TW201900405A - Covering member, manufacturing method of cover member, and display device - Google Patents

Covering member, manufacturing method of cover member, and display device Download PDF

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Publication number
TW201900405A
TW201900405A TW107117504A TW107117504A TW201900405A TW 201900405 A TW201900405 A TW 201900405A TW 107117504 A TW107117504 A TW 107117504A TW 107117504 A TW107117504 A TW 107117504A TW 201900405 A TW201900405 A TW 201900405A
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main surface
layer
transparent substrate
covering member
glass plate
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TW107117504A
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Chinese (zh)
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TWI757490B (en
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藤井健輔
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日商Agc股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C27/00Joining pieces of glass to pieces of other inorganic material; Joining glass to glass other than by fusing
    • C03C27/06Joining glass to glass by processes other than fusing
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/006Surface treatment of glass, not in the form of fibres or filaments, by coating with materials of composite character
    • C03C17/008Surface treatment of glass, not in the form of fibres or filaments, by coating with materials of composite character comprising a mixture of materials covered by two or more of the groups C03C17/02, C03C17/06, C03C17/22 and C03C17/28
    • C03C17/009Mixtures of organic and inorganic materials, e.g. ormosils and ormocers
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/22Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/083Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/083Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
    • C03C3/085Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/076Glass compositions containing silica with 40% to 90% silica, by weight
    • C03C3/083Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound
    • C03C3/085Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal
    • C03C3/087Glass compositions containing silica with 40% to 90% silica, by weight containing aluminium oxide or an iron compound containing an oxide of a divalent metal containing calcium oxide, e.g. common sheet or container glass
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133308Support structures for LCD panels, e.g. frames or bezels
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/133308Support structures for LCD panels, e.g. frames or bezels
    • G02F1/133331Cover glasses
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2218/00Methods for coating glass
    • C03C2218/10Deposition methods
    • C03C2218/11Deposition methods from solutions or suspensions
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2218/00Methods for coating glass
    • C03C2218/10Deposition methods
    • C03C2218/15Deposition methods from the vapour phase

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Inorganic Chemistry (AREA)
  • Composite Materials (AREA)
  • Ceramic Engineering (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Surface Treatment Of Glass (AREA)
  • Liquid Crystal (AREA)
  • Laminated Bodies (AREA)

Abstract

The present invention relates to a covering member comprising a transparent substrate, wherein the transparent substrate has a first main surface facing the covered member and a second main surface opposite to the first main surface. A compound containing an F atom is attached to the first main surface and has a contact angle with respect to the first main surface being 50 degrees or less.

Description

覆蓋構件、覆蓋構件之製造方法及顯示裝置Cover member, manufacturing method of cover member, and display device

本發明係關於一種覆蓋構件、覆蓋構件之製造方法及顯示裝置。The present invention relates to a cover member, a method for manufacturing the cover member, and a display device.

先前以來,為了保護顯示裝置之顯示面板,使用具有玻璃板等透明基體之覆蓋構件(例如,參照專利文獻1)。 有時於透明基體之顯示面板側之主面之緣,呈框狀印刷有用以將配線等隱蔽之邊框部。 [先前技術文獻] [專利文獻]Conventionally, in order to protect a display panel of a display device, a covering member having a transparent substrate such as a glass plate is used (for example, refer to Patent Document 1). A frame portion may be printed on the edge of the main surface of the display panel side of the transparent substrate to conceal wiring and the like. [Prior Art Literature] [Patent Literature]

[專利文獻1]國際公開第2011/148990號[Patent Document 1] International Publication No. 2011/148990

[發明所欲解決之問題][Problems to be solved by the invention]

覆蓋構件之主面通常使用光學黏著膜等黏著層而貼合於顯示面板之顯示面。 此時,存在空氣等氣體進入覆蓋構件(透明基體)之主面與黏著層之間而產生氣泡之情況。尤其是,於將在顯示面板側之主面具有邊框部之覆蓋構件貼合於顯示面板之顯示面之情形時,容易於邊框部與透明基體之間之階差部分在覆蓋構件與黏著層之間產生氣泡。 覆蓋構件與黏著層之間所產生之氣泡會使隔著覆蓋構件觀察顯示面板之顯示面時之顯示圖像之視認性變差。 因此,於覆蓋構件與黏著層之間產生較多之氣泡之情形時,必須進行使用高壓釜使氣泡消失等作業,而較為繁雜。The main surface of the cover member is usually bonded to the display surface of the display panel using an adhesive layer such as an optical adhesive film. At this time, there may be a case where a gas such as air enters between the main surface of the cover member (transparent substrate) and the adhesive layer to generate air bubbles. In particular, when a covering member having a frame portion on the main surface of the display panel is bonded to the display surface of the display panel, it is easy for a step between the frame portion and the transparent substrate to be between the covering member and the adhesive layer. Bubbles are generated in between. The air bubbles generated between the cover member and the adhesive layer deteriorate the visibility of the display image when the display surface of the display panel is viewed through the cover member. Therefore, when a large amount of air bubbles are generated between the cover member and the adhesive layer, operations such as disappearance of air bubbles using an autoclave must be performed, which is complicated.

本發明係鑒於以上方面而完成者,其目的在於提供一種覆蓋構件、上述覆蓋構件之製造方法及使用上述覆蓋構件之顯示裝置,上述覆蓋構件配置於顯示面板之顯示面側,且於將覆蓋構件與顯示面板之顯示面經由黏著層貼合時,可抑制覆蓋構件與黏著層之間之氣泡產生。 [解決問題之技術手段]The present invention has been made in view of the above aspects, and an object thereof is to provide a cover member, a method for manufacturing the cover member, and a display device using the cover member. The cover member is disposed on a display surface side of a display panel, and the cover member When bonded to the display surface of the display panel via the adhesive layer, the generation of air bubbles between the cover member and the adhesive layer can be suppressed. [Technical means to solve the problem]

本發明人等進行了銳意研究,結果發現藉由採用下述構成而可達成上述目的,從而完成了本發明。The present inventors have conducted earnest research, and as a result, found that the above-mentioned object can be achieved by employing the following configuration, and have completed the present invention.

即,本發明之一態樣之覆蓋構件係包含透明基體者,上述透明基體具有與被覆蓋構件對向之第1主面、及與上述第1主面為相反側之第2主面,於上述第1主面附著有包含F原子之化合物,且上述第1主面之接觸角為50°以下。 本發明之一態樣之覆蓋構件之製造方法係製造包含透明基體之覆蓋構件之方法,準備具有與被覆蓋構件對向之第1主面、及與上述第1主面為相反側之第2主面之透明基體,準備於一面附著有含氟化合物之轉印用基體,使上述透明基體之上述第1主面與上述轉印用基體中之附著有上述含氟化合物之面接觸,將上述含氟化合物轉印至上述透明基體之上述第1主面,藉由上述轉印,使包含F原子之化合物附著於上述第1主面,將上述第1主面之接觸角設為50°以下。 本發明之一態樣之顯示裝置係具備上述覆蓋構件、黏著層及顯示面板者,且上述覆蓋構件係以上述透明基體之上述第1主面與上述顯示面板對向之朝向,經由上述黏著層而與上述顯示面板貼合。 [發明之效果]That is, the covering member according to an aspect of the present invention includes a transparent substrate having a first main surface facing the member to be covered and a second main surface opposite to the first main surface. A compound containing an F atom is attached to the first main surface, and a contact angle of the first main surface is 50 ° or less. A manufacturing method of a covering member according to an aspect of the present invention is a method of manufacturing a covering member including a transparent substrate, and preparing a first main surface facing the covered member and a second main surface opposite to the first main surface. The transparent substrate on the main surface is prepared with a transfer substrate having a fluorine-containing compound adhered on one side. The first principal surface of the transparent substrate is brought into contact with the fluorine-containing compound on the transfer substrate, and the above The fluorine-containing compound is transferred to the first main surface of the transparent substrate, and the compound containing F atoms is attached to the first main surface by the transfer, and the contact angle of the first main surface is set to 50 ° or less . A display device according to one aspect of the present invention includes the cover member, an adhesive layer, and a display panel, and the cover member faces the first main surface of the transparent substrate and the display panel, and passes through the adhesive layer. It is bonded to the display panel. [Effect of the invention]

根據本發明,可提供一種於將覆蓋構件與顯示面板之顯示面經由黏著層貼合時能夠抑制覆蓋構件與黏著層之間之氣泡產生的覆蓋構件、上述覆蓋構件之製造方法、及使用上述覆蓋構件之顯示裝置。According to the present invention, a cover member capable of suppressing the generation of air bubbles between the cover member and the adhesive layer when the cover member and the display surface of the display panel are bonded via the adhesive layer, a method for manufacturing the cover member, and using the cover can be provided. Component display device.

基於圖式對本發明之實施形態進行說明。An embodiment of the present invention will be described based on the drawings.

<本實施形態之顯示裝置之構成> 圖1係表示本實施形態之顯示裝置100之剖視圖。 作為顯示裝置100,例如可列舉:智慧型手機、平板終端等顯示裝置;汽車導航裝置、用以供後座之乘員觀看影像等之RSE(Rear Seat Entertainment,後座娛樂)裝置等車載顯示裝置;安裝於冰箱、洗衣機、微波爐等家電製品之開關門之顯示裝置等,但並不限定於該等。<Configuration of Display Device of the Present Embodiment> FIG. 1 is a cross-sectional view showing a display device 100 of the present embodiment. Examples of the display device 100 include display devices such as a smart phone and a tablet terminal; car navigation devices; and RSE (Rear Seat Entertainment) devices for rear seat occupants to watch images and the like; Display devices for opening and closing the door, which are installed in household appliances such as refrigerators, washing machines, microwave ovens, etc., but are not limited to these.

顯示裝置100具有顯示面板104及覆蓋構件11,顯示面板104與覆蓋構件11經由黏著層14而貼合。 顯示裝置100具有收納各部之框體106,於框體106形成有開口部。於框體106之中,載置有上述顯示面板104與背光單元102。如圖1所示,於框體106之底板即框體底板107上載置有背光單元102,於背光單元102上載置有顯示面板104。於本實施形態中,顯示面板104為液晶面板。於框體106之內部且顯示面板104之外側,配置有與顯示面板104連接之配線141。The display device 100 includes a display panel 104 and a cover member 11, and the display panel 104 and the cover member 11 are bonded together via an adhesive layer 14. The display device 100 includes a frame body 106 accommodating each portion, and an opening portion is formed in the frame body 106. In the housing 106, the display panel 104 and the backlight unit 102 are mounted. As shown in FIG. 1, a backlight unit 102 is placed on a bottom plate of the frame body 106, that is, a bottom plate 107 of the frame body, and a display panel 104 is placed on the backlight unit 102. In this embodiment, the display panel 104 is a liquid crystal panel. A wiring 141 connected to the display panel 104 is arranged inside the casing 106 and outside the display panel 104.

背光單元102及顯示面板104之構成並無特別限定,可採用公知之構成。關於框體106(包含框體底板107)之材質等,亦同樣地,並無特別限定。The structures of the backlight unit 102 and the display panel 104 are not particularly limited, and known structures can be adopted. The material of the frame body 106 (including the frame body bottom plate 107) and the like are also not particularly limited.

作為顯示裝置100,並不限定於具有液晶面板作為顯示面板104之顯示裝置,例如,亦可為具有有機EL(Electroluminescence,電致發光)面板、PDP(Plasma Display Panel,電漿顯示面板)、電子墨水型面板等之顯示裝置。顯示裝置100根據顯示面板104之種類,亦存在不具有背光單元102之情形。顯示裝置100亦可具有觸控面板等。作為觸控面板,可列舉靜電電容式之觸控面板或電阻膜方式之觸控面板等。The display device 100 is not limited to a display device having a liquid crystal panel as the display panel 104. For example, the display device 100 may be an organic EL (Electroluminescence) panel, a PDP (Plasma Display Panel), or an electronic device. Display devices such as ink-based panels. The display device 100 may not include the backlight unit 102 depending on the type of the display panel 104. The display device 100 may include a touch panel and the like. Examples of the touch panel include a capacitive touch panel and a resistive film touch panel.

構成顯示裝置100之一部分之覆蓋構件11具有透明基體12。透明基體12藉由黏著層14而貼合於顯示面板104。如此一來,透明基體12作為覆蓋顯示面板104之覆蓋構件發揮功能。 於本實施形態中,透明基體12之端部藉由接著層131而接著於框體106。The cover member 11 constituting a part of the display device 100 has a transparent base 12. The transparent substrate 12 is adhered to the display panel 104 via the adhesive layer 14. In this way, the transparent substrate 12 functions as a covering member covering the display panel 104. In this embodiment, the end of the transparent substrate 12 is adhered to the frame body 106 by the adhesive layer 131.

圖2係將覆蓋構件11、黏著層14及顯示面板104放大表示之剖視圖。 構成覆蓋構件11之透明基體12具有主面。即,透明基體12具有與作為被覆蓋構件之顯示面板104對向之第1主面12a、及與第1主面12a為相反側且不與顯示面板104對向之第2主面12b。於本實施形態中,列舉顯示面板104作為被覆蓋構件而進行說明,但被覆蓋構件並不限定於顯示面板。FIG. 2 is an enlarged cross-sectional view of the cover member 11, the adhesive layer 14 and the display panel 104. The transparent base 12 constituting the covering member 11 has a main surface. That is, the transparent substrate 12 has a first main surface 12a facing the display panel 104 as a covered member, and a second main surface 12b opposite to the first main surface 12a and not facing the display panel 104. In this embodiment, the display panel 104 will be described as a covered member, but the covered member is not limited to the display panel.

於透明基體12中,如下所述,於第1主面12a附著有包含F原子之化合物,且第1主面12a之接觸角為50°以下。In the transparent substrate 12, as described below, a compound containing an F atom is attached to the first main surface 12a, and the contact angle of the first main surface 12a is 50 ° or less.

於本實施形態中,於透明基體12中之第1主面12a之緣,呈框狀形成有將配線141(參照圖1)隱蔽成無法自第2主面12b側視認之邊框部132。 形成有邊框部132之透明基體12之第1主面12a藉由黏著層14而貼合於顯示面板104之顯示面104a。In this embodiment, a frame portion 132 is formed on the edge of the first main surface 12a in the transparent base 12 to conceal the wiring 141 (see FIG. 1) from the side of the second main surface 12b. The first main surface 12 a of the transparent base 12 having the frame portion 132 formed thereon is bonded to the display surface 104 a of the display panel 104 via the adhesive layer 14.

較佳為,黏著層14與透明基體12同樣為透明,且透明基體12與黏著層14之折射率差較小。 作為黏著層14,例如,可列舉由使液狀之硬化性樹脂組合物硬化而獲得之透明樹脂構成之層,除此以外,亦可為光學黏著膜或光學黏著帶。 黏著層14之厚度例如為5~1000 μm,較佳為50~500 μm。Preferably, the adhesive layer 14 is transparent like the transparent substrate 12, and the refractive index difference between the transparent substrate 12 and the adhesive layer 14 is small. Examples of the adhesive layer 14 include a layer made of a transparent resin obtained by curing a liquid curable resin composition, and may be an optical adhesive film or an optical adhesive tape. The thickness of the adhesive layer 14 is, for example, 5 to 1000 μm, and preferably 50 to 500 μm.

<先前之覆蓋構件> 圖3係將先前之覆蓋構件511藉由黏著層14貼合於顯示面板104之狀態放大表示之剖視圖。對與基於圖1及圖2所說明之本實施形態相同之部分標註相同符號,並省略說明。 構成先前之覆蓋構件511之透明基體512係使用黏著層14而貼合於顯示面板104之顯示面104a。<Previous Covering Member> FIG. 3 is an enlarged cross-sectional view showing a state where the previous covering member 511 is bonded to the display panel 104 through the adhesive layer 14. The same portions as those in the present embodiment described with reference to FIGS. 1 and 2 are denoted by the same reference numerals, and descriptions thereof are omitted. The transparent substrate 512 constituting the previous cover member 511 is bonded to the display surface 104 a of the display panel 104 using the adhesive layer 14.

此時,如圖3所示,存在空氣等氣體進入透明基體512與黏著層14之間而產生氣泡551的情況。尤其是,於透明基體512之顯示面板104側之第1主面512a印刷有邊框部132之情形時,容易於藉由邊框部132形成之階差部分561產生氣泡551。 氣泡551會使隔著透明基體512觀察顯示面板104時之顯示於顯示面104a之圖像(顯示圖像)之視認性變差。 因此,於產生較多之氣泡551之情形時,必須進行使用高壓釜使氣泡551消失之作業等,而非常繁雜。At this time, as shown in FIG. 3, a gas such as air may enter between the transparent substrate 512 and the adhesive layer 14 to generate air bubbles 551. In particular, when the frame portion 132 is printed on the first main surface 512a of the transparent substrate 512 on the display panel 104 side, bubbles 551 are easily generated in the step portion 561 formed by the frame portion 132. The air bubbles 551 deteriorate the visibility of the image (display image) displayed on the display surface 104 a when the display panel 104 is viewed through the transparent substrate 512. Therefore, when a large number of bubbles 551 are generated, the operation of using an autoclave to eliminate the bubbles 551 is very complicated.

<本實施形態之覆蓋構件之構成> 圖4係表示本實施形態之覆蓋構件11之剖視圖。 覆蓋構件11具有透明基體12,上述透明基體12具有第1主面12a及第2主面12b。覆蓋構件11視需要於透明基體12之第1主面12a具有邊框部132,且於第1主面12a或第2主面12b具有未圖示之功能層。 以下,對構成覆蓋構件11之各部更詳細地進行說明。<Configuration of Covering Member of the Present Embodiment> FIG. 4 is a cross-sectional view showing a covering member 11 of the present embodiment. The cover member 11 includes a transparent base 12 having the first main surface 12a and the second main surface 12b. The cover member 11 has a frame portion 132 on the first main surface 12 a of the transparent base 12 as necessary, and has a functional layer (not shown) on the first main surface 12 a or the second main surface 12 b. Hereinafter, each part which comprises the cover member 11 is demonstrated in more detail.

《透明基體》 透明基體12之第1主面12a附著有包含F原子之化合物,且第1主面12a之接觸角為50°以下。 藉此,可抑制當將透明基體12之第1主面12a使用黏著層14貼合於顯示面板104之顯示面104a時於透明基體12與黏著層14之間產生氣泡。再者,包含F原子之化合物較佳為有機系化合物,以能夠以少量來控制第1主面12a之接觸角。<< Transparent Substrate >> The first principal surface 12a of the transparent substrate 12 is adhered with a compound containing an F atom, and the contact angle of the first principal surface 12a is 50 ° or less. Thereby, when the first main surface 12 a of the transparent substrate 12 is bonded to the display surface 104 a of the display panel 104 using the adhesive layer 14, bubbles can be prevented from being generated between the transparent substrate 12 and the adhesive layer 14. The compound containing an F atom is preferably an organic compound, so that the contact angle of the first main surface 12a can be controlled in a small amount.

能夠獲得上述效果之理由雖不明確,但推測為如下。 藉由將透明基體12之第1主面12a之接觸角設為50°以下,而第1主面12a與黏著層14容易潤濕,從而可提高密接性。 進而,於透明基體12(例如,包含Si之玻璃板)之第1主面12a上附著有包含F原子之化合物。藉此,於第1主面12a形成微小之撥水部。而且,認為撥水部彼此形成之路徑之表面能降低,從而成為氣泡之氣體通過該等撥水部自透明基體12與黏著層14之間排出。因此,推測可抑制氣泡之產生。Although the reason why the above-mentioned effect is obtained is not clear, it is estimated as follows. By setting the contact angle of the first main surface 12a of the transparent substrate 12 to 50 ° or less, the first main surface 12a and the adhesive layer 14 are easily wetted, thereby improving the adhesion. Further, a compound containing an F atom is adhered to the first main surface 12 a of the transparent substrate 12 (for example, a glass plate containing Si). Thereby, a minute water repellent portion is formed on the first main surface 12a. In addition, it is considered that the surface energy of the paths formed by the water-repellent portions is reduced, and the gas that becomes a bubble is discharged from the transparent substrate 12 and the adhesive layer 14 through the water-repellent portions. Therefore, it is presumed that the generation of bubbles can be suppressed.

根據可進一步抑制氣泡產生之理由,透明基體12之第1主面12a之接觸角較佳為25~45°,更佳為28~40°,進而較佳為30~38°。For the reason that the generation of bubbles can be further suppressed, the contact angle of the first main surface 12a of the transparent substrate 12 is preferably 25 to 45 °, more preferably 28 to 40 °, and even more preferably 30 to 38 °.

透明基體12之第1主面12a之接觸角以如下方式求出。 首先,對透明基體12之第1主面12a(於呈框狀印刷有邊框部132之情形時,未印刷邊框部132之區域)進行4×4等分。測定等分時所畫之線(3條+3條)彼此之交點(合計9點)處之水之接觸角。具體而言,於測定溫度23℃下,使用接觸角計(協和界面科學社製造,PCA-11)測定滴加純水5 μL之後經過5秒後之接觸角。將測定出之合計9點之接觸角之平均值設為透明基體12之第1主面12a之接觸角。再者,接觸角之測定可利用θ/2法(A half angle method,半角法)測定。The contact angle of the first principal surface 12a of the transparent substrate 12 was determined as follows. First, the first main surface 12 a of the transparent substrate 12 (the area where the frame portion 132 is not printed when the frame portion 132 is printed in a frame shape) is divided into 4 × 4 equal parts. Measure the contact angle of water at the intersection (total of 9 points) of the lines (3 + 3) drawn when dividing equally. Specifically, at a measurement temperature of 23 ° C., a contact angle meter (PCA-11, manufactured by Kyowa Interface Science Co., Ltd.) was used to measure the contact angle after 5 seconds of pure water was dropped. The average value of the measured contact angles at a total of 9 points was set as the contact angle of the first principal surface 12 a of the transparent substrate 12. The measurement of the contact angle can be performed by the θ / 2 method (A half angle method).

根據可進一步抑制氣泡產生之理由,透明基體12(例如,包含Si之玻璃板)之第1主面12a中的F原子之數相對於Si原子之數之比(F/Si)(以下亦稱為「原子比(F/Si)」)較佳為0.005~0.13,更佳為0.015~0.1,進而較佳為0.02~0.08。再者,於原子比(F/Si)較大之情形時,透明基體12之第1主面12a中,表面能變低之區域變大,而與黏著層14之黏著性降低之區域變多。因此,若超過原子比(F/Si)之上限值,則容易於第1主面1a與黏著層14之黏著性較低之部位殘留氣泡。For the reason that the generation of bubbles can be further suppressed, the ratio of the number of F atoms to the number of Si atoms (F / Si) in the first main surface 12a of the transparent substrate 12 (for example, a glass plate containing Si) (F / Si The "atomic ratio (F / Si)") is preferably 0.005 to 0.13, more preferably 0.015 to 0.1, and even more preferably 0.02 to 0.08. Furthermore, when the atomic ratio (F / Si) is large, the area of the first main surface 12a of the transparent substrate 12 where the surface energy becomes low becomes larger, and the area where the adhesion with the adhesive layer 14 decreases becomes larger. . Therefore, if it exceeds the upper limit of the atomic ratio (F / Si), it is easy to leave air bubbles in the portion where the adhesion between the first main surface 1a and the adhesive layer 14 is low.

只要透明基體12之第1主面12a之原子比(F/Si)超過0,則可視為於透明基體12(例如,包含Si之玻璃板)之第1主面12a上附著有包含F原子之化合物。As long as the atomic ratio (F / Si) of the first main surface 12a of the transparent substrate 12 exceeds 0, it can be considered that the first main surface 12a of the transparent substrate 12 (for example, a glass plate containing Si) has an F atom containing Compound.

透明基體12之第1主面12a之原子比(F/Si)以如下方式求出。 首先,針對透明基體12之第1主面12a(於呈框狀印刷有邊框部132之情形時,未印刷邊框部132之區域),使用X射線光電子光譜裝置(日本電子公司製、JPS-9000MC),求出F原子濃度(單位:原子%)及Si原子濃度(單位:原子%)。將所求出之F原子濃度與Si原子濃度之比設為透明基體12之第1主面12a之原子比(F/Si)。 更詳細而言,於X射線之射線源為MgKα射線、加速電壓12 kV、25 mA之條件下測定。以點徑為6 mmf進行測定。無試樣之傾斜。以通過能量為50 eV、測定梯級為0.5 eV、Dwell Time(停留時間)為100 msec、掃描數為30次進行測定。針對測定後所獲得之鍵結能峰,藉由Shirley法去除背景之後,根據F1s峰強度與Si2p3/2之峰強度,算出F/Si之原子濃度比。The atomic ratio (F / Si) of the first principal surface 12 a of the transparent substrate 12 is determined as follows. First, an X-ray photoelectron spectroscopy device (manufactured by Japan Electronics Co., Ltd., JPS-9000MC) is used for the first main surface 12a of the transparent substrate 12 (the area where the frame portion 132 is not printed when the frame portion 132 is printed in a frame shape). ) To obtain the F atomic concentration (unit: atomic%) and the Si atomic concentration (unit: atomic%). The atomic ratio (F / Si) of the first principal surface 12 a of the transparent substrate 12 is set as the ratio of the F atomic concentration to the Si atomic concentration obtained. More specifically, the measurement was performed under conditions where the X-ray source was MgKα rays, an acceleration voltage of 12 kV, and 25 mA. The measurement was performed with a spot diameter of 6 mmf. No sample tilt. The measurement was performed with a passing energy of 50 eV, a measurement step of 0.5 eV, a Dwell Time (dwell time) of 100 msec, and a number of scans of 30 times. For the bond energy peak obtained after the measurement, after removing the background by the Shirley method, the atomic concentration ratio of F / Si was calculated based on the peak intensity of F1s and the peak intensity of Si2p3 / 2.

