201205392 六、發明說明： 【發明所屬之技術領域】 本發明係關於電容偵測方法。 【先前技術】 觸控式裝置係一種操控裝置，其可摘測使用者於 置上之觸碰位置或觸碰力度。由於觸控式 &裝 控式面板）之操控方式相較於一般 '一觸 奴π咏和鍵盤更為201205392 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to a capacitance detecting method. [Prior Art] A touch device is a control device that can measure the touch position or touch force of a user. Because the touch & control panel is more controllable than the general one-touch slave 键盘 and keyboard
故可提供非傳統的電腦使用者—更簡單的電腦择作’ 因此，早期的觸控式裝置多半應用於—般公共場所，如雷 腦辅助教學終端機、導覽裝置和自動存提款機等裝置，以 取代人力的配置。隨著科技進步，使用者對於操作直覺性 的要未也曰漸提高，故近期觸控式裝置也可見應用於行動 電話、個人數位助理和掌上型遊戲機等移動式電子裂置， 可見觸控式裝置應用面之廣泛程度。 " =控式裝置之债測方式相當多樣，—般可分為電阻式 、電容式、聲納式、紅外線式、應變儀式和光學式等。其 中，電谷式觸控式裝置係根據一物體觸碰或靠近該裝置時 所造成電容上之改變以決定該觸碰位置或觸碰力度。電容 式觸控式裝置具有許多優點，例如電容式觸控式裝置只會 根據可傳導之物體產生反應’例如人的手指。此外，/電容 式觸控式裝置相較於電阻式觸控式裝置反應較敏銳，且反 應速度較快》 據此’如何偵測電容之改變即成為電容式觸控式裝置 之關鍵。圖1顯示一習知之電容偵測方法。如圖丨所示，在 201205392 步驟102，根據一脈波訊號以電流對一待測電容充電，並進 入步驟104。在步驟1〇4，於一固定時間後檢查該待測電容 之電壓，並進入步驟1 。在步驟100，根據該待測電容之 電麗判斷該待測電容之變化。 圖2顯示根據圖1之電容偵測方法，該脈波訊號和該待 測電谷電壓之關係圖。如圖2所示，當無外在物體碰觸電容 式觸控式裝置時’該電容式觸控式裝置之等效電容，亦即 待測電容為C。因此，根據步驟104，在固定時間後，該待 測電容可被充電至一參考電壓乂尺。另一方面，當有外在物 體碰觸電容式觸控式裝置時，該外在物體會使該電容式觸 控式裝置之等效電容增加。因此，根據步驟1〇4,在固定時 間後，該待測電容只能被充電至v i，其中v丨<VR，而△ v 即為兩者之差。接著，在步驟106，即可根據該待測電容之 電壓判斷該待測電容之變化，例如判斷△ V是否大於一臨界 值，進而判斷是否有一外在物體之存在。 然而’圖1所示之電容偵測方法存在以下所述之缺點。 圖3顯示根據圖丨之電容偵測方法，該脈波訊號和該待測電 谷電壓之另一關係圖。如圖3所示’若在對該待測電容進行 充電之過程中遭遇外在環境雜訊干擾，則該待測電容之電 壓可能會被充電至V2或V3，其中V2<V1<V3<VR »亦即， 對該待測電容和參考電壓Vr之電壓差可能介於 V2之間’其中△”= vR_V3 ’ △”= VR-V2。若該待測電 容之電壓係利用一類比至數位轉換器決定其電壓值，則此 種外在％境雜訊干擾將造成類比至數位轉換器之電壓準位 201205392 判決錯誤，而使得最後的電壓轉換強度發生誤差。 據此，業界所需要的是一種電容偵測方法，其具有雜 訊抑制效果以避免因外在環境雜訊干擾造成電容偵測失準 之問題，並可同時提升製程上電容和阻抗的變化容忍度以 改善製程良率》 【發明内容】 本發明揭示一種電容偵測方法’其不再是以分辨不同 _ #電壓變化來偵測電容變化，而是藉由轉換成頻域與時域 之方式來偵測電容變化。據此，可藉由偵測的脈波頻寬和 數量之變化取代習知之偵測電壓變化，進而達到將習知類 比領域的偵測轉成數位領域來判斷。 根據本發明之一實施例之電容偵測方法，包含下列步 驟：根據一脈波訊號以電壓對一待測電容充電；計算該待 測電谷之電壓達到一臨界電麼時之充電時間；以及根據該 充電時間判斷該待測電容之變化。 • 根據本發明之另一實施例之電容偵測方法，包含下列 步驟根據一脈波訊號以電壓對一待測電容充電；計算該 待測電容之電壓達到一臨界電壓時之充電時間；重複該充 電、該計算充電_間和該放電之步驟以獲得複數組充電時 間；以及根據該等充電時間判斷該待測電容之變化。 詳細描述得以獲得較佳瞭解。構 標的之其它技術特徵將描述於下 中具有通常知識者應可瞭解，下 上文已經概略地敍述本發明之技術特徵，俾使下文之 。構成本發明之申請專利範圍 下文。本發明所屬技術領域 下文揭示之概念與特定實施 201205392 例可作為基礎而相當輕易地予以修改或設計其它結構或製 程而貫現與本發明相同之目的。本發明所屬技術領域中具 有通常知識者亦應可瞭解，這類等效的建構並無法脫離後 附之申請專利範圍所提出之本發明的精神和範圍。 【實施方式】 本發明在此所探討的方向為一種電容偵測方法。為了 月b徹底地瞭解本發明，將在下列的描述中提出詳盡的步驟 ."頁地，本發明的施行並未限定於本發明技術領域之技 藝者所熟習的特殊細節。另—方面’眾所周知的步驟並未 描述於、、’田節中，以避免造成本發明不必要之限制。本發明 的較佳實施例會詳細描述如下，然而除了這些詳細描述之 本發月還可以廣泛地施行在其他的實施例中，且本發 明的範圍不受限定，其以之後的專利範圍為準。 本毛明所私之觸控式裝置係指一物體碰觸或靠近時可 產生電容效應’而使該觸控式裝置之等效電容變化之各種Therefore, non-traditional computer users can be provided - simpler computer choices. Therefore, early touch devices are mostly used in general public places, such as mine-assisted teaching terminals, navigation devices, and automatic deposit machines. And other devices to replace the human configuration. With the advancement of technology, users have not increased their intuitiveness. Therefore, touch-sensitive devices can also be seen in mobile electronic devices such as mobile phones, personal digital assistants and handheld game consoles. The extent to which the device is applied. " = Control devices have a variety of debt measurement methods - generally can be divided into resistive, capacitive, sonar, infrared, strain ceremonies and optical. Among them, the electric valley type touch device determines the touch position or the touch force according to the change in capacitance caused when an object touches or approaches the device. Capacitive touch devices have many advantages, such as capacitive touch devices that only react to a conductive object, such as a human finger. In addition, the /capacitive touch device is more sensitive than the resistive touch device, and the response speed is faster. According to this, how to detect the change of capacitance becomes the key to the capacitive touch device. Figure 1 shows a conventional method of detecting capacitance. As shown in FIG. 00, in step 102 of 201205392, a capacitor to be tested is charged with current according to a pulse signal, and the process proceeds to step 104. In step 1〇4, the voltage of the capacitor to be tested is checked after a fixed time, and the process proceeds to step 1. In step 100, the change of the capacitance to be tested is determined according to the sensation of the capacitor to be tested. FIG. 2 is a diagram showing the relationship between the pulse signal and the voltage of the valley to be tested according to the capacitance detecting method of FIG. 1. As shown in FIG. 2, when no external object touches the capacitive touch device, the equivalent capacitance of the capacitive touch device, that is, the capacitance to be measured is C. Therefore, according to step 104, after a fixed time, the capacitance to be tested can be charged to a reference voltage. On the other hand, when an external object touches the capacitive touch device, the external object increases the equivalent capacitance of the capacitive touch control device. Therefore, according to step 1〇4, after a fixed time, the capacitance to be tested can only be charged to v i , where v 丨 < VR, and Δ v is the difference between the two. Then, in step 106, the change of the capacitance to be tested can be determined according to the voltage of the capacitor to be tested, for example, whether ΔV is greater than a critical value, and then whether there is an external object. However, the capacitance detecting method shown in Fig. 1 has the disadvantages described below. Fig. 3 is a diagram showing another relationship between the pulse signal and the voltage of the valley to be tested according to the capacitance detecting method of the figure. As shown in Figure 3, if the external environment noise is encountered during the charging of the capacitor to be tested, the voltage of the capacitor to be tested may be charged to V2 or V3, where V2 < V1 < V3 < VR » That is, the voltage difference between the capacitor to be tested and the reference voltage Vr may be between V2 'where Δ' = vR_V3 ' Δ" = VR-V2. If the voltage of the capacitor to be tested is determined by a analog-to-digital converter, the external % noise interference will cause the analog voltage to the digital converter of the digital converter 201205392 to make a final error. There is an error in the conversion strength. Accordingly, what is needed in the industry is a capacitance detection method, which has a noise suppression effect to avoid the problem of capacitance detection misalignment caused by external environmental noise interference, and can simultaneously improve the tolerance variation of capacitance and impedance on the process. In order to improve the process yield, the present invention discloses a method for detecting capacitance, which is no longer to detect a change in capacitance by distinguishing different voltage changes, but by converting into a frequency domain and a time domain. To detect changes in capacitance. Accordingly, the detected detection voltage variation can be replaced by the detected pulse wave bandwidth and the number of changes, thereby achieving the judgment of converting the detection of the analog analog field into the digital domain. A capacitance detecting method according to an embodiment of the present invention includes the steps of: charging a capacitor to be tested with a voltage according to a pulse signal; and calculating a charging time when the voltage of the voltage to be tested reaches a critical voltage; The change of the capacitance to be tested is determined according to the charging time. The capacitor detecting method according to another embodiment of the present invention includes the following steps: charging a capacitor to be tested with a voltage according to a pulse signal; calculating a charging time when the voltage of the capacitor to be tested reaches a threshold voltage; repeating the Charging, calculating the charging_interval and the discharging step to obtain a complex array charging time; and determining the change of the capacitance to be tested according to the charging times. A detailed description is obtained for better understanding. Other technical features of the present invention will be described below, and those skilled in the art will be able to understand the technical features of the present invention. The scope of the patent application constituting the present invention is as follows. TECHNICAL FIELD OF THE INVENTION The concepts and specific implementations disclosed below may be modified as a basis or other structures or processes may be readily constructed as a basis for the same purposes as the present invention. It is to be understood by those of ordinary skill in the art that this invention is not limited to the scope of the present invention as set forth in the appended claims. [Embodiment] The direction of the present invention discussed herein is a capacitance detecting method. Detailed description of the present invention will be made in the following description for the purpose of the present invention. The implementation of the present invention is not limited to the specific details familiar to those skilled in the art. The other aspects are not described in the context of the field, to avoid unnecessarily limiting the invention. The preferred embodiments of the present invention are described in detail below, but the present invention may be widely practiced in other embodiments, and the scope of the present invention is not limited by the scope of the following patents. The touch-sensitive device of the present invention refers to a variety of changes in the equivalent capacitance of the touch device when an object touches or approaches.
裝置例如觸控式面板’或筆記型電腦上之觸摸墊 pad)’知名多媒體播放上之感應圈，或是锻上金屬 膜之塑膠外殼等裝置。 圖4顯示本發明之—實施例之電容偵測方法之流程圖 圖4所不|步驟術，根據—脈波訊號以電麈對一待 ，電今充電’並進人步驟4Q4。在步驟例，計算該待測電 容之電壓達到—臨界電壓時之充電日㈣，並進人步驟406 在步驟406 |據該充電時間判斷該待測電容之變化。對 習去的電W貞測方法’本實施例之電容摘測方法係以電 201205392 磨’而非電流對該待測電容充電。此外，本實施例之電容 偵測方法係以時間調變方式比較充電時間，而非於固定時 較該待測電谷之電應^據此，即可達到雜訊抑制效 果和提升製程上電容和阻抗的變化容忍度之目的。 圖5顯不根據圖4之堂六* /怎、》 儺口之電各偵測方法，該脈波訊號和該待 測電#電壓之關係圖中該電容偵測方法係應用於—電 容式觸控式裝置上（例如一電容式觸控式面板）。如圖5所 不®無外在物體（例如手指）碰觸電容式觸控式裝置時 該電今式觸控式裝置之等效電容，亦即待測電容為C。根 據步驟404,該待測電容之電壓達到—臨界電料（例如失 考電屋VR)之充電時間㈣。另一方面，當有外在物體碰 觸電容式觸控式裝置時，該外在物體會使該電容式觸控式 裝置之等效電容增加，亦即待測電容增加為C,，1中 。此時，根據步驟404 ’該待測電容之容值加大使得充電速 度變慢，故該待測電容之電壓達到一臨界電壓時之充電時 間增加至T2。接著’在步驟4G6,根據該充電時間判斷該待 測電容之變化’其巾充電時間之計料可根據該充電時間 内該脈波訊號之脈波數決定。如圖5所示，在T2時間内之脈 波數大於在TW間内之脈波數。據此，即可藉由計算脈波 數決定該待測電容之變化，進而判斷是否有一外在物體之 存在。 由於本發明之電容偵測方法係利用時間調變之方式， 故可根據使用需求調整該臨界電壓、該脈波訊號之頻$率或 該脈波訊號之寬度’以達到最佳化之目的。例如，可於由 201205392 降低該臨界電壓以達到加速本發明之電容偵測方法之目的 。圖6顯示根據圖4之電容谓測方法，該脈波訊號和該待測 電容電壓之另-關係圖。如圖6所示，可將臨界電壓降低到 VI。據此’即可縮短該待測電容之電壓達到臨界電壓時之 充電時間，以加快本發明之電容偵測方法。Devices such as touch panels or touchpad pads on notebook computers are known as "inductive loops for well-known multimedia playback, or plastic housings forged with metal films." 4 shows a flow chart of the method for detecting capacitance of the embodiment of the present invention. FIG. 4 is not a step. According to the pulse signal, the battery is charged, and the battery is charged, and the step 4Q4 is entered. In the example of the step, the charging date (four) when the voltage of the capacitor to be tested reaches the threshold voltage is calculated, and the step 406 is entered in step 406 to determine the change of the capacitor to be tested according to the charging time. The electric power sampling method of the present embodiment is used to charge the capacitance to be tested by electric current 201205392 instead of current. In addition, the capacitance detecting method of the embodiment compares the charging time in a time modulation manner, instead of the electric power of the electric valley to be tested when the fixing is performed, the noise suppression effect and the capacitance on the processing process can be achieved. And the purpose of tolerance change of impedance. Figure 5 is not based on the detection method of Figure 6 * / /, 傩 之 , , 》 》 》 , , , , 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系 关系On a touch device (such as a capacitive touch panel). As shown in Figure 5, when no external object (such as a finger) touches the capacitive touch device, the equivalent capacitance of the current touch device, that is, the capacitance to be measured is C. According to step 404, the voltage of the capacitor to be tested reaches the charging time (4) of the critical electric material (for example, the missing electric house VR). On the other hand, when an external object touches the capacitive touch device, the external object increases the equivalent capacitance of the capacitive touch device, that is, the capacitance to be tested increases to C, 1 . At this time, according to step 404', the capacitance of the capacitor to be tested is increased to make the charging speed slower, so the charging time when the voltage of the capacitor to be tested reaches a threshold voltage is increased to T2. Then, in step 4G6, the change of the capacitance to be tested is judged based on the charging time. The metering of the charging time of the towel can be determined according to the pulse wave number of the pulse wave signal in the charging time. As shown in Fig. 5, the number of pulses in the T2 time is larger than the number of pulses in the TW interval. According to this, the change of the capacitance to be tested can be determined by calculating the pulse wave number to determine whether there is an external object. Since the capacitance detecting method of the present invention utilizes the time modulation method, the threshold voltage, the frequency rate of the pulse signal or the width of the pulse signal can be adjusted according to the use requirement to achieve the purpose of optimization. For example, the threshold voltage can be lowered by 201205392 to achieve the purpose of accelerating the capacitance detecting method of the present invention. Fig. 6 is a diagram showing the relationship between the pulse signal and the voltage of the capacitor to be tested according to the capacitance prediction method of Fig. 4. As shown in Figure 6, the threshold voltage can be reduced to VI. According to this, the charging time when the voltage of the capacitor to be tested reaches the threshold voltage can be shortened to speed up the capacitance detecting method of the present invention.
