TW200741193A - Inspection system and method for a color filter - Google Patents

Inspection system and method for a color filter

Info

Publication number
TW200741193A
TW200741193A TW095113834A TW95113834A TW200741193A TW 200741193 A TW200741193 A TW 200741193A TW 095113834 A TW095113834 A TW 095113834A TW 95113834 A TW95113834 A TW 95113834A TW 200741193 A TW200741193 A TW 200741193A
Authority
TW
Taiwan
Prior art keywords
inspection
color filter
light
different colors
inspection system
Prior art date
Application number
TW095113834A
Other languages
Chinese (zh)
Other versions
TWI322888B (en
Inventor
Wen-Hsien Lien
Meng-Jen Chen
yuan-hao Wen
Shih-Hung Hsueh
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW095113834A priority Critical patent/TWI322888B/en
Priority to KR1020060051899A priority patent/KR100807460B1/en
Publication of TW200741193A publication Critical patent/TW200741193A/en
Application granted granted Critical
Publication of TWI322888B publication Critical patent/TWI322888B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/46—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by spectral analysis, e.g. Fourier analysis or wavelet analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Optical Filters (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

A system for inspecting a color filter and a method thereof is provided. The inspection system comprises an inspection device, a light guide plate, an inspection light generating device and a plurality of light sensing devices. The inspection light generating device provides lights having different colors and the light frequencies of the lights can be adjusted to a specific relation to form a mixed light source. The mixed light source causes the grey levels of pixel patterns of different colors at the color filter to be very close or substantially equal to one another, thereby a variety of defects, such as black loss and white loss can be easily detected simultaneously.
TW095113834A 2006-04-18 2006-04-18 Inspection system and method for a color filter TWI322888B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW095113834A TWI322888B (en) 2006-04-18 2006-04-18 Inspection system and method for a color filter
KR1020060051899A KR100807460B1 (en) 2006-04-18 2006-06-09 Inspection system and method for a color filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095113834A TWI322888B (en) 2006-04-18 2006-04-18 Inspection system and method for a color filter

Publications (2)

Publication Number Publication Date
TW200741193A true TW200741193A (en) 2007-11-01
TWI322888B TWI322888B (en) 2010-04-01

Family

ID=38817807

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095113834A TWI322888B (en) 2006-04-18 2006-04-18 Inspection system and method for a color filter

Country Status (2)

Country Link
KR (1) KR100807460B1 (en)
TW (1) TWI322888B (en)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3060620B2 (en) * 1991-07-29 2000-07-10 日本電気株式会社 Color filter inspector
JP3358331B2 (en) * 1994-10-31 2002-12-16 石川島播磨重工業株式会社 Color filter inspection device
JPH09126948A (en) * 1995-11-06 1997-05-16 Toppan Printing Co Ltd Method for inspecting color filter
JPH10111485A (en) 1996-10-08 1998-04-28 Sony Corp Color slippage inspecting method for color filter-less liquid crystal panel

Also Published As

Publication number Publication date
KR20070103278A (en) 2007-10-23
KR100807460B1 (en) 2008-02-25
TWI322888B (en) 2010-04-01

Similar Documents

Publication Publication Date Title
ATE497479T1 (en) APPARATUS AND METHOD FOR REDUCING PERCEIVED COLOR SHIFT
TW200728712A (en) Method and apparatus for visually inspecting an object
TW200734630A (en) Defect inspection apparatus and defect inspection method
MX2011007508A (en) Image display apparatus and image display method.
MX2009013471A (en) Security device and method.
TW200643869A (en) Liquid-crystal display apparatus and electronic device
TW200743171A (en) Substrate illumination and inspection system
WO2007133581A3 (en) Apparatus and method for characterizing defects in a transparent substrate
TW200641345A (en) Imperfection inspection method and imperfection inspection device using the same
SG155975A1 (en) Method and device for manipulating color in a display
HK1107183A1 (en) Optical lens system and method for microfluidic devices
MX2010003652A (en) Led backlight for display systems.
TW200639417A (en) PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus
ATE507705T1 (en) APPARATUS AND METHOD FOR DYNAMIC COLOR CHANGE
TW200745536A (en) End section inspecting apparatus
MX2010003214A (en) Visual appearance measurement method and system for randomly arranged birefringent fibers.
DE60320369D1 (en) ILLUMINATION DEVICE FOR MICROSCOPY AND PICTURE PRODUCTION PROCESSES
TW200617375A (en) Method and device for inspecting defect of glass plate
EP1584471A3 (en) Method and apparatus for visually insepecting a substrate on a printing press
WO2008024802A3 (en) Dynamic aperture for a light processing system
WO2009054404A1 (en) Inspection method based on captured image and inspection device
WO2010030512A3 (en) Apparatus and method for optically converting a three-dimensional object into a two-dimensional planar image
CN204989048U (en) Light sources and including optical detection device of this light source
TW200610139A (en) Panel for display device and manufacturing method thereof
TW200741193A (en) Inspection system and method for a color filter