TW201307453A - Selectively etching of a polymer matrix on PET - Google Patents

Selectively etching of a polymer matrix on PET Download PDF

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TW201307453A
TW201307453A TW101114711A TW101114711A TW201307453A TW 201307453 A TW201307453 A TW 201307453A TW 101114711 A TW101114711 A TW 101114711A TW 101114711 A TW101114711 A TW 101114711A TW 201307453 A TW201307453 A TW 201307453A
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substrate
paste
etching
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TW101114711A
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Arjan Meijer
Werner Stockum
Ingo Koehler
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Merck Patent Gmbh
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Abstract

The present invention relates to a method for selectively etching and patterning with high resolution of flexible polymer matrices, which may comprise Ag nano tubes.

Description

選擇性蝕刻聚對苯二甲酸乙二酯(PET)上之聚合物基質之方法 Method for selectively etching a polymer matrix on polyethylene terephthalate (PET)

本發明關於一種選擇性蝕刻及高解析度圖案化聚合物基質之方法,該聚合物基質包含銀奈米管。 The present invention relates to a method of selectively etching and high resolution patterned polymer matrix comprising a silver nanotube.

已藉由金屬沉積和圖案形成、高溫退火及異方性化學蝕刻由成批晶圓製備帶有積體歐姆接點之微/奈米線。現在,在顯示器、感應器、醫療裝置及其他系統方面的廣大範圍應用對於以高品質單晶半導體奈米和微結構形成於大面積機械撓性塑膠基材上之電氣裝置很感興趣。已證實有許多方法能將高品質半導體材料轉移至塑膠基材上。 Micro/nano wires with integrated ohmic contacts have been prepared from batch wafers by metal deposition and patterning, high temperature annealing, and anisotropic chemical etching. Today, a wide range of applications in displays, sensors, medical devices, and other systems are of interest for electrical devices that are formed from high quality single crystal semiconductor nano and microstructures on large area mechanically flexible plastic substrates. A number of methods have been demonstrated to transfer high quality semiconductor materials to plastic substrates.

傳統光微影方法,儘管其於形成表面特徵之構造及組成有許多用途,昂貴並需要專門設備。除此以外,光微影方法難以將圖案加於非常大及/或非剛性表面如紡織品、紙及塑膠等。 Conventional photolithography methods, while having many uses for forming the structure and composition of surface features, are expensive and require specialized equipment. In addition, photolithography methods make it difficult to apply patterns to very large and/or non-rigid surfaces such as textiles, paper, and plastics.

在有雷射支援之蝕刻方法中雷射束掃描該基材上的所有蝕刻圖案點,其除了高精確度以外,也需要相當多調整作業且非常耗時。 In laser-assisted etching methods, the laser beam scans all of the etched pattern dots on the substrate, which, in addition to high accuracy, requires considerable adjustment work and is very time consuming.

但是另一方面可提供能直接建構於廣大範圍之異常裝置基材,如塑膠或紙,上的高效裝置。特別是,於低溫將這樣的線之有組織的陣列轉印於塑膠基材上產生高品質彎曲性金屬半導體場效電晶體;例如把電氣裝置製備於聚對苯二甲酸乙二酯[PET]上{Y.Sun等人;Applied Physics Letters,87,083501(2005)}。此後者方法使用高品質成批GaAs晶圓作為起始材料,“由上而下”的裝配程序用以形成微/奈米線且轉印技術使用彈性印模結合這些線之良序陣列與塑膠基材。在此方法中,把光阻劑線之圖案定義於金屬條頂端。有多個開口存在於相鄰金屬條之間且開口讓蝕刻劑能擴散至GaAs表面以異方性地蝕刻GaAs。該異方性蝕刻沿著GaAs之表面產生反向台面(reverse mesas)及底蝕部,造成GaAs線之裝配自母晶圓鬆開。 On the other hand, however, it is possible to provide an efficient device that can be directly constructed on a wide range of abnormal device substrates, such as plastic or paper. In particular, the transfer of an organized array of such wires to a plastic substrate at low temperatures produces a high quality bendable metal semiconductor field effect transistor; for example, an electrical device is prepared for polyethylene terephthalate [PET] {Y.Sun et al; Applied Physics Letters, 87, 083501 (2005)}. The latter method uses high-quality bulk GaAs wafers as the starting material, the "top-down" assembly process to form micro/nano wires and the transfer technology uses elastic stamps to combine the well-ordered arrays and plastics of these wires. Substrate. In this method, the pattern of photoresist lines is defined at the top of the metal strip. A plurality of openings exist between adjacent metal strips and the openings allow the etchant to diffuse to the GaAs surface to anisotropically etch GaAs. The anisotropic etching produces reverse mesas and undercuts along the surface of the GaAs, causing the assembly of the GaAs lines to be released from the mother wafer.

這個於表面形成圖案之裝置、方法係眾所周知並包括光微影技術以及軟質接觸印刷技術如U.S.5,512,131也有揭示之“微接觸印刷”。 This apparatus and method for patterning the surface is well known and includes photolithography and soft contact printing techniques such as "microcontact printing" as disclosed in U.S. Patent 5,512,131.

利用軟質微影技術可將表面特徵製成具有小到40 nm之橫向尺寸,但是卻限制可利用這些技術形成之表面特徵的範圍。 Surface characterization can be made with soft lithography to have lateral dimensions as small as 40 nm, but limits the range of surface features that can be formed using these techniques.

這意指根據此技術之現況,以聚合物為底質之基材可直接藉由有雷射支援之方法或,在遮蔽之後藉由濕式化學方法或藉由乾式蝕刻方法,選擇性地蝕刻成任何所欲之結構。 This means that according to the current state of the art, the polymer-based substrate can be selectively etched directly by laser support or by wet chemical or by dry etching after masking. Into any desired structure.

在另一個方法中使用糊狀物形成具有複雜構造之多變的表面特徵。糊狀物典型藉由網版印刷、噴霧、噴墨印刷或注射器沉積施塗於表面。然而,由這些方法製造之表面特徵的橫向尺寸也有限制。尤其是,已發現難以達成低於100 μm之橫向尺寸。尤其是,如果必須形成圖案或結構化之表面係由不同材料構成且不平,將難以均勻且均質地 於該聚合物材料選擇性地形成圖案。 In another method, a paste is used to form a variable surface feature with a complex configuration. The paste is typically applied to the surface by screen printing, spraying, ink jet printing or syringe deposition. However, the lateral dimensions of the surface features produced by these methods are also limited. In particular, it has been found that it is difficult to achieve a lateral dimension of less than 100 μm. In particular, if the pattern that must be patterned or structured is composed of different materials and is uneven, it will be difficult to uniformly and homogeneously The polymer material is selectively patterned.

該濕式化學和乾式蝕刻法包括材料密集、耗時且昂貴之處理步驟: The wet chemical and dry etch processes include material intensive, time consuming, and expensive processing steps:

A.遮蔽不要被蝕刻之區域,例如藉由 A. Masking areas that are not to be etched, for example by

-光微影術:產生該蝕刻結構之負像或正像(取決於光阻劑),乾燥該光阻劑,將經塗佈之基材表面曝光、顯影、沖洗,必要的話乾燥 Photolithography: producing a negative or positive image of the etched structure (depending on the photoresist), drying the photoresist, exposing, developing, rinsing, and if necessary drying the surface of the coated substrate

B.藉由下列方法蝕刻該等結構: B. Etching the structures by the following methods:

-浸漬方法(例如於濕式化學床中濕式蝕刻):將該等基材浸漬於蝕刻浴中,蝕刻程序,於階式水槽中重複沖洗,乾燥 - impregnation method (for example wet etching in a wet chemical bed): immersing the substrates in an etching bath, etching the procedure, repeating the rinsing in a stepped water bath, drying

-旋塗或噴霧法:將該蝕刻溶液施塗於旋轉基材該蝕刻操作可能沒有/有能量輸入(例如IR或UV輻射)進行,並在此之後接著沖洗及乾燥 Spin coating or spraying: applying the etching solution to a rotating substrate. The etching operation may be carried out without/with energy input (for example IR or UV radiation), followed by rinsing and drying

-乾式蝕刻法,像是,例如,於昂貴之真空單元中電漿蝕刻或於流動反應器中以反應性氣體蝕刻。 Dry etching, such as, for example, plasma etching in an expensive vacuum unit or etching with a reactive gas in a flow reactor.

如以上曾提及的,已經描述過的這些蝕刻方法之缺點起因於耗時、材料密集、昂貴的處理步驟,該等步驟在一些案例中從工藝或安全觀點來看有複雜性或係分批進行。 As mentioned above, the disadvantages of these etching methods that have been described are due to time consuming, material intensive, expensive processing steps which in some cases have complexity or batching from a process or safety point of view. get on.

因此本發明之目的在於提供一種用於蝕刻聚合物表面之省時的便宜方法,其可為具有高聚合物表面效率和處理量之工業規模的方法,且其比於液體或氣相中之習用濕式 和乾式蝕刻方法便宜許多。再者,本案之目的在於提供用於包含第二材料之可撓性聚合物基質的均質且均勻結構化及/或形成圖案之便宜方法。特別是,本案之目的在於提供用於包含銀奈米管(也叫做銀奈米線或銀線)之聚合物基質的選擇性結構化之適合方法。尤其是本案之目的在於提供一種蝕刻含有這樣之銀奈米管的聚合物基質之方法,其中該聚合物基質包含或由下列組成:聚對苯二甲酸乙二酯(PET)、聚胺基甲酸酯或聚(萘二甲酸乙二酯)[PEN]。特別是本案之目的在於提供一種選擇性蝕刻PET上具有銀奈米管之聚合物基質的方法。 It is therefore an object of the present invention to provide a time-saving, inexpensive process for etching polymer surfaces which can be an industrial scale process having high polymer surface efficiencies and throughputs, and which is more conventional than liquid or gas phase. Wet It is much cheaper than dry etching. Moreover, the purpose of the present invention is to provide an inexpensive method for homogenous and uniform structuring and/or patterning of a flexible polymer matrix comprising a second material. In particular, the purpose of the present invention is to provide a suitable method for the selective structuring of polymer matrices comprising silver nanotubes (also known as silver nanowires or silver wires). In particular, the object of the present invention is to provide a method of etching a polymer matrix containing such a silver nanotube, wherein the polymer matrix comprises or consists of polyethylene terephthalate (PET), polyamine Acid ester or poly(ethylene naphthalate) [PEN]. In particular, the object of the present invention is to provide a method of selectively etching a polymer matrix having a silver nanotube on PET.

以許多實驗找到一種新方法以供選擇性蝕刻這樣之含有銀奈米管(也叫做銀奈米線或銀線;後文中僅叫做銀奈米管)的聚合物基質,該方法包含下列步驟a)將鹼性蝕刻糊施塗於該塑料基材,b)加熱,及c)清潔該基材。 A number of experiments have been found to provide a new method for selectively etching a polymer matrix containing a silver nanotube (also known as a silver nanowire or a silver wire; hereinafter simply referred to as a silver nanotube), which comprises the following steps a Applying an alkaline etching paste to the plastic substrate, b) heating, and c) cleaning the substrate.

適合之蝕刻組合物包含選自KOH、Ca(OH)2、NaOH、TMAH、乙二胺、TMEH、SiOH、二乙醇胺或三乙醇胺之鹼性蝕刻劑。 Suitable etching compositions comprise an alkaline etchant selected from the group consisting of KOH, Ca(OH) 2 , NaOH, TMAH, ethylenediamine, TMEH, SiOH, diethanolamine or triethanolamine.

本方法中所施塗之蝕刻糊包含選自1,4-丁二醇、丁內酯、乙醇或甲醇之溶劑,較佳地1,4-丁二醇。特別適合之蝕刻糊包含有機及/或無機填料。因此該施塗之蝕刻糊可包含微粒狀填料。這些填料可為有機性及/或無機性。這些填料較佳為有機聚合物粒子。 The etching paste applied in the method comprises a solvent selected from the group consisting of 1,4-butanediol, butyrolactone, ethanol or methanol, preferably 1,4-butanediol. Particularly suitable etching pastes comprise organic and/or inorganic fillers. Thus the applied etch paste can comprise a particulate filler. These fillers may be organic and/or inorganic. These fillers are preferably organic polymer particles.

根據本發明所使用之蝕刻糊可以多種不同方式施塗於該基材上。該糊較佳用網版印刷。在本發明之特別具體實施例中該等蝕刻組合物係藉由滾網印花(rotary screen printing),或模板印刷施塗。另一個較佳印刷方式是壓印。具有適合性質之糊也可噴墨或分配。在一些案例中較佳是用墨液噴射或微噴射該等糊。但是另一個選擇是藉由噴塗或藉由斜板塗佈施塗該等蝕刻糊。 The etching paste used in accordance with the present invention can be applied to the substrate in a number of different ways. The paste is preferably printed by screen printing. In a particular embodiment of the invention the etching compositions are applied by rotary screen printing, or stencil printing. Another preferred printing method is embossing. Pastes with suitable properties can also be inkjet or dispensed. In some cases it is preferred to eject or micro-spray the paste with ink. However, another option is to apply the etching paste by spraying or by slanting plate coating.

在將該蝕刻組合物施塗於該表面上之後或之中在步驟b)中將該基材加熱至介於約40至140℃之溫度,較佳地介於約60至120℃之溫度歷經至少數秒至數分鐘。在較佳具體實施例中歷經至少1至3分鐘將該基材加熱至約70至90℃之溫度。更佳的是該加熱步驟持續約2分鐘,藉以該溫度係於約80℃。 After or during application of the etching composition to the surface, the substrate is heated in step b) to a temperature between about 40 and 140 ° C, preferably between about 60 and 120 ° C. At least a few seconds to a few minutes. In a preferred embodiment, the substrate is heated to a temperature of from about 70 to 90 ° C for at least 1 to 3 minutes. More preferably, the heating step lasts for about 2 minutes, whereby the temperature is about 80 °C.

經蝕刻後在步驟c)中使用溶劑清潔該處理過之基材並乾燥該基材。這意指使用溶劑沖洗該基材並以空氣或在氮氣流中乾燥該基材。該基材較佳是以去離子水沖洗該基材並利用乾燥空氣或在氮氣流中乾燥該基材。 After the etching, the treated substrate is cleaned using a solvent in step c) and the substrate is dried. This means that the substrate is rinsed with a solvent and dried with air or a stream of nitrogen. The substrate is preferably rinsed with deionized water and dried using dry air or a stream of nitrogen.

本發明之一具體實施例是文中所揭示之方法適用於可撓性及彎曲性塑料基材的蝕刻,該等基材由聚合物組成。這些基材較佳地包含選自聚胺基甲酸酯、PEN或PET的聚合物。實驗顯示,本方法適於蝕刻具有至少100 μm之高解析度的極窄線或結構。 One embodiment of the invention is that the method disclosed herein is applicable to the etching of flexible and flexible plastic substrates composed of a polymer. These substrates preferably comprise a polymer selected from the group consisting of polyurethanes, PEN or PET. Experiments have shown that the method is suitable for etching extremely narrow lines or structures having a high resolution of at least 100 μm.

本發明提供一種於包含聚合物基質之特別不平的可撓性基材中或上面形成特徵之方法。適於根據本發明處理之基材並不特別受限於尺寸或平面幾何形狀。本發明之方法不受表面粗糙度限制且可應用於異質表面形態學(即,具有變化性平滑度和粗糙度之基材)。 The present invention provides a method of forming features in or on a particularly uneven flexible substrate comprising a polymer matrix. Substrates suitable for processing in accordance with the present invention are not particularly limited by size or planar geometry. The method of the present invention is not limited by surface roughness and can be applied to heterogeneous surface morphology (i.e., substrates having variability in smoothness and roughness).

本發明之方法所製造的表面特徵一般可歸類為保形特徵,或減式特徵(subtractive feature),以相對於該基材平面之表面高度為基準。根據表面特徵之基部是否穿入基材平面(該表面特徵形成在其上面)的下面,藉由本發明之方法所製造的表面特徵可另外歸類為穿入表面特徵。用於本文時,“穿透距離”表示介於基材最低點與毗鄰該表面特徵之基材的高度之間的距離。更常地,表面特徵之穿透距離表示相對於該基材平面之最低點。因此,當特徵最低點位於該基材(該特徵位於其上面)平面下面時就是說特徵“穿透”。非穿透之表面特徵可說是具有零穿透距離。 The surface features produced by the method of the present invention can generally be classified as conformal features, or subtractive features, based on the surface height relative to the plane of the substrate. The surface features produced by the method of the present invention may additionally be classified as penetrating surface features depending on whether the base of the surface features penetrates beneath the substrate plane on which the surface features are formed. As used herein, "penetration distance" means the distance between the lowest point of the substrate and the height of the substrate adjacent the surface feature. More often, the penetration distance of the surface features represents the lowest point relative to the plane of the substrate. Thus, the feature "penetrates" when the lowest point of the feature is below the plane of the substrate on which the feature lies. The non-penetrating surface feature can be said to have a zero penetration distance.

表面特徵可根據其組成及功用進一步區分。例如,本發明之方法所製造的表面特徵包括結構表面特徵及導電表面特徵。包括這些表面特徵之成品也可包括半導性表面特徵、絕緣表面特徵及遮蔽表面特徵。用於本文時,“結構表面”表示具有類似或同於該基材(該表面特徵位於其上面)之組成的組成之表面特徵。 Surface features can be further differentiated according to their composition and function. For example, surface features produced by the method of the present invention include structural surface features and conductive surface features. Finished products including these surface features may also include semiconducting surface features, insulating surface features, and masking surface features. As used herein, "structural surface" means a surface feature having a composition that is similar or identical to the composition of the substrate on which the surface features are located.

根據本發明“導電特徵”表示具有導電性或半導電性組成之表面特徵。該“導電特徵”較佳係以導電性組合物 為基礎。該“導電特徵”最佳係以組成物為基礎,該組成物之導電性係以包含金屬化合物之組合物為基礎。 "Electrically conductive features" in accordance with the present invention mean surface features having a conductive or semi-conductive composition. The "conductive feature" is preferably a conductive composition Based on. The "conductive features" are preferably based on a composition whose electrical conductivity is based on a composition comprising a metal compound.

再者“絕緣特徵”表示具有電絕緣性組成之表面特徵。“遮蔽特徵”表示具有不會與對於毗鄰及環繞該表面特徵之基材區域具有反應性的試劑起反應之組成的表面特徵。因此,遮蔽特徵可用以在後續處理步驟,如,但不限於,蝕刻、沉積、植入及表面處理步驟,期間保護某個基材區域。在一些具體實施例中,遮蔽特徵係於後續處理步驟期間或之後移除。根據本發明主要提供選擇性蝕刻包含聚合物及導電材料之表面的方法,該方法不需要任何遮蔽特徵。 Further, "insulating features" means surface features having an electrically insulating composition. By "shading feature" is meant a surface feature that has a composition that does not react with an agent that is reactive with the substrate region adjacent to and surrounding the surface feature. Thus, the masking feature can be used to protect a substrate region during subsequent processing steps such as, but not limited to, etching, deposition, implantation, and surface treatment steps. In some embodiments, the masking feature is removed during or after subsequent processing steps. In accordance with the present invention, a method of selectively etching a surface comprising a polymer and a conductive material is provided, which does not require any masking features.

特徵尺寸及測量 Feature size and measurement

本發明之方法所製造的表面特徵具有經常以長度單位,如埃(Å)、奈米(nm)、毫米(mm)、公分(cm)等等定義之橫向和垂直尺寸。 The surface features produced by the method of the present invention have lateral and vertical dimensions, often defined in units of length, such as angstroms (Å), nanometers (nm), millimeters (mm), centimeters (cm), and the like.

當環繞在該表面上之特徵的表面區為平面時,表面特徵之橫向尺寸可由位於表面特徵相反側的兩點之間的向量大小求得,其中該二點係於該基材平面中且其中該向量與該基材平面平行。在一些具體實施例中,用以求得對稱表面特徵之橫向尺寸的兩點也位於該對稱特徵之鏡面上。在一些具體實施例中,非對稱表面特徵之橫向尺寸可藉由使一個向量正交對準該表面特徵之至少一個邊緣求得。 When the surface area of the feature encircling the surface is planar, the lateral dimension of the surface feature can be determined by the vector size between two points on opposite sides of the surface feature, wherein the two points are in the plane of the substrate and wherein The vector is parallel to the plane of the substrate. In some embodiments, two points for determining the lateral dimension of the symmetrical surface feature are also located on the mirror surface of the symmetrical feature. In some embodiments, the lateral dimension of the asymmetrical surface feature can be determined by orthogonally aligning a vector to at least one edge of the surface feature.

當基材表面之曲率半徑越過100 μm或更大之基材表 面上的距離,或越過1 mm或更大之基材表面上的距離為非零時基材表面即為“彎曲的”。關於彎曲基材把橫向尺寸定義為連接該表面特徵相反側上之兩點的圓周弧段大小,其中該圓具有相當於該基材之曲率半徑的半徑。具有多個或波動曲率之彎曲表面或波狀的基材之橫向尺寸可藉由加總多個圓之弧段大小求得。 When the radius of curvature of the surface of the substrate exceeds 100 μm or more The surface of the substrate is "curved" when the distance on the face, or the distance over the surface of the substrate that is 1 mm or larger, is non-zero. With respect to a curved substrate, the lateral dimension is defined as the size of the circumferential arc segment joining the two points on the opposite side of the surface feature, wherein the circle has a radius corresponding to the radius of curvature of the substrate. The lateral dimension of a curved surface or undulating substrate having a plurality of or varying curvatures can be determined by summing the arc segments of a plurality of circles.

在一些具體實施例中,由本發明方法製造之表面特徵具有至少一個約40 nm至約100 μm之橫向尺寸。在一些具體實施例中,由本發明方法製造之表面特徵的至少一個橫向尺寸具有約40 nm、約50 nm、約60 nm、約70 nm、約80 nm、約100 nm、約150 nm、約200 nm、約250 nm、約300 nm、約400 nm、約500 nm、約600 nm、約700 nm、約800 nm、約900 nm、約1 μm、約2 μm、約3 μm、約4 μm、約5 μm、約10 μm、約15 μm或約20 μm之最小尺寸。依據印刷技術,在一些具體實施例中由本發明方法製造之表面特徵的至少一個橫向尺寸具有約100 μm、約90 μm、約80 μm、約70 μm、約60 μm、約50 μm、約40 μm、約36 μm、約30 μm、約25 μm、約20 μm、約15 μm、約10 μm、約5 μm、約2 μm或約1 μm之最大尺寸。在一些具體實施例中特徵尺寸可為大於100 μm,因為達成之解析度取決於印刷技術,但是本發明之較佳特徵尺寸係為小於100 μm且最佳特徵尺寸係為小於40 μm。 In some embodiments, the surface features produced by the method of the invention have at least one transverse dimension of from about 40 nm to about 100 μm. In some embodiments, at least one lateral dimension of the surface features produced by the method of the invention has about 40 nm, about 50 nm, about 60 nm, about 70 nm, about 80 nm, about 100 nm, about 150 nm, about 200. Nm, about 250 nm, about 300 nm, about 400 nm, about 500 nm, about 600 nm, about 700 nm, about 800 nm, about 900 nm, about 1 μm, about 2 μm, about 3 μm, about 4 μm, A minimum size of about 5 μm, about 10 μm, about 15 μm, or about 20 μm. According to printing techniques, in some embodiments at least one lateral dimension of the surface features produced by the method of the invention has about 100 μm, about 90 μm, about 80 μm, about 70 μm, about 60 μm, about 50 μm, about 40 μm. The largest dimension of about 36 μm, about 30 μm, about 25 μm, about 20 μm, about 15 μm, about 10 μm, about 5 μm, about 2 μm, or about 1 μm. The feature size may be greater than 100 μm in some embodiments, as the resolution achieved depends on the printing technique, but preferred feature sizes of the invention are less than 100 μm and the optimal feature size is less than 40 μm.

在一些具體實施例中,由本發明方法製造之表面特徵 具有約3 Å至約100 μm之穿透距離。在一些具體實施例中,由本發明方法製造之表面特徵具有在表面平面下方約3 Å、約5 Å、約8 Å、約1 nm、約2 nm、約5 nm、約10 nm、約15 nm、約20 nm、約30 nm、約50 nm、約100 nm、約500 nm、約1 μm、約2 μm、約5 μm、約10 μm或約20 μm之最小穿透距離。在一些具體實施例中,由本發明方法製造之表面特徵具有在表面平面下方約1000 μm、約90 μm、約80 μm、約70 μm、約60 μm、約50 μm、約40 μm、約30 μm、約20 μm、約10 μm或約5 μm之最大穿透距離。 Surface features produced by the method of the invention in some embodiments It has a penetration distance of about 3 Å to about 100 μm. In some embodiments, the surface features produced by the method of the invention have about 3 Å, about 5 Å, about 8 Å, about 1 nm, about 2 nm, about 5 nm, about 10 nm, about 15 nm below the surface plane. a minimum penetration distance of about 20 nm, about 30 nm, about 50 nm, about 100 nm, about 500 nm, about 1 μm, about 2 μm, about 5 μm, about 10 μm, or about 20 μm. In some embodiments, the surface features produced by the method of the invention have about 1000 μm, about 90 μm, about 80 μm, about 70 μm, about 60 μm, about 50 μm, about 40 μm, about 30 μm below the surface plane. The maximum penetration distance of about 20 μm, about 10 μm or about 5 μm.

在一些具體實施例中,由本發明方法製造之表面特徵具有約1 000:1至約1:100 000、約100:1至約1:100、約80:1至約1:80、約50:1至約1:50、約20:1至約1:20、約15:1至約1:15、約10:1至約1:10、約8:1至約1:8、約5:1至約1:5、約2:1至約1:2或約1:1之深寬比(即,穿透距離對橫向尺寸之比例)。 In some embodiments, the surface features produced by the method of the invention have from about 1 000:1 to about 1:100 000, from about 100:1 to about 1:100, from about 80:1 to about 1:80, about 50: 1 to about 1:50, about 20:1 to about 1:20, about 15:1 to about 1:15, about 10:1 to about 1:10, about 8:1 to about 1:8, about 5: An aspect ratio of from 1 to about 1:5, from about 2:1 to about 1:2 or about 1:1 (i.e., the ratio of penetration distance to lateral dimension).

減式表面特徵之橫向及/或垂直尺寸可使用可測量表面形貌之分析方法如,例如,掃描式原子力顯微術(AFM)或表面測平術求得。保形表面特徵通常無法藉由表面測平方法測定。然而,如果保形特徵之表面的末端為極性與環繞表面區之極性不同的官能基,該表面特徵之橫向尺寸可利用,例如,間歇接觸式AFM、功能化AFM或掃描探針顯微術求得。 The lateral and/or vertical dimensions of the reduced surface features can be determined using analytical methods that measure the surface topography, such as, for example, scanning atomic force microscopy (AFM) or surface leveling. Conformal surface features are generally not measurable by surface leveling methods. However, if the end of the surface of the conformal feature is a functional group having a polarity different from that of the surrounding surface region, the lateral dimension of the surface feature can be utilized, for example, intermittent contact AFM, functionalized AFM or scanning probe microscopy. Got it.

表面特徵也可以性質如,但不限於,傳導度、電阻率、密度、磁導率、孔隙率、硬度及其組合為基礎利用,例如,掃描探針顯微鏡識別。 Surface features can also be utilized based on properties such as, but not limited to, conductivity, resistivity, density, magnetic permeability, porosity, hardness, and combinations thereof, for example, scanning probe microscopy.

在一些具體實施例中,表面特徵可利用,例如,掃描式電子顯微術或穿透式電子顯微術與周圍之表面區域有所區別。 In some embodiments, surface features can be utilized, for example, by scanning electron microscopy or transmission electron microscopy to distinguish from surrounding surface areas.

在一些具體實施例中,表面特徵具有與周圍之表面區域不同的組成或形態學。因此,表面分析方法可用以同時測定該表面特徵之組成以及該表面特徵之橫向尺寸。適用於測定表面特徵之組成及橫向和垂直尺寸的分析方法包括,但不限於,歐傑(Auger)電子能譜學、能量色散x-射線光譜學、微傅立葉轉換紅外光譜學、粒子誘導x-射線放射、拉曼光譜學、x-射線繞射、x-射線螢光、雷射燒蝕誘導耦合電漿質譜學、拉塞福背散射光譜學/氫正向散射、二次離子質譜學、飛行時間二次離子質譜學、x-射線光電子光譜學及其組合。 In some embodiments, the surface features have a different composition or morphology than the surrounding surface area. Thus, surface analysis methods can be used to simultaneously determine the composition of the surface features and the lateral dimensions of the surface features. Analytical methods suitable for determining the composition and lateral and vertical dimensions of surface features include, but are not limited to, Auger electron spectroscopy, energy dispersive x-ray spectroscopy, micro Fourier transform infrared spectroscopy, particle induction x- Radiation, Raman spectroscopy, x-ray diffraction, x-ray fluorescence, laser ablation induced coupled plasma mass spectrometry, rasape backscatter spectroscopy/hydrogen forward scattering, secondary ion mass spectrometry, Time-of-flight secondary ion mass spectrometry, x-ray photoelectron spectroscopy, and combinations thereof.

糊組合物 Paste composition

根據本發明之措辭“糊”表示具有約1分泊(cP)至約106 cP之黏度的異質組合物。“異質組合物”表示具有多於一種賦形劑或組分之組合物。用於本文時,“糊”可表示黏稠液體或半固體。在一些具體實施例中配合本發明使用之糊具有可調節黏度及/或可藉由一或多個外在條件控制之黏度。在較佳具體實施例中糊表示具有觸變性之組 合物,其意指該黏度隨著有效壓力改變,更精確地這些糊具有有益之非牛頓流動行為。 The phrase "paste" according to the present invention means a heterogeneous composition having a viscosity of from about 1 denomination (cP) to about 10 6 cP. "Heterogeneous composition" means a composition having more than one excipient or component. As used herein, "paste" can mean a viscous liquid or a semi-solid. The paste used in conjunction with the present invention in some embodiments has an adjustable viscosity and/or a viscosity that can be controlled by one or more extrinsic conditions. In a preferred embodiment the paste represents a composition having thixotropic properties, which means that the viscosity changes with effective pressure, and more precisely these pastes have beneficial non-Newtonian flow behavior.

在一些具體實施例中,配合本發明使用之糊具有約1 cP至約106 cP之黏度。在一些具體實施例中,配合本發明使用之糊具有約1 cP、約2 cP、約5 cP、約10 cP、約15 cP、約20 cP、約25 cP、約30 cP、約40 cP、約50 cP、約60 cP、約75 cP、約100 cP、約125 cP、約150 cP、約175 cP、約200 cP、約250 cP、約300 cP、約400 cP、約500 cP、約750 cP、約1000 cP、約1250 cP、約1500 cP或約2000 cP之最小黏度。在一些具體實施例中,配合本發明使用之糊具有約15 000 cP、約10 000 cP、約9 500 cP、約9 000 cP、約8 500 cP、約7 500 cP、約7 000 cP、約6 500 cP、約6 000 cP、約5 500 cP、約5 000 cP、約4 000 cP、約3 000 cP、約2 000 cP、約1 000 cP、約500 cP、約250 cP、約100 cP或約50 cP之最大黏度。所施塗之糊較佳地顯示介於約1000 cP至15 000 cP之黏度,但是一般糊係經選定使其顯示供特定應用方法用之最適黏度。 In some embodiments, the paste used in conjunction with the present invention has a viscosity of from about 1 cP to about 10 6 cP. In some embodiments, the paste used in conjunction with the present invention has about 1 cP, about 2 cP, about 5 cP, about 10 cP, about 15 cP, about 20 cP, about 25 cP, about 30 cP, about 40 cP, About 50 cP, about 60 cP, about 75 cP, about 100 cP, about 125 cP, about 150 cP, about 175 cP, about 200 cP, about 250 cP, about 300 cP, about 400 cP, about 500 cP, about 750 The minimum viscosity of cP, about 1000 cP, about 1250 cP, about 1500 cP, or about 2000 cP. In some embodiments, the paste used in conjunction with the present invention has about 15 000 cP, about 10 000 cP, about 9 500 cP, about 9 000 cP, about 8 500 cP, about 7 500 cP, about 7 000 cP, about 6 500 cP, approximately 6 000 cP, approximately 5 500 cP, approximately 5 000 cP, approximately 4 000 cP, approximately 3 000 cP, approximately 2 000 cP, approximately 1 000 cP, approximately 500 cP, approximately 250 cP, approximately 100 cP Or a maximum viscosity of about 50 cP. The applied paste preferably exhibits a viscosity of between about 1000 cP and 15 000 cP, but in general the paste is selected to exhibit the optimum viscosity for a particular application.

在一些具體實施例中,所用之糊的黏度可以被控制。可控制糊之黏度的參數包括,但不限於,聚合物或共聚物之平均長度、分子量及/或交聯度;以及溶劑之存在及溶劑之濃度;增稠劑(即,黏度調節組分)之存在(該增稠劑可為微粒狀),及該稠稠劑之濃度、存在於該糊中之微粒狀組分的粒徑;存在於該糊中之化合物的自由體積 (即,孔隙率);存在於該糊中之化合物的膨潤;存在於該糊中之帶相反電荷及/或局部帶電的物種之間的離子交互作用(即,溶劑增稠劑交互作用);及其組合。尤其佳的是附加三維網狀結構之增稠劑,如果壓力作用在該糊組合物時該網狀結構會改變且如果該壓力再度降低該網狀結構將重新建立。 In some embodiments, the viscosity of the paste used can be controlled. Parameters that can control the viscosity of the paste include, but are not limited to, the average length, molecular weight, and/or degree of crosslinking of the polymer or copolymer; and the presence of the solvent and the concentration of the solvent; the thickener (ie, the viscosity adjusting component) The presence of the thickener (which may be particulate), the concentration of the thickener, the particle size of the particulate component present in the paste, and the free volume of the compound present in the paste. (ie, porosity); swelling of the compound present in the paste; ionic interaction between oppositely charged and/or locally charged species present in the paste (ie, solvent thickener interaction); And their combinations. It is especially preferred to add a thickening agent to the three-dimensional network structure which will change if pressure is applied to the paste composition and will re-establish if the pressure is again lowered.

在較佳具體實施例中,適於配合本發明使用之糊包含溶劑及增稠劑。在一些具體實施例中,溶劑及增稠劑之組合可經選擇以調整糊之黏度。不受任何特定理論束縛,糊之黏度是製造具有約40 nm至約100 μm之橫向尺寸的表面特徵之重要參數。 In a preferred embodiment, the paste suitable for use in conjunction with the present invention comprises a solvent and a thickening agent. In some embodiments, a combination of solvent and thickener can be selected to adjust the viscosity of the paste. Without being bound by any particular theory, the viscosity of the paste is an important parameter in the fabrication of surface features having a lateral dimension of from about 40 nm to about 100 μm.

依照本發明描述之具有非牛頓流動行為的可印刷均質蝕刻糊之黏度係藉由可形成網狀結構或於液相中膨潤之增稠劑達到,並可隨著所欲之應用區域變化。依照本發明描述之具有非牛頓流動行為的可印刷蝕刻糊包括黏度不得不依存剪切速率之蝕刻糊,特別是具有剪切稀薄作用之蝕刻糊。由增稠劑所製造之網狀結構在剪切應力下塌陷。該網狀結構之修復可在無時間延遲(具有塑性或擬塑性流動行為之非牛頓蝕刻糊)或有時間延遲(具有觸變性流動行為之蝕刻糊)的情況下進行。 The viscosity of a printable homogeneous etching paste having a non-Newtonian flow behavior as described in accordance with the present invention is achieved by a thickening agent which forms a network structure or swells in the liquid phase and which varies depending on the desired application area. A printable etch paste having a non-Newtonian flow behavior as described in accordance with the present invention includes an etch paste having a viscosity that has to be dependent on the shear rate, particularly an etch paste having a shear thinning effect. The network structure made from the thickener collapses under shear stress. Repair of the network structure can be carried out without time delay (non-Newtonian etching paste with plastic or pseudoplastic flow behavior) or with time delay (etching paste with thixotropic flow behavior).

具有非牛頓流動行為的可印刷均質糊係藉由添加增稠劑達到完全均質。微粒狀增稠劑,像是,例如,微粒狀聚矽氧烷或丙烯酸系樹脂,均可使用。 Printable homogeneous pastes with non-Newtonian flow behavior are fully homogenized by the addition of a thickener. A particulate thickener such as, for example, a particulate polyoxyalkylene or an acrylic resin can be used.

適於配合本發明之糊所使用之增稠劑包括,但不限 於,羧烷基纖維素衍生物之金屬鹽類(例如,羧甲基纖維素鈉鹽)、烷基纖維素衍生物(例如,甲基纖維素及乙基纖維素)、經部分氧化之烷基纖維素衍生物(例如,羥乙基纖維素、羥丙基纖維素及羥丙基甲基纖維素)、澱粉類、聚丙烯醯胺凝膠類、聚-N-乙烯基吡咯啶酮之均聚物、聚(烷基醚類)(例如,聚氧化乙烯及聚氧化丙烯)、瓊脂、瓊脂精、黃原膠、動物膠、樹枝狀聚合物、膠體二氧化矽及其組合。其他適合之增稠劑係包含下列之增稠劑 Thickeners suitable for use in conjunction with the pastes of the present invention include, but are not limited to, a metal salt of a carboxyalkyl cellulose derivative (for example, sodium carboxymethyl cellulose), an alkyl cellulose derivative (for example, methyl cellulose and ethyl cellulose), a partially oxidized alkane Cellulose derivatives (for example, hydroxyethyl cellulose, hydroxypropyl cellulose and hydroxypropyl methylcellulose), starches, polypropylene guanamine gels, poly-N-vinylpyrrolidone Homopolymers, poly(alkyl ethers) (eg, polyethylene oxide and polypropylene oxide), agar, agar, xanthan gum, animal glue, dendrimers, colloidal cerium oxide, and combinations thereof. Other suitable thickeners include the following thickeners

˙官能化甲基丙烯酸酯單元,特別是陽離子甲基丙烯酸酯/甲基丙烯醯胺,如Borchigel® A PK ̇-functionalized methacrylate units, especially cationic methacrylate/methacrylamide, such as Borchigel® A PK

˙官能化乙烯基單元,即 ̇ functionalized vinyl unit, ie

-多變水解程度之聚乙烯醇,特別是Mowiol® 47-88(部分水解型,即乙酸乙烯酯及乙烯醇單元)或Mowiol® 56-98(完全水解型)或-聚乙烯基吡咯啶酮類(PVP),特別是PVP K-90或PVP K-120 - Polyhydric alcohols with varying degrees of hydrolysis, especially Mowiol® 47-88 (partially hydrolyzed, ie vinyl acetate and vinyl alcohol units) or Mowiol® 56-98 (fully hydrolyzed) or -polyvinylpyrrolidone Class (PVP), especially PVP K-90 or PVP K-120

這些增稠劑可個別或與以上提及之其他增稠劑合併使用。 These thickeners can be used individually or in combination with other thickeners mentioned above.

根據本發明,增稠劑係以該糊之重量計以約0.1%至約15%,約0.5%至約15%,較佳地約5至約15%,約6.5%至約13%,約7至13%,或約8%至約12%之濃度存在於該蝕刻糊中。 According to the present invention, the thickening agent is from about 0.1% to about 15%, from about 0.5% to about 15%, preferably from about 5 to about 15%, from about 6.5% to about 13%, by weight of the paste. A concentration of from 7 to 13%, or from about 8% to about 12%, is present in the etch paste.

增稠劑較佳可以整個組合物之約8至15%的量,更佳 地10至13%的量添加。 The thickener is preferably present in an amount of from about 8 to 15% of the total composition, more preferably Add 10 to 13% of the ground.

在一些具體實施例中,因為所欲之表面特徵的橫向尺寸縮小,所以可能必須降低該糊中之組分的粒徑或本體長度。例如,為了具有約100 nm或更小之橫向尺寸的表面特徵,可能必須減少或去除糊組合物之聚合物組分。 In some embodiments, the particle size or body length of the components in the paste may have to be reduced because the lateral dimension of the desired surface features is reduced. For example, to have surface features having a lateral dimension of about 100 nm or less, it may be necessary to reduce or remove the polymer component of the paste composition.

一般,糊包含溶劑。適用於本發明之糊的溶劑包括,但不限於水、C1-C8醇類(例如,甲醇、乙醇、丙醇及丁醇)、C6-C12直鏈、分支和環狀烴類(例如,己烷和環己烷)、C6-C14芳基和芳烷基烴類(例如,苯和甲苯)、C3-C10烷基酮類(例如,丙酮)、C3-C10酯類(例如,乙酸乙酯)、C4-C10烷基醚類及其組合。較佳是添加選自1,4-丁二醇、丁內酯、乙醇或甲醇或其混合物的溶劑(較佳地1,4-丁二醇)以製造該等糊。除了這些溶劑或單一溶劑之外,該等糊可包含一定量的水。如果KOH或NaOH是有效蝕刻劑,該等糊通常包含水。一般在製備該等糊之前將KOH、NaOH或Ca(OH)2溶於純水,尤其是去離子水中。在一些具體實施例中,溶劑係以約20重量%至約65重量%之濃度存在於糊中。在一些具體實施例中,溶劑係以該糊之重量計為約65%、約64%、約63%、約61%、約55%、約50%、約40%、約30%、約25%或約20%之最大濃度存在。在一些具體實施例中,溶劑係以該糊之重量計為約20%、約22%、約25%、約30%、約40%、約50%、約60%或約65%之最小濃度存在。因此蝕刻組合物可包含KOH、Ca(OH)2、NaOH、TMAH、乙二胺、 TMEH、SiOH、二乙醇胺及三乙醇胺作為蝕刻劑,該等蝕刻劑係溶於水或水和其他溶劑之混合物中。 Generally, the paste contains a solvent. Paste according to the present invention suitable solvents include, but are not limited to, water, C 1 -C 8 alcohols (e.g., methanol, ethanol, propanol and butanol), C 6 -C 12 straight chain, branched and cyclic hydrocarbons (for example, hexane and cyclohexane), C 6 -C 14 aryl and aralkyl hydrocarbons (for example, benzene and toluene), C 3 -C 10 alkyl ketones (for example, acetone), C 3 - C 10 esters (eg, ethyl acetate), C 4 -C 10 alkyl ethers, and combinations thereof. It is preferred to add a solvent (preferably 1,4-butanediol) selected from 1,4-butanediol, butyrolactone, ethanol or methanol or a mixture thereof to produce the paste. In addition to these solvents or a single solvent, the pastes may contain a certain amount of water. If KOH or NaOH is a effective etchant, the paste typically contains water. The KOH, NaOH or Ca(OH) 2 is typically dissolved in pure water, especially deionized water, prior to preparation of the paste. In some embodiments, the solvent is present in the paste at a concentration of from about 20% to about 65% by weight. In some embodiments, the solvent is about 65%, about 64%, about 63%, about 61%, about 55%, about 50%, about 40%, about 30%, about 25 by weight of the paste. % or about 20% of the maximum concentration is present. In some embodiments, the solvent is a minimum concentration of about 20%, about 22%, about 25%, about 30%, about 40%, about 50%, about 60%, or about 65% by weight of the paste. presence. Therefore, the etching composition may comprise KOH, Ca(OH) 2 , NaOH, TMAH, ethylenediamine, TMEH, SiOH, diethanolamine and triethanolamine as etchants, and the etchants are soluble in water or a mixture of water and other solvents. in.

在本發明之一些具體實施例中,所用之糊另外包含具有有益於所欲目的之性質的添加物。類此之添加物是消泡劑(像是,例如,可以商品名TEGO® Foamex N購得者)、觸變劑(如BYK® 410、Borchigel® Thixo2)、流動控制劑(如,TEGO® Glide ZG 400)、除氣劑(如,TEGO® Airex 985)及黏著促進劑(如,Bayowet® FT 929)。這些添加物可能對於該印刷糊之印刷性具有正面效應,而且對於該蝕刻深度和結果也有正面效應。 In some embodiments of the invention, the paste used additionally comprises an additive having properties beneficial to the intended purpose. Additives of this type are defoamers (such as, for example, those available under the trade name TEGO® Foamex N), thixotropic agents (such as BYK® 410, Borchigel® Thixo2), flow control agents (eg, TEGO® Glide). ZG 400), degassing agents (eg TEGO® Airex 985) and adhesion promoters (eg Bayowet® FT 929). These additives may have a positive effect on the printability of the printing paste and also have a positive effect on the etch depth and results.

在一些具體實施例中,糊另外包含表面活性劑。存在於糊中之表面活性劑會改變經施塗該糊的印模及/或基材之表面能,藉以藉由該糊改善表面之潤濕。適於配合本發明使用之表面活性劑包括,但不限於包括脂族氟碳基之氟碳化合物表面活性劑(例如,ZONYL®FSA及FSN氟表面活性劑、E.I.Du Pont de Nemours and Co.,Wilmington,DE)、氟化烷基烷氧基化物(例如,FUORAD®表面活性劑,Minnesota Mining and Manufacturing Co.,St.Paul,MN)、具有脂族基團之碳氫化合物表面活性劑(例如,包含具有約6至約12個碳原子之烷基的烷基酚乙氧基化物,如辛酚乙氧基化物,可以商品名TRITON® X-100購得,Union Carbide,Danbury,CT)、聚矽氧烷表面活性劑如矽烷類及矽氧烷類(例如,經聚氧乙烯改質之聚二甲基矽氧烷如DOW CORNING® Q2-5211及Q2-5212,Dow Corning Corp.,Midland,MI)、氟化矽氧烷表面活性劑(例如,氟化聚矽烷類如LEVELENE® 100,Ecology Chemical Co.,Watertown MA);及其組合。 In some embodiments, the paste additionally comprises a surfactant. The surfactant present in the paste changes the surface energy of the stamp and/or substrate to which the paste is applied, thereby improving the wetting of the surface by the paste. Surfactants suitable for use in conjunction with the present invention include, but are not limited to, fluorocarbon surfactants including aliphatic fluorocarbon groups (e.g., ZONYL® FSA and FSN fluorosurfactants, EI Du Pont de Nemours and Co., Wilmington, DE), fluorinated alkyl alkoxylates (eg, FUORAD® surfactants, Minnesota Mining and Manufacturing Co., St. Paul, MN), hydrocarbon surfactants having aliphatic groups (eg, An alkylphenol ethoxylate comprising an alkyl group having from about 6 to about 12 carbon atoms, such as a octylphenol ethoxylate available under the tradename TRITON® X-100, Union Carbide, Danbury, CT), Polyoxyalkylene surfactants such as decanes and decanes (for example, polyoxyethylene modified polydimethyl siloxane such as DOW CORNING® Q2-5211 and Q2-5212, Dow Corning Corp., Midland, MI), fluorinated oxane surfactants (eg, fluorinated polydecanes such as LEVELENE® 100, Ecology Chemical Co., Watertown MA); and combinations thereof.

根據本發明之具體實施例,適合之糊另外必定包含蝕刻劑。用於本文時,“蝕刻劑”表示能與基材反應以移除該基材之一部分的組分。因此蝕刻劑係用以形成減式特徵,並與基材反應,形成能自該基材擴散掉之揮發材料,或殘餘物、微粒或碎片,的至少一者,該至少一者能藉由,例如,沖洗或清潔程序自該基材移除。一般根據本發明,適合之蝕刻劑像是之前曾提及之KOH、NaOH或Ca(OH)2,但是較佳地以KOH作為蝕刻劑且其係以該糊之重量計為約15%至約35%,約17%至約30%,或約20%至約30%的濃度存在於根據本發明之糊中。該等蝕刻劑可與下列提及之其他鹼性蝕刻劑合併。 In accordance with a particular embodiment of the invention, a suitable paste additionally must contain an etchant. As used herein, "etchant" means a component that is capable of reacting with a substrate to remove a portion of the substrate. The etchant is therefore used to form a subtractive feature and react with the substrate to form at least one of a volatile material, or a residue, particulate or debris that can diffuse from the substrate, the at least one being capable of For example, a rinse or cleaning procedure is removed from the substrate. Generally, in accordance with the present invention, suitable etchants are KOH, NaOH or Ca(OH) 2 as previously mentioned, but preferably KOH is used as an etchant and is from about 15% to about 5% by weight of the paste. A concentration of 35%, from about 17% to about 30%, or from about 20% to about 30%, is present in the paste according to the invention. These etchants can be combined with other alkaline etchants mentioned below.

與蝕刻劑反應之基材的組成及/或形態學較佳為包含導電材料之聚合物表面。由蝕刻劑與該基材之反應所形成的減式特徵也沒有特別限制,只要與該蝕刻劑反應之材料可自所得的減式表面特徵移除即可。不受任何特定理論束縛,蝕刻劑可藉由與該基材反應自這樣之表面移除材料以形成可,例如,藉由沖洗或清潔程序自該基材移除之揮發性產物、殘餘物、微粒或碎片。例如,蝕刻劑可藉由形成可溶性或揮發性物種與建造該表面之聚合物反應。在一些具體實施例中,蝕刻劑可與基材反應以形成水溶性之離子物種。適用於移除由蝕刻劑與表面之反應所形成的殘餘物 或微粒之方法係例如揭示於美國專利第5,894,853號中,在此以引用之方式將其全文併入本文。 The composition and/or morphology of the substrate that reacts with the etchant is preferably a polymer surface comprising a conductive material. The subtractive feature formed by the reaction of the etchant with the substrate is also not particularly limited as long as the material reactive with the etchant can be removed from the resulting reduced surface features. Without being bound by any particular theory, an etchant may be formed by removing material from such a surface by reaction with the substrate, for example, volatile products, residues removed from the substrate by a rinsing or cleaning procedure, Particles or debris. For example, an etchant can react with a polymer that builds the surface by forming a soluble or volatile species. In some embodiments, the etchant can react with the substrate to form a water soluble ionic species. Suitable for removing residues formed by the reaction of an etchant with a surface Or a method of microparticles is disclosed, for example, in U.S. Patent No. 5,894,853, the disclosure of which is incorporated herein in its entirety by reference.

適於搭配本發明使用之蝕刻劑包括如上所述之鹼性蝕刻劑。適於搭配本發明使用之鹼性蝕刻劑較佳包括氫氧化鉀,其可與蝕刻劑像是氫氧化鈉、氫氧化鈣、氫氧化銨、氫氧化四烷基銨、氨水、乙醇胺、乙二胺及其組合合併,但是最佳之蝕刻劑是氫氧化鉀本身。據發現,可撓性聚合物表面包含或由下列組成:聚合物基質與銀奈米管(在此及後文中使用該措辭“銀奈米管”也意指具有介於1與100 nm之間的直徑及達於數百奈米的長度之一維結構的“銀線”及“銀奈米線”),其中該聚合物基質包含或由下列組成:聚對苯二甲酸乙二酯(PET)、聚胺基甲酸酯或聚(萘二甲酸乙二酯)[PEN],且如果施塗包含以整個組合物之重量計在約15至35%之範圍中,較佳地介於20至30%之濃度之KOH的蝕刻糊,便可以高解析度選擇性蝕刻。 An etchant suitable for use with the present invention includes an alkaline etchant as described above. The alkaline etchant suitable for use in conjunction with the present invention preferably comprises potassium hydroxide, which may be etchant like sodium hydroxide, calcium hydroxide, ammonium hydroxide, tetraalkylammonium hydroxide, ammonia, ethanolamine, ethylene. The amines and combinations thereof are combined, but the best etchant is potassium hydroxide itself. It has been found that the surface of the flexible polymer comprises or consists of a polymer matrix and a silver nanotube (this term is used herein and the term "silver nanotube" also means between 1 and 100 nm. a "silver wire" and "silver nanowire" having a diameter and a dimension of one hundred nanometers, wherein the polymer matrix comprises or consists of polyethylene terephthalate (PET) , a polyurethane or poly(ethylene naphthalate) [PEN], and if applied comprises from about 15 to 35% by weight of the total composition, preferably between 20 The etching paste to a concentration of 30% KOH can be selectively etched with high resolution.

在較佳具體實施例中,該可撓性聚合物表面包含導電組分。用於本文時,“導電組分”表示能轉移或移動電荷之化合物或物種。適於搭配本發明使用之導電組分包括,但不限於,金屬、奈米粒子、聚合物及其組合。在一些具體實施例中,導電組分係以重量計為約1%至約90%之濃度存在於該聚合物表面中。 In a preferred embodiment, the flexible polymer surface comprises a conductive component. As used herein, "conductive component" means a compound or species that is capable of transferring or moving a charge. Conductive components suitable for use with the present invention include, but are not limited to, metals, nanoparticles, polymers, and combinations thereof. In some embodiments, the electrically conductive component is present in the polymer surface at a concentration of from about 1% to about 90% by weight.

適於搭配本發明使用之金屬包括,但不限於過渡金屬、鋁、矽、磷、鎵、鍺、銦、錫、銻、鉛、鉍、其合金 及其組合。在本發明之最佳具體實施例中,該聚合物表面包含銀,其係呈奈米粒子(即,具有100 nm或更小,或約0.5 nm至約100 nm之直徑的粒子)形式存在。適於搭配本發明使用之奈米粒子可為均質、多層、功能化及其組合。其較佳形成為似奈米管狀。 Metals suitable for use with the present invention include, but are not limited to, transition metals, aluminum, bismuth, phosphorus, gallium, germanium, indium, tin, antimony, lead, antimony, alloys thereof. And their combinations. In a preferred embodiment of the invention, the polymer surface comprises silver in the form of nanoparticles (i.e., particles having a diameter of 100 nm or less, or from about 0.5 nm to about 100 nm). Nanoparticles suitable for use with the present invention can be homogeneous, multilayered, functionalized, and combinations thereof. It is preferably formed into a nanotube-like tubular shape.

本發明之方法特別適用於蝕刻可撓性及彎曲性塑料基材,該等基材由聚合物,尤其是選自聚胺基甲酸酯、PET或PEN的聚合物組成。實驗相應地顯示本方法適於蝕刻具有至少100 μm之高解析度的極窄線或結構。 The method of the present invention is particularly useful for etching flexible and flexible plastic substrates composed of a polymer, especially a polymer selected from the group consisting of polyurethane, PET or PEN. Experiments have accordingly shown that the method is suitable for etching very narrow lines or structures having a high resolution of at least 100 μm.

本發明所用之糊可包含導電組分及反應性組分。例如,存在於該糊中之反應性組分能促進至少該蝕刻劑與基材之間的反應、該糊與被蝕刻之基材之間的黏著力及其組合。此糊組成之反應所形成的表面特徵包括減式穿透、保形穿透減式穿透及保形穿透表面特徵。 The paste used in the present invention may contain a conductive component and a reactive component. For example, the reactive component present in the paste can promote at least the reaction between the etchant and the substrate, the adhesion between the paste and the substrate being etched, and combinations thereof. The surface features formed by the reaction of the paste composition include subtractive penetration, conformal penetration reduction penetration, and conformal penetration surface features.

本發明包括含蝕刻劑之糊的用途,該蝕刻劑可應用於製造具有減式表面特徵,該減式表面特徵中具有導電特徵插入件。 The present invention includes the use of an etchant-containing paste that can be applied to fabricate a reduced surface feature having conductive feature inserts therein.

基材 Substrate

適於藉由本發明之方法形成圖案的基材包括能與印模或篩網接觸之表面的材料。適於藉由本發明之方法形成圖案的基材包括膜、薄膜、層積物、箔片、塑料、聚合物及其組合。在一些具體實施例中,基材係選自任何以上材料之多孔性變化例。 Substrates suitable for patterning by the method of the present invention include materials that are capable of contacting the surface of the stamp or screen. Substrates suitable for patterning by the method of the present invention include films, films, laminates, foils, plastics, polymers, and combinations thereof. In some embodiments, the substrate is selected from the group consisting of variations in porosity of any of the above materials.

能藉由本發明之方法形成圖案的基材包含可撓性基材,如塑料、複合材料、層積物、薄膜、金屬箔片及其組合。在一些具體實施例中,該可撓性材料可藉由本發明之方法以捲裝進出(reel-to-reel)方式形成圖案。較佳地,把該蝕刻糊轉移至能以印刷技術蝕刻之基材表面。特別是,網版印刷、絲網印刷、移印(pad printing)、印模印刷及噴墨印刷方法是熟於此藝之士習知的印刷方法。手動施塗也可以。 Substrates that can be patterned by the method of the present invention comprise flexible substrates such as plastics, composites, laminates, films, metal foils, and combinations thereof. In some embodiments, the flexible material can be patterned in a reel-to-reel manner by the method of the present invention. Preferably, the etch paste is transferred to a surface of the substrate that can be etched by printing techniques. In particular, screen printing, screen printing, pad printing, stamp printing, and ink jet printing methods are well known printing methods. Manual application is also possible.

本發明預期藉由選擇適用於特定基材(即聚對苯二甲酸乙二酯(PET),其通常為低分子量聚合物且其顯示高破裂安全性)之糊使處理步驟的效能、效率、成本及速度最佳化。 The present invention contemplates the efficiency, efficiency, and efficiency of the processing steps by selecting a paste suitable for a particular substrate (i.e., polyethylene terephthalate (PET), which is typically a low molecular weight polymer that exhibits high burst safety). Cost and speed are optimized.

該蝕刻可於環境溫度,像是室溫進行。但是該蝕刻反應也可藉由能量輸入活化,例如藉由對流及藉由IR發射器、UV或雷射輻射之熱輻射,結果是把正好在該表面上的反應之處的溫度提高至約300℃。如果適用,該糊於該基材上之反應係藉由至少一類輻射,例如,藉由紫外線引發,該紫外光能配合反應可藉由紫外光引發之糊使用,且該紫外光使基材正面上之糊的反應能藉由紫外光照射該基材背側引發。該反應較佳以IR波引發並提高該表面溫度。該蝕刻較佳於達於180℃之溫度,最佳在達於100℃之溫度的溫和條件下進行。這意指該蝕刻本身可在介於約20至300℃之溫度的廣大範圍中進行,但是取決於被蝕刻之表面的化學性質,該蝕刻溫度係調整在室溫至180℃之 範圍中。但是如果可達成好的蝕刻結果,該溫度也可調整於至高100℃之中等溫度。一般,聚合物表面之蝕刻於較低溫度進行且無機表面之蝕刻可於至高300℃之較高溫度進行。 The etching can be carried out at ambient temperature, such as room temperature. However, the etching reaction can also be activated by energy input, for example by convection and thermal radiation by IR emitters, UV or laser radiation, with the result that the temperature at the reaction site just above the surface is increased to about 300. °C. If applicable, the reaction on the substrate is initiated by at least one type of radiation, for example, by ultraviolet light, which can be used by ultraviolet light-initiated paste, and the ultraviolet light causes the substrate to be front side The reaction of the paste can be initiated by irradiation of the back side of the substrate with ultraviolet light. The reaction is preferably initiated by IR waves and increases the surface temperature. The etching is preferably carried out at a temperature of up to 180 ° C, preferably under mild conditions at a temperature of up to 100 ° C. This means that the etching itself can be carried out in a wide range of temperatures between about 20 and 300 ° C, but depending on the chemistry of the surface being etched, the etching temperature is adjusted from room temperature to 180 ° C. In the scope. However, if a good etching result can be achieved, the temperature can also be adjusted to a temperature of up to 100 ° C. Typically, the etching of the polymer surface is carried out at a lower temperature and the etching of the inorganic surface can be carried out at a higher temperature of up to 300 °C.

印模、模板或篩網 Impression, template or screen

用於本文時,“印模”表示該印模之至少一個表面上具有界定圖案之刻痕的三維物體。配合本發明使用之印模並不特別受幾何形狀限制,且可為扁平的、彎曲的、平滑的、粗糙的、波狀的及其組合。在一些具體實施例中,印模可具有適用於保形接觸基材之三維形狀。在一些具體實施例中,印模可包含多個形成圖案之表面,該等表面包含相同或不同圖案。在一些具體實施例中,印模包含圓筒,其中該圓筒之彎曲面中的一或多個刻痕明示圖形之輪廓。因為該筒形印模滾過表面,所以圖形重複出現。當其滾轉時糊或墨液可被施塗於筒形印模。對於具有多個形成圖案之表面的印模:清潔、施塗、接觸、移除及反應步驟可同時發生以施塗同一印模之不同表面。 As used herein, "stencil" means a three-dimensional object having a score defining a pattern on at least one surface of the stamp. The stamps used in conjunction with the present invention are not particularly limited by geometry and may be flat, curved, smooth, rough, wavy, and combinations thereof. In some embodiments, the stamp can have a three-dimensional shape suitable for conformal contact with the substrate. In some embodiments, the stamp can comprise a plurality of patterned surfaces, the surfaces comprising the same or different patterns. In some embodiments, the stamp comprises a cylinder, wherein one or more scores in the curved face of the cylinder are indicative of the contour of the graphic. Since the cylindrical stamp rolls over the surface, the pattern repeats. The paste or ink can be applied to the cylindrical stamp as it rolls. For stamps having multiple patterned surfaces: the cleaning, application, contacting, removing, and reacting steps can occur simultaneously to apply different surfaces of the same stamp.

根據本發明使用之印模並不特別受限於材料,並可由多種材料如,但不限於,玻璃(例如,石英、藍寶石、硼矽酸鹽玻璃)、陶瓷(例如,金屬碳化物、金屬氮化物、金屬氧化物)、塑料、金屬及其組合製造。在一些具體實施例中,配合本發明使用之印模包含彈性體聚合物。 The stamps used in accordance with the present invention are not particularly limited by materials and may be comprised of a variety of materials such as, but not limited to, glass (e.g., quartz, sapphire, borosilicate glass), ceramics (e.g., metal carbides, metal nitrogen). Manufactured, metal oxides, plastics, metals, and combinations thereof. In some embodiments, the stamp used in conjunction with the present invention comprises an elastomeric polymer.

用於本文時,“彈性體印模”表示一種模製三維物 體,其包含彈性體聚合物,且該印模之至少一個表面上具有明示圖案的輪廓之刻痕。更常地,將包含彈性體聚合物之印模稱為彈性體印模。用於本文時,“彈性體模板”表示一種模製三維物體,其包含彈性體聚合物,並具有至少一個穿透該模板之二相對表面的開口以於該三維物體之模面中形成開口。彈性體印模或模板可另外包含硬質可撓性、多孔性或編織之襯底材料,或當在文中所述之處理期間使用該印模或模板時能防止該印模或模板變形的任何其他機構。類似於印模,配合本發明使用之彈性體模板並不特別受幾何形狀限制,且可為扁平的、彎曲的、平滑的、粗糙的、波狀的及其組合。 As used herein, "elastomer stamp" means a molded three-dimensional object A body comprising an elastomeric polymer and having at least one surface of the stamp having a contoured outline of the pattern. More commonly, a stamp comprising an elastomeric polymer is referred to as an elastomeric stamp. As used herein, "elastomer template" means a molded three-dimensional object comprising an elastomeric polymer and having at least one opening penetrating the opposite surfaces of the template to form an opening in the die face of the three-dimensional object. The elastomeric stamp or stencil may additionally comprise a rigid flexible, porous or woven substrate material, or any other that prevents deformation of the stamp or stencil when the stamp or stencil is used during processing as described herein. mechanism. Similar to the stamp, the elastomeric template used in conjunction with the present invention is not particularly limited by geometry and can be flat, curved, smooth, rough, wavy, and combinations thereof.

適於配合本發明使用之彈性體聚合物包括,但不限於,聚二甲基矽氧烷、聚倍半矽氧烷、聚異戊二烯、聚丁二烯、聚氯丁二烯、鐵氟龍及其組合。用以製造適於配合本發明使用之彈性體印模的其他適合材料及方法係揭示於美國專利第5,512,131號;第5,900,160號;第6,180,239號;及第6,776,094號;及審查中之美國申請案第10/766,427號,在此以引用的方式將其全文併入本文。 Elastomeric polymers suitable for use in conjunction with the present invention include, but are not limited to, polydimethylsiloxane, polysesquioxanes, polyisoprene, polybutadiene, polychloroprene, iron Fluorine and its combination. Other suitable materials and methods for making elastomeric impressions suitable for use in conjunction with the present invention are disclosed in U.S. Patent Nos. 5,512,131; 5,900,160; 6,180,239; and 6,776,094; 10/766,427, herein incorporated by reference in its entirety.

糊類可藉由此技術中習知之方法如,但不限於,網版印刷、噴墨印刷、注射器沉積、噴塗、旋塗、刷塗及其組合,及其他普通熟悉塗佈表面之技術者習知的施塗方法施塗於印模表面或基材表面。在一些具體實施例中,把糊倒在印模表面上,並接著使刮刀橫向移過該表面以確保該印模中之刻痕完全且均勻裝滿該糊。該刮刀也能自印模表面 移除過量之糊。把糊施塗於基材或該印模表面可包含於約100轉/分(rpm)至約5,000 rpm,或約1,000 rpm至約3,000 rpm旋轉該表面,同時將該糊倒在或噴塗在該旋轉表面上。 Pastes may be by methods known in the art such as, but not limited to, screen printing, ink jet printing, syringe deposition, spray coating, spin coating, brush coating, and combinations thereof, as well as other common familiarity with coated surfaces. The known application method is applied to the surface of the stamp or the surface of the substrate. In some embodiments, the paste is poured onto the surface of the stamp and the blade is then moved laterally across the surface to ensure that the score in the stamp completely and evenly fills the paste. The scraper can also self-print the surface Remove excess paste. Applying the paste to the substrate or the surface of the stamp may comprise rotating the surface at about 100 revolutions per minute (rpm) to about 5,000 rpm, or from about 1,000 rpm to about 3,000 rpm, while pouring or spraying the paste on the surface. Rotate on the surface.

較佳地,把糊施塗於印模以完全且均勻填滿該印模表面中之至少一個刻痕。不受任何特定理論所束縛,因為該印模中之刻痕的橫向尺寸變更小,所以該糊之黏度理應降低以確保該印模中之圖案在該施塗步驟期間均勻填滿。糊不均勻施塗於印模會造成無法正確且再現地製造具有所欲之橫向尺寸的表面特徵。印刷之其他適合具體實施例係為網版印刷、滾網印刷、斜板及分配印刷或噴塗,如果適度調整該組合物之黏度,也可以噴射印刷。在以上揭示之一些具體實施例中,糊之組成可經調配以控制其黏度使其可藉由網版印刷施塗。可控制糊黏度之參數包括,但不限於,溶劑組成、溶劑濃度、增稠劑組成、增稠劑濃度、組分之粒徑、聚合物組分之分子量、聚合物組分之交聯度、組分之自由體積(即,孔隙率)、組分之膨潤、糊組分之間的離子交互作用(例如,溶劑-增稠劑交互作用)及其組合。 Preferably, the paste is applied to the stamp to completely and evenly fill at least one of the scores in the surface of the stamp. Without being bound by any particular theory, since the lateral dimension of the score in the stamp is less altered, the viscosity of the paste should be reduced to ensure that the pattern in the stamp is evenly filled during the application step. Improper application of the paste to the stamp can result in the inability to correctly and reproducibly produce surface features having the desired lateral dimensions. Other suitable embodiments for printing are screen printing, web printing, swashplates, and dispensing printing or spraying. If the viscosity of the composition is moderately adjusted, jet printing can also be performed. In some embodiments disclosed above, the composition of the paste can be formulated to control its viscosity such that it can be applied by screen printing. Parameters that can control paste viscosity include, but are not limited to, solvent composition, solvent concentration, thickener composition, thickener concentration, particle size of the component, molecular weight of the polymer component, cross-linking degree of the polymer component, Free volume (i.e., porosity) of the components, swelling of the components, ionic interaction between the paste components (e.g., solvent-thickener interaction), and combinations thereof.

在一些具體實施例中,糊之黏度係在施塗步驟、接觸步驟、反應步驟或其組合之一或多者期間改變。例如,當將該糊施塗於印模表面以確保印模表面中之刻痕完全且均勻填滿時糊之黏度會降低。等塗好之印模與基材接觸之後,該糊之黏度會增加以確保將該印模中之刻痕的橫向尺 寸轉移至形成於該基材上之表面特徵的橫向尺寸。 In some embodiments, the viscosity of the paste changes during one or more of the application step, the contacting step, the reaction step, or a combination thereof. For example, when the paste is applied to the surface of the stamp to ensure that the score in the surface of the stamp is completely and evenly filled, the viscosity of the paste is lowered. After the coated stamp is in contact with the substrate, the viscosity of the paste is increased to ensure a horizontal ruler of the score in the stamp. The inch is transferred to the lateral dimension of the surface features formed on the substrate.

不受特定理論束縛,糊之黏度能藉由外部刺激如溫度、壓力、pH、有或沒有反應性物種、電流、磁場及其組合控制。例如,提高糊之溫度經常會降低其黏度;且提高施加於糊之壓力經常會提高其黏度,具有觸變性之糊除外。 Without being bound by a particular theory, the viscosity of the paste can be controlled by external stimuli such as temperature, pressure, pH, with or without reactive species, current, magnetic field, and combinations thereof. For example, increasing the temperature of the paste often reduces its viscosity; and increasing the pressure applied to the paste often increases its viscosity, with the exception of thixotropy.

糊之pH隨著該糊中之一或多種組分的性質,視呈pH之函數的組分混合物總溶解度而提高或降低糊之黏度。例如,含弱酸性聚合物之含水糊經常具有低於該聚合物之pKa的降低黏度,因為該聚合物之溶解度將會在其pKa之下提高。然而,如果該聚合物之質子化導致模聚合物與降低該聚合物溶解度之糊中另一種組分之間的離子交互作用,則該糊之黏度可能會提高。細心選擇糊組分能使糊黏度被控制於廣大範圍之pH值。 The pH of the paste increases or decreases the viscosity of the paste as a function of the total solubility of the component mixture as a function of pH, as a function of one or more components of the paste. For example, a weakly acidic aqueous paste containing the polymer having a reduced viscosity often less than the pK a of the polymer, since the solubility of the polymer will increase under its pK a. However, if the protonation of the polymer results in an ionic interaction between the mold polymer and another component of the paste which reduces the solubility of the polymer, the viscosity of the paste may increase. Careful selection of the paste component allows the paste viscosity to be controlled over a wide range of pH values.

將該糊自印模或另一種印刷裝置之表面轉移至基材可藉由能促進糊與基材的某個區域之間的黏著力之該糊與該印模或該印刷裝置的表面之間,該糊與該基材之間,該印模或印刷裝置的表面與該基材之間,及其組合的一或多個交互作用促進。不受特定理論束縛,糊對基材之黏著力可藉由重力、凡得瓦交互作用、共價鍵、離子交互作用、氫鍵、親水性交互作用、疏水性交互作用、磁交互作用及其組合促進。因此,該蝕刻糊較佳係形成以致於使糊與印模或該印刷裝置之表面之間的這些交互作用最小化並促成自該印模或該印刷裝置之表面將該糊轉移至該基材。 Transferring the paste from the surface of the stamp or another printing device to the substrate can be achieved between the paste and the surface of the printing device by adhesion between the paste and a region of the substrate. One or more interactions between the paste and the substrate, between the surface of the stamp or printing device and the substrate, and combinations thereof. Without being bound by a particular theory, the adhesion of the paste to the substrate can be achieved by gravity, van der Waals interaction, covalent bonds, ionic interactions, hydrogen bonding, hydrophilic interactions, hydrophobic interactions, magnetic interactions and Combination promotion. Accordingly, the etch paste is preferably formed such that these interactions between the paste and the surface of the stamp or the printing device are minimized and the paste is transferred from the surface of the stamp or the printing device to the substrate. .

在一些具體實施例中,使印模或彈性體模板或印刷篩網與材料表面接觸可藉由將該壓力或真空施加於印模、模板及表面之一或二者的背側促成。在一些具體實施例中,該壓力或真空之施加可確保糊自該印模或模板及材料的表面之間實質移除。在一些具體實施例中,該壓力或真空之施加可確保該等表面之間有保形接觸。在一些具體實施例中,該壓力或真空之施加可使存在於該印模與該基材的表面之間的氣泡,或存在於該印模表面之刻痕中的氣泡,或在該糊反應之前存在於該糊中的氣泡出現率最小化。不欲受任何特定理論束縛,氣泡之移除能促成具有100 μm或更小之橫向尺寸的表面特徵之再現性形成。 In some embodiments, contacting the stamp or elastomeric template or printing screen with the surface of the material can be facilitated by applying the pressure or vacuum to the back side of one or both of the stamp, the template, and the surface. In some embodiments, the application of this pressure or vacuum ensures substantial removal of the paste from the surface of the stamp or template and material. In some embodiments, the application of the pressure or vacuum ensures conformal contact between the surfaces. In some embodiments, the application of the pressure or vacuum may cause bubbles present between the stamp and the surface of the substrate, or bubbles present in the score of the surface of the stamp, or in the paste reaction The rate of occurrence of bubbles previously present in the paste is minimized. Without wishing to be bound by any particular theory, the removal of the bubbles can contribute to the reproducible formation of surface features having a lateral dimension of 100 μm or less.

在一些具體實施例中,基材之表面及/或印刷裝置像是印模之表面可選擇性形成圖案,功能化,衍化,織構化或另行預處理。用於本文時,“預處理”表示在糊施塗或反應之前以化學或物理方式使表面改質。預處理可包括,但不限於,清潔、氧化、還原、衍化、功能化、暴露於反應性氣體、暴露於電漿、暴露於熱能(例如,對流熱能、輻射熱能、傳導熱能及其組合)、暴露於電磁輻射(例如,x-射線、紫外光、可見光、紅外光及其組合)、及其組合。不欲受任何特定理論束縛,預處理印模及/或基材之表面會提高或降低糊與表面之間的黏著交互作用,並促成具有100 μm或更小之橫向尺寸的表面特徵之形成。 In some embodiments, the surface of the substrate and/or the surface of the printing device, such as a stamp, can be selectively patterned, functionalized, derivatized, textured, or otherwise pretreated. As used herein, "pretreatment" means chemically or physically modifying the surface prior to application or reaction of the paste. Pretreatment can include, but is not limited to, cleaning, oxidizing, reducing, derivatizing, functionalizing, exposing to reactive gases, exposure to plasma, exposure to thermal energy (eg, convective thermal energy, radiant thermal energy, conductive heat, and combinations thereof), Exposure to electromagnetic radiation (eg, x-rays, ultraviolet light, visible light, infrared light, and combinations thereof), and combinations thereof. Without wishing to be bound by any particular theory, pre-processing the surface of the stamp and/or substrate will increase or decrease the adhesive interaction between the paste and the surface and contribute to the formation of surface features having a transverse dimension of 100 μm or less.

例如,以極性官能基衍化印模及/或基材之表面(例如,氧化該表面)能藉由親水性糊促進表面潤濕並藉由疏 水性糊阻止表面潤濕。再者,疏水性及/或親水性交互作用可用以防止糊穿透印模本體。例如,以氟碳化合物官能基衍化印模表面會促成糊自該印模轉移至材料表面。 For example, derivatizing the surface of the stamp and/or substrate with a polar functional group (eg, oxidizing the surface) can promote surface wetting by a hydrophilic paste and by thinning The aqueous paste prevents surface wetting. Furthermore, hydrophobic and/or hydrophilic interactions can be used to prevent paste from penetrating the stamp body. For example, derivatization of the surface of the stamp with a fluorocarbon functional group promotes transfer of the paste from the stamp to the surface of the material.

本發明之方法藉由使糊與基材的某個區域反應以製造表面特徵。用於本文時,“反應”表示引發包含下列至少一者之化學反應:使存在於該糊中之一或多種組分相互反應,使糊之一或多種組分與基材表面反應,使糊之一或多種組分與基材之表面下區域反應,及其組合。 The method of the present invention produces surface features by reacting a paste with a region of the substrate. As used herein, "reaction" means initiating a chemical reaction comprising at least one of the following: reacting one or more components present in the paste with one another to cause one or more components of the paste to react with the surface of the substrate to render a paste One or more components react with the subsurface regions of the substrate, and combinations thereof.

根據本發明,反應包含將糊施塗於基材。這意指例如,藉由糊與基材表面之間的接觸引發反應。 According to the invention, the reaction comprises applying a paste to a substrate. This means, for example, that the reaction is initiated by contact between the paste and the surface of the substrate.

因此,該糊之反應包含該糊與該基材上的官能基之間的化學反應,或該糊與該基材表面下方的官能基之間的化學反應。因此,本發明之方法包含使糊或糊之組分不僅與基材表面反應,還與其表面下方之基材區域反應,藉以在基材形成插入特徵或鑲嵌特徵。不欲受任何特定理論束縛,糊之組分能藉由在該基材表面上反應,或滲入及/或擴散至該基材中與基材反應。在一些具體實施例中,糊滲入基材表面能藉由對印模、模板、基材或其組合之背側施加物理壓力或真空促成。 Thus, the reaction of the paste comprises a chemical reaction between the paste and a functional group on the substrate, or a chemical reaction between the paste and a functional group below the surface of the substrate. Accordingly, the method of the present invention comprises reacting a component of the paste or paste not only with the surface of the substrate but also with a region of the substrate below the surface to form an insertion feature or a mosaic feature on the substrate. Without wishing to be bound by any particular theory, the components of the paste can react with the substrate by reacting on the surface of the substrate, or infiltrating and/or diffusing into the substrate. In some embodiments, the penetration of the paste into the surface of the substrate can be facilitated by applying physical pressure or vacuum to the back side of the stamp, template, substrate, or combination thereof.

糊與基材之間的反應會改變基材之一或多種性質,其中性質改變係位於與該糊反應之基材部分。 The reaction between the paste and the substrate changes one or more properties of the substrate, wherein the property change is in the portion of the substrate that reacts with the paste.

較佳地,使該糊與基材反應包含擴展至基材平面(即,本體)之反應,以及在該基材表面之側面中的反應。例如,蝕刻劑與基材之間的反應包含使該蝕刻劑滲入 該基材表面(即,與該表面直交滲入),以致於該表面特徵之最低點的橫向尺寸大約等於該基材表面處之特徵的尺寸。 Preferably, reacting the paste with the substrate comprises reacting to the plane of the substrate (i.e., the bulk) and the reaction in the sides of the surface of the substrate. For example, the reaction between the etchant and the substrate involves infiltrating the etchant The surface of the substrate (i.e., infiltrated orthogonally to the surface) such that the lateral dimension of the lowest point of the surface feature is approximately equal to the size of the feature at the surface of the substrate.

在一些具體實施例中,蝕刻反應也於糊與基材之間依橫向發生,以致於於表面特徵底部處之橫向尺寸比於該表面之平面處的特徵之橫向尺寸窄。用於本文時,“底蝕”表示當表面特徵之橫向尺寸比用以施塗形成該表面特徵之糊的印模之橫向尺寸大時的情況。典型地,底蝕係由蝕刻劑或反應性物種與橫向尺寸中之表面的反應造成,且會導致減式特徵上形成斜緣。 In some embodiments, the etching reaction also occurs laterally between the paste and the substrate such that the lateral dimension at the bottom of the surface features is narrower than the lateral dimension of the features at the plane of the surface. As used herein, "bottom erosion" refers to the situation when the lateral dimension of the surface features is greater than the lateral dimension of the stamp used to apply the paste forming the surface features. Typically, the undercut is caused by the reaction of an etchant or reactive species with the surface in the lateral dimension and results in the formation of a beveled edge on the subtractive feature.

配合本發明使用之糊組合物係調配成使該糊在表面之橫向尺寸中的反應最小化(即,使底蝕最小化)。不欲受任何特定理論束縛,底蝕較佳可藉由使用光活化糊(即,暴露於輻射時與表面反應之糊)最小化。照射該糊通過該透明表面背側引發該糊與該表面之間的反應。因為該光僅照射與該表面依垂直反應之糊的表面,沿著減式表面特徵側壁之糊沒暴露於紫外光,藉以使該表面之橫向蝕刻最小化。此技術一般適於任何針對該表面之反應起始劑。在一些具體實施例中,該反應起始劑可透過印模或彈性體模板之背側將糊活化。 The paste compositions used in conjunction with the present invention are formulated to minimize the reaction of the paste in the lateral dimensions of the surface (i.e., to minimize undercut). Without wishing to be bound by any particular theory, the undercut is preferably minimized by the use of a photoactivated paste (i.e., a paste that reacts with the surface upon exposure to radiation). Irradiating the paste initiates a reaction between the paste and the surface through the back side of the transparent surface. Because the light only illuminates the surface of the paste that reacts perpendicularly to the surface, the paste along the sidewalls of the reduced surface features is not exposed to ultraviolet light, thereby minimizing lateral etching of the surface. This technique is generally suitable for any reaction initiator for this surface. In some embodiments, the reaction initiator can activate the paste through the back side of the stamp or elastomeric template.

底蝕也可藉由使用具有異向性組成或結構之基材最小化,以致於比起依橫向尺寸蝕刻偏好依垂直方向蝕刻。一些材料本質上為異向性,而異向性也可藉由,例如,以化學藥品或輻射及其組合預處理基材導入。 The undercut can also be minimized by using a substrate having an anisotropic composition or structure such that it is etched in a vertical direction compared to the lateral dimension etch preference. Some materials are inherently anisotropic, and anisotropy can also be introduced by, for example, pretreating a substrate with chemicals or radiation and combinations thereof.

使該糊反應可包含自該糊移除溶劑。不欲受任何特定理論束縛,自糊移除溶劑會使該糊固化,或催化糊之組分之間的交聯反應。關於含有帶低沸點(例如,沸點<60℃)之溶劑的糊,該溶劑可被移除而不加熱表面。溶劑移除也能藉由加熱該表面、糊或其組合達成。 The paste reaction can comprise removing the solvent from the paste. Without wishing to be bound by any particular theory, the removal of the solvent from the paste will cure the paste or catalyze the crosslinking reaction between the components of the paste. With regard to a paste containing a solvent having a low boiling point (for example, a boiling point < 60 ° C), the solvent can be removed without heating the surface. Solvent removal can also be achieved by heating the surface, paste, or a combination thereof.

在一些具體實施例中,反應包含使糊暴露於反應起始劑。適於配合本發明使用之反應起始劑包括,但不限於,熱能、電磁輻射、聲波、酸或鹼(例如,降低或升高pH)、升高或降低壓力、交流或直流電、攪動、音波處理及其組合。在一些具體實施例中,反應包含使糊暴露於多種反應起始劑。 In some embodiments, the reaction comprises exposing the paste to a reaction initiator. Reaction initiators suitable for use in connection with the present invention include, but are not limited to, thermal energy, electromagnetic radiation, sound waves, acids or bases (eg, lowering or raising pH), raising or lowering pressure, alternating or direct current, agitation, sonication Processing and combinations thereof. In some embodiments, the reaction comprises exposing the paste to a plurality of reaction initiators.

適於作為反應起始劑之電磁輻射可包括,但不限於,微波光、紅外光、可見光、紫外光、x-射線、射頻及其組合。 Electromagnetic radiation suitable as a reaction initiator can include, but is not limited to, microwave light, infrared light, visible light, ultraviolet light, x-rays, radio frequency, and combinations thereof.

在一些具體實施例中,在該糊反應之前自基材移除印模或彈性體模板。在一些具體實施例中,在該糊反應之後自基材移除印模或彈性體模板。 In some embodiments, the stamp or elastomeric template is removed from the substrate prior to the paste reaction. In some embodiments, the stamp or elastomeric template is removed from the substrate after the paste reaction.

在一些具體實施例中,在將該蝕刻糊施塗於基材之前,使用微接觸印刷法給該基材形成圖案。例如,墨液可被施塗於明示圖案輪廓之彈性體模板的表面中之具有至少一個刻痕的彈性體印模,以形成經塗佈之彈性體印模,並使該經塗佈之印模與基材接觸。該墨液係依由該彈性體印模表面中之圖案定義在該基材上的圖案自該經塗佈之彈性體印模的表面轉移至該基材。該墨液黏附於該表面,且會 形成薄膜、單層、雙層、自組單層及其組合之至少一者。在一些具體實施例中,該墨液會與該基材反應。接著把糊施塗於該基材,其中該糊對該基材之暴露區或藉由該墨液圖案、網版印刷、噴墨印刷、噴射器沉積、噴塗、旋塗、刷塗及其組合,及其他普通熟悉塗佈表面之技術者習知的施塗方法覆蓋之基材區中的一者具有反應性。等反應之後該糊、在該基材上之任何殘餘糊及/或墨液和反應產物均可移除。所得之形成圖案的基材包含一個圖案,該圖案具有由用以將該墨液施塗於該基材之彈性體印模的表面中之圖案確定的橫向尺寸,以及在該糊沉積法時轉移至該基材的任何圖案。 In some embodiments, the substrate is patterned using microcontact printing prior to applying the etch paste to the substrate. For example, the ink can be applied to an elastomeric stamp having at least one score in the surface of the elastomeric template of the pattern profile to form a coated elastomeric stamp and the coated impression The mold is in contact with the substrate. The ink is transferred from the surface of the coated elastomeric stamp to the substrate by a pattern defined on the substrate by a pattern in the surface of the elastomeric stamp. The ink adheres to the surface and will At least one of a film, a single layer, a double layer, a self-assembled single layer, and a combination thereof is formed. In some embodiments, the ink will react with the substrate. The paste is then applied to the substrate, wherein the paste is exposed to the substrate or by the ink pattern, screen printing, inkjet printing, ejector deposition, spray coating, spin coating, brush coating, and combinations thereof And one of the substrate regions covered by conventional application methods known to those skilled in the art of coating the surface is reactive. The paste, any residual paste and/or ink and reaction products on the substrate can be removed after the reaction. The resulting patterned substrate comprises a pattern having a transverse dimension determined by a pattern used to apply the ink to the surface of the elastomeric stamp of the substrate, and transferred during the paste deposition process Any pattern to the substrate.

其他較佳之印刷裝置 Other preferred printing devices

在本發明之較佳具體實施例中,該蝕刻糊係藉由網版印刷、絲網印刷、移印或,噴射印刷方法,該些方法屬於熟於此藝之士習知的印刷方法。手動施塗也可以。 In a preferred embodiment of the invention, the etching paste is by screen printing, screen printing, pad printing or jet printing methods, which are known in the art. Manual application is also possible.

依據該篩網、絲網、雕刻板(clischee)或印模或墨匣定址(cartridge addressing)之設計,可將依照本發明描述之具有非牛頓流動行為的可印刷性均質蝕刻糊施塗在整個區域上面,或依照該蝕刻結構遮罩選擇性地僅施塗於需要蝕刻之處。早期需要之所有遮蔽及微影步驟均不必要。如以上描述過的,蝕刻操作可能在有或沒有能量輸入(例如呈熱輻射(使用IR發射器)形式)之情況下進行。等蝕刻完成之後,使用適合溶劑,較佳地去離子水, 從該蝕刻表面沖掉具有非牛頓流動行為的可印刷性蝕刻糊及反應產物。 A printable homogeneous etching paste having a non-Newtonian flow behavior as described in accordance with the present invention can be applied throughout the screen according to the design of the screen, screen, clischee or stamp or cartridge addressing. Above the region, or in accordance with the etched structure mask, is selectively applied only where etching is desired. All masking and lithography steps that were needed early are not necessary. As described above, the etching operation may be performed with or without energy input (eg, in the form of thermal radiation (using an IR emitter)). After the etching is completed, a suitable solvent, preferably deionized water, is used. A printable etch paste and reaction product having a non-Newtonian flow behavior is washed away from the etched surface.

藉由變化下列參數,可調整在可變厚度之處理過的表面層中之蝕刻深度,且在選擇性結構蝕刻之案例中,還有蝕刻結構之輪廓清晰度; The etch depth in the treated surface layer of variable thickness can be adjusted by varying the following parameters, and in the case of selective structure etching, there is also the outline definition of the etched structure;

˙蝕刻組分之濃度及組成 浓度 etching composition concentration and composition

˙所用之溶劑的濃度及組成 Concentration and composition of the solvent used

˙增稠劑系統之濃度及組成 Concentration and composition of ̇ thickener system

˙任何外加之添加物(如消泡劑、觸變劑、流動控制劑、除氣劑及黏著促進劑)的濃度及組成 浓度 Concentration and composition of any additional additives (such as defoamers, thixotropic agents, flow control agents, deaerators and adhesion promoters)

˙依照本發明描述之具有非牛頓流動行為的可印刷性均質蝕刻糊之黏度 可 Viscosity of a printable homogeneous etching paste having a non-Newtonian flow behavior as described in accordance with the present invention

˙在有或沒有能量輸入以分別印刷糊印刷之聚合物表面及該等聚合物表面層的情況下之蝕刻期間,及 ˙將能量輸入以該蝕刻糊印刷之系統。 蚀刻 during etching with or without energy input to print the surface of the polymer printed with the paste and the surface layer of the polymer, respectively, and ̇ Input energy into the system printed with the etch paste.

當該等糊藉由使用可撓性模板或印模以外之裝置及方法施塗時於所用的蝕刻糊與上述被蝕刻的表面之間的所有交互作用也有效。 All interactions between the etch paste used and the etched surface described above are also effective when the pastes are applied by means other than the use of flexible stencils or stamps.

本發明之方法 Method of the invention

如上所述,本發明之目的因此在於提供一種蝕刻媒質,該蝕刻媒質可以對於聚合物表面具有高潛在處理量用於該技術簡單的蝕刻方法。此簡單的蝕刻方法比於液體或氣相中之習用濕式和乾式蝕刻方法便宜許多。 As stated above, it is therefore an object of the present invention to provide an etch medium which can have a high potential throughput for a polymer surface for a simple etching process of the technique. This simple etching method is much cheaper than conventional wet and dry etching methods in liquid or gas phase.

據發現此方法在蝕刻處理這樣之表面時及在對準被製造在適合之可撓性聚合物表面上的極複雜電路時對聚合物基質極具選擇性。 This method has been found to be highly selective to polymer matrices when etching such surfaces and when aligning extremely complex circuits fabricated on suitable flexible polymer surfaces.

最適合之聚合物是PET,其係聚對苯二甲酸乙二酯聚合物,通常是顯示高破裂安全性之低分子量聚合物。另一種適合聚合物是PEN,其係2,6-萘二甲酸二甲酯與1,2-乙二醇之聚合物且其也被稱為聚(萘二甲酸乙二酯)。此聚合物在商業上可以商品名“PEN Polymer 18348”或“Developmental PEN 10533 Polyester”購得。 The most suitable polymer is PET, which is a polyethylene terephthalate polymer, typically a low molecular weight polymer that exhibits high burst safety. Another suitable polymer is PEN, which is a polymer of dimethyl 2,6-naphthalene dicarboxylate and 1,2-ethanediol and which is also known as poly(ethylene naphthalate). This polymer is commercially available under the trade designation "PEN Polymer 18348" or "Developmental PEN 10533 Polyester".

如果由這些聚合物之一製造的表面必須根據本發明之方法蝕刻,把該蝕刻糊印刷在該塑料基材上,歷經至少90 s加熱至約80℃之溫度並接著以去離子水清洗。因此該聚合物基質係藉由含溶劑、氫氧化鉀(KOH)、增稠劑及有機填料內容物之糊蝕刻。根據本發明之方法及糊特別有用於網版印刷及選擇性蝕刻在塑料基材上的微小結構,其中蝕刻組合物可施塗於彈性體印模,該彈性體印模之明示圖案輪廓的彈性體印模表面中具有至少一個刻痕,以形成經蝕刻糊塗佈之彈性體印模,並使該經塗佈之印模與基材接觸。 If the surface made from one of these polymers must be etched in accordance with the method of the present invention, the etch paste is printed on the plastic substrate and heated to a temperature of about 80 ° C for at least 90 s and then rinsed with deionized water. The polymer matrix is therefore etched by a paste containing a solvent, potassium hydroxide (KOH), a thickener, and an organic filler content. The method and paste according to the present invention are particularly useful for screen printing and selective etching of minute structures on a plastic substrate, wherein the etching composition can be applied to an elastomeric stamp which exhibits the elasticity of the outline of the pattern At least one score in the surface of the body stamp to form an etch paste coated elastomeric stamp and to bring the coated stamp into contact with the substrate.

該等蝕刻糊組合物可以單一處理步驟施塗於被蝕刻之基材表面上。 The etch paste compositions can be applied to the surface of the substrate to be etched in a single processing step.

因此,如果使用特殊印刷技術,根據本發明之方法可以高度自動化和高處理量處理,其適於將該蝕刻糊轉移至被蝕刻之基材表面。特別是,網版印刷、絲網印刷、移 印、印模印刷、微噴射印刷及噴墨印刷方法是熟於此藝之士習知且較佳的印刷方法。手動施塗也可以。但是最佳是微接觸印刷方法。 Thus, if a special printing technique is used, the method according to the invention can be highly automated and highly processed, which is suitable for transferring the etching paste to the surface of the substrate being etched. In particular, screen printing, screen printing, and shifting Printing, stamp printing, micro-jet printing, and ink jet printing methods are well known and preferred printing methods for those skilled in the art. Manual application is also possible. But the best is the microcontact printing method.

藉由變化下列參數,尤其是可調整在以聚合物為底質之基材表面及其可變厚度之層中的蝕刻深度,且在選擇性結構蝕刻之案例中,還有蝕刻結構之輪廓清晰度: By varying the following parameters, in particular, the etch depth in the polymer-based substrate surface and its variable thickness layer can be adjusted, and in the case of selective structure etching, there is also a clear outline of the etched structure. degree:

˙蝕刻組分之濃度及組成 浓度 etching composition concentration and composition

˙所用之溶劑的濃度及組成 Concentration and composition of the solvent used

˙增稠劑系統之濃度及組成 Concentration and composition of ̇ thickener system

˙填料內容物之濃度及組成 Concentration and composition of ̇ filler content

˙任何外加之添加物(如消泡劑、觸變劑、流動控制劑、除氣劑及黏著促進劑)的濃度及組成 浓度 Concentration and composition of any additional additives (such as defoamers, thixotropic agents, flow control agents, deaerators and adhesion promoters)

˙依照本發明描述之可印刷性之以KOH為底質的蝕刻糊之黏度 黏 Viscosity of KOH-based etching paste according to the printability of the present invention

˙在有或沒有能量輸入該蝕刻糊及/或被蝕刻之基材的情況下之蝕刻期間。 蚀刻 During etching with or without energy input to the etch paste and/or the etched substrate.

該蝕刻期間可能持續數秒也可能數分鐘,取決於該等蝕刻結構之用途、所欲的蝕刻厚度及/或輪廓清晰度。一般該蝕刻期間係設定於介於約30秒至約20分之範圍中之時間。該蝕刻時間較佳係在約1分至約15分之範圍中,更佳在約3分至約12分之範圍中。 The etch may last for a few seconds or minutes, depending on the application of the etched structure, the desired etch thickness, and/or the sharpness of the outline. Typically, the etch period is set to a time in the range of from about 30 seconds to about 20 minutes. The etching time is preferably in the range of from about 1 minute to about 15 minutes, more preferably in the range of from about 3 minutes to about 12 minutes.

