TW201821794A - Sensing apparatus and material sensing method - Google Patents

Sensing apparatus and material sensing method Download PDF

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TW201821794A
TW201821794A TW105140869A TW105140869A TW201821794A TW 201821794 A TW201821794 A TW 201821794A TW 105140869 A TW105140869 A TW 105140869A TW 105140869 A TW105140869 A TW 105140869A TW 201821794 A TW201821794 A TW 201821794A
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signal
substance
sensing
state
probe
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TW105140869A
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TWI613441B (en
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黃胤綸
林益助
鄭兆凱
侯宜良
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桓達科技股份有限公司
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Abstract

A sensing apparatus includes a probe and a sensing module. The sensing module includes a material sensing circuit, an operation unit and a signal output circuit. The sensing module generates a frequency sweep signal and sends the frequency sweep signal to the probe to sense a state of a material. The frequency sweep signal is a plurality of signals having different frequencies from each other in a predetermined frequency range. When the frequency sweep signal touches the material, an equivalent capacitance of the material is utilized to generate a reflected signal. The material sensing circuit receives the reflected signal and sends the reflected signal to the operation unit. The operation unit operates the reflected signal to generate a waveform signal to determine the state of the material. The operation unit utilizes an impedance spectrum to determine the state of the material.

Description

感測裝置及物質感測方法Sensing device and substance sensing method

本發明係有關於一種感測裝置及物質感測方法,特別是一種具有可變化頻率偵測的感測裝置及具有可變化頻率偵測的物質感測方法。The invention relates to a sensing device and a substance sensing method, in particular to a sensing device with variable frequency detection and a substance sensing method with variable frequency detection.

靜電容/射頻導納式感測器係用以偵測物質的電容量的變化;基於電容公式C=εA/d,靜電容/射頻導納式感測器將感測到的資訊由物理訊號傳換成電子訊號;當靜電容/射頻導納式感測器安裝於桶槽或管道內時,固定了上述公式內的A(物質接觸面積)與d(極板距離),因此C的變化量將受到ε(物質的介電常數)影響。The static capacitance/RF admittance sensor is used to detect the change of the capacitance of the substance; based on the capacitance formula C=εA/d, the electrostatic capacitance/RF admittance sensor will sense the information from the physical signal. Transmitted into an electronic signal; when the electrostatic capacitor/RF admittance sensor is installed in a tank or a pipe, the A (substance contact area) and d (plate distance) in the above formula are fixed, so the change of C The amount will be affected by ε (the dielectric constant of the substance).

靜電容/射頻導納式感測器係發射一固定頻率的交流訊號至探棒,並接著將電容值轉換為電訊號;當物質接觸到探棒時,會產生訊號的強度變化。簡易的靜電容/射頻導納式開關感測器的控制單元(uC或比較電路)會設定一判斷點;當探棒沒有接觸到物質時,回傳的訊號強度不會超過此判斷點;當探棒接觸到物質時,回傳的訊號強度會超過此判斷點。The static capacitance/RF admittance sensor emits a fixed frequency AC signal to the probe, and then converts the capacitance value into an electrical signal; when the material contacts the probe, a change in the intensity of the signal is generated. The control unit (uC or comparison circuit) of the simple static capacitance/RF admittance sensor will set a judgment point; when the probe does not touch the substance, the signal strength of the return will not exceed this judgment point; When the probe touches the substance, the signal strength of the returned signal will exceed this judgment point.

再者,在安裝靜電容/射頻導納連續式感測器之後,靜電容/射頻導納連續式感測器會進行兩點校正;在靜電容/射頻導納連續式感測器上輸入這兩點的值,接著控制單元會計算出這兩點的斜率變化;因此,如果物質變化,依據訊號強度的變化,可計算出物質在桶槽的等效容量。接著,可將結果顯示於靜電容/射頻導納連續式感測器的介面,以及訊號可透過例如RS-485介面、4-20mA、Modbus介面等等輸出給後端系統。Furthermore, after installing the static capacitance/RF admittance continuous sensor, the static capacitance/RF admittance continuous sensor performs two-point calibration; input this on the static capacitance/RF admittance continuous sensor The value of the two points, and then the control unit calculates the slope change of the two points; therefore, if the substance changes, the equivalent capacity of the substance in the tank can be calculated according to the change of the signal intensity. The results can then be displayed on the interface of the capacitive/RF admittance continuous sensor, and the signal can be output to the backend system via, for example, the RS-485 interface, 4-20 mA, Modbus interface, and the like.

以下例子說明相關技術的方法:在感測器安裝完後,桶槽中物質接觸探棒為10公分,於桶槽內容量比為10%,此時,訊號強度為100mV;接著,物質接觸探棒改變為50公分,於桶槽內容量比為50%,此時,訊號強度為500mV。將上述容量比輸入至感測器中,控制單元會計算得知容量比與訊號強度的關係,即(50%-10%)/(500mV-100mV)=0.1(%⁄mV)。因此,當訊號強度變化成600mV時,就可以直接在感測器上或輸出訊號得知桶槽內的容量比變成60%。The following example illustrates the related art method: after the sensor is installed, the material contact probe in the tank is 10 cm, and the volume ratio of the tank is 10%. At this time, the signal intensity is 100 mV; The rod is changed to 50 cm, and the ratio of the contents of the tank is 50%. At this time, the signal intensity is 500 mV. By inputting the above capacity ratio into the sensor, the control unit calculates the relationship between the capacity ratio and the signal strength, that is, (50%-10%)/(500mV-100mV)=0.1 (%⁄mV). Therefore, when the signal intensity changes to 600mV, the capacity ratio in the tank can be directly changed to 60% on the sensor or the output signal.

物質的介電常數常會因為環境(例如溫度或濕度)的變化、物質性質的劣化(例如含水率的差異)以及感測器所發射的頻率的差異而有不同的阻抗響應。然而,相關技術之靜電容式/射頻導納式感測器的缺點為相關技術之靜電容式/射頻導納式感測器無法操作在不同的頻率,只能操作在固定頻率,因此限制了發展成為智能化與多功能測量的可能。The dielectric constant of a substance often has a different impedance response due to changes in the environment (eg, temperature or humidity), degradation of material properties (eg, differences in moisture content), and differences in the frequencies emitted by the sensor. However, the related art static capacitance/RF admittance sensor has the disadvantage that the related art electrostatic capacitance/RF admittance sensor cannot operate at different frequencies and can only operate at a fixed frequency, thus limiting Developed into the possibility of intelligent and versatile measurements.

為改善上述習知技術之缺點,本發明之目的在於提供一種感測裝置。In order to improve the above disadvantages of the prior art, it is an object of the present invention to provide a sensing device.

為改善上述習知技術之缺點,本發明之又一目的在於提供一種物質感測方法。In order to improve the above disadvantages of the prior art, it is still another object of the present invention to provide a substance sensing method.

為達成本發明之上述目的,本發明之感測裝置用以感測一物質之一介電常數之一變化狀態,該裝置感測裝置包含:一探棒;及一感測模組,該感測模組連接該探棒。其中該感測模組包含:一物質感測電路;一運算單元,該運算單元電性連接至該物質感測電路;及一訊號輸出電路,該訊號輸出電路電性連接至該運算單元。其中該感測模組產生一掃頻訊號並且傳送該掃頻訊號至該探棒以感測該物質之一狀態;該掃頻訊號為在一預設頻率範圍內彼此相異頻率的複數訊號;當該掃頻訊號接觸到該物質時,利用該物質的一等效電容產生一反射訊號;該物質感測電路接收該反射訊號並傳遞該反射訊號至該運算單元;該運算單元對該反射訊號運算以產生一波形訊號以判斷該物質之該狀態。其中該運算單元利用一阻抗頻譜以判斷該物質之該狀態;該阻抗頻譜界定有複數之狀態區;該些狀態區的每一個分別具有不同的一輸出訊號;該運算單元應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質之一物質等效容積以及一物質品質並判斷該物質之該狀態;依據該波形訊號在該些狀態區的該位置,該運算單元利用該訊號輸出電路向外輸出該位置的該狀態區的該輸出訊號。In order to achieve the above object of the present invention, the sensing device of the present invention is configured to sense a change state of a dielectric constant of a substance, the device sensing device includes: a probe; and a sensing module, the sense The test module is connected to the probe. The sensing module comprises: a substance sensing circuit; an computing unit electrically connected to the substance sensing circuit; and a signal output circuit, the signal output circuit is electrically connected to the computing unit. The sensing module generates a sweep signal and transmits the sweep signal to the probe to sense a state of the substance; the sweep signal is a complex signal having a frequency different from each other within a preset frequency range; When the swept signal contacts the substance, an equivalent capacitance of the substance is used to generate a reflected signal; the substance sensing circuit receives the reflected signal and transmits the reflected signal to the operation unit; and the operation unit operates the reflected signal To generate a waveform signal to determine the state of the substance. The operation unit uses an impedance spectrum to determine the state of the substance; the impedance spectrum defines a plurality of state regions; each of the state regions has a different output signal; the computing unit applies one of the waveform signals The signal intensity and a distribution frequency are in the impedance spectrum to determine a position of the waveform signal in the state regions, and a conversion is performed according to the method to obtain a substance equivalent volume of the substance and a substance quality and determine the substance The operation unit uses the signal output circuit to output the output signal of the status area of the position to the position of the status signal according to the waveform signal.

