TW201120917A - High energy density ionic dielectric materials and devices - Google Patents

High energy density ionic dielectric materials and devices Download PDF

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TW201120917A
TW201120917A TW099134645A TW99134645A TW201120917A TW 201120917 A TW201120917 A TW 201120917A TW 099134645 A TW099134645 A TW 099134645A TW 99134645 A TW99134645 A TW 99134645A TW 201120917 A TW201120917 A TW 201120917A
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Taiwan
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dielectric
dielectric material
mixtures
protonated
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TW099134645A
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Chinese (zh)
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Clive A Randall
Leslie E Cross
Aram Yang
Niall J Donnelly
Ramakrishnan Rajagopalan
Amanda Lou Baker
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Recapping Inc
Penn State Res Found
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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Abstract

Dielectric compositions that include compound of the formula (M')1-x(A')x][(M'')1-y-z(B'')y(C'')z]O3- δ (VO) δ and protonated dielectric compositions that include a protonated dielectric compound within the formula[(M')1-x(A')x](M'')1-y-z(B'')y(C'')z]O3- δ +h(Vo) δ (H.)2h are disclosed. Composite materials that employ one or more of these dielectric compounds together with an electrolyte also are disclosed. Composite material that employs one or more of these dielectric compounds together with an electrochemally active material also are disclosed.

Description

201120917 六、發明說明: 【發明所屬之技術領域】 [0001] 本案主張2009年10月13曰提出申請的美國臨時申請 案第61 /278867號以及於2010年2月11日提出申請的美 國臨時申請案第61 /303644號的優先權,其教示整體在 此併入做為參考。 [0002] 【先前技術】 在傳統的阻障層中,多晶介電質,電子是移動種類 ❹ ❹ ,使用電子作為移動種類可使得這些介電質達成相對而 言較高的頻率響應。然而,這些介電質的工作電壓受到 跨越晶粒邊界的電場降以及受到跨越晶粒邊界的電子穿 隧的限制,此相應地限制了可達成的電容能量密度。 典型的阻障層介電質提供大約為20, 000至100, 000 的效率相關介電係數,然而,這些介電質的能量儲存能 力受限於高電場下晶粒邊界處的電子穿隧。並且,典型 的阻障層介電質僅能夠抵抗大約3伏特的低電壓。 商業用阻障層介電質的基礎是具有抗性晶粒邊界以 及表現不均勻分佈電阻率的半導體介電晶粒,這些介電 質利用在電場偏壓下的空間電荷來發展具分離電荷分佈 的極化介電質。商用介電晶粒,多晶阻障介電質,具有 高傳導性,且典型地為η型。然而,在這些介電質中的晶 粒邊界比晶粒更具抗性,且具有雙肖特基能障(呂(:11〇1:-tky barrier )電位。此透過該多晶介電質限制DC傳導 ,直到在高電場偏壓下發生穿隧跨越晶粒邊界為止。 習知技術試著藉由在介電質的晶粒邊緣增加更具抗 099134645 性的相位,例如,二氧化石夕、或氧化紹,而降低電子穿 表單編號A0101 第3頁/共66頁 1003059622-0 201120917 • · .· 隨的可能性損害卻由跨越晶粒邊界的電傳導控 制。 [0003] 因此’存在著對於處理這些不^的新材料的需求。 更進二步^在對於可使料些新材料的I置的需求, 例如,在高能量密度儲存應用中。 【發明内容】 [0004] 在-第-方面的構想中,本發明相關於離子傳導介電 材料,該離子傳導介電材料可具有產生阻障層效應的非 均質分佈傳導性’該離子傳導介電材料可採用離子種類 ’例如’但不限於,H+ ’ Li+,Na+,Ag+,以及〇2_,以 及其結合’以作為主要電荷載體,該料傳導介電材料 具有優勢地可使離子種類的穿隨可能性降低,以及增加 晶粒相關於電化學傳導阻障層電容器的崩潰電壓,當Li + ’Na+,Ag ’以及Ο2被使用做為離子傳導電荷載體種類 時’這些種類可能會在被施加—電壓時於晶粒邊界區域 累積,而產生一離子為基礎的聛障層(I〇nic_Based_201120917 VI. Description of the invention: [Technical field to which the invention pertains] [0001] This application claims US Provisional Application No. 61/278867 filed on October 13, 2009 and US Provisional Application filed on February 11, 2010 The priority of the PCT Patent No. 61/303,644, the entire disclosure of which is incorporated herein by reference. [Prior Art] In a conventional barrier layer, a polycrystalline dielectric, an electron is a mobile type, and the use of electrons as a mobile species allows these dielectrics to achieve a relatively high frequency response. However, the operating voltage of these dielectrics is limited by the electric field drop across the grain boundaries and by electron tunneling across the grain boundaries, which in turn limits the achievable capacitance energy density. Typical barrier dielectrics provide an efficiency-dependent dielectric constant of between about 20,000 and 100,000. However, the energy storage capacity of these dielectrics is limited by electron tunneling at grain boundaries at high electric fields. Also, a typical barrier dielectric can only withstand a low voltage of approximately 3 volts. Commercial barrier layer dielectrics are based on semiconductor grain dies with resistant grain boundaries and heterogeneously distributed resistivity. These dielectrics exploit the space charge under electric field bias to develop a split charge distribution. Polarized dielectric. Commercial dielectric dies, polycrystalline barrier dielectrics, have high conductivity and are typically n-type. However, the grain boundaries in these dielectrics are more resistant than grains and have a double Schottky barrier (Lu (:11〇1:-tky barrier) potential. This is through the polycrystalline dielectric. Limiting DC conduction until tunneling across the grain boundaries occurs under high electric field bias. Conventional techniques attempt to increase the phase resistance to 099134645 at the edge of the grain of the dielectric, for example, sulphur dioxide , or oxidation, and reduce the electron through form number A0101 Page 3 / 66 pages 1003059622-0 201120917 • The possibility of damage is controlled by electrical conduction across the grain boundaries. [0003] Therefore 'existence There is a need to deal with these new materials. Further, the need for I to place some new materials, for example, in high energy density storage applications. [Invention] [0004] In - In an aspect, the present invention relates to an ion-conducting dielectric material that can have a heterogeneous distribution conductivity that produces a barrier layer effect. The ion-conducting dielectric material can employ an ion species such as 'but Not limited to, H+ ' Li+, N a+, Ag+, and 〇2_, and their combination 'as the primary charge carrier, the conductive dielectric material advantageously has the potential to reduce the ionic species, and the increase in crystallites associated with the electrochemically conductive barrier layer The breakdown voltage of a capacitor, when Li + 'Na+, Ag ' and Ο 2 are used as ion-conducting charge carrier species, 'these species may accumulate in the grain boundary region when applied-voltage, resulting in an ion-based Barrier layer (I〇nic_Based_

Barrier-Layer) (IBBL)效應。此IBBL效應可產生有 效阻障層電容,離子種類,例如,Li +,Na+,Ag+,以及 〇2—,可不均句地分佈在該晶粒範圍内的離子傳導晶粒的 鞘狀區域内,或非均質地分佈在該晶粒内,當使用Η+被 做為離子種類時,Η+可累積在晶粒邊界,以產生一種型 態的IBBL效應,之後稱之為質子為基礎的阻障層(pBBL )效應。 在一第二方面的構想中,本發明相關於合成材料,其 中,該離子傳導介電材料的晶粒邊界承受可與介電晶粒 099134645 表單編號A0101 第4頁/共66頁 1003059622-0 201120917 中的一或多個離子電荷載體種類相互作用的一、或多個 電化學活性材料。因此,合成材料可在晶粒以及電化學 活性材料之間的介面產生偽電容,以達成能量儲存容量 的增加。 展見IBBL效應(例如,pbbl效應)的離子傳導介電 材料可包括離子傳導晶粒,例如,單獨的已質子化介電 晶粒’或與一、或多個電化學活性晶粒邊界化合物或紐 成物相結合’當離子傳導晶粒,例如,已質子化晶粒, 丨被用來與一、或多個電化學活性晶粒邊界化合物或組成 物H合’所得d结合f具有優勢地兼備靜電以及 電化學電何儲存機制。於晶雜邊界處出現的電化學活性 晶粒邊界化合物,例如,金屬氫氧化物,例如,Α1(〇Η)3 ,可使電化學反應以及偽電容的產生。 離字傳導介電材料,例如,該些產生1BBL效應(例如 ,PBBL效應)者,可達成大約1G18ChT3至大約l〇21cm-3 的高電荷«離子軸濃度。當Ή+為離子^類時,可以 > 在很少、或沒有已質子化介電質轉變為金屬傳導相的情 形下達成大約1018Cm-3至大約1()21^、η+載體濃度。 離子傳導介電材料,例如,該些產生IBBL效應 (例如 ’ PBBL效應)者,可具優勢地在電I達大約每晶粒邊界5 伏特、及/或少於大約〇. !至大約2 Mv/_tar^的情形 下’最小化跨越晶粒邊界的穿随,離子傳導介電材料, 例如’該些產生IBBL效應(例如,pBBL效應) 者,相較 於利用電子進行電荷傳送的介電質,亦可達成較高的電 壓操作。 離子傳導介電材料’例如,該些產生IBBL效應(例如 099134645 表單編號A0101 第5頁/址如客 ^ bb * 1003059622-0 201120917 ’ PBBL效應)者’亦可達成具有大約ιχι〇4至大約5χι〇5 的有效相關介電係數的介面極化與大約1 〇秒至大約5毫秒 的鬆弛時間,以及在大約l〇_3Hz至大約1〇〇 Hz的低頻率 操作,離子傳導介電材料,例如,該些產生IBBL效應( 例如,PBBL效應)者,亦可避免當以電子為主要載體種 類時,在BaTi03為基礎的介電質中可能發生的電場偏置 下的降解。 離子傳導介電材料,例如,該些產生IBBL效應(例如 ,PBBL效應)者,可被使用作為低頻、高場介電質。離 子傳導介電材料,例如,該些產生iBBL效應(例如, PBBL效應)者·’例如,實例2.的已質子化 /ΉοιΖ% 15)〇 &)〇3亦可展現改善的能量儲 存特性。離子傳導介電材料,例如,該些產生IBBL效應 (例如,PBBL效應)者,亦可對電壓不靈敏,以及可達 成大約100 J/cc或更多的能量密度。離子傳導介電材料 ’例如’該些產生IBBL效鳥(例如,pBBL效應)者,可 採用已質子化介電質,例如,實树2韵已質子化Barrier-Layer) (IBBL) effect. The IBBL effect can produce an effective barrier capacitance, such as Li +, Na+, Ag+, and 〇2, which can be distributed unevenly within the sheath region of the ion-conducting grains within the grain range. Or heterogeneously distributed in the grain, when Η+ is used as the ion species, Η+ can accumulate at the grain boundary to produce a type of IBBL effect, which is then called a proton-based barrier. Layer (pBBL) effect. In a second aspect, the invention relates to a composite material wherein the grain boundary of the ion-conducting dielectric material is capable of with a dielectric die 099134645 Form No. A0101 Page 4 / Total 66 Page 1003059622-0 201120917 One or more electrochemically active materials in which one or more ion charge carrier species interact. Therefore, the synthetic material can generate a pseudo-capacitance at the interface between the crystal grains and the electrochemically active material to achieve an increase in energy storage capacity. Ion-conducting dielectric materials exhibiting an IBBL effect (eg, pbbl effect) may include ion-conducting grains, eg, single protonated dielectric grains' or with one or more electrochemically active grain boundary compounds or The complex combines with 'when ion-conducting grains, for example, protonated grains, which are used to combine with one or more electrochemically active grain boundary compounds or compositions H' Both static electricity and electrochemical electricity storage mechanism. Electrochemically active grain boundary compounds appearing at the crystal boundaries, for example, metal hydroxides, for example, Α1(〇Η)3, can cause electrochemical reactions and the generation of pseudocapacitors. The ion-conducting dielectric material, for example, those that produce a 1BBL effect (e.g., PBBL effect), can achieve a high charge «ion axis concentration of about 1G18ChT3 to about 10 〇 21 cm-3. When Ή+ is an ionic group, it is possible to achieve a carrier concentration of about 1018 cm-3 to about 1 () 21 、 η + in the case of little or no protonated dielectric to metal transition. Ion-conducting dielectric materials, for example, those that produce IBBL effects (eg, 'PBBL effects), can advantageously have an electrical I of about 5 volts per grain boundary, and/or less than about 〇.! to about 2 Mv. In the case of /_tar^ 'minimizes the crossing of grain boundaries, ion-conducting dielectric materials, such as 'these that produce IBBL effects (eg, pBBL effect), compared to dielectrics that use electrons for charge transport It can also achieve higher voltage operation. Ion-conducting dielectric materials', for example, those that produce IBBL effects (eg, 099134645 Form No. A0101, page 5/site, such as guest bb * 1003059622-0 201120917 'PBBL effect) can also be achieved with approximately ιχι〇4 to approximately 5χι The interface polarization of the effective relevant dielectric constant of 〇5 and the relaxation time of about 1 〇 to about 5 ms, and the low frequency operation of about 10 〇 3 Hz to about 1 〇〇, ion-conducting dielectric materials, for example Those who produce IBBL effects (for example, the PBBL effect) can also avoid degradation under electric field bias that may occur in BaTi03-based dielectrics when electrons are the main carrier species. Ion-conducting dielectric materials, such as those that produce IBBL effects (e.g., PBBL effects), can be used as low frequency, high field dielectrics. Ion-conducting dielectric materials, for example, those that produce iBBL effects (eg, PBBL effects), such as, for example, protonated / ΉοιΖ% 15) 〇 &) 〇3 of Example 2. may also exhibit improved energy storage characteristics. . Ion-conducting dielectric materials, such as those that produce IBBL effects (e.g., PBBL effects), can also be insensitive to voltage and can achieve energy densities of about 100 J/cc or more. Ion-conducting dielectric materials, such as those that produce IBBL effect birds (e.g., pBBL effect), can use protonated dielectrics, for example, real tree 2 rhyme has been protonated

Ba(Sco. i(Tl0.85Zr〇 15)〇 9)〇3,在大約每公尺1 MV、 或更多的施加電場下,以用於特殊的能量儲存應用中, 例如,超電容器。 在一第三方面的構想中,本發明相關於使用展現ibbl 效應(例如,PBBL效應)的離子傳導介電材料的裝置, 例如’電容器以及電化學電池。&有優勢地是離子傳 導介電材料,例如,該些產生IBBL效應(例如,pbbl效 應)者’例如,實例2的已質子化 099134645Ba(Sco.i(Tl0.85Zr〇 15)〇 9)〇3, for application of an electric field of about 1 MV, or more per meter, for special energy storage applications, such as ultracapacitors. In a third aspect, the present invention relates to devices that use ion conducting dielectric materials that exhibit ibbl effects (e.g., PBBL effects), such as 'capacitors and electrochemical cells. & is advantageously an ionically conducting dielectric material, for example, those that produce an IBBL effect (e.g., a pbbl effect), e.g., protonated of Example 2 099134645

Ba(Sco.i(Ti〇 85Zr〇.i5)Q 9)〇3 ’可被用於如混合動力 表單編號A0101 第6頁/共66頁 1003059622-0 201120917 ❹ Ο 電動車’制動器,電子裝置(例如,電腦、快取記憶體 ,攝影機),軍事與航空應用,以及井下石油與天然氣 勘探技術的裝置中。 在-第四方面的構想中,本發明相關於採用離子傳導 介電材料的合成材料,例如,離子傳導介電材料與絕緣 材料的組成物。 本發明更進-步相關於_種介電組成物,其包括—化 ,物,在分子式or )ΐ χ(Α,)χ][(Μ”)…(Β,,)α )2]〇3-/¥〇)5的定義下,其中,0.0 = x = 0.4, y 〇.〇〇=b=0.99 > 〇. 〇〇=y^.4〇 v〇. 00 = z^^ , r 、Mg、Ca、Sr、Pb ’ 以及其混合物,A.為K、Na、u、 Ag以及其混合物中任何一個,m、zr、^、ce、 Sn>(Mg1/3.Nb2/3) '(Znl/3,Nb2/3). (Sci/2, Tai/2)以及其混合物的其中任何一個,B·為Sc、 Al、Y、La、Fe、Yb、H〇、Tm、Sb、Sra、Nd、Gd、Er、 Pr、Mo、Dy以及其混合物的其中任何,·G”為v、Mn 、Cr、Fe、Ni、Cu ’ Zn、Ca、Mg以及其混合物的其中任 何一個,(vo)5代表氧空缺,以及δ=0.5χ+〇· 5y+z。 本發明更進一步相關於已質子化介電化合物,在分子 式[(M,Vx(A’)χΚΜ”)i y_z(B” yen +h(Vo)/H· )2h的定義下,其中,0.0^χ^4,Λ〇 SbS0.99’〇.〇〇SyS0.40,〇.〇〇z〇.4〇,M,4 Ba、Mg、Ca、Sr、Pb以及其混合物的其中任何一個,a, 為K、Na、Li、Ag以及其混合物物的其中任何一個,續,, 099134645 為Ti、Zr、Hi、Ce、Sn、(Mg1/3,Nb2/3)、 (Zn1/3,Nb2/3) 、(Sc1/2’Ta1/2)以及其混合物物的其中 表單編號A〇m 第7頁/共66頁 觸_·0 201120917 任何一個,B’ 為Sc、A1、Υ、La、Fe、Yb、Ho、Tm、Ba(Sco.i(Ti〇85Zr〇.i5)Q 9)〇3 ' can be used in, for example, hybrid form number A0101 Page 6 of 66 page 1003059622-0 201120917 ❹ 电动 Electric vehicle 'brake, electronic device ( For example, computers, caches, cameras, military and aerospace applications, and underground oil and gas exploration technology. In the concept of the fourth aspect, the present invention relates to a synthetic material using an ion-conducting dielectric material, for example, a composition of an ion-conducting dielectric material and an insulating material. The present invention is further related to a dielectric composition comprising: -, in the molecular formula or ) χ Α (Α,) χ] [(Μ") ((Β,,) α) 2] 〇 3-/¥〇)5, where 0.0 = x = 0.4, y 〇.〇〇=b=0.99 > 〇. 〇〇=y^.4〇v〇. 00 = z^^ , r , Mg, Ca, Sr, Pb ' and mixtures thereof, A. is any one of K, Na, u, Ag and a mixture thereof, m, zr, ^, ce, Sn > (Mg1/3.Nb2/3) ' (Znl/3, Nb2/3). (Sci/2, Tai/2) and any of its mixtures, B· is Sc, Al, Y, La, Fe, Yb, H〇, Tm, Sb, Sra Any of Nd, Gd, Er, Pr, Mo, Dy, and mixtures thereof, · G" is any one of v, Mn, Cr, Fe, Ni, Cu 'Zn, Ca, Mg, and mixtures thereof, (vo 5 represents oxygen vacancies, and δ = 0.5 χ + 〇 · 5y + z. The present invention is further related to a protonated dielectric compound, under the definition of the formula [(M, Vx(A') χΚΜ") i y_z(B" yen + h(Vo)/H· ) 2h, wherein 0.0 ^χ^4,Λ〇SbS0.99'〇.〇〇SyS0.40,〇.〇〇z〇.4〇, M,4 Ba, Mg, Ca, Sr, Pb, and any mixture thereof, a , which is any of K, Na, Li, Ag, and a mixture thereof, continued, 099134645 is Ti, Zr, Hi, Ce, Sn, (Mg1/3, Nb2/3), (Zn1/3, Nb2/ 3), (Sc1/2'Ta1/2) and the mixture thereof, the form number A〇m, page 7 / total 66 pages touch _·0 201120917 Any one, B' is Sc, A1, Υ, La, Fe , Yb, Ho, Tm,

Sb、Sm、Nd、Gd、Er、Pr、Mo、Dy以及其混合物物的 其中任何一個,C,為V、Μη、Cr、Fe、Ni、Cu、Zn、Ca 、Mg以及其混合物物的其中任何一個,代表氧空 缺’以及0. 〇〇<hS (5 SO. 5x + 〇. 5y + z。該已質子化介電 化合物可為已質子化Ba(ScQ i(Ti。a 9)〇3、 已質子化Ba(Sc。Ji。9)〇3、已質子化 已質子化Any one of Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy, and a mixture thereof, C, of which V, Μη, Cr, Fe, Ni, Cu, Zn, Ca, Mg, and a mixture thereof Any one, representing oxygen vacancies' and 0. 〇〇 <hS (5 SO. 5x + 〇. 5y + z. The protonated dielectric compound may be protonated Ba (ScQ i(Ti.a 9)〇) 3, protonated Ba (Sc. Ji. 9) 〇 3, protonated protonated

Pb(Sc〇 iCTio.ssZro 15)〇 9)〇3以及已質子化 Ba(Zr。8Y〇.2)〇3的其中#何一傭》 本發明亦相關於一種已質..子.化介電化合物,在分子式 C A A ) (B B C" * ) 0 H * aa m -T- 卜 X X l-y-z y 3n (x + y+2z)的疋義下 ’其中,0. 00<x<0. 40,0. 〇〇<y<〇. 40,以及 0. 00<z<0. 40,A為Ba、Mg ' Ca、Sr、Pb以及其混合物 的其中任何一個’ A’為K、Na、Li、Ag以及其混合物的 其中任何一個,B為Ti、Zr、Hf、Sn、(Mg mk λPb(Sc〇iCTio.ssZro 15)〇9)〇3 and the protonated Ba(Zr.8Y〇.2)〇3 of which #何一佣》 The present invention is also related to a kind of quality. An electric compound, in the formula CAA) (BB C" * ) 0 H * aa m -T- 卜 lyz y 3n (x + y+2z), where 0. 00<x<0. 40, 0. 〇〇<y<〇. 40, and 0. 00<z<0. 40, A is any of Ba, Mg 'Ca, Sr, Pb, and a mixture thereof 'A' is K, Na, Li Any one of Ag, Ag, and a mixture thereof, B is Ti, Zr, Hf, Sn, (Mg mk λ

Sl/3’ 間2/3’ 、(Zni/3’Nb2/3)、(谷Cl/2,Tai/2)A及其混合物的其中 任何一個,B’ ’ 為Sc、Y、La、'Fe、Yb、Ho、Tm、Sb、Sl/3' between 2/3', (Zni/3'Nb2/3), (Valley Cl/2, Tai/2) A and any mixture thereof, B' ' is Sc, Y, La, ' Fe, Yb, Ho, Tm, Sb,

Sm、Nd、Gd、Er、Pr、Mo、Dy以及其混合物的其中任何 —個,C” ’ 為V、Μη、Cr、Fe、Ni、Cu、Ca、Mg以及 其混合物的其中任何一個,以及泸為一質子。 本發明更進一步相關於一種已質子化化合物的製造方 法,該化合物受分子式[(Μ’)1χ(Α’)χ](Μ”)ι (Β )y(c”)z]〇3-5+h(Vo) (5 (H )2h的定義,其中,0. 0 ^x^0.4 5 0.00^b^0.99 * 〇.〇〇^y^〇.4〇 > 〇 〇〇< zSO. 40,M’為Ba、Mg、Ca、Sr、Pb以及其混合物的其 099134645 表單編號A0101 第8頁/共66頁 1003059622-0 201120917 中任何一個,\’為Κ、Na、Li、Ag以及其混合物的其中 任何一個,Μ’ ’ 為Ti、Zr、Hf、Ce、Sn、(Mg, ,Nb Ί "3 2/3〉 、(Zni/3,Nb2/3) 、(Sci/2,Tai/2)以及其混合物的其中 任何一個,P)’ ’ 為Sc、A1、Y、La、Fe、Yb、Ho、Tm、 ΟAny one of Sm, Nd, Gd, Er, Pr, Mo, Dy, and a mixture thereof, C"' is any one of V, Μη, Cr, Fe, Ni, Cu, Ca, Mg, and a mixture thereof, and The present invention is further related to a method for producing a protonated compound which is subjected to the molecular formula [(Μ')1χ(Α')χ](Μ") ι (Β)y(c")z ]〇3-5+h(Vo) (5 (H ) 2h definition, where 0. 0 ^x^0.4 5 0.00^b^0.99 * 〇.〇〇^y^〇.4〇> 〇〇 〇<zSO. 40, M' is Ba, Mg, Ca, Sr, Pb, and a mixture thereof, 099134645 Form No. A0101 Page 8 / Total 66 Page 1003059622-0 201120917, \' is Κ, Na, Any of Li, Ag, and a mixture thereof, Μ' ' is Ti, Zr, Hf, Ce, Sn, (Mg, , Nb Ί "3 2/3>, (Zni/3, Nb2/3), ( Sci/2, Tai/2) and any of its mixtures, P)' ' is Sc, A1, Y, La, Fe, Yb, Ho, Tm, Ο

Sb、Sm、Nd、Gd、Er、Pr、Mo、Dy以及其混合物的其 中任何一個’以及Γ 為V、Μη、Cr、Fe、Ni、Cu、Zn、 Ca、Mg以及其混合物的其中任何一個,(v〇)s代表氧空 缺,(5 SO. 5x + 0. 5y+z,H*為一質子,以及0 〇〇<h$ δ SO. 5χ + 〇· 5y + z,該方法需要,形成包括Ba,Ti的氧化 物 '或乳化物刖驅物以及換:質氧化物的一混合物,將該 混合物與一液體結合,以形成一漿狀物,鍛燒該漿狀物 ,以形成一已鍛燒產物,研磨該已鍛燒產物,以產生一 已研磨粉末’壓縮該已研磨粉末,以形成一預形成物, 於大約1 000 C至大約1 500 C的溫度下燒結該預形成物, 以產生一已燒結產物,以及將該已燒結產物暴露於大約 0.1 PSI至大約100 PSI'大約250 °C至大約70(TC的蒸Any one of Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy, and a mixture thereof, and Γ is any one of V, Μη, Cr, Fe, Ni, Cu, Zn, Ca, Mg, and a mixture thereof , (v〇) s represents oxygen vacancies, (5 SO. 5x + 0. 5y + z, H* is a proton, and 0 〇〇 <h$ δ SO. 5χ + 〇 · 5y + z, the method needs Forming a mixture comprising Ba, Ti oxide or emulsion impregnation and a conversion of a quality oxide, combining the mixture with a liquid to form a slurry, and calcining the slurry to form a calcined product, grinding the calcined product to produce a ground powder 'compressing the ground powder to form a preform, sintering the preform at a temperature of from about 1 000 C to about 1 500 C To produce a sintered product, and to expose the sintered product to a steam of from about 0.1 PSI to about 100 PSI' from about 250 ° C to about 70 (TC)

汽下1小時至大約24小時。 本發明亦相關於一種合成材料,包括用於產生丨BBL效 應的介電材料,以及電解質,其中,該電解質為離聚物 電解質,固態質子電解質,以及其混合物的其中任何一 個。該離聚物電解質為四氟乙烯·全氟_3 6_二氧雜_4_ 甲基-7-辛烯硫酸共聚物、聚(乙烯共曱基丙烯酸、聚乙 烯氧化物、聚偏二氟乙烯以及其混合物的其中任何一個 。該固態離聚物電解質為層狀雙氫氧化物、離子傳導玻 璃、傳導陶瓷以及其混合物的其中任何一個,以及該介 電材料為鋰離子傳導介電材料、銀離子傳導介電材料、 099134645 表單編號A0101 第9頁/共66頁 1003059622-0 201120917 鈉離子傳導介電㈣、氧料傳導介電材_及其結合 的其中任何一個。該鋰離子傳導介電材料可具有分子式 (.,Μ)Τι〇3,其中,μ為La、Ce、Pr、Nd以及其結合的 其中任何一個。該鋰離子傳導介電材料亦可具有分子式 1^04,其中1為選自(:〇、心、1^11、(^、^1或 其結合所組成群組的暫態金屬。該介電材料可包括⑴專 (Li conducting beta-alumina) 〇 該銀離子傳導介電材料可她1、“2Te、、AgSBr 、岭3以、RbAg4I5、KAg4I5、NH4Ag4l5、Ki xCsX Ag4I5(^tO<x<l) ^Steam down for 1 hour to about 24 hours. The invention is also related to a synthetic material comprising a dielectric material for producing a bismuth BBL effect, and an electrolyte, wherein the electrolyte is any one of an ionomer electrolyte, a solid proton electrolyte, and a mixture thereof. The ionomer electrolyte is tetrafluoroethylene·perfluoro_3 6 —dioxa-4-methyl-7-octene sulfate copolymer, poly(ethylene conjugated acrylic acid, polyethylene oxide, polyvinylidene fluoride) And any one of the mixtures thereof. The solid ionomer electrolyte is any one of a layered double hydroxide, an ion conductive glass, a conductive ceramic, and a mixture thereof, and the dielectric material is a lithium ion conductive dielectric material, silver Ion Conductive Dielectric Material, 099134645 Form No. A0101 Page 9 / Total 66 Page 1003059622-0 201120917 Sodium ion conducting dielectric (IV), oxygen conducting dielectric material _ and any combination thereof. The lithium ion conducting dielectric material It may have a molecular formula (., Μ) Τι〇3, wherein μ is any one of La, Ce, Pr, Nd, and a combination thereof. The lithium ion conductive dielectric material may also have a molecular formula of 1^04, wherein 1 is selected a transient metal from a group consisting of: 〇, heart, 1^11, (^, ^1, or a combination thereof. The dielectric material may include (1) Li conducting beta-alumina 银 the silver ion conducting dielectric Material can be her 1, "2Te, AgSBr, Ling 3, RbAg4I5, KAg4I5, NH4Ag4l5, Ki xCsX Ag4I5(^tO<x<l) ^

CsAg4ClBr2I2、(其中〇&lt;χ&lt;ι)、 Ag6I4WG4£&lt;及其混合物的其巾任何—個。袖離子傳導 介電材料可為Nan、Na2S、N&quot;_氧化銘以及其混合物 的其中任何一個。該氧離子傳導介電材料可為 Bl2(MeyVh)〇6_x(其中Me為Cu、Co、Zn、Ge、Ca、Sr 、Ni、Fe、Mn、Mg*其結合的其中任贫”個)、 Bl2(Cu0· ^〇. 9)〇6.x ' (l-x)CaO-xA〇2(^ t A4Zr . Hf 、Th、Ce或其結合的其中任何一個)、〇鳥〇 〇他〇 、u4V3-o.mrV (卜χ)βΛ_,ν其中 、Sm'Υ、Yb、Sc、Ga或其結合的其中任何—個其中 ,0〈χ〈1)的其中任何_個。 099134645 本發明更進一步相關於—種合成材料包括用於產生 腿效應的介電材料,以及位於該介電材料的晶粒邊界 處的電化學雜射4,其中該介㈣料為-離子傳導介 電材質,例如雜子料介㈣料、絲子料介電材 料、鈉離子料介電材料、氧離子傳導介騎料以及直 表單編號删1 第10頁/共66頁 '、 1003059622-0 201120917CsAg4ClBr2I2 (wherein 〇&lt;χ&lt;ι), Ag6I4WG4£&lt;&gt; The sleeve ion-conducting dielectric material can be any of Nan, Na2S, N&quot;_oxidation and mixtures thereof. The oxygen ion conductive dielectric material may be B2(MeyVh)〇6_x (where Me is Cu, Co, Zn, Ge, Ca, Sr, Ni, Fe, Mn, Mg*, and any combination thereof), Bl2 (Cu0·^〇. 9)〇6.x ' (lx)CaO-xA〇2(^ t A4Zr . Hf , Th, Ce or any combination thereof), ostrich 〇〇 〇, u4V3-o .mrV (dipole) βΛ_, ν where, Sm'Υ, Yb, Sc, Ga or any combination thereof, wherein any of 0 < χ <1) _ 099134645 The present invention is further related to - The composite material includes a dielectric material for generating a leg effect, and an electrochemical dopant 4 at a grain boundary of the dielectric material, wherein the dielectric material is an ion conductive dielectric material, such as a hetero-substrate (4) Material, silk material dielectric material, sodium ion material dielectric material, oxygen ion conduction medium riding material and straight form number deletion 1 Page 10 / 66 pages ', 1003059622-0 201120917

混合物。該鋰離子傳導介電材料可為(Li M)Ti〇 (其中M 3 為La、Ce、Pr、Nd以及其結合的其中任何一個)、mixture. The lithium ion conductive dielectric material may be (Li M)Ti〇 (wherein M 3 is any one of La, Ce, Pr, Nd, and combinations thereof),

LiM〇4(其中Μ為Co、Mn、Fe、Ni ' Cu、Cr、V或其結合 的其中任何一個)、Li傳導beta型氧化鋁(U conLiM〇4 (wherein Μ is any one of Co, Mn, Fe, Ni'Cu, Cr, V or a combination thereof), Li-conducting beta-type alumina (U con

ducting beta-alumina) , 以及(Li , M)Ti〇3 、 UMO 與Li傳導beta型氧化紹的混合物。該Ag+傳導介電材料為Ducting beta-alumina), and a mixture of (Li, M)Ti〇3, UMO and Li-conducting beta-oxidized. The Ag+ conductive dielectric material is

Agl、Ag2Te、Ag2Se、AgSBr、Ag SI、RbAg I、 KAg4I5、NH4Ag4I5、Kl xCsxAg4I5(其中 0&lt;x&lt;;1)、Agl, Ag2Te, Ag2Se, AgSBr, Ag SI, RbAg I, KAg4I5, NH4Ag4I5, Kl xCsxAg4I5 (where 00&lt;x&lt;;1),

RblxCsxAg4I5(其中 〇&lt;x〈i)、CsAg4clB i 、 2 2RblxCsxAg4I5 (where 〇&lt;x<i), CsAg4clB i , 2 2

CsAg4Br^xI2+x(其中0&lt;x&lt;1) v Ag614W〇4以及其混合物 的其中任何一個,Na+傳導介電材料為NaC1、Na/、Na 卢-氧化銘以及其混合物的其中任何—個,〇2-傳導介電 材料為Bi2(Mey'-y)06-x(其中Me為cu、Co、Zn、Ge、Any one of CsAg4Br^xI2+x (where 00&lt;x&lt;1) v Ag614W〇4 and a mixture thereof, the Na+ conductive dielectric material is any one of NaC1, Na/, Na Lu-Oxide, and a mixture thereof, 〇2-conductive dielectric material is Bi2(Mey'-y)06-x (where Me is cu, Co, Zn, Ge,

Ca、Sr、Ni、Fe、Μη、Mg或其結合的其中任何一個)、Any of Ca, Sr, Ni, Fe, Μη, Mg, or a combination thereof,

Bl2(CViV〇.9)06-x、(卜x)ca〇_xA〇2(其中A為Zr、Hf 、Th、Ce或其結合的其中任何一個)、Bl2(CViV〇.9)06-x, (b x)ca〇_xA〇2 (where A is any one of Zr, Hf, Th, Ce or a combination thereof),

0. 2CaO-0. 8Zr〇2、〇. 04Υ2〇Γ〇. 92Zr〇2、(1_χ)Β 〇 _ xZr〇2(其中Β為La、Sm、Υ、Yb、St;、Ga或其結合的任 何一個,其中0&lt;X&lt;1)的其中任何一個。該電化學活性材 料為AU〇H)3、Mg(0H)2、Ca(〇H)2、Sr(0H)2、 Ba(0H)2Ni(0H)2、Co(〇H)2、Li/、Ν〜〇、:2〇、分子 式[Μ 1χΜ χ(0Η)2]χ+[Αζ—χ/ζ·ηΗ2〇]Χ-的層狀雙氫氧 化物(其中 0. 1 SxSO. 5,1&lt;ζ&lt;3,以及2$η$4,M2 +為 Mg、Ni、Zn、Co、Fe、Ca、Mn以及其結合,M3 +為A卜 Fe、Cr、Mn以及其結合的其中任何一個,A為c〇 2_、 S〇4 、〇H、Cl以及其結合的其中任何一個)以及分子 099134645 表單編號A0101 第頁/共66頁 1003059622-0 201120917 式[Μ' Μ3+ (0Η) + 壯雜 ΛΧ X 2 [A (2χ—1)/ζ.ηΗ2〇Γ-的層 狀又虱乳化物(其中A4C0广、气2' 〇h—、C厂以及 其結合的其令任何一個,心客4,0.29客0.4; Kz&lt;3 ^為L!、Na、K'Ag以及其結合的其中任何_個 ’以及為A1、Fe、rr、M 、,0. 2CaO-0. 8Zr〇2, 〇. 04Υ2〇Γ〇. 92Zr〇2, (1_χ)Β 〇_ xZr〇2 (wherein Β is La, Sm, Υ, Yb, St; Ga or a combination thereof Any one of them, where 0 &lt;X&lt;1). The electrochemically active material is AU〇H)3, Mg(0H)2, Ca(〇H)2, Sr(0H)2, Ba(0H)2Ni(0H)2, Co(〇H)2, Li/ , Ν~〇,: 2〇, molecular formula [Μ 1χΜ χ(0Η)2]χ+[Αζ—χ/ζ·ηΗ2〇]Χ-layered double hydroxide (0. 1 SxSO. 5,1&lt;;ζ&lt;3, and 2$η$4, M2 + is Mg, Ni, Zn, Co, Fe, Ca, Mn, and combinations thereof, and M3 + is any one of A, Fe, Cr, Mn, and combinations thereof, A Is any of c〇2_, S〇4, 〇H, Cl, and combinations thereof) and numerator 099134645 Form No. A0101 Page/Total 66 Page 1003059622-0 201120917 Type [Μ' Μ3+ (0Η) + Zhuang Miscellaneous X 2 [A (2χ-1)/ζ.ηΗ2〇Γ- layered and 虱 emulsion (where A4C0 wide, gas 2' 〇h-, C factory and its combination of any one, heart 4, 0.29 Guest 0.4; Kz&lt;3^ is L!, Na, K'Ag, and any combination of them, and is A1, Fe, rr, M,

Cr Mn以及其結合)的其中任何一 個。 本發明亦相關於-種合成材料,包括用於產生⑽以 應的已質子化介電質,以及位於該已質子化介電質的曰 粒邊界處的電化料性㈣,其中,《化學活性材: 為分子式[M2+ M3+ (OH) 1χ+Γλζ~ v 1-χ χ_2]χ/ζ·ηΗ20]χ-的層狀 乳化物(其中 G. 1 ,1&lt;ζ&lt;3,M、Mg、Ni 、Zn、Co、Fe、Ca、Mn以及其結合的其中任何一個, = 'Μη以及其結合的其中任何一個,八為 C〇3 S〇4、〇H、C1以及其結合的其中任何一個, 以及2 η 4),以及分子式 (2 x -1 ) + j- z W -(2x_1)/z · nH2〇]x—的層狀 、Cl-以及其 —x ^ 〇· 4 &gt; 1 &lt;z&lt;3 [M + i-xM3+x(〇H\ 雙氫氧化物(其中AACO厂、SO 結合的其中任何一個, ^ xt y z 〇- 〇 +h δ 下,其中,H為併入_氧位置的一質子以及 號 Afnm ^ 10 ^ 第12頁/共66頁 3+為Li Na、κ、Ag以及其結合的其中任何一個,以及 為Fe Cr、Μη以及其結合的其中任何一個)的任 何-個。該已質子化介電質為已摻闕鈦礦、未推_ 鈦礦已摻雜n未摻雜鎢青銅、已摻雜焦綠石、 未摻雜焦綠石、層狀触礦、以及具有大或更多的 介電係數的氧化物的其中任何,該触鑛在分子式[(『 &gt;1-X(A )X](M ),_y_z(B^ )y(c» )2]〇3_δ+Η(ν〇)δ(Η 099134645 ^2h 表單編號A0101 201120917 0. 00&lt;hS (5 SO. 5x + 0. 5y + z,其中,0. 0SxS0.4, 0.00^b^0.99 » 0.00^y^0.40 » O.OO^z 0.40, M’為Ba、Mg、Ca、Sr、Pb以及其混合物的其中任何一個 ,A,為K、Na、Li、Ag以及其混合物的其中任何一個, Μ ' 為Ti、Zr、Hf、Ce、Sn、(Mg1/3, Nb2/3)、 (Zn1/3,Nb2/3) 、(Sc1/2,Ta1/2)以及其混合物的其中任 何一個,B 為Sc、A1、Y、La ' Fe、Yb ' Ho ' Tm ' Sb 、Sm、Nd、Gd、Er、Pr、Mo、Dy以及其混合物的其中任 何一個,以及C' 為V、Μη、Cr、Fe、Ni、Cu、Zn、Ca、 Mg以及其混合物的其中任何一個,以及(VO) e代表氧空 Ο 缺。 本發明更進一步相關於一種採用在此所揭示之介電材 料的能量儲存裝置,例如,電容器以及電池,當該儲存 裝置為電容器時,該電容器包括用於產生IBBL效應的介 電材料,以及金屬電極,該金屬電極使用如Cu、Al、Au 、Ag、Ni、Co、Fe、Cr、Pt^Pd及其合金,以及其混合 物的金屬,至少一金屬電極具有與該介電材料中的一離 子種類一起的電化學活性,以致能偽電容產生。 本發明亦相關於一種採用如在此所揭示者的其中任何 之一之介電材料的能量產生裝置,該裝置可為一燃料電 池。 【實施方式】 [0005] 可用於製造離子傳導介電質的陶瓷介電材料 用於可展現IBBL效應之離子傳導介電材料的製造的 材料包括,但不限於,質子傳導介電材料,鋰離子傳導 介電材料,銀離子傳導介電材料,鈉離子傳導介電材料 099134645 表單編號 A0101 第 13 頁/共 66 頁 1003059622-0 201120917 ,以及氧離子傳導介電材料及其結合。鋰離子傳導介電 材料可包括,但不限於,分子式為(Li,M)Ti〇3的鑭系元 素摻雜LiTi〇3,其中Μ為La、Ce、Pr、Nd及其結合的其 中任一。分子式LiM〇4的Li過渡金屬氧化物,其中M為如 Co ' Mn、Fe、Ni、Cu、Cr、V及其結合的過渡金屬,以 及Li傳導beta型氧化銘(Li conducting beta-alumina)。可使用的銀離子傳導介電材料包括,但不限 於’如Agl、Ag2Te、Ag2Se、AgSBr、Ag3SI 的齒化物以 及硫化物(chalgogenides),碘化銀铷形式的化合物 ’例如 ’ —Ms、 其中 0&lt;χ&lt;1)、Rbl xCsxAg4I5(其中,〇〈χ&lt;1)、Any of Cr Mn and its combination). The invention is also related to a synthetic material, including a protonated dielectric for producing (10), and an electrochemical material at the boundary of the protonated dielectric (4), wherein Material: a layered emulsion of the formula [M2+ M3+ (OH) 1χ+Γλζ~ v 1-χ χ_2]χ/ζ·ηΗ20]χ- (where G. 1 , 1 &lt; ζ &lt; 3, M, Mg, Ni Any one of Zn, Co, Fe, Ca, Mn, and combinations thereof, = 'Μη and any combination thereof, and eight are any of C〇3 S〇4, 〇H, C1, and combinations thereof, And 2 η 4), and a layer of the formula (2 x -1 ) + j - z W - (2x_1) / z · nH2 〇] x -, Cl - and its - x ^ 〇 · 4 &gt; 1 &lt;z&lt;3 [M + i-xM3+x (〇H\ double hydroxide (where AACO plant, SO combined any of them, ^ xt yz 〇- 〇+h δ , where H is incorporated _ oxygen a proton of position and the number Afnm ^ 10 ^ page 12 / page 66 3 + is any of Li Na, κ, Ag, and combinations thereof, and any of Fe Cr, Μη, and combinations thereof - The protonated The electric quantity is bismuth-doped ilmenite, unpush- ilmenite has been doped n undoped tungsten bronze, doped pyrochlore, undoped pyrochlore, layered catenary, and has large or more Any of the oxides of the dielectric coefficient, the contact is in the formula [(『 &gt;1-X(A )X](M ), _y_z(B^ )y(c» )2]〇3_δ+Η(ν 〇)δ(Η 099134645^2h Form number A0101 201120917 0. 00&lt;hS (5 SO. 5x + 0. 5y + z, where 0. 0SxS0.4, 0.00^b^0.99 » 0.00^y^0.40 » O .OO^z 0.40, M' is any one of Ba, Mg, Ca, Sr, Pb and a mixture thereof, A, any of K, Na, Li, Ag, and a mixture thereof, Μ ' is Ti, Zr Any one of Hf, Ce, Sn, (Mg1/3, Nb2/3), (Zn1/3, Nb2/3), (Sc1/2, Ta1/2), and a mixture thereof, B is Sc, A1 Any of Y, La 'Fe, Yb ' Ho ' Tm ' Sb , Sm, Nd, Gd, Er, Pr, Mo, Dy, and mixtures thereof, and C' is V, Μη, Cr, Fe, Ni, Cu Any of Zn, Ca, Mg, and mixtures thereof, and (VO)e represents oxygen vacancies. The invention further relates to an energy storage device employing the dielectric material disclosed herein, such as a capacitor and a battery, the capacitor including a dielectric material for generating an IBBL effect, and a metal when the storage device is a capacitor An electrode using a metal such as Cu, Al, Au, Ag, Ni, Co, Fe, Cr, Pt^Pd and alloys thereof, and a mixture thereof, at least one metal electrode having an ion in the dielectric material The electrochemical activity of the species together is such that pseudo-capacitance can be generated. The invention is also related to an energy generating device employing a dielectric material of any of the ones disclosed herein, which may be a fuel cell. [Embodiment] [0005] Ceramic dielectric materials that can be used to fabricate ion-conducting dielectrics Materials for the fabrication of ion-conducting dielectric materials that exhibit IBBL effects include, but are not limited to, proton-conducting dielectric materials, lithium ions Conductive dielectric material, silver ion conductive dielectric material, sodium ion conductive dielectric material 099134645 Form No. A0101 Page 13 of 66 1003059622-0 201120917, and oxygen ion conductive dielectric materials and combinations thereof. The lithium ion conductive dielectric material may include, but is not limited to, a lanthanide doped LiTi〇3 having a molecular formula of (Li,M)Ti〇3, wherein lanthanum is any one of La, Ce, Pr, Nd, and combinations thereof. . Li transition metal oxide of the formula LiM〇4, wherein M is a transition metal such as Co ' Mn, Fe, Ni, Cu, Cr, V and a combination thereof, and Li conducting beta-alumina. Silver ion conductive dielectric materials that can be used include, but are not limited to, 'such as Agl, Ag2Te, Ag2Se, AgSBr, Ag3SI, and sulfides (chalgogenides), compounds in the form of silver iodide, such as 'Ms, where 0 &lt; χ &lt;;1), Rbl xCsxAg4I5 (where 〇<χ&lt;1),

CsAg4ClBr2I2、(:SAg4Brl xI2+x(其中0&lt;χ&lt;1)、鎢酸 硤化銀(silver iodide tungstate) Ag6I4W〇4及其 混合物。可使用的鈉離子傳導介電材料包括,但不限於 ,如NaCl、Na2S、beta型氧化鋁Na氧化鋁(beta aluminas Na沒-Alumiria)以及其混合物的鹵化物以 及硫化物,可使用的軋離子铢導介電枯料包括,但不限 於’具有-般分子式Bi2(MeyU〜^BiMeV〇x家族( 其中Me為金屬陽離子,例如,Cu、c〇、Zn、Ge、“、 、Ni、Fe、Mn、Mg或其結合,並且〇&lt;y&lt;〇 5,例如,CsAg4ClBr2I2, (:SAg4Brl xI2+x (where 00&lt;χ&lt;1), silver iodide tungstate Ag6I4W〇4, and mixtures thereof. Sodium ion conductive dielectric materials that can be used include, but are not limited to, NaCl, Na2S, beta-alumina, aluminum oxide (beta aluminas Na-Alumiria), and mixtures thereof, halides and sulfides, which can be used to include, but are not limited to, 'having a general formula Bi2 (MeyU~^BiMeV〇x family (where Me is a metal cation such as Cu, c〇, Zn, Ge, ", , Ni, Fe, Mn, Mg or a combination thereof, and 〇&lt;y&lt;〇5, E.g,

Bi2(Cu〇9)〇6 x)、缺陷穩定氟石(defect 一 bilized fluorites)(例如(卜 x)Ca〇_xA〇2,其中 A 為 099134645Bi2(Cu〇9)〇6 x), defect-filled fluorites (eg, (b x)Ca〇_xA〇2, where A is 099134645

Zr、Hf ' Th、Ce或其結合’且〇&lt;χ〈卜例如, 0.2CaO-0.8Zr〇2),以及分子式為(卜χ)ΒΛ Zr〇的 已摻雜氧化錯(其中B為La、Sm、γ、Yb、Sc、GXa、』其 結合,且0&lt;x&lt;l,例如,〇.04Y2〇3_〇 92Zr()p。 表早編號A0101 第14頁/共66頁 ' 1003059622-0 201120917 可用於製造H+傳導介電質的㈣介電㈣Zr, Hf 'Th, Ce or a combination thereof' and 〇 &lt; χ < 卜, for example, 0.2CaO-0.8Zr 〇 2), and the doped oxidization error of the formula (dip) ΒΛ Zr ( (where B is La , Sm, γ, Yb, Sc, GXa, 』 combinations thereof, and 0 &lt;x&lt;l, for example, 〇.04Y2〇3_〇92Zr()p. Table early number A0101 Page 14 of 66 '1003059622- 0 201120917 (4) Dielectrics that can be used to fabricate H+ conductive dielectrics (4)

燒結陶竟介電質,例如,受體摻雜的喊介電材料 ,可以被用於製造展現PBBL效應㈣子化介電材料。燒 結陶究介電材料’例如’當單獨於電化學活性晶粒邊界 材料使用時,其可作用為電容器,以及可達至大約100 J/CC或更多的能量密度’可用於製造展現_效應之介 電材質的受體摻雜喊介電材料包括,但不限於,具有 約鈦礦型結構、鶴青銅型結構、焦綠石型結構、触礦 層型結構及其混合物的任何一考。 可使用之具有鈣鈦礦型結構的陶瓷材料的例子包括 ’但不限於’ BaTi03、已摻雜BaTi〇3、BaZr〇3、已摻雜 BaZr〇3、PbTi〇3、已摻雜PbTi〇3、mr〇3、已摻雜 PbZr〇3 ' SrTi〇3、已摻雜㈤^、SrZr〇3、已摻雜 SrZr〇3、CaZr〇3、已摻雜CaZr〇3、BiSc〇3、已摻雜 BiSc〇3及其混合物。Sintered ceramic dielectrics, for example, acceptor-doped shattering dielectric materials, can be used to fabricate PBBL-effect (tetra) dielectric materials. Sintered ceramic dielectric materials 'eg, when used alone in electrochemically active grain boundary materials, can act as capacitors, and energy densities up to about 100 J/CC or more' can be used to create exhibits. The receptor-doped dielectric material of the dielectric material includes, but is not limited to, any one having a smectite type structure, a crane bronze type structure, a pyrochlore type structure, a striking layer type structure, and a mixture thereof. Examples of ceramic materials having a perovskite structure that can be used include, but are not limited to, BaTiO3, doped BaTi〇3, BaZr〇3, doped BaZr〇3, PbTi〇3, doped PbTi〇3 , mr〇3, doped PbZr〇3 'SrTi〇3, doped (5)^, SrZr〇3, doped SrZr〇3, CaZr〇3, doped CaZr〇3, BiSc〇3, doped Heterobi BiSc〇3 and mixtures thereof.

可使用之具有鶴青銅型結構的陶瓷材料的例子包括 ,但不限於,(Si^Ba^ x)Nb2〇6(其中〇&lt;χ&lt;1)、 (SrxBai-x)Ta206(其中〇&lt;Χ&lt;1) 、PbNb206、PbTa206、Examples of the ceramic material having a crane bronze type structure which can be used include, but are not limited to, (Si^Ba^x)Nb2〇6 (wherein 〇&lt;χ&lt;1), (SrxBai-x)Ta206 (where 〇&lt;Χ&lt;1), PbNb206, PbTa206,

LiBa2Nb50i5、Ba2Na3YNb1〇〇3〇、Na3Ba3ff3Nb9〇3◦及其 混合物。 可使用之具有鎢青銅型結構的陶瓷材料的例子包括 ,但不限於,La2Zr2〇7、Bi2(Zn1/3Nb2/3)207、LiBa2Nb50i5, Ba2Na3YNb1〇〇3〇, Na3Ba3ff3Nb9〇3◦ and mixtures thereof. Examples of ceramic materials having a tungsten bronze type structure that can be used include, but are not limited to, La2Zr2〇7, Bi2(Zn1/3Nb2/3)207,

Cd2Nb2〇7、Bi2(Zn4/3Ta2/3)〇6及其混合物。 可使用之具有鎢青銅型結構的陶瓷材料的例子包括 ,但不限於,Bi4Ti3〇i2'Sr2Bi4Ti5〇18、Bi2SrTa2〇9 、Bi2Cu〇 9〇6 χ(其中χ~5.35)及其混合物。 099134645 表單編號Α0101 第15頁/共66頁 1003059622-0 201120917 入當已摻雜鈣鈦礦材料被使用作為可展現PBBL效應的 &quot;電材料時,質子化鈣鈦礦材料可包括質子化 Ba(Zr〇 8Y〇.2)〇3、質子化Cd2Nb2〇7, Bi2(Zn4/3Ta2/3)〇6 and mixtures thereof. Examples of ceramic materials having a tungsten bronze type structure which can be used include, but are not limited to, Bi4Ti3〇i2'Sr2Bi4Ti5〇18, Bi2SrTa2〇9, Bi2Cu〇9〇6 χ (where χ~5.35) and mixtures thereof. 099134645 Form No. Α0101 Page 15 of 66 1003059622-0 201120917 When a doped perovskite material is used as an electric material that exhibits a PBBL effect, the protonated perovskite material may include protonated Ba ( Zr〇8Y〇.2)〇3, protonation

Ba((Zr Τί 、 〇 、λBa((Zr Τί , 〇 , λ

HsiS.sPo./Co.pOg,以及其混合物。 當已摻雜鈣鈦礦被用於製造質子化鈣鈦礦時,該已 摻_欽礦具有通式⑴,[(M,)h(A,)x][(M,, VC”)ζ]03-δ(ν〇νΐ),其中〇.0‘x‘ °·4 5 〇.〇〇^b^0.99 &gt; 0.00^y^0.40 . 0.〇〇^z^ 〇· 4〇,M 為Ba、Mg、Ca、Sr、Pb及其混合物,A·為κ、 Na、Li、Ag及其混合物,M,,為Ti、Zf、Hf、Ce、%、 (Mgi/3,Nb2/3)、(Zn1/3,Nb2/3)、(Sc1/2,Tai/2)及 其混合物,B,,為Sc、A卜 Y、La、Fe、Yb‘、Ho、Tm、HsiS.sPo./Co.pOg, and mixtures thereof. When the doped perovskite is used to produce a protonated perovskite, the already-doped state has the general formula (1), [(M,)h(A,)x][(M,, VC")ζ ]03-δ(ν〇νΐ), where 〇.0'x' °·4 5 〇.〇〇^b^0.99 &gt; 0.00^y^0.40 . 0.〇〇^z^ 〇· 4〇,M As Ba, Mg, Ca, Sr, Pb and mixtures thereof, A· is κ, Na, Li, Ag and mixtures thereof, M, is Ti, Zf, Hf, Ce, %, (Mgi/3, Nb2/3 ), (Zn1/3, Nb2/3), (Sc1/2, Tai/2) and mixtures thereof, B, are Sc, A, Y, La, Fe, Yb', Ho, Tm,

Sb、Sm、Nd、Gd、Er、Pr、Mo、Dy及其混合物。以及 (&quot;為V,Μη ’ Cr ’ Fe ’ Ni ’ Cu,Zn ’ Ca,Mg,以及其 混合物’在已摻雜介電質中的氡空缺(¥〇) 5的量會使得 &lt;5 SO. 5x + 0. 5y + z,分子式(I )的已摻雜介電質在質子 化後會具有通式(ΙΑ) (Ιϋ)[(Μ,(A,)](M” )卜y-z(B”)y(C” )2h,其中,符 號與分子式(I)中的意義相同,Η*是結合在氧位(oxy__ gen site)的質子,且〇. 〇〇&lt;h$ 6 SO. 5x + 0. 5y + z, 0.0^x^0.4 » 0.00^b^0.99 &gt; O.OO^y^O.40, 0. OOSzSO. 40。 IBBL效應 IBBL效應,例如,PBBL效應,可藉由於電場下運送 如質子的離子而產生,以在抗性晶粒邊界處累積,而產 生一有效電容而達成,如在第1圖中所示意顯示者。在第 099134645 表單編號A0101 第16頁/共66頁 1003059622-0 201120917 1圖中所顯示的籍他程序相關於藉由在偏壓下的質子運送 而於晶粒邊界處累積質子。相對地’利用電子以及電洞 作為主要電荷攜帶者的多晶陶瓷中的有效電容通常是以 在BaTi〇3為基礎的材料中約1〇5Hz與以在SrTi〇為基礎 ό 的材料中約1〇6Ηζ的較高頻率鬆弛作為表示。如PBBL效應 的IBBL效應可藉由已知的技術進行測量,例如,阻抗頻 譜,循環伏特安培法,定電流充/放電法,極化場(充電 以及放電)’漏電流量測,以及在超過大約-5(TC至大約Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy and mixtures thereof. And (&quot;V, Μη 'Cr 'Fe 'Ni 'Cu, Zn ' Ca, Mg, and mixtures thereof, the amount of 氡 vacancy (¥ 〇) 5 in the doped dielectric would cause &lt;5 SO. 5x + 0. 5y + z, the doped dielectric of the formula (I) will have the general formula (ΙΑ) (Ιϋ)[(Μ,(A,)](M") 卜z after protonation (B") y(C") 2h, wherein the symbol has the same meaning as in the formula (I), Η* is a proton bound to the oxy__gen site, and 〇. 〇〇&lt;h$ 6 SO 5x + 0. 5y + z, 0.0^x^0.4 » 0.00^b^0.99 &gt; O.OO^y^O.40, 0. OOSzSO. 40. IBBL effect IBBL effect, for example, PBBL effect, can be borrowed This is due to the fact that ions such as protons are transported under an electric field to accumulate at the boundaries of the resistant grains, resulting in an effective capacitance, as shown in Figure 1. At 099134645, Form No. A0101, page 16 / A total of 66 pages 1003059622-0 201120917 1 The program shown in the figure is related to the accumulation of protons at the grain boundaries by proton transport under bias. Relatively 'using electrons and holes as the main charge carriers Polycrystalline The effective capacitance in ceramics is usually expressed by a higher frequency relaxation of about 1 〇 5 Hz in a BaTi 〇 3 based material and about 1 〇 6 以 in a SrTi 〇 based material. The IBBL effect such as the PBBL effect. Measurements can be made by known techniques, such as impedance spectroscopy, cyclic voltammetry, constant current charge/discharge, polarization field (charge and discharge) 'leakage current measurements, and above about -5 (TC to about

65 C軒*圍的溫度的介電崩潰強度。 使用可展現1BBL鍊應(例如,PBBL·效應)的離子傳 導材料的能量儲存裝置的能量儲存電位可藉由變化介電 晶粒的晶粒組成、晶粒邊界型態、以及晶粒尺寸而控制 。晶粒組成可以藉由變化受體掺質的濃度、及/或合併一 、或多個少量摻質(例如’電子受體種_,例如,但不 限於,Mn、Cr、Fe、Ni,以及施體種類,例如,但不限 於,Nb、La、Y、Dy以及Nd)而控制。The dielectric breakdown strength of the 65 C Xuan* temperature. The energy storage potential of an energy storage device using an ion conducting material that exhibits a 1BBL chain (eg, PBBL effect) can be controlled by varying the grain composition, grain boundary pattern, and grain size of the dielectric grains. . The grain composition can be varied by varying the concentration of the acceptor dopant, and/or combining one or more minor dopants (eg, 'electron acceptor species', such as, but not limited to, Mn, Cr, Fe, Ni, and The type of donor, such as, but not limited to, Nb, La, Y, Dy, and Nd) is controlled.

當離子傳導材料為u +型態傳導材料(例如, (Li,La)Ti〇3、LiCo〇4以及LiMn2〇4的其中任一或多個 )時,晶粒組成可藉由變化受體摻質(例如,電子受體 種類,例如,但不限於,在B位置上的託、Cr、Mn、Fe 、Ca、Ni、Cu、Zn、以及施體種類,例如,但不限於, 在A位置上的Mg、Ca、Sr,或是在B位置上的!^、Ta、Mo 、W、Re、Sb)的濃度而控制。 當離子傳導#料為Ag+型態傳導材料蛾化銀物形式化 合物型態材料時,晶粒組成可藉由變化受體摻質(例如 ,取代I的電子受體種類(例如,但不限於,〇、§e、§、 099134645 表單編號A0101 第Π頁/共66頁 1003059622-0 201120917When the ion conductive material is a u + type conductive material (for example, any one or more of (Li, La) Ti〇3, LiCo〇4, and LiMn2〇4), the grain composition can be changed by changing the receptor (eg, electron acceptor species such as, but not limited to, Torr, Cr, Mn, Fe, Ca, Ni, Cu, Zn, and donor species at the B position, such as, but not limited to, at the A position The upper Mg, Ca, Sr, or the concentration of !^, Ta, Mo, W, Re, Sb at the B position is controlled. When the ion conduction material is a compound type material in the form of an Ag+ type conductive material moth silver, the grain composition can be changed by changing the acceptor (for example, the type of electron acceptor that replaces I (for example, but not limited to, 〇,§e,§, 099134645 Form No. A0101 Page/Total 66 Page 1003059622-0 201120917

Te及其結合),以及取代^獅以及其結合的施體種類 (例如,但不限於,Be、Mg、(:a、Sr、Ba、Sc))g 度而控制。 當忒離子傳導材料為Na+型態材料(例如,Na s)時 ,晶粒組成可藉由變化受體摻質(例如,電子受體2種類 ’例如,但不限於,N、P、As、Sb、C、Si及其結合, 以及施體種類,例如,但不限於,Be、Mg、Ca、,以 及其結合)的濃度而控制。 當該離子傳導材料為〇_2型態材料(例如,Te and its combination), as well as the substitution of the lion and its combined type of donor (for example, but not limited to, Be, Mg, (: a, Sr, Ba, Sc)) g degree. When the cerium ion conducting material is a Na+ type material (for example, Na s), the grain composition can be changed by changing the acceptor dopant (for example, the electron acceptor 2 species 'such as, but not limited to, N, P, As, The concentrations of Sb, C, Si, and combinations thereof, as well as the type of donor, such as, but not limited to, Be, Mg, Ca, and combinations thereof, are controlled. When the ion conducting material is a 〇_2 type material (for example,

Bl2(CU〇.lV〇.9)〇5.35)時,晶粒^组成可籍由變化受體摻 質(例如’電子受體種類,例如,但不限於,Mn、Η、 Zn、Sc、Τι、V、Cr、La、Nd、Dy、Ho及其結合,以及 施體種類,例如,但不限於,Nb、Ta、w、M〇,以及其結 合)的?農度而控制。 晶粒邊界型態可以藉由併入掺質而有所改變,而併 入的摻質則是可以在修正大塊晶粒特性乏外,亦修正晶 粒邊界缺陷狀態,進而修正务晶粒备粒介面的運送特 性。這些摻質的例子包括,但不限於,Bi、pb、Zn、Si 、B、Nb、Ta、W、Li、Ca、Mg、Cr、Ni、Μη、A1、P, 以及其結合的氧化物,碳酸鹽,硫酸鹽,硝酸鹽,以及 氫氧化物。 可以藉由變化晶粒尺寸而控制跨越質子化晶粒—晶粒 的運送特性,晶粒尺寸可以藉由使用較高的燒結溫度以 及較長的燒結時間而被增加。燒結輔助(例如,量大約 1% mol至大約8% m〇i的ZnO)可在後鍛燒研磨階段期間 被添加至陶瓷粉末,以使該燒結溫度降低約1〇{rc至約 表單編號A0101 099134645 第18頁/共66頁 201120917 200 C,進而促進於較低溫度下的晶粒生長。 使用電化學活性晶粒邊界材料的IBBL材料的製造 可展現IBBL效應(例如,PBBL效應)的介電質可與 一、或多個電化學活性晶粒邊界材料(例如,電化學活 性晶粒邊界化合物、或電化學活性晶粒邊界組合物)相 混合’或者可以被一、或多個電化學活性晶粒邊界材料 所包覆。離子傳導介電質(例如’質子化介電質)可在 混合物中存在大約1%至大約99. 999%的量,剩餘為電化 學活性晶粒邊界材料。When Bl2(CU〇.lV〇.9)〇5.35), the grain composition can be changed by the accepting receptor (for example, 'electron acceptor species, such as, but not limited to, Mn, Η, Zn, Sc, Τι , V, Cr, La, Nd, Dy, Ho and combinations thereof, and the type of donor, such as, but not limited to, Nb, Ta, w, M〇, and combinations thereof, are controlled by agronomy. The grain boundary pattern can be changed by incorporating the dopant, and the incorporated dopant can correct the bulk grain characteristics and correct the grain boundary defect state. The transport characteristics of the grain interface. Examples of such dopants include, but are not limited to, Bi, pb, Zn, Si, B, Nb, Ta, W, Li, Ca, Mg, Cr, Ni, Tn, A1, P, and oxides thereof, Carbonates, sulfates, nitrates, and hydroxides. The transport characteristics across the protonated grain-grains can be controlled by varying the grain size, which can be increased by using higher sintering temperatures and longer sintering times. Sintering assistance (eg, ZnO in an amount from about 1% mol to about 8% m〇i) can be added to the ceramic powder during the post-calcining grinding stage to reduce the sintering temperature by about 1 〇{rc to about Form No. A0101 099134645 Page 18 of 66 201120917 200 C, which in turn promotes grain growth at lower temperatures. Fabrication of IBBL materials using electrochemically active grain boundary materials can exhibit dielectrics of IBBL effects (eg, PBBL effects) with one or more electrochemically active grain boundary materials (eg, electrochemically active grain boundaries) The compound, or electrochemically active grain boundary composition) may be mixed 'either or may be coated with one or more electrochemically active grain boundary materials. The ionically conductive dielectric (e.g., &apos;protonated dielectric) may be present in the mixture in an amount from about 1% to about 99.999%, with the remainder being an electrochemically active grain boundary material.

當離子傳導介電質(例如,質子化介電質)被一、 或多個電化學活性晶粒邊界化合物、或組合物所包覆時 ,對於離子傳導介電質(例如,質子化介電質)的包覆 可藉由將該介電質浸入金屬鹽前導物溶液中、並接著風 乾該溶液以使鹽類沈澱在該介電質上而達成。接著,所 產生的鹽類包覆介電質被暴露於氫氧溶液中,以將該金 屬鹽轉換為層狀雙氫氧化物(Uyered d(kble hy_ 〇 dr〇Xlde)。包覆的厚度可為大約0.1 nm至大约500 nm ,較佳地是,大約1 nm至大約15〇 nm,更佳地是,大約 50 nm至大約 i5〇nm。 在&quot;電質的表面上的層狀雙氫氧化物的共同沈澱可 於Μ以及Μ的超飽和溶液中執行,超飽和可藉由ρΗ控 制而達成,且反應容器可加熱至大約100。(:,及/或超飽 和可在高溫以及高壓的熱水條件下達成,以氨為基礎的 水解反應’例如,尿素的熱分解,可藉由邱控制而被用 來控制沈3¾, 以致能在介電質上均勻包覆層狀雙氫氧化 099134645 物。因為水解以及PH可藉由將包括適當比例的金屬 表單編號· A0101 第19頁/共66頁 鹽前 1003059622-0 201120917 導物的溶液加熱至80-10(TC之間而進行控制,因此,該 尿素分解會釋放氨,以及增加pH,進而造成金屬氫氧化 物的沈澱。 電化學電荷傳遞反應 電化學活性材料以及質子化介電質間之電荷傳遞反 應开式的反應可產生偽電谷(PSeUd〇CapacitanCe)。 第2C圖以及第6圖中示意地顯示在具有八1(〇11)3晶粒邊界 相之展現PBBL效應的介電質的情形下,電化學機制的功 能性》 使用展現IBBL效應(倒却,效藤)的離子傳導 介電材料的電化學活性晶粒邊界化合物,可在晶粒邊界 形成氫化物,氫氧化物,水合氧化物,或其混合物,並 且可在晶粒邊界處產生偽電容。電化學活性晶粒邊界材 料(例如,可使用的電化學活性晶粒邊界化合物)的例 子包括,但不限於,氫氧化物(例如,A1(〇H)、 3When an ion-conducting dielectric (eg, a protonated dielectric) is coated with one or more electrochemically active grain boundary compounds, or compositions, for ionically conductive dielectrics (eg, protonated dielectrics) The coating can be achieved by immersing the dielectric in a metal salt precursor solution and then air drying the solution to precipitate a salt on the dielectric. Next, the resulting salt-coated dielectric is exposed to a hydrogen-oxygen solution to convert the metal salt into a layered double hydroxide (Uyered d(kble hy_ 〇dr〇Xlde). The thickness of the coating can be It is from about 0.1 nm to about 500 nm, preferably from about 1 nm to about 15 〇 nm, more preferably from about 50 nm to about i5 〇 nm. Layered dihydrogen on the surface of the &quot;electrical substance The coprecipitation of the oxide can be carried out in a supersaturated solution of cerium and lanthanum, supersaturation can be achieved by ρΗ control, and the reaction vessel can be heated to about 100. (:, and/or supersaturated at high temperatures and high pressures Ammonia-based hydrolysis is achieved under hot water conditions. For example, the thermal decomposition of urea can be used to control the sinking by the control of Qiu, so that the layered double hydroxide can be uniformly coated on the dielectric. Because hydrolysis and pH can be controlled by heating a solution containing a suitable ratio of metal form number, A0101, page 19/66, salt before 1003059622-0 201120917, to 80-10 (TC) , the decomposition of urea will release ammonia, and increase the pH, into Precipitation of metal hydroxides. Electrochemical charge transfer reaction Electrochemically active materials and charge transfer reactions between protonated dielectrics can produce pseudo-electric valleys (PSeUd〇CapacitanCe). 2C and 6 The figure schematically shows the function of the electrochemical mechanism in the case of a dielectric exhibiting a PBBL effect with an eight 1 (〇11) 3 grain boundary phase. Using an ion exhibiting an IBBL effect (pour, effect) An electrochemically active grain boundary compound of a conductive dielectric material that forms hydrides, hydroxides, hydrated oxides, or mixtures thereof at grain boundaries and produces pseudocapacitors at grain boundaries. Examples of boundary materials (eg, electrochemically active grain boundary compounds that may be used) include, but are not limited to, hydroxides (eg, A1 (〇H), 3

Mg (OH) 2 ' Ca(0H)2 ' Sr(〇H〇i.:' Ba(0H)|Ni (OH) ' L 2 2Mg (OH) 2 ' Ca(0H)2 ' Sr(〇H〇i.:' Ba(0H)|Ni (OH) ' L 2 2

Co(0H)2及其混合物)、鹼金屬氧化物(例如Li 〇、N 〇 L· L· 、K2〇及其混合物)以及氫氧化物以及鹼金屬氧化物的混 合物,其他可使用的電化學活性晶粒邊界化合物包括, 層狀雙氫氧化物,具有類水滑石結構,以及具有分子式 CM2 + 1_xM3+x(〇H)2]x+[Az-x/z.nH2〇]x-^t0.1^x^ 〇· 5 ; 1&lt;ζ&lt;3 ; Μ 為Mg、Ni、Zn、Co、Fe、Ca、Μη及其 結合;M3 +為A1、Fe、Cr、Μη及其結合,A為C0q2-、 S〇42-、OH、Cl以及其結合,以及2 η 4。層狀雙氫 氧化物的分子式亦可以為 [Μ'_χΜ3+χ(ΟΗ)2](2χ-ι)+[ΑΖ-(2χ_1)/ζ · ηΗ2〇]Χ-,其甲 表單編號Α0101 099134645 1003059622-0 第20頁/共66頁 201120917 Α為陰離子,例如,C〇32-、S〇42—、〇Η—、CT及其結合 ,2$nS4,0.2 χ 0. 4 ; 1&lt;ζ&lt;3,其中M+包括Li、Na 、K、Ag,以及其結合,M3 +為A1、Fe、Cr、Μη及其結合 。較佳地是,該層狀雙氫氧化物為LiAl (〇Η)7 · ηΗ2〇。 展現IBBL效應的離子傳導介電質的製造 展現IBBL效應的Li傳導離子材料(例如, Ο (Li, La)Ti〇3)可以藉由傳統的混合氧化物途徑來製造 ’起始的化學化合物粉末可包括LiJO、La,〇,、以及 Ti〇2,這些粉末可藉由於乙醇中以適當的莫耳比例(例 如,Li :La:Ti ::0.33: 0.57:1,舉例而言)進行球研磨 而相混合,接著(乾燥的粉末於1150。C鍛燒1〇個小時’ 利用球研磨再次磨碎,壓製成為小球狀,以及於13〇〇°C 燒結4小時。 展現IBBL效應的Ag傳導離子材料(如如’ RbAg4I5 )可以藉由在白金坩鍋中熔化化學計量的Agl以及肋1、Co(0H)2 and mixtures thereof), alkali metal oxides (such as Li 〇, N 〇L·L· , K 2 〇 and mixtures thereof) and mixtures of hydroxides and alkali metal oxides, other useful electrochemical The active grain boundary compound includes a layered double hydroxide having a hydrotalcite-like structure and having the molecular formula CM2 + 1_xM3+x(〇H)2]x+[Az-x/z.nH2〇]x-^t0. 1^x^ 〇· 5 ; 1&lt;ζ&lt;3 ; Μ is Mg, Ni, Zn, Co, Fe, Ca, Μη and their combination; M3 + is A1, Fe, Cr, Μη and their combination, A is C0q2 -, S〇42-, OH, Cl and combinations thereof, and 2 η 4. The molecular formula of the layered double hydroxide may also be [Μ'_χΜ3+χ(ΟΗ)2](2χ-ι)+[ΑΖ-(2χ_1)/ζ·ηΗ2〇]Χ-, its form number Α0101 099134645 1003059622 -0 Page 20 of 66 201120917 Α is an anion, for example, C〇32-, S〇42—, 〇Η—, CT and its combination, 2$nS4, 0.2 χ 0. 4 ; 1&lt;ζ&lt;3 Wherein M+ comprises Li, Na, K, Ag, and combinations thereof, and M3+ is A1, Fe, Cr, Μη, and combinations thereof. Preferably, the layered double hydroxide is LiAl(〇Η)7·ηΗ2〇. Manufacture of ion-conducting dielectrics exhibiting IBBL effect Li-conducting ionic materials exhibiting IBBL effect (for example, Ο(Li, La)Ti〇3) can be fabricated from conventional mixed oxide pathways as 'initial chemical compound powders LiJO, La, yttrium, and Ti 〇 2 may be included, and these powders may be ball-milled by a suitable molar ratio in ethanol (for example, Li:La:Ti::0.33:0.57:1, for example) The phases were mixed, and then (the dried powder was calcined at 1150 ° C for 1 hour), again ground by ball milling, pressed into pellets, and sintered at 13 ° C for 4 hours. Ag conduction exhibiting IBBL effect Ionic materials (such as 'RbAg4I5) can be melted by stoichiometric Agl and ribs in a white gold crucible.

並接著快速冷卻至室溫而製成,然後,固化的熔化物被 磨碎成為粉末,該粉末可於鋼模中,在大約1〇〇, 〇〇〇 PSI的壓力下,進行約20小時的冷壓製,以形成密集的小 球狀。 展現IBBL效應的Na傳導離子材料(例如,Na-beta氧化 鋁)可以藉由傳統的固態反應法而製造,製造方法是,And then rapidly cooled to room temperature, and then the solidified melt is ground into a powder which can be carried out in a steel mold at a pressure of about 1 Torr, 〇〇〇PSI for about 20 hours. Cold pressed to form dense globules. A Na-conductive ion material exhibiting an IBBL effect (for example, Na-beta aluminum oxide) can be produced by a conventional solid state reaction method by a method of

混合NaCO,以及,以及於高溫(例如,大約1600°C 〇 2 3 )鍛燒粉末,接著利用球研磨降低顆粒尺寸,然後’粉 末可以被形成為小球狀,並進行燒結。 展現IBBL效應的〇2傳導離子材料(例如,The NaCO is mixed, and, at a high temperature (for example, about 1600 ° C 〇 2 3 ), the powder is calcined, followed by ball milling to reduce the particle size, and then the powder can be formed into a small spherical shape and sintered. a 〇2 conducting ionic material exhibiting an IBBL effect (for example,

Bi2(Cu〇 9)〇6 χ,其中0&lt;x&lt;0. 65)可以藉由傳統的 099134645 表單編號A0101 第21買/共66頁 1003059622-0 201120917 口心反應法而製造。化學計量㈣始材料 _5於乙醇中利用球研磨進行混合,乾释的二〇广、 ㈣銷中,在觸以下锻燒㈣小時,·:乳化 乙醇中重新㈣’以使結塊讀,然後料料=在 的經鍛燒齡㈣成為小球狀,並於侧至= c下,燒結約4小時,以形成密集的經燒結體。約_。 展現PBBL效應之離子傳導介電質的製造Bi2(Cu〇 9)〇6 χ, where 0 &lt;x&lt;0. 65) can be manufactured by the conventional 099134645 Form No. A0101 No. 21 Buy/Total 66 Page 1003059622-0 201120917 Core Reaction Method. Stoichiometric (4) starting material _5 mixed in ethanol by ball milling, dry release of Erqiguang, (four) pin, in the following calcination (four) hours, ·: emulsified ethanol in the (four) 'to make the agglomeration read, then The material = tempered at the age of (4) became a small spherical shape, and sintered at a side to = c for about 4 hours to form a dense sintered body. approximately_. Manufacture of ion-conducting dielectrics exhibiting PBBL effect

展現效應的離子傳導介電材料的製造 子化已摻雜或未摻雜介電質(例如已摻雜或未掺雜=貝 '已掺雜或未摻_青鋼 ' 已摻雜或辦雜线石,、 狀賊礦,以及具有介電係數大約5G或更多的氧化物, 較佳地是’分子式為气的已_或未_触確,例 如,鈦酸鋇、未摻雜鈦酸鋇及其混合物)而達成。The fabrication of ion-conducting dielectric materials exhibiting effects of doped or undoped dielectrics (eg, doped or undoped = shelled 'doped or undoped blue steel' has been doped or miscellaneous a boulder, a thief ore, and an oxide having a dielectric constant of about 5 G or more, preferably 'molecular gas' has been or has not been, for example, barium titanate, undoped titanic acid钡 and its mixture).

在使用已摻雜AB〇3鈣鈦礦形式介電氧化物時,氣化 物可利用一、或多個電子受體摻質進行摻雜,以在氣次 晶格上產生空缺,進而補償電子受體摻質的額外負電荷 。較佳地是,對於每個在3位置上的2+肩電子摻質受體種 類產生一個氡空缺,對於每二個在A位置上的丨+價電子受 體摻質產生一個氧空缺,以及對於每二個在6位置上的3 + 價電子摻質受體產生一個氧空缺。電子受體摻質濃度可 達總B位置的大約50%,以及可達總A位置的大約5〇%。用 於AB03的鈦礦中具有價數丨+的a位置陽離子可包括,但不 限於K、Na、Li、Ag及其結合。 .在ABO3鈣鈦礦中的a位置陽離子可包括2 +價數的陽離 子’例如Ba、Mg、Ca、Sr、Pb、Cd、以及其結合。具有 2價數的B位置陽離子包括,但不限於v、Cr、Μη、ρ r 6、 099134645 表單編號Α0101 第22頁/共66頁 1003059622-0 201120917 i Cu、Ζη、Ca、Mg及其結合。在ABO^^欽礦中且有^ + 價數的B位置陽離子包括,但不限於Sc、A1、γ、La、Y*bWhen using a dielectric oxide that has been doped with an AB〇3 perovskite form, the vapor can be doped with one or more electron acceptor dopants to create vacancies in the gas sub-lattice, thereby compensating for electrons The extra negative charge of the bulk dopant. Preferably, a 氡 vacancy is generated for each of the 2+ shoulder electron dopant acceptor species at position 3, and an oxygen vacancy is generated for every two 丨+ valence electron acceptor dopants at the A position, and An oxygen vacancy is generated for every two 3 + valence electron dopant acceptors at position 6. The electron acceptor dopant concentration can be up to about 50% of the total B position and up to about 5% of the total A position. The a-position cation having a valence 丨+ in the titanium ore of AB03 may include, but is not limited to, K, Na, Li, Ag, and combinations thereof. The a-position cation in the ABO3 perovskite may include a 2 + valence cation such as Ba, Mg, Ca, Sr, Pb, Cd, and combinations thereof. B-position cations having a valence number include, but are not limited to, v, Cr, Μη, ρ r 6, 099134645 Form No. 1010101 Page 22 of 66 1003059622-0 201120917 i Cu, Ζη, Ca, Mg, and combinations thereof. The B-position cations in the ABO^^-qin and having the valence of ^ + include, but are not limited to, Sc, A1, γ, La, Y*b

Ho、Tm ' Sb、Sm ' Nd、Gd、Er、Pr、Mo、Dy及其結 13。在AB〇3每欽礦中的B位置陽離子可包括4+價數的陽離 子’例如’但不限於Ti、Zr、Hf、Sn、Ce、Th、Μη、 ΟHo, Tm ' Sb, Sm ' Nd, Gd, Er, Pr, Mo, Dy and their junctions 13 . The B-position cation in AB〇3 per ton may include 4+ valence cations such as, but not limited to, Ti, Zr, Hf, Sn, Ce, Th, Μη, Ο

Ir及平均價數為4 +的多陽離子種類。可使用之多陽離子 種類的例子包括’但不限於(Mgi/3,Nb2/3)、 (2ni/3,Nb2/3)、(Sc1/2,Ta1/2)、(Mgl/2,W&quot;2)及 其結合。 菖分子式ABOg的錄欽礦為BaTi03時’可用來取代a位 置的1 +價電子受體A,摻質的例子包括,但不限於K、Na 、Li、Ag及其結合;可用來取代B位置的3 +價電子受體B ” . 摻質的例子包括,但不限於Sc、A1、Γ、U、I?e、Yb 、Ho、Tm、Sb、Sm、Nd、Gd、Er、Pr、Mo、Dy及其結 合;可用來取代B位置的2 +價電子受體摻質的例子包括, 值不限於V、Cr、Mn、Fe、Ni、Cu、Zn、Ca、Mg及其結Ir and a polycation type with an average valence of 4 +. Examples of polycation species that can be used include, but are not limited to, (Mgi/3, Nb2/3), (2ni/3, Nb2/3), (Sc1/2, Ta1/2), (Mgl/2, W&quot; 2) and its combination. The 钦 菖 菖 菖 A Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba Ba 3 + valence electron acceptor B ”. Examples of dopants include, but are not limited to, Sc, A1, Γ, U, I?e, Yb, Ho, Tm, Sb, Sm, Nd, Gd, Er, Pr, Mo , Dy and combinations thereof; examples of 2 + valence electron acceptor dopants which can be used to replace the B site include, and the values are not limited to V, Cr, Mn, Fe, Ni, Cu, Zn, Ca, Mg, and their junctions.

合。 如介電氧化物的介電質,例如,鈣鈦礦氧化物(例 如,已摻雜鈦酸鋇、或未摻雜鈦酸鋇)可藉由使該介電 質進行水蒸氣加熱處理而質子化,例如,在大約3〇〇&lt;^至 9〇〇 C、大約〇.1 psi至大約1〇〇 psi的蒸汽下約1〇小時 至約24小時。該介電質可被質子化至約〇. 1%至約4〇%, 較佳地是約0. 5%至約20%,更佳地是約1%至約15%,在此 ,所有的量都是以莫耳百分比表示。質子化的程度可藉 由如質量增加 '傳導性改變、以及紅外線光譜的技術進 行測量。 099134645 表單編號A0101 第23頁/共66頁 1003059622-0 201120917 當在AB〇3.鈦礦中A位置被摻雜時,該已質子化、已 摻雜介電質會有分子式(A A’ B0。 )(Η·),其巾 〇. 〇&lt;χ&lt;0· 5,以及其中a’以及η*如分子式ία中被定義, 當在ΑΒ〇3鈣鈦礦中β位置被摻雜時,該已質子化、已摻雜 介電質會有分子式A(B, B” C’ , )0 (Η * 1-y-z y z 3-y-2zv )y + 2z ’ 其中〇. 〇〇&lt;y&lt;〇 4〇,〇 〇〇&lt;z&lt;〇 4〇,以及其中, A、Β、Β’, 、C’,以及H*如分子式IA中被定義。當在 ΑΒ〇3鈣鈦礦中Α位置以及8位置的每一個皆被摻雜時,該 已質子化、已摻雜介電質會有分子式(Αΐ χΑ, x)(Bi-y-zBM yC,J * ^t〇.0&lt;x&lt;〇.4 ’ 〇&lt;y&lt;0. 4 ’ 以及〇· 〇〇&lt;ζ&lt;〇· 40,以及,其中,A、A, 、B、B’ ,以及c’,如分子sIA中被定義。 分子式為(ΙΑ) [(Μ,) (a,)](M”)Hehe. For example, a dielectric of a dielectric oxide, for example, a perovskite oxide (for example, doped barium titanate or undoped barium titanate) can be protonated by subjecting the dielectric to steam heat treatment. For example, at about 3 Torr &lt; ^ to 9 ° C, about 〇1 psi to about 1 psi of steam for about 1 hour to about 24 hours. The dielectric may be protonated to from about 1% to about 4%, preferably from about 0.5% to about 20%, more preferably from about 1% to about 15%, here, all The amount is expressed in terms of the percentage of moles. The degree of protonation can be measured by techniques such as mass increase 'conductivity change, and infrared spectroscopy. 099134645 Form No. A0101 Page 23 of 66 1003059622-0 201120917 When the A position in the AB〇3. titanium ore is doped, the protonated, doped dielectric will have a molecular formula (A A' B0 . ) (Η·), its 〇. 〇&lt;χ&lt;0· 5, and wherein a' and η* are defined as the formula ία, when the β position is doped in the ΑΒ〇3 perovskite, The protonated, doped dielectric has the formula A(B, B" C' , )0 (Η * 1-yz yz 3-y-2zv )y + 2z ' where 〇. 〇〇&lt;y&lt ;〇4〇,〇〇〇&lt;z&lt;〇4〇, and wherein A, Β, Β', C', and H* are defined as in Formula IA. When ΑΒ〇3 perovskite When the position and the 8 positions are each doped, the protonated, doped dielectric has a molecular formula (Αΐ χΑ, x) (Bi-y-zBM yC, J * ^t〇.0&lt;x&lt;lt;;〇.4 ' 〇&lt;y&lt;0. 4 ' and 〇· 〇〇&lt;ζ&lt;〇· 40, and, among them, A, A, B, B', and c', as in the molecular sIA Definition. The formula is (ΙΑ) [(Μ,) (a,)](M")

Vc”)z]WV0MH.)2h 之展現PBBL效應的質子化介電質的製造 用於製造展現PBBL效應的介電材料的介電化合物 ,例如,已摻雜ABO3好鈦礦(例如,β摻雜BaTi〇,已 摻雜BaZr〇3,已摻雜PbTi〇3,已振雜作&amp;〇3,已^雜 SrTi〇3,已摻雜SrZr〇3,已摻雜cazr〇3,以及已摻雜 Bisect的其中任一、或多),其可藉由將起始材料(例 如’ BaC〇3、Ti〇2以及Sc2〇3)於液體(例如,低燒醇, 099134645 例如乙醇或水-氨溶液或其結合)中進行球研磨而形成聚 狀物而製備’典型地’起始材料的純度大約99. 9%、或更 高’以及液體的pH值為大約7至大約14。起始材料(例如 ’純度99. 9%、或更高的氧化物起始材料)可由^贴_ Aidrich取得。襞狀物進行乾燥,並接著於大約8〇〇^至 表單編號A0101 第24頁/共66頁 1003059622-0 201120917 大約1 400 °C下進行鍛燒,較佳地是大約1 000 °C至大約 1 300 °C,更佳地是大約1 250 °C,以形成鈣鈦礦相鈦酸鋇 、及/或已摻雜鈦酸鋇化合物。 接著,該鈣鈦礦相化合物進行球研磨,以產生顆粒 尺寸大約0. 1微米至大約10微米的已研磨粉末,較佳地是 大約0. 1微米至大約5微米,更佳地是大約0. 1微米至大約 1微米。已研磨粉末形成小球,例如,藉由單軸壓法產生 預形成物,該預形成物可再進一步,藉由,例如,均壓 法(iso-static pressing)被進一步壓縮。該預形成 物於空氣中大約1000°C至大約1500°C下進行燒結,較佳 地是大約1050 °C至大約1 500 °C,更佳地是大約1 250 °C 至大約1 500 °C,並持續大約1小時至大約20小時,較佳 地是大約2小時至大約10小時,更佳地是大約2小時至大 約6小時。 或者,已掺雜ABOq鈣鈦礦(例如,已掺雜鈦酸鋇 )可藉由化學方法(例如,藉由從溶液中沈澱)而製備 。在已摻雜AB0Q鈣鈦礦(如已摻雜鈦酸鋇,已摻雜 0Vc")z]WV0MH.) 2h fabrication of protonated dielectric exhibiting PBBL effect. Dielectric compound used to fabricate dielectric materials exhibiting PBBL effects, for example, doped ABO3 goodite (eg, beta doping) Hetero BaTi〇, which has been doped with BaZr〇3, has been doped with PbTi〇3, has been pulverized &amp; 〇3, has been SrTi〇3, has been doped with SrZr〇3, has been doped with cazr〇3, and Any one or more of the doped Bisects, which can be obtained by using a starting material (eg, 'BaC〇3, Ti〇2, and Sc2〇3) in a liquid (eg, low-burning alcohol, 099134645 such as ethanol or water-ammonia) The solution is ball milled to form a polymer to form a 'typically' starting material having a purity of about 99.9% or higher and a liquid having a pH of from about 7 to about 14. Starting material. (For example, an oxide starting material having a purity of 99.9% or higher) can be obtained from Aidrich. The crucible is dried, and then at about 8 〇〇^ to form number A0101, page 24 / total 66 Page 1003059622-0 201120917 calcination at about 1 400 ° C, preferably from about 1 000 ° C to about 1 300 ° C, more preferably large 1微米至约10 The particle size is about 0.1 μm to about 10, and the perovskite phase is formed by ball milling to produce a particle size of about 0.1 μm to about 10 The micron milled powder, preferably from about 0.1 micron to about 5 microns, more preferably from about 0.1 micron to about 1 micron. The ground powder forms pellets, for example, produced by uniaxial pressing. The preform, the preform may be further compressed by, for example, iso-static pressing. The preform is sintered in air at a temperature of from about 1000 ° C to about 1500 ° C, It is preferably from about 1050 ° C to about 1 500 ° C, more preferably from about 1 250 ° C to about 1 500 ° C, and lasts from about 1 hour to about 20 hours, preferably from about 2 hours to about 10 hours, more preferably from about 2 hours to about 6 hours. Alternatively, the doped ABOq perovskite (e.g., doped barium titanate) can be chemically (e.g., by precipitation from solution). Prepared. In the already doped AB0Q perovskite (if already doped with barium titanate, already doped 0

BaZr〇3,已摻雜PbTiOq,已摻雜PbZrOq,已摻雜 Ο 0BaZr〇3, which has been doped with PbTiOq, which has been doped with PbZrOq, which has been doped Ο 0

SrTi〇3,已摻雜SrZrOQ,已摻雜CaZrOQ,以及已摻雜 BiSc〇3的其中任一、或多個)的合成期間,B位置前驅溶 液與A位置前驅溶液相混合,以形成沈澱。A位置以及B位 置溶液的其中之一、或二者可在混合前由大約20°C加熱 至大約100 °C。第一個前驅溶液(下文中指的是B位置前 驅溶液)可包括含有鈣鈦礦B位置種類(例如,但不限於 Ti、Zr、Hf、以及Sn及其結合)的液體。B位置前驅溶 液可包括有機金屬B位置種類,例如,但不限於,曱基氧 099134645 表單編號A0101 第25頁/共66頁 1003059622-0 201120917 化物,乙基氧化物,丙基氧化物,丁基氧化物及其混合 物形式者。有機金屬B位置種類溶解於有機溶劑中,例如 ,但不限於乙醇、異丙醇或其混合物。在B位置前驅溶液 中,B位置種類的濃度可由大約0. 1 Μ變化至大約5 Μ, 較佳地是由大約0. 1 Μ至大約2 Μ,更佳地是由大約0. 1 Μ至大約0. 5 Μ。 第二個前驅溶液(下文中所指的是Α位置前驅溶液 )包括含有A位置種類的一、或多個鹽類的鹼性水溶液, 這些鹽類可包括,但不限於Ba(0H)2、Sr(OH)2Mg(OH)2 、Pb(OH)2或其混合物。在A位置前驅溶液中,A位置種類 的濃度可由大約0.1 Μ變化至大約5 Μ,較佳地是由大約 0. 1Μ至大約2Μ,更佳地是由大約0. 1 Μ至大約0. 5 Μ。 Α位置前驅溶液的pH值可藉由添加強鹼(例如,但不 限於NaOH、ΝΗ,ΟΗ或(CHjJOH,或其混合物)而調整至 4 3 4 大約8至大約14,較佳地是大約10至大約13,更佳地是大 約11至大約12。 A位置以及B位置前驅溶液的混合可藉由將其中一個 溶液快速地倒入另一個之中、或是藉由將其中一個溶液 慢慢地滴入另一個之中而完成,進而形成沈澱。沈澱的 處理可藉由於大約80° C至大約100 °C,較佳地是大約85° C至大約99 °C,更佳地是大約90 °C至大約95° C下,迴流 0. 5小時至大約48小時,較佳地是大約1小時至大約24小 時,更佳地是大約5小時至大約20小時,而達成。替代地 ,沈澱可於殺菌釜中處理、或是在烤箱中受熱水處理, 溫度大約100 °C至大約300 °C,較佳地是大約150° C至大 約2 50°C,更佳地是大約180°C至大約240 °C,壓力大約 099134645 表單編號A0101 第26頁/共66頁 1003059622-0 201120917 20 PSI至大約500 PSI,較佳地是大約100 PSI至大約 400 PSI,更佳地是大約200 PSI至大約300 PSI,以產 生顆粒尺寸大於沈澱以及結晶度大於沈澱的粉末。粉末 可以於去離子水中洗滌,並利用過濾或離心而自溶液中 移除’接著,粉末在大約50°C至大約200 °C進行乾燥, 較佳地是大約8 0 ° C至大約1 5 0 ° C,更佳地是大約1 〇 〇。c至 大約120 °C,以產生乾燥的粉末。更進一步地,乾燥的粉 末可藉由上述的鍛燒-燒結程序而被處理成為燒結體。 接著,已燒結的ABO化合物,例如,已燒結BaTi〇 \ 3 以及已燒結已推雜B'a T i 0:3 進:行質子化》在質子化期間 ,已燒結BaTi〇3化合物,例如’已摻雜已、燒結鈦酸鋇, 會被暴露於流動蒸汽中,例如,在大約2〇。(:至大約9〇〇。 C的管狀熔爐中’較佳地是大約3〇(Tc至大約9〇〇。(:,更 佳地疋大約500 C至大約700°C,麼力大約〇 1 psi至大 約100 PSI,較佳地是大約1 psi至大約5〇 psi,更佳 地是大約2 PSI至大約20 PSI,持續大約1小時至24小時 丨,較佳地是大約2小時至大約15小時,更佳地是大約5小 時至大約10小時。 能量儲存以及產生裝置的製造 採用離子傳導介電材料的能量儲存裝置,例如,那 些已知可被使用於車輛中者,例如,電動車,混合動力 電動車(例如’混合動力電動汽車)。其他的應用包括 ,但不限於,制動器、電子裝置(例如電腦、電子快取單 元、錄影機,以及類似者)。這些介電質以及使用它們的 裝置可在軍事與航空應用中,以及在井下石油與天然氣 的勘探技術中具有特殊的效用。 1003059622-0 099134645 表單編號A0101 第27頁/共66頁 201120917 多層電容器 採用展現IBBL效應(例如,PBBL效應)的介電質的 多層電容器可由已知的方法製造,例如,在元件的製造 中所使用的層的薄帶鑄造(tape casting)以及厚膜網 版印刷技術。藉由使用金屬膏(例如,包括A1、N i、Cu 、Fe、Pt、Pd、Ag、Au、以及其合金)而沈積在已沈積 介電質的多層上的電性連接,可利用類似傳統多層電容 器、或壓電制動器結構中所使用的方式而形成在每一層 的邊緣。亦可以使用藉由相互連接的電極連接。薄帶鑄 造或網版印刷可被用來產生展現PBBL效應的單層已質子 化介電質,多個單層可具有多至大約100微米的厚度,以 及大約25 mm2至大約4 cm2、或更多的表面積,以在一多 層電容器中使用作為介電層,接著,該多個單層進行加 熱處理,以造成緻密化,在加熱處理之後,該多個單層 利用蒸汽處理再次進行質子化,並能夠在大約500V至大 約800V的電壓下,達成跨越一 10微米至大約20微米層之 毫法拉的電容。 正如在此所使用的,用詞“厚膜”被理解為代表, 具有約0. 5微米的最小單層厚度以及約500微米的最大單 層厚度的膜。 採用離子傳導介電質的合成組合物 展現IBBL效應(例如,PBBL效應)的介電質可與離 聚物電解質(ionomeric electrolyte)、固態質子電 解質及其混合物一起使用,以提供可致能介電質以及任 一、或多個離聚物與質子電解質之間的可逆反應的合成 材料組成。該些合成材料組成可被使用於可充電能量儲 099134645 表單編號A0101 第28頁/共66頁 1003059622-0 201120917 存裝置中,例如電池、電容器、攝影機、快取磁碟、可 攜式電動工具、膝上型電腦、可攜式視訊設備、以及軍 事硬體。可使用之離聚物電解質的例子包括,但不限於 四氟乙烯-全氟-3. 6-二氧雜-4-甲基-7-辛烯硫酸共聚物 (“Nafion”)、聚(乙烯共甲基丙稀酸、聚乙烯氧化物 、聚偏二氟乙烯、以及其混合物。可使用的固態離聚物 電解質包括,但不限於層狀雙氫氧化物(例如前述的該些 )、離子傳導玻璃、傳導陶瓷及其混合物。 合成組成物可藉由將一或多個上述電解質與展現 IBBL效應(例如,PBBL效應)的一、或多個離子傳導介 電質相混合而製成。電解質在合成組合物中出現的量可 為大約0. 1 %至大約99. 99%,較佳地是1%至大約50%,更 佳地是5%至大約35%,剩餘為介電質,在此,所有的量都 是以合成組合物的總體積作為基礎。 藉由參考接下來非作為限制的實例,本發明在下 面有更為詳盡的敘述。 實例1A-1D以及2舉例說明已質子化已摻雜鈦酸鋇 化合物的製造 實例1A:已質子化BaCScO.lTiODOq的製造 〇 197. 3克BaCOq,71. 88克Ti09以及6. 896克Sc90q為 〇 L L &lt;5 起始材料(在此,得自Sigma-A1 dr i ch的起始材料的純 度為99. 9%、或更高),在襯以鐵氟龍(Teflon)的球 狀研磨機中,利用氧化釔穩定氧化錯球,而於乙醇裡進 行球研磨24小時,以形成漿狀物。 該漿狀物於80°C乾燥24小時,以產生乾燥的粉末, 乾燥的粉末接續地於1 050 °C下進行鍛燒10小時,於1150 099134645 表單編號A0101 第29頁/共66頁 1003059622-0 201120917 °c下進行鍛燒10小時’於125(rc下進行鍛燒1〇小時,於 1400 °C下進行鍛燒1〇小時,以及接著,於15〇(rc下進行 鍛燒10小時,以形成Ba(Sc Ti )〇 (v ) , 中V〇為氧位置空缺。該Ba(Scn , Ti )〇 (V、 於 0.1 〇. 9川2· 95、Vo. 05於 乙醇中利用氧化紀穩定氧化結球進行球研磨24小時,以 形成顆粒尺寸為1微米 '或更小的已研磨粉末的漿狀物。 已研磨粉末於8(TC下進行乾燥,接著於1 5,000 PSI下進 行單軸壓制’以產生預形成物。接著,預形成物於 30, 000 PSI下進行均壓壓縮’得出的預形成物於1550。 C下進行燒結1 〇小時,以產生已燒結 Ba(Sc〇 iTi〇 9)〇2.95(V〇)〇 〇5〇 該已燒結Ba(Sc〇 π、9)02 95(V〇)〇 〇5進行拋光, 以形成薄磁碟,並被暴露於560 PSI管狀炫爐内流動於 0· 005 CFM的蒸汽中2小時,接著以0. 5°C/min的速率自 900 °C緩慢冷卻至1〇0°C。 實例1 AT ·· 。15 的製造 在以0. 5°C/min的速奉而自l〇(TC冷卻至20(TC的期 間’實例1A的已燒結Ba(ScQ」TiQ 9 )02 95 (V〇)〇 〇5被暴 露於560 PSI管狀熔爐内流動於0.001 CFM的蒸汽中。 實例1AU : ^(^。.^。.9)〇2.955(^)。.045(料)0.010 的製造 在以0. 5°C/min的速率而自900 °C冷卻至300 °c的期 間,實例1A的已燒結Ba(ScQ9)〇2 μ磁碟 被暴露於560 PSI管狀熔爐内流動於0.001 CFM的蒸汽 中。 099134645 表單編號A0101 第30頁/共66頁 1003059622-0 201120917 實例IB :已質子化的Ba(Scn )〇製造 遵循實例1A的程序,除了所使用的是197.3克的 6&amp;(^〇3、47.92克的14〇2以及27.584 克的8。0。 2 3 實例 1BT : Ba(Scn」Tin e)0n (Vo) (Η*) 0.4 〇.6y 2.83、 Vl7、 V〇6 的製造 在以0. 5°C/min的速率而自90(TC冷卻至200 °C的期 間,在實例IB中所產生的已燒結磁碟被暴露於560 PSI 管狀熔爐内流動於0.001 CFM的蒸汽中。During the synthesis of SrTi〇3, SrZrOQ doped, CaZrOQ doped, and any one or more of the doped BiSc〇3, the B-site precursor solution is mixed with the A-site precursor solution to form a precipitate. One of the A position and the B position solution, or both, may be heated from about 20 ° C to about 100 ° C before mixing. The first precursor solution (hereinafter referred to as the B-site precursor solution) may include a liquid containing a perovskite B site species such as, but not limited to, Ti, Zr, Hf, and Sn, and combinations thereof. The B-position precursor solution may include an organometallic B-position species such as, but not limited to, decyloxy 099134645 Form No. A0101 Page 25 of 66 1003059622-0 201120917 Compound, ethyl oxide, propyl oxide, butyl In the form of oxides and mixtures thereof. The organometallic B position species is dissolved in an organic solvent such as, but not limited to, ethanol, isopropanol or a mixture thereof. The 浓度 Μ Μ Μ 在 在 在 在 在 Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ About 0.5 Μ. The second precursor solution (hereinafter referred to as the ruthenium position precursor solution) includes an aqueous alkaline solution containing one or more salts of the A site species, which may include, but are not limited to, Ba(0H)2. Sr(OH)2Mg(OH)2, Pb(OH)2 or a mixture thereof.至至约0. 5 至至约0. 5 至至约0. Hey. The pH of the ruthenium precursor solution can be adjusted to 4 3 4 from about 8 to about 14, preferably about 10 by the addition of a strong base such as, but not limited to, NaOH, hydrazine, hydrazine or (CHjJOH, or a mixture thereof). Up to about 13, more preferably from about 11 to about 12. Mixing of the A and B precursor precursor solutions can be accomplished by rapidly pouring one of the solutions into the other, or by slowly adding one of the solutions. Drip into the other to complete, thereby forming a precipitate. The treatment of the precipitate may be by about 80 ° C to about 100 ° C, preferably about 85 ° C to about 99 ° C, more preferably about 90 °. From C to about 95 ° C, refluxing from 0.5 hours to about 48 hours, preferably from about 1 hour to about 24 hours, more preferably from about 5 hours to about 20 hours, is achieved. Alternatively, the precipitation can be achieved. Treated in a sterilizer or treated with hot water in an oven at a temperature of from about 100 ° C to about 300 ° C, preferably from about 150 ° C to about 2 50 ° C, more preferably about 180 ° C. To approximately 240 ° C, pressure approximately 099134645 Form No. A0101 Page 26 / Total 66 Page 1003059622- 0 201120917 20 PSI to about 500 PSI, preferably from about 100 PSI to about 400 PSI, more preferably from about 200 PSI to about 300 PSI, to produce a powder having a particle size greater than the precipitate and having a crystallinity greater than the precipitate. Washing in deionized water and removing it from the solution by filtration or centrifugation' Next, the powder is dried at a temperature of from about 50 ° C to about 200 ° C, preferably from about 80 ° C to about 150 ° C. More preferably, it is about 1 〇〇 c to about 120 ° C to produce a dried powder. Further, the dried powder can be processed into a sintered body by the above-described calcination-sintering procedure. ABO compounds, for example, sintered BaTi〇\3 and sintered have been pushed B'a T i 0:3 into: protonation. During protonation, the BaTi〇3 compound has been sintered, for example, 'doped already The sintered barium titanate will be exposed to the flowing steam, for example, at about 2 Torr. (: to about 9 Torr. The tubular furnace of C is preferably about 3 Torr (Tc to about 9 Torr). (:, better, about 500 C to about 700 ° C, great power From 1 psi to about 100 PSI, preferably from about 1 psi to about 5 psi, more preferably from about 2 PSI to about 20 PSI, for about 1 hour to 24 hours, preferably about 2 hours to Approximately 15 hours, more preferably from about 5 hours to about 10 hours. Energy storage and production devices are manufactured using energy storage devices of ion conducting dielectric materials, such as those known to be used in vehicles, for example, electric Cars, hybrid electric vehicles (such as 'hybrid electric cars'). Other applications include, but are not limited to, brakes, electronic devices (such as computers, electronic cache units, video recorders, and the like). These dielectrics and the devices in which they are used have particular utility in military and aerospace applications, as well as in underground oil and gas exploration technologies. 1003059622-0 099134645 Form No. A0101 Page 27 of 66 201120917 Multilayer capacitors Multilayer capacitors using a dielectric exhibiting an IBBL effect (for example, PBBL effect) can be fabricated by known methods, for example, in the manufacture of components. The layer of tape casting and thick film screen printing technology. A similar tradition can be utilized by using a metal paste (eg, including A1, Ni, Cu, Fe, Pt, Pd, Ag, Au, and alloys thereof) to deposit electrical connections on multiple layers of deposited dielectric. The edges of each layer are formed in a manner used in a multilayer capacitor, or piezoelectric actuator structure. It is also possible to use an electrode connection by being connected to each other. Thin strip casting or screen printing can be used to produce a single layer of protonated dielectric exhibiting a PBBL effect, a plurality of single layers can have a thickness of up to about 100 microns, and from about 25 mm2 to about 4 cm2, or more A large surface area is used as a dielectric layer in a multilayer capacitor, and then the plurality of single layers are subjected to heat treatment to cause densification, and after the heat treatment, the plurality of single layers are again protonated by steam treatment And capable of achieving a millifarad capacitance across a layer of 10 microns to about 20 microns at a voltage of about 500V to about 800V. As used herein, the term "thick film" is understood to mean a film having a minimum single layer thickness of about 0.5 microns and a maximum single layer thickness of about 500 microns. A dielectric exhibiting an IBBL effect (eg, a PBBL effect) using a synthetic composition of an ion-conducting dielectric can be used with an ionomeric electrolyte, a solid proton electrolyte, and mixtures thereof to provide an energizable dielectric. A synthetic material consisting of a reversible reaction between any one or more ionomers and a proton electrolyte. These synthetic material compositions can be used in rechargeable energy storage 099134645 Form No. A0101 Page 28 of 66 1003059622-0 201120917 Storage devices, such as batteries, capacitors, cameras, caches, portable power tools, Laptops, portable video devices, and military hardware. Examples of ionomer electrolytes that may be used include, but are not limited to, tetrafluoroethylene-perfluoro-3. 6-dioxa-4-methyl-7-octene sulfate copolymer ("Nafion"), poly(ethylene) Co-methyl acrylate, polyethylene oxide, polyvinylidene fluoride, and mixtures thereof. Solid ionomer electrolytes that can be used include, but are not limited to, layered double hydroxides (such as those described above), ions Conductive glass, conductive ceramics, and mixtures thereof. The composite composition can be made by mixing one or more of the above electrolytes with one or more ion-conducting dielectric phases exhibiting an IBBL effect (eg, PBBL effect). The amount of the composition may be from about 0.1% to about 99. 99%, preferably from 1% to about 50%, more preferably from 5% to about 35%, the remainder being dielectric, Herein, all amounts are based on the total volume of the synthetic composition. The invention is described in more detail below by reference to the following non-limiting examples. Examples 1A-1D and 2 illustrate protons. Production Example 1A: Protonated BaCSc Manufacture of O.lTiODOq 〇197. 3 g BaCOq, 71. 88 g Ti09 and 6.896 g Sc90q are 〇LL &lt; 5 starting materials (here, the purity of the starting material from Sigma-A1 dr i ch 99.9%, or higher, in a Teflon-lined ball mill, stable oxidation of the wrong ball by yttrium oxide, and ball milling in ethanol for 24 hours to form a slurry The slurry was dried at 80 ° C for 24 hours to produce a dry powder, and the dried powder was successively calcined at 1 050 ° C for 10 hours at 1150 099134645 Form No. A0101 Page 29 / Total 66 Page 1003059622 -0 201120917 calcination for 10 hours at °C for 1 hour at rc (for 1 hour at rc, forging for 1 hour at 1400 °C, and then forging for 10 hours at 15 〇 (rc) In order to form Ba(Sc Ti )〇(v), V〇 is a vacancy in the oxygen position. The Ba(Scn , Ti )〇 (V, 0.1 0.1〇. 9川2·95, Vo. 05 is utilized in the oxidation of ethanol. The stabilized oxidized pellets were ball milled for 24 hours to form a slurry of milled powder having a particle size of 1 micron' or less. The ground powder was drilled at 8 (TC) The rows were dried, followed by uniaxial pressing at 15,000 PSI to produce a preform. The preforms were then subjected to pressure equalization at 30,000 PSI to yield a preform which was sintered at 1550 C. After 〇 hours, the sintered Ba(Sc〇iTi〇9)〇 2.95(V〇)〇〇5〇 is sintered to form the sintered Ba(Sc〇π,9)02 95(V〇)〇〇5 to form Thin disk, and exposed to steam in 0·005 CFM for 2 hours in a 560 PSI tubular furnace, followed by slow cooling from 900 °C to 1〇0 °C at a rate of 0.5 °C/min. Example 1 AT ··. 15 was manufactured at a rate of 0.5 ° C / min from 1 〇 (TC cooled to 20 (the period of TC 'Example 1A of sintered Ba (ScQ) TiQ 9 ) 02 95 (V〇) 〇〇 5 5°C。 Manufactured at 0. 5 ° C. 5% (5) 制造 55 55 55 55 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 560 The sintered Ba(ScQ9)〇2 μ disk of Example 1A was exposed to steam flowing at 0.001 CFM in a 560 PSI tubular furnace during the cooling of the temperature from 900 ° C to 300 ° C. 099134645 Form Number A0101 Page 30 of 66 1003059622-0 201120917 Example IB: The protonated Ba(Scn)〇 manufacture follows the procedure of Example 1A except that 197.3 grams of 6&amp;(^〇3, 47.92 g of 14 is used) 5°C。 〇2 and 27.584 g of 8. 0. 2 3 Example 1BT: Ba(Scn"Tin e)0n (Vo) (Η*) 0.4 〇.6y 2.83, Vl7, V〇6 is manufactured at 0. 5 ° C At a rate of /min, the sintered disk produced in Example IB was exposed to 0.001 CFM of steam in a 560 PSI tubular furnace from 90 (TC cooled to 200 °C).

i8(H*&gt;o.〇4 實例 lBU:Ba(SCfwTiG s)〇2 82(Vo) 的製造 在以0. 5°€/min的速率而自9〇0°C冷卻至300 °C的期 間,在實例1B中所產生的已燒結磁碟被暴露於560 PSI 管狀熔爐内流動於0.001 CFM的蒸汽中。 實例1C :已質子化Ca(SC()jTi。9)§3的製造I8(H*&gt;o.〇4 Example lBU: Ba(SCfwTiG s)〇2 82(Vo) was fabricated at a rate of 0.5 ° €/min from 9 ° 0 ° C to 300 ° C. During this time, the sintered disk produced in Example 1B was exposed to steam flowing in 0.001 CFM in a 560 PSI tubular furnace. Example 1C: Manufacture of protonated Ca(SC()jTi.9)§3

遵循實例1A的程序’除了 BaCOQUl00.08克的CaCO 3 3 取代。The procedure of Example 1A was followed except that BaCOQUl00.08 grams of CaCO33 was substituted.

實例1CT: ^(^.^^.9)02:9575(70)0.(^5^)0. 015 的製造 遵循實例1C的程序,除了在以0. rc/min的速率而 自900 °C冷卻至200 °C的期間,如實例ic所產生的已燒結 磁碟被暴露於1 000 PSI管狀熔爐内流動於o.ooi CFM的 蒸汽中》 實例101:Example 1CT: ^(^.^^.9)02:9575(70)0.(^5^)0. 015 Manufactured following the procedure of Example 1C except at 900 ° at a rate of 0.9 rc/min During the cooling of C to 200 °C, the sintered disk produced as in Example ic was exposed to steam flowing in o.ooi CFM in a 1 000 PSI tubular furnace. Example 101:

Ca(SC0. , 0.9)02.955^0)0.045(^)0. 〇1〇的製造 遵循實例1C的程序,除了在以〇. rc/min的速率而 自9〇〇 °C緩慢冷卻至300 °C的期間,如實例1C產生的已燒 099134645 表翠編號A0101 第31頁/共66頁 1003059622-0 201120917 結磁碟被暴露於1 000 PSI管狀熔爐内流動於0.001 CFM 的蒸汽中。 實例1D:已質子化Pb(Scn Q)Oq的製造 遵循實例1A的程序,除了 Bac〇以267.2克的?1&gt;(:0, u 0 取代。 實例1DT : Ρΐ3(δε〇.1Τί〇.9)〇2.9575 (ν〇)〇.〇425 (Η*)〇·015^^^ 遵循實例ID的程序,除了在以〇.5°C/min的速率而 自900 °C緩慢冷卻至200 °C的期間,如實例1D產生的已燒Ca(SC0. , 0.9)02.955^0)0.045(^)0. The manufacture of 〇1〇 follows the procedure of Example 1C except that it is slowly cooled from 300 ° C to 300 ° at a rate of 〇. rc/min. During the period of C, as burned in Example 1C, 099134645, Executor No. A0101, Page 31/66, 1003059622-0, 201120917, the magnetic disk was exposed to 0.001 CFM of steam flowing in a 1 000 PSI tubular furnace. Example 1D: Manufacture of protonated Pb(Scn Q)Oq Follow the procedure of Example 1A, except for Bac〇 with 267.2 grams? 1&gt;(:0, u 0 is substituted. Example 1DT: Ρΐ3(δε〇.1Τί〇.9)〇2.9575 (ν〇)〇.〇425 (Η*)〇·015^^^ Follow the procedure of the instance ID, except During the slow cooling from 900 ° C to 200 ° C at a rate of 5 5 ° C / min, the burnt as produced in Example 1D

結磁碟被暴露於100 PSI管狀熔爐内流動於0.001 CFM 的蒸汽中。 s,. 實例1DU: ? 遵循實例1D的程序,除了在以〇.5°C/min的速率而 自900 °C緩慢冷卻至300 °C的期間,如實例1D產生的已燒 結磁碟被暴露於100 PSI管狀熔爐内叙籍於0.001 CFM 的蒸汽中。 實例1E:巳質子化Ba(ZrQ 8YQ 2)〇3的製造 得自8丨舀1113-人1(11'丨(:11、純度為99.9%或更高的起始 材料 197· 3克BaCO,、98. 576克ZrOQ以及22. 581 克Y 〇 ’於乙醇中藉由球研磨混合24小時,並乾燥,得出的乾 燥粉末接續地於105(TC下進行鍛燒10小時,於115(TC下 進行鍛燒10小時,於125CTC下進行鍛燒10小時,於1400 °C下進行鍛燒1〇小時,以及接著,於15〇〇°c下進行鍛燒 10小時’以形成Ba(Zr〇 8Y。2)〇2 9(V〇)〇」’其中V〇為 氧位置空缺。 099134645 表單編號A0101 第32頁/共66頁 1003059622-0 201120917 2)02.9(^)(^ 以及 2%wt ZnO (基於 Ββ(ΖΓ0·8Υ0.2)〇2. 9(、)〇.1重量)於乙醇中利用氧化紀 穩定氧化锆球進行球研磨24小時,以形成具有1微米、或 更小顆粒尺寸的已研磨粉末的漿狀物。已研磨粉末於8〇。 C下進行乾燥’接著於15, 0〇0 PSI下進行單軸壓制,以 產生預形成物’接著,預形成物於30, 000 PSI下進行均 壓壓縮’得出的預形成物於155〇。(:下進行燒結1〇小時, 以產生已燒結Ba(Zr〇 Λ 2)〇2 9(V〇)〇丨。 該已燒結Ba(Zr〇 8Y〇 2)〇2 9(V〇)。」進行拋光,以 形成薄磁碟’並在的速率而自90ITC冷卻至 20 °C的同時’於15 PSI下被暴露於管狀熔櫨内流動於 0.01 CFM的蒸汽中,以產生已質子化ga(z、2)〇3 實例 1ET : Ba(Zr Y )〇 (v〇) (Η木) 0-8 0.2y 2.925^ ^ 0.0 75 ^ ;0.〇5 的製造 ’ ΊThe junction disk was exposed to a flow of 0.001 CFM in a 100 PSI tubular furnace. s,. Example 1DU: ? Follow the procedure of Example 1D, except that during the slow cooling from 900 °C to 300 °C at a rate of 55 ° C / min, the sintered disk produced as in Example 1D was exposed. It is classified in 0.001 CFM steam in a 100 PSI tubular furnace. Example 1E: 巳Protonated Ba(ZrQ 8YQ 2)〇3 was produced from 8丨舀1113-人1 (11'丨(:11, purity of 99.9% or higher starting material 197·3 g BaCO, 98. 576 g of ZrOQ and 22.581 g of Y 〇' were mixed by ball milling in ethanol for 24 hours, and dried, and the obtained dry powder was successively calcined at 105 (TC for 10 hours at 115 (TC). The calcination was carried out for 10 hours, calcination at 125 CTC for 10 hours, calcination at 1400 ° C for 1 hour, and then calcination at 15 ° C for 10 hours to form Ba (Zr〇). 8Y. 2) 〇 2 9(V〇)〇”' where V〇 is the oxygen position vacancy. 099134645 Form No. A0101 Page 32 of 66 1003059622-0 201120917 2) 02.9(^)(^ and 2%wt ZnO (Based on Ββ(ΖΓ0·8Υ0.2)〇2.9 (,)〇.1 by weight), ball milling was carried out in ethanol using oxidized-stabilized zirconia balls for 24 hours to form a particle size of 1 μm or smaller. Slurry of ground powder. The ground powder was dried at 8 ° C. Then uniaxially pressed at 15,0 〇 0 PSI to produce a preform. Then, the preform was at 30, 0 The preform formed by pressure equalization at 00 PSI was obtained at 155 Torr. (Sintering was carried out for 1 Torr to produce sintered Ba(Zr〇Λ 2)〇2 9(V〇)〇丨. Sintered Ba(Zr〇8Y〇2)〇2 9(V〇).” Polished to form a thin disk 'and at a rate from 90 ITC to 20 ° C while being exposed to the tube at 15 PSI The inside of the crucible flows in 0.01 CFM of steam to produce protonated ga(z,2)〇3 Example 1ET : Ba(Zr Y )〇(v〇) (Η木) 0-8 0.2y 2.925^ ^ 0.0 75 ^ ;0.〇5 Manufacturing ' Ί

遵循實例1E的程序,除了在以0.5-C/min的速率而 自900 °C冷卻至400°C的同時,如實例ιέ產生的磁碟於!5 PSI下被暴露於管戚熔爐内流動於〇. 〇i CFM的蒸汽中。 實例 1EU : Ba(Zr。8Y。2)〇2 93 (ν〇)η _(H*) 0.07 的 製造 遵循實例1E的程序,除了在以0. 5-c/min的速率而 自900 °C冷卻至300 °C的同時,如實例1£;產生的磁碟於15 PSI下被暴露於管狀熔爐内流動於〇〇1 CFM的蒸汽中。 )02.94(V〇)〇.〇6⑽)〇. 的 實例 1EV : Ba(Zrn δΥη U. ο 〇 製造 099134645 遵循實例1Ε的程序,除了在以〇 5°c/min的速率 表單編號A0101 第33頁/共66頁 而 1003059622-0 201120917 自900 °C冷卻至200 °C的同時,如實例1E產生的磁碟於15 PSI下被暴露於管狀熔爐内流動於〇· 01 CFM的蒸汽中。 實例 1EW : Ba(Zrn cYn )〇 (Vo) (Η*) 的 0.8 0.2y 2.97ν y0.03v ^0.14^ 製造 遵循實例IE的程序,除了在以〇.5°c/min的速率而 自900 °C冷卻至100°C的同時’如實例1E產生的磁碟於15 PSI下被暴露於管狀熔爐内流動於〇.〇1 CFM的蒸汽中。 實例2 :已質子化Ba(Sc„ (Ti Zr ) )0的 0. 1、 0· 85 0· 15y 0· 9 川309 製造 得自Sigma-Aldrich、純;度為f 9· 9%或更高的起始 材料 197. 3克BaC〇3 ’ 61. 10'克TiO?,1.6.· 635克ZrO 以及 6. 869克Sc2〇3 ’在襯以鐵氟龍.(Tefi..o.n)的.球狀研磨機 中,利用氧化紀穩定氧化錯球,而於乙醇裡進行球研磨 24小時,以形成漿狀物。 該漿狀物於80°C乾燥24小時,以產生乾燥的粉末, 乾燥的粉末連續地於l〇5(TC下進行鍛燒1〇小時,於115〇 °C下進行鍛燒1〇小時,於12507下道行鍛燒10小時,於 140(TC下進行鍛燒1〇小時,以及接著,於15〇〇»c下進行 鍛燒10小時,以形成Following the procedure of Example 1E, except for the cooling from 900 ° C to 400 ° C at a rate of 0.5-C/min, the disk produced by the example ιέ is in! 5 PSI is exposed to the steam in the tube crucible flowing in the steam of the 〇i CFM. Example 1EU: Ba(Zr.8Y.2) 〇2 93 (ν〇)η _(H*) 0.07 Manufactured in accordance with the procedure of Example 1E except at a rate of 0.5-c/min from 900 °C While cooling to 300 °C, as in Example 1; the resulting disk was exposed to steam flowing from the 〇〇1 CFM in a tubular furnace at 15 PSI. ) 02.94(V〇)〇.〇6(10))〇. Example 1EV: Ba(Zrn δΥη U. ο 〇 Manufacture 099134645 Follow the procedure of Example 1Ε, except at the rate of 〇5°c/min Form No. A0101 Page 33 / Total 66 pages and 1003059622-0 201120917 While cooling from 900 °C to 200 °C, the disk produced as in Example 1E was exposed to steam flowing from the 〇· 01 CFM in a tubular furnace at 15 PSI. Example 1EW : Ba(Zrn cYn )〇(Vo) (Η*) 0.8 0.2y 2.97ν y0.03v ^0.14^ Manufacture follows the procedure of Example IE except at 900 °C at a rate of 〇5 °c/min While cooling to 100 ° C, the disk produced as in Example 1E was exposed to steam in a tubular furnace at 15 PSI flowing in a steam of 〇.〇1 CFM. Example 2: Protonated Ba (Sc„ (Ti Zr ) 0. 1, 0·85 0·15y 0· 9 Chuan 309 Manufactured from Sigma-Aldrich, pure; degree of f 9·9% or higher starting material 197. 3 g BaC〇3 ' 61 10' g TiO?, 1.6.· 635 g ZrO and 6. 869 g Sc2〇3 ' in a spheroidal grinder lined with Teflon. (Tefi..on) And ball milling in ethanol 24 small The slurry is dried at 80 ° C for 24 hours to produce a dry powder, and the dried powder is continuously calcined at 10 ° C for 1 hour at 115 ° C. The calcination was carried out for 1 hour, and calcined for 10 hours at 12507, calcined at 140 (TC for 1 hour, and then calcined at 15 〇〇»c for 10 hours to form

Ba(Sc。^Ti。85Zr。15)。9)〇2 95 (v。)。。該Ba (Sc. ^ Ti. 85Zr. 15). 9) 〇 2 95 (v.). . The

Ba(Sco.i(Ti〇 g5Zr〇 i5)〇 9)〇2 95 (V〇)〇 〇5^2% wtBa(Sco.i(Ti〇 g5Zr〇 i5)〇 9)〇2 95 (V〇)〇 〇5^2% wt

ZnO—起於乙醇中利用氧化釔穩定氧化锆球進行球研磨24 小時,至1微米的顆粒尺寸,已研磨粉末於8〇°c下進行乾 燥,接著於15, 000 PSI下進行單軸壓制,以產生預形成 物,接著,預形成物於30, 000 PSI下進一步被均壓壓縮 ,得出的預形成物於155(TC下進行燒結1〇小時,以產生 099134645ZnO—from ethanol in a cerium oxide stabilized zirconia ball for 24 hours to a particle size of 1 micron, the ground powder is dried at 8 ° C, followed by uniaxial pressing at 15,000 PSI. To produce a pre-form, then the preform is further pressure-compressed at 30,000 PSI and the resulting preform is sintered at 155 (TC for 1 hour to produce 099134645).

表單編號A0101 第34頁/共66 I 1003059622-0 201120917 已燒結BaCS% /Ti 著,該已燒結 〇.85Zr〇. 15^. 9^2.95^^ 0 0.05 接Form No. A0101 Page 34 / Total 66 I 1003059622-0 201120917 Sintered BaCS% / Ti, the sintered 〇.85Zr〇. 15^. 9^2.95^^ 0 0.05

Ba(SC0. I(TV 85Zr0. 15)。· 9)。2. 95(VQ)G· °5被暴露於 15 PSI管狀熔爐内流動於0. 〇〇5 CFM的蒸汽中,並以〇. 5。 C/min的速率而自90(TC冷卻至2(TC,而產生已質子化 Ba(Sc〇 JT、85Zr。丨5)。9)〇3。 已質子化#5鈦礦形式氧化物,例如,欽酸鋇形式介 電質(例如,已質子化Ba (SC0. I (TV 85Zr0. 15).· 9). 2. 95(VQ)G·°5 is exposed to a 15 PSI tubular furnace flowing in 0. 〇〇5 CFM of steam, and 〇. The rate of C/min is from 90 (TC is cooled to 2 (TC, resulting in protonated Ba (Sc〇JT, 85Zr. 丨5). 9) 〇 3. Has been protonated #5 titanium oxide form oxide, for example , 钦 钡 form dielectric (eg, protonated)

Ba(Scx(Ti(K85Zr〇 ΐ5)ΐ χ)〇(3_0 5χ),其中 0.00&lt;x&lt;0.40 (例如’ X讀‘1)) ’可展現相對於未質 子化介電質而言大約1 0000的:;已強化低頻有效介電係數。 當質子為電荷載體種類時,正如在已質子化_已掺雜鐵電 體(例如,Ba(Sc (Ti Zr ) )0 )中一檨, °· 1 ο. 85 0. 1 5 ^0. 9yu3} τ 徠 鬆弛反應可能發生在大約1 Hz的低頻。Ba(Scx(Ti(K85Zr〇ΐ5)ΐ χ)〇(3_0 5χ), where 0.00&lt;x&lt;0.40 (eg 'X-read'1))' can exhibit about 1 with respect to unprotonated dielectric 0000:; The low frequency effective dielectric constant has been enhanced. When the proton is a charge carrier species, as in a protonated _ already doped ferroelectric (for example, Ba(Sc(Ti Zr ) ) 0 ), °· 1 ο. 85 0. 1 5 ^0. 9yu3} The τ 徕 relaxation response may occur at a low frequency of approximately 1 Hz.

第2圖顯示實例2的未質子化以及已質子化 BVSCo./TiuJro.BWOs 中,跨越 〇.〇1 Hz-100 kHz頻率範圍的有效介電係數(£ r)。在質子化之前( 第2A圖),未質子化Figure 2 shows the effective dielectric constant (£ r) across the 〇.〇1 Hz-100 kHz frequency range for the unprotonated and protonated BVSCo./TiuJro.BWOs of Example 2. Before protonation (Fig. 2A), unprotonated

Ba(Scn ,(Ti 85ΖΓ〇·15)〇·9)〇2·95(ν〇)〇.〇5 效介電係數&lt;1000,在質子化之後(第2Β圖) 於1 Hz的有 ,實例2的 已質子化Ba(Sc。i(Ti〇 “zr。15)。9)〇3的有效介電係 數為10, 000 ’在實例2的已質子化Ba(Scn ,(Ti 85ΖΓ〇·15)〇·9)〇2·95(ν〇)〇.〇5 Effective dielectric constant &lt;1000, after protonation (Fig. 2) At 1 Hz, The protonated Ba of Example 2 (Sc.i(Ti〇"zr.15).9) has an effective dielectric constant of 10,000 Å in the protonated form of Example 2

Ba(Sc〇 /T、85Zro.i5)Q 9)〇3中具有相對於如第2A圖 、第2B圖所示的未質子化Ba(Sc〇 /T, 85Zro.i5)Q 9)〇3 has unprotonated as shown in Fig. 2A and Fig. 2B.

Ba(SC。· l(Ti。· 85Zr。· 15)〇. 9)〇2· 95^)0。5而言的已強 化低頻率響應。低頻響應利用Solartron SI 1287電化 099134645 表單編號A0101 第35頁/共66頁 1003059622-0 201120917 學介面/125_率響應分析器,於跨越1〇 —&amp; _i〇6hz 的頻率範圍内,且於l_mV的振盪電壓下,進行 測量。 第3圖顯示晶粒與晶粒邊界活化能的測量。測量是利 用採用IV振盪電壓的S〇iartron SI 1287電化學介面/ 1255B頻率響應分析器來進行,測量實例2的該已質子化Ba(SC.·l(Ti.·85Zr.·15)〇. 9) 〇2·95^)0. 5 has a strong low frequency response. Low Frequency Response Using Solartron SI 1287 Electrochemical 099134645 Form No. A0101 Page 35 of 66 1003059622-0 201120917 Learning Interface / 125_ Rate Response Analyzer, in the frequency range spanning 1〇-&amp; _i〇6hz, and at l_mV The measurement is performed under the oscillating voltage. Figure 3 shows the measurement of the activation energy of the grain and grain boundaries. Measurements were made using an S〇iartron SI 1287 Electrochemical Interface / 1255B Frequency Response Analyzer with IV oscillating voltage, which was measured for protonation of Example 2.

Ba(Sco.i(Tlo.85Zr0.15)0 9)〇3於0· 45 eV的已質子化 晶粒活化能(“EA”),以及測量實例2的該已質子化The protonated grain activation energy ("EA") of Ba(Sco.i(Tlo.85Zr0.15)0 9)〇3 at 0·45 eV, and the protonated of measurement example 2

Ba(Sco_i(Ti0.85Zr0.15)0 9)〇3於〇. 59 eV的已質子化 晶粒活化能EA。 .. 第3A(a)圖顯示於A1(〇H)3/Naf i〇n的固態介面處展現可 逆電容反應的循環伏特安培法,第.3A(b)圖顯示於 Α1(ΟΗ)3/未質子化 介電質(曲 線A)與A1(0H)3/實例2的已質子化Ba(Sco_i(Ti0.85Zr0.15)0 9)〇3于〇. 59 eV protonated grain activation energy EA. .. Figure 3A(a) shows cyclic voltammetry for exhibiting a reversible capacitive response at the solid interface of A1(〇H)3/Naf i〇n, and Fig. 3A(b) shows at Α1(ΟΗ)3/ Protonated dielectric (curve A) and protonated of A1(0H)3/case 2

Ba(Sc〇 /T、85Zr〇. 15)〇 9)〇3 (曲線β)的固態介面處 展現可逆電容反應的循環伏特安培法。曲線B顯示,相較 於未質子化BaU% 的漏電流顯著減少。 (Ti0. 85Zr0. 15)〇·9)〇2·95(ν〇)〇.05 第4圖顯示由於實例2的該已質子化 的晶粒邊界電容(低頻 率)以及晶粒電容(高頻率)所造成之有效介電係數的 溫度穩定性,根據利用Solartron SI1287電化學介面/ 1255B頻率響應分析器所進行的阻抗測量。 第5圖顯示已質子化Cyclic voltammetry for exhibiting a reversible capacitive response at the solid interface of Ba(Sc〇 /T, 85Zr〇. 15)〇 9)〇3 (curve β). Curve B shows a significant reduction in leakage current compared to unprotonated BaU%. (Ti0. 85Zr0. 15) 〇·9) 〇2·95(ν〇)〇.05 Figure 4 shows the protonated grain boundary capacitance (low frequency) and grain capacitance (high frequency) due to Example 2. The temperature stability of the effective dielectric constant is based on impedance measurements made using the Solartron SI1287 Electrochemical Interface / 1255B Frequency Response Analyzer. Figure 5 shows the protonation

Ba(SCx(Ti〇0.85Zr0.15)l-x)〇(3-°-5x)(*t 099134645 表單編號A0101 第36頁/共66頁 1003059622-0 201120917 0.00&lt;χ&lt;0.40,具體為實例2的該已質子化Ba(SCx(Ti〇0.85Zr0.15)lx)〇(3-°-5x)(*t 099134645 Form No. A0101 Page 36/Total 66 Page 1003059622-0 201120917 0.00&lt;χ&lt;0.40, specifically Example 2 Protonated

Ba(Sco. ΙΟ10·85?% 15)〇 9)〇3)的極化與電場的關係 測篁疋利用_接至改良Sawyer-Tower電路的電腦控制 Trek 609C-6高壓放大器而進行。實例2的該已質子化Ba (Sco. ΙΟ10·85?% 15) 〇 9) 〇 3) Polarization vs. electric field The measurement was performed using a computer controlled Trek 609C-6 high voltage amplifier connected to a modified Sawyer-Tower circuit. The protonated of Example 2

Ba(Sco. 15)〇 9)〇3的介電係數是至2MV/m電 場強度的線性函數,此與會隨著電場強度增加而展現介 電係數損失的商用BaTi〇3介電質的介電係數相反。 展現PBBL的介電材料利用電化學活性包覆的製造The dielectric constant of Ba(Sco. 15)〇9)〇3 is a linear function of the electric field strength to 2 MV/m, which is a dielectric of commercial BaTi〇3 dielectric exhibiting a loss of dielectric coefficient as the electric field strength increases. The coefficients are opposite. Fabrication of dielectric materials exhibiting PBBL using electrochemically active cladding

實例3-3E舉例說明結合電化學活性包覆之展現pBBL 效應的介電材料的製造 .實例3 t絵:心Example 3-3E illustrates the fabrication of a dielectric material exhibiting a pBBL effect in combination with an electrochemically active coating. Example 3 t絵: heart

具有1微米平均晶粒尺寸的10克實例1.已質子化 Ba(Sco.iTi〇 9)〇3,藉由在去離子水中球研磨24小時而 進行分散,包覆溶液的製備是藉由將〗克的 八1(仰3)3.9112〇溶解於100|111的去離子水中而形成溶液 ,以及接著將5克的尿素添加至溶液中而達成,然後,該 已質子化Ba(Sc〇 [Til ^)〇3被添加至該包覆溶液中,並 且,將得出的混合物置於熱板上,並於強力攪拌下加熱 至9 0 C ’持續2小時’以在該已質子化10 g of Example with 1 μm average grain size 1. Protonated Ba(Sco.iTi〇9)〇3, dispersed by ball milling in deionized water for 24 hours, the coating solution was prepared by克的八1(仰3)3.9112〇 is dissolved in 100|111 of deionized water to form a solution, and then 5 grams of urea is added to the solution to achieve, then, the protonated Ba (Sc〇[Til ^) 〇3 was added to the coating solution, and the resulting mixture was placed on a hot plate and heated to 90 ° C for 2 hours under vigorous stirring to be protonated at the same time.

Ba(ScQ.lTiU)〇3上沈殺A1(〇H)3,在2小時後,混合物 於冷水中急速冷卻,並藉由離心移除該已包覆、已質子 化Ba(SC()9)〇3,接著,粉末於12〇。〇乾燥隔夜。Ba(ScQ.lTiU) 〇3 kills A1(〇H)3. After 2 hours, the mixture is rapidly cooled in cold water, and the coated, protonated Ba(SC()9 is removed by centrifugation. ) 〇 3, then, the powder is at 12 〇. Dry overnight.

實例3A 遵循實例3的程序’除了實例π的該已質子化 Ba(Sco.iTi〇.9)03取代實例1A的該已質子化Example 3A follows the procedure of Example 3 except that the protonated Ba(Sco.iTi〇.9)03 of the example π replaces the protonated of Example 1A.

Ba(Sc〇 Jio, 9)〇3。 099134645 表單編號A0101 第37頁/共66頁 1003059622-0 201120917Ba (Sc〇 Jio, 9) 〇 3. 099134645 Form No. A0101 Page 37 of 66 1003059622-0 201120917

實例3B 遵循實例3的程序,除了實例ic的該已質子化 Ca(Sco.4Ti〇.6)03取代實例1A的該已質子化Example 3B follows the procedure of Example 3 except that the protonated Ca(Sco.4Ti〇.6)03 of the example ic replaces the protonated of Example 1A.

Ba(Sc〇 Jio. 9)0 〇 實例3C 遵循實例3的程序,除了實例ID的該已質子化 Pb(ScO. lTi〇 9)〇3取代實例^的該已質子化Ba(Sc〇 Jio. 9)0 实例 Example 3C follows the procedure of Example 3, except that the protonated Pb(ScO.lTi〇 9)〇3 of the instance ID replaces the protonated of the example ^

Ba(Sc〇 Jio. 9)〇3。Ba(Sc〇 Jio. 9)〇3.

實例3D 遵循實例3的程序,除了實例1B^C〇(N〇 ) H 〇以 〇 0.9 2 1:1的基礎取代Α1(Ν〇3)3 9Η20。 實例3Ε 遵循實例3的程序,除了實例) Η 〇以 3 3.9 2 1:1的基礎取代A1(N0 ) HO。 3 3.9 2 使用具電化學活性包覆的離子傳導介電質的電容器的製 造 離子傳導介電粉末(例如,質子傳.介電粉末)利用 聚合物黏結劑(例如,聚乙稀丁醛)而在有機溶劑(例 如,乙醇)中進行研磨,以產出漿狀物,漿狀物以線薄 帶鑄造於載體材料(例如’ Mylar)上,並進行乾燥,接 著’已乾燥的線帶切成小方塊’並利用傳導電極承載墨 水(例如,鋁、銀、銅、金、白金、把、鎳、或其混合 物)進行網版印刷’以形成電極,接著,已印刷的線帶 進行堆疊’以形成多層,並利用溫均壓制而結合在一起 以形成壓制的晶片,然後,壓制的晶片藉由移除邊緣 而進行電連接,以藉由傳導金屬墨水而暴露出電極以及 099134645 表單編號A0101 第38頁/共66頁 1003059622-0 201120917 採用展j見iBBL效應(例如,pBBL效應)的介電質的電化 學電池的製造 η偽電容層(例如’ Co(0H)2)生長在一陽極(例如,Ni 鉍〇)上,以產生陽極裝置。展現PBBL效應的溶膠_凝膠 ζ生介電質包覆在該陽極集合上,並接著加熱至大約ι〇〇 田至U〇『C,然後,受加熱處理的陽極集合被冷卻至室 後’施加—陰極層’且若有需要的話,再次退火 Ο 再所得出的結構藉由1Q(TC至約财c的蒸汽處理 丹久進行質子化。 離子傳導介電-絕緣材料合成*Example 3D followed the procedure of Example 3 except that Example 1B^C〇(N〇)H Α replaced Α1(Ν〇3)3 9Η20 on the basis of 〇 0.9 2 1:1. Example 3 遵循 Follow the procedure of Example 3, except for the example) Η 取代 Replace A1(N0 ) HO with a basis of 3 3.9 2 1:1. 3 3.9 2 Manufacture of capacitors using electrochemically active coated ion-conducting dielectrics Ion-conductive dielectric powders (eg, proton-transporting dielectric powders) utilize polymer binders (eg, poly(butyral)) Grinding is carried out in an organic solvent (for example, ethanol) to produce a slurry which is cast into a carrier material (for example, 'Mylar) in a thin strip and dried, and then the 'dried strands are cut into Small squares 'and use conductive electrodes to carry ink (eg, aluminum, silver, copper, gold, platinum, handle, nickel, or a mixture thereof) for screen printing 'to form electrodes, and then, the printed ribbons are stacked' A plurality of layers are formed and joined together by gentle pressing to form a pressed wafer, and then the pressed wafer is electrically connected by removing the edges to expose the electrodes by conducting the metallic ink and 099134645 Form No. A0101 No. 38 Page / Total 66 pages 1003059622-0 201120917 Manufacture of dielectric capacitors using iBBL effects (eg, pBBL effect) for the fabrication of η pseudocapacitor layers (eg 'Co(0H)2) Long in an anode (e.g., Ni bismuth square), means to produce an anode. A sol-gel hybrid dielectric exhibiting a PBBL effect is coated on the anode assembly and then heated to about ι〇〇田至U〇『C, and then the heated anode assembly is cooled to the chamber' Apply-cathode layer' and, if necessary, re-anneal Ο The resulting structure is protonated by 1Q (TC to about cc.). Ion-conducting dielectric-insulation material synthesis*

在另—方面,離子傳導介電材料,例如,展現質子阻 障層效應者,可以與-或多個電化學活性晶粒邊界材料 =及絕緣材料—起使用’以產出離子傳導介電'絕緣材料 合成材料,這些合成材料可被用於電容、或能量儲存廣 用中’糾’詩電钱混合動力電動車料攜式能量 儲存、膝上型電财、快_碟、可攜式電力工具、軍 事硬體、表面黏著電容器、遠端能量收集裝置、晶格尺 度(grid scale)能量儲存。 在此方面,玻璃、金屬氧化物'聚合物、或其混合物 的絕緣材料可被施加於介電•上,以達成所需厚度的 絕緣材料。該絕緣材料可作用來限制到達電化學活性晶 粒邊界_已質子化介電晶粒單元(例如,A1_已質子 化介電晶粒單元)的質子以及電子運送,絕緣材^可具 有大約1 ηιπ至大約50⑽的厚度。 可被使用作為絕緣材料的玻璃包括,但不限於石夕 099134645 表單編號麵 第39頁/共66頁 1003059622-0 201120917 、紹石夕醆鹽、《鹽、卿酸、麵形成氧化物的混合 物(例如,氧化硼,氧化矽)、以及其他金屬氧化物( 例如氧化銘、氧化約、氧化錯、氧化鋅、氧化叙、氧化 銅、氧化鎂及其混合物)。 可被使用作為絕緣材料的金屬氧化物包括,但不限於 氧化銘、氧_、氧化錯' 氧化鋅、氧脑、氧化鋼、 氧化鎂及其混合物。 ----------π &amp;年孖竹的眾合物包括,但不限於聚乙 婦醇、聚乙烯丁搭、聚對苯二甲酸乙二醋、聚(偏二氣乙 烯)、聚醯亞胺及其混合物。 絕緣讨料可藉由如將介電粉末與絕緣材料一起進行球 研磨的方法而被施加於介電質之上’所得出的已研磨材 料進行乾你以及麼缩,以形成生壓庇,加熱生壓胚,以 產生較高岔度的壓庇,加熱可在大⑽m至大約 30_ PSI的施壓下進行,以幫助 當聚合:入作為絕緣物時,於施麗下 度為大約80气至大約3〇〇〇c, &quot;说入m 备破螭、或金屬氧化物的 混合物併入作為絕緣相時,於祐厥 nn心士 Μ 下的典型加熱溫度為 大约5〇〇 C至大约140(TC。 採用絕緣材料的合成材料的製造 一般而::採用絶緣材料的合成材料是藉由將已質子 化介電質,、浥緣玻螭一起進行研磨 胚 物,該蒙狀物進行乾燥,以形成:而末“二以形成聚狀 ^ ^ π 攻鮝末,以壓縮成為生壓 ,接著,該生壓胜進行燒結, 已心…壓胚的質子化可 藉由使用4、或氮氣、或氫氣 而於燒、结期間執行。替代地,^ 的濕氣流 099134645 表單編號綱第㈣共66頁燒結樣品可在空氣 '或 201120917 氮氣、或氫氣、或其混合物的濕氣流中、於溫度約1 0 0 ° c 至約1 20 0 °C下,進行約0. 1天至約10天的退火,並緩慢 地冷卻數天期間,接著,已燒結體藉由施加如前所述的 適當電極而形成為電容器。實例4舉例說明採用玻璃絕緣 材料的合成材料的製造。 實例4 : 100克實例1A的已質子化Ba(SC{) 9)〇3與7.5% wt的硼酸鋅玻璃一起於乙醇中研磨24小時,以產生漿狀 物,該漿狀物乾燥隔夜,以形成粉末,進而壓縮成為生 壓胚,該生壓胚以4°C/min加熱至燒結溫度1100°C,並 在1100°C維持2小時。 合成介電-絕緣材料可利用將電極材料施加至該合成材 料而形成電容*電極材料(例如*傳導電極墨水)可 藉由如塗漆的方式施加,亦可以使用濺鍍、或蒸鍍的方 式而將一或多個傳導金屬(例如,Au、Al、Ag、Pt、Ni 、Fe、Pd、Sn或其結合,以及其合金)施加至電極材料 上,已被施加的電極可提供電化學電容貢獻。 採用合成介電-絕緣材料的裝置可被用於混合動力電動 車中的車上能量儲存,可攜式裝置(例如,膝上型電腦 、行動電話、軍事應用、以及人造衛星)中的能量儲存 〇 單層IBBL裝置的製造 單層IBBL裝置,例如,單層PBBL裝置,可以如下的方 式進行建構: 具有高表面積(例如,大約1 m2/gin至大約1 000 m2/ gm)的層狀雙氫氧化物(例如,C〇,A1(OH))藉由施加 099134645 表單編號A0101 第41頁/共66頁 1003059622-0 201120917 如大約1. 5 V的低電壓而被形成在金屬電流收集器上,以 在具有表面積大約1 m2/gm至大約1 000 m2/gm的陽極上 沈積一層狀雙氫氧化物材料。接著,具有層狀雙氫氧化 物覆蓋的陽極在離子溶液(例如,KOH)中循環,以產生 氫氧化物表面,然後,該層狀雙氫氧化物材料被以金屬 ,例如Au、Sn、Pb、或其結合或合金包覆,或是以金屬 氧化物,例如氧化鈒、氧化鈦、或其結合包覆,以改善 電容力以及可逆性。 該氫氧化物表面-承載陽極接著被包覆以固態電解質的 溶膠-凝膠前驅物包覆,以提供一集合,該集合可於達 1 500 °C的溫度下進行退火,接著,該集合可經由蒸汽處 理、濕氣流、壓力容器、或電化學循環而進行再質子化 。高表面積陰極可以經由塗漆鈷、Mn〇2、鎳、鎂、以及 類似者的顆粒溶液而被包覆,該陽極亦可以是由鋁以及 過渡金屬(Co、Ni、Ζη、Μη)的共同沈澱所形成的高表 面積樹枝狀生長,其中,傳導電極是由來自(Α100Η + Α100Η + XCoO、或XNiO ' 或ΧΜηΟ,X &lt;= 0. 85)的共同 沈澱所形成。 採用合成介電-絕緣材料的裝置的製造 採用離子傳導介電材料的合成材料,例如,質子阻障 層材料、及/或介電絕緣合成材料,可藉由膠結反應( cementitious reaction)而被形成為適合在電容器中 使用的緻密體,在此方面,膠結材料與離子傳導介電質 (例如,質子傳導介電質)相混合。可使用的膠結材料 包括,但不限於CaO、Si〇2、Al2〇3、CaS〇4、或其混合 物,膠結材料以及介電質於混合物中的量可在大約0. 1 099134645 表單編號A0101 第42頁/共66頁 1003059622-0 201120917 ㈣介電質至大約5〇 wt%介電質(基於混合的總重量) 的廣泛範圍中變化’接著,屁合物於溶劍中(例如水、 乙醇丙酮、或其昆合物)進行球研磨一段時間(例如 約24小時)’以產生漿狀物,然後,該漿狀物利用如薄帶 鑄造的方式而形成為片狀,藉此,該膠結材料可造成該 漿狀物SJ化成為堅固的薄片’電極接著被施加至該薄片 ,以產生電容器,可附著的電極可包括,於已燒結介電 質上的Νι、或Ag-Pd,以及PBBL介電質與聚合物的Ag、 或A1合成物。 Ο 採用展現IBBL效應之電化學活性包覆介電質的電容器的 製造 在製造採用展現IBBL效應(例如,PBBL效應)之介電 質的電容器期間,“N”電解活性晶粒邊界-介電單元( 例如,已質子化BaTi03/Al(0H)^B粒邊界-介電單元) 可被串聯使用。電容器的電池電壓根據V=Vcell/N而沿 著單元分佈。 Ο 當採用已質子化電解活性晶粒邊界-介電單元(例如 ’ BaTi〇3/Al(OH)^B粒邊界-介電單元)時,儲存於電 解活性晶粒邊界介面的有效電荷可由In another aspect, an ion-conducting dielectric material, for example, exhibiting a proton barrier effect, can be used with - or a plurality of electrochemically active grain boundary materials = and insulating materials to produce ion-conducting dielectrics. Insulating materials, these synthetic materials can be used in capacitors, or energy storage. 'Encourage' poetry money hybrid electric vehicle materials, energy storage, laptop money, fast _ disc, portable power Tools, military hardware, surface mount capacitors, remote energy harvesting devices, grid scale energy storage. In this regard, an insulating material of glass, metal oxide 'polymer, or a mixture thereof can be applied to the dielectric to achieve the desired thickness of the insulating material. The insulating material acts to limit protons and electron transport to the electrochemically active grain boundaries - protonated dielectric grain units (eg, A1_protonated dielectric grain units), and the insulating material can have about 1 Ηιπ to a thickness of about 50 (10). Glass that can be used as an insulating material includes, but is not limited to, Shi Xi 099134645 Form No. Surface Page 39 / Total 66 Page 1003059622-0 201120917 , Shao Shi Xi Yan Salt, "Salt, Qing Acid, Surface Forming Oxide Mixture ( For example, boron oxide, cerium oxide), and other metal oxides (such as oxidized, oxidized, oxidized, zinc oxide, oxidized, copper oxide, magnesium oxide, and mixtures thereof). Metal oxides that can be used as insulating materials include, but are not limited to, oxidized, oxidized, oxidized, zinc oxide, oxygenated brain, oxidized steel, magnesium oxide, and mixtures thereof. ---------- π & 孖 的 bamboo common composition including, but not limited to, polyethyl ethoxylate, polyethylene butyl, polyethylene terephthalate, poly (diethylene ), polyimine and mixtures thereof. Insulation can be applied to the dielectric by ball milling together with the insulating material. The resulting abrasive material is dried and shrinked to form a pressure-resistant, heated Producing the embryo to produce a higher degree of pressure, the heating can be carried out under a pressure of from (10) m to about 30 PSI to help when the polymerization: as an insulator, the degree of application is about 80 to About 3〇〇〇c, &quot; When the m-breaking or metal oxide mixture is incorporated as an insulating phase, the typical heating temperature is about 5〇〇C to about 140. (TC. The manufacture of synthetic materials using insulating materials is generally:: The synthetic materials using insulating materials are made by grinding the embryos together with the protonated dielectric, and the edges are dried, To form: the end "two to form a poly ^ ^ π attack 鮝 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Or hydrogen gas is used during firing and junction. Alternatively, ^ Airflow 099134645 Form No. (4) A total of 66 pages of sintered sample can be carried out in a humid air stream of air 'or 201120917 nitrogen, or hydrogen, or a mixture thereof at a temperature of about 10 ° C to about 1 20 0 ° C. Annealing from 0.1 to about 10 days, and slowly cooling for several days, then the sintered body is formed into a capacitor by applying an appropriate electrode as described above. Example 4 illustrates a synthetic material using glass insulating material Manufactured. Example 4: 100 grams of protonated Ba(SC{) 9) 〇3 of Example 1A was milled with 7.5% wt of zinc borate glass in ethanol for 24 hours to produce a slurry which was dried Overnight, to form a powder, which is then compressed into a green compact, which is heated at 4 ° C / min to a sintering temperature of 1100 ° C and maintained at 1100 ° C for 2 hours. The composite dielectric - insulating material can be used to electrode The material is applied to the composite material to form a capacitor* electrode material (eg, *conducting electrode ink) may be applied by, for example, painting, or one or more conductive metals may be used by sputtering or evaporation. , Au, Al, Ag, Pt, Ni, Fe Pd, Sn or a combination thereof, and alloys thereof are applied to the electrode material, and the applied electrode can provide an electrochemical capacitance contribution. A device using a synthetic dielectric-insulation material can be used in a vehicle in a hybrid electric vehicle. Energy storage, energy storage in portable devices (eg, laptops, mobile phones, military applications, and satellites) Manufacturing single-layer IBBL devices for single-layer IBBL devices, for example, single-layer PBBL devices, can be as follows The way to construct: a layered double hydroxide with a high surface area (for example, about 1 m2/gin to about 1 000 m2/gm) (for example, C〇, A1(OH)) by applying 099134645 Form No. A0101 41 pages/total 66 pages 1003059622-0 201120917 are formed on a metal current collector such as a low voltage of about 1.5 V to deposit a layer on an anode having a surface area of from about 1 m2/gm to about 1 000 m2/gm. Layered double hydroxide material. Next, the anode having a layered double hydroxide cover is circulated in an ionic solution (for example, KOH) to produce a hydroxide surface, and then the layered double hydroxide material is made of a metal such as Au, Sn, Pb , or a combination thereof or alloy coating, or coated with a metal oxide such as yttria, titanium oxide, or a combination thereof to improve capacitance and reversibility. The hydroxide surface-supporting anode is then coated with a sol-gel precursor coated with a solid electrolyte to provide a collection which can be annealed at a temperature of up to 1 500 ° C. Reprotonation is carried out via steam treatment, wet gas flow, pressure vessel, or electrochemical cycling. The high surface area cathode can be coated by coating a solution of cobalt, Mn 〇 2, nickel, magnesium, and the like, which can also be coprecipitated by aluminum and transition metals (Co, Ni, Ζη, Μη). The resulting high surface area dendritic growth wherein the conductive electrode is formed by a coprecipitation from (Α100Η + Α100Η + XCoO, or XNiO ' or ΧΜηΟ, X &lt; = 0.85). Fabrication of devices employing synthetic dielectric-insulating materials using synthetic materials of ion-conducting dielectric materials, such as proton barrier materials, and/or dielectrically insulating synthetic materials, may be formed by cementitious reactions To be a dense body suitable for use in a capacitor, in this aspect, the cementitious material is mixed with an ion conducting dielectric (eg, a proton conducting dielectric). The cementing material that can be used includes, but is not limited to, CaO, Si〇2, Al2〇3, CaS〇4, or a mixture thereof, and the amount of the cementing material and the dielectric in the mixture can be about 0.11 099134645 Form No. A0101 42 pages / total 66 pages 1003059622-0 201120917 (d) a wide range of dielectrics to about 5 〇 wt% dielectric (based on the total weight of the mixture) 'Next, the fart in the sword (such as water, ethanol Acetone, or a compound thereof, is subjected to ball milling for a period of time (for example, about 24 hours) to produce a slurry, which is then formed into a sheet shape by, for example, thin strip casting, whereby the cement is formed. The material can cause the slurry to be SJ into a strong sheet. The electrode is then applied to the sheet to create a capacitor. The attachable electrode can include Νι, or Ag-Pd on the sintered dielectric, and PBBL. Ag, or A1 composition of dielectric and polymer. Manufacture of capacitors using electrochemically active dielectrics exhibiting IBBL effects During the fabrication of capacitors using dielectrics exhibiting IBBL effects (eg, PBBL effects), "N" electrolytically active grain boundary-dielectric cells (For example, the protonated BaTi03/Al(0H)^B grain boundary-dielectric unit can be used in series. The battery voltage of the capacitor is distributed along the cell according to V = Vcell / N. Ο When a protonated electrolytically active grain boundary-dielectric unit (eg, 'BaTi〇3/Al(OH)^B grain boundary-dielectric unit) is used, the effective charge stored in the electrolytically active grain boundary interface may be

Qeff = QpBBL + QAl(〇H)3/AlH3redox表示,其中Q 於PBBL效應的電荷,以及 QA1(0H)3/AlH3redox 醜4㈣ 為相關於電 化學活性相的電荷。結果 ^^eff^cel 1 ^/^^) = ^pbblVPBBL + CPSEUDO η OVERPOTENTIAL ^ 及採用展現IBBL效應(例如,PBBL效應)的離子傳導介 電質的電容器的有效電容可表示為 099134645 表單編號A0101 第43頁/共66頁 1003059622-0 201120917 [0006] ΒΒ^ΓρΒΒΖ + C PSSUD(^ OVSRPOTSmAlQeff = QpBBL + QAl(〇H)3/AlH3redox represents the charge of Q in the PBBL effect, and QA1(0H)3/AlH3redox ugly 4(d) is the charge associated with the electrochemically active phase. The result ^^eff^cel 1 ^/^^) = ^pbblVPBBL + CPSEUDO η OVERPOTENTIAL ^ and the effective capacitance of the capacitor using the ion-conducting dielectric exhibiting the IBBL effect (for example, PBBL effect) can be expressed as 099134645 Form No. A0101 43 pages/total 66 pages 1003059622-0 201120917 [0006] ΒΒ^ΓρΒΒΖ + C PSSUD(^ OVSRPOTSmAl

KeU 其中CPBBL為關連於該PBBL效應的電容,VDBBT為關連 Γ DDL· 於該PBBL效應的電壓,CpsEu⑽為關連於電化學相的電容 以及?^OVERPOTENTIAL為關連於電化學相的電壓。 PBBL CpSEUDO…以及〇VERJPG:TENTIAL·可以藉由控制介 電質(例如,BaTi〇3)的質子化程度,以及於晶粒邊界 處的電解活性晶粒邊界材料(例如,A1(〇h))層的厚度 而受到管理。電解活性晶粒邊界材料層的$度是取決於 晶粒邊界材料的CPSEUD0以及 ^OVERPOTENTIAL 的内在值( intrinsic value) 〇 採用電解活性晶粒邊界-介電單元的電豸器的整體電容 曰 ίέ jL· P — 疋 a OVERALL CEFF(#PARALLEL/#SERIES)而疋義,其中 #PARALLEL代表電解活性晶粒邊界_介電單元於並聯架構中 的數量,以及#seriesr表電解活性晶粒邊界-芥電單元於 串聯架構中的數量。串聯配置之電解活性晶粒邊界_介電 單元的數量以及並聯配置之電解活性晶粒邊界—介電單元 的數量可以受到晶粒尺寸、層面積、以及層厚度的控制 。串聯配置的數量被定義為層厚度以及晶粒尺寸的函數 ,亦即’串聯配置的數量被定義為層厚度除以該晶粒尺 寸。類似地,並聯配置的數量被定義為層面積除以晶粒 尺寸的平方。 099134645 表單編號A0101 第44頁/共66頁 1003059622-0 201120917 採用展現IBBL效應(例如,pBBL效應)的介電材料的 電容器的整體電容可藉由變化長度、寬度、厚度、以及 於電容器中層的數量而受到管理,位在用於大約〇丨微米 晶粒尺寸的多層裝置中、具有大約! mF的整體電容以及 大約500 V操作電池電壓的電容器中可達成大約(1〇〇〇 J/ cc)的能量密度。展現IBBL效應(例如,pBBL效應) 的離子傳導介《可擁有大㈣,_的高有效介電係數 ,此對達2 MV/m的場強度而言都是不變的。 展現IBBL效應(例如,PBBL效應)、使用任一、或多 個電化學活性晶粒邊界材料(例如,於晶粒邊界處的電 化學活性晶粒邊界金屬氫氧化物(例:ι如:;,A〗(〇h)3 ))的 離子傳導介電質可在該電化學活性辱本邊界.材料組合物 以及該晶粒間產生電化學反應,以產生偽電容,這些反 應可產出增加的電容,捕捉電子載體,以及致能於較高 電壓下的操作。 展現IBBL效應(例如,PBBL效應)的離子傳導介電質 可致使有效介電係數增為三倍,此可藉由結合離子傳導 介電質(例如,已質子化介電質)的IBBL效應(例如, PBBL效應)以及於晶粒邊界處的電化學活性晶粒邊界材 料(例如,ai(oh)3)的電化學效應而發生。因此,當因 質子阻障效應而具有10, 〇〇〇的有效介電係數的已質子化 介電質被用來與於晶粒邊界處的電化學活性晶粒邊界材 料(例如,ai(oh)3)相結合時,在與大約0. 1微米一樣 小的介電晶粒尺寸下’該有效介電係數可增加至大約 30, 〇〇〇。大約2 V至大約5 V的過電位’以及於晶粒邊界 處大約InF的偽電容’以及大約300 F/g的特殊電容也 099134645 表單編號A0101 第45頁/共66頁 1003059622-0 201120917 可被達成’此可致能大約2伏特至大约5伏特的崩潰電壓 ,以及大約1 000 J/cc的靜電能量密度的達成。 【圖式簡單說明】 [0007] 第1圖:為於低頻時在已質子化Ba(zr Y )〇中 0.80.2 3 展現強化電容的阻障層電容器以及阻抗資料的示意圖; 第1A圖:表現於頻域中的介電質鬆弛的示意代表; 第2A圖以及第2B圖:顯示分別在質子化之前以及之 後,所測得之Ba(SC() (Tl〇.85^0.15^. 相關”電係數£ r以及耗損正切(t a n . d ); 第2C圖:為舉例_明介面質子電化學反應的示意圖 第3圖:顯示在藉由實例2的方法所產生的已質子化 Ba(Sc〇.i(Ti〇 85Zr〇 15)〇 9)〇3中,相關於活化能的晶 粒與晶粒邊界區域的有效阻抗; 第3 A圖:顯示利用循環伏特安培法進行測量時於 八1(01〇3_831^〇3晶粒邊界處的電荷轉移反應; 第4圖:顯示在藉由實例2的方法所產生的已質子化KeU where CPBBL is the capacitance associated with the PBBL effect, VDBBT is the voltage associated with the DDL. The PBBL effect, CpsEu(10) is the capacitance associated with the electrochemical phase, and ?OVERPOTENTIAL is the voltage associated with the electrochemical phase. PBBL CpSEUDO... and 〇VERJPG: TENTIAL· can control the degree of protonation of the dielectric (eg, BaTi〇3) and the electrolytically active grain boundary material at the grain boundaries (eg, A1(〇h)) The thickness of the layer is managed. The $degree of the electrolytically active grain boundary material layer is dependent on the intrinsic value of the CPSEUD0 and ^OVERPOTENTIAL of the grain boundary material. 电解The electrolytic capacitance of the dielectric grain boundary-dielectric unit is the overall capacitance 曰ίέ jL · P — 疋a OVERALL CEFF (#PARALLEL/#SERIES) and 疋, where #PARALLEL represents the number of electrolytically active grain boundaries _ dielectric units in the parallel architecture, and #seriesr table electrolytically active grain boundaries - mustard The number of units in the tandem architecture. Electrolytic active grain boundaries in series configuration - the number of dielectric cells and the number of electrolytically active grain boundaries in a parallel configuration - the number of dielectric cells can be controlled by grain size, layer area, and layer thickness. The number of series configurations is defined as a function of layer thickness and grain size, i.e., the number of 'series configurations is defined as the layer thickness divided by the grain size. Similarly, the number of parallel configurations is defined as the layer area divided by the square of the grain size. 099134645 Form No. A0101 Page 44 of 66 1003059622-0 201120917 The overall capacitance of a capacitor using a dielectric material exhibiting an IBBL effect (eg, pBBL effect) can be varied by varying length, width, thickness, and number of layers in the capacitor. Managed, it is located in a multi-layer device for approximately 〇丨 micron grain size, with approximately! An energy density of approximately (1 〇〇〇 J/cc) can be achieved in the overall capacitance of the mF and in a capacitor operating at approximately 500 V of battery voltage. The ion conduction mediator that exhibits the IBBL effect (eg, the pBBL effect) can have a large (four), _ high effective dielectric constant, which is constant for field strengths up to 2 MV/m. Demonstrating IBBL effects (eg, PBBL effects), using any one or more electrochemically active grain boundary materials (eg, electrochemically active grain boundary metal hydroxides at grain boundaries (eg, ι eg:; , A ((h)3)) of the ion-conducting dielectric can produce an electrochemical reaction between the electrochemically active boundary of the material composition and the grain to generate pseudo-capacitance, which can increase the output Capacitance, capture of electronic carriers, and operation at higher voltages. An ion-conducting dielectric exhibiting an IBBL effect (eg, a PBBL effect) can increase the effective dielectric constant by a factor of three, which can be achieved by combining the IBBL effect of an ion-conducting dielectric (eg, protonated dielectric) ( For example, the PBBL effect) and the electrochemical effect of electrochemically active grain boundary material at the grain boundaries (eg, ai(oh)3) occur. Therefore, when a protonated dielectric having an effective dielectric constant of 10, due to the proton blocking effect, is used to interact with the electrochemically active grain boundary material at the grain boundary (for example, ai(oh) 3) When combined, the effective dielectric constant can be increased to about 30, 在 at a dielectric grain size as small as about 0.1 micron. An overpotential of approximately 2 V to approximately 5 V and a pseudocapacitance of approximately InF at the grain boundary and a special capacitance of approximately 300 F/g are also 099134645 Form No. A0101 Page 45 / Total 66 Page 1003059622-0 201120917 Can be Achieving 'this can result in a breakdown voltage of about 2 volts to about 5 volts, and an electrostatic energy density of about 1 000 J/cc. [Simple description of the diagram] [0007] Fig. 1 is a schematic diagram showing the barrier layer capacitor and impedance data showing the reinforced capacitor in the protonated Ba(zr Y ) 0.8 at low frequencies; Figure 1A: A schematic representation of dielectric relaxation in the frequency domain; 2A and 2B: showing Ba(SC() (Tl〇.85^0.15^. correlation) measured before and after protonation, respectively. "Electrical coefficient £ r and loss tangent (tan.d); Figure 2C: Schematic diagram for example - proton proton electrochemical reaction. Figure 3: shows protonated Ba (Sc) produced by the method of Example 2. 〇.i(Ti〇85Zr〇15)〇9)〇3, the effective impedance of the grain and grain boundary regions associated with the activation energy; Figure 3A: shows the measurement using cyclic voltammetry at 8 1 (01〇3_831^〇3 charge transfer reaction at grain boundaries; Fig. 4: shows protonation produced by the method of Example 2

Ba(Sc〇.i(Tlo.85Zro.i5)o.9)03 中’低頻以及高頻時的 有效介電係數的溫度穩定性; 第5圖:顯示藉由實例2的方法所產生的已質子化Ba(Sc〇.i(Tlo.85Zro.i5)o.9)03 'The temperature stability of the effective dielectric constant at low frequencies and high frequencies; Fig. 5: showing the results produced by the method of Example 2 Protonation

Ba(Sc01(Ti〇 85Zr〇15)〇 9)〇3的極化與電場的比較圖 ;以及 第6圖:為在額外存在有wA1(〇H)3的電化學活性晶 粒邊界材料時,於展現PBBL效應介電質中之電化學機制 的功能性的示意圖。 099134645 表單編號A0101 第46頁/共66頁 1003059622-0 201120917 【主要元件符號說明】 [0008]無 Ο ❹ 099134645 表單編號A0101 第47頁/共66頁 1003059622-0Comparison of polarization and electric field of Ba(Sc01(Ti〇85Zr〇15)〇9)〇3; and Fig. 6: when electrochemically active grain boundary material additionally exists with wA1(〇H)3 Schematic representation of the functionality of the electrochemical mechanism in the PBBL effect dielectric. 099134645 Form No. A0101 Page 46 of 66 1003059622-0 201120917 [Description of main component symbols] [0008] No Ο ❹ 099134645 Form No. A0101 Page 47 of 66 1003059622-0

Claims (1)

