TW200742761A - Slurry and method for chemical mechanical polishing - Google Patents
Slurry and method for chemical mechanical polishingInfo
- Publication number
- TW200742761A TW200742761A TW096102175A TW96102175A TW200742761A TW 200742761 A TW200742761 A TW 200742761A TW 096102175 A TW096102175 A TW 096102175A TW 96102175 A TW96102175 A TW 96102175A TW 200742761 A TW200742761 A TW 200742761A
- Authority
- TW
- Taiwan
- Prior art keywords
- slurry
- mechanical polishing
- chemical mechanical
- viscosity
- cps
- Prior art date
Links
- 239000002002 slurry Substances 0.000 title abstract 3
- 238000005498 polishing Methods 0.000 title abstract 2
- 239000000126 substance Substances 0.000 title abstract 2
- 238000000034 method Methods 0.000 title 1
- 239000008367 deionised water Substances 0.000 abstract 1
- 229910021641 deionized water Inorganic materials 0.000 abstract 1
- 239000004034 viscosity adjusting agent Substances 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01F—COMPOUNDS OF THE METALS BERYLLIUM, MAGNESIUM, ALUMINIUM, CALCIUM, STRONTIUM, BARIUM, RADIUM, THORIUM, OR OF THE RARE-EARTH METALS
- C01F7/00—Compounds of aluminium
- C01F7/02—Aluminium oxide; Aluminium hydroxide; Aluminates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1472—Non-aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Inorganic Chemistry (AREA)
- Geology (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
A chemical mechanical polishing slurry, contains an abrasive dispersed in deionized water and an organic viscosity modifier added to adjust the viscosity of the slurry to within a range of 0.5 to 3.2 cps.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20060043128 | 2006-05-12 | ||
KR1020060062212A KR100842742B1 (en) | 2006-05-12 | 2006-07-03 | Slurry and method for chemical mechanical polishing |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200742761A true TW200742761A (en) | 2007-11-16 |
TWI350306B TWI350306B (en) | 2011-10-11 |
Family
ID=38897873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096102175A TWI350306B (en) | 2006-05-12 | 2007-01-19 | Slurry and method for chemical mechanical polishing |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100842742B1 (en) |
CN (2) | CN101070453A (en) |
TW (1) | TWI350306B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110120342A (en) * | 2019-05-10 | 2019-08-13 | 珠海格力电器股份有限公司 | Semiconductor technology, the production method of semiconductor devices and semiconductor devices |
CN115724590A (en) * | 2021-08-31 | 2023-03-03 | 广东艾檬电子科技有限公司 | Mask structure, etching method and glass structure |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3768401B2 (en) * | 2000-11-24 | 2006-04-19 | Necエレクトロニクス株式会社 | Chemical mechanical polishing slurry |
-
2006
- 2006-07-03 KR KR1020060062212A patent/KR100842742B1/en not_active IP Right Cessation
-
2007
- 2007-01-19 TW TW096102175A patent/TWI350306B/en not_active IP Right Cessation
- 2007-05-10 CN CNA2007101032565A patent/CN101070453A/en active Pending
- 2007-05-10 CN CN2012100374496A patent/CN102618172A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
CN102618172A (en) | 2012-08-01 |
KR20070109753A (en) | 2007-11-15 |
CN101070453A (en) | 2007-11-14 |
KR100842742B1 (en) | 2008-07-01 |
TWI350306B (en) | 2011-10-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |