TW200741185A - Optical wavefront sensor - Google Patents
Optical wavefront sensorInfo
- Publication number
- TW200741185A TW200741185A TW095146676A TW95146676A TW200741185A TW 200741185 A TW200741185 A TW 200741185A TW 095146676 A TW095146676 A TW 095146676A TW 95146676 A TW95146676 A TW 95146676A TW 200741185 A TW200741185 A TW 200741185A
- Authority
- TW
- Taiwan
- Prior art keywords
- manipulation device
- wavefront
- detector
- wavefront sensor
- controller
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 2
- 230000003044 adaptive effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1876—Diffractive Fresnel lenses; Zone plates; Kinoforms
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1876—Diffractive Fresnel lenses; Zone plates; Kinoforms
- G02B5/188—Plurality of such optical elements formed in or on a supporting substrate
- G02B5/1885—Arranged as a periodic array
Abstract
An optical wavefront sensor comprising a light manipulation device; a detector for detecting light signals having been subjected to the light manipulation device; and a controller coupled to the manipulation device, the controller controlling the manipulation device to function as a lenslet array, each lenslet of the array focussing an incident portion of a wavefront onto the detector. The controller may also control the distance between the detector and the manipulation device. The spatial resolution of Shack-Hartmann sensors can be increased by digital scanning the wavefront with the manipulation device. The wavefront sensing can be dynamic adaptive by setting of parameters of the manipulation device.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/SG2005/000417 WO2007070006A1 (en) | 2005-12-13 | 2005-12-13 | Optical wavefront sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200741185A true TW200741185A (en) | 2007-11-01 |
Family
ID=38163207
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095146676A TW200741185A (en) | 2005-12-13 | 2006-12-13 | Optical wavefront sensor |
Country Status (3)
Country | Link |
---|---|
US (1) | US8158917B2 (en) |
TW (1) | TW200741185A (en) |
WO (1) | WO2007070006A1 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102735348A (en) * | 2012-06-15 | 2012-10-17 | 中国科学院光电技术研究所 | Wavefront measuring method based on Hartmann wavefront sensor |
CN109506897A (en) * | 2017-09-15 | 2019-03-22 | 东大光电股份有限公司 | wavefront measuring system |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2938933B1 (en) * | 2008-11-25 | 2011-02-11 | Thales Sa | SPACE OPTICAL SYSTEM COMPRISING MEANS OF ACTIVE CONTROL OF OPTICS |
WO2011011385A2 (en) * | 2009-07-20 | 2011-01-27 | Thorlabs, Inc. | Shack hartman sensor with removable lenslet array |
FR2962536B1 (en) * | 2010-07-06 | 2019-12-27 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | LIQUID CRYSTAL MICROLENTINE WAVEFRONT ANALYZER |
US10132925B2 (en) | 2010-09-15 | 2018-11-20 | Ascentia Imaging, Inc. | Imaging, fabrication and measurement systems and methods |
WO2012037343A1 (en) * | 2010-09-15 | 2012-03-22 | Ascentia Imaging, Inc. | Imaging, fabrication, and measurement systems and methods |
WO2013103725A1 (en) | 2012-01-03 | 2013-07-11 | Ascentia Imaging, Inc. | Coded localization systems, methods and apparatus |
US9739864B2 (en) | 2012-01-03 | 2017-08-22 | Ascentia Imaging, Inc. | Optical guidance systems and methods using mutually distinct signal-modifying |
US9628682B2 (en) * | 2012-07-13 | 2017-04-18 | Board Of Trustees Of The University Of Alabama, Fo | High-resolution hyper-spectral orthographic imaging spectrometer |
JP6080427B2 (en) * | 2012-08-10 | 2017-02-15 | キヤノン株式会社 | Shack-Hartmann sensor and wavefront measurement method using it |
JP2014102119A (en) * | 2012-11-19 | 2014-06-05 | Canon Inc | Wavefront aberration measurement method, wavefront aberration measurement apparatus and optical system manufacturing method |
CN102967380B (en) * | 2012-12-09 | 2014-10-29 | 中国科学院光电技术研究所 | Hartmann wavefront sensor based on unit photo-sensitive detector array |
CN105264428B (en) * | 2013-06-06 | 2018-06-29 | 浜松光子学株式会社 | Method of adjustment, adaptive optics system and the recording medium for storing adaptive optics system program of adaptive optics system |
JP6430770B2 (en) * | 2014-10-02 | 2018-11-28 | 株式会社トプコン | Ophthalmic equipment |
JP6409511B2 (en) * | 2014-11-04 | 2018-10-24 | 日本精機株式会社 | Head-up display device |
US10126114B2 (en) | 2015-05-21 | 2018-11-13 | Ascentia Imaging, Inc. | Angular localization system, associated repositionable mechanical structure, and associated method |
TWI589851B (en) * | 2015-11-20 | 2017-07-01 | 九驊科技股份有限公司 | Optical wavefront measuring device and method |
CN107740002A (en) * | 2017-06-13 | 2018-02-27 | 刘红宾 | A kind of novel control nitrogen austenitic stainless steel and preparation method thereof |
CN108151888B (en) * | 2017-11-22 | 2019-09-27 | 中国科学院长春光学精密机械与物理研究所 | A method of for scanning the error decoupling of Hartmann's detection device |
NL2021357A (en) * | 2018-01-31 | 2018-08-16 | Asml Netherlands Bv | Two-dimensional diffraction grating |
WO2019244303A1 (en) * | 2018-06-21 | 2019-12-26 | 三菱電機株式会社 | Wavefront sensor, wavefront measurement device, and wavefront measurement method |
GB2586612B (en) * | 2019-08-28 | 2022-02-09 | X Fab Semiconductor Foundries Gmbh | CMOS wavefront sensors |
CN112304443B (en) * | 2020-10-30 | 2022-10-21 | 中国科学院光电技术研究所 | Hartmann wavefront sensor with variable spatial resolution |
CN117232785A (en) * | 2023-08-18 | 2023-12-15 | 青岛芯微半导体科技有限公司 | Device for improving optical wavefront error detection precision with controllable sub-optical path channel switch |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5864381A (en) * | 1996-07-10 | 1999-01-26 | Sandia Corporation | Automated pupil remapping with binary optics |
US5912731A (en) * | 1997-12-04 | 1999-06-15 | Trw Inc. | Hartmann-type optical wavefront sensor |
US6547395B1 (en) * | 1998-02-06 | 2003-04-15 | Wavefront Sciences, Inc. | Methods of measuring moving objects and reducing exposure during wavefront measurements |
FR2788597B1 (en) * | 1999-01-15 | 2001-02-23 | Imagine Optic Sarl | HIGH DYNAMIC WAVEFRONT ANALYSIS METHOD AND DEVICE |
US6184974B1 (en) * | 1999-07-01 | 2001-02-06 | Wavefront Sciences, Inc. | Apparatus and method for evaluating a target larger than a measuring aperture of a sensor |
US6376819B1 (en) * | 1999-07-09 | 2002-04-23 | Wavefront Sciences, Inc. | Sub-lens spatial resolution Shack-Hartmann wavefront sensing |
US6656373B1 (en) | 1999-07-09 | 2003-12-02 | Wavefront Sciences, Inc. | Apodized micro-lenses for Hartmann wavefront sensing and method for fabricating desired profiles |
US6707020B1 (en) * | 1999-12-28 | 2004-03-16 | Mza Associates Corporation | Adaptive dynamic range wavefront sensor |
US6550917B1 (en) * | 2000-02-11 | 2003-04-22 | Wavefront Sciences, Inc. | Dynamic range extension techniques for a wavefront sensor including use in ophthalmic measurement |
JP3599629B2 (en) * | 2000-03-06 | 2004-12-08 | キヤノン株式会社 | Illumination optical system and exposure apparatus using the illumination optical system |
US6430328B1 (en) * | 2000-10-13 | 2002-08-06 | William H. Culver | Optical switch |
US6784408B1 (en) * | 2001-04-25 | 2004-08-31 | Oceanit Laboratories, Inc. | Array of lateral effect detectors for high-speed wavefront sensing and other applications |
US6747781B2 (en) * | 2001-06-25 | 2004-06-08 | Silicon Light Machines, Inc. | Method, apparatus, and diffuser for reducing laser speckle |
US20030107814A1 (en) * | 2001-12-11 | 2003-06-12 | Altmann Griffith E. | Method and apparatus for improving the dynamic range and accuracy of a Shack-Hartmann wavefront sensor |
AU2002358137A1 (en) * | 2001-12-14 | 2003-06-30 | Technovision Gmbh Gesellschaft Fur Die Entwicklung Medizinischer Technologien | Improved hartmann-shack wavefront sensor apparatus and method |
US6666857B2 (en) * | 2002-01-29 | 2003-12-23 | Robert F. Smith | Integrated wavefront-directed topography-controlled photoablation |
US20050174535A1 (en) * | 2003-02-13 | 2005-08-11 | Lai Shui T. | Apparatus and method for determining subjective responses using objective characterization of vision based on wavefront sensing |
WO2003102519A1 (en) * | 2002-05-31 | 2003-12-11 | Wavefront Sciences, Inc. | Methhod and system for sensing and analyzing a wavefront of an optically transmissive system |
AU2003287536A1 (en) * | 2002-11-05 | 2004-06-07 | Triton Systems, Inc. | Acoustically-controlled dynamic optical lenses and gratings and methods related thereto |
-
2005
- 2005-12-13 US US12/097,434 patent/US8158917B2/en not_active Expired - Fee Related
- 2005-12-13 WO PCT/SG2005/000417 patent/WO2007070006A1/en active Application Filing
-
2006
- 2006-12-13 TW TW095146676A patent/TW200741185A/en unknown
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102735348A (en) * | 2012-06-15 | 2012-10-17 | 中国科学院光电技术研究所 | Wavefront measuring method based on Hartmann wavefront sensor |
CN102735348B (en) * | 2012-06-15 | 2013-07-24 | 中国科学院光电技术研究所 | Wavefront measuring method based on Hartmann wavefront sensor |
CN109506897A (en) * | 2017-09-15 | 2019-03-22 | 东大光电股份有限公司 | wavefront measuring system |
CN109506897B (en) * | 2017-09-15 | 2020-10-16 | 东大光电股份有限公司 | Wavefront measuring system |
Also Published As
Publication number | Publication date |
---|---|
WO2007070006A9 (en) | 2008-01-10 |
WO2007070006A1 (en) | 2007-06-21 |
US20090152453A1 (en) | 2009-06-18 |
US8158917B2 (en) | 2012-04-17 |
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