TW201712345A - Telescopic spring probe and probe card having the telescopic spring probe having a probe seat, the probe, and a circuit board - Google Patents

Telescopic spring probe and probe card having the telescopic spring probe having a probe seat, the probe, and a circuit board

Info

Publication number
TW201712345A
TW201712345A TW105126034A TW105126034A TW201712345A TW 201712345 A TW201712345 A TW 201712345A TW 105126034 A TW105126034 A TW 105126034A TW 105126034 A TW105126034 A TW 105126034A TW 201712345 A TW201712345 A TW 201712345A
Authority
TW
Taiwan
Prior art keywords
probe
circuit board
telescopic spring
spring
seat
Prior art date
Application number
TW105126034A
Other languages
English (en)
Other versions
TWI606239B (zh
Inventor
zong-yi Chen
Ting-Xin Guo
yi-long Li
Shi-xin CHEN
Hong-Chuan Sun
hong-guang Fan
Original Assignee
Mpi Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mpi Corp filed Critical Mpi Corp
Priority to US15/274,409 priority Critical patent/US10393773B2/en
Publication of TW201712345A publication Critical patent/TW201712345A/zh
Application granted granted Critical
Publication of TWI606239B publication Critical patent/TWI606239B/zh

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW105126034A 2015-09-23 2016-08-16 Sleeve spring probe and probe card with the sleeve spring probe TWI606239B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/274,409 US10393773B2 (en) 2015-09-23 2016-09-23 Spring probe and probe card having spring probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW104131496 2015-09-23

Publications (2)

Publication Number Publication Date
TW201712345A true TW201712345A (en) 2017-04-01
TWI606239B TWI606239B (zh) 2017-11-21

Family

ID=59298012

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105126034A TWI606239B (zh) 2015-09-23 2016-08-16 Sleeve spring probe and probe card with the sleeve spring probe

Country Status (1)

Country Link
TW (1) TWI606239B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112129975A (zh) * 2019-06-25 2020-12-25 中国探针股份有限公司 电连接组件
CN112394204A (zh) * 2019-08-15 2021-02-23 旺矽科技股份有限公司 可同时用于高频及中低频讯号测试的探针头
CN114252665A (zh) * 2021-11-19 2022-03-29 深圳市顺天祥电子有限公司 一种电路板微型连接器测试探针模组

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112129975A (zh) * 2019-06-25 2020-12-25 中国探针股份有限公司 电连接组件
CN112394204A (zh) * 2019-08-15 2021-02-23 旺矽科技股份有限公司 可同时用于高频及中低频讯号测试的探针头
CN112394204B (zh) * 2019-08-15 2024-04-02 旺矽科技股份有限公司 可同时用于高频及中低频讯号测试的探针头
CN114252665A (zh) * 2021-11-19 2022-03-29 深圳市顺天祥电子有限公司 一种电路板微型连接器测试探针模组
CN114252665B (zh) * 2021-11-19 2022-12-13 深圳市顺天祥电子有限公司 一种电路板微型连接器测试探针模组

Also Published As

Publication number Publication date
TWI606239B (zh) 2017-11-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees