TW201607289A - Testing system and testing device - Google Patents

Abstract

A testing device configured to connect to a phone socket of a first electric device includes a first node coupled to a signal terminal of the phone socket, a second node coupled to another signal terminal of the phone socket, at least one testing module coupled to the second node, at least one switch module coupled between the first node and the at least one testing module, and a control module. The at least one testing module is configured to simulate at least one second electric device. The controlling module is configured to generate a control signal to switch connections between the phone socket and the at least one testing module. The at least one switch module is configured to conduct electrical currents between the first node and the at least one testing module according to the control signal.

Description

Test system and test device

The invention relates to a test system and a test device, in particular to a test system and a test device which are low in cost and convenient to measure.

With the boom in communication technology, many electronic devices, such as data modems or cable modems, can include several telephone interfaces. When the electronic device fails or during the manufacturing process, the repair or production line tester needs to detect the telephone interface of the electronic device to determine the operation status of the electronic device. During the test, testers used test tools instead of physical telephones. However, common test tools are fragmented, difficult to store or systematically measured, or some of the conventional test tools are cumbersome and complex, and testers cannot quickly perform basic measurements, thereby reducing test efficiency. Therefore, how to reduce the cost of test tools and improve test efficiency has become one of the goals of the industry.

Accordingly, the present invention primarily provides a test system and test apparatus to reduce cost and improve test efficiency.

The present invention discloses a test device for connecting a telephone interface of a first electronic device, comprising a first node coupled to one of the signal terminals of the telephone interface, and a second node coupled to the other of the telephone interfaces At least one test module coupled to the second node for simulating at least one second electronic device; at least one switch module coupled to the first node and the at least one test Between the test modules, the first node is connected to the at least one test module according to a control signal; and a control module is configured to generate the control signal to switch the phone interface and the at least one Test the connections between modules.

A test system includes a first electronic device including a telephone interface, and a test device including a first node coupled to one of the signal terminals of the telephone interface, and a second node coupled to the second node The other end of the telephone interface; the at least one test module is coupled to the second node for simulating at least one second electronic device; the at least one switch module is coupled to the first node and the at least one Between the test modules, the first node is connected to the at least one test module according to a control signal; and a control module is configured to generate the control signal to switch the phone interface and the at least one Test the connections between modules.

10‧‧‧Test system

11, 20, 30, 40‧‧‧ test equipment

12‧‧‧Electronic devices

SC‧‧‧ telephone interface

TIP, RING‧‧‧ signal end

110~140, 210~240‧‧‧ test module

SW1, SW2, SW3, SW3a~SW3e, SW4, SW5‧‧‧ switch module

CT‧‧‧ control module

P1, P2‧‧‧ nodes

S_ctrl‧‧‧ control signal

R1, R2, R3, R4a~R4e, R5‧‧‧ resistance

C1, C2a~C2e‧‧‧ capacitor

VM‧‧‧ voltmeter

232a~232e‧‧‧Load simulation unit

SU‧‧‧Selection unit

1 is a schematic diagram of a test system according to an embodiment of the present invention.

FIG. 2 is a schematic diagram of a test apparatus according to an embodiment of the present invention.

FIG. 3 is a schematic diagram of a test apparatus according to an embodiment of the present invention.

Figure 4 is a schematic diagram of a test apparatus according to an embodiment of the present invention.

Please refer to FIG. 1. FIG. 1 is a schematic diagram of a test system 10 according to an embodiment of the present invention. As shown in FIG. 1, the test system 10 includes a test device 11 and an electronic device 12. The electronic device 12 includes a telephone interface SC, and can be a data machine or a cable modem, etc., but not limited thereto, and can be any electronic device including a telephone interface. The telephone interface SC may be an RJ11 interface of the 4P2C specification, and has two signal terminals TIP, RING, but is not limited thereto. The testing device 11 includes test modules 110-140, switch modules SW1~SW4 and a control module CT, and nodes P1 and P2 are formed. The test modules 110~140 are respectively connected to the switch module SW1~ SW4 can be coupled to the signal terminals TIP and RING of the telephone interface SC via nodes P1 and P2, respectively. The control module CT is configured to transmit a control signal S_ctrl to the switch modules SW1 SWSW4 to switch the connection between the telephone interface SC and the test modules 110-140.