透明基體12只要為由透明材料構成者,則並無特別限定,例如,可較佳地使用由玻璃、或玻璃與樹脂之組合(複合材料、積層材料等)所構成者等。透明基體12之形狀亦無特別限定,例如可列舉具有剛性之板狀。又,透明基體12並非必須為平板狀,亦可為整體彎曲之形狀、於一部分具備折曲部之形狀。The transparent substrate 12 is not particularly limited as long as it is made of a transparent material. For example, glass or a combination of glass and resin (composite material, laminated material, etc.) can be preferably used. The shape of the transparent substrate 12 is not particularly limited, and examples thereof include a plate shape having rigidity. In addition, the transparent base body 12 does not necessarily have to be a flat plate shape, and may have a shape that is bent as a whole and a shape that includes a bent portion at a part.

作為用作透明基體12之玻璃板,可列舉由以二氧化矽為主成分之通常之玻璃、例如鈉鈣矽酸鹽玻璃、鋁矽酸鹽玻璃、硼矽酸玻璃、無鹼玻璃、石英玻璃等玻璃構成的玻璃板。Examples of the glass plate used as the transparent substrate 12 include ordinary glass mainly composed of silicon dioxide, such as soda lime silicate glass, aluminosilicate glass, borosilicate glass, alkali-free glass, and quartz glass. A glass plate made of glass.

於使用玻璃板作為透明基體12之情形時,玻璃之組成較佳為可進行成形或基於化學強化處理之強化之組成,較佳為包含鈉。In the case where a glass plate is used as the transparent substrate 12, the composition of the glass is preferably a composition that can be formed or strengthened by a chemical strengthening treatment, and preferably contains sodium.

玻璃之組成並無特別限定,可利用具有各種組成之玻璃。例如,可列舉以氧化物基準之莫耳%記載而具有以下組成之鋁矽酸鹽玻璃。 (i)包含50~80%之SiO2 、2~25%之Al2 O3 、0~10%之Li2 O、0~18%之Na2 O、0~10%之K2 O、0~15%之MgO、0~5%之CaO及0~5%之ZrO2 的玻璃。 (ii)含有50~74%之SiO2 、1~10%之Al2 O3 、6~14%之Na2 O、3~11%之K2 O、2~15%之MgO、0~6%之CaO及0~5%之ZrO2 ,且SiO2 及Al2 O3 之合計含量為75%以下,Na2 O及K2 O之合計含量為12~25%,MgO及CaO之合計含量為7~15%的玻璃。 (iii)含有68~80%之SiO2 、4~10%之Al2 O3 、5~15%之Na2 O、0~1%之K2 O、4~15%之MgO及0~1%之ZrO2 的玻璃。 (iv)含有67~75%之SiO2 、0~4%之Al2 O3 、7~15%之Na2 O、1~9%之K2 O、6~14%之MgO及0~1.5%之ZrO2 ,SiO2 及Al2 O3 之合計含量為71~75%,Na2 O及K2 O之合計含量為12~20%,且含有CaO之情形時其含量未達1%的玻璃。 (v)包含60~75%之SiO2 、0.5~8%之Al2 O3 、10~18%之Na2 O、0~5%之K2 O、6~15%之MgO、0~8%之CaO的玻璃。 (vi)含有63~75%之SiO2 、3~12%之Al2 O3 、3~10%之MgO、0.5~10%之CaO、0~3%之SrO、0~3%之BaO、10~18%之Na2 O、0~8%之K2 O、0~3%之ZrO2 、0.005~0.25%之Fe2 O3 ,且R2 O/Al2 O3 (式中,R2 O為Na2 O+K2 O)為2.0以上且4.6以下的玻璃。 (vii)含有66~75%之SiO2 、0~3%之Al2 O3 、1~9%之MgO、1~12%之CaO、10~16%之Na2 O、0~5%之K2 O的玻璃。The composition of the glass is not particularly limited, and glasses having various compositions can be used. For example, the aluminosilicate glass which has the following composition in Moire% based on an oxide is mentioned. (i) comprises 50 to 80% of SiO 2, 2 ~ 25% of Al 2 O 3, 0 ~ 10 % of Li 2 O, 0 ~ 18% of Na 2 O, 0 ~ 10% of K 2 O, 0 -15% MgO, 0-5% CaO, and 0-5% ZrO 2 glass. (ii) Contains 50 to 74% of SiO 2 , 1 to 10% of Al 2 O 3 , 6 to 14% of Na 2 O, 3 to 11% of K 2 O, 2 to 15% of MgO, and 0 to 6 % CaO and 0 ~ 5% ZrO 2 , and the total content of SiO 2 and Al 2 O 3 is 75% or less, the total content of Na 2 O and K 2 O is 12-25%, and the total content of MgO and CaO It is 7 to 15% of glass. (iii) Contains 68 to 80% of SiO 2 , 4 to 10% of Al 2 O 3 , 5 to 15% of Na 2 O, 0 to 1% of K 2 O, 4 to 15% of MgO, and 0 to 1 % Of ZrO 2 glass. (iv) Contains 67 to 75% SiO 2 , 0 to 4% Al 2 O 3 , 7 to 15% Na 2 O, 1 to 9% K 2 O, 6 to 14% MgO, and 0 to 1.5 The total content of ZrO 2 , SiO 2 and Al 2 O 3 is 71 to 75%, the total content of Na 2 O and K 2 O is 12 to 20%, and the content is less than 1% when it contains CaO. glass. (v) contains 60 to 75% of SiO 2 , 0.5 to 8% of Al 2 O 3 , 10 to 18% of Na 2 O, 0 to 5% of K 2 O, 6 to 15% of MgO, 0 to 8 % Of CaO glass. (vi) containing 63 to 75% of SiO 2 , 3 to 12% of Al 2 O 3 , 3 to 10% of MgO, 0.5 to 10% of CaO, 0 to 3% of SrO, 0 to 3% of BaO, 10 to 18% of Na 2 O, 0 ~ 8% of K 2 O, 0 ~ 3% of ZrO 2, 0.005 ~ 0.25% of Fe 2 O 3, and R 2 O / Al 2 O 3 ( wherein, R 2 O, Na 2 O + K 2 O) 2.0 or more and 4.6 or less glass. (vii) Contains 66 to 75% SiO 2 , 0 to 3% Al 2 O 3 , 1 to 9% MgO, 1 to 12% CaO, 10 to 16% Na 2 O, and 0 to 5%. K 2 O glass.

作為透明基體12,較佳為玻璃板。 玻璃板之製造方法並無特別限定。可藉由如下方式製造,即,將所期望之玻璃原料投入至熔融爐,以1500~1600℃加熱熔融並澄清之後,供給至成形裝置而將熔融玻璃成形為板狀並進行緩冷。 玻璃板之成形方法並無特別限定,例如可利用下拉法(例如,溢流下拉法、流孔下引法、再曳引法等)、浮式法、滾壓法、壓製法等。The transparent substrate 12 is preferably a glass plate. The manufacturing method of a glass plate is not specifically limited. It can be manufactured by putting a desired glass raw material into a melting furnace, heating and melting at 1500 to 1600 ° C. and clarifying, and then supplying it to a molding device to shape the molten glass into a plate shape and slow cooling. The method for forming the glass plate is not particularly limited, and for example, a down-draw method (for example, an overflow down-draw method, an orifice down-draw method, and a re-draw method), a float method, a rolling method, and a pressing method can be used.

於使用玻璃板作為透明基體12之情形時,為了提高強度,較佳為對玻璃板實施化學強化處理或物理強化處理。When a glass plate is used as the transparent substrate 12, in order to increase the strength, it is preferable to perform a chemical strengthening treatment or a physical strengthening treatment on the glass plate.

化學強化處理方法並無特別限定,對玻璃板之主面進行離子交換,形成殘留壓縮應力之表面層。具體而言,以玻璃轉移點以下之溫度,將玻璃板之主面附近之玻璃中包含之離子半徑較小之鹼金屬離子(例如,Li離子、Na離子)置換為離子半徑更大之鹼金屬離子(例如,相對於Li離子而言為Na離子或K離子,相對於Na離子而言為K離子)。藉此,於玻璃板之主面殘留壓縮應力,而玻璃板之強度提昇。The chemical strengthening treatment method is not particularly limited, and the main surface of the glass plate is ion-exchanged to form a surface layer of residual compressive stress. Specifically, at a temperature below the glass transition point, the alkali metal ions (for example, Li ions, Na ions) having a smaller ionic radius contained in the glass near the main surface of the glass plate are replaced with alkali metals having a larger ionic radius. An ion (for example, Na ion or K ion with respect to Li ion, and K ion with respect to Na ion). As a result, compressive stress remains on the main surface of the glass plate, and the strength of the glass plate is improved.

作為透明基體12之玻璃板較佳為滿足以下所示之條件。藉由進行上述化學強化處理,可使其滿足此種條件。 玻璃板之壓縮應力(以下稱為「CS」)較佳為400 MPa以上且1200 MPa以下,更佳為700 MPa以上且900 MPa以下。若CS為400 Pa以上,則作為實用上之強度已足夠。另一方面,若CS為1200 MPa以下,則能夠承受自身之壓縮應力,不擔心自然地破壞。 玻璃板之應力層之深度(以下稱為「DOL」)較佳為15~50 μm,更佳為20~40 μm。若DOL為15 μm以上,則即便使用玻璃切割機等銳利之治具,亦不擔心容易產生劃痕而被破壞。另一方面,若DOL為40 μm以下,則能夠承受自身之壓縮應力,不擔心自然地破壞。The glass plate as the transparent substrate 12 preferably satisfies the conditions shown below. By performing the above chemical strengthening treatment, such conditions can be satisfied. The compressive stress (hereinafter referred to as "CS") of the glass plate is preferably 400 MPa or more and 1200 MPa or less, and more preferably 700 MPa or more and 900 MPa or less. If CS is 400 Pa or more, it is sufficient as a practical strength. On the other hand, if CS is 1200 MPa or less, it can withstand its own compressive stress without fear of natural damage. The depth of the stress layer of the glass plate (hereinafter referred to as "DOL") is preferably 15 to 50 μm, and more preferably 20 to 40 μm. If the DOL is 15 μm or more, even if a sharp jig such as a glass cutter is used, there is no fear that scratches may easily occur and damage may occur. On the other hand, if the DOL is 40 μm or less, it can withstand its own compressive stress without fear of natural damage.

透明基體12之厚度可根據用途適當選擇。例如,於玻璃板之情形時,厚度較佳為0.1~5 mm,更佳為0.2~2 mm。 於使用玻璃板作為透明基體12並進行上述化學強化處理之情形時,為了使之更有效,玻璃板之厚度通常較佳為5 mm以下,更佳為3 mm以下。透明基體12之尺寸可根據用途適當選擇。The thickness of the transparent substrate 12 can be appropriately selected according to the application. For example, in the case of a glass plate, the thickness is preferably 0.1 to 5 mm, and more preferably 0.2 to 2 mm. When a glass plate is used as the transparent substrate 12 and the above-mentioned chemical strengthening treatment is performed, in order to make it more effective, the thickness of the glass plate is usually preferably 5 mm or less, more preferably 3 mm or less. The size of the transparent substrate 12 can be appropriately selected according to the application.

《邊框部》 邊框部132係將著色墨水印刷於透明基體12而形成。邊框部132較佳為形成於透明基體12之第1主面12a之周緣部。 作為印刷法,例如有棒式塗佈法、反向塗佈法、凹版塗佈法、模嘴塗佈法、輥式塗佈法、網版法、噴墨法等,但根據能夠簡便地印刷、能夠印刷於各種透明基體邊框部、能夠配合透明基體邊框部之尺寸而印刷等理由,較佳為網版印刷法。<< Frame part >> The frame part 132 is formed by printing colored ink on the transparent substrate 12. The frame portion 132 is preferably formed on a peripheral edge portion of the first main surface 12 a of the transparent base 12. Examples of the printing method include a bar coating method, a reverse coating method, a gravure coating method, a die coating method, a roll coating method, a screen printing method, and an inkjet method. For reasons such as being able to print on various transparent substrate frame portions and printing in accordance with the size of the transparent substrate frame portions, the screen printing method is preferred.

作為著色墨水,並無特別限定,例如可使用:包含陶瓷焙燒體等之無機系墨水;包含染料或顏料等色料與有機樹脂之有機系墨水等。用於形成邊框部132之著色墨水多數情況下為黑色或白色,但其顏色並無特別限定。又,亦可為僅使紅外線之波長區域透過之著色墨水。The coloring ink is not particularly limited, and examples thereof include an inorganic ink containing a ceramic calcined body and the like; an organic ink containing a colorant such as a dye or a pigment; and an organic resin. The coloring ink used to form the frame portion 132 is mostly black or white, but the color is not particularly limited. It is also possible to use a coloring ink that transmits only the wavelength region of infrared rays.

作為無機系墨水中含有之陶瓷,例如有:氧化鉻、氧化鐵等氧化物;碳化鉻、碳化鎢等碳化物;碳黑;雲母等。Examples of ceramics contained in the inorganic ink include oxides such as chromium oxide and iron oxide; carbides such as chromium carbide and tungsten carbide; carbon black; mica and the like.

有機系墨水係包含染料或顏料與有機樹脂之組合物。染料或顏料可無特別限定地使用。 作為有機樹脂,例如可列舉:環氧系樹脂、丙烯酸系樹脂、聚對苯二甲酸乙二酯、聚醚碸、聚芳酯、聚碳酸酯、透明ABS(Acrylonitrile Butadiene Styrene,丙烯腈-丁二烯-苯乙烯)樹脂、酚系樹脂、丙烯腈-丁二烯-苯乙烯樹脂、聚胺基甲酸酯、聚甲基丙烯酸甲酯、聚乙烯(polyvinyl)、聚乙烯醇縮丁醛、聚醚醚酮、聚乙烯、聚酯、聚丙烯、聚醯胺、聚醯亞胺等之均聚物;該等樹脂之單體和能夠與之共聚之單體之共聚物等。The organic ink is a composition containing a dye or a pigment and an organic resin. The dye or pigment can be used without particular limitation. Examples of the organic resin include epoxy resin, acrylic resin, polyethylene terephthalate, polyether fluorene, polyarylate, polycarbonate, and transparent ABS (Acrylonitrile Butadiene Styrene, acrylonitrile-butadiene). (Ene-styrene) resin, phenolic resin, acrylonitrile-butadiene-styrene resin, polyurethane, polymethyl methacrylate, polyvinyl, polyvinyl butyral, poly Homopolymer of ether ether ketone, polyethylene, polyester, polypropylene, polyamide, polyimide, etc .; copolymers of monomers of these resins and monomers that can be copolymerized with them.

關於無機系墨水與有機系墨水,由於焙燒溫度較低,故較佳為使用有機系墨水,就耐化學品性之觀點而言,更佳為包含顏料之有機系墨水。Regarding the inorganic ink and the organic ink, since the firing temperature is low, it is preferable to use an organic ink, and from the viewpoint of chemical resistance, an organic ink containing a pigment is more preferable.

《功能層》 覆蓋構件11較佳為於透明基體12之第1主面12a或第2主面12b具有未圖示之功能層,尤其是,更佳為於透明基體12之第2主面12b具有功能層。 功能層係展現透明基體12未具備之特性之層。作為功能層,例如可列舉防眩層、抗反射層、防污層等。<< Functional Layer >> The covering member 11 preferably has a functional layer (not shown) on the first main surface 12a or the second main surface 12b of the transparent substrate 12, and more preferably on the second main surface 12b of the transparent substrate 12. With functional layers. The functional layer is a layer exhibiting characteristics not possessed by the transparent substrate 12. Examples of the functional layer include an antiglare layer, an antireflection layer, and an antifouling layer.

(防眩層) 覆蓋構件11較佳為於透明基體12之第1主面12a或第2主面12b具有防眩層。藉由設置防眩層,可減少周圍之光之映入,從而可防止顯示圖像之視認性降低。尤其是,更佳為於透明基體12之第2主面12b設置防眩層。(Anti-glare layer) The cover member 11 preferably has an anti-glare layer on the first main surface 12 a or the second main surface 12 b of the transparent base 12. By providing an anti-glare layer, the reflection of surrounding light can be reduced, and the visibility of a displayed image can be prevented from being reduced. In particular, it is more preferable to provide an anti-glare layer on the second main surface 12 b of the transparent substrate 12.

防眩層可藉由進行在透明基體12之第1主面12a或第2主面12b設置凹凸形狀之處理、所謂防眩處理而形成。 作為防眩處理,可應用公知之方法,例如,於使用玻璃板作為透明基體12之情形時,可利用對玻璃板之主面化學性或物理性地實施表面處理而形成所期望之表面粗糙度之凹凸形狀的方法、或濕式塗佈等。The anti-glare layer can be formed by performing a process of providing a concave-convex shape on the first main surface 12 a or the second main surface 12 b of the transparent substrate 12, a so-called anti-glare process. As the anti-glare treatment, a known method can be applied. For example, when a glass plate is used as the transparent substrate 12, a main surface of the glass plate can be chemically or physically subjected to a surface treatment to form a desired surface roughness. The method of uneven shape or wet coating.

作為化學性地進行防眩處理之方法,具體而言,可列舉實施磨砂處理之方法。磨砂處理例如藉由將作為被處理體之玻璃板浸漬於氟化氫與氟化銨之混合溶液中而實施。As a method of chemically performing anti-glare treatment, specifically, the method of carrying out a frosting process is mentioned. The frosting treatment is performed, for example, by immersing a glass plate as a treatment object in a mixed solution of hydrogen fluoride and ammonium fluoride.

作為物理性地進行防眩處理之方法,例如可利用將結晶質二氧化矽粉、碳化矽粉等以加壓空氣吹附至玻璃板之主面的所謂噴砂處理、或使用將附著有結晶質二氧化矽粉、碳化矽粉等之刷用水弄濕者進行擦拭的方法等。As a method for physically performing anti-glare treatment, for example, a so-called sandblasting treatment in which crystalline silicon dioxide powder, silicon carbide powder, etc. are blown onto the main surface of a glass plate with pressurized air, or a crystalline substance is attached How to wipe the brushes such as silicon dioxide powder and silicon carbide powder with water.

該等之中,磨砂處理由於不易產生被處理體表面中之微裂紋,而不易發生機械強度之降低,故作為對玻璃板進行防眩處理之方法係較佳。Among these, the frosting treatment is not easy to cause microcracks in the surface of the object to be treated, and it is not easy to reduce the mechanical strength, so it is preferable as a method for antiglare treatment of the glass plate.

以此方式化學性或物理性地實施防眩處理後之玻璃板之主面較佳為進行蝕刻處理,以調整表面形狀。作為蝕刻處理,例如可利用將玻璃板浸漬於為氟化氫之水溶液之蝕刻溶液中而化學性地蝕刻的方法。蝕刻溶液亦可除了氟化氫以外,亦含有鹽酸、硝酸、檸檬酸等酸。藉由含有該等酸,可抑制因玻璃板中含有之Na離子、K離子等陽離子與氟化氫之反應所致的析出物之局部產生,而且可於處理面內均勻地進行蝕刻。The main surface of the glass plate after the anti-glare treatment is chemically or physically performed in this manner is preferably subjected to an etching treatment to adjust the surface shape. As the etching treatment, for example, a method of chemically etching a glass plate by immersing it in an etching solution which is an aqueous solution of hydrogen fluoride can be used. The etching solution may contain acids such as hydrochloric acid, nitric acid, and citric acid in addition to hydrogen fluoride. By containing these acids, the local generation of precipitates caused by the reaction between cations such as Na ions and K ions contained in the glass plate and hydrogen fluoride can be suppressed, and etching can be performed uniformly in the processing surface.

於進行蝕刻處理之情形時,藉由調節蝕刻溶液之濃度、或玻璃板於蝕刻溶液中之浸漬時間等而調節蝕刻量,藉此可將玻璃板之防眩處理面之霧度值調整為所期望之值。於進行噴砂等物理性表面處理作為防眩處理之情形時,有時會產生裂紋,但藉由蝕刻處理而可將此種裂紋去除。藉由蝕刻處理,亦獲得抑制眩光之效果。此處,所謂眩光係表示如下現象,即,於將透明基體12用作像素矩陣類型之顯示裝置用覆蓋構件之情形時,於覆蓋構件表面觀察到具有較像素矩陣大之週期之多個光粒。When the etching process is performed, the amount of etching is adjusted by adjusting the concentration of the etching solution or the immersion time of the glass plate in the etching solution, thereby adjusting the haze value of the anti-glare treatment surface of the glass plate to the desired value. Expected value. When a physical surface treatment such as sandblasting is performed as an anti-glare treatment, cracks may occur, but such cracks can be removed by an etching treatment. The effect of suppressing glare is also obtained by the etching process. Here, the so-called glare means a phenomenon in which, when the transparent substrate 12 is used as a cover member for a display device of a pixel matrix type, a plurality of light particles having a period larger than the pixel matrix are observed on the surface of the cover member. .

防眩處理及蝕刻處理後之玻璃板之主面較佳為表面粗糙度(均方根粗糙度、RMS)為0.01~0.5 μm。表面粗糙度(RMS)更佳為0.01~0.3 μm,進而較佳為0.01~0.2 μm。藉由將表面粗糙度(RMS)設為上述範圍,可將防眩處理後之玻璃板之霧度值調整為1~30%。霧度值係JIS K 7136:(2000)中規定之值。The main surface of the glass plate after the anti-glare treatment and the etching treatment preferably has a surface roughness (root mean square roughness, RMS) of 0.01 to 0.5 μm. The surface roughness (RMS) is more preferably 0.01 to 0.3 μm, and still more preferably 0.01 to 0.2 μm. By setting the surface roughness (RMS) to the above range, the haze value of the glass plate after anti-glare treatment can be adjusted to 1 to 30%. The haze value is a value specified in JIS K 7136: (2000).

表面粗糙度(RMS)可依據JIS B 0601:(2001)中規定之方法測定。具體而言,藉由雷射顯微鏡(商品名:VK-9700、KEYENCE公司製),對作為試樣之防眩處理後之玻璃板之測定面設定300 μm×200 μm之視野範圍,測定玻璃板之高度資訊。對測定值進行臨界修正,並求出所獲得之高度之均方根,藉此可算出表面粗糙度(RMS)。作為臨界值,較佳為使用0.08 mm。The surface roughness (RMS) can be measured according to a method specified in JIS B 0601: (2001). Specifically, a laser microscope (trade name: VK-9700, manufactured by KEYENCE Corporation) was used to set a field of view of 300 μm × 200 μm to the measurement surface of the glass plate after anti-glare treatment as a sample, and the glass plate was measured. Height information. The surface roughness (RMS) can be calculated by critically correcting the measured value and finding the root mean square of the obtained height. As the critical value, 0.08 mm is preferably used.

實施防眩處理及蝕刻處理後之玻璃板之表面具有凹凸形狀,若自玻璃板表面之上方對其進行觀察,則看似為圓形之孔。如此觀察到之圓形之孔之大小(直徑)較佳為1 μm以上且10 μm以下。藉由處於該範圍,可同時實現眩光之防止與防眩性。The surface of the glass plate after the anti-glare treatment and the etching treatment has a concave-convex shape. When viewed from above the surface of the glass plate, it looks like a circular hole. The size (diameter) of the circular holes thus observed is preferably 1 μm or more and 10 μm or less. By being in this range, glare prevention and anti-glare properties can be achieved at the same time.

(抗反射層) 若於透明基體12之主面設置抗反射層作為功能層,則可減少外界光之映入,從而可防止顯示圖像之視認性降低。於在透明基體12之主面設置有防眩層之情形時,較佳為於防眩層之上設置抗反射層。(Anti-reflection layer) If an anti-reflection layer is provided as a functional layer on the main surface of the transparent substrate 12, the reflection of external light can be reduced, and the visibility of the displayed image can be prevented from being lowered. When an anti-glare layer is provided on the main surface of the transparent substrate 12, it is preferable to provide an anti-reflection layer on the anti-glare layer.

作為抗反射層之構成,只要為能夠將光之反射抑制於特定範圍之構成則並無特別限定,例如,可設為將高折射率層與低折射率層積層所得之構成。此處,高折射率層例如係指波長550 nm之光之折射率為1.9以上之層,低折射率層係指波長550 nm之光之折射率為1.6以下之層。The configuration of the anti-reflection layer is not particularly limited as long as it is a configuration capable of suppressing reflection of light within a specific range. For example, it may be a configuration obtained by laminating a high refractive index layer and a low refractive index layer. Here, the high refractive index layer refers to, for example, a layer having a refractive index of light of 550 nm or more, and the low refractive index layer refers to a layer having a refractive index of light of 550 nm or less.

抗反射層中之高折射率層與低折射率層之層數可為將各者各包含1層之態樣,亦可為將各者包含2層以上之構成。於將高折射率層與低折射率層分別包含1層之構成之情形時,較佳為於透明基體12之主面依序積層高折射率層、低折射率層而成者。於將高折射率層與低折射率層分別包含2層以上之構成之情形時,較佳為按照高折射率層、低折射率層之順序交替地積層之態樣。The number of layers of the high-refractive index layer and the low-refractive index layer in the anti-reflection layer may be a state in which each includes one layer, or a configuration in which each includes two or more layers. When the high-refractive index layer and the low-refractive index layer each include one layer, it is preferable that a high-refractive index layer and a low-refractive index layer are sequentially laminated on the main surface of the transparent substrate 12. When the high-refractive index layer and the low-refractive index layer each include two or more layers, it is preferable to alternately laminate the high-refractive index layer and the low-refractive index layer in the order.

為了提高抗反射性能,抗反射層較佳為將複數層積層而成之積層體。該積層體例如較佳為整體為2層以上且8層以下之積層體,更佳為2層以上且6層以下之積層體,進而較佳為2層以上且4層以下之積層體。此處之積層體如上所述較佳為將高折射率層與低折射率層交替地積層而成者。高折射率層與低折射率層之層數之合計較佳為在上述範圍內。亦可於不損害光學特性之範圍內追加層。例如,為了防止來自玻璃基體之Na擴散,亦可於玻璃與第1層之間插入SiO2 層。In order to improve the anti-reflection performance, the anti-reflection layer is preferably a laminated body formed by laminating a plurality of layers. The laminated body is, for example, preferably a laminated body having 2 or more and 8 layers or less, more preferably a laminated body having 2 or more and 6 layers or less, and further preferably a laminated body having 2 or more and 4 layers or less. As described above, the laminated body is preferably obtained by alternately laminating a high refractive index layer and a low refractive index layer. The total number of layers of the high refractive index layer and the low refractive index layer is preferably within the above range. You may add a layer in the range which does not impair optical characteristics. For example, in order to prevent Na from diffusing from the glass substrate, a SiO 2 layer may be inserted between the glass and the first layer.

高折射率層之層厚及低折射率層之層厚被適當調整。The layer thickness of the high refractive index layer and the layer thickness of the low refractive index layer are appropriately adjusted.

構成高折射率層、低折射率層之材料並無特別限定,可考慮所要求之抗反射性能之程度或生產性等而選擇。 作為構成高折射率層之材料,例如可列舉氧化鈮(Nb2 O5 )、氧化鈦(TiO2 )、氧化鋯(ZrO2 )、氧化鉭(Ta2 O5 )、氧化鋁(Al2 O3 )、氮化矽(Si3 N4 )等。可較佳地使用自該等材料中選擇之1種以上。 作為構成低折射率層之材料,可列舉氧化矽(尤其是二氧化矽SiO2 )、包含Si與Sn之混合氧化物之材料、包含Si與Zr之混合氧化物之材料、包含Si與Al之混合氧化物之材料等。可較佳地使用自該等材料中選擇之1種以上。The material constituting the high-refractive index layer and the low-refractive index layer is not particularly limited, and can be selected in consideration of the degree of required antireflection performance, productivity, and the like. Examples of the material constituting the high refractive index layer include niobium oxide (Nb 2 O 5 ), titanium oxide (TiO 2 ), zirconia (ZrO 2 ), tantalum oxide (Ta 2 O 5 ), and alumina (Al 2 O 3 ), silicon nitride (Si 3 N 4 ), etc. One or more selected from these materials can be preferably used. As the material constituting the low refractive index layer include a silicon oxide (especially silicon dioxide SiO 2), a material containing mixed oxides of Si and Sn, the material comprising the mixed oxides of Si and Zr, Al and Si containing the Mixed oxide materials. One or more selected from these materials can be preferably used.

就生產性或折射率之觀點而言,較佳為如下構成,即,高折射率層為由自氧化鈮、氧化鉭、氮化矽中選擇之1種構成之層,且低折射率層為由氧化矽構成之層。From the viewpoint of productivity or refractive index, it is preferable that the high refractive index layer is a layer composed of one selected from niobium oxide, tantalum oxide, and silicon nitride, and the low refractive index layer is A layer made of silicon oxide.

形成構成抗反射層之各層之方法並無特別限定,可使用各種方法。例如可使用真空蒸鍍法、離子束輔助蒸鍍法、離子電鍍法、濺鍍法、電漿CVD(Chemical Vapor Deposition,化學氣相沈積)法等。該等方法之中,藉由使用濺鍍法而可形成緻密且耐久性較高之層,因而較佳。尤佳為脈衝濺鍍法、AC(Alternating Current,交流)濺鍍法、數位濺鍍法等濺鍍法。The method for forming each layer constituting the anti-reflection layer is not particularly limited, and various methods can be used. For example, a vacuum vapor deposition method, an ion beam assisted vapor deposition method, an ion plating method, a sputtering method, a plasma CVD (Chemical Vapor Deposition) method, or the like can be used. Among these methods, it is preferable to use a sputtering method to form a dense and highly durable layer. Particularly preferred are sputtering methods such as pulse sputtering, AC (Alternating Current) sputtering, and digital sputtering.

例如,於脈衝濺鍍法之情形時,將玻璃板等透明基體12配置於惰性氣體與氧氣之混合氣體氛圍之腔室內,並以成為所期望之組成之方式選擇靶。此時,腔室內之惰性氣體之氣體種類並無特別限定,可使用氬氣或氦氣等各種惰性氣體。For example, in the case of the pulse sputtering method, a transparent substrate 12 such as a glass plate is placed in a chamber of a mixed gas atmosphere of an inert gas and oxygen, and a target is selected so as to have a desired composition. At this time, the type of the inert gas in the chamber is not particularly limited, and various inert gases such as argon or helium can be used.

由惰性氣體與氧氣之混合氣體產生之腔室內之壓力並無特別限定,但藉由設為0.5 Pa以下之範圍,而容易將形成之層之表面粗糙度設為較佳之範圍。 由惰性氣體與氧氣之混合氣體產生之腔室內之壓力之下限值並無特別限定,例如較佳為0.1 Pa以上。The pressure in the chamber generated by the mixed gas of the inert gas and oxygen is not particularly limited, but by setting the range to 0.5 Pa or less, it is easy to set the surface roughness of the formed layer to a preferable range. The lower limit value of the pressure in the chamber generated by the mixed gas of the inert gas and oxygen is not particularly limited, and is preferably 0.1 Pa or more, for example.

於利用脈衝濺鍍法形成高折射率層及低折射率層之情形時,各層之層厚之調整例如可藉由放電功率之調整或形成各層之時間之調整等而實現。When the high-refractive-index layer and the low-refractive-index layer are formed by the pulse sputtering method, the adjustment of the layer thickness of each layer can be achieved by, for example, adjusting the discharge power or adjusting the time for forming each layer.

(防污層) 較佳為於透明基體12之主面設置防污層作為功能層。若設置防污層,則容易將附著於透明基體12之污垢(人之指紋等)去掉。防污層較佳為構成功能層之最表面之層,以充分發揮其功能。 作為防污層之形成方法,可使用真空蒸鍍法、離子束輔助蒸鍍法、離子電鍍法、濺鍍法、電漿CVD法等乾式法、旋轉塗佈法、浸漬塗佈法、流延法、狹縫式塗佈法、噴霧法等濕式法中之任一種。就耐擦傷性之觀點而言,較佳為乾式法。(Antifouling layer) It is preferable to provide an antifouling layer as a functional layer on the main surface of the transparent substrate 12. If an antifouling layer is provided, dirt (human fingerprints, etc.) adhering to the transparent substrate 12 can be easily removed. The antifouling layer is preferably the outermost layer constituting the functional layer in order to fully exert its function. As a method for forming the antifouling layer, a dry method such as a vacuum evaporation method, an ion beam assisted evaporation method, an ion plating method, a sputtering method, a plasma CVD method, a spin coating method, a dip coating method, or casting can be used. Any one of the wet methods such as the coating method, the slit coating method, and the spray method. From the viewpoint of abrasion resistance, a dry method is preferred.

防污層之構成材料可自能夠賦予防污性、撥水性、撥油性之材料中適當選擇。具體而言,可列舉含氟有機矽化合物。含氟有機矽化合物只要能夠賦予防污性、撥水性及撥油性,則可無特別限定地使用。The constituent material of the antifouling layer can be appropriately selected from materials capable of imparting antifouling properties, water repellency, and oil repellency. Specific examples include fluorine-containing organosilicon compounds. The fluorine-containing organosilicon compound can be used without particular limitation as long as it can impart antifouling properties, water repellency, and oil repellency.

作為含氟有機矽化合物,例如可較佳地使用具有選自由多氟聚醚基、多氟伸烷基、及多氟烷基所組成之群中之1個以上之基的有機矽化合物。所謂多氟聚醚基係指具有多氟伸烷基與醚性氧原子交替地鍵結所得之構造之2價基。As the fluorine-containing organic silicon compound, for example, an organic silicon compound having one or more groups selected from the group consisting of a polyfluoropolyether group, a polyfluoroalkylene group, and a polyfluoroalkyl group can be preferably used. The polyfluoropolyether group refers to a divalent group having a structure in which a polyfluoroalkylene group and an etheric oxygen atom are alternately bonded.

作為具有選自由多氟聚醚基、多氟伸烷基、及全氟烷基所組成之群中之1個以上之基的含氟有機矽化合物之市售品,例如可較佳地使用KP-801、KY-178、KY-130、KY-185(均為商品名,信越化學公司製造)、OPTOOL DSX及OPTOOL AES(均為商品名,Daikin公司製造)、S550(商品名,旭硝子公司製造)等。As a commercially available product of a fluorine-containing organosilicon compound having one or more groups selected from the group consisting of a polyfluoropolyether group, a polyfluoroalkylene group, and a perfluoroalkyl group, for example, KP can be preferably used. -801, KY-178, KY-130, KY-185 (all are trade names, manufactured by Shin-Etsu Chemical Co., Ltd.), OPTOOL DSX and OPTOOL AES (both trade names, manufactured by Daikin), S550 (trade name, manufactured by Asahi Glass Co., Ltd.) )Wait.

含氟有機矽化合物通常與氟系等之溶劑混合而保存,以抑制因與大氣中之水分之反應所致之劣化等,但若於包含該等溶劑之狀態下直接使用,則有對所獲得之防污層之耐久性等造成不良影響的情況。 因此,按照下述順序,藉由真空蒸鍍法形成防污層之情形時,較佳為使用於利用加熱容器加熱之前預先進行了溶劑去除處理之含氟有機矽化合物。Fluorine-containing organosilicon compounds are usually stored in a mixture with a fluorine-based solvent to suppress deterioration caused by the reaction with moisture in the atmosphere. However, if used directly in a state containing these solvents, the obtained If the durability of the antifouling layer is adversely affected. Therefore, in the case where the antifouling layer is formed by the vacuum evaporation method in the following order, it is preferable to use a fluorine-containing organosilicon compound that has been subjected to a solvent removal treatment before being heated by a heating container.

此處,作為保存上述含氟有機矽化合物時所使用之溶劑,例如可列舉多氟己烷、六氟化間二甲苯(C6 H4 (CF3 )2 )、氫氟聚醚、HFE7200/7100(商品名,住友3M公司製造,HFE7200係由式:C4 F9 OC2 H5 表示,HFE7100係由式:C4 F9 OCH3 表示)等。例如,含氟有機矽化合物之溶液中包含之溶劑之濃度較佳為1 mol%以下,更佳為0.2 mol%以下。尤佳為使用不包含溶劑之含氟有機矽化合物。Here, examples of the solvent used when storing the fluorine-containing organosilicon compound include polyfluorohexane, m-xylene hexafluoride (C 6 H 4 (CF 3 ) 2 ), hydrofluoropolyether, and HFE7200 / 7100 (trade name, manufactured by Sumitomo 3M, HFE7200 is represented by the formula: C 4 F 9 OC 2 H 5 and HFE7100 is represented by the formula: C 4 F 9 OCH 3 ). For example, the concentration of the solvent contained in the solution of the fluorine-containing organosilicon compound is preferably 1 mol% or less, and more preferably 0.2 mol% or less. It is particularly preferable to use a fluorine-containing organosilicon compound containing no solvent.

自上述包含氟系溶劑之含氟有機矽化合物之溶液中去除溶劑之處理例如可藉由將裝有含氟有機矽化合物之溶液之容器真空排氣而實施。真空排氣之時間係根據排氣管線、真空泵等之排氣能力、溶液之量等而變化,因此不受限定,例如真空排氣10小時以上即可。The removal of the solvent from the above-mentioned solution containing a fluorine-containing organic silicon compound containing a fluorine-based solvent can be performed, for example, by vacuum evacuation of a container containing the solution containing a fluorine-containing organic silicon compound. The evacuation time varies depending on the evacuation capacity of the exhaust line, vacuum pump, etc., the amount of solution, etc., and is therefore not limited. For example, the evacuation time may be more than 10 hours.

於形成由上述含氟有機矽化合物構成之防污層之情形時,較佳為使用真空蒸鍍法。於使用真空蒸鍍法之情形時,上述溶劑之去除處理亦可以如下方式進行,即,向用於形成防污層之成膜裝置之加熱容器中導入含氟有機矽化合物之溶液後,於升溫前,於室溫下將加熱容器內真空排氣。亦可於導入至加熱容器之前,預先藉由蒸發器等去除溶劑。When the antifouling layer composed of the fluorine-containing organosilicon compound is formed, a vacuum evaporation method is preferably used. When a vacuum evaporation method is used, the above-mentioned solvent removal treatment can also be performed by introducing a solution containing a fluorine-containing organosilicon compound into a heating container of a film forming apparatus for forming an antifouling layer, and then raising the temperature. Before, the inside of the heating vessel was evacuated at room temperature. The solvent may be removed by an evaporator or the like before being introduced into the heating container.

上述溶劑之含量較少或不含溶劑之含氟有機矽化合物與包含溶劑者相比,容易因與大氣接觸而劣化。因此,溶劑含量較少(或不含溶劑)之含氟有機矽化合物之保管容器較佳為使用將容器中以氮氣等惰性氣體置換、密閉所得者,使得當處理時於大氣中之暴露時間變短。The fluorine-containing organosilicon compound containing a small amount of the solvent or containing no solvent is more likely to be deteriorated by contact with the atmosphere than those containing a solvent. Therefore, the storage container of fluorine-containing organosilicon compounds with less solvent content (or no solvent) is preferably obtained by replacing and sealing the container with an inert gas such as nitrogen, so that the exposure time in the atmosphere during processing will change. short.

具體而言,較佳為將保管容器開封後,立即將含氟有機矽化合物導入至成膜裝置之加熱容器中。而且,較佳為於導入後使加熱容器內為真空或以氮氣、稀有氣體等惰性氣體置換而將加熱容器內包含之大氣(空氣)去除。更佳為例如保管容器與加熱容器藉由帶閥之配管而連接,以能夠不與大氣接觸地自保管容器(儲藏容器)導入至成膜裝置之加熱容器。 而且,較佳為於將含氟有機矽化合物導入至加熱容器後,將容器內以真空或惰性氣體置換後,立即開始用於成膜之加熱。Specifically, it is preferable that the fluorine-containing organosilicon compound is introduced into a heating container of a film forming apparatus immediately after the storage container is opened. Furthermore, it is preferable to remove the atmosphere (air) contained in the heating container by introducing a vacuum in the heating container or replacing with an inert gas such as nitrogen or a rare gas after the introduction. More preferably, for example, the storage container and the heating container are connected by a valved pipe so that they can be introduced from the storage container (storage container) to the heating container of the film forming apparatus without being in contact with the atmosphere. Furthermore, it is preferred that after the fluorine-containing organosilicon compound is introduced into the heating container, the container is replaced with a vacuum or an inert gas, and then heating for film formation is started immediately.

通常而言,防污層之厚度較佳為2~20 nm,更佳為2~15 nm,進而較佳為2~10 nm。In general, the thickness of the antifouling layer is preferably 2 to 20 nm, more preferably 2 to 15 nm, and even more preferably 2 to 10 nm.

<覆蓋構件之製造方法> 覆蓋構件11之製造方法並無特別限定,例如可列舉如下方法,即,準備具有第1主面12a及第2主面12b之透明基體12,準備於一面附著有含氟化合物(未圖示)之轉印用基體(未圖示),使透明基體12之第1主面12a與轉印用基體中之附著有含氟化合物之面(以下亦稱為「轉印面」)接觸,將含氟化合物轉印至透明基體12之第1主面12a,藉由該轉印,使包含F原子之化合物附著於第1主面12a,將第1主面12a之接觸角設為50°以下。 作為覆蓋構件11之製造方法,亦列舉如下方法等,即,使透明基體12之第1主面12a與轉印用基體上之含氟化合物層之表面於相隔特定距離(例如,1~10 mm)之狀態下相面對,並靜置1~48小時。 就第1主面12a之接觸角之值之調整、及容易控制含氟化合物之附著量之方面而言,覆蓋構件11之製造方法較佳為上述基於轉印之方法。<Manufacturing Method of Covering Member> The manufacturing method of the covering member 11 is not particularly limited, and examples thereof include a method of preparing a transparent substrate 12 having a first main surface 12a and a second main surface 12b, and attaching a transparent substrate 12 to one surface. For a transfer substrate (not shown) of a fluorine compound (not shown), the first main surface 12a of the transparent substrate 12 and the transfer-attached surface (hereinafter also referred to as "transfer surface") ") Contact, transfer the fluorine-containing compound to the first main surface 12a of the transparent substrate 12, and by this transfer, a compound containing F atoms is attached to the first main surface 12a, and the contact angle of the first main surface 12a Set to 50 ° or less. As a manufacturing method of the cover member 11, a method is also cited in which the first main surface 12a of the transparent substrate 12 and the surface of the fluorine-containing compound layer on the transfer substrate are separated from each other by a specific distance (for example, 1 to 10 mm). ) Face each other and let stand for 1 to 48 hours. In terms of adjustment of the value of the contact angle of the first main surface 12a and easy control of the adhesion amount of the fluorine-containing compound, the method for manufacturing the cover member 11 is preferably the above-described method based on transfer.

於透明基體12之第1主面12a或第2主面12b之至少一面,視需要形成上述邊框部132或功能層。The frame portion 132 or the functional layer is formed on at least one of the first main surface 12a or the second main surface 12b of the transparent substrate 12 as needed.

於透明基體12為玻璃板之情形時,較佳為轉印用基體亦為玻璃板。轉印用基體之厚度並無特別限定,轉印用基體之尺寸較佳為與透明基體12相同或大於透明基體12。When the transparent substrate 12 is a glass plate, it is preferable that the substrate for transfer is also a glass plate. The thickness of the transfer substrate is not particularly limited, and the size of the transfer substrate is preferably the same as or larger than the transparent substrate 12.

附著於轉印用基體之轉印面之含氟化合物較佳為具有某程度之厚度之層狀。 層狀之含氟化合物(以下亦稱為「轉印用含氟化合物層」)較佳為以足夠多於單分子之厚度之量形成於轉印用基體上之狀態。 轉印用含氟化合物層按照與覆蓋構件11之防污層相同之順序形成。但是,轉印用含氟化合物層之厚度較佳為厚於覆蓋構件11之防污層,具體而言,例如為50~180 nm,較佳為60~170 nm。 轉印用含氟化合物層亦可不為於轉印用基體之主面方向上連續之連續層,亦可為不連續層(間斷層)。The fluorine-containing compound adhering to the transfer surface of the transfer substrate is preferably a layer having a certain thickness. The layered fluorine-containing compound (hereinafter also referred to as a "fluorine-containing compound layer for transfer") is preferably in a state of being formed on the transfer substrate in an amount sufficient to a thickness of a single molecule. The fluorine-containing compound layer for transfer is formed in the same order as the antifouling layer of the cover member 11. However, the thickness of the fluorine-containing compound layer for transfer is preferably thicker than the antifouling layer of the cover member 11, and specifically, for example, 50 to 180 nm, and more preferably 60 to 170 nm. The fluorine-containing compound layer for transfer may not be a continuous layer continuous in the main surface direction of the transfer substrate, or it may be a discontinuous layer (intermittent layer).

構成轉印用含氟化合物層之含氟化合物(例:含氟有機矽化合物)中,藉由與玻璃板等透明基體12反應(例:矽烷耦合反應)而牢固地化學鍵結者通常僅係與玻璃板等透明基體12接觸之分子。因此,存在於與透明基體12接觸之分子之上的分子(氟鏈)只是物理性地凝聚,可容易地游離而轉印至其他構件。Of the fluorine-containing compounds (eg, fluorine-containing organosilicon compounds) constituting the fluorine-containing compound layer for transfer, those that are strongly chemically bonded by reacting with a transparent substrate 12 such as a glass plate (eg, silane coupling reaction) are usually only related to Molecules in contact with the transparent substrate 12 such as a glass plate. Therefore, the molecules (fluorine chains) existing on the molecules that are in contact with the transparent substrate 12 are only physically aggregated, and can be easily released and transferred to other members.

使透明基體12之第1主面12a(亦可形成有邊框部132)與轉印用基體之轉印面接觸,並於經過特定時間後,將兩者剝離。以此方式,將附著於轉印用基體之含氟化合物(轉印用含氟化合物層)轉印至透明基體12之第1主面12a。The first main surface 12a of the transparent substrate 12 (the frame portion 132 may be formed) is brought into contact with the transfer surface of the transfer substrate, and after a certain period of time, the two are peeled off. In this way, the fluorine-containing compound (the fluorine-containing compound layer for transfer) attached to the transfer substrate is transferred to the first main surface 12 a of the transparent substrate 12.

此時,透明基體12與轉印用基體之接觸時間(亦稱為「轉印時間」)較佳為0.5分鐘以上且未達60分鐘,更佳為0.5分鐘以上且30分鐘以下,進而較佳為0.5分鐘以上且15分鐘以下。 [實施例]At this time, the contact time (also referred to as "transfer time") of the transparent substrate 12 and the transfer substrate is preferably 0.5 minutes or more and less than 60 minutes, more preferably 0.5 minutes or more and 30 minutes or less, and further preferably It is 0.5 minutes or more and 15 minutes or less. [Example]

以下,藉由實施例等對本發明之實施形態具體地進行說明。但是,本發明並不限定於以下之例。例1~6為實施例,例7~8為比較例。Hereinafter, embodiments of the present invention will be specifically described using examples and the like. However, the present invention is not limited to the following examples. Examples 1 to 6 are examples, and examples 7 to 8 are comparative examples.

<例1> 如以下所說明般,製作例1之覆蓋構件。<Example 1> The covering member of Example 1 was produced as explained below.

《透明基體(玻璃板)之準備》 於各例中,使用玻璃板作為成為覆蓋構件之透明基體。 更詳細而言,首先,準備作為化學強化用玻璃板之Dragontrail(商品名,旭硝子公司製造,厚度1.3 mm)。 將其裁斷為100 mm×100 mm之尺寸之後,進行化學強化處理。即,將化學強化用玻璃板於加熱至450℃而熔融之硝酸鉀(熔鹽)中浸漬2小時後,自熔鹽中提拉,並以1小時緩冷至室溫為止。以此方式,獲得表面壓縮應力(CS)為730 MPa、應力層之深度(DOL)為30 μm之被實施過化學強化處理之玻璃板。"Preparation of Transparent Substrate (Glass Plate)" In each example, a glass plate was used as a transparent substrate to be a covering member. More specifically, first, Dragontrail (trade name, manufactured by Asahi Glass Co., Ltd., thickness 1.3 mm) was prepared as a glass plate for chemical strengthening. It was cut to a size of 100 mm × 100 mm, and then chemically strengthened. That is, the glass plate for chemical strengthening was immersed in potassium nitrate (molten salt) melted by heating to 450 ° C. for 2 hours, then pulled from the molten salt, and slowly cooled to room temperature in 1 hour. In this way, a chemically strengthened glass plate having a surface compressive stress (CS) of 730 MPa and a depth of a stress layer (DOL) of 30 μm was obtained.

《邊框部之形成》 於成為覆蓋構件之玻璃板之第1主面之外側周邊部,藉由網版印刷而形成外框狀之邊框部。 具體而言,按照以下順序,於玻璃板之第1主面之外側周邊部之四邊,呈10 mm寬度之黑框狀地實施印刷,而形成邊框部。 首先,藉由網版印刷機,將黑色墨水塗佈成5 μm之厚度之後,於150℃下保持10分鐘使其乾燥,而形成第1印刷層。繼而,於第1印刷層之上,按照與上述相同之順序,將黑色墨水塗佈成5 μm之厚度之後,於150℃下保持40分鐘使其乾燥,而形成第2印刷層。以此方式,形成第1印刷層與第2印刷層積層而成之邊框部。 作為黑色墨水,使用HFGV3RX01(商品名,Seiko公司製造)。"Formation of the frame part" An outer frame-shaped frame part is formed by screen printing on the peripheral part of the outer side of the 1st main surface of the glass plate which becomes a cover member. Specifically, in the following procedure, printing was performed on four sides of the peripheral portion outside the first main surface of the glass plate in a black frame shape with a width of 10 mm to form a frame portion. First, black ink was applied to a thickness of 5 μm by a screen printing machine, and then kept at 150 ° C. for 10 minutes to be dried to form a first printing layer. Next, a black ink was applied to a thickness of 5 μm on the first printed layer in the same procedure as above, and then dried at 150 ° C. for 40 minutes to form a second printed layer. In this way, a frame portion formed by laminating the first print layer and the second print layer is formed. As the black ink, HFGV3RX01 (trade name, manufactured by Seiko Corporation) was used.

《防污層之形成》 於成為覆蓋構件之玻璃板之第2主面上,按照以下順序形成防污層。 首先,將作為防污層之材料之含氟有機矽化合物之溶液導入至加熱容器內。其後,將加熱容器內利用真空泵脫氣10小時以上而將溶液中之溶劑去除,將此作為防污層形成用組合物。 於例1中,作為防污層之材料,使用KY185(商品名,信越化學公司製造)。 繼而,將裝有防污層形成用組合物之加熱容器加熱至270℃,達到270℃之後,保持該狀態10分鐘直至溫度穩定為止。繼而,將玻璃板設置於真空腔室內之後,自與裝有防污層形成用組合物之加熱容器連接之噴嘴朝向玻璃板之第2主面供給防污層形成用組合物,形成防污層。 防污層係一面藉由設置於真空腔室內之晶體振子監視器測定防污層之厚度,一面形成直至防污層之厚度成為4 nm為止。 繼而,將自真空腔室取出之玻璃板以防污層向上之方式設置於加熱板,並於大氣中以150℃進行60分鐘之加熱處理。 以此方式,於玻璃板之第2主面上之整面形成防污層。"Formation of antifouling layer" An antifouling layer was formed on the second main surface of the glass plate to be a cover member in the following order. First, a solution of a fluorine-containing organosilicon compound as a material of an antifouling layer is introduced into a heating container. Thereafter, the inside of the heating container was degassed with a vacuum pump for 10 hours or more to remove the solvent from the solution, and this was used as a composition for forming an antifouling layer. In Example 1, as a material of the antifouling layer, KY185 (trade name, manufactured by Shin-Etsu Chemical Co., Ltd.) was used. Then, the heating container containing the composition for forming an antifouling layer was heated to 270 ° C, and after reaching 270 ° C, the state was maintained for 10 minutes until the temperature became stable. Next, after the glass plate is set in the vacuum chamber, the antifouling layer-forming composition is supplied from a nozzle connected to a heating container containing the composition for forming an antifouling layer toward the second main surface of the glass plate to form an antifouling layer. . The antifouling layer is formed by measuring the thickness of the antifouling layer with a crystal oscillator monitor installed in a vacuum chamber, and is formed until the thickness of the antifouling layer becomes 4 nm. Next, the glass plate taken out from the vacuum chamber was set on the heating plate with the antifouling layer facing upward, and was heated at 150 ° C. for 60 minutes in the atmosphere. In this way, an antifouling layer is formed on the entire surface of the second main surface of the glass plate.

