TW201516158A - Tin-silver-copper-bismuth alloy solder ball - Google Patents

Tin-silver-copper-bismuth alloy solder ball Download PDF

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TW201516158A
TW201516158A TW103117528A TW103117528A TW201516158A TW 201516158 A TW201516158 A TW 201516158A TW 103117528 A TW103117528 A TW 103117528A TW 103117528 A TW103117528 A TW 103117528A TW 201516158 A TW201516158 A TW 201516158A
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Shu-Qiu Huang
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Pro Material Technology Co Ltd
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Abstract

A composition of tin-silver-copper-bismuth alloy solder ball is disclosed, wherein the content of silver (Ag) is 0.3-4wt%, the content of copper (Cu) is 0.3-1wt%, the content of bismuth (Bi) is 2000 ± 500ppm, in addition to the above disclosures, the remaining content being tin (Sn). As such, the Sn-Ag-Cu alloy added by an appropriate amount of Bi can improve wettability, refine the grains, and increase the mechanical strength of the alloy, so as to improve the thermal cycling test capability for applications in products of high fatigue strength.

Description

錫-銀-銅-鉍合金錫球 Tin-silver-copper-bismuth alloy solder ball

本發明係與合金錫球有關,特別是指一種錫-銀-銅-鉍合金錫球之組成物。 The invention relates to alloy tin balls, in particular to a composition of tin-silver-copper-bismuth alloy tin balls.

近年來,因環境問題及歐盟的危害物質限制指令(Restriction of Hazardous Substances Directive,簡稱RoHS)等,無鉛合金焊料開始被廣泛地開發及實用化,作為無鉛焊料合金,有以錫為主要成分的錫-銀系、錫-銅系、錫-銀-銅系、錫-銻系、錫-鉍系、錫-鋅系,以及以這些為基礎再添加其他元素者,這些含金系也將因其各具有長處短處而被利用在不同之用途上。 In recent years, lead-free alloy solders have been widely developed and put into practical use due to environmental problems and the European Union's Restriction of Hazardous Substances Directive (RoHS). As lead-free solder alloys, there are tins containing tin as a main component. - silver, tin-copper, tin-silver-copper, tin-antimony, tin-antimony, tin-zinc, and other elements based on these, these gold-containing systems will also be Each has its own strengths and weaknesses and is used for different purposes.

在上述無鉛合金焊料中,尤以錫-銀-銅合金焊料在濕潤性與強度之間最能達到平衡,然而,在錫-銀-銅合金焊料中含有銀,因銀之價格昂貴,故添加過多的銀將導致成本增加,而此將有礙錫-銀-銅合金焊料之普及,若為顧及成本而減少銀之含量,其抗疲勞性將隨著其含量減少而降低,甚至引起連接不良之問題。 Among the above lead-free alloy solders, tin-silver-copper alloy solders are most balanced between wettability and strength. However, silver is contained in tin-silver-copper alloy solder, which is expensive because of the high price of silver. Excessive silver will lead to an increase in cost, which will hinder the popularity of tin-silver-copper alloy solder. If the silver content is reduced in consideration of cost, the fatigue resistance will decrease as its content decreases, and even cause poor connection. The problem.

為克服上述之問題,金村陽司於台灣第I383052號發明專利所揭露一種低銀合金焊料,係由銀含量0.05~2.0wt%、銅含量1.0wt%以下、銻含量3.0wt%以下、鉍含量2.0wt%以下、銦含量4.0wt%以下、鎳含量0.2wt%以下、鍺含量0.1wt%以下、鈷含量0.5wt%以下(其中前述銅、銻、鉍、 銦、鎳、鍺、鈷之含量皆不為0),以及剩餘部分的錫所構成,其中更強調鉍的含量若超過2.0wt%時,合金焊料將變得硬脆,以造成合金強度劣化,藉此以提供降低銀含量而達到抑制成本且具良好延展性、強度之合金焊料。 In order to overcome the above problems, Jincun Yangsi disclosed a low-silver alloy solder in the invention patent No. I383052 of Taiwan, which has a silver content of 0.05 to 2.0 wt%, a copper content of 1.0 wt% or less, a niobium content of 3.0 wt% or less, and a niobium content of 2.0. Below wt%, indium content 4.0 wt% or less, nickel content 0.2 wt% or less, niobium content 0.1 wt% or less, cobalt content 0.5 wt% or less (wherein the aforementioned copper, bismuth, bismuth, The content of indium, nickel, bismuth, and cobalt is not 0), and the remaining part of tin is formed. When the content of bismuth exceeds 2.0% by weight, the alloy solder will become hard and brittle to cause deterioration of the alloy strength. Thereby, an alloy solder having a reduced ductility and strength and a high ductility and strength can be provided.

