TW200916748A - Apparatus for testing flexible device under bending stresses - Google Patents

Apparatus for testing flexible device under bending stresses Download PDF

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Publication number
TW200916748A
TW200916748A TW96137732A TW96137732A TW200916748A TW 200916748 A TW200916748 A TW 200916748A TW 96137732 A TW96137732 A TW 96137732A TW 96137732 A TW96137732 A TW 96137732A TW 200916748 A TW200916748 A TW 200916748A
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TW
Taiwan
Prior art keywords
component
substrate
flexible
pushing
control
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Application number
TW96137732A
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Chinese (zh)
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TWI357497B (en
Inventor
Ko-Yu Chiang
Chen-Pang Kung
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Ind Tech Res Inst
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Priority to TW96137732A priority Critical patent/TWI357497B/en
Publication of TW200916748A publication Critical patent/TW200916748A/en
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Publication of TWI357497B publication Critical patent/TWI357497B/en

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Abstract

The invention relates to a device for bending test of flexible electronic elements (FEE) on a flexible substrate. The device can provide a performance testing for FEE under a bending state. This device includes a clamping element for clamping both ends of the flexible substrate; at least one pushing element having at least one curved surface; an actuator for actuating the pushing element moving to push the flexible substrate and making the flexible substrate bended depending on the curved surface; and a detecting component for detecting a testing contact of the FEE under the bending state. This device can provide a performance test for FEE under tension and compression bending states.

Description

200916748 九、發明說明: 【發明所屬之技術領域】 [001]本發明係關於—種撓性 、 關於-種撓性電子元件·f曲之*、曲測試展置,特別是 【先前技術】 1、材料性能測試裝置。 [2]由於铫}生電子兀件能實現質輕、可 綱電子產品,近年來已經吸Ά、大面 究。目前’撓性電子元件主要應用於智彗;廣泛的被研 超薄手機、腕帶式數位錶、顯示器...等動=,子書報、 這項本質歧錄電子触俱來 、、f ’可彎曲 多全新的應I 口用此項潛力可開創更 [OOWTsuyoshiSeki^e,^^ P.m9(2_)的:㈣,壯撓性電子元 ^ t s趟.说, 的機械彎曲測試下,_成 、力的以及有壓縮力 撓性f子轉特性_移。為了要讓 几電子元件以及其積體電路實 是非常重H θ h I 胡,瞭解其料效應 之改變。特別疋在反覆彎曲之後,撓性電子元件各項特性 的方法第7181979鱗利錢為—種關於監測撓性元件 勺方U統,如第丨圖所示,其利用至少—個彎 可提供7L件輸送的輸送帶,和—個可監測元 測裝置可以提供元件在弯曲形變下,光、光Ί 監 ㈣田贮、日,丨, 又Γ π九毛和電性方面的特枓 在Γ案技術只㈣測元件在張力應力下的特性變显, ^奴縮應力下的特性變異,且前案之彎曲單元係為固定 5 200916748 的,故無絲切_雜_ 測試(亦即多次彎曲測試),而 、亦热法進行反覆彎由 元件。此外’在前_術中對^形下測試換性電子 提出具體的控制手段,因而無法控辦=之壓力、拉力未 測試之撓性電子元件的毁損麵裂。力的杨,可能造成所 ’]因此,本發明提出—套 量測繞性電子元件在彎鱗及反二^轉試裝置,可 【發明内容】 則曲後的特性變異。 [006]雰於以上的問題’本發 元件彎曲測試裝置,用以測試—繞性 '在於提供—種撓性電子 件,該彎曲測試裝置包括有,至上之至少-捷性電子元 板之二端;至少—推抵元件,具有"至小:讀’係央持該撓性基 致動該夹持元件移動,和致動 5面’至)—致動元件, 板,使該撓性基板依該弧面—推抵該撓性基 基板彎曲時檢測該基板。 雜件’係於該撓性 [007]於前述贼置中,該夾持元 兀件彎曲測試裝置更包含一扣制_ # 勹U往且该撓性電子 感測元件係設置於該推抵元;之:面感測元件’嶋 繞性基板時_並傳出—勤訊料勢^ =推抵林推抵該 該壓力訊號而控制該致動元件致動該推抵工7 制元件依 元件之移動量,因此,此挽性電子元件彎曲測試==夾持 繞(Rollto Rail)製程中。 、置了應用於捲 陶]於前述的裝置中,該夹持元件係為固定夹具,該撞性電 200916748 子元件彎曲測試裝置更包含 … ^ =感測___元件與該撓性基 雜蝴元鶴⑽概叙以在該 時感測並傳出-壓力訊號及—拉力訊號 予礼制7L件’該控制元件納^ 該致動元件致_推抿-I D 歧/或該拉力訊號而控制 评性4-= 移動量和該夹持元件之移動量,則 =伽,'曲測試装置可應用於片狀批次(S一㈣ 於本發明内容之說明及以下之實施方式之說 明係用以確與解釋本發明 利申請範圍更進-步之解釋。原虹k供本發明之專 【實施方式】 _下在g %方式巾詳細敘述本發明之詳細特徵以及優 :二容且^^何熟f相關技#者了解本發明之技術内容並 書所揭㈣容十糊範圍及圖式, 任何u相關技為者可輕易地理解本發明 以下之實施例係進—步詳細說明本發明二= 限制本發狀範#。 糾任何喊點 [011]第2圖顯不本發明之—種繞性電子元件 之二’—驾㈣上之一棱性電二置 和LU包括有:—央持树3q, 之二端,㈣简悉,係'、、基板]0 具有至少-_;一致::件τ::== 双動,亥夾持兀件3〇移動,和 200916748 動°亥推抵兀件40移動而推抿該撓性基板ίο,使钟f 依該弧面而彎曲·M认丨 伋 使忒撓性基板】〇 檢測該基板及—檢測崎6G,㈣該撓性基板W彎曲時 f 12]第3圖顯不第2圖㈣致動元 而推抵接性基板】〇之動作_ =抵元㈣ 性基板10的下方内㈣1 件40係位於繞 接觸#如 田推抵兀件40稭由致動元件5〇 接觸此推抵元件4〇的撓性基板ι〇 〗上柄’ 仙之曲率的圓弧形,在基板上的測試元 推抵元件 曲應力,此H车私 P享又個有張力的彎 觸,以檢測該向觸與該撓性電子元㈣相接 組㈣麵—細力時之電性,射該檢測 件20之光學性併 es她〇n),且當欲檢測該撓性電子元 有-光=檢測組件6〇係為-光學檢測裳置,其具 撓性電子元;20,透=:,藉由光發射器所發出之光源經過 元件20之光性,當欲軸撓 件/得知職性電子 檢測組件60係為—材料檢測裝置。 之材料特性時,該200916748 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION [001] The present invention relates to a flexible, a flexible electronic component, a curved test, and a prior art. , material performance testing device. [2] Because of the fact that the electronic components can realize light and light electronic products, they have been sucked and researched in recent years. At present, 'flexible electronic components are mainly used in Zhisheng; a wide range of ultra-thin mobile phones, wristband-type digital watches, monitors, etc. =, sub-books, this essential electronic record, f 'Bendable new one should use this potential to create more [OOWTsuyoshiSeki^e, ^^ P.m9 (2_): (four), strong flexible electronic element ^ ts趟. Said, under the mechanical bending test, _ into, force and compression force flexible f sub-rotation characteristics _ shift. In order to make several electronic components and their integrated circuits very heavy H θ h I Hu, understand the changes in the material effect. In particular, after repeated bending, the method of the various characteristics of flexible electronic components is 718, 1979, which is about the monitoring of flexible components. As shown in the figure, it can provide 7L by using at least one bend. The conveyor belt for conveying, and a monitorable meta-measuring device can provide the characteristics of the components under the curved deformation, light, light supervision (4) field storage, day, 丨, Γ π 九 毛 and electrical characteristics The technique only (four) measured the characteristics of the component under tensile stress, ^ the characteristic variation under the contraction stress, and the bending unit of the previous case is fixed 5 200916748, so there is no wire cutting _ miscellaneous _ test (ie multiple bending Test), and also thermal method to reverse the bending by the component. In addition, in the pre-surgery, a specific control method is proposed for the test of the changeable electrons, so that it is impossible to control the damage of the flexible electronic components that have not been tested and the damage. Therefore, the present invention proposes a set of measuring and measuring electronic components in a curved scale and a reverse two-turn test device, which can be characterized by a variation in characteristics after the song. [006] The above problem 'the present element bending test device for testing - winding' is to provide a kind of flexible electronic device, the bending test device includes, at least the first - the first electronic board End; at least - push the element, having "total: read the system to hold the flexible base to actuate the clamping element to move, and actuate the 5 faces 'to) - actuate the element, the plate, to make the flexibility The substrate is detected by the curved surface when the curved flexible substrate is bent. The miscellaneous member is attached to the flexure [007] in the thief set, and the clamping element bending test device further includes a buckle _ 勹 U and the flexible electronic sensing component is disposed on the urging Yuan: the surface sensing component 'when the substrate is _ and transmitted - the diligent material potential ^ = push the forest to push the pressure signal and control the actuating component to actuate the push 7 component The amount of movement of the component, therefore, the bendable electronic component bend test == the roll-to-roll process. In the foregoing device, the clamping component is a fixing fixture, and the crashing power 200916748 sub-component bending test device further includes... ^ = sensing ___ component and the flexible base Butterfly Yuanhe (10) is generally designed to sense and transmit - pressure signals and - pull signals to the ritual 7L pieces at the time - the control element ~ the actuating element _ push 抿 - ID / / or the pull signal Control evaluation 4-= the amount of movement and the amount of movement of the clamping element, then = gamma, the 'testing device' can be applied to the sheet batch (S-(4) in the description of the present invention and the description of the following embodiments To explain and explain the scope of the application of the present invention further. The original rainbow k is provided for the purpose of the present invention. [Details] The detailed features and advantages of the present invention are described in detail in the g% mode towel: ^何熟frelated technology# understand the technical content of the present invention and the book reveals (4) the scope and the schema of the film, any u related technology can easily understand the following embodiments of the present invention Invention 2 = Limit the hair of the model #. Correct any call points [011] Figure 2 shows the invention - The two of the winding electronic components - the driving (four) and the LU include: - the central holding tree 3q, the two ends, (four) brief, the system ',, the substrate] 0 has at least -_; consistent :: τ::== double-action, the cradle 3 〇 moves, and the 200916748 °° 推 兀 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 M 丨汲 丨汲 忒 忒 忒 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 〇 动作 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The circular shape of the upper handle 'the curvature of the fairy, the test element on the substrate pushes against the component bending stress, and the H car enjoys another tensioned bending contact to detect the contact with the flexible electronic element (4) Connect the group (four) face - the electrical property of the fine force, shoot the optical property of the test piece 20 and es her 〇 n), and when the flexible electronic element is to be detected, the light-detecting component 6 is - optical detection Set The flexible electronic element; 20, transparent =:, by the light source emitted by the light emitter through the optical properties of the component 20, when the axis of the flexible member/knowing the electronic detection component 60 is a material detecting device. When the material properties are

元件㈣可以任意娜,以量測不同曲率下 π丨玍的交兴,推抵元件 丁 I :==:_=== 成本發明=====上下反綱,而達 件40並且·3後的特性量測,該推抵元 纟蝴蝴她娜變。 ⑽圖係為顯示本發明該推抵元件之第二實施例的側 200916748 =圖甘=中顯示該推抵元件4Qa係為具有兩相異曲率半徑之凸 兩’,、弧面41a之曲率半經較弧面41b之曲率半徑大。 視固[Γ中第Γ圖係為顯示本發明該推抵元件之第三實施例的側 見圖^中_該推抵元件概係為具有四相異曲率半徑之凸 面=面化之曲率半徑係最大,其次為弧面4le,再其次 為弧面41d,而最小的則為弧面4ic。 動方ΓΓ第二圖係為顯示本發明該致動元件之第二實施例的作 動方向®。该致動元件51係在—維空 數個致動元件與鱗續元件及該推抵門= 件及該推抵元件連接亦在—維空間或二維空間中軸 視H [H6 Γ域林發簡祕树ϋ施例的侧 視圖。韻持讀3Q係為—對陳組3Q ! 該圓杨峨力__娜細:中之— [】弟7圖顯林發明該夾持 圖。該夾持元件30係為單—固 弟二心例的立體 側係可沿相鄰之-側而滑動。0C,其中該夹具相對之兩 果置^7^目鱗顯林糾之—_性好純f曲測試 I置之弟一貧施例的侧視圖。 元件仙之表面上,用以在錄感測兀件8〇係設置於該推抵 測並藉由任何手段(有件40推抵該撓性基板】〇時感 控制元㈣,雜=+4=:=旬㈣I勤訊號予該 致動該推抵元件4。之移動量和控制該致動元件5。 可控制彎曲力的施加 成J〇之移動更’藉此而 成所測試之撓性電子元件2〇 200916748 並可在特定的撓曲情形下或以固定的製程參數(如 的張力或拉力)測試該撓性電子元件,而達到本發明之目 9圖係為顯示本發明之—種捷性電子元件彎曲測試 :=二貫施__。該拉力感測元件%係設置於該央持 :之:側,以在該推抵元件4。推抵該撓性基板1。時感測並 ===有線連繩__傳出1力訊號予_ 节推抿-Γ工制兀件%依該拉力訊號而控制該致動元件5〇致動 鶴量和該夹持元件%之移動量,藉此而可控 損IS ,免可能造成所測試之撓性電子元件2〇的毁 之張力^^在“的撓♦射彡孩·—參數(如固定 撓性f子元件2G’而達到本發明之目的。 I】弟1 〇圖係為顯示本發明$ _^ .. 裝置之第四實_社_ 試 口田。亥說性電子兀件20彎曲測試裝詈 tG RG1獅中時,央持元件3嶋—對圓柱組 ^甘謂具有待測撓性電子元件20之撓性基板10央持, 中之一該圓柱組咖或施具有動力,以傳送該撓性基 組具有_,藉由該動力將該 J 拉引’而朝具動力之該圓柱組30a或30b移動;告― 對圓柱版咖和鳥皆具有動力且方向和速度相同時,該撓^ ^ 20係朝兩圓柱組中之一方向移動。推抵元件撕係位於換性^ ‘反10的下方’當推抵元件伽藉由致動元件而往上頂時 觸此推抵7L件输的撓性基板〗Q隨即產生一個等同於推抵元件 200916748 40c之_的圓弧形,在基板上的撓性電子元件如即承受一個有 張力的.弓曲應力’此時檢測組件6〇即向下移動與該 20相接觸,以檢測該撓性雷 兀件 材料特性。达性電子兀件20在受到張力時之光、電或 f〇22J於換性基板的卜太,_上 林4M,訪么振4 - 方5又置有相同曲率的一组推抵元 …且件4〇d為兩個。當該組推抵元 元件姻的捷性基㈣隨即產生-個等同^ 組推抵兀件40d之曲率的圓弧形,而 、、/ 受一個有壓縮力的f曲岸力,奸h 的測试元件即承 性電子元件20i a 件6〇即向下移動與該撓 目_,以檢測該撓性電子元件2G在受到壓缩力 犄之先、電或材料特性。此一 子元件20施加屋力,而(免直接對待測之捷性電 中,卜H - 成待測之撓性電子元件2〇之損壞。1 w ^件40d為圓柱,用以使繞性 : to Roll)製程中傳送。 们υ『於捲繞(Ro〇 裝置示本發明之一種挽性電子元件f曲測試 試裝置應用於片_ ^ 田5成性好元件20彎曲測 以狀批次(Sheet t0 Sheei)製 係為-對固定爽具,用以將具有待測撓= ίο央持,推掖开们n〆 獨生私子疋件如之撓性基板 «由致動亀彳1:=·^方. 職即產生i等同於推抵元件40c之曲==的撓性基板 上的撓性電子元㈣即承受—im力的’而在基板 件60即向下移動與該:〜力’此時檢測組 件2〇相接觸,以檢測該繞性電 200916748 子元件2〇在受到張力時之光、電或材料特性。 _]於此實施例中,更包含—控制元件川、— 件:,該壓力感測元件8〇係設置於_元件心面= /或一拉力感測元件90 ,該拉力#_ 衣面上,及 3〇之-側,以在她 刪凡件9〇係設置於該央持元件 一 r 件4G推抵該撓性基板料感測並值φ -座力_及/或-拉力訊齡該控制元件%,離制〇 =壓力訊號及/或該拉力·峻梅縣 依 =之移動量和該夾持元㈣之移動量,藉此而可=: =加,以避免可能造成所測試之撓性電子元件2q的毀損= [〇25]第12圖係為顯示本發明 裝置之第六實施例的立私性電子兀件彎曲測試 上,S己合待測之撓性電子^ Q、4組推抵疋件4Ge為兩個以 桿,以使彼歧树接,Γ㈣輕,其關_具有一連 待測之撓性電子元件2(J _;於同—橫向區域上具有兩個以上 加與各_性電子^㈣子元件2ΰ之間增 —設計係可避免直接對待、ρι丨間隔相配的—推抵元件4〇e。此 待測之撓性電子元件2〇之^性電子元件20施加壓力,而造成 [026]雖然本發明以前 定本發明。在不脫離本發明之例揭路如上,然其並非用以限 均屬本發明之專利保護範:和祀圍内,所為之更動與潤飾, 考所附之申請專利範圍。關於本發明所界定之保護範圍請參 【圖式簡單說明】 12 200916748 第1圖係為先前技術之一種軟性元件的檢測系統; 第2圖係為顯示本發明之一種撓性電子元件彎曲測試裝置之 第一實施例的侧視圖; 第3圖係為顯示第2圖中該致動元件致動該推抵元件而推抵 撓性基板之動作關係的側視圖; 一 圖 第4A圖係為顯示本發明該推抵元件之第二實施例的側視 $ 4B圖係為顯示本發明姉抵元件之第三實施例的側視圖; 弟5 _為_示本發日腾致動元件之第二實施_作動方向 圖, 為=本發明該夹持元件之第二實施例的侧視圖; _轉之第三實施例的立體圖; 弟8圖係為顯不本發明之— 第二實施例的侧視圖; $性電子元件彎曲測試裝置之 第9圖係為顯示本發明之—κ 第三實施儀織圖;—紐電子元件㈣測試裝置之 第10圖係為顯示本發明— 之第四實施_立體圖; —f祕電子元件彎_試裝置 弟11圖係為顯示本發明之 之第五實施_讀圖;及 1撓性電子元件彎_試裝置 苐12圖係為顯示本發明 — 之第六實施例的立體圖。 '捷性電子元件彎曲測試裝置 【主要元件符號說明】 200916748 10 撓性基板 20 撓性電子元件 30 夾持元件 30a 圓柱組 30b 圓柱組 30c 固定夾具 40 推抵元件 40a 推抵元件 40b 推抵元件 40c 推抵元件 40d 推抵元件 40e 推抵元件 41a 弧面 41b 弧面 41c 弧面 41d 弧面 41e 弧面 41f 弧面 50 致動元件 51 致動元件 60 檢測組件 70 控制元件 80 壓力感測元件 200916748 90 拉力感測元件The component (4) can be arbitrary, to measure the convergence of π丨玍 under different curvatures, and push the component D:==:_=== cost invention ===== up and down counter, and up to 40 and ·3 After the characteristic measurement, the push to the yuan 纟 蝴 butterfly her change. (10) The figure is the side 200916748 showing the second embodiment of the pushing element of the present invention. The figure indicates that the pushing element 4Qa is a convex two' having a radius of two different curvatures, and the curvature of the curved surface 41a is half. The radius of curvature of the curved surface 41b is large. The third embodiment of the present invention is shown in the side view of the third embodiment of the present invention. The thrust element is a convex surface having a radius of four different curvatures = the radius of curvature of the surface. The system is the largest, followed by the arc surface 4le, followed by the arc surface 41d, and the smallest is the arc surface 4ic. The second diagram of the actuator is shown to show the direction of action of the second embodiment of the actuator element of the present invention. The actuating element 51 is connected to the plurality of actuating elements and the scale element and the pushing door member and the pushing element are also connected in a dimensional space or a two-dimensional space. [H6 Γ 林 林Side view of a brief tree sill. The rhyme holds the 3Q system as the pair - Chen group 3Q! The circle Yang Lili __Na fine: Zhongzhi - [] brother 7 map Xianlin invented the clamping diagram. The clamping member 30 is a single-solid two-dimensional embodiment in which the three-dimensional side can slide along the adjacent side. 0C, in which the fixture is opposite to the two fruit set ^7^ 目 显 林 林 - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - On the surface of the component, the sensing element 8 is arranged on the push-to-measure and is controlled by any means (the piece 40 is pushed against the flexible substrate). The control element (4), miscellaneous = +4 =: = (4) I diligence signal to the actuating the pushing element 4. The amount of movement and control of the actuating element 5. The application of the bending force can be controlled to be more "by the movement" Electronic component 2〇200916748 and can test the flexible electronic component in a specific flexing condition or with a fixed process parameter (such as tension or tension), and the object of the present invention is to show the present invention. Inductive electronic component bending test: = two-way application __. The tension sensing element % is set at the central: side: in the pushing element 4, when pushing against the flexible substrate 1. And ===wired rope __ outgoing 1 force signal to _ section push 抿 - Γ 兀 % 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依 依Quantity, thereby controlling the loss of IS, avoiding the possibility of causing the ruin of the flexible electronic component tested 2^^ The flexible f sub-element 2G' achieves the purpose of the present invention. I] The first figure is a display of the present invention $ _ ^ .. The fourth real device of the device _ test mouth field. Hai said electronic components 20 bending test When mounting the tG RG1 lion, the central holding element 3嶋—the cylindrical group ^ is said to have the flexible substrate 10 with the flexible electronic component 20 to be tested, one of the cylindrical groups or the power to transmit The flexible base set has _, and the J is pulled by the power to move toward the powered cylindrical group 30a or 30b; and the cylinder is powered and the same direction and speed are The flexing ^ ^ 20 system moves toward one of the two cylindrical groups. The pushing element tearing system is located below the transversal ^ 'reverse 10'. When the pushing element 380 is pushed up by the actuating element, it is pushed to 7L. The flexible substrate of the piece is then produced with a circular arc shape equivalent to the pushing element 200916748 40c, and the flexible electronic component on the substrate is subjected to a tensile bending stress. The helium is moved downward to contact the 20 to detect the material properties of the flexible lightning element. When the tension is light, electricity or f〇22J on the flexible substrate, _ Shanglin 4M, visits the vibration 4 - square 5 and sets a set of pushes with the same curvature... and 4〇d is two When the group pushes the elemental basis of the elemental element (4), it produces a circular arc that is equivalent to the curvature of the element 40d, and / is subjected to a compressive force. The test component of h, that is, the load-bearing electronic component 20i a, 6 〇 downwardly moves with the scratch _ to detect the first, electrical or material property of the flexible electronic component 2G under compression. 20 applies the house force, and (free from the direct measurement of the power of the test, the H - into the damage of the flexible electronic components 2 to be tested. 1 w ^ 40d is a cylinder for the winding: to Roll) process. υ 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于 于- For the fixed cool, used to have the to-be-tested = ίο央, hold the n挠性 〆 私 私 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性 挠性Producing i is equivalent to the flexible electronic element (4) on the flexible substrate of the squeezing element 40c, that is, bearing the 'im force' and moving the substrate member 60 downwards and the: The 〇 phase contacts to detect the optical, electrical or material properties of the winding element 200916748 sub-element 2 〇 under tension. _] In this embodiment, further includes a control element, a component:, the pressure sensing The component 8 is disposed on the _ component core surface = / or a tensile force sensing element 90, the tension force #_ on the clothing surface, and the side of the 3 ,, to be placed on the central component A piece of 4G pushes the flexible substrate material to sense the value φ - the seat force _ and / or - the tension force age of the control element %, the release 〇 = pressure signal and / or the pull force · Junmei County = Momentum and the amount of movement of the clamping element (4), whereby =: = plus to avoid possible damage to the tested flexible electronic component 2q = [〇25] Figure 12 shows the device of the present invention In the flexural test of the electronic component of the six-part embodiment, the flexible electrons to be tested and the four sets of the push-up elements 4Ge are two rods, so that the trees are connected, and the (four) light is Off_ has a continuous flexible electronic component 2 to be tested (J _; in the same - lateral area with more than two plus each _ sex electron ^ (four) sub-element 2 增 increase - design system can avoid direct treatment, ρι丨The spacer-matching element 4〇e. The flexible electronic component 2 to be tested applies pressure to the electronic component 20, resulting in [026] although the invention has been previously set forth in the present invention. The road is as above, but it is not intended to limit the scope of the patent protection of the present invention: and the scope of the application for the modification and retouching, and the scope of protection as defined by the present invention. Brief Description] 12 200916748 Figure 1 is a detection system of a soft component of the prior art. 2 is a side view showing a first embodiment of a flexible electronic component bending test apparatus of the present invention; FIG. 3 is a view showing that the actuating element actuates the pusher element in FIG. Side view of the action relationship of the flexible substrate; Fig. 4A is a side view showing the second embodiment of the pushing member of the present invention. The side view is a side view showing the third embodiment of the resisting member of the present invention. The second embodiment of the present invention is a second embodiment of the present invention. The operating direction is a side view of the second embodiment of the clamping member of the present invention. Figure 8 is a side view of the second embodiment of the present invention; Figure 9 of the S-electronic electronic component bending test device is a KK image of the third embodiment of the present invention; (4) Figure 10 of the test apparatus is a fourth embodiment of the present invention - a perspective view; - a secret electronic component bend - test device 11 is shown to show the fifth embodiment of the present invention - read image; The electronic component bending_testing device 12 is a sixth embodiment showing the present invention - A perspective view of an example. 'Inductive electronic component bending test device [Main component symbol description] 200916748 10 Flexible substrate 20 Flexible electronic component 30 Clamping component 30a Cylindrical group 30b Cylindrical group 30c Fixing jig 40 Pushing component 40a Pushing component 40b Pushing component 40c Pushing element 40d pushing element 40e pushing element 41a curved surface 41b curved surface 41c curved surface 41d curved surface 41e curved surface 41f curved surface 50 actuating element 51 actuating element 60 detecting component 70 controlling element 80 pressure sensing element 200916748 90 Tensile sensing component

Claims (1)

200916748 、申請專利範圍: i. -種撓性電子元件試裝置,用以測試—撓性基板上 少一撓性電子元件,該彎曲測試裝置包括有: 至少-夾持元件,係夾持該撓性基板之二端; 至少一推抵元件,具有至少一弧面; 至少-致件’致軸鱗元件移動,和 =動而推抵該繞性基板’使简性基板依該弧二 -檢敝件,係於職絲板彎㈣檢測該基板。 2. ^請專利翻第1_述之裝置,財該推抵元件為一圓 3‘ Γ申請專糖_1销叙,其巾該減元件具有二個 3亥弧面,且5亥兩弧面具有相異之曲率半栌 4. ^申請專繼㈣3韻叙裝置,^該她元件為一凸 私。 5. 如申請專利細fl項所述之裝置,其中該致航件係在-維 空間中移動。 6. 如申請專利範_丨項所述之裝置,其中該致動元件係在二維 空間中移動。 7. 如申請專利範圍第2項所述之裝置,其中該夾持細係為一對 圓,’該至少其中之一圓柱經具有動力,以傳送該撓性基板。 8. 如”專利範圍第3項所述之裝置,其中該爽持元件係為-固 疋失具,其中該夾具相對之兩侧係可沿相鄰之一侧而滑動。 1 c 200916748 9·=轉利範圍第7項所述之裝置,更包含-控概件及-壓 力感測树,該壓域•件餘置於娜抵 =::=:基板時感測—二 該推抵元件之訊號而控制該致動元件致動 ι〇.=專利範圍第8項所述之裝置,更包含—控概件及—拉 在:亥二Γ件’該拉力感測元件係設置於該夹持元件之一側,以 控攸件 =隹希=&基板時感測並傳出—拉力訊號予該 推抵元件件依該拉力訊號啸繼_元件致動該 η·Γ=Γ第1G侧彻,更包含―勤感測元 元件推抵綠胁_減叙表面上,在該推抵 件,該控:二===訊號予該控制元 致動該推抵元件之移動量虎及雜力_而控制該致動元件 12.如申請專利範圍第】項所述之裝置, .光學:,1項所述鲁其中該等檢測組件係為-14·Ζ==圍第1項所述之裝置,其中該等檢測組件係為- 17200916748, the scope of the patent application: i. - a flexible electronic component test device for testing - one flexible electronic component on the flexible substrate, the bending test device comprising: at least - a clamping component that holds the flexible The two ends of the substrate; at least one pushing member having at least one arc surface; at least - the member 'the shaft scale member moves, and the = pushing and pushing the winding substrate' to make the simple substrate according to the arc The 敝 piece is tested on the substrate by the wire plate bend (4). 2. ^Please turn the patent to the first 1_ device, the financial component is a round 3' Γ application for the special sugar _1 pin, the towel has two 3 argon faces and 5 hp Have a different curvature half a 栌 4. ^ apply for succession (four) 3 rhyme device, ^ her element is a convex private. 5. The device of claim patent application, wherein the navigation component moves in a dimensional space. 6. The device of claim 2, wherein the actuating element is moved in a two dimensional space. 7. The device of claim 2, wherein the gripping system is a pair of circles, and wherein at least one of the cylinders is powered to convey the flexible substrate. 8. The device of claim 3, wherein the holding element is a solid-locking device, wherein the opposite sides of the jig are slidable along one of the adjacent sides. 1 c 200916748 9· = The device described in item 7 of the profit range further includes a control element and a pressure sensing tree, the pressure field and the remaining part are placed on the Na:=::=: sensing on the substrate - the second pushing element The signal is controlled to actuate the actuating element to actuate the device according to item 8 of the patent scope, and further comprises: a control device and a pull-on: the two-component device is disposed in the clip Holding one side of the component, the control element = 隹 = = & the substrate is sensed and transmitted - the pull signal to the push element is activated according to the pull signal _ element η Γ = Γ 1G Side-by-side, more includes - the diligent sensor element pushes the green threat _ on the surface of the reduction, in the push, the control: two === signal to the control element to actuate the amount of movement of the push component Miscellaneous _ and control of the actuating element 12. The device according to the scope of the patent application, optical: 1 item of the said Lu, wherein the detecting components are -14·Ζ== circumference 1 The apparatus described later, wherein such detection component is based --17
TW96137732A 2007-10-08 2007-10-08 Apparatus for testing flexible device under bendin TWI357497B (en)

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TWI480549B (en) * 2012-12-21 2015-04-11 Ind Tech Res Inst Method for bending stress testing and apparatus thereof
CN104729929A (en) * 2013-12-18 2015-06-24 昆山工研院新型平板显示技术中心有限公司 Flexible screen bending method and flexible screen bending system
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CN106680108A (en) * 2016-11-24 2017-05-17 惠科股份有限公司 Method and device for bending test of display panel
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Publication number Priority date Publication date Assignee Title
TWI480549B (en) * 2012-12-21 2015-04-11 Ind Tech Res Inst Method for bending stress testing and apparatus thereof
US9157843B2 (en) 2012-12-21 2015-10-13 Industrial Technology Research Institute Testing method of bending stress and testing apparatus thereof
CN104101544A (en) * 2013-04-11 2014-10-15 三星显示有限公司 Bending apparatus and bending method using the same
TWI664036B (en) * 2013-04-11 2019-07-01 南韓商三星顯示器有限公司 Bending apparatus
CN104729929A (en) * 2013-12-18 2015-06-24 昆山工研院新型平板显示技术中心有限公司 Flexible screen bending method and flexible screen bending system
TWI558992B (en) * 2013-12-18 2016-11-21 Flexible screen bending test methods and systems
US10054527B2 (en) 2013-12-18 2018-08-21 Kunshan New Flat Panel Display Technology Center Co., Ltd. Method and system for bending test of flexible screen
US10197482B2 (en) 2013-12-18 2019-02-05 Kunshan New Flat Panel Display Technology Center Co., Ltd. Method and system for bending test of flexible screen
TWI667476B (en) * 2014-10-11 2019-08-01 日商湯淺系統機器股份有限公司 Folding test machine
CN106680108A (en) * 2016-11-24 2017-05-17 惠科股份有限公司 Method and device for bending test of display panel
US12000803B2 (en) 2020-06-12 2024-06-04 Illinois Tool Works Inc. Methods and apparatus to perform load measurements on flexible substrates

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