201041337 六、發明說明： 【發明所屬之技術領域】 一種元件測試系統之環境參數設定方法，特別是有關 於一種元件測試系統之訊號衰減參數設定方法。 【先前技術】 先前技術中，廠商在製造受測元件後，係對每一受測 元件進行一測試作業。 請參照圖1，其為先前技術之元件測試系統之方塊圖， ❹ 其係由一儀器驅動模組（NI，National Instruments ) 11、一 測試主機12、一功率計（Power Meter ; PM) 15與一訊號 收發器（AP-GoldenUnit; ΑΡ-GUT) 16。其中，測試主機 12係連接儀器驅動模組11，並透過耦合器14接連功率計 15與訊號收發器16。功率計15用以偵測受測元件發出之 訊號（如Radio Frequency Signal，射頻訊號）的訊號強度 與訊號傳送的資料穩定性。 〇 在此說明，訊號收發器16指一個具有標準的訊號收 發、調變、解調變能力的標準樣本元件，用以根據接收訊 號，並根據訊號收發器16是否能正確、完整、調變或解調 變受測元件13發出之無線訊號，測試受測元件13輸出之 訊號的可調變性與受測元件13的傳輸效能，並將接收訊號 結果提供給測試主機12，供測試主機12判斷受測元件13 是否正常運行。 就上述得知，先前技術中，訊號收發器16與受測元件 201041337 13之間設置有一訊號衰減器17。此訊號衰減器17可為訊 • 號收發器所16包含或是額外配置，訊號衰減器17用以對 ^ 受測元件13與訊號收發器16之間的傳輸的無線訊號進行 訊號衰測行為，以同時檢測受測元件13在受訊號衰減器 17進行訊號衰減後是否可正確的進行訊號收發。 先前技術中，為因應不同的元件測試，廠商係配置具 調變衰減訊號強度能力的可調變訊號衰減器於測試系統 中，以使受測元件進行不同測試時，由訊號衰減器提供不 〇 同的訊號衰減數值。 然而，當前的元件測試系統為流水產線形態的測試模 式，且受測元件之規格多為一致時，受測元件與訊號收發 器之間僅需要單一的訊號衰減的規範即可，可調變訊號衰 減器的訊號可調變能力即無用武之地。再者，可調變訊號 衰減器因結合訊號可調變能力，造價不菲，使得廠商付出 的設備成本難以縮減。因此，如何有效的將元件測試作業 Q 所需之設備成本有效降低，同時維持元件測試的效率乃廠 商應思考的問題。 【發明内容】 本發明的目的係在於提供一種可藉由可降低硬體成 本，維持受測元件與訊號收發器之間的訊號衰減作業並簡 化元件測試環境的訊號衰減參數的設定方法。 本發明所提供之技術手段係揭露一種元件測試系統之 201041337 訊號衰減參數設定方法，應用於一訊號衰減器連接於一受 * 測元件與一訊號收發器之間。此方法包含：取得一受測元 件之一元件發送訊號強度值，取得一訊號收發器之一裝置 接收訊號強度值，根據元件發送訊號強度值與裝置接收訊 號強度值推算出一訊號衰減值以設定一訊號衰減器，此訊 號衰減器係連接於受測元件與訊號收發器之間。取得受測 元件之一元件接收訊號強度值’根據元件接收訊號強度值 與訊號衰減值計算出訊號收發器之一裝置發送訊號強度值 〇 用以設定訊號收發器發送訊號之強度。 本發明係揭露一種可設定訊號衰減參數之元件測試系 統，其包含一訊號衰減器、一訊號收發器、一訊號差值推 算單元與一設定單元。 訊號差值推算單元係取得一受測元件之一發送訊號強 度值與一元件接收訊號強度值，及訊號收發器之—接收訊 號強度值。訊號差值推算單元用以根據元件發送訊號強度 〇 值與接收訊號強度值計算出一訊號衰減值，以及根據訊號 衰減值與元件接收訊號強度值推算一裝置發送訊號強度 值ο 設定單兀用以根據訊號衰減值設定訊號衰減器，以及 根據裝置發送訊號強度值設定訊號收發器發送訊號之強 度。 本發明所揭露之系統與方法，訊號衰減器不需要可調 變能力，只需要具有衰減訊號的基本能力即可，而僅具衰 201041337 減^^虎之基本能力的訊號衰減器的造價較低’可有效的降 低兀件測試作業所需的設備成本。其次，當訊號衰減器完 成調整後即自動運行制式化的訊號衰減作業’不再需要額 外的測試主機來控制訊號衰減器的運行’可應用於具流水 產線特性、且受測元件為制式化的元件測試作業中。再者， 本發明所揭露之系統與方法，可在不改變各廠商的元件測 試架構下，使用於原有的元件測試系統，且可立即的進行 兀件測試作業’縮短廠商更動元件測試架構的停機時間。 〇 其四，訊號衰減器雖不具有訊號可調變能力，且訊號衰減 值為固定’乃可藉由調整訊號收發器的訊號輸出強度，以 應用於測試不同規格的受測元件。而且，訊號差值推算單 7G與設定單元可為軟體形式而建構於測試設備中，對廠商 而言極具相當的實用性。 【實施方式】 〇 為使對本發明之終點、構造特徵及其功能有進一步之 了解’茲配合相關實施例及圖式詳細說明如下： 請參照圖2，圖2為本發明元件測試系統之第一種參 數设定架構方塊圖。本實施例之參數設定架構包含一設定 主機 20、一受測元件（device under test，dut) 13、一訊號 衰減器（attenuator ) 17 與一訊號收發器（Golden Unit-Access Point; AP-GUT) 16。設定主機20係個別連接受測元件π 與A號哀減器17 ’訊號衰減器17係連接於受測元件13與 201041337 訊號收發器16之間。受測元件13與訊號收發器16係經由 • 無線方式進行訊號傳輸，並由訊號衰減器17對傳輸的訊號 - 進行訊號強度調整行為（包含訊號衰減與訊號增幅），以令 傳輸的訊號經訊號強度調整後，形成可由訊號收發器16或 受測元件13可接收的訊號強度。 設定主機20包含一訊號差值推算單元22、一設定單 元23與一控制介面21。此控制介面21用以提供測試人員 輸入受測元件13的訊號傳輸與接收規格與訊號收發器16 〇 的訊號傳輸與接收規格。本實施例中，測試人員係輸入受 測元件13輸出訊號的一元件發送訊號強度值與受測元件 13接收訊號的一元件接收訊號強度值，及訊號收發器16 的裝置接收訊號強度值。 訊號差值推算單元22係根據元件發送訊號強度值與 裝置接收訊號強度值，計算出一訊號衰減值以傳送至設定 單元23。設定單元23即根據訊號衰減值對訊號衰減器17 Q 進行參數設定’訊號衰減器17在後續的元件測試作業中， 會根據訊號衰減值對接收到的訊號進行訊號強度調整。 訊號差值推算單元22在推算出訊號衰減值後，會根據 訊號衰減值與裝置接收訊號強度值推算出一裝置發送訊號 強度值以傳送至設定單元23，設定單元23即根據裝置發 送訊號強度值對訊號收發器16進行參數設定，訊號收發器 16在後續的元件測試作業中，調整欲發出訊號的訊號強 度’使訊號收發器16發出訊號的強度符合裝置發送訊號強 201041337 度值。 - 請參照圖3，圖3為本發明元件測試系統之第二種參 數設定架構方塊圖。與圖2所示之實施例不同處在於，本 實施例之設定主機20更包含一資料庫24，此資料庫24係 儲存有不同受測元件13與訊號收發器16的訊號傳輸與接 收的規格參數，以及各受測元件13與訊號收發器16之裝 置編碼或裝置名稱。 測試人員透過控制介面21輸入受測元件13與所使用 Ο 的訊號收發器16之裝置編碼或裝置名稱，控制介面21係 從資料庫24中取得與元件編碼或元件名稱相匹配的訊號 傳輸與接收規格參數。本實施例中，控制介面21係取得的 訊號傳輸與接收規格包含有對應受測元件13之規格參數 的元件發送訊號強度值與元件接收訊號強度值，及對應訊 號收發器16之規格參數的裝置接收訊號強度值。控制介面 21會將此等元件發送訊號強度值、元件接收訊號強度值與 q 裝置接收訊號強度值傳送至訊號差值推算單元22。 訊號差值推算單元22係根據元件發送訊號強度值與 裝置接收訊號強度值，計算出一訊號衰減值以傳送至設定 單元23。設定單元23即根據訊號衰減值對訊號衰減器Π 進行參數設定’訊號衰減器17在後續的元件測試作業中， 會根據訊號衰減值對接收到的訊號進行訊號強度調整。 訊號差值推算單元22在推算出訊號衰減值後，會根據 訊號衰減值與裝置接收訊號強度值推算出一裝置發送訊號 201041337 強度值以傳送至設定單元23，設定單元23即根據裝置發 ‘ 送訊號強度值對訊號收發器16進行參數設定，訊號收發器 16在後續的元件測試作業中，調整欲發出訊號的訊號強 度，使訊號收發器16發出訊號的強度符合裝置發送訊號強 度值。 請參照圖4，圖4為本發明元件測試系統之第三種參 數設定架構方塊圖。本實施例配置有一訊號強度偵測器 25 ’此訊號強度偵測器25各別連接受測元件13之元件發 〇 送訊號端 131 ( Dut signal Tx ; dut : device under test)、受 測元件13之元件接收訊號端132 (Dut signal Rx)、與訊號 收發器16之裝置接收訊號端162( AP-GUT signal Rx)。訊 號強度偵測器25用以偵測元件發送訊號端131所發出訊號 的強度，以兄錄為一元件發送訊號強度值，彳貞測元件接收 訊號端132所接收訊號的強度，以記錄為一元件接收訊號 強度值，以及偵測裝置接收訊號端162所接收訊號的強 Q 度，以記錄為一裝置接收訊號強度值。訊號強度偵測器25 會將此裝置接收訊號強度值、元件接收訊號強度值與元件 發送訊號強度值傳送至訊號差值推算單元22。 訊號差值推算單元22係根據元件發送訊號強度值與 裝置接收訊號強度值’計算出一訊號衰減值以傳送至設定 單元23。設定單元23即根據訊號衰減值對訊號衰減器17 進行參數設定，訊號衰減器17在後續的元件測試作業中， 會根據訊號衰減值對接收到的訊號進行訊號強度調整。 201041337 訊號差值推鼻早元22在推算出訊號衰減值後，會根據 ' 訊號衰減值與裝置接收訊號強度值推算出一裝置發送訊號 強度值以傳送至设定單元23，設定單元23即根據裝置發 送訊號強度值對訊號收發器16進行參數設定，訊號收發器 16在後續的元件測試作業中，調整欲發出訊號的訊號強 度，使訊號收發器16發出訊號的強度符合裝置發送訊號強 度值。本實施例中雖以單一訊號強度偵測器25偵測裝置接 收訊號強度值、元件接收訊號強度值與元件發送訊號強度 值’但也可利用多個訊號強度偵測器以一對一，或一對二 的4貞測方式來取得上述的訊號強度值。如：利用二個訊號 強度偵測器，一者偵測裝置接收訊號強度值，另一者偵測 元件接收訊號強度值與元件發送訊號強度值；亦如利用三 個訊號強度彳貞測器’第一者彳貞測裝置接收訊號強度值，第 二者偵測元件接收訊號強度值，第三者偵測元件發送訊號 強度值’並不以單一訊號強度偵測器偵測各訊號強度值為 〇 限。 請參照圖5,其為本發明元件測試系統之第一種設備 架構示意圖。本實施例可結合圖2所示之第一種參數設定 架構或圖3所示之第二種參數設定架構。