200935073 九、發明說明： 【發明所屬之技術領域】 本發明是有關於一種測試裝置，特別是指一種用於測 式主動式液晶面板的測試裝置。 【先前技術】200935073 IX. Description of the Invention: [Technical Field] The present invention relates to a test apparatus, and more particularly to a test apparatus for a test active liquid crystal panel. [Prior Art]
目前市面上有許多種不同規格的液晶面板（liquid crystal panel )，分別以不同的型號來表示。每一液晶面板可 與一驅動積體電路及一背光模組組裝成一液晶模組（liquid crystal module )。在組裝前，必須先對該液晶面板進行測試 ’並在該液晶面板是不良品時，將該液晶面板捨棄，而不 組裝成該液晶模組’以避免人力、時間及元件的浪費。 當該液晶面板是一主動式液晶面板時，該液晶面板包 括一測試電路^ 一般是利用該測試電路來對該液晶面板進 行測試。 參閱圖1及圖2，一習知的測試系統適用於測試一待測 液晶面板3 ^該待測液晶面板3是一主動式液晶面板。該測 試系統包括一測試平台1及一測試主機2。 該測試平台1供該待測液晶面板3放置，且包括一背 光模組11。該背光模組u從該測試系統之外接收一背光電 壓，並提供背光給該待測液晶面板3。 該測試主機2包括-顯示單元21、一按鍵單元22及一 =憶單元23。該顯示單元21提供—文字使用者介面給使用 者，該按鍵單元22提供—操作介面給使用者， 合以供使用者控制該測試主機2的動作。該記憶單元 5 200935073 存複數組測試參數。該測試主機2根據該按鍵單元22所受 的操作’設定該記憶單元23所儲存的測試參數，或者從該 記憶單元23讀取一組測試參數，並據以產生被輸出到該待 測液晶面板3的一組測試信號。There are many different types of liquid crystal panels available on the market, which are represented by different models. Each liquid crystal panel can be assembled into a liquid crystal module with a driving integrated circuit and a backlight module. The liquid crystal panel must be tested before assembly. When the liquid crystal panel is defective, the liquid crystal panel is discarded without being assembled into the liquid crystal module to avoid waste of labor, time, and components. When the liquid crystal panel is an active liquid crystal panel, the liquid crystal panel includes a test circuit. The test circuit is generally used to test the liquid crystal panel. Referring to Figures 1 and 2, a conventional test system is suitable for testing a liquid crystal panel to be tested. The liquid crystal panel 3 to be tested is an active liquid crystal panel. The test system includes a test platform 1 and a test host 2. The test platform 1 is placed for the liquid crystal panel 3 to be tested, and includes a backlight module 11. The backlight module u receives a backlight voltage from outside the test system and provides backlight to the liquid crystal panel 3 to be tested. The test host 2 includes a display unit 21, a button unit 22, and a = memory unit 23. The display unit 21 provides a text user interface to the user, and the button unit 22 provides an operation interface to the user for the user to control the action of the test host 2. The memory unit 5 200935073 stores the array test parameters. The test host 2 sets the test parameters stored by the memory unit 23 according to the operation of the button unit 22, or reads a set of test parameters from the memory unit 23, and generates and outputs the test parameters to the liquid crystal panel to be tested. A set of test signals for 3.
Ο 由於該記憶單元23是設置在該測試主機2中，且該測 試主機2用於測試許多種不同規格的液晶面板，該記憶單 元23 —般會儲存多數種不同規格的液晶面板所需的測試參 數（例如：儲存五種不同規格的液晶面板所需的測試參數 ’且每一種規格的液晶面板最多八組測試參數），以避免必 須經常設定該記憶單元23所儲存的測試參數。因此，在每 次設定時，使用者必須記錄該記憶單元23所儲存的每一組 測試參數是對應到哪一型號的液晶面板，且在每次測試時 ，使用者必須根據記錄查詢哪一組測試參數適合該待測液 晶面板3，如此會增加管理上的麻煩。 而且 田於琢記憶單疋23沒有儲存與每一組測試參數 對應的液晶面板型號，該顯示單元21無法顯示與讀取出的 該組測試參數對應的液晶面板型號。因此，在每次測試時 ，使用者無法再次確定讀取出的該紐測試參數是否真的適 合該待測液晶面板3，如此會增加選擇錯誤的機會 再者’由於該顯示單元21只能顯示令♦ 顯不文字，當使用者要 §又疋該記憶單元23所儲存的測試參數時，、/ 單元21所顯示的名稱及數值所代表的 p頁了解該顯7Γ ..„ 、義（例如：’’Delay 1 timing ’是代表什麼時間及”002”是代表多長 正確地設定。因此，使用者必須是相 的夺間）才月b 剛’域的專業人士， 200935073 才有能力了解並進行適當的設定。 另外，由於該背光模組11是從該測試系統之外接收該 背光電壓，在每次測試時，使用者必須額外準備一電源供 應器來提供該背光電壓，如此會增加使用上的麻填。 【發明内容】 因此’本發明之目的即在提供一種測試系統，可以減 少管理上的麻煩。 ❹ ❹ 於是’本發明測試系統適用於測試一待測液晶面板， 且包含一測試平台及一測試主機。 該測试平台供該待測液晶面板放置，且包括一第一記 憶單元及一背光模組。該第一記憶單元儲存至少一組測試 參數。該背光模組提供背光給該待測液晶面板。該測試主 機包括一處理單元、一波形產生單元、一參考電壓產生單 元及一信號產生單元。該處理單元讀取該第一記憶單元， 並輸出s亥第一記憶單元所餘存的一組測試參數。該波形產 生單元根據該處理單元所輸出的該組測試參數產生一组參 考波形。該參考電壓產生單元根據該處理單元所輸出的該 組測試參數產生一組參考電壓。該信號產生單元根據該組 參考電壓調整該組參考波形的電壓，以產生被輸出到該待 測液晶面板的一組測試信號。 較佳地’該測試系統更包含一控制裝置。該控制裝置 包括一第一顯示單元。該第一記憶單元更儲存一型號。該 處理單元更輸出該第一記憶單元所儲存的該型號到該控制 裝置，以被顯示在該第一顯示單元上。如此可以減少選擇 200935073 錯誤的機會》 較佳地’該測試系統更包含一設定裝置。該設定裝置 包括一第二輸入單元及一第二顯示單元。該第二輸入單元 提供一操作介面，以供輸入一組測試設定值。該第二顯示 單元提供一圖形使用者介面。該圏形使用者介面供至少一 圖形呈現，以說明該組測試設定值所代表的意義。該設定 裝置根據該第二輸入單元所受的操作，將被輸入的該組測 _ 試设定值傳送到該處理單元。該處理單元更將該設定裝置 所傳送的該組測試設定值轉換成一組測試參數，並儲存到 該第一記憶單元。如此一般人都有能力了解並進行適當的 設定。 較佳地’該測試主機更包括一背光電壓產生單元。該 第一記憶單元更儲存一背光參數。該處理單元更輸出該第 一記憶單元所儲存的該背光參數。該背光電壓產生單元根 據該處理單元所輸出的該背光參數產生被輸出到該背光模 $ 組的一背光電壓。如此可以減少使用上的麻煩。 【實施方式】 有關本發明之前述及其他技術内容、特點與功效，在 以下配合參考圖式之一個較佳實施例的詳細說明中，將可 清楚地呈現。 參閱圖3及圖4,本發明測試系統之較佳實施例適用於 測试一待測液晶面板8。該待測液晶面板8是一主動式液晶 面板。該測試系統包含一測試平台4、一測試主機5及一控 制裝置6。在下文中以該待測液晶面板8包括一如圖4所示 8 200935073 . 的測試電路81為例進行說明。 該測試平台4供該待測液晶面板8放置，且包括一第 一3己憶單几41及一背光模組42。該背光模組42接收一背 光電壓，並提供背光給該待測液晶面板8。該第一記憶單元 41儲存一型號、一背光參數及至少一組測試參數，其中， 該組測試參數描述—組測試信號VdataR 、VdataG、VdataB Vgl、Vg2、Vgg、Vc〇m，每一測試信號是一直流信號及 〇 —脈衝信號中的-者’且當該測試信號是-直流信號時， 該組測試參數描述該測試信號的電壓，而當該測試信號是 一脈衝信號時’該組測試參數描述該測試信號的時序及電 麼。在本實施例中，該第一記憶單元41是一快閃記憶體， 且以燒錄方式被存入資料，但不以此為限。 該控制裝置6包括一第一輸入單元61及一第一顯示單 兀62,並根據該第一輸入單元61所受的操作產生一控制信 號，且使該第一顯示單元62顯示資訊。 Φ &測試主機5包括一處理單元51、一波形產生單元52 、一參考電壓產生單元53、一信號產生單元54及一背光電 塵產生單元56。 ，處理單疋51讀取該第—記憶單元41，並輸出該第一 記：單元41所儲存的該型號到控制裝置6,以被顯示在該 第b、^單元62上，且輸出該第一記憶單元41所儲存的 s月、參數，並根據該控制裝置6所產生的該控制信號選 擇輸出該第一記憶單元41所儲存的一組測試參數。 〇波形產生單兀52根據該處理單元51所輸出的該組 9 200935073 測試參數產生一組參考波形，其中，每一參考波形是一直 流波形及一脈衝波形中的一者。 該參考電壓產生單元53根據該處理單元51所輸出的 該組測試參數產生一組參考電壓。 該信號產生單元54根據該參考電壓產生單元53所產 生的該組參考電壓調整該波形產生單元52所產生的該組參 考波形的電壓’以產生被輸出到該待測液晶面板8的該組 測 §式信號 VdataR、VdataG、VdataB、Vgl、Vg2、Vgg、 ® Vcom。 該背光電壓產生單元56根據該處理單元51所輸出的 該背光參數產生被輸出到該背光模組42的該背光電壓。 在本實施例中，該處理單元51及該波形產生單元52 是以一現場可程式閘陣列（FPGA)來實現，但不以此為限 〇 由於該第一記憶單元41是設置在該測試平台4中，使 ❿ 用者可以為每一種規格的液晶面板準備一專用的測試平台4 ，也就是使該測試平台4的該第一記憶單元41只儲存適合 該種規格之液晶面板的測試參數。在每次測試時，使用者 只需找出該待測液晶面板8專用的_測試平台4，並將該測 口式^ 口 4電連接到該測試主機5即可，而不需要查詢該測 試平台4的該第一記憶單元41所儲存的每-組測試參數是 對應到哪-型號的液晶面板，如此可以減少管理上的麻煩 〇 而且’由於該第—顯示單元62會顯示該第__記憶單元 10 200935073 . 41所儲存的該型號，使用者能據以判斷是否與該待測液晶 板8的型號相同。在每次測試時，使用者能再次確定該 第記隐單元41所儲存的測試參數是否真的適合該待測液 晶面板8，如此可以減少選擇錯誤的機會。 再者，由於該背光模組42是從該測試主機5接收該背 光電壓，在每次測試時，使用者不需額外準備一電源供應 器來提供該背光電壓，如此可以減少使用上的麻煩。 籲 較佳地，該測試主機5更包括一偵測單元57、一多工 單元58及一類比至數位轉換單元59。該偵測單元57偵測 忒信號產生單元54所產生的該組測試信號VdataR、vdata(} 、VdataB、Vgl、Vg2、Vgg、Vcom 中的每一個的一組波峰 及波谷。該多工單元58選擇及輸出該偵測單元57偵測到 的組波峰及波谷。該類比至數位轉換單元59對該多工單 元58所輸出的該組波峰及波谷進行類比至數位轉換。該處 理單7L 51更監控該類比至數位轉換單元59轉換出的該組 ◎波峰及波谷是否正常，並在不正常時，產生及輸出一警示 佗號到該控制裝置6，以被顯示在該第一顯示單元62上， 以及使該信號產生單元54停止產生該組測試信號vdataR、Ο Since the memory unit 23 is disposed in the test host 2 and the test host 2 is used to test a plurality of different sizes of liquid crystal panels, the memory unit 23 generally stores the tests required for a plurality of different sizes of liquid crystal panels. Parameters (for example: test parameters required to store five different specifications of the liquid crystal panel and up to eight sets of test parameters for each specification of the liquid crystal panel) to avoid having to frequently set the test parameters stored by the memory unit 23. Therefore, at each setting, the user must record which set of test parameters stored in the memory unit 23 corresponds to which model of the liquid crystal panel, and at each test, the user must query which group according to the record. The test parameters are suitable for the liquid crystal panel 3 to be tested, which increases the trouble of management. Moreover, the Tian Yuxi memory unit 23 does not store the liquid crystal panel model corresponding to each set of test parameters, and the display unit 21 cannot display the liquid crystal panel model corresponding to the read set of test parameters. Therefore, at each test, the user cannot determine again whether the read test parameter is really suitable for the liquid crystal panel 3 to be tested, which increases the chance of selection error and then 'because the display unit 21 can only display ♦ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ ○ : ''Delay 1 timing' is representative of the time and "002" is the correct setting for the length. Therefore, the user must be the phase of the squad.) Only the professional of the domain b, 200935073 is able to understand and In addition, since the backlight module 11 receives the backlight voltage from outside the test system, the user must additionally prepare a power supply to provide the backlight voltage for each test, which will increase the use. Therefore, the object of the present invention is to provide a test system which can reduce the trouble of management. ❹ ❹ Thus, the test system of the present invention is suitable. Testing a liquid crystal panel to be tested, and comprising a test platform and a test host. The test platform is disposed on the liquid crystal panel to be tested, and includes a first memory unit and a backlight module. The first memory unit stores at least a set of test parameters. The backlight module provides backlight to the liquid crystal panel to be tested. The test host includes a processing unit, a waveform generating unit, a reference voltage generating unit, and a signal generating unit. The processing unit reads the first a memory unit, and outputting a set of test parameters remaining in the first memory unit: the waveform generating unit generates a set of reference waveforms according to the set of test parameters output by the processing unit. The reference voltage generating unit is according to the processing unit The outputted set of test parameters generates a set of reference voltages. The signal generating unit adjusts the voltages of the set of reference waveforms according to the set of reference voltages to generate a set of test signals that are output to the liquid crystal panel to be tested. The test system further includes a control device. The control device includes a first display unit. The first memory unit Storing a model. The processing unit further outputs the model stored by the first memory unit to the control device to be displayed on the first display unit. This can reduce the chance of selecting the 200935073 error. Preferably, the test The system further includes a setting device. The setting device includes a second input unit and a second display unit. The second input unit provides an operation interface for inputting a set of test set values. The second display unit provides a graphic a user interface for presenting at least one graphic to illustrate the meaning of the set of test set values. The setting device will input the set of tests according to the operation of the second input unit. The test set value is transmitted to the processing unit. The processing unit further converts the set of test set values transmitted by the setting device into a set of test parameters and stores them in the first memory unit. So ordinary people have the ability to understand and make appropriate settings. Preferably, the test host further includes a backlight voltage generating unit. The first memory unit further stores a backlight parameter. The processing unit further outputs the backlight parameter stored by the first memory unit. The backlight voltage generating unit generates a backlight voltage outputted to the backlight module according to the backlight parameter outputted by the processing unit. This can reduce the trouble of use. The above and other technical contents, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments. Referring to Figures 3 and 4, a preferred embodiment of the test system of the present invention is suitable for testing a liquid crystal panel 8 to be tested. The liquid crystal panel 8 to be tested is an active liquid crystal panel. The test system includes a test platform 4, a test host 5, and a control device 6. In the following, the test circuit 81 of the LCD panel 8 to be tested includes a test circuit 81 as shown in FIG. 4 as an example. The test platform 4 is placed on the liquid crystal panel 8 to be tested, and includes a first three memories 41 and a backlight module 42. The backlight module 42 receives a backlight voltage and provides backlight to the liquid crystal panel 8 to be tested. The first memory unit 41 stores a model, a backlight parameter, and at least one set of test parameters, wherein the set of test parameters describes a group test signal VdataR, VdataG, VdataB Vgl, Vg2, Vgg, Vc〇m, each test signal When the test signal is a DC signal, and when the test signal is a DC signal, the set of test parameters describes the voltage of the test signal, and when the test signal is a pulse signal, the set of tests The parameter describes the timing and power of the test signal. In this embodiment, the first memory unit 41 is a flash memory, and is stored in the data in the burning mode, but is not limited thereto. The control device 6 includes a first input unit 61 and a first display unit 62, and generates a control signal according to the operation of the first input unit 61, and causes the first display unit 62 to display information. The Φ & test host 5 includes a processing unit 51, a waveform generating unit 52, a reference voltage generating unit 53, a signal generating unit 54, and a backlight dust generating unit 56. The processing unit 51 reads the first memory unit 41, and outputs the model stored in the first unit: 41 to the control device 6, to be displayed on the b, ^ unit 62, and outputs the first A s month, a parameter stored in the memory unit 41, and selecting a set of test parameters stored by the first memory unit 41 according to the control signal generated by the control device 6. The 〇 waveform generation unit 52 generates a set of reference waveforms based on the set of 9 200935073 test parameters output by the processing unit 51, wherein each reference waveform is one of a continuous waveform and a pulse waveform. The reference voltage generating unit 53 generates a set of reference voltages based on the set of test parameters output by the processing unit 51. The signal generating unit 54 adjusts the voltage ' of the set of reference waveforms generated by the waveform generating unit 52 according to the set of reference voltages generated by the reference voltage generating unit 53 to generate the set of samples to be output to the liquid crystal panel 8 to be tested. §-type signals VdataR, VdataG, VdataB, Vgl, Vg2, Vgg, ® Vcom. The backlight voltage generating unit 56 generates the backlight voltage output to the backlight module 42 according to the backlight parameter output by the processing unit 51. In this embodiment, the processing unit 51 and the waveform generating unit 52 are implemented by a field programmable gate array (FPGA), but not limited thereto, because the first memory unit 41 is disposed on the test platform. 4, the user can prepare a dedicated test platform 4 for each type of liquid crystal panel, that is, the first memory unit 41 of the test platform 4 stores only the test parameters of the liquid crystal panel suitable for the specification. In each test, the user only needs to find the _ test platform 4 dedicated to the liquid crystal panel 8 to be tested, and electrically connect the test port 4 to the test host 5 without querying the test. Each set of test parameters stored by the first memory unit 41 of the platform 4 corresponds to which type of liquid crystal panel, so that management trouble can be reduced and 'because the first display unit 62 displays the first __ The model stored in the memory unit 10 200935073 . 41 can be judged by the user to determine whether it is the same as the model of the liquid crystal panel 8 to be tested. At each test, the user can again determine whether the test parameters stored in the first recording unit 41 are really suitable for the liquid crystal panel 8 to be tested, thus reducing the chance of selection errors. Moreover, since the backlight module 42 receives the backlight voltage from the test host 5, the user does not need to additionally prepare a power supply to provide the backlight voltage during each test, thereby reducing the trouble of use. Preferably, the test host 5 further includes a detecting unit 57, a multiplexing unit 58, and an analog-to-digital converting unit 59. The detecting unit 57 detects a set of peaks and troughs of each of the set of test signals VdataR, vdata(}, VdataB, Vgl, Vg2, Vgg, Vcom generated by the chirp signal generating unit 54. The multiplexing unit 58 The group peaks and troughs detected by the detecting unit 57 are selected and outputted. The analog-to-digital converting unit 59 performs analog-to-digital conversion on the set of peaks and troughs outputted by the multiplexing unit 58. The processing unit 7L 51 Monitoring whether the group ◎ peaks and troughs converted by the analog-to-digital conversion unit 59 are normal, and when abnormal, generating and outputting a warning nickname to the control device 6 to be displayed on the first display unit 62 And causing the signal generating unit 54 to stop generating the set of test signals vdataR,
VdataG、VdataB、Vgl、Vg2、Vgg、Vcom，以保護該測試 系統及該待測液晶面板8。 值得注意的是，在本實施例中，該偵測單元57 一次偵 測七組波峰及波谷，藉由使用該多工單元58,該類比至數 位轉換單元59只要能一次處理一組波峰及波谷即可，但在 其它實施例中，該測試主機5也可以不包括該多工單元58 11 200935073 ，此時，該類比至數位轉換單元59則必須能一次處理七組 波峰及波谷。 參閱圖3及圖5，較佳地，該測試系統更包含一設定裝 置7。該設疋裝置7包括一第二輸入單元71、一第二顯示 單元72及一第一記憶單元73。該第二記憶單元73儲存至 少一型號、至少一背光設定值及至少一組測試設定值。 該第二輸入單元71提供一操作介面，以供輸入一型號 、一背光設定值及一組測試設定值。該第二顯示單元72提 供一圖形使用者介面9，其中，該圖形使用者介面9供至少 一圖形942呈現，以說明該組測試設定值所代表的意義。 該設定裝置7根據該第二輸入單元71所受的操作，將被輸 入的該型號、該背光設定值及該組測試設定值儲存到該第 二記憶單元73，或傳送到該處理單元51。在本實施例中， 該設定裝置7是以一個人電腦來實現，但不以此為限。 ❿ 該處理單it 51更將該設定裝置7所傳送的該背光設定 值及該組測試設定值分別轉換成一背光參數及一組測試參 數，並將轉換出的該背光參數及該組測試參數以及該設定 裝置7所傳送的該型號儲存到該第一記憶單元41。 該圖形使用者介面9之-範例如圖5所示。該圖形使 用者介面9包括-型號設定區91、一背光設定區％、一位 置選擇區93、-測試設定區94、—第—儲存設定區％及 第一儲存設定區96。 該型號設定區91供-輸入欄911及相關文字資訊912 呈現，以供使用者藉由操作該第二輸人單元71在該輸入棚 12 200935073 . 911輸入該型號（例如：TFG0013)。 該背光設定區92供一輸入欄921及相關文字資訊922 呈現，以供使用者藉由操作該第二輸入單元71在該輸入欄 輸入該背光設定值（例如：20 )。 該位置選擇區93供複數按鈕931及相關文字資訊932 呈現，以供使用者藉由操作該第二輸入單元71按下該等按 鈕931中的一者，選擇該第一記憶單元41中的一儲存位置 。在本實施例中，該位置選擇區93供八按鈕呈現，因此該 ® 第一記憶單元41最多可儲存八組測試參數。 該測試設定區94供複數選擇欄941、複數圖形942、 複數輸入欄943及相關文字資訊944呈現，以供使用者藉 由操作該第二輸入單元71輸入該組測試設定值。該等選擇 欄 941 用於設定 VdataR、VdataG、VdataB、Vgl 及 Vg2 的 波形（也就是直流波形或脈衝波形），該等圖形942說明VdataG, VdataB, Vgl, Vg2, Vgg, Vcom to protect the test system and the liquid crystal panel 8 to be tested. It should be noted that, in this embodiment, the detecting unit 57 detects seven sets of peaks and troughs at a time. By using the multiplex unit 58, the analog-to-digital converting unit 59 can process a set of peaks and troughs at a time. That is, but in other embodiments, the test host 5 may not include the multiplex unit 58 11 200935073. In this case, the analog to digital conversion unit 59 must be able to process seven sets of peaks and troughs at a time. Referring to Figures 3 and 5, preferably, the test system further includes a setting device 7. The setting device 7 includes a second input unit 71, a second display unit 72 and a first memory unit 73. The second memory unit 73 stores at least one model, at least one backlight setting value, and at least one set of test setting values. The second input unit 71 provides an operation interface for inputting a model, a backlight setting, and a set of test settings. The second display unit 72 provides a graphical user interface 9, wherein the graphical user interface 9 is presented by at least one graphic 942 to illustrate the meaning of the set of test settings. The setting means 7 stores the entered model number, the backlight setting value and the set of test set values to the second memory unit 73 or to the processing unit 51 based on the operation of the second input unit 71. In this embodiment, the setting device 7 is implemented by a personal computer, but is not limited thereto.处理 the processing unit it 51 further converts the backlight setting value and the set of test setting values transmitted by the setting device 7 into a backlight parameter and a set of test parameters, and converts the converted backlight parameter and the set of test parameters and The model number transmitted by the setting device 7 is stored in the first memory unit 41. An example of the graphical user interface 9 is shown in FIG. The graphic user interface 9 includes a model setting area 91, a backlight setting area %, a bit selection area 93, a test setting area 94, a first storage setting area %, and a first storage setting area 96. The model setting area 91 is provided by the input field 911 and the related text information 912 for the user to input the model (for example, TFG0013) by operating the second input unit 71 in the input shed 12 200935073 . 911. The backlight setting area 92 is provided for an input field 921 and related text information 922 for the user to input the backlight setting value (for example, 20) in the input field by operating the second input unit 71. The location selection area 93 is provided with a plurality of buttons 931 and associated text information 932 for the user to select one of the first memory units 41 by operating the second input unit 71 to press one of the buttons 931. Storage location. In the present embodiment, the position selection area 93 is presented by eight buttons, so the ® first memory unit 41 can store up to eight sets of test parameters. The test setting area 94 is provided for the plural selection field 941, the plural graphic 942, the plural input field 943 and the related text information 944 for the user to input the set of test set values by operating the second input unit 71. These selection fields 941 are used to set waveforms (i.e., DC waveforms or pulse waveforms) of VdataR, VdataG, VdataB, Vgl, and Vg2, and these graphics 942 illustrate
VdataR、Vdata'G、VdataB、Vgl、Vg2、Vgg 及 Vcom 的波 _ 形，以及該等輸入欄943所代表的意義，該等輸入欄943 ❹ 位用於設定 VdataR、VdataG、VdataB、Vgl、Vg2、Vgg 及 Vcom的時序及電壓中的至少一者。 該第一儲存設定區95供一按鈕951及相關文字資訊 952呈現，該第二儲存設定區96供一按鈕961及相關文字 資訊962呈現，以供使用者藉由操作該第二輸入單元71按 下該等按鈕951、961中的一者，將被輸入的該型號、該背 光設定值及該測試設定值儲存到該第一記憶單元41及該第 二記憶單元42中的一者。 13 200935073 - 較佳地，該設定裝置7更根據該第二輸入單元71所受 的操作，從該第二記憶單元73讀取一型號、一背光設定值 及一組測試設定值，並傳送到該處理單元51。如此一來， 使用者可先在該第二記憶單元73中儲存該型號、該背光設 定值及該組測試設定值，並在將來需要用到時再從該第 二記憶單元73將該型號、該背光設定值及該組測試設定值 讀出’然後儲存到該第一記憶單元41。 值得注意的是，只有在設定該第一記憶單元41所儲存 的測試參數時才需要將該設定裝置7電連接到該測試主機5 ，而在其它時候，可以將該設定裝置7從該測試系統中移 除’以方便移動該測試系統。 由於該第二顯示單元72提供該圖形使用者介面9,即 便使用者不是相關領域的專業人士，也有能力了解並進行 適當的設定。 惟以上所述者，僅為本發明之較佳實施例而已，當不 〇 m限定本發明實施之_，㉛大凡依本發明中請專利 範圍及發明說明内容所作之簡單的等效變化與修飾，皆仍 屬本發明專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一方塊圖，說明一習知的測試系統； 圖2是一示意圖，說明該習知的測試系統的一測試主 機； 圖3疋一方塊圖，說明本發明測試系統的較佳實施例 14 200935073 圖4是一電路圖，說明一主動式液晶面板；及 圖5是一示意圖，說明該較佳實施例的一圖形使用者 介面。Waveforms of VdataR, Vdata'G, VdataB, Vgl, Vg2, Vgg, and Vcom, and the meanings represented by the input fields 943, which are used to set VdataR, VdataG, VdataB, Vgl, Vg2 At least one of the timing and voltage of Vgg and Vcom. The first storage setting area 95 is provided by a button 951 and related text information 952. The second storage setting area 96 is provided by a button 961 and related text information 962 for the user to press the second input unit 71. One of the buttons 951, 961 is configured to store the input model, the backlight setting value, and the test setting value to one of the first memory unit 41 and the second memory unit 42. 13 200935073 - Preferably, the setting device 7 reads a model, a backlight setting value and a set of test setting values from the second memory unit 73 according to the operation of the second input unit 71, and transmits the same to The processing unit 51. In this way, the user can first store the model, the backlight set value, and the set of test set values in the second memory unit 73, and then use the second memory unit 73 to select the model, The backlight set value and the set of test set values are read 'and then stored in the first memory unit 41. It should be noted that the setting device 7 needs to be electrically connected to the test host 5 only when setting the test parameters stored in the first memory unit 41, and at other times, the setting device 7 can be removed from the test system. Remove 'to facilitate moving the test system. Since the second display unit 72 provides the graphical user interface 9, even if the user is not a professional in the related field, it is also capable of understanding and making appropriate settings. However, the above is only the preferred embodiment of the present invention, and the simple equivalent changes and modifications made by the scope of the patent and the description of the invention in the present invention are not limited to the embodiments of the present invention. All remain within the scope of the invention patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram showing a conventional test system; FIG. 2 is a schematic view showing a test host of the conventional test system; FIG. 3 is a block diagram showing the test of the present invention. Preferred Embodiment 14 of the System 200935073 FIG. 4 is a circuit diagram illustrating an active liquid crystal panel; and FIG. 5 is a schematic diagram illustrating a graphical user interface of the preferred embodiment.
15 20093507315 200935073
【主要元件符號說明】 4 ....... …測試平台 81…… …·測試電路 41…… …第一記憶單元 9 ....... •…圖形使用者介面 42…… …背光模組 91 •…. •…型號設定區 5 ....... …測5式主機 911… •…輸入搁 51…… …處理單元 912… •…文字資訊 52…… …波形產生單元 92…… 貪光ό又疋£ 53…… …參考電壓產生單 921… 輸入搁 元 922… …·文字資訊 54…… …信號產生單元 93 • •… •…位置選擇區 56…… …背光電壓產生單 931 ··· •…按la 元 932… -…文字資訊 57…… …偵測單元 94•… •…測试5又疋£ 58…… ••多工單元 941 ·· •…選擇欄 59…… …類比至數位轉換 942… …·圖形 χ/Ό 一 早兀 943… •…輸入欄 6 ....... …控制裝置 944… •…文字資訊 61…… …第一輸入單元 95••… •…第 儲存s又疋£ 62…… …第一顯示單元 951… …·按鈕 7 ....... …設定裝置 952… •…文字資訊 71…… …第二輸入單元 96··.·· 第一儲存ό又疋£ 72…… …第二顯示單元 961… •…按紐 73…… …第二記憶單元 962… •…文字資訊 8 ....... 待測液日日面板 16[Description of main component symbols] 4 ....... Test platform 81 ... ... test circuit 41 ... ... first memory unit 9 ......... • ... graphic user interface 42 ... Backlight module 91 •.... •...Model setting area 5 .............Measure 5 type main unit 911... •...Input rest 51...... Processing unit 912... •...Text information 52... Waveform generating unit 92...... Greedy and 疋£53... ...reference voltage generation unit 921... input unit 922... ... text information 54... ... signal generation unit 93 • •... •... position selection area 56... ... backlight voltage Produce a single 931 ··· •...press la 932... -...text information 57......detection unit 94•... •...test 5 and 58£58... •• multiplex unit 941 ·· •...selection bar 59...... ...analog to digital conversion 942...··Graphicχ/Ό Early morning 943... •...Input field 6 ....... Control device 944... •...Text information 61... First input unit 95 ••... •... The first storage unit 951... The button 7 is stored. ......Setting device 952... •...Text information 71.........Second input unit 96····· The first storage unit ό£ 72... The second display unit 961... 73.........Second memory unit 962... •...Text information 8 ....... Test liquid day and day panel 16