TW201317626A - Scanning projection device with detection function and detection method thereof - Google Patents
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本發明係有關一種掃描投射裝置,尤指一種具有偵測功能之光束偏射裝置及其偵測方法。The invention relates to a scanning projection device, in particular to a beam deflecting device with a detecting function and a detecting method thereof.
掃描投射裝置(scanning projection apparatus)已廣泛地被應用在光學領域之各種裝置中,例如設計成一雷射掃描單元(LSU,Laser Scanning Unit)供應用於印表機、掃描器等,或設計成一通稱之雷射投影器(laser Projector)供應用於小型雷射投影機或汽車用抬頭顯示器(HUD,head-up device)。該掃描投射裝置係利用一至少一維振動之光束偏射裝置(beam deflecting device),用以偏射至少一光源所發出之光束形成一至少一維之影像區;其中該光源可為雷射光源但不限制(亦可利用LED光源),又該至少一維之影像區在此定義為藉由該光束偏射裝置所偏射形成之掃描光束投射至一目標區所形成之投射光區域,例如一小型雷射投影機或汽車用抬頭顯示器所使用之光束偏射裝置係利用一具雙軸(二維)掃描功能或二各具單軸(一維)掃描功能且各單軸校正成相互垂直之光束掃描器以將一雷射光束偏射並投射至一目標區以形成一通常為二維之影像區。而為製成一小型雷射投影器,通常使用一微機電掃描振鏡(micro electronic mechanical scanning mirror,簡稱MEMS振鏡)作為光束掃描器。Scanning projection apparatus has been widely used in various devices in the field of optics, for example, designed as a laser scanning unit (LSU) for printers, scanners, etc., or designed as a general term. The laser projector is supplied for a small laser projector or a head-up device (HUD) for automobiles. The scanning projection device utilizes a beam deflecting device for at least one-dimensional vibration to deflect a light beam emitted by at least one light source to form an image region of at least one dimension; wherein the light source may be a laser light source However, it is not limited (it is also possible to use an LED light source), and the at least one-dimensional image area is defined herein as a projected light region formed by a scanning beam formed by the beam deflecting device being projected onto a target region, for example, A beam deflecting device used in a small laser projector or a head-up display for a vehicle uses a two-axis (two-dimensional) scanning function or two single-axis (one-dimensional) scanning functions and each single axis is corrected to be perpendicular to each other. The beam scanner deflects and projects a laser beam onto a target area to form a generally two-dimensional image area. To make a small laser projector, a micro electronic mechanical scanning mirror (MEMS galvanometer) is usually used as a beam scanner.
為方便說明,在此以下本發明以一種應用於一雷射投影器之掃描投射裝置為例說明但不限制。一習知之掃描投射裝置如US6,937,372B2、US7,972,014B2等,可利用一光束偏射裝置(beam deflecting device)如具有雙軸掃描功能之光束掃描器如微機電掃描振鏡(MEMS scanning vibrating mirror)或利用兩個具有單軸掃描功能之光束掃描器且各單軸校正成相互垂直,以將一準直的光束以二垂直軸交叉點移動而偏射形成一影像區。一影像區之建立可以將光束以光柵型式(raster pattern)或利薩如型式(Lissajous pattern)掃出;影像,包括圖表或圖形,可以利用確定光束位置及調變光束功率,而在影像區上依據所接收之影像資料以形成所要求的影像像素(image pixels)。For convenience of description, the present invention is described below as an example of a scanning projection device applied to a laser projector, but is not limited thereto. A conventional scanning projection device such as US 6,937,372 B2, US 7,972,014 B2, etc., can utilize a beam deflecting device such as a beam scanner having a dual axis scanning function such as a MEMS scanning vibrating device. Mirror) or two beam scanners having a single-axis scanning function and each uniaxially corrected to be perpendicular to each other to deflect a collimated beam at two perpendicular axis intersections to form an image region. An image region can be created to sweep the beam out in a raster pattern or a Lissajous pattern; the image, including the graph or graph, can be used to determine the beam position and the modulated beam power, while on the image area. Based on the received image data to form the desired image pixels.
為了製成一小型影像投射系統,通常是使用一微機電掃描振鏡(micromechanical scanning mirror)作為光束偏射裝置如US6,937,372B2、US7,972,014B2等所揭示;電子驅動信號如交流電壓或交流電流被應用在光束掃描器以使微機電掃描振鏡產生機械式振動;當光束偏射裝置在或接近其共振頻率時,可以在具正弦掃描拋物線軌跡之雙向運動中得到最大機械成果或大掃描角度。對光柵(raster)掃描系統而言,當垂直向掃描運動依據影像更新率(refresh rate)而以頻率50Hz或60Hz為一控制的鋸齒線運動(sawtooth motion)時,水平向掃描運動依據影像解析度而以一高頻率通常為正弦曲線;對利薩如(Lissajous)掃描系統而言,水平向及垂直向掃描運動皆是其頻率比(frequency ratio)經過仔細選擇之正弦曲線,以能達成一穩定的且可重復的掃描圖形;對向量型式掃描系統而言,若輸入至微機電掃描振鏡之訊號若高於該微機電掃描振鏡之線性反應頻率,則微機電掃描振鏡之掃描角度將不等比於輸入至微機電掃描振鏡之訊號強度,且產生時間差。In order to make a small image projection system, a micromechanical scanning mirror is generally used as a beam deflecting device such as US 6,937,372 B2, US 7,972,014 B2, etc.; electronic driving signals such as alternating current voltage or alternating current The current is applied to the beam scanner to cause the micro-electromechanical scanning galvanometer to produce mechanical vibration; when the beam diverting device is at or near its resonant frequency, the maximum mechanical outcome or large scan can be obtained in a bidirectional motion with a sinusoidal scanning parabolic trajectory. angle. For a raster scanning system, when the vertical scanning motion is controlled by a frequency of 50 Hz or 60 Hz according to the image refresh rate, the horizontal scanning motion is based on the image resolution. At a high frequency, it is usually a sinusoid; for a Lissajous scanning system, both the horizontal and vertical scanning motions are carefully selected sinusoids with a frequency ratio to achieve a stable And repeatable scanning pattern; for the vector type scanning system, if the signal input to the MEMS scanning galvanometer is higher than the linear response frequency of the MEMS scanning galvanometer, the scanning angle of the MEMS scanning galvanometer will be It is not equal to the signal strength input to the MEMS scanning galvanometer and produces a time difference.
為了精密投射一掃描影像,經光束掃描器偏射後之光束的正確位置必須能確定,因此光束才能調變而依據所接收之影像資料去形成所要求的影像像素(image pixels);針對正弦掃描,只要掃描頻率及交叉點時間點,即當光束通過掃描跨距(scan span)中心之時間點是已知的話,就可基於正弦運動之數學方程式以計算相對於掃描軌跡之光束位置;假使光束掃描器是以一接近共振頻率之固定頻率操作,共振頻率之一輕微改變將導致驅動信號與光束掃描器之振動(擺動)運動間之相位改變。為了在正確地點形成影像像素(image pixels),調變(modulation)光束之時間點因而必須被校正。假如調變光束之時間點與掃描光束之位置間的相位差未被正確補償的話,則投射之影像像素將變得移位(displaced)及畸變(distorted)。In order to accurately project a scanned image, the correct position of the beam after being deflected by the beam scanner must be determined, so that the beam can be modulated to form the desired image pixels according to the received image data; for sinusoidal scanning As long as the scanning frequency and the intersection time point, that is, when the beam passes through the center of the scan span, it is known, based on the mathematical equation of the sinusoidal motion to calculate the beam position relative to the scanning trajectory; The scanner operates at a fixed frequency close to the resonant frequency, and a slight change in the resonant frequency will result in a phase change between the drive signal and the vibration (wobble) motion of the beam scanner. In order to form image pixels at the correct location, the point in time at which the beam is modulated must therefore be corrected. If the phase difference between the time point of the modulated beam and the position of the scanning beam is not properly compensated, the projected image pixels will become displaced and distorted.
因此,提供一措施以偵測一光束偏射裝置是否正常操作狀態是有急需性的。雖然針對上述之調變問題如調變光束之時間點與掃描光束之位置間的相位差,部分先前技術如US6,937,372B2、US7,972,014B2等,已提出解決問題之技術手段;然而,該等先前技術之技術手段大都是利用一感應器設在實用影像區(active image field)之外但感應器之感應區至少一部分係設在影像區之垂直向極端之內,使該感應器可用以偵測被偏射之光束;又該光束在影像區之周邊是被切掉(switched off)以形成一實用影像區供投射影像,並在該實用影像區外且靠近影像區之垂直向極端被啟動以產生一掃描線以在每一影像幀(image frame)掃過一次感應器。由此可知,習知技術至少具有下列缺點:Therefore, it is highly desirable to provide a measure to detect whether a beam deflecting device is in a normal operating state. Although the above-mentioned modulation problem, such as the phase difference between the time point of the modulated beam and the position of the scanning beam, some prior art techniques such as US 6,937,372 B2, US 7,972,014 B2, etc., have been proposed to solve the problem; however, The technical means of the prior art mostly use an inductor to be disposed outside the active image field but at least a portion of the sensing area of the sensor is disposed within the vertical extreme of the image area, so that the sensor can be used. Detecting the deflected beam; the beam is switched off at the periphery of the image area to form a practical image area for projecting the image, and is vertically outside the practical image area and close to the image area. Boot to generate a scan line to sweep the sensor once in each image frame. It can be seen that the prior art has at least the following disadvantages:
1、該光束在影像區之周邊是被切掉(switched off)以形成一實用影像區(active image field)供投射影像,因此光束所投射形成之實用影像區的範圍相對縮小,浪費實用影像區之周邊的成像。1. The light beam is switched off at the periphery of the image area to form an active image field for projecting the image, so that the range of the practical image area formed by the light beam is relatively reduced, and the practical image area is wasted. Imaging around.
2、該感應器須依設計而設立在一特定位置,且光束偏射裝置須在該實用影像區外且靠近影像區之垂直向極端處產生一回饋掃描線以在每一影像幀(image frame)掃過一次感應器,因此相對造成組裝作業及校正作業之困難度,不利於量產化。2. The sensor must be set up at a specific position according to the design, and the beam deflecting device must generate a feedback scan line outside the practical image area and near the vertical end of the image area to be in each image frame (image frame) When the sensor is swept once, it is relatively difficult to assemble and correct the operation, which is not conducive to mass production.
3、各種感應器之感應區皆存在一定之寬度,即感應區在寬度向(橫向)上具有分開一定寬度之第一邊緣及第二邊緣,當回饋掃描線在每一影像幀(image frame)掃過一次感應器時,該回饋掃描線經過感應器之第一邊緣及第二邊緣產生之電子脈衝信號之間會產生一時差,而且各種品牌感應器之感應區所具有之寬度並不一致,因此相對造成組裝及校正作業之困難度,不利於調變電路之設計,亦不利於各種感應器之選擇,相對使製作成品無法有效降低。3. The sensing regions of the various sensors have a certain width, that is, the sensing region has a first edge and a second edge separated by a certain width in the width direction (lateral direction), when the feedback scanning line is in each image frame. When the sensor is swept once, the feedback scan line generates a time difference between the electronic pulse signals generated by the first edge and the second edge of the sensor, and the widths of the sensing regions of the various brand sensors are not uniform, so Relatively difficult to assemble and correct the operation, it is not conducive to the design of the modulation circuit, and is not conducive to the selection of various sensors, so that the finished product can not be effectively reduced.
4.先前技術係利用在該實用影像區外產生至少一回饋掃描線,並使該回饋掃描線在每一影像幀(image frame)掃過一次感應器,藉以建立一偵測、計算及補償之模式,但由於感應器之感應區的面積有限,導致該偵測、計算及補償之功能相對受限,例如可調變光束之時間點與掃描光束之位置間的相位差之補償,但無法對該光源及該光束偏射裝置之操作狀態,如該光源所發出光束之強度或該光束偏射裝置之振幅(振動角度)、頻率及波形等,可能就無法達成偵測、計算及補償之功能。4. The prior art utilizes at least one feedback scan line outside the utility image area and causes the feedback scan line to sweep through the sensor every image frame to establish a detection, calculation and compensation. Mode, but due to the limited area of the sensing area of the sensor, the detection, calculation and compensation functions are relatively limited, for example, the compensation of the phase difference between the time point of the variable beam and the position of the scanning beam, but not The operating state of the light source and the beam deflecting device, such as the intensity of the light beam emitted by the light source or the amplitude (vibration angle), frequency and waveform of the beam deflecting device, may fail to achieve detection, calculation and compensation functions. .
5.先前技術無法及時偵測在實用影像區(active image field)內之掃描狀況,因此無法對向量型式掃描系統進行偵測。5. The prior art was unable to detect the scanning condition in the active image field in time, so the vector type scanning system could not be detected.
本發明即針對先前技術之缺點,提出能有效解決問題之技術手段。The present invention addresses the shortcomings of the prior art and proposes a technical means for effectively solving the problem.
本發明之目的乃在於提供一種具有偵測功能之掃描投射裝置及其偵測方法,該掃描投射裝置包含至少一光源用以產生光束及一光束偏射裝置用以偏射該光束以形成掃描光束並投射形成一影像區;本發明係利用至少一分光器設在該光束偏射裝置與該影像區之間掃描光束之投射路徑上,用以使該掃描光束以一預設比例分成一相對較多量及一相對較少量之第一及第二部分光束,並使該第二部分光束投射至一感應器以形成一第二影像區,並利用該感應器以偵測該第二影像區,以達成偵測功能;本發明更利用至少一調變裝置以根據該第二影像區以調變該光源及該光束偏射裝置之操作狀態,藉以避免先前技術之缺點。An object of the present invention is to provide a scanning projection device having a detecting function and a detecting method thereof, the scanning projection device comprising at least one light source for generating a light beam and a beam deflecting device for deflecting the light beam to form a scanning beam And projecting to form an image region; the present invention uses at least one beam splitter to be disposed on the projection path of the scanning beam between the beam deflecting device and the image region, so that the scanning beam is divided into a relatively large proportion by a predetermined ratio. a plurality of and a relatively small amount of the first and second partial beams, and projecting the second partial beam to a sensor to form a second image area, and using the sensor to detect the second image area, In order to achieve the detection function, the present invention further utilizes at least one modulation device to modulate the operating state of the light source and the beam deflecting device according to the second image region, thereby avoiding the disadvantages of the prior art.
為使本發明更加明確詳實,茲列舉較佳實施例並配合下列圖示,將本發明之結構、方法及其技術特徵詳述如後;參考圖1、圖2所示,其係本發明之掃描投射裝置第一實施例之立體示意圖及其平面(上視)示意圖。本發明之具有偵測及補償功能之掃描投射裝置1,主要包含:至少一光源(light source)10、一光束偏射裝置(beam deflecting device)20、至少一分光器(BS,beam splitter)40及至少一感應器(detecting sensor)50;進一步可包含至少一調變裝置(modulation means)60。In order to make the present invention more clear and detailed, the preferred embodiments and the following drawings are used to describe the structure, method and technical features of the present invention as follows. Referring to FIG. 1 and FIG. 2, the present invention is A schematic view of a first embodiment of a scanning projection device and a plan view thereof. The scanning projection device 1 with detection and compensation function of the present invention mainly comprises: at least one light source 10, a beam deflecting device 20, and at least one beam splitter (BS). And at least one detecting sensor 50; further comprising at least one modulation means 60.
該至少一光源(light source)10係用以產生至少一光束11,並投射至該光束偏射裝置20;本實施例中該至少一光源(light source)10只以一光源(light source)10代表但非用來限制本發明。該光源10可為雷射光源但不限制。該光束11可為可見光,如由複數條具有紅、綠、藍色波長之光束組成;該光束11亦可為不可見光,即或具有人眼看不見的波長如紅外線。The at least one light source 10 is configured to generate at least one light beam 11 and project to the light beam deflecting device 20; in the embodiment, the at least one light source 10 is only a light source 10 Representative but not intended to limit the invention. The light source 10 can be a laser source but is not limited. The light beam 11 can be visible light, such as composed of a plurality of light beams having red, green, and blue wavelengths; the light beam 11 can also be invisible light, that is, having a wavelength that is invisible to the human eye such as infrared light.
該光束偏射裝置(beam deflecting device)20係用以偏射該光源10所發出之至少一光束11以形成掃描光束12,該掃描光束12再投射向外以形成一至少一維之影像區30。本實施例中該光束偏射裝置20設計為一微機電掃描振鏡(MEMS scanning vibrating mirror)但非用來限制本發明,圖1所示之光束偏射裝置20即為一具有雙軸掃描功能之微機電掃描振鏡。The beam deflecting device 20 is configured to deflect at least one light beam 11 emitted by the light source 10 to form a scanning beam 12, and the scanning beam 12 is projected further outward to form an image region 30 of at least one dimension. . In the embodiment, the beam deflecting device 20 is designed as a MEMS scanning vibrating mirror, but is not used to limit the present invention. The beam deflecting device 20 shown in FIG. 1 has a dual-axis scanning function. Microelectromechanical scanning galvanometer.
該分光器(BS,beam splitter)40為具有對一入射光束產生部分反射及部分折射之分光特性,其係設置在該光束偏射裝置20與該影像區30之間該掃描光束12之投射路徑上,用以使該掃描光束12在經過該分光器40時能以一預設比例分成一預設之相對較多量之第一部分光束12a及一預設之相對較少量之第二部分光束12b。以一分光器之分光功能而言,部分反射及部分折射之光束量比例可依設計需要而選別,也就是當相對較多量之第一部分光束12a設計以折射方式(或反射方式)經過該分光器40時,表示該分光器40之部分反射及部分折射之光束量比例已經設定,則另一相對較少量之第二部分光束12b就以另一方式,即反射方式(或折射方式),經過該分光器40。在本實施例中,該相對較多量之第一部分光束12a係以折射方式穿過該分光器40而投射向外以形成一對應於該至少一維之影像區30之第一影像區30a如圖1、2所示,此時該相對較少量之第二部分光束12b即以反射方式投射至一感應器50以進一步在該感應器50上形成一對應於該至少一維之影像區30(30a)之第二影像區30b;在本實施例中,該預設之相對較少量之第二部分光束12b可設計為該掃描光束12之光束量之5-10百分率(%),即該掃描光束12在經過該分光器40時能以5%:95%之比例至10%:90%之比例分成一相對較少量之第二部分光束12b及一相對較多量之第一部分光束12a;藉此,該相對較多量之第一部分光束12a所投射形成之第一影像區30a與該掃描光束12所投射形成之影像區30相比,在光強度(亮度)上不會有太大差異,而且該相對較少量之第二部分光束12b所投射形成之第二影像區30b又有足夠之光強度供該感應器50進行偵測,達成本發明所訴求之偵測功能。The beam splitter (BS) 40 has a spectral characteristic of partially reflecting and partially refracting an incident beam, and is disposed between the beam deflecting device 20 and the image region 30 to project a scanning path of the scanning beam 12. The scanning beam 12 can be divided into a predetermined relatively large amount of the first partial beam 12a and a predetermined relatively small amount of the second partial beam 12b by a predetermined ratio when passing through the beam splitter 40. . In terms of the splitting function of a splitter, the proportion of the partially reflected and partially refracted beams can be selected according to the design requirements, that is, when a relatively large amount of the first partial beam 12a is designed to refract (or reflect) through the splitter At 40 o'clock, the proportion of the beam amount indicating partial reflection and partial refraction of the beam splitter 40 has been set, and another relatively small amount of the second partial beam 12b is in another manner, that is, a reflection mode (or a refractive mode). The beam splitter 40. In this embodiment, the relatively large amount of the first partial beam 12a is projected through the beam splitter 40 in a refracting manner to form a first image region 30a corresponding to the at least one-dimensional image region 30. As shown in FIGS. 1 and 2, the relatively small amount of the second partial beam 12b is projected to a sensor 50 in a reflective manner to further form an image region 30 corresponding to the at least one dimension on the sensor 50 ( a second image area 30b of 30a); in this embodiment, the predetermined relatively small amount of the second partial light beam 12b can be designed as a 5-10 percentage (%) of the beam amount of the scanning beam 12, that is, the The scanning beam 12 can be divided into a relatively small amount of the second partial beam 12b and a relatively large amount of the first partial beam 12a by a ratio of 5%:95% to 10%:90% when passing through the beam splitter 40; Therefore, the first image area 30a projected by the relatively large amount of the first partial beam 12a does not have much difference in light intensity (brightness) compared with the image area 30 formed by the scanning beam 12. And the second image area 30 formed by the relatively small amount of the second partial beam 12b is projected. b has sufficient light intensity for the sensor 50 to detect, and achieves the detection function claimed by the present invention.
該至少一感應器(detecting sensor)50係用以偵測該第二影像區30b,藉以達成本發明所訴求之偵測功能;其中該感應器50可選自下列族群中之一種:電荷耦合裝置(charge-coupled device,CCD)、多元光檢測器(Patterned photon detector)、位置感應器(position sensitive device,PSD),但上述該等感應器50之不同型態並非用來限制本發明。本發明之掃描投射裝置1目前以選擇多元光檢測器作為感應器50為較佳。該多元光檢測器或稱為圖案化光檢測器(Patterned photon detector)之結構設計可參考DVD(數位視訊光碟Digital Video Disc或數位多用途光碟Digital Versatile Disc)所使用之讀取用(pick-up)光檢測器如圖5所示但不限制。The at least one detecting sensor 50 is configured to detect the second image area 30b to achieve the detection function claimed by the present invention; wherein the sensor 50 can be selected from one of the following groups: a charge coupled device A charge-coupled device (CCD), a capacitive photon detector, or a position sensitive device (PSD), but the different types of the above-described inductors 50 are not intended to limit the present invention. The scanning projection device 1 of the present invention is preferably a selective multi-photodetector as the sensor 50. The structure design of the multi-element photodetector or the patterned photon detector can be referred to the reading (pick-up) used in DVD (Digital Video Disc or Digital Versatile Disc). The photodetector is shown in Figure 5 but is not limited.
本發明進一步可包含至少一調變裝置(modulation means)60。該至少一調變裝置(modulation means)60係連結設在該至少一感應器50、該至少一光源10及該光束偏射裝置20之間,用以根據該至少一感應器50上所形成之該第二影像區30b以調變該至少一光源10及該光束偏射裝置20之操作狀態。在本實施例中,該調變裝置60進一步可包含下列各單元(電路)但並非用來限制本發明:一偵測單元(measurement unit)61供與該感應器50連結,用以偵測形成在該感應器50上之第二影像區30b並將偵測所得之資料傳送至控制單元(control unit)62;一控制單元(control unit)62供與該偵測單元61連結,用以針對該偵測單元61所提供之資料進行運算,並將運算所得之資料依控制需要分別傳送至一光源驅動單元(light source drive unit)63及/或一偏射驅動單元64;一光源驅動單元(light source drive unit)63供連結在該光源10與該控制單元62之間,用以可依據該控制單元62所提供之運算結果資料以調變該光源10之操作狀態,如調變該光源10所發出光束11之強度;及一偏射驅動單元(deflecting drive unit)64供連結在該光束偏射裝置20與該控制單元62之間,用以可依據該控制單元62所提供之運算結果資料以調變該光束偏射裝置20之操作狀態,如調變該光束偏射裝置20之振幅(amplitude)即振動角度、頻率、相位及偏射軸之運動方式如正弦曲線運動或鋸齒(sawtooth)運動等。由於該調變裝置60之設計,如包含一偵測單元61、一控制單元62、一光源驅動單元63、一偏射驅動單元64,乃利用目前電子技術可達成者,而且該調變裝置60中各單元之電路設計本身或相關軟體設計也並非本發明之技術特點,故於此不再贅述。The invention may further comprise at least one modulation means 60. The at least one modulation device 60 is coupled between the at least one sensor 50, the at least one light source 10, and the beam deflecting device 20 for forming according to the at least one sensor 50. The second image area 30b modulates the operating state of the at least one light source 10 and the beam deflecting device 20. In this embodiment, the modulation device 60 may further include the following units (circuits), but is not intended to limit the present invention: a detection unit 61 is coupled to the sensor 50 for detecting formation. The second image area 30b on the sensor 50 transmits the detected data to a control unit 62; a control unit 62 is coupled to the detecting unit 61 for The data provided by the detecting unit 61 is operated, and the calculated data is separately transmitted to a light source drive unit 63 and/or a bias driving unit 64 according to control needs; a light source driving unit (light) The source drive unit 63 is connected between the light source 10 and the control unit 62 for modulating the operation state of the light source 10 according to the operation result data provided by the control unit 62, such as modulating the light source 10 The intensity of the light beam 11 is emitted; and a deflecting drive unit 64 is coupled between the beam deflecting device 20 and the control unit 62 for use in accordance with the operation result data provided by the control unit 62. Modulation Beam deflection means 20 of the operating state, such as modulating the beam deflection means amplitude (Amplitude) i.e. the angle of vibration, frequency, phase, and the deflection axis of motion, such as a sinusoidal or zigzag motion (sawtooth) 20 of the exercise. Because the design of the modulation device 60 includes a detecting unit 61, a control unit 62, a light source driving unit 63, and a bias driving unit 64, the current electronic technology can be achieved, and the modulation device 60 can be achieved. The circuit design of each unit or the related software design is not a technical feature of the present invention, and thus will not be described herein.
再參考圖3所示,其係本發明之掃描投射裝置第二實施例之平面(上視)示意圖。本第二實施例之掃描投射裝置2與圖1、2所示第一實施例之掃描投射裝置1之間的不同點在於:本第二實施例之掃描投射裝置2進一步在該分光器(BS)40與該感應器50之間該第二部分光束12b的投射路徑上,設置至少一光學元件70。該光學元件70可為一具有聚光作用之光學元件70如一凸透鏡如圖3所示,藉以使該相對較少量之第二部分光束12b在投射至該感應器50以形成該第二影像區30b之前,可先經過該聚光用光學元件70以先縮小該第二部分光束12b之投射區面積,藉以相對縮小該感應器50或其所需要之感應區的面積如圖3所示,有利於使本第二實施例之掃描投射裝置2能相對地輕、薄、短小,以達成小型化之優勢效果及目的,並相對地降低構件成本。另,該光學元件70亦可為一具有擴散作用之光學元件70如一凹透鏡(圖未示),藉以使該相對較少量之第二部分光束12b在投射至該感應器50以形成該第二影像區30b之前,可先經過該擴散用光學元件70以先擴散該第二部分光束12b之投射區面積,藉以相對加大該感應器50或其所需要之感應區的面積(圖未示),有利於提高偵測之精密度。Referring again to FIG. 3, it is a plan view (top view) of a second embodiment of the scanning projection device of the present invention. The difference between the scanning projection device 2 of the second embodiment and the scanning projection device 1 of the first embodiment shown in FIGS. 1 and 2 is that the scanning projection device 2 of the second embodiment is further in the optical splitter (BS). At least one optical element 70 is disposed on the projection path of the second partial beam 12b between the sensor 40 and the inductor 50. The optical element 70 can be a concentrating optical element 70 such as a convex lens as shown in FIG. 3, whereby the relatively small amount of the second partial beam 12b is projected onto the inductor 50 to form the second image area. Before 30b, the concentrating optical element 70 may be first passed to first reduce the area of the projection area of the second partial beam 12b, thereby relatively reducing the area of the inductor 50 or the sensing area required thereof as shown in FIG. The scanning projection device 2 of the second embodiment can be relatively light, thin, and short, so as to achieve the advantageous effects and objects of miniaturization, and relatively reduce the component cost. In addition, the optical component 70 can also be a diffusing optical component 70 such as a concave lens (not shown), whereby the relatively small amount of the second partial beam 12b is projected onto the inductor 50 to form the second component. Before the image area 30b, the diffusing optical element 70 can be used to first diffuse the area of the projection area of the second partial beam 12b, thereby relatively increasing the area of the sensor 50 or the sensing area required (not shown). It is beneficial to improve the precision of detection.
再參考圖4所示,其係本發明之掃描投射裝置第三實施例之平面(上視)示意圖。本第三實施例之掃描投射裝置3與圖1、2所示第一實施例之掃描投射裝置1之間的不同點在於:本第三實施例之掃描投射裝置3進一步將該分光器(BS)40設計成一具凹面41之凹面式分光器(BS)40a如圖4所示,藉以使該掃描光束12在經過該凹面式分光器40a時,該相對較少量之第二部分光束12b能藉由該凹面41之聚光功能先進行聚光式反射再投射至該感應器50,即該相對較少量之第二部分光束12b在投射至該感應器50以形成該第二影像區30b之前,可先經過該凹面式分光器(BS)40a以先縮小該第二部分光束12b之投射區面積,藉以相對縮小該感應器50所需要之感應區,有利於使本第三實施例之掃描投射裝置3能相對地輕、薄、短小,達成小型化之優勢效果,並相對地降低構件成本。Referring again to FIG. 4, it is a plan view (top view) of a third embodiment of the scanning projection device of the present invention. The difference between the scanning projection device 3 of the third embodiment and the scanning projection device 1 of the first embodiment shown in FIGS. 1 and 2 is that the scanning projection device 3 of the third embodiment further divides the beam splitter (BS). 40 is a recessed surface splitter (BS) 40a designed as shown in FIG. 4, whereby the relatively small amount of the second partial beam 12b can be made while the scanning beam 12 passes through the concave beam splitter 40a. The concentrating function of the concave surface 41 is first condensed and then projected onto the inductor 50, that is, the relatively small amount of the second partial beam 12b is projected onto the inductor 50 to form the second image region 30b. The concave area splitter (BS) 40a can be used to reduce the area of the projection area of the second partial light beam 12b first, so as to relatively reduce the sensing area required by the inductor 50, which is advantageous for the third embodiment. The scanning projection device 3 can be relatively light, thin, and short, achieving the advantageous effect of miniaturization and relatively reducing the component cost.
此外,可隨設計需要,將第三實施例之掃描投射裝置3之具凹面41之凹面式分光器(BS)40a與第二實施例之掃描投射裝置2之聚光用光學元件70搭配使用,使該相對較少量之第二部分光束12b在投射至該感應器50以形成該第二影像區30b之前,能更有效地縮小該第二部分光束12b之投射區面積,即更有效地相對縮小該感應器50所需要之感應區,有利於使本發明之掃描投射裝置能相對地輕、薄、短小,達成小型化之優勢效果,並相對地降低構件成本本發明進一步提供一種掃描投射裝置之偵測方法,其包含下列步驟:提供一掃描投射裝置;該掃描投射裝置包含至少一光源10用以產生至少一光束11;及一光束偏射裝置20用以偏射該至少一光源10所發出之至少一光束11以形成掃描光束12,該掃描光束12再投射向外以形成一至少一維之影像區30;提供至少一分光器(BS)40,並使該分光器(BS)40設置在該光束偏射裝置20與該影像區30之間掃描光束12之投射路徑上,用以使該掃描光束12在經過該分光器40時能以一預設比例分成一預設之相對較多量之第一部分光束12a及一預設之相對較少量之第二部分光束12b,其中該相對較多量之第一部分光束12a能投射向外以形成一對應於該至少一維之影像區30之第一影像區30a,其中該相對較少量之第二部分光束12b能投射至一感應器50以進一步在該感應器50上形成一對應於該至少一維之影像區30之第二影像區30b;以及提供至少一感應器50,用以偵測該第二影像區30b。In addition, the concave-type spectroscope (BS) 40a having the concave surface 41 of the scanning projection device 3 of the third embodiment can be used in combination with the concentrating optical element 70 of the scanning projection device 2 of the second embodiment. The relatively small amount of the second partial beam 12b can be more effectively reduced in the projection area of the second partial beam 12b before being projected onto the inductor 50 to form the second image region 30b, that is, more effectively relative The invention further provides a scanning projection device, which is advantageous in that the scanning projection device of the present invention can be relatively light, thin and short, and the advantages of miniaturization are achieved, and the component cost is relatively reduced. The detecting method includes the following steps: providing a scanning projection device; the scanning projection device includes at least one light source 10 for generating at least one light beam 11; and a beam deflecting device 20 for biasing the at least one light source 10 Ejecting at least one light beam 11 to form a scanning beam 12, the scanning beam 12 is projected further outward to form an image region 30 of at least one dimension; at least one beam splitter (BS) 40 is provided, and the segment is provided The device (BS) 40 is disposed on the projection path of the scanning beam 12 between the beam deflecting device 20 and the image region 30, so that the scanning beam 12 can be divided into a predetermined ratio when passing through the beam splitter 40. Presetting a relatively large amount of the first partial beam 12a and a predetermined relatively small amount of the second partial beam 12b, wherein the relatively larger amount of the first partial beam 12a can be projected outward to form a corresponding one of the at least one dimension The first image area 30a of the image area 30, wherein the relatively small amount of the second partial light beam 12b can be projected onto a sensor 50 to further form an image area 30 corresponding to the at least one dimension on the sensor 50. The second image area 30b; and at least one sensor 50 for detecting the second image area 30b.
本發明進一步包含下一步驟:提供至少一調變裝置(modulation means)60,使該調變裝置60連結設在該感應器50、該光源10及該光束偏射裝置20之間,用以根據該感應器50所投射形成之該第二影像區30b,以調變該至少一光源10及該光束偏射裝置20之操作狀態。The present invention further includes the following steps: providing at least one modulation means 60, the modulation means 60 being coupled between the inductor 50, the light source 10 and the beam deflecting means 20 for The second image area 30b is formed by the sensor 50 to modulate the operating state of the at least one light source 10 and the beam deflecting device 20.