根據本發明之較佳具體實施例所用之蝕刻組合物係為可印刷性之以KOH為底質的蝕刻糊,由蝕刻劑、溶劑、增稠劑及一定量之填料組成,把該等組分混合以形成該 糊。所用之蝕刻組合物可包含以整個組合物之重量計為在約15至35%之範圍中,較佳地在20至30%之範圍中之KOH。根據本發明之蝕刻組合物可包含以整個組合物之重量計為介於約20至65%,較佳地介於25至55%之溶劑。增稠劑可以整個組合物之重量計為約8至15%,較佳地約10至13%的量添加。有機及/或無機填料可以整個組合物之重量計為約5至20%的量,較佳地約8至15%的量,且最佳約10至13%的量併入。除了這些組分之外該蝕刻組合物可另外包含添加物像是上述表面活性劑及潤濕劑等。適合添加物在以上提過。這些添加物可以整個組合物之重量計為介於約0.01至1%之量,較佳地介於約0.1至0.5%之量添加。 The etching composition used in accordance with a preferred embodiment of the present invention is a printable KOH-based etching paste composed of an etchant, a solvent, a thickener and a certain amount of filler. Mix to form the paste. The etching composition used may comprise KOH in the range of from about 15 to 35%, preferably from 20 to 30% by weight of the total composition. The etching composition according to the present invention may comprise from about 20 to 65%, preferably from 25 to 55%, by weight of the total composition of the solvent. The thickener may be added in an amount of from about 8 to 15%, preferably from about 10 to 13% by weight of the total composition. The organic and/or inorganic filler may be incorporated in an amount of from about 5 to 20% by weight of the total composition, preferably from about 8 to 15%, and most preferably from about 10 to 13%. In addition to these components, the etching composition may additionally contain additives such as the above-mentioned surfactants and wetting agents and the like. Suitable additives are mentioned above. These additives may be added in an amount of from about 0.01 to 1%, preferably from about 0.1 to 0.5% by weight of the total composition.

該混合可在裝配適當攪拌器之適合容器中進行。該混合較佳係於具有磁攪拌子之燒杯中進行。因此將此量之KOH與該溶劑混合。把該增稠劑緩慢加入,同時攪拌該混合物。其後把適合量之填料,較佳地微粒狀填料加入並同時攪拌該混合物。該混合可於約20至30℃之室溫進行。為了改善組成成分之溶解度及縮短混合所需之時間,該溫度可提高至低於所加入之溶劑的沸點,較佳不高於70℃。該混合最佳在約25至60℃之範圍中,尤其是介於30至50℃之範圍之之溫度進行。製備之蝕刻糊於一般儲存溫度具有儲存安定性。 This mixing can be carried out in a suitable container equipped with a suitable agitator. This mixing is preferably carried out in a beaker having a magnetic stir bar. This amount of KOH is therefore mixed with the solvent. The thickener was slowly added while stirring the mixture. Thereafter, a suitable amount of filler, preferably particulate filler, is added while stirring the mixture. This mixing can be carried out at room temperature of about 20 to 30 °C. In order to improve the solubility of the components and shorten the time required for mixing, the temperature may be raised to below the boiling point of the solvent to be added, preferably not higher than 70 °C. The mixing is preferably carried out at a temperature in the range of from about 25 to 60 ° C, especially in the range of from 30 to 50 ° C. The prepared etching paste has storage stability at a general storage temperature.

如先前所述根據本發明之具有非牛頓流動行為的可印刷性均質蝕刻糊均可用於,特別是,所有想要全面積及/ 或結構化蝕刻聚合物表面或包含這種尤其是由聚合物像是聚胺基甲酸酯、PEN或PET製造之層的系統之表面的案例。 A printable homogeneous etching paste having a non-Newtonian flow behavior according to the present invention as described previously can be used, in particular, all wanting a full area and/or Or a case of structured etching of a polymer surface or a surface comprising such a system, especially a layer made of a polymer such as polyurethane, PEN or PET.

因此,整個表面,還有個別結構均可選擇性蝕刻至上述均勻、固態、無孔性及多孔性聚合物中達於所欲深度,即該蝕刻操作能涵蓋介於深蝕刻結構之微結構化至蝕刻之間的所有範圍,尤其是在這類包含導電材料像是金屬粒子或銀奈米管之聚合物材料中的範圍。 Therefore, the entire surface, as well as individual structures, can be selectively etched into the uniform, solid, non-porous, and porous polymers to a desired depth, i.e., the etching operation can encompass the microstructure of the deep etched structure. All ranges between etchings, especially in the range of such polymeric materials comprising electrically conductive materials such as metal particles or silver nanotubes.

特別是,網版印刷、絲網印刷、移印、印模印刷及噴墨印刷方法是用於施塗所欲之糊的適合技術。一般,除上述印刷方法之外,手動施塗(例如刷塗)也可以。 In particular, screen printing, screen printing, pad printing, stamp printing, and ink jet printing methods are suitable techniques for applying the desired paste. In general, in addition to the above printing method, manual application (for example, brush coating) may be used.

依照本發明所述之具有非牛頓流動行為的可印刷性均質蝕刻糊可用於全面積及/或以結構化方式蝕刻上述可變厚度之聚合物層的所有案例中。 A printable homogeneous etch paste having a non-Newtonian flow behavior in accordance with the present invention can be used in all cases of etching the above-described variable thickness polymer layer in a full area and/or in a structured manner.

所述之具體實施例,及在說明書中關於“一個具體實施例”、“具體實施例”、“示範具體實施例”等之引用文表示所述之具體實施例可包括特定特徵、結構或特性,但是每一個具體實施例可能未必均包括該特定特徵、結構或特性。再者,這樣之措辭不一定表示同一具體實施例。另外,當關聯具體實施例描述特定特徵、結構或特性時,咸瞭解熟於此藝之士知道如何關聯其他無論是否經明確描述之具體實施例以達成這樣的特定特徵、結構或特性。 DETAILED DESCRIPTION OF THE INVENTION The detailed description of the specific embodiments, and the specific embodiments in the specification, the description of the specific embodiments, the However, each specific embodiment may not necessarily include that particular feature, structure, or characteristic. Furthermore, such phrases are not necessarily referring to the specific embodiments. In addition, the specific features, structures, or characteristics of the present invention are described in connection with the specific embodiments.

總而言之,用於蝕刻帶有如所揭示之糊的可撓性聚合物基材之根據本發明的方法因此使大量工件能依適合之自 動方法以工業規模便宜蝕刻。 In summary, the method according to the invention for etching a flexible polymer substrate with a paste as disclosed thus enables a large number of workpieces to be adapted to The method is cheap to etch on an industrial scale.

即使沒有任何其他解釋,也能假設熟於此藝之士能以最廣義範圍使用以上描述。較佳具體實施例及實施例因此僅被認定為說明性但是絕不會限制揭示內容。 Even without any other explanation, it can be assumed that the skilled person can use the above description in the broadest sense. The preferred embodiments and examples are therefore to be considered as illustrative only and are in no way limiting.

為了較易於瞭解及例證,下列供給在本發明之保護範圍以內的實施例。這些實施例也用於例證可行之變化例。 For ease of understanding and illustration, the following examples are provided within the scope of the invention. These embodiments are also used to illustrate possible variations.

上下文曾提及之所有申請案、專利及刊物的完整揭示內容係以引用之方式併入本案且能用於闡明不確定案例。 The complete disclosure of all applications, patents, and publications mentioned in the context is incorporated herein by reference and can be used to clarify an indefinite case.

無須說明,在已知之實施例中且另外在此發明內容其餘部分中,存在於該等組合物中之組分的引用百分比數據始終是加總到達於100%之總和且不會再更多。存在於該等組合物中之組分的所有百分比數據均為重量%或重量百分比。假設溫度係以℃為單位測量。 Needless to say, in the known examples and additionally in the remainder of this summary, the percent reference data for the components present in the compositions is always the sum of the total arrivals of 100% and no more. All percentage data for the components present in the compositions are % by weight or percentage by weight. It is assumed that the temperature is measured in °C.

實施例 Example 實施例1 Example 1

50 g KOH(47%) 50 g KOH (47%)

20 g 丁內酯 20 g butyrolactone

10 g Carbopol EZ 2 10 g Carbopol EZ 2

10 g Vestosint PA 2070 10 g Vestosint PA 2070

KOH溶液係以丁內酯混合。隨後添加10 gCarbopol EZ 2及10 g Vestosint PA 2070同時攪拌。另外再攪拌該混合物2小時。 The KOH solution was mixed with butyrolactone. Then 10 g of Carbopol EZ 2 and 10 g of Vestosint PA 2070 were added while stirring. The mixture was stirred for another 2 hours.

實施例2 Example 2

30 g KOH(47%) 30 g KOH (47%)

20 g 乙醇 20 g ethanol

10 g Carbopol EZ 2 10 g Carbopol EZ 2

10 g Vestosint PA 2070 10 g Vestosint PA 2070

依實施例1所述之相同方式製備此糊。 This paste was prepared in the same manner as described in Example 1.

實施例3 Example 3

60 g KOH(47%) 60 g KOH (47%)

20 g 甲醇 20 g methanol

10 g Carbopol EZ 2 10 g Carbopol EZ 2

10 g Vestosint PA 2070 10 g Vestosint PA 2070

依實施例1所述之相同方式製備此糊。 This paste was prepared in the same manner as described in Example 1.

藉由網版印刷機把該蝕刻糊印刷在該基材上。但是也可使用其他印刷如上所述之蝕刻糊的方法。 The etching paste is printed on the substrate by a screen printer. However, other methods of printing the etching paste as described above can also be used.

為了得到好的結果,必須將蝕刻劑之濃度、蝕刻糊之施塗量、蝕刻時間及蝕刻時之溫度最佳化以適於不同層及層厚度。 In order to obtain good results, the concentration of the etchant, the application amount of the etching paste, the etching time, and the temperature at the time of etching must be optimized to suit different layers and layer thicknesses.

Claims (17)

一種選擇性蝕刻含有銀奈米管之聚合物基質之方法,其包含下列步驟:a)將鹼性蝕刻糊施塗於該塑料基材,b)加熱,及c)清潔該基材。 A method of selectively etching a polymer matrix comprising a silver nanotube comprising the steps of: a) applying an alkaline etch paste to the plastic substrate, b) heating, and c) cleaning the substrate. 如申請專利範圍第1項之方法,其中該施塗之蝕刻糊包含選自KOH、Ca(OH)2、NaOH、TMAH、乙二胺、TMEH、SiOH、二乙醇胺或三乙醇胺之鹼性蝕刻劑。 The method of claim 1, wherein the applied etching paste comprises an alkaline etchant selected from the group consisting of KOH, Ca(OH) 2 , NaOH, TMAH, ethylenediamine, TMEH, SiOH, diethanolamine or triethanolamine. 如申請專利範圍第1項之方法,其中該施塗之蝕刻糊包含選自1,4-丁二醇、丁內酯、乙醇或甲醇之溶劑。 The method of claim 1, wherein the applied etching paste comprises a solvent selected from the group consisting of 1,4-butanediol, butyrolactone, ethanol or methanol. 如申請專利範圍第1項之方法,其中該施塗之蝕刻糊包含1,4-丁二醇作為溶劑。 The method of claim 1, wherein the applied etching paste comprises 1,4-butanediol as a solvent. 如申請專利範圍第1至4項中任一項之方法,其中該施塗之蝕刻糊包含有機及/或無機填料。 The method of any one of claims 1 to 4, wherein the applied etching paste comprises an organic and/or inorganic filler. 如申請專利範圍第1至4項中任一項之方法,其中該施塗之蝕刻糊包含作為微粒狀填料之有機聚合物粒子。 The method of any one of claims 1 to 4, wherein the applied etching paste comprises organic polymer particles as a particulate filler. 如申請專利範圍第1至4項中任一項之方法,其中該施塗之蝕刻糊係壓印於該基材上。 The method of any one of claims 1 to 4, wherein the applied etching paste is imprinted on the substrate. 如申請專利範圍第1至4項中任一項之方法,其中該蝕刻糊係藉由網版印刷,尤其是滾網印花(rotary screen printing),或模板印刷施塗於該基材上。 The method of any one of claims 1 to 4, wherein the etching paste is applied to the substrate by screen printing, especially rotary screen printing, or stencil printing. 如申請專利範圍第1至4項中任一項之方法,其中該蝕刻糊係藉由噴墨,尤其是藉由微噴射,施塗於該基材 上。 The method of any one of claims 1 to 4, wherein the etching paste is applied to the substrate by inkjet, in particular by micro-ejection on. 如申請專利範圍第1至4項中任一項之方法,其中該蝕刻糊係分配於該基材上。 The method of any one of claims 1 to 4 wherein the etching paste is dispensed onto the substrate. 如申請專利範圍第1至4項中任一項之方法,其中該蝕刻糊係藉由噴塗或藉由斜板塗佈施塗於該基材上。 The method of any one of claims 1 to 4, wherein the etching paste is applied to the substrate by spraying or by slanting plate coating. 如申請專利範圍第1至4項中任一項之方法,其中在步驟b)中將該基材加熱至介於約40至140℃之溫度,較佳地介於約80至120℃之溫度。 The method of any one of claims 1 to 4 wherein the substrate is heated in step b) to a temperature of between about 40 and 140 ° C, preferably between about 80 and 120 ° C. . 如申請專利範圍第1至4項中任一項之方法,其中在步驟b)中於80℃下加熱該基材2分鐘。 The method of any one of claims 1 to 4, wherein the substrate is heated at 80 ° C for 2 minutes in step b). 如申請專利範圍第1至4項中任一項之方法,其中在步驟b)中經蝕刻後使用溶劑沖洗該基材並利用乾燥空氣或在氮氣流中乾燥該基材。 The method of any one of claims 1 to 4, wherein the substrate is rinsed with a solvent after etching in step b) and the substrate is dried using dry air or a stream of nitrogen. 如申請專利範圍第1至4項中任一項之方法,其中在步驟b)中經蝕刻後使用去離子水沖洗該基材並利用乾燥空氣或在氮氣流中乾燥該基材。 The method of any one of claims 1 to 4, wherein the substrate is rinsed with deionized water after etching in step b) and the substrate is dried using dry air or a stream of nitrogen. 如申請專利範圍第1項之方法,其中該塑料基材係由聚胺基甲酸酯或PEN[聚(萘二甲酸乙二酯)]或PET(聚對苯二甲酸乙二酯)製造。 The method of claim 1, wherein the plastic substrate is made of polyurethane or PEN [poly(ethylene naphthalate)] or PET (polyethylene terephthalate). 如申請專利範圍第1至4項中任一項之方法,其中以至少100 μm之解析度蝕刻線和結構。 The method of any one of claims 1 to 4 wherein the lines and structures are etched with a resolution of at least 100 μm.
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