TW201400801A - Device and method for detecting mobile micro-articles based on chromatic aberration effect - Google Patents

Device and method for detecting mobile micro-articles based on chromatic aberration effect Download PDF

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TW201400801A
TW201400801A TW101121901A TW101121901A TW201400801A TW 201400801 A TW201400801 A TW 201400801A TW 101121901 A TW101121901 A TW 101121901A TW 101121901 A TW101121901 A TW 101121901A TW 201400801 A TW201400801 A TW 201400801A
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light
dispersive
lens
wavelength
micro object
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TW101121901A
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TWI468665B (en
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Che-Hsin Lin
Shin-Yu Su
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Univ Nat Sun Yat Sen
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Abstract

A device for detecting mobile micro-articles based on chromatic aberration effect and a method therefor are provided. The device includes a chromatic aberration lens with a low Abbe number for generating a chromatic aberration beam which passes through an emission lens for observing a mobile micro-article moving within a miniature transportation device. Scattering images of the mobile micro-article will be analyzed by a spectrometer unit and a calculation processing unit to obtain an intensity ratio of short/long wavelength lights in the scattering images. The intensity ratio is then rapidly compared to a predefined linear relationship curve between an axial depth of the mobile micro-article and the intensity ratio of short/long wavelength lights, so as to obtain a depth parameter (and the amount) of the mobile micro-article. Thus, the operation of detecting mobile micro-articles can be accelerated, and the device cost thereof can be lowered.

Description

利用光色散效應偵測動態微型物件之裝置及方法 Device and method for detecting dynamic miniature object by using light dispersion effect

本發明係關於一種偵測動態微型物件之裝置及方法,特別是關於一種利用光色散效應偵測動態微型物件之裝置及方法。 The present invention relates to an apparatus and method for detecting a dynamic miniature object, and more particularly to an apparatus and method for detecting a dynamic miniature object using a light dispersion effect.

現有光學檢測方式普遍使用於檢測各種精密微型元件的數量、表面輪廓或位置,例如應用半導體晶圓之表面缺陷檢測或生醫細胞儀之細胞計數等。 Existing optical detection methods are commonly used to detect the number, surface profile or position of various precision micro-components, such as surface defect detection using semiconductor wafers or cell counting of biomedical cytometers.

舉例來說,美國公告第7,224,540號發明專利揭示一種使用光色散(chromatic aberration)之場成像系統,其利用多個單色發光二極體(LED)光源混合創造出一軸向光源,接著再進行色散,並加強其景深,以增加成像解析度。再者,美國公告第5,785,651號發明專利揭示一種測距用共軛焦顯微鏡,其則是於共軛焦顯微鏡原理上使用多單色混成光作為光源,接著再進行色散,並以一針孔大小來控制解析度的參數,以利用光之色散來進行物件深度測量;上述發明專利同樣使用色散方式進行成像的改善或深度感測,但由於其光線皆設計在光路徑的後段才以色散元件進行色散,因而使其整體光學元件組無法使用既有光學顯微鏡為基礎來進行架設,結果造成整體光學元件組之架構過於複雜及製作成本過高。再者,以共軛焦顯微鏡原理來架構其整體光學元件組的問題 在於共軛焦顯微鏡僅能單點掃描,因此亦導致其檢測作業耗費時間。 For example, U.S. Patent No. 7,224,540 discloses a field imaging system using chromatic aberrations that utilizes a plurality of monochromatic light-emitting diode (LED) sources to create an axial source, which is then performed. Dispersion and enhance its depth of field to increase imaging resolution. In addition, U.S. Patent No. 5,785,651 discloses a conjugate focal length microscope for ranging, which uses multi-monochromatic mixed light as a light source on the principle of a conjugate focal microscope, followed by dispersion and a pinhole size. To control the resolution parameters to use the dispersion of light for object depth measurement; the above invention patent also uses the dispersion method for imaging improvement or depth sensing, but since the light is designed in the latter part of the light path, the dispersion element is used. Dispersion, so that the overall optical component group can not be erected based on the existing optical microscope, resulting in an overly complex structure of the overall optical component group and high production cost. Furthermore, the problem of constituting the entire optical component group by the principle of conjugate focal microscope In the conjugated focus microscope, only a single point scan can be performed, which also results in a time-consuming inspection operation.

故,有必要提供一種利用光色散效應偵測動態微型物件之裝置及方法,以解決習用技術所存在的問題。 Therefore, it is necessary to provide a device and method for detecting dynamic micro-objects by using the light dispersion effect to solve the problems of the conventional technology.

本發明之主要目的在於提供一種利用光色散效應偵測動態微型物件之裝置及方法,其係以一低阿貝數之色散透鏡來產生色散光束,該色散光束通過既有之顯微透鏡組(包含發射端物鏡)後可用以觀察移動中之動態微型物件;並在後續配合光譜分析單元及運算處理單元來分析動態微型物件之散射光影像中短/長波長之強度比,使該強度比與一預先繪製之微型物件之軸向深度與短/長波長強度比之線性關係圖進行快速比對分析,以取得各動態微型物件之深度參數(及數量),因此確實有利於加速偵測動態微型物件作業並降低所需設備成本。 The main object of the present invention is to provide an apparatus and method for detecting a dynamic micro object by using a light dispersion effect, which uses a low Abbe number dispersion lens to generate a dispersive beam that passes through an existing microlens group ( The transmitting end objective lens can be used to observe the moving dynamic micro object; and the spectral analysis unit and the arithmetic processing unit are used to analyze the short/long wavelength intensity ratio of the scattered light image of the dynamic micro object, so that the intensity ratio is A linear comparison of the axial depth of the pre-drawn micro-objects with the short/long wavelength intensity ratio is performed for quick comparison analysis to obtain the depth parameters (and quantities) of each dynamic micro object, so it is indeed beneficial to accelerate the detection of dynamic micro Work on objects and reduce the cost of equipment required.