然而,金村陽司所教示之合金焊料不僅需添加較 多種類之金屬方能克服低銀所帶來熱循環測試不佳、抗疲勞性以及低強度等問題,又有鉍含量超過2.0wt%將會使合金焊料變硬變脆之限制,因而有待改進。 However, the alloy solder taught by Jin Cunyang Division not only needs to be added A variety of metals can overcome the problems of poor thermal cycle test, fatigue resistance and low strength caused by low silver, and the content of bismuth exceeding 2.0wt% will make the alloy solder hard and brittle, so it needs to be improved. .

本發明之主要目的在於提供一種錫-銀-銅-鉍合金錫球,其不僅能細化晶粒,更能改善合金機械強度而增加熱循環測試能力,以適用於高疲勞強度之產品上。 The main object of the present invention is to provide a tin-silver-copper-bismuth alloy tin ball which not only refines the crystal grains, but also improves the mechanical strength of the alloy and increases the thermal cycle test capability, and is suitable for products with high fatigue strength.

為了達成上述之目的,本發明之一種錫-銀-銅-鉍合金錫球之組成物,其包含有銀(Ag),該銀之含量係於0.3~4.0wt%;銅(Cu),該銅之含量係於0.3~1.0wt%;鉍(Bi),該鉍之含量係於2000±500ppm;以及錫(Sn),上述所揭剩餘之含量。 In order to achieve the above object, a composition of a tin-silver-copper-bismuth alloy solder ball of the present invention comprises silver (Ag), the content of the silver being 0.3 to 4.0 wt%; copper (Cu), The content of copper is 0.3 to 1.0 wt%; bismuth (Bi), the content of the lanthanum is 2000 ± 500 ppm; and tin (Sn), the remaining content disclosed above.

其中更包含有鎳(Ni),該鎳之含量係於0.05~0.1wt%。 Further, it further contains nickel (Ni), and the content of the nickel is 0.05 to 0.1% by weight.

本發明另揭露一種錫-銀-銅-鉍合金錫球,係由前述該組成物所形成者。 The present invention further discloses a tin-silver-copper-bismuth alloy solder ball which is formed by the aforementioned composition.

其中該錫球之直徑為100~890μm。 The diameter of the solder ball is 100-890 μm.

藉此,本發明之錫-銀-銅-鎳合金錫球及其組成物 具有下列之功效: Thereby, the tin-silver-copper-nickel alloy solder ball of the present invention and the composition thereof Has the following effects:

1.具有抑制介面合金化合物(Inter-Metallic Compound)厚度之成長,並增加其剪切強度,進而提高錫球可承受熱循環測試之能力。 1. It has the growth of the thickness of the Inter-Metallic Compound and increases the shear strength, thereby improving the ability of the solder ball to withstand the thermal cycle test.

2.在添加2000±500ppm之Bi時能有效地提高合金焊料之濕潤性,並且可得到較為細化及均勻之晶粒尺寸。 2. When adding 2000±500ppm of Bi, the wettability of the alloy solder can be effectively improved, and a finer and uniform grain size can be obtained.

為使 貴審查委員能進一步了解本發明之構成、特徵及其目的,以下乃舉本發明之若干實施例,並配合圖式詳細說明如後,同時讓熟悉該技術領域者能夠具體實施,惟以下所述者,僅係為了說明本發明之技術內容及特徵而提供之一實施方式,凡為本發明領域中具有一般通常知識者,於了解本發明之技術內容及特徵之後,以不違背本發明之精神下,所為之種種簡單之修飾、替換或構件之減省,皆應屬於本發明意圖保護之範疇。 The following is a description of the embodiments of the present invention, and the following detailed description of the embodiments of the present invention, The present invention is provided for the purpose of illustrating the technical contents and features of the present invention. Those having ordinary general knowledge in the field of the present invention, after understanding the technical contents and features of the present invention, do not contradict the present invention. In the spirit of the invention, all modifications, substitutions, or limitations of the components are intended to be within the scope of the invention.

第1圖為本發明一較佳實施例所提供之錫-銀-銅-鉍合金錫球的對比圖,主要顯示添加Bi元素對熱循環測試之影響。 1 is a comparison diagram of tin-silver-copper-bismuth alloy solder balls provided by a preferred embodiment of the present invention, mainly showing the effect of adding Bi element on thermal cycle test.

第2圖為本發明該較佳實施例所提供之錫-銀-銅-鉍合金錫球的曲線圖,主要顯示添加不同含量之Bi的濕潤性變化。 Fig. 2 is a graph showing the tin-silver-copper-bismuth alloy solder balls provided by the preferred embodiment of the present invention, mainly showing the change in wettability of Bi with different contents.

第3圖為本發明該較佳實施例所提供之錫-銀-銅-鉍合金錫球的曲線圖,主要顯示添加不同含量之Bi對介面合金化合物層之影響。 Fig. 3 is a graph showing the tin-silver-copper-bismuth alloy solder balls provided by the preferred embodiment of the present invention, mainly showing the effect of adding different contents of Bi on the interface alloy compound layer.

第4圖類同第3圖,主要顯示本發明之錫-銀-銅-鉍合金錫 球在經過多次回流焊(reflow)後,其介面合金化合物層之變化。 Figure 4 is similar to Figure 3, mainly showing the tin-silver-copper-bismuth alloy tin of the present invention. The ball undergoes a change in the interface alloy compound layer after repeated reflow.

第5圖為本發明該較佳實施例所提供之錫-銀-銅-鉍合金錫球的曲線圖,主要顯示添加不同含量之Bi對剪切強度之影響 Figure 5 is a graph showing the tin-silver-copper-bismuth alloy tin ball provided by the preferred embodiment of the present invention, mainly showing the effect of adding different contents of Bi on the shear strength.

第6圖類同第5圖,主要顯示本發明之錫-銀-銅-鉍合金錫球在經過多次回流焊(reflow)後,其剪切強度之變化。 Fig. 6 is a view similar to Fig. 5, mainly showing changes in the shear strength of the tin-silver-copper-bismuth alloy solder balls of the present invention after repeated reflow.

第7圖類同第1圖,主要顯示添加Ni元素對熱循環測試之影響。 Figure 7 is similar to Figure 1, which mainly shows the effect of adding Ni element on the thermal cycle test.

為了詳細說明本發明之結構、特徵及功效所在, 茲列舉一較佳實施例並配合下列圖式說明如後,其中:本發明該較佳實施例所提供之一種錫-銀-銅-鉍合金錫球之組成物,其包含有銀(Ag)之含量係於0.3~4.0wt%,銅(Cu)之含量係於0.3~1.0wt%,鉍(Bi)之含量係於2000±500ppm,以及錫(Sn)為上述所揭剩餘之含量。 In order to explain in detail the structure, features and effects of the present invention, DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of the present invention will be described with reference to the following drawings, wherein: a composition of a tin-silver-copper-bismuth alloy tin ball provided by the preferred embodiment of the present invention, comprising silver (Ag) The content is in the range of 0.3 to 4.0% by weight, the content of copper (Cu) is 0.3 to 1.0% by weight, the content of bismuth (Bi) is 2000 ± 500 ppm, and the content of tin (Sn) is the remaining content disclosed above.

在熱循環測試的部分,如第1圖所示,在其他元 素含量相同之條件下,Ag含量4wt%的錫球之失效比率顯然優於Ag含量1wt%的錫球,但Ag含量高將使得低韌性之錫球與基板間的介面合金化合物層(IMC)容易形成斷裂之情況,以導致高銀含量之錫球的掉球機率高於低銀含量之錫球,因此,本發明為克服前述之缺陷則分別於Ag含量1wt%與Ag含量4wt%的合金錫球中分別添加Bi含量2000±500ppm。由第1圖中可看出Ag含量1wt%之合金錫球在添加Bi含量2000±500ppm後,其合金錫球可承受熱循環測試之能力明顯提升,甚 至趨近於Ag含量4wt%的合金錫球,雖耐熱循環測試的數據仍略低於Ag含量4wt%之合金錫球,但Ag含量1wt%添加Bi含量2000±500ppm的合金錫球在成本上係遠低於Ag含量4wt%的合金錫球。 In the part of the thermal cycle test, as shown in Figure 1, in other elements Under the same conditions of the same content, the failure rate of the tin ball with Ag content of 4wt% is obviously better than that of the tin ball with Ag content of 1wt%, but the high content of Ag will make the interface alloy compound layer (IMC) between the low-toughness solder ball and the substrate. It is easy to form a fracture, so that the ball of high silver content has a higher ball drop probability than the low silver content of the tin ball. Therefore, the present invention is an alloy having an Ag content of 1 wt% and an Ag content of 4 wt%, respectively, to overcome the aforementioned drawbacks. A Bi content of 2000 ± 500 ppm was added to the solder balls. It can be seen from Fig. 1 that after the addition of Bi content of 2000±500ppm, the alloy tin ball with Ag content of 1wt% can obviously withstand the thermal cycle test ability. To the alloy tin ball which is close to the Ag content of 4wt%, although the data of the heat cycle test is still slightly lower than the alloy tin ball with the Ag content of 4wt%, the Ag content is 1wt%, and the alloy tin ball with the Bi content of 2000±500ppm is added in cost. It is much lower than the alloy tin ball with an Ag content of 4 wt%.

本發明為驗證Bi含量於2000±500ppm係為最佳 值,故於相同的Sn-1.0wt%Ag-0.5wt%Cu合金錫球條件下添加不同含量的Bi元素,並分別進行濕潤性分析(Wetting)、顯微組織分析、抑制IMC厚度成長分析以及剪切強度分析。 The invention is the best for verifying that the Bi content is 2000±500ppm. Value, so different content of Bi element was added under the same Sn-1.0wt% Ag-0.5wt% Cu alloy tin ball, and Wetting analysis, microstructure analysis, inhibition of IMC thickness growth analysis and Shear strength analysis.

在濕潤性的部分,合金錫球之濕潤性係指一種液 態金屬於一固體表面鋪展之能力(即為潤濕值),對於合金錫球而言,能否與基板形成良好的濕潤性即為能否完成焊接之關鍵。如第2圖所示,隨著Bi含量由0ppm增加至2000ppm,合金錫球的潤濕值由66.7上升至77.2,當Bi含量超過2000ppm至3000ppm時,合金錫球的潤濕值反而呈現下降之趨勢,如數據顯示為77.2下降至74.1,由實驗中可得出在Sn-1.0wt%Ag-0.5wt%Cu合金錫球條件下添加含量2000ppm的Bi元素可得到最佳的濕潤性。 In the wet part, the wettability of the alloy tin ball refers to a liquid The ability of the metal to spread on a solid surface (ie, the wetting value), for the alloy tin ball, whether it can form a good wettability with the substrate is the key to whether the welding can be completed. As shown in Fig. 2, as the Bi content increases from 0 ppm to 2000 ppm, the wetting value of the alloy tin ball increases from 66.7 to 77.2. When the Bi content exceeds 2000 ppm to 3000 ppm, the wetting value of the alloy tin ball decreases. The trend, as shown by the data, is 77.2 down to 74.1. It can be concluded from the experiment that the addition of 2000 ppm of Bi element under Sn-1.0 wt% Ag-0.5 wt% Cu alloy tin ball can obtain the best wettability.

前述合金錫球未添加Bi元素之 Sn-1.0wt%Ag-0.5wt%Cu組織的Sn晶粒主要呈胞狀分布,且晶粒尺寸較大,當前述合金錫球添加含量1000ppm的Bi元素之時,Sn晶粒大部分係以枝晶狀分布,且具有一定的方向性,直至前述合金錫球添加含量2000ppm的Bi元素,其晶粒尺寸 變得較為細化且分布均勻;然而,當前述合金錫球添加含量3000ppm的Bi元素,其組織的Sn晶粒反而轉變成粗化。綜上所陳,Sn-Ag-Cu合金錫球添加適量的Bi不僅可使其晶粒細化及均勻化,尤其在添加含量2000ppm的Bi更是可讓其合金強度得以最佳化。 The aforementioned alloy tin ball is not added with Bi element The Sn grain of Sn-1.0wt%Ag-0.5wt%Cu is mainly cell-like and has a large grain size. When the above-mentioned alloy tin ball is added with 1000 ppm of Bi element, most of the Sn grain is Dendritic distribution, and has a certain directionality, until the aforementioned alloy tin ball is added with 2000 ppm of Bi element, its grain size It becomes finer and evenly distributed; however, when the aforementioned alloy tin ball is added with a Bi element having a content of 3000 ppm, the Sn crystal grains of the structure are instead converted into coarsening. In summary, the addition of an appropriate amount of Bi to the Sn-Ag-Cu alloy tin ball not only makes the grain refinement and homogenization, especially in the addition of 2000 ppm of Bi, which can optimize the alloy strength.

在抑制介面合金化合物(IMC)厚度成長的部分請 參閱第3圖,於Sn-1.0wt%Ag-0.5wt%Cu合金錫球條件下添加不同含量的Bi元素,其IMC厚度將隨著Bi元素含量的增加而逐漸降低,如Bi含量為0ppm時,IMC厚度的平均值約為11μm,而Bi含量為2000ppm時可得到IMC厚度之平均值約為7.6μm,其說明添加Bi元素確實能有效地抑制IMC厚度之成長,但是當Bi含量超過2000ppm時,IMC厚度將隨著Bi含量的增加而逐漸增厚。此外,合金錫球通常應用於電子產品中將經過多道的回流焊製程,而本發明考慮其重要性,故針對Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi合金錫球進行5次的回流焊測試,如第4圖所示,未添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球與添加含量2000ppm Bi的Sn-1.0wt%Ag-0.5wt%Cu合金錫球之IMC厚度係都隨著回流焊的次數增加而遞增,在此值得一提的是,本發明之Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi合金錫球在經多次回流焊後,其增加之速率相較於以往未添加Bi元素係緩慢許多,而此也說明了添加適當的Bi元素係能有效抑制IMC厚度之成 長。 In the part where the thickness of the interface alloy compound (IMC) is suppressed, please Referring to Fig. 3, different amounts of Bi elements are added under the condition of Sn-1.0wt%Ag-0.5wt%Cu alloy tin balls, and the IMC thickness will gradually decrease with the increase of Bi content, such as when the Bi content is 0ppm. The average thickness of the IMC is about 11 μm, and the average value of the IMC thickness is about 7.6 μm when the Bi content is 2000 ppm, which indicates that the addition of the Bi element can effectively suppress the growth of the IMC thickness, but when the Bi content exceeds 2000 ppm. The thickness of the IMC will gradually increase as the Bi content increases. In addition, alloy solder balls are generally used in electronic products and will undergo a multi-pass reflow process, and the present invention considers its importance, so 5 times for Sn-1.0 wt% Ag-0.5 wt% Cu-2000 ppm Bi alloy solder balls. Reflow soldering test, as shown in Fig. 4, Sn-1.0wt%Ag-0.5wt%Cu alloy tin balls without addition of Bi element and Sn-1.0wt% Ag-0.5wt% Cu alloy tin added with 2000ppm Bi The IMC thickness of the ball increases with the number of reflow soldering. It is worth mentioning that the Sn-1.0wt% Ag-0.5wt% Cu-2000ppm Bi alloy solder ball of the present invention is repeatedly reflowed. After that, the rate of increase is much slower than that of the conventional Bi element system, which also shows that the addition of an appropriate Bi element system can effectively suppress the thickness of the IMC. long.

在剪切強度的部分,本發明係以Nondson公司所 生產的多功能焊接強度檢測儀(型號為Dage series 4000)來進行剪切強度之檢測,請參閱第5圖及表一所示,未添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球之剪切強度為22.46MPa,其數值係低於其他有添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球,尤其是當Sn-1.0wt%Ag-0.5wt%Cu合金錫球所添加的Bi含量越多時,其剪切強度則逐漸增加,再進一步來看,添加含量1000ppm~2000ppm的Bi,其剪切強度的增加速率較為緩慢,當添加Bi的含量超過2000ppm時,其剪切強度則有大幅的增加,如添加Bi含量為2750ppm時之剪切強度為44.07Mpa,但根據表一延伸率之數值來看,Sn-1.0wt%Ag-0.5wt%Cu合金錫球添加Bi含量2750ppm之延伸率反而下降至僅有0.6%,其代表添加過多的Bi元素將導致韌性大幅降低,綜合來看剪切強度及延伸率之數據,Sn-1.0wt%Ag-0.5wt%Cu合金錫球添加Bi含量2000±500ppm時,其剪切強度分別為34.62MPa、35.31MPa、42.3MPa,而延伸率分別為6.6%、8.1%、6.4%,尤以添加Bi含量2000ppm可得較高的剪切強度及具有良好的塑性。 In the part of shear strength, the present invention is based on Nondson Corporation. The multi-function welding strength tester (model Dage series 4000) is used to test the shear strength. Please refer to Figure 5 and Table 1. Sn-1.0wt%Ag-0.5wt%Cu without Bi element The shear strength of the alloy tin ball is 22.46 MPa, which is lower than that of other Sn-1.0 wt% Ag-0.5 wt% Cu alloy tin balls with added Bi element, especially when Sn-1.0 wt% Ag-0.5 wt%. When the content of Bi added to the Cu alloy tin ball is increased, the shear strength is gradually increased. Further, when Bi is added at a content of 1000 ppm to 2000 ppm, the rate of increase of shear strength is slow, and when the content of Bi is more than At 2000 ppm, the shear strength is greatly increased. For example, when the addition of Bi content is 2750 ppm, the shear strength is 44.07 MPa, but according to the value of Table 1 elongation, Sn-1.0 wt% Ag-0.5 wt% Cu. The elongation of the alloy tin ball with the addition of Bi content of 2750ppm decreased to only 0.6%, which means that the addition of too much Bi element will lead to a significant reduction in toughness. In general, the shear strength and elongation data, Sn-1.0wt% Ag- When 0.5wt% Cu alloy tin balls are added with a Bi content of 2000±500ppm, the shear strength is 34.62MPa, 35.31MPa, 42.3M, respectively. Pa, and the elongation are 6.6%, 8.1%, and 6.4%, respectively, especially when the addition of Bi content of 2000 ppm can obtain higher shear strength and good plasticity.

在硬度(Hardness)試驗的部分,本發明係以 FUTURE TECH公司所生產的微硬度計(型號為FM-100e)來進行硬度之檢測,其結果請參閱表二所示,未添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球之硬度為14.2Hv,此數值係低於其他有添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球,而此試驗結果與前述拉伸試驗的結果相似,當Sn-1.0wt%Ag-0.5wt%Cu合金錫球所添加的Bi含量越多時,其硬度則逐漸增加,而此係有助於提升錫球於熱循環測試的能力;然而,當Sn-1.0wt%Ag-0.5wt%Cu合金錫球添加Bi含量超過2000ppm時,其延伸率反而逐漸下降,如表二中Bi含量由2000ppm增加至2750ppm,其延伸率反而從8.1%下降至僅剩0.6%。綜觀前述硬度及延伸率之數據,Sn-1.0wt%Ag-0.5wt%Cu合金錫球添加Bi含量2000±500ppm時可得較佳的硬度及延伸率,如硬度分別為15.1Hv、15.4Hv、16.3Hv,而延伸率分別為6.6%、8.1%、6.4%,尤以添加Bi含量2000ppm具有同時兼顧硬度、熱循環測試及塑性之功效。 In the part of the Hardness test, the present invention The hardness tester (model FM-100e) produced by FUTURE TECH company is used to test the hardness. The results are shown in Table 2. The Sn-1.0wt%Ag-0.5wt%Cu alloy solder ball without Bi element is added. The hardness is 14.2Hv, which is lower than other Sn-1.0wt% Ag-0.5wt% Cu alloy tin balls with added Bi element, and the test results are similar to those of the aforementioned tensile test, when Sn-1.0wt The more Bi content added to the %Ag-0.5wt%Cu alloy tin ball, the more the hardness increases, which helps to improve the ability of the solder ball to be tested in thermal cycling; however, when Sn-1.0wt% Ag When the Bi content of the 0.5wt% Cu alloy tin ball exceeds 2000ppm, the elongation gradually decreases. As shown in Table 2, the Bi content increases from 2000ppm to 2750ppm, and the elongation decreases from 8.1% to only 0.6%. Looking at the above data of hardness and elongation, Sn-1.0wt%Ag-0.5wt%Cu alloy tin balls can obtain better hardness and elongation when the Bi content is 2000±500ppm, such as hardness of 15.1Hv and 15.4Hv, respectively. 16.3Hv, and the elongation is 6.6%, 8.1%, 6.4%, especially the addition of 2000 ppm of Bi content has the effect of both hardness, thermal cycle test and plasticity.

請再參閱第6圖所示,未添加Bi元素的 Sn-1.0wt%Ag-0.5wt%Cu合金錫球與添加含量2000ppm BiSn-1.0wt%Ag-0.5wt%Cu的合金錫球在經過5次的回流焊試驗後,其實驗結果顯示本發明添加含量2000ppm Bi的Sn-1.0wt%Ag-0.5wt%Cu之合金錫球的剪切強度係高於未添加Bi元素的Sn-1.0wt%Ag-0.5wt%Cu合金錫球,而從測試整體之面向來看,添加含量2000ppm Bi的Sn-1.0wt%Ag-0.5wt%Cu之合金錫球無論經過幾次的回流焊,其剪切強度皆優於未添加Bi的Sn-1.0wt%Ag-0.5wt%Cu合金錫球。 Please refer to Figure 6, as shown in Figure 6, without the addition of the Bi element. Sn-1.0wt%Ag-0.5wt%Cu alloy tin ball and alloy tin ball with addition content 2000ppm BiSn-1.0wt%Ag-0.5wt%Cu after 5 times of reflow soldering test, the experimental results show that the invention is added The shear strength of the alloy ball of the content of 2000 ppm Bi of Sn-1.0 wt% Ag-0.5 wt% Cu is higher than that of the Sn-1.0 wt% Ag-0.5 wt% Cu alloy tin ball without the addition of Bi element, and the overall test from the test From the aspect of view, the addition of 2000ppm Bi of Sn-1.0wt%Ag-0.5wt%Cu alloy solder ball is better than that of Sn-1.0wt% Ag without Bi addition after several times of reflow soldering. - 0.5 wt% Cu alloy tin ball.

於本發明該較佳實施例中,合金錫球之組成物更 包含有鎳(Ni),該鎳之含量係於0.05~0.1wt%,其中Ni元素係為該錫球之耐摔落測試之主要成分,原因在於Ag3Sn具有明顯的纖維狀、針狀,介面合金化合物較稀散處的Ag3Sn呈粗片狀和小塊狀,而添加Ni可使組織細化,且在組織中出現(Cu1-xNix)6Sn5,其對該錫球有強化的作用,但若添加過量之Ni時,將形成了過多的(Cu1-xNix)6Sn5,此於組織中不斷聚集長大影響合金錫球之性能,在本發明中,Ni之含量為0.05wt% 為較佳,合金錫球添加0.05~0.1wt%的Ni後形成一種(CuNi)6Sn5的IMC層,由此可見添加適量的Ni有助抑制Cu3Sn的IMC生成,並阻止Kirkendall效應的發生,又如前述IMC層之厚度將隨著回流焊次數之增加而增厚,經實驗得知,未添加Ni之IMC層厚度不僅較厚,其厚度增加之曲率更是明顯大於添加Ni含量0.05~0.1wt%,而此也說明了Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi在添加適量之Ni係有助於抑制IMC厚度的成長。在此值得一提的是,如第7圖所示,當Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi合金錫球在添加0.05wt%的Ni後,其熱循環測試能力相較於前述Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi合金錫球是有提升的功效,且更已趨近於Sn-4.0wt%Ag-0.5wt%Cu合金錫球。 In the preferred embodiment of the present invention, the composition of the alloy tin ball further comprises nickel (Ni), and the content of the nickel is 0.05-0.1 wt%, wherein the Ni element is the fall resistance test of the solder ball. The main component is that Ag 3 Sn has obvious fibrous and needle-like shape, and the Ag 3 Sn of the interface alloy compound is coarse and small in shape, and the addition of Ni can refine the structure and appear in the tissue. (Cu 1-x Ni x ) 6 Sn 5 , which has a strengthening effect on the solder ball, but when an excessive amount of Ni is added, excessive (Cu 1-x Ni x ) 6 Sn 5 is formed , which is in the structure In the present invention, the content of Ni is preferably 0.05 wt%, and the alloy tin ball is added with 0.05 to 0.1 wt% of Ni to form an IMC layer of (CuNi) 6 Sn 5 . It can be seen that the addition of an appropriate amount of Ni helps to inhibit the IMC formation of Cu 3 Sn and prevents the Kirkendall effect from occurring. As the thickness of the aforementioned IMC layer increases with the number of reflow cycles, it has been experimentally found that The thickness of the IMC layer to which Ni is added is not only thicker, but the curvature of the thickness increase is more than 0.05 to 0.1 wt% of the added Ni content, and this is also said. A Sn-1.0wt% Ag-0.5wt% Cu-2000ppm Bi addition amount of Ni-based help suppress the growth of the thickness of the IMC. It is worth mentioning here that, as shown in Fig. 7, when the Sn-1.0wt%Ag-0.5wt%Cu-2000ppm Bi alloy tin ball is added with 0.05wt% Ni, its thermal cycle test ability is compared with that. The aforementioned Sn-1.0 wt% Ag-0.5 wt% Cu-2000 ppm Bi alloy tin ball has an improved effect, and has more recently approached Sn-4.0 wt% Ag-0.5 wt% Cu alloy tin ball.

本發明利用上述之組成物所構成之一種錫-銀- 銅-鉍合金錫球,其中合金錫球之直徑為100~890μm。在回焊中,使用合金錫球之球閘陣列封裝(Ball Grid Array,簡稱BGA)、晶片尺寸封裝(Chip Scale Package,簡稱CSP)、覆晶封裝(Flip Chip Package,簡稱FCP)等,隨著合金錫球之直徑越小,該錫球之接合部的剖面將會越小,故耐摔落測試也將會受到考驗,因此,當合金錫球之直徑越小時,其越能發揮本發明之耐摔落測試的效果,而介於100~890μm之錫球,係可充分地發揮本發明之耐摔落之特性。 The present invention utilizes a tin-silver composition composed of the above composition Copper-bismuth alloy solder balls, wherein the alloy tin balls have a diameter of 100 to 890 μm. In the reflow soldering, a Ball Grid Array (BGA), a Chip Scale Package (CSP), and a Flip Chip Package (FCP) are used. The smaller the diameter of the alloy tin ball, the smaller the cross section of the joint of the solder ball will be, so the drop resistance test will also be tested. Therefore, the smaller the diameter of the alloy tin ball, the more the invention can be used. The effect of the drop resistance test, and the solder ball between 100 and 890 μm, can fully exert the drop resistance characteristics of the present invention.

總括來說,本發明所提供之錫-銀-銅-鉍合金錫球 組成物不僅能提升濕潤性及細化晶粒,更能改善合金機械強度而增加熱循環測試能力,以適用於更為廣泛之電子產品上。 In summary, the tin-silver-copper-bismuth alloy solder ball provided by the present invention The composition not only improves the wettability and refines the grain, but also improves the mechanical strength of the alloy and increases the thermal cycle test capability for use in a wider range of electronic products.

本發明於前揭露實施例中所揭露的構成元件,僅為舉例說明,並非用來限制本案之範圍,其他等效元件的替代或變化,亦應為本案之申請專利範圍所涵蓋。 The present invention is not limited to the scope of the present invention, and the alternative or variations of other equivalent elements are also covered by the scope of the patent application.

Claims (4)

一種錫-銀-銅-鉍合金錫球之組成物,其包含有:銀(Ag),該銀之含量係於0.3~4.0wt%;銅(Cu),該銅之含量係於0.3~1.0wt%;鉍(Bi),該鉍之含量係於2000±500ppm;以及錫(Sn),上述所揭剩餘之含量。 A composition of tin-silver-copper-bismuth alloy solder balls, comprising: silver (Ag), the content of the silver is 0.3-4.0 wt%; copper (Cu), the content of copper is 0.3-1.0 Wt%; bismuth (Bi), the content of the lanthanum is 2000 ± 500 ppm; and tin (Sn), the remaining content disclosed above. 如申請專利範圍第1項所述之錫-銀-銅-鉍合金錫球之組成物,其中更包含有鎳(Ni),該鎳之含量係於0.05~0.1wt%。 The composition of the tin-silver-copper-bismuth alloy tin ball described in claim 1, further comprising nickel (Ni), the nickel content being 0.05 to 0.1 wt%. 一種錫-銀-銅-鉍合金錫球,係由申請專利範圍第1項至第2項其中之一所形成者。 A tin-silver-copper-bismuth alloy solder ball is formed by one of the first to second items of the patent application scope. 如申請專利範圍第3項所述之錫-銀-銅-鉍合金錫球,其中該錫球之直徑為100~890μm。 The tin-silver-copper-bismuth alloy solder ball described in claim 3, wherein the tin ball has a diameter of 100 to 890 μm.
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