201007139 九、發明說明： 【發明所屬之技術領域】 一種測試緣及方法，制有_—騎_具有新世代周 邊連接介面之主機的測試系統及其測試方法。 【先前技術】 為了解決個人電财的各項設備對於頻寬的需要，近來發布 了-種新世代周邊連接介面(PeripheraI c，咖旭⑽皿奶 © Exp職)匯流排。這種技術起勒是為實現高速傳送資料所設計。其 中，新世代周邊連接介面提供給每一個設備它自己專用的匯流 排。資料通過被稱為通道(iane)的發送和接受信號對來以封包 (pacte)的形式串行傳輸’在第—代的新世代周邊連接界面的每個 通道具有單方向250Gigabiis/sec的速度。多個通道可以組合在一 起形成 XI、X2、X4、X8 高插槽的頻寬。 X12、X16、和X32的通道頻寬從而提 © 為因應使用者的需求，因此許多域板麵也加人新世代周 邊，接介面匯流排。目前針對新世代周邊連接介關測試方法通 常是在新世代周邊連接介面插槽上插人—騎世代周邊連接介面 卡’如果賴正確操作此卡，則認為新世代周邊連接介面插槽是 玉常的。這酬試方式是正麵，但是目前產線上沒有專門用來 測試的新世代周邊連接介面卡，而是制朝設備卡，通用設備 卡例如為ΙΌ_Εχρ_ _卡。由於_卡健·數_專輸速 201007139 度二而不注麵π的鞋特徵蝴助信制試。因此無法全面的 測4新世朗邊連接介面卡的各鄕徵，使得職的過程需要反 覆的插拔不同的通用卡進行測試。 【發明内容】 馨2上的問題，本發明的主要目的在於提供—種對新世代 制=:蝴峨’祕戦具有新侧細介面的 ❹ ==目的’本判露之—種對新世代周邊連接介面 _试錢包财：待啦_戦料 刪連接介面之插槽、處理單元、儲存單元C =:儲存對新世代周邊連接介面之測試 序。測處理單元肋執行測試程 古^^ 邊連接介面之_，戦治呈包括 新代周邊連接介面控制器，測試程序透 面傳輸複數舞嫩梅刪_ 根據新世代周邊連接介面控制器所回傳的 2取私序 代周邊連接介面之插槽的運作狀態。 。儿用以解析新世 從本發_另-誠，本發喷出—輯新世代觸 面的測試方法’驗測試具有新世朗邊連接介_待測主機。)丨 為達上述目的，本發明所揭露之對新世代周邊遠接人 試方法包括町辣：錢峨 2 面的測 /、至待測主機的新世代周邊連 201007139 接介面之_，並將賴治具設定為第—運作模式；在待測主機 上執行測試程序，用以發送複數筆測試訊號至測試治具；傳送、备 數筆回覆訊㈣mat _物键_編彳試= 得測試治具翻能；經過第—時間後，將職治具致能並將測試 ’ °具切換至第二運作模式；重複執行測試程序。 〇 本發明係提供-種測試新世代周邊連接介面的系統，利用待 測主機上的賴程序用以對測試治具進行各種項目的測試。待測 程序解析賴治具所傳回來的回覆訊號，待難相以判斷待測 主機上的新世代周邊連接介面插槽及其®流排是否運作正常。 有關本發_概與實作，紐合_作最佳實施例詳細說 明如下。 【實施方式】 ,^考第1圖」所示’其係為本發明之系統架構示意圖。 ««.^^，t#^S(Penpheral c〇mp〇nent ^ £xpress)^ 測減系統包括有：待測主機11()與測試治具i2Q。待測主機⑽包 括有新世代周翁接介面之減ln、處理單元ιΐ2、儲存單元 li3、虛擬熱插拔程序114舆測試程序115。 儲存單70 113肋齡對新世代周邊連接介面之虛擬熱插拔 程序m與測試鞋序115。處理單元112連接補世代周邊連接介 面與儲存單元113 ’處理單元112用以執行虛擬熱插拔程序⑽與 I式程序115。測試治具12〇連接於新世代周邊連接介面之插槽 201007139 111 /則具120中更包括有新世代周邊連接介面控制器121與 服務訊息阻擋控制器122。 赋料115舰新世代周邊連齡轉輸減_試訊號 至測減/0具12〇的新世代周邊連接介面控制器⑵。測試程序115 根據新世代周邊連接介面控織121 _傳的喊訊號用以解析 新世代周邊連接介面之插槽m的運作狀態。其中，測試程序ιΐ5 中更咏複數筆測試項目，該些測試項目係為介面版本測試、電 、J 式系統 g 理總線(System Management Bus)、JTAG(J〇int 丁故 Action Group)測試、嗅醒測試、預先重設卿卿測試、差分時 ^^t#(Difference Clk and £(lane),t]^ 0 ^ 中，新世代周邊連結介面至少包括有，，xi，,、，，狄，、，m6” 的通道頻寬。 β心丨播测試用以寫入及讀取該服 訊息阻播控制器122之暫存器資料，使得測試程序ιΐ5用以邦 服務訊息阻擋控制器122之運作是否正確。 明茶考第2圖」所不，其係為本發明之運作示意圖。本4 明對新世朗輕接介面關財法包括町步驟：安裝測試、、’ ^至_主_新世代周邊連接介面之插槽，並將測試治呈％ 為弟一運作模式(步驟S210)。在本發明中所指的運作模式係為系 世代周邊連接介面的版本與頻寬。舉例來說， ’、、 介面第-版的”壯，纖輸可以視為—種運作模式；在== 201007139 邊連接介面第一版的” χ2，，頻寬傳輸視為另 代周邊雜^楚 料作Μ;在新世 弟二版的，，Χ1”頻寬傳輸視為相異於上述的另 種運作模式。 上述的另一 在待測主機上執行測試程序，複數 試治具(步驟⑽)。在馳序115㈣包細蝴 介面版本顧、f力職、_t_線、TUg嗔、喚醒 預先重、差分時脈及資料之職與/麵寬峨。舉例來說， 在測試服務訊息阻擋的測試中，測試程序m會將資料寫入/讀取 服務訊息阻播控制器、122之暫存器資料，使得測試程序出用以 判斷服務訊息阻擔控制！ 122之運作是否正確。 ，測試治具根據所接收到的測試訊號進行相應處理後，傳送複 數筆回覆訊號至測試程序(步驟S23〇)。接下來，由測試治具執行 虚擬熱插拔測試，使得測試治具被禁能(步驟S24〇)。首先，測試 程序115會發送熱插拔測試訊號至測試治具12〇,用以將測試治具 ❹120不此(disable)。這樣一來傳輸連結會處於無效狀態細如）。 測試程序在經過第—時職，會制試治賊能並將測試治 具切換至第二運作模式(步驟㈣）。再將測試治具i2Q致能步驟 中更包括下列的步驟：致能(enable)測試治具12〇，使得參考時脈 (REFCLK)信號開起。接著，令傳輸連結(Link)處於動態或是經由 主動式電源官理(Active state power Management，ASPM)進入省電 模式(可以是電源狀態LGs或電源織L1)。最後錢執行步驟 201007139 S220(步驟S26Q)，直至财的運作封中的每—測試項目都被& 成為止特別而要;主思的疋’本發明係利用虛擬熱插拔測試時， 將測試治具120再重新致能測試治具12〇時將其第一運作 換為另-種運作模式。—方面可以測試熱插拔功能是否正常 少插拔所浪費的時間。 ❹ 本發明係提供-麵試新世代周邊連接介_系統 ::了上的測試程序115用以對測試治 測程序解析測試治具120所傳回來的回覆訊號，待測程序用以判 斷待測主機1U)上的新世代周邊連 乐序用㈣ 是否運作正常。 如面之插肖⑴及其匯流排 =_日_叙健加稿露如上，然_用以限 内，當可作轉之更動田脫離本發明之精神和範圍 本說明書所附之申請專利範圍所界定者為準。、—頁視 【圖式簡單說明】 第1圖係為本發明之系統架構示意圖。 第2圖係為本發明之運作流程示意圖。 【主要元件符號說明】 110 待測主機 111 新世代周邊連接介 112 處理單元 11 201007139 113 儲存單元 114 虛擬熱插拔程序 115 測試程序 120 測試治具 121 新世代周邊連接介面控制器 122 服務訊息阻擋控制器201007139 Nine, invention description: [Technical field of invention] A test edge and method, which has a test system and a test method for a host with a new generation peripheral connection interface. [Prior Art] In order to solve the need for bandwidth of various devices for personal finance, a new generation of peripheral connection interfaces (Periphera I c, Kaxu (10) milk © Exp) bus has recently been released. This technology is designed to achieve high-speed data transmission. Among them, the new generation peripheral connection interface provides each device with its own dedicated bus. The data is serially transmitted in the form of a packet by a pair of transmitting and receiving signals called an eae. Each channel of the new generation peripheral connection interface of the first generation has a speed of 250 Gigabiis/sec in one direction. Multiple channels can be combined to form the bandwidth of the XI, X2, X4, and X8 high slots. The channel bandwidth of X12, X16, and X32 is raised accordingly. In order to meet the needs of users, many domain boards are also added to the new generation perimeter and interface bus. At present, the test method for the connection connection of the new generation is usually inserted in the socket of the new generation peripheral connection interface—the connection interface card of the generation generation. If the card is operated correctly, the connection interface slot of the new generation is considered to be Yuchang. of. This method of compensation is positive, but there is no new generation peripheral connection interface card for testing on the production line, but a device card, such as ΙΌ_Εχρ__ card. Because of the _ card health number _ special speed 201007139 degrees two without the surface π shoes feature butterfly help test. Therefore, it is impossible to comprehensively measure the various signs of the 4 New World Long Edge connection interface card, so that the job process needs to be inserted and removed with different universal cards for testing. SUMMARY OF THE INVENTION The problem of the present invention is that the main purpose of the present invention is to provide a new generation system for the new generation system: the key to the new generation. Peripheral connection interface _ test wallet: _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The test processing unit rib performs the test process. The ^^ side connection interface _, the governance includes a new generation of peripheral connection interface controller, the test program transmits the complex number of dances and the meimei delete _ according to the new generation peripheral connection interface controller The operation of the slot of the private connection generation peripheral connection interface. . For the analysis of the new world from the hair _ another - sincerity, this hair squirt - the test method of the new generation touch test 'test test with a new world lang jun _ test host. In order to achieve the above objectives, the method for testing the remote generation of the new generation disclosed in the present invention includes the test of the town of Shou Shou: Qian Qi 2, and the connection to the new generation of the host to be tested, and the interface of 201007139, and Lai Zhiji is set to the first-operation mode; the test program is executed on the host to be tested to send a plurality of test signals to the test fixture; the transmission and the backup report are repeated (4) mat _object key _ editing test = test With the turn-over energy; after the first time, the function is enabled and the test is switched to the second mode of operation; the test procedure is repeated. 〇 The present invention provides a system for testing a peripheral connection interface of a new generation, and uses the Lay program on the host to be tested to test various items of the test fixture. The program to be tested analyzes the reply signal sent back from Laizhi, and it is difficult to judge whether the new generation peripheral connection interface slot and its ® flow channel on the host under test are functioning properly. The details of the present invention, the implementation, and the best embodiment are described below. [Embodiment] FIG. 1 is a schematic diagram of a system architecture of the present invention. ««.^^,t#^S(Penpheral c〇mp〇nent ^ £xpress)^ The measurement and reduction system includes: the host 11 () to be tested and the test fixture i2Q. The host to be tested (10) includes a subtraction ln of the new generation Zhou Wen interface, a processing unit ι 2, a storage unit li3, a virtual hot plug program 114, and a test program 115. The storage list is 70 113 ribs for the virtual hot plugging program m of the new generation peripheral connection interface and the test shoe sequence 115. The processing unit 112 is coupled to the complementary generation peripheral connection interface and storage unit 113' processing unit 112 for performing the virtual hot plug process (10) and the I program 115. The test fixture 12 is connected to the slot of the new generation peripheral connection interface. The 201007139 111/station 120 further includes a new generation peripheral connection interface controller 121 and a service message blocking controller 122. In the new generation of the new generation, the connection between the new generations of the 115 ship is reduced to _ test signal to the measurement / reduction / 0 with 12 〇 new generation peripheral connection interface controller (2). The test program 115 analyzes the operation status of the slot m of the peripheral connection interface of the new generation according to the new generation peripheral connection interface control. Among them, the test program ιΐ5 is more than a plurality of test items, which are interface version test, electric, J-type system management bus (System Management Bus), JTAG (J〇int Ding Action Group) test, sniffing Wake up test, pre-reset Qingqing test, difference ^^t# (Difference Clk and £(lane),t]^ 0 ^, the new generation peripheral connection interface includes at least, xi,,,,, Di, , the channel bandwidth of the m6". The beta heartbeat test is used to write and read the scratchpad data of the service message blocking controller 122, so that the test program ιΐ5 is used to operate the message blocking controller 122. Whether it is correct. The second section of the Mingcha test is not the case. It is a schematic diagram of the operation of the present invention. This 4th paragraph on the Xinshilang light interface method includes the town steps: installation test, '^至_主_新The slot of the peripheral interface of the generation is connected, and the test is in a mode of operation (step S210). The mode of operation referred to in the present invention is the version and bandwidth of the peripheral connection interface of the generation. For example, ',, interface version--" strong, fiber loss can be regarded as - species Operation mode; in the first version of the == 201007139 interface, "χ2, the bandwidth transmission is regarded as another generation of miscellaneous ^ Chu Μ Μ; in the second edition of the new world, Χ 1" bandwidth transmission is considered as phase The other mode of operation is different from the above. The other one of the above tests is executed on the host to be tested, and the plurality of test fixtures (step (10)). In the step 115 (four) package, the interface version, the force, the _t_ line, TUg嗔, wake up pre-heavy, differential clock, and data job/face width. For example, in the test service message blocking test, the test program m will write/read the service message blocking controller. The 122 temporary register data is used to determine whether the service message is controlled by the test program. The operation of the test fixture is correct. The test fixture transmits a plurality of response signals to the test according to the received test signal. The program (step S23〇). Next, the virtual hot plug test is performed by the test fixture, so that the test fixture is disabled (step S24〇). First, the test program 115 sends the hot plug test signal to the test fixture. 12〇, used to test ❹120 is not disabled. In this way, the transmission link will be in an invalid state. The test program will pass the first-time job, and the test thief will be able to switch the test fixture to the second operation mode (step (4)). Further, the test fixture i2Q enabling step further includes the following steps: enabling the test fixture 12〇 to enable the reference clock (REFCLK) signal to be turned on. Then, making the transmission link (Link) dynamic or The active power management (ASPM) is used to enter the power saving mode (which may be the power state LGs or the power woven L1). Finally, the money executes step 201007139 S220 (step S26Q), until each test item in the financial operation seal is "specially required"; the main thinking of the invention is to use the virtual hot plug test, the test will be tested When the jig 120 is re-enabled to test the fixture 12, its first operation is changed to another mode of operation. - You can test whether the hot plug function is normal. ❹ The present invention provides an interview with a new generation of peripheral connections. System: The test program 115 is used to analyze the response signal sent by the test fixture 120 to the test and test program. The test program is used to determine the host to be tested. The 1U) is used in the new generation of surrounding music (4). If the face is inserted (1) and its busbars = _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The definition is final. - Page view [Simple description of the diagram] Figure 1 is a schematic diagram of the system architecture of the present invention. Figure 2 is a schematic diagram of the operational flow of the present invention. [Main component symbol description] 110 Host to be tested 111 New generation peripheral connection interface 112 Processing unit 11 201007139 113 Storage unit 114 Virtual hot plug program 115 Test program 120 Test fixture 121 New generation peripheral connection interface controller 122 Service message blocking control Device
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