TW200815571A - Polishing composition and polishing method - Google Patents

Polishing composition and polishing method Download PDF

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Publication number
TW200815571A
TW200815571A TW96121066A TW96121066A TW200815571A TW 200815571 A TW200815571 A TW 200815571A TW 96121066 A TW96121066 A TW 96121066A TW 96121066 A TW96121066 A TW 96121066A TW 200815571 A TW200815571 A TW 200815571A
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Taiwan
Prior art keywords
honing
composition
acid
insulating film
benzotriazole
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TW96121066A
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Chinese (zh)
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Tetsuya Kamimura
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Fujifilm Corp
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Publication of TW200815571A publication Critical patent/TW200815571A/en

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Abstract

The present invention provides a polishing composition used, in a method for manufacturing a semiconductor device, to chemically mechanically polish the insulation film of a body to be polished that includes embedded wiring, via a barrier metal layer, on an insulation film having an organic siloxane structure and a relative dielectric constant of 3.0 or less, the polishing composition comprising colloidal silica particles, a benzotriazole compound and a primary amino alcohol represented by the following formula (I): NH2-R1-OH and having a pH within the range of 7 to 10; and a polishing method using the polishing composition. In formula (I), R1 represents an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

Description

200815571 九、發明說明: 【發明所屬之技術領域】 本發明係關於半導體裝置在硏磨加工時,進行化學機 械平坦化之硏磨方法及硏磨用組成物。 【先前技術】 、 關於以半導體積體電路(以下述爲LSI)爲代表之半導 體裝置之開發,爲了小型化·高速化,近年已要求藉由配線 之微細化與積層化的高密度化·高積體化。對於LSI之層間 絶緣膜,爲了 LSI之高速化,需求配線間容量少之電容率 低的材料。 以往’使用Si02作爲半導體裝置的層間絶緣膜材料, 電容率爲約3 . 8〜4.2。但是,隨著線幅變得狭窄,層間絶 緣膜材料之電容率亦必須變低,例如線幅13 〇nm的元件, 必須爲電容率約2 · 5〜3.0的材料。 作爲用來形成層間絶緣膜之低電容率絶緣膜(以下稱 爲Low_k膜)的材料,已知Si0C系材料(例如含複數個 Si-C、或Si-H鍵之SiOC)、MSQ等有機-無機複合(hybrid) 系材料。 具體而言,作爲用來形成電容率之絶緣膜的材料,有 SiOC 系之 HSG-R7(日立化成工業)、BLACKDIAM〇ND (Applied Materials,lnc)等 〇 該等Low-k膜爲了 LSI之微細化,平坦化爲必要之要 求。 將Low-k膜予以平坦化之方法,特開2〇〇〇_28625 5號 200815571 公報中揭示使用cMP技術之平坦化方法,即,用氧化鈽粒 子作爲硏磨粒進行硏磨之方法。此處,CMP爲化學機械硏 磨(Chemical Mechanical Polishing)的略稱,通常係於圓形 硏磨定盤(臺板 platen)上貼付硏磨墊’用硏磨用組成物浸 泡硏磨墊表面,使墊與基板(晶圓 wafer)表面押付,以從 基板裏面施加預定壓力(硏磨壓力)之狀態,使硏磨定盤及 基板雙方旋轉,藉由發生機械摩擦進行被硏磨面之表面平 坦化。 但是,用氧化鈽粒子作爲硏磨粒之硏磨方法的硏磨速 度慢,且金属配線間之絶緣膜有必要以上之硏磨,容易發 生複數個配線金属面表面形成碟狀凹部之現象(腐蝕 erosion) 〇 隨著LSI微細化·積層化之進展,爲了 LSI之高速化, 將層間絶緣膜予以低電容率化,以降低配線間容量係爲必 要。 然而,以往該Low-k膜之平坦化花費時間長,且亦會 發生腐蝕。 本發明係有鑑於上述習知技術之問題點,以達成以下 目的作爲課題。 即,本發明係以提供硏磨用電容率3.0以下之材料所 形成低電容率之絶緣膜(Low-K膜)時,硏磨速度快,且可 抑制腐蝕之硏磨用組成物、及使用該硏磨用組成物之硏磨 方法作爲目的。 【發明內容】 200815571 鑑於上述情形,本發明人等進行鑽硏探討,發現藉由 使用具有特定組成之硏磨用組成物的硏磨方法可解決上述 問題,因而完成本發明。 即,本發明爲藉由下述手段而達成。 &lt;ι&gt; 一種硏磨用組成物,其係於半導體裝置之製造方 法中,用於化學機械硏磨被硏磨體的絶緣膜之硏磨用組成 物,含有膠態二氧化矽粒子、苯并三唑化合物及下式(I)所 示之一級胺基醇,且pH爲7〜10之範圍,其中該硏磨體係 包括於具有有機矽氧烷構造之電容率3以下的絶緣膜透過 屏障金屬層之埋入配線, NH2-R1-OH 式(I) [式(I)中、Ri係表示脂肪族烴基或芳香族烴基]。 &lt;2&gt;如上述&lt;1&gt;之硏磨用組成物,其中該膠態二氧化矽 粒子之濃度爲〇 . 5〜1 5質量%。 &lt;3&gt;如上述&lt;1&gt;或&lt;2&gt;之硏磨用組成物,其中苯并三唑 化合物係選自於1,2,3-苯并三唑、5,6-二甲基-1,2, 3-苯并三唑、1-(1,2-二羧基乙基)苯并三唑、1-[N,N-雙(羥 基乙基)胺基甲基]苯并三唑及1-(羥基甲基)苯并三唑的1 種以上之化合物。 &lt;4&gt; 一種硏磨方法,其特徵爲將硏磨用組成物供給於 硏磨定盤上之硏磨墊,一邊使該硏磨墊與被硏磨體之絶緣 膜接觸,一邊使該硏磨定盤旋轉使對接觸面做相對運動來 進行硏磨之硏磨方法,該絶緣膜爲上述被硏磨體之絶緣 膜,且該硏磨用組成物係如申請專利範圍第1項之硏磨用 200815571 組成物,該硏磨體爲於具有有機矽氧烷構造之電容率3.0 以下的絶緣膜,透過屏障金屬層埋入配線所構成。 &lt;5&gt;如上述&lt;4&gt;之硏磨方法,其中使硏磨墊與被硏磨體 之絶緣膜接觸時的荷重爲〇·69〜21.6KPa。 &lt;6&gt;如上述&lt;4&gt;之硏磨方法,其中將硏磨用組成物供給 於硏磨定盤上之硏磨墊時,供給流量爲0.03 5〜0.6 Oml/min • cm2 ° 〔發明效果〕 根據本發明,可提供一種硏磨用電容率3.0以下之材 料所形成低電容率之絶緣膜(Low-K膜)時,硏磨速度快, 且可抑制腐蝕之硏磨用組成物;及一種使用該硏磨用組成 物之硏磨方法。 【實施方式】 〔實施發明之最佳形態〕 本發明之硏磨用組成物爲:用於半導體裝置製造中, 透過屏障金屬層,於具有有機矽氧烷構造之電容率3.0以 下的Low-k膜形成埋入配線時,化學機械硏磨用之硏磨用 組成物,其特徵爲含有膠態二氧化矽粒子、苯并三唑化合 物及下式(I)所示之一級胺基醇,pH爲7〜10之範圍。 NH2-Ri-〇H 式(I) [式(I)中、R!係表示烴基或芳香環。] 以下,依序說明本發明之硏磨用組成物的構成要素。 〔低電容率絶緣膜〕 本發明中之絶緣膜係具有有機矽氧烷構造之電容率 200815571 3·0以下的低電容率絶緣膜(以下稱爲「本發明之Low_K 膜」)。 作爲用於形成上述低電容率絶緣膜之材料,可使用能 形成具有有機矽氧烷構造之電容率3.0以下的絶緣膜之材 料,並無特別限定。[Technical Field] The present invention relates to a honing method and a honing composition for chemical mechanical planarization of a semiconductor device during honing processing. [Prior Art] In the development of a semiconductor device including a semiconductor integrated circuit (hereinafter referred to as LSI), in order to reduce the size and speed of the semiconductor device, it has been required to increase the density and thickness of the wiring in recent years. Integrated. In the LSI interlayer insulating film, in order to increase the speed of the LSI, a material having a low capacitance ratio with a small wiring capacity is required. In the past, the SiO 2 was used as the interlayer insulating film material of the semiconductor device, and the permittivity was about 3.8 to 4.2. However, as the line width becomes narrow, the permittivity of the interlayer insulating film material must also become low. For example, a component having a line width of 13 〇 nm must be a material having a permittivity of about 2 · 5 to 3.0. As a material of a low permittivity insulating film (hereinafter referred to as a Low_k film) for forming an interlayer insulating film, a SiOC-based material (for example, SiOC containing a plurality of Si-C or Si-H bonds), an organic compound such as MSQ, and the like are known. Inorganic composite materials. Specifically, as a material for forming an insulating film having a permittivity, there are an OSiO-based HSG-R7 (Hitachi Chemical Industry Co., Ltd.), a BLACKDIA M〇ND (Applied Materials, lnc), etc., and these Low-k films are fine for LSI. Flattening is a necessary requirement. In the method of flattening a Low-k film, a flattening method using a cMP technique, that is, a method of honing using cerium oxide particles as honing particles, is disclosed in Japanese Laid-Open Patent Publication No. Hei. No. Hei. Here, CMP is an abbreviation for Chemical Mechanical Polishing, which is usually applied to a circular honing plate (platen platen) and immersed in the surface of the honing pad with a honing composition. The surface of the pad and the substrate (wafer wafer) is post-applied to apply a predetermined pressure (honing pressure) from the inside of the substrate to rotate both the honing plate and the substrate, and the surface of the honed surface is flattened by mechanical friction. Chemical. However, the honing method using the cerium oxide particles as the honing granules is slow, and the insulating film between the metal wirings is necessary to be honed, and it is easy to cause the disk-shaped concave portions to be formed on the surface of the plurality of wiring metal surfaces (corrosion) Erosion 〇 With the progress of LSI miniaturization and stratification, in order to increase the speed of LSI, it is necessary to reduce the capacitance of the interlayer insulating film to reduce the capacity between wirings. However, in the past, the flattening of the Low-k film took a long time and corrosion occurred. The present invention has been made in view of the above problems of the prior art, and has achieved the following objects. In other words, the present invention provides a low-density insulating film (Low-K film) which is formed by using a material having a permittivity of 3.0 or less for honing, and has a high honing speed and a composition for honing which can suppress corrosion and use. The honing method of the honing composition is aimed at. SUMMARY OF THE INVENTION In view of the above circumstances, the inventors of the present invention conducted a drill collar and found that the above problem can be solved by a honing method using a composition for honing having a specific composition, and thus the present invention has been completed. That is, the present invention has been achieved by the following means. &lt;ι&gt; A composition for honing, which is a honing composition for chemical mechanical honing of an insulating film of a honed body, comprising colloidal cerium oxide particles, benzene, in a method of manufacturing a semiconductor device And a triazole compound and a first-order amino alcohol represented by the following formula (I), and having a pH of from 7 to 10, wherein the honing system is included in an insulating film permeation barrier having a permittivity of 3 or less having an organic decane structure Buried wiring of metal layer, NH2-R1-OH Formula (I) [In the formula (I), Ri represents an aliphatic hydrocarbon group or an aromatic hydrocarbon group]. <2> The honing composition according to the above <1>, wherein the concentration of the colloidal cerium oxide particles is 〜 5 to 15% by mass. &lt;3&gt; The honing composition according to the above &lt;1&gt; or &lt;2&gt;, wherein the benzotriazole compound is selected from the group consisting of 1,2,3-benzotriazole and 5,6-dimethyl -1,2,3-benzotriazole, 1-(1,2-dicarboxyethyl)benzotriazole, 1-[N,N-bis(hydroxyethyl)aminomethyl]benzotriene One or more compounds of azole and 1-(hydroxymethyl)benzotriazole. &lt;4&gt; A honing method characterized in that a honing composition is supplied to a honing pad on a honing plate, and the honing pad is brought into contact with an insulating film of the honing body to make the enamel A grinding method in which the grinding disc rotates to make a relative movement to the contact surface, and the insulating film is the insulating film of the above-mentioned honed body, and the honing composition is as in the first item of the patent application scope. The composition of 200815571 is used to form an insulating film having a permittivity of 3.0 or less in an organic siloxane structure and is buried in a barrier metal layer. &lt;5&gt; The honing method according to the above <4>, wherein the load when the honing pad is brought into contact with the insulating film of the honed body is 〇·69 to 21.6 KPa. &lt;6&gt; The honing method according to the above <4>, wherein when the honing composition is supplied to the honing pad on the honing plate, the supply flow rate is 0.03 5 to 0.6 Oml/min • cm 2 ° [Effects] According to the present invention, it is possible to provide a honing composition which has a high honing rate and can suppress corrosion when an insulating film (Low-K film) having a low permittivity formed by a material having a permittivity of 3.0 or less is used for honing; And a honing method using the honing composition. [Embodiment] [Best Mode for Carrying Out the Invention] The composition for honing of the present invention is a low-k having a permittivity of 3.0 or less in an organic germanium oxide structure, which is used for transmission of a semiconductor device in a semiconductor device. When the film is formed into a buried wiring, the composition for honing for chemical mechanical honing is characterized by containing colloidal cerium oxide particles, a benzotriazole compound, and a first-order amino alcohol represented by the following formula (I), pH It is a range of 7 to 10. NH2-Ri-〇H Formula (I) [In the formula (I), R! represents a hydrocarbon group or an aromatic ring. Hereinafter, the constituent elements of the honing composition of the present invention will be described in order. [Low permittivity insulating film] The insulating film of the present invention has a low permittivity insulating film (hereinafter referred to as "Low_K film of the present invention" having a permittivity of an organic siloxane structure of 200815571 3 or less. As a material for forming the above-described low-permittivity insulating film, a material capable of forming an insulating film having a permittivity of 3.0 or less in the organic siloxane structure can be used, and is not particularly limited.

具體而言’較佳爲具有式(II)之有機矽氧烷構造的 SiOC(例如,含有複數個Si-c、或Si-H鍵之SiOC)、MSQ 等有機-無機複合系材料。Specifically, it is preferably an organic-inorganic composite material such as SiOC having an organic siloxane structure of the formula (II) (for example, SiOC containing a plurality of Si-c or Si-H bonds) or MSQ.

上述式(II)中,R2表示氫原子、烴基或OR4,R3表示 烴基或〇R5。R4、R5係各自獨立地表示烴基。 上述式(II)中,作爲R2〜R5表示之烴基,可列舉脂肪 族烴基或芳香族烴基。In the above formula (II), R2 represents a hydrogen atom, a hydrocarbon group or OR4, and R3 represents a hydrocarbon group or hydrazine R5. R4 and R5 each independently represent a hydrocarbon group. In the above formula (II), examples of the hydrocarbon group represented by R2 to R5 include an aliphatic hydrocarbon group or an aromatic hydrocarbon group.

作爲可用來形成上述低電容率絶緣膜之材料,具體而 言,SiOC系可列舉HSG-R7(日立化成工業:2.8)、 BLACKDIAMOND(Applied Materials,Inc : 2.4-3.0)、 p-MTES(曰立開發:3.2)、Coral(Novellus Systems 5 Inc : 2.4-2.7)、Aurora(日本 AMS: 2.7),又,MSQ 系可列舉 OCDT-9(東京應化工業:2.7)、LKD-T200(JSR: 2·5-2·7)、 HOSP(Honey well Electronic Materials: 2.5)、HSG-RZ25(日 立化成工業:2.5)、OCLT-31(東京應化工業製:2.3)、 LKD-T400(JSR 製:2.0-2.2)、HSG-6211X(曰立化成工業製: 200815571 2.1)、ALCAP-S(旭化成工業製:1.8-2.3)、OCLT-77(東京應 化工業製:1.9-2.2)、HSG-6211X(日立化成工業製:2_4)、 811&amp;&amp;&amp;61:(^61(神戸製鋼所製:1.1-1.4)等,並不限定於該等。 可形成上述低電容率絶緣膜之材料可單獨使用1種, 亦可倂用複數種。此外,該等材料亦可爲具有微小空孔之 形態。 本發明中絶緣膜之形成方法,可以是電漿CVD、也可 以是旋轉塗布。 ^ 本發明中低電容率絶緣膜之電容率必須爲3.0以下, 低者爲較佳,特佳爲1.8〜2.8。 上述電容率爲1 · 8〜2 · 8之範圍時,本發明效果從顯著 的腐蝕抑制與硏磨速度提升而言爲較佳。 本發明中電容率,固體膜之電容率可使用水銀探針之 測定方法,設有配線之絶緣膜的電容率可藉由精密42 84 A LCR測定器予以測定。本發明中電容率之測定係採用該等 方法。 以往迄今,一般的誘電體材料爲電容率約3.8〜4.2之 材料。隨著線幅變得狭窄,層間絶緣膜材料之電容率亦必 須變低。例如線幅1 3 0 n m之元件,必須爲電容率約2.5〜 3.0之材料。關於低電容率之材料,通常係電容率爲約2.0 〜2.5。線幅90nm之元件爲誘電率小於2.4。 從該觀點而言,本發明之硏磨用組成物較佳爲使用比 13 0nm更細之配線幅的元件。 [硏磨用組成物] -10- 200815571 本發明之硏磨用組成物特徵爲含有(a)膠態二氧化@ 粒子、(b)苯并三唑化合物、及(c)上述式(I)所示之一級胺基 醇。 膠態二氧化矽粒子 本發明所使用之硏磨用組成物係含有膠態二氧化砍粒 子作爲構成成分。含有膠態二氧化矽粒子作爲硏磨粒子。 作爲上述膠態二氧化矽粒子之製作法,可以是例如將 Si(OC2H5)4、Si(sec-OC4H9)4、Si(OCH3)4、Si(OC4H9)4 之類 ^ 的矽醇鹽化合物藉由溶膠化凝.膠法加水分解而得。此種膠 態二氧化矽粒子的粒度分布爲非常的陡峻。 關於本發明中膠態二氧化矽粒子之平均粒徑,意指在 表示膠態二氧化矽粒子之粒徑與積算具有該粒徑之粒子數 之累積度數的関係之粒度累積曲線(度數分布曲線)中,累 積度數爲50%點的粒徑。上述膠態二氧化矽粒子之平均粒 徑係表示由動態光散乱法所得之粒度分布求出之平均粒 0 徑。求出上述粒度分布之測定裝置,可用例如堀場製作所 製 LB-500 等。 含有之膠態二氧化矽粒子的平均粒徑較佳爲 5〜 60nm,更佳爲5〜30nm。從達成充分硏磨力□工速度之目的 而言,較佳爲平均粒徑爲5nm以上之粒子。又,以在硏磨 加工中不發生過剩的摩擦熱爲目的時,平均粒徑較佳爲 6 Onm以下。 硏磨用組成物全質量中硏磨粒子之膠態二氧化矽粒子 的濃度,較佳爲0 · 5〜1 5質量%,更佳爲1〜1 〇質量%。以 -11- 200815571 達成充分硏磨加工速度爲目的時,濃度較佳爲0.5質量%以 上。又,以在硏磨加工中不發生過剩摩擦熱爲目的時,濃 度較佳爲10質量%以下。 又,本發明之硏磨用組成物可直接使用,或是以稀釋 形態使用,但在將硏磨用組成物稀釋使用的情況下,使用 時硏磨用組成物稀釋液中硏磨粒子濃度的較佳範圍係與組 成物中硏磨粒子濃度的較佳範圍相同。 〔苯并三唑化合物〕 本發明之硏磨用組成物含有苯并三唑化合物。 本發明中,作爲苯并三唑化合物,較佳爲選自於1,2,3-苯并三唑(BTA)、5,6-二甲基-1,2,3-苯并三唑(DBTA)、 1-(1,2-二羧基乙基)苯并三唑(DCEBTA)、1-[N,N_雙(羥基乙 基)胺基甲基]苯并三唑(HE ABTA)及1-(羥基甲基)苯并三唑 (HMBTA)之1種以上的化合物。 上述之中,更佳之苯并三哗化合物,可列舉5,6 -二甲 0 基·1,2,3-苯并三唑(DBTA)、1-(1,2-二羧基乙基)苯并三唑 (DCEBTA)、1-[N,N-雙(羥基乙基)胺基甲基]苯并三唑 (HEABTA)、1-(羥基甲基)苯并三唑(hmbTA)。 本發明所用之苯并三唑化合物係可單獨使用,亦可倂 用2種以上9 又,硏磨用組成物中上述苯并三唑化合物的濃度並無 特殊限制’但較佳爲0.01質量%以上、〇·2暂量%以下,更 佳爲0.05質量%以上、0.2質量%以下。 〔一級胺基醇〕 -12- 200815571 本發明之硏磨用組成物係含有式(I)所示之化合物。 NH2-Ri-〇H 式(I) [式(I)中、Ri係表示脂肪族烴基或芳香族烴基。] 上述式(1)中Ri所表示之脂肪族烴基,可列舉碳數1〜 15的脂肪族鏈狀或環狀構造之烴基,其中較佳爲具有碳數 2〜1 0之脂肪族鏈狀或環狀構造之烴基。 上述脂肪族鏈狀烴基,可列舉碳數1〜1 5的伸烷基(較 佳爲1〜12,更佳爲2〜8),該等亦可爲烷基、羥基、胺基、 羧基等予以置換。 上述脂肪族環狀烴基,可列舉例如、環丙烷、環丁烷、 環戊烷、環己烷、環庚烷、環辛烷、環壬烷、環癸烷、二 環己基、疒環己基、降冰片烷。 上述式(I)中^所表示之2價芳香族烴基,除了構成芳 香族烴之任意碳原子上的2個氫原子外,可列舉2價烴基。 上述芳香族烴,可列舉苯、萘、蒽。 該等2價芳香族烴基亦可爲烷基、羥基、胺基、羧基 等所置換。 上述一級胺基醇的較佳具體例示於下述表1。但本發 明並不受該等所限制。 -13 - 200815571 【表πSpecific examples of the material for forming the above-mentioned low-permittivity insulating film include HSG-R7 (Hitachi Chemical Co., Ltd.: 2.8), BLACKDIAMOND (Applied Materials, Inc: 2.4-3.0), and p-MTES. Development: 3.2), Coral (Novellus Systems 5 Inc: 2.4-2.7), Aurora (Japan AMS: 2.7), and MSQ series, OCDT-9 (Tokyo Chemical Industry: 2.7), LKD-T200 (JSR: 2) ·5-2·7), HOSP (Honey well Electronic Materials: 2.5), HSG-RZ25 (Hitachi Chemical Industry: 2.5), OCLT-31 (Tokyo Chemical Industry Co., Ltd.: 2.3), LKD-T400 (JSR system: 2.0) -2.2), HSG-6211X (Industrial Chemical Co., Ltd.: 200815571 2.1), ALCAP-S (Asahi Kasei Industrial Co., Ltd.: 1.8-2.3), OCLT-77 (Tokyo Chemical Industry Co., Ltd.: 1.9-2.2), HSG-6211X ( Hitachi Chemical Industrial Co., Ltd.: 2_4), 811 &amp;&amp;&amp; 61: (^61 (manufactured by Shinkan Steel Co., Ltd.: 1.1-1.4), etc., is not limited to these. The material for forming the above low-permittivity insulating film may be separately used. One type may be used, and a plurality of types may be used. Further, the materials may be in the form of fine pores. The method for forming the insulating film in the present invention may be plasma CVD or Therefore, in the present invention, the permittivity of the low permittivity insulating film must be 3.0 or less, and the lower is preferably, particularly preferably 1.8 to 2.8. When the above permittivity is in the range of 1 · 8 to 2 · 8 The effect of the present invention is preferably in terms of significant corrosion inhibition and honing speed improvement. In the present invention, the permittivity of the solid film can be measured by a mercury probe, and the permittivity of the insulating film provided with the wiring can be borrowed. It is measured by a precision 42 84 A LCR meter. The measurement of the permittivity in the present invention is carried out by using these methods. Conventionally, the conventional electric conductor material is a material having a permittivity of about 3.8 to 4.2. As the line width becomes narrow, The permittivity of the interlayer insulating film material must also be low. For example, a component with a line width of 130 nm must be a material having a permittivity of about 2.5 to 3.0. For a material with a low permittivity, the capacitance is usually about 2.0 to 2.5. The component having a line width of 90 nm has a dielectric constant of less than 2.4. From this viewpoint, the composition for honing of the present invention is preferably an element using a wiring strip which is finer than 130 nm. [Material for honing] -10- 200815571 Composition of honing of the present invention The product is characterized by containing (a) colloidal dioxide@particles, (b) a benzotriazole compound, and (c) a tertiary amino alcohol represented by the above formula (I). Colloidal cerium oxide particles The honing composition used in the present invention contains colloidal oxidized chopped particles as a constituent component. Contains colloidal cerium oxide particles as honing particles. The method for producing the colloidal ceria particles may be, for example, a bismuth alkoxide compound such as Si(OC2H5)4, Si(sec-OC4H9)4, Si(OCH3)4, or Si(OC4H9)4. It is obtained by solification, gelation and hydrolysis. The particle size distribution of such colloidal cerium oxide particles is very steep. The average particle diameter of the colloidal cerium oxide particles in the present invention means a particle size cumulative curve (degree distribution curve) indicating a relationship between the particle diameter of the colloidal cerium oxide particles and the cumulative number of the particles having the particle diameter. In the case, the cumulative degree is 50% of the particle size. The average particle diameter of the above colloidal ceria particles indicates the average particle diameter determined by the particle size distribution obtained by the dynamic light scattering method. For the measurement apparatus for obtaining the above-described particle size distribution, for example, LB-500 manufactured by Horiba, Ltd. can be used. The colloidal ceria particles contained have an average particle diameter of preferably 5 to 60 nm, more preferably 5 to 30 nm. From the viewpoint of achieving a sufficient honing work speed, particles having an average particle diameter of 5 nm or more are preferred. Further, in order to prevent excessive frictional heat from occurring during the honing process, the average particle diameter is preferably 6 Onm or less. The concentration of the colloidal cerium oxide particles of the honing particles in the total mass of the honing composition is preferably from 0.5 to 15% by mass, more preferably from 1 to 1% by mass. When the honing processing speed is achieved by -11-200815571, the concentration is preferably 0.5% by mass or more. Further, in the case where no excessive friction heat is generated during the honing process, the concentration is preferably 10% by mass or less. Further, the composition for honing of the present invention may be used as it is, or may be used in a diluted form, but in the case where the honing composition is diluted and used, the concentration of the honing particles in the boring composition diluent is used. The preferred range is the same as the preferred range of honing particle concentration in the composition. [Benzotriazole compound] The composition for honing of the present invention contains a benzotriazole compound. In the present invention, as the benzotriazole compound, it is preferably selected from the group consisting of 1,2,3-benzotriazole (BTA) and 5,6-dimethyl-1,2,3-benzotriazole ( DBTA), 1-(1,2-dicarboxyethyl)benzotriazole (DCEBTA), 1-[N,N-bis(hydroxyethyl)aminomethyl]benzotriazole (HE ABTA) and One or more compounds of 1-(hydroxymethyl)benzotriazole (HMBTA). Among the above, a more preferable benzotriazine compound is exemplified by 5,6-dimethylcarbonyl-1,2,3-benzotriazole (DBTA), 1-(1,2-dicarboxyethyl)benzene. And triazole (DCEBTA), 1-[N,N-bis(hydroxyethyl)aminomethyl]benzotriazole (HEABTA), 1-(hydroxymethyl)benzotriazole (hmbTA). The benzotriazole compound used in the present invention may be used singly or in combination of two or more. The concentration of the benzotriazole compound in the honing composition is not particularly limited, but is preferably 0.01% by mass. The above-mentioned, 〇·2 temporary amount % or less, more preferably 0.05% by mass or more and 0.2% by mass or less. [First-Oriented Amino Alcohol] -12- 200815571 The composition for honing of the present invention contains a compound represented by the formula (I). NH2-Ri-〇H Formula (I) [In the formula (I), Ri represents an aliphatic hydrocarbon group or an aromatic hydrocarbon group. The aliphatic hydrocarbon group represented by Ri in the above formula (1) may, for example, be an aliphatic chain or a cyclic hydrocarbon group having 1 to 15 carbon atoms, and preferably an aliphatic chain having 2 to 10 carbon atoms. Or a cyclic hydrocarbon group. The aliphatic chain hydrocarbon group may, for example, be an alkylene group having 1 to 15 carbon atoms (preferably 1 to 12, more preferably 2 to 8), and these may be an alkyl group, a hydroxyl group, an amine group, a carboxyl group or the like. Replace it. Examples of the aliphatic cyclic hydrocarbon group include cyclopropane, cyclobutane, cyclopentane, cyclohexane, cycloheptane, cyclooctane, cyclodecane, cyclodecane, dicyclohexyl, indole cyclohexyl, Norbornane. The divalent aromatic hydrocarbon group represented by the above formula (I) may be a divalent hydrocarbon group other than the two hydrogen atoms constituting any carbon atom of the aromatic hydrocarbon. Examples of the aromatic hydrocarbons include benzene, naphthalene and anthracene. These divalent aromatic hydrocarbon groups may be substituted with an alkyl group, a hydroxyl group, an amine group, a carboxyl group or the like. Preferred specific examples of the above primary amino alcohol are shown in Table 1 below. However, the present invention is not limited by the above. -13 - 200815571 [Table π

Ri A-1 CH2CH2 A-2 ch2ch2ch2 A-3 GH2CH2CH2GH2 A-4 CH2CH2CH2CH2CH2 A-5 ,,: .'-V..V . : * :· Ph(伸苯基:〇-) A-6 Ph(伸苯基:in-) A -7 Ph(伸苯基:p-) A-8 HNCH2CH2 &quot; A- 9 eH2GH2HNCH2CH2 A-10] A-11 ch(ch2ch2oh)ch2ch2 A-12 G(GH2CH20H)2CH2CH2 A-1 3 gh(ch2gh2ch2oh)gh2gh2gh2 A-14 C(CH2CH2CH20H)2CH2CH2CH2Ri A-1 CH2CH2 A-2 ch2ch2ch2 A-3 GH2CH2CH2GH2 A-4 CH2CH2CH2CH2CH2 A-5 ,,: .'-V..V . : * :· Ph (phenylene: 〇-) A-6 Ph Phenyl: in-) A -7 Ph (phenylene: p-) A-8 HNCH2CH2 &quot; A- 9 eH2GH2HNCH2CH2 A-10] A-11 ch(ch2ch2oh)ch2ch2 A-12 G(GH2CH20H)2CH2CH2 A- 1 3 gh(ch2gh2ch2oh)gh2gh2gh2 A-14 C(CH2CH2CH20H)2CH2CH2CH2

用於本發明之一級胺基醇可使用市售品、或是也可以 用合成。 可用於本發明之一級胺基醇係可以單獨使用,亦可倂 用2種以上。又,硏磨用組成物中一級胺基醇的濃度並無 特殊限制,但從提升硏磨速度與腐飩抑制之観點而言,較 佳爲0·01〜10質量%,更佳爲0·1〜5質量%。 〔pH〕 本發明之硏磨用組成物必須爲pH7.0〜1〇之範圍。本 發明之硏磨用組成物係藉由pH在該範圍內,而發揮提升硏 磨速度及腐蝕抑制之優良效果。 -14- 200815571 再者,本發明之硏磨用組成物的pH從提升硏磨速度及 腐蝕抑制之観點而言,較佳爲8 · 0〜1 0,特佳爲8.5〜1 0。 本發明中,爲了將上述pH諷整爲7.0〜10之範圍內, 可使用鹼、酸或緩衝劑。 上述鹼、酸或緩衝劑,較適合可列舉氨、氫氧化銨、 氫氧化四甲銨等有機氫氧化銨、及二乙醇胺、三乙醇胺與 三異丙醇胺等烷醇胺之類的非金屬鹼性劑;氫氧化鈉、氫 氧化鉀與氫氧化鋰等鹼金屬氫氧化物;硝酸、硫酸與磷酸 ® 等無機酸;碳酸鈉等碳酸鹽;磷酸三鈉等磷酸鹽;硼酸 鹽、四硼酸及羥基苯甲酸。特佳之鹼性劑可列舉氫氧化銨、 氫氧化鉀、氫氧化鋰、與氫氧化四甲銨等。 上述鹼、酸或緩衝劑的添加量,宜爲使硏磨用組成物 之pH維持在7.0〜10之範圍的量,於硏磨使用時,1L的 硏磨用組成物中,較佳爲 0.0 0 0 1 m ο 1〜1 . 0 m ο 1,更佳爲 0.0 03mol 〜0.5mol 〇 g 〔氧化劑〕 本發明之硏磨用組成物較佳爲含有可將金属氧化進行 硏磨之化合物(氧化劑)。 氧化劑,可列舉例如過氧化氫、過氧化物、硝酸鹽、 碘酸鹽、過碘酸鹽、次氯酸鹽、亞氯酸鹽、氯酸鹽、過氯 酸鹽、過硫酸鹽、亞鉻酸鹽、過錳酸鹽、臭氧水溶液、銀 (II)鹽與鐵(III)鹽,其中較佳爲使用過氧化氫。 鐵(ΠΙ)鹽,較佳爲使用無機鐵(III)鹽,如硝酸鐵(III)、 氯化鐵(III)、硫酸鐵(III)、與溴化鐵(III),及鐵(III)之有 200815571 機錯合物。 氧化劑之添加量,在1 L的硏磨用組成物中,較佳爲 O.Olmol 〜lmol,特佳爲 0.05mol 〜0.6mol。 〔有機酸〕 本發明中,硏磨用組成物更佳爲含有有機酸。 此處所說之有機酸爲與用於氧化金属之氧化劑構造相 異之化合物,不可以是包含作爲前述氧化劑機能的酸。此 處的酸係具有促進氧化、pH調整、作爲緩衝劑之作用。 ® 本發明中之有機酸,可適當地從以下群組中加以選擇。 即,甲酸、乙酸、丙酸、丁酸、戊酸、2 -甲基丁酸、 正己酸、3,3-二甲基丁酸、2-乙基丁酸、4-甲基戊酸、正庚 酸、2-甲基己酸、正辛酸、2-乙基己酸、安息香酸、乙醇 酸、水楊酸、甘油酸、草酸、丙二酸、琥珀酸、戊二酸、 己二酸、庚二酸、馬來酸、對苯二甲酸、蘋果酸、酒石酸、 檸檬酸、乳酸、甘胺酸、亞胺二乙酸及此等之銨鹽或鹼金 | 屬鹽等鹽;硫酸、硝酸、氨、銨鹽類,或此等之混合物等。 此等之中,對於含有至少1種選自於銅、銅合金、及 銅或銅合金之氧化物的金屬層的積層膜而言,甲酸、丙二 酸、蘋果酸、酒石酸、檸檬酸、甘胺酸、亞胺二乙酸爲適 合。 本發明中之有機酸,可較佳地列舉胺基酸。 該胺基酸,較佳爲水溶性之物,更適合爲選自於以下 群組之物。 即,例如希望含有以下之至少1種:甘胺酸、L-丙胺 -16- 200815571 酸、β-丙胺酸、L-2-胺基丁酸、L•戊胺酸、L•纈胺酸、L_ 焭胺酸、L-己胺酸、L·異亮胺酸、L-別異亮胺酸、苯基 丙fe: Is:、L -脯fe:酸、肌|女酸、l -烏胺酸、L _三甲基甘胺酸、 牛磺酸、L-絲胺酸、L-蘇胺酸、L·別蘇胺酸、L-均絲胺酸、 L-酪胺酸、3,5_二碘-L-酪胺酸、卜(3,二羥基苯基)_l_ 丙胺酸、L -甲狀腺素、4-羥基脯胺酸、L -半胱胺酸、L· 甲硫胺酸、L-乙硫胺酸、L-羊毛硫胺酸、L·胱硫醚、^胱 胺酸、L-半胱胺酸酸、L-天冬胺酸酸、L·谷胺酸、s_(羧基 甲基)-L-半胱胺酸、4-胺基酪酸、L_天冬醯胺、^胱胺醯甘 胺酸、重氮乙醯絲胺酸、L ·精胺酸、L ·刀豆胺酸、L -瓜胺 酸、δ-經基-L-三甲基甘胺酸、肌酸、^犬尿酸、£_組胺酸、 1 -甲基-L -組胺酸、3 -甲基-L ·組胺酸、麥角硫因、L _色胺酸、 放線菌素C 1、芹胺(&amp;?111丨116)、高血壓蛋白寧1、高血壓蛋 白寧II及抗木瓜酶等胺基酸等。 此等之中,從維持實用的C MP速度的同時,可抑制蝕 刻速度之效果的觀點而言,特佳爲蘋果酸、酒石酸、檸檬 酸、甘胺酸、乙二醇酸。 有機酸的添加量,在硏磨使用時1 L的硏磨用組成物 中,較佳爲 0.0 005mol〜0.5mol,更佳爲 0.005mol〜 0.3 mol,特佳爲0.01 mol〜0·1 mol。即,從抑制蝕刻的觀點 而言,有機酸的添加量較佳爲〇.5mol以下,爲得到充分效 果,較佳爲〇.〇〇〇5mol以上。 〔鉗合劑〕 本發明之硏磨用組成物,爲了降低混入之多價金属離 200815571 子等之不良影響,可依照需要較佳地含有鉗合劑。 鉗合劑,可爲作爲鈣與鎂之防止沉澱劑的常用硬水軟 化劑及其相關化合物,例如可列舉腈三乙酸、二伸乙三胺 五乙酸、乙二胺四乙酸、n,n,n-三亞甲基磷酸、乙二胺 -N,N,N’,N’-四亞甲基硫酸、反環己烷二胺四乙酸、1,2,二 胺基丙烷四乙酸、二醇醚二胺四乙酸、乙二胺鄰羥基苯基 乙酸、乙二胺二琥珀酸(SS-異構物)、N-(2-羧酸乙基) ^ -L-天冬胺酸、β-丙胺酸二乙酸、2-磷丁烷-1,2,4-三羧酸、 1-羥基伸乙基-1,1-二膦酸、N,N’-雙(2-羥基苄基)乙二胺 -N,N’-二乙酸、與1,2-二羥基苯-4,6·二磺酸。 〔硏磨方法〕 本發明之硏磨方法係將硏磨用組成物供給於硏磨定盤 上的硏磨墊,且一邊使該硏磨墊與被硏磨體的絶緣膜相接 觸,一邊使該硏磨定盤旋轉,以使硏磨定盤的接觸面與絶 緣膜的接觸面做相對運動,來進行硏磨的硏磨方法,上述 ρ 絶緣膜爲透過屏障金屬層,於具有有機矽氧烷構造之電容 率3 · 0以下的絶緣膜形成埋入配線之上述被硏磨體的絶緣 膜,且上述硏磨用組成物爲本發明之上述硏磨用組成物。 藉由如上述之構成,可提供一種用電容率3.0以下之. 材料所形成的低電容率絶緣膜(Low-K膜)之硏磨速度快 速,且可抑制腐蝕之硏磨方法。 本發明之硏磨方法中,用上述電容率3.0以下之材料 所形成的低電容率絶緣膜(Low-K膜)係與前述本發明之硏 磨用組成物項目中所記載之絶緣膜相同,較佳的例子亦相 -18- 200815571 同。 又,用於本發明之硏磨方法的硏磨用組成物係與前述 本發明之硏磨用組成物相同,較佳的例子亦相同。 本發明之硏磨用組成物爲:1.濃縮液,其在使用時以 水或水溶液稀釋而形成使用液之情形;2.各成分如下所述 分別地製備成水溶液之形式,及將其混合且視情況地以水 稀釋而形成使用液之情形;3 .使用液之情形。 任一情形之硏磨用組成物均可適用使用本發明之硏磨 ® 用組成物硏磨方法。 該硏磨方法係將硏磨用組成物供給於硏磨定盤上之硏 磨墊,使硏磨墊與被硏磨體之被硏磨面相接觸,使被硏磨 面與硏磨墊做相對運動的方法。 用於硏磨之裝置,可以使用含有具有保持被硏磨面之 被硏磨體(例如,形成導電性材料膜之晶圓等)之夾持器、 與貼附硏磨墊之硏磨定盤(而且其具有可改變轉數之馬達 φ 等)的一般硏磨設備。 上述硏磨裝置之具體例,可列舉 Mirra Mesa CMP、 Reflexion CMP(阿普萊多瑪逖力阿路司)、FREX200、 FREX300(荏原製作所)、NPS3 3 0 1、NP S 2 3 0 1 (Nikon)、 A-FP-310A、A-FP-210A(東京精密)、23 00 TERES(ram research)、Momentum(SpeedfamlPEC)等。 硏磨墊,通常可使用不織布、發泡聚胺基甲酸酯、多 孔質氟樹脂等,並無特殊限制。詳細於後敘述。 又,硏磨條件並無特殊限制,但硏磨定盤的旋轉速度 -19- 200815571 較佳爲以被硏磨體不會飛出的形式之200rpm以下的低旋 轉。 具有被硏磨面(被硏磨膜)之被硏磨體對硏磨墊押附之 壓力較佳爲0.68〜34.5KPa,更佳爲0.69〜21.6KPa;爲了 滿足硏磨速度之被硏磨體的面内均勻性及圖案平坦性,特 佳爲 3.40 〜20.7 KP a。 硏磨之間,關於硏磨墊,係將硏磨用組成物以泵等連 續的進行供給。硏磨€束後之被硏磨體係在流水中良好地 ^ 洗浄後,使用旋轉乾燥機等使附著於被硏磨體上之水滴拂 落而乾燥。 本發明中,如上述1.之方法,稀釋濃縮液時可使用下 述所示之水溶液。水溶液係預先準備含有選自於氧化劑、1 級胺基醇、添加劑、界面活性劑之至少1種以上的水,以 該水溶液將濃縮液予以稀釋之液體係滿足硏磨用組成物 (使用液)中所記載的條件之水溶液與濃縮液。 g 如此,將濃縮液以水溶液稀釋使用的情況下,由於較 不溶成分可在之後以水溶液之形式加入,因此可調製較爲 濃縮之濃縮液。 又,將水或水溶液加入濃縮液予以稀釋之方法,有一 種方法係將供給濃縮硏磨用組成物組成之濃縮液的配管與 供給水或水溶液的配管在途中使之合流予以混合,將混合 之稀釋硏磨用組成物的使用液供給於硏磨墊。濃縮液與水 或水溶液之混合,可採用以施加壓力之狀態通過狹窄通道 使液體彼此衝突混合之方法;在配管中裝塡玻璃管等充塡 -20- 200815571 物且使液體流反覆進行分流分離、合流之方法·,在配管中 設置以動力旋轉之輪葉的方法等一般之方法。 硏磨用組成物之供給速度較佳爲10〜l〇〇〇ml/min,爲 了滿足硏磨速度之被硏磨面内均勻性及圖案平坦性,更佳 爲 170 〜800ml/mino 又,硏磨用組成物之供給流量爲,每1分鐘對硏磨墊 之硏磨組成物流量,以相對於硏磨加工之被硏磨體中被硏 0 磨面之面積(晶圓面積)流量來規定時,硏磨用組成物之供 給流量較佳爲〇·〇3 5〜0.60m 1/min· cm2。藉此可滿足硏磨速 度之被硏磨面内均勻性及圖案平坦性。 再者,藉由一邊以水或水溶液等稀釋濃縮液,硏磨方 法爲一種獨立設置供給濃縮液之配管與供給水或水溶液之 配管,分別自其供給預定量之液體至硏磨墊,且一邊以硏 磨墊與被硏磨面之相對運動來混合一邊硏磨之方法。又, 亦可使用藉由於1個容器中注入預定量之濃縮液與水或水 p 溶液進行混合,將該混合之硏磨用組成物供給於硏磨墊, 進行硏磨之方法。 又,其他硏磨方法,有一種將硏磨用組成物應該含有 之至少2種成分之構成成分,分別在使用時加水或水溶液 將其稀釋之稀釋液供給於硏磨定盤上之硏磨墊,使與被硏 磨面接觸,使被硏磨面與硏磨墊做相對運動來硏磨之方法。 例如,以氧化劑作爲構成成分(A): —級胺基醇、添加 劑、界面活性劑、及以水作爲構成成分(B),可將其在使用 時以水或水溶液將構成成分(A)及構成成分(B)予以稀釋使 -21 - 200815571 用。 又,將溶解度低之添加劑2種構成成分(A)與(B)分別 (例如以氧化劑、添加劑、及界面活性劑作爲構成成分 (A),以一級胺基醇、添加劑、界面活性劑、及水作爲構成 成分(B))在使用時,加入水或水溶液將構成成分(A)及構 成成分(B)予以稀釋使用。於此等情況下,本發明中之膠態 二氧化矽粒子(硏磨粒)係較佳含有於構成成分(A)中。 如上述例子的情況下,有將構成成分(A)、構成成分(B) ^ 與水或水溶液分別供給的3個配管係爲必要,稀釋混合係 將3個配管結合成1個供給於硏磨墊之配管,且在該配管 内混合之方法,該情形中,亦可將2個配管結合,然後結 合另1個配管。具體而言,將含有較不易溶解添加劑之構 成成分與其他構成成分混合,將混合通道變長以確保溶解 時間,然後結合水或水溶液之配管的方法。 其他混合方法係將如上述的3個配管直接分別導至硏 _ 磨墊,藉由硏磨墊與被硏磨面的相對運動進行混合之方 法、或在1個容器中混合3種構成成分,從其稀釋之硏磨 用組成物供給於硏磨墊之方法。 上述硏磨方法中,含有氧化劑之1種構成成分保持在 4(TC以下,其他構成成分從室温在1〇〇 °C的範圍內加温,混 合1種構成成分與其他構成成分時,或加入水、水溶液予 以稀釋時,液温可變爲40°C以下。該方法係利用温度高時 溶解度變高.的現象,使硏磨用組成物之溶解度低的原料之 溶解度提高的較佳方法.。 * -22- 200815571 由於從室温開始在100 °c之範圍進行加温而使上述其 他構成成分溶解的原料會在温度下降時在溶液中析出,因 此使用低温狀態的其他構成成分時,於供給至硏磨墊前, 將析出之原料加温使之溶解係爲必要。因此可採用加熱及 輸送其中溶解原料之其他組分的措施。由於在含氧化劑之 1種構成成分的溫度加熱至4 0 °c以上時氧化劑可能分解, 因此在混合其他構成成分與含氧化劑之1種構成成分之情 形下,混合液之溫度較佳爲40°C以下。 ® 如此,在本發明中,亦可將硏磨用組成物的成分離析 爲二份以上供給於被硏磨面。在該情況下,含氧化物之成 分與含一級胺基醇之成分較佳爲分開供給。又,亦可將硏 磨用組成物作爲濃縮液,將稀釋水與濃縮液分別供給至被 硏磨面。 本發明中,適用將硏磨用組成物的成分離析爲二份以 上,供給於被硏磨面的方法的情形,硏磨用組成物之供給 _ 量係以從各配管之供給量的合計來表示。 〔墊〕 適用於本發明之硏磨方法的硏磨用硏磨墊可爲無發泡 構造墊,亦可爲發泡構造墊。前者係可將如塑膠板之硬質 合成樹脂鬆密度(bulk)材料用於墊。又,後者係進一步爲獨 立發泡體(乾式發泡系)、連續發泡體(湿式發泡系)、2層複 合體(積層系)之3種,特佳爲2層複合體(積層系)。發泡可 以爲均勻亦可爲不均勻。 再者,一般可含有用於硏磨之硏磨粒(例如铈氧、矽 -2 3 - 200815571 氧、鋁氧、樹脂等)。又,雖然硬度爲軟質之物或硬質之物 均可,但較佳爲在積層系各層中使用不同硬度之物。 作爲材質,較佳爲不織布、人造皮革、聚醯胺、聚胺 基甲酸酯、聚酯、與聚碳酸酯等。又,關於與被硏磨面接 觸之面,可施以可形成格狀槽、坑、同心槽、或螺紋槽等 加工。 〔晶圓〕 作爲以本發明中硏磨用組成物進行CMP之對象被硏磨 體的晶圓,較佳爲直徑係200mm以上,特佳爲300mm以 上。3 0 0mm以上時,可顯著發揮本發明之效果。 【實施例】 藉由以下實施例更詳細地說明本發明,但本發明並不 受此等所限定。 [實施例1] 硏磨用組成物之調製 _ 混合下述成分以謌製硏磨用組成物。 &lt;組成&gt;The one-stage amino alcohol used in the present invention may be a commercially available product or may be synthesized. The one-stage amino alcohol which can be used in the present invention may be used singly or in combination of two or more. Further, the concentration of the primary amino alcohol in the honing composition is not particularly limited, but is preferably from 0. 01 to 10% by mass, more preferably from 0 to 01% to 10% by mass. ·1 to 5 mass%. [pH] The composition for honing of the present invention must be in the range of pH 7.0 to 1 Torr. The honing composition of the present invention exhibits an excellent effect of improving the honing speed and corrosion inhibition by setting the pH within this range. Further, the pH of the honing composition of the present invention is preferably from 8 to 0 to 10, particularly preferably from 8.5 to 10, from the viewpoint of increasing the honing speed and the corrosion inhibition. In the present invention, in order to satirize the above pH to a range of 7.0 to 10, a base, an acid or a buffer may be used. The base, the acid or the buffering agent is preferably a non-metal such as an organic ammonium hydroxide such as ammonia, ammonium hydroxide or tetramethylammonium hydroxide, or an alkanolamine such as diethanolamine, triethanolamine or triisopropanolamine. Alkaline agent; alkali metal hydroxides such as sodium hydroxide, potassium hydroxide and lithium hydroxide; inorganic acids such as nitric acid, sulfuric acid and phosphoric acid; carbonates such as sodium carbonate; phosphates such as trisodium phosphate; borate, tetraboric acid And hydroxybenzoic acid. Examples of the particularly preferable alkaline agent include ammonium hydroxide, potassium hydroxide, lithium hydroxide, and tetramethylammonium hydroxide. The amount of the base, the acid or the buffer to be added is preferably such that the pH of the honing composition is maintained in the range of 7.0 to 10, and in the case of honing, 1 L of the honing composition is preferably 0.0. 0 0 1 m ο 1 to 1. 0 m ο 1, more preferably 0.0 03 mol to 0.5 mol 〇g [oxidizing agent] The honing composition of the present invention preferably contains a compound which can oxidize the metal for honing (oxidizing agent) ). Examples of the oxidizing agent include hydrogen peroxide, peroxide, nitrate, iodate, periodate, hypochlorite, chlorite, chlorate, perchlorate, persulfate, and chromite. The acid salt, permanganate, aqueous ozone solution, silver (II) salt and iron (III) salt, of which hydrogen peroxide is preferably used. Iron (ΠΙ) salt, preferably using inorganic iron (III) salts such as iron (III) nitrate, iron (III) chloride, iron (III) sulfate, iron (III) bromide, and iron (III) There is a 200815571 machine complex. The amount of the oxidizing agent to be added is preferably from 0.1 mol% to 1 mol, particularly preferably from 0.05 mol to 0.6 mol, per 1 L of the honing composition. [Organic Acid] In the present invention, the composition for honing is more preferably an organic acid. The organic acid referred to herein is a compound different from the oxidizing agent structure for oxidizing a metal, and may not be an acid containing the function as the oxidizing agent. The acid system here has a function of promoting oxidation, pH adjustment, and acting as a buffer. The organic acid in the present invention can be appropriately selected from the following groups. Namely, formic acid, acetic acid, propionic acid, butyric acid, valeric acid, 2-methylbutyric acid, n-hexanoic acid, 3,3-dimethylbutyric acid, 2-ethylbutyric acid, 4-methylpentanoic acid, positive Heptanoic acid, 2-methylhexanoic acid, n-octanoic acid, 2-ethylhexanoic acid, benzoic acid, glycolic acid, salicylic acid, glyceric acid, oxalic acid, malonic acid, succinic acid, glutaric acid, adipic acid, Pimelic acid, maleic acid, terephthalic acid, malic acid, tartaric acid, citric acid, lactic acid, glycine acid, imine diacetic acid and the ammonium or alkali gold thereof; salts such as salts; sulfuric acid, nitric acid, Ammonia, ammonium salts, or mixtures of these, and the like. Among these, for a laminated film containing at least one metal layer selected from the group consisting of copper, a copper alloy, and an oxide of copper or a copper alloy, formic acid, malonic acid, malic acid, tartaric acid, citric acid, and glycine Amine acid and imine diacetic acid are suitable. The organic acid in the present invention is preferably an amino acid. The amino acid, preferably water-soluble, is more preferably selected from the group consisting of the following. That is, for example, it is desirable to contain at least one of the following: glycine, L-propylamine-16-200815571 acid, β-alanine, L-2-aminobutyric acid, L•valeric acid, L•proline, L_proline, L-hexylamine, L-isoleucine, L-isolylamine, phenylpropene Fe: Is:, L-脯fe: acid, muscle|fed acid, l-uranium Acid, L _ trimethylglycine, taurine, L-serine, L-threonine, L. bethreonine, L-homouric acid, L-tyrosine, 3,5 _Diiodo-L-tyrosine, Bu (3, dihydroxyphenyl)_l_ alanine, L-thyroxine, 4-hydroxyproline, L-cysteine, L-methionine, L - ethionine, L-lanine thiamine, L-cystathionine, cysteine, L-cysteine, L-aspartic acid, L-glutamate, s_ (carboxyl -L-cysteine, 4-aminobutyric acid, L_aspartate, cysteine glycine, diazoacetate, L · arginine, L · concanavalin Acid, L-citrulline, δ-trans-L-trimethylglycine, creatine, kynuric acid, histidine, 1-methyl-L-histidine, 3-methyl -L · histidine, ergothione, L _ tryptophan, discharge Su C 1, celery amine (&amp;? 111 Shu 116), rather a protein hypertension, hypertensive and anti-protein rather II enzymes papain amino acids and the like. Among these, from the viewpoint of maintaining the practical C MP speed and suppressing the effect of the etching rate, malic acid, tartaric acid, citric acid, glycine, and glycolic acid are particularly preferable. The amount of the organic acid to be added is preferably from 0.001 mol to 0.5 mol, more preferably from 0.005 mol to 0.3 mol, particularly preferably from 0.01 mol to 0.1 mol, per 1 L of the honing composition at the time of honing. In other words, the amount of the organic acid to be added is preferably 〇5 mol or less from the viewpoint of suppressing etching, and is preferably 5 mol or more in order to obtain sufficient effects. [Clamping agent] The composition for honing of the present invention preferably contains a chelating agent as needed in order to reduce the adverse effects of the mixed polyvalent metal from 200815571. The chelating agent may be a commonly used hard water softening agent and a related compound as a precipitating agent for calcium and magnesium, and examples thereof include nitrile triacetic acid, diethylenetriamine pentaacetic acid, ethylenediaminetetraacetic acid, n, n, n-. Trimethylene phosphate, ethylenediamine-N,N,N',N'-tetramethylenesulfate, anticyclohexanediaminetetraacetic acid, 1,2,diaminopropanetetraacetic acid, glycol ether diamine Tetraacetic acid, ethylenediamine o-hydroxyphenylacetic acid, ethylenediamine disuccinic acid (SS-isomer), N-(2-carboxylic acid ethyl)^-L-aspartic acid, β-alanine II Acetic acid, 2-phosphobutane-1,2,4-tricarboxylic acid, 1-hydroxyethylidene-1,1-diphosphonic acid, N,N'-bis(2-hydroxybenzyl)ethylenediamine- N,N'-diacetic acid, and 1,2-dihydroxybenzene-4,6.disulfonic acid. [Haw grinding method] The honing method of the present invention is to supply the honing composition to the honing pad on the honing plate, and to make the honing pad contact the insulating film of the honing body while making the honing pad The honing plate rotates to make a relative movement of the contact surface of the honing plate and the contact surface of the insulating film to perform a honing method, wherein the ρ insulating film is a barrier metal layer and has an organic argon gas. The insulating film having a permittivity of 3 to 0 or less of the alkane structure forms the insulating film of the above-mentioned honed body in which the wiring is buried, and the honing composition is the honing composition of the present invention. According to the above configuration, it is possible to provide a honing method in which a low-permittivity insulating film (Low-K film) formed of a material having a permittivity of 3.0 or less has a high honing speed and can suppress corrosion. In the honing method of the present invention, the low-permittivity insulating film (Low-K film) formed of the material having a permittivity of 3.0 or less is the same as the insulating film described in the honing composition item of the present invention. The preferred example is also the same as -18-200815571. Further, the honing composition used in the honing method of the present invention is the same as the above-described honing composition of the present invention, and preferred examples are also the same. The composition for honing of the present invention is: 1. A concentrated liquid which is diluted with water or an aqueous solution to form a use liquid at the time of use; 2. Each component is separately prepared into an aqueous solution as described below, and mixed. And depending on the case, it is diluted with water to form a use liquid; 3. The case of using a liquid. The honing composition of the present invention can be suitably used in the honing agent composition of the present invention. The honing method is to supply the honing composition to the honing pad on the honing plate, so that the honing pad is in contact with the honed surface of the honed body, so that the honed surface is opposite to the honing pad. The method of exercise. For the honing device, a holder having a honed body (for example, a wafer forming a film of a conductive material, etc.) having a honed surface, and a honing plate attached to the honing pad may be used. (Also, it has a motor φ that can change the number of revolutions, etc.). Specific examples of the above honing device include Mirra Mesa CMP, Reflexion CMP, FREX 200, FREX 300 (荏原制所), NPS3 3 0 1 , NP S 2 3 0 1 (Nikon ), A-FP-310A, A-FP-210A (Tokyo Precision), 23 00 TERES (ram research), Momentum (SpeedfamlPEC), and the like. As the honing pad, a non-woven fabric, a foamed polyurethane, a porous fluororesin or the like can be usually used without particular limitation. Details will be described later. Further, the honing condition is not particularly limited, but the rotational speed of the honing plate -19-200815571 is preferably a low rotation of 200 rpm or less in a form in which the honing body does not fly out. The pressure of the honed body having the honed surface (the honed film) attached to the honing pad is preferably 0.68 to 34.5 KPa, more preferably 0.69 to 21.6 KPa; and the honing body is required to satisfy the honing speed. In-plane uniformity and pattern flatness, particularly preferably 3.40 to 20.7 KP a. In the case of the honing pad, the honing pad is continuously supplied by a pump or the like. After the honing system after the honing is well washed in the running water, the water droplets adhering to the honed body are smashed and dried using a rotary dryer or the like. In the present invention, as described in the above 1., the aqueous solution shown below can be used when the concentrate is diluted. In the aqueous solution, at least one or more kinds of water selected from the group consisting of an oxidizing agent, a primary amino alcohol, an additive, and a surfactant are prepared in advance, and the liquid system in which the concentrated solution is diluted with the aqueous solution satisfies the composition for honing (use liquid) An aqueous solution and a concentrate of the conditions described in the above. g Thus, in the case where the concentrate is diluted with an aqueous solution, since the less soluble component can be added as an aqueous solution later, a more concentrated concentrate can be prepared. Further, a method in which water or an aqueous solution is added to a concentrate to be diluted is a method in which a pipe for supplying a concentrate composed of a concentrated honing composition and a pipe for supplying water or an aqueous solution are mixed and mixed on the way, and mixed. The use liquid for diluting the honing composition is supplied to the honing pad. The mixture of the concentrated liquid and the water or the aqueous solution may be a method in which the liquids are mixed with each other through a narrow passage in a state of applying pressure; the glass tube is filled with a 塡-20-200815571, and the liquid flow is repeatedly subjected to split separation. A method of joining, a method of providing a power-rotating vane in a pipe, and the like. The supply speed of the honing composition is preferably 10 to l 〇〇〇 ml/min, and in order to satisfy the honing speed of the honing surface uniformity and the pattern flatness, it is more preferably 170 to 800 ml/mino. The supply flow rate of the grinding composition is such that the flow rate of the honing composition of the honing pad per minute is specified in relation to the flow area (wafer area) of the honing surface of the honed body by the honing process. The supply flow rate of the honing composition is preferably 〇·〇3 5 to 0.60 m 1 /min·cm 2 . Thereby, the honing surface uniformity and pattern flatness of the honing speed can be satisfied. Further, by diluting the concentrate with water or an aqueous solution or the like, the honing method is a pipe in which a pipe for supplying a concentrate and a pipe for supplying water or an aqueous solution are separately provided, and a predetermined amount of liquid is supplied therefrom to the honing pad, and one side The method of mixing and honing with the relative movement of the honing pad and the surface to be honed. Further, a method in which the mixed honing composition is supplied to the honing pad by immersing a predetermined amount of the concentrated liquid in a container with water or a water p solution may be used. Further, in other honing methods, there is a structuring component which contains at least two components which should be contained in the honing composition, and the diluted solution which is diluted with water or an aqueous solution at the time of use is supplied to the honing pad on the honing plate. A method of making a contact with the surface to be honed to make the honed surface and the honing pad move relative to each other. For example, an oxidizing agent is used as a constituent component (A): a -amino alcohol, an additive, a surfactant, and water as a constituent (B), which can be used as a component (A) in water or an aqueous solution at the time of use. Component (B) is diluted to use -21 - 200815571. Further, two kinds of components (A) and (B) of the additive having low solubility are respectively used (for example, an oxidizing agent, an additive, and a surfactant as a constituent component (A), and a primary amino alcohol, an additive, a surfactant, and When water is used as the component (B)), the component (A) and the component (B) are diluted and used by adding water or an aqueous solution. In these cases, the colloidal cerium oxide particles (honing particles) in the present invention are preferably contained in the constituent component (A). In the case of the above example, it is necessary to supply the three components of the component (A) and the component (B) ^ to the water or the aqueous solution. The dilution and mixing system combines the three pipes into one for the honing. A method in which the mat is piped and mixed in the pipe. In this case, two pipes may be combined and then combined with another pipe. Specifically, a method in which a constituent component containing a less soluble additive is mixed with other constituent components, a mixing passage is lengthened to secure a dissolution time, and then a pipe of water or an aqueous solution is combined is used. In other mixing methods, the three pipes as described above are directly guided to the 硏_brading pad, mixed by the relative movement of the honing pad and the surface to be honed, or three components are mixed in one container. A method of supplying a honing composition from the diluted honing pad to the honing pad. In the honing method, one of the constituent components containing the oxidizing agent is kept at 4 (TC or less, and the other constituent components are heated from room temperature in a range of 1 ° C, and when one type of constituent component and other constituent components are mixed, or added When water or an aqueous solution is diluted, the liquid temperature may be changed to 40 ° C or less. This method is a preferred method for improving the solubility of a raw material having a low solubility of the honing composition by utilizing a phenomenon that the solubility is high when the temperature is high. * -22- 200815571 The raw material which dissolves in the range of 100 °c from room temperature and dissolves the above-mentioned other constituent components is precipitated in the solution when the temperature is lowered. Therefore, when other components in a low temperature state are used, the supply is performed. Before the honing pad, it is necessary to heat the precipitated material to dissolve it. Therefore, it is possible to heat and transport the other components in which the raw material is dissolved. Since the temperature of the constituent component containing the oxidizing agent is heated to 40. When the temperature is above °c, the oxidizing agent may be decomposed. Therefore, when mixing other constituent components and one constituent component containing an oxidizing agent, the temperature of the mixed liquid is preferably 40 ° C or lower. As described above, in the present invention, the honing composition may be separated into two or more parts and supplied to the honed surface. In this case, the oxide-containing component and the primary amino group-containing component are preferably. Further, the honing composition may be used as a concentrate to supply the dilution water and the concentrate to the surface to be honed. In the present invention, the composition for honing is separated into two or more portions. In the case of the method of supplying the surface to be honed, the supply amount of the honing composition is expressed by the total amount of supply from each pipe. [Mat] A honing honing method suitable for the honing method of the present invention The mat may be a non-foamed structural mat or a foamed structural mat. The former may be used as a mat for a hard synthetic resin bulk material such as a plastic sheet. Further, the latter is further an independent foam (dry type) Three types of foaming system, continuous foam (wet foaming system), and two-layer composite (layered system), particularly preferably two-layer composite (layered system). Foaming may be uniform or uneven. Furthermore, it is generally possible to contain abrasive grains for honing (for example) Such as argon, 矽-2 3 - 200815571 oxygen, aluminum oxide, resin, etc.) Further, although the hardness may be either soft or hard, it is preferred to use different hardnesses in each layer of the laminate. The material is preferably a non-woven fabric, an artificial leather, a polyamide, a polyurethane, a polyester, a polycarbonate, etc. Further, regarding a surface in contact with the surface to be honed, a groove can be formed Processing of a pit, a concentric groove, or a thread groove. [Wafer] The wafer to be honed by the CMP for the honing composition of the present invention preferably has a diameter of 200 mm or more, and particularly preferably 300 mm. When the above is more than 300 mm, the effects of the present invention can be remarkably exhibited. [Examples] The present invention will be described in more detail by way of the following examples, but the invention is not limited thereto. [Example 1] Preparation of composition for honing _ The following components were mixed to prepare a composition for honing. &lt;Composition&gt;

l〇g/L 14g/L 0.5g/L 30g/L 9.5 lOOOmL •過氧化氫(氧化劑) •A-1 :胺基乙醇(1級胺基醇、和光純薬工業(股)製) •1H-苯并三唑(BTA:芳香環化合物) •膠態二氧化矽粒子 (PL-3、一級粒徑15nm、結合度4、二級粒徑40nm) • pH(以氨水與硫酸調整) •純水加入總量 -24- 200815571 &lt;實施例2〜2 0及比較例1〜2&gt; 於實施例1之硏磨用組成物的調製中’除了將一級胺 基醇與苯并三唑化合物、其添加量、及硏磨速度變更爲如 表2之記載以外,與實施例1同樣地進行調製硏磨用組成 物。 硏磨試驗及評價 使用Lapmaster公司製的裝置「LGP-612」作爲硏磨裝 置,以下述條件,一邊供給上述所得之硏磨用組成物(漿料) ^ 一邊硏磨設置於形成圖案之各晶圓的膜,並測定該時間之 段差。 具體而言,一邊將硏磨用組成物供給於硏磨裝置之硏 磨定盤的硏磨墊上,一邊以將基板(被硏磨體)壓在硏磨墊 之狀態,使硏磨定盤與基板相對移動,硏磨銅膜(導體膜)、 Ta膜(屏障金属膜)、BDI(絶緣膜)等。 -硏磨對象_ 被硏磨體(基板):將算出硏磨速度BD之固體,分別使 用如下述之膜腐蝕評價作成之8吋晶圓。 在 8吋矽晶圓上,藉由濺鍍法以四乙氧基矽烷 (TEOS)、碳化矽(SIC)、黑金鋼石(BDI)、矽氧化膜(SiOx) 的順序形成絶緣膜,藉由光蝕刻步驟及反應性離子蝕刻步 驟形成圖案,形成幅0·09〜1 ΟΟμπι、深度45 0nm的配線用 溝與接續孔。 此外,藉由濺鍍法形成厚度25nm的Ta膜(Ta屏障層)。 藉著以濺鍍法形成厚度10 Onm的銅膜(Cu-Seed)後,以電鍍 \ -25- 200815571 法形成合計厚度l〇〇〇nm的銅膜,而做成8吋晶圓。 -硏磨條件· •硏磨墊:Rohm and Haas 公司製之型號 IC-1400 (K-grv) + (A21) •平台旋轉數:64rpm •頭旋轉數:65rpm(加工線速度=1.0m/s) •硏磨壓力·· l.Opsi(約 6.9KPa) •漿料供給速度:200ml/分 -評價方法- (1) 絶緣膜硏磨速度 硏磨速度係由CMP前後之BDI絶緣膜的膜厚差從電気 抵抗値換算,用下式求出。膜厚差測定係用Filmetalix(股) 製之F20進行測定。 硏磨速度(A/分)==(硏磨前BDI之厚度-硏磨後BDI之厚 度)/硏磨時間 (2) 腐蝕 對Ta屏障膜硏磨後之圖案晶圓,以觸針式段差計 DektakV320Si(Veeco社製)測定線與空間部(線9μιη、空間 1 μ m)的腐触(段差:A)。 -26- 200815571 【表2】L〇g/L 14g/L 0.5g/L 30g/L 9.5 lOOOmL • Hydrogen peroxide (oxidizing agent) • A-1 : Aminoethanol (1 grade amino alcohol, and light pure bismuth industrial (stock) system) • 1H -benzotriazole (BTA: aromatic ring compound) • Colloidal ceria particles (PL-3, primary particle size 15 nm, degree of binding 4, secondary particle size 40 nm) • pH (adjusted with ammonia and sulfuric acid) • Pure Total amount of water added - 24 - 200815571 &lt;Examples 2 to 2 0 and Comparative Examples 1 to 2&gt; In the preparation of the composition for honing of Example 1, 'except for the primary amino alcohol and the benzotriazole compound, The composition for honing was prepared in the same manner as in Example 1 except that the amount of addition and the honing speed were changed as described in Table 2. The honing test and the evaluation were carried out using the apparatus "LGP-612" manufactured by Lapmaster Co., Ltd. as a honing device, and the honing composition (slurry) obtained as described above was supplied under the following conditions. Round the membrane and measure the difference in time. Specifically, while the honing composition is supplied to the honing pad of the honing plate of the honing device, the substrate (the honed body) is pressed against the honing pad to make the honing plate and the honing plate The substrate is relatively moved, and a copper film (conductor film), a Ta film (barrier metal film), a BDI (insulating film), or the like is honed. - Honing target _ honed body (substrate): The solid of the honing speed BD was calculated, and each of the 8 吋 wafers prepared by the following film corrosion evaluation was used. On the 8 吋矽 wafer, an insulating film is formed by sputtering in the order of tetraethoxy decane (TEOS), tantalum carbide (SIC), black diamond (BDI), and tantalum oxide film (SiOx). The photo-etching step and the reactive ion etching step form a pattern to form a wiring trench and a connection hole having a width of 0·09 to 1 ΟΟμπι and a depth of 45 nm. Further, a Ta film (Ta barrier layer) having a thickness of 25 nm was formed by a sputtering method. A copper film (Cu-Seed) having a thickness of 10 Onm was formed by sputtering, and a copper film having a total thickness of 10 nm was formed by a plating method of -25-200815571 to form an 8-inch wafer. - Honing conditions · Honing pad: Model IC-1400 (K-grv) + (A21) manufactured by Rohm and Haas Co., Ltd. • Platform rotation number: 64 rpm • Number of head rotation: 65 rpm (processing line speed = 1.0 m/s • Honing pressure · · l.Opsi (about 6.9KPa) • Slurry supply speed: 200ml / min - evaluation method - (1) Insulating film honing speed Honing speed is the film thickness of BDI insulating film before and after CMP The difference is calculated from the electric resistance 値 and is obtained by the following equation. The film thickness difference measurement was carried out using F20 manufactured by Filmetalix Co., Ltd. Honing speed (A / min) == (thickness of BDI before honing - thickness of BDI after honing) / honing time (2) Corrosion of pattern wafer after honing of Ta barrier film, with stylus type step Dektak V320Si (manufactured by Veeco Co., Ltd.) was used to measure the corrosion of the line and space portion (line 9 μm, space 1 μm) (step: A). -26- 200815571 [Table 2]

1級胺基醇 苯并三唑化合物、 其他添加劑 硏磨用組 成物之pH BDI硏磨速度 (A/分) 腐飩 (A) 實施例1 A-K1.4) ΒΤΑ(0.5) 9.5 400 200 實施例2 Α_2(1·4) DBTA(0.5) 10 360 250 實施例3 A-l(1.4) DBTA(0.5) 350 220 十二基苯磺酸(0.03) 8.5 實施例4 Α-3(1.4) BTA(0.5) 9.5 420 十二基苯磺酸(0.03) 200 實施例5 Α-4(1·4) ΗΕΑΒΤΑ(0·5) 8.5 390 190 實施例6 Α-1(1·4) DCEBTA(0.5) 9 380 150 實施例7 HMBTA(0.5) 450 170 Α-1(1.4) 十二基苯磺酸(0·03) 10 實施例8 Α-6(1.5) DCEBTA(0.5) 9.5 440 190 實施例9 Α-7(1.5) BTA(0.5) 9 360 190 實施例10 Α-3(1.4) HMBTA(0.5) 10 380 170 實施例11 Α-8(1·5) DCEBTA(0.5) 9.5 390 210 實施例12 Α·9(1·5) DBTA(0.5) 9.5 410 190 實施例13 ; Α-10(1.8) BTA(0.5) 10 420 200 實施例14 Α-11(1_8) DCEBTA(0.5) 8.5 370 260 實施例15 Α-9(1.5) BTA(0.5) 9.5 420 200 實施例16 HEABTA(0.5) 9.5 380 240 Α-12(1·8) DBTA(0.5) 10 實施例17 Α-13(1·8) BTA(0.5) 9.5 360 200 實施例18 Α-14(1·8) BTA(0.5) 8,5 420 200 實施例19 DBTA(0.5) 350 190 Α-14(1.8) 十二基苯磺酸(0.03) 10 ΒΤΑ(0·5) 實施例20 Α-1(1.4) HEABTA(0.5) 9.5 400 150 十二基苯磺酸(0.03) 比較例1 甘胺酸(1·4) BTA(0.5) 6.5 20 560 比較例2 乳酸(1.3) ΒΤΑ(0·5) 9 450 ' 600 -27- 200815571 &lt;關於略稱&gt; 1,2,3-苯并三唑(BTA) 5,6-二甲基-1,2,3-苯并三哩(〇8丁八) 1-(1,2-二羧基乙基)苯并三唑(1:)(^3丁幻 1-[N,N-雙(羥基乙基)胺基甲基;]苯并三唑(heabta) 1-(羥基甲基)苯并三唑(HMBTA) 從表2可知,實施例1〜20在低壓條件下可達成高硏 ® 磨速度及高平坦化。另一方面,比較例1及2觀測到硏磨 速度降低、腐触悪化,各組分無法達成筒平坦化之加工。Grade 1 amino alcohol benzotriazole compound, other additives pH composition of the honing composition BDI honing rate (A / min) Corrosion (A) Example 1 A-K1.4) ΒΤΑ (0.5) 9.5 400 200 Example 2 Α_2(1·4) DBTA(0.5) 10 360 250 Example 3 Al(1.4) DBTA(0.5) 350 220 Dodecylbenzenesulfonic acid (0.03) 8.5 Example 4 Α-3(1.4) BTA( 0.5) 9.5 420 Dodecylbenzenesulfonic acid (0.03) 200 Example 5 Α-4(1·4) ΗΕΑΒΤΑ(0·5) 8.5 390 190 Example 6 Α-1(1·4) DCEBTA(0.5) 9 380 150 Example 7 HMBTA (0.5) 450 170 Α-1 (1.4) Dodecylbenzenesulfonic acid (0·03) 10 Example 8 Α-6 (1.5) DCEBTA (0.5) 9.5 440 190 Example 9 Α- 7(1.5) BTA(0.5) 9 360 190 Example 10 Α-3(1.4) HMBTA(0.5) 10 380 170 Example 11 Α-8(1·5) DCEBTA(0.5) 9.5 390 210 Example 12 Α· 9(1·5) DBTA(0.5) 9.5 410 190 Example 13; Α-10(1.8) BTA(0.5) 10 420 200 Example 14 Α-11(1_8) DCEBTA(0.5) 8.5 370 260 Example 15 Α -9(1.5) BTA(0.5) 9.5 420 200 Example 16 HEABTA(0.5) 9.5 380 240 Α-12(1·8) DBTA(0.5) 10 Example 17 Α-13(1·8) BTA(0.5) 9.5 360 200 implementation 18 Α-14(1·8) BTA(0.5) 8,5 420 200 Example 19 DBTA(0.5) 350 190 Α-14(1.8) Dodecylbenzenesulfonic acid (0.03) 10 ΒΤΑ(0·5) Example 20 Α-1 (1.4) HEABTA (0.5) 9.5 400 150 Dodecylbenzenesulfonic acid (0.03) Comparative Example 1 Glycine (1·4) BTA (0.5) 6.5 20 560 Comparative Example 2 Lactic acid (1.3) ΒΤΑ (0·5) 9 450 '600 -27- 200815571 &lt;About abbreviated &gt; 1,2,3-benzotriazole (BTA) 5,6-dimethyl-1,2,3-benzotriene哩(〇8丁八) 1-(1,2-dicarboxyethyl)benzotriazole (1:) (^3丁丁1-[N,N-bis(hydroxyethyl)aminomethyl; ]Benzatriazole (heabta) 1-(hydroxymethyl)benzotriazole (HMBTA) From Table 2, it can be seen that Examples 1 to 20 can achieve high 硏® grinding speed and high flattening under low pressure conditions. On the other hand, in Comparative Examples 1 and 2, it was observed that the honing speed was lowered and the rot was touched, and the processing of the flattening of the cylinder could not be achieved for each component.

-28--28-

Claims (1)

200815571 十、申請專利範圍: 1 · 一種硏磨用組成物,其係於半導體裝置之製造方法中, 用於化學機械硏磨被硏磨體的絶緣膜之硏磨用組成物, 含有膠態二氧化矽粒子、苯并三唑化合物及下式(I)所示 之一級胺基醇,且pH爲7〜1 0之範圍,其中該硏磨體係 包括於具有有機矽氧烷構造之電容率3以下的絶緣膜透 過屏障金屬層之埋入配線, NH2-Ri-OH 式(I) ® [式(I)中、I係表示脂肪族烴基或芳香族烴基]。 2·如申請專利範圍第1項之硏磨用組成物,其中該膠態二 氧化矽粒子之濃度爲0.5〜1 5質量%。 3·如申請專利範圍第1或2項之硏磨用組成物,其中苯并 三唑化合物係選自於1,2,3-苯并三唑、5,6-二甲基·1,2,3-苯并三唑、1-(1,2-二羧基乙基)苯并三唑、1-[Ν,Ν-雙(羥 基乙基)胺基甲基]苯并三唑及1-(羥基甲基)苯并三唑的1 種以上之化合物。 I 4. 一種硏磨方法,其特徵爲將硏磨用組成物供給於硏磨定 盤上之硏磨墊,一邊使該硏磨墊與被硏磨體之絶緣膜接 觸,一邊使該硏磨定盤旋轉使對接觸面做相對運動來進 行硏磨之硏磨方法,該絶緣膜爲上述被硏磨體之絶緣 膜,且該硏磨用組成物係如申請專利範圍第1項之硏磨 用組成物,該硏磨體爲於具有有機矽氧烷構造之電容率 3.0以下的絶緣膜,透過屏障金屬層埋入配線所構成。 5.如申請專利範圍第4項之硏磨方法,其中使硏磨墊與被 -2 9 - 200815571 % 硏磨體之絶緣膜接觸時的荷重爲0.69〜21.6KPa。 6.如申請專利範圍第4項之硏磨方法,其中將硏磨用組成 物供給於硏磨定盤上之硏磨墊時,供給流量爲〇 . 〇 3 5〜 0.6 0ml/min · cm2 〇200815571 X. Patent application scope: 1 · A composition for honing, which is used in a manufacturing method of a semiconductor device, for honing a chemical composition for honing an insulating film of a honed body, comprising a colloidal composition a cerium oxide particle, a benzotriazole compound, and a monohydric amino alcohol represented by the following formula (I), and having a pH in the range of 7 to 10, wherein the honing system is included in a permittivity 3 having an organic decane structure The following insulating film is passed through the buried wiring of the barrier metal layer, NH2-Ri-OH Formula (I) ® [In the formula (I), I represents an aliphatic hydrocarbon group or an aromatic hydrocarbon group]. 2. The composition for honing according to the first aspect of the invention, wherein the concentration of the colloidal cerium oxide particles is from 0.5 to 15% by mass. 3. The honing composition according to claim 1 or 2, wherein the benzotriazole compound is selected from the group consisting of 1,2,3-benzotriazole, 5,6-dimethyl-1,2 , 3-benzotriazole, 1-(1,2-dicarboxyethyl)benzotriazole, 1-[indene, fluorenyl-bis(hydroxyethyl)aminomethyl]benzotriazole and 1- One or more compounds of (hydroxymethyl)benzotriazole. I. A honing method characterized in that a honing composition is supplied to a honing pad on a honing plate, and the honing pad is brought into contact with an insulating film of the honing body to make the honing The honing method is a honing method in which the aligning is performed by the relative rotation of the contact surface, the insulating film is the insulating film of the honed body, and the honing composition is honed according to the first item of the patent application. In the composition, the honing body is formed of an insulating film having a permittivity of 3.0 or less in an organic siloxane structure and buried in a barrier metal layer. 5. The honing method of claim 4, wherein the load of the honing pad is 0.69 to 21.6 KPa when it is brought into contact with the insulating film of the honing body of -2 9 - 200815571%. 6. The honing method of claim 4, wherein when the honing composition is supplied to the honing pad on the honing plate, the supply flow rate is 〇. 3 5 to 0.6 0 ml/min · cm2 〇 -30 - 200815571 七、指定代表圖: (一) 本案指定代表圖為:無。 (二) 本代表圖之元件符號簡單說明: Μ 〇 j \ \\-30 - 200815571 VII. Designated representative map: (1) The representative representative of the case is: None. (2) A brief description of the symbol of the representative figure: Μ 〇 j \ \\ 八、本案若有化學式時,請揭示最能顯示發明特徵的化學式:8. If there is a chemical formula in this case, please disclose the chemical formula that best shows the characteristics of the invention:
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