元件測試系統包 含有一第一主機31、一第二主機32、一儀器驅動模組11 (ΝΙ，National Instruments )、一功率計 15 ( Power Meter ; PM)與一訊號收發器 16 (AP-GoldenUnit; AP-GUT)。 本實施例中，第一主機31係與第二主機32相連接而 11 201041337 形成主從關係（Server-Client)，第二主機32視為第—主機 31的客端（Client)，第一主機31為第二主機32的伺服端 (Server)。第一主機31係連接（或本身配置）—栽具μ 以供裝載受測元件13，如受測元件13為一半導體類型之 受測晶片時，載具18為配置有晶片插槽（s〇cket)之測試 電路板；亦如，受測元件13為一受測網路卡時，載具18 為配置有卡片插槽（Slot);亦或，受測元件13為一蜊試電 路板時，載具18為配置連接器（connect〇r)的配線座。儀 ❹器驅動模組11儲存有受測元件13的驅動程式碼，係提供 給第一主機31來控制受測元件13,以進行元件測試作業。 第二主機32係連接訊號衰減器17，以令第〜主機 間接透過第二主機32來設定訊號衰減器17。或者，第一 主機31可直接連線至訊號衰減器I?以直接設定訊赞衰減 器17。 本實施例中，第一主機31視為圖2或圖3所述的設定 〇 主機20。在進行元件測試作業前’測試人員係利用第一主 機31的輸入上述的裝置接收訊號強度值、元件接收訊號強 度值與元件發送訊號強度值，計算出訊號衰減值與裝置發 送訊號強度值，再根據訊號衰減值透過第二主機32設定訊 號衰減器17以及調整訊號收發器16的發送訊號端所發出 訊號的強度。 元件測試系統進行元件測試時，第一主機31從儀器驅 動模組11取得受測元件13的驅動程式以驅動、設定與控 12 201041337 制受測元件13。第一主機31係控制受測元件13發出一功 * 率測試訊號，此功率測試訊號係由功率計15所接收，功率 - 計15係分析功率測試訊號的訊號強度，以產生一訊號強度 資料，並傳輸訊號強度資料至儀器驅動模組11。儀器驅動 模組11係根據訊號強度資料提供一修正程序給第一主機 31，第一主機31根據修正程序調整受測元件13之至少一 工作參數。受測元件13之工作參數係選自於由受測元件 13輸出第一訊號之電路之至少一控制設定值、一工作電 Ο 壓、一工作電流與一運作功率所組成之群組。 接著，第一主機31係控制受測元件13發出一測試訊 號，此測試訊號係由無線方式傳輸至訊號衰減器17。訊號 衰減器17係根據前述計算出的訊號衰減值以調整測試訊 號的訊號強度，訊號強度被調整後的測試訊號，其強度係 符合訊號收發器16之裝置接收訊號端162所能接收訊號的 強度值。同時，第一主機31會以實體接線方式傳輸相同的 q 測試訊號的内容給予第二主機32，供第二主機32比對受 測元件13發出的測試訊號的資料準確性。 第二主機32係產生一回應訊號，由訊號收發器16之 裝置發送訊號端161所發出，此回應訊號之訊號強度係符 合前述的裝置發送訊號強度值。此回應訊號會由訊號衰減 器17所接收並調整其訊號強度，使其符合受測元件13之 元件接收訊號端132可接收訊號的強度值，即符合上述的 元件接收訊號強度值。同時，第二主機32會以實體接線方 13 201041337 式傳輸相同的回應訊號的内容給予第一主機31，供第一主 ， 機31比對受測元件13所接收的回應訊號的資料準確性。 在此說明，訊號收發器16為一元件標準樣本，具有標 準化的工作參數與訊號收發模式。訊號收發器16接收測試 資料後，即將測試資料之接收情形形成上述回應資料以回 傳至第一主機31，第一主機31即根據此回應資料決定受 測元件13運作是否正常。至此，元件測試系統即完成測試 受測元件13之測試。 〇 請參照圖6，其為本發明元件測試系統之第二種設備 架構示意圖。本實施例可結合圖4所示之第三種參數設定 架構。如圖4與圖6所示，此系統包含前述的訊號強度偵 測器25，用以連接訊號收發器16的裝置接收訊號端162、 受測元件13的元件發送訊號端131及元件接收訊號端 132。元件偵測系統在對受測元件13進行元件測試作業 前，係透過訊號強度偵測器25偵測上述的訊號收發器16 Q 的裝置接收訊號端162、受測元件13的元件發送訊號端131 及元件接收訊號端132的訊號收發強度，以取得上述的裝 置接收訊號強度值、元件接收訊號強度值與元件發送訊號 強度值，並傳送至第一主機31。第一主機31係計算出訊 號衰減值以設定訊號衰減器17,以及計算出裝置發送訊號 強度值對訊號收發器16進行參數設定。 請參照圖7,其為本發明實施例之訊號衰減參數設定 方法流程圖，請同時參照圖2、圖3或圖4以利於了解。 14 201041337 本實施例中’令受測元件13之元件發送訊號端131所發出 訊5虎的元件發送訊號強度值為+15dbm，受測元件13之元 - 件接收訊號端132可接收訊號的元件接收訊號強度值為 -70dbm。訊號收發器16之裝置接收訊號端162其可接收訊 號的装置接收訊號強度值為_65dbm。但受測元件13與訊號 收發器16的訊號收發規格並不以上述的數值為限，在此僅 是作為說明。以下係說明訊號衰減參數設定方法的流程： 取得受測元件13之一元件發送訊號強度值（步羯 〇 S110)’取得訊號收發器16之一裝置接收訊號強度值（步 驟S120)。如圖2 ’測試人員透過設定主機20的控制介面 21直接輸入元件發送訊號強度值+ i5dbm與裝置接收訊號 強度值-65dbm。或如圖3，測試人員透過設定主機20的控 制介面21直接輸入受測元件13與訊號收發器16的規格， 以從資料庫24中取得相關的元件發送訊號強度值+ 15dbm 與裝置接收訊號強度值-65dbm。或如圖4，由訊號強度偵 q 測器25偵測受測元件13發送訊號的訊號強度以形成元件 發送訊號強度值+15dbm，及偵測訊號收發器16可接收訊 號的訊號強度以形成裝置接收訊號強度值-65dbm。 根據裝置接收訊號強度值與元件發送訊號強度值計算 出一訊號衰減值以設定訊號衰減器Π (步驟S130)。如前 述，訊號差值推算單元22係根據裝置接收訊號強度值與元 件發送訊號強度值之間的訊號差值： (-65dbm)-(+15dbm)=-80db，得知受測元件13與訊號收發器 15 201041337 16之間的訊號衰減值應為-80db’設定單元23即根據此 • -80db以設定訊號衰減器17。在元件測試期間，訊號衰減 器17係將受測元件13發出的無線訊號進行訊號衰減行 為，令其由+15dbm衰減至-65dbm，再由訊號收發器16的 裝置接收訊號端162接收被衰減後的無線訊號。 取得受測元件13之一元件接收訊號強度值（步驟 S140)。如圖2，測試人員透過設定主機20的控制介面21 直接輸入元件接收訊號強度值-7〇dbm。或如圖3 ’測試人 〇 員透過設定主機20的控制介面21直接輸入受測元件13的 規格，以從資料庫24中取得相關的元件接收訊號強度值 -70dbm。或如圖4,由訊號強度偵測器25偵測受測元件13 可接收訊號的訊號強度，以形成元件接收訊號強度值 -70dbm。此元件接收訊號強度值-70dbm會被傳送至訊號差 值推算單元22，訊號差值推算單元22根據元件接收訊號 強度值與訊號衰減值計算出訊號收發器16之一裝置發送 Q 訊號強度值（步驟 S150):即（-70dbm)-(-80db)=+10dbm。 根據裝置發送訊號強度值設定訊號收發器16發送訊 號之強度（步驟S160)。設定單元23係根據裝置發送訊號 強度值+10dbm設定訊號收發器16，令訊號收發器16之裝 置訊號發送端所發出的無線訊號的訊號強度即符合 + 10dbm。 雖然本發明以前述之較佳實施例揭露如上，然其並非 用以限定本發明’任何熟習相像技藝者，在不脫離本發明 16 201041337 明之專利保護範圍内。 朁、仍為本發 ^ 【圖式簡單說明】 圖1係先前技術之元件測試系統之方塊圖· 圖； 圖2 !本發明元件測試系統之第-種參數設定架構方塊 圖3 :本㈣元件測種參較定架構方塊 圖； 〇 圖4係本發明元件測試系統之第三種參數設定架構方塊 圖； =係本發明元件測試系統之第—種設騎構示意圖； 圖6係本發明元件測試系統之第二種設傷架構示意圖；以 方法流程圖 圖7係本發明實施例之訊號衰減參數設定 〇 【主要元件符號說明】 11 儀器驅動模組 12 測試主機 13 受測元件 131 元件發送訊號端 132 元件接收訊號端 14 耦合器 15 功率計 17 201041337 16 訊號收發器 161 裝置發送訊號端 162 裝置接收訊號端 17 訊號衰減器 18 載具 20 設定主機 21 控制介面 22 訊號差值推算單元 23 設定單元 24 資料庫 25 訊號強度偵測器 31 第一主機 32 第二主機 ❹ 18201041337 VI. Description of the invention: [Technical field of invention] A method for setting environmental parameters of a component test system, in particular, a signal attenuation parameter setting method for a component test system. [Prior Art] In the prior art, after manufacturing a component under test, the manufacturer performs a test operation on each device under test. Please refer to FIG. 1 , which is a block diagram of a component testing system of the prior art, which is composed of an instrument driving module (NI, National Instruments) 11, a test host 12, a power meter (PM) 15 and A signal transceiver (AP-GoldenUnit; ΑΡ-GUT) 16. The test host 12 is connected to the instrument drive module 11 and connected to the power meter 15 and the signal transceiver 16 via the coupler 14. The power meter 15 is used for detecting the signal strength of the signal transmitted by the device under test (such as the Radio Frequency Signal) and the stability of the data transmitted by the signal. As used herein, the signal transceiver 16 refers to a standard sample component having standard signal transceiving, modulation, and demodulation capabilities for determining, based on the received signal, and based on whether the transceiver 16 is correct, complete, modulated, or Demodulating the wireless signal sent by the device under test 13, testing the tunability of the signal output by the device under test 13 and the transmission performance of the device under test 13, and providing the received signal result to the test host 12 for the test host 12 to determine Test component 13 is operating normally. As described above, in the prior art, a signal attenuator 17 is disposed between the signal transceiver 16 and the device under test 201041337 13. The signal attenuator 17 can be included or additionally configured by the signal transceiver unit 16, and the signal attenuator 17 can perform signal attenuation behavior on the wireless signal transmitted between the device under test 13 and the signal transceiver 16. Simultaneously detecting whether the signal under test 13 can be correctly transmitted and received after being subjected to signal attenuation by the signal attenuator 17. In the prior art, in order to respond to different component tests, the manufacturer configures a variable-signal attenuator with a variable-attenuation signal strength capability in the test system so that the signal-tested attenuator is provided when the tested component is tested differently. The same signal attenuation value. However, when the current component test system is in the test mode of the flow line production mode, and the specifications of the device under test are mostly consistent, only a single signal attenuation specification is required between the device under test and the signal transceiver. The signal attenuator's ability to adjust the signal is useless. Moreover, the variable-signal attenuator is costly due to the combination of the variable signal capability and the cost of the equipment that the manufacturer pays. Therefore, how to effectively reduce the equipment cost required for component test operation Q while maintaining the efficiency of component testing is an issue that manufacturers should consider. SUMMARY OF THE INVENTION It is an object of the present invention to provide a method for setting a signal attenuation parameter that can reduce the hardware cost, maintain signal attenuation between the device under test and the signal transceiver, and simplify the component test environment. The technical means provided by the present invention discloses a 201041337 signal attenuation parameter setting method for a component test system, which is applied to a signal attenuator connected between a device under test and a signal transceiver. The method comprises: obtaining a signal transmission intensity value of a component of a device under test, obtaining a signal intensity value of a device of a signal transceiver, and deriving a signal attenuation value according to the component transmission signal intensity value and the device receiving signal intensity value to set A signal attenuator, the signal attenuator is connected between the device under test and the signal transceiver. Obtaining the signal strength value of one of the components under test ‘Based on the component receiving signal strength value and the signal attenuation value, one of the signal transceivers transmits the signal strength value 〇 to set the strength of the signal transceiver to send the signal. The invention discloses a component testing system capable of setting a signal attenuation parameter, which comprises a signal attenuator, a signal transceiver, a signal difference estimating unit and a setting unit. The signal difference estimating unit obtains a signal strength value and a component received signal strength value of one of the tested components, and a received signal strength value of the signal transceiver. The signal difference estimation unit is configured to calculate a signal attenuation value according to the component transmission signal strength threshold and the received signal strength value, and calculate a device transmission signal strength value according to the signal attenuation value and the component received signal strength value. The signal attenuator is set according to the signal attenuation value, and the strength of the signal transmission signal is set according to the signal strength value transmitted by the device. In the system and method disclosed by the present invention, the signal attenuator does not need to be adjustable, and only needs the basic ability to attenuate the signal, and only the signal attenuator with the basic capability of the 201041337 is reduced. 'It can effectively reduce the equipment cost required for the test of the parts. Secondly, when the signal attenuator completes the adjustment, it automatically runs the normalized signal attenuation operation 'no need for additional test host to control the operation of the signal attenuator'. It can be applied to the characteristics of the flow line and the device under test is standardized. Component testing work. Furthermore, the system and method disclosed by the present invention can be used in the original component testing system without changing the component testing architecture of each manufacturer, and can immediately perform the component testing operation 'to shorten the manufacturer's component testing architecture. Downtime. 〇 Fourth, the signal attenuator does not have the ability to adjust the signal, and the signal attenuation value is fixed ’, which can be used to test different measured components by adjusting the signal output intensity of the signal transceiver. Moreover, the signal difference calculation table 7G and the setting unit can be constructed in a test device in a software form, which is quite practical for the manufacturer. [Embodiment] In order to further understand the end point, structural features and functions of the present invention, the related embodiments and drawings are described in detail as follows: Please refer to FIG. 2, which is the first component testing system of the present invention. A parameter setting architecture block diagram. The parameter setting architecture of this embodiment includes a setting host 20, a device under test (dut) 13, a signal attenuator 17 and a Golden Unit-Access Point (AP-GUT). 16. The host 20 is individually connected to the device under test π and the A-theater 17 ’ signal attenuator 17 is connected between the device under test 13 and the 201041337 signal transceiver 16. The device under test 13 and the signal transceiver 16 transmit signals via the wireless method, and the signal attenuator 17 performs signal strength adjustment (including signal attenuation and signal amplification) to transmit the signal through the signal. After the intensity adjustment, the signal strength that can be received by the signal transceiver 16 or the device under test 13 is formed. The setting host 20 includes a signal difference estimating unit 22, a setting unit 23 and a control interface 21. The control interface 21 is used to provide the signal transmission and reception specifications of the test component 13 and the signal transmission and reception specifications of the signal transceiver 16 测试. In this embodiment, the tester inputs a component transmit signal strength value of the output signal of the device under test 13 and a component receive signal strength value of the signal received by the device under test 13, and the device receives the signal strength value of the signal transceiver 16. The signal difference estimating unit 22 calculates a signal attenuation value for transmission to the setting unit 23 based on the component transmission signal strength value and the device received signal strength value. The setting unit 23 performs parameter setting on the signal attenuator 17 Q according to the signal attenuation value. In the subsequent component testing operation, the signal attenuator 17 performs signal strength adjustment on the received signal according to the signal attenuation value. After deriving the signal attenuation value, the signal difference estimation unit 22 estimates a device transmission signal strength value according to the signal attenuation value and the device received signal strength value for transmission to the setting unit 23, and the setting unit 23 transmits the signal intensity value according to the device. The signal transceiver 16 is parameterized, and the signal transceiver 16 adjusts the signal strength of the signal to be sent in the subsequent component test operation to make the signal transceiver 16 transmit the signal with the strength of the device transmission signal strength of 201041337 degrees. - Please refer to FIG. 3. FIG. 3 is a block diagram showing the second parameter setting architecture of the component testing system of the present invention. The difference from the embodiment shown in FIG. 2 is that the setting host 20 of the embodiment further includes a database 24 that stores specifications of signal transmission and reception of different tested components 13 and signal transceivers 16 . The parameters, as well as the device code or device name of each of the device under test 13 and the signal transceiver 16. The tester inputs the device code or device name of the device under test 13 and the signal transceiver 16 used by the control interface 21, and the control interface 21 obtains the signal transmission and reception from the database 24 that matches the component code or the component name. Specifications. In this embodiment, the signal transmission and reception specifications obtained by the control interface 21 include a component transmission signal strength value corresponding to the specification parameter of the device under test 13 and a component reception signal strength value, and a device corresponding to the specification parameter of the signal transceiver 16 Receive signal strength value. The control interface 21 transmits the component transmission signal strength value, the component reception signal strength value, and the q device reception signal strength value to the signal difference estimation unit 22. The signal difference estimating unit 22 calculates a signal attenuation value for transmission to the setting unit 23 based on the component transmission signal strength value and the device received signal strength value. The setting unit 23 performs parameter setting on the signal attenuator 根据 according to the signal attenuation value. In the subsequent component testing operation, the signal attenuator 17 performs signal strength adjustment on the received signal according to the signal attenuation value. After deriving the signal attenuation value, the signal difference estimation unit 22 derives a device transmission signal 201041337 intensity value according to the signal attenuation value and the device received signal strength value for transmission to the setting unit 23, and the setting unit 23 sends the signal according to the device. The signal strength value is parameterized to the signal transceiver 16. The signal transceiver 16 adjusts the signal strength of the signal to be sent in the subsequent component test operation, so that the strength of the signal sent by the signal transceiver 16 conforms to the signal strength value transmitted by the device. Please refer to FIG. 4. FIG. 4 is a block diagram of a third parameter setting architecture of the component testing system of the present invention. In this embodiment, a signal strength detector 25 is disposed. The signal intensity detector 25 is connected to the component signal transmitting terminal 131 of the device under test 13 (Dut signal Tx; dut : device under test), and the device under test 13 The component receives the signal terminal 132 (Dut signal Rx) and the device of the signal transceiver 16 receives the signal terminal 162 (AP-GUT signal Rx). The signal strength detector 25 is configured to detect the intensity of the signal sent by the component transmitting signal terminal 131, and send the signal intensity value to the component by the brother record, and the strength of the signal received by the component to receive the signal terminal 132 is recorded as one. The component receives the signal strength value and the strong Q of the signal received by the detecting device receiving the signal terminal 162 to record as a device receiving signal strength value. The signal strength detector 25 transmits the device received signal strength value, the component received signal strength value, and the component transmission signal strength value to the signal difference estimation unit 22. The signal difference estimating unit 22 calculates a signal attenuation value based on the component transmission signal strength value and the device received signal strength value' to transmit to the setting unit 23. The setting unit 23 performs parameter setting on the signal attenuator 17 according to the signal attenuation value. In the subsequent component testing operation, the signal attenuator 17 performs signal strength adjustment on the received signal according to the signal attenuation value. 201041337 After the signal difference value is pushed, the signal attenuation value is calculated according to the 'signal attenuation value and the device received signal strength value to be transmitted to the setting unit 23, and the setting unit 23 is based on The device sends a signal strength value to the signal transceiver 16 for parameter setting. In the subsequent component test operation, the signal transceiver 16 adjusts the signal strength of the signal to be sent, so that the strength of the signal sent by the signal transceiver 16 conforms to the device transmission signal strength value. In this embodiment, the single signal strength detector 25 detects the device receiving the signal strength value, the component receiving signal strength value, and the component transmitting signal strength value', but may also use multiple signal strength detectors in one-to-one, or A pair of two methods are used to obtain the above signal strength values. For example, using two signal strength detectors, one detecting device receives the signal intensity value, and the other detecting component receiving the signal intensity value and the component transmitting signal intensity value; for example, using three signal strength detectors' The first detecting device receives the signal intensity value, the second detecting component receives the signal intensity value, and the third detecting component sends the signal intensity value 'not detecting the signal intensity value by a single signal intensity detector Unlimited. Please refer to FIG. 5, which is a schematic diagram of the first device architecture of the component testing system of the present invention. This embodiment can be combined with the first parameter setting architecture shown in FIG. 2 or the second parameter setting architecture shown in FIG. The component testing system includes a first host 31, a second host 32, an instrument driver module 11 (National Instruments), a power meter 15 (Power Meter; PM) and a signal transceiver 16 (AP-GoldenUnit; AP-GUT). In this embodiment, the first host 31 is connected to the second host 32 and 11 201041337 forms a master-slave relationship (Server-Client), and the second host 32 is regarded as the client (Client) of the first host 31, and the first host 31 is a server (Server) of the second host 32. The first host 31 is connected (or configured by itself) - the device μ is mounted for the device under test 13. If the device under test 13 is a semiconductor-type test wafer, the carrier 18 is configured with a chip slot (s〇 The test circuit board of the socket; for example, when the device under test 13 is a network card under test, the carrier 18 is provided with a card slot (Slot); or, when the device under test 13 is a test circuit board The carrier 18 is a wiring harness for a connector (connector). The instrument drive module 11 stores the drive code of the device under test 13 and provides it to the first host 31 to control the device under test 13 for component test operations. The second host 32 is connected to the signal attenuator 17 to enable the first host to indirectly pass the second host 32 to set the signal attenuator 17. Alternatively, the first host 31 can be directly connected to the signal attenuator I to directly set the signal attenuator 17. In the present embodiment, the first host 31 is regarded as the setting 主机 host 20 described in Fig. 2 or Fig. 3. Before performing the component test operation, the tester receives the signal strength value, the component received signal strength value, and the component transmission signal strength value by using the input of the first host 31, and calculates the signal attenuation value and the device transmission signal strength value, and then The intensity of the signal emitted by the signal attenuator 17 and the signal transmitting end of the adjustment signal transceiver 16 is set by the second host 32 according to the signal attenuation value. When the component test system performs component test, the first host 31 obtains the drive program of the device under test 13 from the instrument drive module 11 to drive, set, and control the test component 13 of the 201041337 system. The first host 31 controls the device under test 13 to send a power rate test signal, and the power test signal is received by the power meter 15, and the power meter 15 analyzes the signal strength of the power test signal to generate a signal strength data. And transmitting the signal strength data to the instrument driving module 11. The instrument driver module 11 provides a correction program to the first host 31 based on the signal strength data, and the first host 31 adjusts at least one operating parameter of the device under test 13 according to the correction program. The operating parameters of the device