TW201506372A - Test device for tilting angle of machine cabinet - Google Patents
Test device for tilting angle of machine cabinet Download PDFInfo
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- TW201506372A TW201506372A TW102121688A TW102121688A TW201506372A TW 201506372 A TW201506372 A TW 201506372A TW 102121688 A TW102121688 A TW 102121688A TW 102121688 A TW102121688 A TW 102121688A TW 201506372 A TW201506372 A TW 201506372A
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Abstract
Description
本發明係關於一種機櫃傾斜角度測試裝置。The present invention relates to a cabinet tilt angle testing device.
機櫃一般是冷軋鋼板或合金製作的用來存放電腦和相關控制設備的物件,可以提供對存放設備的保護,遮罩電磁干擾,有序、整齊地排列設備,方便以後維護設備。機櫃一般分為伺服器機櫃、網路機櫃、控制台機櫃等。機櫃一般用在網路佈線間,樓層配線間,中心機房,資料機房,控制中心,監控室,監控中心等,系統性地解決了電腦應用中的高密度散熱、大量線纜附設和管理、大容量配電及全面相容不同廠商機架式設備的難題,從而使資料中心能夠在高穩定性的環境下運行。The cabinet is generally made of cold-rolled steel or alloy for storing computers and related control equipment. It can provide protection for storage equipment, cover electromagnetic interference, arrange equipment in an orderly and neat manner, and facilitate maintenance of equipment in the future. Cabinets are generally divided into server cabinets, network cabinets, console cabinets, and so on. The cabinet is generally used in the network wiring room, the floor wiring room, the central computer room, the data room, the control center, the monitoring room, the monitoring center, etc., systematically solving the high-density heat dissipation in the computer application, a large number of cable attachment and management, and large Capacity distribution and full compatibility with the rack-mount equipment of different manufacturers, enabling the data center to operate in a highly stable environment.
由於機櫃在出廠之後的搬運或架設過程中會產生一定的傾斜,為了避免機櫃傾倒,生產商在機櫃出廠前都會按照客戶的要求對機櫃進行傾斜角度的測試,以檢測機櫃是否符合一預設的傾斜角度值。習知技術中,人們通常將機櫃的一端放置在液壓叉車上,利用叉車將機櫃的一端抬高,然後用角度表測出機櫃傾斜角度值。但是,採取該種方法存在誤差大的問題,且需要經過多次調整才能達到需要的角度;此外,叉車的穩定度很難控制,容易給測試人員帶來危險。Because the cabinet will be tilted during the handling or erection process after the factory, in order to avoid the cabinet from falling over, the manufacturer will test the tilt angle of the cabinet according to the customer's requirements before the cabinet leaves the factory to check whether the cabinet meets the preset. Tilt angle value. In the prior art, one end of the cabinet is usually placed on a hydraulic forklift, and one end of the cabinet is raised by a forklift, and then the angle of the cabinet is measured by an angle meter. However, there is a problem of large error in adopting such a method, and it is necessary to adjust a plurality of times to achieve a desired angle; in addition, the stability of the forklift is difficult to control, and it is easy to bring danger to testers.
鑒於上述內容,有必要提供一種能方便及高效地檢測出機櫃傾斜角度的機櫃傾斜角度測試裝置。In view of the above, it is necessary to provide a cabinet tilt angle test device that can easily and efficiently detect the tilt angle of the cabinet.
一種機櫃傾斜角度測試裝置,包括:A cabinet tilt angle testing device includes:
一角度偵測儀,用於與待測機櫃相連,該角度測試儀包括與一待測機櫃相連的偵測模組,該偵測模組用以感測待測機櫃的傾斜角度;An angle detector is connected to the cabinet to be tested, and the angle tester includes a detection module connected to a cabinet to be tested, and the detection module is configured to sense an inclination angle of the cabinet to be tested;
一控制台,包括一處理晶片,與該處理晶片相連的預設角度模組、傾斜角度監視幕及測試按鍵,該角度測試儀的偵測模組與該處理晶片連接,該預設角度模組設定一預設傾斜角度值;a console includes a processing chip, a preset angle module connected to the processing chip, a tilt angle monitoring screen and a test button, and the detecting module of the angle tester is connected to the processing chip, the preset angle module Setting a preset tilt angle value;
一驅動裝置,用於承載並驅動該待測機櫃,該驅動裝置與該控制台的處理晶片連接,並根據該測試按鍵向該處理晶片發出的測試指令驅動待測機櫃傾斜移動;當按下該控制台的測試按鍵,該處理晶片接收到該測試按鍵輸出的測試指令後控制該驅動裝置向第一方向轉動,並帶動待測機櫃傾斜,該角度測試儀的偵測模組偵測待測機櫃的傾斜角度,並將偵測到的傾斜角度值回饋給該處理晶片,該處理晶片將該預設傾斜角度值與偵測的傾斜角度值做比較,當該傾斜角度值與預設傾斜角度值不相等時,處理晶片命令該驅動裝置繼續向第一方向轉動,並帶動待測機櫃傾斜,當該預設傾斜角度值與該傾斜角度相等時,該處理晶片向該驅動裝置發出停止指令以停止驅動待測機櫃傾斜移動,該傾斜角度監視幕監視偵測到的傾斜角度值。a driving device for carrying and driving the cabinet to be tested, the driving device is connected to the processing chip of the console, and driving the test cabinet to be tilted according to the test command sent by the test button to the processing chip; when the button is pressed a test button of the console, the processing chip receives the test command outputted by the test button, controls the driving device to rotate in the first direction, and drives the cabinet to be tested to tilt, and the detecting module of the angle tester detects the cabinet to be tested The tilt angle is fed back to the processing wafer, and the processing wafer compares the preset tilt angle value with the detected tilt angle value, and the tilt angle value and the preset tilt angle value When the unequal, the processing chip commands the driving device to continue to rotate in the first direction, and drives the cabinet to be tested to tilt. When the preset tilt angle value is equal to the tilt angle, the processing chip sends a stop command to the driving device to stop. The tilting movement of the cabinet to be tested is driven, and the tilt angle monitoring screen monitors the detected tilt angle value.
本發明的機櫃傾斜角度測試裝置由控制台控制一承載待測機櫃的驅動裝置的轉動,並透過安裝在待測機櫃上的角度偵測儀檢測待測機櫃的傾斜角度,角度偵測儀將檢測到的待測機櫃的傾斜角度回饋給控制台的處理晶片,當該傾斜角度值與預設傾斜角度值不相等時,處理晶片命令該驅動裝置繼續向第一方向轉動,並帶動待測機櫃傾斜,當控制台的處理晶片接收到的傾斜角度與預設角度相等時,處理晶片控制驅動裝置停止轉動,若此時待測機櫃沒有傾倒,則該待測機櫃符合出廠規格。如此,即可方便、高效、安全地檢測出機櫃的傾斜角度。The cabinet tilt angle test device of the present invention controls the rotation of the driving device carrying the cabinet to be tested by the console, and detects the tilt angle of the cabinet to be tested through the angle detector installed on the cabinet to be tested, and the angle detector will detect The tilt angle of the cabinet to be tested is fed back to the processing wafer of the console. When the tilt angle value is not equal to the preset tilt angle value, the processing chip commands the driving device to continue to rotate in the first direction and drives the cabinet to be tested to tilt. When the tilt angle received by the processing wafer of the console is equal to the preset angle, the processing chip control driving device stops rotating. If the cabinet to be tested is not dumped at this time, the cabinet to be tested meets the factory specifications. In this way, the tilt angle of the cabinet can be detected conveniently, efficiently and safely.
10‧‧‧機櫃傾斜角度測試裝置10‧‧‧Cabinet tilt angle test device
11‧‧‧角度偵測儀11‧‧‧ Angle detector
12‧‧‧控制台12‧‧‧ console
13‧‧‧驅動裝置13‧‧‧ drive
14‧‧‧偵測模組14‧‧‧Detection module
15‧‧‧錶盤15‧‧‧ dial
150‧‧‧預設指針150‧‧‧Preset pointer
151‧‧‧實際測量指針151‧‧‧ Actual measurement pointer
16‧‧‧處理晶片16‧‧‧Processing wafer
17‧‧‧預設角度模組17‧‧‧Preset angle module
18‧‧‧傾斜角度監視幕18‧‧‧ tilt angle monitor
19‧‧‧測試按鍵19‧‧‧Test button
20‧‧‧重定按鍵20‧‧‧Resume button
170‧‧‧設定鍵盤170‧‧‧Set keyboard
171‧‧‧預設角度監視幕171‧‧‧Preset angle monitor screen
172‧‧‧記憶體172‧‧‧ memory
130‧‧‧電機130‧‧‧Motor
301‧‧‧電機主體301‧‧‧ motor body
302‧‧‧電機主軸302‧‧‧Motor spindle
310‧‧‧傳動輪310‧‧‧Drive wheel
131‧‧‧定滑輪131‧‧‧ fixed pulley
132‧‧‧支架132‧‧‧ bracket
313‧‧‧支撐柱313‧‧‧Support column
315‧‧‧托架315‧‧‧ bracket
312‧‧‧鋼繩312‧‧‧Steel rope
21‧‧‧第一開關21‧‧‧First switch
22‧‧‧第二開關22‧‧‧second switch
133‧‧‧電源線133‧‧‧Power cord
330‧‧‧主繞組330‧‧‧Main winding
331‧‧‧次繞組331‧‧‧ windings
332‧‧‧零線332‧‧‧Neutral
100‧‧‧待測機櫃100‧‧‧Wholes to be tested
圖1係本發明機櫃傾斜角度測試裝置的較佳實施方式的示意圖。1 is a schematic view of a preferred embodiment of a cabinet tilt angle testing device of the present invention.
圖2係本發明機櫃傾斜角度測試裝置額驅動裝置的結構示意圖。2 is a schematic structural view of a front drive device of a tilt angle test device of the cabinet of the present invention.
請參照圖1,本發明機櫃傾斜角度測試裝置10用於測試一待測機櫃100的傾斜角度。該機櫃傾斜角度測試裝置10包括一角度偵測儀11、一控制台12及一驅動裝置13,該驅動裝置13用於承載該待測機櫃100。Referring to FIG. 1, the cabinet tilt angle testing device 10 of the present invention is used to test the tilt angle of a cabinet 100 to be tested. The cabinet tilt angle testing device 10 includes an angle detector 11 , a console 12 , and a driving device 13 . The driving device 13 is configured to carry the cabinet 100 to be tested.
角度偵測儀11包括一偵測模組14及一錶盤15。該偵測模組14與該待測機櫃100相連,用以感測待測機櫃100的傾斜角度。該錶盤15上設有一預設指針150及一實際測量指針151,該預設指針150及該實際測量指針151均與偵測模組14相連,該預設指針150用以指示待測機櫃100的最大傾斜角度,該實際測量指針151用以指示待測機櫃100的實際傾斜角度。The angle detector 11 includes a detection module 14 and a dial 15 . The detection module 14 is connected to the cabinet 100 to be tested to sense the tilt angle of the cabinet 100 to be tested. A preset pointer 150 and an actual measurement pointer 151 are disposed on the dial 15 . The preset pointer 150 and the actual measurement pointer 151 are both connected to the detection module 14 . The preset pointer 150 is used to indicate the cabinet 100 to be tested. The maximum tilt angle is used to indicate the actual tilt angle of the cabinet 100 to be tested.
