TW200741929A - Device and method for embedded testing and test device for embedding in scribe line on wafer - Google Patents
Device and method for embedded testing and test device for embedding in scribe line on waferInfo
- Publication number
- TW200741929A TW200741929A TW095114660A TW95114660A TW200741929A TW 200741929 A TW200741929 A TW 200741929A TW 095114660 A TW095114660 A TW 095114660A TW 95114660 A TW95114660 A TW 95114660A TW 200741929 A TW200741929 A TW 200741929A
- Authority
- TW
- Taiwan
- Prior art keywords
- testing
- wafer
- digitizer
- embedded
- scribe line
- Prior art date
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
A device and method for embedded testing and test device for embedding in scribe line on wafer are disclosed. The device is used for testing at least one IC on wafer. And the testing device is used for converting outputs of several IC chips into digital codes. The embedded testing device includes a digitizer and a testing platform. And the testing device which is embedded in scribe line on wafer includes a digitizer. The digitizer which is embedded in wafer is electrically connected with the output of the IC is used for translating the output value into the digital code. A testing platform which is electrically connected with the output of the digitizer is used for providing at least one testing pattern to the IC. Besides, a platform is used for receiving the digital code from the digitizer. After received the digital code, the platform also verified the digital code.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95114660A TWI303091B (en) | 2006-04-25 | 2006-04-25 | Device and method for embedded test ing and test device for embedding in scribe line on wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95114660A TWI303091B (en) | 2006-04-25 | 2006-04-25 | Device and method for embedded test ing and test device for embedding in scribe line on wafer |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200741929A true TW200741929A (en) | 2007-11-01 |
TWI303091B TWI303091B (en) | 2008-11-11 |
Family
ID=45070631
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW95114660A TWI303091B (en) | 2006-04-25 | 2006-04-25 | Device and method for embedded test ing and test device for embedding in scribe line on wafer |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI303091B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI395952B (en) * | 2008-05-21 | 2013-05-11 | Advantest Corp | Testing wafer unit and test system |
-
2006
- 2006-04-25 TW TW95114660A patent/TWI303091B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI395952B (en) * | 2008-05-21 | 2013-05-11 | Advantest Corp | Testing wafer unit and test system |
Also Published As
Publication number | Publication date |
---|---|
TWI303091B (en) | 2008-11-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200625586A (en) | Semiconductor package, ID generating system thereof, ID recognizing system thereof, ID recognition method thereof, semiconductor integrated circuit chip, ID generating system thereof, ID recognizing system thereof, and ID recognition method thereof | |
TW200626917A (en) | Low cost test for IC's or electrical modules using standard reconfigurable logic devices | |
TW200707614A (en) | Testing method detecting localized failure on a semiconductor wafer | |
ATE453155T1 (en) | UNIVERSAL BIDIRECTIONAL SERIAL DATA TRANSPORT INTERFACE AND DATA TRANSPORT METHOD THEREOF | |
MX2010004391A (en) | Technique and apparatus to perform a leak off test in a well. | |
WO2011150409A3 (en) | Solution for full speed, parallel dut testing | |
TW200745867A (en) | Universal interface apparatus and method | |
WO2007024794A3 (en) | Heater chip test circuit and methods for using the same | |
IL194807A0 (en) | Configurable parallel computation of cyclic redundancy check (crc) codes | |
TW200741929A (en) | Device and method for embedded testing and test device for embedding in scribe line on wafer | |
MY125842A (en) | Semiconductor test system with easily changed interface unit | |
WO2008024701A3 (en) | System and method for testing software code for use on a target processor | |
WO2003073506A3 (en) | A modular integrated circuit chip carrier | |
ATE497174T1 (en) | METHOD FOR TESTING A PROTECTIVE DEVICE AND CORRESPONDINGLY DESIGNED PROTECTIVE DEVICE AND TEST DEVICE | |
TWI256122B (en) | Integrated circuit and associated packaged integrated circuit | |
WO2008120362A1 (en) | Fault locating device, fault locating method, and integrated circuit | |
TW200700745A (en) | Remote testing system and method | |
ATE486419T1 (en) | FAULT CHARACTERIZATION AND ELIMINATION | |
TW200702678A (en) | Semiconductor device, test board for testing the same, and test system and method for testing the same | |
TW200951444A (en) | Testing wafer unit and test system | |
GB2500149A (en) | Switch to perform non-destructive and secure disablement of ic functionality utilizing mems and method thereof | |
WO2006003023A3 (en) | Method and arrangement for detecting unidirectional errors with systematic unordered codes | |
DE602004016689D1 (en) | INTEGRATED CDMA CIRCUIT DIMODULATOR WITH INTEGRATED TEST PATTERN GENERATION | |
TW200619633A (en) | Method for burn-in test and measurement program for burn-in test | |
TW200729388A (en) | Method and apparatus for placing electronic parts on a substrate |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |