TW200821564A - Stray light measuring system and method thereof - Google Patents

Stray light measuring system and method thereof Download PDF

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TW200821564A
TW200821564A TW95141465A TW95141465A TW200821564A TW 200821564 A TW200821564 A TW 200821564A TW 95141465 A TW95141465 A TW 95141465A TW 95141465 A TW95141465 A TW 95141465A TW 200821564 A TW200821564 A TW 200821564A
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stray light
screen
optical system
tested
projection device
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TW95141465A
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Chinese (zh)
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TWI311197B (en
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Chuan-Chung Chang
Yi-Ling Wu
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Ind Tech Res Inst
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Abstract

A stray light measuring system and a method thereof are disclosed for measuring stray light of an optical system. The method includes installing a screen in front of the optical system, installing in front of the screen a projection device for projecting light and targets onto the screen, and coupling a control device to the optical system to calculate the stray light of the optical system. Since the projection device projects the targets, as well as the light, the cost for installation of a light source is significantly reduced, the uniformity of illumination is greatly improved, and the stray light measuring system has a simple architecture. Therefore, the drawbacks of the prior art are overcome.

Description

200821564,. 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種雜散光量測技術,尤指一種用於量 測光學系統之雜散光量測系統與方法。 【先前技術】 應用於電子產品中的光學系統設計,一般只分析特定 .幾個光線來確認所能達到的光學規格,例如焦距、成像光 點大小、各項像差、光學調制函數等,當光學系統完成前 ⑩述的光學設計達到設計規格後便進行生產製造,但是光學 系統在實際使用上,由物方向進入鏡頭的光線是具有各種 方向與角度的,因此往往在實際狀況下於成像面上會發現 部分區域有雜光、鬼影、炫光等現象的產生,這些效應雖 然可用特定功能的光學軟體來做分析以協助確認雜散光 的來源,但這種模擬分析最終仍須依靠對光學鏡頭做實際 的雜散光量測後,才足以確認並作為光學工程的改進依據 _ _與參考。 — 就雜散光量測部份,在我國、美國及中國大陸均查無 相關之專利,僅見部份應用在光學系統中以提供降低雜散 光之結構或控制設計。目前雖然已經有相關的國際規範 (IS09358)加以說明,但在這種規範中,只提供一個大略 的輪廓與茶考的方向,並未針對量測系統與量測方法做最 佺化的具體架構設計,因此並無法落實於雜散光量測的實 際應用。 ' 在國際規範IS09358中,係將雜散光的量測分為定性 19832 5 200821564… 量測與定量量測兩大類。在定性量測部分的做法,是在待 測光學系統的中心視場或是對角線視場位置擺放一個不 發光的物體,並分別計算光學系統就單純全白視場下與存 在不發光物體視場下在成像面上所接收到的訊號強度比 值來作為該待測系統的雜散光係數,這種量測方式相當於 模擬光學系統在「順光」條件下使用時所產生的雜散光。 另外一種方法歸類為定量量測,其做法是讓待測光學 系統分別在物方向的不同視場產生發光源,此時除了發光 _源之外,其餘視場均不發光,接著可以分別記錄下在成像 面上隨著物方向視場變化下的強度變化,這種測試方式可 以詳細得知不同視角的雜光係數,同時若與定性量測的方 法來比較,這種方法相當於測試光學系統在「逆光」條件 下使用時所產生的雜散光。 通常雜散光的量測要在物方向所預定的物空間中產 生種圖樣’以分別提供定性量測與定量量測,如第1 a ⑩圖及第1B圖所示之圖樣可提供取得雜散光係數,而如第 1C圖所不之圖樣則可提供取得在不同視角下的雜散光。 產生前述第1A圖至第1C圖所示圖樣的方法,一般可 以區刀為牙透式與反射式兩種。以反射式而言,國際規範 S09358中誕及在物空間使用移動平台,移動平台上設置 一個可以改變位置的白色標靶以用作模擬不同視場的光. 源使用,其餘背景則均為黑色的,且反射式的光源通常使 用至少二個特定光源,分別以左右45度的角度照射至移 動平台上的標乾’並需要確認在被照射的標靶之照度分佈 6 19832 200821564 .. 具有相當高的均勾性(-般要求照度均勾性在整個標革巴上 須達⑽以上)。但這種做法會隨著物距與待測光學系统 視角的增加而發生困難,其困難在於隨著標㈣尺寸增 加,照明的難度也隨著增加,同時為了達到要求的照度曰均 勻度’經常需要增加所使用的照明光源,而#照明光源數 量增加時’對照明光源的調整與控制的難度也隨著增加, 因此造成時量測上的極大難度與高成本。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a stray light measurement technique, and more particularly to a stray light measurement system and method for a measurement optical system. [Prior Art] The design of an optical system used in electronic products generally analyzes only a specific number of rays to confirm the optical specifications that can be achieved, such as focal length, imaging spot size, various aberrations, optical modulation functions, etc. The optical system is manufactured after the optical design of the previous tenth reaches the design specification, but in actual use, the light entering the lens from the object direction has various directions and angles, so it is often in the actual condition on the imaging surface. Some areas will be found to have stray light, ghosting, glare and other phenomena. Although these effects can be analyzed with specific functional optical software to help confirm the source of stray light, this simulation analysis still has to rely on optics. After the actual stray light measurement of the lens is sufficient, it is sufficient to confirm and serve as an improvement basis for optical engineering _ _ and reference. — For the stray light measurement section, no related patents have been found in China, the United States, and China. Only some of them are used in optical systems to provide structural or control designs that reduce stray light. Although there are already relevant international norms (IS09358) to explain, in this specification, only a general outline and the direction of the tea test are provided, and the specific structure that does not make the most depreciation for the measurement system and the measurement method is not provided. Design, therefore, can not be implemented in the practical application of stray light measurement. In the international standard IS09358, the measurement of stray light is divided into two categories: characterization 19832 5 200821564... measurement and quantitative measurement. In the qualitative measurement part, the non-illuminating object is placed in the central field of view or the diagonal field of view of the optical system to be tested, and the optical system is calculated separately. The ratio of the signal intensity received on the imaging surface in the field of view of the object is used as the stray light coefficient of the system under test. This measurement method is equivalent to the stray light generated by the analog optical system when used under "shun" conditions. . Another method is classified into quantitative measurement, which is to make the optical system to be tested generate a light source in different fields of view in the object direction. At this time, except for the light source, the other fields of view are not illuminated, and then can be separately recorded. This test method can know the stray light coefficient of different viewing angles in detail on the imaging surface with the change of the field of view in the object direction. At the same time, if compared with the qualitative measurement method, this method is equivalent to the test optics. Stray light generated when the system is used under "backlighting" conditions. Usually, the measurement of stray light is to produce a pattern in the object space predetermined in the direction of the object to provide qualitative measurement and quantitative measurement respectively, and the patterns shown in FIGS. 1 a 10 and 1 B can provide stray light. Coefficients, as shown in Figure 1C, provide for obtaining stray light at different viewing angles. In the method of generating the patterns shown in the above Figs. 1A to 1C, the area knife can be generally used as both a translucent type and a reflective type. In terms of reflection, the international standard S09358 uses the mobile platform in the object space, and the mobile platform sets a white target that can change position to use as the light for simulating different fields of view. The source is used, and the rest of the background is black. And the reflective light source usually uses at least two specific light sources, respectively, to the head of the moving platform at an angle of 45 degrees left and right respectively and needs to confirm the illumination distribution of the target being illuminated 6 19832 200821564 .. High uniformity (the general requirement for illuminance must be above (10) above the standard leather bar). However, this approach will be difficult as the object distance and the viewing angle of the optical system to be tested increase. The difficulty is that as the size of the standard (4) increases, the difficulty of illumination increases, and at the same time, in order to achieve the required illumination uniformity, 'often It is necessary to increase the illumination source used, and when the number of illumination sources increases, the difficulty of adjusting and controlling the illumination source increases, which causes great difficulty and high cost in measurement.

Hit式而言’通常採用「光箱」來作為穿透式的光 •源來源,這種方法針對測試物距與待測視角較小的量測需 求而言尚屬簡便,但同樣的,當待測視場變大時,所泰大 面積的光箱成本也隨著增加,因此亦造成時量測上的高成 本。 待測試光學系統以光學鏡頭為例,若待測物距為一公 尺,同時該鏡頭的半視角最大為4〇度時,在此種條件下 測試區域的標革巴對角線長度至少須達1.7公尺以上,對於 •這種尺寸不—疋反射式或是穿透式*言,光是在照明的要 长P伤就相田不谷易達到規範的要I。舉例來說,在穿透 式部份可以採用積分球來產生均勻光源,但是若要在17 公尺直徑的範圍内產生均勻的光源,則所使用的積分球尺 ^至少半徑須達2公尺以上(以5%的積分球開σ率做計 异),可想而知在此架構下單就使用積分球所需耗費的成 本就相當昂貴。 、β由於前揭國際規範IS09358所提及利用移動圖樣形 成標靶以模擬不同視角的光源使用中,必須配置移動平台 19832 7 200821564. % 而造成量測系統所需空間與成本之限制。另就產生圖樣之 反射式架構而言,為顧及95%以上之照度均勻性,不可避 免的必而要使用爿多個光源,不僅造成耗費配置空間、配 置成本’亦何生照明光源的調整與控制的極大難度與高成 本:又就穿透式架構而言,雖然針對照度均勻性之達成較 為谷易,但疋使用光箱(如積分球)所需要的成本又實在 、過於昂貴,大大地降低了實用價值。 、、有鑑於前述缺點,如何提供一種雜散光量測系統與方 法,以簡化針對物空間之光源與測試標靶的要求,實現大 幅降低光源成本、、縮小配置空間、屏除配置移動平台等功 2 ’進而克服先前技術所存在之問題,乃成為目前業界亟 待克服之課題。 【發明内容】 日鐾於以上所述先前技術之缺點,本發明之—目的即在 於提供-種簡化系統架構之雜散光量測系統與方法。 _本發明之另-目的在於提供—種降低光源成本並易 、、只現照度均勻性之雜散光量測系統與方法。 本lx明之再一目的在於提供一種縮小配置空間之 散光量測系統與方法。 " 本U之又-目的在於提供—種無須配置移動么 之雜散光量測系統與方法·。‘ 口 為達成上揭目的及其它目的,本發明提供一種 开,係配置於該待測光學系統之正前方;投影裳置, 19832 8 200821564,, ^配置於該屏幕之正前方,用以投射光源與標乾至該屏 棊,俾供該待測光學系統擷取成像;以及控制裝置 待測光學系統,用以計算求得該待測光學系統 、同時,為達成相同目的,本發明亦提供一種雜散光量 測方法’係供應用於待測光㈣統之雜散光量測,其包 一於及待測光H統之正前方配置—屏幕;於該屏幕之 正前方配置—投影裝置,以投射光源與標無至該屏幕,供 雛=測光料、統擷取成像;以絲合—控制裝置至該待測 光子2統,以計算求得該待測光學系統之雜散光。 前述之雜散光量測系統與方法中,該屏幕係可為一穿 透式屏棊’且該投影裝置與待測光學系統分別配置於該穿 透式屏幕之相對兩側,俾構成一種穿透式之量測架構。此 屏、幕亦可係—反射式屏幕,且該投影裝置與待測光 子糸、、“別配置於該反射式屏幕之同一側,俾構成一種反 •射式之量測架構。於一較佳實施例中,該屏幕係一白紙。 該置係可為一具有伸縮鏡頭之投影機,以供選 擇性的調整所投射標乾之區域大小。於一較佳實施例中, 該伸縮鏡頭復可安裝一中性渡光片⑽Filter)、,以增加 該投影機之影像對比,故可輕易彌補所需之對比度,無須 使用高對比度之高價投影機。. 該控制裝置除了耦合至該待㈣學系統以計算求得 該待測光學系統之雜散光以外,復可輕合至該投影裝置, 俾選擇性的調整所投影之標乾圖樣、標乾區域大小、以及 19832 9 200821564,. > :原區預大小之其中至少一者,較佳地,該控制裳置係一 電腦,俾輕易地控制該投影裝置之投影變化。 、相車乂於習知技術,本發明所提供之雜散光量測系統與 壯-主要利用技影裝置投射光源與標革巴,由於採用投影 衣置同:兼具光源與標革巴的作用,因此可大幅降低光源的 成本、貝現照度均勻性、並簡化系統架構。由此可知,本 發明已相對克服先前技術之缺失,實具高度之產業利用價 值。 、 _【實施方式】 /以下茲配合圖式說明本創作之具體實施例,以使所屬 技術中具有通常知識者可輕易地瞭解本創作之技術特徵 與達成功效。 y如第2圖所示,本發明提供一種雜散光量測系統i, 係仏應用於待測光學系統2之雜散光量測,該雜散光量測 _系統1係包括:配置於該待測光學系統2正前方之屏幕 Η、配置於該屏幕Π正前方以投射光源與標靶之投影裝 置13、以及耦合至該待測光學系統2以計算求得雜散光 =控制裝置15。所述之待測光學系統2係以例如應用於 知、相機之光學鏡頭為例,但絕非以此為限,舉凡存在因為 外界雜光導致成像品質不佳疑慮之光學系統,均屬本發明 所得應用量測雜散光之待測光學系統2。 该屏幕11係配置於該待測光學系統2之正前方,用 以供投射光源與標靶,俾供該待測光學系統2擷取成像。 19832 10 200821564,. 於本實施例中,該屏幕u係 裝置13與待測光學系統2分別配置於 = 侧旦俾1成Γ種穿透式之量測架構。此外,由於進行雜散 ::測時,係要求標靶上所發出的光源必須為各方向均: …光源,而一般白紙具有可穿透特性,且表面具有均 勻的微粒供反射光線,極適於在光源照射時期反射或是 透光的特性堤供接近各方向均勻發光的效果,因此該屏幕 11係可選用一白紙。 ,該投影裝置13係配置於該屏i η之正前方,並且間 隔者屏幕11而與該待測光學系統2相對,用以投射光源 與標靶至該屏幕U,俾供該待測光學系統2擷取成像。 於本實施例中,該投影裝置13係為—具有伸縮鏡頭131 之投影機,以供選擇性的調整投影距離,亦即相當於調整 所投射標乾之區域大小。同時,由於—般投影機的影像對 比達2 0 0 0 .1左右,對應用於雜散光量測之國際規範 jS09358所要求的10000:1以上而言猶嫌不足,因此可於 该伸縮鏡頭131上安裝一中性濾光片(NDFilter)133,以 增加該投影機之影像對比,故可輕易彌補所需之對比度, 無須使用高對比度之高價投影機。 該控制裝置15係耦合至該待測光學系統2,可搭配 一感測lr 151,用以根據該待測光學系統2所擷取成像之 成像面上中心位置的強度變化,計算求得該待測光學系統 2之雜散光。於本實施例中,該控制裝置15係一電腦, 同時’除了耦合至該待測光學系統2以計算求得該待測光 19832 11 200821564… 學系統2之雜散光以外,復耦合至該投影裝置13,俾選 擇性的調整所投影之標靶圖樣、標靶區域大小、以及光源 區預大小之其中至少一者,由於採用電腦實施該控制裝置 15 ’故可透過常見的套裝軟體而輕易地控制該投影裝置 13進行前述之投影變化。 相對於前揭量測系統,本發明亦提供一種雜散光量测 ' 方法,同樣請配合參閱如第2圖所示,係包括:於待測光 . 學系統2之正前方配置一屏幕n ;於該屏幕n之正前方 馨配置一投影裝置13,以投射光源與標革巴至該屏幕1卜供 待測光4»糸統2榻取成像,以及搞合一控制裝置15至 。玄待測光學系統2,以計算求得該待測光學系統2之埼 光。 ,、月又 不論是本發明所提出之雜散光量測系統或方法中,針 對進行定性量測或定量量測之流程與運算法則並無特 異,茲進一步說明之。 •馨 首先,在在定性量測部分,分別控制投影裝置13產 '生如圖第1A圖或第1B圖所示的圖樣,然後分別記錄待測 學系統2之成像面上中心位置的強度變化,再利用式(— 末求出待測糸統的雜散光係數(VGI或vgIb)。 VGl(orVGIB)-|i^xl〇〇〇/〇In the case of Hit, 'the light box is usually used as the source of the penetrating light source. This method is simple for measuring the distance between the object and the angle of view to be measured, but the same, when When the field of view to be measured becomes larger, the cost of the large-area light box increases, which also causes high cost in time measurement. The optical system to be tested is exemplified by an optical lens. If the object to be tested is one meter apart and the half angle of view of the lens is at most 4 degrees, the diagonal length of the standard leather of the test area must be at least Up to 1.7 meters or more, for this size is not - 疋 reflective or penetrating * words, the light is in the light of the long P injury, it is easy to reach the standard I. For example, an integrating sphere can be used to create a uniform source in the penetrating section, but to produce a uniform source within a 17-meter diameter, the integrating sphere must be at least 2 meters in radius. Above (using 5% of the integrating sphere opening sigma ratio), it is conceivable that the cost of using the integrating sphere in this structure is quite expensive. Because of the reference to the use of moving patterns to form targets to simulate different angles of light source, as mentioned in the previous International Code IS09358, the mobile platform 19832 7 200821564. % must be configured to limit the space and cost required for the measurement system. In addition, in the reflective architecture that produces the pattern, in order to take into account the illumination uniformity of more than 95%, it is inevitable that a plurality of light sources must be used, which not only causes the configuration space and the configuration cost, but also the adjustment of the illumination source. Extreme difficulty and high cost of control: In terms of transmissive architecture, although the uniformity of illumination is relatively easy, the cost of using a light box (such as an integrating sphere) is real and too expensive. Reduced practical value. In view of the foregoing shortcomings, how to provide a stray light measurement system and method to simplify the requirements of the light source and the test target for the object space, to achieve a significant reduction in the cost of the light source, to reduce the configuration space, and to remove the configuration of the mobile platform; Further, overcoming the problems existing in the prior art has become an urgent issue to be overcome in the industry. SUMMARY OF THE INVENTION In view of the above-discussed shortcomings of the prior art, the present invention is directed to providing a stray light measurement system and method that simplifies the system architecture. Another object of the present invention is to provide a stray light measurement system and method that reduces the cost of the light source and is easy, and only uniform in illumination. A further object of the present invention is to provide an astigmatism measurement system and method for reducing the configuration space. " This U--the purpose is to provide a stray light measurement system and method without the need to configure mobile. The present invention provides an opening that is disposed directly in front of the optical system to be tested; a projection skirt, 19832 8 200821564, ^ is disposed directly in front of the screen for projection a light source and a standard to the screen, for imaging the optical system to be tested; and an optical system to be tested by the control device for calculating the optical system to be tested, and at the same time, for the same purpose, the present invention also provides A method for measuring stray light is provided for the measurement of stray light for the light to be measured (4), and the package is disposed in front of the screen to be measured, and the screen is arranged in front of the screen to project The light source and the standard are not up to the screen, the feeding mode = the photometric material, and the image is captured; the silk-in-control device is connected to the photon to be measured to calculate the stray light of the optical system to be tested. In the foregoing stray light measurement system and method, the screen can be a penetrating screen and the projection device and the optical system to be tested are respectively disposed on opposite sides of the penetrating screen, and the cymbal constitutes a penetration. Measurement architecture. The screen and the screen can also be a reflective screen, and the projection device and the photon to be measured, "not disposed on the same side of the reflective screen, constitute an anti-radiation measurement architecture. In a preferred embodiment, the screen is a white paper. The system can be a projector with a telescopic lens for selectively adjusting the size of the projected target. In a preferred embodiment, the telescopic lens is A neutral light-passing film (10) can be installed to increase the image contrast of the projector, so that the required contrast can be easily compensated without using a high-contrast high-priced projector. The control device is coupled to the standby (four) The system calculates and obtains the stray light of the optical system to be tested, and can be lightly coupled to the projection device, and selectively adjusts the projected dry pattern, the size of the dry area, and the length of the postal zone, and 19382 9 200821564,. > : At least one of the pre-sizes of the original area, preferably, the control skirt is a computer, and the projection change of the projection apparatus is easily controlled. The amount of stray light provided by the present invention is different from the conventional technology. Measurement System and Zhuang- mainly use the technical shadow device to project the light source and the standard leather. Because of the use of the projection clothes, the light source and the standard bag can be used together, so the cost of the light source, the uniformity of the illuminance of the scalar, and the system can be simplified. Therefore, it can be seen that the present invention has overcome the disadvantages of the prior art and has a high industrial utilization value. _ [Embodiment] / The following describes a specific embodiment of the present creation in order to make the technology have Generally, the knowledger can easily understand the technical features and achieve the efficacy of the creation. y As shown in Fig. 2, the present invention provides a stray light measurement system i, which is applied to the measurement of stray light of the optical system 2 to be tested. The stray light measurement system 1 includes: a screen 配置 disposed directly in front of the optical system 2 to be tested, a projection device 13 disposed directly in front of the screen 以 to project a light source and a target, and coupled to the optical device to be tested The system 2 calculates the stray light=control device 15 by calculation. The optical system 2 to be tested is exemplified by an optical lens applied to, for example, a camera, but it is not limited thereto. The optical system for the problem that the external stray light causes poor image quality is the optical system 2 for measuring the stray light obtained by the present invention. The screen 11 is disposed directly in front of the optical system 2 to be tested for The projection light source and the target are captured by the optical system 2 to be tested. 19832 10 200821564, In the embodiment, the screen u system 13 and the optical system 2 to be tested are respectively disposed at the side of the field. A penetrating measurement architecture. In addition, due to the implementation of spurious:: time measurement, the source of light required on the target must be in all directions: ... light source, and generally white paper has a penetrability characteristic, and the surface It has uniform particles for reflecting light, and is suitable for the effect of reflecting or transmitting light in the illumination period of the light source for uniform illumination in all directions. Therefore, the screen 11 can be selected with a white paper. The projection device 13 is disposed directly in front of the screen i n, and the spacer screen 11 is opposite to the optical system 2 to be tested for projecting a light source and a target to the screen U for the optical system to be tested. 2 capture imaging. In the present embodiment, the projection device 13 is a projector having a telescopic lens 131 for selectively adjusting the projection distance, that is, equivalent to adjusting the size of the projected stem. At the same time, since the image contrast of the projector is about 2020, it is not enough for the 10000:1 or more required by the international specification jS09358 for stray light measurement, so it can be used in the telescopic lens 131. A neutral filter (NDFilter) 133 is mounted to increase the image contrast of the projector, so that the required contrast can be easily compensated without using a high-contrast high-priced projector. The control device 15 is coupled to the optical system 2 to be tested, and can be coupled with a sensing lr 151 for calculating the intensity change according to the intensity change of the central position of the imaging surface captured by the optical system 2 to be tested. The stray light of the optical system 2 is measured. In this embodiment, the control device 15 is a computer, and is coupled to the projection device in addition to being coupled to the optical system 2 to be tested to calculate the stray light of the light to be measured 19382 11 200821564. 13. Selectively adjust at least one of the projected target pattern, the size of the target area, and the pre-size of the light source area. Since the control device 15 is implemented by a computer, it can be easily controlled by a common software package. The projection device 13 performs the aforementioned projection change. Compared with the front measurement system, the present invention also provides a method for measuring the stray light measurement, which is also referred to as shown in FIG. 2, which includes: configuring a screen n in front of the system to be measured; A projection device 13 is disposed in front of the screen n to project a light source and a standard bar to the screen 1 for imaging, and to integrate a control device 15 to. The optical system 2 to be tested is calculated to obtain the light of the optical system 2 to be tested. In addition, in the stray light measurement system or method proposed by the present invention, the flow and algorithm for qualitative measurement or quantitative measurement are not particularly specific, and further explanation is provided. • Xin First, in the qualitative measurement section, respectively, the projection device 13 is controlled to produce a pattern as shown in FIG. 1A or FIG. 1B, and then the intensity changes of the center position on the imaging surface of the system 2 to be tested are separately recorded. , Reuse the formula (- to find the stray light coefficient (VGI or vgIb) of the system to be tested. VGl(orVGIB)-|i^xl〇〇〇/〇

White 式(一) 在定量量測部份,控制投影裝置13產生如第1C 圖樣,然後.分別記錄待測光學系統2之成像面上中心3 19832 12 200821564, 的強度變化,再利用式(二)來求出待測系統在不同視角下 的雜散光(GSF或GSFR)。 GSF(orGSFR)= intensity^>pecifkati〇n viewangle orjmageheight total image flux of source χΙ〇〇% 式(二) 由於前料性量測蚊量量測之計算公式係源自國 際規範IS09358,並非本發明所首創,應為所屬技術領域 中具有通常知識者所能理解並據以實施者,故不贅言詳述 •,。而針對前述利用中性濾光片133來彌補以增加該投: 裝置=影像對比的設計中,以採用投影機影像對比為Η 來計异,則所使用的中性濾光片規格肋可依式(三)計算 出來。 ίο4 <x^iom.......... ..........式(三) 在實際應用上,只要事先確認中性濾光片133的穿透 ⑩率,録最後做雜光計算時將中性滤光片133的規格帶入 式(一)或式(二),便可以在無法提升投影裝置13對比下 達到測試時對標靶影像對比的要求。 多二實施例— 月^閱第3圖所示,本實施例與第一實施例之差異僅 在於投影裝置之配置位置不同,其餘相關屏幕、㈣光學 =、、、先以及控制裝置之設計均相同,因此基於相同之設計與 义化再重複贅述,以下僅說明其相異處,特此敘明。 第圖所示’本發明提供一種雜散光量測系統3, 19832 13 200821564、 係供應用於待測光學系統2之雜散光量測,該雜散光量測 系統3係包括··配置於該待測光學系統2正前方之屏幕 31、配置於該屏幕31正前方以投射光源與標靶之投影裝 置33、以及耦合至該待測光學系統2以計算求得雜散光 之控制裝置35。 於本實施例中,該屏幕31係為一反射式屏幕,且該 投影裝置33與待測光學系統2分別配置於該屏幕31之同 一側,俾構成一種反射式之量測架構。該投影裝置犯係 馨為一具有伸縮鏡頭331之投影機,以供選擇性的調整投影 距離,亦即相當於調整所投射標靶之區域大小。同時,亦 可於該伸縮鏡頭331上安裝一中性濾光片(ND Filter)333,以增加該投影機之影像對比,故可輕易彌補 所需之對比度,無須使用高對比度之高價投影機。該控制 裝置35係耦合至該待測光學系統2,可搭配一感測器 151,用以根據該待測光學系統2所擷取成像之成像面上 中心位置的強度變化,計算求得該待測光學系統2之雜散 '光,同時,復耦合至該投影裝置33,俾選擇性的調整所 投影之標靶圖樣、標靶區域大小、以及光源區預大小之其 中至少一者,由於採用電腦實施該控制裝置35,故可透 過常見的套裝軟體而輕易地控制該投影裝置33進行前述 之投影變化。…· · … · 《 由於本發明所提供之雜散光量測系統及方法中可利 用軟體達成用移動標革巴以模擬不同視角的光源使用之變 化’因此播須配置移動平台而縮小量測系統所需空間與成 19832 14 200821564, t :::同時’因採用投影裝置同時兼具光源娜的 降低光源的成本、實現照度均句性、以及簡 構,並可剌於穿透式歧射式量㈣構。由此 可知,本發明已相對克服先前技術之缺 業利用價值。 只八阿度之產 上述實施例僅例示性說明本發明之原理及其功效,^ 非用於限制本發明。任何所屬技術領域中具有通常知 均可在不違背本發明之精神及範•下,對上述實 = 修飾與改變。因此,本發明之制保 庫 申請專利範圍所列。 應如後述4 【圖式簡單說明】 第1Α圖及第1C圖分別顯示雜散光量測中進一〜 ^與定量量測所需在物空間中的圖樣,其中第 圖係顯不定性量測所需之_樣,第lc圖係顯示 測所需之圖樣; 里 統之第一實施例 統之第二實施例 _ 第2圖係顯示本發明雜散光量測系 系統架構示意圖;以及 第3圖係顯示本發明雜散光量測系 系统架構示意圖。 【主要元件符號說明】 X 11 雜散光量測系統 屏幕 13 投影裝置 131 伸縮鏡頭 19832 15 200821564,, t 133 中性濾、光片 15 控制裝置 151 感測器 2 待測光學系統 3 雜散光量測系統 31 屏幕 33 投影裝置 331 伸縮鏡頭 333 中性濾光片 35 控制裝置 351 感測器 16 19832White (1) In the quantitative measurement section, the control projection device 13 generates a pattern as shown in the 1C, and then records the intensity change of the center of the imaging surface of the optical system 2 to be tested 3, 19, 832, and 12, 21, 21, respectively, and reuses the equation (2). ) to find the stray light (GSF or GSFR) of the system under test at different viewing angles. GSF(orGSFR)=intensity^>pecifkati〇n viewangle orjmageheight total image flux of source χΙ〇〇% (2) The formula for calculating the amount of mosquitoes measured by the forehead is derived from the international standard IS09358, not the present invention. The first creation should be understood by the people with ordinary knowledge in the technical field and implemented by them, so it is not necessary to elaborate. For the above-mentioned design using the neutral filter 133 to increase the projection: device=image contrast, the neutral filter specification rib can be used according to the contrast of the projector image. Equation (3) is calculated. Οο^ <x^iom...................... (3) In practical applications, as long as the penetration rate of the neutral filter 133 is confirmed in advance, When the last stray light calculation is performed, the specification of the neutral filter 133 is brought into the formula (1) or (2), so that the comparison of the target image can be achieved when the projection device 13 cannot be lifted. More than two embodiments - as shown in Fig. 3, the difference between this embodiment and the first embodiment is only that the arrangement positions of the projection devices are different, and the rest of the related screens, (4) optical =, ,, and the design of the control device are The same, therefore, based on the same design and deconstruction, the following is only a description of the differences, and is hereby described. The present invention provides a stray light measurement system 3, 19832 13 200821564, which supplies a stray light measurement for the optical system 2 to be tested, and the stray light measurement system 3 includes A screen 31 directly in front of the optical measuring system 2, a projection device 33 disposed directly in front of the screen 31 to project a light source and a target, and a control device 35 coupled to the optical system 2 to be tested to calculate stray light are calculated. In this embodiment, the screen 31 is a reflective screen, and the projection device 33 and the optical system 2 to be tested are respectively disposed on the same side of the screen 31, and constitute a reflective measurement architecture. The projection device is a projector with a telescopic lens 331 for selectively adjusting the projection distance, which is equivalent to adjusting the size of the projected target. At the same time, a neutral filter (ND Filter) 333 can be mounted on the telescopic lens 331 to increase the image contrast of the projector, so that the required contrast can be easily compensated without using a high-contrast high-priced projector. The control device 35 is coupled to the optical system 2 to be tested, and can be coupled with a sensor 151 for calculating the intensity of the center position of the imaged surface on which the optical system 2 is to be imaged. The stray light of the optical system 2 is simultaneously coupled to the projection device 33, and selectively adjusts at least one of the projected target pattern, the size of the target region, and the pre-size of the light source region. Since the computer implements the control device 35, the projection device 33 can be easily controlled to perform the aforementioned projection change through a common software package. ...······································································································· The required space is at the same time as 19382 14 200821564, t ::: 'Because of the use of the projection device, the cost of the light source is reduced, the illuminance is uniform, and the structure is simple, and can be used in a transmissive type. Quantity (four) structure. Thus, it can be seen that the present invention has overcome the deficiencies of the prior art. The present invention is only illustrative of the principles of the invention and its efficacy, and is not intended to limit the invention. Any of the above-mentioned real modifications and changes can be made without departing from the spirit and scope of the invention. Therefore, the warranty library of the present invention is listed in the patent application scope. It should be as follows. [Simplified description of the diagram] The first diagram and the 1C diagram respectively show the patterns in the space of the stray light measurement, which are required to be measured in the object space, where the figure shows the uncertainty measurement. The lc diagram shows the pattern required for the measurement; the second embodiment of the first embodiment of the system is shown in FIG. 2 is a schematic diagram showing the architecture of the stray light measurement system of the present invention; and FIG. The schematic diagram of the architecture of the stray light measurement system of the present invention is shown. [Main component symbol description] X 11 Stray light measurement system screen 13 Projection device 131 Telescopic lens 19382 15 200821564,, t 133 Neutral filter, light film 15 Control device 151 Sensor 2 Optical system to be tested 3 Stray light measurement System 31 Screen 33 Projection device 331 Telescopic lens 333 Neutral filter 35 Control device 351 Sensor 16 19832

Claims (1)

200821564, 十、申請專利範固: 係供應用於待測光學系統之雜 1 · 一種雜散光量測系統 散光置測’其包括·· 屏幕’係配置於該待測光學系統之正前方; 投影裝置’係配置於該屏幕之正前方,用以投射 ^源與標乾至該屏幕,俾供該待測光學系統擷取成 像;以及 麵…>/工制衣置’係至少_合至該待測光學系統,用以 •計算求得該待測光學系統之雜散光。 2. 如申請專利範圍第i項之雜散光量測系統,·其中,該 屏幕係—牙透式屏幕,且該投影裝置與待測光學系統 分別配置於該穿透式屏幕之相對兩側。 3. 如申請專利範圍第1項之雜散光量測系統,其中,該 屏幕係-反射式屏幕,且該投影裝置與待測光學系統 分別配置於該反射式屏幕之同一侧。 如申請專利範圍帛i項之雜散光量測系统,其中,該 屏幕係一白紙。 5·=申請專利範圍第1項之雜散光量測系統,其中,該 投影裝置係一具有伸縮鏡頭之投影機,以供選擇性的 調整所投射標靶之區域大小。 6·如申請專利範圍第5項之雜散光量測系統,其中,該 伸縮鏡頭復安裝一中性濾光片(ND Filter),以增加 該投影機之影像對比。 7·如申請專利範圍第1項之雜散光量測系統,其中,該 17 19832 200821564 控制農置復耦合至該投影裝置,俾選擇性的調整所投 衫之標靶圖樣、標靶區域大小、以及光源區預大小之 其中至少一者。 8.如申請專利範圍第7項之雜散光量測系統,其中,該 控制裝置係一電腦。 9 —搞 • 種雜散光量測方法,係供應用於待測光學系統之雜 散光量測,其包括: 於該待測光學系統之正前方配置一屏幕; _ 於該屏幕之正前方配置一投影裝置,以投射光源 與標靶至該屏幕,供該待測光學系統擷取成像;以及 輕合一控制裝置至該待測光學系統,以計算求得 該待測光學系統之雜散光。 1〇·如申請專利範圍第9項之雜散光量測方法,其中,該 屏幕係一穿透式屏幕,且該投影裝置與待測光學系統 刀別配置於該穿透式屏幕之相對兩侧。 、_U·如申請專利範圍第9項之雜散光量測方法,其中,該 、 屏幕係一反射式屏幕,且該投影裝置與待測光學系統 分別配置於該反射式屏幕之同一側。 12·如申凊專利範圍第9項之雜散光量測方法,其中,該 屏幕係一白紙。 3·如申睛專利範圍第9項之雜散光量測方法,其中,該 投影裝置係一具有伸縮鏡頦之投影機,以供選擇性的 調整所投射標靶之區域大小。 14.如申請專利範圍第〗3項之雜散光量測方法,其中, 19832 18 200821564' 該伸縮鏡頭復安裝-中性據光片⑽Fmer),以增 加該投影機之影像對比。 曰 15. 如申請專利範圍第9項之雜散光量測方法,其中,該 =制裝置㈣合至該投料置,俾選擇性的調整所= 影之標靶圖樣、標靶區域大小、以及光源區預大小之 其中至少一者。 16. 如申請專利範圍第15項之雜散光量測方法,其中, 該控制裝置係一電腦。 19832 19200821564, X. Application for patents: Supply of impurities for the optical system to be tested 1 · A stray light measurement system astigmatism test 'It includes · · Screen ' is placed directly in front of the optical system to be tested; Projection The device is disposed directly in front of the screen for projecting the source and the standard to the screen, and for capturing the image by the optical system to be tested; and the surface...>/manufacturing device is at least _ The optical system to be tested is used to calculate the stray light of the optical system to be tested. 2. The stray light measurement system of claim i, wherein the screen is a tooth-operated screen, and the projection device and the optical system to be tested are respectively disposed on opposite sides of the penetrating screen. 3. The stray light measurement system of claim 1, wherein the screen is a reflective screen, and the projection device and the optical system to be tested are respectively disposed on the same side of the reflective screen. For example, the stray light measurement system of the patent application 帛i item, wherein the screen is a white paper. 5·=The stray light measurement system of claim 1 of the patent scope, wherein the projection device is a projector having a telescopic lens for selectively adjusting the size of the projected target. 6. The stray light measurement system of claim 5, wherein the telescopic lens is further provided with a neutral filter (ND Filter) to increase the image contrast of the projector. 7. The stray light measurement system of claim 1, wherein the 17 19832 200821564 controls the agricultural coupling to the projection device, and selectively adjusts the target pattern of the shirt, the size of the target area, And at least one of the pre-sizes of the light source zone. 8. The stray light measurement system of claim 7, wherein the control device is a computer. 9 — Engaged with a stray light measurement method, which supplies a stray light measurement for an optical system to be tested, which includes: Configuring a screen directly in front of the optical system to be tested; _ Configuring a front side of the screen a projection device for projecting a light source and a target to the screen for capturing the image to be tested; and coupling the control device to the optical system to be tested to calculate the stray light of the optical system to be tested. 1. The method of measuring stray light according to claim 9 wherein the screen is a penetrating screen, and the projection device and the optical system to be tested are disposed on opposite sides of the penetrating screen. . The method of measuring the stray light of the ninth aspect of the patent application, wherein the screen is a reflective screen, and the projection device and the optical system to be tested are respectively disposed on the same side of the reflective screen. 12. The method of measuring stray light according to item 9 of the patent application scope, wherein the screen is a white paper. 3. The method of measuring stray light in item 9 of the scope of the patent application, wherein the projection device is a projector having a telescopic mirror for selectively adjusting the size of the projected target. 14. For the stray light measurement method of claim 3, wherein 19832 18 200821564' retractable lens re-installation-neutral light film (10) Fmer) is used to increase the image contrast of the projector.曰 15. The method for measuring stray light according to item 9 of the patent application, wherein the device (4) is connected to the feeding device, and the selective adjustment is performed; the target pattern of the shadow, the size of the target area, and the light source At least one of the pre-sizes. 16. The method of measuring stray light according to item 15 of the patent application, wherein the control device is a computer. 19832 19
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102928385A (en) * 2012-11-26 2013-02-13 中国科学院长春光学精密机械与物理研究所 Portable stray light detection device with inclined illumination structure
TWI407245B (en) * 2008-05-16 2013-09-01 Hon Hai Prec Ind Co Ltd Camera lens length measuring system and measuring method thereof
CN103983433A (en) * 2014-03-26 2014-08-13 歌尔声学股份有限公司 Testing tool and testing method for stray light of camera lens

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407245B (en) * 2008-05-16 2013-09-01 Hon Hai Prec Ind Co Ltd Camera lens length measuring system and measuring method thereof
CN102928385A (en) * 2012-11-26 2013-02-13 中国科学院长春光学精密机械与物理研究所 Portable stray light detection device with inclined illumination structure
CN103983433A (en) * 2014-03-26 2014-08-13 歌尔声学股份有限公司 Testing tool and testing method for stray light of camera lens

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