TW200808992A - Copper(I) complexes and processes for deposition of copper films by atomic layer deposition - Google Patents

Copper(I) complexes and processes for deposition of copper films by atomic layer deposition Download PDF

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TW200808992A
TW200808992A TW95128794A TW95128794A TW200808992A TW 200808992 A TW200808992 A TW 200808992A TW 95128794 A TW95128794 A TW 95128794A TW 95128794 A TW95128794 A TW 95128794A TW 200808992 A TW200808992 A TW 200808992A
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alkyl
group
copper
independently selected
substrate
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TW95128794A
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Kyung-Ho Park
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Du Pont
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Abstract

The present invention relates to novel 1,3-diimine copper complexes and the use of 1,3-diimine copper complexes for the deposition of copper on substrates or in or on porous solids in an Atomic Layer Deposition process.

Description

200808992 九、發明說明: 【發明所屬之技術領域】 本發明係關於新穎1,3-二亞胺銅錯合物。本發明亦係關 於使用1,3-二亞胺銅錯合物在基板上或在多孔固體上或多 孔固體中形成銅沈積物之方法。 【先前技術】 如由 M· Ritala及M. Leskela在 Handbook of Thin Film200808992 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to novel 1,3-diimine copper complexes. The invention is also directed to a method of forming a copper deposit on a substrate or on a porous solid or in a porous solid using a 1,3-diimine copper complex. [Prior Art] by M. Ritala and M. Leskela in Handbook of Thin Film

Materials, H. S. Nalwa? Editor, Academic Press, San Diego, 2001,第 1卷,第 2章中之"Atomic Layer Deposition,,中所 述,原子層沈積(ALD)方法適用於產生薄膜。該等膜(尤其 為金屬及金屬氧化物膜)為製造電子電路及裝置中之關鍵 組件。 在用於沈積銅膜之ALD方法中,將鋼前驅物及還原劑交 替地引入反應室中。在將該銅前驅物引入反應室中且容許 吸附至基板上之後,將過量(未吸附)前驅物蒸氣自該室抽 取或清除。移除過量前驅物蒸氣後接著引入還原劑,其與 在該基板表面上之銅前驅物反應形成銅金屬及配位基之游 離形式。若需要達到所要薄膜厚度,則可重複該循環。 該ALD方法不同於在金屬錯合物之分解化學中之化學氣 相沈積(CVD)。在CVD方法中,錯合物在接觸表面時經受 高溫分解以產生所要膜。在ALD方法中,錯合物在接觸表 面時並不完全分解成金屬。相反地,金屬膜之形成係於引 入與該經沈積之金屬錯合物反應之第二試劑時發生。在自 銅⑴錯合物製備銅膜中’該第二試劑為還原劑。ALD方法 113577.doc 200808992 之優點包含此控制膜厚度之能力,及由於在該方法之第一 步中前驅物自限吸附於基板表面而能產生改良的覆蓋區域 順形性。 就分解而s,希望用於ALD方法中之配位基為穩定的, 且該等配位基應能夠以不含金屬之形式自錯合物釋放。在 銅還原後,配位基釋出且必須予以自表面移除,以便防止 其併入正形成之金屬層中。Materials, H. S. Nalwa? Editor, Academic Press, San Diego, 2001, Vol. 1, Chapter 2, "Atomic Layer Deposition,", The Atomic Layer Deposition (ALD) method is suitable for producing thin films. These films, especially metal and metal oxide films, are key components in the manufacture of electronic circuits and devices. In the ALD method for depositing a copper film, a steel precursor and a reducing agent are alternately introduced into the reaction chamber. After the copper precursor is introduced into the reaction chamber and allowed to adsorb onto the substrate, excess (unadsorbed) precursor vapor is withdrawn or removed from the chamber. The excess precursor vapor is removed followed by a reducing agent which reacts with the copper precursor on the surface of the substrate to form a free form of copper metal and a ligand. This cycle can be repeated if it is desired to achieve the desired film thickness. This ALD method is different from chemical gas phase deposition (CVD) in the decomposition chemistry of metal complexes. In the CVD method, the complex is subjected to pyrolysis upon contact with the surface to produce a desired film. In the ALD method, the complex does not completely decompose into metal upon contact with the surface. Conversely, the formation of the metal film occurs when a second reagent that reacts with the deposited metal complex is introduced. In the preparation of a copper film from a copper (1) complex, the second reagent is a reducing agent. The advantages of the ALD method 113577.doc 200808992 include this ability to control film thickness and the improved coverage area conformability due to the self-limiting adsorption of the precursor to the substrate surface in the first step of the process. In terms of decomposition, it is desirable that the ligands used in the ALD process are stable, and the ligands should be capable of being released from the complex in a metal-free form. After copper reduction, the ligand is released and must be removed from the surface to prevent its incorporation into the metal layer being formed.

之膜。 【發明内容】The film. [Summary of the Invention]

其包括: 之方法, 以在該基板上形成銅錯合 •將基板與銅錯合物(I)接觸,以 物之沈積物;及The method comprises: a method of forming a copper misalignment on the substrate; contacting the substrate with the copper complex (I), deposits of the object;

將該經沈積之細合物與還原 L係選自由C2-C 組成之群; 選自由C2-Cl5埽煙、 〖勿與逛原劑接觸,其中 C2_C15炔烴、腈、芳放 芳族雜環及膦 113577.doc 200808992 η為1或2 ; R及R獨立地選自由H、CrC#烷基、經氟取代之Cl·。 烷基及SUR、組成之群,其中R4各自獨立地為烷 基; R獨立地選自由Cl_C4烷基、經氟取代之C广q烷基及 Si(R4)3組成之群,其中R4各自獨立地為烷基;且 還原劑係選自由下列各物組成之群:9_bbn(9_硼雙環 (3.3.1]壬燒),二硼烧;brxH3-xB式之硼燒其中x=〇、1或2 且R獨立地選自苯基及ci-Ci〇烷基;二氫苯幷呋喃;吡唑 琳,一石夕烧’ SiR’yH4-y形式之石夕烧其中y=〇、1、2或3且R, 獨立地選自笨基及Ci-Ciq烷基;及z形式之鍺烷其 中z=0、1、2或3且R,,獨立地選自苯基及Ci_Ci〇烷基。 本發明之另一態樣為包括沈積於基板上之^二亞胺銅 錯合物(I)之物品。 本發明之另一態樣為對應於銅錯合物(j)之組合物。 本發明之另一態樣為對應於配位基(I]t)之組合物, R1\ R2 Hh]/The deposited composition and the reduced L system are selected from the group consisting of C2-C; the C2-Cl5 smoulder is selected, and the contact agent is not contacted, wherein the C2_C15 alkyne, the nitrile, the aromatic aromatic heterocycle And phosphine 113577.doc 200808992 η is 1 or 2; R and R are independently selected from Cl, which is substituted by H, CrC# alkyl, or fluorine. Alkyl and SUR, a group of constituents, wherein each R4 is independently alkyl; R is independently selected from the group consisting of a C1-C4 alkyl group, a fluorine-substituted C-g-q-alkyl group, and Si(R4)3, wherein R4 is independently The ground is an alkyl group; and the reducing agent is selected from the group consisting of 9_bbn (9-boron bicyclic (3.3.1) smoldering), diboron burning; brxH3-xB type boron burning wherein x=〇, 1 Or 2 and R is independently selected from the group consisting of phenyl and ci-Ci 〇 alkyl; dihydrophenyl hydrazine; pyrazolidine, a diarrhea 'SiR'yH4-y form of Shi Xi burning where y = 〇, 1, 2 Or 3 and R, independently selected from phenyl and Ci-Ciq alkyl; and z-form decane wherein z = 0, 1, 2 or 3 and R, independently selected from phenyl and Ci-Ci decyl. Another aspect of the invention is an article comprising a copper diimide complex (I) deposited on a substrate. Another aspect of the invention is a composition corresponding to the copper complex (j). Another aspect of the invention is a composition corresponding to the ligand (I]t), R1\ R2 Hh]/

其中η為1或2 ; R1及R2獨立地選自由Η、CrC4烷基、經氟取代之c c 113577.doc 200808992 烷基及Si(R4)3組成之群,其中R4各自獨立地為CkG烷 基;且 R3獨立地選自由烷基、經氟取代之c!-C4烷基及 Si(R4)3組成之群,其中R4各自獨立地為Cl_c4烷基。 【實施方式】 申請人已發現適於產生銅膜的原子層沈積(ALD)方法。 此等銅膜可在積體電路之銅互連形成過程中用作晶種層或 可用於各種裝飾或催化應用。該方法使用的銅⑴錯合物在 約50至l2〇C之溫度下在35〇 T〇rr時為揮發性 的、在50至150°C在350 mT〇rr至1 Torr之條件下為熱穩定 的,且衍生自含有C、Η及N但不限於該等元素之配位基。 選擇配位基以便形成在冑當溫度範圍内為揮發性的但在該 服度範圍内並不分解成銅金屬的銅⑴錯合物。相反,該等 錯合物在添加適合之還原劑時,分解成金屬。另外選擇配 土 k而在將鋼錯合物暴露於還原劑後,該等配位基將釋 放而不分解。已證明在適度溫度下,#由市售還原劑將銅 錯合物還原為銅金屬可進行完全。 在本發明之方法中’鋼係藉由以下方法沈積在基板上·· 1基板與銅錯合物⑴接觸,以在該基板上形成鋼 物之沈積物,·及 113577.doc 200808992Wherein η is 1 or 2; R1 and R2 are independently selected from the group consisting of hydrazine, CrC4 alkyl, fluoro-substituted cc 113577.doc 200808992 alkyl and Si(R4)3, wherein each R4 is independently CkG alkyl And R3 is independently selected from the group consisting of an alkyl group, a fluorine-substituted c!-C4 alkyl group, and Si(R4)3, wherein each R4 is independently a Cl_c4 alkyl group. [Embodiment] Applicants have discovered an atomic layer deposition (ALD) method suitable for producing a copper film. These copper films can be used as seed layers in the copper interconnect formation process of integrated circuits or can be used in a variety of decorative or catalytic applications. The copper (1) complex used in this method is volatile at 35 〇 T 〇 rr at a temperature of about 50 to 12 ° C, and is hot at 50 to 150 ° C at 350 mT Torr to 1 Torr. Stable and derived from a ligand containing C, hydrazine and N but not limited to these elements. The ligand is selected to form a copper (1) complex which is volatile over the temperature range but does not decompose into copper metal within this range of service. Instead, the complexes decompose into metals upon addition of a suitable reducing agent. In addition, the soil k is selected and after the steel complex is exposed to the reducing agent, the ligands will be released without decomposition. It has been shown that at moderate temperatures, the reduction of the copper complex to a copper metal by a commercially available reducing agent can be carried out completely. In the method of the present invention, the steel is deposited on the substrate by the following method: 1. The substrate is in contact with the copper complex (1) to form a deposit of steel on the substrate, and 113577.doc 200808992

LL

其中 芳族雜環及膦 b ·將該經沈積之鋼錯合% 少 σ物與遇原劑接觸,Wherein the aromatic heterocyclic ring and the phosphine b are less than % of the deposited steel, and the σ substance is in contact with the original agent,

L係選自由c2-C15稀煙、匚ΓLL is selected from c2-C15 dilute smoke, 匚ΓL

LyCis炔烴、腈、 組成之群; η為1或2 ; R1及R2獨立地選自由Η、 烧基及Si(R4)3組成之群, 基; ci-c4烷基、經氟取代之c】_C4 其中R各自獨立地為C^-CU烷 R3獨立地選自由CrQ烧其 办一卜 ,r4, ς., Λ 4烷基、經氟取代之CVC4烷基及 (R )3Si組成之群,其中反4各 w 分目獨立地為c】-c4烷基,·且LyCis alkyne, nitrile, group of constituents; η is 1 or 2; R1 and R2 are independently selected from the group consisting of ruthenium, alkyl and Si(R4)3, ac-c4 alkyl, substituted by fluorine 】 _C4 wherein R is independently C ^ - CU alkane R 3 independently selected from the group consisting of CrQ, r4, ς., Λ 4 alkyl, fluorine-substituted CVC4 alkyl and (R) 3Si , wherein the inverse 4 each w subheading is independently c]-c4 alkyl, and

還原劑係選自由下列各物έ 士、 . 、、’成之群· 9-BBN(9_硼雙環 [3·3·1]壬统),一侧烧,BRxHh形式之领烧其中❹、1或2 且R獨立地選自苯基及Cl_Ci〇烷基;4苯幷吱喃;吡嗤 啉;二矽烷;SiR,yH4_y形式之矽烷其中y=〇、j、2或3且化, 獨立地選自苯基及Cl_CiQ烷基;及GeR”zH“形式之鍺烷其 中z=〇、1、2或3且R,,獨立地選自苯基及Ci-Ci〇烧基。 本沈積方法容許使用相對低的溫度(例如,約〇至2〇〇。〇 且產生南品質、均勻的膜。理想的膜為連續的及導電的。 此等方法亦提供至銅膜的直接路線,可避免需要形成中間 113577.doc 200808992 氧化膜。 在銅沈積方法之-實施例中,心 上,或基板之孔中及/或孔上 、基板之表面 板、丰導夢其刼η炫&社 ^ 〇之基板包含導體基 丰¥體基板及絕緣基板,其包含鋼 造超大規模積體電路之晶圓、用具—曰曰、於製 常數之介電材料製備之曰 —乳化矽低之介電 刊竹表侑之日日囡及塗以障# k基板。防止銅遷移之障壁層包含叙、氮化Λ矽及低 欽、组石夕氮化物、欽石夕氮化物、^一、敍、氮化 y 一 + — 虱化物及氮化鈮。 在一二貫施例中,可在溶液中, 溶谅盥、萝®十丨k , 心、即猎由使銅錯合物之 7ΓΓ 進行此等方法。然而,在一實施 例中,較佳將基板暴露於鋼錯合 二貫鉍 沈積之錯合物暴露於還 :::吉且隨後在將經 疋你y之瘵虱刖藉由真空或 任何過量的銅錯合物(咅 ’、 俨入μ u、即未沈積之錯合物)。在還原銅 :、物後,可例如經由真空、淨化、加熱、用適 漂洗或該等方法夕人n入 Μ 、、· Β私除配位基之游離形式。 可重複該方法以堆積較厚之銅層或消除針孔。 =物之沈積通常在。至2,c下進行。銅錯合物之還 通吊在類似溫度,0至戰,更佳50至赋下進行。 ^銅錯。物沈積在基板上。直至該銅錯合物暴露於 原劑才形成金屬銅膜。 t 、使用4又入性還原劑以便快速及完全地還原銅錯合 物f 口之遷原劑為揮發性的,且在加熱時不分解。”侵 ί*生還原』具有足夠之還原力,以便與沈積於基板表面 上之銅錯合物在接觸時快速反應。如於(例如)專利公開案 H3577.doc 200808992 WO 2004/094689中所揭示,已鑒別在ALD方法中用於銅⑴ 還原之適當還原劑。該等試劑之一特徵為存在質子供體。 該還原劑理想地能夠轉移至少一個電子以還原錯合物之銅 離子,且能夠轉移至少一個質子以質子化配位基。亦期望 經氧化之還原劑及經質子化之配位基能夠易於自新形成之 銅沈積物之表面移除。經質子化之配位基較佳藉由真空、 藉由淨化或藉由用適合之溶劑沖洗表面而移除。 用於銅沈積方法之適合還原劑包含9-BBN、硼烷、二硼 烧、一氳苯幷吱喃、吼唾琳、鍺烧、二乙基石夕烧、二甲基 矽烷 '乙基矽烷、苯基矽烷、矽烷及二矽烷。二乙基矽烷 及矽烷較佳。 在銅沈積方法之一實施例中,在能達到經汽化之錯合物 至该基板之表面的適合通量之溫度、時間及壓力的條件 下’將銅錯合物導入含有基板之反應器腔室。該等變量 (時間、T、p)之選擇將視個別腔室及系統設計及所要處理 率而定,但作為一般準則,可使用在約^至汕❶^範圍内之 溫度、在約10〇至180 mTorr範圍内之壓力及至少3〇秒至i 分鐘之時期。在至少部分銅錯合物沈積於基板上後,自腔 至移除未沈積之錯合物蒸氣(例如,藉由抽取或淨化),且 在約50至760 mT〇rr之壓力下將還原劑引入腔室以還原經 吸附之鋼錯合物。在還原期間,將基板保持於約〇至2〇〇它 之溫度下。使用銅錯合物及還原劑之適合組合,該還原為 I*夬速的(忍即,對於大多錯合物而言,通常可在1秒至數分 鐘之時間範圍内完成)及大體上完全的(例如,完成約95〇/〇 113577.doc 200808992 =1。理想地,在小於1秒至數分鐘之暴露時間内,還 原凡成至少95%。希望在該等還原條 定 表面移除來自該反應之產物。… ;自基板之 在一實施例中,銅錯合物為銅〗 中RI及尺2為乙基,為甲基,叫二亞胺錯合物⑴’其 院,且還原劑為二乙基料。 ^基二甲基石夕 本發明亦提供新穎的u·二亞胺鋼錯合物⑴,The reducing agent is selected from the group consisting of: 成, 、, '成之群·9-BBN (9_Bronobicyclo[3·3·1] 壬), one side burned, the BRxHh form is burnt, 1 or 2 and R is independently selected from phenyl and Cl_Ci decyl; 4 benzopyran; pyroxaline; dioxane; silane in the form of SiR, yH4_y wherein y = 〇, j, 2 or 3 and is independent Selected from phenyl and Cl_CiQ alkyl; and GeR"zH" form of decane wherein z = 〇, 1, 2 or 3 and R, independently selected from phenyl and Ci-Ci decyl. The deposition method allows for the use of relatively low temperatures (e.g., about 〇 to 2 〇〇. and produces a south quality, uniform film. The desired film is continuous and electrically conductive. These methods also provide a direct route to the copper film. In order to avoid the need to form an intermediate 113577.doc 200808992 oxide film. In the copper deposition method - in the embodiment, the core, or the hole in the substrate and / or on the hole, the surface plate of the substrate, the guide Meng Qi 刼 Hyun & amp The substrate of the company 包含 导体 包含 包含 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 体 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板 基板The dielectric publication of the bamboo watch 侑 侑 涂 涂 涂 涂 涂 涂 k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k k 、, 氮化 y + 虱 虱 及 及 及 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在 在These methods are performed. However, in an embodiment, the substrate is preferably exposed to steel. The two-pass tantalum deposit is exposed to a ::: 吉 and then after 将 y y 瘵虱刖 by vacuum or any excess copper complex (咅 ', μ μ u, ie undeposited The complex form can be repeated after the copper is reduced, for example, by vacuum, purification, heating, rinsing or the like, or the liberation of the ligand. The method is to deposit a thicker copper layer or eliminate pinholes. = The deposition of the material is usually carried out at 2, c. The copper complex is also suspended at a similar temperature, 0 to war, and better to 50. The copper is deposited on the substrate until the copper complex is exposed to the original agent to form a metallic copper film. t. Using a re-entry reducing agent to rapidly and completely reduce the copper complex. The migration agent is volatile and does not decompose when heated. "Invasive reduction" has sufficient reducing power to react quickly with the copper complex deposited on the surface of the substrate. Applicable in the ALD method, as disclosed in the patent publication H3577.doc 200808992 WO 2004/094689 A suitable reducing agent for the reduction of copper (1). One of the agents is characterized by the presence of a proton donor. The reducing agent is desirably capable of transferring at least one electron to reduce the copper ion of the complex and capable of transferring at least one proton to protonate the coordination. It is also expected that the oxidized reducing agent and the protonated ligand can be easily removed from the surface of the newly formed copper deposit. The protonated ligand is preferably purified by vacuum, by purification or by It is removed by rinsing the surface with a suitable solvent. Suitable reducing agents for the copper deposition method include 9-BBN, borane, diboron, monobenzopyrene, sputum, smoldering, diethyl sulphur , dimethyl decane 'ethyl decane, phenyl decane, decane and dioxane. Diethyl decane and decane are preferred. In one embodiment of the copper deposition process, the copper complex is introduced into the reactor chamber containing the substrate under conditions that achieve a suitable flux temperature, time, and pressure of the vaporized complex to the surface of the substrate. room. The choice of these variables (time, T, p) will depend on the individual chamber and system design and the desired treatment rate, but as a general guideline, temperatures in the range of about ^ to 汕❶^ can be used at about 10 〇. Pressures up to 180 mTorr and periods of at least 3 sec to i minutes. After at least a portion of the copper complex is deposited on the substrate, the undeposited complex vapor is removed from the chamber (eg, by extraction or purification) and the reducing agent is at a pressure of between about 50 and 760 mT Torr A chamber is introduced to reduce the adsorbed steel complex. During the reduction, the substrate was maintained at a temperature of about 〇〇 to 2 Torr. Using a suitable combination of a copper complex and a reducing agent, the reduction is I* idling (fortunately, for most complexes, it can usually be completed in the range of 1 second to several minutes) and substantially complete (eg, complete about 95 〇 / 〇 113577.doc 200808992 =1. Ideally, in less than 1 second to several minutes of exposure time, the reduction is at least 95%. It is desirable to remove the surface from the reduction strip The product of the reaction.... In one embodiment, the copper complex is copper. The RI and the ruler 2 are ethyl, and the methyl group is called the diimine complex (1). The agent is a diethyl material. The invention also provides a novel u-diimine steel complex (1).

(I) 其中(I) where

L係選自由c2-Cl5烯烴、C2_Ci5快烴 組成之群; 、腈、芳族雜環及膦 η為1或2 ;The L system is selected from the group consisting of c2-Cl5 olefins and C2_Ci5 fast hydrocarbons; the nitrile, the aromatic heterocyclic ring and the phosphine η are 1 or 2;

Rl及R2獨立地選自由Η、 焼基及Si(R4)3組成之群, 基;且R1 and R2 are independently selected from the group consisting of ruthenium, osmium and Si(R4)3;

CrC4烷基、經氟取代之 其中R4各自獨立地為CrC*烷 R3獨立地選自由Cl_C4烷基、經氟取代之Ci_C4烷基及 Sl(R )3組成之群,其中R4各自獨立地為C「C4烷基。 在一實施例中,L為直鏈末端烯烴。對於具有4_15個碳 113577.doc -12- 200808992 之烯烴而[L亦可為具有順式或反式構型之内烯烴,順 式構型較佳。L可為環㈣或雙環_。l亦可經例如 矽烷基取代。適合之烯烴包含但不限於乙烯基三 烧、烯丙基三甲基石夕烧、卜己烤、4_甲基小戊稀、^二 甲基]-丁烯及降冰片烯。L亦可為炔烴、腈或諸如二 "比嗪、三嗪或#•取代咪唾、対或三奴芳族氮雜環 亦可為膦。CrC4 alkyl, substituted by fluorine wherein R4 are each independently CrC* alkane R3 independently selected from the group consisting of a C1-C4 alkyl group, a fluorine-substituted Ci_C4 alkyl group, and Sl(R)3, wherein each R4 is independently C "C4 alkyl. In one embodiment, L is a linear terminal olefin. For an olefin having 4 to 15 carbons 113577.doc -12 to 200808992, [L may also be an internal olefin having a cis or trans configuration, Preferably, the cis configuration is L. The ring may be a ring (tetra) or a bicyclic ring. The group may also be substituted with, for example, a decyl group. Suitable olefins include, but are not limited to, vinyl trisole, allyl trimethyl sulphur, bake, 4 _Methyl pentyl, dimethyl]-butene and norbornene. L can also be an alkyne, nitrile or such as a two-biszine, triazine or #•substituted imi, 対 or three slaves The nitrogen heterocycle can also be a phosphine.

本發明亦提供式(II)之配位基The invention also provides a ligand of formula (II)

其中η為1或2 ;Where η is 1 or 2;

R1及R2獨立地選自由H、Cl_C4烷基、經氟取代之Ci_c々烷 基及Si(R4)3組成之群,其中R4各自獨立地為^-^烷基; R獨立地選自由C1-C4烷基、經氟取代之Ci-C4烷基及 Si(R4)3組成之群,其中r4各自獨立地為Ci_c4烷基。當y 為C^C:4烷基時,其亦可在烷基鏈中含有亞矽烷基,例如 -CH2SiH2CH3 或-CH2Si(H)(CH3)CH3 或-CH2Si(CH3)2CH3。 在以下實例中說明合成一種適用於製造銅錯合物之配位 基之方法。因此,1-氮雜-1-亞環烷基烷可由強鹼去質子 化,隨後用諸如酯或醯基鹵衍生物之親電子試劑處理以提 113577.doc •13- 200808992 供相應的酮基環外烯胺作為中間物。用諸如硫酸二甲酉匕之 烧化劑處理該中間物,接著添加第—㈣生所要的環夕1二 酮亞胺。或者,在由強給本所2 μ 田強驗去貝子化後’可直接將該環外酮 亞胺與亞胺醯基衍生物偶合以提供所要的_二酮亞胺❶其 他配位基可類似製備。 /、 在另-實施财,本發明提供包括沈積於基板上之結構 (I)之1,3-二亞胺銅錯合物的物品。適合之基板包含:鋼、 梦晶圓、用於製造超大規模積體電路之晶圓、用具有比二 氧化矽低之介電常數之介電材料製備之晶圓及塗以障壁層 之二氧化矽及低k基板。障壁層可用於防止銅遷移至基板 中。適合之障壁層包含:鈕、氮化鈕、鈦、氮化鈦、鈕矽 氮化物、鈦矽氮化物、鈕碳氮化物及氮化鈮。 實例 示非另外規疋’否則所有有機試劑購自Sigma-AidHchR1 and R2 are independently selected from the group consisting of H, Cl_C4 alkyl, fluorine-substituted Ci_c々 alkyl, and Si(R4)3, wherein R4 is each independently ^-^alkyl; R is independently selected from C1- A group consisting of a C4 alkyl group, a fluorine-substituted Ci-C4 alkyl group, and Si(R4)3, wherein each of r4 is independently a Ci_c4 alkyl group. When y is C^C:4 alkyl, it may also contain a decylene group in the alkyl chain, such as -CH2SiH2CH3 or -CH2Si(H)(CH3)CH3 or -CH2Si(CH3)2CH3. A method for synthesizing a ligand suitable for the manufacture of a copper complex is illustrated in the following examples. Thus, 1-aza-1-cycloalkylene can be deprotonated from a strong base, followed by treatment with an electrophile such as an ester or a hydrazine halide derivative to provide 113577.doc •13-200808992 for the corresponding keto group. An exocyclic enamine is used as an intermediate. The intermediate is treated with a burning agent such as dimethyl hydrazine, followed by the addition of the desired cycloheximide. Alternatively, the exocyclic ketimine can be directly coupled with the imin oxime derivative to provide the desired _diketimine oxime other ligands after strong benzalization of the 2 μ field. Similar preparation. Further, the present invention provides an article comprising a 1,3-diimine copper complex of the structure (I) deposited on a substrate. Suitable substrates include: steel, dream wafers, wafers used to fabricate very large scale integrated circuits, wafers prepared with dielectric materials having a lower dielectric constant than cerium oxide, and dioxide coated with barrier layers矽 and low-k substrate. The barrier layer can be used to prevent copper from migrating into the substrate. Suitable barrier layers include: button, nitride button, titanium, titanium nitride, button nitride, titanium tantalum nitride, button carbonitride and tantalum nitride. Examples show no additional regulations' otherwise all organic reagents were purchased from Sigma-AidHch

Corporation(Milwaiikee,WI5 USA)。[Cu(CH3CN)4]S03CF3 可根據描述於:Τ· 〇gUra,Transiu〇n Metai Chemistry,1, 179-182 (976)中之方法製備。 實例1 製備氮雜·2_[2_(氮雜亞丙基)環戊基]戊-2-烯 在至溫下’攪拌環戊酮(21 g,25 0 mmol)、乙胺(125 mL, 於THF中之2.0 Μ溶液)及經乾燥之分子篩(1〇〇 g)於乙醚 (300 mL)中之混合物3天。過濾反應混合物,且在減壓下 派縮慮液。在真空(65它,1() min Hg)下蒸餾經濃縮之濾 液,獲得1-氮雜亞環戊基丙烷(18 g,65%)。 113577.doc -14- 200808992 在-78°C下,將於THF(5 mL)中之7 g 1-氮雜-1-亞環戊基 丙烷(62.9 mmol)逐滴添加至LDA溶液(132.2 mmol,於250 mL THF中)。在-10°C下攪拌混合物40 min後,在下添 加乙酸乙酯(5.6 g,62·9 mmol)。當使溫度逐漸升高至室溫 時,攪拌反應混合物,且在室溫下繼續攪拌隔夜。將甲醇 (20 mL)逐滴添加至混合物,隨後在減壓下移除溶劑。在 將水(200 mL)添加至殘餘物後,用乙醚(200 mLx2)萃取混 合物。將經合併之有機層經無水MgS04乾燥,隨後過濾。 在減壓下濃縮濾液,接著管柱層析提供7.2 g β-酮基烯胺 產物(75%)。 在室溫下,將5·5 g β-酮基烯胺(35.9 mmol)及硫酸二曱 酯(4.53 g,35.9 mmol)之混合物攪拌隔夜,獲得固化混合 物。隨後,將乙胺(24 mL,46.7 mmol,2.0 Μ於 THF 中,1.3 eq)逐滴添加至混合物。在室溫下將混合物攪拌隔夜後., 在減壓下移除溶劑。在將甲氧化鈉溶液(1.94 g,於20 mL 曱醇中,35.9 mmol)添加至殘餘物後,在減壓下濃縮混合 物。將戊烷(50 mL)添加至經濃縮之殘餘物,隨後將所得 混合物過濾。在減壓下濃縮濾液,接著真空蒸餾(60°C,50 mTorr),提供5.1§產物3-氮雜-2-[2-(氮雜亞丙基)環戊基] 戊-2-烯(78%)。 實例2 製備並還原乙烯基三甲基矽烷[3-氮雜-2-[2-(氮雜亞丙 基)環戊基】戊-2-酸]銅 在乾燥箱中,將3-氮雜-2-[2-(氮雜亞丙基)環戊基]戊-2- 113577.doc -15- 200808992 烯(0·5 g5 2·77 mmol)溶解於乙醚(l〇 mL),隨後將 BuLi(1.63 mL,2·77 mmol,1·7 Μ於戊烷中)逐滴添加至該 溶液。在室溫下攪拌混合物10 min。其間將(:11[((:113(:]^4] SO3CF3(1.04 g,2·77 mmol)及乙烯基三甲基矽烷(0.83 g, 8·31 mmol)—起混合於乙醚(15 mL)中,且在室溫下攪拌混 合物10 min。將丁基鋰溶液添加至銅混合物,且在室溫下 攪拌所得混合物1 h。在真空下濃縮反應混合物,接著添 加戊烷(30 mL)至殘餘物。過濾,接著濃縮濾液,獲得黏 性油狀之所要產物(0·88 g,產率89%)。 在基板上還原:將該黏性油用作在基板上產生銅膜之銅 則驅物。基板由具有25〇埃之鈕層及1〇〇埃之銅層的二氧化 碎晶圓組成。 在乾燥箱中,將約0 04 g銅前驅物加載於瓷舟。將該舟 及晶圓(〜1 cm2)隔開約3·5吋放置於玻璃管中。將玻璃管自 乾燥箱耖除且連接於真空管線。將加熱線圈連接於玻璃 狄裒、%瓷舟周圍之區域及晶圓片周圍之區域。該組態容 許將兩個區域維持於不同溫度下。將系、統抽空之後,使氮 =流穿過該管,首先流經舟中之樣本且隨後流經晶圓。將 吕内之£力維持在LUO mT〇rr。使晶圓周圍之區域升溫 至。120 C。約1小時後,將樣本舟周圍區域之溫度升至 、隹持忒等溫度及氣流約2小時。隨後,將樣本舟周 圍之區域冷部至室溫。將該管抽空至〜mT〇rr之壓力且 用二乙基矽烷再充填。11(rc下管中之區域迅速轉變成銅 色。將設備冷卻且返回至乾燥箱。可察覺銅色更暗。重複 I13577.doc • 16 - 200808992 該方法以產生具有平滑銅膜之晶圓。 實例3 製備乙烯基三甲基矽烷[2_氮雜(氮雜亞丙基) 環戊基]丁-2-酸]銅 於-78C 在氮下,將 n-BuLi(2.89 M,37.6 mL,108.1 mmol)逐滴添加至二異丙胺(1〇·9 g,l〇8 l 於 mL)中之溶液中。在添加所有n_BuLi之後,將溫度調節為 5 C 且將反應混合物攪拌3 0 min。隨後在-5 °C下將1 -氮 雜-1-亞環戊基丙烷(5 g,51·5〇 mmol)於THF(10 mL)中之溶 液逐滴添加至反應混合物,且隨後攪拌。30 min後,在_ 78 C下經30 min逐滴添加甲硫基乙醯亞胺甲酯(5.3 g, 5 1·5 mmol)。當使溫度逐漸升高至室溫時,攪拌反應混合 物’且接著在室溫下繼續攪拌隔夜。在減壓下移除THF^ d後將3 0 mL曱醇逐滴添加至殘餘物。在移除所有揮 發性溶劑後,將戊烷(50 mLx2)添加至殘餘物,且過濾混 合物。在減壓下濃縮濾液,接著真空蒸餾(55°c,6〇 mTorr 下)提供5.3 g 2-氮雜-3-[2-(氮雜亞丙基)環戊基]丁 _2_烯 (62%)。在乾燥箱中,將氮雜_3·[2_(氮雜亞丙基)環戊基] 丁-2-烯(0.3 g5 ι·8〇 mmol)溶解於乙醚(15 mL)中,隨後將 BuLi(l ·06 mL,1.80 mmol,1 ·7 Μ於戊烧中)逐滴添力口至溶 液。在室溫下攪拌混合物1〇 min。其間將Cu[(CH3CN)d SO3CF3(0.67 g,ι·8〇 mmol)及乙稀基三甲基石夕烧(0.90 g, 9·0 mmol) —起混合於乙醚(15 mL)中,且在室溫下攪拌混 合物5 min。將丁基經溶液添加至銅混合物,且在室溫下 113577.doc •17- 200808992 攪拌所得混合物40 min。在真空下,濃縮反應混合物,接 著添加戍烷(30 mL)至殘餘物。過濾,接著濃縮濾液,獲 得白色固體狀之所要產物(0.568 g,產率94%)。Corporation (Milwaiikee, WI5 USA). [Cu(CH3CN)4]S03CF3 can be produced according to the method described in: Τ·〇gUra, Transiu〇n Metai Chemistry, 1, 179-182 (976). Example 1 Preparation of aza·2_[2_(azacyclopropyl)cyclopentyl]pent-2-ene at a temperature to stir a cyclopentanone (21 g, 25 0 mmol), ethylamine (125 mL, A mixture of 2.0 g of THF in THF and dried molecular sieves (1 g) in diethyl ether (300 mL) for 3 days. The reaction mixture was filtered, and a reducing solution was applied under reduced pressure. The concentrated filtrate was distilled under vacuum (yield: 65 (1 min)) to afford 1-azacyclopentanepropane (18 g, 65%). 113577.doc -14- 200808992 7 g of 1-aza-1-cyclopentylpropane (62.9 mmol) in THF (5 mL) was added dropwise to the LDA solution (132.2 mmol) at -78 °C. , in 250 mL THF). After the mixture was stirred at -10 °C for 40 min, ethyl acetate (5.6 g, 62·9 mmol) was added. When the temperature was gradually raised to room temperature, the reaction mixture was stirred, and stirring was continued overnight at room temperature. Methanol (20 mL) was added dropwise to the mixture, followed by removal of solvent under reduced pressure. After water (200 mL) was added to the residue, mixture was extracted with diethyl ether (200 mL×2). The combined organic layers were dried over anhydrous MgSO.sub.4 then filtered. The filtrate was concentrated under reduced pressure and then purified to give 7.2 g (yield: EtOAc). A mixture of 5·5 g of β-keto enamine (35.9 mmol) and dinonyl sulfate (4.53 g, 35.9 mmol) was stirred overnight at room temperature to obtain a solidified mixture. Subsequently, ethylamine (24 mL, 46.7 mmol, 2.0 Μ in THF, 1.3 eq) was added dropwise to the mixture. The mixture was stirred overnight at room temperature. The solvent was removed under reduced pressure. After the sodium methoxide solution (1.94 g, 35.9 mmol in 20 mL of decyl alcohol) was added to the residue, the mixture was concentrated under reduced pressure. Pentane (50 mL) was added to the concentrated residue, which was then filtered. The filtrate was concentrated under reduced pressure, followed by vacuum distillation (60 ° C, 50 m s) to afford the product of <RTI ID=0.0> 78%). Example 2 Preparation and Reduction of Vinyl Trimethyldecane [3-Aza-2-[2-(azacyclopropyl)cyclopentyl]penta-2-acid] Copper in a Drying Box, 3-Aza -2-[2-(Azacyclopropyl)cyclopentyl]pent-2- 113577.doc -15- 200808992 Alkene (0.55 g5 2·77 mmol) was dissolved in diethyl ether (10 mL), then BuLi (1.63 mL, 2.77 mmol, 1.7 Torr in pentane) was added dropwise to the solution. The mixture was stirred at room temperature for 10 min. In the meantime, (:11[(::113(:]^4] SO3CF3 (1.04 g, 2.77 mmol) and vinyltrimethylnonane (0.83 g, 8.31 mmol) were mixed with diethyl ether (15 mL) The mixture was stirred at room temperature for 10 min. The butyl lithium solution was added to the copper mixture, and the resulting mixture was stirred at room temperature for 1 h. The reaction mixture was concentrated under vacuum, then pentane (30 mL) was added. The residue was filtered, and the filtrate was concentrated to give the desired product as a viscous oil (0·88 g, yield 89%). Reduction on the substrate: the viscous oil was used as the copper film on the substrate. The substrate is composed of a oxidized chip having a button layer of 25 angstroms and a copper layer of 1 angstrom. In the drying oven, about 0 04 g of copper precursor is loaded on the porcelain boat. The wafer (~1 cm2) is placed in a glass tube separated by about 3·5 。. The glass tube is removed from the drying box and connected to the vacuum line. The heating coil is connected to the area around the glass diamond, the % porcelain boat, and The area around the wafer. This configuration allows the two areas to be maintained at different temperatures. After the system is evacuated, the nitrogen = flow through The tube first flows through the sample in the boat and then flows through the wafer. The force in Lu is maintained at LUO mT〇rr. The area around the wafer is heated to 120 C. After about 1 hour, the sample boat is taken. The temperature in the surrounding area is raised to a temperature of about 2 hours, and the temperature is about 2 hours. Then, the area around the sample boat is cooled to room temperature. The tube is evacuated to a pressure of ~mT〇rr and then with diethyl decane. Filling. 11 (The area in the rc lower tube is rapidly converted to copper. Cool the unit and return to the dry box. The copper color is perceived to be darker. Repeat I13577.doc • 16 - 200808992 This method produces a crystal with a smooth copper film Example 3. Preparation of vinyltrimethylnonane [2-aza(azacyclopropyl)cyclopentyl]butan-2-acid]copper at -78C under nitrogen, n-BuLi (2.89 M, 37.6 mL, 108.1 mmol) was added dropwise to a solution of diisopropylamine (1 〇·9 g, l 〇 8 l in mL). After all n_BuLi was added, the temperature was adjusted to 5 C and the reaction mixture was stirred 3 0 Then, a solution of 1-aza-1-cyclopentylpropane (5 g, 51·5 mmol) in THF (10 mL) was added dropwise at -5 °C. The reaction mixture was stirred, and after 30 min, methyl thioacetamide (5.3 g, 5 1.5 mmol) was added dropwise at -30 C for 30 min. While warm, stir the reaction mixture' and then continue stirring at room temperature overnight. After removing THF^d under reduced pressure, add 30 mL of decyl alcohol dropwise to the residue. After removing all volatile solvents, Pentane (50 mL x 2) was added to the residue and the mixture was filtered. The filtrate was concentrated under reduced pressure, followed by vacuum distillation (55 ° C, 6 〇m Torr) affording 5.3 g of 2-aza-3-[2-(aza-propylidene)cyclopentyl]but-2-ene ( 62%). In a dry box, aza_3·[2_(azacyclopropyl)cyclopentyl]but-2-ene (0.3 g5 ι·8 mmol) was dissolved in diethyl ether (15 mL), followed by BuLi (l · 06 mL, 1.80 mmol, 1 · 7 Μ in Ethanol) Add dropwise to the solution. The mixture was stirred at room temperature for 1 〇 min. In the meantime, Cu[(CH3CN)d SO3CF3 (0.67 g, ι·8〇mmol) and ethylene trimethyl sulphate (0.90 g, 9·0 mmol) were mixed together in diethyl ether (15 mL), and in the room. The mixture was stirred at room temperature for 5 min. The butyl solution was added to the copper mixture and the resulting mixture was stirred for 40 min at room temperature 113577.doc • 17-200808992. The reaction mixture was concentrated under vacuum, then decane (30 mL) was then evaporated. Filtration, followed by EtOAc EtOAc (EtOAc)

113577.doc 18·113577.doc 18·

Claims (1)

200808992 十、申請專利範圍: 1 ·種在基板上形成鋼沈積物之方法,其包括: a·使基板與銅錯合物⑴接觸,以在該基板上形成沈積 之銅錯合物;及 '200808992 X. Patent Application Range: 1 . A method for forming a steel deposit on a substrate, comprising: a. contacting a substrate with a copper complex (1) to form a deposited copper complex on the substrate; and ' b·使該沈積之鋼錯合物與還原劑接觸,其中: L係選自由C2-C15烯烴、c2_Cl5块烴、腈、芳族雜環及 膦組成之群; η為1或2 ; R1及R2獨立地選自由H、Ci_C4烷基、經氟取代之 烷基及Si(R4)3組成之群,其中R4各自獨立地為烷 基; R3獨立地選自Cl-C4烷基、經氟取代之Ci_C4烷基及 Si(R、,其中R4各自獨立地選自Cj_C4烷基;且 還原劑係選自由下列各物組成之群:9_硼雙環[3·3ι] 壬烷,二硼烷;BRxH3_x形式之硼烷其中χ=〇、1或2且尺 獨立地選自苯基及Cl-C1G烷基;二氫苯幷呋喃;吡唑 啉;二矽烷;SiR’yHoB式之矽烷其中y=:()、1、2或3且 R’獨立地選自苯基及CVCw烷基;及GeR"zH4 z形式之鍺 113577.doc 200808992 烧其中、1 2如枝卡 、2或3且R’’獨立地選自苯基及CVCw烷基。 山永項!之方法,其中R 3. 如請求们之方法,其中R、甲基。 4. 如請求項!之方法,其中_卜 5·如請求項 6·如請长、 法,其中乙為乙烯基三甲基矽烷。 拉、1之方法,其中該基板係選自銅、矽晶圓及塗 以一 P早壁層之二氧化矽。 7 · 如請求項1 $ f ^ , ^ ',八中該接觸包括將該基板暴露於該 銅錯合物之蒸汽。 8»如請求項1 y 、 ,/、中該方法係在〇至200。(:之溫度下進 行0 9·如請求項1 | 烧。 方去’其中該還原劑為我或二乙基石夕 1〇· —種鋼錯合物⑴,b. contacting the deposited steel complex with a reducing agent, wherein: L is selected from the group consisting of C2-C15 olefins, c2_Cl5 hydrocarbons, nitriles, aromatic heterocycles, and phosphines; η is 1 or 2; R1 and R2 is independently selected from the group consisting of H, Ci_C4 alkyl, fluoro substituted alkyl and Si(R4)3, wherein R4 are each independently alkyl; R3 is independently selected from Cl-C4 alkyl, substituted by fluorine a Ci_C4 alkyl group and Si (R, wherein R4 are each independently selected from a Cj_C4 alkyl group; and the reducing agent is selected from the group consisting of 9-borobicyclo[3·3ι] decane, diborane; a borane of the form BRxH3_x wherein χ=〇, 1 or 2 and the sizing is independently selected from the group consisting of phenyl and Cl-C1G alkyl; dihydrophenylhydrazine; pyrazoline; dioxane; SiR'yHoB-type decane wherein y= :(), 1, 2 or 3 and R' is independently selected from phenyl and CVCw alkyl; and GeR"zH4 z form 锗113577.doc 200808992 burns therein, 1 2 as a branch, 2 or 3 and R' 'Independently selected from phenyl and CVCw alkyl. The method of Shan Yongxiang!, where R 3. as the method of the requester, wherein R, methyl. 4. As the method of the request item, wherein _b 5· Request item 6· Please, the method, wherein B is vinyl trimethyl decane. The method of pulling, 1, wherein the substrate is selected from the group consisting of copper, germanium wafers and cerium oxide coated with an early P layer. 1 $ f ^ , ^ ', the contact in the eighth includes exposing the substrate to the vapor of the copper complex. 8» As in claim 1 y , , /, the method is in the range of 〇 to 200. Go to 0 9 · as requested in item 1 | Burn. Go to 'where the reducing agent is me or diethyl 夕 〇 1 · · steel complex (1), 其中among them C2-C15块烴、腈 方埃雜環及 [係選自由c2-c15烯烴、 膦組成之群; 113577.doc 200808992 η為1或2 ;且 R1及R2獨立地選自由H、Ci_C4烷基、經氟取代之 烷基及SKR4)3組成之群,其中f各自獨立地為烷 基;且 R3獨立地選自Ci_C4烷基、經氟取代之Ci_C4烷基及 Si(R、,其中R4各自獨立地選自Ci_c4烷基。 11·如請求項10之銅錯合物(1),其中a C2-C15 block hydrocarbon, a nitrile pentene ring and [selected from the group consisting of c2-c15 olefins, phosphine; 113577.doc 200808992 η is 1 or 2; and R1 and R2 are independently selected from H, Ci_C4 alkyl, a group consisting of a fluorine-substituted alkyl group and SKR4)3, wherein each f is independently an alkyl group; and R3 is independently selected from a Ci_C4 alkyl group, a fluorine-substituted Ci_C4 alkyl group, and Si (R, wherein R4 is independently Is selected from the group consisting of Ci_c4 alkyl. 11. The copper complex (1) of claim 10, wherein 乙為乙烯基三甲基矽烷;R1及R2為甲基或乙基且R3為 甲基。 … 12. 種物1112,其係藉由使一基板與如請求項1 〇之鋼錯合物 接觸而產生。 13. 如請求項12之物品,其中該基板係選自銅、矽晶圓及塗 以一障壁層之二氧化矽。 14. 如請求項13之物品,其中該障壁層係選自组、氮化组、 鈦、氮化鈦、㈣氮化物、切氮化物、组碳氮化物及 氮化銳。 15· —種式(II)之組合物,B is vinyl trimethylnonane; R1 and R2 are methyl or ethyl and R3 is methyl. 12. The species 1112 is produced by contacting a substrate with a steel complex as in claim 1 . 13. The article of claim 12, wherein the substrate is selected from the group consisting of copper, tantalum wafers, and ruthenium dioxide coated with a barrier layer. 14. The article of claim 13, wherein the barrier layer is selected from the group consisting of a group, a nitrided group, titanium, titanium nitride, (iv) nitride, a tantalum nitride, a group carbonitride, and a nitride. 15·—a composition of the formula (II), 其中η為1或2 ; 113577.doc f 200808992 R1及R2獨立地選自由Η、CrQ烷基、經氟取代之Ci-C# 烷基及Si(R4)3組成之群,其中R4各自獨立地為CrQ烷 基;且 R3獨立地選自烷基、經氟取代之CrQ烷基及 Si(R4)3,其中R4各自獨立地選自CVC4烷基。 113577.doc 200808992 七、指定代表圖: (一) 本案指定代表圖為:(無) (二) 本代表圖之元件符號簡單說明: 八、本案若有化學式時,請揭示最能顯示發明特徵的化學式:Wherein η is 1 or 2; 113577.doc f 200808992 R1 and R2 are independently selected from the group consisting of hydrazine, CrQ alkyl, fluorine-substituted Ci-C# alkyl and Si(R4)3, wherein R4 is independently CrQ alkyl; and R3 are independently selected from alkyl, fluorine-substituted CrQ alkyl and Si(R4)3, wherein each R4 is independently selected from CVC4 alkyl. 113577.doc 200808992 VII. Designated representative map: (1) The representative representative of the case is: (none) (2) The symbolic symbol of the representative figure is simple: 8. If there is a chemical formula in this case, please reveal the best indication of the characteristics of the invention. Chemical formula: 113577.doc113,577.doc
TW95128794A 2006-08-07 2006-08-07 Copper(I) complexes and processes for deposition of copper films by atomic layer deposition TW200808992A (en)

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