201120917 七、申請專利範圍: 1 · 一種介電組合物,包括一化合物,分子式為(M,) (A 1 -χ ,)χ][(Μ” )y(C” ,其中 0.0 SxS0.4 ’ 〇.〇〇sbS0.99,0.00SyS0.40,O.OOg z S 0. 40 ’ M 為Ba、Mg、Ca、Sr、Pb及其混合物,A’ 為 K、Na ' Li、Ag及其混合物,μ· ’選自下列所組成之群組 :Ti ' Zr、Hf、Ce、Sn、(Mg1/3,Nb2/3)、 (Zn1/3,Nb2/3) 、(Sci/2,Ta1/2)及其混合物 ’ B,' 選自 Sc、A1、Y、La、Fe、Yb、Ho、Tm、Sb、Sm、Nd、Gd、 Er、Pr、Mo、Dy及其混合物所組成之群組,(:”選自v、 Μη ' Cr、Fe、Ni、Cu、Zn、Ca、Mg及其混合物所組成之 群組’(V0)5代表氧空缺,以及d s0. 5x + 0. 5y + z。 2 . —種已質子化介電化合物,受以下分子式的定義[(M, )ι-χ(α’)χ](Μ”)…(B”)y(c”)z]wv〇VH • )2h,其中 O.OSxSO.4 ’ 0.00SbS0.99,O.OOgyg .0. 40,0. 00 $ z S 〇. 40,、;’ 選自'B'a、_Mg、Ca、Sr、Pb及 其混合物所組成之群組,Α·選自K、Na、Li、Ag及其混合 物所組成之群組,Μ’ ·選自Ti、Zr、Hf、Ce、Sn、 (Mg1/3,Nb2/3)、(、/3屬2/3)、(SCi/2,Tai/2)及其 混合物所組成之群組,B’,選自Sc、A1、Y、La、Fe、Yb 、Ho、Tm、Sb、Sm、Nd、Gd、Er、Pr、Mo、Dy及其混 合物所組成之群組,以及C.選自V ' Μη ' Cr ' Fe、Ni、 Cu、Zn、Ca、Mg及其混合物所組成之群組,(v〇) ^代表 氧空缺,以及0· 00&lt;hS 6 SO. 5x+0. 5y + z。 3 ·如申請專利範圍第2項所述由分子式定義的已質子化介電 099134645 表單編號A0101 第48頁/共66頁 1003059622-0 201120917 化合物’其中,該化合物為已質子化 Ba(SC〇-l(Ti〇.85Zr〇-15)〇.9)〇3° 如申請專利範圍第2項所述的分子式定義的已質子化介電 化合物’其中,該化合物為已質子tBa(s Ti )〇 0.1 0.9 3 .如申請專利範圍第2項所述的分子式定義的已質子化介電 化合物,其中,該化合物為已質子化 Ca(SC〇.l(Ti〇.85Zr〇15)〇.9)〇3°201120917 VII. Patent application scope: 1 · A dielectric composition comprising a compound of the formula (M,) (A 1 -χ ,)χ][(Μ" )y(C" , where 0.0 SxS0.4 ' 〇.〇〇sbS0.99, 0.00SyS0.40, O.OOg z S 0. 40 ' M is Ba, Mg, Ca, Sr, Pb and mixtures thereof, A' is K, Na ' Li, Ag and mixtures thereof , μ· ' is selected from the group consisting of Ti ' Zr, Hf, Ce, Sn, (Mg1/3, Nb2/3), (Zn1/3, Nb2/3), (Sci/2, Ta1/ 2) and its mixture 'B,' is selected from the group consisting of Sc, A1, Y, La, Fe, Yb, Ho, Tm, Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy and mixtures thereof , (:" selected from the group consisting of v, Μη 'Cr, Fe, Ni, Cu, Zn, Ca, Mg, and mixtures thereof, '(V0)5 represents oxygen vacancies, and d s0. 5x + 0. 5y + z. 2 . A protonated dielectric compound, defined by the following formula [(M, )ι-χ(α')χ](Μ")...(B")y(c")z]wv〇 VH • )2h, where O.OSxSO.4 ' 0.00SbS0.99, O.OOgyg .0. 40,0. 00 $ z S 〇. 40,,;' from 'B'a, _Mg, Ca, Sr , Pb a group consisting of a mixture selected from the group consisting of K, Na, Li, Ag, and mixtures thereof, selected from the group consisting of Ti, Zr, Hf, Ce, Sn, (Mg1/3, Nb2/ 3), (, /3 genus 2/3), (SCi/2, Tai/2) and a mixture thereof, B', selected from Sc, A1, Y, La, Fe, Yb, Ho, a group consisting of Tm, Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy, and mixtures thereof, and C. selected from V ' Μ η 'Cr 'Fe, Ni, Cu, Zn, Ca, Mg, and The group consisting of the mixture, (v〇) ^ represents oxygen vacancies, and 0· 00&lt;hS 6 SO. 5x+0. 5y + z. 3 · Protons defined by the formula as described in claim 2 Dielectric 099134645 Form No. A0101 Page 48 of 66 1003059622-0 201120917 Compound 'where the compound is protonated Ba(SC〇-l(Ti〇.85Zr〇-15)〇.9)〇3° The protonated dielectric compound defined by the formula of claim 2, wherein the compound is protonated tBa(s Ti ) 〇 0.1 0.9 3 , as defined in the formula of claim 2 Protonated dielectric compound, , The protonated compounds as Ca (SC〇.l (Ti〇.85Zr〇15) 〇.9) 〇3 ° .如申請專利範圍第2項所述的分子式定義的已質子化介電 化合物’其中,該化合物為已質子化 Pb(5ScO ,(Tift Zr ) )0 » •1 0.85 0.1 5 ^0. 9;υ3 如申請專利範圍第2項所述的分子式定義的已質子化介電 化合物’其中’該化合物為已質子tBa(Zr γ )〇。 0.8 0.2 3 一種已質子化介電化合物,受以下分子式的定義(八a’ 1 -X χ)(Β,_ Β’ ’ c’ ’ )〇 Η* ,装Φ 1 y z y ζ 3 (x + y + 2z)具中 0.00&lt;x&lt;0.40 ’ 〇.〇〇&lt;y&lt;〇.4〇 ’ 以及〇, 〇〇i&lt;z&lt;〇. 40,A選 ❹ 自Ba ' Mg、Ca、Sr、Pb及其混合物所组成之群組,A’選 自K、Na、Li、Ag及其混合物所組成之群組,b選自Ti、 Zr、Hf、Sn、(Mgi/3,Nb2/3)、(Zni/3,Nb2/3)、 (Sci/2, Ta1/2)及其混合物所組成之群組,b,’選自Sc、Y 、La、Fe、Yb、Ho、Tm、Sb、Sm、Nd、Gd、Er、Pr、 Mo、Dy及其混合物所組成之群組,c”,選自v、Mn、Cr ' Fe ' Ni、Cu、Ca、Mg及其混合物所組成之群組,以及 Η*為一質子。 • 一種已質子化化合物的製造方法,該化合物受以下分子式 的定義[(M,) (A,)](M”) (B,,)(C,,)]〇, 1 χ χ 1 -y~z y ζ 3- 表單編號Α0101 第49頁/共66頁 1003059622-0 201120917 5+h(V〇) &lt;5 (H · )2h ’ 其中〇. 00$Χ$〇· 40 ’ 0· 00$b$ 0.99,0.00SyS0.40,0.0〇SzS〇.4〇,M 選自 Ba、 Mg、Ca、Sr、Pb及其混合物所組成之群組,a•選自κ、 Na、Li、Ag及其混合物所組成之群組,μ…選自Ti、Zr 、Hf、Ce、Sn、(Mgl/3,Nb2/3)、……,〜)、 (SCl/2, Tai/2)、以及其混合物所組成之群組’ B',選自 Sc、A1、Y、La、Fe、Yb、Ho ' Tm ' Sb、Sm、Nd、Gd、 Er、Pr、Mo、Dy及其混合物所組成之群組,選自v、 Μη、Cr、Fe、Ni、Cu、Zn、Ca、Mg及其混合物所組成之 群組,(V0)5代表氧空缺,6 g x+〇. 5y + z,H*為一 質子’以及0. 00&lt;hS δ S 0· 5x + 0. 5y+z,該方法包括: 形成包括Ba,Ti的氧化物、或氧化物前驅物以及摻質氧 化物的一混合物; 將該混合物與一液體結合,以形成一漿狀物; 鍛燒該漿狀物,以形成一已鍛燒產物; 研磨該已鍛燒產物,以產生一已研磨粉末; 壓縮該已研磨粉末,以形成一預形成物; 於大約100(TC至大約1500°C的一溫度下燒結該預形成物 ,以產生一已燒結產物;以及 將該已燒結產物暴露於大約0.1 pSI至大約1〇〇 PSI、大 約20 C至大約70(TC的蒸汽下1小時至大約24小時。 .一種合成材料,包括用於產生一 IBBL效應的一介電材料 以及一電解質,其中,該電解質選自離聚物電解質、固態 質子電解質及其混合物所組成之群組。 11 如申請專利範圍第10項所述的合成材料,其中,該離聚物 電解質選自四氟乙稀-全氟-3. 6 -二氧雜-4-甲基-7-辛婦 099134645 表單編號A0101 第50頁/共66頁 1003059622-0 201120917 硫酸共聚物、聚(乙烯共甲基丙婦酸、聚乙稀氧化物、聚 偏一氟乙烯及其混合物所組成之群組。 12 .如申請專利範圍第1〇項所述的合成材料,其中,該固態離 聚物電解質選自層狀雙氫氧化物、離子傳導破璃、傳導陶 兗及其混合物所組成之群組。 13.如申請專利範圍第1〇項所述的合成材料其中該介電材 料選自鋰離子傳導介電材料、銀離子傳導介電材料、鈉離 子傳導介電材料、氧離子傳導介電材料及其結合所組成之 群組。 0 14 ·如申請專利範圍第1〇項所述的合成材料,其中,該介電材 料分子式包括分子式為(Li,.:jQT.i..〇3.的一鐘離子傳導介電 材料’其中Μ選自La、Ce、Pr、Nd、以及其結合所組成之 群組。 15 .如申請專利範圍第1〇項所述的合成材料,其中,該介電材 料分子式包括分子式um〇4的一鋰離子傳導介電材料,其 中Μ為選自下列組成群組的一過渡金屬t勺急麻:c〇、、 g Fe、Ni、Cu、Cr、V、或其結合。 16 .如申請專利範圍第10項所述的合成材料,其中,該介電材 料包括Li傳導beta型氧化銘(Li conducting beta-alumina)。 17 .如申請專利範圍第10項所述的合成材料,其中,該介電材 料選自 Agl、Ag2Te、Ag2Se、AgSBr、Ag3SI、RbAg4I5 、KAg4I5、NH4Ag4I5、K 卜xCsX Ag4I5(其中 0&lt;x&lt;1)、 Rln-xCsX Ag4I5(其中 〇&lt;x&lt;i)、CsAg4ClBr2I2、 (其中 〇&lt;x&lt;l)、Ag6I4W〇4 及其混合物所 組成之群組。 099134645 表單編號A0101 第51頁/共66頁 1003059622-0 201120917 18 19 . 20 . 21 . 22 . 23 . 099134645 如申請專利範圍第Π)項所述的合成材料,其中,該介電树 料選自NaC1、Na2S、Na ^氡化銘及其混合物所組成之 群組。 申請專職㈣1Q項所述的合成材料,其中,該介電材 料選自 Bi2(MeyVw)〇6x(其中 Me 選自 Cu、c〇、Zn、 ^,,,,或其結合所組成之群組)、 2(CV 1V0.9)06-x、(1-x)Ca〇 xA〇2(其中 A選自 Zr、 Lee或其結合所組成之群組)、〇遍Zr〇The protonated dielectric compound defined by the formula of claim 2, wherein the compound is protonated Pb (5ScO , (Tift Zr ) ) 0 » •1 0.85 0.1 5 ^0. 9; Υ3 The protonated dielectric compound as defined in the formula of claim 2, wherein the compound is protonated tBa(Zr γ )〇. 0.8 0.2 3 A protonated dielectric compound, defined by the following formula (8a' 1 -X χ)(Β,_ Β' ' c' ' )*, loaded with Φ 1 yzy ζ 3 (x + y + 2z) with 0.00&lt;x&lt;0.40 ' 〇.〇〇&lt;y&lt;〇.4〇' and 〇, 〇〇i&lt;z&lt;〇. 40,A selection from Ba 'Mg, Ca, Sr, A group consisting of Pb and a mixture thereof, A' is selected from the group consisting of K, Na, Li, Ag, and mixtures thereof, and b is selected from the group consisting of Ti, Zr, Hf, Sn, (Mgi/3, Nb2/3) , (Zni/3, Nb2/3), (Sci/2, Ta1/2) and a mixture thereof, b, 'selected from Sc, Y, La, Fe, Yb, Ho, Tm, Sb, a group consisting of Sm, Nd, Gd, Er, Pr, Mo, Dy, and mixtures thereof, c", selected from the group consisting of v, Mn, Cr 'Fe 'Ni, Cu, Ca, Mg, and mixtures thereof And Η* is a proton. • A method for producing a protonated compound, which is defined by the following formula [(M,) (A,)] (M") (B,,) (C,,)] 〇, 1 χ χ 1 -y~zy ζ 3- Form No. 1010101 Page 49/Total 66 Page 1003059622-0 201120917 5+h(V〇) &lt;5 (H · )2h ' where 〇. 00$Χ$〇· 40 ' 0· 00$b$ 0.99, 0.00SyS0.40, 0.0〇SzS〇.4〇, M is selected from Ba, Mg, Ca, a group consisting of Sr, Pb, and a mixture thereof, a• selected from the group consisting of κ, Na, Li, Ag, and a mixture thereof, μ... selected from Ti, Zr, Hf, Ce, Sn, (Mgl/3) , Nb2/3), ..., ~), (SCl/2, Tai/2), and a group 'B' composed of a mixture thereof, selected from Sc, A1, Y, La, Fe, Yb, Ho' a group consisting of Tm ' Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy and mixtures thereof, selected from the group consisting of v, Μη, Cr, Fe, Ni, Cu, Zn, Ca, Mg and mixtures thereof In the group, (V0)5 represents oxygen vacancies, 6 g x+〇. 5y + z, H* is a proton ' and 0. 00&lt;hS δ S 0· 5x + 0. 5y+z, the method includes: forming Including a salt of Ba, Ti or an oxide precursor and a mixture of dopant oxides; combining the mixture with a liquid to form a slurry; calcining the slurry to form a calcined product a product; grinding the calcined product to produce a ground powder; compressing the ground Finally, forming a pre-form; sintering the preform at a temperature of about 100 (TC to about 1500 ° C to produce a sintered product; and exposing the sintered product to about 0.1 pSI to about 1 〇〇PSI, about 20 C to about 70 (TC steam for 1 hour to about 24 hours. A composite material comprising a dielectric material for producing an IBBL effect and an electrolyte, wherein the electrolyte is selected from the group consisting of an ionomer electrolyte, a solid proton electrolyte, and mixtures thereof. The synthetic material according to claim 10, wherein the ionomer electrolyte is selected from the group consisting of tetrafluoroethylene-perfluoro-3. 6-dioxa-4-methyl-7-simly 099134645 No. A0101 Page 50 of 66 1003059622-0 201120917 Group of sulphuric acid copolymer, poly(ethylene methionine, polyethylene oxide, polyvinylidene fluoride and mixtures thereof. The synthetic material of claim 1, wherein the solid ionomer electrolyte is selected from the group consisting of layered double hydroxide, ion conductive glass, conductive ceramics, and mixtures thereof. The composite material according to the first aspect of the invention, wherein the dielectric material is selected from the group consisting of a lithium ion conductive dielectric material, a silver ion conductive dielectric material, a sodium ion conductive dielectric material, an oxygen ion conductive dielectric material, and a combination thereof. The composition of the composition according to the first aspect of the invention, wherein the molecular formula of the dielectric material comprises one ion conduction of (Li,.:jQT.i..〇3. Dielectric material 'where Μ is selected from La, Ce, Pr, Nd, The composite material according to the first aspect of the invention, wherein the dielectric material comprises a lithium ion conductive dielectric material of the formula um〇4, wherein Μ is selected A synthetic metal t-spoon from the following group of groups: c〇, g Fe, Ni, Cu, Cr, V, or a combination thereof. 16. The synthetic material according to claim 10, wherein The dielectric material includes Li conducting beta-alumina. The composite material according to claim 10, wherein the dielectric material is selected from the group consisting of Agl, Ag2Te, Ag2Se, AgSBr, Ag3SI, RbAg4I5, KAg4I5, NH4Ag4I5, KbxCsX Ag4I5 (where 00&lt;x&lt;1), Rln-xCsX Ag4I5 (where 〇&lt;x&lt;i), CsAg4ClBr2I2, (where 〇&lt;x&lt;l), Ag6I4W〇4 And a mixture of the same. 099134645 Form No. A0101 Page 51 of 66 1003059622-0 201120917 18 19 . 20 . 21 . 22 . 23 . 099134645 The synthetic material as described in the scope of the patent application, Wherein the dielectric tree material is selected from the group consisting of NaC1 A group consisting of Na2S, Na ^ 氡化铭, and mixtures thereof. Apply for a full-time (4) synthetic material as described in 1Q, wherein the dielectric material is selected from the group consisting of Bi2(MeyVw)〇6x (where Me is selected from Cu, c〇, a group consisting of Zn, ^, ,, or a combination thereof, 2 (CV 1V0.9) 06-x, (1-x)Ca〇xA〇2 (wherein A is selected from Zr, Lee or a combination thereof) Group of groups), 〇 Z Zr〇 '〇.〇4Y2〇3-〇.92Zr〇2^ (l-x)B2〇3_xZr〇2(^〇tU^ La Sm、Y、Yb、Sc、Ga、或其結合所組成之群組,其 中〇&lt;χ&lt;1)所組成之群組。 -種合成材料’包括用於產生一舰效應的一介電材料 以及位於該介電材料的晶粒邊界處的_電化學活性材料, 其中該介電材料為選自下顺成群組的_離子傳導介電材 質’包括.轉子傳導介電材料、銀離子傳導介電材料、 鈉離子傳導介電材料、氧離卿導介電_及其結合。 如申請專利範圍第19項所述的合成材輪,其中,該介電材'〇.〇4Y2〇3-〇.92Zr〇2^ (lx)B2〇3_xZr〇2(^〇tU^ La Sm, Y, Yb, Sc, Ga, or a combination thereof, where 〇&lt;; χ &lt;1) group. - a synthetic material 'includes a dielectric material for generating a ship effect and an electrochemically active material at a grain boundary of the dielectric material, wherein the dielectric material is selected from the group consisting of The ion-conducting dielectric material includes: a rotor conductive dielectric material, a silver ion conductive dielectric material, a sodium ion conductive dielectric material, an oxygen ion conductive dielectric, and combinations thereof. The composite material wheel according to claim 19, wherein the dielectric material 料刀子式包括分子式為(Li,M)Ti〇3的一组離子傳導介電 材料,其中Μ選自La、Ce、Pr、Nd、以及其結合所組成之 群組。 如申請專利範圍第19項所述的合成材料,其中,該介電材 料分子式包括分子式LiM〇4的一鋰離子傳導介電材料,其 中Μ為選自下列組成群組的一過渡金屬,包括:c〇、、 Fe ' Ni、Cu、Cr、V、或其結合。 如申請專利範圍第19項所述的合成材料,其中,該介電材 料包括Li傳導beta型氧化紹。 1003059622-0 表單編號A0101 第52頁/共66頁 201120917 24 包括用於產生一 IBBL效應的一介電材料 一種合成材料 以及位於該介電材料的晶粒邊界處的—電化學活性材料 其中,該介電材料為選自下列組成群組的一 Ag+傳導介電 材料包括.Agl、Ag2Te、Ag2Se、AgSBr ' Ag3SI、 RbAg4l5、、NW5、\,&quot;^15(3其中 〇&lt;^&lt;1)、肋1-5((:以八£415(其中〇&lt;乂&lt;1)、 CsAg4CiBr2I2、CsAg4Br 卜 (其中 〇&lt;χ&lt;1)、 Ag6I/〇4及其混合物。 25 . —種合成材料,包括用於產生一 IBBL效應的一介電材料 、及位於該&quot;電材料的晶雜邊养:處的&quot;..貧化學活性材料, 其中,該介電材料為選自下列組成群組的一Na+傳導介電 材料,包括.NaCl、Na2S、Na召-氧化鋁、以及其混合 物。 26. —種合成材料,包括用於產生一 IBBL效應的一介電材料 以及位於該介電材料的晶粒邊界處的一電化學活性材料, 其中,該介電材料為選自下列組成群組的_1〇2-傳導介電 材料,包括:Bi2(MeyVl y)0卜χ(其中Me選自Cu、C。、 Zn ' Ge、Ca、Sr、Ni、Fe、Μη、Mg或其結合所組成群組 )、Βί2((:ινΛ·9)〇6_χ、(卜x)Ca0_xA02(其中A選自 Zr ' Hf ' Th、Ce或其結合所組成群組)、 〇.2CaO_〇 8Zr〇2、0.〇4Υ2〇3-0· 92Zr〇2、 (1_x)B203-xZr02(其中 B 選自 La、Sm、Y、Yb、Sc、Ga 、或其結合,其中,0&lt;X&lt;1所組成群組)。 27 .如申請專利範圍第i9_26項其中任一所述的合成材料,其 中,該電化學佘性材料選自下列組成群組,包括: 099134645 A1(0H)3 、 Mg(OH)2 、 Ca(OH)2 、 Sr(OH)2 、 表單編號A0101 第53頁/共66頁 1003059622-0 201120917 Ni(〇H)2、c〇(0H)2、Li2〇、Na2〇、K2〇、分子式 [M2 + i-xm3+x(〇H)2]x+[Az-x/z · πΗ20]χ_的層狀雙氫氧化 物(其中 0.1$χ$〇.5,1&lt;ζ&lt;3,以及2SnS4,Μ2 +為 Mg 、Ni、Zn、Co、Fe ' Ca、Μη及其結合,M3 +選自 A卜 Fe 2- 、Cr、Μη及其結合所組成群組,A選自C0q2_、SO 〇 之 〇Η- ' C厂以及其結合所組成群組)、以及分子式 -χΜ3+χ⑽2](2X—1) + [AZ—(2x—1)/z [1T 雙氫氧化物(其中A選自C0Q2_、SO A j .nH2〇]x^的層狀 — i or、cr 及其 結合所組成群組,2$11$4,0.2^$0.4;1&lt;2&lt;3,其 中M+選自Li、Na、K、Ag、以及其結合所組成群組,以及 Μ選自Al、Fe、Cr、Μη及其結合所組成群組)。 28 29 099134645 一種合成材料,包括用於產生一 IBBL效應的一已質子化 介電質以及位於該已質子化介電質的晶粒邊界處的一電化 學活性材料,其中,該電化學活性材料選自下列組成群組 [Αζ-χ/ζ.ηΜ] 包括:分子式[M2' M3+ (OH) 1Χ+ 1-x x y 2 的層狀雙氫氧化物(其中0.1$χ$0.5,1&lt;z&lt;3,M2 +選自 Mg ' Νι、Zn、Co、Fe、Ca、Μη及其結合所組成群組, Μ3 +選自Al、Fe、Cr、Μη及其結合所組成群組,Α選自 C032、S042-、〇『、C「以及其結合所組成群組以及 nS4),以及分子式 [M i-xm3+x(oh)2](2x-1)+[Az_(2X-i)/z · ηΗ2〇]χ-的層狀 雙氫氧化物(其中Α選自C〇32—、s〇42—、0H-、C1-及其 結合所組成群組,2$η$4,0.2sd4,1&lt;z&lt;3,M+ 選自Li、Na、K、Ag、以及其結合所組成群組,以及M3 + 選自Al、Fe、Cr、Μη及其結合所組成群組)。 表單編號A0101 如申請專利範圍第28項所述的合成材料,其中,該已質子 第 54 頁/共 66 頁 1003059622- 201120917 化介電質選自已摻雜鈣鈦礦、未摻雜鈣鈦礦'已摻雜鎢青 鋼、未摻雜鎢青銅、已摻雜焦綠石、未摻雜焦綠石、層狀 鈣鈦礦、以及介電係數大約50或更多的氧化物所組成群組 如申印專利範圍第28項所述的合成材料,其中,該已質子 化介電質為一鈣鈦礦,其分子式定義為[(M,)ix(A, )x](M” w,vc” )z]〇…(v〇v:’)2h,其 中H*為併入一氧位置的一質子,以及〇 〇〇&lt;h$占s 〇. 5x + 〇. 5y + z,其中 〇.〇sxs〇.4,00〇sbs〇99, 〇. OOSySO. 40 ’ 〇· ooszgo. 40,Μ’ 選自 Ba、Mg、Ca 、Sr、Pb及其混合物所組成群組,A,選自κ、Na、Li、 Ag及其混合物所組成群組,選^Ti、Zr% 、Ce、 Sn、(Mg1/3,Nb2/3)、(Zni/3,Nb2/3)、 (Sc1/2, Ta1/2)及其混合物所組成群組,B,’選自Sc、A1 、Y、La、Fe、Yb、Ho、Tm、Sb、Sm、Nd、Gd、Er、Pr 、Mo、Dy及其混合物所組成群組,以及jt自v、Mn、 Cr、Fe、Ni、Cu、Zn、Ca、Mg及其混合物所組成群組, 以及(vo)5代表氧空缺。 31 . —種能量儲存裝置,包括如申請專利範圍第1-7項,第 9-26項’以及第28-30項的其中任一所述的介電材料。 32.如申請專利範圍第31項所述的裝置,其中,該裝置為電容 器以及電池的其中任一。 33 .如申請專利範圍第32項所述的裝置,其中,該裝置為一電 容器,包括用於產生一 IBBL效應的一介電材料以及複數 個金屬電極,該等金屬電極使用選自下列組成群組的金屬 ,包括:Cu、Al、Au、Ag、Ni、Co、Fe、Cr、Pt、Pd 099134645 表單編號A0101 第55頁/共66頁 1( 201120917 、其合金以及其混合物。 34 .如申請專利範圍第33項所述的裝置,其中,至少一金屬電 極具與該介電材料中的一離子種類一起致能偽電容產生的 電化學活性。 35 . 一種能量產生裝置,包括如申請專利範圍第1-7項,第 10-26項,以及第28-30項的其中任一所述的介電材料。 36 .如申請專利範圍第33項所述的裝置,其中,該裝置為一燃 料電池。 099134645 表單編號A0101 第56頁/共66頁 1003059622-0The knife type includes a group of ion-conducting dielectric materials of the formula (Li,M)Ti〇3, wherein the lanthanum is selected from the group consisting of La, Ce, Pr, Nd, and combinations thereof. The synthetic material according to claim 19, wherein the dielectric material comprises a lithium ion conductive dielectric material of the formula LiM〇4, wherein the germanium is a transition metal selected from the group consisting of: C〇, Fe 'Ni, Cu, Cr, V, or a combination thereof. The synthetic material of claim 19, wherein the dielectric material comprises Li-conducting beta-type oxidation. 1003059622-0 Form No. A0101 Page 52 of 66 201120917 24 includes a dielectric material for generating an IBBL effect, a synthetic material, and an electrochemically active material at the grain boundary of the dielectric material, wherein The dielectric material is an Ag+ conductive dielectric material selected from the group consisting of: Agl, Ag2Te, Ag2Se, AgSBr 'Ag3SI, RbAg4l5, NW5, \, &quot;^15(3 wherein 〇&lt;^&lt;1 ), ribs 1-5 ((: with eight £415 (where 〇 &lt; 乂 &lt; 1), CsAg4CiBr2I2, CsAg4Br 卜 (where 〇 &lt; χ &lt; 1), Ag6I / 〇 4 and mixtures thereof. a composite material comprising a dielectric material for generating an IBBL effect, and a &quot;. lean chemically active material located at the crystal material of the &quot;electric material, wherein the dielectric material is selected from the group consisting of a group of Na+ conductive dielectric materials, including .NaCl, Na2S, Na-alumina, and mixtures thereof 26. A synthetic material comprising a dielectric material for generating an IBBL effect and located in the dielectric An electrochemically active material at the grain boundary of the electrical material, wherein The dielectric material is a 〇2-electroconductive dielectric material selected from the group consisting of Bi2(MeyVl y)0 χ (wherein Me is selected from Cu, C., Zn 'Ge, Ca, Sr, a group consisting of Ni, Fe, Μη, Mg, or a combination thereof, Βί2((:ινΛ·9)〇6_χ, (Bu x)Ca0_xA02 (wherein A is selected from the group consisting of Zr 'Hf 'Th, Ce, or a combination thereof) Group), 〇.2CaO_〇8Zr〇2, 0.〇4Υ2〇3-0·92Zr〇2, (1_x)B203-xZr02 (wherein B is selected from La, Sm, Y, Yb, Sc, Ga, or And a composite material according to any one of the preceding claims, wherein the electrochemically inert material is selected from the group consisting of: 099134645 A1(0H)3 , Mg(OH)2 , Ca(OH)2 , Sr(OH)2 , Form No. A0101 Page 53 of 66 1003059622-0 201120917 Ni(〇H)2, c〇(0H 2, Li2〇, Na2〇, K2〇, layered double hydroxide of the formula [M2 + i-xm3+x(〇H)2]x+[Az-x/z · πΗ20]χ_ (where 0.1$ χ$〇.5,1&lt;ζ&lt;3, and 2SnS4, Μ2 + is Mg, Ni, Zn, Co, Fe ' Ca, Μη and their combination, M3 + It is selected from the group consisting of A, Fe 2- , Cr, Μη and combinations thereof, A is selected from the group consisting of C0q2_, SO 〇 〇Η - 'C factory and its combination group), and the molecular formula - χΜ3 + χ (10) 2] ( 2X-1) + [AZ-(2x-1)/z [1T double hydroxide (where A is selected from the group consisting of C0Q2_, SO A j .nH2〇]x^) - i or, cr and their combination Group, 2$11$4, 0.2^$0.4; 1&lt;2&lt;3, wherein M+ is selected from the group consisting of Li, Na, K, Ag, and combinations thereof, and Μ is selected from the group consisting of Al, Fe, Cr, Μη and Combine the group of groups). 28 29 099134645 A synthetic material comprising an aprotonated dielectric for generating an IBBL effect and an electrochemically active material at a grain boundary of the protonated dielectric, wherein the electrochemically active material The group consisting of the following group [Αζ-χ/ζ.ηΜ] includes: a layered double hydroxide of the formula [M2' M3+ (OH) 1Χ+ 1-xxy 2 (where 0.1$χ$0.5,1&lt;z&lt;3 M2 + is selected from the group consisting of Mg ' Νι, Zn, Co, Fe, Ca, Μη and combinations thereof, and Μ3 + is selected from the group consisting of Al, Fe, Cr, Μη and combinations thereof, and is selected from C032, S042-, 〇『, C" and its combination group and nS4), and the formula [M i-xm3+x(oh)2](2x-1)+[Az_(2X-i)/z · ηΗ2层]χ-layered double hydroxide (wherein Α is selected from the group consisting of C〇32—, s〇42—, 0H-, C1- and combinations thereof, 2$η$4, 0.2sd4, 1&lt;z&lt;lt 3, M+ is selected from the group consisting of Li, Na, K, Ag, and combinations thereof, and M3 + is selected from the group consisting of Al, Fe, Cr, Μη, and combinations thereof. Form No. A0101 The synthetic material described in item 28 , wherein the proton has been selected from the group consisting of doped perovskite, undoped perovskite, tungsten-doped steel, undoped tungsten bronze, and doped a synthetic group of a pyrochlore, an undoped pyrochlore, a layered perovskite, and an oxide having a dielectric constant of about 50 or more, such as the synthetic material described in claim 28, wherein The protonated dielectric is a perovskite, and its molecular formula is defined as [(M,) ix(A, )x](M" w, vc" )z]〇...(v〇v:') 2h, Where H* is a proton incorporated into an oxygen position, and 〇〇〇&lt;h$ 占 s. 5x + 〇. 5y + z, where 〇.〇sxs〇.4,00〇sbs〇99, 〇. OOSySO. 40 '〇· ooszgo. 40,Μ' is selected from the group consisting of Ba, Mg, Ca, Sr, Pb and mixtures thereof, A, selected from the group consisting of κ, Na, Li, Ag and mixtures thereof. Select a group consisting of ^Ti, Zr%, Ce, Sn, (Mg1/3, Nb2/3), (Zni/3, Nb2/3), (Sc1/2, Ta1/2) and mixtures thereof, B, 'Selected from Sc, A1, Y, La, Fe, Yb, Ho, Tm, Sb, Sm, Nd, Gd, Er, Pr, Mo, Dy Groups of mixtures thereof, and groups of jt from v, Mn, Cr, Fe, Ni, Cu, Zn, Ca, Mg, and mixtures thereof, and (vo) 5 represents oxygen vacancies. 31. An energy storage device comprising a dielectric material as described in any one of claims 1-7, 9-26, and 28-30. The device of claim 31, wherein the device is any one of a capacitor and a battery. 33. The device of claim 32, wherein the device is a capacitor comprising a dielectric material for generating an IBBL effect and a plurality of metal electrodes, the metal electrodes being selected from the group consisting of Group of metals, including: Cu, Al, Au, Ag, Ni, Co, Fe, Cr, Pt, Pd 099134645 Form No. A0101 Page 55 of 66 (201120917, alloys and mixtures thereof. 34. Application The device of claim 33, wherein the at least one metal electrode device together with an ion species in the dielectric material enables electrochemical activity generated by the pseudo capacitance. 35. An energy generating device comprising, as claimed in the patent application The device of any one of the preceding claims, wherein the device is a fuel, the device of claim 33, wherein the device is a fuel. Battery 099134645 Form No. A0101 Page 56 / Total 66 Page 1003059622-0
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114649527A (en) * 2022-02-24 2022-06-21 南京工业大学 Four-phase conductor proton conductor oxygen electrode material, preparation method and application
CN114976023A (en) * 2022-07-28 2022-08-30 江苏蓝固新能源科技有限公司 Conductor material, preparation method thereof, coated electrode material and battery

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114649527A (en) * 2022-02-24 2022-06-21 南京工业大学 Four-phase conductor proton conductor oxygen electrode material, preparation method and application
CN114976023A (en) * 2022-07-28 2022-08-30 江苏蓝固新能源科技有限公司 Conductor material, preparation method thereof, coated electrode material and battery
CN114976023B (en) * 2022-07-28 2022-09-30 江苏蓝固新能源科技有限公司 Conductor material, preparation method thereof, coated electrode material and battery

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