為達上述之目的,本發明提供一種利用光色散效應偵測動態微型物件之裝置,其包含:一光源組,提供一軸向光束,至少包含一第一波長光及一第二波長光;一低阿貝數之色散透鏡,該軸向光束通過該色散透鏡後成為一色散光束;一發射端物鏡,用以將該色散光束之第一及第二波長光分別聚焦在同一軸向上之二不同光點位置,以照明 一輸送裝置中橫向移動通過該二光點附近的至少一微型物件,並對應產生至少一散射光影像;一接收端物鏡,用以接收該散射光影像;一光譜分析單元,用以分析該散射光影像中之第一及第二波長光的個別強度;以及一運算處理單元,其預先儲存有該微型物件之軸向深度與該第一/第二波長之強度比之間的一線性關係,並且用以計算該散射光影像中之第一及第二波長光的強度比並使其與該線性關係進行比對,以取得該微型物件之實際深度參數。 In order to achieve the above object, the present invention provides a device for detecting a dynamic micro object by using a light dispersion effect, comprising: a light source group, providing an axial beam comprising at least a first wavelength light and a second wavelength light; a dispersion lens having a low Abbe number, the axial beam passing through the dispersing lens becomes a dispersive beam; and an emitting end objective lens for focusing the first and second wavelengths of the dispersive beam respectively on the same axial direction Spot position to illuminate a transport device laterally moves through at least one micro object near the two spots, and correspondingly generates at least one scattered light image; a receiving end objective lens for receiving the scattered light image; and a spectral analysis unit for analyzing the scattering An individual intensity of the first and second wavelengths of light in the optical image; and an arithmetic processing unit pre-stored a linear relationship between an axial depth of the micro object and an intensity ratio of the first/second wavelength, And calculating an intensity ratio of the first and second wavelengths of the scattered light image and comparing the linear relationship with the linear relationship to obtain an actual depth parameter of the miniature object.

在本發明之一實施例中,該色散透鏡之阿貝數(Abbe number)係介於45至55之間。 In one embodiment of the invention, the Abbe number of the dispersive lens is between 45 and 55.

在本發明之一實施例中,該色散透鏡係由丙烯酸樹脂(acrylic resin)、聚碳酸脂(polycarbonate,PC)或聚對苯二甲酸二乙酯(polyethylene terephthalate,PET)製成之一雙凸透鏡。 In an embodiment of the invention, the dispersive lens is a lenticular lens made of an acrylic resin, a polycarbonate (PC) or a polyethylene terephthalate (PET). .

在本發明之一實施例中,該第一波長光之波長範圍介於450至460奈米(nm)之間;及該第二波長光之波長範圍介於670至680奈米之間。 In an embodiment of the invention, the wavelength of the first wavelength light ranges from 450 to 460 nanometers (nm); and the wavelength of the second wavelength light ranges from 670 to 680 nanometers.

在本發明之一實施例中,在該色散透鏡及發射端物鏡之間另設有一光束導引組。 In an embodiment of the invention, a beam guiding group is further disposed between the dispersing lens and the objective lens of the transmitting end.

在本發明之一實施例中,該光束導引組包含:一針孔擋板,具有一針孔,該色散光束聚焦於該針孔並通過該針孔; 一反射鏡,用以反射上述通過該針孔後之色散光束;一光場透鏡,上述反射後之色散光束通過該光場透鏡成為軸向平行傳輸之色散光束;以及一光學擋板,具有至少一狹縫,上述軸向平行傳輸之色散光束通過該狹縫以改變該色散光束之一橫截面形狀。 In an embodiment of the invention, the beam guiding group comprises: a pinhole baffle having a pinhole, the dispersive beam is focused on the pinhole and passes through the pinhole; a mirror for reflecting the dispersion beam passing through the pinhole; a light field lens, the reflected dispersion beam passing through the light field lens becomes an axially parallel transmission of the dispersion beam; and an optical baffle having at least A slit through which the axially parallel transmitted dispersive light beam passes to change a cross-sectional shape of the dispersive light beam.

在本發明之一實施例中,該光學擋板之狹縫係至少一弧形狹縫,該軸向平行傳輸之色散光束通過該弧形狹縫,以產生在橫向上呈弧形之至少一弧形色散光束。 In an embodiment of the invention, the slit of the optical baffle is at least one arcuate slit, and the axially parallel transmitted dispersive light beam passes through the arcuate slit to generate at least one curved in the lateral direction. Curved dispersion beam.

另一方面,本發明亦提供一種利用光色散效應偵測動態微型物件之方法,其包含步驟:提供一軸向光束,其至少包含一第一波長光及一第二波長光;使該軸向光束通過一低阿貝數之色散透鏡,而成為一色散光束;藉由一發射端物鏡將該色散光束之第一及第二波長光分別聚焦在同一軸向上之二不同光點位置,以照明一輸送裝置中橫向移動通過該二光點附近的至少一微型物件,並對應產生至少一散射光影像;利用一光譜分析單元分析該散射光影像中之第一及第二波長光的個別強度;以及藉由一運算處理單元計算該散射光影像中之第一及第二波長光的強度比,並使其與該運算處理單元預先儲存之該微型物件之軸向深度與該第一/第二波長之強度 比之間的一線性關係進行比對,以取得該微型物件之實際深度參數。 In another aspect, the present invention also provides a method for detecting a dynamic miniature object by using a light dispersion effect, comprising the steps of: providing an axial beam comprising at least a first wavelength light and a second wavelength light; The light beam passes through a low Abbe number dispersion lens to become a dispersive light beam; the first and second wavelength lights of the dispersive light beam are respectively focused by two emitters at two different spot positions in the same axial direction to illuminate Moving at least one micro object in the vicinity of the two light spots in a transport device, and correspondingly generating at least one scattered light image; analyzing the individual intensity of the first and second wavelength lights in the scattered light image by using a spectral analysis unit; And calculating, by an operation processing unit, an intensity ratio of the first and second wavelength lights in the scattered light image, and pre-storing the axial depth of the micro object with the operation processing unit and the first/second Wavelength intensity A linear relationship between the ratios is compared to obtain the actual depth parameters of the miniature object.

在本發明之一實施例中,在取得該微型物件之實際深度參數時,同時取得該微型物件之數量。 In an embodiment of the invention, the number of the miniature objects is simultaneously obtained when the actual depth parameter of the miniature object is obtained.

在本發明之一實施例中,該微型物件選自生物性微粒、半導體晶圓/晶片表面或其他微小電子元件。 In one embodiment of the invention, the micro-object is selected from the group consisting of bio-particles, semiconductor wafer/wafer surfaces, or other tiny electronic components.

為了讓本發明之上述及其他目的、特徵、優點能更明顯易懂,下文將特舉本發明較佳實施例,並配合所附圖式,作詳細說明如下。再者,本發明所提到的方向用語,例如「上」、「下」、「前」、「後」、「左」、「右」、「內」、「外」或「側面」等,僅是參考附加圖式的方向。因此,使用的方向用語是用以說明及理解本發明,而非用以限制本發明。 The above and other objects, features and advantages of the present invention will become more <RTIgt; Furthermore, the directional terms mentioned in the present invention, such as "upper", "lower", "before", "after", "left", "right", "inside", "outside" or "side", etc. Just refer to the direction of the additional schema. Therefore, the directional terminology used is for the purpose of illustration and understanding of the invention.

請參照第1圖所示,其揭示本發明較佳實施例之利用光色散效應偵測動態微型物件之裝置,該裝置係可應用於流式細胞儀之細胞計數、微流道晶片表面輪廓及缺陷檢測、半導體晶圓之表面輪廓及缺陷檢測或其他動態微型物件之檢測上,下文將以應用在一由微機電製程技術製作之一流式細胞儀為例進行說明,但其應用並不限於此。根據本實施例,該裝置主要包含:一光源組11、一低阿貝數之色散透鏡12、一光束導引組13、一發射端物鏡14、一接收端物鏡15、一多模光纖16、一光譜 分析單元17及一運算處理單元18。本發明將於下文利用第1及2A至2C圖逐一詳細說明較佳實施例之上述各元件的基本構造及其功能。 Please refer to FIG. 1 , which illustrates a device for detecting a dynamic micro object using a light dispersion effect according to a preferred embodiment of the present invention. The device can be applied to a cell counting of a flow cytometer, a surface profile of a micro flow channel wafer, and Defect detection, surface profile of semiconductor wafers and defect detection or other dynamic micro-objects detection, the following will be described as an example of a flow cytometer made by MEMS process technology, but its application is not limited to this. . According to the embodiment, the device mainly comprises: a light source group 11, a low Abbe number dispersion lens 12, a beam guiding group 13, a transmitting end objective lens 14, a receiving end objective lens 15, a multimode optical fiber 16, One spectrum The analyzing unit 17 and an arithmetic processing unit 18 are provided. The present invention will be described in detail below with reference to Figures 1 and 2A through 2C in detail to explain the basic construction and functions of the above-described elements of the preferred embodiment.

請參照第1圖所示,本發明較佳實施例之光源組11可選自一具有連續光譜之白色氙燈光源或是具有至少二種不同長、短波長之發光二極體(LED)的光源組,但並不限於此。在本實施例中,該光源組11例如選自白色氙燈光源,其提供可見光波長範圍之白光,亦即包含380至760奈米(nm)之波長範圍。藉此,該光源組11可提供在水平方向(橫向)上相互平行射出之一軸向光束21,該軸向光束21至少包含一第一波長光及一第二波長光,其分別係指一短波長光及一長波長光,例如是一可見藍光及一可見紅光。該第一波長光及一第二波長光可以分別指一個特定波長範圍或一個特定波長值。例如,該第一波長光之波長範圍可介於450至460奈米(nm)之間,且較佳為450奈米,但並不限於此;及該第二波長光之波長範圍可介於670至680奈米之間,且較佳為670奈米,但並不限於此。 Referring to FIG. 1, the light source group 11 of the preferred embodiment of the present invention may be selected from a white neon light source having a continuous spectrum or a light source having at least two different long and short wavelength light emitting diodes (LEDs). Group, but not limited to this. In the present embodiment, the light source group 11 is, for example, selected from a white xenon light source that provides white light in the visible wavelength range, that is, a wavelength range of 380 to 760 nanometers (nm). Thereby, the light source group 11 can provide an axial beam 21 which is emitted parallel to each other in the horizontal direction (lateral direction), and the axial beam 21 includes at least a first wavelength light and a second wavelength light, which respectively refer to The short-wavelength light and the long-wavelength light are, for example, a visible blue light and a visible red light. The first wavelength light and the second wavelength light may respectively refer to a specific wavelength range or a specific wavelength value. For example, the wavelength of the first wavelength light may range from 450 to 460 nanometers (nm), and preferably is 450 nanometers, but is not limited thereto; and the wavelength range of the second wavelength light may be It is between 670 and 680 nm, and preferably 670 nm, but is not limited thereto.

請再參照第1圖所示,本發明較佳實施例之低阿貝數之色散透鏡12係一雙凸透鏡,且係由阿貝數(Abbe number)介於45至55之間的材料製成,例如丙烯酸樹脂(acrylic resin)、聚碳酸脂(polycarbonate,PC)或聚對苯二甲酸二乙酯(polyethylene terephthalate,PET)製成之一雙凸透鏡。在本實施例中,該低阿貝數材料可取自 丙烯酸樹脂類之聚甲基丙烯酸甲酯(poly(methyl methacrylate),PMMA),其阿貝數約為52,但並不限於此。該低阿貝數之色散透鏡12的作用是使該軸向平行傳輸之軸向光束21通過該色散透鏡12後成為一軸向聚焦傳輸之色散光束22,也就是,在原本之軸向光束21中,若所有的光束是通過一無色散作用之透鏡時,則基本應具有相同之焦距位置(即光點位置);但若是通過該色散透鏡12,則在轉變成色散光束22後將使不同波長之光束(如第一及第二波長光)被散開成各自聚焦在不同之焦距位置(光點位置)。 Referring to FIG. 1 again, the low Abbe number dispersion lens 12 of the preferred embodiment of the present invention is a lenticular lens and is made of a material having an Abbe number between 45 and 55. For example, a lenticular lens made of an acrylic resin, a polycarbonate (PC) or a polyethylene terephthalate (PET). In this embodiment, the low Abbe number material can be taken from Poly(methyl methacrylate) (PMMA) having an Abbe number of about 52, but is not limited thereto. The low Abbe number dispersion lens 12 functions to pass the axially parallel transmitted axial beam 21 through the dispersing lens 12 to become an axially focused transmitted dispersive beam 22, that is, in the original axial beam 21 If all the beams pass through a lens without dispersion, they should have the same focal position (ie, spot position); but if they pass through the dispersive lens 12, they will be different after being converted into the dispersive beam 22. Wavelength beams (such as first and second wavelengths of light) are scattered to focus on different focal length positions (spot position).

請再參照第1圖所示,本發明較佳實施例之光束導引組13係設置在該色散透鏡12及發射端物鏡14之間,主要用以導引該色散光束22之行進方向,其中該光束導引組13包含:一針孔擋板131、一反射鏡132、一光場透鏡133及一光學擋板134。在本實施例中,該針孔擋板131係一不透光之擋板且具有一針孔131a,其中該針孔131a之直徑介於0.1至2毫米(mm)之間,例如為1毫米。來自該色散透鏡12之色散光束22因該色散透鏡12之雙凸透鏡特性而聚焦在該針孔131a的平面上,並穿過該針孔131a後放射到該反射鏡132上。藉由調整該針孔擋板131之針孔131a的尺寸大小可快速改變後續偵測用光點之直徑大小。再者,該反射鏡132用以反射上述通過該針孔131a後之色散光束22,使該色散光束22由水平方向(橫向)改變成垂直方向(縱 向),並向下射向該光場透鏡133。該光場透鏡133係一雙凸透鏡,上述針孔131a之位置係位於該色散透鏡12及該光場透鏡133兩者的焦平面上。該光場透鏡133係可使上述反射後之色散光束22在通過該光場透鏡133時改變成為軸向傳輸且實質相互平行之色散光束22。 Referring to FIG. 1 again, the beam guiding group 13 of the preferred embodiment of the present invention is disposed between the dispersing lens 12 and the transmitting end objective lens 14 for guiding the traveling direction of the dispersive light beam 22, wherein The beam guiding group 13 includes a pinhole baffle 131, a mirror 132, a light field lens 133 and an optical baffle 134. In this embodiment, the pinhole baffle 131 is a light-tight baffle and has a pinhole 131a, wherein the pinhole 131a has a diameter of between 0.1 and 2 millimeters (mm), for example, 1 mm. . The dispersive light beam 22 from the dispersing lens 12 is focused on the plane of the pinhole 131a due to the lenticular characteristics of the dispersing lens 12, and passes through the pinhole 131a and is radiated onto the mirror 132. By adjusting the size of the pinhole 131a of the pinhole shutter 131, the diameter of the subsequent detection spot can be quickly changed. Furthermore, the mirror 132 is configured to reflect the dispersion beam 22 passing through the pinhole 131a, and the dispersion beam 22 is changed from a horizontal direction (lateral direction) to a vertical direction (longitudinal direction). Towards, and directed downward toward the light field lens 133. The light field lens 133 is a lenticular lens, and the position of the pinhole 131a is located on a focal plane of both the dispersion lens 12 and the light field lens 133. The light field lens 133 is such that the reflected dispersed light beam 22 is changed to a dispersive light beam 22 that is axially transmitted and substantially parallel to each other as it passes through the light field lens 133.

再者,請另參照第2A、2B及2C圖所示,該光學擋板134係一不透光之擋板且具有至少一狹縫134a,該狹縫134a可以是二對稱設置之弧形狹縫、單一弧形狹縫或一針孔,但並不限於此。基於第2A、2B及2C圖之狹縫134a的不同形狀設計,上述軸向平行傳輸之色散光束22進一步通過該狹縫134a後可以改變該色散光束22在水平方向(橫向)上之一橫截面形狀,以便調控進入該發射端物鏡14時的光學路徑。例如,在該第2A圖中,該光學擋板134之狹縫134a係二弧形狹縫,該二弧形狹縫之排列方向係平行於一輸送裝置30橫向移動該微型物件40之輸送方向(如第1圖之由右至左之方向),該軸向平行傳輸之色散光束22通過該二弧形狹縫134a,以產生在橫向上呈弧形之至少一弧形色散光束(未繪示),但該弧形色散光束在垂直方向(縱向)仍維持軸向平行傳輸之特性。 In addition, as shown in FIGS. 2A, 2B, and 2C, the optical baffle 134 is an opaque baffle and has at least one slit 134a. The slit 134a may be a symmetrically arranged arc. A slit, a single curved slit or a pinhole, but is not limited thereto. Based on the different shape design of the slits 134a of FIGS. 2A, 2B, and 2C, the axially parallel transmitted dispersive light beam 22 further passes through the slit 134a to change a cross section of the dispersive light beam 22 in the horizontal direction (lateral direction). The shape is to regulate the optical path when entering the objective lens 14 of the transmitting end. For example, in FIG. 2A, the slit 134a of the optical baffle 134 is a two-arc slit, and the arrangement direction of the two arc-shaped slits is parallel to a conveying device 30 to laterally move the conveying direction of the micro-object 40. (as in the right-to-left direction of Fig. 1), the axially parallel transmitted dispersive beam 22 passes through the two arcuate slits 134a to produce at least one arc-shaped dispersive beam that is curved in the lateral direction (not drawn) Shown, but the arc-shaped dispersive beam maintains the characteristics of axial parallel transmission in the vertical direction (longitudinal direction).

請再參照第1圖所示,本發明較佳實施例之發射端物鏡14較佳具有一高數值孔徑(numerical aperture,N.A.)之顯微鏡物鏡。在本實施例中,該發射端物鏡14之數值孔徑值(N.A.value)係設定介於0.7至1.2之間, 例如較佳為0.75。該發射端物鏡14之入射瞳徑(entrance pupil)係介於10毫米(mm)至20毫米之間,例如較佳為15毫米。再者,該發射端物鏡14之倍率為4至100倍,例如為20倍;其工作距離(working distance,W.D.)為1毫米;及其焦距(focal length,f0)例如為10毫米,但並不限於此。該發射端物鏡14用以將上述軸向平行傳輸之弧形色散光束(未繪示)轉換成軸向聚焦傳輸之圓錐色散光束23。 Referring to FIG. 1 again, the transmitting end objective lens 14 of the preferred embodiment of the present invention preferably has a high numerical aperture (NA) microscope objective lens. In the present embodiment, the numerical aperture value (NAvalue) of the transmitting end objective lens 14 is set to be between 0.7 and 1.2, for example, preferably 0.75. The entrance pupil of the transmitting end objective lens 14 is between 10 millimeters (mm) and 20 millimeters, for example, preferably 15 millimeters. Furthermore, the emission end objective lens 14 has a magnification of 4 to 100 times, for example 20 times; its working distance (WD) is 1 mm; and its focal length ( f0 ) is, for example, 10 mm, but Not limited to this. The transmitting end objective lens 14 is configured to convert the axially parallel transmitted arc-shaped dispersive light beam (not shown) into an axially focused transmitted conical dispersion beam 23.

請參照第1及3A圖所示,假設原本之色散光束22是由白光分散成多種不同波長之色光(例如紅光R、橙光O、黃光Y、綠光G、藍光B、紫光V等),則這些不同波長之色光將在同一軸向上分別聚焦於數個不同光點(焦距)位置上。此時,可以將同一軸向上之最上方及最下方光點之間定義出的一段距離設定為一有效的軸向偵測區域24(即所有色光之光點附近區域),該軸向偵測區域24係剛好對應落於一輸送裝置30用以輸送至少一微型物件40的橫向移動路徑上,因此這些不同波長之色光的多個光點剛好可用以照明剛好移動通過某一軸向位置的微型物件40,並對應產生至少一散射光影像25。該微型物件40可以指生物性微粒、半導體晶圓/晶片表面或其他微小電子元件(如晶片電阻等),所述生物性微粒例如為細胞、生物性微粒、化合物、微膠囊、微脂體、DNA片段或蛋白質片段等。在本實施例中,例如選自粒徑介於2至200微米(μm)之間的細胞或其他 生物性微粒,其粒徑例如為2、5、10、20、30、50、70、80、100、125、150、175、200微米等。 Referring to Figures 1 and 3A, it is assumed that the original dispersion beam 22 is dispersed by white light into a plurality of different wavelengths of color light (for example, red light R, orange light O, yellow light Y, green light G, blue light B, violet light V, etc.) ), these different wavelengths of color light will be respectively focused on several different spot (focal length) positions in the same axial direction. At this time, a distance defined between the uppermost and lowermost spots on the same axial direction can be set as an effective axial detection area 24 (ie, the vicinity of the spot of all color lights), the axial detection The region 24 is exactly corresponding to the lateral movement path of the delivery device 30 for transporting the at least one micro-object 40, so that the plurality of spots of the different wavelengths of color light can be used to illuminate the micro-just moving through an axial position. The object 40, and correspondingly generates at least one scattered light image 25. The micro object 40 may refer to biological particles, semiconductor wafer/wafer surface or other tiny electronic components (such as wafer resistors, etc.), such as cells, biological particles, compounds, microcapsules, liposomes, DNA fragments or protein fragments, etc. In this embodiment, for example, a cell selected from a particle size of between 2 and 200 micrometers (μm) or other The biological particles have a particle diameter of, for example, 2, 5, 10, 20, 30, 50, 70, 80, 100, 125, 150, 175, 200 μm or the like.

請再參照第1、3A及3B圖所示,本發明較佳實施例之接收端物鏡15具有一相對較低之數值孔徑,其係小於該發射端物鏡14的數值孔徑值,例如較佳為0.45。該接收端物鏡15之出射瞳徑(exit pupil)係介於10毫米(mm)至20毫米之間,例如較佳為15毫米。再者,該接收端物鏡4之倍率例如為20倍、工作距離(W.D.)為1毫米,及焦距(f0)為10毫米,但並不限於此。該接收端物鏡15即用以接收該散射光影像25,且可以經由該多模光纖16將該散射光影像25傳輸至該光譜分析單元17進行該散射光影像25之光譜分析,以分析獲得通過該軸向偵測區域24之不同軸向位置(+50μm~-50μm)之該微型物件40所產生的散射光影像25所帶有的所有色光成份(含第一/第二波長光)之個別強度值。 Referring to Figures 1, 3A and 3B again, the receiving end objective lens 15 of the preferred embodiment of the present invention has a relatively low numerical aperture which is smaller than the numerical aperture value of the transmitting end objective lens 14, for example, preferably 0.45. The exit pupil of the receiving end objective lens 15 is between 10 millimeters (mm) and 20 millimeters, for example, preferably 15 millimeters. Further, the magnification of the receiving end objective lens 4 is, for example, 20 times, the working distance (WD) is 1 mm, and the focal length ( f0 ) is 10 mm, but is not limited thereto. The receiving end objective lens 15 is configured to receive the scattered light image 25, and the scattered light image 25 can be transmitted to the spectrum analyzing unit 17 via the multimode optical fiber 16 to perform spectral analysis of the scattered light image 25 for analysis and obtaining Each of the color light components (including the first/second wavelength light) carried by the scattered light image 25 generated by the micro object 40 of the axial detection region 24 at different axial positions (+50 μm~-50 μm) Strength value.

如第3A圖所示,按照該微型物件40(粒徑為20μm)通過該軸向偵測區域24之軸向位置的不同(+50μm~-50μm),該散射光影像25所帶有的色光成份(例如紅光R、橙光O、黃光Y、綠光G、藍光B、紫光V等)及各色光成份之強度也不同。如第3B圖所示,利用該光譜分析單元17可分析獲得通過該軸向偵測區域24之不同軸向位置(+20μm~-20μm)之該微型物件40所產生的散射光影像25所帶有的所有色光成份(含第一/第二波長光)之強度值曲線圖(色光波長v.s.標準強度 值),其中在不同軸向位置(+20μm~-20μm)之該微型物件40所產生的散射光影像25所帶有的第一/第二波長光(分別為450及670奈米)之強度值具有明顯的強度差異,因此可在後續以第一/第二波長光之強度比來做為計算該微型物件40所在之軸向位置(即軸向深度)的參考依據。 As shown in FIG. 3A, according to the difference in the axial position (+50 μm~-50 μm) of the axial detecting region 24 according to the micro object 40 (particle size 20 μm), the colored light of the scattered light image 25 is Ingredients (such as red light R, orange light O, yellow light Y, green light G, blue light B, violet light V, etc.) and the intensity of each color light component are also different. As shown in FIG. 3B, the spectral analysis unit 17 can analyze and obtain the scattered light image 25 generated by the micro object 40 passing through different axial positions (+20 μm~-20 μm) of the axial detection region 24. A graph of the intensity values of all the color components (including the first/second wavelength light) (color wavelength vs standard intensity) Value), wherein the intensity of the first/second wavelength light (450 and 670 nm, respectively) carried by the scattered light image 25 generated by the micro object 40 at different axial positions (+20 μm~-20 μm) The value has a significant intensity difference, so the intensity ratio of the first/second wavelength light can be used as a reference for calculating the axial position (ie, the axial depth) of the micro-object 40.

請再參照第1、4A、4B及4C圖所示,本發明較佳實施例之運算處理單元18較佳係為一適當型態之電腦,例如桌上型電腦、筆記型電腦、伺服器電腦、個人數位助理(PDA)機或平板電腦等。該運算處理單元18用以預先記錄通過該軸向偵測區域24之已知軸向位置(+50μm~-50μm)之該微型物件40所產生的散射光影像25所帶有的第一/第二波長光(450/670奈米)之強度值資料(如第4A圖所示),接著即可預定義出該微型物件40之軸向深度與該第一/第二波長光之強度比之間的一線性關係(如第4B圖所示)。 Referring to Figures 1, 4A, 4B and 4C again, the arithmetic processing unit 18 of the preferred embodiment of the present invention is preferably a computer of a suitable type, such as a desktop computer, a notebook computer, or a server computer. , personal digital assistant (PDA) or tablet. The operation processing unit 18 is configured to pre-record the first/first of the scattered light image 25 generated by the micro object 40 passing through the known axial position (+50 μm~-50 μm) of the axial detection region 24. The intensity value data of the two-wavelength light (450/670 nm) (as shown in FIG. 4A) can then be predefined to determine the axial depth of the micro object 40 and the intensity of the first/second wavelength light. A linear relationship between them (as shown in Figure 4B).

值得注意的是,如第4B圖所示之軸向深度與強度比之線性關係是在該微型物件40之粒徑大小維持固定值(20μm)的情況下所作的結果。如第4C圖所示,若觀測不同粒徑大小(7、15、20μm)之微型物件40的散射光影像25,則可得到不同的軸向深度與強度比之線性關係,其中在第4C圖中因實驗採用的輸送裝置30之介質材料(空氣)不同於第4B圖(玻璃),故其得到的20μm粒徑之微型物件40之線性關係數據因此未匹配於第4B圖之線 性關係數據。 It is to be noted that the linear relationship between the axial depth and the intensity ratio as shown in Fig. 4B is a result obtained in the case where the particle size of the micro object 40 is maintained at a fixed value (20 μm). As shown in Fig. 4C, if the scattered light image 25 of the micro object 40 of different particle sizes (7, 15, 20 μm) is observed, a linear relationship between different axial depths and intensity ratios can be obtained, wherein in Fig. 4C The medium material (air) of the conveying device 30 used in the experiment is different from the material of FIG. 4B (glass), so the linear relationship data of the obtained micro-object 40 having a particle diameter of 20 μm is therefore not matched with the line of FIG. 4B. Sexual relationship data.

再者,請參照第5A及5B圖所示,本發明較佳實施例之運算處理單元18在實際操作時則可在每一時間點記錄每一通過該軸向偵測區域24之微型物件40的總色光強度(如第5A圖所示),接著由總色光強度中分析得到第一/第二波長光之實際強度比;隨後,再以該第一/第二波長光之實際強度比來根據第4B或4C圖所示之軸向深度與強度比之線性關係進行比對,進而對應計算得知每一微型物件40通過該軸向偵測區域24時所在之軸向位置(即軸向深度)為何(如第5B圖所示)。同時,由第5A圖之每一強度比峰值亦可得知通過該軸向偵測區域24之微型物件40的數量。 Furthermore, referring to FIGS. 5A and 5B, the arithmetic processing unit 18 of the preferred embodiment of the present invention can record each of the miniature objects 40 passing through the axial detection region 24 at each time point during actual operation. The total intensity of the light (as shown in Figure 5A), and then the actual intensity ratio of the first/second wavelength light is analyzed from the total color intensity; subsequently, the actual intensity ratio of the first/second wavelength light is used According to the linear relationship between the axial depth and the intensity ratio shown in FIG. 4B or 4C, the axial position of each of the micro-objects 40 passing through the axial detection region 24 (ie, the axial direction) is calculated correspondingly. Depth) (as shown in Figure 5B). At the same time, the number of miniature objects 40 passing through the axial detection region 24 can also be known from each intensity ratio peak of FIG. 5A.

因此,根據第1至5B圖所述之利用光色散效應偵測動態微型物件之裝置,本發明較佳實施例亦提供一種利用光色散效應偵測動態微型物件之方法,其包含下述步驟:(S10)、提供一軸向光束21,其至少包含一第一波長光及一第二波長光;(S20)、使該軸向光束21通過一低阿貝數之色散透鏡12,而成為一色散光束22;(S30)、藉由一發射端物鏡14將該色散光束22之第一及第二波長光分別聚焦在同一軸向上之二不同光點位置,以照明一輸送裝置30中橫向移動通過該二光點附近的至少一微型物件40,並對應產生至少一散射光 影像25;(S40)、利用一光譜分析單元17分析該散射光影像25中之第一及第二波長光的個別強度;以及(S50)、藉由一運算處理單元18計算該散射光影像25中之第一及第二波長光的強度比,並使該強度比與該運算處理單元18預先儲存之該微型物件40之軸向深度與該第一/第二波長之強度比之間的一線性關係進行比對,以取得該微型物件40之實際深度參數(及通過該輸送裝置30之微型物件40的總數量)。 Therefore, according to the apparatus for detecting a dynamic micro object using the light dispersion effect according to the first to fifth embodiments, the preferred embodiment of the present invention also provides a method for detecting a dynamic micro object by using a light dispersion effect, which comprises the following steps: (S10) providing an axial beam 21 comprising at least a first wavelength light and a second wavelength light; (S20), passing the axial beam 21 through a low Abbe number dispersion lens 12 to become a Dispersing the light beam 22; (S30), focusing the first and second wavelengths of the dispersive light beam 22 on two different spot positions in the same axial direction by a transmitting end objective lens 14 to illuminate a lateral movement in a conveying device 30 Passing at least one micro object 40 in the vicinity of the two spots, and correspondingly generating at least one scattered light Image 25; (S40) analyzing the individual intensity of the first and second wavelength lights in the scattered light image 25 by using a spectral analysis unit 17; and (S50) calculating the scattered light image by an arithmetic processing unit 18 The intensity ratio of the first and second wavelengths of light, and the intensity ratio is a line between the axial depth of the micro object 40 and the intensity ratio of the first/second wavelength stored in advance by the arithmetic processing unit 18. The sexual relationships are compared to obtain the actual depth parameters of the miniature object 40 (and the total number of miniature objects 40 passing through the delivery device 30).

如上所述,相較於習用之使用光色散之場成像系統及測距用共軛焦顯微鏡存在結構複雜、成本過高、僅能單點掃描及檢測耗時等缺點,第1圖之本發明係以一低阿貝數之色散透鏡12來產生色散光束,該色散光束通過既有之顯微透鏡組(至少包含發射端物鏡14)後可用以觀察移動中之動態微型物件(例如生物性微粒、半導體晶圓/晶片表面或其他微小電子元件等);並在後續配合光譜分析單元17及運算處理單元18來分析動態微型物件40之散射光影像中短/長波長之強度比,使該強度比與一預先繪製之微型物件之軸向深度與短/長波長強度比之線性關係圖進行快速比對分析,以取得各動態微型物件40之深度參數(及數量),因此確實有利於加速偵測動態微型物件作業並降低所需設備成本。 As described above, the field imaging system using the light dispersion and the conjugate focal length microscope for ranging have disadvantages such as a complicated structure, an excessive cost, a single point scanning, and a time-consuming detection, and the present invention of FIG. 1 A dispersion lens 12 having a low Abbe number is used to generate a dispersive beam that can be used to observe moving micro-objects (eg, biological particles) through an existing microlens group (including at least the emitter objective 14). And a semiconductor wafer/wafer surface or other tiny electronic component, etc.; and subsequently cooperate with the spectral analysis unit 17 and the arithmetic processing unit 18 to analyze the intensity ratio of the short/long wavelength in the scattered light image of the dynamic micro object 40, so that the intensity Fast comparison analysis with a linear relationship between the axial depth and the short/long wavelength intensity ratio of a pre-drawn micro object to obtain the depth parameter (and quantity) of each dynamic micro object 40, thus indeed facilitating the acceleration detection Measure dynamic miniature object operations and reduce the cost of equipment required.

雖然本發明已以較佳實施例揭露,然其並非用以限制本發明,任何熟習此項技藝之人士,在不脫離本發明 之精神和範圍內,當可作各種更動與修飾,因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed in its preferred embodiments, it is not intended to limit the invention, and those skilled in the art, without departing from the invention The scope of the present invention is defined by the scope of the appended claims.

11‧‧‧光源組 11‧‧‧Light source group

12‧‧‧色散透鏡 12‧‧‧Dispersion lens

13‧‧‧光束導引組 13‧‧‧beam guiding group

131‧‧‧針孔擋板 131‧‧‧ pinhole baffle

131a‧‧‧針孔 131a‧‧ pinhole

132‧‧‧反射鏡 132‧‧‧Mirror

133‧‧‧光場透鏡 133‧‧‧Light field lens

134‧‧‧光學擋板 134‧‧‧ optical baffle

134a‧‧‧狹縫 134a‧‧‧slit

14‧‧‧發射端物鏡 14‧‧‧transmitting objective

15‧‧‧接收端物鏡 15‧‧‧ receiving end objective

16‧‧‧多模光纖 16‧‧‧Multimode fiber

17‧‧‧光譜分析單元 17‧‧‧Spectral Analysis Unit

18‧‧‧運算處理單元 18‧‧‧Operation Processing Unit

21‧‧‧軸向光束 21‧‧‧Axial beam

22‧‧‧色散光束 22‧‧‧Dispersed light beam

23‧‧‧圓錐色散光束 23‧‧‧Cone dispersive beam

24‧‧‧軸向偵測區域 24‧‧‧Axial detection area

25‧‧‧散射光影像 25‧‧‧scattered light image

30‧‧‧輸送裝置 30‧‧‧Conveyor

40‧‧‧微型物件 40‧‧‧Micro Objects

第1圖:本發明較佳實施例之利用光色散效應偵測動態微型物件之裝置之示意圖。 Figure 1 is a schematic illustration of an apparatus for detecting dynamic miniature objects using light dispersion effects in accordance with a preferred embodiment of the present invention.

第2A、2B及2C圖:本發明較佳實施例之各種類型光學擋板之上視圖。 2A, 2B, and 2C are top views of various types of optical baffles in accordance with a preferred embodiment of the present invention.

第3A圖:本發明較佳實施例之微型物件通過軸向偵測區域之不同軸向位置(+50μm~-50μm)所產生的散射光影像之顯微照相圖。 Figure 3A is a photomicrograph of a scattered light image produced by a miniature object of the preferred embodiment of the present invention through different axial positions (+50 μm - 50 μm) of the axial detection region.

第3B圖:本發明較佳實施例通過不同軸向位置(+20μm~-20μm)之微型物件所產生的散射光影像所帶有的所有色光成份之強度值曲線圖(色光波長v.s.標準強度值)。 FIG. 3B is a graph showing the intensity values of all the color components of the scattered light image generated by the miniature objects of different axial positions (+20 μm to -20 μm) according to a preferred embodiment of the present invention (color wavelength vs standard intensity value) ).

第4A圖:本發明較佳實施例通過已知軸向位置(+50μm~-50μm)之微型物件產生的散射光影像所帶有的第一/第二波長光(450/670奈米)之強度值曲線圖(軸向深度v.s.強度值)。 Fig. 4A is a view showing a first/second wavelength light (450/670 nm) carried by a scattered light image produced by a micro object having a known axial position (+50 μm to 50 μm) according to a preferred embodiment of the present invention. Intensity value graph (axial depth vs intensity value).

第4B圖:本發明較佳實施例之微型物件(粒徑20μm)之軸向深度與第一/第二波長光之強度比之間的線性關係圖(軸向深度v.s.強度比)。 Fig. 4B is a graph showing the linear relationship between the axial depth of the micro object (particle size 20 μm) and the intensity ratio of the first/second wavelength light (axial depth v.s. intensity ratio) of the preferred embodiment of the present invention.

第4C圖:本發明較佳實施例之微型物件(粒徑7、15、20μm)之軸向深度與第一/第二波長光之強度比之間 的線性關係圖(軸向深度v.s.強度比)。 Figure 4C: between the axial depth of the miniature object (particle size 7, 15, 20 μm) and the intensity ratio of the first/second wavelength light of the preferred embodiment of the present invention Linear relationship (axial depth v.s. intensity ratio).

第5A圖:本發明較佳實施例在每一時間點記錄每一通過軸向偵測區域之微型物件的總色光強度之統計圖(強度v.s.時間)。 Figure 5A: A preferred embodiment of the present invention records a statistical graph (intensity v.s. time) of the total color intensity of each of the miniature objects passing through the axial detection zone at each point in time.

第5B圖:本發明較佳實施例之每一微型物件通過軸向偵測區域時所在之軸向位置之統計圖(軸向深度v.s.時間)。 Figure 5B is a graph (axial depth v.s. time) of the axial position of each of the miniature objects in the preferred embodiment of the present invention as it passes through the axial detection region.

11‧‧‧光源組 11‧‧‧Light source group

12‧‧‧色散透鏡 12‧‧‧Dispersion lens

13‧‧‧光束導引組 13‧‧‧beam guiding group

131‧‧‧針孔擋板 131‧‧‧ pinhole baffle

131a‧‧‧針孔 131a‧‧ pinhole

132‧‧‧反射鏡 132‧‧‧Mirror

133‧‧‧光場透鏡 133‧‧‧Light field lens

134‧‧‧光學擋板 134‧‧‧ optical baffle

14‧‧‧發射端物鏡 14‧‧‧transmitting objective

15‧‧‧接收端物鏡 15‧‧‧ receiving end objective

16‧‧‧多模光纖 16‧‧‧Multimode fiber

17‧‧‧光譜分析單元 17‧‧‧Spectral Analysis Unit

18‧‧‧運算處理單元 18‧‧‧Operation Processing Unit

21‧‧‧軸向光束 21‧‧‧Axial beam

22‧‧‧色散光束 22‧‧‧Dispersed light beam

23‧‧‧圓錐色散光束 23‧‧‧Cone dispersive beam

24‧‧‧軸向偵測區域 24‧‧‧Axial detection area

25‧‧‧散射光影像 25‧‧‧scattered light image

30‧‧‧輸送裝置 30‧‧‧Conveyor

40‧‧‧微型物件 40‧‧‧Micro Objects

Claims (10)

一種利用光色散效應偵測動態微型物件之裝置,其包含:一光源組,提供一軸向光束,至少包含一第一波長光及一第二波長光;一低阿貝數之色散透鏡,該軸向光束通過該色散透鏡後成為一色散光束;一發射端物鏡,用以將該色散光束之第一及第二波長光分別聚焦在同一軸向上之二不同光點位置,以照明一輸送裝置中橫向移動通過該二光點附近的至少一微型物件,並對應產生至少一散射光影像;一接收端物鏡,用以接收該散射光影像;一光譜分析單元,用以分析該散射光影像中之第一及第二波長光的個別強度;以及一運算處理單元,其預先儲存有該微型物件之軸向深度與該第一/第二波長之強度比之間的一線性關係,並且用以計算該散射光影像中之第一及第二波長光的強度比並使其與該線性關係進行比對,以取得該微型物件之實際深度參數。 A device for detecting a dynamic micro object by using a light dispersion effect, comprising: a light source group, providing an axial beam, comprising at least a first wavelength light and a second wavelength light; and a low Abbe number dispersion lens, The axial beam passes through the dispersing lens to form a dispersive beam; a transmitting end objective lens is used to focus the first and second wavelengths of the dispersive beam respectively at two different spot positions in the same axial direction to illuminate a conveying device Moving laterally through at least one micro object near the two spots, and correspondingly generating at least one scattered light image; a receiving end objective for receiving the scattered light image; and a spectral analyzing unit for analyzing the scattered light image An individual intensity of the first and second wavelengths of light; and an arithmetic processing unit pre-stored a linear relationship between an axial depth of the micro object and an intensity ratio of the first/second wavelength, and Calculating an intensity ratio of the first and second wavelengths of light in the scattered light image and comparing the linear relationship to the linear relationship to obtain an actual depth parameter of the miniature object. 如申請專利範圍第1項所述之利用光色散效應偵測動態微型物件之裝置,其中該色散透鏡之阿貝數係介於45至55之間。 The apparatus for detecting a dynamic micro object using the light dispersion effect according to the first aspect of the patent application, wherein the dispersion lens has an Abbe number of between 45 and 55. 如申請專利範圍第2項所述之利用光色散效應偵測動態微型物件之裝置,其中該色散透鏡係由丙烯酸樹 脂、聚碳酸脂或聚對苯二甲酸二乙酯製成之一雙凸透鏡。 A device for detecting a dynamic micro object using a light dispersion effect as described in claim 2, wherein the dispersive lens is made of an acrylic tree A lenticular lens made of grease, polycarbonate or polyethylene terephthalate. 如申請專利範圍第1項所述之利用光色散效應偵測動態微型物件之裝置,其中該第一波長光之波長範圍介於450至460奈米之間;及該第二波長光之波長範圍介於670至680奈米之間。 The apparatus for detecting a dynamic micro object by using a light dispersion effect according to claim 1, wherein the wavelength of the first wavelength light ranges from 450 to 460 nm; and the wavelength range of the second wavelength light Between 670 and 680 nm. 如申請專利範圍第1項所述之利用光色散效應偵測動態微型物件之裝置,其中在該色散透鏡及發射端物鏡之間另設有一光束導引組。 A device for detecting a dynamic micro object by using a light dispersion effect according to the first aspect of the invention, wherein a beam guiding group is further disposed between the dispersing lens and the transmitting end objective lens. 如申請專利範圍第5項所述之利用光色散效應偵測動態微型物件之裝置,其中該光束導引組包含:一針孔擋板,具有一針孔,該色散光束聚焦於該針孔並通過該針孔;一反射鏡,用以反射上述通過該針孔後之色散光束;一光場透鏡,上述反射後之色散光束通過該光場透鏡成為軸向平行傳輸之色散光束;以及一光學擋板,具有至少一狹縫,上述軸向平行傳輸之色散光束通過該狹縫以改變該色散光束之一橫截面形狀。 The apparatus for detecting a dynamic micro object by using a light dispersion effect according to claim 5, wherein the beam guiding group comprises: a pinhole baffle having a pinhole, wherein the dispersive beam is focused on the pinhole Passing through the pinhole; a mirror for reflecting the dispersive light beam passing through the pinhole; a light field lens, the reflected dispersive light beam passing through the optical field lens to become an axially parallel dispersed dispersive light beam; and an optical The baffle has at least one slit through which the axially parallel transmitted dispersive light beam passes to change a cross-sectional shape of the dispersive light beam. 如申請專利範圍第6項所述之利用光色散效應偵測動態微型物件之裝置,其中該光學擋板之狹縫係至少一弧形狹縫,該軸向平行傳輸之色散光束通過該弧形狹縫,以產生在橫向上呈弧形之至少一弧形色散光束。 The apparatus for detecting a dynamic micro object by using a light dispersion effect according to claim 6, wherein the slit of the optical baffle is at least one arcuate slit, and the axially parallel transmitted dispersive light beam passes through the arc a slit to produce at least one arc-shaped dispersive beam that is curved in a lateral direction. 一種利用光色散效應偵測動態微型物件之方法,其包含步驟:提供一軸向光束,其至少包含一第一波長光及一第二波長光;使該軸向光束通過一低阿貝數之色散透鏡,而成為一色散光束;藉由一發射端物鏡將該色散光束之第一及第二波長光分別聚焦在同一軸向上之二不同光點位置,以照明一輸送裝置中橫向移動通過該二光點附近的至少一微型物件,並對應產生至少一散射光影像;利用一光譜分析單元分析該散射光影像中之第一及第二波長光的個別強度;以及藉由一運算處理單元計算該散射光影像中之第一及第二波長光的強度比,並使其與該運算處理單元預先儲存之該微型物件之軸向深度與該第一/第二波長之強度比之間的一線性關係進行比對,以取得該微型物件之實際深度參數。 A method for detecting a dynamic miniature object by using a light dispersion effect, comprising the steps of: providing an axial beam comprising at least a first wavelength light and a second wavelength light; and passing the axial beam through a low Abbe number Dispersing the lens to become a dispersive beam; focusing the first and second wavelengths of the dispersive beam on two different spot positions in the same axial direction by a transmitting end objective lens to illuminate a lateral movement of the conveying device through the At least one micro object in the vicinity of the two light spots, and correspondingly generating at least one scattered light image; analyzing an individual intensity of the first and second wavelength lights in the scattered light image by using a spectral analysis unit; and calculating by an operation processing unit An intensity ratio of the first and second wavelengths of light in the scattered light image, and a line between the axial depth of the micro object and the intensity ratio of the first/second wavelength stored in advance by the arithmetic processing unit The sexual relationships are compared to obtain the actual depth parameters of the miniature object. 如申請專利範圍第8項所述之利用光色散效應偵測動態微型物件之方法,其中在取得該微型物件之實際深度參數時,同時取得該微型物件之數量。 The method for detecting a dynamic micro object by using a light dispersion effect as described in claim 8 wherein the number of the micro object is simultaneously obtained when the actual depth parameter of the micro object is obtained. 如申請專利範圍第8項所述之利用光色散效應偵測動態微型物件之方法,其中該微型物件選自生物性微粒、半導體晶圓/晶片表面或微小電子元件。 A method for detecting a dynamic micro object using a light dispersion effect as described in claim 8 wherein the micro object is selected from the group consisting of a biological particle, a semiconductor wafer/wafer surface, or a tiny electronic component.
TW101121901A 2012-06-19 2012-06-19 Device and method for detecting mobile micro-articles based on chromatic aberration effect TWI468665B (en)

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TWI659204B (en) * 2014-12-05 2019-05-11 美商克萊譚克公司 Spectroscopic beam profile metrology

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TWI659204B (en) * 2014-12-05 2019-05-11 美商克萊譚克公司 Spectroscopic beam profile metrology

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