TW200745892A - Method and system for predicting shrinkable yield for business assessment of integrated circuit design shrink and related cost benefits predicting method - Google Patents
Method and system for predicting shrinkable yield for business assessment of integrated circuit design shrink and related cost benefits predicting methodInfo
- Publication number
- TW200745892A TW200745892A TW096115565A TW96115565A TW200745892A TW 200745892 A TW200745892 A TW 200745892A TW 096115565 A TW096115565 A TW 096115565A TW 96115565 A TW96115565 A TW 96115565A TW 200745892 A TW200745892 A TW 200745892A
- Authority
- TW
- Taiwan
- Prior art keywords
- predicting
- integrated circuit
- shrinkable
- yield
- circuit design
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q30/00—Commerce
- G06Q30/02—Marketing; Price estimation or determination; Fundraising
- G06Q30/0283—Price estimation or determination
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/04—Forecasting or optimisation specially adapted for administrative or management purposes, e.g. linear programming or "cutting stock problem"
Landscapes
- Business, Economics & Management (AREA)
- Engineering & Computer Science (AREA)
- Strategic Management (AREA)
- Development Economics (AREA)
- Economics (AREA)
- Theoretical Computer Science (AREA)
- Game Theory and Decision Science (AREA)
- Entrepreneurship & Innovation (AREA)
- Marketing (AREA)
- Finance (AREA)
- Accounting & Taxation (AREA)
- Human Resources & Organizations (AREA)
- Physics & Mathematics (AREA)
- General Business, Economics & Management (AREA)
- General Physics & Mathematics (AREA)
- Tourism & Hospitality (AREA)
- Quality & Reliability (AREA)
- Operations Research (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Management, Administration, Business Operations System, And Electronic Commerce (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US80830706P | 2006-05-25 | 2006-05-25 | |
US11/486,521 US8577717B2 (en) | 2006-05-25 | 2006-07-13 | Method and system for predicting shrinkable yield for business assessment of integrated circuit design shrink |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200745892A true TW200745892A (en) | 2007-12-16 |
TWI341979B TWI341979B (en) | 2011-05-11 |
Family
ID=38750691
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW96115565A TWI341979B (en) | 2006-05-25 | 2007-05-02 | Method and system for predicting shrinkable yield for business assessment of integrated circuit design shrink and related cost benefits predicting method |
Country Status (2)
Country | Link |
---|---|
US (1) | US8577717B2 (zh) |
TW (1) | TWI341979B (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100088129A1 (en) * | 2008-10-03 | 2010-04-08 | Chih-Shih Wei | Technology Selection and Pricing System |
US8286119B2 (en) * | 2009-01-30 | 2012-10-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Systematic method for variable layout shrink |
CN104076686A (zh) * | 2013-03-29 | 2014-10-01 | 沈阳铝镁设计研究院有限公司 | 一种氧化铝生产过程动态成本控制方法 |
US9703907B2 (en) | 2015-10-27 | 2017-07-11 | International Business Machines Corporation | RAS evaluation for circuit element |
US11545495B2 (en) * | 2017-06-29 | 2023-01-03 | Taiwan Semiconductor Manufacturing Co., Ltd. | Preventing gate-to-contact bridging by reducing contact dimensions in FinFET SRAM |
US10685161B2 (en) * | 2018-08-20 | 2020-06-16 | Taiwan Semiconductor Manufacturing Company Ltd. | Region based shrinking methodology for integrated circuit layout migration |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5552995A (en) * | 1993-11-24 | 1996-09-03 | The Trustees Of The Stevens Institute Of Technology | Concurrent engineering design tool and method |
US6066179A (en) * | 1997-06-13 | 2000-05-23 | University Of Edinburgh | Property estimation of an integrated circuit |
CN1160776C (zh) | 1999-03-01 | 2004-08-04 | 松下电器产业株式会社 | 晶体管最优化方法、集成电路布局设计方法及其相应装置 |
US6658375B1 (en) * | 1999-03-15 | 2003-12-02 | Isola Laminate Systems, Inc. | Compensation model and registration simulation apparatus and method for manufacturing of printed circuit boards |
US6470229B1 (en) * | 1999-12-08 | 2002-10-22 | Yield Dynamics, Inc. | Semiconductor yield management system and method |
US7231374B1 (en) * | 2000-05-16 | 2007-06-12 | Cypress Semiconductor Corp. | Scheme for evaluating costs and/or benefits of manufacturing technologies |
US7337149B2 (en) * | 2000-12-12 | 2008-02-26 | International Business Machines Corporation | System and methodology for calculating the cost of future semiconductor products using regression analysis of historical cost data |
US20040078310A1 (en) * | 2002-10-17 | 2004-04-22 | Louis Shaffer | System and method for determining a return-on-investment in a semiconductor or data storage fabrication facility |
US6996790B2 (en) * | 2003-01-30 | 2006-02-07 | Synopsys, Inc. | System and method for generating a two-dimensional yield map for a full layout |
US6868301B1 (en) * | 2003-02-11 | 2005-03-15 | Kla-Tencor Corporation | Method and application of metrology and process diagnostic information for improved overlay control |
JP2004273903A (ja) * | 2003-03-11 | 2004-09-30 | Renesas Technology Corp | 回路シミュレータおよびシミュレーションシステム |
US20050049911A1 (en) * | 2003-08-29 | 2005-03-03 | Accenture Global Services Gmbh. | Transformation opportunity indicator |
US7013441B2 (en) * | 2003-09-26 | 2006-03-14 | International Business Machines Corporation | Method for modeling integrated circuit yield |
JP2005250874A (ja) * | 2004-03-04 | 2005-09-15 | Toshiba Corp | 回路シミュレーション装置、回路シミュレーション方法を格納するコンピュータ記録媒体及び回路シミュレーションプログラム |
JP2005258080A (ja) * | 2004-03-11 | 2005-09-22 | Matsushita Electric Ind Co Ltd | レイアウトデータ検証方法、マスクパターン検証方法および回路動作検証方法 |
US20060095237A1 (en) * | 2004-10-28 | 2006-05-04 | Weidong Wang | Semiconductor yield management system and method |
US7441211B1 (en) * | 2005-05-06 | 2008-10-21 | Blaze Dfm, Inc. | Gate-length biasing for digital circuit optimization |
US7308669B2 (en) * | 2005-05-18 | 2007-12-11 | International Business Machines Corporation | Use of redundant routes to increase the yield and reliability of a VLSI layout |
US7564017B2 (en) * | 2005-06-03 | 2009-07-21 | Brion Technologies, Inc. | System and method for characterizing aerial image quality in a lithography system |
-
2006
- 2006-07-13 US US11/486,521 patent/US8577717B2/en not_active Expired - Fee Related
-
2007
- 2007-05-02 TW TW96115565A patent/TWI341979B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TWI341979B (en) | 2011-05-11 |
US8577717B2 (en) | 2013-11-05 |
US20070276770A1 (en) | 2007-11-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200741494A (en) | Methods and apparatus for improving operation of an electronic device manufacturing system | |
WO2007076080A3 (en) | Analyzing content to determine context and serving relevant content based on the context | |
WO2009105339A3 (en) | Systems and methods for providing electronic transaction auditing and accountability | |
IL194741A (en) | Method for providing login information at @ terminal | |
EP2101147A4 (en) | SYSTEM, INFORMATION TRANSMISSION METHOD, AND COMPUTER PROGRAM | |
TW200745892A (en) | Method and system for predicting shrinkable yield for business assessment of integrated circuit design shrink and related cost benefits predicting method | |
TWI365666B (en) | Information processing apparatus and method, and computer program therefor | |
TWI370966B (en) | Apparatus, method and computer program for processing information | |
EP1949117A4 (en) | TANDEM MANIPULATION SYSTEM AND METHOD FOR REDUCING THE INDEXING TIME | |
SG133608A1 (en) | Method to determine the value of process parameters based on scatterometry data | |
WO2008103398A3 (en) | Pattern searching methods and apparatuses | |
WO2008088652A3 (en) | Method and system for generating a predictive analysis of the performance of peer reviews | |
EP1952280A4 (en) | SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR SEARCH AND ANALYSIS ON CONCEPT BASE | |
EP1941434A4 (en) | SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR PROVIDING TRAVEL INFORMATION USING INFORMATION OBTAINED FROM OTHER TRAVELERS | |
EP2000917A4 (en) | INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM | |
WO2008051364A3 (en) | Method for using image depth information | |
EP1977205A4 (en) | RAMAN + LIBS COMBINED DETECTION METHOD AND SYSTEM | |
GB0802989D0 (en) | System, method and computer program for selecting an information provider | |
SG157252A1 (en) | Data quality analyzing method and system | |
FR2926375B1 (fr) | Procede d'execution d'une application informatique, kit et aeronef associes | |
WO2007038405A3 (en) | Apparatus and method to estimate the value of a work process and determine gaps in current and desired states | |
WO2008081295A3 (en) | Method and system for indicating links in a document | |
GB0921239D0 (en) | Map data processor and method for processing information based on map data | |
GB0405410D0 (en) | Method for computer booting | |
WO2007098426A3 (en) | Methods and apparatus for data analysis |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |