TW201404519A - Bias adjustment structure of positioning measurement device - Google Patents

Bias adjustment structure of positioning measurement device Download PDF

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Publication number
TW201404519A
TW201404519A TW101126159A TW101126159A TW201404519A TW 201404519 A TW201404519 A TW 201404519A TW 101126159 A TW101126159 A TW 101126159A TW 101126159 A TW101126159 A TW 101126159A TW 201404519 A TW201404519 A TW 201404519A
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Taiwan
Prior art keywords
seat
probe
measuring device
adjustment
base
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TW101126159A
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Chinese (zh)
Inventor
Ming-Jia Wu
zheng-wen Su
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Wang Xiang Entpr Co Ltd
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Priority to TW101126159A priority Critical patent/TW201404519A/en
Publication of TW201404519A publication Critical patent/TW201404519A/en

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Abstract

This invention provides a bias adjustment structure of a positioning measurement device, mainly comprising a housing set, an adjustment component, and a measurement component. The adjustment component and the measurement component are disposed in the housing set. The adjustment component comprises at least one spring, a movable seat abutted against the at least one spring, and an adjustment rod disposed in the movable seat. The measurement component comprises a rotary seat and a probe connected with the rotary seat. The measurement component is abutted against the lower portion of the adjustment component through the rotary seat. This invention enables a probe of the measurement component to be abutted against a reference surface of a standard reference member to perform the correction, using the axial movement distance of the adjustment component to calculate the bias of the measurement component and to directly compensating the bias on a processing machine.

Description

定位量測裝置之偏差調校結構 Deviation adjustment structure of positioning measuring device

本發明係涉及一種一種量測裝置,尤其是一種定位量測裝置之偏差調校結構。 The invention relates to a measuring device, in particular to a deviation adjusting structure of a positioning measuring device.

習用的定位量測裝置通常用於工具機的起始基準點量測及調整刀具或校正使用,以CNC銑床為例,通常係將定位量測裝置裝設於主軸上隨著機台進行旋轉,隨後將定位量測裝置移動並分別接觸抵靠於工件的基準面,依此來測量計算得出工件的加工原點,並與程式原點作對照後進行加工; 習用的定位量測裝置有可能因為溫度、應力作用或零件組裝而產生量具誤差,但卻無法如一般的量具本身進行歸零或校正來將誤差去除,只能夠針對量錶進行歸零或校正,因此隨著量具誤差逐漸增加,就有可能發生量測精度不佳的問題,實有改良加強的必要。 The conventional positioning measuring device is usually used for measuring the starting point of the machine tool and adjusting the tool or correcting the use. Taking the CNC milling machine as an example, the positioning measuring device is usually mounted on the main shaft and rotates with the machine. Then, the positioning measuring device is moved and respectively contacted against the reference surface of the workpiece, and the processing origin of the workpiece is measured and calculated, and processed according to the program origin; Conventional positioning measuring devices may have gage errors due to temperature, stress or component assembly, but they cannot be zeroed or corrected as in the general gage itself to remove the error, and only zero or correction can be performed on the scale. Therefore, as the gage error gradually increases, there is a possibility that the measurement accuracy is not good, and there is a need for improvement and enhancement.

為了解決習用的定位量測裝置無法歸零或校正,可能會導致量測精度不佳的問題,本發明的主要目的在於提供一種定位量測裝置之偏差調校結構,目的在於使定位量測裝置的量具誤差有辦法被計算後,再於機台上進行參數補正來解決量具誤差的問題。 In order to solve the problem that the conventional positioning measurement device cannot be reset to zero or corrected, the measurement accuracy may be poor. The main object of the present invention is to provide a deviation adjustment structure of the positioning measurement device, aiming at the positioning measurement device. After the gage error has been calculated, the parameter correction is performed on the machine to solve the gage error problem.

本發明所運用的技術手段係在於提供一種定位量測裝置之偏差調校結構,包括: 一外殼組,其係包括有一夾持座及一結合於該夾持座底部之環蓋,於該環蓋係開設有一開孔,且該外殼組之軸向位置定義為Z軸;一調校組件,其係對應設置於該夾持座並能夠沿著Z軸平移作動,該調校組件係包括有一設置於該夾持座內部且可沿軸向作動的移動座、至少一抵靠於支持座內部與移動座之間的壓縮彈簧及一設置於該移動座內部並可伸縮作動的調校桿,該調校桿係於底部具有一呈傾斜狀的抵靠面;一量測組件,其係設置於該外殼組的內部並係抵靠於該調校組件之調校桿的下方,該量測組件係包括有一可旋轉作動的轉動座及穿設固定於該轉動座之一探針,該探針係於頂部具有一抵針部,該探針係以該抵針部抵靠於該調校桿之抵靠面,利用該轉動座及該探針移動以帶動該調校組件的平移作動。 The technical means used in the present invention is to provide a deviation adjustment structure of the positioning measurement device, comprising: An outer casing group includes a clamping seat and a ring cover coupled to the bottom of the clamping seat, the opening of the ring cover is defined, and the axial position of the outer casing group is defined as a Z-axis; An assembly, which is correspondingly disposed on the holder and capable of translational movement along the Z axis, the adjustment assembly includes a movable seat disposed inside the holder and axially movable, at least one against the support a compression spring between the inner portion and the movable seat, and a adjusting rod disposed inside the movable seat and being telescopically actuable, the adjusting rod has a slanting abutting surface at the bottom; a measuring component, The utility model is disposed inside the outer casing group and is disposed below the adjusting rod of the adjusting component, the measuring component comprises a rotatable rotating seat and a probe which is fixed to the rotating seat. The probe has an abutting portion on the top portion, and the probe abuts against the abutting surface of the adjusting rod, and the rotating base and the probe are moved to drive the translation of the adjusting component. Actuate.

前述之定位量測裝置之偏差調校結構,其中該調校桿係具有一抵靠柱及軸向地設置於該抵靠柱之頂面的一套桿,該調校桿係於該套桿套設結合一緩衝彈簧,使該調校桿能夠伸縮作動。 The offset adjustment structure of the positioning measuring device, wherein the adjusting rod has an abutting post and a set of rods axially disposed on a top surface of the abutting post, the adjusting rod is attached to the set rod The sleeve is combined with a buffer spring to enable the adjustment rod to be stretched and actuated.

前述之定位量測裝置之偏差調校結構,其中該調校桿係與該移動座以凹凸卡制的方式結合定位,使該調校桿不會產生轉動。 In the above-mentioned deviation measuring structure of the positioning measuring device, the adjusting rod is combined with the moving seat in a concave-convex manner, so that the adjusting rod does not rotate.

前述之定位量測裝置之偏差調校結構,其中該移動座係呈階級圓柱狀,並具有一底座及軸向連接於該底座之頂面的一延伸柄。 The offset adjustment structure of the positioning measuring device described above, wherein the moving seat has a class cylindrical shape and has a base and an extending handle axially connected to the top surface of the base.

前述之定位量測裝置之偏差調校結構,其中該調校組 件係設有兩壓縮彈簧,該兩壓縮彈簧係分別對應地抵靠於該移動座之延伸柄之頂面與該底座之頂面。 The offset adjustment structure of the foregoing positioning measuring device, wherein the tuning group The two parts are respectively provided with two compression springs, respectively correspondingly abutting against the top surface of the extending handle of the moving seat and the top surface of the base.

前述之定位量測裝置之偏差調校結構,其中該轉動座係呈半圓球狀,且係以呈平面的一端可轉動地抵靠於該移動座的底部,並以呈球面的一端朝向該環蓋之開孔。 The offset adjustment structure of the positioning measuring device, wherein the rotating seat has a semi-spherical shape, and the flat end is rotatably abutted against the bottom of the moving seat, and the spherical end faces the ring Cover the opening.

本發明利用所提供的定位量測裝置之偏差調校結構,可以獲得的功效增進在於能夠以量測組件之探針接觸標準件的基準面來進行量測校正,利用調校組件與探針接觸時所造成的位移,來得知量測組件的整體誤差,並能夠於機台上以參數調整進行補正,來排除量具誤差的問題,相當方便實用。 The invention utilizes the deviation adjustment structure of the provided positioning measuring device, and the power improvement can be obtained by measuring and correcting the reference surface of the measuring component contacting the standard component, and using the adjusting component to contact with the probe. The displacement caused by the time is known to the overall error of the measuring component, and can be corrected by parameter adjustment on the machine to eliminate the problem of the gage error, which is quite convenient and practical.

為了能夠詳細瞭解本發明的技術特徵及實用功效,並可依照說明書的內容來實施,更進一步以如圖式所示的較佳實施例,詳細說明如后:本發明係一種定位量測裝置之偏差調校結構,請參閱圖1至圖3的較佳實施例,其係包括一外殼組10、一調校組件20及一量測組件30,其中:如圖1及圖2所示,該外殼組10係包括有一夾持座11及一環蓋12,且該外殼組10之軸向位置定義為Z軸,該夾持座11係呈階級圓柱狀之中空殼體,該夾持座11係於上端形成一夾持柄110,並於底部形成一開口111,以及於夾持座11內部形成一連通至該開口111的容置空間112,於該夾持座11的底部外周面係形成螺紋,使該環蓋12對應螺鎖結合於該夾持座11之底部,並蓋合於該夾持座11之開口111,該環 蓋12於中央部位係形成一連通至該容置空間112的開孔121;如圖2及圖3所示,該調校組件20係對應設置於該夾持座11之容置空間112,並可於該容置空間112內沿Z軸向移動,該調校組件20係包括有一移動座21、兩壓縮彈簧22、一調校桿23及一緩衝彈簧24,該移動座21係呈階級圓柱狀並設置於該容置空間112內,該移動座21係具有一底座211及軸向連接於該底座211之頂面的一延伸柄212,於該底座211的底部係開設有一呈階級圓柱狀的容置槽213,於該容置槽213的側壁係凹設有一卡槽214,該兩壓縮彈簧22係分別對應地抵靠於該延伸柄212之頂面與該底座211的頂面,並容置於該夾持座11之容置空間112內,藉由該兩壓縮彈簧22使該移動座21可於該容置空間112內沿軸向平移動作;該調校桿23係對應設置於該底座211之容置槽213內,且該調校桿23係具有一抵靠柱231及軸向地設置於該抵靠柱231之頂面的一套桿232,該抵靠柱231於底部係形成一呈傾斜狀的抵靠面2311,並於該抵靠柱231之外周面係開設有一對應於該底座211之卡槽214的卡制塊233,該調校桿23係於該套桿232套設結合該緩衝彈簧24,藉由該緩衝彈簧24之彈力於該容置槽213內作動,並以該調校桿23之卡制塊233卡嵌於該底座211之卡槽214,使該調校桿23不會產生轉動,而隨著該移動座21做同軸向的平移。 In order to be able to understand the technical features and practical functions of the present invention in detail, and in accordance with the contents of the specification, the present invention is further described in the following preferred embodiments. For the deviation adjustment structure, please refer to the preferred embodiment of FIG. 1 to FIG. 3, which includes a housing assembly 10, a calibration assembly 20, and a measurement assembly 30, wherein: as shown in FIG. 1 and FIG. The outer casing group 10 includes a clamping seat 11 and a ring cover 12, and the axial position of the outer casing group 10 is defined as a Z-axis, and the clamping seat 11 is a hollow cylindrical shell of a class cylindrical shape, and the clamping seat 11 A receiving handle 110 is formed on the upper end, and an opening 111 is formed in the bottom portion, and an accommodating space 112 communicating with the opening 111 is formed in the clamping seat 11 to form an outer peripheral surface of the bottom of the clamping seat 11. Threading, the ring cover 12 is coupled to the bottom of the clamping seat 11 and is closed to the opening 111 of the clamping seat 11, the ring The cover 12 defines an opening 121 that communicates with the accommodating space 112 at the central portion. The aligning assembly 20 is disposed corresponding to the accommodating space 112 of the cradle 11 as shown in FIG. 2 and FIG. The adjustment assembly 20 includes a movable seat 21, two compression springs 22, a calibration rod 23 and a buffer spring 24, and the movable seat 21 is a class cylinder. And the movable seat 21 has a base 211 and an extending handle 212 axially connected to the top surface of the base 211. The bottom of the base 211 has a column-like shape. The accommodating groove 213 is recessed in the side wall of the accommodating groove 213, and the two compression springs 22 respectively abut against the top surface of the extending shank 212 and the top surface of the base 211, and The movement seat 21 is axially translatable in the accommodating space 112 by the two compression springs 22; the adjustment rod 23 is correspondingly disposed on the accommodating space 112 of the holder 11 The shank 211 is disposed in the receiving slot 213, and the adjusting rod 23 has an abutting post 231 and is axially disposed on the abutting post 231. a set of rods 232 on the top surface, the abutting post 231 defines a slanting abutting surface 2311 at the bottom, and a peripheral groove 214 corresponding to the base 211 is formed on the outer peripheral surface of the abutting post 231. The clamping block 233, the adjusting rod 23 is sleeved on the sleeve 232 and coupled with the buffer spring 24, and the spring of the buffer spring 24 is actuated in the receiving groove 213, and the card is adjusted by the adjusting rod 23 The block 233 is inserted into the slot 214 of the base 211 so that the adjustment lever 23 does not rotate, and the movable seat 21 performs the same axial translation.

如圖2及圖3所示,該量測組件30係設置於該外殼組10的內部並係抵靠於該調校組件20之調校桿23的下方,該量測組件30係包括有一轉動座31及穿設固定於該轉動座31之 一探針32,該轉動座31係呈半圓球狀,且係以呈平面的一端可轉動地抵靠於該移動座21的底部,並以呈球面的一端朝向該環蓋12之開孔121,並於中央開設有一裝設孔311,使該探針32穿設固定於該裝設孔311,並以一端凸出至該環蓋12之開孔121,該探針32係呈直立圓柱狀且具有兩端部,其中位於頂部的一端係為一抵針部321,另一端則係為一探針部322,該探針32係以該抵針部321抵靠於該調校桿23之抵靠面2311,該探針部322係用於量測工件用,利用該探針32與工件接觸的壓力壓抵該調校組件20產生位移來進行量測及誤差的計算。 As shown in FIG. 2 and FIG. 3, the measuring assembly 30 is disposed inside the outer casing group 10 and is disposed below the adjusting rod 23 of the adjusting assembly 20, and the measuring assembly 30 includes a rotation. The seat 31 and the piercing are fixed to the rotating seat 31 a probe 32, which is semi-spherical, and has a flat end rotatably abuts against the bottom of the movable seat 21, and has a spherical end toward the opening 121 of the ring cover 12. And a mounting hole 311 is defined in the center, and the probe 32 is disposed and fixed to the mounting hole 311, and protrudes to the opening 121 of the ring cover 12 at one end. The probe 32 is in an upright cylindrical shape. And having two ends, wherein one end of the top portion is an abutting portion 321 and the other end is a probe portion 322, and the probe 32 is fixed by the abutting portion 321 against the adjusting rod 23 The abutting surface 2311 is used for measuring a workpiece, and the pressure of the probe 32 in contact with the workpiece is pressed against the calibration component 20 to generate displacement for measurement and error calculation.

本發明較佳的實施方式如圖4所示,其係能夠將外殼組10之夾持座11夾持固定後,使該量測組件30之探針32向下抵靠接觸一工件40的一基準面41,藉由該探針32與該基準面41的接觸,而使該量測組件30向後推動該調校組件20,藉由該調校組件20之移動座21沿Z軸所產生的一位移距離,即能夠得知該工件40的偏差後,對此進行校正。 A preferred embodiment of the present invention is shown in FIG. 4, which is capable of clamping and holding the holder 11 of the outer casing group 10 such that the probe 32 of the measuring assembly 30 abuts against a workpiece 40. The reference surface 41, by the contact of the probe 32 with the reference surface 41, causes the measuring component 30 to push the adjustment component 20 backwards, and the movable seat 21 of the calibration component 20 is generated along the Z axis. After a displacement distance, that is, the deviation of the workpiece 40 can be known, this is corrected.

如圖5及圖6所示,其係為本發明用於測量量具誤差的使用方法,用於本身因加工製造、組裝或溫差、應力變化而造成量具誤差的一量測組件30A,其中假設該探針32A因製作過程不良而產生水平方向的量具誤差,因此需要進行量測量具誤差的動作後,對於量具誤差進行校正,如圖5所示,當該探針32A接觸至一工件40A之基準面41A時,因該探針32A本身的誤差造成轉動過程無法與該基準面41A貼齊,故如圖6所示移動本發明至將該探針32A靠抵至該基準面41A,並使該探針32A能夠靠著基準面41A旋轉,此時,該 量測組件30A之轉動座31A將會因該探針32A本身的誤差而於轉動時產生偏移,並且因該探針32A之抵針部321A因為與呈傾斜的該調校桿23之抵靠面2311接觸,使該調校組件20產生Z軸向的位移,如此一來,即可將該調校組件20於Z軸向的總位移換算得知該探針32A本身的偏移量,只需要於機台上調整補正後,即能夠彌補該探針32A本身所造成的量具誤差,而無需因此而更換該探針32A。 As shown in FIG. 5 and FIG. 6 , it is a method for measuring the gage error of the present invention, and is used for a measuring component 30A which itself causes a gage error due to processing manufacturing, assembly or temperature difference and stress variation, wherein it is assumed The probe 32A generates a gage error in the horizontal direction due to a poor manufacturing process. Therefore, after the measurement of the error is performed, the gage error is corrected, as shown in FIG. 5, when the probe 32A contacts the reference of a workpiece 40A. When the surface 41A is used, the rotation process cannot be aligned with the reference surface 41A due to the error of the probe 32A itself, so the present invention is moved as shown in FIG. 6 until the probe 32A abuts against the reference surface 41A, and the The probe 32A is rotatable against the reference surface 41A, at this time, The rotating base 31A of the measuring assembly 30A will be displaced during rotation due to the error of the probe 32A itself, and because the abutting portion 321A of the probe 32A abuts against the tilting adjustment lever 23 The surface 2311 is contacted to cause the adjustment assembly 20 to generate a displacement in the Z-axis. Thus, the offset of the probe 32A itself can be obtained by converting the total displacement of the calibration assembly 20 in the Z-axis. After the correction needs to be adjusted on the machine, the gage error caused by the probe 32A itself can be compensated without replacing the probe 32A.

本發明除了能夠用於量測具有量具誤差的該探針32A之外,只要該量測組件30的各零件有產生量具誤差,都能夠以同樣的方法進行量測並補正,相當地具有實用價值。 In addition to being able to measure the probe 32A having the gage error, the present invention can be measured and corrected in the same way as long as the components of the measuring component 30 have a gage error, which is quite practical. .

以上所述,僅是本發明的較佳實施例,並非對本發明作任何形式上的限制,任何所屬技術領域中具有通常知識者,若在不脫離本發明所提技術特徵的範圍內,利用本發明所揭示技術內容所作出局部更動或修飾的等效實施例,均仍屬於本發明技術特徵的範圍內。 The above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any one of ordinary skill in the art can use the present invention without departing from the technical features of the present invention. Equivalent embodiments of the local changes or modifications made by the disclosed technology are still within the scope of the technical features of the present invention.