under test 13 are selected from the group consisting of at least one control set value of the circuit for outputting the first signal by the device under test 13, a working voltage, an operating current, and an operating power. Then, the first host 31 controls the device under test 13 to send a test signal, and the test signal is wirelessly transmitted to the signal attenuator 17. The signal attenuator 17 adjusts the signal strength of the test signal according to the calculated signal attenuation value. The intensity of the test signal after the signal strength is adjusted is in accordance with the strength of the signal received by the signal receiving end 162 of the signal transceiver 16 value. At the same time, the first host 31 transmits the contents of the same q test signal to the second host 32 in a physical connection manner, for the second host 32 to compare the data accuracy of the test signal sent by the device 13 under test. The second host 32 generates a response signal, which is sent by the device of the signal transceiver 16 to the signal terminal 161. The signal strength of the response signal corresponds to the device transmission signal strength value. The response signal is received by the signal attenuator 17 and its signal strength is adjusted to match the intensity value of the signal received by the component receiving signal terminal 132 of the device under test 13, that is, the component received signal strength value is met. At the same time, the second host 32 transmits the content of the same response signal to the first host 31 by the physical terminal 13 201041337 for the first host 31 to compare the data accuracy of the response signal received by the device under test 13. As described herein, the signal transceiver 16 is a component standard sample having standardized operating parameters and signal transceiving modes. After receiving the test data, the signal transceiver 16 forms the response data to the first host 31, and the first host 31 determines whether the device 13 is operating normally according to the response data. At this point, the component test system completes the test of the test component 13. Please refer to FIG. 6, which is a schematic diagram of a second device architecture of the component testing system of the present invention. This embodiment can be combined with the third parameter setting architecture shown in FIG. As shown in FIG. 4 and FIG. 6, the system includes the foregoing signal strength detector 25, and the device for connecting to the signal transceiver 16 receives the signal terminal 162, the component transmitting signal terminal 131 of the device under test 13, and the component receiving signal terminal. 132. Before the component testing system performs the component testing operation on the device under test 13, the device receiving the signal transceiver terminal 16 through the signal strength detector 25 receives the signal terminal 162, and the component of the device under test 13 transmits the signal terminal 131. And the component receives the signal transmission and reception strength of the signal terminal 132 to obtain the device receiving signal strength value, the component receiving signal strength value and the component transmission signal strength value, and transmits the signal to the first host 31. The first host 31 calculates the signal attenuation value to set the signal attenuator 17, and calculates the device transmission signal strength value to parameterize the signal transceiver 16. Please refer to FIG. 7, which is a flowchart of a method for setting a signal attenuation parameter according to an embodiment of the present invention. Please refer to FIG. 2, FIG. 3 or FIG. 4 for convenience. 14 201041337 In this embodiment, the component of the device under test 13 sends a signal to the signal terminal 131, and the signal strength value of the device is +15 dbm. The component of the device under test 13 receives the signal from the signal terminal 132. The received signal strength value is -70dbm. The device of the signal transceiver 16 receives the signal terminal 162 and the device receiving the signal receives the signal strength value of _65 dbm. However, the signal transmission and reception specifications of the device under test 13 and the signal transceiver 16 are not limited to the above numerical values, and are merely described herein. The flow of the signal attenuation parameter setting method is as follows: A component transmission signal strength value of the device under test 13 is obtained (step 〇 S110) to obtain a device receiving signal strength value from the signal transceiver 16 (step S120). As shown in Fig. 2, the tester directly inputs the component to send the signal strength value + i5dbm and the device received signal strength value -65dbm through the control interface 21 of the host 20. Or, as shown in FIG. 3, the tester directly inputs the specifications of the device under test 13 and the signal transceiver 16 through the control interface 21 of the host 20 to obtain the relevant component transmission signal strength value + 15 dBm from the database 24 and the device received signal strength. The value is -65dbm. Or, as shown in FIG. 4, the signal strength detector 25 detects the signal strength of the signal transmitted by the device 13 to form a component transmission signal strength value of +15 dbm, and the signal strength of the signal receiving transceiver 16 can receive the signal to form a device. Receive signal strength value -65dbm. A signal attenuation value is calculated according to the received signal strength value of the device and the component transmission signal strength value to set the signal attenuator Π (step S130). As described above, the signal difference estimating unit 22 determines the signal to be tested 13 and the signal according to the signal difference between the received signal strength value and the component transmitted signal strength value: (-65dbm)-(+15dbm)=-80db. The signal attenuation value between the transceiver 15 201041337 16 should be -80db'. The setting unit 23 is based on this -80db to set the signal attenuator 17. During the component test, the signal attenuator 17 performs the signal attenuation behavior of the wireless signal emitted by the device under test 13 to be attenuated from +15 dbm to -65 dbm, and then received by the signal transceiver 16 of the signal transceiver 16 to be attenuated. Wireless signal. One of the elements of the device under test 13 receives the signal strength value (step S140). As shown in FIG. 2, the tester directly inputs the component to receive the signal strength value -7 〇 dbm by setting the control interface 21 of the host 20. Alternatively, as shown in Fig. 3, the tester directly inputs the specification of the device under test 13 through the control interface 21 of the host 20 to obtain the associated component received signal strength value -70 dbm from the database 24. Or, as shown in FIG. 4, the signal strength detector 25 detects the signal strength of the signal that the device under test 13 can receive to form a component receiving signal strength value of -70 dbm. The component received signal strength value -70dbm is transmitted to the signal difference estimating unit 22, and the signal difference estimating unit 22 calculates the device to transmit the Q signal intensity value according to the component receiving signal intensity value and the signal attenuation value ( Step S150): namely (-70dbm)-(-80db)=+10dbm. The strength of the signal transmitted by the signal transceiver 16 is set according to the device transmission signal strength value (step S160). The setting unit 23 sets the signal transceiver 16 according to the device transmission signal strength value +10dbm, so that the signal strength of the wireless signal sent by the device signal transmitting end of the signal transceiver 16 is + 10dbm. While the present invention has been described above in terms of the preferred embodiments thereof, it is not intended to limit the scope of the invention.朁 仍 仍 仍 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图 图Figure 4 is a block diagram of a third parameter setting architecture of the component testing system of the present invention; = is a schematic diagram of the first component of the component testing system of the present invention; Figure 6 is a component of the present invention; Schematic diagram of the second damage structure of the test system; method flow chart FIG. 7 is the signal attenuation parameter setting of the embodiment of the present invention 〇 [main component symbol description] 11 instrument drive module 12 test host 13 test component 131 component transmission signal Terminal 132 component receiving signal terminal 14 coupler 15 power meter 17 201041337 16 signal transceiver 161 device transmitting signal terminal 162 device receiving signal terminal 17 signal attenuator 18 carrier 20 setting host 21 control interface 22 signal difference estimating unit 23 setting unit 24 Database 25 Signal Strength Detector 31 First Host 32 Second Host ❹ 18