TW201928308A - Light source detection system and method thereof - Google Patents

Light source detection system and method thereof Download PDF

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TW201928308A
TW201928308A TW106145591A TW106145591A TW201928308A TW 201928308 A TW201928308 A TW 201928308A TW 106145591 A TW106145591 A TW 106145591A TW 106145591 A TW106145591 A TW 106145591A TW 201928308 A TW201928308 A TW 201928308A
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TWI655412B (en
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李後賢
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群光電子股份有限公司
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Abstract

A light source detection system includes an image capture module, an image processing module and a detection module. The image capture module captures a test image. The test image includes two or more area images for test. These area images are respectively located in two or more preset areas on the test image. The image processing module is electrically connected to the image capture module. The image processing module receives the area images and processes them into two or more two-dimensional pixels having the same two-dimensional number. Each of the two-dimensional pixels has optical information. The detection module is electrically connected to the image processing module. The detection module reads the two-dimensional pixels of each area image and detects the optical information of the two-dimensional pixels to determine whether each area image is a qualified image or a disqualified image according to a detection model.

Description

發光源檢測系統與方法Luminous source detection system and method

本發明係關於一種檢測系統,特別是指一種發光源檢測系統與方法。The invention relates to a detection system, in particular to a light source detection system and method.

市面上許多產品都具有發光的功能,舉發光式鍵盤為例,其一般是在按鍵下方裝設有發光元件(例如LED),以透過發光元件發出光線並照射按鍵,致使按鍵上所標示的數字或文字能透出光線,而達到預定的使用需求(例如因應光照不足的使用環境)。Many products on the market have a light-emitting function. For example, a light-emitting keyboard is generally provided with a light-emitting element (such as an LED) under the key to emit light through the light-emitting element and illuminate the key, resulting in the number marked on the key. Or the text can penetrate the light and meet the intended use requirements (for example, the use environment due to insufficient light).

承上,在發光產品的生產過程中,一般都會對發光元件進行檢測,以確保發光元件所發出的光線符合預定的顏色、亮度或飽和度等等。目前的檢測方式是由生產線上的工作人員進行目測判斷,然而,此種方式工作人員易因長時間的檢測引起視覺疲勞而發生誤判的情形,且對眼睛也會造成傷害。另外,對於特殊發光產品來說,例如發光產品的顯像為不規則型態或者發光產品經由材料導光後已非基準色等情形,也難以透過人工目測的方式準確判斷。It is assumed that in the production process of light-emitting products, light-emitting elements are generally inspected to ensure that the light emitted by the light-emitting elements conforms to a predetermined color, brightness, or saturation. The current detection method is visually judged by the workers on the production line. However, workers in this way are prone to misjudgment due to visual fatigue caused by prolonged detection, and may cause eye damage. In addition, for special light-emitting products, for example, the appearance of the light-emitting product is irregular, or the light-emitting product is out of the reference color after being guided by the material, it is also difficult to accurately judge by manual visual inspection.

有鑑於此,於一實施例中,提供一種發光源檢測方法,包括擷取步驟:擷取一檢測畫面,檢測畫面包括有複數個待測區影像,這些待測區影像分別位於檢測畫面上複數個預設區域、影像處理步驟:將這些待測區影像分別處理成具有相同二維數量之複數個二維像素,其中各二維像素具有一光學資訊、檢測步驟:讀取各待測區影像之二維像素,並根據一檢測模型以檢測各待測區影像之二維像素之光學資訊,並判斷各待測區影像為一合格影像或一失格影像,其中檢測模型是指依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,且輸出層演算結果包括有合格影像及失格影像。In view of this, in an embodiment, a method for detecting a luminous source is provided. The method includes a capturing step: capturing a detection frame, the detection frame includes a plurality of images to be tested, and the images of the regions to be tested are respectively located on the detection screen. Preset areas and image processing steps: These images of the test area are processed into a plurality of two-dimensional pixels having the same two-dimensional number, each of which has an optical information, and the detection step: reading the images of each test area Two-dimensional pixels, and according to a detection model to detect the optical information of the two-dimensional pixels of the images of each area under test, and determine whether each image of the area under test is a qualified image or a disqualified image, where the detection model refers to a deep learning The algorithm performs artificial intelligence calculation and obtains an artificial intelligence algorithm model of an output layer calculation result, and the output layer calculation result includes a qualified image and a disqualified image.

於另一實施例中,提供一種發光源檢測系統,包括影像擷取模組、影像處理模組及檢測模組。影像擷取模組擷取一檢測畫面,檢測畫面包括有複數個待測區影像,這些待測區影像分別位於檢測畫面上複數個預設區域。影像處理模組電連接於影像擷取模組,影像處理模組接收這些待測區影像並分別處理成具有相同二維數量之複數個二維像素,其中各二維像素具有一光學資訊。檢測模組電連接於影像處理模組,檢測模組讀取各待測區影像之二維像素,且根據一檢測模型以檢測各待測區影像之二維像素之光學資訊,並判斷各待測區影像為一合格影像或一失格影像。其中,檢測模型是指依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,且輸出層演算結果包括有合格影像及失格影像。In another embodiment, a light source detection system is provided, which includes an image capture module, an image processing module, and a detection module. The image capture module captures a detection frame. The detection frame includes a plurality of images to be tested, and the images of the regions to be tested are respectively located in a plurality of preset areas on the detection screen. The image processing module is electrically connected to the image capture module. The image processing module receives the images of the test area and processes them into a plurality of two-dimensional pixels having the same two-dimensional number, wherein each two-dimensional pixel has an optical information. The detection module is electrically connected to the image processing module. The detection module reads the two-dimensional pixels of the images of each area to be tested, and detects the optical information of the two-dimensional pixels of the images of each area to be tested according to a detection model, and judges each of the areas to be tested. The measurement area image is a qualified image or a disqualified image. The detection model refers to an artificial intelligence algorithm model that performs artificial intelligence calculations according to a deep learning algorithm and obtains an output layer calculation result. The output layer calculation results include qualified images and disqualified images.

綜上所述,根據本發明實施例之發光源檢測方法與發光源檢測系統,透過擷取一檢測畫面並經由檢測模型檢測待測區影像以判斷發光源是否合格,可達到不需以人工目測方式辦別而提高檢測的準確性與人力。此外,透過將各待測區影像分別處理成具有相同二維數量之複數個二維像素,可使發光源檢測的基準一致,並能提高檢測的運算速度。再者,透過檢測模型是依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,更可適用於特殊發光產品,例如發光源顯像為不規則型態或發光源經由材料導光後已非基準色等情形。In summary, according to the luminous source detection method and luminous source detection system according to the embodiments of the present invention, it is possible to determine whether the luminous source is qualified by capturing a detection picture and detecting the image of the area to be tested through the detection model, which can be achieved without manual visual inspection Different ways to improve the accuracy and manpower of detection. In addition, by processing the images of each area to be tested into a plurality of two-dimensional pixels having the same two-dimensional number, the reference of the light source detection can be made consistent, and the detection calculation speed can be improved. In addition, the detection model is an artificial intelligence algorithm model that performs artificial intelligence calculations based on a deep learning algorithm and obtains an output layer calculation result. It is more suitable for special light-emitting products, such as the irregular shape of the light source image. Or the light source is no longer the reference color after being guided by the material.

圖1為本發明發光源檢測方法一實施例之步驟流程圖。本實施例之發光源檢測方法可適用於在生產過程中,對發光源(例如發光鍵盤、LED面板或燈具的發光源)進行檢測,以確保產品出廠時發光源所發出的光線符合預定的顏色、亮度或飽和度等光學資訊。如圖1所示,本實施例之發光源檢測方法是依序執行擷取步驟S1、影像處理步驟S2以及檢測步驟S3。在一實施例中,上述發光源檢測方法的各步驟可透過一發光源檢測系統1執行,如圖2所示,在本例中,發光源檢測系統1包括有影像擷取模組10、影像處理模組20及檢測模組30。以下即配合圖式說明發光源檢測方法之詳細步驟流程。FIG. 1 is a flowchart of steps in an embodiment of a light source detection method according to the present invention. The light source detection method of this embodiment is applicable to the detection of a light source (such as a light source of a light-emitting keyboard, LED panel, or lamp) during the production process to ensure that the light emitted by the light source when the product leaves the factory meets a predetermined color , Brightness, or saturation. As shown in FIG. 1, the light source detection method of this embodiment sequentially executes the capturing step S1, the image processing step S2, and the detecting step S3. In an embodiment, each step of the above-mentioned light source detection method can be performed through a light source detection system 1, as shown in FIG. 2. In this example, the light source detection system 1 includes an image capture module 10, an image The processing module 20 and the detection module 30. The detailed steps of the method for detecting a light source are described below with reference to the drawings.

如圖1所示,在擷取步驟S1中,首先是先擷取一檢測畫面,舉例來說,可擷取具有發光源之待測物(如發光鍵盤、發光面板或燈具)的影像以取得檢測畫面。例如圖2至圖4所示,本實施例是透過發光源檢測系統1的影像擷取模組10擷取一發光鍵盤K的影像(如圖3所示)而取得一檢測畫面D(如圖4所示),在一些實施例中,影像擷取模組10具體上可為相機(Camera)或感光元件以擷取上述檢測畫面D。其中感光元件可為感光耦合元件(charge-coupled device, CCD)、互補式金屬氧化物半導體(Complementary Metal-Oxide Semiconductor , CMOS )、或互補式金屬氧化物半導體主動像素傳感器(CMOS Active pixel sensor)以擷取待測物影像。As shown in FIG. 1, in the capturing step S1, a detection frame is first captured. For example, an image of a test object (such as a light-emitting keyboard, a light-emitting panel, or a lamp) having a light source can be captured to obtain Detection screen. For example, as shown in FIGS. 2 to 4, in this embodiment, an image of a light-emitting keyboard K is captured by the image capture module 10 of the light source detection system 1 (as shown in FIG. 3) to obtain a detection frame D (as shown in FIG. 3). 4). In some embodiments, the image capturing module 10 may be a camera or a light sensing element to capture the detection frame D. The photosensitive element can be a charge-coupled device (CCD), a complementary metal-oxide semiconductor (CMOS), or a complementary metal-oxide semiconductor active pixel sensor (CMOS) Capture the image of the object under test.

再對照圖3與圖4所示,其中檢測畫面D包括有複數個待測區影像T,這些待測區影像T是由複數個位於不同位置之發光源L(例如LED)發光所形成的亮區影像,且這些待測區影像T位於檢測畫面D上複數個預設區域,例如在本例中,這些待測區影像T是對應於發光鍵盤K的各個按鍵區域。3 and FIG. 4, the detection frame D includes a plurality of images T to be tested, and the images T to be tested are formed by a plurality of light sources L (such as LEDs) at different positions. Area images, and the area images T to be tested are located in a plurality of preset areas on the detection frame D. For example, in this example, the area images T to be tested are corresponding to the key areas of the illuminated keyboard K.

在一實施例中,如圖3所示,影像擷取模組10可包括減光鏡11,以經由減光鏡11擷取檢測畫面D,使檢測畫面D獲得減光效果而為減光後的畫面,避免因發光源L過亮而使檢測畫面D之各待測區影像T無法實際呈現發光源L的顏色或亮度。In an embodiment, as shown in FIG. 3, the image capturing module 10 may include a light reduction mirror 11 to capture a detection frame D through the light reduction mirror 11, so that the detection frame D obtains a light reduction effect and is a light reduction. To prevent the images T of the test areas D from actually displaying the color or brightness of the light source L due to the light source L being too bright.

再如圖1所示,在擷取步驟S1後,接著進行影像處理步驟S2:將檢測畫面D的各個待測區影像T分別處理成具有相同二維數量之複數個二維像素P,其中各二維像素P具有一光學資訊。例如圖2所示,在本實施例中,發光源檢測系統1的影像處理模組20電連接於影像擷取模組10以接收影像擷取模組10所擷取的多個待測區影像T,並且影像處理模組20可將這些待測區影像T並分別處理成具有相同二維數量之複數個二維像素P。舉例來說,影像處理模組20可將各待測區影像T調整成相同的尺寸大小(例如12×12、18×18、32×32、42×42或64×64)而形成相同二維數量之二維像素P、或者影像處理模組20也可直接將不同尺寸大小的各待測區影像T分別切割成相同二維數量之二維像素P(例如二維數量介於12×12至64×64之間),此部分並不侷限。其中各二維像素P皆具有一光學資訊(例如色頻資訊、亮度資訊或其組合)。例如圖5所示,在本實施例中,影像處理模組20是將各待測區影像T調整成二維數量為14×14的二維像素P,但本實施例並不限制,影像處理模組20除了可將待測區影像T的二維數量調整成方形矩陣型態(例如12×12、18×18、32×32、42×42或64×64),亦可將待測區影像T的二維數量調整成長方形矩陣型態(例如15×20、20×30、60×40、50×30或70×20)。As shown in FIG. 1, after capturing step S1, image processing step S2 is performed: each image T of each test area of the detection frame D is processed into a plurality of two-dimensional pixels P having the same two-dimensional number, each of which The two-dimensional pixel P has an optical information. For example, as shown in FIG. 2, in this embodiment, the image processing module 20 of the light source detection system 1 is electrically connected to the image capture module 10 to receive images of a plurality of test areas captured by the image capture module 10. T, and the image processing module 20 can process the images T of the test areas into a plurality of two-dimensional pixels P having the same two-dimensional number, respectively. For example, the image processing module 20 can adjust the images T of each area to be measured to the same size (eg, 12 × 12, 18 × 18, 32 × 32, 42 × 42, or 64 × 64) to form the same two-dimensional The number of two-dimensional pixels P, or the image processing module 20 can also directly cut the images T of the test areas of different sizes into the same two-dimensional number of two-dimensional pixels P (for example, the number of two-dimensional pixels ranges from 12 × 12 to 64 × 64), this part is not limited. Each of the two-dimensional pixels P has optical information (such as color frequency information, brightness information, or a combination thereof). For example, as shown in FIG. 5, in this embodiment, the image processing module 20 adjusts the images T of each area to be measured into two-dimensional pixels P having a two-dimensional number of 14 × 14. The module 20 can adjust the two-dimensional quantity of the image T of the area to be tested into a square matrix type (for example, 12 × 12, 18 × 18, 32 × 32, 42 × 42, or 64 × 64). The two-dimensional number of images T is adjusted to a rectangular matrix type (for example, 15 × 20, 20 × 30, 60 × 40, 50 × 30, or 70 × 20).

在一實施例中,影像處理模組20將這些待測區影像T分別處理成二維數量介於30×30至32×32之間的二維像素P為較佳,此可進一步參閱下揭表一所示,表一為經實驗整理的表格,其顯示各待測區影像T之二維數量所對應之運算速度與影像品質,由表一可看出待測區影像T的二維數量介於30×30至32×32之間相較於其他數量來說可同時兼顧影像品質及後續處理的運算速度。 表一 In an embodiment, the image processing module 20 processes the images T of the test area into two-dimensional pixels P each having a two-dimensional number between 30 × 30 and 32 × 32. As shown in Table 1, Table 1 is an experimentally compiled table that shows the calculation speed and image quality corresponding to the two-dimensional number of images T in each area to be tested. Compared with other numbers, it is between 30 × 30 and 32 × 32, which can take into account both the image quality and the operation speed of subsequent processing. Table I

再如圖1所示,在影像處理步驟S2後,進行檢測步驟S3:讀取各待測區影像T之二維像素P,並根據一檢測模型31以檢測各待測區影像T之各二維像素P之光學資訊,並判斷各待測區影像T為一合格影像或一失格影像。如圖2所示,在本實施例中,發光源檢測系統1的檢測模組30電連接於影像處理模組20,以讀取各待測區影像T之多個二維像素P,且根據一檢測模型31以檢測各待測區影像T之二維像素P之光學資訊,並判斷各待測區影像T為合格影像或失格影像。其中檢測模型31是指依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,且輸出層演算結果包括有合格影像及失格影像,使檢測模組30能夠基於檢測模型31判斷各待測區影像T為合格影像或失格影像。As shown in FIG. 1, after the image processing step S2, a detection step S3 is performed: two-dimensional pixels P of the images T of each area to be tested are read, and two of the images T of each area to be tested are detected according to a detection model 31. Dimension the optical information of the pixel P, and determine whether the image T of each area to be measured is a qualified image or a disqualified image. As shown in FIG. 2, in this embodiment, the detection module 30 of the light source detection system 1 is electrically connected to the image processing module 20 to read a plurality of two-dimensional pixels P of the image T of each area to be measured, and according to A detection model 31 detects the optical information of the two-dimensional pixels P of the images T of each area to be tested, and determines whether the images T of each area to be tested are qualified images or disqualified images. The detection model 31 refers to an artificial intelligence algorithm model that performs artificial intelligence calculations according to a deep learning algorithm and obtains an output layer calculation result, and the output layer calculation results include qualified images and disqualified images, so that the detection module 30 can Based on the detection model 31, it is determined whether the images T in each area to be tested are qualified images or disqualified images.

更進一步地,在檢測步驟S3後,進行資料存檔步驟:藉由將所有合格影像、失格影像的資料存檔於資料庫中,從而未來可以用大量的數據進行分類,並統計正確率。也可以利用更多數據來判定批次的待測物,是否有製程不良的問題。Furthermore, after the detecting step S3, a data archiving step is performed: by archiving all the data of qualified images and disqualified images in a database, so that a large amount of data can be used for classification in the future and the accuracy rate can be calculated. You can also use more data to determine whether the batch of test objects has a problem with a poor process.

在一實施例中,如圖5所示,各待測區影像T之二維像素P的光學資訊可為一色頻資訊,例如色頻資訊可包括紅光資訊(例如紅色像素值R)、一綠光資訊(例如綠色像素值G)、一藍光資訊(例如藍色像素值B)或其組合,合格影像可指各待測區影像T之色頻資訊大於一色頻閥值之影像,失格影像是指各待測區影像T之色頻資訊小於上述色頻閥值之影像。舉例來說,當需要檢測發光源L發出的光線是否符合預定顏色時(如紅色),假設檢測模型31之輸出層演算結果顯示色頻閥值為紅色像素值=200,當待測區影像T之二維像素P的紅色像素值R(例如R值=212)超過色頻閥值時,檢測模組30即判斷待測區影像T為合格影像,代表發光源L發出的光線符合預定顏色,當待測區影像T之二維像素P的紅光像素值R(例如R值=150)小於色頻閥值時,檢測模組30即判斷待測區影像T為失格影像,代表發光源L發出的光線不符合預定顏色,藉以透過影像判斷發光源L是否合格。然而上述實施例僅為舉例,在其他實施例中,當需要檢測發光源L發出的光線是否符合其他顏色時(如綠色或藍色),即可以其他像素值(例如綠色像素值G或藍色像素值B)為基準進行判斷。In an embodiment, as shown in FIG. 5, the optical information of the two-dimensional pixel P of each image T of the area to be measured may be a color frequency information. For example, the color frequency information may include red light information (such as a red pixel value R), a Green light information (such as green pixel value G), a blue light information (such as blue pixel value B), or a combination thereof. A qualified image can refer to an image in which the color frequency information of the image T of each area under test is greater than a color frequency threshold, and the image is disqualified. Refers to the image whose color frequency information of the image T of each area to be measured is smaller than the above-mentioned color frequency threshold. For example, when it is necessary to detect whether the light emitted by the light source L conforms to a predetermined color (such as red), assuming that the output layer calculation result of the detection model 31 shows that the color frequency threshold value is red pixel value = 200, and when the image T of the test area T When the red pixel value R (for example, R value = 212) of the two-dimensional pixel P exceeds the color frequency threshold, the detection module 30 judges that the image T of the area to be measured is a qualified image, which represents that the light emitted by the light source L conforms to a predetermined color. When the red light pixel value R (for example, R value = 150) of the two-dimensional pixel P of the image T of the measurement area is smaller than the color frequency threshold, the detection module 30 judges that the image T of the measurement area is a disqualified image, which represents the light source L The emitted light does not conform to the predetermined color, thereby determining whether the light-emitting source L is qualified through the image. However, the above embodiments are merely examples. In other embodiments, when it is required to detect whether the light emitted by the light source L conforms to other colors (such as green or blue), other pixel values (such as green pixel values G or blue) can be used. The pixel value B) is used as a reference for judgment.

在一實施例中,各二維像素P之光學資訊也可包括一亮度資訊(例如灰階值),合格影像是指待測區影像T之亮度資訊大於亮度閥值之影像,失格影像是指待測區影像T之亮度資訊小於亮度閥值之影像。舉例來說,當需要檢測發光源L發出的光線是否符合預定亮度時,假設檢測模型31之輸出層演算結果顯示亮度閥值為灰階值=180,當待測區影像T之二維像素P的平均灰階值(例如灰階值=200)超過亮度閥值時,檢測模組30即判斷待測區影像T為合格影像,代表發光源L發出的光線符合預定亮度,當待測區影像T之二維像素P的平均灰階值(例如灰階值=140)小於亮度閥值時,檢測模組30即判斷各待測區影像T為失格影像,代表發光源L發出的光線不符合預定亮度。如圖5所示,在一實施例中,上述待測區影像T之二維像素P的灰階值可根據紅色像素值R、綠色像素值G、藍色像素值B計算出,例如將紅色像素值R、綠色像素值G、藍色像素值B分別乘以不同權重再取平均值而計算出二維像素P的灰階值。In an embodiment, the optical information of each two-dimensional pixel P may also include a brightness information (such as a grayscale value). A qualified image is an image in which the brightness information of the image T in the area to be measured is greater than a brightness threshold, and a disqualified image is The brightness information of the image T in the test area is smaller than the brightness threshold. For example, when it is necessary to detect whether the light emitted by the light source L meets the predetermined brightness, it is assumed that the output layer calculation result of the detection model 31 shows that the brightness threshold value is grayscale value = 180. When the average grayscale value (for example, grayscale value = 200) exceeds the brightness threshold, the detection module 30 judges that the image T of the area under test is a qualified image, which represents that the light emitted by the light source L meets the predetermined brightness. When the average grayscale value (for example, grayscale value = 140) of the two-dimensional pixel P of T is smaller than the brightness threshold, the detection module 30 judges that the image T of each area to be measured is a disqualified image, which indicates that the light emitted by the light source L does not meet Predetermined brightness. As shown in FIG. 5, in an embodiment, the grayscale value of the two-dimensional pixel P of the image T of the test area can be calculated according to the red pixel value R, the green pixel value G, and the blue pixel value B. For example, red The pixel value R, the green pixel value G, and the blue pixel value B are respectively multiplied by different weights and then averaged to calculate the grayscale value of the two-dimensional pixel P.

在一些實施例中,各二維像素P之光學資訊也可包括上述亮度資訊與色頻資訊,檢測模組30可根據各待測區影像T的亮度資訊與色頻資訊綜合判斷各待測區影像T為一合格影像或一失格影像,以檢測發光源L發出的光線是否符合預定亮度及預定顏色。In some embodiments, the optical information of each two-dimensional pixel P may also include the above-mentioned brightness information and color frequency information. The detection module 30 may comprehensively determine each area to be tested based on the brightness information and color frequency information of the image T of each area to be tested. The image T is a qualified image or a disqualified image to detect whether the light emitted by the light source L conforms to a predetermined brightness and a predetermined color.

在一些實施例中,影像處理模組20與檢測模組30具體上可為具備有運算能力的硬體,例如中央處理單元(Central Processing Unit, CPU)、可程式化之微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor, DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuits, ASIC)、可程式化邏輯裝置(Programmable Logic Device, PLD)或其他類似裝置,以進行影像處理與判斷。In some embodiments, the image processing module 20 and the detection module 30 may be hardware with computing capabilities, such as a Central Processing Unit (CPU), a programmable microprocessor (Microprocessor) , Digital Signal Processor (DSP), Programmable Controller, Application Specific Integrated Circuits (ASIC), Programmable Logic Device (PLD), or other similar devices, For image processing and judgment.

在一實施例中,檢測模組30可以二維的形式讀取各待測區影像T之多個二維像素P,例如圖2與圖5所示,影像處理模組20可將各待測區影像T處理成二維矩陣形式之二維像素P,檢測模組30是直接讀取二維矩陣形式之二維像素P進行判斷。或者,在另一實施例中,檢測模組30亦可以一維的形式讀取各待測區影像T之多個二維像素P,舉例來說,請對照圖5、圖6及圖7所示,影像處理模組20將各待測區影像T處理成二維矩陣形式之二維像素P後(如圖5所示),可將這些二維像素P以一維方式排列,例如圖6所示,在本實施例中,影像處理模組20可將二維像素P中的紅色像素值R、綠色像素值G及藍色像素值B分別以一維方式排列,再依序排列一維的紅色像素值R、一維的綠色像素值G以及一維的藍色像素值B,使檢測模組30能以一維的形式讀取各待測區影像T之多個二維像素P。或者,如圖7所示,影像處理模組20可將二維像素P中的紅色像素值R、綠色像素值G及藍色像素值B以一維方式交錯排列,使檢測模組30能以一維的形式讀取各待測區影像T之多個二維像素P。其中,檢測模組30以一維的形式讀取各待測區影像T之多個二維像素P相較於讀取二維的形式之多個二維像素P可進一步降低處理上的複雜度而能更快速的進行影像判斷。在其他實施例中,檢測模組30亦可接收二維矩陣形式之二維像素P後再處理成一維形式進行處理與判斷,此並不限制。In an embodiment, the detection module 30 can read a plurality of two-dimensional pixels P of the image T of each area to be tested in a two-dimensional form. For example, as shown in FIG. 2 and FIG. 5, the image processing module 20 can The area image T is processed into two-dimensional pixels P in the form of two-dimensional matrix, and the detection module 30 directly reads the two-dimensional pixels P in the form of two-dimensional matrix for judgment. Alternatively, in another embodiment, the detection module 30 may also read a plurality of two-dimensional pixels P of the image T of each area to be measured in a one-dimensional form. For example, please refer to FIG. 5, FIG. 6, and FIG. 7. As shown in the figure, after the image processing module 20 processes the images T of each area to be tested into two-dimensional pixels P in the form of a two-dimensional matrix (as shown in FIG. 5), these two-dimensional pixels P can be arranged in a one-dimensional manner, such as FIG. 6. As shown, in this embodiment, the image processing module 20 may arrange the red pixel value R, the green pixel value G, and the blue pixel value B in the two-dimensional pixel P in a one-dimensional manner, and then sequentially arrange the one-dimensional pixel P. The red pixel value R, the one-dimensional green pixel value G, and the one-dimensional blue pixel value B enable the detection module 30 to read a plurality of two-dimensional pixels P of the image T of each area to be measured in a one-dimensional form. Alternatively, as shown in FIG. 7, the image processing module 20 may arrange the red pixel value R, the green pixel value G, and the blue pixel value B in the two-dimensional pixel P in a one-dimensional manner, so that the detection module 30 can A plurality of two-dimensional pixels P of each image T of the test area are read in a one-dimensional format. Among them, the detection module 30 reads a plurality of two-dimensional pixels P of the image T of each area to be tested in a one-dimensional form, which can further reduce the processing complexity compared to reading a plurality of two-dimensional pixels P in a two-dimensional form. And can make image judgment faster. In other embodiments, the detection module 30 may also receive the two-dimensional pixels P in the form of a two-dimensional matrix and then process them into a one-dimensional form for processing and judgment, which is not limited.

綜上,本發明實施例之發光源檢測方法與發光源檢測系統,透過擷取一檢測畫面D並經由檢測模型31檢測待測區影像T以判斷發光源L是否合格,可達到不需以人工目測方式辦別而提高檢測的準確性與人力。此外,透過將各待測區影像T分別處理成具有相同二維數量之複數個二維像素P,可使發光源L檢測的基準一致,並能提高檢測的運算速度。再者,透過檢測模型31是依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,更可適用於特殊發光產品,例如發光源L顯像為不規則型態或發光源L經由材料導光後已非基準色等情形。In summary, the luminous source detection method and the luminous source detection system of the embodiment of the present invention determine whether the luminous source L is qualified by capturing a detection frame D and detecting the image T of the area to be measured through the detection model 31, which can be achieved without manual work. Visual inspection methods can improve the accuracy and manpower of detection. In addition, by processing the images T of each area to be tested into a plurality of two-dimensional pixels P having the same two-dimensional number, the reference for detecting the light source L can be consistent, and the detection calculation speed can be improved. Furthermore, the detection model 31 is an artificial intelligence algorithm model that performs artificial intelligence calculations according to a deep learning algorithm and obtains an output layer calculation result, which is more suitable for special light-emitting products, such as the light source L imaging is irregular. The type or the light source L is no longer the reference color after being guided by the material.

在一實施例中,上述檢測模型31所依據的深度學習演算法可為深度神經網路演算法、一捲基神經網路演算法、一深度置信網路演算法、一遞迴神經網路演算法或一深度信念網路演算法,此並不限制。In an embodiment, the deep learning algorithm on which the detection model 31 is based may be a deep neural network algorithm, a roll-based neural network algorithm, a deep belief network algorithm, a recursive neural network algorithm, or a deep Belief network algorithms are not limited.

在一實施例中,如圖8所示,上述檢測步驟S3中之檢測模型31可依序執行取樣步驟S4、二維處理步驟S5以及深度學習步驟S6而獲得。在一實施例中,上述各步驟可透過一深度學習訓練裝置40執行,例如圖9所示,在此,深度學習訓練裝置40包括有取樣模組41、處理模組42及深度學習模組43。In an embodiment, as shown in FIG. 8, the detection model 31 in the detection step S3 can be obtained by sequentially performing the sampling step S4, the two-dimensional processing step S5, and the deep learning step S6. In an embodiment, the above steps may be performed by a deep learning training device 40, for example, as shown in FIG. 9, where the deep learning training device 40 includes a sampling module 41, a processing module 42, and a deep learning module 43. .

如圖8所示,在取樣步驟S4中,首先擷取對應於上述檢測畫面D之一樣本畫面S。例如圖3與圖9所示,可透過深度學習訓練裝置40之取樣模組41擷取樣本畫面S,其中取樣模組41具體上可同樣為相機(Camera)或感光元件。如圖3所示,在本實施例中,取樣模組41同樣是擷取一發光鍵盤K的影像而取得樣本畫面S(如圖10所示),其中樣本畫面S包括有多個合格區影像Q與多個失格區影像U,合格區影像Q與失格區影像U分別位於樣本畫面S上並對應於待測區影像T之相同預設區域。此請對照圖3、圖4及圖10所示,多個合格區影像Q與多個失格區影像U是分別由複數個位於不同位置之發光源L(例如LED)發光所形成的亮區影像,由於樣本畫面S與檢測畫面D都是拍攝發光鍵盤K而獲得,因此,合格區影像Q與失格區影像U的位置會對應於待測區影像T的位置。其中合格區影像Q為擷取合格發光源L所形成的影像,失格區影像U為擷取失格發光源L所形成的影像。也就是說,在取樣時會擷取合格的發光源L影像與不合格的發光源L影像,以供後續進行深度學習時能判別出合格與不合格兩種結果,其中合格的發光源L可指其所發出的光線符合預定的顏色或亮度,不合格的發光源L可指其所發出的光線不符合預定的顏色或亮度。然而上述實施例僅為舉例,在其他實施例中,待測物的合格區影像Q與失格區影像U分布位置應為隨機,此並不限制。As shown in FIG. 8, in the sampling step S4, a sample frame S corresponding to one of the detection frames D is first captured. For example, as shown in FIG. 3 and FIG. 9, the sample frame S can be sampled through the sampling module 41 of the deep learning training device 40. The sampling module 41 can be a camera or a light sensor. As shown in FIG. 3, in this embodiment, the sampling module 41 also captures an image of a light-emitting keyboard K to obtain a sample picture S (as shown in FIG. 10), where the sample picture S includes multiple qualified area images. Q and a plurality of disqualified area images U, the qualified area image Q and the disqualified area image U are respectively located on the sample picture S and correspond to the same preset area of the area T to be measured. Please refer to FIG. 3, FIG. 4, and FIG. 10. The multiple qualified area images Q and the multiple disqualified area images U are bright area images formed by the light sources L (such as LEDs) at different positions, respectively. Since both the sample frame S and the detection frame D are obtained by shooting the illuminated keyboard K, the positions of the qualified area image Q and the disqualified area image U will correspond to the positions of the area T to be measured. The qualified area image Q is an image formed by capturing a qualified light source L, and the disqualified area image U is an image formed by capturing a disqualified light source L. In other words, the qualified light source L image and the unqualified light source L image will be captured during sampling for subsequent deep learning to distinguish between the qualified and unqualified results. Among them, the qualified light source L can It means that the light emitted by it conforms to the predetermined color or brightness, and the unqualified light source L can mean that the light emitted by it does not conform to the predetermined color or brightness. However, the above embodiments are merely examples. In other embodiments, the distribution positions of the image Q of the qualified area and the image U of the disqualified area should be random, which is not limited.

再如圖8所示,在取樣步驟S4後,接著進行二維處理步驟S5:將合格區影像Q與失格區影像U分別處理成具有相同二維數量之合格二維樣本像素Qp 與失格二維樣本像素Up ,其中合格二維樣本像素Qp 具有一合格光學資訊,失格二維樣本像素Up 具有一失格光學資訊。舉例來說,如圖9所示,深度學習訓練裝置40的處理模組42連接取樣模組41以接收取樣模組41所擷取的樣本畫面S,處理模組42可將合格區影像Q與失格區影像U分別處理成具有相同二維數量之一合格二維樣本像素Qp 與一失格二維樣本像素Up (此如同上述影像處理模組20將各待測區影像T並分別處理成具有相同二維數量之複數個二維像素P,具體請參圖5所示,在此則不重複贅述),其中合格二維樣本像素Qp 具有一合格像素資訊(例如合格的亮度資訊、色頻資訊或其組合),失格二維樣本像素Up 具有一失格像素資訊(例如不合格的亮度資訊、色頻資訊或其組合)。As shown in FIG. 8, after the sampling step S4, a two-dimensional processing step S5 is performed: the qualified area image Q and the disqualified area image U are processed into the qualified two-dimensional sample pixels Q p and disqualified two with the same two-dimensional number, respectively. The two-dimensional sample pixel U p , wherein the qualified two-dimensional sample pixel Q p has a qualified optical information, and the disqualified two-dimensional sample pixel U p has a disqualified optical information. For example, as shown in FIG. 9, the processing module 42 of the deep learning training device 40 is connected to the sampling module 41 to receive the sample picture S captured by the sampling module 41. The processing module 42 may combine the qualified area image Q and The disqualified area image U is processed into one qualified two-dimensional sample pixel Q p and one disqualified two-dimensional sample pixel U p with the same two-dimensional number. (This is the same as the image processing module 20 described above. There are a plurality of two-dimensional pixels P having the same two-dimensional number. For details, please refer to FIG. 5, which will not be repeated here. The qualified two-dimensional sample pixel Q p has qualified pixel information (such as qualified luminance information, color, etc.). Frequency information or a combination thereof), the disqualified two-dimensional sample pixel U p has a disqualified pixel information (such as unqualified brightness information, color frequency information, or a combination thereof).

再如圖8所示,在二維處理步驟S5後,接著進行深度學習步驟S6:讀取合格區影像Q之合格二維樣本像素Qp 與失格區影像U之失格二維樣本像素Up ,並根據深度學習演算法,以合格光學資訊與失格光學資訊分別進行人工智慧演算,並獲得用以判斷出輸出層演算結果之檢測模型31。例如圖9所示,可透過深度學習訓練裝置40的深度學習模組43演算獲得檢測模型31,其中深度學習模組43連接於處理模組42以讀取合格區影像Q之合格二維樣本像素Qp 與失格區影像U之失格二維樣本像素Up 。再如圖11所示,為本發明深度學習訓練一實施例之深度學習網路圖,在本例中,深度學習模組43包括有輸入層431、隱藏層432(在此為一層,亦可包含有多層隱藏層432)以及輸出層433,其中深度學習模組43是以合格二維樣本像素Qp 與失格二維樣本像素Up 作為輸入層431的輸入資料,在深度學習訓練過程中,輸入層431會將合格二維樣本像素Qp 與失格二維樣本像素Up 傳遞至隱藏層432,經由隱藏層432依一深度學習演算法反覆進行特徵檢測與權重分配而可將演算結果傳遞至輸出層433而形成一輸出層演算結果434,例如隱藏層432可將合格二維樣本像素Qp 與失格二維樣本像素Up 分別區分至輸出層433中的合格影像區4341與失格影像區4342而形成輸出層演算結果434,也就是輸出層演算結果434中可包含合格影像區4341中的合格影像與失格影像區4342中的失格影像,進而產生上述檢測步驟S3與檢測模組30中用以判斷合格影像與失格影像之檢測模型31,以作為上述實施例之發光源檢測方法與發光源檢測系統之發光源L檢測的依據。As shown in FIG. 8, after the two-dimensional processing step S5, a deep learning step S6 is performed: a qualified two-dimensional sample pixel Q p of the qualified area image Q and a disqualified two-dimensional sample pixel U p of the disqualified area image U are read, Based on the deep learning algorithm, artificial intelligence calculations are performed with qualified optical information and disqualified optical information, and a detection model 31 is obtained to determine the calculation result of the output layer. For example, as shown in FIG. 9, the detection model 31 can be obtained through the calculation of the deep learning module 43 of the deep learning training device 40. The deep learning module 43 is connected to the processing module 42 to read the qualified two-dimensional sample pixels of the qualified area image Q. Q p and the disqualified two-dimensional sample pixel U p of the disqualified region image U. As shown in FIG. 11, a deep learning network diagram of an embodiment of deep learning training according to the present invention. In this example, the deep learning module 43 includes an input layer 431 and a hidden layer 432 (here, one layer, or Contains multiple hidden layers 432) and an output layer 433. The deep learning module 43 uses qualified two-dimensional sample pixels Q p and disqualified two-dimensional sample pixels U p as input data of the input layer 431. During the deep learning training process, The input layer 431 will pass the qualified two-dimensional sample pixels Q p and the disqualified two-dimensional sample pixels U p to the hidden layer 432. Through the hidden layer 432, iteratively performs feature detection and weight allocation according to a deep learning algorithm, and can pass the calculation results to The output layer 433 forms an output layer calculation result 434. For example, the hidden layer 432 can distinguish the qualified two-dimensional sample pixel Q p and the disqualified two-dimensional sample pixel U p into the qualified image area 4341 and the disqualified image area 4342 in the output layer 433, respectively. The output layer calculation result 434 is formed, that is, the output layer calculation result 434 may include a qualified image in the qualified image area 4341 and a disqualified image in the disqualified image area 4342, thereby generating the above detection. Step S3 and the detection model 31 in the detection module 30 for determining a qualified image and a disqualified image serve as the basis for the light source detection method and the light source L detection of the light source detection system of the above embodiments.

再如圖9所示,在一實施例中,深度學習模組43可以一維的形式(如圖6與圖7所示)或二維的形式(如圖5所示)讀取合格二維樣本像素Qp 與失格二維樣本像素Up ,此並不侷限。As shown in FIG. 9, in one embodiment, the deep learning module 43 can read the qualified two-dimensional data in one-dimensional format (as shown in FIGS. 6 and 7) or two-dimensional format (as shown in FIG. 5). The sample pixel Q p and the disqualified two-dimensional sample pixel U p are not limited.

雖然本發明的技術內容已經以較佳實施例揭露如上,然其並非用以限定本發明,任何熟習此技藝者,在不脫離本發明之精神所作些許之更動與潤飾,皆應涵蓋於本發明的範疇內,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the technical content of the present invention has been disclosed as above with preferred embodiments, it is not intended to limit the present invention. Any person skilled in the art and making some changes and retouching without departing from the spirit of the present invention should be covered by the present invention. Therefore, the scope of protection of the present invention shall be determined by the scope of the appended patent application.

1‧‧‧發光源檢測系統1‧‧‧Light source detection system

10‧‧‧影像擷取模組10‧‧‧Image capture module

11‧‧‧減光鏡11‧‧‧Dimmer

20‧‧‧影像處理模組20‧‧‧Image Processing Module

30‧‧‧檢測模組30‧‧‧Detection Module

31‧‧‧檢測模型31‧‧‧ detection model

40‧‧‧深度學習訓練裝置40‧‧‧Deep learning training device

41‧‧‧取樣模組41‧‧‧Sampling module

42‧‧‧處理模組42‧‧‧Processing Module

43‧‧‧深度學習模組43‧‧‧Deep Learning Module

431‧‧‧輸入層431‧‧‧input layer

432‧‧‧隱藏層432‧‧‧Hidden layer

433‧‧‧輸出層433‧‧‧ output layer

434‧‧‧輸出層演算結果434‧‧‧ Output layer calculation results

4341‧‧‧合格影像區4341‧‧‧Eligible image area

4342‧‧‧失格影像區4342‧‧‧Disqualified image area

S1‧‧‧擷取步驟S1‧‧‧Retrieval steps

S2‧‧‧影像處理步驟S2‧‧‧Image processing steps

S3‧‧‧檢測步驟S3‧‧‧Test steps

S4‧‧‧取樣步驟S4‧‧‧Sampling steps

S5‧‧‧二維處理步驟S5‧‧‧Two-dimensional processing steps

S6‧‧‧深度學習步驟S6‧‧‧ deep learning steps

D‧‧‧檢測畫面D‧‧‧Detection screen

K‧‧‧發光鍵盤K‧‧‧ illuminated keyboard

T‧‧‧待測區影像T‧‧‧Image to be measured

L‧‧‧發光源L‧‧‧light source

P‧‧‧二維像素P‧‧‧ 2D Pixel

S‧‧‧樣本畫面S‧‧‧ sample screen

Q‧‧‧合格區影像Q‧‧‧Eligible area image

Qp‧‧‧合格二維樣本像素Q p ‧‧‧ qualified 2D sample pixels

U‧‧‧失格區影像U‧‧‧ Disqualified area image

Up‧‧‧失格二維樣本像素U p ‧‧‧Disqualified 2D sample pixels

[圖1] 係本發明發光源檢測方法一實施例之步驟流程圖。 [圖2] 係本發明發光源檢測系統一實施例之系統方塊圖。 [圖3] 係本發明發光源檢測系統一實施例之畫面擷取示意圖。 [圖4] 係本發明發光源檢測系統一實施例之檢測畫面示意圖。 [圖5] 係本發明發光源檢測系統一實施例之二維像素示意圖。 [圖6] 係本發明待測區影像一實施例之二維像素排列示意圖。 [圖7] 係本發明待測區影像另一實施例之二維像素排列示意圖。 [圖8] 係本發明深度學習訓練方法一實施例之步驟流程圖。 [圖9] 係本發明深度學習訓練裝置一實施例之裝置方塊圖。 [圖10] 係本發明深度學習訓練裝置一實施例之取樣畫面示意圖。 [圖11] 係本發明深度學習訓練一實施例之深度學習網路圖。[Fig. 1] Fig. 1 is a flowchart of steps of an embodiment of the light source detection method of the present invention. [FIG. 2] A system block diagram of an embodiment of the light source detection system of the present invention. [Fig. 3] A schematic diagram of screen capture of an embodiment of the light source detection system of the present invention. [Fig. 4] A schematic diagram of a detection screen of an embodiment of the light source detection system of the present invention. [Fig. 5] A schematic diagram of a two-dimensional pixel of an embodiment of the light source detection system of the present invention. [Fig. 6] It is a schematic diagram of a two-dimensional pixel arrangement according to an embodiment of the image of the test area according to the present invention. [FIG. 7] It is a schematic diagram of a two-dimensional pixel arrangement of another embodiment of the image of the test area according to the present invention. [FIG. 8] It is a flowchart of the steps of an embodiment of the deep learning training method of the present invention. [FIG. 9] It is a device block diagram of an embodiment of the deep learning training device of the present invention. [Fig. 10] A schematic diagram of a sampling screen of an embodiment of the deep learning training device of the present invention. FIG. 11 is a deep learning network diagram of an embodiment of deep learning training according to the present invention.

Claims (20)

