TW201612287A - Polishing agent for tungsten, stock solution for polishing agent, and polishing method - Google Patents
Polishing agent for tungsten, stock solution for polishing agent, and polishing methodInfo
- Publication number
- TW201612287A TW201612287A TW104125619A TW104125619A TW201612287A TW 201612287 A TW201612287 A TW 201612287A TW 104125619 A TW104125619 A TW 104125619A TW 104125619 A TW104125619 A TW 104125619A TW 201612287 A TW201612287 A TW 201612287A
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing
- polishing agent
- tungsten
- stock solution
- agent
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 title abstract 2
- 229910052721 tungsten Inorganic materials 0.000 title abstract 2
- 239000010937 tungsten Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 239000011550 stock solution Substances 0.000 title 1
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 abstract 2
- 239000003795 chemical substances by application Substances 0.000 abstract 2
- 239000006061 abrasive grain Substances 0.000 abstract 1
- 239000002253 acid Substances 0.000 abstract 1
- 150000001875 compounds Chemical class 0.000 abstract 1
- 229920003169 water-soluble polymer Polymers 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
A polishing agent for tungsten, the polishing agent containing abrasive grains, hydrogen peroxide, a silicomolybdic acid compound, and a water-soluble polymer.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-161561 | 2014-08-07 | ||
JP2014161561A JP6405776B2 (en) | 2014-08-07 | 2014-08-07 | Abrasive for tungsten, stock solution for abrasive, and polishing method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201612287A true TW201612287A (en) | 2016-04-01 |
TWI670368B TWI670368B (en) | 2019-09-01 |
Family
ID=55263965
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104125619A TWI670368B (en) | 2014-08-07 | 2015-08-06 | Polishing agent for tungsten, stock solution for polishing agent, and grinding method |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP6405776B2 (en) |
TW (1) | TWI670368B (en) |
WO (1) | WO2016021708A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113993968A (en) * | 2019-06-17 | 2022-01-28 | 福吉米株式会社 | Polishing composition |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002080827A (en) * | 2000-02-09 | 2002-03-22 | Jsr Corp | Aqueous dispersion for chemical and mechanical polishing |
WO2003021651A1 (en) * | 2001-08-16 | 2003-03-13 | Asahi Kasei Chemicals Corporation | Polishing fluid for metallic film and method for producing semiconductor substrate using the same |
CN102690605B (en) * | 2009-02-16 | 2015-01-21 | 日立化成株式会社 | Polishing agent for copper polishing and polishing method using same |
KR101330956B1 (en) * | 2009-08-19 | 2013-11-18 | 히타치가세이가부시끼가이샤 | Polishing solution for cmp and polishing method |
JP6028432B2 (en) * | 2012-07-17 | 2016-11-16 | 日立化成株式会社 | Polishing liquid for CMP, storage liquid for polishing liquid for CMP, and polishing method |
-
2014
- 2014-08-07 JP JP2014161561A patent/JP6405776B2/en not_active Expired - Fee Related
-
2015
- 2015-08-06 TW TW104125619A patent/TWI670368B/en active
- 2015-08-07 WO PCT/JP2015/072451 patent/WO2016021708A1/en active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113993968A (en) * | 2019-06-17 | 2022-01-28 | 福吉米株式会社 | Polishing composition |
Also Published As
Publication number | Publication date |
---|---|
TWI670368B (en) | 2019-09-01 |
JP6405776B2 (en) | 2018-10-17 |
JP2017183297A (en) | 2017-10-05 |
WO2016021708A1 (en) | 2016-02-11 |
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