10‧‧‧外殼組 10‧‧‧ Shell group

11‧‧‧夾持座 11‧‧‧Clamping seat

110‧‧‧夾持柄 110‧‧‧Clamping handle

111‧‧‧開口 111‧‧‧ openings

112‧‧‧容置空間 112‧‧‧ accommodating space

12‧‧‧環蓋 12‧‧‧ ring cover

121‧‧‧開孔 121‧‧‧Opening

20‧‧‧調校組件 20‧‧‧Revising components

21‧‧‧移動座 21‧‧‧Mobile seat

211‧‧‧底座 211‧‧‧Base

212‧‧‧延伸柄 212‧‧‧Extension handle

213‧‧‧容置槽 213‧‧‧ accommodating slots

214‧‧‧卡槽 214‧‧‧ card slot

22‧‧‧壓縮彈簧 22‧‧‧Compression spring

23‧‧‧調校桿 23‧‧‧ adjustment rod

231‧‧‧抵靠柱 231‧‧‧Abutment column

2311‧‧‧抵靠面 2311‧‧‧Abutment

232‧‧‧套桿 232‧‧‧ sets of rods

233‧‧‧卡制塊 233‧‧‧Card block

24‧‧‧緩衝彈簧 24‧‧‧buffer spring

30‧‧‧量測組件 30‧‧‧Measurement components

31‧‧‧轉動座 31‧‧‧ rotating seat

311‧‧‧裝設孔 311‧‧‧Installation holes

32‧‧‧探針 32‧‧‧ probe

321‧‧‧抵針部 321‧‧‧Neighboring

322‧‧‧探針部 322‧‧‧ Probe Department

40‧‧‧工件 40‧‧‧Workpiece

41‧‧‧基準面 41‧‧‧ datum

圖1係本發明較佳實施例的外觀圖。 BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is an external view of a preferred embodiment of the present invention.

圖2係本發明較佳實施例的分解圖。 Figure 2 is an exploded view of a preferred embodiment of the present invention.

圖3係本發明較佳實施例的剖面圖。 Figure 3 is a cross-sectional view of a preferred embodiment of the present invention.

圖4係本發明較佳實施例的量測動作示意圖。 Figure 4 is a schematic illustration of the measurement operation of the preferred embodiment of the present invention.

圖5係本發明之具有量測誤差之量測組件未靠抵基準面時的動作示意圖。 FIG. 5 is a schematic view showing the operation of the measuring component with the measurement error of the present invention when it is not against the reference surface.

圖6係本發明之具有量測誤差之量測組件靠抵基準面並帶動調校組件的動作示意圖。 FIG. 6 is a schematic diagram of the action of the measuring component with the measurement error of the invention against the reference surface and driving the calibration component.

10‧‧‧外殼組 10‧‧‧ Shell group

11‧‧‧夾持座 11‧‧‧Clamping seat

110‧‧‧夾持柄 110‧‧‧Clamping handle

111‧‧‧開口 111‧‧‧ openings

112‧‧‧容置空間 112‧‧‧ accommodating space

12‧‧‧環蓋 12‧‧‧ ring cover

121‧‧‧開孔 121‧‧‧Opening

20‧‧‧調校組件 20‧‧‧Revising components

21‧‧‧移動座 21‧‧‧Mobile seat

211‧‧‧底座 211‧‧‧Base

212‧‧‧延伸柄 212‧‧‧Extension handle

213‧‧‧容置槽 213‧‧‧ accommodating slots

214‧‧‧卡槽 214‧‧‧ card slot

22‧‧‧壓縮彈簧 22‧‧‧Compression spring

23‧‧‧調校桿 23‧‧‧ adjustment rod

231‧‧‧抵靠柱 231‧‧‧Abutment column

232‧‧‧套桿 232‧‧‧ sets of rods

233‧‧‧固定鍵 233‧‧‧fixed keys

24‧‧‧緩衝彈簧 24‧‧‧buffer spring

30‧‧‧量測組件 30‧‧‧Measurement components

31‧‧‧轉動座 31‧‧‧ rotating seat

311‧‧‧裝設孔 311‧‧‧Installation holes

32‧‧‧探針 32‧‧‧ probe

321‧‧‧抵針部 321‧‧‧Neighboring

322‧‧‧探針部 322‧‧‧ Probe Department

Claims (7)