In short, the test modules 110-140 are used to simulate different electronic characteristics of an electronic device, wherein the electronic device can conform to the Public Switched Telephone Network (PSTN) communication specification and is a telephone. Therefore, by inputting the control signal S_ctrl to the switch modules SW1~SW4, the electronic device 12 can be coupled to one of the test modules 110-140, and the test modules 110-140 respectively simulate the different functions of the phone end. Electronic characteristics to test the operating conditions of the electronic device 12.

In detail, the test modules 110, 120 can respectively simulate the impedance characteristics of the telephone terminal under different national specifications, and provide a fixed impedance value or an impedance value that changes with frequency. The test module 130 can simulate the load situation of the telephone terminal in the ringing state. Wherein, since the electronic device 12 can be connected to a plurality of telephones, the test module 130 can also provide an analog function when a plurality of telephones ring to test the working condition of the electronic device 12 when a plurality of telephones are ringing. The test module 140 can be used to detect the current driving capability of the telephone interface SC of the electronic device 12.

It should be noted that those skilled in the art can appropriately adjust the test device 11 according to different system requirements. For example, please refer to FIG. 2, which is a schematic diagram of a test apparatus 20 according to an embodiment of the present invention. The structure of the test device 20 is substantially similar to that of the test device 11, except that the test modules 210-240 of the test device 20 respectively include resistors R1, R2, R3, R5, a capacitor C1, and a voltmeter VM, which are tested. The load simulation units 232a to 232e of the module 230 respectively include resistors R4a to R4e and a capacitor C2a to C2e. The test device 20 further includes a selection unit SU coupled to the load simulation unit 232a-232e via the switch modules SW3a~SW3e to switch the telephone interface SC and the load simulation unit by receiving the control signal S_ctrl. The link between 232a and 232e.

The resistance R1 of the test module 210 can provide a fixed impedance value of the electronic device 12, which can be 600 Ω according to the North American specification, but is not limited thereto, and the impedance value can also be 900 Ω to simulate the telephone of the North American rural area or other countries. Impedance characteristics. Accordingly, when the switch module SW1 is connected to the connection between the telephone interface SC and the test module 210, the test module 210 simulates the load condition of the telephone conforming to the North American specification, so that the tester can confirm whether the electronic device 12 can operate normally. On the other hand, the capacitance C1 of the test module 210 can provide an impedance value that the electronic device 12 changes with frequency, which can be an European harmonized complex impedance. For example, resistors R2, R3 can be 750Ω, 270Ω, respectively, and capacitor C1 is 270 nanofarads (nF), thus providing impedance values of 927Ω to 446Ω at operating frequencies of 200Hz to 4.6kHz. However, the present invention is not limited thereto. The resistors R2 and R3 may also be 820 Ω and 220 Ω, respectively, and the capacitor C1 is 120 Nefira (nF) to simulate the impedance characteristics of the Australian or New Zealand telephone end. Accordingly, when the switch module SW2 is connected to the connection between the telephone interface SC and the test module 220, the test module 220 simulates the load condition of the telephone conforming to the European standard, so that the tester can confirm whether the electronic device 12 can operate normally.

In addition, the load simulation units 232a-232e of the test module 230 can simulate the load situation of the plurality of telephones in the ringing state, and after the selection unit SU receives the control signal S_ctrl, the telephone interface SC can be further switched to the load simulation unit 232a. Between 232e, to adjust the Ringer Equivalence Number (REN). Resistors R4a~R4e and a capacitor C2a~C2e can be 6930Ω and 8 microfarads (μF), respectively. According to the definition of Federal Communications Commission (FCC), a 6930Ω resistor and an 8μF capacitor can be connected in series. Equivalent to the number of ringing equivalents of 1 REN, and corresponds to the load situation of a conventional telephone in the ringing state. Accordingly, when the switch modules SW3a, SW3b are connected to the load interface unit 232a, 232b, the test module 230 can simulate the load condition of the two conventional telephones in the ringing state, so that the tester can confirm the electronic device. 12 is it working properly. due to When the telephone line cannot load the telephone terminal, the service such as Caller ID or Call waiting will be abnormal. Therefore, the maximum ringing equivalent value of the single telephone line is limited to 5 REN. In this case, the test module 230 of the present invention includes five load simulation units 232a-232e, but the invention is not limited thereto, and the number of load simulation units can also be adjusted according to different telecommunication requirements. In addition, since the ringing equivalent value of the new type of telephone (such as a modem analog telephone or an external power digital telephone) is less than 1 REN, the test module 230 of the present invention can further ensure that the electronic device 12 that passes the test can support more than 5 A new type of telephone.

The test module 240 can detect the current driving capability of the telephone interface SC by the parallel resistor R5 and the voltmeter VM. In detail, when the switch module SW4 is connected to the connection between the telephone interface SC and the test module 240, the voltmeter VM can measure the voltage difference between the two ends of the resistor R5, and divide the voltage difference by the impedance value of the resistor R5. The magnitude of the current output by the telephone interface SC is known, so that the tester can confirm whether the electronic device 12 can operate normally. The output impedance value of the electronic device 12 is much larger than the impedance value of the resistor R5. Therefore, the resistor R5 hardly affects the voltage distribution of the electronic device 12, and can confirm the maximum output current value of the electronic device 12. For the convenience of calculation, the resistor R5 can be 0.1 Ω, so directly multiplying the reading value of the voltmeter VM by 10 times is the output current value, but not limited thereto.

It should be noted that the testing devices 11, 20 are embodiments of the present invention, and those skilled in the art can make various modifications, and are not limited thereto. For example, the control module CT can be controlled by the tester, and thus includes a plurality of buttons or touch panels, but the control module CT can also be automatically detected by the code. The test module is not limited to load simulation or current drive capability measurement, but can be appropriately adjusted according to different system requirements. Therefore, the test device can include more than four test modules. The switching elements SW_1~SW_4 can be mechanical switches, electronic switches such as pin diodes, single-pole single-throw (SPST) digital switches, single-pole double-throws (Single-pole Double- Throw, SPDT) digital switch, single pole multi throw (Single-pole Multi-throw, SPMT) digital switch, multi-pole multi-throw (MPMT) digital switch or switch integrated circuit, etc., but not limited to this, depending on system requirements or design considerations, moderate adjustment .

In addition, the method of controlling the switch modules SW3a to SW3e can be appropriately adjusted depending on system requirements. For example, please refer to FIG. 3, which is a schematic diagram of a test apparatus 30 according to an embodiment of the present invention. The structure of the test device 30 is substantially similar to that of the test device 20, except that the test device 30 is not provided with the selection unit SU of the test device 20, and the switch modules SW3a~SW3e directly receive the control signal S_ctrl of the control module CT. The electronic device 12 can be coupled to one of the test modules 210-240 by inputting the control signal S_ctrl to the switch modules SW1~SW4, and the test modules 210-240 respectively simulate the electronic characteristics of the telephone terminal under different functions. For example, load and current drive capability to test the operating conditions of the electronic device 12.

In addition, the implementation of the switch modules SW1 to SW4 can be appropriately adjusted depending on system requirements. For example, please refer to FIG. 4, which is a schematic diagram of a test apparatus 40 according to an embodiment of the present invention. The structure of the test device 40 is substantially similar to that of the test device 30, except that the test device 40 receives the control signal S_ctrl of the control module CT from the switch module SW5, and selectively turns on the telephone interface SC and the test module 210. ~240 link. The electronic device 12 can be coupled to one of the test modules 210-240 by inputting the control signal S_ctrl to the switch module SW5, and the test modules 210-240 respectively simulate the electronic characteristics of the phone terminal under different functions, such as Load and current drive capability to test the operating conditions of the electronic device 12.

In the prior art, when an electronic device (such as a data machine) fails or during the manufacturing process, the maintenance or production line tester needs to detect the telephone interface of the electronic device to determine the operation status of the electronic device. During the test, testers used test tools instead of physical telephones. However, some of the well-known test tools are relatively fragmented, difficult to store or systematically measured, or, Some of the well-known test tools are cumbersome and complex, and testers cannot quickly perform basic measurements, thereby reducing test efficiency.

In summary, since the test module of the present invention is composed of basic circuit components, cost can be reduced. Moreover, by operating the control module, the connection between the telephone interface and the test module can be switched, so that the test module can respectively simulate the electronic characteristics of the telephone terminal under different functions, such as load and current drive capability, and the energy measuring electronic device The state of operation. In this way, the tester can quickly confirm the operation of the electronic device and improve the test efficiency.

The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.

10‧‧‧Test system

11‧‧‧Testing device

12‧‧‧Electronic devices

SC‧‧‧ telephone interface

TIP, RING‧‧‧ signal end

110~140‧‧‧ test module

SW1, SW2, SW3, SW4‧‧‧ switch module

CT‧‧‧ control module

P1, P2‧‧‧ nodes

S_ctrl‧‧‧ control signal

Claims (16)

A test device for connecting a telephone interface of a first electronic device, comprising: a first node coupled to one of the signal terminals of the telephone interface; and a second node coupled to the other of the telephone interfaces The at least one test module is coupled to the second node for simulating at least one second electronic device; the at least one switch module is coupled between the first node and the at least one test module, The method is configured to: connect a connection between the first node and the at least one test module according to a control signal; and a control module to generate the control signal to switch between the phone interface and the at least one test module link. The test device of claim 1, wherein the telephone interface is an RJ11 interface. The test device of claim 1, wherein the first electronic device is a cable modem. The test device of claim 1, wherein the at least one second electronic device is at least one telephone that conforms to a Public Switched Telephone Network (PSTN) communication specification. The test device of claim 1, wherein a test module of the at least one test module is a resistor. The test device of claim 1, wherein a test module of the at least one test module comprises: a first resistor and a second resistor connected in series and coupled to the at least one switch module a switch module and the second node; A capacitor is connected in parallel to the second resistor. The test device of claim 1, wherein a test module of the at least one test module comprises a plurality of load simulation units, each load simulation unit comprising a resistor and a capacitor connected in series and coupled to Between the switch module of the at least one switch module and the second node. The test device of claim 1, wherein the test module of the at least one test module is a loop current measurement module, and the loop current measurement module comprises: a resistor coupled to the at least one a switch module is connected between the switch module and the second node; and a voltmeter is connected in parallel with the resistor; wherein an output impedance value of one of the first electronic devices is greater than a resistance value of the resistor, and the loop current is The measurement module provides a current measurement result according to the voltage value of the voltmeter and the impedance value. A test system includes: a first electronic device, including a telephone interface; and a test device, comprising: a first node coupled to one of the signal terminals of the telephone interface; and a second node coupled to the second node The other end of the telephone interface; the at least one test module is coupled to the second node for simulating at least one second electronic device; the at least one switch module is coupled to the first node and the at least one Between the test modules, the connection between the first node and the at least one test module is turned on according to a control signal; A control module is configured to generate the control signal to switch a connection between the telephone interface and the at least one test module. The test system of claim 1, wherein the telephone interface is an RJ11 interface. The test system of claim 1, wherein the first electronic device is a cable modem. The test system of claim 1, wherein the at least one second electronic device is at least one telephone compliant with a Public Switched Telephone Network (PSTN). The test system of claim 1, wherein a test module of the at least one test module is a resistor. The test system of claim 1, wherein a test module of the at least one test module comprises: a first resistor and a second resistor connected in series and coupled to the at least one switch module a switch module and the second node; and a capacitor connected in parallel to the second resistor. The test system of claim 1, wherein a test module of the at least one test module comprises a plurality of load simulation modules, each load simulation module comprising a resistor and a capacitor, coupled in series and coupled in a sequence Connected between the switch module of the at least one switch module and the second node. The test system of claim 1, wherein one of the at least one test module is a test module a loop current measuring module, the loop current measuring module includes: a resistor coupled between the switch module of the at least one switch module and the second node; and a voltmeter connected in parallel The resistor; wherein the output impedance value of the first electronic device is greater than the impedance value of the resistor, and the loop current measuring module provides a current measurement result according to the voltage value of the voltage meter and the impedance value.