一種發光源檢測方法,包括: 擷取步驟:擷取一檢測畫面,該檢測畫面包括有複數個待測區影像,該些待測區影像分別位於該檢測畫面上複數個預設區域; 影像處理步驟:將該些待測區影像分別處理成具有相同二維數量之複數個二維像素,其中各該二維像素具有一光學資訊;以及 檢測步驟:讀取各該待測區影像之該些二維像素,並根據一檢測模型以檢測各該待測區影像之該些二維像素之該光學資訊,並判斷各該待測區影像為一合格影像或一失格影像,其中該檢測模型係指依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,且該輸出層演算結果包括有該合格影像及該失格影像。A method for detecting a luminous source includes: an acquisition step: acquiring a detection frame, the detection frame including a plurality of images to be tested, the images of the regions to be tested are respectively located in a plurality of preset areas on the detection screen; image processing Steps: processing the images of the test area into a plurality of two-dimensional pixels having the same two-dimensional number, wherein each of the two-dimensional pixels has an optical information; and the detection step: reading the images of the images of the test area Two-dimensional pixels, and according to a detection model to detect the optical information of the two-dimensional pixels of each image of the area under test, and determine that each image of the area under test is a qualified image or a disqualified image, wherein the detection model is Refers to an artificial intelligence algorithm model that performs artificial intelligence calculation according to a deep learning algorithm and obtains an output layer calculation result, and the output layer calculation result includes the qualified image and the disqualified image. 如請求項1所述之發光源檢測方法,其中該檢測步驟中之該檢測模型是由下列步驟獲得: 取樣步驟:擷取對應於該檢測畫面之一樣本畫面,該樣本畫面包括有一合格區影像與一失格區影像,該合格區影像與該失格區影像分別位於該樣本畫面上並對應於該些待測區影像之相同預設區域; 二維處理步驟:將該合格區影像與該失格區影像分別處理成具有相同二維數量之一合格二維樣本像素與一失格二維樣本像素,其中該合格二維樣本像素具有一合格光學資訊,該失格二維樣本像素具有一失格光學資訊;以及 深度學習步驟:讀取該合格區影像之該合格二維樣本像素與該失格區影像之該失格二維樣本像素、並根據該深度學習演算法,以該合格光學資訊與該失格光學資訊分別進行人工智慧演算,獲得用以判斷出該輸出層演算結果之該檢測模型。The luminous source detection method according to claim 1, wherein the detection model in the detection step is obtained by the following steps: Sampling step: acquiring a sample frame corresponding to the detection frame, the sample frame including a qualified area image And a disqualified area image, the qualified area image and the disqualified area image are respectively located on the sample screen and correspond to the same preset area of the test area images; two-dimensional processing steps: the qualified area image and the disqualified area The images are processed into one qualified two-dimensional sample pixel and one disqualified two-dimensional sample pixel with the same two-dimensional number, wherein the qualified two-dimensional sample pixel has qualified optical information, and the disqualified two-dimensional sample pixel has disqualified optical information; and Deep learning steps: Read the qualified two-dimensional sample pixels of the qualified area image and the disqualified two-dimensional sample pixels of the disqualified area image, and perform the qualified optical information and the disqualified optical information separately according to the deep learning algorithm. Artificial intelligence calculation to obtain the detection model used to determine the output layer calculation result. 如請求項1所述之發光源檢測方法,其中該深度學習演算法為一深度神經網路演算法、一捲基神經網路演算法、一深度置信網路演算法、一遞迴神經網路演算法或一深度信念網路演算法。The luminous source detection method according to claim 1, wherein the deep learning algorithm is a deep neural network algorithm, a volume-based neural network algorithm, a deep belief network algorithm, a recursive neural network algorithm, or a Deep belief network algorithms. 如請求項1所述之發光源檢測方法,其中該影像處理步驟中之各該二維像素之該光學資訊為一亮度資訊、一色頻資訊或其組合。The luminous source detection method according to claim 1, wherein the optical information of each of the two-dimensional pixels in the image processing step is a brightness information, a color frequency information, or a combination thereof. 如請求項1所述之發光源檢測方法,其中該影像處理步驟中各該二維像素之該光學資訊包括一亮度資訊,該合格影像係指各該待測區影像之該亮度資訊大於一亮度閥值之影像,該失格影像係指各該待測區影像之該亮度資訊小於該亮度閥值之影像。The luminous source detection method according to claim 1, wherein the optical information of each of the two-dimensional pixels in the image processing step includes a brightness information, and the qualified image means that the brightness information of each image of the area under test is greater than a brightness The threshold image. The disqualified image refers to an image in which the brightness information of each of the images of the area under test is smaller than the brightness threshold. 如請求項1所述之發光源檢測方法,其中該影像處理步驟中各該二維像素之該光學資訊包括一色頻資訊,該合格影像係指各該待測區影像之該色頻資訊大於一色頻閥值之影像,該失格影像係指各該待測區影像之該色頻資訊小於該色頻閥值之影像。The luminous source detection method according to claim 1, wherein the optical information of each two-dimensional pixel in the image processing step includes a color frequency information, and the qualified image means that the color frequency information of each image of the area under test is greater than one color An image with a frequency threshold. The disqualified image refers to an image in which the color frequency information of each image of the area under test is smaller than the color frequency threshold. 如請求項1所述之發光源檢測方法,其中該影像處理步驟中各該二維像素之該光學資訊為一色頻資訊,該色頻資訊包括一紅光資訊、一綠光資訊、一藍光資訊或其組合。The light source detection method according to claim 1, wherein the optical information of each two-dimensional pixel in the image processing step is a color frequency information, and the color frequency information includes a red light information, a green light information, and a blue light information Or a combination. 如請求項1所述之發光源檢測方法,其中該擷取步驟中之該檢測畫面為一減光後畫面。The light source detection method according to claim 1, wherein the detection frame in the capturing step is a dimmed frame. 如請求項1所述之發光源檢測方法,其中該影像處理步驟中之該相同二維數量介於18×18至42×42之間。The luminous source detection method according to claim 1, wherein the same two-dimensional number in the image processing step is between 18 × 18 and 42 × 42. 如請求項9所述之發光源檢測方法,其中該影像處理步驟中之該相同二維數量介於30×30至32×32之間。The luminous source detection method according to claim 9, wherein the same two-dimensional number in the image processing step is between 30 × 30 and 32 × 32. 一種發光源檢測系統,包括: 一影像擷取模組,擷取一檢測畫面,該檢測畫面包括有複數個待測區影像,該些待測區影像分別位於該檢測畫面上複數個預設區域; 一影像處理模組,電連接於該影像擷取模組,該影像處理模組接收該些待測區影像並分別處理成具有相同二維數量之複數個二維像素,其中各該二維像素具有一光學資訊;以及 一檢測模組,電連接於該影像處理模組,該檢測模組讀取各該待測區影像之該些二維像素,且根據一檢測模型以檢測各該待測區影像之該些二維像素之該些光學資訊,並判斷各該待測區影像為一合格影像或一失格影像; 其中,該檢測模型係指依一深度學習演算法進行人工智慧演算、並獲得一輸出層演算結果之人工智慧演算法模型,且該輸出層演算結果包括有該合格影像及該失格影像。A light source detection system includes: an image capture module that captures a detection picture, the detection picture includes a plurality of images to be tested, and the images to be tested are respectively located in a plurality of preset areas on the detection screen An image processing module electrically connected to the image capturing module, the image processing module receiving the images of the test area and processing them into a plurality of two-dimensional pixels having the same two-dimensional number, each of which is two-dimensional The pixel has an optical information; and a detection module electrically connected to the image processing module, the detection module reads the two-dimensional pixels of each image of the area to be tested, and detects each of the areas according to a detection model. The optical information of the two-dimensional pixels of the measurement area image, and determine that each of the measurement area images is a qualified image or a disqualified image; wherein the detection model refers to artificial intelligence calculations based on a deep learning algorithm, An artificial intelligence algorithm model of an output layer calculation result is obtained, and the output layer calculation result includes the qualified image and the disqualified image. 如請求項11所述之發光源檢測系統,更包括一深度學習訓練裝置,該深度學習訓練裝置包括: 一取樣模組,擷取一樣本畫面,該樣本畫面包括有一合格區影像與一失格區影像,該合格區影像與該失格區影像分別位於該樣本畫面上並對應於該些待測區影像之相同預設區域; 一處理模組,連接該取樣模組,該處理模組將該合格區影像與該失格區影像分別處理成具有相同二維數量之一合格二維樣本像素與一失格二維樣本像素,其中該合格二維樣本像素具有一合格像素資訊,該失格二維樣本像素具有一失格像素資訊;以及 一深度學習模組,連接於該處理模組,該深度學習模組讀取該合格二維樣本像素與該失格二維樣本像素,且該深度學習模組以該合格像素資訊與該失格像素資訊經由該深度學習演算法演算出判斷該合格影像與該失格影像之該檢測模型。The luminous source detection system according to claim 11, further comprising a deep learning training device, the deep learning training device includes: a sampling module, which captures a sample picture, the sample picture includes a qualified area image and a disqualified area Image, the qualified area image and the disqualified area image are respectively located on the sample screen and correspond to the same preset area of the images of the tested areas; a processing module is connected to the sampling module, and the processing module is qualified The area image and the disqualified area image are respectively processed into a qualified two-dimensional sample pixel and a disqualified two-dimensional sample pixel with the same two-dimensional number, wherein the qualified two-dimensional sample pixel has a qualified pixel information, and the disqualified two-dimensional sample pixel has A disqualified pixel information; and a deep learning module connected to the processing module, the deep learning module reads the qualified two-dimensional sample pixel and the disqualified two-dimensional sample pixel, and the deep learning module uses the qualified pixel The information and the disqualified pixel information are calculated through the deep learning algorithm to determine the detection model of the qualified image and the disqualified image. 如請求項11所述之發光源檢測系統,其中該深度學習演算法為一深度神經網路演算法、一捲基神經網路演算法、一深度置信網路演算法、一遞迴神經網路演算法或一深度信念網路演算法。The luminous source detection system according to claim 11, wherein the deep learning algorithm is a deep neural network algorithm, a volume-based neural network algorithm, a deep belief network algorithm, a recursive neural network algorithm, or a Deep belief network algorithms. 如請求項11所述之發光源檢測系統,其中各該二維像素之該光學資訊為一亮度資訊、一色頻資訊或其組合。The luminous source detection system according to claim 11, wherein the optical information of each two-dimensional pixel is a brightness information, a color frequency information, or a combination thereof. 如請求項11所述之發光源檢測系統,其中各該二維像素之該光學資訊包括一亮度資訊,該合格影像係指各該待測區影像之該亮度資訊大於一亮度閥值之影像,該失格影像係指各該待測區影像之該亮度資訊小於該亮度閥值之影像。The luminous source detection system according to claim 11, wherein the optical information of each two-dimensional pixel includes a brightness information, and the qualified image refers to an image in which the brightness information of each image of the area to be measured is greater than a brightness threshold, The disqualified image refers to an image in which the brightness information of each image of the area under test is less than the brightness threshold. 如請求項11所述之發光源檢測系統,其中各該二維像素之該光學資訊包括一色頻資訊,該合格影像係指各該待測區影像之該色頻資訊大於一色頻閥值之影像,該失格影像係指各該待測區影像之該色頻資訊小於該色頻閥值之影像。The luminous source detection system according to claim 11, wherein the optical information of each of the two-dimensional pixels includes a color frequency information, and the qualified image refers to an image in which the color frequency information of each image of the area under test is greater than a color frequency threshold The disqualified image refers to an image in which the color frequency information of each image of the area under test is smaller than the color frequency threshold. 如請求項11所述之發光源檢測系統,其中各該二維像素之該光學資訊為一色頻資訊,該色頻資訊包括一紅光資訊、一綠光資訊、一藍光資訊或其組合。The light source detection system according to claim 11, wherein the optical information of each two-dimensional pixel is a color frequency information, and the color frequency information includes a red light information, a green light information, a blue light information, or a combination thereof. 如請求項11所述之發光源檢測系統,其中該影像擷取模組包括一減光鏡,以經由該減光鏡擷取該檢測畫面。The luminous source detection system according to claim 11, wherein the image capture module includes a dimmer lens to capture the detection frame through the dimmer lens. 如請求項11所述之發光源檢測系統,其中該相同二維數量介於18×18至42×42之間。The luminous source detection system according to claim 11, wherein the same two-dimensional number is between 18 × 18 and 42 × 42. 如請求項19所述之發光源檢測系統,其中該相同二維數量介於30×30至32×32之間。The luminous source detection system according to claim 19, wherein the same two-dimensional number is between 30 × 30 and 32 × 32.
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