TW200745505A - Method and system for measuring the shape of a reflective surface - Google Patents

Method and system for measuring the shape of a reflective surface

Info

Publication number
TW200745505A
TW200745505A TW096111631A TW96111631A TW200745505A TW 200745505 A TW200745505 A TW 200745505A TW 096111631 A TW096111631 A TW 096111631A TW 96111631 A TW96111631 A TW 96111631A TW 200745505 A TW200745505 A TW 200745505A
Authority
TW
Taiwan
Prior art keywords
pattern
camera
measuring
shape
reflective surface
Prior art date
Application number
TW096111631A
Other languages
Chinese (zh)
Other versions
TWI348018B (en
Inventor
Stephan Wienand
Armin Rudert
Original Assignee
Isra Surface Vision Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Isra Surface Vision Gmbh filed Critical Isra Surface Vision Gmbh
Publication of TW200745505A publication Critical patent/TW200745505A/en
Application granted granted Critical
Publication of TWI348018B publication Critical patent/TWI348018B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning

Abstract

A method for measuring the shape of a reflective surface and a respective system are described. The system provides a pattern (15) for reflection at a reflecting, mirroring surface (14) and at least one camera (1) for a pixel-wise inspection of the pattern (15) reflected on the surface (14) wherein the position and orientation of the camera (1) and the pattern (15) are known. For reaching a reliable measurement of the reflecting surface with low device effort, the surface angle and the surface height are determined for the measurement of the form from the directions of the lines of sight of the camera known for each pixel (8) and the positions of the pattern (15) corresponding to the image of the reflected pattern (15) on pixels (8) of the camera.
TW096111631A 2006-04-05 2007-04-02 Method and system for measuring the shape of a reflective surface, and method for calibrating the system TWI348018B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102006015792A DE102006015792A1 (en) 2006-04-05 2006-04-05 Method and system for measuring the shape of a reflective surface

Publications (2)

Publication Number Publication Date
TW200745505A true TW200745505A (en) 2007-12-16
TWI348018B TWI348018B (en) 2011-09-01

Family

ID=38042763

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111631A TWI348018B (en) 2006-04-05 2007-04-02 Method and system for measuring the shape of a reflective surface, and method for calibrating the system

Country Status (10)

Country Link
US (1) US8064069B2 (en)
EP (2) EP2040026B1 (en)
JP (2) JP5334835B2 (en)
KR (2) KR101318866B1 (en)
CN (2) CN101416022B (en)
AT (2) ATE475062T1 (en)
DE (3) DE102006015792A1 (en)
ES (2) ES2360239T3 (en)
TW (1) TWI348018B (en)
WO (1) WO2007115621A2 (en)

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KR101893771B1 (en) * 2012-05-10 2018-08-31 삼성전자주식회사 Apparatus and method for processing 3d information
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WO2015095101A1 (en) * 2013-12-19 2015-06-25 Corning Incorporated Methods for determining a shape of a substantially cylindrical specular reflective surface
WO2015164214A1 (en) * 2014-04-22 2015-10-29 The Government of the United State of America as represented by the Secretary of the Navy System and method for sun glint correction of split focal plane visibile and near infrared imagery
DE102014115336A1 (en) * 2014-10-21 2016-04-21 Isra Surface Vision Gmbh Method for determining a local power and device therefor
US9818021B2 (en) 2014-10-21 2017-11-14 Isra Surface Vision Gmbh Method for determining a local refractive power and device therefor
DE102014115331A1 (en) * 2014-10-21 2016-04-21 Isra Surface Vision Gmbh Method and device for determining a three-dimensional distortion
US9774093B2 (en) * 2015-03-20 2017-09-26 The Boeing Company Automated reflector tuning systems and methdos
US9933251B2 (en) * 2015-06-26 2018-04-03 Glasstech, Inc. Non-contact gaging system and method for contoured glass sheets
US9841276B2 (en) 2015-06-26 2017-12-12 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured glass sheet
US9851200B2 (en) 2015-06-26 2017-12-26 Glasstech, Inc. Non-contact gaging system and method for contoured panels having specular surfaces
US9470641B1 (en) 2015-06-26 2016-10-18 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured glass sheets
US9952037B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured sheet
US9952039B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured panels having specular surfaces
US9958259B2 (en) 2016-01-12 2018-05-01 Canon Kabushiki Kaisha Depth value measurement
US9996905B2 (en) * 2016-03-16 2018-06-12 Planet Labs, Inc. Systems and methods for enhancing object visibility for overhead imaging
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CN106441149B (en) * 2016-09-05 2019-04-16 上海晶电新能源有限公司 It is a kind of based on more range estimations away from tower secondary reflection mirror surface type detection system and method
TWI620926B (en) 2016-11-04 2018-04-11 財團法人工業技術研究院 Workpiece surface detection method and system using the same
CN107860333B (en) * 2017-10-26 2020-01-24 常熟理工学院 Automobile windshield detection device and automobile windshield detection system
AU2019212751A1 (en) * 2018-01-26 2020-09-03 Vehicle Service Group, Llc Vehicle surface scanning system
CN108444391A (en) * 2018-03-16 2018-08-24 浙江大学 The measuring device and measuring method of solid suspension height in the transparent stirred tank of multiphase
DE102019208474A1 (en) * 2019-06-11 2020-12-17 Micro-Epsilon Messtechnik Gmbh & Co. Kg Method and system for optically measuring an object with a reflective and / or partially reflective surface and a corresponding measuring arrangement
CN114041039A (en) * 2019-06-28 2022-02-11 株式会社高迎科技 Apparatus and method for determining three-dimensional image of object
CN110360930A (en) * 2019-08-29 2019-10-22 江苏集萃华科智能装备科技有限公司 A kind of laser displacement normal sensor and its measurement method
KR20220158987A (en) 2021-05-25 2022-12-02 (주)와이엔디케이 High speed Non contact Type Figure Inspection Method with Large area Freeform Surface Using Phase Measuring Deflectometry
DE102021123880A1 (en) 2021-09-15 2023-03-16 Isra Vision Gmbh Method and device for detecting local defects on a reflective surface
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Also Published As

Publication number Publication date
ES2348902T3 (en) 2010-12-16
EP2040026B1 (en) 2010-05-19
CN101416022B (en) 2012-05-23
ES2360239T3 (en) 2011-06-02
JP2011227093A (en) 2011-11-10
KR101318866B1 (en) 2013-10-17
WO2007115621A3 (en) 2007-12-06
DE502007004485D1 (en) 2010-09-02
EP2040026A2 (en) 2009-03-25
US8064069B2 (en) 2011-11-22
EP2002203B1 (en) 2010-07-21
EP2040026A3 (en) 2009-04-01
JP2009532685A (en) 2009-09-10
JP5334835B2 (en) 2013-11-06
EP2002203A2 (en) 2008-12-17
DE502007003867D1 (en) 2010-07-01
WO2007115621A2 (en) 2007-10-18
TWI348018B (en) 2011-09-01
CN101416022A (en) 2009-04-22
KR101266115B1 (en) 2013-05-27
US20100060905A1 (en) 2010-03-11
CN102305602B (en) 2014-10-01
CN102305602A (en) 2012-01-04
JP5623347B2 (en) 2014-11-12
ATE468522T1 (en) 2010-06-15
KR20090031854A (en) 2009-03-30
ATE475062T1 (en) 2010-08-15
DE102006015792A1 (en) 2007-10-18

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees