TW201809284A - Compact thermal cycling device and system comprising said thermal cycling device - Google Patents

Compact thermal cycling device and system comprising said thermal cycling device Download PDF

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TW201809284A
TW201809284A TW106128292A TW106128292A TW201809284A TW 201809284 A TW201809284 A TW 201809284A TW 106128292 A TW106128292 A TW 106128292A TW 106128292 A TW106128292 A TW 106128292A TW 201809284 A TW201809284 A TW 201809284A
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base
test tube
heating
patent application
thermal
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TW106128292A
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艾托 伊卡拉佛奈黛
傑畢爾 柏甘索路易斯
伊尼果 阿朗布魯蘭斯卡諾
黛安娜 艾諾莉姿艾諾莉姿
米果 羅凱勒波札
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西班牙商聖伊格納西奧阿爾法實驗室製藥公司
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Publication of TW201809284A publication Critical patent/TW201809284A/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00Heating or cooling apparatus; Heat insulating devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00Heating or cooling apparatus; Heat insulating devices
    • B01L7/52Heating or cooling apparatus; Heat insulating devices with provision for submitting samples to a predetermined sequence of different temperatures, e.g. for treating nucleic acid samples
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00Additional constructional details
    • B01L2300/06Auxiliary integrated devices, integrated components
    • B01L2300/0627Sensor or part of a sensor is integrated
    • B01L2300/0663Whole sensors
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00Additional constructional details
    • B01L2300/08Geometry, shape and general structure
    • B01L2300/0809Geometry, shape and general structure rectangular shaped
    • B01L2300/0829Multi-well plates; Microtitration plates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00Additional constructional details
    • B01L2300/18Means for temperature control
    • B01L2300/1805Conductive heating, heat from thermostatted solids is conducted to receptacles, e.g. heating plates, blocks
    • B01L2300/1822Conductive heating, heat from thermostatted solids is conducted to receptacles, e.g. heating plates, blocks using Peltier elements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01LCHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L2300/00Additional constructional details
    • B01L2300/18Means for temperature control
    • B01L2300/1805Conductive heating, heat from thermostatted solids is conducted to receptacles, e.g. heating plates, blocks
    • B01L2300/1827Conductive heating, heat from thermostatted solids is conducted to receptacles, e.g. heating plates, blocks using resistive heater

Abstract

The present invention relates to a compact thermal cycling device (1) for heating and cooling at least one housing mount (2) for housing a lower portion of a reagent tube (3), adapted for conducting heat into or out of same; and a thermoelectric heater (6) coupled to said mount (2). Advantageously, the device (1) of the invention further comprises a heating block (8) arranged in a region located above the region of the mount (2), comprising at least one housing port (9) adapted for receiving an upper portion of the tube (3) located above the portion housed by the mount (2), being in thermal contact with said upper portion.

Description

緊湊型熱循環裝置和包含此熱循環裝置的系統 Compact thermal cycler and system including the same

本發明屬於分子生物學,生物化學和基因組學的實驗領域。更具體地,本發明涉及用於DNA序列擴增的熱迴圈裝置,以及與所述裝置相關的系統。 The invention belongs to the experimental fields of molecular biology, biochemistry and genomics. More specifically, the present invention relates to a thermal loop device for DNA sequence amplification, and a system related to the device.

熱迴圈裝置,也稱為PCR(聚合酶鏈式反應))設備,是優選用於分子生物學領域以將聚合酶進行不同的溫度迴圈,例如進行DNA擴增或使用Sanger方法進行測序反應的設備。所述裝置的最常見的模型由多個孔組成,該多個孔被配置成容納試管,通過加熱板連接到電阻塊,該電阻塊將均勻的溫度分佈到孔中用於程式設計多次,通常溫度範圍包括在4℃至96℃之間。 Thermal loop devices, also known as PCR (polymerase chain reaction) devices, are preferably used in the field of molecular biology to loop polymerases at different temperatures, such as DNA amplification or sequencing reactions using the Sanger method device of. The most common model of the device consists of multiple holes, which are configured to hold test tubes, connected to a resistance block through a heating plate, which distributes uniform temperature into the holes for programming multiple times, Typical temperature ranges include between 4 ° C and 96 ° C.

考慮到試管中的培養反應通常在水溶液中進行,熱迴圈裝置通常還包括加熱蓋,其設置用於覆蓋試管並在104℃恆定加熱,使得水的冷凝限制在反應發生的封閉的管 中,降低了溶質的濃度以防止聚合酶的最佳條件改變,並為用作DNA複製起點的引物配對保持所需的熱力學。 Considering that the culture reaction in the test tube is usually performed in an aqueous solution, the thermal loop device usually also includes a heating cover, which is arranged to cover the test tube and is constantly heated at 104 ° C, so that the condensation of water is limited to the closed tube in which the reaction occurs. In this case, the concentration of the solute is reduced to prevent the optimal conditions of the polymerase from changing, and the required thermodynamics are maintained for the primer pairing used as a starting point for DNA replication.

在熱迴圈儀中,快速和連續的溫度變化迴圈被程式設計以開始在高溫下分離和變性DNA鏈,然後在低溫退火,最後在高溫下延伸的過程。該迴圈可重複多次,從而達到DNA片段所需的擴增程度。 In the thermal loop instrument, rapid and continuous temperature change loops are programmed to begin the process of separating and denaturing DNA strands at high temperatures, then annealing at low temperatures, and finally extending at high temperatures. This loop can be repeated multiple times to achieve the desired degree of amplification of the DNA fragment.

包括基於使用半導體性質的Peltier技術的加熱裝置的各種商業熱迴圈儀已有幾年時間。這些材料提供更好的溫度均勻性,以及更陡峭的向上和向下的溫度斜坡,從而在PCR過程中獲得更好的結果。同樣,為了提高溫度精度,準確度和均勻性,市場上的一些解決方案選擇在孔加熱塊中使用如金,銀和其他合金等金屬,從而實現更高的試驗穩定性和再現性。 Various commercial thermal loop meters including heating devices based on Peltier technology using semiconductor properties have been available for several years. These materials provide better temperature uniformity and steeper temperature ramps up and down for better results during the PCR process. Also, in order to improve temperature accuracy, accuracy, and uniformity, some solutions on the market choose to use metals such as gold, silver, and other alloys in the hole heating block to achieve higher test stability and reproducibility.

然而,即使在基於加熱蓋的熱迴圈儀中,冷凝問題仍然存在,因此限制了其結果的有效性。從這個意義上來說,作為這種類型的熱迴圈儀中的加熱塊的蓋子必須降到或滑到管的上部,並放置在所述試管上。這需要一個複雜的結構,其限制了試管的進入和操作,並且還使得焦點加熱點(即,試管的基座和加熱蓋的加熱器)位置太遠,這造成了較高程度的試劑冷凝。 However, even in thermal loop-based thermocyclers, the problem of condensation still exists, thus limiting the validity of its results. In this sense, the lid, which is a heating block in this type of thermal loop instrument, must be lowered or slid onto the upper part of the tube and placed on the test tube. This requires a complex structure that restricts access and manipulation of the test tube, and also places the focal point of heating (ie, the base of the test tube and the heater of the heated lid) too far away, which results in a higher degree of reagent condensation.

如前面段落所述,因此需要提供一種可以集成在熱迴圈儀中的解決方案,其有效地減少在擴增反應發生的樣品中發生冷凝,並且還允許更直接地進入使用的容納管。本發明通過一種新穎的緊湊型熱迴圈裝置來滿足所述需要, 其具有用於加熱容納管的雙重靜態和動態加熱系統。 As mentioned in the previous paragraph, there is therefore a need to provide a solution that can be integrated into a thermocycler, which effectively reduces condensation in the samples in which the amplification reaction occurs, and also allows more direct access to the used containment tube. The present invention meets the needs through a novel compact thermal loop device, It has dual static and dynamic heating systems for heating the containment tube.

根據前一部分提到的資訊,本發明的一個目的是提供一種與已知的基於加熱蓋系統的熱迴圈儀相比,能夠顯著減少樣品冷凝的裝置,其中使用的蓋子降低或滑到管的上部,放在它們的端部上。 According to the information mentioned in the previous section, it is an object of the present invention to provide a device that can significantly reduce sample condensation compared to known thermal loop meters based on heated lid systems, in which the lid used is lowered or slid to the tube. The top, on their ends.

為了上述目的,本發明的所述目的是通過緊湊型熱迴圈裝置實現的,該裝置用於加熱和冷卻至少一個用於容納試管的下部的容納底座,其中所述底座連接到熱電加熱器以加熱/冷卻所述試管的下部。 For the above purpose, the object of the present invention is achieved by a compact thermal loop device for heating and cooling at least one receiving base for receiving a lower part of a test tube, wherein the base is connected to a thermoelectric heater to The lower part of the test tube is heated / cooled.

有利地,本發明的裝置還包括與底座熱隔離的加熱塊,該加熱快佈置在加熱塊上方的上部區域中,包括至少一個容納埠,該容納埠適於容納試管的上部並且加熱由底座容納的下部區域的所述上部。 Advantageously, the device of the invention further comprises a heating block thermally isolated from the base, the heating block being arranged in the upper area above the heating block, comprising at least one receiving port adapted to receive the upper part of the test tube and heating to be received by the base The upper area of the lower area.

加熱塊優選地包括一個或多個電阻加熱裝置,當所述試管容納在熱迴圈儀中時,其適合於與試管的熱接觸,使得所述試管的上部可以保持在恆定溫度,從而防止在不同溫度迴圈的試管壁上的樣品冷凝。加熱塊和熱電加熱器的效果的組合允許減少次數以獲得結果,以及獲得更快的溫度升高和降低(更陡的斜坡),這相當於更大的反應效率,從而與現有技術的其他熱迴圈儀相比改善所獲得的結果。 The heating block preferably includes one or more resistance heating devices, which are adapted to be in thermal contact with the test tube when the test tube is contained in a thermal loop meter, so that the upper part of the test tube can be maintained at a constant temperature, thereby preventing Samples condensed on the wall of the test tube looped at different temperatures. The combination of the effect of the heating block and the thermoelectric heater allows a reduction in the number of times to obtain results, as well as a faster temperature increase and decrease (steeper slopes), which equates to a greater reaction efficiency, thus being comparable to other heat of the prior art Improved results compared to lap meters.

在本發明的優選實施方式中,熱電加熱器包括彼此相對並且圍繞底座的兩個Peltier元件。由此實現熱對稱配 置。 In a preferred embodiment of the invention, the thermoelectric heater comprises two Peltier elements facing each other and surrounding the base. This achieves thermally symmetrical distribution Home.

在本發明的另一個優選實施方式中,底座包括用於光學檢測或檢查由於其加熱和冷卻而在試管中發生的反應的埠。 In another preferred embodiment of the present invention, the base includes a port for optically detecting or inspecting a reaction occurring in a test tube due to its heating and cooling.

在本發明的另一個優選實施方式中,電阻加熱裝置配置為保持由容納埠容納的試管的部分在恆定溫度,其值優選等於或大於容納在試管中的樣品的最小冷凝抑制溫度。更優選地,溫度基本保持在104℃。因此不需要與現有技術的大多數熱迴圈裝置一樣將裝置降到或滑動到其上部。因此,其允許不需要自動裝置或使用者干預的更簡單的結構,並且保持試管的橫向加熱提供更大的無冷凝表面,以及試管中更高的溫度精度和均勻性。 In another preferred embodiment of the present invention, the resistance heating device is configured to keep the portion of the test tube contained in the receiving port at a constant temperature, and its value is preferably equal to or greater than the minimum condensation suppression temperature of the sample contained in the test tube. More preferably, the temperature is kept substantially at 104 ° C. There is therefore no need to lower or slide the device to its upper part like most prior art thermal loop devices. Therefore, it allows for a simpler structure that does not require automatic devices or user intervention, and maintains lateral heating of the test tube to provide a larger non-condensing surface, as well as higher temperature accuracy and uniformity in the test tube.

在本發明的另一優選實施方式中,底座和加熱塊彼此隔開距離為0.5mm至5.0mm。 In another preferred embodiment of the present invention, the base and the heating block are separated from each other by a distance of 0.5 mm to 5.0 mm.

在本發明的另一個優選實施方式中,底座包括上部延伸部分或通常具有0.1mm至5.0mm高度的孔。所述範圍適用於防止Peltier加熱器和加熱塊之間的熱接觸,特別是在試管由如塑膠材料的低導熱性材料製成的情況下。 In another preferred embodiment of the present invention, the base includes an upper extension or a hole generally having a height of 0.1 mm to 5.0 mm. The range is suitable for preventing thermal contact between the Peltier heater and the heating block, especially if the test tube is made of a low thermal conductivity material such as a plastic material.

孔可以是底座的集成部分,其延長部分或與其熱接觸的元件,其主要功能是擴大試管下部的熱電加熱器的傳熱表面。因此,孔有助於加熱試劑水準以上的管,從而防止接近所述水準的試管壁的熱量損失並使試劑的溫度均勻。 The hole may be an integrated part of the base, an extension thereof or an element in thermal contact therewith, whose main function is to enlarge the heat transfer surface of the thermoelectric heater in the lower part of the test tube. Therefore, the holes help to heat the tube above the reagent level, thereby preventing heat loss from the wall of the test tube near the level and uniformizing the temperature of the reagent.

在本發明的另一優選實施方式中,該裝置包括與底座熱接觸的溫度感測器,該溫度感測器配置用於控制由熱電 加熱器提供的功率和容納在底座中的試管的溫度。更優選地,溫度感測器佈置在挨著底座的對稱平面和/或最靠近容納試劑的容納管的區域中。 In another preferred embodiment of the invention, the device includes a temperature sensor in thermal contact with the base, the temperature sensor being configured to control the The power provided by the heater and the temperature of the test tube contained in the base. More preferably, the temperature sensor is arranged in a plane of symmetry next to the base and / or in an area closest to the containing tube containing the reagent.

在本發明的另一優選實施方式中,本發明的熱迴圈裝置包括用於容納試管的多個容納底座,其具有相應的Peltier加熱器,加熱塊和孔(如果使用的話)。因此獲得了完全可擴展的熱迴圈儀,由此獲得了其相關技術不受所使用的試管數量的限制。 In another preferred embodiment of the present invention, the thermal loop device of the present invention includes a plurality of receiving bases for receiving test tubes, which have corresponding Peltier heaters, heating blocks, and holes (if used). As a result, a fully expandable thermal loop meter is obtained, and thus its related technology is not limited by the number of test tubes used.

本發明的另一個目的涉及一種系統,其包括根據本文所述任何實施方式的至少一個熱迴圈裝置與一個或多個容納在所述熱迴圈儀的一個或多個容納底座中的試管組合。 Another object of the invention relates to a system comprising at least one thermal loop device according to any of the embodiments described herein in combination with one or more test tubes housed in one or more receiving bases of the thermal loop meter .

在本發明的系統的優選實施方式中,一個或多個試管包括塞子或上封閉件,其進入直到高度基本等於或小於容納在所述試管中的試劑水準以上20mm的高度。更優選地,所述高度基本上等於或小於1mm。 In a preferred embodiment of the system of the invention, the one or more test tubes include a stopper or an upper closure that enters until the height is substantially equal to or less than a height of 20 mm above the level of the reagent contained in the test tube. More preferably, the height is substantially equal to or less than 1 mm.

為了說明的目的,下面提供了本說明書中使用的一些主要術語及其根據本發明的解釋範圍的定義:熱迴圈裝置或PCR設備必須解釋為適於使一個或多個含有試劑的試管經歷不同溫度迴圈的裝置,例如進行DNA擴增或用Sanger方法進行測序反應。 For the purpose of illustration, the following provides some of the main terms used in this description and their definitions in accordance with the scope of the present invention: The thermal loop device or PCR device must be interpreted as suitable for subjecting one or more test tubes containing reagents to different Temperature loop devices, such as DNA amplification or sequencing reactions using the Sanger method.

底座必須解釋為用於熱迴圈儀的容納含有試劑的試管的下部或底部的裝置,所述底座通過一個或多個加熱裝置進行溫度控制。 The base must be interpreted as a device for the lower or bottom of a thermocycler containing a test tube containing a reagent, said base being temperature controlled by one or more heating devices.

含有試劑的試管必須解釋為用於容納所述試劑的任何 裝置,其形狀適於容納在熱迴圈儀的底座中。 Test tubes containing reagents must be interpreted as any The device is shaped to fit in the base of the thermal lap device.

孔必須解釋為作為底座的一部分的熱連接元件或元件,並且佈置在高於所述底座的高度以容納含有試劑的試管。因此,孔容納位於由底座容納的部分上方的管的一部分。 The hole must be interpreted as a thermal connection element or element that is part of the base and is arranged at a height higher than the base to accommodate the test tube containing the reagent. Therefore, the hole receives a part of the tube located above the part received by the base.

光學檢查埠必須解釋為任何通向底座的入口,通過該檢測埠可以獲得與傳輸到所述底座的內部或從所述底座的內部傳輸的光有關的資訊。 The optical inspection port must be interpreted as any entrance to the base, through which information related to light transmitted to or from the inside of the base can be obtained.

熱電加熱器必須解釋為通過基於熱電效應的任何已知表現的機構來控制底座的溫度的裝置。 A thermoelectric heater must be interpreted as a device that controls the temperature of the base by a mechanism based on any known manifestation of the thermoelectric effect.

熱電Peltier元件必須解釋為基於通過Peltier效應控制溫度的熱電加熱器的元件。 Thermoelectric Peltier elements must be interpreted as elements based on thermoelectric heaters whose temperature is controlled by the Peltier effect.

溫度感測器必須解釋為具有測量底座內部溫度值或用於測量所述值變化的裝置的任何機構。 The temperature sensor must be interpreted as any mechanism having a device for measuring a temperature value inside the base or for measuring a change in said value.

加熱塊必須解釋為用於將熱量施加到由容納埠容納的試管的上部的任何電阻加熱裝置。 The heating block must be interpreted as any resistance heating device for applying heat to the upper part of the test tube accommodated by the receiving port.

試管的下部必須解釋為試管的連續部分,當所述試管容納在熱迴圈儀的底座中時,試管的下部相應地包括容納經歷溫度迴圈的試劑的試管的體積。 The lower part of the test tube must be interpreted as a continuous part of the test tube. When the test tube is contained in the base of the thermal loop instrument, the lower part of the test tube accordingly includes the volume of the test tube containing the reagents that have undergone temperature looping.

試管的上部必須解釋為試管的連續部分,當所述管容納在底座中時,試管的上部設置在比上一段所指的下部更高的位置。 The upper part of the test tube must be interpreted as a continuous part of the test tube. When the tube is contained in the base, the upper part of the test tube is set higher than the lower part referred to in the previous paragraph.

管的塞子或封閉件必須解釋為所述試管的任何上封閉元件,其應用限制了可容納在其中的試劑的體積。 The stopper or closure of the tube must be interpreted as any upper closing element of the test tube, the application of which limits the volume of reagents that can be contained therein.

兩個或更多個元件之間的表述“熱接觸”在本發明的範圍內必須解釋為所述元件之間的緊密接觸(這被理解為在不存在如空氣的介面介質的直接接觸),由此在所述元件之間的熱傳遞是允許的。 The expression "thermal contact" between two or more elements must be interpreted within the scope of the present invention as close contact between the elements (this is understood as the direct contact in the absence of an interface medium such as air), As a result, heat transfer between the elements is allowed.

應用於兩個或多個量級之間的關係的表達“基本上”在本發明的範圍內必須解釋為等於或包含在相對於所討論的值具有±10%變化的範圍內。 An expression "substantially" applied to a relationship between two or more orders of magnitude must be interpreted within the scope of the present invention to be equal to or contained within a range having a ± 10% change from the value in question.

本發明的裝置作用於處於垂直位置的縱向管,重力作為垂直度的參考。因此,如上,下,上方或下方的相關術語必須相對於垂直方向解釋。試管的垂直方向通過試管的容納區域的配置來確定,配置為使得所述試管在熱迴圈裝置中其操作位置中採用正確的位置。 The device of the invention acts on a longitudinal tube in a vertical position, with gravity as a reference for verticality. Therefore, the relevant terms above, below, above or below must be interpreted relative to the vertical direction. The vertical direction of the test tube is determined by the configuration of the test tube's accommodating area, so that the test tube adopts the correct position in its operating position in the thermal loop device.

當表述“包括(comprises)”應用於主要元件和其他次要元件之間的關係時,必須將其解釋為包括或包含所述次要元件,但不排除其他附加元件。 When the expression "comprises" is applied to a relationship between a primary element and other secondary elements, it must be interpreted to include or include the secondary element, but does not exclude other additional elements.

當表述“由……組成(consists)”應用於主要元件和其他次要元件之間的關係時,必須將其解釋為包括或包含所述次要元件,不包括其他附加元件。 When the expression "consists" is applied to the relationship between a primary element and other secondary elements, it must be interpreted as including or including the secondary element, excluding other additional elements.

1‧‧‧熱迴圈裝置 1‧‧‧ thermal loop device

2‧‧‧用於容納含有試劑的試管的下部的底座 2‧‧‧ Lower base for receiving test tubes containing reagents

3‧‧‧含有試劑的試管 3‧‧‧ test tubes containing reagents

4‧‧‧孔或底座的上延長部分 4‧‧‧hole or upper extension of base

5‧‧‧光學檢查埠 5‧‧‧ Optical inspection port

6‧‧‧熱電加熱器 6‧‧‧thermoelectric heater

6’、6”‧‧‧熱電Peltier元件 6 ’, 6” ‧‧‧ Thermoelectric Peltier element

7‧‧‧溫度感測器 7‧‧‧ temperature sensor

8‧‧‧加熱塊 8‧‧‧ heating block

9‧‧‧用於容納試管上部的容納埠 9‧‧‧Receiving port for receiving the upper part of the test tube

10‧‧‧試管的塞子或封閉件 10‧‧‧ Stopper or closure for test tube

本文的圖1示出了本發明的熱迴圈儀的橫截面視圖,其中容納有多個試管,其中一個被截斷和可視地進入,根據其優選的實施方式,其描述了動態加熱塊和靜態加熱塊的相對位置,以及兩者之間的分離。 FIG. 1 herein shows a cross-sectional view of a thermal loop meter of the present invention in which a plurality of test tubes are housed, one of which is truncated and visually entered, and according to its preferred embodiment, it describes a dynamic heating block and a static The relative position of the heating block, and the separation between the two.

圖2a-2b示出了本發明的熱迴圈儀的底座和孔的兩個視圖,其中詳細示出了一些主要元件。 Figures 2a-2b show two views of the base and the hole of the thermal cycler of the present invention, in which some main elements are shown in detail.

圖3示出了可以通過本發明的裝置容納的試管的一部分,其中所述試管通過塞子封閉。 Figure 3 shows a part of a test tube that can be accommodated by the device of the invention, wherein the test tube is closed by a stopper.

下文提供了本發明參考本發明基於圖1-3的優選實施方式的詳細描述,其以非限制性和說明性目的被提供。 The following provides a detailed description of the present invention with reference to the preferred embodiment of the present invention based on FIGS. 1-3, which is provided for non-limiting and illustrative purposes.

如前幾部分所述,本發明的熱迴圈裝置(1)(圖1)的目的是設想非連通的容器或底座(2)的組合靜態加熱(熱板模式)和/或動態加熱(熱迴圈儀模式),用於容納試管(3),其中每個底座(2)可選地以一體的方式熱連接或貼合到孔(4),其允許在試管(3)的下部中延伸加熱到比試劑體積佔據的更高水準。因此,由孔(4)提供的加熱使得容納在試管(3)中的樣品的溫度均勻化,從而使包含在試管(3)中的試劑和空氣之間的介面中的熱梯度最小化,並防止冷凝。 As mentioned in the previous sections, the purpose of the thermal loop device (1) (FIG. 1) of the present invention is to imagine a combined static heating (hot plate mode) and / or dynamic heating (thermal Looper mode) for accommodating test tubes (3), wherein each base (2) is optionally thermally connected or fitted to the hole (4) in an integral manner, which allows extension in the lower part of the test tube (3) Heat to a higher level than the volume occupied by the reagent. Therefore, the heating provided by the hole (4) makes the temperature of the sample contained in the test tube (3) uniform, thereby minimizing the thermal gradient in the interface between the reagent and air contained in the test tube (3), and Prevent condensation.

更詳細地,本發明的緊湊型且優選的整體式熱迴圈裝置(1)至少包括以下元件: In more detail, the compact and preferred integrated thermal loop device (1) of the present invention includes at least the following elements:

-底座(2):其包括優選的金屬結構,熱量通過其導入或匯出,分別導致由於熱傳導而使容納在其中的試管(3)的下部區域的加熱或冷卻。底座(2)還包括用於光學檢測或檢查由於加熱和冷卻而在試管(3)中發生的反應的埠(5)(圖1和2a)。為了使所述檢查更容易,底座(2)優選地具有平坦的下基部。反過來,底座(2)的上部在內部優選地 具有用於容納對應的管(3)的截頭圓錐形部分。 -Base (2): it comprises a preferred metal structure through which heat is introduced or exported, which respectively causes heating or cooling of the lower region of the test tube (3) contained therein due to heat conduction. The base (2) also includes a port (5) for optical detection or inspection of reactions occurring in the test tube (3) due to heating and cooling (Figures 1 and 2a). To make the inspection easier, the base (2) preferably has a flat lower base. In turn, the upper part of the base (2) is preferably internally There is a frusto-conical portion for receiving a corresponding tube (3).

-孔(4):其是用於容納試管(3)的元件,試管熱連接到底座(2)或者是底座(2)的一部分,並且被佈置在高於所述底座(2)的高度處。因此,孔(4)容納位於由底座(2)容納的試管部分上方的試管(3)的一部分,用作底座的延長部分。 -Hole (4): it is an element for accommodating the test tube (3), the test tube is thermally connected to the base (2) or part of the base (2), and is arranged at a height higher than the base (2) . Therefore, the hole (4) receives a part of the test tube (3) located above the test tube part received by the base (2), and serves as an extension of the base.

-熱電加熱器(6):所述加熱器(6)優選地包括兩個熱電Peltier元件(6’,6”),其彼此相對定位並且在底座(2)的每一側上,使得當向試管(3)施加熱量或從試管(3)去除熱量時獲得更好的熱對稱性。 Thermoelectric heater (6): The heater (6) preferably comprises two thermoelectric Peltier elements (6 ', 6 "), which are positioned opposite each other and on each side of the base (2) such that when A better thermal symmetry is obtained when the test tube (3) applies or removes heat from the test tube (3).

-溫度感測器(7)(圖2a和2b):優選地包括在底座(2)中並與其熱接觸,其允許監測由熱電加熱器(6)提供的功率,從而實現對試管(3)的溫度的精確控制。 -Temperature sensor (7) (Figures 2a and 2b): preferably included in and in thermal contact with the base (2), which allows monitoring of the power provided by the thermoelectric heater (6), thereby enabling the test tube (3) Precise temperature control.

-加熱塊(8):所述塊(8)佈置在所述熱迴圈裝置(1)中在底座(2)和孔(4)(如果使用)上方的上部區域中。在優選實施方式中,塊(8)連接到底座(2),但是它們必須彼此熱分離和隔離。在同一實施方式中,底座(2)和孔(4)是同一部分,儘管它們可以形成為彼此熱連通的不同部件。所述加熱塊(8)還包括至少一個容納元件(9),其配置成用於容納位於由孔(4)容納的試管(3)部分上方的試管(3)的一部分。 -Heating block (8): The block (8) is arranged in the upper area of the thermal loop device (1) above the base (2) and the hole (4) (if used). In a preferred embodiment, the blocks (8) are connected to the base (2), but they must be thermally separated and isolated from each other. In the same embodiment, the base (2) and the hole (4) are the same part, although they may be formed as different parts in thermal communication with each other. The heating block (8) also includes at least one receiving element (9) configured to receive a portion of the test tube (3) located above the portion of the test tube (3) received by the hole (4).

加熱塊(8)包括一個或多個電阻加熱裝置(例如“熱板”型裝置)和用於容納試管(3)的容納埠(9),從而與其熱接觸,使得由所述埠(9)容納的試管(3)的部分可以保持在恆定溫度,從而防止在PCR反應期間樣品在所述試管(3)的 壁上的冷凝。另外,加熱塊(8)和熱電加熱器(6)的效果的組合導致在更短時間獲得結果,以及溫度升高和降低的更快(更陡的斜坡),這是相當於提高反應效率,從而與現有技術的其它熱迴圈儀相比獲得改進的結果。 The heating block (8) includes one or more resistance heating devices (such as a "hot plate" type device) and a receiving port (9) for receiving the test tube (3) so as to be in thermal contact therewith, so that the port (9) The portion of the contained test tube (3) can be kept at a constant temperature, thereby preventing the sample from being trapped in the test tube (3) during the PCR reaction. Condensation on the wall. In addition, the combination of the effects of the heating block (8) and the thermoelectric heater (6) results in obtaining results in a shorter time, and the temperature rises and decreases more quickly (a steeper slope), which is equivalent to improving the reaction efficiency, This results in improved results compared to other thermal loop meters of the prior art.