為達成本發明之上述又一目的,本發明之物質感測方法包含下列步驟:準備一感測裝置,其中該感測裝置係用以量測一物質之一狀態且具有一探棒及連接該探棒的一感測模組;將該探棒設置於該物質中;對該感測裝置進行一環境校正;利用該感測模組產生一掃頻訊號並且傳送該掃頻訊號至該探棒以感測該物質之該狀態,其中該掃頻訊號為在一預設頻率範圍內彼此相異頻率的複數訊號;當該掃頻訊號接觸到該物質時,利用該物質的一等效電容產生一反射訊號;該感測模組對該反射訊號運算以產生一波形訊號並進行一量測模式以判斷該物質之該狀態而得到一量測結果並對外輸出,其中該量測模式為利用一阻抗頻譜判斷該物質之該狀態,該阻抗頻譜界定有複數之狀態區,該些狀態區的每一個分別具有不同的一輸出訊號;該感測模組應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質之一物質等效容積以及一物質品質並判斷該物質之該狀態;及依據該波形訊號在該些狀態區的該位置,該感測模組向外輸出該位置的該狀態區的該輸出訊號。In order to achieve the above further object of the present invention, the substance sensing method of the present invention comprises the steps of: preparing a sensing device, wherein the sensing device is configured to measure a state of a substance and have a probe and connect the same a sensing module of the probe; the probe is disposed in the material; an environmental correction is performed on the sensing device; a frequency sweep signal is generated by the sensing module, and the frequency sweep signal is transmitted to the probe Sensing the state of the substance, wherein the sweep signal is a complex signal having a frequency different from each other within a predetermined frequency range; and when the sweep signal contacts the substance, generating an equivalent capacitance of the substance a reflection signal; the sensing module operates on the reflected signal to generate a waveform signal and performs a measurement mode to determine the state of the substance to obtain a measurement result and output to the external output, wherein the measurement mode uses an impedance The spectrum determines the state of the substance, the impedance spectrum defines a plurality of status regions, each of the status regions having a different output signal; the sensing module applies the waveform signal The intensity and a distribution frequency are in the impedance spectrum to determine a position of the waveform signal in the state regions, and a conversion is performed according to which a material equivalent volume of the substance and a substance quality are determined and the state of the substance is determined. And according to the position of the waveform signal in the status areas, the sensing module outputs the output signal of the status area of the position to the outside.

本發明之功效在於提供一種具有可變化頻率偵測的智能型感測器。為了能更進一步瞭解本發明為達成預定目的所採取之技術、手段及功效,請參閱以下有關本發明之詳細說明與附圖,相信本發明之目的、特徵與特點,當可由此得一深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本發明加以限制者。The effect of the present invention is to provide an intelligent sensor with variable frequency detection. In order to further understand the technology, the means and the effect of the present invention in order to achieve the intended purpose, refer to the following detailed description of the invention and the accompanying drawings. The detailed description is to be understood as illustrative and not restrictive.

茲有關本發明之技術內容及詳細說明,配合圖式說明如下:The technical content and detailed description of the present invention are as follows:

請參考圖1,其係為本發明之感測裝置之一實施例方塊圖。本發明之感測裝置10係用以感測一物質20之一介電常數(permittivity)變化狀態;該物質20係放置於一桶槽30內。該裝置感測裝置10包含一探棒102、一感測模組104及複數之溫度感測單元120。該感測模組104包含一物質感測電路106、一運算單元108、一訊號輸出電路110及一溫度感測電路116。該訊號輸出電路110包含一第一訊號輸出電路122及一第二訊號輸出電路124。上述該些元件係彼此電性連接,且該感測模組104係連接該探棒102,而該些溫度感測單元120的每一個係分別間隔地設置於該探棒102上。Please refer to FIG. 1, which is a block diagram of an embodiment of a sensing device of the present invention. The sensing device 10 of the present invention is for sensing a change in the permittivity of a substance 20; the substance 20 is placed in a tank 30. The device sensing device 10 includes a probe 102, a sensing module 104, and a plurality of temperature sensing units 120. The sensing module 104 includes a substance sensing circuit 106 , an arithmetic unit 108 , a signal output circuit 110 , and a temperature sensing circuit 116 . The signal output circuit 110 includes a first signal output circuit 122 and a second signal output circuit 124. The components are electrically connected to each other, and the sensing module 104 is connected to the probe 102, and each of the temperature sensing units 120 is disposed on the probe 102 at intervals.

首先,該感測模組104產生一掃頻訊號(frequency sweep signal)112並且接著傳送該掃頻訊號112至該探棒102(以感測該物質20之一狀態);該掃頻訊號112為在一預設頻率範圍內彼此相異頻率的複數訊號。當該掃頻訊號112接觸到該物質20時,利用該物質20的一等效電容產生一反射訊號114;該物質感測電路106接收該反射訊號114並傳遞該反射訊號114至該運算單元108。該運算單元108對該反射訊號114運算以產生一波形訊號以判斷該物質20之該狀態(容後詳述)。First, the sensing module 104 generates a frequency sweep signal 112 and then transmits the sweep signal 112 to the probe 102 (to sense a state of the substance 20); the sweep signal 112 is A complex signal of mutually different frequencies within a predetermined frequency range. When the frequency sweeping signal 112 is in contact with the substance 20, an equivalent capacitance of the substance 20 is used to generate a reflected signal 114; the substance sensing circuit 106 receives the reflected signal 114 and transmits the reflected signal 114 to the arithmetic unit 108. . The arithmetic unit 108 operates on the reflected signal 114 to generate a waveform signal to determine the state of the substance 20 (described in detail later).

換言之,本發明的第一個技術特徵是提供一種具有可變化頻率偵測的智能型感測器,稱之為阻抗頻譜感測器。阻抗頻譜感測器的測量原理是該感測模組104會發射具有一可調整頻率範圍(即該掃頻訊號112,例如但本發明不限定為50MHz至200MHz)的一交流訊號至該探棒102上;該交流訊號的訊號強度不會因為頻率變化而變化,其為一固定強度的電壓。該探棒102結構與電路可以等效成一固定的等效電感值(Ld),且一固定的等效電容值(Cd)是由該探棒102接觸該物質20所形成(當該探棒102沒有接觸到該物質20時,該探棒102的介質是介電常數為1的空氣)。In other words, the first technical feature of the present invention is to provide an intelligent sensor with variable frequency detection, called an impedance spectrum sensor. The measurement principle of the impedance spectrum sensor is that the sensing module 104 transmits an alternating current signal having an adjustable frequency range (ie, the frequency sweeping signal 112, for example, but the invention is not limited to 50 MHz to 200 MHz) to the probe. 102; the signal strength of the alternating signal does not change due to the frequency change, which is a fixed intensity voltage. The structure and circuit of the probe 102 can be equivalent to a fixed equivalent inductance value (Ld), and a fixed equivalent capacitance value (Cd) is formed by the probe 102 contacting the substance 20 (when the probe 102 is When the substance 20 is not in contact, the medium of the probe 102 is air having a dielectric constant of 1).

藉由該感測模組104發射該掃頻訊號112,該運算單元108即可繪製出該探棒102在空氣中的LdCd頻率響應圖,並計算出在空氣(即介電常數為1)中,在某一頻率時出現的最大的阻抗值,即是諧振點(Fd)。當該物質20接觸到該探棒102時,等效電容值會改變成為C1;此時,該運算單元108重新計算出諧振點為F1。By the sensing module 104 transmitting the sweep signal 112, the operation unit 108 can plot the LdCd frequency response of the probe 102 in the air and calculate the air (ie, the dielectric constant is 1). The maximum impedance value that occurs at a certain frequency is the resonance point (Fd). When the substance 20 contacts the probe 102, the equivalent capacitance value changes to C1; at this time, the arithmetic unit 108 recalculates that the resonance point is F1.

在阻抗頻譜感測器的該運算單元108中,寫入一預設值(A1)。藉由上述F1與A1,本發明可設計出連續式(continuous)測量的感測器或感測開關(point sensor)。例如但本發明不限定為,在感測開關的應用上,如果F1大於A1,則感測器輸出訊號;如果F1小於或等於A1,則感測器不輸出訊號。一般來說,該物質20的介電常數大於1,因此產生的等效電容值只會增加,所以諧振點會比在空氣的諧振點還要小。In the arithmetic unit 108 of the impedance spectrum sensor, a preset value (A1) is written. With the above F1 and A1, the present invention can design a continuous measuring sensor or a point sensor. For example, the present invention is not limited to, in the application of the sensing switch, if F1 is greater than A1, the sensor outputs a signal; if F1 is less than or equal to A1, the sensor does not output a signal. In general, the substance 20 has a dielectric constant greater than 1, so that the equivalent capacitance produced will only increase, so the resonance point will be smaller than the resonance point of the air.

不同的物質20有不同的介電常數,而阻抗頻譜感測器可以精確的量測出差異。例如但本發明不限定,原本感測該物質20為機油,其介電常數為E1,因為長期使用,該物質20變質或是具有太多雜質,使得該物質20的介電常數改變為E2;阻抗頻譜感測器可以感測到諧振點的變化以計算判斷出該物質20性質改變了。阻抗頻譜感測器可為例如但本發明不限定為油質劣化器(oil conditioning sensor)或物質劣化器。Different substances 20 have different dielectric constants, and the impedance spectrum sensor can accurately measure the difference. For example, but the invention is not limited, the substance 20 is originally sensed as an engine oil, and its dielectric constant is E1. Because of long-term use, the substance 20 is deteriorated or has too many impurities, so that the dielectric constant of the substance 20 is changed to E2; The impedance spectrum sensor can sense the change in the resonance point to calculate that the property of the substance 20 has changed. The impedance spectrum sensor can be, for example, but the invention is not limited to an oil conditioning sensor or a substance deteriorating device.

又例如,原本感測該物質20為玉米粒,玉米粒的含水率為20%以上,阻抗頻譜感測器設定含水率20%~30%以上的玉米粒的介電常數為E3;當阻抗頻譜感測器感測玉米粒的含水率偏低(例如,低於15%)時,玉米粒的介電常數變為E4,此變化可由阻抗頻譜感測器測得;此應用類似於含水率測試儀(moisture instrument),只是在此類似的應用當中,該物質20的介電常數的變化,是因為環境及時間的變化,而非容積的變化。For another example, the substance 20 is originally sensed as corn kernels, the moisture content of the corn kernels is 20% or more, and the dielectric constant of the corn kernels having a moisture content of 20% to 30% or more by the impedance spectrum sensor is E3; When the sensor senses that the moisture content of the corn kernel is low (for example, less than 15%), the dielectric constant of the corn kernel becomes E4, which can be measured by an impedance spectrum sensor; this application is similar to the moisture content test. The moisture instrument, except in this similar application, the change in the dielectric constant of the substance 20 is due to changes in the environment and time, rather than changes in volume.

請復參考圖1。該溫度感測電路116係用以偵測一外部環境溫度(該感測模組104的溫度)以產生一溫度感測訊號118並傳送該溫度感測訊號118至該運算單元108;接著,該運算單元108利用該溫度感測訊號118對該波形訊號進行一訊號補償;亦即,在一訊號補償模式當中,該感測模組104產生該溫度感測訊號118以對該波形訊號進行該訊號補償。Please refer to Figure 1. The temperature sensing circuit 116 is configured to detect an external ambient temperature (the temperature of the sensing module 104) to generate a temperature sensing signal 118 and transmit the temperature sensing signal 118 to the computing unit 108; The operation unit 108 performs a signal compensation on the waveform signal by using the temperature sensing signal 118. That is, in a signal compensation mode, the sensing module 104 generates the temperature sensing signal 118 to perform the signal on the waveform signal. make up.

再者,該些溫度感測單元120係用以偵測該外部環境溫度(該物質20的溫度)並通知該溫度感測電路116該外部環境溫度,使得該溫度感測電路116產生該溫度感測訊號118並傳送該溫度感測訊號118至該運算單元108;接著,該運算單元108利用該溫度感測訊號118對該波形訊號進行該訊號補償;亦即,在該訊號補償模式當中,該感測模組104產生該溫度感測訊號118以對該波形訊號進行該訊號補償。上述兩種訊號補償可於不同時間分別安排,因此他們不會互相干擾。Moreover, the temperature sensing unit 120 is configured to detect the external ambient temperature (the temperature of the substance 20) and notify the temperature sensing circuit 116 of the external ambient temperature, so that the temperature sensing circuit 116 generates the temperature sense. The signal 118 transmits the temperature sensing signal 118 to the computing unit 108; then, the computing unit 108 uses the temperature sensing signal 118 to perform the signal compensation on the waveform signal; that is, in the signal compensation mode, The sensing module 104 generates the temperature sensing signal 118 to perform the signal compensation on the waveform signal. The above two types of signal compensation can be arranged separately at different times, so they do not interfere with each other.

換言之,本發明的第二個技術特徵是對溫度的訊號補償;因為偵測該外部環境溫度變化會造成該物質20的介電常數變化以及電路板與電路板上的半導體零件的特性變化,所以該感測模組104需要進行溫度補償,使得該外部環境溫度變化不會影響該感測模組104的精確。再者,該物質20受溫度變化的影響也要回饋給該運算單元108,讓該運算單元108可以了解到該物質20的溫度而進行介電常數變化的補償,所以該探棒102上會有該些溫度感測單元120。本發明的第二個技術特徵將使得阻抗頻譜感測器具有另一個感知能力以達到智能化的判斷。In other words, the second technical feature of the present invention is signal compensation for temperature; since detecting changes in the external ambient temperature causes a change in the dielectric constant of the substance 20 and a change in characteristics of the semiconductor component on the board and the board, The sensing module 104 needs to perform temperature compensation such that the external ambient temperature change does not affect the accuracy of the sensing module 104. Furthermore, the substance 20 is also fed back to the arithmetic unit 108 by the influence of the temperature change, so that the arithmetic unit 108 can understand the temperature of the substance 20 and compensate for the change of the dielectric constant, so the probe 102 will have The temperature sensing units 120. The second technical feature of the present invention will allow the impedance spectrum sensor to have another sensing capability to achieve an intelligent decision.

請復參考圖1。該運算單元108利用一阻抗頻譜以判斷該物質20之該狀態;該阻抗頻譜界定有複數之狀態區;該些狀態區的每一個分別具有不同的一輸出訊號。該運算單元108應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質20之一物質等效容積以及一物質品質並判斷該物質20之該狀態。依據該波形訊號在該些狀態區的該位置,該運算單元108利用該訊號輸出電路110向外輸出該位置的該狀態區的該輸出訊號。該些狀態區包含一測量區以及複數個變異區;該測量區係位於一事先定義中間頻率位置;依據複數之預設訊號強度邊界,該些變異區分別分佈在該測量區之兩側。以上內容容後詳述。Please refer to Figure 1. The arithmetic unit 108 utilizes an impedance spectrum to determine the state of the substance 20; the impedance spectrum defines a plurality of status regions; each of the status regions has a different output signal. The computing unit 108 applies a signal strength of the waveform signal and a distribution frequency to the impedance spectrum to determine a position of the waveform signal in the state regions, and performs a conversion according to the method to obtain a substance equivalent of the substance 20 The volume and the quality of a substance determine the state of the substance 20. According to the position of the waveform signal in the status areas, the operation unit 108 uses the signal output circuit 110 to output the output signal of the status area of the position to the outside. The status areas include a measurement area and a plurality of variation areas; the measurement area is located at a pre-defined intermediate frequency position; and the variation areas are respectively distributed on both sides of the measurement area according to a plurality of preset signal intensity boundaries. The above content is detailed later.

該運算單元108對應該物質等效容積驅動該第一訊號輸出電路122以輸出一第一訊號126;該運算單元108對應該物質品質驅動該第二訊號輸出電路124以輸出一第二訊號128;該輸出訊號包含該第一訊號126與該第二訊號128。而該第一訊號126與該第二訊號128的訊號型式包含下列三種型式:The computing unit 108 drives the first signal output circuit 122 corresponding to the material equivalent volume to output a first signal 126; the computing unit 108 drives the second signal output circuit 124 corresponding to the material quality to output a second signal 128; The output signal includes the first signal 126 and the second signal 128. The signal patterns of the first signal 126 and the second signal 128 include the following three types:

(1)該第一訊號126為一類比訊號且該第二訊號128為一類比訊號;亦即,該第一訊號126與該第二訊號128皆為類比訊號。(1) The first signal 126 is an analog signal and the second signal 128 is an analog signal; that is, the first signal 126 and the second signal 128 are analog signals.

(2)該第一訊號126為一數位訊號且該第二訊號128為一數位訊號;亦即,該第一訊號126與該第二訊號128皆為數位訊號。(2) The first signal 126 is a digital signal and the second signal 128 is a digital signal; that is, the first signal 126 and the second signal 128 are digital signals.

(3)該第一訊號126為一類比訊號且該第二訊號128為一數位訊號,或者是該第一訊號126為一數位訊號且該第二訊號128為一類比訊號;亦即,該第一訊號126與該第二訊號128的其中之一為一類比訊號,另一個為一數位訊號。(3) The first signal 126 is an analog signal and the second signal 128 is a digital signal, or the first signal 126 is a digital signal and the second signal 128 is an analog signal; that is, the first One of the signals 126 and the second signal 128 is an analog signal, and the other is a digital signal.

請參考圖2,其係為本發明之物質感測方法之一實施例流程圖。本發明之物質感測方法包含下列步驟:Please refer to FIG. 2 , which is a flow chart of an embodiment of the material sensing method of the present invention. The substance sensing method of the present invention comprises the following steps:

S02:準備一感測裝置,其中該感測裝置係用以量測一物質之一狀態且具有一探棒及連接該探棒的一感測模組。接著,本發明之物質感測方法進入步驟S04。S02: Preparing a sensing device, wherein the sensing device is configured to measure a state of a substance and has a probe and a sensing module connected to the probe. Next, the substance sensing method of the present invention proceeds to step S04.

S04:將該探棒設置於該物質中。接著,本發明之物質感測方法進入步驟S06。S04: The probe is placed in the substance. Next, the substance sensing method of the present invention proceeds to step S06.

S06:對該感測裝置進行一環境校正。接著,本發明之物質感測方法進入步驟S08。S06: Perform an environmental correction on the sensing device. Next, the substance sensing method of the present invention proceeds to step S08.

S08:利用該感測模組產生一掃頻訊號並且傳送該掃頻訊號至該探棒以感測該物質之該狀態,其中該掃頻訊號為在一預設頻率範圍內彼此相異頻率的複數訊號。接著,本發明之物質感測方法進入步驟S10。S08: generating a sweep signal by using the sensing module and transmitting the sweep signal to the probe to sense the state of the substance, wherein the sweep signal is a plurality of frequencies different from each other within a preset frequency range Signal. Next, the substance sensing method of the present invention proceeds to step S10.

S10:當該掃頻訊號接觸到該物質時,利用該物質的一等效電容產生一反射訊號。接著,本發明之物質感測方法進入步驟S12。S10: When the sweep signal contacts the substance, a reflection signal is generated by using an equivalent capacitance of the substance. Next, the substance sensing method of the present invention proceeds to step S12.

S12:該感測模組對該反射訊號運算以產生一波形訊號並進行一量測模式以判斷該物質之該狀態而得到一量測結果並對外輸出,其中該量測模式為利用一阻抗頻譜判斷該物質之該狀態,該阻抗頻譜界定有複數之狀態區,該些狀態區的每一個分別具有不同的一輸出訊號。接著,本發明之物質感測方法進入步驟S14。S12: The sensing module operates on the reflected signal to generate a waveform signal and performs a measurement mode to determine the state of the substance to obtain a measurement result and externally output, wherein the measurement mode uses an impedance spectrum Determining the state of the substance, the impedance spectrum defines a plurality of status regions, each of the status regions having a different output signal. Next, the substance sensing method of the present invention proceeds to a step S14.

S14:該感測模組應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質之一物質等效容積以及一物質品質並判斷該物質之該狀態。接著,本發明之物質感測方法進入步驟S16。S14: The sensing module applies a signal strength of the waveform signal and a distribution frequency to the impedance spectrum to determine a position of the waveform signal in the state regions, and performs a conversion according to the method to obtain a substance of the substance. The equivalent volume and the quality of a substance determine the state of the substance. Next, the substance sensing method of the present invention proceeds to step S16.

S16:依據該波形訊號在該些狀態區的該位置,該感測模組向外輸出該位置的該狀態區的該輸出訊號。S16: The sensing module outputs the output signal of the status area of the position to the position of the status area according to the waveform signal.

而該些狀態區係包含一測量區以及複數個變異區;該測量區係位於一事先定義中間頻率位置;依據複數之預設訊號強度邊界,該些變異區分別分佈在該測量區之兩側。本發明係設定一操作模式並且依據該操作模式驅使該感測裝置進行該物質之一物質容積量測或該物質之一物質品質量測,或同時進行該物質之該物質容積量測與該物質之該物質品質量測。該感測模組對該物質容積量測之一結果產生一第一訊號以對外輸出該第一訊號;該感測模組對該物質品質量測之一結果產生一第二訊號以對外輸出該第二訊號;該輸出訊號包含該第一訊號與該第二訊號。And the state zones comprise a measurement zone and a plurality of variation zones; the measurement zone is located at a predefined intermediate frequency position; and the variation zones are respectively distributed on both sides of the measurement zone according to a plurality of preset signal intensity boundaries . The present invention sets an operation mode and drives the sensing device to perform a volume measurement of the substance or a substance quality measurement of the substance according to the operation mode, or simultaneously perform volume measurement of the substance and the substance. The quality of the substance is measured. The sensing module generates a first signal for outputting the first signal to output the first signal; the sensing module generates a second signal for the result of the mass measurement to output the external signal. The second signal; the output signal includes the first signal and the second signal.

請參考圖3,其係為本發明之物質感測方法之另一實施例流程圖。本發明之物質感測方法包含下列步驟:Please refer to FIG. 3 , which is a flow chart of another embodiment of the material sensing method of the present invention. The substance sensing method of the present invention comprises the following steps:

T02:安裝本發明之感測裝置。接著,本發明之物質感測方法進入步驟T04。T02: The sensing device of the present invention is installed. Next, the substance sensing method of the present invention proceeds to step T04.

T04:校正環境參數。接著,本發明之物質感測方法進入步驟T06。T04: Correct the environmental parameters. Next, the substance sensing method of the present invention proceeds to step T06.

T06:感測物質並運算與判斷物質特徵。接著,本發明之物質感測方法進入步驟T08或T10。T06: Sensing the substance and calculating and judging the substance characteristics. Next, the substance sensing method of the present invention proceeds to step T08 or T10.

T08:進行物質的物理性測量容積計算以產生第一訊號。接著,本發明之物質感測方法進入步驟T12。T08: Physical measurement of the volume of the substance is performed to generate a first signal. Next, the substance sensing method of the present invention proceeds to step T12.

T10:進行物質的品質量測以鑑別不同物質種類以產生第二訊號。接著,本發明之物質感測方法進入步驟T12。T10: Perform quality measurement of the substance to identify different substance types to generate a second signal. Next, the substance sensing method of the present invention proceeds to step T12.

T12:操作模式選擇。本發明之物質感測方法可以選擇單一訊號輸出,或該第一訊號與該第二訊號任意組合之複數訊號輸出;接著,輸出電路依操作模式將訊號轉換成現有類比或數位通訊界面的訊號,其中現有類比或數位通訊界面為例如但本發明不限定為Wireless HART界面、RS-485界面、4-20mA界面或IO-Link界面等等。T12: Operation mode selection. The material sensing method of the present invention can select a single signal output, or a complex signal output of any combination of the first signal and the second signal; and then, the output circuit converts the signal into an existing analog or digital communication interface signal according to an operation mode. The existing analog or digital communication interface is, for example, but the invention is not limited to a Wireless HART interface, an RS-485 interface, a 4-20 mA interface or an IO-Link interface, and the like.

換言之,本發明的第三個技術特徵是提供一種判斷方法以綜合地考量與判斷物質的介電常數的變化、溫度的變化以及物質的容積的變化,以設計出一個判斷公式:Curve(x) = f(T,ε) + I(T,ε,V),其中f 代表發射頻率,I代表回饋訊號強度,T代表溫度,ε代表物質的介電常數,V代表物質的容積。In other words, the third technical feature of the present invention is to provide a judging method for comprehensively considering and judging the change of the dielectric constant of the substance, the change of the temperature, and the change of the volume of the substance to design a judgment formula: Curve(x) = f(T, ε) + I(T, ε, V), where f represents the emission frequency, I represents the feedback signal strength, T represents temperature, ε represents the dielectric constant of the substance, and V represents the volume of the substance.

請參考圖4,其係為本發明之阻抗頻譜之波形圖;請參考圖5,其係為本發明之該些狀態區之示意圖;圖4包含了7條曲線(即,在7種不同狀態下所分別量測到的7個波形訊號),他們為一第一波形訊號2001、一第二波形訊號2002、一第三波形訊號2003、一第四波形訊號2004、一第五波形訊號2005、一第六波形訊號2006及一第七波形訊號2007;在圖4與圖5當中,頻率的單位為赫茲,強度的單位則不予限制,可為任意單位。Please refer to FIG. 4 , which is a waveform diagram of the impedance spectrum of the present invention; please refer to FIG. 5 , which is a schematic diagram of the state regions of the present invention; FIG. 4 includes 7 curves (ie, in 7 different states) The seven waveform signals respectively measured are a first waveform signal 2001, a second waveform signal 2002, a third waveform signal 2003, a fourth waveform signal 2004, a fifth waveform signal 2005, A sixth waveform signal 2006 and a seventh waveform signal 2007; in Figures 4 and 5, the unit of frequency is Hertz, and the unit of intensity is not limited, and may be any unit.

依照上述公式、圖4及圖5,阻抗頻譜可以區分為五個狀態區,包含一個測量區1000以及四個變異區,其中四個變異區包含一第一變異區1001、一第二變異區1002、一第三變異區1003及一第四變異區1004;該測量區1000係位於一事先定義中間頻率位置;依據複數之預設訊號強度邊界(包含一第一預設訊號強度邊界3001、一第二預設訊號強度邊界3002、一第三預設訊號強度邊界3003及一第四預設訊號強度邊界3004),該些變異區(即該第一變異區1001、該第二變異區1002、該第三變異區1003及該第四變異區1004)係分別分佈在該測量區1000之兩側。According to the above formula, FIG. 4 and FIG. 5, the impedance spectrum can be divided into five state regions, including one measurement region 1000 and four variation regions, wherein the four variation regions include a first variation region 1001 and a second variation region 1002. a third variation zone 1003 and a fourth variation zone 1004; the measurement zone 1000 is located at a predefined intermediate frequency position; and according to a plurality of preset signal strength boundaries (including a first preset signal strength boundary 3001, a first Two preset signal strength boundaries 3002, a third predetermined signal strength boundary 3003, and a fourth predetermined signal intensity boundary 3004), the variation regions (ie, the first variation region 1001, the second variation region 1002, the The third variation region 1003 and the fourth variation region 1004) are respectively distributed on both sides of the measurement region 1000.

在該測量區1000:溫度在預先設定範圍;物質介電常數在預先設定範圍;物質容積具變化值;發射頻率在預先設定範圍;回饋訊號強度具變化值。在這個模式下,其通常屬於事先定義物質的容積的變化的量測區域。In the measurement area 1000: the temperature is in a preset range; the material dielectric constant is in a preset range; the material volume has a change value; the emission frequency is in a preset range; and the feedback signal strength has a change value. In this mode, it typically belongs to a measurement area of a change in the volume of a previously defined substance.

換句話說,該波形訊號的該訊號強度的一最大值被定義為一強度最大值;當該強度最大值的一頻率介於一第一頻率與一第二頻率時(例如圖4所示之該第五波形訊號2005、該第六波形訊號2006及該第七波形訊號2007),該外部環境溫度被判定為在一預先設定溫度範圍,該物質之該介電常數被判定為在一預先設定介電常數範圍,該物質之該物質等效容積被判定為超出一預先設定容積範圍,該反射訊號之一訊號強度被判定為超出一預先設定反射強度範圍,其中該第二頻率大於該第一頻率。In other words, a maximum value of the signal strength of the waveform signal is defined as an intensity maximum value; when a frequency of the intensity maximum is between a first frequency and a second frequency (eg, as shown in FIG. 4) The fifth waveform signal 2005, the sixth waveform signal 2006, and the seventh waveform signal 2007), the external ambient temperature is determined to be within a predetermined temperature range, and the dielectric constant of the substance is determined to be a preset a dielectric constant range in which the equivalent volume of the substance is determined to exceed a predetermined volume range, and one of the reflected signals is determined to exceed a predetermined reflection intensity range, wherein the second frequency is greater than the first frequency.

在該第一變異區1001:溫度超出預先設定範圍;物質介電常數低於預先設定範圍;物質容積變化不明顯,在一定定義範圍內;發射頻率高於預先設定範圍;回饋訊號強度高於預先設定範圍。在這個模式下(溫度變化且物質變化),其通常屬於容積沒有變化,但物質有性質上變化(物質改變為不同物質或物質本身性質變化)的一種區域。In the first variation region 1001: the temperature exceeds a preset range; the dielectric constant of the substance is lower than a preset range; the volume change of the substance is not obvious, within a certain definition range; the emission frequency is higher than a preset range; the feedback signal strength is higher than the predetermined Predetermined area. In this mode (temperature changes and material changes), it usually belongs to a region where the volume does not change, but the substance has a change in properties (the substance changes to a different substance or the nature of the substance itself).

換句話說,當該強度最大值的該頻率大於該第二頻率且該強度最大值大於一第一強度預設值時(例如圖4所示之該第一波形訊號2001),該外部環境溫度被判定為超出該預先設定溫度範圍,該物質之該介電常數被判定為低於該預先設定介電常數範圍,該物質之該物質等效容積被判定為在該預先設定容積範圍,該反射訊號之該訊號強度被判定為超出該預先設定反射強度範圍,但該物質之該物質品質被判定為改變。In other words, when the frequency of the maximum intensity is greater than the second frequency and the maximum value is greater than a first intensity preset value (eg, the first waveform signal 2001 shown in FIG. 4), the external ambient temperature When it is determined that the predetermined temperature range is exceeded, the dielectric constant of the substance is determined to be lower than the predetermined dielectric constant range, and the equivalent volume of the substance is determined to be within the preset volume range, the reflection The signal strength of the signal is determined to be outside the predetermined reflection intensity range, but the substance quality of the substance is determined to be changed.

在該第二變異區1002:溫度超出預先設定範圍;物質介電常數高於預先設定範圍;物質容積變化不明顯,在一定定義範圍內;發射頻率低於預先設定範圍;回饋訊號強度低於預先設定範圍。在這個模式下(溫度變化且物質變化),其通常屬於容積沒有變化,但物質有性質上變化(物質改變為不同物質或物質本身性質變化)的一種區域。In the second variation zone 1002: the temperature exceeds a preset range; the dielectric constant of the substance is higher than a preset range; the volume change of the substance is not obvious, within a certain defined range; the emission frequency is lower than a preset range; the feedback signal strength is lower than the predetermined Predetermined area. In this mode (temperature changes and material changes), it usually belongs to a region where the volume does not change, but the substance has a change in properties (the substance changes to a different substance or the nature of the substance itself).

換句話說,當該強度最大值的該頻率小於該第一頻率且該強度最大值不大於一第二強度預設值時(例如圖4所示之該第三波形訊號2003),該外部環境溫度被判定為超出該預先設定溫度範圍,該物質之該介電常數被判定為高於該預先設定介電常數範圍,該物質之該物質等效容積被判定為在該預先設定容積範圍,該反射訊號之該訊號強度被判定為低於該預先設定反射強度範圍,但該物質之該物質品質被判定為改變。In other words, when the frequency of the maximum intensity is less than the first frequency and the maximum value is not greater than a second intensity preset value (eg, the third waveform signal 2003 shown in FIG. 4), the external environment The temperature is determined to exceed the predetermined temperature range, the dielectric constant of the substance is determined to be higher than the predetermined dielectric constant range, and the substance equivalent volume of the substance is determined to be within the predetermined volume range, The signal strength of the reflected signal is determined to be lower than the predetermined reflection intensity range, but the substance quality of the substance is determined to be changed.

在該第三變異區1003:溫度在預先設定範圍;物質介電常數高於預先設定範圍;物質容積變化不明顯,在一定定義範圍內;發射頻率低於預先設定範圍;回饋訊號強度在預先設定範圍。在這個模式下(物質變化),其通常屬於容積沒有變化,但物質有性質上變化(物質改變為不同物質或物質本身性質變化)的一種區域。In the third variation zone 1003: the temperature is in a preset range; the dielectric constant of the substance is higher than a preset range; the volume change of the substance is not obvious, within a certain definition range; the emission frequency is lower than a preset range; the feedback signal strength is preset range. In this mode (substance change), it usually belongs to a region where the volume does not change, but the substance has a change in properties (the substance changes to a different substance or the nature of the substance itself).

換句話說,當該強度最大值的該頻率小於該第一頻率且該強度最大值大於該第二強度預設值時(例如圖4所示之該第四波形訊號2004),該外部環境溫度被判定為在該預先設定溫度範圍,該物質之該介電常數被判定為高於該預先設定介電常數範圍,該物質之該物質等效容積被判定為在該預先設定容積範圍,該反射訊號之該訊號強度被判定為在該預先設定反射強度範圍,但該物質之該物質品質被判定為改變。In other words, when the frequency of the intensity maximum is less than the first frequency and the intensity maximum is greater than the second intensity preset value (eg, the fourth waveform signal 2004 shown in FIG. 4), the external ambient temperature It is determined that the dielectric constant of the substance is determined to be higher than the predetermined dielectric constant range in the predetermined temperature range, and the substance equivalent volume of the substance is determined to be within the predetermined volume range, the reflection The signal strength of the signal is determined to be within the predetermined range of reflected intensity, but the substance quality of the substance is determined to be changed.

在該第四變異區1004:溫度在預先設定範圍;物質介電常數低於預先設定範圍;物質容積變化不明顯,在一定定義範圍內;發射頻率在高於預先設定範圍;回饋訊號強度在預先設定範圍。在這個模式下(物質變化),其通常屬於容積沒有變化,但物質有性質上變化(物質改變為不同物質或物質本身性質變化)的一種區域。In the fourth variation zone 1004: the temperature is in a predetermined range; the dielectric constant of the substance is lower than a predetermined range; the volume change of the substance is not obvious, within a certain definition range; the emission frequency is higher than a preset range; the feedback signal strength is in advance Predetermined area. In this mode (substance change), it usually belongs to a region where the volume does not change, but the substance has a change in properties (the substance changes to a different substance or the nature of the substance itself).

換句話說,當該強度最大值的該頻率大於該第二頻率且該強度最大值不大於該第一強度預設值時(例如圖4所示之該第二波形訊號2002),該外部環境溫度被判定為在該預先設定溫度範圍,該物質之該介電常數被判定為低於該預先設定介電常數範圍,該物質之該物質等效容積被判定為在該預先設定容積範圍,該反射訊號之該訊號強度被判定為在該預先設定反射強度範圍,但該物質之該物質品質被判定為改變。In other words, when the frequency of the maximum intensity is greater than the second frequency and the maximum value is not greater than the first intensity preset value (eg, the second waveform signal 2002 shown in FIG. 4), the external environment The temperature is determined to be within the predetermined temperature range, the dielectric constant of the substance is determined to be lower than the predetermined dielectric constant range, and the substance equivalent volume of the substance is determined to be within the predetermined volume range, The intensity of the signal of the reflected signal is determined to be within the predetermined range of reflected intensity, but the quality of the substance of the substance is determined to be changed.

因此,本發明的第三個技術特徵為,藉由上述五個區域的事先定義以綜合地判斷物質的介電常數的變異、環境的溫度的變異以及物質的容積的變異;本發明包含至少一個上述區域的判別。Therefore, a third technical feature of the present invention is to comprehensively judge the variation of the dielectric constant of the substance, the variation of the temperature of the environment, and the variation of the volume of the substance by the above-described definition of the five regions; the present invention includes at least one Discrimination of the above areas.

請參考圖6,其係為本發明之概念圖。本發明可綜合地評判相同物料下的訊號強度變化、不同物料下的訊號頻率變化以及環境溫度影響的特性偏移。結合上述所言,利用阻抗頻譜感測器的掃頻原理、靜電容/射頻導納型感測器判斷強度的方式、連續式感測器的探棒結構以及考慮環境溫度影響的補償電路,本發明提供一種可以量測桶槽內物質容量的多寡,且同時判斷物質的品質狀況,而不會受到環境溫度變化影響的接觸式多功型連續式感測裝置。Please refer to FIG. 6, which is a conceptual diagram of the present invention. The invention can comprehensively judge the signal intensity variation under the same material, the signal frequency variation under different materials, and the characteristic deviation of the environmental temperature influence. In combination with the above, the frequency sweeping principle of the impedance spectrum sensor, the way the static capacitance/radio admittance type sensor is used to judge the intensity, the probe structure of the continuous sensor, and the compensation circuit considering the influence of the ambient temperature are used. The invention provides a contact type multi-function continuous sensing device which can measure the amount of material in the tank and at the same time judge the quality condition of the substance without being affected by the change of the ambient temperature.

阻抗頻譜感測器與靜電容/射頻導納感測器的原理均是將安裝環境下的物質視為一等效電容值,感測器的探棒偵測該等效電容值的變化來進行輸出與反應,其變化的大小取決於物質的介電常數的大小,如果物質的介電常數越大,則變化越大,如果物質的介電常數越小,則變化越小。而靜電容/射頻導納連續式感測器係將探棒接觸物質的面積進行計算,以判斷桶槽內物質的容量。而物質的品質是否會在量測中變化,是需要另外安裝其他感測裝置進行偵測,使其可以達到監測桶槽內物質的容量與品質的效果。The principle of the impedance spectrum sensor and the static capacitance/RF admittance sensor are to treat the material in the installation environment as an equivalent capacitance value, and the probe of the sensor detects the change of the equivalent capacitance value. The output and the reaction vary depending on the dielectric constant of the substance. If the dielectric constant of the substance is larger, the change is larger. If the dielectric constant of the substance is smaller, the change is smaller. The static capacitance/RF admittance continuous sensor calculates the area of the contact material of the probe to determine the volume of the material in the tank. Whether the quality of the material will change during the measurement requires the installation of other sensing devices for detection, so that it can achieve the effect of monitoring the volume and quality of the material in the tank.

本發明將阻抗頻譜感測器與靜電容/射頻導納感測器的原理進行結合;利用可調整頻率的訊號及接觸型連續式探棒的結構設計,本發明感測從物質的回饋訊號的頻率響應特性以分析訊號頻率的變化與訊號強度,並且進行環境溫度造成電路與物質的補償;本發明判斷桶槽內物質的變化、確認物質的品質以及偵測物質的溫度,並接著顯示結果在感測模組的使用者介面或透過界面(例如但本發明不限定為Wireless HART界面、RS-485界面、4-20mA界面或IO-Link界面等等)輸出到中控系統。The invention combines the impedance spectrum sensor with the principle of the electrostatic capacitance/radio admittance sensor; the invention senses the feedback signal from the substance by using the adjustable frequency signal and the structural design of the contact type continuous probe The frequency response characteristic analyzes the change of the signal frequency and the signal intensity, and compensates for the circuit and the substance caused by the ambient temperature; the present invention determines the change of the substance in the tank, confirms the quality of the substance, and detects the temperature of the substance, and then displays the result in The user interface of the sensing module or the interface (for example, the invention is not limited to the Wireless HART interface, the RS-485 interface, the 4-20 mA interface or the IO-Link interface, etc.) is output to the central control system.

亦即,本發明利用感測模組以感測反射訊號的頻率變異與強度變化,藉由事先定義好之物質的電容率與環境溫度變化的補償,利用雙重判斷模式,本發明透過輸出電路及界面(例如但本發明不限定為Wireless HART界面、RS-485界面、4-20mA界面或IO-Link界面等等)輸出判斷結果,使得訊號頻率偏移曲率與訊號強度變化可被得知,藉此本發明計算出物質高度(即物質容積)與物質品質。再者,本發明也可選擇單一模式測量(料位高度)或多工模式測量(物質劣化判斷)。That is, the present invention utilizes the sensing module to sense the frequency variation and intensity variation of the reflected signal, and by using the compensation of the capacitance ratio of the previously defined substance and the change of the ambient temperature, the double judgment mode is adopted, and the present invention transmits the output circuit and The interface (for example, the invention is not limited to the Wireless HART interface, the RS-485 interface, the 4-20 mA interface or the IO-Link interface, etc.) outputs a judgment result, so that the signal frequency offset curvature and the signal intensity change can be known, This invention calculates the material height (i.e., the volume of matter) and the quality of the material. Furthermore, the present invention can also select single mode measurement (level height) or multiplex mode measurement (material deterioration determination).

然以上所述者,僅為本發明之較佳實施例,當不能限定本發明實施之範圍,即凡依本發明申請專利範圍所作之均等變化與修飾等,皆應仍屬本發明之專利涵蓋範圍意圖保護之範疇。本發明還可有其它多種實施例,在不背離本發明精神及其實質的情況下,熟悉本領域的技術人員當可根據本發明作出各種相應的改變和變形,但這些相應的改變和變形都應屬於本發明所附的權利要求的保護範圍。綜上所述,當知本發明已具有產業利用性、新穎性與進步性,又本發明之構造亦未曾見於同類產品及公開使用,完全符合發明專利申請要件,爰依專利法提出申請。However, the above is only a preferred embodiment of the present invention, and the scope of the present invention is not limited thereto, that is, the equivalent changes and modifications made by the scope of the present invention should still be covered by the patent of the present invention. The scope of the scope is intended to protect. The invention may be embodied in various other modifications and changes without departing from the spirit and scope of the inventions. It is intended to fall within the scope of the appended claims. In summary, it is known that the present invention has industrial applicability, novelty and advancement, and the structure of the present invention has not been seen in similar products and public use, and fully complies with the requirements of the invention patent application, and is filed according to the patent law.

10‧‧‧感測裝置10‧‧‧Sensing device

20‧‧‧物質20‧‧‧ substances

30‧‧‧桶槽30‧‧‧ barrels

102‧‧‧探棒102‧‧‧ Probe

104‧‧‧感測模組104‧‧‧Sensing module

106‧‧‧物質感測電路106‧‧‧Material sensing circuit

108‧‧‧運算單元108‧‧‧ arithmetic unit

110‧‧‧訊號輸出電路110‧‧‧Signal output circuit

112‧‧‧掃頻訊號112‧‧‧Sweeping signal

114‧‧‧反射訊號114‧‧‧Reflected signal

116‧‧‧溫度感測電路116‧‧‧Temperature sensing circuit

118‧‧‧溫度感測訊號118‧‧‧temperature sensing signal

120‧‧‧溫度感測單元120‧‧‧Temperature sensing unit

122‧‧‧第一訊號輸出電路122‧‧‧First signal output circuit

124‧‧‧第二訊號輸出電路124‧‧‧second signal output circuit

126‧‧‧第一訊號126‧‧‧ first signal

128‧‧‧第二訊號128‧‧‧second signal

1000‧‧‧測量區1000‧‧‧Measurement area

1001‧‧‧第一變異區1001‧‧‧First Variation Zone

1002‧‧‧第二變異區1002‧‧‧Second variant

1003‧‧‧第三變異區1003‧‧‧The third variant

1004‧‧‧第四變異區1004‧‧‧4th variant

2001‧‧‧第一波形訊號2001‧‧‧First Waveform Signal

2002‧‧‧第二波形訊號2002‧‧‧Second waveform signal

2003‧‧‧第三波形訊號2003‧‧‧ Third Waveform Signal

2004‧‧‧第四波形訊號2004‧‧‧fourth waveform signal

2005‧‧‧第五波形訊號2005‧‧‧ Fifth Waveform Signal

2006‧‧‧第六波形訊號2006‧‧‧ sixth waveform signal

2007‧‧‧第七波形訊號2007‧‧‧ seventh waveform signal

3001‧‧‧第一預設訊號強度邊界3001‧‧‧First preset signal strength boundary

3002‧‧‧第二預設訊號強度邊界3002‧‧‧Second preset signal strength boundary

3003‧‧‧第三預設訊號強度邊界3003‧‧‧ Third preset signal strength boundary

3004‧‧‧第四預設訊號強度邊界3004‧‧‧Fourth preset signal strength boundary

S02~16‧‧‧步驟S02~16‧‧‧Steps

T02~12‧‧‧步驟Step T02~12‧‧‧

圖1為本發明之感測裝置之之一實施例方塊圖。1 is a block diagram of an embodiment of a sensing device of the present invention.

圖2為本發明之物質感測方法之一實施例流程圖。2 is a flow chart of an embodiment of a material sensing method of the present invention.

圖3為本發明之物質感測方法之另一實施例流程圖。3 is a flow chart of another embodiment of a substance sensing method of the present invention.

圖4為本發明之阻抗頻譜之波形圖。4 is a waveform diagram of an impedance spectrum of the present invention.

圖5為本發明之該些狀態區之示意圖。Figure 5 is a schematic illustration of the state zones of the present invention.

圖6為本發明之概念圖。Figure 6 is a conceptual diagram of the present invention.

Claims (14)