控制台12包括一處理晶片16、一預設角度模組17、一傾斜角度監視幕18、一測試按鍵19、一重定按鍵20、一第一開關21及一第二開關22,該預設角度模組17、傾斜角度監視幕18、測試按鍵19、重定按鍵20、第一開關21及第二開關22均與處理晶片16相連。所述預設角度模組17包括一設定鍵盤170、一預設角度監視幕171及一記憶體172。所述設定鍵盤170用以設定待測機櫃100的預設傾斜角度值,並輸出至該處理晶片16。該記憶體172用以根據處理晶片16發出的指令存儲該設定的待測機櫃100的預設傾斜角度值。該預設角度監視幕171用以根據處理晶片16發出的指令監視該設定的待測機櫃100的預設傾斜角度值。該傾斜角度監視幕18用以監視待測機櫃100的實際傾斜角度值。測試按鍵19用於向該處理晶片16發出一測試指令,該重定按鍵20用於向該處理晶片16發出一重定指令。The console 12 includes a processing chip 16, a preset angle module 17, a tilt angle monitoring screen 18, a test button 19, a reset button 20, a first switch 21 and a second switch 22, the preset angle The module 17, the tilt angle monitor screen 18, the test button 19, the reset button 20, the first switch 21, and the second switch 22 are all connected to the processing wafer 16. The preset angle module 17 includes a setting keyboard 170, a preset angle monitoring screen 171, and a memory 172. The setting keyboard 170 is configured to set a preset tilt angle value of the cabinet 100 to be tested, and output to the processing chip 16 . The memory 172 is configured to store the preset preset tilt angle value of the cabinet 100 to be tested according to an instruction issued by the processing chip 16. The preset angle monitor screen 171 is configured to monitor the preset preset tilt angle value of the cabinet 100 to be tested according to an instruction issued by the processing chip 16. The tilt angle monitoring screen 18 is used to monitor the actual tilt angle value of the cabinet 100 to be tested. The test button 19 is used to issue a test command to the processing wafer 16, which is used to issue a reorder command to the processing wafer 16.
參照圖2,驅動裝置13包括電機130、與電機130相連的一定滑輪131、與定滑輪131相連的支架132,該電機130包括位於一基板134上的主體電機301、傳動輪310及與電機主體301及傳動輪310相連電機主軸302。該支架132包括一固定於該基板134的支撐柱313及靠近於支撐柱底端的托架315。該定滑輪131位於支撐柱313的頂端,鋼繩312一端固定於傳動輪310上,另一端經過定滑輪131固定於托架315上,傳動輪310用於纏繞鋼繩312,鋼繩312控制托架315的升降。當電機主體301接收一正轉訊號時,電機主軸302及傳動輪310順時針轉動,傳動輪310卷繩帶動托架315緩慢向上移動;當電機主體301接收一反轉訊號時,電機主軸302及傳動輪310逆時針轉動,將鋼繩312從傳動輪310上緩慢放下,帶動定托架315向下移動。Referring to FIG. 2, the driving device 13 includes a motor 130, a certain pulley 131 connected to the motor 130, and a bracket 132 connected to the fixed pulley 131. The motor 130 includes a main body motor 301, a transmission wheel 310 and a motor body on a substrate 134. The motor shaft 302 is connected to the 301 and the transmission wheel 310. The bracket 132 includes a support post 313 fixed to the base plate 134 and a bracket 315 adjacent to the bottom end of the support post. The fixed pulley 131 is located at the top end of the support column 313. One end of the steel wire 312 is fixed on the transmission wheel 310, and the other end is fixed on the bracket 315 via the fixed pulley 131. The transmission wheel 310 is used for winding the steel wire 312, and the steel wire 312 controls the support. The lifting of the frame 315. When the motor main body 301 receives a forward rotation signal, the motor main shaft 302 and the transmission wheel 310 rotate clockwise, and the transmission wheel 310 reels the carriage 315 to move upward slowly; when the motor main body 301 receives a reversal signal, the motor main shaft 302 and The drive wheel 310 rotates counterclockwise to slowly lower the steel cord 312 from the drive wheel 310, causing the fixed bracket 315 to move downward.
該電機主體301透過電源線133接收該處理晶片16的測試指令或重定指令。該電源線133包括由主繞組330及次繞組331組成的火線及零線332。該第一開關21的第一端與處理晶片16相連,該第一開關21的第二端與該主繞組330相連,該第一開關21的第三端與該零線332相連並接地。該第二開關22的第一端與處理晶片16相連,第二端與次繞組331相連,第三端與零線332相連。The motor body 301 receives the test command or reset command of the process wafer 16 via the power line 133. The power line 133 includes a live line and a neutral line 332 composed of a primary winding 330 and a secondary winding 331. The first end of the first switch 21 is connected to the processing chip 16. The second end of the first switch 21 is connected to the main winding 330. The third end of the first switch 21 is connected to the neutral line 332 and grounded. The first end of the second switch 22 is connected to the processing wafer 16, the second end is connected to the secondary winding 331, and the third end is connected to the neutral line 332.
測試時,將待測機櫃100的底部的第一端放置於該托架315遠離支撐柱313的一端,該待測機櫃100的底部的遠離第一端的第二端位於一水平面上。當按下控制台12的測試按鍵19,處理晶片16接收到測試按鍵19輸出的測試指令,處理晶片16向第一開關21發出一高電平訊號,該第一開關21導通,該電源線的零線332與主繞組330相連,該傳動輪310正轉,該定滑輪131向第一方向轉動並帶動該托架315向上移動,該待測機櫃100的第一端被托架315緩慢抬起,由於待測機櫃100的第二端位於一水平面上,故待測機櫃100的底部相較水平面成一定角度,該角度即為待測機櫃100的傾斜角度。During the test, the first end of the bottom of the cabinet 100 to be tested is placed at one end of the bracket 315 away from the support post 313, and the second end of the bottom of the cabinet 100 to be tested that is far from the first end is located on a horizontal plane. When the test button 19 of the console 12 is pressed, the processing chip 16 receives the test command output by the test button 19, and the processing chip 16 sends a high level signal to the first switch 21, the first switch 21 is turned on, and the power line is turned on. The zero line 332 is connected to the main winding 330. The transmission wheel 310 rotates forward. The fixed pulley 131 rotates in the first direction and drives the bracket 315 to move upward. The first end of the cabinet 100 to be tested is slowly lifted by the bracket 315. The bottom of the cabinet 100 to be tested is at a certain angle from the horizontal plane. The angle is the angle of inclination of the cabinet 100 to be tested.
該角度測試儀11的偵測模組14偵測該待測機櫃100的傾斜角度,並將偵測到的傾斜角度值即時回饋給該處理晶片16,同時,該實際測量指標151根據偵測模組14偵測到的傾斜角度發生偏移。該處理晶片16即時調整該傾斜角度監視幕18,使該傾斜角度監視幕18監視當前待測機櫃100的傾斜角度值,同時處理晶片16將該設定的待測機櫃100的預設傾斜角度值與待測機櫃100當前的傾斜角度值做比較,若當前的傾斜角度值與預設傾斜角度值不相等時,處理晶片命令電機主體301繼續正轉,電機主軸302及傳動輪310繼續順時針轉動,傳動輪310卷繩帶動托架315繼續緩慢向上移動,直到該預設傾斜角度值與當前的傾斜角度值相等時,處理晶片16向該第一開關21發出一低電平訊號,該第一開關21截止,該電源線的零線332與主繞組330斷開,該電機130停止工作,此時錶盤15上監視預設指標150與實際測量指針151重合。若此時,待測機櫃100仍沒有傾倒,則待測機櫃100符合出廠規格。該預設角度監視幕171、傾斜角度監視幕18及錶盤15可使測試人員方便觀測待測機櫃100的傾斜角度情況。The detection module 14 of the angle tester 11 detects the tilt angle of the cabinet 100 to be tested, and instantly returns the detected tilt angle value to the processing chip 16, and the actual measurement index 151 is based on the detection mode. The tilt angle detected by group 14 is offset. The processing wafer 16 adjusts the tilt angle monitoring screen 18 in real time, so that the tilt angle monitoring screen 18 monitors the tilt angle value of the current cabinet 100 to be tested, and simultaneously processes the wafer 16 to set the preset tilt angle value of the cabinet 100 to be tested. The current tilt angle value of the cabinet 100 to be tested is compared. If the current tilt angle value is not equal to the preset tilt angle value, the processing wafer commands the motor body 301 to continue to rotate forward, and the motor spindle 302 and the drive wheel 310 continue to rotate clockwise. The drive wheel 310 drives the carriage 315 to continue to move slowly upward until the preset tilt angle value is equal to the current tilt angle value, and the processing chip 16 sends a low level signal to the first switch 21, the first switch 21, the zero line 332 of the power line is disconnected from the main winding 330, and the motor 130 stops working. At this time, the monitoring preset index 150 on the dial 15 coincides with the actual measuring pointer 151. If the cabinet 100 to be tested is still not dumped at this time, the cabinet 100 to be tested meets the factory specifications. The preset angle monitoring screen 171, the tilt angle monitoring screen 18 and the dial 15 enable the tester to conveniently observe the tilt angle of the cabinet 100 to be tested.
