200807004 九、發明說明： % 【發明所屬之技術領域】 本發明係關於一種攜帶型電子裝置測試系统，尤其係 關於一種便於使用多個測試機台同時進行測試，並即時檢 測測試機台狀態之攜帶型電子裝置測試系統。 【先前技術】 在移動電話等攜帶型電子裝置之生産過程中，出廠之 •叙性能測試係必不可少之-道工序。傳統之測試系統包 括一測試機台及一與該測試機台相連接並預先安裝了測試 程式之資料處理器。、測試時’將攜帶型電子裂置置於測試 機臺上採集相關測試資料，並使用資料處理器運行測試程 式，顯示測試結果。 “王200807004 IX. INSTRUCTIONS: % TECHNICAL FIELD The present invention relates to a portable electronic device testing system, and more particularly to a portable device that facilitates simultaneous testing using multiple testing machines and instantly detects the state of the testing machine. Type electronic device test system. [Prior Art] In the production process of a portable electronic device such as a mobile phone, it is indispensable for the factory to perform the performance test. The conventional test system includes a test machine and a data processor connected to the test machine and pre-installed with the test program. During the test, the portable electronic chip is placed on the test machine to collect relevant test data, and the data processor is used to run the test program to display the test results. "king
當生産規模較大時，需要同時使用多套測試系 測試資料，最後將所有mu統|㈣之職資料卢、 ^ ’得到所需之職結果。*於每套測試系統在投二使= 雨均需要安裝測試程式，且每次之測試專㈣所變動時， 測試程式及相_m參數也經常需要隨之改動，因此，洛 所需測試祕數量較多時，在所有職系統中安裝測試: 式及設置測試參數需要大量之重復勞動，導致人力和時間 之’良費另夕卜由於各套測試系統彼此之間沒有聯繫，若 有某套測試系統之測試機台發生故障造成測試資料失真則 报難及時發現，使各測試機台之工作狀態難以掌握，可能 導致大量産品需要重新進行測試之後果，嚴重地延誤生産 過程。 200807004 【發明内容】 有雲於此，有必要提供一種可節省測試時間並可 檢測測試機台狀態之攜帶型電子裝置測試系統。 、 另外，有必要提供-種可節省測試時間並可及時 測試機台狀態之攜帶型電子裝置測試方法。 一種攜帶型電子裝置測試系統，該攜帶型電子裝 ==處理器及若干測試機台，該若干測試機 口_該-貝料處理器連接；該資料處理器包括 模組及-資贼賴組，資料賴_存賴參數，、料 處理权組同時處理各賴機台採集之測試資料，進产口 測試並檢測各測試機台之狀態。 生口口 一種攜帶型電子裝置測試方法，該方法包括 驟：提供-種攜帶型電子裝置測試系統，該攜帶 二 置測試系統包括-資料處理減若干測試機台， = 試機台同時與該資料處理器連接；該資料處理^括= 料庫模組及-㈣處理餘，㈣庫触儲相試貝 貧料處理模組同時處理各職機台採集之測試: 進行產品測試並檢測各測試機台之狀態；完成上述押 電子裝置測試系統之組裝並_上 = 子衣置料錢進行初始化；將制試之攜帶 =::内:進行産品測試工作;， 、’、、、k至資料處理模組進行分析處理，得屮丨$ 結果並檢測各測試機台之狀態。 $出測试 200807004 與習知技術相比，本發明提供之攜帶型電子裝置測試 * 系統中多個測試機台只需連接到同一個資料處理器，結構 簡單，便於組裝；本發明提供之攜帶型電子裝置測試方法 使用同一個資料處理器即可同時控制多個測試機台進行 産品測試工作，安裝測試程式及設置測試參數可以在該資 料處理器上統一設置，明顯地節省了勞動時間，同時便於 通過相互比較來檢測各測試機台之狀態。 _ 【實施方式】 請參閱圖1，本發明攜帶型電子裝置測試系統較佳實 施例包括一資料處理器1及若干測試機台2。資料處理器1 爲電腦等資料處理裝置，該資料處理器1與所有測試機台 2連接。 請參閱圖2，資料處理器1包括一網卡10、一輸入/ 輸出模組11、一資料庫模組12、一資料處理模組13、一 指令模組14及一顯示模組15。網卡10將各測試機台2同 ⑩ 時與資料處理器1連接，使資料處理器1與所有測試機台 2構成一局域網。輸入/輸出模組11用於在資料處理器1 與各测試機台2之間傳輸資料及指令。資料庫模組12用於 安裝初始測試程式、設置及儲存測試參數。資料處理模組 13用於處理各測試機台2採集之測試資料，進行産品測試 並同時檢測各測試機台2之狀態。指令模組14用於對各測 試機台2進行遠端控制。顯示模組15用於顯示測試結果及 各測試機台2之狀態。 請一併參閱圖3，每一測試機台2包括一資料採集裝 200807004 置22及-與該資料採集裝置22相連接之介面μ。資料採 集裝置22包括:測試電源221、—測試治具222及二萬用 表223。其中測試電源221與測讀、、Λ目 、、二且999盥茧用本on ”" /σ /、222相連接’測試 Γ ίί 連接，萬絲223與介面24相連 接。母1面24均與資料處理器1之網卡1〇相連接，可 在測試機台2與資料處理器i之間傳輸資料及指令。 請參閱圖4,本發明攜帶型電子裝置測試方法之較佳 實施例即使霞攜帶型電子裝置職线對攜帶 置産品進行㈣測試。該本發明攜帶型電子裝置測試枝 之較佳實施例主要包括以下步驟： 對本發明攜帶型電子裝置測試系統進行組裝， 測試機台2之介面24均連接至資料處理器i之 有 (步驟 S1)。 完成組裝後，開啓該攜帶型電子裝置測試系統中資 處理器1及各測試機台2之電源（步驟S2)。 貝4 開始對該攜帶型電子裝置測試系統進行初始化（步 53) ，其具體方法係通過資料處理器工之資料庫模組 裝初始測試程式（步驟S301)並設置測試參數（步驟 S302)。可以理解，若該攜帶型電子裝置測試系統迷非初 次使用，測試程式已經儲存在系統内，則步驟S3〇1可以 省略，直接執行步驟S302即可完成系統初始化。 系統初始化完成後，即可開始産品測試工作（步驟 54) 。開啓各測試電源221 (步驟S401)，分別將多個待測 試之攜γ型電子裝置産品以正確之方式安放於各測試機a 200807004 ..2之測試治具222内（步驟S402)，然後通過指令模組14 操縱各測試治具222及各萬用表223，令各萬用表223通 過測試治具222依次接通産品内部待測試之各類電路，按 照測試程式採集産品内部各類電路之電壓、電流及電阻等 測試資料（步驟S403)。 每一測試機台2將産品之測試資料採集完畢後，即通 過介面24將測試資料統一傳送至輸入/輸出模組η，然後 _ 輸入/輸出模組11將各測試機台2採集之測試資料傳送至 貧料處理模組13進行分析處理（步驟S5)，資料處理模組 13同時將各測試機台2採集之測試資料與資料庫模組12 内儲存之測試參數進行比較，若産品測試資料未超過測試 參數規定之合格範圍，則該産品可以通過測試，反之則不 能通過测試。 在對産品進行測試之同時，資料處理模組13也將各 測試機台2採集之同類測試資料及得出之測試結果互相進 •打比較以檢測各測試機台2之狀態（步驟S501)，若某測 "式機、口 2採集之測試資料與其他測試機台2採集之同類測 忒貝料存在超過預先設定之測試參數範圍之較大偏差，或 測试結果表明該測試機台2之測試通過率與其他測試機台 2 則減通過率存在較大偏差，則通過顯示模組15顯示該 式機° 2狀態異常（步驟S502)，此時可以通過指令模 ▲ 14操縱該測試機台暫時停止工作（步驟S503)，以防止 軏大數里之產品出現測試失誤，也可提醒操作人員及時地 進灯檢刪及維修以及時排除故障（步驟S5f〇4)，維修成功 200807004 .·後可相步驟S4’繼續完成以下各步驟之測試工作。 軸産品之賴結果通過顯示模組15進行顯示（牛 •驟S505)。在測試機台2正常工作之情況下，一個產品^ 試完畢後，系統可由人工作業或程式自動判斷係否還有待 測試産品（步驟S6)。若還有其他待測試産品，則返回步 驟S402,向測試治具222内安放下一個産品開始新一輪測 試，如此重復㈣S402至步驟糊，直至沒有剩餘之待 φ 測産品，即可結束本次測試工作。 可以理解，測試機台2上之資料採集裝置22還可以 裝配測力计、感測器、影像感測器等測量裝置，這樣即可 使用本發明攜f型電子裝置測試系統較佳實施例及本發明 攜π型電子裝置測試方法較佳實施例來進行攜帶型電子穿 置之結構力學測試及帶有拍攝功能之攜帶型電子裝置之^ 學性能測試，只要將上述各種測量裝置均通過介面24與資 料處理益1相連，使上述各種測量裝置採集之各類測試資 肇料均可以通過資料處理器！進行處理及顯示即可。、 綜上所述，本發明符合發明專利要件，爰依法提出專 利申請。惟，以上所述者僅為本發明之較佳實施例，本發 明=範圍並不以上述實施例為限，舉凡熟習本案技藝之人 士板依本發明之精神所作之等效修飾或變化，皆應涵蓋於 以下申請專利範圍内。 【圖式簡單說明】 圖1爲本發明攜帶型電子裝置測試系統較佳實施例之 結構方塊圖。When the scale of production is large, it is necessary to use multiple sets of test system test materials at the same time, and finally get all the results of the job information of the mu system|(4). * In each test system, if you need to install a test program for rain, and the test program and phase _m parameters are often changed each time the test (4) changes, the test secret is required. When the quantity is large, the test is installed in all job systems: The formula and the setting of the test parameters require a lot of duplication of labor, resulting in a good expense for manpower and time. Because each test system has no connection with each other, if there is a set If the test machine's test machine is faulty, the test data is distorted and the report is difficult to find in time, making the working status of each test machine difficult to master, which may result in a large number of products needing to be re-tested, which seriously delays the production process. 200807004 [Summary of the Invention] In view of this, it is necessary to provide a portable electronic device test system which can save test time and can detect the state of the test machine. In addition, it is necessary to provide a portable electronic device test method that can save test time and test the state of the machine in time. A portable electronic device testing system, the portable electronic device==processor and a plurality of testing machines, the plurality of testing machine ports _ the-before processing processor connection; the data processor comprises a module and a thief group The data _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ A method for testing a portable electronic device, the method comprising: providing a portable electronic device testing system, the carrying two-in-one testing system comprising - data processing minus a plurality of testing machines, = testing the machine simultaneously with the data Processor connection; the data processing includes: the library module and - (4) processing remainder, (4) the library touches the phase test and the barren material processing module simultaneously processes the test of each job machine: test the product and test each test machine The status of the station; complete the assembly of the above-mentioned electronic device test system and _ upper = sub-clothing money for initialization; carry the test carrier =:: inside: carry out product testing work;, , ',,, k to data processing The module performs analysis and processing, and the result is obtained and the status of each test machine is detected. $出测试200807004 Compared with the prior art, the portable electronic device test* system provided by the present invention only needs to be connected to the same data processor, and has a simple structure and is easy to assemble; The electronic device test method can simultaneously control multiple test machines for product testing by using the same data processor. The installation test program and setting test parameters can be uniformly set on the data processor, which obviously saves labor time and simultaneously saves labor time. It is convenient to check the status of each test machine by comparing with each other. EMBODIMENT Referring to FIG. 1, a preferred embodiment of the portable electronic device testing system of the present invention includes a data processor 1 and a plurality of testing machines 2. The data processor 1 is a data processing device such as a computer, and the data processor 1 is connected to all of the test machines 2. Referring to FIG. 2, the data processor 1 includes a network card 10, an input/output module 11, a