一種感測裝置,用以感測一物質之一介電常數之一變化狀態,該裝置感測裝置包含: 一探棒;及 一感測模組,該感測模組連接該探棒, 其中該感測模組包含: 一物質感測電路; 一運算單元,該運算單元電性連接至該物質感測電路;及 一訊號輸出電路,該訊號輸出電路電性連接至該運算單元, 其中該感測模組產生一掃頻訊號並且傳送該掃頻訊號至該探棒以感測該物質之一狀態;該掃頻訊號為在一預設頻率範圍內彼此相異頻率的複數訊號;當該掃頻訊號接觸到該物質時,利用該物質的一等效電容產生一反射訊號;該物質感測電路接收該反射訊號並傳遞該反射訊號至該運算單元;該運算單元對該反射訊號運算以產生一波形訊號以判斷該物質之該狀態; 其中該運算單元利用一阻抗頻譜以判斷該物質之該狀態;該阻抗頻譜界定有複數之狀態區;該些狀態區的每一個分別具有不同的一輸出訊號;該運算單元應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質之一物質等效容積以及一物質品質並判斷該物質之該狀態;依據該波形訊號在該些狀態區的該位置,該運算單元利用該訊號輸出電路向外輸出該位置的該狀態區的該輸出訊號。a sensing device for sensing a change state of a dielectric constant of a substance, the device sensing device comprising: a probe; and a sensing module, the sensing module is connected to the probe, wherein The sensing module comprises: a substance sensing circuit; an arithmetic unit electrically connected to the substance sensing circuit; and a signal output circuit, the signal output circuit is electrically connected to the computing unit, wherein the sensing unit The sensing module generates a sweep signal and transmits the sweep signal to the probe to sense a state of the substance; the sweep signal is a complex signal having a frequency different from each other within a preset frequency range; When the frequency signal contacts the substance, an equivalent capacitance of the substance is used to generate a reflection signal; the substance sensing circuit receives the reflection signal and transmits the reflection signal to the operation unit; and the operation unit operates the reflected signal to generate a waveform signal for determining the state of the substance; wherein the operation unit utilizes an impedance spectrum to determine the state of the substance; the impedance spectrum defines a plurality of state regions; Each of the zones has a different output signal; the computing unit applies a signal strength of the waveform signal and a distribution frequency to the impedance spectrum to determine a position of the waveform signal in the state zones, and performs a Converting to obtain a substance equivalent volume of a substance and a substance quality and determining the state of the substance; according to the waveform signal at the position of the state areas, the arithmetic unit outputs the position to the position by using the signal output circuit The output signal of the status area. 如申請專利範圍第1項所述之感測裝置,其中該些狀態區包含一測量區以及複數個變異區;該測量區係位於一事先定義中間頻率位置;依據複數之預設訊號強度邊界,該些變異區分別分佈在該測量區之兩側。The sensing device of claim 1, wherein the state regions comprise a measurement region and a plurality of variation regions; the measurement region is located at a predefined intermediate frequency position; and according to a plurality of preset signal intensity boundaries, The variation regions are respectively distributed on both sides of the measurement area. 如申請專利範圍第1項所述之感測裝置,其中該感測模組更包含: 一溫度感測電路,該溫度感測電路電性連接至該運算單元, 其中該溫度感測電路係用以產生一溫度感測訊號並傳送該溫度感測訊號至該運算單元;該運算單元利用該溫度感測訊號對該波形訊號進行一訊號補償。The sensing device of claim 1, wherein the sensing module further comprises: a temperature sensing circuit electrically connected to the computing unit, wherein the temperature sensing circuit is The temperature sensing signal is generated to transmit the temperature sensing signal to the computing unit; the computing unit uses the temperature sensing signal to perform a signal compensation on the waveform signal. 如申請專利範圍第3項所述之感測裝置,其中該溫度感測電路係用以偵測一外部環境溫度以產生該溫度感測訊號。The sensing device of claim 3, wherein the temperature sensing circuit is configured to detect an external ambient temperature to generate the temperature sensing signal. 如申請專利範圍第3項所述之感測裝置,更包含: 複數之溫度感測單元,該些溫度感測單元的每一個係分別間隔地設置於該探棒上且分別電性連接至該溫度感測電路, 其中該些溫度感測單元係用以偵測一外部環境溫度。The sensing device of claim 3, further comprising: a plurality of temperature sensing units, each of the temperature sensing units being separately disposed on the probe and electrically connected to the probe The temperature sensing circuit is configured to detect an external ambient temperature. 如申請專利範圍第1項所述之感測裝置,其中該訊號輸出電路包含: 一第一訊號輸出電路,該第一訊號輸出電路電性連接至該運算單元;及 一第二訊號輸出電路,該第二訊號輸出電路電性連接至該運算單元, 其中該運算單元對應該物質等效容積驅動該第一訊號輸出電路以輸出一第一訊號;該運算單元對應該物質品質驅動該第二訊號輸出電路以輸出一第二訊號;該輸出訊號包含該第一訊號與該第二訊號。The sensing device of claim 1, wherein the signal output circuit comprises: a first signal output circuit, the first signal output circuit is electrically connected to the operation unit; and a second signal output circuit, The second signal output circuit is electrically connected to the operation unit, wherein the operation unit drives the first signal output circuit corresponding to the material equivalent volume to output a first signal; the operation unit drives the second signal corresponding to the material quality The output circuit outputs a second signal; the output signal includes the first signal and the second signal. 如申請專利範圍第6項所述之感測裝置,其中該第一訊號為一類比訊號且該第二訊號為一類比訊號。The sensing device of claim 6, wherein the first signal is an analog signal and the second signal is an analog signal. 如申請專利範圍第6項所述之感測裝置,其中該第一訊號為一數位訊號且該第二訊號為一數位訊號。The sensing device of claim 6, wherein the first signal is a digital signal and the second signal is a digital signal. 如申請專利範圍第6項所述之感測裝置,其中該第一訊號為一類比訊號且該第二訊號為一數位訊號,或者是該第一訊號為一數位訊號且該第二訊號為一類比訊號。The sensing device of claim 6, wherein the first signal is an analog signal and the second signal is a digital signal, or the first signal is a digital signal and the second signal is a Analog signal. 如申請專利範圍第7項所述之感測裝置,其中在一訊號補償模式當中,該感測模組產生一溫度感測訊號以對該波形訊號進行一訊號補償。The sensing device of claim 7, wherein in a signal compensation mode, the sensing module generates a temperature sensing signal to perform a signal compensation on the waveform signal. 一種物質感測方法,包含: 準備一感測裝置,其中該感測裝置係用以量測一物質之一狀態且具有一探棒及連接該探棒的一感測模組; 將該探棒設置於該物質中; 對該感測裝置進行一環境校正; 利用該感測模組產生一掃頻訊號並且傳送該掃頻訊號至該探棒以感測該物質之該狀態,其中該掃頻訊號為在一預設頻率範圍內彼此相異頻率的複數訊號; 當該掃頻訊號接觸到該物質時,利用該物質的一等效電容產生一反射訊號; 該感測模組對該反射訊號運算以產生一波形訊號並進行一量測模式以判斷該物質之該狀態而得到一量測結果並對外輸出,其中該量測模式為利用一阻抗頻譜判斷該物質之該狀態,該阻抗頻譜界定有複數之狀態區,該些狀態區的每一個分別具有不同的一輸出訊號; 該感測模組應用該波形訊號之一訊號強度與一分佈頻率於該阻抗頻譜以判斷該波形訊號在該些狀態區的一位置,並據此進行一換算以得到該物質之一物質等效容積以及一物質品質並判斷該物質之該狀態;及 依據該波形訊號在該些狀態區的該位置,該感測模組向外輸出該位置的該狀態區的該輸出訊號。A method for sensing a substance, comprising: preparing a sensing device, wherein the sensing device is configured to measure a state of a substance and has a probe and a sensing module connected to the probe; Provided in the material; performing an environmental correction on the sensing device; generating a sweep signal by using the sensing module and transmitting the sweep signal to the probe to sense the state of the substance, wherein the sweep signal a complex signal having a frequency different from each other within a predetermined frequency range; when the swept signal contacts the substance, an equivalent capacitance of the substance is used to generate a reflected signal; and the sensing module operates on the reflected signal Generating a waveform signal and performing a measurement mode to determine the state of the substance to obtain a measurement result and externally outputting, wherein the measurement mode is to determine the state of the substance by using an impedance spectrum, the impedance spectrum is defined a plurality of status areas, each of the status areas having a different output signal; the sensing module applying a signal strength of the waveform signal and a distribution frequency to the impedance spectrum Disconnecting the waveform signal at a position of the state regions, and performing a conversion to obtain a material equivalent volume of the substance and a substance quality and determining the state of the substance; and according to the waveform signal in the states At the location of the zone, the sensing module outputs the output signal of the state zone of the location to the outside. 如申請專利範圍第11項所述之物質感測方法,其中該些狀態區包含一測量區以及複數個變異區;該測量區係位於一事先定義中間頻率位置;依據複數之預設訊號強度邊界,該些變異區分別分佈在該測量區之兩側。The material sensing method of claim 11, wherein the state regions comprise a measurement area and a plurality of variation regions; the measurement region is located at a pre-defined intermediate frequency position; and the predetermined signal intensity boundary is based on the complex number The variation regions are respectively distributed on both sides of the measurement area. 如申請專利範圍第11項所述之物質感測方法,更包含: 設定一操作模式並且依據該操作模式驅使該感測裝置進行該物質之一物質容積量測或該物質之一物質品質量測,或同時進行該物質之該物質容積量測與該物質之該物質品質量測。The material sensing method of claim 11, further comprising: setting an operation mode and driving the sensing device to perform a volume measurement of the substance or a mass measurement of the substance according to the operation mode. , or simultaneously measuring the volume of the substance of the substance and the mass of the substance of the substance. 如申請專利範圍第11項所述之物質感測方法,其中該感測模組對該物質容積量測之一結果產生一第一訊號以對外輸出該第一訊號;該感測模組對該物質品質量測之一結果產生一第二訊號以對外輸出該第二訊號;該輸出訊號包含該第一訊號與該第二訊號。The material sensing method of claim 11, wherein the sensing module generates a first signal for one of the volume measurement results to output the first signal; the sensing module One of the results of the quality measurement of the substance produces a second signal for externally outputting the second signal; the output signal includes the first signal and the second signal.
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