TW201024702A - Measurement system for display panel - Google Patents

Measurement system for display panel Download PDF

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Publication number
TW201024702A
TW201024702A TW97151571A TW97151571A TW201024702A TW 201024702 A TW201024702 A TW 201024702A TW 97151571 A TW97151571 A TW 97151571A TW 97151571 A TW97151571 A TW 97151571A TW 201024702 A TW201024702 A TW 201024702A
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TW
Taiwan
Prior art keywords
panel
display panel
light
tested
axis
Prior art date
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TW97151571A
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Chinese (zh)
Inventor
Sheng-Hsiung Chang
Yan-Cen Ou
Yong-Qiang Wei
wen-xuan Xie
Xin-Yao Huang
Yu-Cheng Wu
Kun-San Ceng
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Univ Far East
Metal Ind Res & Dev Ct
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Application filed by Univ Far East, Metal Ind Res & Dev Ct filed Critical Univ Far East
Priority to TW97151571A priority Critical patent/TW201024702A/en
Publication of TW201024702A publication Critical patent/TW201024702A/en

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Abstract

The present invention relates to a measurement system for display panel, particularly to a measurement system capable of effectively measuring the viewing angle, chromaticity and brightness of the panel under test, which includes a carrier device, a support device and a detection device. The panel under test can be placed on the carrier device, and the support device can be used to selectively adjust z-axis, x-axis and y-axis. The detection device has a measuring instrument, a light converging component disposed on the support device, a light-guide component for connecting the light converging component and the measuring instrument, and a processing unit for processing and outputting data, so that light source of the panel under test can be guided, in a guidance manner, into the measuring instrument, thereby reducing external interference and simplifying the measurement system's structure, and further to enhance the measurement convenience, flexibility, and the efficiency and accuracy of measurement as well.

Description

201024702 六、發明說明: 【發明所屬之技術領域】 本發明是有關於一種顯示面板之光線量測技術領 域,具體而言是一種結構簡單、且干擾少的顯示面板 量測系統,藉以提升量測的便利性與彈性,且能提升 其量測效率與準確性。 【先前技術】 按,自陰極射線管的黑白電視機發明以後,顯示 技術便不斷地快度的演進,各種顯示面板技術不斷的 被研發出來;如液晶顯示面板(LCD, Liquid Crystal Displays)、場發射顯示面板(FEDs,Field Emission Displays)、電漿電視(PDPs, Plasma Displays)..等。在這些平面顯示技術當中,以液晶 顯示面板技術為最純熟及最普及化的一項產品。液晶 顯示面板的優點為重量輕、省電、可攜帶、無輻射及 全彩色等優點,可應用於手機、語言翻譯機、數位相 機及攝影機、筆記型電腦等各類的電子商品。 因此隨著影像顯示產業的蓬勃發展,於顯示面板 在產品檢測上也顯的相當重要,其中顯示面板的光學 特性的檢測技術亦為相當重要的一環,特別是視角測 量技術、色度和輝度的測量方法。目前所發展的顯示 面板檢測設備多以早點式量測為主。早點量測因為檢 測速度較慢,而目前研究是以全面性量測為目標。有 關使用CCD來獲得光線資訊的可得性或是在定義光 度學性質的照明設備這些科技的系統正被研究設立, 研究構思在於全晝面影像擷取分析色度均性量測,供 3 201024702 大量縮短檢測整個平面顯示面板的時間與提高其量測 精準度,如我國專利公告第〇〇558633號之「測量 LCD角度依存之輝度特性的方法及系統」、公開第 200804785號之「輝度量測之機構與方法」及公開第 200825396號之「薄膜發光輝度之檢測設備與方法」 〇 由於量,時,需針對待測面板所發出的光線進行 不同位置、兩度、距離與角度的量測,故量測儀需能 相對待測面板移動與旋轉。但目前的量測系統大抵係 令集光的量測儀直接相對待測面板移動【如第一圖所 示】,如此不僅增加量測系統結構的複雜度,且驅動 元件的規格與強度均需提高,不僅增加製造成本,且 外界干擾大【如馬達規格越大其電磁干擾越大】,再 者也減緩了量測儀移動的速度與靈活性。 、f鑑於此’本發明人乃藉由多年從事相關產品的 製造”研發經驗,針對前述現有量測系統所面臨的問 題深入探討,並積極尋求解決之道,經不斷努力的研 © 冑與試作,終於創作出1顯示面板之量測系統,藉 以克服現有量測系統量測不方便及彈性不足的問題。 【發明内容】 一口此,本發明之目的即在提供一種可簡化結構的 顯不面板之量測系統’藉以減少干擾,且提升量測操 作的便利性與彈性。 又,本發明之另一目的在於提供一種可快速移動 的顯不面板之量測系統,藉以提升量測的效率,並進 一步增進其量測的準確度; 4 201024702 基於此,本發明主要係透過下列的技術手段來具 體實現前述的目的與效能;其包含有: 一承載裝置,其係可供一待測面板水平放置固定 , 一支撐裝置,其具有一 X軸調整單元與一Y軸調 整單元,使支撐裝置可相對前述待測面板選擇性調節 位置; 一檢測裝置,其具有一量測儀、一設於支撐裝置 上的集光元件、一連接集光元件與量測儀之導光元件 ® 及一供處理與輸出資料之處理單元,其中集光元件並 對應前述之待測面板。 經由前述技術手段的實現,使得本發明可透過集 光元件與導光元件將待測面板的光源引導至量測儀内 ,簡化量測系統的結構,以減少外界的干擾,進一步 可增加量測的便利性及彈性,並可提升量測效率與準 確率,而能增加產品的附加價值,並提升其競爭力與 經濟效益。 ❿ 以下為配合圖式及圖號,列舉一較佳實施例做進 一步之說明,期能使熟悉本項技術者對本發明有更詳 細的暸解,惟以下所述者僅為用來解釋本發明之較佳 實施例,並非企圖據以對本發明做任何形式上之限制 ,因此凡是在本發明之創作精神下,所為任何形式的 修飾或變更,皆仍應屬於本發明意圖保護之範疇。 【實施方式】 本發明係一種顯示面板之量測系統,如第二圖所 示,該量測系統包含有一承載裝置(10)、一支撐裝 5 201024702 置(20)及一檢測裝置(3〇),使得待測面板(4〇) 【如第三圖所示】的光源可以引導的方式導入檢測裝 置(30 )内; ❺ ❹ 而關於本發明較佳實施例的詳細構成,則仍請參 看第二圖所示,其中承载裝置(10)係可讓待測面板 (40)呈水平放置狀【如第三圖所示】,而支撐裝置 (20)的角落設有可調節高度的z軸調整單元(21) 三再者支撐裝置(20)更具有可調節位置的χ軸調整 單元(22)與Υ軸調整單元(23),使支撐裝置(2〇 )能相對承載裝置(1G)上的制面板⑽)選擇性 ,整Ζ軸、X軸及γ軸的對角度及位置,且ζ抽調整 單元(21)、Χ軸調整單元(22)與γ軸調整單元( 23)上另設有一或多數定點感測器,可用於檢知支撐 裝置(20)的位置與角度; 且檢測裝置(3〇)具有一量測儀(31)、一設於 =撐裝置(20)上、且對應待測面板⑷)的集光元 ϋ 一連接集光元件(33)與量測儀(31)之 導光το件(32)及-供處理與輸出資料之處理單元( 料而ft量測儀(31)可對處理單元(35)傳輸資 L ==(31)可為輝度計或CCD等檢測 =用於透過集光元件(33)與導光元件(32)接 5Π(40)的光源後’可將該光源輸入至處理 $协道止-,又集光凡件(33)可為光纖或透鏡等, 卜於主=(32)則為具撓性之光纖或導光棒,使 裝置⑽移動、旋轉,件(33)可隨同支撐 m疋轉再者處理單元(35)可選自 6 201024702 電腦或邏輯運算器,且處理單( 數據輸出; &早兀(35)並可將資料與 藉此,使得待測面板(40)的光源可以引 導入檢測裝置(30)内’而組構成便於量測、 少的顯不面板之量測系統者。 镘 至於本發明於實際使用的狀態,則係如第三、四 =圖::’將待測面板㈤平置於承载裝;(1〇 „一 者透過控㈣統與定關測賴作X轴調整 早兀(22)、γ軸調整單元(23)【如第四圖所示 及Ζ軸調整單元(21)【如第五圖所示】位移與轉動 撐(2〇)移動至檢測位置與角度,使支 按裝置(20)上的檢測裝置(3〇)集光元件 應該待測面板(40),使待測面板(4〇)力出的光線 可經由集光元件(33)收集,並利用導光元件、j 導入量測儀(31),再者量測儀(31)輸入至處理 ==内’以透過處理單元(35)内的軟體進行運 ❿ 、歸納上述,本發明的待測面板(40)係水平置於 承載裝置(10)上’且檢測裝置(3G)係利用與井 =牛(32)連接的集光元件(33)來收集待測面板( 4〇)的光線,因此可簡化整個架設檢測裝置 = Γ2〇)之結構’如此所使用的驅動元件規格 :士幅縮小,結構也可以更為簡化,不僅能降低製作 成本’且可減少不必要的干擾,進—步並 的便利性與靈活性。 捉升麵作 且由於支撐裝置(20)僅需負載集光元件(33) 7 201024702 的重量,可避免因重量而造成移動誤差,如此可大幅 提升量測的準確度,且能讓支推裝置(20)的移動更 為快速,而提升量測的效率。 再者如第六圖所示,其中承載裝置(10)係設有 於一輪送裝置(50)上,藉以利用輸送裝置(50)的 連動’而能讓支撐裝置(20)上的檢測装置(3〇)連 續檢測待測面板(4〇 ),如此可進一步可提升其量測 效率。201024702 VI. Description of the Invention: [Technical Field] The present invention relates to the field of light measurement technology for a display panel, and more particularly to a display panel measuring system with simple structure and less interference, thereby improving measurement Convenience and flexibility, and can improve its measurement efficiency and accuracy. [Prior Art] According to the invention of the black-and-white television set of the cathode ray tube, the display technology has been continuously rapidly developed, and various display panel technologies have been continuously developed; for example, liquid crystal display (LCD), field Transmitting display panels (FEDs, Field Emission Displays), plasma televisions (PDPs, Plasma Displays), etc. Among these flat display technologies, liquid crystal display panel technology is the most sophisticated and most popular product. The advantages of the liquid crystal display panel are light weight, power saving, portability, no radiation, and full color. It can be applied to various electronic products such as mobile phones, language translators, digital cameras, cameras, and notebook computers. Therefore, with the vigorous development of the image display industry, display panels are also very important in product inspection. The detection technology of the optical characteristics of the display panel is also a very important part, especially the viewing angle measurement technology, chromaticity and luminance. Measurement methods. At present, the development of display panel inspection equipment is mostly based on early measurement. Early measurement is slow because of the current measurement, and the current research is aimed at comprehensive measurement. Systems for the use of CCDs to obtain the availability of light information or for the definition of photometrically illuminating devices are being developed. The research concept is to analyze the chromaticity uniformity of the full-surface imagery for 3 201024702. A large number of times to shorten the time of detecting the entire flat display panel and improve its measurement accuracy, such as "Method and System for Measuring the Brightness Characteristics of LCD Angle Dependence" in Chinese Patent Publication No. 558 633, "Glow Measurement" of No. 200804785 "Mechanism and method" and "Detection equipment and method for thin film luminance" of the publication No. 200825396 〇 Depending on the amount, it is necessary to measure different positions, two degrees, distances and angles for the light emitted by the panel to be tested. Therefore, the measuring instrument needs to be able to move and rotate relative to the panel to be tested. However, the current measurement system is generally such that the measuring instrument of the collecting light moves directly relative to the panel to be tested [as shown in the first figure], which not only increases the complexity of the measuring system structure, but also requires the specification and strength of the driving components. Improvement, not only increases manufacturing costs, but also has large external interference [such as the larger the motor specification, the greater the electromagnetic interference], and the slower speed and flexibility of the measuring instrument. In view of the research and development experience of the 'inventors of the present invention through the manufacture of related products for many years', the in-depth discussion of the problems faced by the above-mentioned existing measurement systems, and actively seeking solutions, has been continuously researched and tested. Finally, a measurement system for the display panel is created, thereby overcoming the problem of inconvenience and lack of flexibility of the existing measurement system. [Invention] In one aspect, the object of the present invention is to provide a display panel that can simplify the structure. The measurement system is used to reduce interference and improve the convenience and flexibility of the measurement operation. Moreover, another object of the present invention is to provide a measurement system for a display panel that can be quickly moved, thereby improving measurement efficiency. And further improve the accuracy of the measurement; 4 201024702 Based on this, the present invention mainly achieves the foregoing objectives and effects through the following technical means; the present invention comprises: a carrying device, which is available for a panel level to be tested Positioned and fixed, a supporting device having an X-axis adjusting unit and a Y-axis adjusting unit, so that the supporting device can be opposite to the foregoing The measuring panel selectively adjusts the position; a detecting device has a measuring instrument, a light collecting component disposed on the supporting device, a light guiding component connected to the light collecting component and the measuring instrument, and a processing and output data The processing unit, wherein the light collecting element corresponds to the panel to be tested. The realization of the foregoing technical means enables the light source of the panel to be tested to be guided into the measuring instrument through the light collecting element and the light guiding element, simplifying the amount The structure of the measurement system is designed to reduce external interference, further increase the convenience and flexibility of measurement, and improve measurement efficiency and accuracy, thereby increasing the added value of products and enhancing their competitiveness and economic benefits. The following is a description of the preferred embodiments in order to provide a more detailed description of the present invention, and the following description is only for the purpose of explaining the present invention. The preferred embodiment is not intended to limit the invention in any way, and thus any form of modification or alteration, in the spirit of the invention, The present invention is also intended to protect the present invention. [Embodiment] The present