一種定位量測裝置之偏差調校結構,包括:一外殼組,其係包括有一夾持座及一結合於該夾持座底部之環蓋,於該環蓋係開設有一開孔,且該外殼組之軸向位置定義為Z軸;一調校組件,其係對應設置於該夾持座並能夠沿著Z軸平移作動,該調校組件係包括有一設置於該夾持座內部且可沿軸向作動的移動座、至少一抵靠於支持座內部與移動座之間的壓縮彈簧及一設置於該移動座內部並可伸縮作動的調校桿,該調校桿係於底部具有一呈傾斜狀的抵靠面;一量測組件,其係設置於該外殼組的內部並係抵靠於該調校組件之調校桿的下方,該量測組件係包括有一可旋轉作動的轉動座及穿設固定於該轉動座之一探針,該探針係於頂部具有一抵針部,該探針係以該抵針部抵靠於該調校桿之抵靠面,利用該轉動座及該探針移動以帶動該調校組件的平移作動。 A deviation adjusting structure of the positioning measuring device comprises: a housing group comprising a clamping seat and a ring cover coupled to the bottom of the clamping seat, the opening of the ring cover, and the outer casing The axial position of the group is defined as a Z-axis; a calibration component is correspondingly disposed on the clamping seat and is capable of translational movement along the Z-axis, the calibration component includes a setting inside the clamping seat and along the An axially actuating movable seat, at least one compression spring abutting between the inner portion of the support base and the movable seat, and a adjusting rod disposed inside the movable seat and being telescopically actuable, the adjusting rod has a a slanting abutment surface; a measuring assembly disposed inside the outer casing group and resting under the aligning rod of the aligning assembly, the measuring assembly including a rotatable rotating seat And a probe fixed to the rotating base, the probe has an abutting portion at the top, and the probe abuts against the abutting surface of the adjusting rod by using the rotating seat And moving the probe to drive the translation of the calibration component. 如請求項1所述之定位量測裝置之偏差調校結構,其中該調校桿係具有一抵靠柱及軸向地設置於該抵靠柱之頂面的一套桿,該調校桿係於該套桿套設結合一緩衝彈簧,使該調校桿能夠伸縮作動。 The deviation adjustment structure of the positioning measuring device according to claim 1, wherein the adjustment rod has an abutting column and a set of rods axially disposed on a top surface of the abutting column, the adjustment rod The sleeve is sleeved with a buffer spring to enable the adjustment rod to be stretched and actuated. 如請求項2所述之定位量測裝置之偏差調校結構,其中該調校桿係與該移動座以凹凸卡制的方式結合定位,使該調校桿不會產生轉動。 The offset adjustment structure of the positioning measuring device according to claim 2, wherein the adjusting rod and the moving base are combined and positioned in a concave-convex manner, so that the adjusting rod does not rotate. 如請求項1、2或3所述之定位量測裝置之偏差調校結構,其中該移動座係呈階級圓柱狀,並具有一底座及軸 向連接於該底座之頂面的一延伸柄。 The deviation adjustment structure of the positioning measuring device according to claim 1, 2 or 3, wherein the moving seat is in a class cylindrical shape and has a base and a shaft An extension handle attached to the top surface of the base. 如請求項4所述之定位量測裝置之偏差調校結構,其中該調校組件係設有兩壓縮彈簧,該兩壓縮彈簧係分別對應地抵靠於該移動座之延伸柄之頂面與該底座之頂面。 The deviation adjusting structure of the positioning measuring device according to claim 4, wherein the adjusting component is provided with two compression springs respectively corresponding to the top surface of the extending handle of the moving seat and The top surface of the base. 如請求項5所述之定位量測裝置之偏差調校結構,其中該轉動座係呈半圓球狀,且係以呈平面的一端可轉動地抵靠於該移動座的底部,並以呈球面的一端朝向該環蓋之開孔。 The deviation adjusting structure of the positioning measuring device according to claim 5, wherein the rotating seat has a semi-spherical shape, and the flat end is rotatably abutted against the bottom of the moving seat, and is spherical One end faces the opening of the ring cover. 如請求項1、2或3所述之定位量測裝置之偏差調校結構,其中該轉動座係呈半圓球狀,且係以呈平面的一端可轉動地抵靠於該移動座的底部,並以呈球面的一端朝向該環蓋之開孔。 The deviation adjustment structure of the positioning measuring device according to claim 1, 2 or 3, wherein the rotating base is semi-spherical, and the flat end is rotatably abutted against the bottom of the moving seat. And the spherical end faces the opening of the ring cover.
TW101126159A 2012-07-20 2012-07-20 Bias adjustment structure of positioning measurement device TW201404519A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116984948A (en) * 2023-09-25 2023-11-03 中国航发沈阳黎明航空发动机有限责任公司 On-machine control method for overall impeller runner profile

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116984948A (en) * 2023-09-25 2023-11-03 中国航发沈阳黎明航空发动机有限责任公司 On-machine control method for overall impeller runner profile
CN116984948B (en) * 2023-09-25 2023-12-08 中国航发沈阳黎明航空发动机有限责任公司 On-machine control method for overall impeller runner profile

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