《轉印》 使用轉印用基體,將轉印用含氟化合物層轉印至成為覆蓋構件之玻璃板之第1主面(形成有邊框部之側之主面)。 具體而言,首先,將與成為覆蓋構件之玻璃板相同之玻璃板以相同尺寸(100 mm×100 mm)準備另1片,將此作為轉印用基體。於轉印用基體之一主面(轉印面)上,按照與上述「防污層之形成」所記載之順序相同之順序,形成轉印用含氟化合物層。轉印用含氟化合物層之厚度設為70 nm。 繼而,使成為覆蓋構件之玻璃板之第1主面(形成有邊框部之側之主面)與形成於轉印用基體上之轉印用含氟化合物層之表面(與轉印用基體側之面為相反側之面)接觸。該接觸之時間(轉印時間)設為10分鐘。轉印後,將兩者剝離。<< Transfer >> Using a transfer substrate, the transfer fluorine-containing compound layer is transferred to the first main surface (the main surface of the side where the frame portion is formed) of a glass plate that is a cover member. Specifically, first, another glass plate having the same size (100 mm × 100 mm) as the glass plate serving as the cover member was prepared, and this was used as a transfer substrate. On one main surface (transfer surface) of the transfer substrate, a fluorine-containing compound layer for transfer is formed in the same procedure as described in the above-mentioned "Formation of an antifouling layer". The thickness of the fluorine-containing compound layer for transfer was set to 70 nm. Next, the first main surface of the glass plate (the main surface on the side where the frame portion is formed) serving as the cover member and the surface of the fluorine-containing compound layer for transfer formed on the substrate for transfer (the side of the substrate for transfer) The surface is the surface on the opposite side). The contact time (transfer time) was set to 10 minutes. After the transfer, both are peeled off.

<例2> 於成為覆蓋構件之玻璃板之第2主面上形成抗反射層並於該抗反射層上形成防污層,以及將轉印用含氟化合物層之厚度自70 nm變更為150 nm,除此以外,按照與例1相同之順序,製作例2之覆蓋構件。<Example 2> An anti-reflection layer was formed on the second main surface of the glass plate as a cover member, an antifouling layer was formed on the anti-reflection layer, and the thickness of the fluorine-containing compound layer for transfer was changed from 70 nm to 150 Except for nm, a covering member of Example 2 was produced in the same procedure as in Example 1.

《抗反射層之形成》 於玻璃板之第2主面之整面,形成高折射率層與低折射率層交替地積層而成之構造之抗反射層。 更詳細而言,於例2中,依次形成由氧化鈮構成之高折射率層、及由氧化矽構成之低折射率層,形成積層數成為2層之抗反射層。關於各層之厚度,將第1層之高折射率層設為13 nm,將第2層之低折射率層設為120 nm。 以下,分別記載高折射率層及低折射率層之形成方法。"Formation of anti-reflection layer" An anti-reflection layer having a structure in which a high refractive index layer and a low refractive index layer are alternately laminated is formed on the entire second main surface of a glass plate. More specifically, in Example 2, a high-refractive index layer composed of niobium oxide and a low-refractive index layer composed of silicon oxide were sequentially formed, and an antireflection layer having two layers was formed. Regarding the thickness of each layer, the high refractive index layer of the first layer was set to 13 nm, and the low refractive index layer of the second layer was set to 120 nm. Hereinafter, a method for forming a high refractive index layer and a low refractive index layer will be described.

(高折射率層之形成) 於真空腔室內,一面導入於氬氣中以成為10體積%之方式混合氧氣所得之混合氣體,一面於壓力0.3 Pa、頻率20 kHz、功率密度3.8 W/cm2 、反轉脈衝寬度5 μsec之條件下,使用氧化鈮靶(商品名:NBO靶,AGC CERAMICS股份有限公司製造)進行脈衝濺鍍,於玻璃板之應形成高折射率層之面之整面形成由氧化鈮構成之高折射率層。(Formation of high refractive index layer) in a vacuum chamber, the argon gas introduced into the side to be 10% by volume of a mixed manner obtained from a mixed gas oxygen side pressure 0.3 Pa, frequency 20 kHz, power density of 3.8 W / cm 2 With a reverse pulse width of 5 μsec, pulse sputtering was performed using a niobium oxide target (trade name: NBO target, manufactured by AGC CERAMICS Co., Ltd.) on the entire surface of the glass plate where the high refractive index layer should be formed High refractive index layer made of niobium oxide.

(低折射率層之形成) 於真空腔室內,一面導入於氬氣中以成為40體積%之方式混合氧氣所得之混合氣體,一面於壓力0.3 Pa、頻率20 kHz、功率密度3.8 W/cm2 、反轉脈衝寬度5 μsec之條件下,使用矽靶進行脈衝濺鍍,於應形成低折射率層之面之整面形成由氧化矽構成之低折射率層。(Formation of low-refractive-index layer) In a vacuum chamber, a mixed gas obtained by mixing oxygen in an argon gas at a volume of 40% by volume is introduced while the pressure is 0.3 Pa, the frequency is 20 kHz, and the power density is 3.8 W / cm 2 With a reverse pulse width of 5 μsec, pulse sputtering is performed using a silicon target, and a low refractive index layer made of silicon oxide is formed on the entire surface of the surface where the low refractive index layer should be formed.

<例3> 於成為覆蓋構件之玻璃板之第2主面上形成抗反射層並於該抗反射層上形成防污層,將防污層及轉印用含氟化合物層之材料自KY185變更為OPTOOL DSX(商品名,Daikin公司製造),以及將轉印時間自10分鐘變更為1分鐘,除此以外,按照與例1相同之順序,製作例3之覆蓋構件。抗反射層按照與例2相同之順序形成。〈Example 3〉 An anti-reflection layer was formed on the second main surface of the glass plate to be a cover member, and an anti-fouling layer was formed on the anti-reflection layer. The material of the anti-fouling layer and the fluorochemical layer for transfer was changed from KY185 An OPTOOL DSX (trade name, manufactured by Daikin Co., Ltd.) was used, and a transfer member was changed from 10 minutes to 1 minute, and a cover member of Example 3 was produced in the same procedure as in Example 1. The antireflection layer was formed in the same order as in Example 2.

<例4> 於成為覆蓋構件之玻璃板之第2主面上形成抗反射層並於該抗反射層上形成防污層,將防污層及轉印用含氟化合物層之材料自KY185變更為S550(商品名,旭硝子公司製造),以及將轉印時間自10分鐘變更為1分鐘,除此以外,按照與例1相同之順序,製作例4之覆蓋構件。抗反射層按照與例2相同之順序形成。<Example 4> An anti-reflection layer was formed on the second main surface of the glass plate to be a cover member, and an antifouling layer was formed on the antireflection layer. The material of the antifouling layer and the fluorine-containing compound layer for transfer was changed from KY185 Except for S550 (trade name, manufactured by Asahi Glass Co., Ltd.) and changing the transfer time from 10 minutes to 1 minute, a covering member of Example 4 was produced in the same procedure as in Example 1. The antireflection layer was formed in the same order as in Example 2.

<例5> 使轉印用含氟化合物層不與成為覆蓋構件之玻璃板之第1主面接觸,除此以外,按照與例1相同之順序,製作例5之覆蓋構件。 具體而言,於例5中,首先,以與例1相同之方式,於轉印用基體之轉印面上形成轉印用含氟化合物層(厚度:70 nm)。繼而,使成為覆蓋構件之玻璃板之第1主面(形成有邊框部之側之主面)與形成於轉印用基體上之轉印用含氟化合物層之表面(與轉印用基體側之面為相反側之面)於相隔5 mm之狀態下相面對,並靜置24小時。<Example 5> A cover member of Example 5 was produced in the same procedure as in Example 1 except that the fluorine-containing compound layer for transfer was not brought into contact with the first main surface of the glass plate as the cover member. Specifically, in Example 5, first, in the same manner as in Example 1, a fluorine-containing compound layer for transfer (thickness: 70 nm) was formed on the transfer surface of the transfer substrate. Next, the first main surface of the glass plate (the main surface on the side where the frame portion is formed) serving as the cover member and the surface of the fluorine-containing compound layer for transfer formed on the substrate for transfer (on the side of the substrate for transfer) The opposite side is the opposite side.) Face each other at a distance of 5 mm and let stand for 24 hours.

<例6> 於成為覆蓋構件之玻璃板之第2主面上形成抗反射層並於該抗反射層上形成防污層,以及將轉印時間自10分鐘變更為60分鐘,除此以外,按照與例1相同之順序,製作例6之覆蓋構件。抗反射層按照與例2相同之順序形成。<Example 6> In addition to forming an anti-reflection layer on the second main surface of the glass plate to be a covering member, forming an antifouling layer on the anti-reflection layer, and changing the transfer time from 10 minutes to 60 minutes, In the same procedure as in Example 1, a covering member of Example 6 was produced. The antireflection layer was formed in the same order as in Example 2.

<例7> 將轉印用含氟化合物層之厚度自70 nm變更為200 nm,以及將轉印時間自10分鐘變更為60分鐘,除此以外,按照與例1相同之順序,製作例7之覆蓋構件。<Example 7> Except that the thickness of the fluorine-containing compound layer for transfer was changed from 70 nm to 200 nm, and the transfer time was changed from 10 minutes to 60 minutes, the same procedure as in Example 1 was used to prepare Example 7. The cover member.

<例8> 不將轉印用含氟化合物層轉印至成為覆蓋構件之玻璃板之第1主面。取而代之,於成為覆蓋構件之玻璃板之第1主面貼附塗佈有矽酮系黏著劑之聚醯亞胺膠帶(Kapton tape 650S,寺岡製作所製造),然後立即剝下。除此以外,按照與例1相同之順序,製作例8之覆蓋構件。<Example 8> The fluorine-containing compound layer for transfer was not transferred to the first main surface of the glass plate as a cover member. Instead, a polyimide tape (Kapton tape 650S, manufactured by Teraoka Manufacturing Co., Ltd.) coated with a silicone-based adhesive was attached to the first main surface of the glass plate as the cover member, and immediately peeled off. Other than this, the covering member of Example 8 was produced in the same procedure as in Example 1.

<接觸角> 玻璃板之第1主面之接觸角以如下方式求出。 首先,對玻璃板之第1主面中之未印刷框狀之邊框部之區域分成4×4等分。測定分成等分時於玻璃板之第2主面所畫之線(3條+3條)彼此之交點(合計9點)處之水之接觸角。具體而言,於測定溫度23℃下,使用接觸角計(協和界面科學社製造,PCA-11)測定滴加純水5 μL之後經過5秒後之接觸角。將測定出之合計9點之接觸角之平均值設為玻璃板之第1主面之接觸角。<Contact angle> The contact angle of the 1st main surface of a glass plate was calculated | required as follows. First, the area of the unprinted frame-shaped frame portion on the first main surface of the glass plate is divided into 4 × 4 equal portions. Measure the contact angle of water at the intersection (total of 9 points) of the lines (3 + 3) drawn on the second main surface of the glass plate when divided into equal parts. Specifically, at a measurement temperature of 23 ° C., a contact angle meter (PCA-11, manufactured by Kyowa Interface Science Co., Ltd.) was used to measure the contact angle after 5 seconds of pure water was dropped. The average value of the measured contact angles at a total of 9 points was defined as the contact angle of the first main surface of the glass plate.

<原子比(F/Si)> 玻璃板之第1主面之原子比(F/Si)以如下方式求出。 首先,針對玻璃板之第1主面中之未印刷框狀之邊框部之區域,使用X射線光電子光譜裝置(日本電子公司製造,JPS-9000MC),求出F原子濃度(單位:原子%)及Si原子濃度(單位:原子%)。將所求出之F原子濃度與Si原子濃度之比設為玻璃板之第1主面中的F原子之數相對於Si原子之數之比(F/Si)。 更詳細而言,於X射線之射線源為MgKα射線、加速電壓12 kV、25 mA之條件下測定。以點徑為6 mmf進行測定。無試樣之傾斜。以通過能量為50 eV、測定梯級為0.5 eV、Dwell Time為100 msec、掃描數為30次進行測定。針對測定結果所獲得之鍵結能峰,藉由Shirley法去除背景之後,根據F1s峰強度與Si2p3/2之峰強度算出F/Si之原子濃度比。<Atomic ratio (F / Si)> The atomic ratio (F / Si) of the 1st main surface of a glass plate is calculated | required as follows. First, an X-ray photoelectron spectroscopy device (manufactured by Japan Electronics Co., Ltd., JPS-9000MC) was used to determine the area of the frame portion of the first main surface of the glass plate that is not printed with a frame (unit: atomic%) And Si atom concentration (unit: atomic%). The ratio of the obtained F atom concentration to the Si atom concentration was defined as the ratio (F / Si) of the number of F atoms to the number of Si atoms on the first principal surface of the glass plate. More specifically, the measurement was performed under conditions where the X-ray source was MgKα rays, an acceleration voltage of 12 kV, and 25 mA. The measurement was performed with a spot diameter of 6 mmf. No sample tilt. The measurement was performed with a passing energy of 50 eV, a measurement step of 0.5 eV, a Dwell Time of 100 msec, and a number of scans of 30 times. For the bond energy peak obtained from the measurement results, after removing the background by the Shirley method, the atomic concentration ratio of F / Si was calculated from the F1s peak intensity and the Si2p3 / 2 peak intensity.

<評估> 針對各例之覆蓋構件,以如下方式進行評估。<Evaluation> The covering members of each case were evaluated as follows.

《試驗體之製作》 準備鈉鈣玻璃(板厚:0.7 mm、尺寸:100 mm×100 mm),將此作為顯示面板代替品。 將各例中之覆蓋構件之玻璃板之第1主面(包含邊框部)使用黏著層(巴川製紙所公司製造,MK64)而貼合於顯示面板代替品之一主面。以此方式,製作試驗體。貼合係使用貼合裝置(CLIMB PRODUCTS公司製造)。 於各例中,製作300個試驗體。"Production of test body" Soda-lime glass (plate thickness: 0.7 mm, size: 100 mm × 100 mm) was prepared, and this was used as a substitute for a display panel. The first main surface (including the frame portion) of the glass plate of the cover member in each example was bonded to one of the main surfaces of a display panel substitute using an adhesive layer (MK64, manufactured by Bachuan Paper Co., Ltd.). In this way, a test body was produced. For bonding, a bonding device (CLIMB PRODUCTS) was used. In each case, 300 test bodies were produced.

《氣泡發泡率》 確認於各試驗體中,是否於玻璃板與黏著層之間產生30 μm以上之大小之氣泡。 於各例中,求出產生30 μm以上之氣泡之試驗體之個數相對於所有試驗體之個數(300個)之比率(%)。 該比率越小,則可評估為越能夠抑制玻璃板與黏著層之間之氣泡產生,較佳為6%以下。"Bubble foaming rate" It was confirmed in each test body whether bubbles having a size of 30 μm or more were generated between the glass plate and the adhesive layer. In each example, the ratio (%) of the number of test bodies which generate | occur | produced the bubble of 30 micrometers or more with respect to the number (300) of all test bodies was calculated | required. The smaller the ratio, the more it can be evaluated that the generation of air bubbles between the glass plate and the adhesive layer can be suppressed, and it is preferably 6% or less.

針對以上之結果,總結成下述表1。下述表1中之「防污層之材料」亦指「轉印用含氟化合物層之材料」。The above results are summarized in Table 1 below. The "material of the antifouling layer" in Table 1 below also refers to the "material of the fluorine-containing compound layer for transfer".

[表1] [Table 1]

如上述表1所示,於玻璃板之第1主面附著有包含F原子之化合物(原子比(F/Si)超過0)且第1主面之接觸角為50°以下之例1~6與不滿足該等條件之例7~8相比,玻璃板與黏著層之間之氣泡產生得以抑制。As shown in Table 1 above, Examples 1 to 6 include compounds containing F atoms (the atomic ratio (F / Si) exceeds 0) and the contact angle of the first main surface to 50 ° or less on the first main surface of the glass plate. Compared with Examples 7 to 8 which do not satisfy these conditions, the generation of bubbles between the glass plate and the adhesive layer is suppressed.

原子比(F/Si)為0.005~0.13之範圍內之例1~4與為該範圍外之例5~6相比,玻璃板與黏著層之間之氣泡產生得以抑制。In Examples 1 to 4 in which the atomic ratio (F / Si) is in the range of 0.005 to 0.13, generation of bubbles between the glass plate and the adhesive layer is suppressed compared to Examples 5 to 6 outside the range.

若將例1~4進行對比,則與玻璃板之第1主面之原子比(F/Si)為0.012之例3相比,該原子比(F/Si)為0.023~0.075之例1、2及4更能抑制氣泡產生。再者,認為例7由於原子比(F/Si)較大而表面能較低之區域較多,故氣泡之產生率反而變高。When Examples 1 to 4 are compared, compared with Example 3 in which the atomic ratio (F / Si) of the first main surface of the glass plate is 0.012, Example 1 in which the atomic ratio (F / Si) is 0.023 to 0.075 2 and 4 can more inhibit the generation of bubbles. In addition, it is considered that in Example 7, since the atomic ratio (F / Si) is large and there are many regions with low surface energy, the generation rate of bubbles is rather high.

本申請案係基於2017年5月24日申請之日本專利申請案2017-102481者,其內容以參照之形式併入本文中。This application is based on Japanese Patent Application 2017-102481 filed on May 24, 2017, the contents of which are incorporated herein by reference.

11‧‧‧覆蓋構件11‧‧‧ Covering member

12‧‧‧透明基體12‧‧‧ transparent substrate

12a‧‧‧第1主面12a‧‧‧1st main face

12b‧‧‧第2主面12b‧‧‧ 2nd main face

14‧‧‧黏著層14‧‧‧ Adhesive layer

100‧‧‧顯示裝置100‧‧‧ display device

102‧‧‧背光單元102‧‧‧ backlight unit

104‧‧‧顯示面板(被覆蓋構件)104‧‧‧display panel (covered member)

104a‧‧‧顯示面104a‧‧‧display surface

106‧‧‧框體106‧‧‧Frame

107‧‧‧框體底板107‧‧‧Frame floor

131‧‧‧接著層131‧‧‧adjacent layer

132‧‧‧邊框部132‧‧‧Frame section

141‧‧‧配線141‧‧‧Wiring

511‧‧‧覆蓋構件511‧‧‧ cover member

512‧‧‧透明基體512‧‧‧ transparent substrate

512a‧‧‧第1主面512a‧‧‧1st main face

551‧‧‧氣泡551‧‧‧ Bubble

561‧‧‧階差部分561‧‧‧step difference

圖1係表示本實施形態之顯示裝置之剖視圖。 圖2係將覆蓋構件、黏著層及顯示面板放大表示之剖視圖。 圖3係將先前之覆蓋構件藉由黏著層貼合於顯示面板之狀態放大表示之剖視圖。 圖4係表示本實施形態之覆蓋構件之剖視圖。FIG. 1 is a sectional view showing a display device according to this embodiment. FIG. 2 is an enlarged cross-sectional view of a cover member, an adhesive layer, and a display panel. FIG. 3 is an enlarged cross-sectional view showing a state in which a conventional covering member is bonded to a display panel through an adhesive layer. FIG. 4 is a cross-sectional view showing a covering member according to this embodiment.

Claims (19)

一種覆蓋構件,其係包含透明基體者, 上述透明基體具有與被覆蓋構件對向之第1主面、及與上述第1主面為相反側之第2主面, 於上述第1主面附著有包含F原子之化合物,且 上述第1主面之接觸角為50°以下。A covering member comprising a transparent substrate, the transparent substrate having a first main surface facing the member to be covered, and a second main surface opposite to the first main surface, and attached to the first main surface There are compounds containing an F atom, and the contact angle of the first principal surface is 50 ° or less. 如請求項1之覆蓋構件,其中上述第1主面中之F原子之數相對於Si原子之數之比(F/Si)為0.005~0.13。For example, the covering member of claim 1, wherein the ratio (F / Si) of the number of F atoms to the number of Si atoms in the first main surface is 0.005 to 0.13. 如請求項2之覆蓋構件,其中上述比(F/Si)為0.015~0.1。Such as the covering member of claim 2, wherein the above-mentioned ratio (F / Si) is 0.015 to 0.1. 如請求項1至3中任一項之覆蓋構件,其中上述接觸角為25~45°。The covering member according to any one of claims 1 to 3, wherein the contact angle is 25 to 45 °. 如請求項4之覆蓋構件,其中上述接觸角為28~40°。The covering member of claim 4, wherein the contact angle is 28 to 40 °. 如請求項1至5中任一項之覆蓋構件,其中上述透明基體之厚度為0.1 mm以上且5 mm以下。The covering member according to any one of claims 1 to 5, wherein the thickness of the transparent substrate is 0.1 mm or more and 5 mm or less. 如請求項1至6中任一項之覆蓋構件,其中上述包含F原子之化合物係有機系化合物。The covering member according to any one of claims 1 to 6, wherein the compound containing an F atom is an organic compound. 如請求項1至7中任一項之覆蓋構件,其中上述透明基體為玻璃板。The covering member according to any one of claims 1 to 7, wherein the transparent substrate is a glass plate. 如請求項8之覆蓋構件,其中上述玻璃板為化學強化玻璃板。The cover member according to claim 8, wherein the glass plate is a chemically strengthened glass plate. 如請求項8或9之覆蓋構件,其中上述玻璃板之任一主面之壓縮應力(CS)為400 MPa以上且1200 MPa以下。For the covering member of claim 8 or 9, wherein the compressive stress (CS) of any one of the main surfaces of the glass plate is 400 MPa or more and 1200 MPa or less. 如請求項8至10中任一項之覆蓋構件,其中上述玻璃板之任一主面之應力層之深度(DOL)為15 μm以上且50 μm以下。The cover member according to any one of claims 8 to 10, wherein the depth (DOL) of the stress layer on any one of the main surfaces of the glass plate is 15 μm or more and 50 μm or less. 如請求項1至11中任一項之覆蓋構件,其中於上述第1主面具有邊框部。The covering member according to any one of claims 1 to 11, further comprising a frame portion on the first main surface. 如請求項1至12中任一項之覆蓋構件,其進而具備配置於上述透明基體之上述第2主面上之功能層。The covering member according to any one of claims 1 to 12, further comprising a functional layer disposed on the second main surface of the transparent substrate. 如請求項13之覆蓋構件,其中上述功能層包含防污層。The covering member according to claim 13, wherein the functional layer includes an antifouling layer. 如請求項14之覆蓋構件,其中上述防污層之厚度為2 nm以上且20 nm以下。The covering member according to claim 14, wherein the thickness of the antifouling layer is 2 nm or more and 20 nm or less. 如請求項13至15中任一項之覆蓋構件,其中上述功能層包含抗反射層。The covering member according to any one of claims 13 to 15, wherein the functional layer includes an anti-reflection layer. 一種覆蓋構件之製造方法,其係製造包含透明基體之覆蓋構件之方法, 準備具有與被覆蓋構件對向之第1主面、及與上述第1主面為相反側之第2主面的透明基體, 準備於一面附著有含氟化合物之轉印用基體, 使上述透明基體之上述第1主面與上述轉印用基體中之附著有上述含氟化合物之面接觸,將上述含氟化合物轉印至上述透明基體之上述第1主面, 藉由上述轉印,使包含F原子之化合物附著於上述第1主面,將上述第1主面之接觸角設為50°以下。A manufacturing method of a covering member, which is a method of manufacturing a covering member including a transparent substrate, and is prepared to have a first main surface facing the covered member and a second main surface opposite to the first main surface. A substrate is prepared on a transfer substrate with a fluorine-containing compound adhered on one side, and the first main surface of the transparent substrate is brought into contact with the fluorine-containing compound-attached surface of the transfer substrate to transfer the fluorine-containing compound. The first principal surface printed on the transparent substrate is adhered to the first principal surface with a compound containing an F atom by the transfer, and a contact angle of the first principal surface is set to 50 ° or less. 如請求項17之覆蓋構件之製造方法,其中藉由上述轉印,將上述第1主面之接觸角設為25~45°,將上述第1主面中之F原子之數相對於Si原子之數之比(F/Si)設為0.005~0.13。For example, the method for manufacturing a covering member according to claim 17, wherein the contact angle of the first main surface is set to 25 to 45 ° by the above transfer, and the number of F atoms in the first main surface is relative to Si atoms. The ratio (F / Si) is set to 0.005 to 0.13. 一種顯示裝置,其係具備如請求項1至16中任一項之覆蓋構件、黏著層及顯示面板者,且 上述覆蓋構件係以上述透明基體之上述第1主面與上述顯示面板對向之朝向,經由上述黏著層而與上述顯示面板貼合。A display device includes a cover member, an adhesive layer, and a display panel according to any one of claims 1 to 16, and the cover member faces the display panel with the first main surface of the transparent substrate facing the display panel. Oriented and bonded to the display panel via the adhesive layer.
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