置(1205)可與檢定板(1210)交互作用以將檢定板(1210)相對於卡匣(100、200)之晶粒(104)移動的一結構。檢定控制裝置(1205)可被用於任何資料處理情況,包括獨立式硬體、行動應用、透過一運算網路或其組合。並且,檢定控制裝置(1205)可被用於一運算網路、一公共雲端網路、一私人雲端網路、一混合式雲端網路、其他形式網路、或其組合。為達到檢定控制裝置(1205)之所欲功能性,該檢定控制裝置包含多種硬體構件。在這些硬體構件之中可為數個控制器(1215)、數個資料儲存裝置(1240)、數個周邊裝置適配器(1225)、及數個網路適配器(1230)。這些硬體構件可經由使用數個匯流排(1260)及/或網路連接來互連。在一範例中,控制器(1215)、資料儲存裝置(1240)、周邊裝置適配器(1225)、及網路適配器(1230)可經由一匯流排(1260)通訊式耦接。The verification plate (1210) may be any plate body that receives fluid ejected from the die (104). This verification plate (1210) may include several wells into which fluids can be injected. The verification plate (1210) may further include a structure that enables the verification control device (1205) to interact with the verification plate (1210) to move the verification plate (1210) relative to the die (104) of the cassette (100, 200). . The verification control device (1205) can be used in any data processing situation, including stand-alone hardware, mobile applications, via a computing network, or a combination thereof. Moreover, the verification control device (1205) can be used in a computing network, a public cloud network, a private cloud network, a hybrid cloud network, other forms of networks, or a combination thereof. In order to achieve the desired functionality of the verification control device (1205), the verification control device includes a variety of hardware components. Among these hardware components may be several controllers (1215), several data storage devices (1240), several peripheral device adapters (1225), and several network adapters (1230). These hardware components can be interconnected using several buses (1260) and / or network connections. In one example, the controller (1215), the data storage device (1240), the peripheral device adapter (1225), and the network adapter (1230) can be communicatively coupled through a bus (1260).

控制器(1215)可包括硬體架構,以從資料儲存裝置(1240)擷取可執行碼及執行該可執行碼。根據本案說明書於此描述之方法,此可執行碼在由控制器(1215)執行時可使控制器(1215)實行至少傳送信號至卡匣(100、200)之晶粒(104)及射出一數量之流體到一檢定板(1210)中的功能性。在執行碼期間,控制器(1215)可接收來自數個其餘硬體單元之輸入及提供輸入給該等其餘硬體單元。The controller (1215) may include a hardware architecture to retrieve executable code from the data storage device (1240) and execute the executable code. According to the method described here in the description of this case, when the executable code is executed by the controller (1215), the controller (1215) can execute at least the signal to the die (104) of the cassette (100, 200) and emit a A quantity of fluid into a verification plate (1210) for functionality. During code execution, the controller (1215) may receive input from and provide input to several remaining hardware units.

資料儲存裝置(1240)可儲存資料,諸如由控制器(1215)或其他處理裝置執行的可執行程式碼。如同將要論述地,資料儲存裝置(1240)可特別地儲存表示控制器(1215)執行以實行至少本文所述之功能性之數個應用程式的電腦碼。The data storage device (1240) can store data, such as executable code executed by the controller (1215) or other processing devices. As will be discussed, the data storage device (1240) may specifically store computer code representing several applications that the controller (1215) executes to perform at least the functionality described herein.

資料儲存裝置(1240)可包括各種類型的記憶體模組,包含依電性及非依電性記憶體。例如,本範例之資料儲存裝置(1240)包括隨機存取記憶體(RAM) (1245)、唯讀記憶體(ROM)(1250)、及硬碟驅動機(HDD)記憶體(1255)。許多其他類型的記憶體亦可被使用,而在可適於本文所述之原理的一特定應用之狀況下,本案說明書可推及在資料儲存裝置(1240)中使用各種類型的記憶體。於某些範例中,資料儲存裝置(1240)中不同類型的記憶體可針對不同資料儲存目的使用。例如,在某些範例中,控制器(1215)可自唯讀記憶體(ROM)(1250)啟動、在硬碟驅動機(HDD)記憶體(1255)維持非依電性儲存、及執行儲存在隨機存取記憶體(RAM)(1245)中的程式碼。The data storage device (1240) may include various types of memory modules, including electrical and non-electrical memory. For example, the data storage device (1240) of this example includes random access memory (RAM) (1245), read-only memory (ROM) (1250), and hard disk drive (HDD) memory (1255). Many other types of memory can also be used, and in the context of a particular application that can be adapted to the principles described herein, this specification can be extended to the use of various types of memory in the data storage device (1240). In some examples, different types of memory in the data storage device (1240) can be used for different data storage purposes. For example, in some examples, the controller (1215) may boot from read-only memory (ROM) (1250), maintain non-dependent storage in hard disk drive (HDD) memory (1255), and perform storage Code in Random Access Memory (RAM) (1245).

資料儲存裝置(1240)可包含一電腦可讀媒體、一電腦可讀儲存媒體、或一非暫態性電腦可讀媒體等等。例如,資料儲存裝置(1240)可為但不限於一電子、磁性、光學、電磁、紅外線或半導體系統、設備或裝置、或前述項目的任何合適組合。電腦可讀儲存媒體之更特定範例可包括例如以下:具有數條線之電氣連接、可攜式電腦磁片、硬碟、隨機存取記憶體(RAM)、唯讀記憶體(ROM)、可抹除可規劃唯讀記憶體(EPROM或快閃記憶體)、可攜式實密碟片唯讀記憶體(CD-ROM)、光學儲存裝置、磁性儲存裝置、或前述項目之任何合適組合。在此文件的內容中,一電腦可讀儲存媒體可為任何實體媒體,其可含有或儲存由一指令執行系統、設備或裝置使用或配合使用的電腦可用程式碼。於另一範例中,一電腦可讀儲存媒體可為任何非暫態性媒體,此等非暫態性媒體可含有或儲存由一指令執行系統、設備或裝置使用或與其配合使用的程式。The data storage device (1240) may include a computer-readable medium, a computer-readable storage medium, or a non-transitory computer-readable medium, and so on. For example, the data storage device (1240) may be, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any suitable combination of the foregoing. More specific examples of computer-readable storage media may include, for example, the following: electrical connections with several wires, portable computer diskettes, hard disk drives, random access memory (RAM), read-only memory (ROM), Erase can be programmed with read-only memory (EPROM or flash memory), portable compact disc read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing. In the content of this document, a computer-readable storage medium may be any physical medium, which may contain or store computer-usable code used or coordinated by an instruction execution system, device, or device. In another example, a computer-readable storage medium may be any non-transitory medium. Such non-transitory media may contain or store programs used by or in conjunction with an instruction execution system, device, or device.

檢定控制裝置(1205)中之硬體適配器(1225、1130)讓控制器(1215)與檢定控制裝置(1205)外部及內部的各種其他硬體元件介接。例如,周邊裝置適配器(1225)可對輸入/輸出裝置提供一介面,諸如,例如顯示裝置、滑鼠或鍵盤。周邊裝置適配器(1225)亦可對諸如外部儲存裝置的其他外部裝置、諸如例如伺服器、交換器及路由器的數個網路裝置、客戶端裝置、其他類型的運算裝置、及其組合提供存取。The hardware adapter (1225, 1130) in the verification control device (1205) allows the controller (1215) to interface with various other hardware components outside and inside the verification control device (1205). For example, the peripheral device adapter (1225) may provide an interface to an input / output device such as, for example, a display device, a mouse, or a keyboard. The peripheral device adapter (1225) can also provide access to other external devices such as external storage devices, several network devices such as, for example, servers, switches, and routers, client devices, other types of computing devices, and combinations thereof .

顯示裝置(1235)可被設置來允許檢定控制裝置(1205)的一使用者與檢定控制裝置(1205)之功能性互動及實行該功能性。周邊裝置適配器(1225)亦可在控制器(1215)與顯示裝置(1235)、印表機或其他媒體輸出裝置之間建立一介面。網路適配器(1230)可對例如在一網路內的其他運算裝置提供一介面,藉此允許在檢定控制裝置(1205)與設置於網路內之其他裝置間能有資料傳輸。The display device (1235) can be configured to allow a user of the verification control device (1205) to interact with and implement the functionality of the verification control device (1205). The peripheral device adapter (1225) can also establish an interface between the controller (1215) and the display device (1235), a printer or other media output device. The network adapter (1230) can provide an interface to, for example, other computing devices in a network, thereby allowing data transmission between the verification control device (1205) and other devices provided in the network.

檢定控制裝置(1205)在由控制器(1215)執行時,可於與表示儲存在資料儲存裝置(1240)上之數個應用程式相關聯之可執行程式碼的顯示裝置(1235)上顯示數個圖形化使用者介面(GUI)。顯示裝置(1235)之範例包括電腦螢幕、膝上型電腦螢幕、行動裝置螢幕、個人數位助理(PDA)螢幕、及桌上型電腦螢幕等其他顯示裝置(1235)。顯示在顯示裝置(1235)上之GUI的範例將於下文中作更為詳細的描述。When the verification control device (1205) is executed by the controller (1215), the verification control device (1205) can display data on the display device (1235) that represents executable code associated with several applications stored on the data storage device (1240). Graphical User Interface (GUI). Examples of the display device (1235) include a computer screen, a laptop screen, a mobile device screen, a personal digital assistant (PDA) screen, and a desktop computer screen and other display devices (1235). An example of the GUI displayed on the display device (1235) will be described in more detail below.

檢定控制裝置(1205)更包含用以實施本文所述之方法的數個模組。檢定控制裝置(1205)內的各種模組包含可分開執行的可執行程式碼。於此範例中,此等各種模組可被儲存成分別的電腦程式產品。在另一範例中,檢定控制裝置(1205)內之各種模組可被組合在數個電腦程式產品內,各電腦程式產品包含數個模組。The verification control device (1205) further includes several modules for implementing the method described herein. Various modules in the verification control device (1205) include executable code that can be executed separately. In this example, these various modules can be stored as separate computer program products. In another example, various modules in the verification control device (1205) may be combined in several computer program products, and each computer program product includes several modules.

圖13係為根據本案所述原理之另一範例繪示用以形成一卡匣之方法的流程圖。圖13之方法可始於形成一單石式基體(101)(方塊1301)。一電氣互連墊佈局配置(1101)可被形成在單石式基體(101)之一第一側上(方塊1302)。此電氣互連墊佈局配置(1101)可藉由形成一第一列(116)之互連墊而形成(方塊1302),該第一列之互連墊包括至少一互連墊(105),其中該第一列(116)之互連墊(105)中的各互連墊(105)係電氣耦合至第一組(126)之通孔(106)中的一者(方塊1303)。再者,電氣互連墊佈局配置(1101)可藉由形成一第二列(115)之互連墊(105)而形成(方塊1302),該第二列之互連墊包括至少一互連墊(105),其中該第二列(115)之互連墊(105)中的各互連墊(105)係電氣耦合至第二組(125)之通孔(106)中的一者(方塊1304)。並且,電氣互連墊佈局配置(1101)可藉由使電氣耦合至第二列(115)之互連墊(105)的第二組(125)之通孔(106)相對於第一及第二列(115、116)中之互連墊(105)的對準線而偏置(方塊1305)來形成(方塊1302)。FIG. 13 is a flowchart illustrating a method for forming a cassette according to another example of the principles described in this case. The method of FIG. 13 may begin by forming a monolithic substrate (101) (block 1301). An electrical interconnect pad layout configuration (1101) may be formed on a first side of a monolithic substrate (101) (block 1302). The electrical interconnect pad layout configuration (1101) may be formed by forming a first row (116) of interconnect pads (block 1302), the first row of interconnect pads including at least one interconnect pad (105), Each of the interconnecting pads (105) in the first row (116) is electrically coupled to one of the through holes (106) of the first group (126) (block 1303). Furthermore, the electrical interconnect pad layout configuration (1101) may be formed by forming a second row (115) of interconnect pads (105) (block 1302), the second row of interconnect pads including at least one interconnect Pad (105), wherein each interconnect pad (105) in the interconnect pad (105) of the second column (115) is electrically coupled to one of the through holes (106) of the second group (125) ( Block 1304). Moreover, the electrical interconnection pad layout configuration (1101) can be compared with the first and the first through holes (106) of the second group (125) of the interconnection pads (105) of the second row (115) by electrically coupling The alignment lines of the interconnect pads (105) in the two columns (115, 116) are offset (block 1305) to form (block 1302).

圖13之方法更可包括將至少一接觸座(111)形成到第一列(116)之互連墊(105)中的至少一互連墊(105)中。此外,圖13之方法更可包括在單石式基體(101)之一第二側上界定將一晶粒(104)電氣耦合至第一與第二組(125、126)之通孔(106)的數條電氣跡線(107)。在一範例中,數條電氣跡線(107)可使用一雷射直接建構(LDS)程序來界定。The method of FIG. 13 may further include forming at least one contact pad (111) into at least one interconnection pad (105) of the interconnection pads (105) in the first row (116). In addition, the method of FIG. 13 may further include defining a through hole (106) electrically coupling a die (104) to the first and second groups (125, 126) on a second side of the monolithic substrate (101). ) Of several electrical traces (107). In one example, several electrical traces (107) may be defined using a laser direct construction (LDS) procedure.

此系統及方法之態樣於本文中係配合根據本案所述之原理範例之方法、設備(系統)及電腦程式產品的流程圖說明及/或方塊圖來描述。流程圖說明及方塊圖中之各方塊及流程圖說明與方塊圖中之方塊的組合,可經由電腦可用程式碼來實行。此電腦可用程式碼可提供給一通用電腦、特定目的電腦、或其他可規劃資料處理設備之處理器,以形成一機器,使得電腦可用程式碼在經由例如檢定控制裝置(1205)之控制器(1215)或其他可規劃資料處理設備執行時,會實現流程圖及/或方塊圖之(多個)方塊中指定的功能或動作。在一範例中,電腦可用程式碼可具現於一電腦可讀儲存媒體內,而該電腦可讀儲存媒體為電腦程式產品之一部分。於一範例中,此電腦可讀儲存媒體為一非暫態性電腦可讀媒體。The aspect of this system and method is described in this article in conjunction with the flowchart illustration and / or block diagram of the method, equipment (system) and computer program product according to the principle examples described in this case. Each block in the flowchart illustration and block diagram, and the combination of the flowchart illustration and the block diagram in the block diagram, can be implemented by a computer using code. The computer-usable code can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing equipment to form a machine, so that the computer-usable code can pass through, for example, the controller (1205) of the control device (1205) 1215) or other programmable data processing equipment, when executed, will implement the functions or actions specified in the block (s) of the flowchart and / or block diagram. In one example, the computer-usable code may be embodied in a computer-readable storage medium, and the computer-readable storage medium is part of a computer program product. In one example, the computer-readable storage medium is a non-transitory computer-readable medium.

本案說明書及圖式描述一卡匣及形成該卡匣之相關聯方法。此卡匣可包括一基體、耦合至該基體之一晶粒、及形成在該基體之一第一側上的一電氣互連墊佈局配置。此電氣互連墊佈局配置可包括一第一列互連墊,該等互連墊包括至少一互連墊。第一列互連墊中的各互連墊係可電氣耦合至一第一組通孔中之一者。該電氣互連墊佈局配置亦包括一第二列互連墊,該等互連墊包括至少一互連墊。第二列互連墊中的各互連墊係可電氣耦合至一第二組通孔中之一者。電氣耦合至第二列互連墊的第二組通孔係相對於第一及第二列中之該等互連墊的一對準線而偏置。The description and drawings of this case describe a cassette and the associated method of forming the cassette. The cassette may include a substrate, a die coupled to the substrate, and an electrical interconnection pad layout formed on a first side of the substrate. The electrical interconnection pad layout may include a first row of interconnection pads, and the interconnection pads include at least one interconnection pad. Each of the interconnect pads in the first row of interconnect pads may be electrically coupled to one of a first set of through holes. The electrical interconnection pad layout configuration also includes a second row of interconnection pads, and the interconnection pads include at least one interconnection pad. Each interconnecting pad in the second row of interconnecting pads may be electrically coupled to one of a second set of through-holes. The second set of vias electrically coupled to the second row of interconnect pads are offset relative to an alignment line of the interconnect pads in the first and second rows.

以上敘述已被用來說明及描述所述原理之範例。本案說明書並不欲視為窮舉,或將這些原理限制在所揭露的任何特定形式。藉助於上述教示內容,仍可作出多種修改及變化。The foregoing description has been used to illustrate and describe examples of the principles described. This specification is not intended to be exhaustive or to limit these principles to any particular form disclosed. With the above teaching content, many modifications and changes can still be made.

100‧‧‧(第一容積)卡匣100‧‧‧ (first volume) cassette

101‧‧‧基體101‧‧‧ Matrix

102‧‧‧儲槽102‧‧‧ storage tank

103‧‧‧流體孔103‧‧‧fluid hole

104‧‧‧晶粒104‧‧‧ Grain

105‧‧‧接觸墊;連接墊105‧‧‧contact pad; connection pad

105-1~105-10‧‧‧接觸墊105-1 ~ 105-10‧‧‧Contact pad

106、106-1~106-10‧‧‧通孔106, 106-1 ~ 106-10‧‧‧ through hole

107、107-1~107-10‧‧‧跡線107、107-1 ~ 107-10‧‧‧ Trace

108‧‧‧線接合體108‧‧‧wire junction

109‧‧‧晶粒墊109‧‧‧ die pad

110、110-1~5‧‧‧偏置跡線110、110-1 ~ 5‧‧‧Offset trace

901‧‧‧卡匣介面901‧‧‧Cartridge interface

903‧‧‧印刷電路總成(PCA)903‧‧‧Printed Circuit Assembly (PCA)

904‧‧‧箭頭方向904‧‧‧arrow direction

905‧‧‧彈簧壓抵連接件905‧‧‧Spring pressure connection

914‧‧‧箭頭914‧‧‧arrow

1000‧‧‧卡匣1000‧‧‧ Cassette

1001‧‧‧施配頭(總成)1001‧‧‧ Distribution head (assembly)

1005‧‧‧(單石式)框架1005‧‧‧ (monolithic) frame

1100、1200‧‧‧系統1100, 1200‧‧‧ system

1101‧‧‧電氣互連墊佈局配置1101‧‧‧Electrical interconnection pad layout configuration

1110‧‧‧檢定試料1110‧‧‧test sample

1130‧‧‧硬體適配器1130‧‧‧hardware adapter

1205‧‧‧檢定控置裝置1205‧‧‧Verification control device

111‧‧‧接觸座;掣子111‧‧‧contact seat; detent

115‧‧‧(第一)列;橫列;第二列115‧‧‧ (first) row; horizontal row; second row

116‧‧‧(第二)列;橫列;第一列116‧‧‧ (second) row; horizontal row; first row

117‧‧‧線117‧‧‧line

125‧‧‧第一列;第二組125‧‧‧ first column; second group

126‧‧‧第二列;第一組126‧‧‧second column; first group

150‧‧‧握把150‧‧‧ Grip

200‧‧‧(第二容積)卡匣200‧‧‧ (second volume) cassette

900‧‧‧檢定流體施配器驅動器900‧‧‧ calibrated fluid dispenser driver

1210‧‧‧檢定(板)1210‧‧‧test (board)

1215‧‧‧控制器1215‧‧‧Controller

1225‧‧‧周邊裝置適配器;硬體適配器1225‧‧‧ Peripheral device adapter; hardware adapter

1230‧‧‧網路適配器1230‧‧‧ network adapter

1235‧‧‧顯示裝置1235‧‧‧Display device

1240‧‧‧資料儲存裝置1240‧‧‧Data Storage Device

1245‧‧‧隨機存取記憶體1245‧‧‧RAM

1250‧‧‧唯讀記憶體1250‧‧‧Read Only Memory

1255‧‧‧硬碟驅動機記憶體1255‧‧‧hard drive memory

1260‧‧‧匯流排1260‧‧‧Bus

1301~1305‧‧‧方塊1301 ~ 1305‧‧‧‧box

A、B‧‧‧圓圈A, B‧‧‧ circles

D‧‧‧距離D‧‧‧distance

附圖繪示本文所述之原理的多種範例且為說明書的一部分。所繪的範例僅供例示,且不限制申請專利範圍之範疇。The drawings illustrate various examples of the principles described herein and are a part of the specification. The examples drawn are for illustration only and do not limit the scope of patent application.

圖1係為根據本案所述原理之一範例之第一容積卡匣的前立體圖。FIG. 1 is a front perspective view of a first volume cassette according to an example of the principles described in this case.

圖2係為根據本案所述原理之一範例之圖1之第一容積卡匣的後立體圖。FIG. 2 is a rear perspective view of the first volume cassette of FIG. 1 according to an example of the principles described in this case.

圖3係為根據本案所述原理之一範例之第二容積卡匣的前立體圖。FIG. 3 is a front perspective view of a second volume cassette according to an example of the principles described in this case.

圖4係為根據本案所述原理之一範例之圖3之第二容積卡匣的後立體圖。FIG. 4 is a rear perspective view of the second volume cassette of FIG. 3 according to an example of the principles described in this case.

圖5係為根據本案所述原理之一範例之圖1之第一容積卡匣的前平面圖。FIG. 5 is a front plan view of the first volume cassette of FIG. 1 according to an example of the principles described in this case.

圖6係為根據本案所述原理之一範例之圖1之第一容積卡匣從圖5之圓圈A觀視的前平面圖。FIG. 6 is a front plan view of the first volume cassette of FIG. 1 viewed from circle A in FIG. 5 according to an example of the principles described in this case.

圖7係為根據本案所述原理之一範例之圖1之第一容積卡匣的後平面圖。FIG. 7 is a rear plan view of the first volume cassette of FIG. 1 according to an example of the principles described in this case.

圖8係為根據本案所述原理之一範例之圖1之第一容積卡匣從圖7之圓圈B觀視的後平面圖。FIG. 8 is a rear plan view of the first volume cassette of FIG. 1 viewed from circle B in FIG. 7 according to an example of the principles described in this case.

圖9係為根據本案所述原理之一範例之圖1之第一容積卡匣與一檢定流體施配器驅動器之一卡匣介面之一印刷電路總成(PCA)介接的立體圖。FIG. 9 is a perspective view of the interface between the first volume cassette of FIG. 1 and a printed circuit assembly (PCA) of a cassette interface of a verification fluid dispenser driver according to an example of the principles described in this case.

圖10係為根據本案所述原理之一範例之包括多個施配頭總成之一卡匣的前平面圖。FIG. 10 is a front plan view of a cassette including a plurality of dispensing head assemblies according to an example of the principles described herein.

圖11係為根據本案所述原理之一範例之用以射出流體到一檢定試料中之系統的方塊圖。FIG. 11 is a block diagram of a system for injecting fluid into a test sample according to an example of the principles described in this case.

圖12係為根據本案所述原理之另一範例之用以射出流體到一檢定試料中之系統的方塊圖。FIG. 12 is a block diagram of a system for ejecting fluid into a test sample according to another example of the principles described in this case.

圖13係為根據本案所述原理之另一範例繪示用以形成一卡匣之方法的流程圖。FIG. 13 is a flowchart illustrating a method for forming a cassette according to another example of the principles described in this case.

附圖之中,相同參考編號指出類似但不一定相同的元件。In the drawings, the same reference numbers indicate similar but not necessarily identical elements.

Claims (15)

一種卡匣,其包含: 一基體; 耦合至該基體的一晶粒;以及 形成在該基體之一第一側上的一電氣互連墊佈局配置,其包含: 一第一列互連墊,其包含至少一互連墊,該第一列互連墊中的各互連墊係電氣耦合至一第一組通孔中的一者;及 一第二列互連墊,其包含至少一互連墊,該第二列互連墊中的各互連墊係電氣耦合至一第二組通孔中的一者, 其中電氣耦合至該第二列互連墊的該第二組通孔係相對於該第一列及該第二列中之互連墊的一對準線而偏置。A cassette comprising: a base body; a die coupled to the base body; and an electrical interconnection pad layout configuration formed on a first side of the base body, comprising: a first row of interconnection pads, It includes at least one interconnecting pad, each interconnecting pad in the first row of interconnecting pads is electrically coupled to one of a first set of through holes; and a second row of interconnecting pads comprising at least one interconnecting pad. Interconnected pads, each interconnected pad in the second row of interconnected pads is electrically coupled to one of a second set of vias, wherein the second set of vias electrically coupled to the second row of interconnected pads Offset with respect to an alignment line of the interconnect pads in the first and second columns. 如請求項1之卡匣,其更包含形成在該基體之一第二側上的數條電氣跡線,其中該第一組及該第二組通孔將該電氣互連墊佈局配置電氣耦合至該等電氣跡線,且其中電氣耦合至該第二列互連墊之該第二組通孔的偏置,造成該基體之第二側上所形成之該等電氣跡線的一偏置。For example, the cartridge of claim 1 further includes a plurality of electrical traces formed on a second side of the base, wherein the first group and the second group of through holes electrically couple the electrical interconnection pad layout configuration. To the electrical traces, and the bias of the second set of vias electrically coupled to the second column of interconnect pads, causing a bias of the electrical traces formed on the second side of the substrate . 如請求項1之卡匣,其中該第一列互連墊中之該等互連墊中的至少一者包含界定於其中的一接觸座,該接觸座允許一彈簧壓抵連接體之座設。As in the cartridge of claim 1, wherein at least one of the interconnection pads in the first row of interconnection pads includes a contact seat defined therein, the contact seat allows a spring to be pressed against the seat of the connection body. . 如請求項1之卡匣,其中該第二列互連墊中之該等互連墊中的至少一者包含一發射互連墊。The cartridge of claim 1, wherein at least one of the interconnection pads in the second row of interconnection pads includes a launch interconnection pad. 一種用以射出流體到檢定試料中之系統,其包含: 一印刷電路總成(PCA),其包含: 至少一彈簧壓抵連接件;以及 至少一施配頭,該至少一施配頭包含: 一基體; 耦合至該基體之一晶粒;及 形成在該基體之一第一側上之一電氣互連墊佈局配置,其包含: 一第一列互連墊,其包含至少一互連墊,該第一列互連墊中之各互連墊係電氣耦合至一第一組通孔中之一者;及 一第二列互連墊,其包含至少一互連墊,該第二列互連墊中之各互連墊係電氣耦合至一第二組通孔中之一者, 其中電氣耦合至該第二列互連墊之該第二組通孔係相對於該第一列與該第二列中之該等互連墊之一對準線而偏置。A system for injecting fluid into a test sample includes: a printed circuit assembly (PCA) including: at least one spring pressed against a connection member; and at least one dispensing head, the at least one dispensing head comprising: A substrate; a die coupled to the substrate; and an electrical interconnection pad layout configuration formed on a first side of the substrate, comprising: a first row of interconnection pads including at least one interconnection pad Each interconnect pad in the first row of interconnect pads is electrically coupled to one of a first set of through holes; and a second row of interconnect pads including at least one interconnect pad, the second row Each of the interconnect pads in the interconnect pads is electrically coupled to one of a second set of vias, wherein the second set of vias electrically coupled to the second row of interconnect pads is relative to the first row and One of the interconnect pads in the second column is offset by an alignment. 如請求項5之系統,其中該第二列互連墊中之該等互連墊中的至少一者包含一發射互連墊。The system of claim 5, wherein at least one of the interconnect pads in the second row of interconnect pads includes a launch interconnect pad. 如請求項5之系統,其中該第一列互連墊中之該等互連墊中的至少一者包含界定於其中的一接觸座,該接觸座允許該彈簧壓抵連接件在該至少一施配頭與該PCA介接時座設於該接觸座中。The system of claim 5, wherein at least one of the interconnection pads in the first row of interconnection pads includes a contact seat defined therein, the contact seat allowing the spring to press the connecting member against the at least one The dispensing head is seated in the contact seat when it interfaces with the PCA. 如請求項5之系統,其中該第一列互連墊包含至少一接地互連墊、一電源電壓互連墊、及一熱感測電阻器(TSR)互連墊。The system of claim 5, wherein the first row of interconnect pads includes at least one ground interconnect pad, a power supply voltage interconnect pad, and a thermal sensing resistor (TSR) interconnect pad. 如請求項8之系統,其中該第二列互連墊包含至少一發射互連墊、一時鐘互連墊、及一資料互連墊。The system of claim 8, wherein the second row of interconnect pads includes at least one transmit interconnect pad, a clock interconnect pad, and a data interconnect pad. 如請求項5之系統,其中該PCA藉由使該至少一彈簧壓抵連接件滑動經過該第二列互連墊,且將該至少一彈簧壓抵連接件電氣耦合至該第一列互連墊中之至少一互連墊,來與該至少一施配頭之該電氣互連墊佈局配置介接。The system of claim 5, wherein the PCA slides through the second row of interconnecting pads by causing the at least one spring pressing connector to electrically couple the at least one spring pressing connector to the first row of interconnections. At least one interconnection pad among the pads is used to interface with the electrical interconnection pad layout configuration of the at least one dispensing head. 如請求項5之系統,其中該PCA藉由將該至少一彈簧壓抵連接件在與由該電氣互連墊佈局配置形成之一平面垂直的一方向上,垂降到該第一列互連墊或該第二列互連墊中的至少一互連墊上,來與該至少一施配頭之該電氣互連墊佈局配置介接。The system of claim 5, wherein the PCA is lowered to the first row of interconnecting pads by pressing the at least one spring against the connecting member in a direction perpendicular to a plane formed by the electrical interconnecting pad layout configuration. Or at least one of the interconnection pads in the second row of interconnection pads, to interface with the electrical interconnection pad layout configuration of the at least one dispensing head. 一種形成卡匣之方法,其包含: 形成一單石式基體; 形成一電氣互連墊佈局配置,其係藉由以下步驟而形成於該單石式基體之一第一側上: 形成一第一列互連墊,其包含至少一互連墊,該第一列互連墊中的各互連墊係電氣耦合至一第一組通孔中之一者;及 形成一第二列互連墊,其包含至少一互連墊,該第二列互連墊中的各互連墊係電氣耦合至一第二組通孔中之一者;以及 使電氣耦合至該第二列互連墊之該第二組通孔相對於該第一列及該第二列中之該等互連墊的一對準線而偏置。A method for forming a cassette includes: forming a monolithic substrate; forming an electrical interconnection pad layout configuration, which is formed on a first side of the monolithic substrate by the following steps: forming a first A row of interconnect pads including at least one interconnect pad, each interconnect pad in the first row of interconnect pads being electrically coupled to one of a first set of through-holes; and forming a second row of interconnects A pad including at least one interconnect pad, each interconnect pad in the second row of interconnect pads being electrically coupled to one of a second set of vias; and electrically coupled to the second row of interconnect pads The second set of through-holes are offset relative to an alignment line of the interconnect pads in the first column and the second column. 如請求項12之方法,其更包含將至少一接觸座形成到該第一列互連墊中之至少一互連墊中。The method of claim 12, further comprising forming at least one contact pad into at least one interconnection pad in the first row of interconnection pads. 如請求項12之方法,其更包含在該單石式基體之一第二側上界定將一晶粒電氣耦接至該第一組通孔與該第二組通孔的數條電氣跡線。The method of claim 12, further comprising defining electrical traces electrically coupling a die to the first group of vias and the second group of vias on a second side of the monolithic substrate. . 如請求項12之方法,其中該等數條跡線係利用一雷射直接建構(LDS)程序來界定。The method of claim 12, wherein the plurality of traces are defined using a laser direct construction (LDS) procedure.
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