invention is a measurement system for a display panel, as shown in the second figure, the measurement system includes a carrying device (10), a support device 5 201024702 (20) and a detecting device (3〇), such that the light source of the panel to be tested (as shown in the third figure) can be guided into the detecting device (30) in a guided manner; For the detailed configuration of the embodiment, please refer to the second figure, wherein the carrying device (10) allows the panel (40) to be tested to be horizontally placed [as shown in the third figure], and the supporting device (20) The corner is provided with an adjustable height z-axis adjustment unit (21). The third support device (20) further has an adjustable position of the cymbal adjustment unit (22) and the boring adjustment unit (23) for supporting the device (2) 〇) can select the angle and position of the entire axis, the X axis and the γ axis with respect to the panel (10) on the carrier (1G), and the pumping adjustment unit (21) and the shaft adjustment unit (22) One or more fixed-point sensors are additionally provided on the γ-axis adjustment unit (23) for inspection The position and angle of the supporting device (20); and the detecting device (3) has a measuring instrument (31), a collecting unit disposed on the = supporting device (20), and corresponding to the panel (4) to be tested. Connecting the light collecting element (33) and the light guiding unit (32) of the measuring instrument (31) and the processing unit for processing and outputting data (the material and the ft measuring instrument (31) can transmit to the processing unit (35) L == (31) can be detected by a luminance meter or CCD, etc. = after connecting the light source (33) and the light guiding element (32) to the light source of 5 Π (40), the light source can be input to the processing $ The stop-and-light collection (33) can be an optical fiber or a lens, etc., and the main = (32) is a flexible optical fiber or light guide rod, so that the device (10) can be moved and rotated, and the member (33) can be The support unit (35) can be selected from the 6 201024702 computer or logic operator, and the processing unit (data output; & early (35) and the data can be used to make the panel to be tested ( The light source of 40) can be guided into the detecting device (30) to form a measuring system which is convenient for measurement and has few panels. As for the state of actual use of the present invention, it is as follows: third, fourth = map:: 'Place the panel to be tested (five) flat on the carrying device; (1〇„一的控制(四)统和定关测作 X Axis adjustment early 兀 (22), γ axis adjustment unit (23) [as shown in the fourth figure and Ζ axis adjustment unit (21) [as shown in the fifth figure] displacement and rotation support (2 〇) moved to the detection position And the angle, so that the light collecting component on the supporting device (20) should be the panel (40) to be tested, so that the light from the panel to be tested can be collected through the light collecting component (33). And using the light guiding element, j to introduce the measuring instrument (31), and then inputting the measuring instrument (31) into the processing == inside 'to pass through the software in the processing unit (35) for operation, summarizing the above, the present invention The panel to be tested (40) is horizontally placed on the carrying device (10)' and the detecting device (3G) collects the panel to be tested (4〇) by using the light collecting element (33) connected to the well = cow (32). The light, therefore simplifies the structure of the entire erection detection device = Γ 2〇) 'The driving component specifications used so that the size of the drive is reduced and the structure can be more In addition, it can not only reduce the production cost, but also reduce unnecessary interference, and the convenience and flexibility of the step-by-step operation. Since the supporting device (20) only needs to load the light collecting element (33) 7 201024702 The weight can avoid the movement error caused by the weight, which can greatly improve the accuracy of the measurement, and can make the movement of the pushing device (20) faster and improve the efficiency of the measurement. Furthermore, as shown in the sixth figure The carrier device (10) is disposed on a wheeling device (50), whereby the detecting device (3) on the supporting device (20) can be continuously detected by using the linkage of the conveying device (50). The panel (4〇) can further improve its measurement efficiency.

•丨芦Μ上所述者,僅為本發明之較佳實施例 而已’當不能以此限定本發明實施之範圍,即 大凡依本發明申請專利範圍及發明說明内容所 單,效變化與修飾’皆仍屬於本發明 專利涵盍之範圍内。 【圖式簡單說明】 式之量測儀器的外觀示意圖。ϋυ:明之量測系統的外觀示意圖。 =本發明之量喝統於實際使㈣外觀示意 ϊ ii明之量測系統於實際使用的俯視平面 第四圖 第五圖 弟六圖··係本發明 :i:明之量測系統於實際使用的侧視平面 示意圖。'系、、先應用於連續作業的外觀 201024702 【主要元件符號說明】 (10) 承載裝置 (20) 支撐裝置 (21) Z軸調整單元 (22) X轴調整單元 (23) Y軸調整單元 (30) 檢測裝置 (31) 量測儀 (32) 導光元件 (33) 集光元件 (35) 處理單元 (40) 待測面板 (50) 輸送裝置 七、申請專利範圍: 一種顯示面板之量測系統,其包含有: 一承載裝置,其係可供一待測面板水平放置固定 9 一支撐裝置,其具有一 X軸調整單元與一 Y轴調 整單元,使支撐裝置可相對前述待測面板選擇性 調節位置; 2、 一檢測裝置,其具有一量測儀、一設於支撐裝置 上的集光元件、一連接集光元件與量測儀之導光 元件及一供處理與輸出資料之處理單元,其中集 光元件並對應前述之待測面板。 依據申請專利範圍第1項所述顯示面板之量測系 統,其中該支撐裝置並具有一可調節高度的Z轴 調整單元,供改變集光元件對應待測面板的視角 〇 3、 依據申請專利範圍第2項所述顯示面板之量測系 統,其中該支撐裝置之Z軸調整單元、X軸調整 單元與Y軸調整單元上設有一或多數定點感測器 ,可用於檢知支撐裝置的位置與角度。 4、 依據申請專利範圍第1項所述顯示面板之量測系 9The above description of the cucurbits is only a preferred embodiment of the present invention, and the scope of the present invention is not limited thereto, that is, the scope of the patent application and the description of the invention are varied and modified. 'All are still within the scope of the patent of the present invention. [Simple diagram of the diagram] The appearance of the measuring instrument. Ϋυ: A schematic diagram of the appearance of the measurement system. = The amount of the invention is based on the actual appearance of (4) Appearance ϊ ii The measurement system is used in the actual use of the plan view. The fourth picture is the fifth picture. The invention is: i: The measurement system of the Ming is actually used. Side view of the plane. 'System, first applied to the appearance of continuous operation 201024702 [Description of main components] (10) Carrier (20) Support device (21) Z-axis adjustment unit (22) X-axis adjustment unit (23) Y-axis adjustment unit ( 30) Detection device (31) Measuring instrument (32) Light guiding element (33) Light collecting element (35) Processing unit (40) Panel to be tested (50) Conveying device 7. Patent application scope: Measurement of a display panel The system includes: a carrying device for horizontally fixing a panel to be tested; a supporting device having an X-axis adjusting unit and a Y-axis adjusting unit, so that the supporting device can be selected relative to the panel to be tested Positioning device; 2. A detecting device having a measuring instrument, a light collecting component disposed on the supporting device, a light guiding component connecting the light collecting component and the measuring instrument, and a processing for processing and outputting data a unit, wherein the light collecting element corresponds to the aforementioned panel to be tested. The measuring system of the display panel according to claim 1, wherein the supporting device has an adjustable height Z-axis adjusting unit for changing the viewing angle of the light collecting element corresponding to the panel to be tested, according to the patent application scope. The measuring system of the display panel of the second aspect, wherein the Z-axis adjusting unit, the X-axis adjusting unit and the Y-axis adjusting unit of the supporting device are provided with one or more fixed-point sensors, which can be used for detecting the position of the supporting device and angle. 4. The measurement system of the display panel according to item 1 of the patent application scope 9

Claims (1)

201024702 【主要元件符號說明】 (10) 承載裝置 (20) 支撐裝置 (21) Z軸調整單元 (22) X轴調整單元 (23) Y軸調整單元 (30) 檢測裝置 (31) 量測儀 (32) 導光元件 (33) 集光元件 (35) 處理單元 (40) 待測面板 (50) 輸送裝置 七、申請專利範圍: 一種顯示面板之量測系統,其包含有: 一承載裝置,其係可供一待測面板水平放置固定 9 一支撐裝置,其具有一 X軸調整單元與一 Y轴調 整單元,使支撐裝置可相對前述待測面板選擇性 調節位置; 2、 一檢測裝置,其具有一量測儀、一設於支撐裝置 上的集光元件、一連接集光元件與量測儀之導光 元件及一供處理與輸出資料之處理單元,其中集 光元件並對應前述之待測面板。 依據申請專利範圍第1項所述顯示面板之量測系 統,其中該支撐裝置並具有一可調節高度的Z轴 調整單元,供改變集光元件對應待測面板的視角 〇 3、 依據申請專利範圍第2項所述顯示面板之量測系 統,其中該支撐裝置之Z軸調整單元、X軸調整 單元與Y軸調整單元上設有一或多數定點感測器 ,可用於檢知支撐裝置的位置與角度。 4、 依據申請專利範圍第1項所述顯示面板之量測系 9 201024702 統,其令該檢測裝置可選自輝度計或 5、 依據申請專利範圍第i項所述顯示η 統,其尹該檢測裝置的集光元t罝树系 鏡等。 衣且j呆亢70件係選自光纖或透 6、 :據:f專利範圍第1項所述顯示面板之量測系 、、,,、中該檢測裝置的導光元件係選自具撓性 光纖或導光棒。 < 7、 依據申請專利範圍第i項所述顯示面板之量測系 ❹ 統,其中該檢測裝置的處理單元係選自電腦或邏 輯運算器。201024702 [Description of main component symbols] (10) Carrier device (20) Support device (21) Z-axis adjustment unit (22) X-axis adjustment unit (23) Y-axis adjustment unit (30) Detection device (31) Measuring instrument ( 32) Light guiding element (33) Light collecting element (35) Processing unit (40) Panel to be tested (50) Conveying device 7. Patent application scope: A measuring system for a display panel, comprising: a carrying device, The utility model is characterized in that a panel to be tested is horizontally fixed and fixed by a supporting device, which has an X-axis adjusting unit and a Y-axis adjusting unit, so that the supporting device can selectively adjust the position relative to the panel to be tested; 2. a detecting device, The invention has a measuring instrument, a light collecting component disposed on the supporting device, a light guiding component connecting the light collecting component and the measuring instrument, and a processing unit for processing and outputting data, wherein the light collecting component corresponds to the foregoing Test panel. The measuring system of the display panel according to claim 1, wherein the supporting device has an adjustable height Z-axis adjusting unit for changing the viewing angle of the light collecting element corresponding to the panel to be tested, according to the patent application scope. The measuring system of the display panel of the second aspect, wherein the Z-axis adjusting unit, the X-axis adjusting unit and the Y-axis adjusting unit of the supporting device are provided with one or more fixed-point sensors, which can be used for detecting the position of the supporting device and angle. 4. According to the measuring system of the display panel of claim 1, the measuring device 9 201024702 system, which enables the detecting device to be selected from a luminance meter or 5, according to the invention of the scope of the invention, the η system, The collecting unit of the detecting device is a t-tree mirror or the like. 70 pieces of clothing and j are selected from the optical fiber or through 6, according to: the measurement system of the display panel according to the first item of the f patent range, and, wherein, the light guiding element of the detecting device is selected from the group Optical fiber or light guide. < 7. The measuring system of the display panel according to the invention of claim i, wherein the processing unit of the detecting device is selected from a computer or a logic operator.
TW97151571A 2008-12-31 2008-12-31 Measurement system for display panel TW201024702A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103645036A (en) * 2013-12-30 2014-03-19 京东方科技集团股份有限公司 Moire pattern evaluation method and device
TWI467139B (en) * 2011-01-21 2015-01-01 Hon Hai Prec Ind Co Ltd Device for testing luminance

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI467139B (en) * 2011-01-21 2015-01-01 Hon Hai Prec Ind Co Ltd Device for testing luminance
CN103645036A (en) * 2013-12-30 2014-03-19 京东方科技集团股份有限公司 Moire pattern evaluation method and device
US9506875B2 (en) 2013-12-30 2016-11-29 Boe Technology Group Co., Ltd. Detection-evaluation method and device for moiré pattern

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