由上可知,本發明之主要技術手段,即其不同於相關先前技術如US6,937,372B2、US7,972,014B2等之主要區別特徵,乃是利用至少一分光器設在該光束偏射裝置20與該影像區30之間該掃描光束12之投射路徑上,用以使該掃描光束12能以一預設比例分成一相對較多量及一相對較少量之第一及第二部分光束12a、12b,並使該相對較少量之第二部分光束12b投射至一感應器50以形成一第二影像區30b,並利用該感應器50以偵測該第二影像區30b。另,可再利用至少一調變裝置60以根據該第二影像區30b以調變該光源10及該光束偏射裝置20之操作狀態,藉以避免該等相關先前技術之缺點。It can be seen from the above that the main technical means of the present invention, that is, the main distinguishing feature from the related prior art such as US 6,937,372 B2, US 7,972,014 B2, etc., is that at least one beam splitter is provided in the beam deflecting device 20 and The scanning path of the scanning beam 12 between the image areas 30 is configured to enable the scanning beam 12 to be divided into a relatively large amount and a relatively small amount of the first and second partial beams 12a, 12b by a predetermined ratio. And the relatively small amount of the second partial beam 12b is projected to a sensor 50 to form a second image area 30b, and the sensor 50 is used to detect the second image area 30b. In addition, at least one modulation device 60 can be reused to modulate the operational state of the light source 10 and the beam deflecting device 20 according to the second image region 30b to avoid the disadvantages of the related prior art.
以上所述僅為本發明的優選實施例,對本發明而言僅是說明性的,而非限制性的;本專業技術領域具通常知識人員理解,在本發明權利要求所限定的精神和範圍內可對其進行許多改變,修改,甚至等效變更,但都將落入本發明的保護範圍內。The above description is only the preferred embodiments of the present invention, and is intended to be illustrative, and not restrictive, and the scope of the Many changes, modifications, and equivalents may be made thereto, all of which fall within the scope of the invention.
1、2、3...掃描投射裝置1, 2, 3. . . Scan projection device
10...光源10. . . light source
11...光束11. . . beam
12...掃描光束12. . . Scanning beam
12a...第一部分光束12a. . . First part of the beam
12b...第二部分光束12b. . . Second part beam
20...光束偏射裝置20. . . Beam deflector
30...影像區30. . . Image area
30a...第一影像區30a. . . First image area
30b...第二影像區30b. . . Second image area
40、40a...分光器40, 40a. . . Splitter
41...凹面41. . . Concave surface
50...感應器50. . . sensor
60...調變裝置60. . . Modulation device
61...偵測單元61. . . Detection unit
62...控制單元62. . . control unit
63...光源驅動單元63. . . Light source drive unit
64...偏射驅動單元64. . . Bias drive unit
圖1係本發明之掃描投射裝置第一實施例之立體示意圖。1 is a perspective view of a first embodiment of a scanning projection device of the present invention.
圖2係圖1所示第一實施例之平面(上視)示意圖。Figure 2 is a plan view (top view) of the first embodiment shown in Figure 1.
圖3係本發明之掃描投射裝置第二實施例之平面(上視)示意圖。Figure 3 is a plan view (top view) of a second embodiment of the scanning projection device of the present invention.
圖4係本發明之掃描投射裝置第三實施例之平面(上視)示意圖。Figure 4 is a plan view (top view) showing a third embodiment of the scanning projection device of the present invention.
圖5係本發明所使用之感應器一實施例(DVD之讀取用(pick-up)光檢測器)之參考圖。Fig. 5 is a reference diagram of an embodiment of a sensor (a pickup-up photodetector for DVD) used in the present invention.
1...掃描投射裝置1. . . Scan projection device
10...光源10. . . light source
11...光束11. . . beam
12...掃描光束12. . . Scanning beam
12a...第一部分光束12a. . . First part of the beam
12b...第二部分光束12b. . . Second part beam
20...光束偏射裝置20. . . Beam deflector
30...影像區30. . . Image area
30a...第一影像區30a. . . First image area
30b...第二影像區30b. . . Second image area
40、40a...分光器40, 40a. . . Splitter
41...凹面41. . . Concave surface
50...感應器50. . . sensor
60...調變裝置60. . . Modulation device
61...偵測單元61. . . Detection unit
62...控制單元62. . . control unit
63...光源驅動單元63. . . Light source drive unit
64...偏射驅動單元64. . . Bias drive unit
Claims (16)
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TW100138783A TW201317626A (en) | 2011-10-26 | 2011-10-26 | Scanning projection device with detection function and detection method thereof |
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TW100138783A TW201317626A (en) | 2011-10-26 | 2011-10-26 | Scanning projection device with detection function and detection method thereof |
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TW201317626A true TW201317626A (en) | 2013-05-01 |
TWI493225B TWI493225B (en) | 2015-07-21 |
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Family Cites Families (3)
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US7098871B1 (en) * | 1998-08-05 | 2006-08-29 | Microvision, Inc. | Optical scanning system with correction |
US7732751B2 (en) * | 2005-06-13 | 2010-06-08 | Arete' Associates | Optical systems and methods using microelectromechanical-systems mirrors exceeding thirty microns |
TW200914976A (en) * | 2007-09-19 | 2009-04-01 | Ming-Hua Wen | Display device capable of switching real image virtual image projection modes |
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