200912633 .九、發明說明： 【發明所屬之技術領域】 之，传本有 = 系有關於一種儲存裝置之測試方法，更詳而言 ::性連接的刪置⑽系 【先前技術】 隨著電腦技術的迅速發展，電腦作㈣統功能越來越 Η應用程式也越來越多，而儲存該作業系統及這些庫 “ί:硬就扮演著重要角色’一旦硬碟執行不穩或 ^過重，都會造成整個系統效能大幅下降，因此，系統 r三ΐ:1"管理者特別重視硬碟運轉之穩定度，因為其 ，度_作業系統之效能有著莫大的關係，故有必要 在伺服益或硬碟出廠前作缜密之測試工作。 目前’在測制服器之效能上，特別是硬碟，多以人 工方式處理’其處理流程為記錄待測硬碟資訊、選擇測試 =具、運行相關壓力（咐咖）測試1具、輪人需要測試硬 -的代#u、察看效能測試值並記錄下來、反覆測試數十次 次以上、對所有測試結果求平均值、以及再把該平均值和 客戶要求之最低期望值進行比較，以判斷是否符合測試要 求：而獲得最終測試結果（Pass/Fall)，其中該效能測試 值係由系統自帶的測試命令行Hdparm測試而得，且 Hdparm —次只能測試一個硬碟，以及有—個返回值，例 如’ #hdparm-Td/dev/Sda(可對sda硬碟作效能測試，而 110403 5 200912633 知到這顆更碟的效能測試數據）、#hdparm/dev/sda(可察 看目刖:da的翏數設定狀態）、(可察 看詳細資料狀況與支援類型）。 、 工 然而’上述硬碟測試所面臨的問題包括：需要測試 多：輸入測試資訊和比對資訊，一般而言，一個硬碟 f所需時間大約需要a分鐘，既浪費時間且易出r Γ 若測試的次數不夠n / B， 則測忒結果不夠準確；每次只能逸杆 —個硬碟的測試，效率 浪費許多時 个门如果而要測试多個硬碟，將 試处果的其：’始的測試結果都是人工記錄，不利於測 '、’、。果的s理。故現行硬碟效能測試 廠商的測試成本。 者Λ %加硬碟 冇，在檢查㈣之效财，如何有效減少人力負 何’使硬碟所測試出之結 人力負 前亟需解決之問題。 兼/、同效率，即是目 【發明内容】 鑒·於以上習知技術之缺， 種儲存裝置之測##、、& Χ月之目的在於提供一 〜W式方法’其應用於且右 置之電腦系統中，用以自動測試與該電;及輸入裝 裝置:執行效能，以確保測試結果的;=統連接的儲存 ㈣H g的在於提供 法’其應用於具有顯示裝置及輸入事之測試方 :自動測試與該電腦系統連接的J =系蘇中，用 减輕工程師負擔，並能節省測試時間執行效能，以 本發明之再一目的在於提供 仔衮置之測試方 U04Q3 6 200912633 • t白t應用於具有顯示裝置及輸人裝置之電腦系統中，用 口 腦系統連接的儲存裝置之執行效能，以 挺冋硬碟測試工作的效率。 .:為達上述目的或其他目的，本發明提供一種儲存裝置 =童則5式方法’僅需輸人待測的儲存裝置類型以及 陶㈣置進行賴，該賴方法包° 望值:接收二儲存裝置類型及相對之儲存襄置效能期 值接者接收輸入待測儲存裝置類型及測試次數 該儲存裝置執行符合該測試次數的效能測試 有的效能測試結果進行運算而得出效能測試結果=所 值’進而㈣料_料置㈣自 = 儲存裝置效能期望值與該平均值進行比較， ;，最後广m存所有的效能測試結果及二果因σ 了師不必針對每—類型之儲存裝 同。果= 值’故二幅縮減贼日㈣，並增加龍之準確Γ:參數200912633. Nine, invention description: [Technical field of invention], the transmission has = test method for a storage device, more specifically:: the deletion of sexual connection (10) is [previous technology] with the computer With the rapid development of technology, there are more and more applications for computers (4), and the storage of these operating systems and these libraries "ί: Hard plays an important role" once the hard disk is unstable or too heavy, Will cause the overall system performance to drop significantly, therefore, the system r three: 1 " managers pay special attention to the stability of the hard disk operation, because its degree _ operating system has a great relationship, so it is necessary to be in the servo or hard The disc is carefully tested before leaving the factory. At present, 'the performance of the uniforms, especially the hard discs, is mostly handled manually'. The processing flow is to record the hard disk information to be tested, select the test = tool, and run the relevant pressure (咐咖)1 test, the wheel person needs to test the hard-generation generation #u, check the performance test value and record it, repeat the test dozens of times or more, average all test results, and The average value is compared with the minimum expected value requested by the customer to determine whether the test requirement is met: and the final test result (Pass/Fall) is obtained, wherein the performance test value is obtained by the test command line Hdparm that is included in the system. And Hdparm can only test one hard disk at a time, and have a return value, such as ' #hdparm-Td/dev/Sda (can perform performance test on sda hard disk, and 110403 5 200912633 knows this more Performance test data), #hdparm/dev/sda (can see the directory: da's parameter setting status), (can see the details of the status and support type). However, the problems faced by the above hard disk test include: Need to test more: input test information and comparison information, in general, a hard disk f takes about a minute, which is a waste of time and easy to r Γ If the number of tests is not enough n / B, the test results are not enough Accurate; each time only the tester - a hard disk test, the efficiency is wasted a lot of time if you want to test multiple hard drives, the test will be fruitful: 'The initial test results are all manual records, not conducive to Measurement' ', the fruit of the reason. Therefore, the current hard disk performance test manufacturers test costs. Λ 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加 加The problem that needs to be solved before the negative. The same efficiency, that is, the purpose of the invention [Invention] The lack of the above-mentioned conventional technology, the measurement of the storage device ##,, & the purpose of the month is to provide a ~ W-method 'is applied to the right-hand computer system for automatic testing and the power; and input device: performing performance to ensure test results; = connection storage (4) H g is provided by the method It is applied to the tester with the display device and the input device: the automatic test is connected with the computer system, the J= system is used to reduce the burden on the engineer, and the test time can be saved, and another object of the present invention is to provide the child. Tester U04Q3 6 200912633 • The white t is applied to the performance of the storage device connected to the brain system with the display device and the input device, so as to test the efficiency of the hard disk test work. For the above purpose or other purposes, the present invention provides a storage device=Children's 5 method's only need to input the type of storage device to be tested and the Tao (4) set to rely on, the method of the package is expected to receive: The storage device type and the relative storage device performance period value are received by the input device to be tested and the number of tests. The storage device performs the performance test results of the performance test that meets the number of tests, and the performance test result is obtained. The value 'further (four) material _ material set (four) from = storage device performance expectation value compared with the average value;; finally, all the performance test results and the second factor σ does not have to be installed for each type of storage. If the value = value, then the second reduction of the thief day (four), and increase the accuracy of the dragon Γ: parameters
.λ V 於^施例中，可基於該平均值大於或 置效能期望值之比較結果 7錯存裝 測試的訊息;於另一實·復可 效能期望值之比較結果而透過該顯出= 存袭置 測試的訊息。 别出未通過 藉由本發明之儲存裝 必:次輸入測試資訊和比輪師不 值直接比較’進而判斷該儲存裝 1與 求’因而得到較精確之測試結果，以及節省人二:::。 】]〇403 200912633 【實施方式】 以下係藉由特定的具體實施例說明本發明之每a 式，熟悉此技藝之人士可由本說明書所揭示之内:，方 瞭解本發明之其他優點與功效。本發明亦可藉由复易地 的具體實施例加以施行或應用，本說明書中的各不同 可基於不同觀點與應用，在不悖離本發明下:節亦 種修飾與變更。 中下進仃各 請參閱第1圖，其係用以顯示本發明之 試方法的運作流程示意圖。如圖所示，本發明之錯存壯= =測試方法係應用於具有輸人裝置及顯^ 接的儲存裝置之執行效能。 乂電知糸統連 型及行㈣S1G’預先建謂麵㈣儲存裝置類 庫令，^^文能期望值於一連接至該電腦系統之資料 電腦^Γ 建立於該電腦系統中’或者建立於與該 料庫中伺服器或另一台電腦系統中，墙 的，本，^利及料裝置效能期望值係相對應 型，本二？’複數個儲存裝置類型係為不同之硬碟類 該储存袭置兮1=、观、冗、11)£等類型之硬碟，而 的最低期/⑨期望值係指客戶對不同類型硬碟之效能 根據不同干值，該期望值一般是不變的’但此期望值也可 儲存的：Γ 行修改。在此舉例而言，該資料庫中所 置類型與健存裝置效能期望值的對應關係 係為㈣/S、FC係為5GM/S的對應關係，接 8 110403 200912633 -著進行步騾SI2。 由j步驟⑽中，對該儲存裝置執行測試，且體而言， 由该步驟幻2至下列所述之步 /、耻而。 η乂鄉以4所執行的測試處理均 疋透過一測試軟體完成，換士 試方法係透過一測試軟體執:亍=發明之儲存裝置之測 求輸入待測儲存裝置類型始執行測試時，係要 等儲存裝置資料，即透過該電^以及儲存裝置代碼 軟體㈣心、1+ 存褒置資料後執行該測試 ^ _指令，例如對硬碟進行測試時，即可以 口參數形成該測試指令，該測試指令例如 __ -Td/dev/sda、編财m/dev/sda、細咖 ~l/deV/Sda或其它參數組成之指令，以對上述步驟所輸 入之儲存裝置類型以及儲存事 " 11 進行數次的效能測試，需說明的是二㈣置 指令與相關參數所組成指令__，㈣^ :;而儲存裝置代碼係用以供該電 = 連接（即安裝）的儲存裝置，一 扣/、/、電度 裝的儲存裝置數量並不限定4们:’該％腦系統所安 里卫不限疋為一個，亦可 上，故，精由該儲存褒置代碼以供該電腦系統識 行測試的儲存裝置為何，換言之，若 出人執 置，則不須輸入該儲存裂置代碼。里古早—個儲存裳 於儲存裝置資料輸入過程中，若電腦二出說明的是’ 中取得該輸入待測儲存穿置窄型自該資料庫 柯仔衣置颌型（例如硬碟類型 後續的比較處理時，該測試軟體復提供另—輸人介面(订在 110403 9 200912633 -此未予以圖示），以供測試人員 料進行該儲存裝置類型及相對岸之錯/1 存的錯存裝置資 預設值（例如50次試次數可以是 後輸入所欲測$儲> ^ °依只際需求進行變更，最 存裝置代喝，例如 <碼，、· Sdb，sdc等，接著進行步驟=的硬碟 測試=等測試次數之效能測試的不同 測試結果之平均值=同運算而得出該等 (Min)，接著進行步驟训。 X、以及最小值 於步驟S16中，擷取該等 該資料庫中所輸入之健存裝置二:::均值崎 期望值）進行比較，接著進行步驟S18。（亦即客戶最低 於步驟S18中，若哕单抝括。 低期望值，則進至步驟;;句值⑽）大於或等於客戶最 戶最低期f # aI 中，若該平均值（Ave)小於客 取低期望值，則進至步驟S22中。 測二：’令該電腦系統之顯示裝置輸出-通過 客戶二藉此表示所測試的硬碟之效能符合 光源的發光貫施例而言，該顯示裝置例如發出綠色 ㊇先—極體，接著進行步驟S24。 於步驟S22中，令哕恭肝金μ 過測試（Fail)之ιΓϋ 顯示裝置輸出一不通 符合客戶J 猎此表示所測試的硬碟之效能不 红色光沔二’就本貫施例而言，該顯示裝置例如發出 '色先源的發光二極體，接著進行步驟S24。 110403 200912633 . 於步驟S24中，將該步驟S20及誃牛现 通過/不通過之比對結果予以儲存，例：儲2二斤：得的 .之特定目錄下，例如/teDlp/result’或者θ 腦系統 -電腦系統網路連接的飼服器或另n二γ子於與該 ，中’該測試資料及結果的儲存處：= =製及管理。藉由上述的處理步驟以完成所二師二 置類型之測試。 丨方减仔衣 雖然本實施例中係以步驟s :後的具體判斷方式，但是並無特定3表 本發明之實施方式。舉例而言 纟匕限制 結果之平均值（Ave)與該資料庫㈣^16擷取該等測試 :::(亦即客戶最低期望值)進行比較之 製及管理該測試;;錯存，後續透過察看、複 提高測試效能及;=:可:_試結果，同樣達到 ⑽而顯示結果為限。的，絕非以進行步驟⑽至 儲存本發明之儲存裝置之測試方法，係先建立 根據L;、L=對:之客戶最低期望值於資料庫中，再 測試次數、輸入儲入儲存裝置類型、輸入測試 便可依據待測 ^馬’依次輸入相關數值，接著 指令…來;控制 將所得出之測試結果計算及比較而得出最大值再 Π0403 11 200912633 小值（Min)、以及平均值（Ave)，該平均值g 數測試後所得到的效能測試結果之平 =有測試次 且與儲存裝置類型相對應之客戶最低期望值與入 =行比較，好均值大於或等於該客戶最低期望值，則輸 出通過測試（Pass)之訊息，若平均 ' 沾 值小於該客戶最低湘望 值’則輸出不通過測試（Fail)之1自符从 望 里》+ 訊息，最後將該等測試紗 果儲存於預設目錄中，藉此可快速& 、 、° 作，並提高測試之效能及準確性。& 1衣置的測試工 上述實施例僅例示性說明本發 非用於限制本料。任何熟悉H、功效’而 背本發明之精神及範訂，對if之人士均可在不違 變。因此，本㈣之__=貫域進行修飾與改 範圍所列。 。靶圍，應如後述之申請專利 【圖式簡單說明】 第1圖係顯示本發明之錯 流程示意圖。 子凌置之測试方法的運作 【主要元件符號說明】 S10至S24步驟 110403 12λ V In the embodiment, the test message may be erroneously stored based on the comparison result of the average value being greater than or the performance expectation value; and the comparison result of the other actual performance expectation value is transmitted through the display = attack Set the test message. Do not pass the storage device according to the present invention: the input test information is directly compared with the wheeler's value, and the storage device 1 and the request are judged to obtain a more accurate test result, and the saver 2:::. 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The present invention may be embodied or applied by a specific embodiment of the present invention, and various differences in the present invention may be made based on various aspects and applications without departing from the invention. Referring to Figure 1, there is shown a schematic diagram showing the operational flow of the test method of the present invention. As shown in the figure, the fault persistence of the present invention = = test method is applied to the execution performance of a storage device having an input device and a display.乂 糸 糸 连 及 及 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四In the server or another computer system in the library, the wall, the original, the profit and the device performance expectation value are corresponding types, the second? 'The number of storage devices is different for the hard disk type. The storage is set to 1=, view, redundant, 11) £ and other types of hard disk, and the minimum period / 9 expected value refers to the customer's different types of hard disk. Performance is based on different dry values, which are generally constant 'but this expected value can also be stored: 修改 modified. For example, the correspondence between the type of the database and the expected performance of the storage device is (4) / S, and the FC system is 5 GM / S, and then the step is 11012 200912633 - step SI2. From step j (10), the storage device is tested, and physically, from the step 2 to the following steps, shame. The test processing performed by 乂 乂 乡 乡 4 4 4 4 4 4 4 4 4 4 4 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换 换To wait for the storage device data, that is, to execute the test ^ _ command after the power and the storage device code software (4) heart, 1+ storage device data, for example, when testing the hard disk, the test parameter can be formed by the mouth parameter. The test command such as __-Td/dev/sda, coded m/dev/sda, fine coffee ~l/deV/Sda or other parameters consists of the storage device type and storage thing entered in the above steps. 11 The performance test is performed several times. It is necessary to explain the two (four) instructions and related parameters of the instruction __, (4) ^:; and the storage device code is used for the electricity = connection (ie installation) storage device, The number of storage devices with one button/, /, and electrical capacity is not limited to 4: 'The % brain system is not limited to one, but can also be used. Therefore, it is necessary to store the code for the computer. What is the storage device for the system identification test, In other words, if you execute it, you do not need to enter the storage split code. In the early morning, a storage is stored in the storage device data input process. If the computer is out of the description, the medium is obtained. The input is to be tested and the storage is narrowed. The data is stored in the database. During the comparison processing, the test software provides a separate input interface (booked at 110403 9 200912633 - not shown here) for the tester to perform the storage device type and the fault of the opposite shore / 1 storage The preset value of the device (for example, 50 trials can be input after the input is to be measured). ^ ° is changed according to the demand only, and the most stored device is used for drinking, for example, <code,, · Sdb, sdc, etc., then Perform the hard disk test of step = = the average value of the different test results of the performance test of the number of test times = the same operation to obtain the (Min), and then the step training. X, and the minimum value in step S16, The storage device 2::: mean value expected in the database is compared, and then step S18 is performed. (That is, the customer is at least in step S18, if the order is included. Step;;sentence value (10)) is greater than or equal In the customer's lowest minimum period f # aI, if the average value (Ave) is less than the guest low expected value, then the process goes to step S22. Test 2: 'Make the display device output of the computer system-by the customer 2 The performance of the tested hard disk conforms to the illumination of the light source. The display device emits, for example, a green eight-polar body, and then proceeds to step S24. In step S22, the test is performed. The display device output does not meet the customer J. This indicates that the performance of the hard disk tested is not red. In the case of the present embodiment, the display device emits, for example, a 'light source' LED, and then Go to step S24. 110403 200912633. In step S24, the result of the comparison of the step S20 and the current pass/fail of the yak is stored, for example, in a specific directory of 2 jin: obtained, for example, /teDlp/ Result' or θ brain system - computer system network connection of the feeding device or another n gamma gamma in the same, the storage of the test data and results: = = system and management. By the above processing steps to Complete the second division of the second division Although the present embodiment is based on the specific judgment method after the step s:, there is no specific embodiment of the present invention. For example, the average value (Ave) of the limit result and the Database (4)^16 Take these tests::: (ie, the customer's lowest expected value) to compare and manage the test;; erroneously save, follow-up through inspection, re-test performance and; =: can: _ test results The same as (10) and the result is limited. The test method of storing the storage device of the present invention is not performed in the step (10), and the minimum expected value of the customer according to L;, L=pair is first established in the database, and then The number of tests, the type of storage stored in the storage device, and the input test can be entered according to the test to be tested, followed by the command... followed by the command; the control calculates and compares the resulting test results to obtain the maximum value and then Π 0403 11 200912633 Value (Min), and average value (Ave), the average value of the number of g test results obtained after the test = the number of test times and the minimum expected value of the customer corresponding to the type of storage device compared with the input = line, the average If the value is greater than or equal to the minimum expected value of the customer, the message passing the test is output. If the average 'dip value is less than the minimum expected value of the customer', the output does not pass the test (Fail) 1 from the lookout + message Finally, the test results are stored in a preset directory, which can be quickly &, , and improve the performance and accuracy of the test. & 1 Tester for the garment The above examples are merely illustrative of the present invention and are not intended to limit the material. Anyone who is familiar with H, efficacy, and the spirit and scope of the invention can not be violated. Therefore, the __= __= cross-domain of this (4) is listed in the scope of modification and modification. . The target circumference should be patented as described later. [Simplified illustration of the drawings] Fig. 1 is a schematic diagram showing the wrong flow of the present invention. Operation of the test method of the sub-module [Description of main component symbols] Steps S10 to S24 110403 12