database module 12, a data processing module 13, a command module 14, and a display module 15. The network card 10 connects each test machine 2 to the data processor 1 at the same time as 10, so that the data processor 1 and all the test machines 2 constitute a local area network. The input/output module 11 is used to transfer data and instructions between the data processor 1 and each test machine 2. The database module 12 is used to install initial test programs, set up and store test parameters. The data processing module 13 is configured to process the test data collected by each test machine 2, perform product testing, and simultaneously detect the status of each test machine 2. The command module 14 is used for remote control of each test machine 2. The display module 15 is used to display the test results and the status of each test machine 2. Referring to FIG. 3 together, each test machine 2 includes a data acquisition device 200807004 and a interface μ connected to the data acquisition device 22. The data collection device 22 includes a test power source 221, a test fixture 222, and a 20,000 table 223. The test power supply 221 is connected to the test, the watch, the second, the 999, and the "on" " /σ /, 222 is connected to the test Γ ίί connection, and the Wans 223 is connected to the interface 24. Both are connected to the network card 1 of the data processor 1, and can transmit data and commands between the test machine 2 and the data processor i. Referring to FIG. 4, the preferred embodiment of the portable electronic device testing method of the present invention is even The Xia portable electronic device line performs (4) testing on the portable product. The preferred embodiment of the portable electronic device test branch of the present invention mainly comprises the following steps: assembling the portable electronic device testing system of the present invention, and testing the machine 2 The interface 24 is connected to the data processor i (step S1). After the assembly is completed, the power of the processor 1 and each test machine 2 of the portable electronic device test system is turned on (step S2). The portable electronic device test system performs initialization (step 53), and the specific method is to assemble an initial test program by using a data warehouse tool (step S301) and set test parameters (step S302). Understand that if the portable electronic device test system is not used for the first time and the test program is already stored in the system, step S3〇1 can be omitted, and the system initialization can be completed by directly performing step S302. After the system initialization is completed, the product can be started. Test work (step 54). Turn on each test power supply 221 (step S401), and respectively place a plurality of γ-type electronic device products to be tested in the test fixture 222 of each test machine a 200807004 .. 2 in the correct manner. (Step S402), and then the test fixtures 222 and the multimeters 223 are operated by the command module 14, so that the multimeters 223 sequentially turn on the various circuits to be tested in the product through the test fixtures 222, and collect the internal products according to the test program. Test data such as voltage, current and resistance of the circuit (step S403). After each test machine 2 collects the test data of the product, the test data is uniformly transmitted to the input/output module η through the interface 24, and then _ The input/output module 11 transmits the test data collected by each test machine 2 to the lean processing module 13 for analysis processing (step S5), and the data The processing module 13 simultaneously compares the test data collected by each test machine 2 with the test parameters stored in the database module 12. If the product test data does not exceed the qualified range specified by the test parameters, the product can pass the test, and vice versa. In the test of the product, the data processing module 13 also compares and compares the test data collected by each test machine 2 with the test results obtained to test each test machine 2 State (step S501), if the test data collected by a test "machine and port 2 and the similar test bead material collected by other test machine 2 have a larger deviation than the preset test parameter range, or the test result It indicates that the test pass rate of the test machine 2 is greatly different from that of the other test machine 2, and the display unit 15 displays the state of the machine 2 state abnormality (step S502), and at this time, the command mode can be passed. ▲ 14 manipulating the test machine temporarily stops working (step S503), in order to prevent the test error of the products in the large number, and also remind the operator to enter the light check and delete in time. Repair and troubleshooting (step S5f〇4), maintenance success 200,807,004. Relative step S4 'to finish testing the following steps after ·. The result of the axis product is displayed by the display module 15 (S). In the case where the test machine 2 is working normally, after a product is tested, the system can automatically determine whether there is still a product to be tested by a manual operation or a program (step S6). If there are other products to be tested, return to step S402, and place a next product in the test fixture 222 to start a new round of testing, and then repeat (4) S402 to the step paste until there is no remaining product to be tested, and the test can be ended. jobs. It can be understood that the data acquisition device 22 on the test machine 2 can also be equipped with a measuring device such as a dynamometer, a sensor, an image sensor, etc., so that the preferred embodiment of the f-type electronic device test system of the present invention can be used. The preferred embodiment of the π-type electronic device testing method of the present invention carries out the structural mechanical test of the portable electronic device and the performance test of the portable electronic device with the shooting function, as long as the above various measuring devices pass through the interface 24 It is connected with the data processing benefit 1, so that all kinds of test materials collected by the above various measuring devices can pass through the data processor! It can be processed and displayed. In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. However, the above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and those skilled in the art will be equivalently modified or changed according to the spirit of the present invention. It should be covered by the following patent application. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a block diagram showing a preferred embodiment of a portable electronic device test system of the present invention.
11 200807004 圖2爲本發明攜帶型電子裝置測試系統較佳實施例中 資料處理器之功能模組圖。 圖3爲本發明攜帶型電子裝置測試系統較佳實施例中 任一測試機台與資料處理器相連接之方塊圖。 圖4爲本發明攜帶型電子裝置測試方法較佳實施例之 工作步驟流程圖。 【主要元件符號說明】 資料處理器 1 網卡 10 輸入/輸出模組 11 資料庫模組 12 資料處理模組 13 指令模組 14 顯示模組 15 測試機台 2 資料採集裝置 22 測試電源 221 測試治具 222 萬用表 223 介面 24 1211 200807004 FIG. 2 is a functional block diagram of a data processor in a preferred embodiment of the portable electronic device testing system of the present invention. 3 is a block diagram showing a connection between a test machine and a data processor in a preferred embodiment of the portable electronic device test system of the present invention. 4 is a flow chart showing the working steps of a preferred embodiment of the portable electronic device testing method of the present invention. [Main component symbol description] Data processor 1 NIC 10 Input/output module 11 Database module 12 Data processing module 13 Command module 14 Display module 15 Test machine 2 Data acquisition device 22 Test power supply 221 Test fixture 222 Multimeter 223 Interface 24 12