TW201100813A - Determining the zeta potential at inside surface of tube via the streaming potential in annular flow - Google Patents

Determining the zeta potential at inside surface of tube via the streaming potential in annular flow Download PDF

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TW201100813A
TW201100813A TW098120215A TW98120215A TW201100813A TW 201100813 A TW201100813 A TW 201100813A TW 098120215 A TW098120215 A TW 098120215A TW 98120215 A TW98120215 A TW 98120215A TW 201100813 A TW201100813 A TW 201100813A
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Taiwan
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potential
measuring
solution
tube
circular tube
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TW098120215A
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Chinese (zh)
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Ching-Jung Chuang
Juin-Yih Lai
Yi-Ping Fang
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Univ Chung Yuan Christian
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Priority to TW098120215A priority Critical patent/TW201100813A/en
Publication of TW201100813A publication Critical patent/TW201100813A/en

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Abstract

The present invention discloses a method for measuring the zeta potential at the tube inner surface. In the measuring cell, a reference cylinder is held coaxially inside the tube and a given solution is forced to flow through the annular space between the tube and the reference cylinder. The streaming potential induced by the flow forced with a hydraulic pressure drop is measured to determine the zeta potential, ζ m, of the tube's inner surface by using the following Equation, where D is the permittivity, k is the electric conductivity of solution in the capillary, ζ ref is the zeta potential of the reference cylinder tube, κ the Debye Huckel parameter and F a correction factor for the electrokinetic model.

Description

201100813 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種電位量測方法,特別是關於一種圓管 内表面電位量測方法及量測系統。 【先前技術】 材料表面與溶液接觸時之電性,對其工程應財有決定 〇 性的影響’目前有關材料電性量測,多以平板材質為主,但在 實際應用上’管狀構造(tubular stmcture)已廣泛使用於業界(如 陶磁管膜)。對於微管,藉由流體流職管時兩端之流線電位 值即可決定表面界達電位,但對於大於毛細管徑之圓管,除非 管子甚長㈣於職流動下於不易有義之流線電位 可量測到’對於有限長度之此類管,目前並無方法可有效決定 其内壁表面電位。有鑑於此,有必要發展新的電位量測方法及 ❹ 制祕以量刪管物_喊面電位,提供該類物體於工 織用時内壁面電性的資訊,以作為材料製備、改質或操作條 件選定等的參考依據。 【發明内容】 蓉於上述之發明背景中’為了符合產業上之要求,本發 明提供一種新的圓管内表面電位量測方法及量測系統。 本發月之目的在於藉由同軸圓管(肪如p㈣設計以 4 201100813 量測圓管魄面電位,其巾參考®柱體之表面界達電位為已知 或預先測定(如參考圓柱體為玻璃材質,以玻璃毛細管内之流 線電位量測即可決定其表面電位),量測時將參考圓柱體置入 圓管中,以壓力迫使流體於兩管間隙内流動,量測該間隙進出 口兩端點之流線電位,並配合流線電位與兩壁面界達電位之關 係式’即可決定圓管内表面電位,此方法操作簡便,系統安裝 容易。據此,本發明能符合經濟上的效益與產業上的利用性。 Ο 根據以上所述之目的,本發明揭示了一種圓管内表面電 位量測方法’首先提供一具有第一半徑之圓管與一具有第二半 徑之參考圓柱體,其中,第一半徑大於第二半徑,圓管與參考 圓柱體之間具有間隙並形成一流動空間,且圓管的軸心與參考 圓柱體的軸心重合。其次,導入一溶液於上述之流動空間中, 接著藉由一壓力差ΔΡ執行一加壓程序使上述之溶液於流動 空間中流動’且溶液之流動方向係平行於參考圓柱體之軸線方 〇 向。最後’執行一測量程序以量測流動空間之溶液入口處與溶 液出口處兩端點之流線電位差5,其中,上述之測量程序包含 下列方程式以計算圓管内表面之界達電位: ~ == ’其中’ D代表電容率’ 代表參考圓柱體表面之界達電位, V代表溶液黏度,々代表溶液電導度,厂代表修正因子。 5 201100813 【實施方式] 去及装此聰相方向為—細管内表面電位量測方 法及其朗。為了能_地_1 ,】方 7盡的步其料。_地,本㈣軌; :之技藝者所熟習的特殊細節。另-方面,眾所周知: 縣财咖科,《奴造縣㈣秘要之^成201100813 VI. Description of the Invention: [Technical Field] The present invention relates to a method for measuring a potential, and more particularly to a method and a measurement system for measuring the potential of a surface of a circular tube. [Prior Art] The electrical properties of the surface of the material in contact with the solution have a decisive influence on the engineering. 'The current electrical measurement of the material is mostly based on flat material, but in practical application, the tubular structure ( Tubular stmcture) has been widely used in the industry (such as ceramic tube film). For microtubules, the surface potential of the two ends can be determined by the flow line potential at both ends of the fluid flow tube, but for a tube larger than the capillary diameter, unless the tube is very long (4), the flow is not easy to flow. The potential can be measured. For a tube of limited length, there is currently no way to effectively determine the surface potential of the inner wall. In view of this, it is necessary to develop a new potential measurement method and control the amount of material to be removed, to provide information on the electrical properties of the inner wall of the object during the weaving process, as a material preparation and modification. Or reference basis for selection of operating conditions, etc. SUMMARY OF THE INVENTION In order to meet the requirements of the industry, the present invention provides a new method and measurement system for measuring the internal surface potential of a circular tube. The purpose of this month is to measure the surface potential of the round tube by means of a coaxial tube (such as the p (four) design to 4 201100813. The surface boundary potential of the reference column is known or pre-determined (for example, the reference cylinder is Glass material, the surface potential of the glass capillary can be determined by measuring the surface potential). During the measurement, the reference cylinder is placed in the circular tube, and the pressure is forced to flow in the gap between the two tubes, and the gap is measured. The flow line potential at the two ends of the outlet is combined with the relationship between the streamline potential and the potential of the two walls to determine the potential of the inner surface of the tube. This method is simple in operation and easy to install the system. Accordingly, the present invention can be economically compatible. The utility model and the utility of the industry. Ο According to the above object, the invention discloses a method for measuring the potential of the inner surface of a circular tube, which first provides a circular tube with a first radius and a reference cylinder with a second radius. Wherein the first radius is greater than the second radius, the tube has a gap between the circular tube and the reference cylinder and forms a flow space, and the axis of the tube coincides with the axis of the reference cylinder. A solution is introduced into the flow space, and then a pressure program is performed to cause the solution to flow in the flow space by a pressure difference ΔΡ and the flow direction of the solution is parallel to the axis of the reference cylinder. 'Perform a measurement procedure to measure the difference in flow line potential between the solution inlet of the flow space and the two ends of the solution outlet. The above measurement procedure includes the following equation to calculate the boundary potential of the inner surface of the tube: ~ == ' Where 'D represents the permittivity' represents the boundary of the surface of the reference cylinder, V represents the viscosity of the solution, 々 represents the conductivity of the solution, and the factory represents the correction factor. 5 201100813 [Embodiment] The direction of the Congxiang is in the thin tube The surface potential measurement method and its lang. In order to be able to _ ground_1, the party 7 is doing its best. _ ground, the (four) rail; : the special details familiar to the craftsman. Another aspect, well known: Kako, "The slavery county (four) secrets ^ Cheng

G 〇 卿會詳,細除了触詳細描述 敍地贿雜㈣實 的範圍不_,其以之後的__。本發月 參考第—騎示,本㈣之第—實_聽—種圓管内 表面電位量測方法,首先提供—具有第,R1之8^與 -具有第二+彳心之參考圓柱體2G, π之間具有間隙並形成-流動_3G,其中,第—考jfR體 大於第二半徑R2,且圓管1G的軸心與參考體2G的軸心 1 重口其次’導入-溶液於上述之流動空間%中,接著藉由 壓力差ΔΡ執行-加壓程序使上述溶液於流動空間邓中流 動’且溶液之流射向解行於參考體2()之軸線方向, 兩壁面上電雙層⑽電荷將賴體移動而產生流線電位 (streaming P〇tential)。最後’執行―測量程糾麵流動空間 30之溶液入口處與溶液出口處兩端點之流線電位差⑼職㈣ potential difference)! ’其中,上述之測量程序包含下列方程式 以計算圓管内表面之界達電位(zetap〇tential) 6 201100813G 〇 会 会 会 , 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会 会This month's reference to the first - riding, the first (the fourth) - the actual - listening - the inner surface potential measurement method of the round tube, first provide - with the first, R1 8 ^ and - with the second + heart of the reference cylinder 2G Between π has a gap and forms a flow_3G, wherein the first test jfR body is larger than the second radius R2, and the axis of the round pipe 1G and the axis 1 of the reference body 2G are the second 'introduction-solution In the flow space %, the pressure is further performed by the pressure difference ΔΡ to cause the solution to flow in the flow space Deng' and the flow of the solution is directed to the axis of the reference body 2 (), and the two walls are electrically doubled. The layer (10) charge moves the body to generate a streamline potential (streaming P〇tential). Finally, the flow-potential difference between the solution inlet and the solution outlet at the solution inlet flow space 30 (9) potential difference)! 'The above measurement procedure contains the following equation to calculate the boundary of the inner surface of the tube. Potential (zetap〇tential) 6 201100813

E ΔΡ ,其中,D代表電容率[permittivity,〜 常數(dielectric constant)、為真空下介電常數(di— c福ant in vacuum) =8.85χ,C2JV1],^代表參考圓柱 體表面之界達電位,〃代表絲減,(代表溶液電導度,F 代表修正因子。E ΔΡ , where D represents the permittivity, ~ constant constant, dielectric constant under vacuum (di- c ant in vacuum) = 8.85 χ, C2JV1], ^ represents the boundary of the reference cylinder surface Potential, 〃 represents silk reduction, (represents solution conductivity, and F represents correction factor.

+ Ce/ ^為相對介電 於本實施例中,上述之參考圓柱體2〇表面平滑,以避免 溶液異常擾動’影響量測結果。再者,上述之溶液的電導度與 酸驗值可以預先菫測’或是藉由上述^_測量程序以量測溶液之 電導度與酸驗值。 於本實施例中,上述之修正因子F的一般式如下: F- (ί±· ζη (手)+ 1 1 ++ Ce/ ^ is a relative dielectric. In the present embodiment, the surface of the reference cylinder 2 is smooth as described above to avoid abnormal disturbance of the solution, which affects the measurement result. Furthermore, the conductivity and acid value of the above solution can be pre-measured or measured by the above-mentioned measurement procedure to measure the conductivity and acid value of the solution. In the present embodiment, the general formula of the above correction factor F is as follows: F- (ί±· ζη (hand) + 1 1 +

A.[b.K,{Xb)-KxW\y href ^χ^±12όΜη6_4.[/ι(Λ)_6./ι(/1ό)] Cm 1ηδ·(1-62\ ~ — ~: ^ref hW-K,{X)-K0{Xb)-I0{X) 尤〇(乂)十·尤。⑽) _ζτ£_ I0(Ab)-K0(X)-K0(Ab)-I0A.[bK,{Xb)-KxW\y href ^χ^±12όΜη6_4.[/ι(Λ)_6./ι(/1ό)] Cm 1ηδ·(1-62\ ~ — ~: ^ref hW- K, {X)-K0{Xb)-I0{X) You Yu (乂) 十· You. (10)) _ζτ£_ I0(Ab)-K0(X)-K0(Ab)-I0

κ (reciprocal Debye length)可視 為電雙層厚度之倒數’/〇與/】為第一類之零階與一階之修正貝 索函數(zero-order and first order modified Bessel function of first kind),:^及Ka分別為第二類之零階與一階修正貝索函數 (modified Bessel function of second kind )。 201100813 參考第二騎示,本發明之第二實關揭露—種圓管内 表電位量測系統,其包含一進料模組、一測量模組、至少一 貞;則器與一汁算模組。上述之測量模組包含一圓管與一參 考^域’ 81管辭鼓於齡考B1輔的半徑,储之軸心 中參考圓柱體之表面界達電位為已知,量測模組接 收進料模组之溶液’使溶液流過參考圓柱體與圓管之間的間隙 後排出溶液至出料模組中,形成量測通路,量測模組藉由此 〇 量測通路產生一電位差訊號。 上述之量測模組更包含一組用以量測參考圓柱體進出口 端之流線電位偵測器,兩偵侧器執行偵測並產生一電位差訊 號。 於本實施例中,上述之壓力偵測器係用以量測進料入口端 與出口端的溶液壓力差以產生一壓力差訊號。其次,上述之計 算模組包含下列方程式以計算圓管内表面之界達電位(zeta 〇 potential) :κ (reciprocal Debye length) can be regarded as the reciprocal of the thickness of the electric double layer '/〇 and / is the first-order and first order modified Bessel function of first kind, :^ and Ka are the second-order modified first-order and first-order modified Bessel function of second kind. 201100813 Referring to the second riding, the second practical disclosure of the present invention is a round tube internal surface potential measuring system, which comprises a feeding module, a measuring module, at least one turn; and a juice calculating module . The above measuring module comprises a circular tube and a reference ^ domain '81 tube vocabulary in the radius of the age test B1 auxiliary, the surface boundary potential of the reference cylinder in the storage axis is known, the measuring module receives the feeding mold The solution of the group 'flows the solution through the gap between the reference cylinder and the circular tube, and then discharges the solution into the discharge module to form a measurement path, and the measurement module generates a potential difference signal by using the measurement path. The measuring module further comprises a set of streamline potential detectors for measuring the inlet and outlet ends of the reference cylinder, and the two side detectors perform detection and generate a potential difference signal. In this embodiment, the pressure detector is configured to measure a solution pressure difference between the inlet end and the outlet end of the feed to generate a pressure difference signal. Second, the above calculation module includes the following equation to calculate the zeta potential of the inner surface of the tube:

D U.+CrA 1 2 J ,其中,D代表電容率’ 代表該參考圓柱體表面之界達電 位,//代表溶液黏度’々代表溶液電導度’ F代表修正因子(其 一般式與第一實施例相同)。上述之計算模組藉由參考圓柱體 表面已知之界達電位及分別接收之電位差訊號與壓力差訊號 8 201100813 以計算圓管内表面之界達電位。此外,圓管内表面電位量測系 統更可以包含-用以偵測溶液電導度之電導度偵測器和用 以偵測溶液酸鹼值之酸鹼值偵測器。 於本實施财,上述之參相鋪為實心緻密圓柱體, 以防止溶液於其内部中流動,影響量測結果,同時,該 柱體之表面平滑’以避免溶液異常擾動,影響量測結果。 Ο 〇 、綜合以上所述,本發明揭示了—麵管内表面電位量測 方法,瓦先提供-具有第一半徑之圓管與一具有第二半經之 考圓柱體,其中,第一半徑大於第二半徑,圓管與參考圓柱體 之間具有間隙並形成-流動空間,且圓管的軸心與參考圓 的軸^重σ其_人’導人_溶液於上述之流動空間中,接著 由一壓力差ΔΡ執行一加壓程序使上述之溶液於流動空間中 流動,且溶液之流動方向係平行於參考_體之軸線方向 執行程序以量猶動郎之溶狀口處與溶 處兩端點之流線電位差互’其中,上述之測量程序包含下列方 程式以叶算圓管内表面之界達電位^ : 其中,D代表電容率,“代表參考圓柱體内表面之界達電 位1代表溶液黏度,硪表溶液電導度,F代表修正因子。 顯然地’依照上面實施例巾的描述,本發财能有許多 的修正與差異。因此需要在其附加的權利要求項之範圍内加以 9 201100813 理解除了上述詳細的描述外,本發明還可以廣泛地在其他的 實施例中施行。上述僅為本發日月之較佳實施例而已,並非用以 限疋本發狀帽專概圍;凡其它未脫縣㈣所揭示之精 #下所7〇成的等效改變或修飾,均應包含在下述中請專利範圍 【圖式簡單說明】 第一圖係根據本發明之第一實施例中,圓管、參考圓柱 體與流動空間之相對關係示意圖;以及 第二圖係根據本發明之第二實施例中,一種圓管内表面 電位量測系統之示意圖。 【主要元件符號說明】 10圓管 2〇參考圓柱體 30流動空間D U.+CrA 1 2 J , where D represents the permittivity ' represents the boundary of the surface of the reference cylinder, // represents the viscosity of the solution '々 represents the conductivity of the solution' F represents the correction factor (the general formula and the first The same applies to the embodiment). The above calculation module calculates the boundary potential of the inner surface of the circular tube by referring to the known potential of the surface of the cylinder and the potential difference signal and the pressure difference signal 8 201100813 respectively received. In addition, the inner surface potential measuring system of the round tube may further comprise a conductivity detector for detecting the conductivity of the solution and a pH detector for detecting the pH value of the solution. In the implementation, the above-mentioned phase is paved as a solid dense cylinder to prevent the solution from flowing inside the chamber, affecting the measurement results, and at the same time, the surface of the cylinder is smoothed to avoid abnormal disturbance of the solution and affect the measurement result.综合 〇, in combination with the above, the present invention discloses a method for measuring the surface potential of a surface tube. The tile first provides a circular tube having a first radius and a cylinder having a second half, wherein the first radius is greater than a second radius, a gap between the circular tube and the reference cylinder and forming a flow space, and the axis of the circular tube and the axis of the reference circle are σ _ _ _ _ _ _ solution in the above flow space, and then A pressure program is performed by a pressure difference ΔΡ to cause the above solution to flow in the flow space, and the flow direction of the solution is performed parallel to the axial direction of the reference body to measure the amount of the solution at the ends of the solution and the ends of the solution. The flow line potential difference mutual ', wherein the above measurement procedure includes the following equation to calculate the boundary potential of the inner surface of the tube ^ : where D represents the permittivity, "representing the boundary of the inner surface of the reference cylinder, the potential 1 represents the viscosity of the solution,溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液 溶液In addition to the above detailed description, the present invention can be widely implemented in other embodiments. The above is only a preferred embodiment of the present invention, and is not intended to be limited to the hair cap. Approximate; all other equivalent changes or modifications of the above-mentioned products are not included in the following patent scope [simplified description] The first figure is according to the invention In one embodiment, a schematic diagram of the relative relationship between the circular tube, the reference cylinder and the flow space; and a second diagram is a schematic diagram of a measurement system for the inner surface potential of the circular tube according to the second embodiment of the present invention. 】 10 round tube 2〇 reference cylinder 30 flow space

Claims (1)

201100813 七、申請專利範圍: 1.一種圓管内表面電位量測方法,該圓管内表面電位量測方法包 含: 提供一具有第一半徑之圓管與一具有第二半徑之參考圓 柱體,其中,該第一半徑大於該第二半徑,該圓管與該參考圓201100813 VII. Patent application scope: 1. A method for measuring the surface potential of a circular tube, the method for measuring the potential of the inner surface of the tube comprises: providing a circular tube having a first radius and a reference cylinder having a second radius, wherein The first radius is greater than the second radius, the circular tube and the reference circle 柱體之間具有間隙並形成一流動空間,且該圓管的軸心與該參 考圓柱體的軸心重合; 導入一溶液於該流動空間中;藉由一壓力差ΔΡ執行一加 壓程序使該溶液於該流動空間中流動,且該溶液之流動方向係 平行於該參考圓柱體之軸線方向;與 執行一測量程序以罝測該流動空間之溶液入口處與溶液 出口處兩端點之流線電位差(streamingp〇tentialdifference)互,其 中,該測量程序包含下列方程式以計算該圓管内表面之界達電 位(zeta potential) L : —== ^ 2 ,其中’ D代表電容率,I:㈣代表該參考圓柱體表面之界達電 位,以代表溶液黏度,A代表溶液電導度,尸代表修正因子。 2. 如申請專利範圍帛!項之圓管内表面電位量測方法,其中上述之 圓管包含内徑大於毫米級之圓管。 3. 如申請專利範_ i項之圓管内表面電位量測方法,其中上述之 11 201100813 參考圓柱體表面平滑。 4·如申請專利範圍第1項之圓管内表面電位量測方法,其中上述之 測量程序更包含量測該溶液之電導度灸。 5. 如申睛專利範圍第1項之圓管内表面電位量測方法,其中上述之 測量程序更包含量測該溶液之酸鹼值。 6. 如申請專利範圍第1項之圓管内表面電位量測方法,其中上述之 修正因子F的一般式如下: O f=^1 _ 4 · [/.g) - & · i.im ΚΛλ)_Ζ^·κ°(ΛΙή __ (ik) + 1 l + I^ \nb-(l-b2) A. (1 _ 62). (1 + ^ I0(Ab) · KM - K0(Xb) · Ι0(λ) Cref A-[b-K,{Xb)-K,(X)-\ Α·(1-ή2).(1 + ^-) ζrefThere is a gap between the cylinders and a flow space is formed, and the axis of the circular tube coincides with the axis of the reference cylinder; a solution is introduced into the flow space; and a pressure program is performed by a pressure difference ΔΡ The solution flows in the flow space, and the flow direction of the solution is parallel to the axis direction of the reference cylinder; and a flow of the two ends of the solution inlet and the solution outlet is performed by performing a measurement procedure to detect the flow space The line potential difference (streamingp〇tentialdifference), wherein the measurement program includes the following equation to calculate the zeta potential of the inner surface of the tube L: -== ^ 2 , where 'D represents the permittivity, and I: (d) represents The boundary of the reference cylinder surface reaches a potential to represent the viscosity of the solution, A represents the conductivity of the solution, and the cadaver represents a correction factor. 2. If you apply for a patent range! The method for measuring the internal surface potential of a circular tube, wherein the above-mentioned round tube comprises a round tube having an inner diameter greater than a millimeter. 3. For example, the method for measuring the surface potential of a circular tube in the patent _i item, wherein the above-mentioned 11 201100813 reference cylinder surface is smooth. 4. The method for measuring the surface potential of a round pipe according to item 1 of the patent application scope, wherein the above measuring procedure further comprises measuring the conductivity of the solution. 5. The method for measuring the surface potential of a round tube according to item 1 of the scope of the patent application, wherein the above measuring procedure further comprises measuring the pH value of the solution. 6. The method for measuring the internal surface potential of a round pipe according to item 1 of the patent application scope, wherein the general formula of the above correction factor F is as follows: O f=^1 _ 4 · [/.g) - & · i.im ΚΛλ )_Ζ^·κ°(ΛΙή __ (ik) + 1 l + I^ \nb-(l-b2) A. (1 _ 62). (1 + ^ I0(Ab) · KM - K0(Xb) · Ι0(λ) Cref A-[bK,{Xb)-K,(X)-\ Α·(1-ή2).(1 + ^-) ζref - W) _br£__ /〇(Λδ)·Κ0(Λ)-Κ0(Λδ)·Ι0(λ)- W) _br£__ /〇(Λδ)·Κ0(Λ)-Κ0(Λδ)·Ι0(λ) ,κ (reciprocal Debye length)可視為, κ (reciprocal Debye length) can be regarded as 電雙層厚度之倒數,與A為第一類之零階與一階之修正貝索 函數(zero-order and first order modified Bessel fimction of flrst kind) ’ K〇及Ka分別為第二類之零階與一階修正貝索函數 (modified Bessel fimction of second kind ) 〇 7. —種圓管内表面電位量測系統,該圓管内表面電位量測系統包 含: 一進料模組: 一測量模組,該測量模組包含一圓管與一參考圓柱體,該 12 201100813 圓管的半控大於該參考圓柱體的半徑,兩者之轴心重合,其中, 該參考陳體之表㈣達電位為已知電位,該量賴組接收該 進料模組之洛液,使該溶液流過該參考圓柱體與該圓管之間的 間隙後,排出該溶液至-出料模組中,形成一量測通路,該量 . 測模域由該量騎路產生-驗差訊號; 、至少—壓力偵測器,用以量測該圓管之入口端與出口端的 /合液壓力差以產生一壓力差訊號;與一計算模組,該計算模組 〇 ㈣下列方程式以計算ϋ管内表面之界達電位(zetapGtential) ζ m :The reciprocal of the thickness of the electric double layer, and the zero-order and first order modified Bessel fimction of flrst kind 'K〇 and Ka of the first type are respectively the zero of the second type Modified Bessel fimction of second kind 〇7. A kind of circular tube inner surface potential measuring system, the inner surface potential measuring system of the round tube comprises: a feeding module: a measuring module, The measuring module comprises a circular tube and a reference cylinder. The semi-control of the 12 201100813 circular tube is larger than the radius of the reference cylinder, and the axes of the two are coincident, wherein the reference body (4) reaches a potential of a known potential. The measuring group receives the liquid of the feeding module, and the solution flows through the gap between the reference cylinder and the circular tube, and then discharges the solution into the discharging module to form a measuring channel. The measurement mode is generated by the amount of riding - a differential signal; at least - a pressure detector for measuring a pressure difference between the inlet end and the outlet end of the tube to generate a pressure difference signal; With a computing module, the meter (Iv) square module following equation to calculate the boundary of the inner surface of the pipe ϋ zeta potential (zetapGtential) ζ m: ,其中代表電料’ q代表該參考圓_表面之界達電 位1代表溶液黏度,Α代表溶液電導度,F代表修正因子,該 計算模組藉由已知之參考縣面之界達電位。並分雌 收電位差訊號與該壓力差訊號以計算該圓管内表面之界達電位 泛m。 8.如申請專利範圍第7項之圓管内表面電位量測系統,其中上述之 圓官包含内徑大於毫米級之圓管。 電位量測系統’其中上述參 9.如申請專利範圍第7項之圓管内表面 考圓柱體之表面平滑。 電位量測系統,其中上述 10.如申請專利範圍第7項之圓管内表面 參考圓柱體為實心緻密圓柱體。 201100813 11.如申請專利範圍第7項之圓管内表面電位量測系統,其中上述 之該第一偵測器與該第二偵測器係於該量測通路中偵測並產生 該電位差訊號。 12.如申請專利範圍第7項之圓管内表面電位量測系統,其中上述 之修正因子F的一般式如下: F = _?_+ Cref xb2-\-2b2-\nb 4-[IiU)-b.IlUh)] 夺)+ 1 1 + 笋 InMH2) ^ “f ζη/Wherein the representative electric material 'q' represents the reference circle_the boundary of the surface reaches the potential of the solution as the solution viscosity, Α represents the solution conductivity, and F represents the correction factor, and the calculation module reaches the potential by the known county boundary. And dividing the potential difference signal and the pressure difference signal to calculate the boundary potential of the inner surface of the circular tube. 8. The inner surface potential measuring system for a round pipe according to item 7 of the patent application, wherein the above-mentioned circular body comprises a round pipe having an inner diameter greater than a millimeter. The potential measuring system 'the above-mentioned reference 9. The inner surface of the circular tube of the round pipe of the seventh aspect of the patent application is smooth. A potential measuring system, wherein the above 10. The inner surface of the round pipe of the seventh aspect of the patent application is a solid compact cylinder. The invention relates to a tube inner surface potential measuring system according to claim 7, wherein the first detector and the second detector detect and generate the potential difference signal in the measuring path. 12. The inner surface potential measuring system for a round pipe according to item 7 of the patent application, wherein the general formula of the above correction factor F is as follows: F = _?_+ Cref xb2-\-2b2-\nb 4-[IiU)- b.IlUh)] 夺) + 1 1 + shoots InMH2) ^ "f ζη/ ^-(1-62).(1 + ^-) Qref _href λ= Rb ,κ (reciprocal Debye length)可視為電 雙層厚度之倒數,/fl與/!為第一類之零階與一階之修正貝索函 數(zero-order and first order modified Bessel fimction of flrst^-(1-62).(1 + ^-) Qref _href λ= Rb , κ (reciprocal Debye length) can be regarded as the reciprocal of the electric double layer thickness, /fl and /! are the first order of zero order and first order Zero-order and first order modified Bessel fimction of flrst kind),K◦及Ki分別為第二類之零階與一階修正貝索函數 (modified Bessel function of second kind )。Kind), K◦ and Ki are the second-order modified first-order and first-order modified Bessel function of second kind.
TW098120215A 2009-06-17 2009-06-17 Determining the zeta potential at inside surface of tube via the streaming potential in annular flow TW201100813A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI571640B (en) * 2015-12-24 2017-02-21 國立臺灣科技大學 Method for measuring electric double layer potential, stern layer thickness, and ion concentration

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI571640B (en) * 2015-12-24 2017-02-21 國立臺灣科技大學 Method for measuring electric double layer potential, stern layer thickness, and ion concentration

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