TW201543495A - Shift register apparatus and voltage regulating device thereof - Google Patents
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本發明是有關於一種移位暫存裝置及其電壓調整裝置,且特別是有關於一種可降低漏電流的移位暫存裝置及其電壓調整裝置。 The present invention relates to a shift register device and a voltage adjusting device thereof, and more particularly to a shift register device capable of reducing leakage current and a voltage adjusting device thereof.
目前閘極驅動電路結構(gate driver on array;GOA)顯示器多由薄膜電晶體(thin film transistor;TFT)所構成。其中,閘極驅動電路結構等效上為移位暫存器。 At present, the gate driver on array (GOA) display is mostly composed of a thin film transistor (TFT). The gate driving circuit structure is equivalent to a shift register.
由於薄膜電晶體的元件特性,當薄膜電晶體的汲極與源極間受到較大偏壓VDS時,漏電流將對應增加,而可能導致閘極驅動電路結構的輸出發生異常。為了改善此現象,習知的閘極驅動電路使用雙閘薄膜電晶體(double-gate thin-film transistor)中串接的兩個薄膜電晶體來均分電路運作時可能承受的較大偏壓VDS,藉以減少漏電流。其中,這兩個薄膜電晶體的控制端彼此相連,且其中一個薄膜電晶體以其源極與另一個薄膜電晶體的汲極相連,而此連接點(以下以第三端稱之)在雙閘薄膜電晶體關 閉時為浮接。然而,由於第三端的電壓準位往往為未知,故從圖1可看出,第三端的波形F1明顯低於驅動端的波形Q1。換言之,習知的閘極驅動電路其抑制漏電流的效果仍有限。 Due to the element characteristics of the thin film transistor, when the drain and the source of the thin film transistor are subjected to a large bias voltage VDS, the leakage current will increase correspondingly, which may cause an abnormality in the output of the gate driving circuit structure. In order to improve this phenomenon, the conventional gate driving circuit uses two thin film transistors connected in series in a double-gate thin-film transistor to share a large bias VDS which may be subjected to operation of the circuit. In order to reduce leakage current. Wherein the control ends of the two thin film transistors are connected to each other, and one of the thin film transistors has its source connected to the drain of the other thin film transistor, and the connection point (hereinafter referred to as the third end) is in the double Gate thin film transistor When it is closed, it is floating. However, since the voltage level of the third terminal is often unknown, it can be seen from FIG. 1 that the waveform F1 of the third end is significantly lower than the waveform Q1 of the driving end. In other words, the conventional gate drive circuit has a limited effect of suppressing leakage current.
本發明提供一種移位暫存裝置與其電壓調整裝置,可改善漏電流的問題而具有較佳的穩定性。 The invention provides a shift temporary storage device and a voltage adjusting device thereof, which can improve the leakage current problem and have better stability.
本發明提出的移位暫存裝置包括多數個移位暫存單元,且所述移位暫存單元相互串連耦接。其中第N級的移位暫存單元包括輸出驅動電路、第一電容、上拉電路、下拉電路以及輔助下拉電路。輸出驅動電路耦接至輸出端以及驅動端,輸出驅動電路由驅動端接收驅動信號,並依據驅動信號及時序信號以產生輸出信號。第一電容耦接在輸出端以及驅動端間。上拉電路其一端耦接至驅動端,其另一端接收N-P級輸出信號。上拉電路依據上拉控制信號及N-P級輸出信號以產生驅動信號。下拉電路耦接在驅動端、輸出端以及參考接地端間,並依據下拉控制信號以穩定驅動信號及輸出信號上的電壓準位。輔助下拉電路耦接至驅動端、輸出端以及參考接地端間,依據N+Z級輸出信號以拉低驅動信號及輸出端上的電壓。其中,上拉電路、下拉電路以及輔助下拉電路的至少其中之一包括電壓調整單元,且電壓調整單元包括雙閘極薄膜電晶體、第二電容以及預充電開關。雙閘極薄膜電晶體具有第一控制端、第二控制端、第一端、第二端以及第三端,雙閘 極薄膜電晶體的第一控制端與第二控制端共同耦接至N+Z級輸出信號、下拉控制信號或上拉控制信號,雙閘極薄膜電晶體的第一端耦接至驅動端,且其第二端耦接至參考接地端或N-P級輸出信號。第二電容的第一端耦接至雙閘極薄膜電晶體的第三端,且第二電容的第二端耦接至輸出端。預充電開關的第一端接收N-P級時序信號,且其第二端耦接至雙閘極薄膜電晶體的第三端,預充電開關之控制端耦接至N-P級時序信號或上拉控制信號以導通或斷開。其中,N、P、Z為正整數且P小於N。 The shift register device of the present invention includes a plurality of shift register units, and the shift register units are coupled in series with each other. The shift register unit of the Nth stage includes an output drive circuit, a first capacitor, a pull-up circuit, a pull-down circuit, and an auxiliary pull-down circuit. The output driving circuit is coupled to the output end and the driving end, and the output driving circuit receives the driving signal from the driving end, and generates an output signal according to the driving signal and the timing signal. The first capacitor is coupled between the output end and the driving end. The pull-up circuit has one end coupled to the driving end and the other end receiving the N-P level output signal. The pull-up circuit generates a drive signal according to the pull-up control signal and the N-P stage output signal. The pull-down circuit is coupled between the driving end, the output end and the reference ground end, and is configured to stabilize the driving signal and the voltage level on the output signal according to the pull-down control signal. The auxiliary pull-down circuit is coupled between the driving end, the output end and the reference ground end, and according to the N+Z level output signal, the driving signal and the voltage on the output end are pulled down. Wherein at least one of the pull-up circuit, the pull-down circuit and the auxiliary pull-down circuit comprises a voltage adjusting unit, and the voltage adjusting unit comprises a double gate thin film transistor, a second capacitor and a precharge switch. The double gate thin film transistor has a first control end, a second control end, a first end, a second end, and a third end, and the double gate The first control end and the second control end of the ultra-thin film transistor are coupled to the N+Z-level output signal, the pull-down control signal or the pull-up control signal, and the first end of the double-gate thin film transistor is coupled to the driving end. And the second end thereof is coupled to the reference ground or the NP level output signal. The first end of the second capacitor is coupled to the third end of the dual gate thin film transistor, and the second end of the second capacitor is coupled to the output end. The first end of the pre-charge switch receives the NP-level timing signal, and the second end of the pre-charge switch is coupled to the third end of the dual-gate thin film transistor, and the control end of the pre-charge switch is coupled to the NP-level timing signal or the pull-up control signal To turn on or off. Where N, P, and Z are positive integers and P is less than N.
本發明另提出的移位暫存裝置包括多數個移位暫存單元,且所述移位暫存單元相互串連耦接。其中第N級的移位暫存單元包括輸出驅動電路、第一電容、上拉電路、下拉電路以及輔助下拉電路。輸出驅動電路耦接至輸出端以及驅動端,輸出驅動電路由驅動端接收驅動信號,並依據驅動信號及時序信號以產生輸出信號。第一電容耦接在輸出端以及驅動端間。上拉電路其一端耦接至驅動端,其另一端接收N-P級輸出信號。上拉電路依據上拉控制信號及N-P級輸出信號以產生驅動信號。下拉電路耦接在驅動端、輸出端以及參考接地端間,並依據下拉控制信號以拉低驅動信號及輸出信號上的電壓準位。輔助下拉電路耦接至驅動端、輸出端以及參考接地端間,依據N+Z級輸出信號以拉低驅動信號及輸出端上的電壓準位。其中,上拉電路、下拉電路以及輔助下拉電路的至少其中之一包括電壓調整單元,且電壓調整單元包括雙閘極薄膜電晶體以及第二電容。雙閘極薄膜電晶體具有第 一控制端、第二控制端、第一端、第二端以及第三端,雙閘極薄膜電晶體的第一控制端與第二控制端共同耦接至N+Z級輸出信號、下拉控制信號或上拉控制信號,雙閘極薄膜電晶體的第一端耦接至驅動端,且其第二端耦接至參考接地端或N-P級輸出信號。第二電容耦接在雙閘極薄膜電晶體的第一端與第三端間。其中,N、P、Z為正整數且P小於N。 The shift register device of the present invention further includes a plurality of shift register units, and the shift register units are coupled in series with each other. The shift register unit of the Nth stage includes an output drive circuit, a first capacitor, a pull-up circuit, a pull-down circuit, and an auxiliary pull-down circuit. The output driving circuit is coupled to the output end and the driving end, and the output driving circuit receives the driving signal from the driving end, and generates an output signal according to the driving signal and the timing signal. The first capacitor is coupled between the output end and the driving end. The pull-up circuit has one end coupled to the driving end and the other end receiving the N-P level output signal. The pull-up circuit generates a drive signal according to the pull-up control signal and the N-P stage output signal. The pull-down circuit is coupled between the driving end, the output end and the reference ground end, and is configured to pull down the driving signal and the voltage level on the output signal according to the pull-down control signal. The auxiliary pull-down circuit is coupled between the driving end, the output end and the reference ground end, and according to the N+Z level output signal, the driving signal and the voltage level on the output end are pulled down. Wherein at least one of the pull-up circuit, the pull-down circuit and the auxiliary pull-down circuit comprises a voltage adjustment unit, and the voltage adjustment unit comprises a double gate thin film transistor and a second capacitance. Double gate thin film transistor has the first a control terminal, a second control terminal, a first terminal, a second terminal and a third terminal, the first control terminal and the second control terminal of the dual gate thin film transistor are coupled to the N+Z level output signal and the pull-down control The signal or the pull-up control signal, the first end of the double-gate thin film transistor is coupled to the driving end, and the second end thereof is coupled to the reference ground or the NP-level output signal. The second capacitor is coupled between the first end and the third end of the dual gate thin film transistor. Where N, P, and Z are positive integers and P is less than N.
本發明提出的電壓調整裝置適用於整合型閘極驅動電路的移位暫存單元。對應第N級移位暫存單元的電壓調整裝置包括雙閘極薄膜電晶體、電容以及預充電開關。雙閘極薄膜電晶體具有第一控制端、第二控制端、第一端、第二端以及第三端。雙閘極薄膜電晶體的第一控制端與第二控制端共同耦接至N+Z級輸出信號、下拉控制信號或上拉控制信號。雙閘極薄膜電晶體的第一端耦接至驅動端以下拉或產生驅動信號,且其第二端耦接至參考接地端或N-P級輸出信號。電容的第一端耦接至雙閘極薄膜電晶體的第三端,電容的第二端耦接至輸出端以產生輸出信號。預充電開關其第一端接收N-P級時序信號,且其第二端耦接至雙閘極薄膜電晶體的第三端,預充電開關之控制端耦接至預充電控制信號或N-P級時序信號。其中,N、P、Z為正整數且P小於N。 The voltage adjusting device proposed by the present invention is suitable for a shift register unit of an integrated gate driving circuit. The voltage adjusting device corresponding to the Nth stage shift register unit includes a double gate thin film transistor, a capacitor, and a precharge switch. The dual gate thin film transistor has a first control end, a second control end, a first end, a second end, and a third end. The first control end and the second control end of the dual gate thin film transistor are coupled to the N+Z stage output signal, the pull-down control signal or the pull-up control signal. The first end of the double gate thin film transistor is coupled to the driving end to pull or generate a driving signal, and the second end thereof is coupled to the reference ground or the N-P stage output signal. The first end of the capacitor is coupled to the third end of the dual gate thin film transistor, and the second end of the capacitor is coupled to the output end to generate an output signal. The first end of the precharge switch receives the NP level timing signal, and the second end thereof is coupled to the third end of the double gate thin film transistor, and the control end of the precharge switch is coupled to the precharge control signal or the NP level timing signal . Where N, P, and Z are positive integers and P is less than N.
本發明另提出的電壓調整裝置適用於整合型閘極驅動電路的移位暫存單元。對應第N級移位暫存單元的電壓調整裝置包括雙閘極薄膜電晶體以及電容。雙閘極薄膜電晶體具有第一控制端、第二控制端、第一端、第二端以及第三端,雙閘極薄膜電晶 體的第一控制端與第二控制端共同耦接至N+Z級輸出信號、下拉控制信號或一上拉控制信號,雙閘極薄膜電晶體的第一端耦接至驅動端,且其第二端耦接至參考接地端或N-P級輸出信號。電容耦接在雙閘極薄膜電晶體的第一端與第三端間。其中,N、P、Z為正整數且P小於N。 The voltage adjusting device proposed by the present invention is suitable for the shift register unit of the integrated gate driving circuit. The voltage adjusting device corresponding to the Nth stage shift register unit includes a double gate thin film transistor and a capacitor. The double gate thin film transistor has a first control end, a second control end, a first end, a second end and a third end, and the double gate thin film electro-crystal The first control end of the body and the second control end are coupled to the N+Z stage output signal, the pull-down control signal or a pull-up control signal, and the first end of the double gate thin film transistor is coupled to the driving end, and The second end is coupled to the reference ground or the NP stage output signal. The capacitor is coupled between the first end and the third end of the double gate thin film transistor. Where N, P, and Z are positive integers and P is less than N.
基於上述,本發明實施例所提出的移位暫存裝置與電壓調整裝置利用預充電開關以及電容耦合效應,以調整雙閘極薄膜電晶體其第三端的電壓準位至接近於驅動端的電壓準位,可改善移位暫存裝置漏電流的問題,實現較佳的穩定性。 Based on the above, the shift register device and the voltage adjusting device proposed by the embodiments of the present invention use a precharge switch and a capacitive coupling effect to adjust the voltage level of the third terminal of the double gate thin film transistor to a voltage level close to the driving end. The bit can improve the leakage current of the shift register and achieve better stability.
為讓本案的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。 In order to make the above features and advantages of the present invention more comprehensible, the following embodiments are described in detail with reference to the accompanying drawings.
200、600、700、800‧‧‧移位暫存單元 200, 600, 700, 800‧‧‧ shift register unit
210、610、710、810‧‧‧輸出驅動電路 210, 610, 710, 810‧‧‧ output drive circuit
220、620、720、820‧‧‧上拉電路 220, 620, 720, 820‧‧‧ pull-up circuits
230、630、730、830‧‧‧下拉電路 230, 630, 730, 830‧‧‧ pulldown circuits
240、640、740、840‧‧‧輔助下拉電路 240, 640, 740, 840‧‧‧Auxiliary pull-down circuit
250、650、750、850‧‧‧下拉控制電路 250, 650, 750, 850‧‧‧ pull-down control circuit
260‧‧‧上拉控制電路 260‧‧‧ Pull-up control circuit
660_1、660_2、760_1、760_2、860_1、860_2、620_1、620_2‧‧‧電路 660_1, 660_2, 760_1, 760_2, 860_1, 860_2, 620_1, 620_2‧‧‧ circuits
300、400、500‧‧‧電壓調整單元 300, 400, 500‧‧‧ voltage adjustment unit
310、410、510、622、742、832‧‧‧雙閘極薄膜電晶體 310, 410, 510, 622, 742, 832‧‧‧ double gate thin film transistors
C、Cx‧‧‧電容 C, Cx‧‧‧ capacitor
CT1、CT2‧‧‧控制端 CT1, CT2‧‧‧ control terminal
F‧‧‧第三端 F‧‧‧ third end
F1、F2、Q1、Q2‧‧‧波形 F1, F2, Q1, Q2‧‧‧ waveform
G‧‧‧輸出端 G‧‧‧ output
G(n)、G(n-p)、G(n-2)、G(n+4)、G(n+z)‧‧‧輸出信號 G(n), G(n-p), G(n-2), G(n+4), G(n+z)‧‧‧ output signals
HC(n)、HC(n-p)、HC(n-2)‧‧‧時序信號 HC(n), HC(n-p), HC(n-2)‧‧‧ timing signals
K(n)‧‧‧下拉控制信號 K(n)‧‧‧ pulldown control signal
LC‧‧‧低頻時脈信號 LC‧‧‧Low-frequency clock signal
M1~M3、M11、M21、M31~M32、M41~M42、M51~M54、M61、M62‧‧‧電晶體 M1~M3, M11, M21, M31~M32, M41~M42, M51~M54, M61, M62‧‧‧O crystal
Q‧‧‧驅動端 Q‧‧‧Driver
Q(n)、Q(n-p)、Q(n-2)‧‧‧驅動信號 Q(n), Q(n-p), Q(n-2)‧‧‧ drive signals
ST(n)‧‧‧上拉控制信號 ST(n)‧‧‧ pull-up control signal
SWx‧‧‧預充電開關 SWx‧‧‧Precharge switch
VSS‧‧‧參考接地端 VSS‧‧‧reference ground
圖1是習知移位暫存單元的波形圖。 1 is a waveform diagram of a conventional shift register unit.
圖2是依照本發明一實施例所繪示的移位暫存單元的方塊示意圖。 FIG. 2 is a block diagram of a shift register unit according to an embodiment of the invention.
圖3是依照本發明一實施例所繪示的電壓調整裝置的電路圖。 FIG. 3 is a circuit diagram of a voltage adjustment device according to an embodiment of the invention.
圖4是依照本發明一實施例所繪示的電壓調整裝置的電路圖。 4 is a circuit diagram of a voltage regulating device according to an embodiment of the invention.
圖5是依照本發明一實施例所繪示的電壓調整裝置的電路 圖。 FIG. 5 is a circuit diagram of a voltage adjusting device according to an embodiment of the invention Figure.
圖6是依照本發明一實施例所繪示的移位暫存單元的電路圖。 FIG. 6 is a circuit diagram of a shift register unit according to an embodiment of the invention.
圖7是依照本發明一實施例所繪示的移位暫存單元的電路圖。 FIG. 7 is a circuit diagram of a shift register unit according to an embodiment of the invention.
圖8是依照本發明一實施例所繪示的移位暫存單元的電路圖。 FIG. 8 is a circuit diagram of a shift register unit according to an embodiment of the invention.
圖9是本發明實施例的移位暫存單元的波形圖。 Figure 9 is a waveform diagram of a shift register unit in accordance with an embodiment of the present invention.
本發明實施例所提出的移位暫存裝置包括相互串連耦接的多個移位暫存單元。請參照圖2,圖2是依照本發明一實施例所繪示的移位暫存裝置中的第N級的移位暫存單元200的方塊圖。移位暫存單元200包括輸出驅動電路210、電容C、上拉電路220、下拉電路230以及輔助下拉電路240。其中,輸出驅動電路210耦接至輸出端G以及驅動端Q。輸出驅動電路由驅動端Q接收驅動信號Q(n),並依據驅動信號Q(n)及時序信號HC(n)以決定輸出端G上的電壓準位,而產生輸出信號G(n)。 The shift register device provided by the embodiment of the invention comprises a plurality of shift register units coupled in series with each other. Referring to FIG. 2, FIG. 2 is a block diagram of an Nth stage shift register unit 200 in a shift register device according to an embodiment of the invention. The shift register unit 200 includes an output drive circuit 210, a capacitor C, a pull-up circuit 220, a pull-down circuit 230, and an auxiliary pull-down circuit 240. The output driving circuit 210 is coupled to the output terminal G and the driving terminal Q. The output driving circuit receives the driving signal Q(n) from the driving terminal Q, and generates an output signal G(n) according to the driving signal Q(n) and the timing signal HC(n) to determine the voltage level on the output terminal G.
電容C耦接在輸出端G以及驅動端Q間。上拉電路220的一端耦接至驅動端Q,而其另一端接收N-P級輸出信號G(n-p)。上拉電路220依據上拉控制信號ST(n)及N-P級輸出信號G(n-p)以決定驅動端Q的電壓準位,而產生驅動信號Q(n)。 The capacitor C is coupled between the output terminal G and the driving terminal Q. One end of the pull-up circuit 220 is coupled to the driving terminal Q, and the other end thereof receives the N-P-level output signal G(n-p). The pull-up circuit 220 generates a driving signal Q(n) according to the pull-up control signal ST(n) and the N-P stage output signal G(n-p) to determine the voltage level of the driving terminal Q.
下拉電路230耦接在驅動端Q、輸出端G以及參考接地端VSS間,並依據下拉控制信號K(n)以拉低驅動端Q及輸出端G的電壓準位。輔助下拉電路240耦接至驅動端Q、輸出端G以及參考接地端VSS間,並依據N+Z級輸出信號G(n+z)以拉低驅動端Q及輸出端G上的電壓。 The pull-down circuit 230 is coupled between the driving terminal Q, the output terminal G and the reference ground terminal VSS, and pulls down the voltage level of the driving terminal Q and the output terminal G according to the pull-down control signal K(n). The auxiliary pull-down circuit 240 is coupled between the driving terminal Q, the output terminal G and the reference ground terminal VSS, and drives the voltage on the driving terminal Q and the output terminal G according to the N+Z-level output signal G(n+z).
另外,移位暫存單元200還可包括下拉控制電路250以及上拉控制電路260。詳細來說,下拉控制電路250耦接至驅動端Q,並接收低頻時脈信號LC,下拉控制電路250依據低頻時脈信號LC以及驅動信號Q(n)以產生下拉控制信號K(n),從而控制下拉單元230的作動。至於上拉控制電路260則接收N-P級時序信號HC(n-p)及N-P級驅動信號Q(n-p),並依據N-P級驅動信號Q(n-p)以提供N-P級時序信號HC(n-p)以作為上拉控制信號ST(n),藉以控制上拉電路220的電路運作。 In addition, the shift register unit 200 may further include a pull-down control circuit 250 and a pull-up control circuit 260. In detail, the pull-down control circuit 250 is coupled to the driving terminal Q and receives the low-frequency clock signal LC. The pull-down control circuit 250 generates the pull-down control signal K(n) according to the low-frequency clock signal LC and the driving signal Q(n). Thereby, the actuation of the pull-down unit 230 is controlled. The pull-up control circuit 260 receives the NP-level timing signal HC(np) and the NP-level driving signal Q(np), and provides the NP-level timing signal HC(np) as a pull-up according to the NP-level driving signal Q(np). The signal ST(n) is controlled to control the circuit operation of the pull-up circuit 220.
需說明的是,移位暫存單元200在其上拉電路220、下拉電路230以及輔助下拉電路240的至少其中之一還可包括電壓調整單元。在此以圖3至圖5的電壓調整單元300、400、500進行說明,且電壓調整單元300、400、500中的任一可用作上述上拉電路220、下拉電路230或輔助下拉電路240中的至少其中之一的電壓調整單元,藉以改善移位暫存單元發生漏電流現象的問題。需說明的是,在以下實施例中,上述的N-P級將以N-2級為例,且N+Z級將以N+4級為例進行說明,然本發明並不限於此。 It should be noted that the shift register unit 200 may further include a voltage adjustment unit at least one of the pull-up circuit 220, the pull-down circuit 230, and the auxiliary pull-down circuit 240. Here, the voltage adjustment units 300, 400, and 500 of FIGS. 3 to 5 will be described, and any of the voltage adjustment units 300, 400, and 500 may be used as the pull-up circuit 220, the pull-down circuit 230, or the auxiliary pull-down circuit 240 described above. The voltage adjusting unit of at least one of the electrodes improves the leakage current phenomenon of the shift register unit. It should be noted that, in the following embodiments, the above-mentioned N-P level will be exemplified by the N-2 level, and the N+Z level will be described by taking the N+4 level as an example, but the present invention is not limited thereto.
圖3是本發明一實施例的電壓調整單元300的電路圖, 並可包括雙閘極薄膜電晶體310、電容Cx以及預充電開關SWx。其中,雙閘極薄膜電晶體310包括電晶體M1及M2,電晶體M1及M2並分別具有控制端CT1與CT2,且控制端CT1與CT2可共同耦接至N+4級輸出信號G(n+4)、下拉控制信號K(n)或上拉控制信號ST(n)。雙閘極薄膜電晶體310的第一端耦接至驅動端Q以下拉或產生驅動信號Q(n),且其第二端耦接至參考接地端VSS或N-2級輸出信號G(n-2),且電晶體M1的第二端耦接至電晶體M2的第一端並作為雙閘極薄膜電晶體的第三端F。在此實施例中,預充電開關SWx包括電晶體M3,且電晶體M3的第一端接收N-2級時序信號HC(n-2),電晶體M3的控制端接收預充電控制信號或耦接至上拉控制信號ST(n),電晶體M3的第二端則耦接至雙閘極薄膜電晶體310的第三端F。在本實施例中,預充電開關SWx以上拉控制信號ST(n)作為預充電控制信號,並依據上拉控制信號ST(n)以導通或斷開。當上拉控制信號ST(n)為高電壓準位而使預充電開關SWx導通時,N-2級時序信號HC(n-2)將對雙閘極薄膜電晶體310的第三端F進行充電。之後,上拉控制信號ST(n)轉為低電壓準位,且輸出信號G(n)轉為高電壓準位,使第三端F的電壓準位藉由電容Cx而被抬升至接近於輸出端G的電壓準位,或甚至高於輸出端G的電壓準位。藉此,可有效降低驅動端Q與第三端F之間的電壓差,亦即可使電晶體M1的汲極與源極間的電壓差可有效被降低(例如接近0伏特(V)),藉以減少漏電流的產生。 3 is a circuit diagram of a voltage adjustment unit 300 according to an embodiment of the present invention. It may include a dual gate thin film transistor 310, a capacitor Cx, and a precharge switch SWx. The double gate thin film transistor 310 includes transistors M1 and M2, and the transistors M1 and M2 have control terminals CT1 and CT2, respectively, and the control terminals CT1 and CT2 can be coupled to the N+4 output signal G(n). +4), pull-down control signal K(n) or pull-up control signal ST(n). The first end of the dual gate thin film transistor 310 is coupled to the driving terminal Q to pull or generate the driving signal Q(n), and the second end thereof is coupled to the reference ground VSS or the N-2 output signal G(n). -2), and the second end of the transistor M1 is coupled to the first end of the transistor M2 and serves as the third end F of the double gate thin film transistor. In this embodiment, the precharge switch SWx includes a transistor M3, and the first end of the transistor M3 receives the N-2 stage timing signal HC(n-2), and the control end of the transistor M3 receives the precharge control signal or coupled Connected to the pull-up control signal ST(n), the second end of the transistor M3 is coupled to the third terminal F of the dual-gate thin film transistor 310. In the present embodiment, the precharge switch SWx pulls up the control signal ST(n) as a precharge control signal and turns on or off according to the pull up control signal ST(n). When the pull-up control signal ST(n) is at a high voltage level and the precharge switch SWx is turned on, the N-2 stage timing signal HC(n-2) will be performed on the third terminal F of the double gate thin film transistor 310. Charging. After that, the pull-up control signal ST(n) is turned to the low voltage level, and the output signal G(n) is turned to the high voltage level, so that the voltage level of the third terminal F is raised to be close to the capacitor Cx. The voltage level of the output terminal G, or even higher than the voltage level of the output terminal G. Thereby, the voltage difference between the driving terminal Q and the third terminal F can be effectively reduced, and the voltage difference between the drain and the source of the transistor M1 can be effectively reduced (for example, close to 0 volt (V)). In order to reduce the generation of leakage current.
圖4繪示出本發明另一實施例的電壓調整單元400的電 路圖。電壓調整單元400包括雙閘極薄膜電晶體410、電容Cx以及預充電開關SWx,雙閘極薄膜電晶體410包括電晶體M1及M2。與圖3的電壓調整單元300不同的是,電壓調整單元400的預充電開關SWx中,電晶體M3的控制端耦接至其第一端,並共同耦接至N-2級時序信號HC(n-2)。因此,當N-2級時序信號HC(n-2)為高電壓準位時,可使預充電開關SWx導通,並同時以N-2級時序信號HC(n-2)對雙閘極薄膜電晶體410的第三端F進行充電,而達到類似前述實施例的效果而減少漏電流。 FIG. 4 illustrates the power of the voltage adjustment unit 400 according to another embodiment of the present invention. Road map. The voltage adjustment unit 400 includes a dual gate thin film transistor 410, a capacitor Cx, and a precharge switch SWx, and the double gate thin film transistor 410 includes transistors M1 and M2. Different from the voltage adjustment unit 300 of FIG. 3, in the pre-charge switch SWx of the voltage adjustment unit 400, the control end of the transistor M3 is coupled to the first end thereof and is commonly coupled to the N-2 timing signal HC ( N-2). Therefore, when the N-2 stage timing signal HC(n-2) is at a high voltage level, the precharge switch SWx can be turned on, and at the same time, the N-2 level timing signal HC(n-2) is applied to the double gate film. The third end F of the transistor 410 is charged to achieve an effect similar to the foregoing embodiment to reduce leakage current.
圖5繪示出本發明另一實施例的電壓調整單元500的電路圖。電壓調整單元500包括雙閘極薄膜電晶體510以及電容Cx,且雙閘極薄膜電晶體510包括電晶體M1及M2。與圖3的電壓調整單元300不同的是,圖5的電壓調整單元500將電容Cx耦接於驅動端Q與第三端F之間,使驅動端Q的電壓準位變化可以透過電容Cx而直接耦合至第三端F,故此實施例的電壓調整單元500也可實現降低驅動端Q與第三端F之間的電壓差,從而改善漏電流現象發生的問題。需說明的是,當考量寄生電容效應時,此實施例中第三端F的電壓準位可能較驅動端Q的電壓準位低。然而,即使受寄生電容影響,電容Cx仍可有效減少驅動端Q與第三端F之間的電壓差,從而減少漏電流產生。 FIG. 5 is a circuit diagram of a voltage adjustment unit 500 according to another embodiment of the present invention. The voltage adjustment unit 500 includes a dual gate thin film transistor 510 and a capacitor Cx, and the double gate thin film transistor 510 includes transistors M1 and M2. Different from the voltage adjustment unit 300 of FIG. 3 , the voltage adjustment unit 500 of FIG. 5 couples the capacitor Cx between the driving terminal Q and the third terminal F, so that the voltage level change of the driving terminal Q can pass through the capacitor Cx. Directly coupled to the third terminal F, the voltage adjustment unit 500 of this embodiment can also achieve a reduction in the voltage difference between the driving terminal Q and the third terminal F, thereby improving the problem of leakage current. It should be noted that when considering the parasitic capacitance effect, the voltage level of the third terminal F in this embodiment may be lower than the voltage level of the driving terminal Q. However, even if it is affected by the parasitic capacitance, the capacitor Cx can effectively reduce the voltage difference between the driving terminal Q and the third terminal F, thereby reducing leakage current generation.
藉此,利用上述實施例的電壓調整單元中的預充電開關SWx對雙閘極薄膜電晶體的第三端F進行充電,並利用電容Cx的耦合效應抬升第三端F的電壓準位,可將第三端F的電壓準位 調整至接近於驅動端Q,有效改善移位暫存單元200中漏電流現象發生的問題。 Thereby, the third terminal F of the double gate thin film transistor is charged by the precharge switch SWx in the voltage adjusting unit of the above embodiment, and the voltage level of the third terminal F is raised by the coupling effect of the capacitor Cx. The voltage level of the third terminal F Adjusting to be close to the driving terminal Q effectively improves the problem of the leakage current phenomenon in the shift register unit 200.
接著以電壓調整單元300的電路架構為例,並各舉實施例以說明將電壓調整單元300應用至移位暫存單元200的上拉電路220、下拉電路230以及輔助下拉電路240中的情況。 Next, the circuit architecture of the voltage adjustment unit 300 is taken as an example, and the embodiments are used to explain the case where the voltage adjustment unit 300 is applied to the pull-up circuit 220, the pull-down circuit 230, and the auxiliary pull-down circuit 240 of the shift temporary storage unit 200.
圖6是依照本發明一實施例所繪示的移位暫存單元600的電路圖。其中,移位暫存單元600包括輸出驅動電路610、電容C、上拉電路620、下拉電路630、輔助下拉電路640、下拉控制電路650以及由電路660_1以及660_2所構成的上拉控制電路。輸出驅動電路610包括電晶體M11,電晶體M11依據其控制端所接收的驅動信號Q(n),並利用其第一端所接收的時序信號HC(n),以決定輸出端G上的電壓準位,而產生輸出信號G(n)。電容C則耦接在輸出端G以及驅動端Q間。 FIG. 6 is a circuit diagram of a shift register unit 600 according to an embodiment of the invention. The shift register unit 600 includes an output drive circuit 610, a capacitor C, a pull-up circuit 620, a pull-down circuit 630, an auxiliary pull-down circuit 640, a pull-down control circuit 650, and a pull-up control circuit formed by the circuits 660_1 and 660_2. The output driving circuit 610 includes a transistor M11. The transistor M11 determines the voltage at the output terminal G according to the driving signal Q(n) received by the control terminal thereof and the timing signal HC(n) received by the first terminal thereof. The level is generated to produce an output signal G(n). The capacitor C is coupled between the output terminal G and the driving terminal Q.
下拉電路630包括電晶體M31及M32。電晶體M31的第一端耦接至輸出端G,且其控制端接收下拉控制信號K(n),其第二端則耦接至參考接地端VSS,藉以在下拉控制信號K(n)為高電壓準位時使電晶體M31導通,而將輸出端G的電壓準位下拉至參考接地端VSS的電壓準位。相類似地,電晶體M32的第一端耦接至該驅動端Q,且其控制端接收下拉控制信號K(n),其第二端則耦接至參考接地端VSS,藉以在下拉控制信號K(n)為高電壓準位時使電晶體M32導通,而將驅動端Q的電壓準位下拉至參考接地端VSS的電壓準位。 The pull-down circuit 630 includes transistors M31 and M32. The first end of the transistor M31 is coupled to the output terminal G, and the control terminal thereof receives the pull-down control signal K(n), and the second end thereof is coupled to the reference ground terminal VSS, so that the pull-down control signal K(n) is When the high voltage level is high, the transistor M31 is turned on, and the voltage level of the output terminal G is pulled down to the voltage level of the reference ground VSS. Similarly, the first end of the transistor M32 is coupled to the driving terminal Q, and the control end thereof receives the pull-down control signal K(n), and the second end thereof is coupled to the reference ground terminal VSS, thereby pulling down the control signal. When K(n) is at a high voltage level, the transistor M32 is turned on, and the voltage level of the driving terminal Q is pulled down to the voltage level of the reference ground VSS.
輔助下拉電路640包括電晶體M41及M42。電晶體M41的第一端耦接至驅動端Q,其控制端接收N+4級輸出信號G(n+4),且其第二端耦接至參考接地端VSS,藉以在N+4級輸出信號G(n+4)為高電壓準位時使電晶體M41導通,而將驅動端Q的電壓準位下拉至參考接地端VSS的電壓準位。相類似地,電晶體M42的第一端耦接至輸出端G,其控制端接收N+4級輸出信號G(n+4),且其第二端耦接至參考接地端VSS,藉以在N+4級輸出信號G(n+4)為高電壓準位時使電晶體M42導通,而將輸出端G的電壓準位下拉至參考接地端VSS的電壓準位。 The auxiliary pull-down circuit 640 includes transistors M41 and M42. The first end of the transistor M41 is coupled to the driving terminal Q, and the control terminal receives the N+4 output signal G(n+4), and the second end thereof is coupled to the reference ground VSS, thereby being at the N+4 level. When the output signal G(n+4) is at the high voltage level, the transistor M41 is turned on, and the voltage level of the driving terminal Q is pulled down to the voltage level of the reference ground VSS. Similarly, the first end of the transistor M42 is coupled to the output terminal G, the control terminal receives the N+4 output signal G(n+4), and the second end thereof is coupled to the reference ground VSS, thereby When the N+4 output signal G(n+4) is at the high voltage level, the transistor M42 is turned on, and the voltage level of the output terminal G is pulled down to the voltage level of the reference ground VSS.
下拉控制電路650包括電晶體M51~M54。其中,電晶體M51的第一端及控制端接收低頻時脈信號LC。電晶體M52的第一端耦接至電晶體M51的第二端,電晶體M52的控制端耦接至驅動端Q,且其第二端耦接至參考接地端VSS。電晶體M53的第一端接收低頻時脈信號LC,其控制端耦接至電晶體M51的第二端,且電晶體M53的第二端產生下拉控制信號K(n)。電晶體M54的第一端耦接至電晶體M53的第二端,電晶體M54的控制端耦接至驅動端Q,且其第二端耦接至參考接地端VSS。藉此,下拉控制電路650所產生的下拉控制信號K(n)可用以控制下拉電路630以拉低驅動端Q及輸出端G上的電壓準位。 The pull-down control circuit 650 includes transistors M51-M54. The first end and the control end of the transistor M51 receive the low frequency clock signal LC. The first end of the transistor M52 is coupled to the second end of the transistor M51, the control end of the transistor M52 is coupled to the driving terminal Q, and the second end thereof is coupled to the reference ground VSS. The first end of the transistor M53 receives the low frequency clock signal LC, the control end of which is coupled to the second end of the transistor M51, and the second end of the transistor M53 generates the pull-down control signal K(n). The first end of the transistor M54 is coupled to the second end of the transistor M53, the control end of the transistor M54 is coupled to the driving terminal Q, and the second end thereof is coupled to the reference ground VSS. Thereby, the pull-down control signal K(n) generated by the pull-down control circuit 650 can be used to control the pull-down circuit 630 to pull down the voltage levels on the driving terminal Q and the output terminal G.
上拉控制電路由電路660_1以及660_2所構成。上拉控制電路包括電晶體M61以及M62。電晶體M61的第一端接收前級時序信號(如:N-2級時序信號HC(n-2)),其控制端接收前級驅 動信號(如:N-2級驅動信號Q(n-2)),而其第二端產生上拉控制信號ST(n),以控制上拉電路620以拉高驅動信號Q(n)的電壓準位。電晶體M62的第一端耦接至電晶體M61的第二端,電晶體M62的第二端耦接至參考接地端GND,電晶體M62的控制端則接收下拉控制信號K(n)。其中,電晶體M62依據下拉控制信號K(n)來拉低上拉控制信號ST(n)的電壓值。 The pull-up control circuit is composed of circuits 660_1 and 660_2. The pull-up control circuit includes transistors M61 and M62. The first end of the transistor M61 receives the pre-stage timing signal (eg, the N-2 timing signal HC(n-2)), and the control terminal receives the pre-driver a dynamic signal (eg, N-2 stage drive signal Q(n-2)), and a second end thereof generates a pull-up control signal ST(n) to control the pull-up circuit 620 to pull up the drive signal Q(n) Voltage level. The first end of the transistor M62 is coupled to the second end of the transistor M61, the second end of the transistor M62 is coupled to the reference ground GND, and the control end of the transistor M62 receives the pull-down control signal K(n). The transistor M62 pulls down the voltage value of the pull-up control signal ST(n) according to the pull-down control signal K(n).
需說明的是,本實施例的上拉電路620由電路620_1以及620_2所構成。上拉電路620包括電壓調整單元,且此電壓調整單元是以圖3中電壓調整單元300的電路架構來實現,並包括雙閘極薄膜電晶體622的電晶體M1與M2、電容Cx以及預充電開關SWx的電晶體M3。其中,雙閘極薄膜電晶體622的控制端CT1與CT2共同耦接至上拉控制信號ST(n),且雙閘極薄膜電晶體622的第一端耦接至驅動端Q,其第二端則耦接至N-2級輸出信號G(n-2)。另外,電容Cx的第一端耦接至雙閘極薄膜電晶體622的第三端F,電容Cx的第二端則耦接至輸出端G。預充電開關SWx的第一端接收N-2級時序信號HC(n-2),其第二端耦接至雙閘極薄膜電晶體622的第三端F。預充電開關SWx並依據上拉控制信號ST(n)以導通或斷開,且在其為導通時以第一端接收的N-2級時序信號HC(n-2)對第三端F充電。之後,當上拉控制信號ST(n)轉為低電壓準位且輸出信號G(n)轉為高電壓準位時,藉由電容Cx的耦合效應,第三端F的電壓準位可被抬升至接近於輸出端G的電壓準位,藉此,驅動端Q與第三端F之間的電壓差大幅降低,可改 善漏電流現象的問題。 It should be noted that the pull-up circuit 620 of this embodiment is composed of circuits 620_1 and 620_2. The pull-up circuit 620 includes a voltage adjustment unit, and the voltage adjustment unit is implemented by the circuit architecture of the voltage adjustment unit 300 of FIG. 3, and includes the transistors M1 and M2 of the double gate thin film transistor 622, the capacitor Cx, and the precharge. The transistor M3 of the switch SWx. The control terminals CT1 and CT2 of the dual gate thin film transistor 622 are coupled to the pull-up control signal ST(n), and the first end of the dual-gate thin film transistor 622 is coupled to the driving terminal Q, and the second end thereof Then coupled to the N-2 level output signal G(n-2). In addition, the first end of the capacitor Cx is coupled to the third end F of the dual gate thin film transistor 622, and the second end of the capacitor Cx is coupled to the output end G. The first end of the precharge switch SWx receives the N-2 stage timing signal HC(n-2), and the second end thereof is coupled to the third end F of the double gate thin film transistor 622. The precharge switch SWx is turned on or off according to the pull-up control signal ST(n), and charges the third terminal F with the N-2 timing signal HC(n-2) received at the first end when it is turned on. . After that, when the pull-up control signal ST(n) is turned to the low voltage level and the output signal G(n) is turned to the high voltage level, the voltage level of the third terminal F can be Raised to a voltage level close to the output terminal G, whereby the voltage difference between the driving terminal Q and the third terminal F is greatly reduced, and can be changed The problem of good leakage current.
圖7是依照本發明另一實施例所繪示的移位暫存單元700的電路圖。其中,移位暫存單元700包括輸出驅動電路710、電容C、上拉電路720、下拉電路730、輔助下拉電路740、下拉控制電路750以及由電路760_1以及760_2所構成的上拉控制電路。與圖6的移位暫存單元600不同的是,本實施例是將圖3中電壓調整單元300的電路架構應用於輔助下拉電路740中。此電壓調整單元包括雙閘極薄膜電晶體742的電晶體M1與M2、電容Cx以及預充電開關SWx的電晶體M3。其中,雙閘極薄膜電晶體742的控制端CT1與CT2共同耦接至N+4級輸出信號G(n+4),其第一端耦接至驅動端Q,其第二端耦接至參考接地端VSS。類似地,此實施例透過輔助下拉電路740中的電壓調整單元調整第三端F的電壓準位,可大幅降低驅動端Q與第三端F之間的電壓差,改善漏電流的問題。 FIG. 7 is a circuit diagram of a shift register unit 700 according to another embodiment of the invention. The shift register unit 700 includes an output drive circuit 710, a capacitor C, a pull-up circuit 720, a pull-down circuit 730, an auxiliary pull-down circuit 740, a pull-down control circuit 750, and a pull-up control circuit composed of the circuits 760_1 and 760_2. Different from the shift register unit 600 of FIG. 6, the present embodiment applies the circuit architecture of the voltage adjusting unit 300 of FIG. 3 to the auxiliary pull-down circuit 740. The voltage adjustment unit includes transistors M1 and M2 of the double gate thin film transistor 742, a capacitor Cx, and a transistor M3 of the precharge switch SWx. The control terminal CT1 and the CT2 of the dual gate thin film transistor 742 are coupled to the N+4 output signal G(n+4), the first end of which is coupled to the driving end Q, and the second end of the double gate transistor 742 is coupled to the driving end Q. Refer to ground VSS. Similarly, this embodiment adjusts the voltage level of the third terminal F through the voltage adjusting unit in the auxiliary pull-down circuit 740, so that the voltage difference between the driving terminal Q and the third terminal F can be greatly reduced, and the problem of leakage current is improved.
另外,本實施例的上拉電路720包括電晶體M21,且電晶體M21的一端耦接至驅動端Q,其另一端接收N-2級輸出信號G(n-2)。上拉電路720依據上拉控制信號ST(n)及N-2級輸出信號G(n-2)以決定驅動端Q的電壓準位,而產生驅動信號Q(n)。 In addition, the pull-up circuit 720 of the present embodiment includes a transistor M21, and one end of the transistor M21 is coupled to the driving terminal Q, and the other end thereof receives the N-2-level output signal G(n-2). The pull-up circuit 720 generates a driving signal Q(n) according to the pull-up control signal ST(n) and the N-2-level output signal G(n-2) to determine the voltage level of the driving terminal Q.
圖8是依照本發明另一實施例所繪示的移位暫存單元800的電路圖。其中,移位暫存單元800包括輸出驅動電路810、電容C、上拉電路820、穩壓電路830、輔助下拉電路840、下拉控制電路850以及由電路860_1及860_2構成的上拉控制電路。 與圖6的移位暫存單元600不同的是,本實施例是將圖3中電壓調整單元300的電路架構應用於下拉電路830中。此電壓調整單元包括雙閘極薄膜電晶體832的電晶體M1與M2、電容Cx以及預充電開關SWx的電晶體M3。其中,雙閘極薄膜電晶體832的控制端CT1與CT2共同耦接至下拉控制信號K(n),其第一端耦接至驅動端Q,而其第二端則耦接至參考接地端VSS。類似地,此實施例透過下拉電路830中的電壓調整單元調整第三端F的電壓準位,可大幅降低驅動端Q與第三端F之間的電壓差,藉以改善漏電流的產生。 FIG. 8 is a circuit diagram of a shift register unit 800 according to another embodiment of the invention. The shift register unit 800 includes an output drive circuit 810, a capacitor C, a pull-up circuit 820, a voltage stabilization circuit 830, an auxiliary pull-down circuit 840, a pull-down control circuit 850, and a pull-up control circuit composed of the circuits 860_1 and 860_2. Different from the shift register unit 600 of FIG. 6, the present embodiment applies the circuit architecture of the voltage adjusting unit 300 of FIG. 3 to the pull-down circuit 830. The voltage adjustment unit includes transistors M1 and M2 of the double gate thin film transistor 832, a capacitor Cx, and a transistor M3 of the precharge switch SWx. The control terminals CT1 and CT2 of the dual gate thin film transistor 832 are coupled to the pull-down control signal K(n), the first end of which is coupled to the driving terminal Q, and the second end of the double gate transistor 832 is coupled to the reference ground. VSS. Similarly, this embodiment adjusts the voltage level of the third terminal F through the voltage adjusting unit in the pull-down circuit 830, and the voltage difference between the driving terminal Q and the third terminal F can be greatly reduced, thereby improving the generation of leakage current.
藉此,應用本發明實施例者可依其需求而將電壓調整單元用作移位暫存單元中的上拉電路、輔助下拉電路以及下拉電路的至少其中之一的電壓調整單元,如此一來,可藉由調整第三端F的電壓準位而大幅降低驅動端Q與第三端F之間的電壓差,改善漏電流的問題。 Therefore, the voltage adjustment unit can be used as a voltage adjustment unit of at least one of a pull-up circuit, an auxiliary pull-down circuit, and a pull-down circuit in the shift temporary storage unit according to an embodiment of the present invention. By adjusting the voltage level of the third terminal F, the voltage difference between the driving terminal Q and the third terminal F can be greatly reduced, and the problem of leakage current can be improved.
需強調的是,圖4與圖5所提出之電壓調整單元400、500也可參照上述方式而分別應用於上拉電路、輔助下拉電路以及下拉電路至少其一之中,並亦能達到類似於上述改善漏電流的效果。 It should be emphasized that the voltage adjusting units 400 and 500 proposed in FIG. 4 and FIG. 5 can also be applied to at least one of the pull-up circuit, the auxiliary pull-down circuit, and the pull-down circuit, respectively, with reference to the above manner, and can also be similar. The above effect of improving leakage current.
圖9是本發明實施例的移位暫存裝置的第三端F與驅動端Q的波形圖。相對於圖1,圖9中第三端F的波形F2與低於驅動端Q的波形Q2的電壓差可明顯獲得抑制。換言之,本發明實施例的移位暫存裝置能夠有效降低漏電流。 FIG. 9 is a waveform diagram of the third terminal F and the driving terminal Q of the shift register device according to the embodiment of the present invention. With respect to FIG. 1, the voltage difference between the waveform F2 of the third terminal F and the waveform Q2 of the driving terminal Q in FIG. 9 can be remarkably suppressed. In other words, the shift register device of the embodiment of the present invention can effectively reduce leakage current.
綜上所述,本發明實施例所提出的移位暫存裝置與電壓 調整單元利用預充電開關以及電容耦合效應,以調整雙閘極薄膜電晶體其第三端的電壓準位至接近於驅動端的電壓準位,可改善移位暫存裝置漏電流的問題,實現較佳的穩定性。 In summary, the shift register device and the voltage proposed by the embodiment of the present invention The adjusting unit utilizes a pre-charging switch and a capacitive coupling effect to adjust the voltage level of the third terminal of the double-gate thin-film transistor to a voltage level close to the driving end, thereby improving the leakage current of the temporary storage device and achieving better Stability.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention, and any one of ordinary skill in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of the invention is defined by the scope of the appended claims.
200‧‧‧移位暫存單元 200‧‧‧Shift register unit
210‧‧‧輸出驅動電路 210‧‧‧Output drive circuit
220‧‧‧上拉電路 220‧‧‧ Pull-up circuit
230‧‧‧下拉電路 230‧‧‧ Pulldown circuit
240‧‧‧輔助下拉電路 240‧‧‧Auxiliary pull-down circuit
250‧‧‧下拉控制電路 250‧‧‧ Pull-down control circuit
260‧‧‧上拉控制電路 260‧‧‧ Pull-up control circuit
C‧‧‧電容 C‧‧‧ capacitor
G‧‧‧輸出端 G‧‧‧ output
G(n)、G(n-p)、G(n+z)‧‧‧輸出信號 G(n), G(n-p), G(n+z)‧‧‧ output signals
HC(n)、HC(n-p)‧‧‧時序信號 HC(n), HC(n-p)‧‧‧ timing signals
K(n)‧‧‧下拉控制信號 K(n)‧‧‧ pulldown control signal
LC‧‧‧低頻時脈信號 LC‧‧‧Low-frequency clock signal
Q‧‧‧驅動端 Q‧‧‧Driver
Q(n)、Q(n-p)‧‧‧驅動信號 Q(n), Q(n-p)‧‧‧ drive signals
ST(n)‧‧‧上拉控制信號 ST(n)‧‧‧ pull-up control signal
VSS‧‧‧參考接地端 VSS‧‧‧reference ground
Claims (11)
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TWI562114B (en) * | 2015-12-30 | 2016-12-11 | Au Optronics Corp | Shift register and shift register circuit |
TWI738567B (en) * | 2020-11-18 | 2021-09-01 | 友達光電股份有限公司 | Display panel testing circuit |
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