TW201920642A - Mask cleaning solution composition - Google Patents

Mask cleaning solution composition Download PDF

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TW201920642A
TW201920642A TW108105001A TW108105001A TW201920642A TW 201920642 A TW201920642 A TW 201920642A TW 108105001 A TW108105001 A TW 108105001A TW 108105001 A TW108105001 A TW 108105001A TW 201920642 A TW201920642 A TW 201920642A
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mask
cleaning
cleaning liquid
group
hydrocarbon group
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TWI705133B (en
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金聖植
金正鉉
房淳洪
高京俊
趙漢爀
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南韓商東友精細化工有限公司
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    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3263Amides or imides
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/50Solvents
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Electroluminescent Light Sources (AREA)
  • Detergent Compositions (AREA)

Abstract

The present invention provides a mask cleaning liquid composition characterized by comprising the amide compound represented by the following chemical formula 1, wherein R1 and R2 are each independently a methyl group or an ethyl group; R3 is hydrogen or a C1 to C4 saturated or unsaturated hydrocarbon group substituted or un-substituted with a C1 to C4 alkoxy group, wherein, when R1 and R2 are a methyl group, R3 is a saturated hydrocarbon group of C2 to C4 or an unsaturated hydrocarbon group of C2 to C4 substituted or un-substituted by a C1-C4 alkoxy group. The mask cleaning liquid composition of the present invention has an advantage of exhibiting a good cleaning power and facilitating an easier operable process even without using any environmentally controlled substance such as NMP.

Description

遮罩清洗液組合物Mask cleaning liquid composition

本發明係有關於一種遮罩清洗液組合物,具體而言,涉及用於去除真空蒸鍍製程中所使用的遮罩上的各種有機物的遮罩清洗液組合物。The present invention relates to a mask cleaning liquid composition, and more particularly, to a mask cleaning liquid composition for removing various organic matters from a mask used in a vacuum evaporation process.

平板顯示器(flat panel display,FPD)作為顯示裝置受到關注,其中,液晶顯示裝置和有機發光二極體(Organic Light Emitting Diode,OLED)成為關注對象。Flat panel displays (FPDs) have attracted attention as display devices. Among them, liquid crystal display devices and Organic Light Emitting Diodes (OLEDs) have become the focus of attention.

目前,作為顯示器最常用的液晶顯示裝置具有比以往的陰極射線管(Cathode ray tube;CRT)輕、體積小且低耗電等優點。但是存在如下缺點:由於不是自發光,因此需要使用背光(Backlight),且因使用液晶而視角受限。At present, the most commonly used liquid crystal display devices as displays have advantages such as lighter weight, smaller size, and lower power consumption than conventional cathode ray tubes (CRT). However, there are disadvantages: since it is not self-emissive, a backlight needs to be used, and the viewing angle is limited due to the use of liquid crystal.

與此相對,OLED元件具有驅動電壓低、發光效率高、視角寬、回應速度快等優點,尤其由於是自發光型,因而具有不需要背光等優點。這樣的OLED元件通過使用自發光的發光有機物,從而由陰極和陽極供給的電子和空穴再結合而發出光。In contrast, OLED elements have the advantages of low driving voltage, high luminous efficiency, wide viewing angle, and fast response speed. Especially since they are self-luminous, they have the advantage of not requiring a backlight. Such an OLED element emits light by using a self-luminous light-emitting organic substance so that electrons and holes supplied from a cathode and an anode are recombined.

對於這樣的OLED之類的半導體設備或平板顯示器而言,為了在製程中形成各種發光層、電洞注入層、電洞傳輸層、電子傳輸層、電子注入層等有機物層,會利用遮罩來實施有機物的蒸鍍。此時,有機物也附著於遮罩的表面,由於這樣附著的有機物,通過遮罩形成的圖案的形狀可能會變形。這會導致蒸鍍製程的效率降低,對所製造的半導體設備或平板顯示器的性能也可能造成影響,因此有必要去除蒸鍍於遮罩的有機物。For semiconductor devices such as OLEDs or flat panel displays, in order to form various organic layers such as light emitting layers, hole injection layers, hole transport layers, electron transport layers, and electron injection layers in the manufacturing process, a mask is used to An organic substance is vapor-deposited. At this time, the organic matter is also attached to the surface of the mask. Due to the organic matter thus adhered, the shape of the pattern formed by the mask may be deformed. This will lead to a decrease in the efficiency of the evaporation process and may affect the performance of the manufactured semiconductor device or flat panel display. Therefore, it is necessary to remove the organic substances deposited on the mask.

韓國公開專利第2011-0095814號有關於一種蒸鍍材料清洗液組合物和利用該蒸鍍材料清洗液組合物的清洗方法,公開了有關於包含N-甲基-2-吡咯烷酮(N-Methyl-2-pyrrolidone)和1,3-二甲基-2-咪唑啉酮(1,3-Dimethyl-2- imidazolidinone)的蒸鍍材料清洗液組合物的內容。Korean Laid-Open Patent No. 2011-0095814 relates to a cleaning material composition for a vapor deposition material and a cleaning method using the cleaning material composition for a vapor deposition material, and discloses a method containing N-methyl-2-pyrrolidone (N-Methyl- 2-pyrrolidone), and 1,3-Dimethyl-2-imidazolidinone (1,3-Dimethyl-2-imidazolidinone) vapor deposition material cleaning solution composition.

韓國公開專利第1388283號有關於一種遮罩清洗裝置,公開了有關於具有如下特徵的遮罩清洗裝置的內容,即,包含:產生超音波而清洗浸沒於清洗液的遮罩的超音波清洗部;用於排出和供給上述超音波清洗部的清洗液的清洗液迴圈部,上述超音波清洗部中的超音波的頻率為75KHz以上90KHz以下,強度為800W以上1100W以下,上述清洗液為N-甲基吡咯烷酮(N-Methyl Pyrrolidinone;NMP)混合物。Korean Laid-Open Patent No. 1388283 relates to a mask cleaning device, which discloses a mask cleaning device having the following characteristics, that is, an ultrasonic cleaning unit that generates an ultrasonic wave and cleans a mask immersed in a cleaning solution. ; The cleaning liquid loop part for discharging and supplying the cleaning liquid of the ultrasonic cleaning part, the frequency of the ultrasonic wave in the ultrasonic cleaning part is 75KHz to 90KHz, the intensity is 800W to 1100W, and the cleaning liquid is N -N-Methyl Pyrrolidinone (NMP) mixture.

但是,以往遮罩清洗液中所使用的N-甲基-2-吡咯烷酮(NMP)為有毒物質,具體而言,根據韓國國立環境科學院第2014-25號,其是含有0.3重量%以上時被分類為有毒物的物質。使用包含NMP的遮罩清洗液的情況下,不僅對人體有害,而且在環境方面也不佳。However, N-methyl-2-pyrrolidone (NMP) used in conventional mask cleaning liquids is a toxic substance. Specifically, according to Korean National Institute of Environmental Sciences No. 2014-25, it is contained at a content of 0.3% by weight or more. Substances classified as toxic. When using a mask cleaning solution containing NMP, it is not only harmful to the human body, but also environmentally unsound.

此外,遮罩清洗製程根據製程狀況而確定操作時間,因此不應當在大氣狀態下長期保存後發生性能降低。特別是由於露出於大氣中,因此不應當因水分吸收而發生性能降低。In addition, the mask cleaning process determines the operating time according to the process conditions, so performance degradation should not occur after long-term storage in the atmospheric state. In particular, due to exposure to the atmosphere, performance degradation should not occur due to moisture absorption.

由此,要求開發即使不包含NMP之類的環境管制物質清洗力也優異、不發生因水分吸收而導致的性能降低、易於製程操作的遮罩清洗液。Therefore, it is required to develop a mask cleaning liquid that is excellent in cleaning power even if it does not contain environmentally controlled substances such as NMP, does not cause degradation in performance due to moisture absorption, and is easy to handle.

現有技術文獻Prior art literature

專利文獻Patent literature

韓國公開專利第2011-0095814號(2011.08.25.)Korean Published Patent No. 2011-0095814 (2011.08.25.)

韓國公開專利第1388283號(2014.04.16.)Korean Published Patent No. 1388283 (2014.04.16.)

所要解決的課題Problems to be solved

本發明的目的在於,提供即使不包含環境管制物質也顯示良好的清洗力的清洗液組合物。An object of the present invention is to provide a cleaning liquid composition that exhibits a good cleaning power even without containing an environmentally controlled substance.

此外,本發明的目的在於,提供不需要超音波和電解清洗且穩定性優異而易於製程操作的清洗液組合物。Another object of the present invention is to provide a cleaning liquid composition that does not require ultrasonic and electrolytic cleaning and is excellent in stability and easy to process.

解決課題的方法Problem solving

用於實現上述目的的本發明的清洗液組合物的特徵在於,包含下述化學式1所表示的醯胺系化合物。The cleaning liquid composition of the present invention for achieving the above-mentioned object is characterized by including a sulfonamide-based compound represented by the following Chemical Formula 1.

[化學式1] [Chemical Formula 1]

上述化學式1中,In the above Chemical Formula 1,

R1和R2各自獨立地為甲基或乙基,R3為氫、或者被C1~C4的烷氧基取代或非取代的C1~C4的飽和或不飽和烴基,其中,當R1和R2為甲基時,R3為被C1~C4的烷氧基取代或非取代的C2~C4的飽和烴基或C2~C4的不飽和烴基。R1 and R2 are each independently methyl or ethyl, R3 is hydrogen, or C1 ~ C4 saturated or unsaturated hydrocarbon group substituted or unsubstituted by C1 ~ C4 alkoxy group, wherein when R1 and R2 are methyl In this case, R3 is a saturated hydrocarbon group of C2 to C4 or an unsaturated hydrocarbon group of C2 to C4 substituted or unsubstituted by an alkoxy group of C1 to C4.

發明效果Invention effect

本發明的遮罩清洗液組合物具有即使不包含NMP之類的環境管制物質也能顯示良好的清洗力而易於製程操作的優點。The mask cleaning liquid composition of the present invention has the advantages of exhibiting good cleaning power even when it does not contain environmentally controlled substances such as NMP, and is easy to process.

此外,本發明的遮罩清洗液組合物具有抑制因水分吸收而導致的性能降低的優點。In addition, the mask cleaning liquid composition of the present invention has an advantage of suppressing a decrease in performance due to moisture absorption.

此外,在利用本發明的遮罩清洗液組合物清洗遮罩的情況下具有不需要超音波和電解清洗的優點。In addition, when the mask is cleaned with the mask cleaning liquid composition of the present invention, there is an advantage that ultrasonic waves and electrolytic cleaning are not required.

以下,對本發明進行更詳細說明。Hereinafter, the present invention will be described in more detail.

本發明中,當指出某一構件位於另一構件「上」時,其不僅包括某一構件與另一構件接觸的情況,還包括兩構件之間存在其他構件的情況。In the present invention, when it is pointed out that a certain component is "on" another component, it includes not only the case where a certain component is in contact with another component, but also the case where other components are present between the two components.

本發明中,當指出某一部分「包含」某一構成要素時,其意味著只要沒有特別相反的記載,則可以進一步包含其他構成要素,而不是將其他構成要素排除。In the present invention, when a certain part “contains” a certain constituent element, it means that as long as there is no particularly contrary description, other constituent elements may be further included instead of excluding other constituent elements.

本發明的一方面有關於包含下述化學式1所表示的醯胺系化合物的遮罩清洗液組合物。One aspect of the present invention relates to a mask cleaning solution composition containing a fluorene-based compound represented by the following Chemical Formula 1.

[化學式1] [Chemical Formula 1]

上述化學式1中,In the above Chemical Formula 1,

R1和R2各自獨立地為甲基或乙基,R3為氫、或者被C1~C4的烷氧基取代或非取代的C1~C4的飽和或不飽和烴基,其中,當R1和R2為甲基時,R3為被C1~C4的烷氧基取代或非取代的C2~C4的飽和烴基或C2~C4的不飽和烴基。R1 and R2 are each independently methyl or ethyl, R3 is hydrogen, or C1 ~ C4 saturated or unsaturated hydrocarbon group substituted or unsubstituted by C1 ~ C4 alkoxy group, wherein when R1 and R2 are methyl In this case, R3 is a saturated hydrocarbon group of C2 to C4 or an unsaturated hydrocarbon group of C2 to C4 substituted or unsubstituted by an alkoxy group of C1 to C4.

本發明中,烷氧基可以為直鏈、支鏈或環狀鏈。烷氧基的碳原子數雖然沒有特別限定,但較佳碳原子數為1~4。具體而言,可以舉出甲氧基、乙氧基、正丙氧基、異丙氧基、正丁氧基、異丁氧基、叔丁氧基、仲丁氧基等,但不限於此。In the present invention, the alkoxy group may be a linear, branched or cyclic chain. Although the number of carbon atoms of the alkoxy group is not particularly limited, the number of carbon atoms is preferably 1 to 4. Specific examples include, but are not limited to, methoxy, ethoxy, n-propoxy, isopropoxy, n-butoxy, isobutoxy, tert-butoxy, and sec-butoxy. .

本發明中,飽和烴基可以為滿足上述碳原子數的直鏈或支鏈和環狀的任一種。In the present invention, the saturated hydrocarbon group may be any of a straight chain, a branched chain, and a cyclic ring that satisfy the above-mentioned number of carbon atoms.

作為上述直鏈或支鏈的飽和烴基,可以舉出甲基、乙基、丙基、丁基等直鏈狀烷基;異丙基、異丁基等支鏈狀烷基等。上述飽和烴基較佳碳原子數為1~4,更佳碳原子數為1~3。但在R1和R2均為甲基的情況下,上述飽和烴基的碳原子數為2~4。Examples of the linear or branched saturated hydrocarbon group include linear alkyl groups such as methyl, ethyl, propyl, and butyl; branched alkyl groups such as isopropyl and isobutyl; and the like. The saturated hydrocarbon group preferably has 1 to 4 carbon atoms, and more preferably 1 to 3 carbon atoms. However, when R1 and R2 are both methyl groups, the carbon number of the saturated hydrocarbon group is 2 to 4.

作為上述環狀的飽和烴基,可以舉出環丙基、環丁基等。Examples of the cyclic saturated hydrocarbon group include a cyclopropyl group and a cyclobutyl group.

本發明中,不飽和烴基在末端具有不飽和基團,其可以為碳原子數2~4的直鏈型脂肪族不飽和烴基、支鏈型脂肪族不飽和烴基。上述直鏈型脂肪族不飽和烴基比如可以舉出乙烯基、丙烯基(烯丙基)、丁烯基等,作為上述支鏈型不飽和烴基,比如可以舉出1-甲基丙烯基、2-甲基丙烯基等,但不限於此。In the present invention, the unsaturated hydrocarbon group has an unsaturated group at the terminal, which may be a linear aliphatic unsaturated hydrocarbon group having a carbon number of 2 to 4, or a branched aliphatic unsaturated hydrocarbon group. Examples of the linear aliphatic unsaturated hydrocarbon group include vinyl, propenyl (allyl), and butenyl, and examples of the branched unsaturated hydrocarbon group include 1-methacryl, 2 -Methacryl and the like, but not limited thereto.

本發明的遮罩清洗液組合物可以為上述化學式1所表示的醯胺系化合物單獨(neat,純)狀態。比如,本發明的遮罩清洗液組合物可以由上述化學式1所表示的醯胺系化合物形成。The mask cleaning liquid composition of the present invention may be in a neat (pure) state of the amidoamine compound represented by the above Chemical Formula 1. For example, the mask cleaning liquid composition of the present invention can be formed from a fluorene-based compound represented by the aforementioned Chemical Formula 1.

本發明的一實施方式中,上述化學式1所表示的醯胺系化合物可以為選自由N,N-二甲基丙醯胺、N,N-二甲基異丁醯胺、N,N-二甲基丙烯醯胺、N,N-二甲基甲基丙烯醯胺、N,N-二乙基甲醯胺、N,N-二乙基乙醯胺、N,N-二乙基丙醯胺、N,N-二乙基異丁醯胺、N,N-二乙基丙烯醯胺、N,N-二乙基甲基丙烯醯胺、3-甲氧基-N,N-二甲基丙醯胺和3-丁氧基-N,N-二甲基丙醯胺組成的組中的一種以上,比如,可以單獨或將兩者以上混合使用。In one embodiment of the present invention, the amidamine-based compound represented by the above Chemical Formula 1 may be selected from the group consisting of N, N-dimethylpropanamide, N, N-dimethylisobutylamidine, and N, N-diamine. Methacrylamide, N, N-dimethylmethacrylamine, N, N-diethylmethaneamine, N, N-diethylacetamide, N, N-diethylpropylamine Amine, N, N-diethylisobutylamidine, N, N-diethylacrylamidine, N, N-diethylmethacrylamidine, 3-methoxy-N, N-dimethylformamide One or more of the group consisting of propylpropylamine and 3-butoxy-N, N-dimethylpropylamine, for example, can be used alone or in combination of two or more.

本發明的遮罩清洗液組合物由於包含上述化學式1所表示的醯胺系化合物,因此具有遮罩清洗力優異,不會對遮罩、比如形成遮罩的SUS、不脹鋼(Invar)等物質造成損傷的優點,並且由於可以替代NMP之類的環境有害物質,因此具有環境方面優異且製程方面也容易的優點。具體而言,本發明的遮罩清洗液組合物具有不會對有機發光元件的圖案形成中所使用的不脹鋼材質的遮罩和支援上述遮罩的不銹鋼(SUS 304、316、420等)基材等造成腐蝕等之類的損傷的優點。Since the mask cleaning liquid composition of the present invention contains a fluorene-based compound represented by the above Chemical Formula 1, it has excellent mask cleaning power, and does not affect masks such as SUS, Invar, etc. that form a mask. The material has the advantages of damage, and because it can replace environmentally harmful substances such as NMP, it has the advantages of being excellent in the environment and easy in the process. Specifically, the mask cleaning liquid composition of the present invention includes a non-expandable steel material mask that is not used for patterning organic light-emitting elements, and a stainless steel (SUS 304, 316, 420, etc.) that supports the mask. The base material has the advantage of causing damage such as corrosion.

比如,本發明的遮罩清洗液組合物對於附著在上述遮罩的各種有機物質的清洗力優異。For example, the mask cleaning liquid composition of this invention is excellent in the cleaning power with respect to the various organic substances adhering to the said mask.

上述有機物質比如可以為形成發出紅色、綠色和/或藍色的發光層、電洞傳輸層(HTL)、空穴注入層(HIL)等的物質。上述發光層可以發出紅色、綠色和/或藍色的光,可以由磷光物質或螢光物質形成。此時,作為上述發光主體材料,可以使用(咔唑-9-基)聯苯((carbazole-9-yl)biphenyl,CBP)或1,3-二(咔唑-9-基)苯(1,3-bis(carbazol-9-yl)benzene,mCP),但並不僅限於此。The organic substance may be, for example, a substance that forms a red, green, and / or blue light emitting layer, a hole transport layer (HTL), a hole injection layer (HIL), and the like. The light emitting layer may emit red, green, and / or blue light, and may be formed of a phosphorescent substance or a fluorescent substance. At this time, as the light-emitting host material, (carbazole-9-yl) biphenyl (Ccarbazole-9-yl) biphenyl (CBP) or 1,3-bis (carbazole-9-yl) benzene (1 , 3-bis (carbazol-9-yl) benzene, mCP), but it is not limited to this.

作為紅色發光摻雜物,可以使用二(1-苯基異喹啉)乙醯丙酮銥(bis(1-phenylisoquinoline)acetylacetonato iridium,PIQIr(acac))、二(1-苯基喹啉)乙醯丙酮銥((bis(1-phenylquinoline)acetylacetonato iridium,PQIr(acac))、三(1-苯基喹啉)銥(tris(1-phenylquinoline)iridium,PQIr)、八乙基卟啉鉑(octaethylporphyrin platinum,PtOEP)之類的磷光物質,或三(8-羥基喹啉)鋁(tris-(8-hydroxyquinoline)aluminum,Alq3)之類的螢光物質等。As the red light-emitting dopant, bis (1-phenylisoquinoline) acetylacetonato iridium (PIQIr (acac)), bis (1-phenylquinoline) acetamidine can be used. Acetone iridium (bis (1-phenylquinoline) acetylacetonato iridium (PQIr (acac)), tris (1-phenylquinoline) iridium (PQIr), octaethylporphyrin platinum Phosphorescent substances such as PtOEP), or fluorescent substances such as tris- (8-hydroxyquinoline) aluminum (Alq3).

作為綠色發光摻雜物,可以使用面式-三(2-苯基吡啶)銥(fac tris(2-phenylpyridine)iridium,Ir(ppy)3 )之類的磷光物質、或三(8-羥基喹啉)鋁(tris-(8-hydroxyquinoline)aluminum,Alq3)之類的螢光物質,但並不僅限於此。As the green light-emitting dopant, a phosphorescent substance such as fac tris (2-phenylpyridine) iridium (Ir (ppy) 3 ) or tris (8-hydroxyquine) can be used. (Fluoroline) aluminum (tris- (8-hydroxyquinoline) aluminum, Alq3), but it is not limited to this.

作為藍色發光摻雜物,可以使用(4,6-F2 ppy)2 Irpic之類的磷光物質,或螺-DPVBi、螺-6P、二苯乙烯基苯(DSB)、二苯乙烯基亞芳基(distyrylarylene,DSA)、PFO系高分子,PPV系高分子之類的螢光物質,但並不僅限於此。As the blue light-emitting dopant, a phosphorescent substance such as (4,6-F 2 ppy) 2 Irpic, or spiro-DPVBi, spiro-6P, distyrylbenzene (DSB), distyryl Fluorescent substances such as aromatic (DSA), PFO-based polymers, and PPV-based polymers are not limited thereto.

電洞傳輸層可以由選自由N,N′-二(1-萘基)-N,N′-二苯基-(1,1′-聯苯基)-4,4′-二胺(N,N′-Di(1-naphthyl)-N,N′-diphenyl-(1,1′-biphenyl)-4,4′-diamine,NPD)、N,N'-雙(3-甲基苯基)-N,N'-二(苯基)-聯苯胺(N,N'-bis-(3-methylphenyl) -N,N'-bis-(phenyl)-benzidine,TPD)、s-TAD和4,4',4"-三(N-3-甲基苯基-N-苯基-氨基)-三苯胺(4,4',4"- Tris(N-3-methylphenyl-N-phenyl-amino)-triphenylamine,MTDATA)組成的群組中的任一種以上形成,但不限於此。比如,作為電洞傳輸層材料,可以舉出三唑衍生物、噁二唑衍生物、咪唑衍生物、聚芳基烷烴(polyarylalkane)衍生物、吡唑啉衍生物和吡唑啉酮衍生物、苯二胺衍生物、芳基胺衍生物、氨基取代查耳酮衍生物、噁唑衍生物、苯乙烯基蒽衍生物、芴酮衍生物、腙衍生物、芪衍生物、矽氮烷衍生物、聚矽烷系、苯胺系共聚物、導電性高分子低聚物(尤其噻吩低聚物)等。The hole transport layer may be selected from N, N′-bis (1-naphthyl) -N, N′-diphenyl- (1,1′-biphenyl) -4,4′-diamine (N , N′-Di (1-naphthyl) -N, N′-diphenyl- (1,1′-biphenyl) -4,4′-diamine (NPD), N, N′-bis (3-methylphenyl) ) -N, N'-bis (phenyl) -benzidine (N, N'-bis- (3-methylphenyl) -N, N'-bis- (phenyl) -benzidine (TPD)), s-TAD and 4 , 4 ', 4 "-Tri (N-3-methylphenyl-N-phenyl-amino) -triphenylamine (4,4', 4"-Tris (N-3-methylphenyl-N-phenyl-amino ) -triphenylamine (MTDATA) is formed in any one or more groups, but is not limited thereto. For example, as the hole transport layer material, triazole derivatives, oxadiazole derivatives, imidazole derivatives, polyarylalkane derivatives, pyrazoline derivatives and pyrazolinone derivatives, Phenylenediamine derivative, arylamine derivative, amino substituted chalcone derivative, oxazole derivative, styrylanthracene derivative, fluorenone derivative, fluorene derivative, stilbene derivative, silazane derivative , Polysilane-based, aniline-based copolymers, conductive polymer oligomers (especially thiophene oligomers), and the like.

此外,可以使用除了上述之外的電洞阻擋層中所包含的噁二唑衍生物或三唑衍生物、菲咯啉衍生物、2,9-二甲基-4,7-二苯基-1,10-菲咯啉(2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline,BCP)、鋁錯合物等,作為電洞注入層材料,可以使用選自由銅酞菁(copper phthalocyanine,CuPc)、聚(3,4-亞乙二氧基噻吩)(Poly(3,4-ethylene dioxythiophene),PEDOT)、聚苯胺(polyaniline,PANI)和NPD組成的群組中的一種以上。In addition, an oxadiazole derivative or a triazole derivative, a phenanthroline derivative, a 2,9-dimethyl-4,7-diphenyl- As a material for the hole injection layer, 1,10-phenanthroline (2,9-dimethyl-4,7-diphenyl-1,10-phenanthroline (BCP), aluminum complex, etc.) can be selected from copper phthalocyanine ( one or more of the group consisting of copper phthalocyanine (CuPc), poly (3,4-ethylene dioxythiophene) (Pod (3,4-ethylene dioxythiophene), PEDOT), polyaniline (PANI), and NPD .

本發明的另一實施方式中,上述遮罩清洗液組合物可以進一步包含水溶性極性溶劑。In another embodiment of the present invention, the mask cleaning liquid composition may further include a water-soluble polar solvent.

本發明的另一實施方式中,上述水溶性極性溶劑可以包含選自由質子性極性溶劑和非質子性極性溶劑組成的群組中的一種以上。In another embodiment of the present invention, the water-soluble polar solvent may include one or more members selected from the group consisting of a protic polar solvent and an aprotic polar solvent.

具體而言,本發明的水溶性極性溶劑可以舉出質子性極性溶劑和非質子性極性溶劑,可以將它們單獨或混合使用。Specifically, the water-soluble polar solvent of the present invention includes a protic polar solvent and an aprotic polar solvent, and these may be used alone or in combination.

上述質子性極性溶劑比如可以舉出乙二醇單甲基醚、乙二醇單乙基醚、乙二醇單異丙基醚、乙二醇單丁基醚、二乙二醇單甲基醚、二乙二醇單乙基醚、二乙二醇單異丙基醚、二乙二醇單丁基醚、三乙二醇單甲基醚、三乙二醇單乙基醚、三乙二醇單異丙基醚、三乙二醇單丁基醚、聚乙二醇單甲基醚、聚乙二醇單丁基醚、丙二醇單甲基醚、二丙二醇單甲基醚、三丙二醇單甲基醚等亞烷基二醇單烷基醚;和四氫糠醇等,還可以舉出4-羥基甲基-1,3-二氧戊烷、4-羥基甲基-2,2-二甲基-1,3-二氧戊烷、4-羥基乙基-2,2-二甲基-1,3-二氧戊烷、4-羥基丙基-2,2-二甲基-1,3-二氧戊烷、4-羥基丁基-2,2-二甲基-1,3-二氧戊烷、4-羥基甲基-2,2-二乙基-1,3-二氧戊烷、4-羥基甲基-2-甲基-2-乙基-1,3-二氧戊烷等羥基二氧戊烷系化合物,它們可以使用單獨一種或兩種以上一起使用,但不限於此,可以使用本領域中通常使用的、不阻礙本發明的目的的質子性極性溶劑。Examples of the protic polar solvent include ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monoisopropyl ether, ethylene glycol monobutyl ether, and diethylene glycol monomethyl ether. , Diethylene glycol monoethyl ether, diethylene glycol monoisopropyl ether, diethylene glycol monobutyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, triethylene glycol Alcohol monoisopropyl ether, triethylene glycol monobutyl ether, polyethylene glycol monomethyl ether, polyethylene glycol monobutyl ether, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, tripropylene glycol mono Alkylene glycol monoalkyl ethers such as methyl ether; and tetrahydrofurfuryl alcohol, etc., and also include 4-hydroxymethyl-1,3-dioxolane, 4-hydroxymethyl-2,2-di Methyl-1,3-dioxolane, 4-hydroxyethyl-2,2-dimethyl-1,3-dioxolane, 4-hydroxypropyl-2,2-dimethyl-1 , 3-dioxolane, 4-hydroxybutyl-2,2-dimethyl-1,3-dioxolane, 4-hydroxymethyl-2,2-diethyl-1,3-di Oxypentane, 4-hydroxymethyl-2-methyl-2-ethyl-1,3-dioxolane and other hydroxydioxolane-based compounds may be used alone or in combination of two or more. Not limited to this Commonly used in the art may be used, protic polar solvent does not inhibit the object of the present invention.

作為上述非質子性極性溶劑的例子,比如可以舉出γ-丁內酯等內酯化合物;二甲基亞碸(DMSO)、環丁碸等亞碸化合物;磷酸三乙酯、磷酸三丁酯等磷酸酯化合物;碳酸二甲酯、碳酸亞乙酯、碳酸亞丙酯等碳酸酯化合物,它們可以單獨或將兩種以上混合使用,但也不限於此。Examples of the above-mentioned aprotic polar solvent include lactone compounds such as γ-butyrolactone; osmium compounds such as dimethylsulfinium (DMSO) and cyclobutane; triethyl phosphate and tributyl phosphate And other phosphate compounds; carbonate compounds such as dimethyl carbonate, ethylene carbonate, and propylene carbonate, which can be used alone or as a mixture of two or more, but are not limited thereto.

上述水溶性極性溶劑與上述化學式1所表示的醯胺系化合物一起發揮使殘留於遮罩的有機材料溶解的作用,此外可以發揮如下作用:在清洗後去離子水的沖洗過程中容易利用水去除清洗液,從而能夠使被去除的有機材料的再吸附/再附著最少化或者提高特定有機材料的去除力。The water-soluble polar solvent works together with the amidoamine compound represented by the above Chemical Formula 1 to dissolve the organic material remaining in the mask, and can also play a role in that it can be easily removed by water during the rinse process of deionized water after washing The cleaning liquid can minimize re-adsorption / re-adhesion of the removed organic material or improve the removal force of the specific organic material.

上述水溶性極性溶劑可以根據後續清洗製程中所要求的性能而選擇,為了適宜的清洗力和工序的穩定操作,較佳上述水溶性極性溶劑的沸點不低。比如,較佳具有150~290℃的沸點。在使用具有上述範圍內的沸點的水溶性極性溶劑的情況下,在環境方面、製程方面考慮較佳。The water-soluble polar solvent can be selected according to the performance required in the subsequent cleaning process. For proper cleaning power and stable operation of the process, the boiling point of the water-soluble polar solvent is preferably not low. For example, it is preferred to have a boiling point of 150 to 290 ° C. When a water-soluble polar solvent having a boiling point within the above range is used, environmental considerations and manufacturing process considerations are preferred.

在上述水溶性溶劑的沸點低的情況下,因在清洗製程中被揮發而製程使用量變多,可能對操作環境造成不良影響,因此較佳使用具有上述範圍內的沸點的水溶性極性溶劑。In the case where the water-soluble solvent has a low boiling point, the amount used in the process is increased due to volatilization in the cleaning process, which may adversely affect the operating environment. Therefore, it is preferable to use a water-soluble polar solvent having a boiling point within the above range.

本發明的另一實施方式中,相對於上述清洗液組合物整體100重量份,上述水溶性極性溶劑的含量可以為1~50重量份,較佳為5~40重量份,更佳為5~30重量份。在上述水溶性極性溶劑的含量處於上述範圍內的情況下,存在能夠製造清洗力優異並且在清洗後去離子水的沖洗製程中去除容易的清洗液組合物的優點,因此較佳。In another embodiment of the present invention, the content of the water-soluble polar solvent may be 1 to 50 parts by weight, preferably 5 to 40 parts by weight, and more preferably 5 to 100 parts by weight with respect to the entire cleaning solution composition. 30 parts by weight. When the content of the water-soluble polar solvent is within the above range, there is an advantage that it is possible to produce a cleaning liquid composition having excellent cleaning power and easy removal in a rinse process of deionized water after cleaning, so it is preferable.

本發明的清洗液組合物由於包含上述化學式1所表示的醯胺系化合物而具有優異的清洗力,因此具有不需要超音波和電解清洗等的優點。Since the cleaning liquid composition of the present invention contains an amidine-based compound represented by the above Chemical Formula 1 and has excellent cleaning power, it has the advantage that ultrasonic waves, electrolytic cleaning, and the like are not required.

以下,為了具體說明本說明書,舉出實施例進行詳細說明。然而,本說明書中的實施例可以變形為其他各種形態,不應被解釋為本說明書的範圍受到下述實施例的限定,本說明書的實施例是為了向本領域內具有通常知識者更完整地說明而提供的。此外,下文中,表示含量的「%」及「份」只要沒有特別提及則為重量基準。Hereinafter, in order to specifically describe this specification, examples will be described in detail. However, the embodiments in this specification can be modified into various other forms, and should not be construed as the scope of this specification is limited by the following examples. The examples in this specification are intended to be more complete for those with ordinary knowledge in the field. Provided. In addition, hereinafter, "%" and "parts" indicating content are based on weight unless otherwise mentioned.

實施例和比較例:清洗液組合物的製造Examples and Comparative Examples: Production of Cleaning Liquid Composition

按照下述表1的構成和組成,製造實施例和比較例的清洗液組合物。The cleaning liquid compositions of Examples and Comparative Examples were produced according to the structures and compositions of Table 1 below.

[表1] [Table 1]

實驗例1:有機材料吸附遮罩清洗力評估Experimental example 1: Evaluation of cleaning ability of organic material adsorption mask

為了確認實施例和比較例的遮罩清洗液組合物的清洗效果,對於根據通常的方法分別附著有用作有機發光元件中所包含的發光層和電子/電洞傳輸層的物質的5種遮罩(材質:不脹鋼),實施了清洗力評估。利用恒溫槽將製造的遮罩清洗液組合物升溫至50℃後,攪拌遮罩清洗液組合物(試劑)。在攪拌中的遮罩清洗液組合物中浸漬切斷成2×2cm尺寸的附著有有機材料的遮罩後,用去離子水清洗1分鐘,利用SEM(掃描顯微鏡,Hitachi-4800),判斷在遮罩表面是否殘留有有機材料,從而評估清洗力。遮罩清洗液浸漬時間以5分鐘單位進行,標示殘留物不殘留於遮罩表面的時間,從而評估清洗力,並將其結果示於下述表2。In order to confirm the cleaning effect of the mask cleaning liquid compositions of the examples and comparative examples, five types of masks were attached to each of the substances used as the light-emitting layer and the electron / hole transporting layer included in the organic light-emitting element according to a general method. (Material: Non-swelling steel) We performed a cleaning power evaluation. After the manufactured mask cleaning liquid composition was heated to 50 ° C. in a constant temperature bath, the mask cleaning liquid composition (reagent) was stirred. After immersing and cutting the mask with an organic material attached to the mask cleaning solution composition under stirring to a size of 2 × 2 cm, the mask was washed with deionized water for 1 minute, and determined by SEM (scanning microscope, Hitachi-4800). Whether there is any organic material on the surface of the mask to evaluate the cleaning power. The mask cleaning liquid immersion time was performed in units of 5 minutes, and the time during which the residue did not remain on the mask surface was indicated to evaluate the cleaning power. The results are shown in Table 2 below.

[表2] [Table 2]

參照表2,可確認在混合有化學式1所表示的醯胺系化合物、醯胺系化合物和水溶性極性溶劑實施例中,遮罩1~5均能夠以25分鐘以內被清洗。Referring to Table 2, it can be confirmed that in the examples in which the amidine-based compound, the amidine-based compound, and the water-soluble polar solvent shown in Chemical Formula 1 are mixed, the masks 1 to 5 can be cleaned within 25 minutes.

然而,在比較例的情況下,除了包含環境管制物質的比較例1以外,可確認各比較例中的一個以上的遮罩為30分鐘以上,清洗力下降。However, in the case of the comparative example, in addition to the comparative example 1 containing an environmentally controlled substance, it was confirmed that one or more masks in each comparative example were 30 minutes or more, and the cleaning power fell.

使用了化學式1中R1和R2不為甲基或乙基的醯胺系物質的比較例2~4中,可確認遮罩2和遮罩3的清洗力下降。In Comparative Examples 2 to 4 in which the amidine-based substance in which R1 and R2 were not methyl or ethyl in Chemical Formula 1 was used, it was confirmed that the cleaning power of the mask 2 and the mask 3 was decreased.

此外,化學式1中R3超過C4的醯胺系物質的比較例5中,可確認對於遮罩1~5的所有遮罩清洗力下降,在R1和R2為甲基且R3為氫或C1的情況下,可確認對於遮罩2、3去除力下降。In addition, in Comparative Example 5 of the amine-based substance in which R3 exceeds C4 in Chemical Formula 1, it was confirmed that the cleaning power of the masks for all masks 1 to 5 is decreased. When R1 and R2 are methyl groups, and R3 is hydrogen or C1 Next, it can be confirmed that the removal force decreases with respect to the masks 2 and 3.

此外,不包含化學式1所表示的醯胺系化合物而僅包含水溶性極性溶劑的比較例8、9、10、11中,也可確認遮罩清洗力下降,不屬於化學式1的醯胺系化合物與極性溶劑的混合物的比較例12、13中,也可確認清洗力下降。In addition, in Comparative Examples 8, 9, 10, and 11 that did not include the amidamine-based compound represented by Chemical Formula 1 and only contained a water-soluble polar solvent, it was also confirmed that the mask cleaning power was decreased, and it was not included in the amidamine-based compound of Chemical Formula 1. In Comparative Examples 12 and 13 of a mixture with a polar solvent, it was also confirmed that the cleaning power was decreased.

實驗例2:有機發光元件溶解穩定性評估Experimental example 2: Evaluation of the solubility stability of organic light-emitting elements

蒸鍍製程後從遮罩分離有機材料,然後利用研缽而形成粉末形態,將以所製造的遮罩清洗液組合物的重量計為0.05%的有機材料在60℃溶解1小時後,用玻璃材質的透明的50ml玻璃瓶分取,然後在常溫下放置24小時後,對於實施例1、2、4、5、6、8、10和比較例2、4、6、8、11、12的遮罩清洗液組合物(試劑)的穩定性(濁度增加和沉澱物)進行評估,並示於下述表3。After the evaporation process, the organic material is separated from the mask, and then formed into a powder form using a mortar. The 0.05% organic material based on the weight of the manufactured mask cleaning solution composition is dissolved at 60 ° C for 1 hour, and then glass is used. The material is divided into 50ml transparent glass bottles, and then left at room temperature for 24 hours. For Examples 1, 2, 4, 5, 6, 8, 10 and Comparative Examples 2, 4, 6, 8, 11, 12 The stability (increased turbidity and sediment) of the mask cleaning liquid composition (reagent) was evaluated and shown in Table 3 below.

評估基準如下。The evaluation criteria are as follows.

