201241439 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種探針電路，尤指一種具有熱敏電阻 之探針之量測電路。 【先前技術】 許多電子產品以及電子元件在使用時都會有溫升的現 象，溫度升高除了可能造成使用效能降低，嚴重時更可能 產生安全性的問題，例如鋰鈷電池就是一個非常典型的例 子。 因此，這類電子產品與電子元件在進行電性測試時， 通常也必須對待測物的溫度同步做量測，請參閱第一圖與 第二圖，第一圖係為習知技術於電性測試時偵測溫度之系 統示意圖，第二圖係為用以習知技術用以感測溫度之電路 示意圖。要對帶電性待測物〗〇〇做電性測試時，係利用探 針21接觸帶電性待測物100之正電極，一般來說，探針 21係藉由針套21〗連結於電路板22，且探針21本身係為 單純的金屬探針；同時，為了構成電性測試的迴路，還必 須以固定於電路板24上的探針23接觸帶電性待測物100 之負電極。 除此之外，習知技術是藉由設置熱敏電阻25於電路板 22之上，以量測帶電性待測物100周遭溫度的變化，而要 使熱敏電阻25形成一個迴路並進行溫度量測，那麼電路板 22之上還必須規劃有參考電壓源26、分壓電阻27、電壓 201241439 感測器29以及接地端28，以形山 然而，此量測方式中之妖敏^如第二圖所式之電路。 電性待測物太遠，所量泡電阻25的設置位置距離帶 物】()〇的實際溫度有相當大白矣1的溫度也就與帶電性待測 圖係為待測物溫度與熱敏電請參照第三圖’第三 示意圖。曲綱為帶電性待二:：之溫f之時間-溫度 曲線幻係為熱敏電阻25所量t物100之實際溫度變化， 清楚發現，當帶電性待測物咖^之核境溫度變化，可以 :逮升高’並於時間T1時就達::工:狀：時，溫度會 電阻25由於距離帶電性待測物1而此時熱敏 度係藉由空氣傳導，因此僅 且絕大部分的熱 電㈣若要量測到溫度出，則=氏的溫度扣，熱敏 T2。 、、/員寺到許久之後的時間 即有—地端， 路，形_'上的;二電得=::迴 【發明内容】 所欲解決之技術問題與目的： 緣此，本發明之主要目的係 ‘針之量蜊電、"―種具有熱敏電阻之 剛物之處，且•…電阻能夠設置於鄰近帶電性待 針與空氣傳導：：陡待測物所產生之熱度能夠同時遷過探 的量測到帶電性待測物之溫度阻能夠更迅速且準確 此外，此一量測電％係使 201241439 用電性測試時所規劃的參考接地，以避免規劃額外的參考 接地。 本發明解決問題之技術手段： 一種探針電路係用以對一帶電性待測物進行量測，該 帶電性待測物之一第一電極係耦接至參考接地，該探針電 路係包含探針、分壓電阻以及電壓偵測器。探針係包括針 軸、絕緣層、針頭與熱敏電阻，針軸係為導體材質所構成， 絕緣層係包覆該針軸；針頭係為導體材質所構成，並包覆 該絕緣層，以凸設於該針軸之一端，並用以電性耦接該帶 電性待測物之一第二電極；熱敏電阻係具有二電極接點， 且該二電極接點係分別電性耦接於該針軸與該針頭。分壓 電阻係電性耦接於該針軸與一參考電壓源之間。電壓偵測 器係用以量測該分壓電阻與該針軸間之一分壓電壓。 於本發明之一較佳實施例中，該探針更包括一電路 板，該電路板係設置於鄰近該針頭之處，且該熱敏電阻係 設置於該電路板，以透過該電路板使該熱敏電阻之二電極 接點分別電性連結於該針軸與該針頭。 於本發明之一較佳實施例中，探針電路更包含一針 盤，該探針係垂直連結於該針盤，該分壓電阻係設置於該 針盤。 於本發明之一較佳實施例中，該探針更包括針套與彈 性元件，針套係為一中空套管，垂直固設於該針盤，藉以 套接該針軸相對於該針頭之一端；彈性元件係設置於該針 201241439 套内部，以分別抵接於該針套與該針軸。 !之—較佳實施例中，探針電路更包括-處理 為-，吕亥處理器係轉接於該電墨哭 『 測器量測該分壓電厣所& ψ 、一 a 〇a讀債 厭十㈣— 』出之—分壓電壓值，並依據該分 =£值：；帶電性待測物之-待測物電壓值、該參考電 電壓值與該分壓電阻之-分壓電阻值計2 熱敏電阻值;此外，該處理器更可以預先 儲存該熱敏電阻之一雷.、w由、疋 .,^- /皿又對照表，並依據該熱敏電阻 值自“電溫度對照表中求得-環境溫度。 本發明對照先前技術之功效： 相較於習知於電性測試同時量測待測物溫度之方法， 振針電路，能夠將熱敏電阻設置於鄰近帶電性待 僂Γ電性待測物所產生之熱度能夠同時透過探 制i以生^f敏電阻’使熱敏電阻更迅速且準確的量 測到4性_物之溫度，轉護電㈣m時的安全性。 及發明之探針電路，係利用了帶電性待測物以 及电性測式時所規劃之參考接地來形成迴路，因此不需另 外規劃參考接地，亦能夠具有節省成本之功效。 2明所採用的具體實施例’將藉由以下之實施例及 圖式作進一步之說明。 【實施方式】 本發明係關於一種探針雷路，太、扣 休τ电峪尤托一種具有熱敏電阻 201241439 之探針之量測電路。以下兹 明，然熟習此項技藝者皆施例μ明本發 定發明本身。有關此較佳實：二而並非用以限 請參閱第四圖、第五丄内奋坪述如下。 本發明之探針之剖面示意圖係為利用於 本發明之探針電L;圖係為本發明之探針電 之&針電路係心對 ^路簡圖。 測，該帶電性待測物100之一^性待測物100進行量 參考接地，該探針電路係一電極（負電句係轉接= 電壓偵測器43;其中，於實t針300、分壓電阻q以及 46上之探針45接觸該帶用時可以藉由設置於針盤 接至針盤46上之參考接地。彳叫物100之第〆電極以耦 探針係包括針軸31 電阻34，針軸31係為導體 g 32、針頭33與熱敏 該針軸3】，於本發明之較、所構成；絕緣層32係包覆 由鐵弗龍或塑谬所組成施例中，絕緣層32可以是 包覆該絕緣層32，以 頭33係為導體材質所構成，並 性耦接該帶電性待測物：:5玄31之-端’並用以電 電租3 4係具有二電極接點之令—苐二電極（正電極）；熱敏 接於該針軸31與該針豆…' ^〜電極接點係分別電性耦 探斜300更可以勺碩33，於本發明之較佳實施例中， 鄰近該針頭33之虎，包路板35，讀電路板35係設置於 35，以透過該電路^ k且该熱敏電随34係設置於該電路板 34之二電極接點分別^點341與⑷使該熱敏電阻 生連、，，"於垓針軸3丨與該針頭33。 201241439 於本發明之一較私 時，更可以包含一斜夺 ' 例中，探針電路在實際使用 盤44,該分愿針300係垂直連結於該針 包括針套36與彈性元、叹;s玄針盤44 ·，此外，探針更 直固設於該針盤^ ΓΙ’針套36係為—中空套管，垂 之-端；彈性元件37 相對於該針頭33 接於該針套36與該針36㈣，以分別抵 44垂直移動。 μ針軸31能夠相對該針盤 刀C電阻41係電軸接㈣料3 電壓_43係用，該分壓電阻= _ 本發明之—較佳實施例中，電壓 偵心43 了以疋頰比數位轉換器或—比較 於本發明之-較佳實施例中，探 處理器47，該處理器47係耦接於該電壓她:… 接收該電壓偵測器43量測該分壓輸口二以 壓值’並依據該分壓電墨值、該帶電性待壓： 測物電壓值、該參考電壓源42之—參考電壓值 阻4〗之-分壓電阻值計算出該熱敏電阻34 ;: 值；此外，處理器47更可以預先儲存該熱敏電阻=?! 電阻-溫度對照表，並依據該熱敏電阻 〜— 照表中求得一環境溫度，此環境溫度g 阻-溫度對 之周遭溫度。 W表可電性待測物 由於針盤44可以同時設置有本發明探針電路 針3〇0以及習知技術中用來電性測試之普通探針，因I; 201241439 電性待測物100之待測物電壓值是可以藉由電性測試得 知，當然亦可以帶電性待測物100之規格來作為參考。 綜合以上所述，相較於習知於電性測試同時量測待測 物溫度之方法，本發明之探針電路，能夠將熱敏電阻34設 置於鄰近帶電性待測物100之處，且帶電性待測物100所 產生之熱度能夠同時透過探針與空氣傳導至熱敏電阻34， 使熱敏電阻34更迅速且準確的量測到帶電性待測物100之 溫度，以維護電性測試時的安全性。 此外，本發明之探針電路，係利用了帶電性待測物100 以及電性測試時所規劃之參考接地來形成迴路，因此不需 於針盤44之上另外規劃參考接地，亦能夠具有節省成本之 功效。 藉由以上較佳具體實施例之詳述，係希望能更加清楚 描述本發明之特徵與精神，而並非以上述所揭露的較佳具 體實施例來對本發明之範疇加以限制。相反地，其目的是 希望能涵蓋各種改變及具相等性的安排於本發明所欲申請 之專利範圍的範疇内。 【圖式簡單說明】 第一圖係為習知技術於電性測試時偵測溫度之系統示意 圖； 第二圖係為用以習知技術用以感測溫度之電路示意圖； 第三圖係為待測物溫度與熱敏電阻所量測之溫度之時間 -溫度示意圖； 9 201241439 第四圖係為利用於本發明之探針之剖面示意圖； 第五圖係為本發明之探針電路實際應用示意圖；以及 第六圖係為本發明之探針電路簡圖。 【主要元件符號說明】 帶電性待測物100 探針21 針套211 電路板22 探針23 電路板24 熱敏電阻25 參考電壓源26 分壓電阻27 接地端28 電壓感測器29 探針300 針軸31 絕緣層32 針頭33 熱敏電阻34 焊接點341、342 電路板35 針套36 201241439 彈性元件37 分壓電阻4] 參考電壓源42 電壓偵測器43 針盤44 探針45 針盤46 處理器47 曲線S1 曲線S2 時間T1 時間T2 溫度H1 溫度H2201241439 VI. Description of the Invention: [Technical Field] The present invention relates to a probe circuit, and more particularly to a measuring circuit having a probe of a thermistor. [Prior Art] Many electronic products and electronic components will have a temperature rise when they are used. In addition to the possibility of lowering the temperature, the temperature rise is more likely to cause safety problems. For example, a lithium cobalt battery is a typical example. . Therefore, when conducting electrical tests on such electronic products and electronic components, it is usually necessary to measure the temperature of the object to be measured simultaneously. Please refer to the first figure and the second figure. The first figure is a conventional technique for electrical properties. A schematic diagram of the system for detecting temperature during testing, and the second diagram is a schematic diagram of a circuit for sensing temperature using conventional techniques. When the electrical test object is to be electrically tested, the probe 21 is used to contact the positive electrode of the charged test object 100. Generally, the probe 21 is connected to the circuit board by the needle cover 21 22, and the probe 21 itself is a simple metal probe; at the same time, in order to constitute a circuit for electrical testing, the probe 23 fixed to the circuit board 24 must also be in contact with the negative electrode of the charged test object 100. In addition, the conventional technique is to measure the temperature change of the charged test object 100 by setting the thermistor 25 on the circuit board 22, so that the thermistor 25 forms a loop and performs temperature. Measurement, then the reference voltage source 26, the voltage dividing resistor 27, the voltage 201241439 sensor 29, and the grounding terminal 28 must be planned on the circuit board 22 to shape the mountain. However, the measurement method is demon-sensitive. The circuit of the figure. The electrical test object is too far away, and the set position of the measured bubble resistor 25 is far from the actual temperature of the tape. () The actual temperature of the 〇 有 has a considerable white 矣 1 temperature and the chargeability test is the temperature and heat sensitivity of the test object. Please refer to the third diagram of the third figure for electricity. The curve is charged with electricity: the time of the temperature f - the temperature curve is the actual temperature change of the mass of the thermistor 25, and it is clearly found that when the temperature of the charged object is changed, the temperature of the nuclear environment changes. , can: catch the rise 'and at time T1 to reach:: work: shape: when the temperature will be resistance 25 due to the distance from the charged object 1 and the heat sensitivity is transmitted by air, so only Most of the thermoelectricity (4), if the temperature is measured, the temperature of the = buckle, the thermal T2. , , / / / / / / / / / / / / / / / / / / / / / / / / / / The main purpose is the 'quantity of the needle, 'the kind of the thing with the thermistor, and the ... resistance can be set in the vicinity of the charged needle and air conduction:: the heat generated by the steep object can be simultaneously The measured temperature of the charged test object can be detected more quickly and accurately. In addition, this measurement is used to ground the reference planned in the 201241439 power test to avoid planning additional reference grounding. The technical method for solving the problem is as follows: A probe circuit is used for measuring a charged object to be tested, and a first electrode of the charged object to be tested is coupled to a reference ground, and the probe circuit includes Probe, voltage divider resistor and voltage detector. The probe system includes a needle shaft, an insulating layer, a needle and a thermistor, and the needle shaft is made of a conductor material, and the insulating layer covers the needle shaft; the needle is made of a conductor material, and the insulating layer is covered with a second electrode disposed on one end of the needle shaft and electrically coupled to the second electrode of the charged object; the thermistor has two electrode contacts, and the two electrode contacts are electrically coupled to the second electrode The needle shaft is with the needle. The voltage dividing resistor is electrically coupled between the needle shaft and a reference voltage source. The voltage detector is used to measure a divided voltage between the voltage dividing resistor and the needle shaft. In a preferred embodiment of the present invention, the probe further includes a circuit board disposed adjacent to the needle, and the thermistor is disposed on the circuit board to transmit through the circuit board. The two electrode contacts of the thermistor are electrically connected to the needle shaft and the needle, respectively. In a preferred embodiment of the invention, the probe circuit further includes a dial, the probe is vertically coupled to the dial, and the voltage dividing resistor is disposed on the dial. In a preferred embodiment of the present invention, the probe further includes a needle sleeve and an elastic member. The needle sleeve is a hollow sleeve that is vertically fixed to the dial to thereby sleeve the needle shaft relative to the needle. One end; an elastic member is disposed inside the sleeve 201241439 to abut the needle sleeve and the needle shaft, respectively. In the preferred embodiment, the probe circuit further includes a processing--, and the Luhai processor is connected to the electric ink crying detector to measure the piezoelectric device & ψ, a 〇a Reading debts are ten (4) - 』 出—divide voltage values, and according to the points = £ value:; charged object to be tested - the voltage value of the object to be tested, the reference voltage value and the voltage divider resistor - The resistance value meter 2 the thermistor value; in addition, the processor can pre-store one of the thermistors Ray, w, 疋., ^- / dish and table, and according to the thermistor value From the "electrical temperature comparison table - the ambient temperature. The present invention compares the efficacy of the prior art: compared to the conventional method of measuring the temperature of the test object simultaneously with the electrical test, the vibrating pin circuit can set the thermistor The heat generated by the adjacent electrically charged test object can simultaneously pass through the probe i to generate the temperature sensitive resistance, so that the thermistor can measure the temperature of the quadruple material more quickly and accurately. Safety in the case of electricity (4) m. The probe circuit of the invention is a reference to the planning of the charged test object and the electrical test type. The ground is formed to form a loop, so that it is not necessary to separately plan the reference grounding, and the cost can be saved. 2 The specific embodiment used will be further described by the following embodiments and drawings. The invention relates to a probe lightning path, a too, a buckle, a τ 峪 峪 一种 一种 一种 一种 一种 一种 一种 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 2012 The invention itself is not limited to the fourth figure, and the fifth section of the invention is as follows. The cross-sectional view of the probe of the present invention is the probe electric L used in the present invention; The figure is a schematic diagram of the probe and the circuit of the probe of the present invention. The measurement of the charged object 100 is performed by reference to the ground, and the probe circuit is The electrode (negative sentence is transferred to the voltage detector 43; wherein the probe 45 on the real t pin 300, the voltage dividing resistors q and 46 can be connected to the dial 46 by being placed on the dial Reference grounding on the ground. The third electrode of the squeak 100 is coupled to the probe package. The needle shaft 31 has a resistor 34, the needle shaft 31 is a conductor g32, a needle 33 and a heat sensitive needle shaft 3, which are constructed according to the present invention; the insulating layer 32 is covered by Teflon or plastic enamel. In the embodiment, the insulating layer 32 may be covered with the insulating layer 32, and the head 33 is made of a conductor material, and is coupled to the charged object to be tested: 5's 31-end' and used for electric electricity renting 3 4 series has two electrodes contact - 苐 two electrodes (positive electrode); thermal connection to the needle shaft 31 and the needle beans ... ' ^ ~ electrode contacts are electrically coupled to the oblique 300 respectively can be scoop 33 In the preferred embodiment of the present invention, the tiger adjacent to the needle 33, the bypass board 35, and the read circuit board 35 are disposed at 35 to transmit the circuit and the thermistor is disposed in the circuit with the 34 system. The two electrode contacts of the board 34 are respectively 341 and (4) to cause the thermistor to be connected to the needle shaft 33 and the needle 33. 201241439 In one of the inventions, the invention may include a tilting handle. In the example, the probe circuit is actually using the disk 44, and the splitting pin 300 is vertically coupled to the needle including the needle sleeve 36 and the elastic element and the sigh; s Xuan dial 44 · In addition, the probe is more directly fixed to the dial ^ ΓΙ 'needle sleeve 36 is a hollow sleeve, hanging end - the elastic element 37 is connected to the needle sleeve relative to the needle 33 36 with the needle 36 (four) to move vertically against 44 respectively. The μ needle shaft 31 can be electrically connected to the dial plate C resistor 41 (4) material 3 voltage _43 system, the voltage dividing resistor = _ in the preferred embodiment, the voltage detector 43 is used to cheek Compared with the digital converter or - in the preferred embodiment of the present invention, the