當按下控制台12的重定按鍵20時,處理晶片16接收到重定按鍵20輸出的重定指令,處理晶片16向第二開關22發出一高電平訊號,該第二開關22導通,該電源線的零線332與次繞組331相連,該傳動輪310反轉,該定滑輪131亦向第二方向轉動並帶動該托架315向下移動,該待測機櫃100的第一端被緩慢恢復原位。When the reset button 20 of the console 12 is pressed, the processing chip 16 receives the reset command output by the reset button 20, the processing chip 16 sends a high level signal to the second switch 22, and the second switch 22 is turned on. The zero line 332 is connected to the secondary winding 331. The transmission wheel 310 is reversed. The fixed pulley 131 also rotates in the second direction and drives the bracket 315 to move downward. The first end of the cabinet 100 to be tested is slowly restored. Bit.
在本實施例中,該第一開關21、第二開關22為NMOS場效應管,該第一開關21及第二開關22的第一端、第二端及第三端分別對應於NMOS場效應管的閘極、汲極及源極。In this embodiment, the first switch 21 and the second switch 22 are NMOS FETs, and the first end, the second end, and the third end of the first switch 21 and the second switch 22 respectively correspond to an NMOS field effect. The gate, drain and source of the tube.
綜上所述,本發明確已符合發明專利的要件,爰依法提出專利申請。惟,以上所述者僅為本發明的較佳實施方式,本發明的範圍並不以上述實施方式為限,舉凡熟悉本案技藝的人士爰依本發明的精神所作的等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in accordance with the spirit of the present invention are It should be covered by the following patent application.
無no
10‧‧‧機櫃傾斜角度測試裝置 10‧‧‧Cabinet tilt angle test device
11‧‧‧角度偵測儀 11‧‧‧ Angle detector
12‧‧‧控制台 12‧‧‧ console
13‧‧‧驅動裝置 13‧‧‧ drive
14‧‧‧偵測模組 14‧‧‧Detection module
15‧‧‧錶盤 15‧‧‧ dial
150‧‧‧預設指針 150‧‧‧Preset pointer
151‧‧‧實際測量指針 151‧‧‧ Actual measurement pointer
16‧‧‧處理晶片 16‧‧‧Processing wafer
17‧‧‧預設角度模組 17‧‧‧Preset angle module
18‧‧‧傾斜角度監視幕 18‧‧‧ tilt angle monitor
19‧‧‧測試按鍵 19‧‧‧Test button
20‧‧‧重定按鍵 20‧‧‧Resume button
170‧‧‧設定鍵盤 170‧‧‧Set keyboard
171‧‧‧預設角度監視幕 171‧‧‧Preset angle monitor screen
172‧‧‧記憶體 172‧‧‧ memory
130‧‧‧電機 130‧‧‧Motor
131‧‧‧定滑輪 131‧‧‧ fixed pulley
132‧‧‧支架 132‧‧‧ bracket
21‧‧‧第一開關 21‧‧‧First switch
22‧‧‧第二開關 22‧‧‧second switch
330‧‧‧主繞組 330‧‧‧Main winding
331‧‧‧次繞組 331‧‧‧ windings
332‧‧‧零線 332‧‧‧Neutral
100‧‧‧待測機櫃 100‧‧‧Wholes to be tested
Claims (6)
一角度偵測儀,用於與待測機櫃相連,該角度測試儀包括與一待測機櫃相連的偵測模組,該偵測模組用以感測待測機櫃的傾斜角度;
一控制台,包括一處理晶片,與該處理晶片相連的預設角度模組、傾斜角度監視幕及測試按鍵,該角度測試儀的偵測模組與該處理晶片連接,該預設角度模組設定一預設傾斜角度值;
一驅動裝置,用於承載並驅動該待測機櫃,該驅動裝置與該控制台的處理晶片連接,並根據該測試按鍵向該處理晶片發出的測試指令驅動待測機櫃傾斜移動;
當按下該控制台的測試按鍵,該處理晶片接收到該測試按鍵輸出的測試指令後控制該驅動裝置向第一方向轉動,並帶動待測機櫃傾斜,該角度測試儀的偵測模組偵測待測機櫃的傾斜角度,並將偵測到的傾斜角度值回饋給該處理晶片,該處理晶片將該預設傾斜角度值與偵測的傾斜角度值做比較,當該傾斜角度值與預設傾斜角度值不相等時,處理晶片命令該驅動裝置繼續向第一方向轉動,並帶動待測機櫃傾斜,當該預設傾斜角度值與該傾斜角度相等時,該處理晶片向該驅動裝置發出停止指令以停止驅動待測機櫃傾斜移動,該傾斜角度監視幕監視偵測到的傾斜角度值。A cabinet tilt angle testing device includes:
An angle detector is connected to the cabinet to be tested, and the angle tester includes a detection module connected to a cabinet to be tested, and the detection module is configured to sense an inclination angle of the cabinet to be tested;
a console includes a processing chip, a preset angle module connected to the processing chip, a tilt angle monitoring screen and a test button, and the detecting module of the angle tester is connected to the processing chip, the preset angle module Setting a preset tilt angle value;
a driving device for carrying and driving the cabinet to be tested, the driving device is connected to the processing chip of the console, and driving the test cabinet to be tilted according to the test command sent by the test button to the processing chip;
When the test button of the console is pressed, the processing chip receives the test command outputted by the test button, and then controls the driving device to rotate in the first direction, and drives the cabinet to be tested to tilt, and the detection module of the angle tester detects Measuring the tilt angle of the cabinet to be tested, and feeding back the detected tilt angle value to the processing chip, the processing wafer comparing the preset tilt angle value with the detected tilt angle value, when the tilt angle value is When the tilt angle values are not equal, the processing chip commands the driving device to continue to rotate in the first direction, and drives the cabinet to be tested to tilt. When the preset tilt angle value is equal to the tilt angle, the processing wafer is sent to the driving device. The stop command stops driving the tilting movement of the cabinet to be tested, and the tilt angle monitor screen monitors the detected tilt angle value.
Priority Applications (1)
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TW102121688A TW201506372A (en) | 2013-06-19 | 2013-06-19 | Test device for tilting angle of machine cabinet |
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TW102121688A TW201506372A (en) | 2013-06-19 | 2013-06-19 | Test device for tilting angle of machine cabinet |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106974452A (en) * | 2017-03-29 | 2017-07-25 | 西安科技大学 | Imflammable gas gas cylinder storage protection cabinet and method |
CN114252226A (en) * | 2020-09-21 | 2022-03-29 | 维谛技术(西安)有限公司 | Test method of cabinet |
-
2013
- 2013-06-19 TW TW102121688A patent/TW201506372A/en unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106974452A (en) * | 2017-03-29 | 2017-07-25 | 西安科技大学 | Imflammable gas gas cylinder storage protection cabinet and method |
CN114252226A (en) * | 2020-09-21 | 2022-03-29 | 维谛技术(西安)有限公司 | Test method of cabinet |
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