優選地,位於所述試管(3)的上部的靜態加熱塊(8)加熱所述試管(3),在其橫向區域中溫度基本上在104℃,使得所述塊(8)不必如同現有技術的大多數熱迴圈裝置所發生的那樣降到或滑到試管(3)的上部。因此,這允許不需要自動裝置或使用者干預的更簡單的結構,並且保持試管(3)的橫向加熱提供更大的無冷凝表面(即,不冷凝),以及在所述試管(3)中更好的溫度精度和均勻性。 Preferably, the static heating block (8) located on the upper part of the test tube (3) heats the test tube (3), and the temperature in the lateral area thereof is substantially 104 ° C, so that the block (8) does not have to be as in the prior art Most of the thermal loop devices drop or slide to the upper part of the test tube (3). This therefore allows for a simpler structure that does not require robotic or user intervention, and maintains the lateral heating of the test tube (3) to provide a larger non-condensing surface (i.e. non-condensing), and in Better temperature accuracy and uniformity.

在本發明的優選實施方式中,為了提供熱迴圈裝置(1)的動態和靜態加熱方案更大的獨立性,底座(2)和加熱塊(8)被分離,使得它們彼此熱隔離。它們的分離範圍優選在0.5mm至5.0mm之間。所述分離被認為是合適的,因為試管的材料通常是塑膠的是不良的熱導體,因此熱電加熱器(6)和加熱塊(8)之間不會有熱接觸。 In a preferred embodiment of the present invention, in order to provide greater independence of the dynamic and static heating schemes of the thermal loop device (1), the base (2) and the heating block (8) are separated such that they are thermally isolated from each other. Their separation range is preferably between 0.5 mm and 5.0 mm. The separation is considered to be suitable because the material of the test tube is usually plastic and is a poor thermal conductor, so there will be no thermal contact between the thermoelectric heater (6) and the heating block (8).

反過來,根據本發明的底座(2)的配置被優化,以便最大化熱對稱性並最小化熱慣性。這使得整個底座中達到目標溫度所需的能量輸入減少,這有助於提高熱迴圈儀(1)的效率。 In turn, the configuration of the base (2) according to the invention is optimized in order to maximize thermal symmetry and minimize thermal inertia. This reduces the energy input required to reach the target temperature throughout the base, which helps improve the efficiency of the thermal loop meter (1).

在這個意義上,在本發明的優選實施方式中,底座(2)的形狀被設計成使得作為熱慣性的決定性因素的品質當到熱迴圈裝置(1)的主要焦點加熱點的距離增加時減 小,所述焦點加熱點是熱電加熱器(6)。鑒於這樣底座(2)的截面尺寸是最大的,以及由於試管(3)的上部區域之間的逐漸增大的距離而導致的可能的溫度梯度的減小,因而有利於向熱電加熱器(6)傳遞熱或從熱電加熱器(6)傳出熱。同樣地,與試管(3)接觸的中心區域的較小品質使得底座(2)的熱慣性最小化。鑒於這種佈置是對稱的,則插入到底座(2)中的試管部分中的溫度均勻性是最大的。 In this sense, in a preferred embodiment of the present invention, the shape of the base (2) is designed such that the quality as a determining factor of thermal inertia increases as the distance to the main focus heating point of the thermal loop device (1) increases Less Small, the focus heating point is a thermoelectric heater (6). In view of this, the cross-sectional size of the base (2) is the largest, and the possible temperature gradient is reduced due to the increasing distance between the upper regions of the test tubes (3), which is beneficial to the thermoelectric heater (6). ) Transfer heat or transfer heat from the thermoelectric heater (6). Likewise, the smaller mass of the central area in contact with the test tube (3) minimizes the thermal inertia of the base (2). Given that this arrangement is symmetrical, the temperature uniformity in the portion of the test tube inserted into the base (2) is maximized.

在本發明的實施方式中,在底座(2)中併入孔(4),所述孔(4)優選地具有在0.1mm至5.0mm之間的高度,這允許在試劑水準以上進行加熱,從而防止通過靠近所述水準的試管壁損失並使試劑的溫度均勻。 In an embodiment of the invention, holes (4) are incorporated in the base (2), said holes (4) preferably having a height between 0.1 mm and 5.0 mm, which allows heating above the reagent level, This prevents loss through the wall of the test tube near the level and makes the temperature of the reagent uniform.

在本發明的另一個實施方式中,溫度感測器(7)佈置在緊鄰底座(2)的對稱平面,即位於其可能最冷的區域中。這允許確保試管(3)中的最低溫度處於與每個反應的目標溫度盡可能接近的水準。或者或補充地,在本發明的另一個實施方式中,溫度感測器(7)位於與試管(3)接觸的區域中。這允許確保管中的最低溫度盡可能接近每個反應的目標溫度。 In another embodiment of the invention, the temperature sensor (7) is arranged in a plane of symmetry immediately adjacent to the base (2), i.e. in its coldest region. This allows to ensure that the minimum temperature in the test tube (3) is at a level as close as possible to the target temperature of each reaction. Alternatively or additionally, in another embodiment of the invention, the temperature sensor (7) is located in an area in contact with the test tube (3). This allows to ensure that the lowest temperature in the tube is as close as possible to the target temperature of each reaction.

提供最大熱對稱性和最小熱慣性的底座(2)的形狀以及溫度感測器(7)在對稱平面中和/或最靠近試管(3)的區域中的位置的組合,允許熱迴圈裝置(1)的優化品質,即加熱/冷卻均勻性和速率,同時將能量消耗保持在最小。 The combination of the shape of the base (2) that provides the maximum thermal symmetry and the minimum thermal inertia and the position of the temperature sensor (7) in the plane of symmetry and / or in the area closest to the test tube (3) allows a thermal loop device (1) Optimized quality, ie heating / cooling uniformity and rate, while keeping energy consumption to a minimum.

所提出的發明是可擴展的可應用於亂數量的試管(3),使得熱迴圈裝置(1)具有模組化和可複製的結構,允 許在單試管(3)和大規模反應中使用。基於這種加熱/冷卻方法或其他加熱/冷卻方法(例如油,空氣等),另外還涉及針對用於多個試管(3)設計的現有技術的裝置的其他差異。將常規設計特別地降低到單個底座,產生了沿其整個長度具有均勻部分的底座,其效率比本發明提出的效率低。將加熱/冷卻元件的分佈特別地降低到單個底座,導致試管周圍的不對稱分佈,這轉化成比本文所描述的更差的均勻性。 The proposed invention is scalable and can be applied to a random number of test tubes (3), so that the thermal loop device (1) has a modular and reproducible structure, allowing May be used in single test tubes (3) and large-scale reactions. Based on this heating / cooling method or other heating / cooling methods (e.g. oil, air, etc.), it also relates to other differences for prior art devices designed for multiple test tubes (3). Reducing the conventional design specifically to a single base produces a base with uniform sections along its entire length, which is less efficient than the efficiency proposed by the present invention. Reducing the distribution of the heating / cooling elements specifically to a single base results in an asymmetric distribution around the test tube, which translates into worse uniformity than described herein.

此外,在本發明的其它實施方式中,熱迴圈裝置(1)可以包括在試管(3)中使用塞子(10)或封閉件(圖3),其優選以柱塞形式進入直到高度基本上等於或小於所述試管(3)要容納的試劑水準以上20mm。更優選地,所述高度基本上等於或小於1mm。 Furthermore, in other embodiments of the invention, the thermal loop device (1) may include the use of a stopper (10) or a closure (Figure 3) in the test tube (3), which is preferably entered in the form of a plunger until the height is substantially It is equal to or less than 20 mm above the level of the reagent to be contained in the test tube (3). More preferably, the height is substantially equal to or less than 1 mm.

試管(3)中的塞子(10)的使用甚至提高了溫度均勻性,減少了試劑的蒸發和冷凝。所有這些還增加了PCR反應的效率,這是由於當塞子(10)進入管(3)時,所述塞子(10)被靜態加熱塊(8)縱向加熱至接近試劑的區域,從而有助於減少熱損失和冷凝。塞子(10)進一步減小了所述試管(3)內的空氣體積,從而達到與反應溫度對應的飽和壓力,將較少的液體試劑轉化為蒸氣。這使得試劑濃度的變化最小化,這是相對於現有技術的其它熱迴圈儀的額外的優點。 The use of the stopper (10) in the test tube (3) even improves the temperature uniformity and reduces the evaporation and condensation of the reagent. All these also increase the efficiency of the PCR reaction, because when the stopper (10) enters the tube (3), the stopper (10) is heated vertically by the static heating block (8) to the area close to the reagent, which helps Reduce heat loss and condensation. The plug (10) further reduces the volume of air in the test tube (3), thereby achieving a saturation pressure corresponding to the reaction temperature, and converting less liquid reagents into vapor. This minimizes the variation in reagent concentration, which is an additional advantage over other thermal loop meters of the prior art.

1‧‧‧熱迴圈裝置 1‧‧‧ thermal loop device

2‧‧‧用於容納含有試劑的試管的下部的底座 2‧‧‧ Lower base for receiving test tubes containing reagents

3‧‧‧含有試劑的試管 3‧‧‧ test tubes containing reagents

4‧‧‧孔或底座的上延長部分 4‧‧‧hole or upper extension of base

5‧‧‧光學檢查埠 5‧‧‧ Optical inspection port

6‧‧‧熱電加熱器 6‧‧‧thermoelectric heater

6’、6”‧‧‧熱電Peltier元件 6 ’, 6” ‧‧‧ Thermoelectric Peltier element

8‧‧‧加熱塊 8‧‧‧ heating block

9‧‧‧用於容納試管上部的容納埠 9‧‧‧Receiving port for receiving the upper part of the test tube

Claims (12)

一種用於加熱和冷卻至少一個用於容納試管(3)的下部的容納底座(2)的緊湊型熱迴圈裝置(1),其中所述底座(2)連接到用於加熱/冷卻所述試管(3)的下部的熱電加熱器(6);並且其中所述裝置(1)的特徵在於,所述裝置(1)還包括與底座(2)熱隔離並且佈置在底座(2)上方的上部區域中的加熱塊(8),所述加熱塊(8)包括至少一個容納埠(9)適於容納試管(3)的上部並且加熱由所述底座(2)容納的下部區域上方的所述上部;-其中所述底座(2)和所述加熱塊(8)通過熱隔離距離彼此分離,所述熱隔離距離為0.5mm至5.0mm;和-其中所述加熱塊(8)包括一個或多個電阻加熱裝置,所述電阻加熱裝置配置為將由容納埠(9)容納的試管(3)的部分保持恆定溫度,所述溫度值等於或高於容納在試管(3)中的樣品的最小冷凝抑制溫度。 A compact thermal loop device (1) for heating and cooling at least one receiving base (2) for receiving a lower portion of a test tube (3), wherein the base (2) is connected to for heating / cooling the The lower part of the test tube (3) is a thermoelectric heater (6); and the device (1) is characterized in that the device (1) further comprises a thermal insulation from the base (2) and arranged above the base (2) A heating block (8) in an upper region, said heating block (8) including at least one receiving port (9) adapted to receive an upper portion of a test tube (3) and to heat a chamber above the lower region received by said base (2) Said upper part;-wherein said base (2) and said heating block (8) are separated from each other by a thermal isolation distance, said thermal isolation distance being 0.5mm to 5.0mm; and-wherein said heating block (8) comprises a Or a plurality of resistance heating devices configured to maintain a constant temperature of a portion of the test tube (3) received by the accommodation port (9), the temperature value being equal to or higher than that of the sample contained in the test tube (3) Minimum condensation suppression temperature. 根據申請專利範圍第1項所述的緊湊型熱迴圈裝置(1),其中所述底座(2)包括用於容納試管(3)的下部的至少一部分的孔(4),其中所述孔(4)是底座(2)的集成部分,延長部分或與其熱接觸的元件,佈置在底座(2)的上部區域中,並適於將在試管(3)的所述下部中的熱電加熱器(6)的傳熱表面放大至高於所述試管(3)中容納的試劑的水準。 The compact thermal loop device (1) according to item 1 of the patent application scope, wherein the base (2) includes a hole (4) for receiving at least a portion of a lower portion of a test tube (3), wherein the hole (4) is an integrated part of the base (2), an extension or an element in thermal contact therewith, which is arranged in the upper area of the base (2) and is suitable for a thermoelectric heater to be placed in said lower part of the test tube (3) (6) The heat transfer surface is enlarged to a level higher than the reagent contained in the test tube (3). 根據申請專利範圍第2項所述的緊湊型熱迴圈裝置(1),其中所述孔(4)具有0.1mm至5.0mm的高度。 The compact thermal loop device (1) according to item 2 of the scope of patent application, wherein the hole (4) has a height of 0.1 mm to 5.0 mm. 根據申請專利範圍第1項所述的緊湊型熱迴圈裝置(1),其中所述熱電加熱器(6)包括彼此相對定位並且在底座(2)的每一側上的兩個熱電Peltier元件(6’,6”)。 The compact thermal loop device (1) according to item 1 of the patent application scope, wherein the thermoelectric heater (6) includes two thermoelectric Peltier elements positioned opposite each other and on each side of the base (2) (6 ', 6 "). 根據申請專利範圍第1項所述的緊湊型熱迴圈裝置(1),其中所述底座(2)包括埠(5),用於光學檢測或檢查由於加熱和冷卻而在試管(3)中發生的反應。 The compact thermal loop device (1) according to item 1 of the patent application scope, wherein the base (2) includes a port (5) for optical inspection or inspection in a test tube (3) due to heating and cooling The reaction occurred. 根據申請專利範圍第1項所述的緊湊型熱迴圈裝置(1),其中所述加熱塊(8)的溫度基本上為104℃。 According to the compact thermal loop device (1) according to item 1 of the patent application scope, wherein the temperature of the heating block (8) is substantially 104 ° C. 根據申請專利範圍第1項所述的緊湊型熱迴圈裝置(1),其中所述底座(2)包括溫度感測器(7),所述溫度感測器(7)與所述底座(2)熱接觸,用於控制由熱電加熱器(6)提供的功率和試管(3)的溫度。 The compact thermal loop device (1) according to item 1 of the scope of patent application, wherein the base (2) includes a temperature sensor (7), the temperature sensor (7) and the base ( 2) Thermal contact for controlling the power provided by the thermoelectric heater (6) and the temperature of the test tube (3). 根據申請專利範圍第7項所述的緊湊型熱迴圈裝置(1),其中所述溫度感測器(7)佈置在底座(2)的對稱平面上和/或在與試管(3)接觸的區域中。 The compact thermal loop device (1) according to item 7 of the scope of patent application, wherein the temperature sensor (7) is arranged on a symmetrical plane of the base (2) and / or in contact with the test tube (3) In the area. 根據申請專利範圍第1至8項任一項所述的緊湊型熱迴 圈裝置(1),包括多個用於容納試管(3)的底座(2),設置有相應的熱電加熱器(6)和加熱塊(8)。 Compact thermal return according to any of claims 1 to 8 of the patent application scope The ring device (1) includes a plurality of bases (2) for receiving test tubes (3), and is provided with corresponding thermoelectric heaters (6) and heating blocks (8). 一種包括至少一個根據申請專利範圍第1至9項任一項所述的緊湊型熱迴圈裝置(1)的系統,所述系統由容納在所述裝置(1)中包括的一個或多個底座(2)中的一個或多個試管(3)組合而產生。 A system comprising at least one compact thermal loop device (1) according to any of claims 1 to 9 of the scope of the patent application, said system comprising one or more of the devices contained in said device (1) It is produced by combining one or more test tubes (3) in the base (2). 根據申請專利範圍第10項所述的系統,其中一個或多個試管(3)包括上封閉件或塞子(10),所述上封閉件或塞子(10)進入直到基本上等於或小於所述試管(3)中容納的試劑的水準以上20mm的高度。 The system according to item 10 of the scope of patent application, wherein one or more test tubes (3) include an upper closure or stopper (10) which enters until it is substantially equal to or smaller than said A height of 20 mm above the level of the reagent contained in the test tube (3). 根據申請專利範圍第11項所述的系統,其中所述高度基本上等於或小於1mm。 The system according to item 11 of the patent application scope, wherein the height is substantially equal to or less than 1 mm.
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TWI801020B (en) * 2021-12-07 2023-05-01 財團法人工業技術研究院 Heating device for convective polymerase chain reaction
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CN114669341A (en) * 2020-12-24 2022-06-28 厦门致善生物科技股份有限公司 Reaction device and medical equipment
TWI801020B (en) * 2021-12-07 2023-05-01 財團法人工業技術研究院 Heating device for convective polymerase chain reaction
US11938485B2 (en) 2021-12-07 2024-03-26 Industrial Technology Research Institute Heating device for convective polymerase chain reaction

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