另一方面，可藉由調整脈波訊號之頻率或該脈波訊號 之寬度以達到雜訊抑制之目的。圖7顯示根據圖4之電容偵 測方法’該脈波訊號㈣彳㈣電料壓之再—關係圖。如 圖7所示，若驗訊號之頻率高於外在環境雜訊之頻率，則 該待測電容之充電過程容易受該外在環境雜訊之影響而造 成電壓位準發生變化，進而衫充料料算之失準，例 充電時間内可％具有不同的脈波數。此時，可降低若該 脈波訊號之鮮使其低料在環境雜狀頻率，並增加該 波訊號之寬度。如圖7所示，由於脈波訊號之寬度增長， 該待測電料錢受料在環境㈣之干擾，仍然保持在 充電狀態’故在充電時間内仍具有相同脈波數。據此，即 可有效降低外在環境雜訊干擾。 同 亦可藉由調整脈波訊號之頻率或該脈波訊號之 寬度以提升製程上電容和阻抗的變化容忍度以改善製程良 率n ®8顯示根_4之電容制方法，該脈波訊號 和該待測電容電壓之又1係圖。如圖8所示，該待測電容 可能會受到製程的影響或是阻抗的容忍度不足而造成不同 充電曲線❿使得充電時間内可能具有不同脈波數。此 、可降低右該脈波说號之頻率並增加該脈波訊號之寬度 201205392 。如圖8所示，由於脈波訊號之寬度增長，該待測電容即使 具有不同之充電曲線’充電時間内仍將具有相同脈波數。 據此，即可提升製程上電容和阻抗的變化容忍度。 此外’若要進一步降低外在環境雜訊干擾，可藉由重 複多次計算過程’以平均掉雜訊干擾所帶來的影響。圖9 顯示本發明之一實施例之電容偵測方法之流程圖。如圖9 所示’在步驟902，根據一脈波訊號以電壓對一待測電容充 電’並進入步驟904。在步驟904，計算該待測電容之電壓 • 達到一臨界電壓時之充電時間，並進入步驟906。在步驟906 ’對該待測電容充電進行放電，並進入步驟9〇8。在步驟9〇8 ’判斷疋否已達到預疋之重複次數。若否，則回到步驟go] ，否則進入步驟910。在步驟910，根據該等充電時間判斷 該待測電容之變化。根據圖9之電容偵測方法，例如將重複 次數設為10次，搭配調整臨界電壓、脈波訊號之頻率及該 脈波訊號之寬度，即可達到雜訊抑制效杲及提升製程上電 容和阻抗的變化容忍度之目的。 ® 综上所述’本發明之電容偵測方法係以電壓對一待測 電容充電’並利用時間調變方式比較充電時間，以決定談 待測電容之變化’並可依此決定一觸控式裝置是否觸碰以 該一物體’或該物體已足夠靠近該觸控式裝置而使其等效 電容產生變化。據此，本發明之電容偵測方法可逹到雜訊 抑制效果和提升製程上電容和阻抗的變化容忍度之目的 本發明之技術内容及技術特點已揭示如上，然而熟糸 本項技術之人士仍可能基於本發明之教示及揭示而作種種 201205392 不背離本發明精神之替換及修飾。因此， 圍應不限於實施例所揭示者，而應包括 明^之保護範 各種不背離本發明 之替換及修飾，並為以下之申請專利範圍所涵蓋。 【圖式簡單說明】 ° 圖1顯示一習知之電容偵測方法； 圖2顯示根據一習知之綱測方法，其脈波訊 測電容電壓之關係圖； 圖3顯示根據一習知之電容债測方法，其脈波訊號和待 測電谷電壓之另一關係圖； ^ 圖4顯示本發明之一實施例之電容偵測方法之流程圖； 圖5顯示根據本發明之一實施例之電容價測方法，其脈 波訊號和待測電容電壓之關係圖； 圖6顯示根據本發明之一實施例之電容偵測方法，其脈 波訊號和待測電容電壓之另一關係圖； 圖7顯不根據本發明之一實施例之電容偵測方法，其脈 波訊號和待測電容電壓之再一關係圖； 圖8顯不根據本發明之一實施例之電容偵測方法，其脈 波訊號和待測電容電壓之又一關係圖；以及 圖9顯示本發明之另一實施例之電容偵測方法之流程 圖。 【主要元件符號說明】 102〜106 步驟 402〜406 步驟 902〜910 步驟On the other hand, the noise suppression can be achieved by adjusting the frequency of the pulse signal or the width of the pulse signal. Fig. 7 is a diagram showing the re-relationship of the voltage of the pulse wave signal (4) 彳 (4) according to the capacitance detecting method of Fig. 4. As shown in FIG. 7, if the frequency of the test signal is higher than the frequency of the external environment noise, the charging process of the capacitor to be tested is susceptible to the change of the voltage level caused by the external environmental noise, and then the charging is performed. If the material is out of alignment, the sample may have different pulse wave numbers during the charging time. In this case, if the pulse signal is fresh, it is low in the ambient frequency and increases the width of the wave signal. As shown in Fig. 7, since the width of the pulse wave signal increases, the amount of the electricity to be tested is disturbed by the environment (4), and remains in the state of charge, so that the same pulse wave number is still available during the charging time. According to this, the external environment noise interference can be effectively reduced. It is also possible to improve the process yield by adjusting the frequency of the pulse signal or the width of the pulse signal to improve the variation tolerance of the capacitance and impedance on the process. And another 1 map of the capacitor voltage to be tested. As shown in Figure 8, the capacitor to be tested may be affected by the process or the impedance tolerance is insufficient to cause different charging curves, which may cause different pulse numbers during the charging time. This can reduce the frequency of the right pulse wave and increase the width of the pulse signal 201205392. As shown in Fig. 8, since the width of the pulse signal increases, the capacitance to be tested will have the same pulse number even if it has a different charging curve. According to this, the change tolerance of capacitance and impedance on the process can be improved. In addition, to further reduce the external environmental noise interference, the effect of noise interference can be averaged by repeating the calculation process multiple times. FIG. 9 is a flow chart showing a method of detecting capacitance according to an embodiment of the present invention. As shown in Fig. 9, 'at step 902, a capacitor to be tested is charged with a voltage according to a pulse signal' and the process proceeds to step 904. At step 904, the voltage of the capacitor to be tested is calculated. • The charging time when a threshold voltage is reached, and the process proceeds to step 906. The capacitor to be tested is charged at step 906' and is discharged to step 9-8. At step 9〇8', it is judged whether or not the number of repetitions of the preview has been reached. If no, go back to step go], otherwise go to step 910. At step 910, a change in the capacitance to be tested is determined based on the charging times. According to the capacitance detecting method of FIG. 9, for example, the number of repetitions is set to 10 times, and the threshold voltage, the frequency of the pulse signal, and the width of the pulse signal are adjusted to achieve noise suppression effect and increase the capacitance of the process. The purpose of impedance change tolerance. In summary, the 'capacitance detection method of the present invention charges a capacitor to be tested by voltage' and compares the charging time with a time modulation method to determine the change of the capacitance to be measured' and can determine a touch accordingly. Whether the device touches the object or the object is sufficiently close to the touch device to vary its equivalent capacitance. Accordingly, the capacitance detecting method of the present invention can achieve the noise suppression effect and improve the variation tolerance of the capacitance and the impedance on the process. The technical content and technical features of the present invention have been disclosed as above, but those skilled in the art It is still possible to make various alternatives and modifications to the present invention based on the teachings and disclosures of the present invention. Therefore, the scope of the invention is not limited by the scope of the invention, and the scope of the invention is not limited by the scope of the invention. [Simple diagram of the figure] ° Figure 1 shows a conventional method for detecting capacitance; Figure 2 shows a diagram of the relationship between pulse wave capacitance and capacitance according to a conventional method; Figure 3 shows a capacitor measurement according to a conventional method. Method, another relationship diagram between the pulse signal and the voltage of the valley to be tested; ^ Figure 4 shows a flow chart of a capacitance detecting method according to an embodiment of the present invention; Figure 5 shows a capacitor price according to an embodiment of the present invention The measurement method, the relationship between the pulse signal and the capacitance of the capacitor to be tested; FIG. 6 shows a capacitance detection method according to an embodiment of the present invention, and another relationship diagram between the pulse signal and the capacitance to be measured; A capacitance detecting method according to an embodiment of the present invention, a relationship diagram between a pulse signal and a capacitor voltage to be tested; FIG. 8 is a diagram showing a capacitance detecting method according to an embodiment of the present invention, and a pulse signal thereof And a further diagram of the capacitance of the capacitor to be tested; and FIG. 9 is a flow chart showing a method of detecting capacitance of another embodiment of the present invention. [Main component symbol description] 102~106 Steps 402~406 Steps 902~910 Steps