用肉眼評估時試劑的透明度沒有變化:◎There is no change in the transparency of the reagent when evaluated with the naked eye: ◎

用肉眼評估時濁度略增加(透明):○The turbidity slightly increased when evaluated by the naked eye (transparent): ○

用肉眼評估時濁度增加(不透明):△Increase in turbidity (opaque) when evaluated with the naked eye: △

用肉眼評估時產生沉澱物:×Precipitation when evaluated with the naked eye: ×

[表3] [table 3]

參照表3,混合有化學式1的醯胺系化合物和水溶性極性溶劑的實施例中,有機材料溶解後試劑的透明度變化少,在清洗液中表現出穩定性,可知沒有再吸附於基材(不脹鋼、SUS)。然而,在比較例2、4、6、8、11、12中,放置24小時後,可確認從遮罩2和遮罩3分離的有機材料在溶解後穩定性下降。由此確認,在反復清洗製程中清洗次數增加的情況下,再吸附於基材而可能導致二次污染。Referring to Table 3, in the examples in which the amidine compound of Formula 1 and the water-soluble polar solvent were mixed, the transparency of the reagent changed little after the organic material was dissolved, and it showed stability in the cleaning solution. Non-bulging steel, SUS). However, in Comparative Examples 2, 4, 6, 8, 11, and 12, after being left for 24 hours, it was confirmed that the organic materials separated from the mask 2 and the mask 3 had a decreased stability after being dissolved. From this, it was confirmed that when the number of cleanings is increased in the repeated cleaning process, re-adsorption on the substrate may cause secondary pollution.

實驗例3:遮罩清洗液吸收率和保存穩定性評估Experimental example 3: Evaluation of absorption rate and storage stability of mask cleaning solution

為了確認因水分吸收而導致的清洗性能降低,利用恒溫槽將遮罩清洗液組合物升溫至30℃後,將遮罩清洗液組合物(試劑)放置48小時,然後用水分測定儀測定水分含量而計算吸收率,將吸附有有機材料的玻璃切斷成2×4cm尺寸,將下部的玻璃部位浸漬(半浸,Half dip)於清洗液後,用去離子水清洗1分鐘,然後利用UV燈(254nm),用肉眼判斷是否殘留有有機材料,從而評估清洗力。遮罩清洗液浸漬時間以15秒單位進行,標示殘留物不殘留於遮罩表面的時間,從而評估清洗力,並將其結果示於表4。第1圖和第2圖為在UV燈下觀察遮罩的圖,比如,第1圖為有機蒸鍍物殘留於浸漬在清洗液中的玻璃下部的玻璃的圖,第2圖為有機蒸鍍物沒有殘留於浸漬在清洗液中的玻璃下部的玻璃的圖。In order to confirm the decrease in cleaning performance due to moisture absorption, the mask cleaning liquid composition was heated to 30 ° C in a thermostatic bath, and the mask cleaning liquid composition (reagent) was left for 48 hours, and then the moisture content was measured with a moisture analyzer Calculate the absorptivity, cut the glass with the adsorbed organic material to 2 × 4cm size, immerse (half dip) the lower glass part in the cleaning solution, wash it with deionized water for 1 minute, and then use a UV lamp (254 nm), the presence or absence of an organic material was judged with the naked eye, and the cleaning power was evaluated. The mask cleaning liquid immersion time was performed in units of 15 seconds, and the time during which the residue did not remain on the mask surface was indicated to evaluate the cleaning power. The results are shown in Table 4. Figures 1 and 2 are views of a mask viewed under a UV lamp. For example, Figure 1 is a view of an organic vapor deposited on a glass lower portion of a glass immersed in a cleaning solution, and Figure 2 is an organic vapor deposition. A figure showing that there is no substance remaining in the glass below the glass immersed in the cleaning solution.

[表4] [Table 4]

參照上述表4,混合有化學式1所表示的醯胺系化合物、醯胺系化合物和水溶性極性溶劑的實施例中,顯示出120秒以內的快速清洗力,保存穩定性評估後水分含量小於2%,且清洗力沒有發生變化。Referring to Table 4 above, the examples in which the amidine-based compound, the amidine-based compound, and the water-soluble polar solvent shown in Chemical Formula 1 were mixed showed a rapid cleaning power within 120 seconds, and the moisture content after storage stability evaluation was less than 2 % And the cleaning power has not changed.

然而,包含NMP的比較例1、8中,保存穩定性評估後水分含量為27%以上,可確認一部分有機蒸鍍物的去除速度下降。However, in Comparative Examples 1 and 8 including NMP, the moisture content after the storage stability evaluation was 27% or more, and it was confirmed that the removal rate of a part of the organic vapor-deposited product was decreased.

no

第1圖和第2圖為實施例之基於遮罩清洗液吸收率和保存穩定性評估的玻璃的圖。FIG. 1 and FIG. 2 are graphs of glass based on the evaluation of the absorption rate of the mask cleaning liquid and the storage stability of the examples.

Claims (1)

一種遮罩清洗液組合物,其包含下述化學式1所表示的醯胺系化合物以及二醇醚基化合物: 化學式1所述化學式1中, R1和R2各自獨立地為甲基或乙基, R3為氫、或者被C1~C4的烷氧基取代或非取代的C1~C4的飽和或不飽和烴基, 其中,當R1和R2為甲基時,R3為被C1~C4的烷氧基取代或非取代的C2~C4的飽和烴基或C2~C4的不飽和烴基。A mask cleaning liquid composition comprising a fluorene-based compound and a glycol ether-based compound represented by the following Chemical Formula 1: Chemical Formula 1 In the chemical formula 1, R1 and R2 are each independently a methyl group or an ethyl group, R3 is hydrogen, or a saturated or unsaturated C1 to C4 hydrocarbon group substituted or unsubstituted with a C1 to C4 alkoxy group, where, when When R1 and R2 are methyl groups, R3 is a saturated hydrocarbon group of C2 to C4 or an unsaturated hydrocarbon group of C2 to C4 substituted or unsubstituted by an alkoxy group of C1 to C4.
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