TW201901680A - Flash memory storage apparatus - Google Patents

Flash memory storage apparatus Download PDF

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TW201901680A
TW201901680A TW106116560A TW106116560A TW201901680A TW 201901680 A TW201901680 A TW 201901680A TW 106116560 A TW106116560 A TW 106116560A TW 106116560 A TW106116560 A TW 106116560A TW 201901680 A TW201901680 A TW 201901680A
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flash memory
storage device
memory storage
mode
current
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TW106116560A
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TWI625736B (en
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陳宗仁
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華邦電子股份有限公司
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Abstract

A flash memory storage apparatus having a plurality of operation modes is provided. The flash memory storage apparatus includes a memory controller circuit and a memory cell array. The memory controller circuit is configured to control the flash memory storage apparatus to operate in one of the operation modes. The operation modes includes a low standby current mode. The memory cell array is coupled to the memory controller circuit. The memory cell array is configured to store data. The data includes read-only memory data. The memory controller circuit controls the flash memory storage apparatus to enter the low standby current mode according to a first command. The memory controller circuit wakes up the flash memory storage apparatus from the low standby current mode according to a second command. When the flash memory storage apparatus operates in the low standby current mode, the read-only memory data is kept.

Description

快閃記憶體儲存裝置Flash memory storage device

本發明是有關於一種記憶體儲存裝置,且特別是有關於一種快閃記憶體儲存裝置。The present invention relates to a memory storage device, and more particularly to a flash memory storage device.

隨著電子科技的演進,電子裝置成為人們生活中必要的工具。而為了提供長效且大量的資料儲存的功能,非揮發性記憶體成為重要的資料儲存媒介。並且,在現今的電子產品中,快閃記憶體是為較為受歡迎的非揮發性記憶體中的一種。快閃記憶體儲存裝置的操作模式主要包括主動模式(active mode)、正常待機模式(normal standby mode)以及深度省電模式(deep power down mode)。With the evolution of electronic technology, electronic devices have become a necessary tool in people's lives. In order to provide long-lasting and large-scale data storage functions, non-volatile memory has become an important data storage medium. Also, in today's electronic products, flash memory is one of the more popular non-volatile memories. The operation modes of the flash memory storage device mainly include an active mode, a normal standby mode, and a deep power down mode.

在現有技術中,快閃記憶體儲存裝置需要接收指令以進入深度省電模式。進入深度省電模式的快閃記憶體儲存裝置的動態操作均被停止,其優勢為所消耗的電流非常低,惟要喚醒進入深度省電模式的快閃記憶體儲存裝置通常需要花費相當多的時間。所花費的時間通常是用來復原快閃記憶體儲存裝置內部的電路設定。In the prior art, the flash memory storage device needs to receive an instruction to enter the deep power saving mode. The dynamic operation of the flash memory storage device entering the deep power saving mode is stopped, and the advantage is that the current consumed is very low, but the flash memory storage device that wakes up into the deep power saving mode usually takes a considerable amount of time. time. The time spent is usually used to restore the circuit settings inside the flash memory storage device.

另一方面,雖然在正常待機模式的快閃記憶體儲存裝置所消耗的電流較高,但是其喚醒時間較短。在正常待機模式的快閃記憶體儲存裝置所消耗的電流通常是由於在此模式中,電壓產生器電路仍需要工作以提供高電壓給字元線解碼器電路。因此,目前在正常待機模式的快閃記憶體儲存裝置所消耗的電流仍無法有效降低。On the other hand, although the flash memory storage device in the normal standby mode consumes a higher current, its wake-up time is shorter. The current consumed by the flash memory storage device in normal standby mode is typically due to the fact that in this mode, the voltage generator circuit still needs to operate to provide a high voltage to the word line decoder circuit. Therefore, the current consumed by the flash memory storage device in the normal standby mode cannot be effectively reduced.

本發明提供一種快閃記憶體儲存裝置,其操作在低待機電流模式(low standby current mode)時,待機電流小且喚醒時間短。The present invention provides a flash memory storage device that operates in a low standby current mode with a small standby current and a short wake-up time.

本發明的快閃記憶體儲存裝置具有多種操作模式。快閃記憶體儲存裝置包括記憶體控制電路以及記憶體晶胞陣列。記憶體控制電路用以控制快閃記憶體儲存裝置操作在多種操作模式其中之一。所述操作模式包括低待機電流模式。記憶體晶胞陣列耦接至記憶體控制電路。記憶體晶胞陣列用以儲存資料。所述資料包括唯讀記憶體資料。記憶體控制電路依據第一指令控制快閃記憶體儲存裝置進入低待機電流模式。記憶體控制電路依據第二指令從低待機電流模式喚醒快閃記憶體儲存裝置。快閃記憶體儲存裝置操作在低待機電流模式時,唯讀記憶體資料(read-only memory data,ROM data)被保持。The flash memory storage device of the present invention has a variety of modes of operation. The flash memory storage device includes a memory control circuit and a memory cell array. The memory control circuit is used to control the operation of the flash memory storage device in one of a plurality of operating modes. The mode of operation includes a low standby current mode. The memory cell array is coupled to the memory control circuit. A memory cell array is used to store data. The information includes read-only memory data. The memory control circuit controls the flash memory storage device to enter a low standby current mode according to the first command. The memory control circuit wakes up the flash memory storage device from the low standby current mode according to the second command. When the flash memory storage device operates in the low standby current mode, read-only memory data (ROM data) is held.

本發明的快閃記憶體儲存裝置具有多種操作模式。快閃記憶體儲存裝置包括記憶體控制電路以及記憶體晶胞陣列。記憶體控制電路用以控制快閃記憶體儲存裝置操作在多種操作模式其中之一。所述操作模式包括低待機電流模式。記憶體晶胞陣列耦接至記憶體控制電路。記憶體晶胞陣列用以儲存資料。所述資料包括唯讀記憶體資料。記憶體控制電路依據第一指令控制快閃記憶體儲存裝置進入低待機電流模式。記憶體控制電路依據第二指令從低待機電流模式喚醒快閃記憶體儲存裝置。操作模式包括正常待機模式以及深度省電模式。快閃記憶體儲存裝置操作在低待機電流模式、正常待機模式以及深度省電模式分別具有第一電流、第二電流以及第三電流。第一電流小於第二電流並且大於第三電流。The flash memory storage device of the present invention has a variety of modes of operation. The flash memory storage device includes a memory control circuit and a memory cell array. The memory control circuit is used to control the operation of the flash memory storage device in one of a plurality of operating modes. The mode of operation includes a low standby current mode. The memory cell array is coupled to the memory control circuit. A memory cell array is used to store data. The information includes read-only memory data. The memory control circuit controls the flash memory storage device to enter a low standby current mode according to the first command. The memory control circuit wakes up the flash memory storage device from the low standby current mode according to the second command. The operation modes include a normal standby mode and a deep power saving mode. The flash memory storage device operates in the low standby current mode, the normal standby mode, and the deep power saving mode, respectively having a first current, a second current, and a third current. The first current is less than the second current and greater than the third current.

基於上述,在本發明的示範實施例中,快閃記憶體儲存裝置依據指令控制進入或離開低待機電流模式。並且快閃記憶體儲存裝置操作在低待機電流模式時,唯讀記憶體資料被保持。因此,快閃記憶體儲存裝置操作在低待機電流模式時,其待機電流小且喚醒時間短。Based on the above, in an exemplary embodiment of the invention, the flash memory storage device controls entry into or exit of the low standby current mode in accordance with the instructions. And the read-only memory data is maintained while the flash memory storage device is operating in the low standby current mode. Therefore, when the flash memory storage device operates in the low standby current mode, its standby current is small and the wake-up time is short.

為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。The above described features and advantages of the invention will be apparent from the following description.

以下提出多個實施例來說明本發明,然而本發明不僅限於所例示的多個實施例。又實施例之間也允許有適當的結合。在本案說明書全文(包括申請專利範圍)中所使用的「耦接」一詞可指任何直接或間接的連接手段。舉例而言,若文中描述第一裝置耦接於第二裝置,則應該被解釋成該第一裝置可以直接連接於該第二裝置,或者該第一裝置可以透過其他裝置或某種連接手段而間接地連接至該第二裝置。此外,「訊號」一詞可指至少一電流、電壓、電荷、溫度、資料、電磁波或任何其他一或多個訊號。The invention is illustrated by the following examples, but the invention is not limited to the illustrated embodiments. Further combinations are also allowed between the embodiments. The term "coupled" as used throughout the specification (including the scope of the patent application) may be used in any direct or indirect connection. For example, if the first device is described as being coupled to the second device, it should be construed that the first device can be directly connected to the second device, or the first device can be connected through other devices or some kind of connection means. Connected to the second device indirectly. In addition, the term "signal" may refer to at least one current, voltage, charge, temperature, data, electromagnetic wave or any other one or more signals.

圖1繪示本發明一實施例之快閃記憶體儲存裝置的概要示意圖。請參考圖1,本實施例之快閃記憶體儲存裝置100包括記憶體控制電路110以及記憶體晶胞陣列120。記憶體晶胞陣列120耦接至記憶體控制電路110。記憶體控制電路110用以控制快閃記憶體儲存裝置100操作在多種操作模式其中之一。記憶體晶胞陣列120用以儲存資料。在本實施例中,快閃記憶體儲存裝置100的操作模式包括低待機電流模式、正常待機模式以及深度省電模式。FIG. 1 is a schematic diagram of a flash memory storage device according to an embodiment of the invention. Referring to FIG. 1 , the flash memory storage device 100 of the present embodiment includes a memory control circuit 110 and a memory cell array 120 . The memory cell array 120 is coupled to the memory control circuit 110. The memory control circuit 110 is configured to control the flash memory storage device 100 to operate in one of a plurality of operating modes. The memory cell array 120 is used to store data. In the embodiment, the operation modes of the flash memory storage device 100 include a low standby current mode, a normal standby mode, and a deep power saving mode.

在本實施例中,記憶體控制電路110控制快閃記憶體儲存裝置100操作深度省電模式,以進一步降低記憶體控制電路110操作在正常待機模式時的待機電流。在深度省電模式中,降低待機電流的方式例如是停止(turn off)快閃記憶體儲存裝置100在正常待機模式時的各種操作,或者藉由電源阻障機制(power blocking scheme)來阻障(block)快閃記憶體儲存裝置100中各元件操作所需的電源。在本實施例中,記憶體控制電路110例如依據深度省電指令來控制快閃記憶體儲存裝置100進入深度省電模式,並且依據喚醒指令來控制快閃記憶體儲存裝置100離開深度省電模式進入正常待機模式。In the present embodiment, the memory control circuit 110 controls the flash memory storage device 100 to operate the deep power saving mode to further reduce the standby current when the memory control circuit 110 operates in the normal standby mode. In the deep power saving mode, the manner of reducing the standby current is, for example, turning off various operations of the flash memory storage device 100 in the normal standby mode, or blocking by a power blocking scheme. A power source required for operation of each component in the flash memory storage device 100. In this embodiment, the memory control circuit 110 controls the flash memory storage device 100 to enter the deep power saving mode according to the deep power saving command, and controls the flash memory storage device 100 to leave the deep power saving mode according to the wake-up command. Enter normal standby mode.

因此,在本實施例中,快閃記憶體儲存裝置100操作在正常待機模式的電流(第二電流)大於操作在深度省電模式的電流(第三電流)。在本實施例中,快閃記憶體儲存裝置100從正常待機模式被喚醒的時間(第二喚醒時間)是短於從深度省電模式被喚醒的時間(第三喚醒時間)。在本實施例中,快閃記憶體儲存裝置100的操作模式更包括低待機電流模式。低待機電流模式的待機電流(第一電流)小於第二電流並且大於第三電流。低待機電流模式的喚醒時間(第一喚醒時間)長於第二喚醒時間並且短於第三喚醒時間。以下提出多個實施例來說明本發明的低待機電流模式。Therefore, in the present embodiment, the flash memory storage device 100 operates in a normal standby mode (second current) greater than a current operating in a deep power saving mode (third current). In the present embodiment, the time (second wake-up time) at which the flash memory storage device 100 is woken up from the normal standby mode is shorter than the time (third wake-up time) that is awakened from the deep power saving mode. In this embodiment, the operation mode of the flash memory storage device 100 further includes a low standby current mode. The standby current (first current) of the low standby current mode is less than the second current and greater than the third current. The wake-up time (first wake-up time) of the low standby current mode is longer than the second wake-up time and shorter than the third wake-up time. A number of embodiments are set forth below to illustrate the low standby current mode of the present invention.

在本實施例中,記憶體控制器電路110以及記憶體晶胞陣列120的電路架構可分別由所屬技術領域的任一種適合的電路來加以實施,本發明並不加以限制。其詳細步驟及實施方式可以由所屬技術領域的通常知識獲致足夠的教示、建議與實施說明,因此不再贅述。In this embodiment, the circuit architecture of the memory controller circuit 110 and the memory cell array 120 can be implemented by any suitable circuit in the art, and the invention is not limited thereto. The detailed steps and implementations thereof may be adequately taught, suggested, and implemented by the ordinary knowledge in the art, and therefore will not be described again.

圖2繪示本發明一實施例之字元線解碼器電路以及電壓產生器電路的概要示意圖。圖3繪示圖2實施例之各操作訊號的概要示意圖。請參考圖1至圖3,圖1的快閃記憶體儲存裝置100更包括電壓產生器電路200以及字元線解碼器電路300。在本實施例中,字元線解碼器電路300耦接至快閃記憶體儲存裝置100的一或多條字元線WL。電壓產生器電路200耦接至字元線解碼器電路300。電壓產生器電路200用以經由節點HV提供高電壓給字元線解碼器電路300以作為操作所需的電源。在圖3中,標示為HV的訊號是指位於節點HV處的電壓訊號。2 is a schematic diagram showing a word line decoder circuit and a voltage generator circuit according to an embodiment of the present invention. FIG. 3 is a schematic diagram showing the operation signals of the embodiment of FIG. 2. Referring to FIG. 1 to FIG. 3 , the flash memory storage device 100 of FIG. 1 further includes a voltage generator circuit 200 and a word line decoder circuit 300 . In the present embodiment, the word line decoder circuit 300 is coupled to one or more word lines WL of the flash memory storage device 100. The voltage generator circuit 200 is coupled to the word line decoder circuit 300. The voltage generator circuit 200 is operative to provide a high voltage to the word line decoder circuit 300 via the node HV as a power source required for operation. In Figure 3, the signal labeled HV refers to the voltage signal at node HV.

具體而言,在本實施例中,電壓產生器電路200包括時脈產生器210、電荷磊220 (charge pump)、參考電壓產生器230以及電壓調節器240。參考電壓產生器230經由第一電晶體開關Q1耦接至第一電壓VP,電壓調節器240經由第二電晶體開關Q2耦接至第二電壓VSS。時脈產生器210包括第三電晶體開關(未繪示)。節點HV經由第四電晶體開關Q4耦接至第二電壓VSS。在本實施例中,時脈產生器210用以產生時脈訊號給電荷磊220。電荷磊220再依據時脈訊號來產生電壓訊號,並且輸出電壓訊號給電壓調節器240。參考電壓產生器230用以產生參考電壓訊號並且輸出參考電壓訊號給電壓調節器240。電壓調節器240依據參考電壓訊號以及電壓訊號來產生所述高電壓,並且輸出所述高電壓給字元線解碼器電路300。Specifically, in the present embodiment, the voltage generator circuit 200 includes a clock generator 210, a charge pump 220, a reference voltage generator 230, and a voltage regulator 240. The reference voltage generator 230 is coupled to the first voltage VP via the first transistor switch Q1, and the voltage regulator 240 is coupled to the second voltage VSS via the second transistor switch Q2. The clock generator 210 includes a third transistor switch (not shown). The node HV is coupled to the second voltage VSS via the fourth transistor switch Q4. In this embodiment, the clock generator 210 is configured to generate a clock signal to the charge bar 220. The charge beam 220 generates a voltage signal according to the clock signal, and outputs a voltage signal to the voltage regulator 240. The reference voltage generator 230 is configured to generate a reference voltage signal and output a reference voltage signal to the voltage regulator 240. The voltage regulator 240 generates the high voltage according to the reference voltage signal and the voltage signal, and outputs the high voltage to the word line decoder circuit 300.

在本實施例中,記憶體控制電路110依據第一指令CMD1控制快閃記憶體儲存裝置100進入低待機電流模式。記憶體控制電路110依據第二指令CMD2喚醒快閃記憶體儲存裝置100,從低待機電流模式進入正常待機模式。在本實施例中,在快閃記憶體儲存裝置100進入低待機電流模式時,控制訊號Vctrl拉高至高準位。在快閃記憶體儲存裝置100離開低待機電流模式時,控制訊號Vctrl降低至低準位。在低待機電流模式中,高準位的控制訊號Vctrl不導通第一電晶體開關Q1、第二電晶體開關Q2以及時脈產生器210中的第三電晶體開關。因此,電壓產生器電路200操作所需的電源,例如第一電壓VP以及第二電壓VSS,被阻障而不供應給其中的各電路元件,從而時脈產生器210、電荷磊220、參考電壓產生器230以及電壓調節器240停止操作。此外,在低待機電流模式中,第四電晶體開關Q4依據控制訊號Vctrl被導通,因此節點HV的電壓被拉低至第二電壓VSS,以進一步降低字元線解碼器電路的功率消耗。因此,在本實施例中,快閃記憶體儲存裝置100操作在低待機電流模式的電流(第一電流)小於操作在正常待機模式的電流(第二電流)。在圖2中,標示為的訊號是指控制訊號Vctrl的反相訊號。In this embodiment, the memory control circuit 110 controls the flash memory storage device 100 to enter the low standby current mode according to the first command CMD1. The memory control circuit 110 wakes up the flash memory storage device 100 according to the second command CMD2, and enters the normal standby mode from the low standby current mode. In this embodiment, when the flash memory storage device 100 enters the low standby current mode, the control signal Vctrl is pulled high to a high level. When the flash memory storage device 100 leaves the low standby current mode, the control signal Vctrl is lowered to a low level. In the low standby current mode, the high level control signal Vctrl does not turn on the first transistor switch Q1, the second transistor switch Q2, and the third transistor switch in the clock generator 210. Therefore, the power source required for the voltage generator circuit 200 to operate, such as the first voltage VP and the second voltage VSS, is blocked from being supplied to the circuit elements therein, thereby the clock generator 210, the charge bar 220, and the reference voltage. Generator 230 and voltage regulator 240 cease operation. In addition, in the low standby current mode, the fourth transistor switch Q4 is turned on according to the control signal Vctrl, so the voltage of the node HV is pulled down to the second voltage VSS to further reduce the power consumption of the word line decoder circuit. Therefore, in the present embodiment, the flash memory storage device 100 operates in a low standby current mode (first current) less than a current operating in a normal standby mode (second current). In Figure 2, marked as The signal is the inverted signal of the control signal Vctrl.

在本實施例中,記憶體晶胞陣列120儲存的資料包括唯讀記憶體資料,此唯讀記憶體資料例如是可程式化唯讀記憶體資料(programmable read-only memory data,PROM data)。快閃記憶體儲存裝置100操作在低待機電流模式時,唯讀記憶體資料被保持,例如被保持在一揮發性記憶體中。因此,快閃記憶體儲存裝置100被喚醒時從低待機電流模式進入正常待機模式或正常操作模式時,唯讀記憶體資料不需要重新被載入揮發性記憶體,因此其喚醒時間tLSTB短。在本實施例中,快閃記憶體儲存裝置100在深度省電模式中,唯讀記憶體資料不被保持。因此,快閃記憶體儲存裝置100在被喚醒時其唯讀記憶體資料需要重新被載入揮發性記憶體從而其喚醒時間長。因此,在本實施例中,快閃記憶體儲存裝置100從低待機電流模式被喚醒的時間(第一喚醒時間)短於從深度省電模式被喚醒的時間(第三喚醒時間)。In this embodiment, the data stored in the memory cell array 120 includes read-only memory data, such as programmable read-only memory data (PROM data). When the flash memory storage device 100 is operating in the low standby current mode, the read only memory data is held, for example, in a volatile memory. Therefore, when the flash memory storage device 100 is awake from the low standby current mode to the normal standby mode or the normal operation mode, the read-only memory data does not need to be reloaded into the volatile memory, so the wake-up time tLSTB is short. In the present embodiment, in the deep power saving mode, the read-only memory data is not retained. Therefore, when the flash memory storage device 100 is woken up, its read-only memory data needs to be reloaded into the volatile memory so that its wake-up time is long. Therefore, in the present embodiment, the time (the first wake-up time) at which the flash memory storage device 100 is woken up from the low standby current mode is shorter than the time (the third wake-up time) that is awakened from the deep power saving mode.

在本實施例中,電壓產生器電路200以及字元線解碼器電路300的電路架構可分別由所屬技術領域的任一種適合的電路來加以實施,本發明並不加以限制。其詳細步驟及實施方式可以由所屬技術領域的通常知識獲致足夠的教示、建議與實施說明,因此不再贅述。In the present embodiment, the circuit architectures of the voltage generator circuit 200 and the word line decoder circuit 300 can be implemented by any suitable circuit in the art, and the invention is not limited thereto. The detailed steps and implementations thereof may be adequately taught, suggested, and implemented by the ordinary knowledge in the art, and therefore will not be described again.

圖4繪示本發明另一實施例之字元線解碼器電路以及電壓產生器電路的概要示意圖。圖5繪示圖4實施例之各操作訊號的概要示意圖。請參考圖2至圖5,本實施例之字元線解碼器電路以及電壓產生器電路類似於圖2實施例,惟兩者之間主要的差異例如在於節點HV沒有經由電晶體開關耦接至第二電壓VSS。在本實施例中,在低待機電流模式中,節點HV的電壓被浮接,因此以較慢的速度被拉低至第二電壓VSS。另外,本發明之實施例的記憶體儲存裝置的操作方法可以由圖1至圖3實施例之敘述中獲致足夠的教示、建議與實施說明,因此不再贅述。4 is a schematic diagram showing a word line decoder circuit and a voltage generator circuit according to another embodiment of the present invention. FIG. 5 is a schematic diagram showing the operation signals of the embodiment of FIG. 4. Referring to FIG. 2 to FIG. 5, the word line decoder circuit and the voltage generator circuit of this embodiment are similar to the embodiment of FIG. 2, but the main difference between the two is, for example, that the node HV is not coupled to the via transistor switch. The second voltage VSS. In the present embodiment, in the low standby current mode, the voltage of the node HV is floated, and thus pulled down to the second voltage VSS at a slower speed. In addition, the operation method of the memory storage device of the embodiment of the present invention can be sufficiently taught, suggested, and implemented by the description of the embodiment of FIG. 1 to FIG. 3, and therefore will not be described again.

綜上所述,在本發明的示範實施例中,快閃記憶體儲存裝置的操作模式包括低待機電流模式。快閃記憶體儲存裝置操作在低待機電流模式的待機電流較操作在正常待機模式的待機電流小。快閃記憶體儲存裝置依據指令進入低待機電流模式或離開低待機電流模式而回到正常待機模式。快閃記憶體儲存裝置從低待機電流模式被喚醒的時間較從深度省電模式被喚醒的時間短。In summary, in an exemplary embodiment of the invention, the operating mode of the flash memory storage device includes a low standby current mode. The flash memory storage device operates in a low standby current mode with a standby current that is smaller than a standby current operating in a normal standby mode. The flash memory storage device returns to the normal standby mode according to the instruction to enter the low standby current mode or leave the low standby current mode. The flash memory storage device is awakened from a low standby current mode for a shorter time than a deep power save mode.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.

100‧‧‧快閃記憶體儲存裝置100‧‧‧Flash memory storage device

110‧‧‧記憶體控制電路110‧‧‧Memory Control Circuit

120‧‧‧記憶體晶胞陣列120‧‧‧Memory cell array

200‧‧‧電壓產生器電路200‧‧‧Voltage generator circuit

210‧‧‧時脈產生器210‧‧‧ clock generator

220‧‧‧電荷磊220‧‧‧ Charge Lei

230‧‧‧參考電壓產生器230‧‧‧reference voltage generator

240‧‧‧電壓調節器240‧‧‧Voltage regulator

300‧‧‧字元線解碼器電路300‧‧‧word line decoder circuit

WL‧‧‧字元線WL‧‧‧ character line

HV‧‧‧節點、節點的電壓訊號HV‧‧‧ node, node voltage signal

Q1、Q2、Q4‧‧‧電晶體開關Q1, Q2, Q4‧‧‧ transistor switch

VP‧‧‧第一電壓VP‧‧‧First voltage

VSS‧‧‧第二電壓VSS‧‧‧second voltage

Vctrl‧‧‧控制訊號Vctrl‧‧‧ control signal

‧‧‧控制訊號的反相訊號 ‧‧‧Inverted signal of control signal

CMD1‧‧‧第一指令CMD1‧‧‧ first instruction

CMD2‧‧‧第二指令CMD2‧‧‧ second instruction

tLSTB‧‧‧喚醒時間tLSTB‧‧‧Wake time

圖1繪示本發明一實施例之快閃記憶體儲存裝置的概要示意圖。 圖2繪示本發明一實施例之字元線解碼器電路以及電壓產生器電路的概要示意圖。 圖3繪示圖2實施例之各操作訊號的概要示意圖。 圖4繪示本發明另一實施例之字元線解碼器電路以及電壓產生器電路的概要示意圖。 圖5繪示圖4實施例之各操作訊號的概要示意圖。FIG. 1 is a schematic diagram of a flash memory storage device according to an embodiment of the invention. 2 is a schematic diagram showing a word line decoder circuit and a voltage generator circuit according to an embodiment of the present invention. FIG. 3 is a schematic diagram showing the operation signals of the embodiment of FIG. 2. 4 is a schematic diagram showing a word line decoder circuit and a voltage generator circuit according to another embodiment of the present invention. FIG. 5 is a schematic diagram showing the operation signals of the embodiment of FIG. 4.

Claims (10)

一種快閃記憶體儲存裝置,具有多種操作模式,並且該快閃記憶體儲存裝置包括: 一記憶體控制電路,用以控制該快閃記憶體儲存裝置操作在該些操作模式其中之一,其中該些操作模式包括一低待機電流模式;以及 一記憶體晶胞陣列,耦接至該記憶體控制電路,用以儲存資料,該資料包括唯讀記憶體資料, 其中該記憶體控制電路依據一第一指令控制該快閃記憶體儲存裝置進入該低待機電流模式,並且依據第二指令從該低待機電流模式喚醒該快閃記憶體儲存裝置, 其中該快閃記憶體儲存裝置操作在該低待機電流模式時,該唯讀記憶體資料被保持。A flash memory storage device having a plurality of operation modes, and the flash memory storage device includes: a memory control circuit for controlling operation of the flash memory storage device in one of the operation modes, wherein The operating modes include a low standby current mode, and a memory cell array coupled to the memory control circuit for storing data, the data including read-only memory data, wherein the memory control circuit is based on a The first command controls the flash memory storage device to enter the low standby current mode, and wakes up the flash memory storage device from the low standby current mode according to the second instruction, wherein the flash memory storage device operates at the low The read-only memory data is held in the standby current mode. 如申請專利範圍第1項所述的快閃記憶體儲存裝置,其中該些操作模式包括一正常待機模式以及一深度省電模式,以及該快閃記憶體儲存裝置操作在該低待機電流模式、該正常待機模式以及該深度省電模式分別具有一第一電流、一第二電流以及一第三電流,其中該第一電流小於該第二電流並且大於該第三電流。The flash memory storage device of claim 1, wherein the operation modes include a normal standby mode and a deep power saving mode, and the flash memory storage device operates in the low standby current mode, The normal standby mode and the deep power saving mode respectively have a first current, a second current, and a third current, wherein the first current is less than the second current and greater than the third current. 如申請專利範圍第1項所述的快閃記憶體儲存裝置,其中該些操作模式包括一正常待機模式以及一深度省電模式,以及該快閃記憶體儲存裝置從該低待機電流模式、該正常待機模式以及該深度省電模式被喚醒分別需要一第一喚醒時間、一第二喚醒時間以及一第三喚醒時間,其中該第一喚醒時間長於該第二喚醒時間並且短於該第三喚醒時間。The flash memory storage device of claim 1, wherein the operation modes include a normal standby mode and a deep power saving mode, and the flash memory storage device is from the low standby current mode, The normal standby mode and the deep power saving mode are respectively required to wake up, a second wake-up time, and a third wake-up time, wherein the first wake-up time is longer than the second wake-up time and shorter than the third wake-up time time. 如申請專利範圍第1項所述的快閃記憶體儲存裝置,更包括: 一字元線解碼器電路,耦接至該快閃記憶體儲存裝置的多條字元線;以及 一電壓產生器電路,耦接至該字元線解碼器電路,用以經由一節點提供一高電壓給該字元線解碼器電路, 其中在該低待機電流模式,該電壓產生器電路當中的多個電晶體開關依據一控制訊號不導通。The flash memory storage device of claim 1, further comprising: a word line decoder circuit coupled to the plurality of word lines of the flash memory storage device; and a voltage generator a circuit coupled to the word line decoder circuit for providing a high voltage to the word line decoder circuit via a node, wherein the plurality of transistors in the voltage generator circuit are in the low standby current mode The switch is not conductive according to a control signal. 如申請專利範圍第4項所述的快閃記憶體儲存裝置,其中該電壓產生器電路包括一時脈產生器、一參考電壓產生器以及一電壓調節器,以及該參考電壓產生器經由一第一電晶體開關耦接至一第一電壓,該電壓調節器經由一第二電晶體開關耦接至一第二電壓,以及該時脈產生器包括一第三電晶體開關,其中在該低待機電流模式,該第一電晶體開關、該第二電晶體開關以及該第三電晶體開關依據該控制訊號不導通。The flash memory storage device of claim 4, wherein the voltage generator circuit comprises a clock generator, a reference voltage generator, and a voltage regulator, and the reference voltage generator is first The transistor switch is coupled to a first voltage, the voltage regulator is coupled to a second voltage via a second transistor switch, and the clock generator includes a third transistor switch, wherein the low standby current In the mode, the first transistor switch, the second transistor switch, and the third transistor switch are not turned on according to the control signal. 如申請專利範圍第5項所述的快閃記憶體儲存裝置,其中該節點經由一第四電晶體開關耦接至該第二電壓,在該低待機電流模式,該第四電晶體開關依據該控制訊號被導通,以將該節點的電壓拉至該第二電壓。The flash memory storage device of claim 5, wherein the node is coupled to the second voltage via a fourth transistor switch, and in the low standby current mode, the fourth transistor switch is The control signal is turned on to pull the voltage of the node to the second voltage. 如申請專利範圍第4項所述的快閃記憶體儲存裝置,其中在該低待機電流模式,該節點被浮接。The flash memory storage device of claim 4, wherein the node is floated in the low standby current mode. 一種快閃記憶體儲存裝置,具有多種操作模式,並且該快閃記憶體儲存裝置包括: 一記憶體控制電路,用以控制該快閃記憶體儲存裝置操作在該些操作模式其中之一,其中該些操作模式包括一低待機電流模式;以及 一記憶體晶胞陣列,耦接至該記憶體控制電路,用以儲存資料,該資料包括唯讀記憶體資料, 其中該記憶體控制電路依據一第一指令控制該快閃記憶體儲存裝置進入該低待機電流模式,並且依據第二指令從該低待機電流模式喚醒該快閃記憶體儲存裝置, 其中該些操作模式包括一正常待機模式以及一深度省電模式,以及該快閃記憶體儲存裝置操作在該低待機電流模式、該正常待機模式以及該深度省電模式分別具有一第一電流、一第二電流以及一第三電流,其中該第一電流小於該第二電流並且大於該第三電流。A flash memory storage device having a plurality of operation modes, and the flash memory storage device includes: a memory control circuit for controlling operation of the flash memory storage device in one of the operation modes, wherein The operating modes include a low standby current mode, and a memory cell array coupled to the memory control circuit for storing data, the data including read-only memory data, wherein the memory control circuit is based on a The first command controls the flash memory storage device to enter the low standby current mode, and wakes up the flash memory storage device from the low standby current mode according to the second instruction, wherein the operation modes include a normal standby mode and a a deep power saving mode, wherein the flash memory storage device operates in the low standby current mode, the normal standby mode, and the deep power saving mode respectively have a first current, a second current, and a third current, wherein the current The first current is less than the second current and greater than the third current. 如申請專利範圍第8項所述的快閃記憶體儲存裝置,更包括: 一字元線解碼器電路,耦接至該快閃記憶體儲存裝置的多條字元線;以及 一電壓產生器電路,耦接至該字元線解碼器電路,用以經由一節點提供一高電壓給該字元線解碼器電路, 其中在該低待機電流模式,該電壓產生器電路當中的多個電晶體開關依據一控制訊號不導通。The flash memory storage device of claim 8, further comprising: a word line decoder circuit coupled to the plurality of word lines of the flash memory storage device; and a voltage generator a circuit coupled to the word line decoder circuit for providing a high voltage to the word line decoder circuit via a node, wherein the plurality of transistors in the voltage generator circuit are in the low standby current mode The switch is not conductive according to a control signal. 如申請專利範圍第9項所述的快閃記憶體儲存裝置,其中該電壓產生器電路包括一時脈產生器、一參考電壓產生器以及一電壓調節器,以及該參考電壓產生器經由一第一電晶體開關耦接至一第一電壓,該電壓調節器經由一第二電晶體開關耦接至一第二電壓,以及該時脈產生器包括一第三電晶體開關,其中在該低待機電流模式,該第一電晶體開關、該第二電晶體開關以及該第三電晶體開關依據該控制訊號不導通。The flash memory storage device of claim 9, wherein the voltage generator circuit comprises a clock generator, a reference voltage generator, and a voltage regulator, and the reference voltage generator is first The transistor switch is coupled to a first voltage, the voltage regulator is coupled to a second voltage via a second transistor switch, and the clock generator includes a third transistor switch, wherein the low standby current In the mode, the first transistor switch, the second transistor switch, and the third transistor switch are not turned on according to the control signal.
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