detecting processor 47 is coupled to the voltage she:... receiving the voltage detector 43 to measure the voltage dividing port Secondly, the pressure value is calculated according to the voltage value of the piezoelectric ink, the charge voltage to be measured: the voltage value of the sample, the reference voltage source 42, the reference voltage value resistance 4 The resistor 34;: value; in addition, the processor 47 can pre-store the thermistor =?! resistance-temperature comparison table, and according to the thermistor ~ - according to the table to find an ambient temperature, the ambient temperature g resistance - Temperature is around the temperature. The W-table electrical test object can be simultaneously provided with the probe circuit pin 3〇0 of the present invention and the conventional probe used for electrical testing in the prior art, because I; 201241439 electrical test object 100 The voltage value of the object to be tested can be known by electrical testing, and of course, the specification of the charged object 100 can be used as a reference. In summary, the probe circuit of the present invention can set the thermistor 34 adjacent to the charged object 100 in a manner similar to the conventional method of measuring the temperature of the object to be tested simultaneously with the electrical test, and The heat generated by the charged test object 100 can be simultaneously transmitted to the thermistor 34 through the probe and the air, so that the thermistor 34 can more quickly and accurately measure the temperature of the charged test object 100 to maintain electrical properties. Security during testing. In addition, the probe circuit of the present invention utilizes the charged test object 100 and the reference ground planned during the electrical test to form a loop, so that it is not necessary to additionally plan the reference ground on the dial 44, and the saving can be achieved. The cost of the effect. The features and spirit of the present invention are intended to be more apparent from the detailed description of the preferred embodiments. On the contrary, the intention is to cover various modifications and equivalents within the scope of the invention as claimed. BRIEF DESCRIPTION OF THE DRAWINGS The first figure is a schematic diagram of a system for detecting temperature during electrical testing by a conventional technique; the second figure is a schematic diagram of a circuit for sensing temperature by a conventional technique; Time-temperature diagram of the temperature of the analyte and the temperature measured by the thermistor; 9 201241439 The fourth diagram is a schematic cross-sectional view of the probe used in the present invention; the fifth diagram is the practical application of the probe circuit of the present invention. The schematic diagram; and the sixth diagram are schematic diagrams of the probe circuit of the present invention. [Main component symbol description] Charged object to be tested 100 Probe 21 Needle sleeve 211 Circuit board 22 Probe 23 Circuit board 24 Thermistor 25 Reference voltage source 26 Voltage dividing resistor 27 Ground terminal 28 Voltage sensor 29 Probe 300 Needle shaft 31 Insulation layer 32 Needle 33 Thermistor 34 Solder joint 341, 342 Circuit board 35 Needle sleeve 36 201241439 Elastic element 37 Divider resistor 4] Reference voltage source 42 Voltage detector 43 Dial 44 Probe 45 Needle plate 46 Processor 47 Curve S1 Curve S2 Time T1 Time T2 Temperature H1 Temperature H2